ETC 5082-2774

Schottky Barrier Diodes for
Stripline, Microstrip Mixers and
Detectors
Technical Data
5082-2207/09
5082-2765/85
5082-2774/94
Features
Outline C2
Package Characteristics
• Small Size
• Low Noise Figure
6 dB Typical at 9 GHz
• Rugged Design
• High Uniformity
• High Burnout Rating
1 W RF Pulse Power Incident
• Both Medium and Low
Barrier Available
CP = 0.055 pF
These diodes are designed for
microstrip and stripline use. The
kovar leads provide good
continuity of transmission line
impedance to the diode. Outline
C2 is a plastic on ceramic
package. Outline H2 has a metal
ceramic hermetic seal. The
ceramic is alumina. Metal parts
are gold plated kovar.
Description/Applications
This family consists of medium
barrier and low barrier beam lead
diodes mounted in easily handled
carrier packages. Low barrier
diodes provide optimum noise
figure at low local oscillator drive
levels. Medium barrier diodes
provide a wider dynamic range for
lower distortion mixer designs.
Application Note 976 presents
design techniques for an X-Band
mixer.
Note: For new designs, the
HSMS-286X and HSMS-820X series of
surface mount microwave diodes are
recommended.
ANGLE CUT 30-50°
ALTERNATE 0.13 (.005)
DIA. HOLE 1.5 (0.06)
FROM END
CATHODE
0.46 (0.018)
0.30 (0.012)
3.81 (0.150)
MIN.
1.40 (0.055)
1.14 (0.045)
SQUARE
1.27 (0.050)
MAX.
0.36 (0.014)
MAX.
0.10
(0.004)
TYP.
DIMENSIONS IN MILLIMETERS AND (INCHES).
Outline H2
The hermetic package, outline H2,
is capable of passing many of the
environmental tests of MIL-STD750. The applicable solderability
test is reference 2031.1: 260°C,
10␣ seconds.
CP = 0.175 pF
2.59 (0.102)
2.06 (0.081)
LID DIA.
CATHODE
0.58 (0.023)
0.43 (0.017)
2.64 (0.104)
2.34 (0.092)
3.30 (0.130)
SQUARE
MIN.
0.20 (0.008)
0.10 (0.004)
0.89 (0.035)
0.64 (0.025) 0.18 (0.007)
KOVAR LEADS,
Au PLATED
0.08 (0.003)
DIMENSIONS IN MILLIMETERS AND (INCHES).
3-57
5965-8846E
Maximum Ratings
Operating and Storage Temperature Range
C2 Packaged Diodes ................................................ -65°C to +150 °C
H2 Packaged Diodes ................................................ -65°C to +175 °C
Pulse Power Incident at TCASE = 25°C ............................................... 1 W
(1 µs pulse, Du = 0.001)
CW Power Dissipation at TCASE = 25°C
(Measured in an infinite heat sink) ......................................... 125 mW
Derate linearly to zero at maximum operating temperature.
Diode Mounting Temperature in Packages
C2 .................................................................... 235°C for 10 sec max.
H2 .................................................................... 260°C for 10 sec max.
Peak Inverse Voltage ......................................................................... 4 V
These diodes are ESD sensitive. Handle with care to avoid static
discharge through the diode.
RF Electrical Specifications at TA = 25°C
Barrier
Maximum
Noise
Figure
NF (dB)
Low
Low
6.0
6.5
150
350
2207
2209
Medium
Medium
6.0
6.5
200
2774
2794
Low
Low
6.0
6.5
150
Part
Number
5082-
Test
Freq.
(GHz)
2765
2785
9.375
IF
Impedance
ZIF (Ω)
Min.
Max.
Package
Typical
Junction
Capacitance
Cj (pF)
1.5:1
2.0:1
Hermetic H2
0.18
400
1.5:1
2.0:1
Broadband C2
350
1.5:1
2.0:1
Maximum
SWR
DC Load Resistance = 0 Ω
L.O. Power = 1 mW
IF = 30 MHz, 1.5 dB NF
Test
Conditions
V=0
*Minimum batch size 20 units.
Typical Detector Characteristics at TA = 25°C
Medium Barrier and Low Barrier (DC Bias)
Parameter
Symbol
Typical Value
Units
Test Conditions
Tangential Sensitivity
TSS
-54
dBm
Voltage Sensitivity
γ
6.6
mV/µW
Video Resistance
RV
1400
Ω
20 µA Bias, RL = 100 KΩ
Pin = - 40 dBm
Video Bandwidth = 2 MHz
f = 10 GHz
Parameter
Symbol
Typical Value
Units
Test Conditions
Tangential Sensitivity
TSS
-44
dBm
Voltage Sensitivity
γ
10
mV/µW
Video Resistance
RV
1.8
ΜΩ
Zero Bias, RL = 10 MΩ
Pin = - 30 dBm
Video Bandwidth = 2 MHz
f = 10 GHz
Low Barrier (Zero Bias)
3-58
SPICE Parameters
Parameter
Units
5082-2207
5082-2209
5082-2765
5082-2774
5082-2785
5082-2794
BV
V
5
5
CJ0
pF
0.20
0.20
EG
eV
0.69
0.69
IBV
A
10E-5
10E-5
IS
A
3 x 10E - 10
4 x 10E - 8
1.08
1.08
N
RS
Ω
5
6
PB
V
0.65
0.5
PT
2
2
M
0.5
0.5
Typical Parameters
100
100
FORWARD CURRENT (mA)
10
1
0.1
0.6
0.8
0.01
1.0
0
0.2
FORWARD VOLTAGE (V)
0.4
Figure 1. Typical Forward
Characteristics for Medium Barrier
Diodes.
3.
0
0.2
10.0
.0
3.0
10
9
10
0
10
11
0
3.
2.0
1.0
0.
2.0
5
12 GHz
1.0
0.
1.0
0.2
0.2
5.
11
12 GHz
.0
8
10
10
0
5.
50
150 µA
10.0
.0
5.0
3.0
2.0
1.0
0.5
0.2
20
10
9
7
2
5.0
0
.0
3 mA
5
0.2
5.
2
6
3
0.5
1.5 mA
1 mA
8
5
3.
0
2.0
7
4
2.0
1.0
1.0
6
5
3
0.2
5
0.8
Figure 2. Typical Forward
Characteristics for Low Barrier
Diodes.
0.
5
0.
4
0.6
FORWARD VOLTAGE (V)
2.0
0.4
0.1
0
0.2
1
3.
0
10
0
0.01
+125°C
+25°C
-55°C
5.
FORWARD CURRENT (mA)
+125°C
+25°C
-55°C
Figure 3. Typical Admittance Characteristics, 5082-2765
with Self Bias.
Figure 4. Typical Admittance Characteristics, 5082-2765
with External Bias.
3-59
3.
0
1
10
0.2
0
11
0
3.
2.0
0.
5
12 GHz
1.0
1.0
2.0
0.
5
Figure 6. Typical Admittance Characteristics 5082-2785
with External Bias.
1.0
1.0
Figure 5. Typical Admittance Characteristics 5082-2785
with Self Bias.
0
0
5.
0
2.0
0.
1.0
1.0
0.
2.0
5
5
3.
1.0
1.0
3.
0
0
3.
1
11
12
0
1.0
1.0
2.0
0.
5
2.0
5
3.
0.
10.0
0
0.
10
3.
Figure 9. Typical Admittance Characteristics, 5082-2209
and 5082-2794 with Self Bias.
5.0
3.0
2.0
1.0
0.2
10.0
.0
10
5.0
2.0
3.0
1.0
0.5
9
0
0.2
.0
10
8
0.2
0
0.2
150 µA
5.
6 7
5.
12
GHz
3
2 GHz
20 50
0.5
.0
11
0
4 5
10
10
3 mA
0.2
0
5.
0
9
3
5.
8
4
2
1
1.5
2.0
2.0
5
7
10.0
0
3.
Figure 8. Typical Admittance Characteristics, 5082-2207
and 5082-2774 with External Bias.
5
0.
0.
0.2
6
5.0
3.0
0
5.
Figure 7. Typical Admittance Characteristics, 5082-2207
and 5082-2774 with Self Bias.
5
1
1
0.2
0
0.
0
0.
12 GHz
12 GHz
0.2
.0
10
10
2.0
0.2
10.0
5.0
150 µA
0.5
.0
10
11
0
5.
2
20 50
1.0
0
3.0
2.0
1.0
0.2
5.
10
0.5
0.2
2
1 1.5
3 mA
8
3.
0
9
3
6
4
3.
8
2.0
5
5
2.0
0.
0.
4
0.2
7
0 10.0
0.
1
9
5.
11
12 GHz
6
5.0
2.0
3.0
1.0
0.5
0.2
0 10.0
0.
5.0
2.0
3.0
1.0
0.2
5
.0
10
150 µA
0
0.5
10
8
3.
0.2
.0
10
9
0
5.
2
20 50
0
3 mA
0.2
0
5.
8
1.5
7
3
2
1
6
5.
7
5
4
3.
0
2.0
5
6
3
0.2
0.
5
0.
5
4
2.0
1.0
1.0
Typical Parameters, continued
Figure 10. Typical Admittance Characteristics, 5082-2209
and 5082-2794 with External Bias.
3-60
Typical Parameters, continued
50 Ω PPO STRIPLINE
1/8 INCH GROUNDPLANE SPACING
DEVICE UNDER TEST
CATHODE GROUNDED
NOISE FIGURE (dB)
7.5
"A"
7.0
PPO
AIR
GROUND
6.5
4.1
(0.16)
6.0
10.0
(0.40)
PACKAGE
C2
5.5
1
3
5
7
9
11
13
15
H2
FREQUENCY (GHz)
Figure 11. Typical Noise Figure vs.
Frequency for 5082-2209, -2794.
DIMENSION
"A"
1.91 ± 0.05
(0.075 ± 0.002)
2.67 ± 0.05
(0.105 ± 0.002)
Figure 12. Admittance Test Circuit.
MODEL FOR H2 DIODES
RJ
14.5 nH
46.9 Ω
0.320 (0.0126)
εEFF. = 6.37
0.435 nH
CJ
47.6 Ω
0.775 (0.0305)
εEFF. = 6.37
0.085 pF
DIMENSIONS IN MILLIMETERS (INCHES)
1 mA Rect. Current
20 µA Ext. Bias
Symbol
5082-2765
5082-2765
Units
Junction Resistance
RJ
258
545
Ω
Junction Capacitance
CJ
0.255
0.302
pF
Parameter
MODEL FOR C2 DIODES
14.5 nH
67.0 Ω
0.318 (0.0125)
εEFF. = 6.37
RJ
0.53 nH
CJ
67.0 Ω
0.318 (0.0125)
εEFF. = 6.37
0.065 pF
DIMENSIONS IN MILLIMETERS (INCHES)
Parameter
Symbol
1 mA Rect. Current
20 µA Ext. Bias
5082-2207, 5082-2774
5082-2207, 5082-2774
Units
Junction Resistance
RJ
338
421
Ω
Junction Capacitance
CJ
0.189
0.195
pF
3-61