FAIRCHILD 74F545SC

Revised August 1999
74F545
Octal Bidirectional Transceiver with 3-STATE Outputs
General Description
Features
The 74F545 is an 8-bit, 3-STATE, high-speed transceiver. It
provides bidirectional drive for bus-oriented microprocessor and digital communications systems. Straight through
bidirectional transceivers are featured, with 24 mA bus
drive capability on the A Ports and 64 mA bus drive capability on the B Ports.
One input, Transmit/Receive (T/R) determines the direction
of logic signals through the bidirectional transceiver. Transmit enables data from A-to-B Ports; Receive enables data
from B-to-A Ports. The Output Enable input disables both A
and B Ports by placing them in a 3-STATE condition.
■ Higher drive than 8304
■ 8-bit bidirectional data flow reduces system package
count
■ 3-STATE inputs/outputs for interfacing with bus-oriented
systems
■ 24 mA and 64 mA bus drive capability on A and B Ports,
respectively
■ Transmit/Receive and Output Enable simplify control
logic
■ Guaranteed 4000V minimum ESD protection
Ordering Code:
Order Number
Package Number
Package Description
74F545SC
M20B
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
74F545PC
N20A
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Logic Symbols
Connection Diagram
IEEE/IEC
© 1999 Fairchild Semiconductor Corporation
DS009556
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74F545 Octal Bidirectional Transceiver with 3-STATE Outputs
April 1988
74F545
Unit Loading/Fan Out
Pin Names
U.L.
Input IIH/IIL
HIGH/LOW
Output IOH/IOL
Description
OE
Output Enable Input (Active LOW)
1.0/2.0
20 µA/−1.2 mA
T/R
Transmit/Receive Input
1.0/2.0
20 µA/−1.2 mA
A0–A7
Side A 3-STATE Inputs or
3-STATE Outputs
B0–B7
Side B 3-STATE Inputs or
3-STATE Outputs
3.5/1.083
70 µA/−650 µA
150/40 (33.3)
−3 mA/24 mA (20 mA)
3.5/1.083
70 µA/−650 µA
600/106.6 (80)
−12 mA/64 mA (48 mA)
Truth Table
Inputs
OE
Outputs
T/R
L
L
Bus B Data to Bus A
L
H
Bus A Data to Bus B
H
X
High Z
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Z = High Impedance
Logic Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
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Storage Temperature
−65°C to +150°C
Ambient Temperature under Bias
−55°C to +125°C
Junction Temperature under Bias
−55°C to +150C
VCC Pin Potential to Ground Pin
−0.5V to +7.0V
Input Voltage (Note 2)
−0.5V to +7.0V
Input Current (Note 2)
−30 mA to +5.0 mA
Recommended Operating
Conditions
0°C to +70°C
Free Air Ambient Temperature
+4.5V to +5.5V
Supply Voltage
Voltage Applied to Output
in HIGH State (with VCC = 0V)
Standard Output
−0.5V to VCC
3-STATE Output
−0.5V to +5.5V
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Current Applied to Output
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
twice the rated IOL (mA)
in LOW State (Max)
ESD Last Passing Voltage (Min)
4000V
DC Electrical Characteristics
Symbol
Parameter
Min
Typ
Max
Input HIGH Voltage
VIL
Input LOW Voltage
0.8
V
VCD
Input Clamp Diode Voltage
−1.2
V
VOH
Output HIGH
10% VCC
2.5
Voltage
10% VCC
2.4
10% VCC
2.0
5% VCC
2.7
5% VCC
2.7
VOL
IIH
2.0
Units
VIH
10% VCC
0.5
Voltage
10% VCC
0.55
Input HIGH
Input HIGH Current
Input HIGH Current
Output HIGH
Input Leakage
Test
IOD
Circuit Current
Input LOW Current
IIH + IOZH
Output Leakage Current
IIL + IOZL
Output Leakage Current
IOS
Output Short-Circuit Current
IOH = −15 mA (Bn)
IOL = 24 mA (A n)
V
Min
5.0
µA
Max
VIN = 2.7V (OE, T/R)
7.0
µA
Max
VIN = 7.0V (OE, T/R)
0.5
mA
Max
VIN = 5.5V (An, Bn)
50
µA
Max
VOUT = VCC
V
0.0
3.75
µA
0.0
−1.2
mA
Max
VIN = 0.5V (OE, T/R)
70
µA
Max
VOUT = 2.7V (An, Bn)
−650
µA
Max
VOUT = 0.5V (An, Bn)
mA
Max
500
µA
0.0V
VOUT = 5.25V
mA
Max
VO = HIGH
4.75
Output Leakage
IIL
Min
IOH = −3 mA (An)
Output LOW
Leakage Current
VID
IIN = −18 mA (OE, T/R)
IOH = −1 mA (An)
Breakdown (I/O)
ICEX
Recognized as a LOW Signal
Min
IOH = −3 mA (An)
V
Breakdown Test
IBVIT
Conditions
Recognized as a HIGH Signal
IOH = −1 mA (An)
Current
IBVI
VCC
V
−60
−150
−100
−225
IOL = 64 mA (B n)
IID = 1.9 µA
All Other Pins Grounded
VIOD = 150 mV
All Other Pins Grounded
VOUT = 0V (An)
VOUT = 0V (Bn)
IZZ
Bus Drainage Test
ICCH
Power Supply Current
70
90
ICCL
Power Supply Current
95
120
mA
Max
VO = LOW
ICCZ
Power Supply Current
85
110
mA
Max
VO = HIGH Z
3
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74F545
Absolute Maximum Ratings(Note 1)
74F545
AC Electrical Characteristics
Symbol
Parameter
TA = +25°C
TA = −55°C to +125°C
TA = 0°C to +70°C
VCC = +5.0V
VCC = +5.0V
VCC = +5.0V
CL = 50 pF
CL = 50 pF
CL = 50 pF
Min
Typ
Max
Min
Max
Min
Max
tPLH
Propagation Delay
2.5
4.2
6.0
2.0
7.5
2.5
7.0
tPHL
An to Bn or Bn to An
2.5
4.6
6.0
2.0
7.5
2.5
7.0
tPZH
Output Enable Time
3.0
5.3
7.0
2.5
9.0
3.0
8.0
3.5
6.0
8.0
3.0
10.0
3.5
9.0
3.0
5.0
6.5
2.5
9.0
3.0
7.5
2.0
5.0
6.5
2.0
10.0
2.0
7.5
tPZL
tPHZ
Output Disable Time
tPLZ
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Units
ns
ns
74F545
Physical Dimensions inches (millimeters) unless otherwise noted
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
Package Number M20B
5
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74F545 Octal Bidirectional Transceiver with 3-STATE Outputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N20A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
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1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
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instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the
user.
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