MOSAIC SYS84000RKXL-85

4M x 8 SRAM MODULE
SYS84000RKX - 85/10/12
Issue 1.7 : April 2001
Description
The SYS84000RKX is a plastic 32Mbit Static RAM
Module housed in a standard 38 pin Single In-Line
package organised as 4M x 8 with access times of,
85,100, or 120 ns.
The module is constructed using eight 512Kx8 SRAMs
in TSOPII packages mounted onto both sides of an FR4
epoxy substrate. This offers an extremely high PCB
packing density.
The device is offered in standard and low power versions,
with the -L module having a low voltage data retention
mode for battery backed applications. Buffering is
provided on the module to reduce the output capacitance
to 8pF(Typ).
Note: CS and OE on the module, should be used
with care to avoid on and off board bus contention.
Pin Definition
Block Diagram
OE
WE
A0 - A18
512K x 8
SRAM
CS
A19
A20
A21
CS
CS
CS
T/R
Q0~3
D0 - D7
DECODER
D0 - D7
/8
Q4~7
CS
CS
512K x 8
SRAM
CS
Features
Access Times of 85/100/120 ns.
Low Power Disipation:
Operating
770 mW (Max.)
Standby-L Version (CMOS) 4.84mW (Max.)
• 5 Volt Supply ± 10%.
• Completely Static Operation.
• Equal Access and Cycle Times.
• Low Voltage VCC Data Retention.
• On-board Decoding & Capacitors.
• 38 Pin Single-In-Line package (SIP).
• Upgrade path to SYS88000RKX (64Mbits).
•
•
OE
CS
CS
Pin Functions
Address Inputs
Data Input/Output
Chip Select
Write Enable
Output Enable
No Connect
Power (+5V)
Ground
A0 - A21
NC
A20
Vcc
WE
D2
D3
D0
A1
A2
A3
A4
GND
D5
A10
A11
A5
A13
A14
A19
CS
A15
A16
A12
A18
A6
D1
GND
A0
A7
A8
A9
D7
D4
D6
A17
Vcc
OE
A21
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
D0 - D7
CS
WE
Package Details
OE
NC
VCC
GND
Plastic 38 pin Single-In-Line (SIP)
ISSUE 1.7 April 2001
SYS84000RKX - 85/10/12
DC OPERATING CONDITIONS
Absolute Maximum Ratings
(1)
Parameter
Symbol
(2)
T
Voltage on any pin relative to VSS
Power Dissipation
Storage Temperature
V
PT
TSTG
Min
Typ
Max
Unit
-0.3
-55
-
7.0
2.0
125
V
W
o
C
Notes : (1) Stresses above those listed may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions above those indicated in the
operational sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
Recommended Operating Conditions
Parameter
Supply Voltage
Input High Voltage
Input Low Voltage
Operating Temperature
(Commercial)
(Industrial)
DC Electrical Characteristics
Parameter
I/P Leakage Current
Symbol
Min
Typ
Max
Unit
VCC
VIH
VIL
TA
TAI
4.5
2.2
-0.3
0
-40
5.0
-
5.5
VCC+0.3
0.8
70
85
V
V
V
o
C
o
C
TA 0 to 70 oC
(VCC=5V±10%)
Symbol Test Condition
Min Typ
max
Unit
ILI
0V < VIN < VCC
-8
-
8
µA
Output Leakage Current
ILO
CS = VIH, VI/O = GND to VCC
-8
-
8
µA
Operating Supply Current
ICC1
Min. Cycle, CS = VIL,VIL<VIN<VIH
-
-
140
mA
TTL levels
ISB1
CS = VIH
-
-
24
mA
CMOS levels
ISB2
CS > VCC-0.2V, 0.2<VIN<VCC-0.2V
-
-
16
mA
-L Version (CMOS)
ISB3
CS > VCC-0.2V, 0.2<VIN<VCC-0.2V
-
-
880
uA
Output Voltage
VOL
IOL = 64.0mA
-
-
0.4
V
VOH
IOH = -15.0mA
2.4
-
-
V
Address,OE,WE
Standby Supply Current
Typical values are at VCC=5.0V,TA=25oC and specified loading.
Add 420mA to -L & -P CMOS standby currents to obtain industrial temp range parameters.
Capacitance (VCC=5V±10%,TA=25oC)
Parameter
Input Capacitance (Address,OE,WE)
I/P Capacitance (other)
I/O Capacitance
Note: Capacitance calculated, not measured.
Symbol Test Condition
CIN1
CIN2
CI/O
VIN = 0V
VIN = 0V
VI/O = 0V
2
max
Unit
64
12
12
pF
pF
pF
SYS84000RKX - 85/10/12
ISSUE 1.7 April 2001
AC Test Conditions
Output Load
* Input pulse levels: 0V to 3.0V
I/O Pin
645Ω
* Input rise and fall times: 5ns
1.76V
* Input and Output timing reference levels: 1.5V
100pF
* Output load: see diagram
* VCC=5V±10%
Operation Truth Table
CS
OE
WE
DATA PINS
SUPPLY CURRENT
MODE
H
X
X
High Impedance
ISB1 , ISB2 , ISB3, ISB4
Standby
L
L
L
Invalid State
~
Invalid
L
L
H
Data Out
ICC1
Read
L
H
L
Data In
ICC1
Write
L
H
H
High-Impedance
ICC1
High-Z
Notes : H = VIH : L =VIL : X = VIH or VIL
OE must not be tied low permanently.
Low Vcc Data Retention Characteristics - L Version Only
Parameter
VCC for Data Retention
Data Retention Current
Chip Deselect to Data Retention Time
Operation Recovery Time
Notes
Symbol
VDR
ICCDR1 (2)
ICCDR3
tCDR
tR
Test Condition
min
typ(1)
max
CS > VCC-0.2V
VCC = 3.0V, CS > VCC-0.2V
TOP = 0°C to 70°C
TOP = TAI
See Retention Waveform
See Retention Waveform
2.0
-
-
0
5
-
1
TBA
-
(1) Typical figures are measured at 25°C.
(2) This parameter is guaranteed not tested.
Unit
V
mA
uA
ns
ms
ISSUE 1.7 April 2001
SYS84000RKX - 85/10/12
AC OPERATING CONDITIONS
Read Cycle
-85
Parameter
Read Cycle Time
Address Access Time
Chip Select Access Time
Output Enable to Output Valid
Output Hold from Address Change
Chip Selection to Output in Low Z
Output Enable to Output in Low Z
Chip Deselection to O/P in High Z
Output Disable to Output in High Z
-10
-12
Symbol
min
max
min
max
min
max
Unit
tRC
tAA
tACS
tOE
tOH
tCLZ
tOLZ
tCHZ
tOHZ
85
11.5
1.5
1.5
0
0
85
85
50
5
5
100
11.5
1.5
1.5
0
0
100
100
55
5
5
120
11.5
1.5
1.5
0
0
120
120
60
5
5
ns
ns
ns
ns
ns
ns
ns
ns
ns
Symbol
min
max
min
max
min
max
Unit
tWC
tCW
tAW
tAS
tWP
tWR
tWHZ
tDW
tDH
tOW
85
75
75
0
60
5
0
40
0
5
35
-
100
80
80
0
70
5
0
45
0
5
40
-
120
100
100
0
70
5
0
45
0
5
40
-
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Write Cycle
-85
Parameter
Write Cycle Time
Chip Selection to End of Write
Address Valid to End of Write
Address Setup Time
Write Pulse Width
Write Recovery Time
Write to Output in High Z
***
Data to Write Time Overlap
Data Hold from Write Time
Output active from end of write ***
-10
-12
*** Theses signals are the internal Ram signals on the module and are included to assist control signal
timing.
4
SYS84000RKX - 85/10/12
ISSUE 1.7 April 2001
Read Cycle Timing Waveform (1,2)
t RC
Address
t AA
OE
t OE
t OH
t OLZ
CS
t ACS
Don't
care.
t OHZ (3)
t CLZ (4,5)
Dout
Data Valid
t CHZ (3,4,5)
AC Read Characteristics Notes
(1) WE is High for Read Cycle.
(2) All read cycle timing is referenced from the last valid address to the first transition address.
(3) tCHZ and tOHZ are defined as the time at which the outputs achieve open circuit conditions and are
not referenced to output voltage levels.
(4) At any given temperature and voltage condition, tCHZ (max) is less than tCLZ (min) both for a given module
and from module to module.
(5) These parameters are sampled and not 100% tested.
Write Cycle No.1 Timing Waveform(1,4)
tWC
Address
t WR(7)
OE
t AS(6)
t AW
t CW
CS
Don't
Care
WE
t OHZ(3,9)
t OW
t WP(2)
High-Z
Dout
t DW
Din
High-Z
t DH
Data Valid
(8)
ISSUE 1.7 April 2001
SYS84000RKX - 85/10/12
Write Cycle No.2 Timing Waveform
(1,5)
tWC
Address
t AS(6)
t WR(7)
t CW
CS
t AW
t WP(2)
WE
tOH
t WHZ(3,9)
t OW
High-Z
Dout
t DW
(8)
(4)
Don't
Care
t DH
High-Z
Din
Data Valid
AC Write Characteristics Notes
(1) All write cycle timing is referenced from the last valid address to the first transition address.
(2) All writes occur during the overlap of CS and WE low.
(3) If OE, CS, and WE are in the Read mode during this period, the I/O pins are low impedance state.
Inputs of opposite phase to the output must not be applied because bus contention can occur.
(4) Dout is the Read data of the new address.
(5) OE is continuously low.
(6) Address is valid prior to or coincident with CS and WE low, too avoid inadvertant writes.
(7) CS or WE must be high during address transitions.
(8) When CS is low : I/O pins are in the output state. Input signals of opposite phase leading to the
output should not be applied.
(9) Defined as the time at which the outputs achieve open circuit conditions and are not referenced to
output voltage levels. These parameters are sampled and not 100% tested.
Data Retention Waveform
DATA RETENTION MODE
Vcc
4.5V
4.5V
tCDR
tR
2.2V
2.2V
V DR
CS
CS > Vcc -0.2V
0V
6
SYS84000RKX - 85/10/12
Package Information
ISSUE 1.7 April 2001
Dimensions in mm
2 0 .6 5 M a x .
9 7 .1 6 M a x .
4 .3 0 M a x
1
3 . 5 0 + /- 0 . 5 0
0 .5 0 T y p .
2 .5 4 T y p .
Ordering Information
SYS84000RKXLI - 85
Speed
85 = 85 ns
10 = 100 ns
12 = 120 ns
Temperature Range
Blank = Commercial Temperature
I = Industrial Temperature
Power Consumption
Blank = Standard Part
L = Low Power Part
Package
Organization
Memory Type
RKX = Plastic 38 pin SIP
84000 = 4M x 8
SYS = Static RAM
Note :
Although this data is believed to be accurate, the information contained herein is not intended to and does not create
any warranty of merchantibility or fitness for a particular purpose.
Our products are subject to a constant process of development. Data may be changed at any time without notice.
Products are not authorised for use as critical components in life support devices without the express written approval
of a company director.