CYPRESS CY7C1011CV33_09

CY7C1011CV33
2-Mbit (128K x 16) Static RAM
Features
Functional Description
■
Temperature ranges
❐ Industrial: –40°C to 85°C
❐ Automotive-A: –40°C to 85°C
❐ Automotive-E: –40°C to 125°C
The CY7C1011CV33 is a high performance CMOS static RAM
organized as 131,072 words by 16 bits. This device has an
automatic power down feature that significantly reduces power
consumption when deselected.
■
Pin and function compatible with CY7C1011BV33
■
High speed
❐ tAA = 10 ns (Industrial and Automotive-A)
❐ tAA = 12 ns (Automotive-E)
■
Low active power
❐ 360 mW (max) (Industrial and Automotive-A)
■
Data Retention at 2.0
■
Automatic power down when deselected
■
Independent control of upper and lower bits
■
Easy memory expansion with CE and OE features
■
Available in Pb-free 44-pin TSOP II, 44-pin TQFP and non
Pb-free 48-Ball VFBGA packages
To write to the device, take Chip Enable (CE) and Write Enable
(WE) inputs LOW. If Byte Low Enable (BLE) is LOW, then data
from I/O pins (I/O0 through I/O7), is written into the location
specified on the address pins (A0 through A16). If Byte High
Enable (BHE) is LOW, then data from I/O pins (I/O8 through
I/O15) is written into the location specified on the address pins
(A0 through A16).
To read from the device, take Chip Enable (CE) and Output
Enable (OE) LOW while forcing the Write Enable (WE) HIGH. If
Byte Low Enable (BLE) is LOW, then data from the memory
location specified by the address pins appear on I/O0 to I/O7. If
Byte High Enable (BHE) is LOW, then data from memory
appears on I/O8 to I/O15. For more information, see the “Truth
Table” on page 9 for a complete description of Read and Write
modes.
The input and output pins (I/O0 through I/O15) are placed in a
high impedance state when the device is deselected (CE HIGH),
the outputs are disabled (OE HIGH), the BHE and BLE are
disabled (BHE, BLE HIGH), or during a write operation (CE LOW
and WE LOW).
For best practice recommendations, refer to the Cypress
application note AN1064, SRAM System Guidelines.
Logic Block Diagram
SENSE AMPS
A0
A1
A2
A3
A4
A5
A6
A7
A8
ROW DECODER
INPUT BUFFER
128K x 16
RAM Array
I/O0–I/O7
I/O8–I/O15
•
BHE
WE
CE
OE
BLE
A16
A15
A14
A12
A13
A9
Cypress Semiconductor Corporation
Document Number: 38-05232 Rev. *H
A10
A11
COLUMN DECODER
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised February 23, 2009
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CY7C1011CV33
Pin Configuration
Figure 1. 44-Pin TSOP II [1]
A4
A3
A2
A1
A0
CE
I/O0
I/O1
I/O2
I/O3
VCC
VSS
I/O4
I/O5
I/O6
I/O7
WE
A16
A15
A14
A13
A12
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
Figure 2. 48-Ball VFBGA Pinout [1]
A5
A6
A7
OE
BHE
BLE
I/O15
I/O14
I/O13
I/O12
VSS
VCC
I/O11
I/O10
I/O9
I/O8
NC
A8
A9
A10
A11
NC
1
2
3
4
5
6
BLE
OE
A0
A1
A2
NC
A
I/O8
BHE
A3
A4
CE
I/O0
B
I/O9
I/O10
A5
A6
I/O1
I/O2
C
VSS I/O11
NC
A7
VCC
D
VCC
NC
A16
I/O4
VSS
E
I/O14 I/O13 A14
A15
I/O5
I/O6
F
I/O12
I/O3
I/O15
NC
A12
A13
WE
I/O7
G
NC
A8
A9
A10
A11
NC
H
A12
A11
A10
A9
OE
BHE
BLE
40
39
38
37
36
35
34
A13
A14
A15
A16
Figure 3. 44-Pin TQFP
42
41
43
44
1
I/O10
I/O5
9
I/O9
I/O6
10
24
I/O8
I/O7
11
23
NC
21
26
25
22
8
A8
7
I/O4
A7
VSS
I/O11
20
VCC
27
A5
6
A6
VCC
18
VSS
28
19
29
NC
5
17
4
I/O3
16
I/O2
A4
I/O13
I/O12
A3
31
30
14
3
15
I/O1
A1
2
A2
I/O0
I/O14
13
I/O15
32
12
33
WE
A0
1
CE
Note
1. NC pins are not connected on the die.
Document Number: 38-05232 Rev. *H
Page 2 of 13
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CY7C1011CV33
Selection Guide
Description
Maximum Access Time
Maximum Operating Current
-10
-12
10
12
ns
Industrial
100
95
mA
Automotive-A
100
Automotive-E
Maximum CMOS Standby Current
Industrial
10
Automotive-A
10
Automotive-E
Document Number: 38-05232 Rev. *H
Unit
mA
120
mA
10
mA
mA
15
mA
Page 3 of 13
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CY7C1011CV33
Maximum Ratings
Current into Outputs (LOW) ........................................ 20 mA
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied ............................................ –55°C to +125°C
Static Discharge Voltage............................................ >2001V
(MIL-STD-883, Method 3015)
Latch Up Current ..................................................... >200 mA
Operating Range
Range
Supply Voltage on VCC Relative to GND[2] .....–0.5V to +4.6V
Ambient
Temperature (TA)
VCC
–40°C to +85°C
3.3V ± 10%
DC Voltage Applied to Outputs
in High Z State[2] ...................................... –0.5V to VCC+0.5V
Industrial
DC Input Voltage[2] .................................. –0.5V to VCC+0.5V
Automotive-A
–40°C to +85°C
Automotive -E
–40°C to +125°C
Electrical Characteristics
Over the Operating Range
Parameter
Description
-10
Test Conditions
Min
-12
Max
VOH
Output HIGH Voltage
VCC = Min, IOH = –4.0 mA
VOL
Output LOW Voltage
VCC = Min, IOL = 8.0 mA
VIH
Input HIGH Voltage
2.0
VCC
+ 0.3
VIL
Input LOW Voltage[2]
–0.3
IIX
Input Leakage
Current
Industrial
Automotive-A
GND < VI < VCC
2.4
Output Leakage Current
GND < VI < VCC,
Output disabled
VCC Operating Supply Current VCC = Max, IOUT = 0 mA,
f = fMAX = 1/tRC
Automatic CE Power Down
Current —TTL Inputs
Max VCC, CE > VIH
VIN > VIH or VIN < VIL, f = fMAX
V
VCC
+ 0.3
V
0.8
–0.3
0.8
V
–1
+1
–1
+1
μA
–1
+1
–20
+20
–1
+1
–20
+20
Industrial
–1
+1
Automotive-A
–1
+1
Industrial
100
Automotive-A
100
Automatic CE Power Down
Current — CMOS Inputs
Max VCC, CE > VCC – 0.3V,
VIN > VCC – 0.3V, or
VIN < 0.3V, f = 0
Industrial
40
Automotive-A
40
mA
40
mA
45
Industrial
10
Automotive-A
10
Automotive -E
95
μA
120
Automotive -E
ISB2
V
2.0
Automotive -E
ISB1
Unit
0.4
Automotive -E
ICC
Max
2.4
0.4
Automotive -E
IOZ
Min
10
mA
15
Note
2. VIL (min) = –2.0V for pulse durations of less than 20 ns.
Document Number: 38-05232 Rev. *H
Page 4 of 13
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CY7C1011CV33
Capacitance
Tested initially and after any design or process changes that may affect these parameters.
Parameter
Description
CIN
Input Capacitance
COUT
Output Capacitance
Test Conditions
TA = 25°C, f = 1 MHz, VCC = 3.3V
Max
Unit
8
pF
8
pF
Thermal Resistance
Tested initially and after any design or process changes that may affect these parameters.
Parameter
Description
ΘJA
Thermal Resistance
(Junction to Ambient)
ΘJC
Thermal Resistance
(Junction to Case)
Test Conditions
Still Air, soldered on a 3 × 4.5 inch,
four-layer printed circuit board
TSOP II
TQFP
VFBGA
Unit
44.56
42.66
46.98
°C/W
10.75
14.64
9.63
°C/W
Figure 4. AC Test Loads and Waveforms [3]
10-ns devices:
12-ns devices:
Z = 50Ω
50 Ω
* CAPACITIVE LOAD CONSISTS
OF ALL COMPONENTS OF THE
TEST ENVIRONMENT
R 317Ω
3.3V
OUTPUT
30 pF*
OUTPUT
R2
351Ω
30 pF*
1.5V
(b)
(a)
High-Z characteristics:
3.0V
GND
ALL INPUT PULSES
90%
90%
10%
10%
Rise Time: 1 V/ns
(c)
R 317Ω
3.3V
Fall Time: 1 V/ns
OUTPUT
R2
351Ω
5 pF
(d)
Note
3. AC characteristics (except High-Z) for 10-ns parts are tested using the load conditions shown in Figure 4 (a). All other speeds are tested using the Thevenin load shown
in Figure 4 (b). High-Z characteristics are tested for all speeds using the test load shown in Figure 4 (d).
Document Number: 38-05232 Rev. *H
Page 5 of 13
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CY7C1011CV33
Switching Characteristics
Over the Operating Range [4]
Parameter
-10
Description
Min
-12
Max
Min
Max
Unit
Read Cycle
tpower[5]
VCC(Typical) to the First Access
1
1
μs
tRC
Read Cycle Time
10
12
ns
tAA
Address to Data Valid
tOHA
Data Hold from Address Change
tACE
CE LOW to Data Valid
tDOE
OE LOW to Data Valid
10
12
ns
10
12
ns
5
6
ns
3
Industrial/Automotive-A
3
Automotive-E
Z[6]
tLZOE
OE LOW to Low
tHZOE
OE HIGH to High Z[6, 7]
tLZCE
CE LOW to Low
tHZCE
CE HIGH to High
8
0
3
Z[6, 7]
tPU
CE LOW to Power Up
tPD
CE HIGH to Power Down
tDBE
Byte Enable to Data Valid
0
5
Z[6]
tLZBE
Byte Enable to Low Z
Byte Disable to High Z
ns
3
5
0
Industrial/Automotive-A
ns
6
ns
6
ns
0
ns
10
12
ns
5
6
ns
Automotive-E
tHZBE
ns
8
0
0
5
ns
6
ns
Write Cycle[8, 9]
tWC
Write Cycle Time
10
12
ns
tSCE
CE LOW to Write End
7
8
ns
tAW
Address Setup to Write End
7
8
ns
tHA
Address Hold from Write End
0
0
ns
tSA
Address Setup to Write Start
0
0
ns
tPWE
WE Pulse Width
7
8
ns
tSD
Data Setup to Write End
5
6
ns
tHD
Data Hold from Write End
0
0
ns
3
3
ns
WE HIGH to Low
Z[6]
tHZWE
WE LOW to High
Z[6, 7]
tBW
Byte Enable to End of Write
tLZWE
5
7
6
8
ns
ns
Notes
4. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, and input pulse levels of 0 to 3.0V.
5. tPOWER gives the minimum amount of time that the power supply is at typical VCC values until the first memory access is performed.
6. At any temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any device.
7. tHZOE, tHZBE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in part (d) of “AC Test Loads and Waveforms [3]” on page 5. Transition is measured
±500 mV from steady state voltage.
8. The internal write time of the memory is defined by the overlap of CE LOW, WE LOW, and BHE/BLE LOW. CE, WE, and BHE/BLE must be LOW to initiate a write.
The transition of these signals terminate the write. The input data setup and hold timing is referenced to the leading edge of the signal that terminates the write.
9. The minimum write cycle time for Write Cycle No. 3 (WE controlled, OE LOW) is the sum of tHZWE and tSD.
Document Number: 38-05232 Rev. *H
Page 6 of 13
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CY7C1011CV33
Switching Waveforms
Figure 5. Read Cycle No. 1 (Address Transition Controlled)[10, 11]
tRC
RC
ADDRESS
tOHA
DATA OUT
tAA
PREVIOUS DATA VALID
DATA VALID
Figure 6. Read Cycle No. 2 (OE Controlled)[11, 12]
ADDRESS
tRC
CE
tACE
OE
tHZOE
tDOE
tLZOE
BHE, BLE
tHZCE
tDBE
tLZBE
DATA OUT
HIGH IMPEDANCE
tLZCE
VCC
SUPPLY
CURRENT
tHZBE
DATA VALID
HIGH
IMPEDANCE
tPD
tPU
50%
50%
ICC
ISB
Notes
10. Device is continuously selected. OE, CE, BHE, and/or BLE = VIL.
11. WE is HIGH for read cycle.
12. Address valid prior to or coincident with CE transition LOW.
Document Number: 38-05232 Rev. *H
Page 7 of 13
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CY7C1011CV33
Switching Waveforms
(continued)
Figure 7. Write Cycle No. 1 (CE Controlled)[13, 14]
tWC
ADDRESS
tSA
tSCE
CE
tAW
tHA
tPWE
WE
tBW
BHE, BLE
tSD
tHD
DATA IO
Figure 8. Write Cycle No. 2 (BLE or BHE Controlled)
tWC
ADDRESS
BHE, BLE
tSA
tBW
tAW
tHA
tPWE
WE
tSCE
CE
tSD
tHD
DATA I/O
Notes
13. Data I/O is high impedance if OE, BHE, and/or BLE = VIH.
14. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high impedance state.
Document Number: 38-05232 Rev. *H
Page 8 of 13
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CY7C1011CV33
Switching Waveforms
(continued)
Figure 9. Write Cycle No. 3 (WE Controlled, LOW)
tWC
ADDRESS
tSCE
CE
tAW
tHA
tSA
tPWE
WE
tBW
BHE, BLE
tHZWE
tSD
tHD
DATA I/O
tLZWE
Truth Table
CE
OE
WE
BLE
BHE
H
X
X
X
X
High Z
High Z
Power Down
Standby (ISB)
L
L
H
L
L
Data Out
Data Out
Read – All Bits
Active (ICC)
L
L
H
L
H
Data Out
High Z
Read – Lower Bits Only
Active (ICC)
L
L
H
H
L
High Z
Data Out
Read – Upper Bits Only
Active (ICC)
L
X
L
L
L
Data In
Data In
Write – All Bits
Active (ICC)
L
X
L
L
H
Data In
High Z
Write – Lower Bits Only
Active (ICC)
L
X
L
H
L
High Z
Data In
Write – Upper Bits Only
Active (ICC)
L
H
H
X
X
High Z
High Z
Selected, Outputs Disabled
Active (ICC)
Document Number: 38-05232 Rev. *H
I/O0– I/O7 I/O8 – I/O15
Mode
Power
Page 9 of 13
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CY7C1011CV33
Ordering Information
Speed
(ns)
10
12
Package
Diagram
Ordering Code
Package Type
Operating
Range
CY7C1011CV33-10BVI
51-85150 48-ball (6 x 8 x 1 mm) VFBGA
Industrial
CY7C1011CV33-10ZSXA
51-85087 44-pin TSOP II (Pb-Free)
Automotive-A
CY7C1011CV33-12AXI
51-85064 44-pin TQFP (Pb-Free)
Industrial
CY7C1011CV33-12ZSXE
51-85087 44-pin TSOP II (Pb-Free)
Automotive-E
Package Diagrams
Figure 10. 44-Pin Thin Small Outline Package Type II, 51-85087
51-85087-*A
Document Number: 38-05232 Rev. *H
Page 10 of 13
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CY7C1011CV33
Package Diagrams
(continued)
Figure 11. 44-Pin Thin Plastic Quad Flat Pack, 51-85064
12.00±0.25 SQ
10.00±0.10 SQ
44
34
0° MIN.
1
33
0.37±0.05
R. 0.08 MIN.
0.20 MAX.
STAND-OFF
0.05 MIN.
0.15 MAX.
0.25
GAUGE PLANE
R. 0.08 MIN.
0.20 MIN.
0-7°
0.20 MIN.
0.60±0.15
1.00 REF.
11
0.80
B.S.C.
23
DETAIL
12
A
22
NOTE:
1. JEDEC STD REF MS-026
SEATING PLANE
1.60 MAX.
12°±1°
(8X)
1.40±0.05
2. BODY LENGTH DIMENSION DOES NOT INCLUDE MOLD PROTRUSION/END FLASH
MOLD PROTRUSION/END FLASH SHALL NOT EXCEED 0.0098 in (0.25 mm) PER SIDE
BODY LENGTH DIMENSIONS ARE MAX PLASTIC BODY SIZE INCLUDING MOLD MISMATCH
3. DIMENSIONS IN MILLIMETERS
0.10
0.20 MAX.
SEE DETAIL
Document Number: 38-05232 Rev. *H
A
51-85064-*C
Page 11 of 13
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CY7C1011CV33
Package Diagrams
(continued)
Figure 12. 48-Ball VFBGA (6 x 8 x 1 mm), 51-85150
BOTTOM VIEW
TOP VIEW
A1 CORNER
Ø0.05 M C
Ø0.25 M C A B
A1 CORNER
Ø0.30±0.05(48X)
2
3
4
5
6
6
5
4
3
2
1
C
C
E
F
G
D
E
2.625
D
0.75
A
B
5.25
A
B
8.00±0.10
8.00±0.10
1
F
G
H
H
A
1.875
A
B
0.75
6.00±0.10
3.75
0.55 MAX.
6.00±0.10
0.10 C
0.21±0.05
0.25 C
B
0.15(4X)
51-85150-*D
Document Number: 38-05232 Rev. *H
1.00 MAX
0.26 MAX.
SEATING PLANE
C
Page 12 of 13
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CY7C1011CV33
Document History Page
Document Title: CY7C1011CV33, 2-Mbit (128K x 16) Static RAM
Document Number: 38-05232
Issue
Orig. of
REV. ECN NO.
Description of Change
Date
Change
**
117132 07/31/02
HGK
New Data Sheet
*A
118057 08/19/02
HGK
Pin configuration for 48-ball FBGA correction
*B
119702 10/11/02
DFP
Updated FBGA to VFBGA; updated package code on page 8 to BV48A. Updated
address pinouts on page 1 to A0 to A16. Updated CMOS standby current on page 1
from 8 to 10 mA
*C
386106 See ECN
PCI
Added lead-free parts in Ordering Information Table
*D
498501 See ECN
NXR
Corrected typo in the Logic Block Diagram on page# 1
Included the Maximum Ratings for Static Discharge Voltage and Latch up Current on
page# 3
Changed the description of IIX from Input Load Current to
Input Leakage Current in DC Electrical Characteristics table
Updated the Ordering Information Table
*E
522620 See ECN
VKN
Added Thermal Resistance Table
*F
1891366 See ECN VKN/AESA Added -10ZSXA part
Updated Ordering Information table
*G
2428606 See ECN VKN/PYRS Corrected typo in the 44-Pin TSOP and 48-Ball FBGA pinout
Removed Commercial parts
Removed 15 ns speed bin
Removed inactive parts from the Ordering Information table
*H
2664421 02/25/09 VKN/AESA Added Automotive-E specs for 12 ns speed
Updated Ordering Information table
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© Cypress Semiconductor Corporation, 2009. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any
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Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
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assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
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Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 38-05232 Rev. *H
Revised February 23, 2009
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