HANBIT HSD32M64D8KP-10L

HANBit
HSD32M64D8KP
Synchronous DRAM Module 256Mbyte (32Mx64bit),DIMM Unbuffered with Based on
Stacked 16Mx8, 4Banks, 4K Ref., 3.3V
Part No. HSD32M64D8KP
GENERAL DESCRIPTION
The HSD32M64D8KP is a 32M x 64 bit Synchronous Dynamic RAM high density memory module. The module consists
of sixteen CMOS 16M x 8 bit(stacking chip) with 4banks Synchronous DRAMs in TSOP-II 400mil packages on a 168-pin
glass-epoxy substrate. Two 0.1uF decoupling capacitors are mounted on the printed circuit board in parallel for each
SDRAM. The HSD32M64D8KP is a DIMM(Dual in line Memory Module) and is intended for mounting into 168-pin edge
connector sockets. Synchronous design allows precise cycle control with the use of system clock. I/O transactions are
possible on every clock cycle. Range of operating frequencies, programmable latencies allows the same device to be
useful for a variety of high bandwidth, high performance memory system applications All module components may be
powered from a single 3.3V DC power supply and all inputs and outputs are LVTTL-compatible.
FEATURES
• Part Identification
HSD32M64D8KP – 10L
: 100MHz ( CL=3)
HSD32M64D8KP – 13
: 133MHz ( CL=3)
• Burst mode operation
• Auto & self refresh capability (4096 Cycles/64ms)
• LVTTL compatible inputs and outputs
• Single 3.3V ±0.3V power supply
• MRS cycle with address key programs
- Latency (Access from column address)
- Burst length (1, 2, 4, 8 & Full page)
- Data scramble (Sequential & Interleave)
• All inputs are sampled at the positive going edge of the system clock
• The used device is 4M x 8bit x 4Banks SDRAM
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PIN ASSIGNMENT
PIN
Symbol
PIN
Symbol
PIN
Symbol
PIN
Symbol
PIN
Symbol
PIN
Symbol
1
Vss
29
DQM1
57
DQ18
85
Vss
113
DQM5
141
DQ50
2
DQ0
30
/CS0
58
DQ19
86
DQ32
114
/CS1
142
DQ51
3
DQ1
31
NC
59
Vcc
87
DQ33
115
/RAS
143
Vcc
4
DQ2
32
Vss
60
DQ20
88
DQ34
116
Vss
144
DQ52
5
DQ3
33
A0
61
NC
89
DQ35
117
A1
145
NC
6
Vcc
34
A2
62
NC
90
Vcc
118
A3
146
NC
7
DQ4
35
A4
63
/CKE1
91
DQ36
119
A5
147
NC
8
DQ5
36
A6
64
Vss
92
DQ37
120
A7
148
Vss
9
DQ6
37
A8
65
DQ21
93
DQ38
121
A9
149
DQ53
10
DQ7
38
A10
66
DQ22
94
DQ39
122
BA0
150
DQ54
11
DQ8
39
BA1
67
DQ23
95
DQ40
123
A11
151
DQ55
12
Vss
40
Vcc
68
Vss
96
Vss
124
Vcc
152
Vss
13
DQ9
41
Vcc
69
DQ24
97
DQ41
125
CLK1
153
DQ56
14
DQ10
42
CLK0
70
DQ25
98
DQ42
126
NC
154
DQ57
15
DQ11
43
Vss
71
DQ26
99
DQ43
127
Vss
155
DQ58
16
DQ12
44
NC
72
DQ27
100
DQ44
128
CKE0
156
DQ59
17
DQ13
45
/CS2
73
Vcc
101
DQ45
129
/CS3
157
Vcc
18
Vcc
46
DQM2
74
DQ28
102
Vcc
130
DQM6
158
DQ60
19
DQ14
47
DQM3
75
DQ29
103
DQ46
131
DQM7
159
DQ61
20
DQ15
48
NC
76
DQ30
104
DQ47
132
NC
160
DQ62
21
CB0
49
Vcc
77
DQ31
105
CB4
133
Vcc
161
DQ63
22
CB1
50
NC
78
Vss
106
CB5
134
NC
162
Vss
23
Vss
51
NC
79
CLK2
107
Vss
135
NC
163
CLK3
24
NC
52
CB2
80
NC
108
NC
136
CB6
164
NC
25
NC
53
CB3
81
WP
109
NC
137
CB7
165
SA0
26
Vcc
54
Vss
82
SDA
110
Vcc
138
Vss
166
SA1
27
/WE
55
DQ16
83
SCL
111
/CAS
139
DQ48
167
SA2
28
DQM0
56
DQ17
84
Vcc
112
DQM4
140
DQ49
168
Vcc
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HSD32M64D8KP
FUNCTIONAL BLOCK DIAGRAM
Vcc
Vcc
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HSD32M64D8KP
PIN FUNCTION DESCRIPTION
PIN
NAME
INPUTT FUNCTION
CLK
System clock
/CE
Chip enable
CKE
Clock enable
A0 ~ A11
Address
BA0 ~ BA1
Bank select address
/RAS
Row address strobe
/CAS
Column
Address
Active on the positive going edge to sample all inputs.
Disables or enables device operation by masking or enabling all inputs except
CLK, CKE and DQM
Masks system clock to freeze operation from the next clock cycle.
CKE should be enabled at least one cycle prior to new command.
Disable input buffers for power down in standby.
CKE should be enabled 1CLK+tSS prior to valid command.
Row/column addresses are multiplexed on the same pins.
Row address : RA0 ~ RA11, Column address : CA0 ~ CA9
Selects bank to be activated during row address latch time.
Selects bank for read/write during column address latch time.
Latches row addresses on the positive going edge of the CLK with RAS low.
Enables row access & precharge.
Latches column addresses on the positive going edge of the CLK with CAS low.
Enables column access.
strobe
/WE
Write enable
DQM0 ~ 7
Data
input/output
Enables write operation and row precharge.
Latches data in starting from CAS, WE active.
Makes data output Hi-Z, tSHZ after the clock and masks the output.
Blocks data input when DQM active. (Byte masking)
mask
DQ0 ~ 63
Data input/output
Data inputs/outputs are multiplexed on the same pins.
Vcc/Vss
Power supply/ground
Power and ground for the input buffers and the core logic.
ABSOLUTE MAXIMUM RATINGS
PARAMETER
SYMBOL
RATING
VIN ,OUT
-1.0V to 4.6V
Voltage on Vcc Supply Relative to Vss
Vcc
-1.0V to 4.6V
Power Dissipation
PD
16W
TSTG
-55oC to 150oC
Voltage on Any Pin Relative to Vss
Storage Temperature
Short Circuit Output Current
IOS
50mA
Notes:
Permanent device damage may occur if " Absolute Maximum Ratings" are exceeded. Functional operation should be
restricted to the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
DC OPERATING CONDITIONS
(Recommended operating conditions (Voltage referenced to VSS = 0V, TA = 0 to 70°C))
PARAMETER
SYMBOL
MIN
TYP.
MAX
UNIT
Supply Voltage
Vcc
3.0
3.3
3.6
V
Input High Voltage
VIH
2.0
3.0
Vcc+0.3
V
1
Input Low Voltage
VIL
-0.3
0
0.8
V
2
Output High Voltage
VOH
2.4
-
-
V
IOH = -2mA
Output Low Voltage
VOL
-
-
0.4
V
IOL = 2mA
Input leakage current
I LI
-10
-
10
uA
3
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NOTE
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HSD32M64D8KP
Notes :
1. VIH (max) = 5.6V AC. The overshoot voltage duration is ≤ 3ns.
2. VIL (min) = -2.0V AC. The undershoot voltage duration is ≤ 3ns.
3. Any input 0V ≤ VIN ≤ VDDQ.
Input leakage currents include Hi-Z output leakage for all bi-directional buffers with Tri-State outputs.
CAPACITANCE
(VCC = 3.3V, TA = 23°C, f = 1MHz, VREF =1.4V ± 200 mV)
DESCRIPTION
SYMBOL
MIN
MAX
UNITS
CCLK
10
14
pF
CIN
40
60.8
pF
CKE
CCKE
10
15.2
pF
/CS
CCS
10
15.2
pF
DQM
CDQM
5
7.6
pF
Address
CADD
40
60.8
pF
DQ (DQ0 ~ DQ7)
COUT
64
96
pF
Clock
/RAS, /CAS,/WE, CKE
DC CHARACTERISTICS
(Recommended operating condition unless otherwise noted, TA = 0 to 70°C)
TEST
PARAMETER
Operating current
(One bank active)
Precharge standby current
in
power-down mode
Precharge standby current
in
non power-down mode
ICC1
ICC2P
ICC2PS
ICC2N
ICC2NS
Active standby current in
power-down mode
ICC3P
ICC3PS
Active standby current in
non power-down mode
(One bank active)
ICC3N
ICC3NS
Operating current
(Burst mode)
ICC4
Refresh current
ICC5
Self refresh current
ICC6
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VERSION
NOT
SYMBOL
UNIT
CONDITION
Burst length = 1
tRC ≥ tRC(min)
IO = 0mA
CKE ≤ VIL(max)
tCC=10ns
CKE & CLK ≤ VIL(max)
tCC=∞
CKE ≥ VIH(min)
CS* ≥ VIH(min), tCC=10ns
Input signals are changed
one time during 20ns
CKE ≥ VIH(min)
CLK ≤ VIL(max), tCC=∞
Input signals are stable
CKE ≤ VIL(max), tCC=10ns
CKE&CLK ≤ VIL(max)
tCC=∞
CKE≥VIH(min),
CS*≥VIH(min), tCC=10ns
Input signals are changed
one time during 20ns
CKE≥VIH(min)
CLK ≤VIL(max), tCC=∞
Input signals are stable
IO = 0 mA
Page burst
4Banks Activated
tCCD = 2CLKs
tRC ≥ tRC(min)
CKE ≤ 0.2V
-5-
C
-13
-10L
1440
1440
E
mA
32
mA
32
mA
1
320
mA
160
80
mA
80
480
mA
400
1760
1600
mA
1
3200
3040
mA
2
32
mA
HANBiT Electronics Co., Ltd
HANBit
HSD32M64D8KP
L
Notes:
1. Measured with outputs open.
2. Refresh period is 64ms.
3. Unless otherwise noticed, input swing level is CMOS(VIH/VIL=VDDQ/VSSQ).
12.8
AC OPERATING TEST CONDITIONS
(vcc = 3.3V ± 0.3V, TA = 0 to 70°C)
PARAMETER
AC Input levels (Vih/Vil)
Value
UNIT
2.4/0.4
V
1.4
V
tr/tf = 1/1
ns
1.4
V
Input timing measurement reference level
Input rise and fall time
Output timing measurement reference level
Output load condition
See Fig. 2
+3.3V
1200Ω
DOUT
870Ω
50pF*
Vtt=1.4V
VOH (DC) = 2.4V, IOH = -2mA
VOL (DC) = 0.4V, IOL = 2mA
50Ω
DOUT
Z0=50Ω
50pF
(Fig. 1) DC output load circuit
(Fig. 2) AC output load circuit
OPERATING AC PARAMETER
(AC operating conditions unless otherwise noted)
PARAMETER
SYMBOL
VERSION
-13
-10L
UNIT
NOTE
Row active to row active delay
tRRD(min)
15
20
ns
1
RAS to CAS delay
tRP(min)
20
20
ns
1
Row precharge time
tRP(min)
20
20
ns
1
tRAS(min)
45
50
ns
1
Row active time
Row cycle time
tRAS(max)
tRC(min)
100
65
ns
70
ns
1
2
Last data in to row precharge
tRDL(min)
2
CLK
Last data in to Active delay
tDAL(min)
2 CLK + 20 ns
-
Last data in to new col. address delay
tCDL(min)
1
CLK
2
Last data in to burst stop
tBDL(min)
1
CLK
2
Col. address to col. address delay
tCCD(min)
1
CLK
3
2
ea
4
Number of valid output data
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CAS
latency=3
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HSD32M64D8KP
Notes :
1. The minimum number of clock cycles is determined by dividing the minimum time required with clock cycle time and
then rounding off to the next higher integer.
2. Minimum delay is required to complete write.
3. All parts allow every cycle column address change.
4. In case of row precharge interrupt, auto precharge and read burst stop.
.5. For -L/10, tRDL=1CLK and tDAL=1CLK+20ns is also supported .
( recommend : tRDL=2CLK and tDAL=2CLK + 20ns.)
AC CHARACTERISTICS
(AC operating conditions unless otherwise noted)
-75
PARAMETER
CLK cycle time
CLK to valid
output delay
Output data
hold time
-10L
SYMBOL
UNIT
NOTE
1000
ns
1
6
ns
1,2
MIN
MAX
MIN
MAX
7.5
1000
10
CAS latency=3
tCC
CAS latency=3
tSAC
CAS latency=3
tOH
3
3
ns
2
CLK high pulse width
tCH
2.5
3
ns
3
CLK low pulse width
tCL
2.5
3
ns
3
Input setup time
tSS
1.5
2
ns
3
Input hold time
tSH
0.8
1
ns
3
CLK to output in Low-Z
CLK to output
CAS latency=3
in Hi-Z
tSLZ
1
1
ns
3
ns
2
5.4
tSHZ
5.4
6
Notes :
1. Parameters depend on programmed CAS latency.
2. If clock rising time is longer than 1ns, (tr/2-0.5)ns should be added to the parameter.
3. Assumed input rise and fall time (tr & tf) = 1ns.
If tr & tf is longer than 1ns, transient time compensation should be considered
ie., [(tr + tf)/2-1]ns should be added to the parameter.
SIMPLIFIED TRUTH TABLE
COMMAND
Register
Mode register set
Auto refresh
Entry
Refresh
Self
refres
h
Exit
Bank active & row address.
Read &
column
address
Write &
column
Auto
precharge
disable
Auto
precharge
disable
Auto
precharge
disable
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CKE
n-1
CKE
n
/C
S
/R
A
S
/C
A
S
/W
E
D
Q
M
H
X
L
L
L
L
X
OP code
L
L
L
H
X
X
L
H
H
H
X
X
H
L
H
L
H
H
X
X
X
BA
0,1
A10/
AP
A11
A9~A0
NOTE
1,2
3
3
3
3
H
X
L
L
H
H
X
V
H
X
L
H
L
H
X
V
Row address
L
Column
Address
(A0 ~ A9)
H
H
X
L
H
-7-
L
L
X
V
L
4
4,5
Column
Address
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4
HANBit
address
HSD32M64D8KP
Auto
precharge
enable
Burst Stop
H
X
L
H
H
L
X
H
X
L
L
H
L
X
Entry
H
L
H
X
X
X
L
V
V
V
Exit
L
H
X
X
X
X
Entry
H
L
Exit
L
H
Precharg
Bank selection
e
All banks
Clock suspend or
active power down
Precharge power
down mode
DQM
No operation command
(A0 ~ A9)
H
H
X
X
X
L
H
H
H
H
X
X
X
L
V
V
V
H
H
X
X
H
X
X
X
L
H
H
H
X
X
V
L
X
H
6
X
X
X
X
X
X
V
X
X
X
(V=Valid, X=Don't care, H=Logic high, L=Logic low)
Notes :
1. OP Code : Operand code
A0 ~ A12 & BA0 ~ BA1 : Program keys. (@ MRS)
2. MRS can be issued only at all banks precharge state.
A new command can be issued after 2 CLK cycles of MRS.
3. Auto refresh functions are as same as CBR refresh of DRAM.
The automatical precharge without row precharge command is meant by "Auto".
Auto/self refresh can be issued only at all banks precharge state.
4. BA0 ~ BA1 : Bank select addresses.
If both BA0 and BA1 are "Low" at read, write, row active and precharge, bank A is selected.
If both BA0 is "Low" and BA1 is "High" at read, write, row active and precharge, bank B is selected.
If both BA0 is "High" and BA1 is "Low" at read, write, row active and precharge, bank C is selected.
If both BA0 and BA1 are "High" at read, write, row active and precharge, bank D is selected.
If A10/AP is "High" at row precharge, BA0 and BA1 is ignored and all banks are selected.
5. During burst read or write with auto precharge, new read/write command can not be issued.
Another bank read/write command can be issued after the end of burst.
New row active of the associated bank can be issued at tRP after the end of burst.
6. Burst stop command is valid at every burst length.
7. DQM sampled at positive going edge of a CLK and masks the data-in at the very CLK (Write DQM latency is 0),
but makes Hi-Z state the data-out of 2 CLK cycles after. (Read DQM latency is 2)
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TIMING DIAGRAM
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* All banks precharge should be completed before Mode Resister Set cycle and auto refresh cycle
--MODE RESISTER SET CYCLE-*Note :
1. /CS, /RAS, /CAS, /WE activation at the same clock cycle with address key will set internal mode resister
2.Minimum 2 clock cycle should be met before new /RAS activation.
3.Please refer to Mode Resister Set table
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PACKAGING INFORMATION
Unit : mm
Front View
Rear View
ORDERING INFORMATION
Part Number
Density
Org.
Package
Ref.
Vcc
MODE
MAX.frq
HSD32M64D8KP-13
256MByte
32M x64
168 Pin-DIMM
4K
3.3V
SDRAM
CL3
133MHz
HSD32M64D8KP-10L
256MByte
32M x 64
168 Pin-DIMM
4K
3.3V
SDRAM
CL3
100MHz
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