PHILIPS IP4337CX18/LF

IP4337CX18/LF
7-channel integrated filter network with ESD input protection
to IEC 61000-4-2 level 4
Rev. 02 — 20 August 2009
Product data sheet
1. Product profile
1.1 General description
The IP4337CX18/LF is a 7-channel RC low-pass filter array which is designed to provide
filtering of undesired RF signals in the 800 MHz to 3000 MHz frequency band. In addition,
the IP4337CX18/LF incorporates diodes to provide protection to downstream components
from ElectroStatic Discharge (ESD) voltages as high as ±15 kV.
The IP4337CX18/LF is fabricated using monolithic silicon technology and integrates
7 resistors and 14 diodes in a single Wafer-Level Chip-Scale Package (WLCSP)
measuring 1.96 mm by 1.61 mm (typical). These features make the IP4337CX18/LF ideal
for use in applications requiring the utmost in miniaturization.
1.2 Features
n
n
n
n
Pb-free, RoHS compliant and free of halogen and antimony (Dark Green compliant)
Integrated 7-channel π-type RC filter network
70 Ω series resistance; 25 pF (typical) capacitance per line
Integrated ESD protection withstanding ±15 kV contact discharge, far exceeding
IEC 61000-4-2 level 4
n WLCSP with 0.4 mm pitch
1.3 Applications
n Cellular and Personal Communication System (PCS) mobile handsets
n Cordless telephones
n Wireless data (WAN/LAN) systems
IP4337CX18/LF
NXP Semiconductors
7-channel integrated filter network with ESD input protection
2. Pinning information
2.1 Pinning
bump A1
index area
IP4337CX18/LF
1
2
3
4
5
A
B
C
D
008aaa185
Transparent top view
Fig 1.
Pin configuration IP4337CX18/LF
2.2 Pin description
Table 1.
Pinning
Pin
Description
A2 and A5
filter channel 1
A1 and A4
filter channel 2
B1 and B5
filter channel 3
C2 and C5
filter channel 4
C1 and C4
filter channel 5
D2 and D5
filter channel 6
D1 and D4
filter channel 7
A3, B3, C3, D3
ground
B2 and B4
no balls
3. Ordering information
Table 2.
Ordering information
Type number
IP4337CX18/LF
Package
Name
Description
Version
WLCSP18
wafer level chip-size package; 18 bumps; 1.96 × 1.61 × 0.61 mm
IP4337CX18/LF
IP4337CX18LF_2
Product data sheet
© NXP B.V. 2009. All rights reserved.
Rev. 02 — 20 August 2009
2 of 12
IP4337CX18/LF
NXP Semiconductors
7-channel integrated filter network with ESD input protection
4. Functional diagram
A1, A2, B1, C1,
C2, D1, D2
Rs(ch)
A4, A5, B5, C4,
C5, D4, D5
A3, B3, C3, D3
008aaa186
Fig 2.
Schematic diagram IP4337CX18/LF
5. Limiting values
Table 3.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
Conditions
VI
input voltage
VESD
electrostatic discharge voltage all pins to ground
Min
Max
Unit
−0.5
+5.5
V
contact discharge
[1]
−15
+15
kV
air discharge
[1]
−15
+15
kV
contact discharge
−8
+8
kV
air discharge
−15
+15
kV
IEC 61000-4-2 level 4;
all pins to ground
Ich
channel current (DC)
Tamb = 70 °C
-
33
mA
Pch
channel power dissipation
continuous power;
Tamb = 70 °C
-
60
mW
Ptot
total power dissipation
continuous power;
Tamb = 70 °C
-
250
mW
Tstg
storage temperature
−55
+150
°C
-
260
°C
−30
+85
°C
Treflow(peak) peak reflow temperature
Tamb
[1]
10 s maximum
ambient temperature
Device is qualified with 1000 pulses of ±15 kV contact discharges each, according to the IEC 61000-4-2
model and far exceeds the specified level 4 (8 kV contact discharge).
IP4337CX18LF_2
Product data sheet
© NXP B.V. 2009. All rights reserved.
Rev. 02 — 20 August 2009
3 of 12
IP4337CX18/LF
NXP Semiconductors
7-channel integrated filter network with ESD input protection
6. Characteristics
Table 4.
Channel characteristics
Tamb = 25 °C; unless otherwise specified.
Symbol Parameter
Rs(ch)
Conditions
channel series resistance f = 0 Hz (DC)
[1]
Min
Typ
Max
Unit
52.5
70
87.5
Ω
Cch
channel capacitance
Vbias(DC) = 0 V; f = 1 MHz
-
25
30
pF
VBR
breakdown voltage
Itest = 1 mA
6
-
20
V
ILR
reverse leakage current
per channel; VI = 3.0 V
-
-
20
nA
[1]
Guaranteed by design.
Table 5.
Frequency characteristics
Tamb = 25 °C; unless otherwise specified.
Symbol Parameter
Conditions
Min
Typ
Max
Unit
αil
insertion loss
800 MHz < f < 3 GHz;
Rgen = 50 Ω; RL = 50 Ω
-
20
-
dB
αct
crosstalk attenuation
800 MHz < f < 3 GHz;
Rgen = 50 Ω; RL = 50 Ω
-
25
-
dB
IP4337CX18LF_2
Product data sheet
© NXP B.V. 2009. All rights reserved.
Rev. 02 — 20 August 2009
4 of 12
IP4337CX18/LF
NXP Semiconductors
7-channel integrated filter network with ESD input protection
7. Application information
7.1 Insertion loss
The insertion loss measurement configuration of a typical 50 Ω NetWork Analyzer (NWA)
system for evaluation of the IP4337CX18/LF is shown in Figure 3.
As an example, the insertion loss of channels between pins A2 and A5, A1 and A4,
B1 and B5, C1 and C4 at frequencies up to 6 GHz is displayed in Figure 4.
The insertion loss is measured with a test PCB utilizing laser drilled micro-via holes that
connect the PCB ground plane to the IP4337CX18/LF ground pins.
IN
DUT
OUT
50 Ω
50 Ω
TEST BOARD
Vgen
001aai755
Fig 3.
Frequency response measurement configuration
001aaj922
0
s21
(dB)
−10
−20
(1)
(2)
−30
−40
(3)
(4)
−50
−60
−70
10−1
1
10
102
103
104
f (MHz)
(1) Channel 2 (pins A1 and A4).
(2) Channel 1 (pins A2 and A5).
(3) Channel 3 (pins B1 and B5).
(4) Channel 5 (pins C1 and C4).
Fig 4.
Measured insertion loss magnitudes
IP4337CX18LF_2
Product data sheet
© NXP B.V. 2009. All rights reserved.
Rev. 02 — 20 August 2009
5 of 12
IP4337CX18/LF
NXP Semiconductors
7-channel integrated filter network with ESD input protection
7.2 Crosstalk
The crosstalk measurement configuration of a typical 50 Ω NWA system for evaluation of
the IP4337CX18/LF is shown in Figure 5.
The measured crosstalk within the IP4337CX18/LF in a 50 Ω NWA system from one
channel to another is shown in Figure 6 for four different pairs of channels. In all cases,
unused connections are terminated with 50 Ω to ground.
IN_1
50 Ω
DUT
IN_2
OUT_2
OUT_1
TEST BOARD
50 Ω
50 Ω
50 Ω
Vgen
001aai756
Fig 5.
Crosstalk measurement configuration
001aaj923
0
αct
(dB)
−10
−20
(1)
(2)
(3)
(4)
−30
−40
−50
−60
−70
10−1
1
10
102
103
104
f (MHz)
(1) Channels 1 and 2 (pins A2 and A4).
(2) Channels 5 and 7 (pins C1 and D4).
(3) Channels 5 and 1 (pins C1 and A5).
(4) Channels 1 and 7 (pins A2 and D4).
Fig 6.
Measured crosstalk between adjacent channels
IP4337CX18LF_2
Product data sheet
© NXP B.V. 2009. All rights reserved.
Rev. 02 — 20 August 2009
6 of 12
IP4337CX18/LF
NXP Semiconductors
7-channel integrated filter network with ESD input protection
8. Package outline
WLCSP18: wafer level chip-size package; 18 bumps; 1.96 x 1.61 x 0.61 mm
A
B
D
IP4337CX18/LF
bump A1
index area
A2
E
A
A1
detail X
e1
e
b
D
e
C
e2
B
A
1
2
3
4
5
X
0
1
Dimensions
Unit
mm
2 mm
scale
A
A1
A2
b
D
E
max 0.66 0.22
0.31 2.01 1.66
nom 0.61 0.20 0.41 0.26 1.96 1.61
min 0.56 0.18
0.21 1.91 1.56
e
e1
e2
0.4
1.6
1.2
ip4337cx18_lf_po
Outline
version
References
IEC
JEDEC
JEITA
Issue date
09-03-31
09-05-19
IP4337CX18/LF
Fig 7.
European
projection
Package outline IP4337CX18/LF (WLCSP18)
IP4337CX18LF_2
Product data sheet
© NXP B.V. 2009. All rights reserved.
Rev. 02 — 20 August 2009
7 of 12
IP4337CX18/LF
NXP Semiconductors
7-channel integrated filter network with ESD input protection
9. Soldering of WLCSP packages
9.1 Introduction to soldering WLCSP packages
This text provides a very brief insight into a complex technology. A more in-depth account
of soldering WLCSP (Wafer Level Chip-Size Packages) can be found in application note
AN10439 “Wafer Level Chip Scale Package” and in application note AN10365 “Surface
mount reflow soldering description”.
Wave soldering is not suitable for this package.
All NXP WLCSP packages are lead-free.
9.2 Board mounting
Board mounting of a WLCSP requires several steps:
1. Solder paste printing on the PCB
2. Component placement with a pick and place machine
3. The reflow soldering itself
9.3 Reflow soldering
Key characteristics in reflow soldering are:
• Lead-free versus SnPb soldering; note that a lead-free reflow process usually leads to
higher minimum peak temperatures (see Figure 8) than a PbSn process, thus
reducing the process window
• Solder paste printing issues, such as smearing, release, and adjusting the process
window for a mix of large and small components on one board
• Reflow temperature profile; this profile includes preheat, reflow (in which the board is
heated to the peak temperature), and cooling down. It is imperative that the peak
temperature is high enough for the solder to make reliable solder joints (a solder paste
characteristic) while being low enough that the packages and/or boards are not
damaged. The peak temperature of the package depends on package thickness and
volume and is classified in accordance with Table 6.
Table 6.
Lead-free process (from J-STD-020C)
Package thickness (mm)
Package reflow temperature (°C)
Volume (mm3)
< 350
350 to 2000
> 2000
< 1.6
260
260
260
1.6 to 2.5
260
250
245
> 2.5
250
245
245
Moisture sensitivity precautions, as indicated on the packing, must be respected at all
times.
Studies have shown that small packages reach higher temperatures during reflow
soldering, see Figure 8.
IP4337CX18LF_2
Product data sheet
© NXP B.V. 2009. All rights reserved.
Rev. 02 — 20 August 2009
8 of 12
IP4337CX18/LF
NXP Semiconductors
7-channel integrated filter network with ESD input protection
maximum peak temperature
= MSL limit, damage level
temperature
minimum peak temperature
= minimum soldering temperature
peak
temperature
time
001aac844
MSL: Moisture Sensitivity Level
Fig 8.
Temperature profiles for large and small components
For further information on temperature profiles, refer to application note AN10365
“Surface mount reflow soldering description”.
9.3.1 Stand off
The stand off between the substrate and the chip is determined by:
• The amount of printed solder on the substrate
• The size of the solder land on the substrate
• The bump height on the chip
The higher the stand off, the better the stresses are released due to TEC (Thermal
Expansion Coefficient) differences between substrate and chip.
9.3.2 Quality of solder joint
A flip-chip joint is considered to be a good joint when the entire solder land has been
wetted by the solder from the bump. The surface of the joint should be smooth and the
shape symmetrical. The soldered joints on a chip should be uniform. Voids in the bumps
after reflow can occur during the reflow process in bumps with high ratio of bump diameter
to bump height, i.e. low bumps with large diameter. No failures have been found to be
related to these voids. Solder joint inspection after reflow can be done with X-ray to
monitor defects such as bridging, open circuits and voids.
9.3.3 Rework
In general, rework is not recommended. By rework we mean the process of removing the
chip from the substrate and replacing it with a new chip. If a chip is removed from the
substrate, most solder balls of the chip will be damaged. In that case it is recommended
not to re-use the chip again.
IP4337CX18LF_2
Product data sheet
© NXP B.V. 2009. All rights reserved.
Rev. 02 — 20 August 2009
9 of 12
IP4337CX18/LF
NXP Semiconductors
7-channel integrated filter network with ESD input protection
Device removal can be done when the substrate is heated until it is certain that all solder
joints are molten. The chip can then be carefully removed from the substrate without
damaging the tracks and solder lands on the substrate. Removing the device must be
done using plastic tweezers, because metal tweezers can damage the silicon. The
surface of the substrate should be carefully cleaned and all solder and flux residues
and/or underfill removed. When a new chip is placed on the substrate, use the flux
process instead of solder on the solder lands. Apply flux on the bumps at the chip side as
well as on the solder pads on the substrate. Place and align the new chip while viewing
with a microscope. To reflow the solder, use the solder profile shown in application note
AN10365 “Surface mount reflow soldering description”.
9.3.4 Cleaning
Cleaning can be done after reflow soldering.
10. Abbreviations
Table 7.
Abbreviations
Acronym
Description
DUT
Device Under Test
ESD
ElectroStatic Discharge
LAN
Local Area Network
NWA
NetWork Analyzer
PCB
Printed-Circuit Board
PCS
Personal Communication System
RoHS
Restriction of Hazardous Substances
WAN
Wide Area Network
WLCSP
Wafer-Level Chip-Scale Package
11. Revision history
Table 8.
Revision history
Document ID
Release date
Data sheet status
Change notice
Supersedes
IP4337CX18LF_2
20090820
Product data sheet
-
IP4337CX18LF_1
-
-
Modifications:
IP4337CX18LF_1
•
Figure 4: figure title and symbol changed
20090618
Product data sheet
IP4337CX18LF_2
Product data sheet
© NXP B.V. 2009. All rights reserved.
Rev. 02 — 20 August 2009
10 of 12
IP4337CX18/LF
NXP Semiconductors
7-channel integrated filter network with ESD input protection
12. Legal information
12.1 Data sheet status
Document status[1][2]
Product status[3]
Definition
Objective [short] data sheet
Development
This document contains data from the objective specification for product development.
Preliminary [short] data sheet
Qualification
This document contains data from the preliminary specification.
Product [short] data sheet
Production
This document contains the product specification.
[1]
Please consult the most recently issued document before initiating or completing a design.
[2]
The term ‘short data sheet’ is explained in section “Definitions”.
[3]
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
12.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
12.3 Disclaimers
General — Information in this document is believed to be accurate and
reliable. However, NXP Semiconductors does not give any representations or
warranties, expressed or implied, as to the accuracy or completeness of such
information and shall have no liability for the consequences of use of such
information.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in medical, military, aircraft,
space or life support equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liability for inclusion and/or use of
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) may cause permanent
damage to the device. Limiting values are stress ratings only and operation of
the device at these or any other conditions above those given in the
Characteristics sections of this document is not implied. Exposure to limiting
values for extended periods may affect device reliability.
Terms and conditions of sale — NXP Semiconductors products are sold
subject to the general terms and conditions of commercial sale, as published
at http://www.nxp.com/profile/terms, including those pertaining to warranty,
intellectual property rights infringement and limitation of liability, unless
explicitly otherwise agreed to in writing by NXP Semiconductors. In case of
any inconsistency or conflict between information in this document and such
terms and conditions, the latter will prevail.
No offer to sell or license — Nothing in this document may be interpreted
or construed as an offer to sell products that is open for acceptance or the
grant, conveyance or implication of any license under any copyrights, patents
or other industrial or intellectual property rights.
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from national authorities.
12.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
13. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
IP4337CX18LF_2
Product data sheet
© NXP B.V. 2009. All rights reserved.
Rev. 02 — 20 August 2009
11 of 12
IP4337CX18/LF
NXP Semiconductors
7-channel integrated filter network with ESD input protection
14. Contents
1
1.1
1.2
1.3
2
2.1
2.2
3
4
5
6
7
7.1
7.2
8
9
9.1
9.2
9.3
9.3.1
9.3.2
9.3.3
9.3.4
10
11
12
12.1
12.2
12.3
12.4
13
14
Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1
General description. . . . . . . . . . . . . . . . . . . . . . 1
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Pinning information . . . . . . . . . . . . . . . . . . . . . . 2
Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 2
Ordering information . . . . . . . . . . . . . . . . . . . . . 2
Functional diagram . . . . . . . . . . . . . . . . . . . . . . 3
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 3
Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Application information. . . . . . . . . . . . . . . . . . . 5
Insertion loss . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Crosstalk. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 7
Soldering of WLCSP packages. . . . . . . . . . . . . 8
Introduction to soldering WLCSP packages . . . 8
Board mounting . . . . . . . . . . . . . . . . . . . . . . . . 8
Reflow soldering . . . . . . . . . . . . . . . . . . . . . . . . 8
Stand off . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Quality of solder joint . . . . . . . . . . . . . . . . . . . . 9
Rework . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Revision history . . . . . . . . . . . . . . . . . . . . . . . . 10
Legal information. . . . . . . . . . . . . . . . . . . . . . . 11
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 11
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Contact information. . . . . . . . . . . . . . . . . . . . . 11
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
© NXP B.V. 2009.
All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
Date of release: 20 August 2009
Document identifier: IP4337CX18LF_2