54AC/74AC125 # 74ACT125 Quad Buffer with TRI-STATEÉ Outputs General Description Features The ’AC/’ACT125 contains four independent non-inverting buffers with TRI-STATE outputs. Y Y Y Logic Symbol ICC reduced by 50% Outputs source/sink 24 mA ’ACT125 has TTL-compatible outputs Connection Diagrams Pin Assignment for DIP, SOIC and Flatpak IEEE/IEC TL/F/10692–1 Pin Assignment for LCC TL/F/10692 – 2 TL/F/10692 – 3 Pin Names Description An, Bn On Inputs Outputs Function Table Inputs Output An Bn On L L H L H X L H Z H e HIGH Voltage Level L e LOW Voltage Level Z e HIGH Impedance X e Immaterial TRI-STATEÉ is a registered trademark of National Semiconductor Corporation. FACTTM is a trademark of National Semiconductor Corporation. C1995 National Semiconductor Corporation TL/F/10692 RRD-B30M75/Printed in U. S. A. 54AC/74AC125 # 74ACT125 Quad Buffer with TRI-STATE Outputs March 1993 Absolute Maximum Ratings (Note 1) Recommended Operating Conditions If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications. Supply Voltage (VCC) DC Input Diode Current (IK) VI e b0.5V VI e VCC a 0.5V DC Input Voltage (VI) DC Output Diode Current (IOK) VO e b0.5V VO e VCC a 0.5V DC Output Voltage (VO) DC Output Source or Sink Current (IO) DC VCC or Ground Current per Output Pin (ICC or IGND) Storage Temperature (TSTG) Junction Temperature (TJ) CDIP PDIP Supply Voltage (VCC) ’AC ’ACT Input Voltage (VI) b 0.5V to a 7.0V b 20 mA a 20 mA 2.0V to 6.0V 4.5V to 5.5V 0V to VCC 0V to VCC Output Voltage (VO) Operating Temperature (TA) 74AC/ACT 54AC/ACT b 0.5V to VCC a 0.5V b 20 mA a 20 mA b 40§ C to a 85§ C b 55§ C to a 125§ C Minimum Input Edge Rate (DV/Dt) ’AC Devices VIN from 30% to 70% of VCC VCC @ 3.3V, 4.5V, 5.5V Minimum Input Edge Rate (DV/Dt) ’ACT Devices VIN from 0.8V to 2.0V VCC @ 4.5V, 5.5V b 0.5V to VCC a 0.5V g 50 mA g 50 mA b 65§ C to a 150§ C 125 mV/ns 125 mV/ns 175§ C 140§ C Note 1: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. National does not recommend operation of FACT TM circuits outside databook specifications. DC Characteristics for ’AC Family Devices Symbol Parameter VCC (V) 74AC 54AC 74AC TA e a 25§ C TA e b 55§ C to a 125§ C TA e b 40§ C to a 85§ C Typ VIH VIL VOH IIN Conditions Guaranteed Limits Minimum High Level Input Voltage 3.0 4.5 5.5 1.5 2.25 2.75 2.1 3.15 3.85 2.1 3.15 3.85 2.1 3.15 3.85 V VOUT e 0.1V or VCC b 0.1V Maximum Low Level Input Voltage 3.0 4.5 5.5 1.5 2.25 2.75 0.9 1.35 1.65 0.9 1.35 1.65 0.9 1.35 1.65 V VOUT e 0.1V or VCC b 0.1V Minimum High Level Output Voltage 3.0 4.5 5.5 2.99 4.49 5.49 2.9 4.4 5.4 2.9 4.4 5.4 2.9 4.4 5.4 V 2.56 3.86 4.86 2.4 3.7 4.7 2.46 3.76 4.76 V 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 0.1 V 3.0 4.5 5.5 0.36 0.36 0.36 0.50 0.50 0.50 0.44 0.44 0.44 V 5.5 g 0.1 g 1.0 g 1.0 mA 3.0 4.5 5.5 VOL Units Maximum Low Level Output Voltage Maximum Input Leakage Current 3.0 4.5 5.5 0.002 0.001 0.001 *All outputs loaded; thresholds on input associated with output under test. 2 IOUT e b50 mA *VIN e VIL or VIH b 12 mA b 24 mA IOH b 24 mA IOUT e 50 mA *VIN e VIL or VIH 12 mA IOL 24 mA 24 mA VI e VCC, GND DC Characteristics for ’AC Family Devices (Continued) Symbol Parameter VCC (V) 74AC 54AC 74AC TA e a 25§ C TA e b 55§ C to a 125§ C TA e b 40§ C to a 85§ C Typ IOZ Maximum TRI-STATE Current ² Minimum Dynamic Output Current IOLD IOHD ICC Maximum Quiescent Supply Current Units Conditions Guaranteed Limits g 10.0 g 5.0 mA VI (OE) e VIL, VIH VI e VCC, VGND VO e VCC, GND 5.5 50 75 mA VOLD e 1.65V Max 5.5 b 50 b 75 mA VOHD e 3.85V Min 80.0 40.0 mA VIN e VCC or GND 5.5 g 0.5 5.5 4.0 ² Maximum test duration 2.0 ms, one output loaded at a time. Note : IIN and ICC @ ICC for 54AC 3.0V are guaranteed to be less than or equal to the respective limit @ 25§ C is identical to 74AC @ @ 5.5V VCC. 25§ C. DC Characteristics for ’ACT Family Devices Symbol Parameter VCC (V) 74ACT 74ACT TA e a 25§ C TA e b 40§ C to a 85§ C Typ Units Conditions Guaranteed Limits VIH Minimum High Level Input Voltage 4.5 5.5 1.5 1.5 2.0 2.0 2.0 2.0 V VOUT e 0.1V or VCC b 0.1V VIL Maximum Low Level Input Voltage 4.5 5.5 1.5 1.5 0.8 0.8 0.8 0.8 V VOUT e 0.1V or VCC b 0.1V VOH Minimum High Level Output Voltage 4.5 5.5 4.49 5.49 4.4 5.4 4.4 5.4 V 3.86 4.86 3.76 4.76 V 0.1 0.1 0.1 0.1 V 4.5 5.5 0.36 0.36 0.44 0.44 V 4.5 5.5 VOL Maximum Low Level Output Voltage 4.5 5.5 0.001 0.001 IOUT e b50 mA *VIN e VIL or VIH b 24 mA IOH b 24 mA IOUT e 50 mA *VIN e VIL or VIH 24 mA IOL 24 mA IIN Maximum Input Leakage Current 5.5 g 0.1 g 1.0 mA VI e VCC, GND IOZ Maximum TRI-STATE Current 5.5 g 0.5 g 5.0 mA VI e VIL, VIH VO e VCC, GND ICCT Maximum ICC/Input 5.5 1.5 mA VI e VCC b 2.1V ³ IOLD ² Minimum Dynamic Output Current IOHD ICC Maximum Quiescent Supply Current 0.6 5.5 75 mA VOLD e 1.65V Max 5.5 b 75 mA VOHD e 3.85V Min 40.0 mA VIN e VCC or GND 5.5 4.0 *All outputs loaded; thresholds on input associated with output under test. ² Maximum test duration 2.0 ms, one output loaded at a time. ³ May be measured per the JEDEC Alternate Method. 3 AC Electrical Characteristics Symbol Parameter VCC* (V) 74AC 54AC 74AC TA e a 25§ C CL e 50 pF TA e b55§ C to a 125§ C CL e 50 pF TA e b40§ C to a 85§ C CL e 50 pF Min Max Units Min Typ Max Min Max tPLH Propagation Delay Data to Output 3.3 5.0 1.0 1.0 6.5 5.5 9.0 7.0 1.0 1.0 10.0 7.5 ns tPHL Propagation Delay Data to Output 3.3 5.0 1.0 1.0 6.5 5.0 9.0 7.0 1.0 1.0 10.0 7.5 ns tPZH Output Enable Time 3.3 5.0 1.0 1.0 6.0 5.0 10.5 7.0 1.0 1.0 11.0 8.0 ns tPZL Output Enable Time 3.3 5.0 1.0 1.0 7.5 5.5 10.0 8.0 1.0 1.0 11.0 8.5 ns tPHZ Output Disable Time 3.3 5.0 1.0 1.0 7.5 6.5 10.0 9.0 1.0 1.0 10.5 9.5 ns tPLZ Output Disable Time 3.3 5.0 1.0 1.0 7.5 6.5 10.5 9.0 1.0 1.0 11.5 9.5 ns *Voltage Range 3.3 is 3.3V g 0.3V Voltage Range 5.0 is 5.0V g 0.5V AC Electrical Characteristics Symbol Parameter VCC* (V) 74ACT 74ACT TA e a 25§ C CL e 50 pF TA e b40§ C to a 85§ C CL e 50 pF Units Min Typ Max Min Max 5.0 1.0 6.5 9.0 1.0 10.0 ns Propagation Delay Data to Output 5.0 1.0 7.0 9.0 1.0 10.0 ns tPZH Output Enable Time 5.0 1.0 6.0 8.5 1.0 9.5 ns tPZL Output Enable Time 5.0 1.0 7.0 9.5 1.0 10.5 ns tPHZ Output Disable Time 5.0 1.0 7.0 9.5 1.0 10.5 ns tPLZ Output Disable Time 5.0 1.0 7.5 10.0 1.0 10.5 ns tPLH Propagation Delay Data to Output tPHL *Voltage Range 5.0 is 5.0V g 0.5V Capacitance Symbol Parameter AC/ACT Units Conditions Typ CIN Input Capacitance 4.5 pF VCC e OPEN CPD Power Dissipation Capacitance 45.0 pF VCC e 5.0V 4 Ordering Information The device number is used to form part of a simplified purchasing code where the package type and temperature range are defined as follows: 74AC 125 P Temperature Range Family 74AC e Commercial 54AC e Military 74ACT e Commercial TTL-Compatible C QR Special Variations Xe Devices shipped in 13× reels QR e Commercial grade device with burn-in QB e Military grade device with environmental and burn-in processing shipped in tubes Device Type Package Code P e Plastic DIP D e Ceramic DIP F e Flatpak L e Leadless Ceramic Chip Carrier (LCC) S e Small Outline (SOIC) Temperature Range C e Commercial (b40§ C to a 85§ C) M e Military (b55§ C to a 125§ C) 5 Physical Dimensions inches (millimeters) 20 Terminal Ceramic Leadless Chip Carrier (L) NS Package Number E20A 14-Lead Ceramic Dual-In-Line Package (D) NS Package Number J14A 6 Physical Dimensions inches (millimeters) (Continued) 14-Lead Small Outline Integrated Circuit (S) NS Package Number M14A 14-Lead Plastic Dual-In-Line Package (P) NS Package Number N14A 7 54AC/74AC125 # 74ACT125 Quad Buffer with TRI-STATE Outputs Physical Dimensions inches (millimeters) (Continued) 14-Lead Ceramic Flatpak (F) NS Package Number W14B LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. National Semiconductor Corporation 2900 Semiconductor Drive P.O. Box 58090 Santa Clara, CA 95052-8090 Tel: 1(800) 272-9959 TWX: (910) 339-9240 National Semiconductor GmbH Livry-Gargan-Str. 10 D-82256 F4urstenfeldbruck Germany Tel: (81-41) 35-0 Telex: 527649 Fax: (81-41) 35-1 National Semiconductor Japan Ltd. Sumitomo Chemical Engineering Center Bldg. 7F 1-7-1, Nakase, Mihama-Ku Chiba-City, Ciba Prefecture 261 Tel: (043) 299-2300 Fax: (043) 299-2500 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. National Semiconductor Hong Kong Ltd. 13th Floor, Straight Block, Ocean Centre, 5 Canton Rd. Tsimshatsui, Kowloon Hong Kong Tel: (852) 2737-1600 Fax: (852) 2736-9960 National Semiconductores Do Brazil Ltda. Rue Deputado Lacorda Franco 120-3A Sao Paulo-SP Brazil 05418-000 Tel: (55-11) 212-5066 Telex: 391-1131931 NSBR BR Fax: (55-11) 212-1181 National Semiconductor (Australia) Pty, Ltd. Building 16 Business Park Drive Monash Business Park Nottinghill, Melbourne Victoria 3168 Australia Tel: (3) 558-9999 Fax: (3) 558-9998 National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications. 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