Edge737 Per-Pin Precision Measurement Unit PRELIMINARY TEST AND MEASUREMENT PRODUCTS Description Features The Edge737 is a precision measurement unit designed for automatic test equipment and instrumentation. Manufactured in a wide voltage CMOS process, it is a monolithic solution for a per pin PMU. • FV / MI Capability • FI / MV Capability • 4 Current Ranges (± 40 mA, ± 1 mA, ± 100 µA, ± 10 µA) • +7V / –5V I / O Range • Short Circuit Protection • Clamps for limiting mode and range select transients The Edge737 supports two modes of operation: force current/measure voltage and force voltage/measure current. The Edge737 can force or measure voltage in the range of +7V to –5V. In addition, the Edge737 can force or measure a current of up to 40 mA over four distinct ranges: ± 40 mA, ± 1 mA, ± 100 µA and ± 10 µA. Applications The Edge737 has an on board window comparator that provides three bits of information: DUT too high, DUT too low, and DUT fail. There is also a monitor function which provides a real time analog voltage signal proportional to either the DUT voltage or current. • Automatic Test Equipment - Memory Testers - VLSI Testers - Mixed Signal Tester On board clamps prevent large transient spikes when changing operating mode or current range. Also, the PMU will survive a direct short over the legal voltage range. The Edge737 is designed to be a low power, low cost, small footprint solution to allow high pin count testers to support a PMU per pin. Functional Block Diagram HIZ VINP FORCE IVIN MODE SEL SENSE I/V MAX I/V MIN DISABLE Comparators Detector Logic Voltage Monitor DUT LTH PASS/FAIL* DUT GTL I/V MONITOR Revision 4 / June 21, 2002 1 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS Pin Description Pin Name Pin # VINP 20 Analog voltage input which forces the output voltage at FORCE (FV/MI mode). IVIN 21 Analog voltage input which forces the output current at FORCE (FI/MV mode). FORCE SENSE 3 2 MODE SEL 10 RS1, RS2 9, 11 I/V MIN I/V MAX 24 31 Analog input voltages which establish the lower and upper threshold level for the measurement comparator. DUT LTH DUT GTL 32 26 Digital comparator open drain outputs that indicate the DUT measurement is less than the upper threshold and greater than the lower threshold. PASS/FAIL* 25 Digital output that indicates whether or not the monitored voltage is between the comparator thresholds. Logic1 corresponds to a measurement that is between comparator thresholds. DISABLE 18 Digital input which places the digital comparator outputs a I/V MONITOR in high impedance. HiZ 8 RA, RB, RC, RD 5, 16 19, 22 I/V MONITOR 12 Analog voltage output that provides a real time monitor of either the measured voltage or measured current level. COMP1 COMP2 15 14 External compensation pins that require an external capacitor connected between the two pins. VCC 27 Positive analog power supply. VEE 13, 30 Negative analog power supply. CA CB 1 23 CAPI 7 GND 4 2000 Semtech Corp. Description Analog output pin which forces current or voltage. Analog input pin which senses voltage (typically connected to FORCE). Digital input which determines whether the PMU is forcing voltage or forcing current. Digital inputs which select one of the four current ranges. Digital input which places the FORCE output into high impedance. External resistors corresponding to ranges A through D. External compensation pins that require an external capacitor connected between the two pins. External compensation pins that require an external capacitor connected to ground. Ground. 2 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS Pin Description (continued) CA PASS/FAIL* DUT GTL VCC N/C N/C VEE I/V MAX DUT LTH 32 Pin TQFP (7 mm x 7 mm x 1.4 mm) (Top View) 25 1 SENSE CB FORCE RD GND IVIN RA VINP N/C RC CAPI DISABLE COMP1 VEE I/V MONITOR RS2 MODE SEL COMP2 3 N/C RB 17 9 RS1 HIZ 2000 Semtech Corp. I/V MIN www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS Circuit Description Circuit Overview Comparator Outputs The Edge737 is a parametric test and measurement unit that can : • Force Voltage / Measure Current • Force Current / Measure Voltage. The comparator outputs DUT GTL, DUT LTH, and PASS/FAIL* are open drain outputs. When active (logical 0), they will pull to ground. When disabled (logical 1 or DISABLE = 1), they require an external pull up resistor to a positive voltage to achieve a high state. The Edge737 can force or measure voltage over a +7V to -5V range, and force or measure current over four distinct ranges: • ± 40 mA • ± 1 mA • ± 100 µA • ± 10 µA. An on board window comparator provides three-bit measurement range classification. Also, a monitor passes a real time analog signal which tracks either the DUT’s current or voltage performance. Force / Sense FORCE is an analog output which either forces a current or forces a voltage, depending on which operating mode is selected. The SENSE pin is a high impedance analog input which measures the DUT voltage input in the FI / MV operating mode. FORCE and SENSE are brought out to separate pins to allow for remote sensing. Control Inputs MODE SEL is a digital input which determines whether the PMU forces voltage or current, when it is not placed in a high impedance state by the HIZ input (see Table 1). HIZ Mode SEL PMU Operation 1 0 0 X 0 1 High Impedance FV / MI FI / MV I/V MONITOR I/V MONITOR is a real time analog output which tracks the sensed parameter. I/V MONITOR functionality is described in Table 3. Disable Mode SEL I/V Monitor 1 0 0 X 0 1 High Impedance Measured Current Measured Voltage Table 1. Table 3. RS1 and RS2 are digital inputs to an analog MUX which establishes the full scale current range of the PMU. One of four current ranges can be selected by using RS1 and RS2 as shown in Table 2. Rext Nom RA = 200KΩ RB = 20KΩ RC = 2KΩ RD = 50Ω RS1 RS2 0 0 1 1 0 1 1 0 I(measured) = I/V MONITOR / (4.0 * REXT). Current Range A: B: C: D: In the FI / MV mode, the output voltage is a 1:1 mapping of the DUT voltage. In the FV / MI mode, I/V MONITOR follows the equation: Using nominal values for the external resistors, I/V MONITOR of +8.0V corresponds to Imax and –8.0V corresponds to Imin of the selected current range. ± 10 µA ± 100 µA ± 1 mA ± 40 mA Table 2. 2000 Semtech Corp. 4 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) HIZ HIZ is a digital input which places the FORCE output into a high impedance state, regardless of the operating mode (forcing current or voltage.) This function allows the PMU to be connected directly to the pin electronics without an isolation relay while NOT adding any leakage current. The voltage at I/V MONITOR follows the equation: I(measured) = I/V MONITOR / (4.0 * REXT). Nominally, the external resistors (RA, RB, RC, and RD) should be chosen such that Imax * REXT = 2.0V. DISABLE Force Current / Measure Voltage Mode DISABLE is a digital input which places DUT LTH, DUT GTL, I/V MONITOR, and PASS/FAIL* into high impedance states. In the FI / MV mode, IVIN is a high input impedance, analog voltage input that is converted into a current (see Table 5) using the following relationship: Force Voltage / Measure Current Mode FORCE = IVIN / (4.0 * REXT) In the FV / MI mode, VINP is a high input impedance, analog voltage input that maps directly to the voltage forced at the DUT (see Figure 1), where FORCE = VINP. with positive current is defined as current flowing out of the PMU. A current monitor is connected in series with the Op Amp driving the FORCE voltage. This monitor generates a voltage that is proportional to the current passing through it, and its output is brought out to I/V MONITOR. The monitor’s voltage may also be evaluated using the Window Comparator whose operation is in accordance with the FV/MI functional truth table (Table 6). I/V MAX and I/V MIN are high impedance analog inputs that establish the upper and lower thresholds for the window comparator (see Table 4). In the FV / MI mode, a maximum voltage input corresponds to at least a maximum current output. Positive current is defined as current flowing out of the PMU. I/V MAX I/V MIN Comparator Threshold +8.0V 0V –8.0V > Imax (full scale) 0 < Imin (full scale) IVIN Forced Current +8.0V 0V –8.0V Imax (full scale) 0 Imin (full scale) Table 5. The resulting DUT voltage is then tested via the SENSE input by a window comparator, whose functional truth table is shown in Table 7. I/V MAX and I/V MIN are high impedance analog inputs that establish the upper and lower thresholds for the window comparator. In the FI / MV mode, the reference inputs translate 1:1 to SENSE level thresholds. Table 4. 2000 Semtech Corp. 5 www .semtech.com 2000 Semtech Corp. SENSE IVIN VINP 5KΩ 6 40KΩ 40KΩ FV* A* B* C* D* A B C D D D* Cext C C* B B* A A* RA RB RC RD CA + INST. – FV 15 KΩ FV* 5 KΩ – 4X + IV_MIN IV_MAX FV* FV + – + – – + DISABLE 1 1 1 1 0 0 0 0 70 Ω typ. DUT_GTL PASS/FAIL* DUT_LTH I/V MONITOR FORCE TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Cext CAPI: Input noise filter capacitor (low pass) Cext CB, CA: Current sense resistor compensation Cext COMP1, COMP2: Force amplifier compensation CB FV FV* COMP1 FV* Cext – DRIVER + HiZ FV COMP2 CAPI Cext FV ⇒ FV/FI* = 1 FV* ⇒ FV/FI* = 0 FV* FV 15KΩ FV FV* FV Edge737 Functional Schematic Edge737 PRELIMINARY Figure 1. Edge737 Functional Schematic www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) TEST CONDITION DISABLE DUT LTH DUT GTL I/V MONITOR PASS / FAIL* X 1 Hi Z Hi Z Hi Z I/V MONITOR > I/V MAX I/V MONITOR < I/V MAX 0 0 0 1 N/A N/A I/V MONITOR = Iout * 4.0 * REXT I/V MONITOR = Iout * 4.0 * REXT 0 N/A I/V MONITOR > I/V MIN I/V MONITOR < I/V MIN 0 0 N/A N/A 1 0 I/V MONITOR = Iout * 4.0 * REXT I/V MONITOR = Iout * 4.0 * REXT N/A 0 I/V MONITOR < I/V MAX and I/V MONITOR > I/V MIN 0 1 1 I/V MONITOR = Iout * 4.0 * REXT 1 Table 6. FV / MI Truth Table TEST CONDITION DISABLE DUT LTH DUT GTL I/V MONITOR PASS / FAIL* X 1 Hi Z Hi Z Hi Z SENSE > I/V MAX SENSE < I/V MAX 0 0 0 1 N/A N/A I/V MONITOR = SENSE I/V MONITOR = SENSE 0 N/A SENSE > I/V MIN SENSE < I/V MIN 0 0 N/A N/A 1 0 I/V MONITOR = SENSE I/V MONITOR = SENSE N/A 0 DUT < I/V MAX and DUT > I/V MIN 0 1 1 I/V MONITOR = SENSE 1 Table 7. FI / MV Truth Table 2000 Semtech Corp. 7 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) VOS@IVMON REXT Selection CM Linearity The Edge737 is designed for the voltage drop across RA, RB, RC, and RD to be ≤ 2V with the maximum current passing through them. However, these resistor values can be changed to support different applications. Increasing the maximum current beyond the nominal range is not recommended. However, decreasing the maximum current is allowed. CM Error = Slope VCM@FORCE –5V 7V Short Circuit Protection The Edge737 is designed to survive a direct short circuit to any voltage within the supply rails at the FORCE and SENSE pins. Transient Clamps The Edge737 has on-board clamps to limit the voltage and current spikes that might result from either changing the current range or changing the operating mode. Common Mode Error/Calibration In order to attain a high degree of accuracy in a typical ATE application, offset and gain errors are accounted for through software calibration. When forcing or measuring a current with the Edge737, an additional source of error, common mode error, should be accounted for. Common mode error is a measure of how the common mode voltage, VCM, at the input of the current sense amplifier affects the forced or measured current values (see Figure 2). Since this error is created by internal resistors in the current sense amplifier, it is very linear in nature. Using the common mode error and common mode linearity specifications, one can see that with a small number of calibration steps (see Applications note PMU-A1), the effect of this error can be significantly reduced. Figure 2. Graphical Representation of Common Mode Error Compensation Capacitors COMP1 and COMP2 are internal op amp compensation pins that require a 120 pF capacitor connected between the two pins. CAPI is an external noise compensation pin that can be used as a low pass filter to eliminate noise from the IVIN and VINP input pins through the connection of an external capacitor from CAPI to GND. The relationship between the roll-off frequency of noise filtered (in Hz) to the external capacitance (in farads) can be seen below: Filter Frequency = 1 80,000 π X CCAPI CA and CB are internal compensation pins that require a 120 pF capacitor connected between them. Power Supply Sequencing In order to help protect the Edge737 from a latch-up condition, it is important that VCC ≥ All Input Voltages ≥ VEE, and VCC ≥ GND ≥ VEE at all times. 2000 Semtech Corp. 8 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS Application Information Required External Components Choose Rext such that: Iout (low) = V+ / RPU < 1 mA, V+ ≤ VCC 120 pF V+ 120 pF * Typical Values COMP1 COMP2 CAPI 200 KΩ RPU RPU RA RPU DUT LTH 20 KΩ RB DUT GTL 2 KΩ RC PASS/FAIL* 50 Ω RD CA FORCE 120 pF CB VCC VEE .1 µF .1 µF VCC VEE * Optional (see Compensation Capacitors Section) Actual decoupling capacitor values depend on the actual system environment. 2000 Semtech Corp. 9 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS Package Information 32 Pin TQFP Package 7 mm x 7 mm x 1.4 mm TOP VIEW 4 D D/2 b 3 e E N / 4 TIPS 0.20 C 4 E/2 A–B D SEE DETAIL "A" 4X BOTTOM VIEW 5 7 D1 D1 / 2 E1 / 2 5 7 E1 C OO 4X 2000 Semtech Corp. 0.20 H A–B D 10 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS Package Information (continued) DETAIL "A" DETAIL "B" 0 MIN. 3 e/2 – 0.05 S 0.08 / 0.20 R. DATUM PLANE A2 0.25 –H– GAUGE PLANE A1 b C.08 R. MIN. 0–7 0.20 MIN. L 1.00 REF. SECTION C–C ;;; ;;; 9 8 PLACES( 11 / 13 b A – H –( 2 0.05 // ccc – C –( 0.10 C 0.09 / 0.20 M SEE DETAIL "B" Notes: 1. All dimensions and tolerances conform to ANSI Y14.5-1982. 2. Datum plane -H- located at mold parting line and coincident with lead, where lead exits plastic body at bottom of parting line. 3. Datums A-B and -D- to be determined at centerline between leads where leads exit plastic body at datum plane -H-. 4. To be determined at seating plane -C-. 5. Dimensions D1 and E1 do not include mold protrusion. 6. “N” is the total # of terminals. 7. These dimensions to be determined at the datum plane -H-. 8. Package top dimensions are smaller than bottom dimensions and top of package will not overhang bottom of package. 9. Dimension b does not include dambar protrusion. Allowable dambar protrusion shall be 0.08 mm total in excess of the b dimension at maximum material condition. Dambar cannot be located on the lower radius or the foot. 10. Controlling dimension: millimeter. 11. Maximum allowable die thickness to be assembled in this package family is 0.30 millimeters. 12. This outline conforms to JEDEC publication 95, registration MO-136, variations AC, AE, and AF. 11 M C A–B S D S WITH LEAD FINISH 0.09 / 0.16 b 2000 Semtech Corp. ddd Lead( Cross Section 1 BASE METAL JDEC Variation Dimensions in Millimeters Sy m M in Nom A M ax Not e C omment s 1.60 P ac k ag e St and Off Heig ht A1 0.05 0.10 0.15 A ir Gap A2 1.35 1.40 1.45 P ac k ag e B ody T hic k ness D 9.00 B SC 4 D1 7.00 B SC 7,8 E 9.00 B SC 4 E1 7.00 B SC L 0.45 M 0.15 0.60 7,8 P ac k ag e B ody Leng t h P ac k ag e B ody W idt h 0.765 5 N 32 Lead C ount e 0.80 B SC Lead P it c h b 0.30 0.37 0.45 b1 0.30 0.35 0.40 ccc 0.10 ddd 0.20 9 Lead T hic k ness www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS Recommended Operating Conditions Parameter Symbol Min Typ Max Units Positive Analog Power Supply (Relative to GND) VCC 11.5 12 13 V Negative Analog Power Supply (Relative to GND) VEE – 11 – 10 – 9.5 V VCC – VEE 21 22 22.5 V Case Temperature TC +25 +75 ˚C Junction Temperature TJ +125 ˚C Thermal Resistance of Package (Junction to Case) θJ C Total Analog Power Supply 14.1 ˚ C/W Production tested @ +12V, –10V for linearity and min/max parametric testing. Absolute Maximum Ratings Parameter Symbol Min Positive Power Supply VCC Negative Power Supply Total Power Supply Max Units 0 14.0 V VEE – 13.0 0 V VCC – VEE 0 23.0 V – .5 7.0 V Digital Inputs Typ Storage Temperature TS – 55 +150 ˚C Junction Temperature TJ – 65 +150 ˚C +260 ˚C Soldering Temperature Stresses above listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended period may affect device reliability. 2000 Semtech Corp. 12 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS DC Characteristics Description Symbol Min Typ Max Units ICC IEE ICCB ∆ICC IEEB ∆IEE 3 – 11 3 0 – 55 –3 5 –5 11 –3 11 3 – 42 0 mA mA mA mA mA mA Power Supplies Power Supply Consumption Positive Supply (no-load) Negative Supply (no-load) Positive Supply Breakdown (Note 1) Positive Supply Rejection (Note 1) Negative Supply Breakdown (Note 1) Negative Supply Rejection (Note 1) Power Supply Rejection Ratio (Note 2) VCC/VEE to FORCE 0.1 kHz 1.0 kHz 10 kHz 100 kHz PSRR VCC/VEE to I/V MONITOR 0.1 kHz 1.0 kHz 10 kHz 100 kHz (MI mode) 100 kHz (MV mode) 65 60 50 20 dB dB dB dB 65 60 50 1.5 15 dB dB dB dB dB Force Voltage / Measure Current Mode Input Voltage Range @ VINP Input Bias Current @ VINP Capacitive Loading Range @ FORCE for Stability Output Forcing Voltage Range VINP IBIAS CF O R C E VF O R C E VEE + 4 – 0.4 0 VEE + 4.5 VCC – 4 0.4 12 VCC – 5.0 V µA nF V Forcing Voltage Accuracy (@ FORCE) Offset (VINP = 0V, no load) Linearity Gain VOS FV INL FV Gain – 100 – 0.025 – 0.985 100 0.025 1.015 mV % FSVR V/V IL E A K – 20 20 nA – 10 – 100 –1 – 40 10 100 1 40 µA µA mA mA VOS MI INL MI Gain CM Error ∆CM Error – 400 – 0.122 3.94 – 10 – 10.5 400 0.122 4.06 10 10.5 mV % FSCR V/V mV/V mV IL E A K – 150 150 nA 12 nF FORCE/SENSE Combined Leakage Current in HiZ Mode Compliance Current Measurement Range Range A Range B Range C Range D Current Measurement Accuracy (@ I/V MONITOR) Offset Linearity (Note 3) Gain (Note 4) Common Mode Error Common Mode Linearity I/V MONITOR Output Leakage Current in Disable Mode Capacitive Loading Range @ I/V MONITOR 2000 Semtech Corp. CI / V M O N I T O R 13 1 4 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS DC Characteristics (continued) Description Symbol Min IVIN IBIAS CF O R C E IF O R C E Typ Max Units VEE + 1.0 – 0.4 VCC – 3.0 0.4 12 V µA nF – 10 – 100 –1 – 40 10 100 1 40 µA µA mA mA 4 0.26 0.35 0.075 0.1 % FSCR V/V % FSCR % FSCR/V %FSCR Force Current/Measure Voltage Mode Input Voltage Range @ IVIN Input Bias Current @ IVIN Capacitive Loading Range @ FORCE for Stability Output Forcing Current Range A Range B Range C Range D Forcing Current Accuracy (@ FORCE) Offset Gain (Note 5) Linearity @ FORCE = – 5V to 7V Common Mode Error Common Mode Linearity IOS FI Gain FI INL ICM Error ∆CM Error –4 0.24 – 0.35 – 0.075 – 0.1 IL E A K – 20 20 nA VC O M P L I A N C E VEE + 4.5 VCC – 5.0 V VOS MV Gain MV INL – 100 0.985 – 0.025 100 1.015 0.025 mV V/V % FSVR IL E A K – 150 150 nA 12 nF FORCE/SENSE Combined Leakage Current in HiZ Mode Compliance Voltage Range Voltage Measurement Accuracy (@ I/V MONITOR) Offset Gain Linearity (Note 3) I/V MONITOR Output Leakage Current in Disable Mode Capacitive Loading Range @ I/V MONITOR CI / V M O N IT O R 0.25 1 Comparator Input Voltage Range (I/V MIN, I/V MAX) VIN VEE + 1 VCC – 3 V Input Offset Voltage VOS – 100 100 mV Input Bias Current (I/V MIN, I/V MAX) IIN – 0.4 0.4 µA Output Low Level @ IOL = 1 mA (DUT LTH, DUT GTL, PASS/FAIL*) VOL 400 mV Output Leakage in DISABLED Mode IOH –1 1 µA IL E A K – 0.2 0.2 µA IIN – 0.2 0.2 µA Output Leakage DISABLE Input Bias Current 2000 Semtech Corp. 14 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS DC Characteristics (continued) Description Symbol Min Input High Level VIH 2.4 Input Low Level VIL Input Bias Current IIN – 0.2 Input High Level (MODE SEL, HIZ) VIH 2.4 Input Low Level (MODE SEL, HIZ) VIL MODE SEL Input Bias Current IIN HIZ Input Bias Current IIN Typ Max Units Analog MUX (RS1, RS2) V 0.8 V 0.2 µA Other Digital Inputs V 0 .8 V – 0.2 0.2 µA –1 50 µA DC Test Conditions: CAPI = 120 pF connected to GND, CA – CB = 120 pF, COMP1 – COMP2 = 120 pF, TA = 25˚C unless otherwise noted. Note 1: Note 2: Note 3: Note 4: Test Conditions are as follows: VCC = 12 to 13V, VEE = –10V, 40 mA is externally forced into FORCE pin. Guaranteed by design and characterization. Not production tested. Characterized with a ± 10 µA current load at I/V MONITOR. V/V units derived as follows: MI Gain = Note 5: V IVMON (I MEASURED x R EXT ) V/V units derived as follows: FI Gain = I FORCE x R EXT V IVIN Unit Definitions: FSCR = Full Scale Current Range Range A, FSCR = 20 µA Range B, FSCR = 200 µA Range C, FSCR = 2 mA Range D, FSCR = 80 mA FSVR = Full Scale Voltage Range = 12V nominal (–5V to 7V) 2000 Semtech Corp. 15 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS Description Symbol Min Typ Max Units 150 120 µs µs 300 µs 35 µs 400 125 µs µs 1.5 300 ms µs 1 450 µs ns 700 250 µs µs 2 300 ms µs 35 µs 700 250 µs µs 2 350 ms µs 1 0.45 µs µs Force Voltage / Measure Current Mode FORCE Voltage Settling Time (100 pF load @ FORCE) To 0.1% of 10V Step Range A Ranges B, C, D To 0.025% of 10V Step All Ranges FORCE Amp Saturation Recovery Time Measure Current Settling Time (100 pF load @ I/V MONITOR) To 0.1% of FSCR Range A Ranges B, C, D To 0.025% of FSCR Range A Ranges B, C, D Disable Time, HiZ Low to High Enable Time, HiZ High to Low tsettle ts a t tsettle tz to e Force Current / Measure Voltage Mode FORCE Output Current Settling Time (100 pF load @ FORCE) To 0.1% of FSCR Range A Ranges B, C, D To 0.025% of FSCR Range A Ranges B, C, D FORCE Amp Saturation Recovery Time Measure Voltage Settling Time (100 pF load @ I/V MONITOR) To 0.1% of 10V Step Range A Ranges B, C, C To 0.025% of 10V Step Range A Ranges B, C, D Disable Time, HiZ Low to High Enable Time, HiZ High to Low 2000 Semtech Corp. tsettle ts a t tsettle tz to e 16 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS AC Characteristics Description Symbol Min Typ Max Units tp d 30 µs Disable Time, DISABLE Low to High tz 300 ns Enable Time, DISABLE High to Low to e 5.5 µs Disable Time, DISABLE Low to High tz 350 ns Enable Time, DISABLE High to Low to e 40 µs MODE SEL Propagation Delay tp d 10 µs RS0/RS1 Propagation Delay tp d 1 µs Comparator Propagation Delay I/V MONITOR Mode/Range Selection AC Test Conditions: CAPI = 120 pF connected to GND, CA – CB = 120 pF, COMP1 – COMP2 = 120 pF, TA = 25˚C unless otherwise noted. Settling times guaranteed by design and characterization (not production tested). 2000 Semtech Corp. 17 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS Ordering Information Model Number Package E737ATF 32-Pin TQFP 7 mm x 7 mm EVM737ATF Edge737H Evaluation Module This device is ESD sensitive. Care should be taken when handling and installing this device to avoid damaging it. Contact Information Semtech Corporation Test and Measurement Division 10021 Willow Creek Rd., San Diego, CA 92131 Phone: (858)695-1808 FAX (858)695-2633 2000 Semtech Corp. 18 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS Revision History Current Revision Date: June 21, 2002 Previous Revision Date: January 14, 2002 Page # Section Name all Previous Revision Current Revision TTL Change all "TTL" to "digital". 6 Circuit Description Update Functional Block Diagram 8 Power Supply Sequencing paragraph rewritten 12 Recommended Operating Conditions 12 Ab Max Ratings 13 DC Characteristics Positive Analog Power Supply, Max: 13 Positive Analog Power Supply, Max: 12.5 Thermal Resistance of Package, Sym: θJA Thermal Resistance of Package, Sym: θJC Positive Analog Power Supply, Max: 12.5 Positive Analog Power Supply, Max: 13 Delete: Ambient Operating Temperature Power Supplies Positive Supply Negative Supply Power Supplies Positive Supply (no-load), Typ: 5 Negative Supply (no-load), Typ: –5 Add: Positive & Negative Supply Breakdown & Rejection values Power Supply Rejction Ratio Power Supply Rejction Ratio (Note 2) Add: Ranges with values Force Voltage/Measure Current Capacative Loading Range, Max: TBD Output Forcing Voltage Range, Max: VCC – 4.5 Force Voltage/Measure Current Capacative Loading Range, Max: 12 Output Forcing Voltage Range, Max: VCC – 5.0 Forcing Voltage Accuracy Linearity, Min: –0.083, Max: 0.083 Gain Error, Min: –0.015, Max: +0.015 Forcing Voltage Accuracy Linearity, Min: –0.025, Max: 0.025 Gain, Min: –0.985, Typ: 1, Max: 1.015 FORCE/SENSE Combined Leakage, Min: TBD, Max: TBD, Units, TBD FORCE/SENSE Combined Leakage, Min: –20, Max: 20, Units, nA Current Measurement Accuracy Gain Error, Min: TBD, Max: TBD Linearity Current Measurement Accuracy Gain (Note 2), Min: 3.94, Typ: 4, Max: 4.06 Linearity (Ntoe 3) Common Mode Error, Min: –4.3, Max: 4.3 Common Mode Error, Min: –10, Max: 10 Common Mode Linearity, MIn: –.9, Max: –.9 Common Mode Linearity, MIn: –10.5, Max: 10.5 I/V MONITOR Output Leakage Min: TBD, Max: TBD I/V MONITOR Output Leakage Min: –150, Max: 150 nA Delete: I/V Monitor Output Current Range Capacitive Loading Range, Max: TBD Capacitive Loading Range, Max: 12 (continued next page) 2000 Semtech Corp. 19 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS Revision History Current Revision Date: June 21, 2002 (continued) Previous Revision Date: January 14, 2002 Page # Section Name Previous Revision Current Revision 14 DC Characteristics Force Current/Measure Voltage Capacitive Loading Range, Max: TBD Force Current/Measure Voltage Capacitive Loading Range, Max: 12 Forcing Current Accuracy Gain Error, Min: TBD, Max: TBD, Units: % FSCR Common Mode Error, Min: –0.7, Max: 0.7 Forcing Current Accuracy Gain (Note 5), Min: 0.24, Typ: 0.25, Max: 0.26, Units: V/V Common Mode Error, Min: –0.075, Max: 0.075 FORCE/SENSE Combined Leakage Current, Min: TBD, Max: TBD FORCE/SENSE Combined Leakage Current, Min: –20, Max: 20 nA Compliance Voltage Range, Max: VCC – 4.5 Compliance Voltage Range, Max: VCC – 4.5 V Voltage Measurement Accuracy Gain Error, Min: TBD, Max: TBD Linearity Voltage Measurement Accuracy Gain, Min: 0.985, Typ: 1, Max: 1.015 V/V Linearity (Note 3) I/V MONITOR Output Leakage Current, Max: TBD I/V MONITOR Output Leakage Current, Min: –10, Max: 10 µA Capacitive Loading Range, Max: TBD Capacitive Loading Range, Max: 12 nF Delete: I/V MONITOR Output Current Range Comparator Output Leakage in Disabled Mode, Max: 100 Output Leakage, Max: TBD Comparator Output Leakage in Disabled Mode, Min: –1, Max: 1 Output Leakage, MIn: –0.2, Max: 0.2 HiZ Input Bias Current, Min: –1 Add: Notes 1-5 15 DC Characteristics HiZ Input Bias Current, Min: –0.2 16 AC Characteristics FORCE Voltage/Measure Current Mode Force Voltage Settling Time (All Ranges) FORCE Amp Saturation Recovery Time, Max: TBD Disable Time, Max: TBD Enable Time, Max: TBD FORCE Voltage/Measure Current Mode Force Voltage Settling Time To 0.1% of 10V Step To 0.025% of 10V Step FORCE Amp Saturation Recovery Time, Max: 35 µs Disable Time, Max: 1 µs Enable Time, Max: 450 ns Add: Measure Current Settling Time Force Current/Meausre Voltage Mode FORCE Output Current Settling Time Force Current/Meausre Voltage Mode Force Voltage Settling Time 100 pF load @ FORCE) To 0.1% of FSCR To 0.025% of FSCR FORCE Amp Saturation Recovery Time, Max: TBD Disable Time, Max: TBD Enable Time, Max: TBD FORCE Amp Saturation Recovery Time, Max: 35 µs Disable Time, Max: 1 µs Enable Time, Max: 0.45 µs Add: Measure Voltae Settling Time Comparator Propagation Delay, Max: 20 ns Disable Time, Max: 20 ns Enable Time, Max: 20 ns Comparator Propagation Delay, Max: 30 µs Disable Time, Max: 300 Enable Time, Max: 5.5 µs I/V MONITOR Disable Time, Max: 40 I/V MONITOR Disable Time, Max: 350 Delete: Output Settling Time Mode/Range Selection MODE SEL Prop Delay, Max: TBD RS0/RS1 Prop Delay, Max: TBD Mode/Range Selection MODE SEL Prop Delay, Max: 10 µs RS0/RS1 Prop Delay, Max: 1 µs Delete: Notes 1-3 2000 Semtech Corp. 20 www .semtech.com Edge737 PRELIMINARY TEST AND MEASUREMENT PRODUCTS Revision History Current Revision Date: January 14, 2002 Previous Revision Date: October 23, 2001 Page # Section Name Previous Revision Current Revision 2 Pin Description DISABLE ... outputs in high impedance. DISABLE ... outputs and I/V MONITOR in high impedance. 5 Circuit Description DISABLE Section ... which places DUT LTH, DUT GTL, and PASS/FAIL* ... DISABLE Section ... which places DUT LTH, DUT GTL, I/V MONITOR, and PASS/FAIL* ... 6 Circuit Description 12 Recommended Operating Conditons Replace Detailed Block Diagram with Functional Schematic Ambient Operating Temperature, Symbol: TA Case Temperature, Symbol: TC Thermal Resistance (Junction to Still Air), Typ: 92.4 Thermal Resistance (Junction to Case, Typ: 14/4 Add: Thermal Resistance of Package Add: Capacitive Loading Range @ I/V MONITOR 13, 14 DC Characteristics 14 DC Characteristics 16 AC Characteristics Add: Capacitive Loading Range @ FORCE for Stability Add: FORCE/SENSE Combined eakage Current Add: Compliance Current Measurement Range Add: Compliance Voltage Range Add: I/V MONITOR Output Leakage Current in Disable Mode Add: I/V MONITOR Output Current Range Add: DC Test Conditions Add: Capacitive Loading Range @ I/V MONITOR Input High Level, Min: 2 Input High Level, Min: 2.4 New Table Current Revision Date: October 23, 2001 Previous Revision Date: September 27, 2001 Page # 12 Section Name Previous Revision Current Revision Force Voltage/Measure Current and Force Current/Measure Voltage Modes DC Characteristics Add: Output Leakage Current in HiZ Add: Symbol info for Linearity & Gain Error Input Voltage Range @ IVIN, Min: VEE + 1.5, Max: VCC – 3.5 13 DC Characteristics 14 AC Characteristics Input Voltage Range @ IVIN, Min: VEE + 1.0, Max: VCC – 3.0 Output Leakage - add symbol info Delete: Measured Current Settling Time Add: Disable Time and Enable Time specs 15 2000 Semtech Corp. Add: ESD Note 21 www .semtech.com