54AC00/54ACT00 Quad 2-Input NAND Gate General Description The ’AC/’ACT00 contains four 2-input NAND gates. Features n Standard Microcircuit Drawing (SMD) — ’AC00: 5962-87549 — ’ACT00: 5962-87699 n 54AC00 now qualified to 300Krad RHA designation, refer to the SMD for more information n ICC reduced by 50% n Outputs source/sink 24 mA n ’ACT00 has TTL-compatible inputs Logic Symbol Pin Names IEEE/IEC Description A n, B n Inputs On Outputs 10025701 Connection Diagrams Pin Assignment for DIP and Flatpak Pin Assignment for LCC 10025703 10025702 FACT ® is a registered trademark of Fairchild Semiconductor Corporation. © 2003 National Semiconductor Corporation DS100257 www.national.com 54AC00/54ACT00 Quad 2-Input NAND Gate July 2003 54AC00/54ACT00 Absolute Maximum Ratings Recommended Operating Conditions (Note 1) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Supply Voltage (VCC) Supply Voltage (VCC) −0.5V to +7.0V DC Input Diode Current (IIK) ’AC 2.0V to 6.0V ’ACT 4.5V to 5.5V VI = −0.5V −20 mA Input Voltage (VI) VI = VCC + 0.5V +20 mA Output Voltage (VO) DC Input Voltage (VI) 0V to VCC Operating Temperature (TA) −0.5V to VCC + 0.5V 54AC/ACT −55˚C to +125˚C Minimum Input Edge Rate (∆V/∆t) DC Output Diode Current (IOK) VO = −0.5V −20 mA ’AC Devices VO = VCC + 0.5V +20 mA VIN from 30% to 70% of VCC DC Output Voltage (VO) 0V to VCC VCC @ 3.3V, 4.5V, 5.5V −0.5V to VCC + 0.5V 125 mV/ns Minimum Input Edge Rate (∆V/∆t) ’ACT Devices DC Output Source VIN from 0.8V to 2.0V ± 50 mA or Sink Current (IO) VCC @ 4.5V, 5.5V DC VCC or Ground Current per Output Pin (ICC or IGND) Storage Temperature (TSTG) ± 50 mA Note 1: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. National does not recommend operation of FACT ® circuits outside databook specifications. −65˚C to +150˚C Junction Temperature (TJ) CDIP 125 mV/ns 175˚C DC Characteristics for ’AC Family Devices 54AC Symbol Parameter VCC TA = (V) Units Conditions −55˚C to +125˚C Guaranteed Limits VIH VIL VOH Minimum High Level 3.0 2.1 Input Voltage 4.5 3.15 5.5 3.85 Maximum Low Level 3.0 0.9 Input Voltage 4.5 1.35 5.5 1.65 Minimum High Level 3.0 2.9 Output Voltage 4.5 4.4 5.5 5.4 VOUT = 0.1V V or VCC − 0.1V VOUT = 0.1V V or VCC − 0.1V IOUT = −50 µA V (Note 2) VIN = VIL or VIH VOL 3.0 2.4 IOH = −12 mA 4.5 3.7 5.5 4.7 IOH = −24 mA Maximum Low Level 3.0 0.1 IOUT = 50 µA Output Voltage 4.5 0.1 5.5 0.1 V IOH = −24 mA V (Note 2) VIN = VIL or VIH IIN Maximum Input 3.0 0.5 4.5 0.5 5.5 0.5 5.5 ± 1.0 Leakage Current www.national.com 2 IOL = 12 mA V IOL = 24 mA IOL = 24 mA µA VI = VCC, GND (Continued) 54AC Symbol Parameter VCC TA = (V) Units Conditions −55˚C to +125˚C Guaranteed Limits IOLD IOHD Minimum Dynamic Output Current (Note 4) ICC Maximum Quiescent 5.5 50 mA 5.5 −50 mA VOHD = 3.85V Min 5.5 40.0 µA VIN = VCC Supply Current VOLD = 1.65V Max or GND Note 2: All outputs loaded; thresholds on input associated with output under test. Note 3: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC. ICC for 54AC @ 25˚C is identical to 74AC @ 25˚C. Note 4: Maximum test duration 2.0 ms, one output loaded at a time. Note 5: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC. ICC for 54AC @ 25˚C is identical to 74AC @ 25˚C. DC Characteristics for ’ACT Family Devices 54ACT Symbol Parameter VCC TA = (V) −55˚C to +125˚C Units Conditions Guaranteed Limits VIH VIL VOH Minimum High Level 4.5 2.0 Input Voltage 5.5 2.0 Maximum Low Level 4.5 0.8 Input Voltage 5.5 0.8 Minimum High Level 4.5 4.4 Output Voltage 5.5 5.4 V VOUT = 0.1V or VCC − 0.1V V VOUT = 0.1V or VCC − 0.1V V IOUT = −50 µA (Note 6) VIN = VIL or VIH VOL 4.5 3.70 5.5 4.70 Maximum Low Level 4.5 0.1 Output Voltage 5.5 0.1 V IOH = −24 mA IOH = −24 mA V IOUT = 50 µA (Note 6) VIN = VIL or VIH IIN Maximum Input 4.5 0.50 5.5 0.50 V IOL = 24 mA 5.5 ± 1.0 µA VI = VCC, GND 5.5 1.6 mA VI = VCC − 2.1V IOL = 24 mA Leakage Current ICCT Maximum ICC/Input IOLD Minimum Dynamic Output Current (Note 7) 5.5 50 mA VOLD = 1.65V Max IOHD 5.5 −50 mA VOHD = 3.85V Min ICC Maximum Quiescent 5.5 40.0 µA VIN = VCC Supply Current or GND Note 6: All outputs loaded; thresholds on input associated with output under test. Note 7: Maximum test duration 2.0 ms, one output loaded at a time. Note 8: ICC for 54ACT @ 25˚C is identical to 74ACT @ 25˚C. 3 www.national.com 54AC00/54ACT00 DC Characteristics for ’AC Family Devices 54AC00/54ACT00 AC Electrical Characteristics 54AC Symbol tPLH tPHL VCC TA = −55˚C (V) to +125˚C (Note 9) CL = 50 pF Parameter Propagation Delay Propagation Delay Fig. Units Min Max 3.3 1.0 11.0 5.0 1.5 8.5 3.3 1.0 9.0 5.0 1.5 7.0 No. ns ns Note 9: Voltage Range 3.3 is 3.3V ± 0.3V Voltage Range 5.0 is 5.0V ± 0.5V AC Electrical Characteristics 54ACT Symbol VCC TA = −55˚C (V) to +125˚C (Note 10) CL = 50 pF Parameter Fig. Units Min Max tPLH Propagation Delay 5.0 1.5 9.5 ns tPHL Propagation Delay 5.0 1.5 8.0 ns Note 10: Voltage Range 5.0 is 5.0V ± 0.5V Capacitance Symbol Parameter Typ Units CIN Input Capacitance 4.5 pF VCC = Open CPD Power Dissipation 30.0 pF VCC = 5.0V Capacitance www.national.com Conditions 4 No. 54AC00/54ACT00 Physical Dimensions inches (millimeters) unless otherwise noted 20 Terminal Ceramic Leadless Chip Carrier (L) NS Package Number E20A 14 Lead Ceramic Dual-In-Line Package (D) NS Package Number J14A 5 www.national.com 54AC00/54ACT00 Quad 2-Input NAND Gate Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14 Lead Ceramic Flatpak (F) NS Package Number W14B LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. 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