FAIRCHILD 74F899QCX

Revised August 1999
74F899
9-Bit Latchable Transceiver
with Parity Generator/Checker
General Description
Features
The 74F899 is a 9-bit to 9-bit parity transceiver with transparent latches. The device can operate as a feed-through
transceiver or it can generate/check parity from the 8-bit
data busses in either direction. It has a guaranteed current
sinking capability of 24 mA at the A-bus and 64 mA at the
B-bus.
■ Latchable transceiver with output sink of 24 mA at the
A-bus and 64 mA at the B-bus
The 74F899 features independent latch enables for the
A-to-B direction and the B-to-A direction, a select pin for
ODD/EVEN parity, and separate error signal output pins for
checking parity.
■ Select pin for ODD/EVEN parity
■ ERRA and ERRB output pins for parity checking
■ Option to select generate parity and check or
“feed-through” data/parity in directions A-to-B or B-to-A
■ Independent latch enables for A-to-B and B-to-A
directions
■ Ability to simultaneously generate and check parity
■ May be used in systems applications in place of the
74F543 and 74F280
■ May be used in system applications in place of the
74F657 and 74F373 (no need to change T/R to check
parity)
Ordering Code:
Order Number
Package Number
Package Description
74F899SC
M28B
28-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
74F899QC
V28A
28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Connection Diagrams
Pin Assignment for SOIC
Pin Assignment for PCC
Logic Symbol
© 1999 Fairchild Semiconductor Corporation
DS010195
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74F899 9-Bit Latchable Transceiver
February 1989
74F899
Input Loading/Fan-Out
HIGH/LOW
Pin Names
A0–A7
U.L.
Input IIH/IIL
HIGH/LOW
Output IOH/IOL
20 µA/−0.6 mA
Description
Data Inputs/
1.0/1.0
Data Outputs
150/40
−3 mA/24 mA
B0–B7
Data Inputs/
1.0/1.0
20 µA/−0.6 mA
Data Outputs
600/106.6
−12 mA/64 mA
APAR
A Bus Parity
1.0/1.0
20 µA/−0.6 mA
Input/Output
150/40
−3 mA/24 mA
BPAR
B Bus Parity
1.0/1.0
20 µA/−0.6 mA
Input/Output
600/106.6
−12 mA/64 mA
1.0/1.0
20 µA/−0.6 mA
ODD/EVEN
Parity Select Input
GBA, GAB
Output Enable Inputs
1.0/1.0
20 µA/−0.6 mA
SEL
Mode Select Input
1.0/1.0
20 µA/−0.6 mA
LEA, LEB
Latch Enable Inputs
1.0/1.0
20 µA/−0.6 mA
ERRA, ERRB
Error Signal Outputs
50/33.3
−1 mA/20 mA
Pin Descriptions
Pin Names
Description
A0–A7
A Bus Data Inputs/Data Outputs
B0–B7
B Bus Data Inputs/Data Outputs
APAR, BPAR
A and B Bus Parity Inputs
ODD/EVEN
ODD/EVEN Parity Select, Active LOW for EVEN Parity
GBA, GAB
Output Enables for A or B Bus, Active LOW
SEL
Select Pin for Feed-Through or Generate Mode, LOW for Generate Mode
LEA, LEB
Latch Enables for A and B Latches, HIGH for Transparent Mode
ERRA, ERRB
Error Signals for Checking Generated Parity with Parity In, LOW if Error Occurs
Functional Description
• Bus A (B) communicates to Bus B (A) in a feed-through
mode if SEL is HIGH. Parity is still generated and
checked as ERRA and ERRB in the feed-through mode
(can be used as an interrupt to signal a data/parity bit
error to the CPU).
The 74F899 has three principal modes of operation which
are outlined below. These modes apply to both the A-to-B
and B-to-A directions.
• Bus A (B) communicates to Bus B (A), parity is generated and passed on to the B (A) Bus as BPAR (APAR). If
LEB (LEA) is HIGH and the Mode Select (SEL) is LOW,
the parity generated from B[0:7] (A[0:7]) can be checked
and monitored by ERRB (ERRA).
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• Independent Latch Enables (LEA and LEB) allow other
permutations of generating/checking (see Function
Table).
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74F899
Function Table
Inputs
Operation
GAB
GBA
SEL LEA LEB
H
H
X
X
X
Busses A and B are 3-STATE.
H
L
L
L
H
Generates parity from B[0:7] based on O/E (Note 1). Generated parity → APAR.
Generated parity checked against BPAR and output as ERRB.
H
L
L
H
H
Generates parity from B[0:7] based on O/E. Generated parity → APAR. Generated
parity checked against BPAR and output as ERRB. Generated parity also fed back
through the A latch for generate/check as ERRA.
H
L
L
X
L
Generates parity from B latch data based on O/E. Generated parity → APAR.
Generated parity checked against latched BPAR and output as ERRB.
H
L
H
X
H
BPAR/B[0:7] → APAR/A0:7] Feed-through mode. Generated parity checked against
BPAR and output as ERRB.
H
L
H
H
H
BPAR/B[0:7] → APAR/A[0:7]
Feed-through mode. Generated parity checked against BPAR and output as ERRB.
Generated parity also fed back through the A latch for generate/check as ERRA.
L
H
L
H
L
Generates parity for A[0:7] based on O/E. Generated parity → BPAR. Generated parity
checked against APAR and output as ERRA.
L
H
L
H
H
Generates parity from A[0:7] based on O/E. Generated parity → BPAR. Generated
parity checked against APAR and output as ERRA. Generated parity also fed back
through the B latch for generate/check as ERRB.
L
H
L
L
X
Generates parity from A latch data based on O/E. Generated parity → BPAR.
Generated parity checked against latched APAR and output as ERRA.
L
H
H
H
L
APAR/A[0:7] → BPAR/B[0:7]
Feed-through mode. Generated parity checked against APAR and output as ERRA.
L
H
H
H
H
APAR/A[0:7] → BPAR/B[0:7]
Feed-through mode. Generated parity checked against APAR and output as ERRA.
Generated parity also fed back through the B latch for generate/check as ERRB.
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Note 1: O/E = ODD/EVEN
Functional Block Diagram
3
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74F899
Absolute Maximum Ratings(Note 2)
Recommended Operating
Conditions
Storage Temperature
−65°C to +150°C
Ambient Temperature under Bias
−55°C to +125°C
Free Air Ambient Temperature
Junction Temperature under Bias
−55°C to +150°C
Supply Voltage
0°C to +70°C
+4.5V to +5.5V
−0.5V to +7.0V
VCC Pin Potential to Ground Pin
Input Voltage (Note 3)
−0.5V to +7.0V
Input Current (Note 3)
−30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State (with VCC = 0V)
Standard Output
−0.5V to VCC
3-STATE Output
−0.5V to +5.5V
Note 2: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Current Applied to Output
Note 3: Either voltage limit or current limit is sufficient to protect inputs.
Twice the Rated IOL (mA)
in LOW State (Max)
ESD Last Passing Voltage (Min)
4000V
DC Electrical Characteristics
Symbol
Parameter
Min
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
VCD
Input Clamp Diode Voltage
VOH
Output HIGH
Typ
Max
2.0
Units
VCC
Conditions
V
Recognized as a
0.8
V
Recognized as a
−1.2
V
HIGH Signal
LOW Signal
Voltage
VOL
Output LOW
10% VCC
2.5
10% VCC
2.4
10% VCC
2.0
5% VCC
2.7
5% VCC
2.7
Min
IIN = −18 mA
IOH = −1 mA
IOH = −3 mA
IOH = −15 mA (Bn, BPAR)
V
IOH = −1 mA
IOH = −3 mA
10% VCC
0.5
5% VCC
0.55
IOL = 20 mA
Voltage
(An, APAR, ERRA, ERRB)
IOL = 24 mA
V
(An, APAR, ERRA, ERRB)
10% VCC
VTH
Input Threshold Voltage
VOLV
Negative Ground Bounce
Voltage
VOLP
Positive Ground Bounce
Voltage
IIL
Input Low Current
IIH
Input HIGH
Current
IBVI
Input HIGH Current
Breakdown Test
IBVIT
Input HIGH Current
Breakdown (I/O)
ICEX
Output HIGH
Leakage Current
VID
Input Leakage
Test
IOD
Output Leakage
Circuit Current
IIL
Input Low Current
IIH+
Output Leakage Current
IOZH
Current
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IOL = 64 mA (Bn, BPAR)
0.55
1.45
V
1.0
V
1.0
V
±0.1V, Sweep Edge Rate must be > 1V/50 ns
Observed on “quiet” output during
simultaneous switching of remaining outputs
Observed on “quiet” output during
simultaneous switching of remaining outputs
−0.6
mA
Max
VIN = 0.5V
5.0
µA
Max
VIN = 2.7V
7.0
µA
Max
0.5
mA
Max
50
µA
Max
V
0.0
3.75
µA
0.0
−0.6
mA
Max
4.75
70
4
µA
Max
VIN = 7.0V
(ODD/EVEN, GBA, GAB, SEL, LEA, LEB)
VIN = 5.5V
(An, Bn, APAR, BPAR)
VOUT = VCC
IID = 1.9 µA
All Other Pins Grounded
VIOD = 150 mV
All Other Pins Grounded
VIN = 0.5V
VI/O = 2.7V
(An, Bn, APAR, BPAR)
Symbol
Parameter
IIL+
Output Leakage
IOZL
Current
IOS
Output Short-Circuit Current
Min
(Continued)
Typ
Max
Units
−650
−60
µA
−150
VCC
Max
Max
mA
Bus Drainage Test
ICCH
Power Supply Current
ICCL
Power Supply Current
Conditions
VI/O = 0.5V
(An, Bn, APAR, BPAR)
VOUT = 0V
(An, APAR, ERRA, ERRB)
Max
VOUT = 0V (Bn, BPAR)
500
µA
0.0V
VOUT = 5.25V
132
155
mA
Max
VO = HIGH
178
210
mA
Max
−100
IZZ
74F899
DC Electrical Characteristics
−225
VO = LOW, GAB = LOW,
GBA = HIGH, VIL = LOW
ICCZ
Power Supply Current
160
190
mA
Max
VO = HIGH Z
AC Electrical Characteristics
Symbol
Parameter
TA = +25°C
TA = 0°C to +70°C
VCC = +5.0V
VCC = +5.0V
CL = 50 pF
CL = 50 pF
Min
Typ
Max
Min
Max
tPLH
Propagation Delay
4.0
7.5
13.0
4.0
14.0
tPHL
An, APAR to Bn, BPAR
4.0
8.5
13.0
4.0
14.0
tPLH
Propagation Delay
7.5
12.0
17.0
7.5
18.0
tPHL
An, Bn to BPAR, APAR
7.5
12.5
17.0
7.5
18.0
tPLH
Propagation Delay
7.5
12.0
17.0
7.5
18.0
tPHL
An, Bn to ERRA, ERRB
7.5
12.5
17.0
7.5
18.0
tPLH
Propagation Delay
4.5
7.5
11.0
4.5
12.0
tPHL
ODD/EVEN to ERRA, ERRB
4.5
8.0
11.0
4.5
12.0
tPLH
Propagation Delay
4.5
7.5
11.5
4.5
12.5
tPHL
ODD/EVEN to APAR, BPAR
4.5
8.5
11.5
4.5
12.5
tPLH
Propagation Delay
5.5
9.0
13.0
5.5
14.0
tPHL
APAR, BPAR to ERRA, ERRB
5.5
9.5
13.0
5.5
14.0
tPLH
LEA/LEB to
9.5
13.0
17.5
7.5
18.0
tPHL
ERRA /ERRB
9.7
17.5
7.5
18.0
tPLH
Propagation Delay
3.0
6.0
10.0
3.0
11.0
tPHL
SEL to APAR, BPAR
3.0
7.0
10.0
3.0
11.0
tPLH
Propagation Delay
3.5
7.0
10.0
3.5
11.0
tPHL
LEB to An, APAR
3.5
8.0
10.0
3.5
11.0
tPLH
tPHL
Propagation Delay
3.5
6.5
10.0
3.5
11.0
LEA to Bn, BPAR
3.5
7.5
10.0
3.5
11.0
tPZH
Output Enable Time
1.0
4.5
10.0
1.0
11.0
tPZL
GBA or GAB to An,
1.0
6.5
10.0
1.0
11.0
Units
Figure
Number
ns
Figure 1
ns
Figure 2
ns
Figure 3
ns
Figure 4
ns
Figure 5
ns
Figure 6
ns
Figure 7
ns
Figure 10
ns
Figure 11
ns
Figure 11
ns
Figure 8,
Figure 9
ns
Figure 8,
Figure 9
ns
Figure 12,
Figure 13
ns
Figure 12,
Figure 13
ns
Figure 14
APAR or Bn, BPAR
tPHZ
Output Disable Time
1.0
4.0
7.0
1.0
8.0
tPLZ
GBA or GAB to An,
1.0
4.0
7.0
1.0
8.0
APAR or Bn, BPAR
tS(H)
Setup Time, HIGH or LOW
5.0
1.6
5.0
tS(L)
An, Bn to LEA, LEB
5.0
1.8
5.0
tH(H)
Hold Time, HIGH or LOW
0
−1.7
0
tH(L)
An, Bn to LEA, LEB
0
−1.5
0
tW
Pulse Width for LEA, LEB
6.0
2.0
6.0
5
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74F899
AC Path
An, APAR → Bn, BPAR
(Bn, BPAR → An, APAR)
FIGURE 1.
An → BPAR
(Bn → APAR)
FIGURE 2.
An → ERRA
(Bn → ERRB)
FIGURE 3.
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6
74F899
AC Path
(Continued)
O/E → ERRA
O/E → ERRB
FIGURE 4.
O/E → BPAR
(O/E → APAR)
FIGURE 5.
APAR → ERRA
(BPAR → ERRB)
FIGURE 6.
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74F899
AC Path
(Continued)
FIGURE 7.
ZH, HZ
FIGURE 8.
ZL, LZ
FIGURE 9.
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74F899
AC Path
(Continued)
SEL → BPAR
(SEL → APAR)
FIGURE 10.
LEA → BPAR, B[0:7]
(LEB → APAR, A[0:7])
FIGURE 11.
TS(H), TH(H)
LEA → APAR, A[0:7]
(LEB → BPAR, B[0:7])
FIGURE 12.
9
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74F899
AC Path
(Continued)
TS(L), TH(L)
LEA → APAR, A[0:7]
(LEB → BPAR, B[0:7])
FIGURE 13.
FIGURE 14.
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10
74F899
Physical Dimensions inches (millimeters) unless otherwise noted
28-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
Package Number M28B
11
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74F899 9-Bit Latchable Transceiver
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square
Package Number V28A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the
user.
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