AD AD7401AYRWZ

Isolated Sigma-Delta Modulator
AD7401A
FEATURES
GENERAL DESCRIPTION
20 MHz maximum external clock rate
Second-order modulator
16 bits, no missing codes
±2 LSB INL typical at 16 bits
1 μV/°C typical offset drift
On-board digital isolator
On-board reference
±250 mV analog input range
Low power operation: 17 mA typical at 5.5 V
−40°C to +125°C operating range
16-lead SOIC package
Internal clock version: AD7400A
Safety and regulatory approvals
UL recognition
3750 V rms for 1 minute per UL 1577
CSA Component Acceptance Notice #5A
VDE Certificate of Conformity
DIN V VDE V 0884-10 (VDE V 0884-10):2006-12
VIORM = 891 V peak
The AD7401A1 is a second-order, sigma-delta (Σ-Δ) modulator
that converts an analog input signal into a high speed, 1-bit data
stream with on-chip digital isolation based on Analog Devices,
Inc., iCoupler® technology. The AD7401A operates from a 5 V
power supply and accepts a differential input signal of ±250 mV
(±320 mV full scale). The analog input is continuously sampled
by the analog modulator, eliminating the need for external
sample-and-hold circuitry. The input information is contained
in the output stream as a density of ones with a data rate up to
20 MHz. The original information can be reconstructed with
an appropriate digital filter. The serial I/O can use a 5 V or a 3 V
supply (VDD2).
The serial interface is digitally isolated. High speed CMOS,
combined with monolithic air core transformer technology,
means the on-chip isolation provides outstanding performance
characteristics, superior to alternatives such as optocoupler
devices. The part contains an on-chip reference. The AD7401A
is offered in a 16-lead SOIC and has an operating temperature
range of −40°C to +125°C.
APPLICATIONS
AC motor controls
Shunt current monitoring
Data acquisition systems
Analog-to-digital and opto-isolator replacements
FUNCTIONAL BLOCK DIAGRAM
VDD1
VDD2
AD7401A
VIN+
T/H
Σ-Δ ADC
UPDATE
ENCODE
BUF
REF
WATCHDOG
CONTROL LOGIC
WATCHDOG
DECODE
GND1
DECODE
MDAT
UPDATE
MCLKIN
ENCODE
GND2
07332-001
VIN–
Figure 1.
1
Protected by U.S. Patents 5,952,849; 6,873,065; and 7,075,329. Other patents pending.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113
©2008 Analog Devices, Inc. All rights reserved.
AD7401A
TABLE OF CONTENTS
Features .............................................................................................. 1
Terminology .................................................................................... 13
Applications ....................................................................................... 1
Theory of Operation ...................................................................... 14
General Description ......................................................................... 1
Circuit Information.................................................................... 14
Functional Block Diagram .............................................................. 1
Analog Input ............................................................................... 14
Revision History ............................................................................... 2
Differential Inputs ...................................................................... 15
Specifications..................................................................................... 3
Current Sensing Applications ................................................... 15
Timing Specifications .................................................................. 5
Voltage Sensing Applications .................................................... 15
Insulation and Safety-Related Specifications ............................ 6
Digital Filter ................................................................................ 16
Regulatory Information ............................................................... 6
Applications Information .............................................................. 18
DIN V VDE V 0884-10 (VDE V 0884-10) Insulation
Characteristics .............................................................................. 7
Grounding and Layout .............................................................. 18
Absolute Maximum Ratings............................................................ 8
Insulation Lifetime ..................................................................... 18
ESD Caution .................................................................................. 8
Outline Dimensions ....................................................................... 19
Pin Configuration and Function Descriptions ............................. 9
Ordering Guide .......................................................................... 19
Evaluating the AD7401A Performance ................................... 18
Typical Performance Characteristics ........................................... 10
REVISION HISTORY
7/08—Revision 0: Initial Version
Rev. 0 | Page 2 of 20
AD7401A
SPECIFICATIONS
VDD1 = 4.5 V to 5.5 V, VDD2 = 3 V to 5.5 V, VIN+ = −200 mV to +200 mV, and VIN− = 0 V (single-ended); TA = −40°C to +125°C, fMCLKIN =
16 MHz maximum, 1 tested with sinc3 filter, 256 decimation rate, as defined by Verilog code, unless otherwise noted.
Table 1.
Parameter
STATIC PERFORMANCE
Resolution
Integral Nonlinearity (INL) 3
Min
Y Version1, 2
Typ
Max
16
±1.5
±2
±1.5
±2
±7
±13
±11
±46
±0.9
±.025
1
120
0.07
±1
23
110
±0.5
3.5
±200
±13
±10
0.08
±0.01
10
±250
±18
±15
Differential Nonlinearity (DNL)3
Offset Error3
Offset Drift vs. Temperature3
Offset Drift vs. VDD13
Gain Error3
Gain Error Drift vs. Temperature
Gain Error Drift vs. VDD13
ANALOG INPUT
Input Voltage Range
Dynamic Input Current
3
DC Leakage Current
Input Capacitance
DYNAMIC SPECIFICATIONS
Signal-to-(Noise + Distortion) Ratio (SINAD)3
Signal-to-Noise Ratio (SNR)3
Total Harmonic Distortion (THD)3
Peak Harmonic or Spurious Noise (SFDR)3
Effective Number of Bits (ENOB)3
Isolation Transient Immunity3
LOGIC INPUTS
Input High Voltage, VIH
Input Low Voltage, VIL
Input Current, IIN
Floating State Leakage Current
Input Capacitance, CIN 4
±1.5
±0.6
Unit
Test Conditions/Comments
Bits
LSB
LSB
LSB
LSB
LSB
Filter output truncated to 16 bits
VIN+ = ±200 V, TA = −40°C to +85°C, fMCLKIN = 20 MHz max1
VIN+ = ±250 V, TA = −40°C to +85°C, fMCLKIN = 20 MHz max1
VIN+ = ±200 V, TA = −40°C to +125°C, fMCLKIN = 20 MHz max1
VIN+ = ±250 V, TA = −40°C to +125°C, fMCLKIN = 20 MHz max1
Guaranteed no missed codes to 16 bits,
fMCLKIN = 20 MHz max,1 VIN+ = −250 mV to +250 mV
fMCLKIN = 20 MHz max,1 VIN+ = −250 mV to +250 mV
mV
μV/°C
μV/V
mV
mV
μV/°C
μV/V
mV
μA
μA
μA
μA
pF
76
82
dB
71
82
dB
72
82
dB
82
dB
81
83
dB
80
82
dB
25
−90
−92
13.3
30
dB
dB
Bits
kV/μs
12.3
0.8 × VDD2
0.2 × VDD2
±0.5
1
10
V
V
μA
μA
pF
Rev. 0 | Page 3 of 20
fMCLKIN = 20 MHz max,1 VIN+ = −250 mV to +250 mV
For specified performance; full range ±320 mV
VIN+ = 500 mV, VIN− = 0 V, fMCLKIN = 20 MHz max1
VIN+ = 400 mV, VIN− = 0 V, fMCLKIN = 20 MHz max1
VIN+ = 0 V, VIN− = 0 V, fMCLKIN = 20 MHz max1
VIN+ = 5 kHz
VIN+ = ±200 V, TA = −40°C to +85°C,
fMCLKIN = 5 MHz to 20 MHz1
VIN+ = ±250 V, TA = −40°C to +85°C,
fMCLKIN = 5 MHz to 20 MHz1
VIN+ = ±200 V, TA = −40°C to +125°C,
fMCLKIN = 5 MHz to 20 MHz1
VIN+ = ±250 V, TA = −40°C to +125°C,
fMCLKIN = 5 MHz to 20 MHz1
VIN+ = ±250 V, TA = −40°C to +125°C,
fMCLKIN = 5 MHz to 20 MHz1
VIN+ = ±200 V, TA = −40°C to +125°C,
fMCLKIN = 5 MHz to 20 MHz1
fMCLKIN = 20 MHz max1, VIN+ = −250 mV to +250 mV
AD7401A
Parameter
LOGIC OUTPUTS
Output High Voltage, VOH
Output Low Voltage, VOL
POWER REQUIREMENTS
VDD1
VDD2
IDD1 5
IDD2 6
Power Dissipation
Min
Y Version1, 2
Typ
Max
VDD2 − 0.1
0.4
4.5
3
10
7
3
93.5
5.5
5.5
12
9
4
Unit
Test Conditions/Comments
V
V
IO = −200 μA
IO = +200 μA
V
V
mA
mA
mA
mW
VDD1 = 5.5 V
VDD2 = 5.5 V
VDD2 = 3.3 V
VDD1 = VDD2 = 5.5 V
1
For fMCLK > 16 MHz to 20 MHz, mark space ratio is 48/52 to 52/48, VDD1 = VDD2 = 5 V ± 5%, and TA = −40°C to +85°C.
All voltages are relative to their respective ground.
See the Terminology section.
4
Sample tested during initial release to ensure compliance.
5
See Figure 15.
6
See Figure 17.
2
3
Rev. 0 | Page 4 of 20
AD7401A
TIMING SPECIFICATIONS
VDD1 = 4.5 V to 5.5 V, VDD2 = 3 V to 5.5 V, TA = −40°C to +125°C, unless otherwise noted.
Table 2.
Parameter 1
fMCLKIN 2, 3
t1 4
t24
t3
t4
Limit at TMIN, TMAX
20
5
25
15
0.4 × tMCLKIN
0.4 × tMCLKIN
Unit
MHz max
MHz min
ns max
ns min
ns min
ns min
Description
Master clock input frequency
Master clock input frequency
Data access time after MCLKIN rising edge
Data hold time after MCLKIN rising edge
Master clock low time
Master clock high time
1
Sample tested during initial release to ensure compliance.
Mark space ratio for clock input is 40/60 to 60/40 for fMCLKIN ≤ 16 MHz and 48/52 to 52/48 for 16 MHz < fMCLKIN < 20 MHz.
3
VDD1 = VDD2 = 5 V ± 5% for fMCLKIN > 16 MHz to 20 MHz.
4
Measured with the load circuit of Figure 2 and defined as the time required for the output to cross 0.8 V or 2.0 V.
2
200µA
1.6V
CL
25pF
200µA
07332-002
TO OUTPUT
PIN
IOL
IOH
Figure 2. Load Circuit for Digital Output Timing Specifications
t4
t1
t2
MDAT
Figure 3. Data Timing
Rev. 0 | Page 5 of 20
t3
07332-003
MCLKIN
AD7401A
INSULATION AND SAFETY-RELATED SPECIFICATIONS
Table 3.
Parameter
Input-to-Output Momentary Withstand Voltage
Minimum External Air Gap (Clearance)
Symbol
VISO
L(I01)
Value
3750 min
7.46 min
Unit
V
mm
Minimum External Tracking (Creepage)
L(I02)
8.1 min
mm
Minimum Internal Gap (Internal Clearance)
Tracking Resistance (Comparative Tracking Index)
Isolation Group
CTI
0.017 min
>175
IIIa
mm
V
Conditions
1-minute duration
Measured from input terminals to output
terminals, shortest distance through air
Measured from input terminals to output
terminals, shortest distance path along body
Insulation distance through insulation
DIN IEC 112/VDE 0303 Part 1
Material Group (DIN VDE 0110, 1/89, Table I)
REGULATORY INFORMATION
Table 4.
UL 1
Recognized Under 1577
Component Recognition Program1
3750 V rms Isolation Voltage
File E214100
1
2
CSA
Approved under CSA Component
Acceptance Notice #5A
Reinforced insulation per
CSA 60950-1-03 and IEC 60950-1,
630 V rms maximum working
voltage
File 205078
VDE 2
Certified according to DIN V VDE V 0884-10
(VDE V 0884-10):2006-122
Reinforced insulation per DIN V VDE V 0884-10 (VDE V
0884-10):2006-12, 891 V peak
File 2471900-4880-0001
In accordance with UL 1577, each AD7401A is proof tested by applying an insulation test voltage ≥ 4500 V rms for 1 second (current leakage detection limit = 7.5 μA).
In accordance with DIN V VDE V 0884-10, each AD7400A is proof tested by applying an insulation test voltage ≥1671V peak for 1 sec (partial discharge detection limit = 5 pC).
Rev. 0 | Page 6 of 20
AD7401A
DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 INSULATION CHARACTERISTICS
This isolator is suitable for reinforced electrical isolation only within the safety limit data. Maintenance of the safety data is ensured by
means of protective circuits.
Table 5.
Description
INSTALLATION CLASSIFICATION PER DIN VDE 0110
For Rated Mains Voltage ≤ 300 V rms
For Rated Mains Voltage ≤ 450 V rms
For Rated Mains Voltage ≤ 600 V rms
CLIMATIC CLASSIFICATION
POLLUTION DEGREE (DIN VDE 0110, TABLE 1)
MAXIMUM WORKING INSULATION VOLTAGE
INPUT-TO-OUTPUT TEST VOLTAGE, METHOD B1
VIORM × 1.875 = VPR, 100% Production Test, tm = 1 sec, Partial Discharge < 5 pC
INPUT-TO-OUTPUT TEST VOLTAGE, METHOD A
After Environmental Test Subgroup 1
VIORM × 1.6 = VPR, tm = 60 sec, Partial Discharge < 5 pC
After Input and/or Safety Test Subgroup 2/ Safety Test Subgroup 3
VIORM × 1.2 = VPR, tm = 60 sec, Partial Discharge < 5 pC
HIGHEST ALLOWABLE OVERVOLTAGE (TRANSIENT OVERVOLTAGE, tTR = 10 sec)
SAFETY-LIMITING VALUES (MAXIMUM VALUE ALLOWED IN THE EVENT OF A FAILURE, SEE Figure 4)
Case Temperature
Side 1 Current
Side 2 Current
INSULATION RESISTANCE AT TS, VIO = 500 V
250
SIDE #2
200
150
SIDE #1
100
50
50
100
150
CASE TEMPERATURE (°C)
200
07332-004
SAFETY-LIMITING CURRENT (mA)
300
0
Figure 4. Thermal Derating Curve, Dependence of Safety-Limiting Values
with Case Temperature per DIN V VDE V 0884-10
Rev. 0 | Page 7 of 20
Characteristic
Unit
VIORM
I to IV
I to II
I to II
40/105/21
2
891
V peak
1671
V peak
1426
V peak
1069
V peak
VTR
6000
V peak
TS
IS1
IS2
RS
150
265
335
>109
°C
mA
mA
Ω
VPR
VPR
350
0
Symbol
AD7401A
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted. All voltages are relative to
their respective ground.
Table 6.
Parameter
VDD1 to GND1
VDD2 to GND2
Analog Input Voltage to GND1
Digital Input Voltage to GND2
Output Voltage to GND2
Input Current to Any Pin Except
Supplies 1
Operating Temperature Range
Storage Temperature Range
Junction Temperature
SOIC Package
θJA Thermal Impedance 2
θJC Thermal Impedance2
Resistance (Input to Output), RI-O
Capacitance (Input to Output), CI-O 3
Pb-Free Temperature, Soldering
Reflow
ESD
Rating
−0.3 V to +6.5 V
−0.3 V to +6.5 V
−0.3 V to VDD1 + 0.3 V
−0.3 V to VDD1 + 0.5 V
−0.3 V to VDD2 + 0.3 V
±10 mA
−40°C to +125°C
−65°C to +150°C
150°C
89.2°C/W
55.6°C/W
1012 Ω
1.7 pF typ
260°C
1.5 kV
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Table 7. Maximum Continuous Working Voltage1
Parameter
AC Voltage,
Bipolar Waveform
AC Voltage,
Unipolar Waveform
Max
565
Unit
V peak
Constraint
50-year minimum lifetime
891
V peak
DC Voltage
891
V
Maximum CSA/VDE
approved working
voltage
Maximum CSA/VDE
approved working
voltage
1
Refers to continuous voltage magnitude imposed across the isolation
barrier. See the Insulation Lifetime section for more details.
ESD CAUTION
1
Transient currents of up to 100 mA do not cause SCR to latch up.
EDEC 2S2P standard board.
3
f = 1 MHz.
2
Rev. 0 | Page 8 of 20
AD7401A
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
1
16
GND2
VIN+ 2
15
NC
14
VDD2
VIN–
3
NC
4
NC
5
NC
6
11
MDAT
VDD1
7
10
NC
GND1 8
9
GND2
AD7401A
MCLKIN
TOP VIEW
(Not to Scale) 12 NC
13
NC = NO CONNECT
07332-005
VDD1
Figure 5. Pin Configuration
Table 8. Pin Function Descriptions
Pin No.
1, 7
2
3
4 to 6, 10,
12, 15
8
9, 16
11
Mnemonic
VDD1
VIN+
VIN−
NC
Description
Supply Voltage, 4.5 V to 5.5 V. This is the supply voltage for the isolated side of the AD7401A and is relative to GND1.
Positive Analog Input. Specified range of ±250 mV.
Negative Analog Input. Normally connected to GND1.
No Connect.
GND1
GND2
MDAT
13
14
MCLKIN
VDD2
Ground 1. This is the ground reference point for all circuitry on the isolated side.
Ground 2. This is the ground reference point for all circuitry on the nonisolated side.
Serial Data Output. The single bit modulator output is supplied to this pin as a serial data stream.
The bits are clocked out on the rising edge of the MCLKIN input and valid on the following MCLKIN rising edge.
Master Clock Logic Input. 20 MHz maximum. The bit stream from the modulator is valid on the rising edge of MCLKIN.
Supply Voltage. 3 V to 5.5 V. This is the supply voltage for the nonisolated side and is relative to GND2.
Rev. 0 | Page 9 of 20
AD7401A
TYPICAL PERFORMANCE CHARACTERISTICS
TA = 25°C, using 25 kHz brick-wall filter, unless otherwise noted.
100
–90
90
VDD1 = VDD2 = 5V
–85
80
MCLKIN = 10MHz
MCLKIN = 16MHz
–80
60
50
MCLKIN = 5MHz
SINAD (dB)
PSRR (dB)
70
MCLKIN = 10MHz
40
MCLKIN = 16MHz
–75
–70
–65
30
–60
600
700
800
900
1000
SUPPLY RIPPLE FREQUENCY (kHz)
–50
0.17 0.18 0.19 0.20 0.21 0.22 0.23 0.24 0.25 0.26 0.27 0.28 0.29 0.30 0.31 0.32 0.33
± INPUT AMPLITUDE (V)
Figure 6. PSRR vs. Supply Ripple Frequency Without Supply Decoupling
–90
Figure 9. SINAD vs. VIN
0.4
=V
=5V
VDD1 V= V
DD2 = 5V
DD1
DD2
0.3
–85
MCLKIN = 16MHz
0.2
DNL ERROR (LSB)
–75
MCLKIN = 10MHz
–70
–65
MCLKIN = 5MHz
–60
0.1
0
–0.1
–0.2
1k
2k
3k
4k
5k
6k
7k
8k
9k
10k
INPUT FREQUENCY (Hz)
07332-007
0
–0.4 V + = –200mV TO +200mV
IN
VIN– = 0V
–0.5
0
10k
20k
30k
–20
60k
0.8
VIN+ = –200mV TO +200mV
VIN– = 0V
0.6
INL ERROR (LSB)
–40
–60
–80
–100
–120
–140
0.4
0.2
0
–0.2
–160
–180
0
5
10
15
20
FREQUENCY (kHz)
25
30
07332-008
(dB)
60k
Figure 10. Typical DNL (±200 mV Range)
4096 POINT FFT
fIN = 5kHz
SINAD = 81.984dB
THD = –96.311dB
DECIMATION BY 256
0
50k
CODE
Figure 7. SINAD vs. Analog Input Frequency
20
40k
07332-010
–0.3
–55
07332-011
SINAD (dB)
–80
–50
07332-009
–55
07332-006
20 200mV p-p SINE WAVE ON V
DD1
NO DECOUPLING
10 V
=
V
=
5V
DD1
DD2
1MHz CUTOFF FILTER
0
0
100 200 300 400 500
Figure 8. Typical FFT (±200 mV Range)
–0.4
0
10k
20k
30k
40k
50k
CODE
Figure 11. Typical INL (±200 mV Range)
Rev. 0 | Page 10 of 20
AD7401A
0.0105
250
150
0.0100
0.0095
IDD1 (A)
0
–50
–100
–150
–200
VDD1 = VDD2 = 5.25V
MCLKIN = 16MHz
5
15 25 35 45 55 65 75 85 95 105
0.0085
0.0080
0.0065
MCLKIN = 16MHz
TA = +105°C
MCLKIN = 10MHz
TA = +105°C
MCLKIN = 10MHz
TA = +85°C
MCLKIN = 5MHz
TA = +85°C
MCLKIN = 5MHz
TA = –40°C
MCLKIN = 5MHz
TA = +105°C
0.0060
–0.33 –0.28 –0.23 –0.18 –0.13 –0.08 –0.03 0.03 0.08 0.13 0.18 0.23 0.28 0.33
VIN DC INPUT VOLTAGE (V)
Figure 15. IDD1 vs. VIN at Various Temperatures
Figure 12. Offset Drift vs. Temperature for Various Supply Voltages
0.0070
200.4
VDD1 = VDD2 = 4.5V
MCLKIN = 16MHz
VDD1 = VDD2 = 4.5V
MCLKIN = 10MHz
0.0065
200.3
VDD1 = VDD2 = 4.5V
MCLKIN = 5MHz
VDD1 = VDD2 = 5V
MCLKIN = 5MHz
0.0060
200.2
VDD1 = VDD2 = 5V
MCLKIN = 16MHz
VDD1 = VDD2 = 5.25V
MCLKIN = 10MHz
0.0055
200.1
VDD1 = VDD2 = 5.25V
MCLKIN = 16MHz
VDD1 = VDD2 = 5.25V
MCLKIN = 5MHz
0.0050
200.0
VDD1 = VDD2 = 5V
MCLKIN = 10MHz
IDD2 (A)
GAIN (mV)
MCLKIN = 16MHz
TA = +85°C
MCLKIN = 10MHz
TA = –40°C
0.0070
VDD1 = VDD2 = 5.25V
MCLKIN = 5MHz
TEMPERATURE (°C)
200.5
MCLKIN = 16MHz
TA = –40°C
0.0075
VDD1 = VDD2 = 5.25V
MCLKIN = 10MHz
VDD1 = VDD2 = 5V
MCLKIN = 10MHz
–250
–45 –35 –25 –15 –5
VDD1 = VDD2 = 5V
0.0090
50
07332-012
OFFSET (µV)
100
VDD1 = VDD2 = 4.5V
MCLKIN = 10MHz
VDD1 = VDD2 = 5V
MCLKIN = 5MHz
07332-015
200
VDD1 = VDD2 = 4.5V
MCLKIN = 16MHz
VDD1 = VDD2 = 4.5V
MCLKIN = 5MHz
VDD1 = VDD2 = 5V
MCLKIN = 16MHz
VDD1 = VDD2 = 5V
TA = 25°C
MCLKIN = 16MHz
MCLKIN = 10MHz
0.0045
199.9
0.0040
199.8
0.0035
199.7
0.0030
199.6
0.0025
MCLKIN = 5MHz
TEMPERATURE (°C)
0.0020
–0.225
–0.125
–0.025
0.075
0.175
0.275
–0.325
–0.275
–0.175
–0.075
0.025
0.125
0.225
0.325
VIN DC INPUT VOLTAGE (V)
Figure 13. Gain Error Drift vs. Temperature for Various Supply Voltages
0.0105
Figure 16. IDD2 vs. VIN DC Input Voltage
0.0070
VDD1 = VDD2 = 5V
TA = 25°C
0.0100
VDD1 = VDD2 = 5V
0.0065
0.0060
0.0095
MCLKIN = 16MHz
0.0055
IDD2 (A)
0.0050
MCLKIN = 10MHz
MCLKIN = 5MHz
MCLKIN = 10MHz
TA = –40°C
0.0025
0.0065
VIN DC INPUT VOLTAGE (V)
MCLKIN = 16MHz
TA = +85°C
MCLKIN = 10MHz
TA = +105°C
MCLKIN = 5MHz
TA = –40°C
MCLKIN = 10MHz
TA = +85°C
0.0030
0.0070
–0.33 –0.28 –0.23 –0.18 –0.13 –0.08 –0.03 0.03 0.08 0.13 0.18 0.23 0.28 0.33
MCLKIN = 16MHz
TA = +105°C
0.0045
0.0035
0.0075
MCLKIN = 16MHz
TA = –40°C
0.0040
0.0080
07332-014
IDD1 (A)
0.0090
0.0085
07332-016
15 25 35 45 55 65 75 85 95 105
0.0020
MCLKIN = 5MHz
TA = +85°C
MCLKIN = 5MHz
TA = +105°C
–0.225
–0.125
–0.025
0.075
0.175
0.275
–0.325
–0.275
–0.175
–0.075
0.025
0.125
0.225
0.325
VIN DC INPUT VOLTAGE (V)
Figure 17. IDD2 vs. VIN at Various Temperatures
Figure 14. IDD1 vs. VIN DC Input Voltage
Rev. 0 | Page 11 of 20
07332-017
5
07332-013
199.5
–45 –35 –25 –15 –5
AD7401A
8
1.0
VDD1 = VDD2 = 4.5V TO 5.25V
VDD1 = VDD2 = 5V
50kHz BRICK-WALL FILTER
MCLKIN = 16MHz
6
0.8
MCLKIN = 10MHz
4
NOISE (mV)
IIN (µA)
2
MCLKIN = 5MHz
0
–2
0.6
0.4
MCLKIN = 5MHz
–4
0.2
0
=V =5V
VDD1 = VVDD2
= 5V
DD1
DD2
–20
–40
MCLKIN = 5MHz
–60
MCLKIN = 10MHz
–80
–120
0.1
1
10
100
RIPPLE FREQUENCY (kHz)
1000
07332-019
MCLKIN = 16MHz
–100
Figure 19. CMRR vs. Common-Mode Ripple Frequency
Rev. 0 | Page 12 of 20
0.30
0.25
0.20
0.15
0.05
0
–0.05
–0.10
–0.15
–0.20
–0.30
–0.25
VIN DC INPUT (V)
Figure 20. RMS Noise Voltage vs. VIN DC Input
Figure 18. IIN vs. VIN− DC Input
07332-020
VIN– DC INPUT (V)
0
07332-018
0.30
0.35
0.25
0.20
0.15
0.10
0
0.05
–0.05
–0.10
–0.15
–0.20
–0.25
–0.30
–0.35
–8
CMRR (dB)
MCLKIN = 16MHz
MCLKIN = 10MHz
0.10
–6
AD7401A
TERMINOLOGY
Total Harmonic Distortion (THD)
THD is the ratio of the rms sum of harmonics to the
fundamental. For the AD7401A, it is defined as
Differential Nonlinearity (DNL)
DNL is the difference between the measured and the ideal 1
LSB change between any two adjacent codes
in the ADC.
Integral Nonlinearity (INL)
INL is the maximum deviation from a straight line passing
through the endpoints of the ADC transfer function. The
endpoints of the transfer function are specified negative full
scale, −250 mV (VIN+ − VIN−), Code 7169 for the 16-bit level,
and specified positive full scale, +250 mV (VIN+ − VIN−), Code
58366 for the 16-bit level.
Offset Error
Offset error is the deviation of the midscale code (32768 for the
16-bit level) from the ideal VIN+ − VIN− (that is, 0 V).
Gain Error
The gain error includes both positive full-scale gain error and
negative full-scale gain error. Positive full-scale gain error is the
deviation of the specified positive full-scale code (58366 for the
16-bit level) from the ideal VIN+ − VIN− (+250 mV) after the
offset error is adjusted out. Negative full-scale gain error is the
deviation of the specified negative full-scale code (7169 for the
16-bit level) from the ideal VIN+ − VIN− (−250 mV) after the
offset error is adjusted out. Gain error includes reference error.
Signal-to-(Noise and Distortion) Ratio (SINAD)
SINAD is the measured ratio of signal-to-noise and distortion
at the output of the ADC. The signal is the rms amplitude of the
fundamental. Noise is the sum of all nonfundamental signals up
to half the sampling frequency (fS/2), excluding dc. The ratio is
dependent on the number of quantization levels in the digitization
process; the more levels, the smaller the quantization noise. The
theoretical signal-to-(noise and distortion) ratio for an ideal
N-bit converter with a sine wave input is given by
Signal-to-(Noise and Distortion) = (6.02N + 1.76) dB
Therefore, for a 12-bit converter, this is 74 dB.
Effective Number of Bits (ENOB)
ENOB is defined by
ENOB = (SINAD − 1.76)/6.02 bits
THD(dB) = 20 log
V2 2 + V32 + V4 2 + V5 2 + V6 2
V1
where:
V1 is the rms amplitude of the fundamental.
V2, V3, V4, V5, and V6 are the rms amplitudes of the second
through the sixth harmonics.
Peak Harmonic or Spurious Noise
Peak harmonic or spurious noise is defined as the ratio of the
rms value of the next largest component in the ADC output
spectrum (up to fS/2, excluding dc) to the rms value of the
fundamental. Normally, the value of this specification is
determined by the largest harmonic in the spectrum, but
for ADCs where the harmonics are buried in the noise floor,
it is a noise peak.
Common-Mode Rejection Ratio (CMRR)
CMRR is defined as the ratio of the power in the ADC output
at ±250 mV frequency, f, to the power of a 250 mV p-p sine
wave applied to the common-mode voltage of VIN+ and VIN−
of frequency, fS, as
CMRR (dB) = 10 .log(Pf/PfS)
where:
Pf is the power at frequency, f, in the ADC output.
PfS is the power at frequency, fS, in the ADC output.
Power Supply Rejection Ratio (PSRR)
Variations in power supply affect the full-scale transition but
not the converter’s linearity. PSRR is the maximum change in
the specified full-scale (±250 mV) transition point due to a
change in power supply voltage from the nominal value (see
Figure 6).
Isolation Transient Immunity
The isolation transient immunity specifies the rate of rise/fall of
a transient pulse applied across the isolation boundary beyond
which clock or data is corrupted. The AD7401A was tested
using a transient pulse frequency of 100 kHz.
Rev. 0 | Page 13 of 20
AD7401A
THEORY OF OPERATION
CIRCUIT INFORMATION
The AD7401A isolated Σ-Δ modulator converts an analog input
signal into a high speed (20 MHz maximum), single-bit data
stream; the time average single-bit data from the modulators
is directly proportional to the input signal. Figure 23 shows a
typical application circuit where the AD7401A is used to provide
isolation between the analog input, a current sensing resistor,
and the digital output, which is then processed by a digital filter
to provide an N-bit word.
ANALOG INPUT
The differential analog input of the AD7401A is implemented
with a switched capacitor circuit. This circuit implements a
second-order modulator stage that digitizes the input signal
into a 1-bit output stream. The sample clock (MCLKIN)
provides the clock signal for the conversion process as well as
the output data-framing clock. This clock source is external
on the AD7401A. The analog input signal is continuously
sampled by the modulator and compared to an internal
voltage reference. A digital stream that accurately represents
the analog input over time appears at the output of the
converter (see Figure 21).
A differential input of 320 mV results in a stream of, ideally, all
1s. This is the absolute full-scale range of the AD7401A, and
200 mV is the specified full-scale range, as shown in Table 9.
Table 9. Analog Input Range
Analog Input
Full-Scale Range
Positive Full Scale
Positive Typical Input Range
Positive Specified Input Range
Zero
Negative Specified Input Range
Negative Typical Input Range
Negative Full Scale
Voltage Input
+640 mV
+320 mV
+250 mV
+200 mV
0 mV
−200 mV
−250 mV
−320 mV
To reconstruct the original information, this output needs to be
digitally filtered and decimated. A sinc3 filter is recommended
because this is one order higher than that of the AD7401A modulator. If a 256 decimation rate is used, the resulting 16-bit word
rate is 62.5 kHz, assuming a 16 MHz external clock frequency.
Figure 22 shows the transfer function of the AD7401A relative
to the 16-bit output.
MODULATOR OUTPUT
65535
+FS ANALOG INPUT
Figure 21. Analog Input vs. Modulator Output
A differential signal of 0 V results (ideally) in a stream of alternating 1s and 0s at the MDAT output pin. This output is high
50% of the time and low 50% of the time. A differential input of
200 mV produces a stream of 1s and 0s that are high 81.25% of
the time (for a +250 mV input, the output stream is high 89.06% of
the time). A differential input of −200 mV produces a stream of
1s and 0s that are high 18.75% of the time (for a −250 mV
input, the output stream is high 10.94% of the time).
12288
0
–320mV
+200mV +320mV
Figure 22. Filtered and Decimated 16-Bit Transfer Characteristic
NONISOLATED
5V/3V
VDD1
AD7401A
VDD2
VIN+
Σ-Δ
MOD/
ENCODER
MDAT
MDAT
MCLKIN
MCLK
VDD
SINC3 FILTER*
DECODER
VIN–
CS
SCLK
SDAT
RSHUNT
DECODER
GND1
ENCODER
GND2
GND
*THIS FILTER IS IMPLEMENTED
WITH AN FPGA OR DSP.
Figure 23. Typical Application Circuit
Rev. 0 | Page 14 of 20
07332-023
INPUT
CURRENT
–200mV
ANALOG INPUT
ISOLATED
5V
+
SPECIFIED RANGE
07332-022
ANALOG INPUT
ADC CODE
–FS ANALOG INPUT
07332-021
53248
AD7401A
DIFFERENTIAL INPUTS
CURRENT SENSING APPLICATIONS
The analog input to the modulator is a switched capacitor
design. The analog signal is converted into charge by highly
linear sampling capacitors. A simplified equivalent circuit
diagram of the analog input is shown in Figure 24. A signal
source driving the analog input must be able to provide the
charge onto the sampling capacitors every half MCLKIN cycle
and settle to the required accuracy within the next half cycle.
The AD7401A is ideally suited for current sensing applications
where the voltage across a shunt resistor is monitored. The load
current flowing through an external shunt resistor produces a
voltage at the input terminals of the AD7401A. The AD7401A
provides isolation between the analog input from the current
sensing resistor and the digital outputs. By selecting the appropriate shunt resistor value, a variety of current ranges can be
monitored.
φA
VIN–
1kΩ
MCLKIN
Choosing RSHUNT
φB
2pF
φA
2pF
φB
07332-024
VIN+
1kΩ
φA φB φA φB
Figure 24. Analog Input Equivalent Circuit
Because the AD7401A samples the differential voltage across
its analog inputs, low noise performance is attained with an
input circuit that provides low common-mode noise at each
input. The amplifiers used to drive the analog inputs play a
critical role in attaining the high performance available from the
AD7401A.
When a capacitive load is switched onto the output of an op
amp, the amplitude momentarily drops. The op amp tries to
correct the situation and, in the process, hits its slew rate limit.
This nonlinear response, which can cause excessive ringing,
can lead to distortion. To remedy the situation, a low-pass RC
filter can be connected between the amplifier and the input
to the AD7401A. The external capacitor at each input aids
in supplying the current spikes created during the sampling
process, and the resistor isolates the op amp from the transient
nature of the load.
The recommended circuit configuration for driving the
differential inputs to achieve best performance is shown in
Figure 25. A capacitor between the two input pins sources or
sinks charge to allow most of the charge that is needed by one
input to be effectively supplied by the other input. The series
resistor again isolates any op amp from the current spikes
created during the sampling process. Recommended values for
the resistors and capacitor are 22 Ω and 47 pF, respectively.
R
C
VIN–
R
When the peak sense current is known, the voltage range of the
AD7401A (±200 mV) is divided by the maximum sense current
to yield a suitable shunt value. If the power dissipation in the
shunt resistor is too large, the shunt resistor can be reduced
and less of the ADC input range is used. Using less of the ADC
input range results in performance that is more susceptible to
noise and offset errors because offset errors are fixed and are
thus more significant when smaller input ranges are used.
RSHUNT must be able to dissipate the I2R power losses. If the
power dissipation rating of the resistor is exceeded, its value
may drift or the resistor may be damaged, resulting in an open
circuit. This can result in a differential voltage across the terminals of the AD401A in excess of the absolute maximum
ratings. If ISENSE has a large high frequency component, take
care to choose a resistor with low inductance.
VOLTAGE SENSING APPLICATIONS
The AD7401A can also be used for isolated voltage monitoring.
For example, in motor control applications, it can be used to
sense bus voltage. In applications where the voltage being monitored exceeds the specified analog input range of the AD7401A,
a voltage divider network can be used to reduce the voltage to
be monitored to the required range.
AD7401A
07332-025
VIN+
The shunt resistor values used in conjunction with the AD7401A
are determined by the specific application requirements in
terms of voltage, current, and power. Small resistors minimize
power dissipation, while low inductance resistors prevent any
induced voltage spikes, and good tolerance devices reduce
current variations. The final values chosen are a compromise
between low power dissipation and good accuracy. Low value
resistors have less power dissipated in them, but higher value
resistors may be required to utilize the full input range of the
ADC, thus achieving maximum SNR performance.
Figure 25. Differential Input RC Network
Rev. 0 | Page 15 of 20
AD7401A
The overall system resolution and throughput rate is determined
by the filter selected and the decimation rate used. The higher
the decimation rate, the greater the system accuracy, as illustrated in Figure 26. However, there is a tradeoff between accuracy
and throughput rate and, therefore, higher decimation rates
result in lower throughput solutions. Note that for a given
bandwidth requirement, a higher MCLKIN frequency can allow
for higher decimation rates to be used, resulting in higher SNR
performance.
90
SINC3
80
70
SINC2
SNR (dB)
60
50
40
SINC1
30
20
0
1
10
100
1k
DECIMATION RATE
07332-026
10
Figure 26. SNR vs. Decimation Rate for Different Filter Types
A sinc3 filter is recommended for use with the AD7401A. This
filter can be implemented on an FPGA or a DSP.
⎛ (1 − Z DR ) ⎞
⎟
H (z ) =⎜⎜
−1 ⎟
⎝ (1 − Z ) ⎠
3
where DR is the decimation rate.
The following Verilog code provides an example of a sinc3 filter
implementation on a Xilinx® Spartan-II 2.5 V FPGA. This code
can possibly be compiled for another FPGA, such as an Altera®
device. Note that the data is read on the negative clock edge in
this case, although it can be read on the positive edge, if
preferred.
/*`Data is read on negative clk edge*/
module DEC256SINC24B(mdata1, mclk1, reset,
DATA);
input mclk1;
input reset;
input mdata1;
filtered*/
/*used to clk filter*/
/*used to reset filter*/
/*ip data to be
output [15:0] DATA;
/*filtered op*/
integer location;
integer info_file;
reg [23:0]
ip_data1;
reg [23:0]
acc1;
reg [23:0]
acc2;
reg [23:0]
acc3;
reg [23:0]
acc3_d1;
reg [23:0]
acc3_d2;
reg [23:0]
diff1;
reg [23:0]
diff2;
reg [23:0]
diff3;
reg [23:0]
diff1_d;
reg [23:0]
diff2_d;
reg [15:0]
DATA;
reg [7:0]
word_count;
reg word_clk;
reg init;
/*Perform the Sinc ACTION*/
always @ (mdata1)
if(mdata1==0)
ip_data1 <= 0;
to a -1 for 2's comp */
else
ip_data1 <= 1;
/* change from a 0
/*ACCUMULATOR (INTEGRATOR)
Perform the accumulation (IIR) at the speed
of the modulator.
MCLKIN
ACC1+
IP_DATA1
Z
+
ACC2+
Z
+
Z
+
Figure 27. Accumulator
Rev. 0 | Page 16 of 20
ACC3+
07332-027
DIGITAL FILTER
AD7401A
Z = one sample delay
WORD_CLK = output word rate
*/
Z = one sample delay
MCLKOUT = modulators conversion bit rate
*/
always @ (posedge mclk1 or posedge reset)
if (reset)
begin
/*initialize acc registers on reset*/
acc1 <= 0;
acc2 <= 0;
acc3 <= 0;
end
else
begin
/*perform accumulation process*/
acc1 <= acc1 + ip_data1;
acc2 <= acc2 + acc1;
acc3 <= acc3 + acc2;
end
always @ (posedge word_clk or posedge reset)
if(reset)
begin
acc3_d2 <= 0;
diff1_d <= 0;
diff2_d <= 0;
diff1 <= 0;
diff2 <= 0;
diff3 <= 0;
end
else
begin
diff1 <= acc3 - acc3_d2;
diff2 <= diff1 - diff1_d;
diff3 <= diff2 - diff2_d;
acc3_d2 <= acc3;
diff1_d <= diff1;
diff2_d <= diff2;
end
/*DECIMATION STAGE (MCLKOUT/ WORD_CLK)
*/
always @ (negedge mclk1 or posedge reset)
if (reset)
word_count <= 0;
else
word_count <= word_count + 1;
/* Clock the Sinc output into an output
register
/*DIFFERENTIATOR ( including decimation
stage)
Perform the differentiation stage (FIR) at a
lower speed.
WORD_CLK
DIFF3
DATA
07332-029
always @ (word_count)
word_clk <= word_count[7];
Figure 29. Clocking Sinc Output into an Output Register
+
ACC3
DIFF1
+
–
+
–
Z–1
DIFF3
WORD_CLK = output word rate
*/
–
Z–1
07332-028
Z–1
DIFF2
WORD_CLK
Figure 28. Differentiator
always @ (posedge word_clk)
begin
DATA[15]
DATA[14]
DATA[13]
DATA[12]
DATA[11]
DATA[10]
DATA[9]
DATA[8]
DATA[7]
DATA[6]
DATA[5]
DATA[4]
DATA[3]
DATA[2]
DATA[1]
DATA[0]
<=
<=
<=
<=
<=
<=
<=
<=
<=
<=
<=
<=
<=
<=
<=
<=
end
endmodule
Rev. 0 | Page 17 of 20
diff3[23];
diff3[22];
diff3[21];
diff3[20];
diff3[19];
diff3[18];
diff3[17];
diff3[16];
diff3[15];
diff3[14];
diff3[13];
diff3[12];
diff3[11];
diff3[10];
diff3[9];
diff3[8];
AD7401A
APPLICATIONS INFORMATION
Series resistance in the analog inputs should be minimized to
avoid any distortion effects, especially at high temperatures. If
possible, equalize the source impedance on each analog input to
minimize offset. Beware of mismatch and thermocouple effects
on the analog input PCB tracks to reduce offset drift.
EVALUATING THE AD7401A PERFORMANCE
•
•
The value that ensures at least a 50-year lifetime of
continuous use.
The maximum CSA/VDE approved working voltage.
It should also be noted that the lifetime of the AD7401A varies
according to the waveform type imposed across the isolation
barrier. The iCoupler insulation structure is stressed differently
depending on whether the waveform is bipolar ac, unipolar ac,
or dc. Figure 30, Figure 31, and Figure 32 illustrate the different
isolation voltage waveforms.
An AD7401A evaluation board is available with split ground
planes and a board split beneath the AD7401A package to
ensure isolation. This board allows access to each pin on the
device for evaluation purposes.
The evaluation board package includes a fully assembled and
tested evaluation board, documentation, and software for
controlling the board from the PC via the EVAL-CED1Z. The
software also includes a sinc3 filter implemented on an FPGA.
The evaluation board is used in conjunction with the EVALCED1Z board and can also be used as a standalone board. The
software allows the user to perform ac (fast Fourier transform)
and dc (histogram of codes) tests on the AD7401A. The software and documentation are on a CD that is shipped with the
evaluation board.
RATED PEAK VOLTAGE
07332-030
Supply decoupling with a value of 100 nF is recommended on
both VDD1 and VDD2. In applications involving high commonmode transients, care should be taken to ensure that board
coupling across the isolation barrier is minimized. Furthermore, the board layout should be designed so that any coupling
that occurs equally affects all pins on a given component side.
Failure to ensure this may cause voltage differentials between
pins to exceed the absolute maximum ratings of the device,
thereby leading to latch-up or permanent damage. Any decoupling
used should be placed as close to the supply pins as possible.
These tests subjected devices to continuous cross-isolation
voltages. To accelerate the occurrence of failures, the selected
test voltages were values exceeding those of normal use. The
time-to-failure values of these units were recorded and used
to calculate acceleration factors. These factors were then used
to calculate the time-to-failure under normal operating
conditions. The values shown in Table 7 are the lesser of the
following two values:
0V
Figure 30. Bipolar AC Waveform
RATED PEAK VOLTAGE
07332-031
GROUNDING AND LAYOUT
0V
Figure 31. Unipolar AC Waveform
RATED PEAK VOLTAGE
All insulation structures, subjected to sufficient time and/or
voltage, are vulnerable to breakdown. In addition to the testing
performed by the regulatory agencies, Analog Devices has
carried out an extensive set of evaluations to determine the
lifetime of the insulation structure within the AD7401A.
Rev. 0 | Page 18 of 20
07332-032
INSULATION LIFETIME
0V
Figure 32. DC Waveform
AD7401A
OUTLINE DIMENSIONS
10.50 (0.4134)
10.10 (0.3976)
9
16
7.60 (0.2992)
7.40 (0.2913)
8
1.27 (0.0500)
BSC
0.30 (0.0118)
0.10 (0.0039)
COPLANARITY
0.10
0.51 (0.0201)
0.31 (0.0122)
10.65 (0.4193)
10.00 (0.3937)
0.75 (0.0295)
0.25 (0.0098)
2.65 (0.1043)
2.35 (0.0925)
SEATING
PLANE
45°
8°
0°
0.33 (0.0130)
0.20 (0.0079)
1.27 (0.0500)
0.40 (0.0157)
COMPLIANT TO JEDEC STANDARDS MS-013- AA
CONTROLLING DIMENSIONS ARE IN MILLIMETERS; INCH DIMENSIONS
(IN PARENTHESES) ARE ROUNDED-OFF MILLIMETER EQUIVALENTS FOR
REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN.
032707-B
1
Figure 33. 16-Lead Standard Small Outline Package [SOIC_W]
Wide Body
(RW-16)
Dimensions shown in millimeters and (inches)
ORDERING GUIDE
Model
AD7401AYRWZ 1
AD7401AYRWZ-RL1
EVAL-AD7401AEDZ1
EVAL-CED1Z1
1
Temperature Range
−40°C to +125°C
−40°C to +125°C
Package Description
16-Lead Standard Small Outline Package (SOIC_W)
16-Lead Standard Small Outline Package (SOIC_W)
Evaluation Board
Development Board
Z = RoHS Compliant Part.
Rev. 0 | Page 19 of 20
Package Option
RW-16
RW-16
AD7401A
NOTES
©2008 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D07332-0-7/08(0)
Rev. 0 | Page 20 of 20