ETC HD151BF853

HD151BF853
2.5 V PLL Clock Buffer for DDR Application
ADE-205-692B (Z)
Preliminary
Rev.2
Sep. 2002
Description
The HD151BF853 is a high-performance, low-skew, low-jitter, PLL clock buffer. It is specifically
designed for use with DDR (Double Data Rate) PC mother board application.
Features
•
•
•
•
•
•
•
Designed for DDR200/266/333/400 PC mother board clock buffering
Supports 60 MHz to 210 MHz operation range
Distributes one to ten differential clock outputs pairs
Spread spectrum clock compatible
External feedback pin (FBIN) is used to synchronize the outputs to the clock input
Supports 2.5 V analog supply voltage (AVDD), and 2.5 V VDD
Ordering Information
Part Name
Package Type
Package Code
Package
Abbreviation
Taping
Abbreviation (Quantity)
HD151BF853SSEL
SSOP-48 pin

SS
EL (1,000 pcs / Reel)
Note: Please consult the sales office for the above package availability.
HD151BF853
Key Specifications
• Supply voltages: VDD = AVDD = 2.5 V±0.2 V
• Output clock cycle to cycle jitter = ±75 ps
• Output clock pin to pin skew = 150 ps max
Function Table
Inputs
Outputs
AVDD
CLK
Yn
Yn
FBOUT
PLL
GND
L
L
H
L
Bypass / Off
GND
H
H
L
H
Bypass / Off
2.5 V (typ.)
L
L
H
L
Running
2.5 V (typ.)
H
H
L
H
Running
H: High level
L: Low level
Rev.2, Sep. 2002, page 2 of 10
HD151BF853
Pin Arrangement
48 GND
GND 1
Y0 2
47 Y5
Y0 3
46 Y5
45 VDD
VDD 4
Y1 5
44 Y6
Y1 6
43 Y6
GND 7
42 GND
GND 8
41 GND
Y2 9
40 Y7
Y2 10
39 Y7
38 VDD
VDD 11
NC 12
37 NC
CLKIN 13
36 NC
NC 14
35 FBIN
VDD 15
34 VDD
AVDD 16
33 FBOUT
AGND 17
32 NC
31 GND
GND 18
Y3 19
30 Y8
Y3 20
29 Y8
28 VDD
VDD 21
Y4 22
27 Y9
Y4 23
26 Y9
GND 24
25 GND
(Top view)
Rev.2, Sep. 2002, page 3 of 10
HD151BF853
Logic Diagram
AVCC
CLKIN
16
Test
Logic
13
PLL
FBIN
35
Note: All inputs and outputs are associated with VDDQ = 2.5 V.
Rev.2, Sep. 2002, page 4 of 10
3
2
Y0
5
6
Y1
10
9
Y2
20
19
Y3
22
23
Y4
46
47
Y5
44
43
Y6
39
40
Y7
29
30
Y8
27
26
Y9
33
FBOUT
Y0
Y1
Y2
Y3
Y4
Y5
Y6
Y7
Y8
Y9
HD151BF853
Absolute Maximum Ratings
Item
Symbol
Ratings
Unit
Supply voltage
VDD
–0.5 to 3.6
V
Input voltage
VI
–0.5 to
VDD+0.5
V
Output voltage *1
VO
–0.5 to
VDD+0.5
V
Input clamp current
IIK
–50
mA
VI < 0
Output clamp current
IOK
–50
mA
VO < 0
Continuous output current
IO
±50
mA
VO = 0 to VDD
0.7
W
–65 to +150
°C
Maximum power dissipation
at Ta = 55°C (in still air)
Storage temperature
Notes:
Tstg
Conditions
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage
to the device. These are stress ratings only, and functional operation of the device at these or
any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute maximum rated conditions for extended periods may affect device
reliability.
1. The input and output negative voltage ratings may be exceeded if the input and output clamp
current ratings are observed.
Recommended Operating Conditions
Item
Symbol
Min
Typ
Max
Unit Conditions
Supply voltage
AVDD
2.3
2.5
2.7
V
Output supply voltage
VDD
2.3
2.5
2.7
V
–0.3
—
VDD+0.3
V
All pins
DC input signal voltage
High level input voltage
VIH
1.7
—
3.6
V
CLKIN
High level input voltage
VIH
1.7
—
VDD+0.3
V
FBIN
Low level input voltage
VIL
–0.3
—
0.7
V
CLKIN, FBIN
Output differential cross point
voltage
VOX
0.5×VDD
–0.2
—
0.5×VDD
+0.2
V
Output current
IOH
—
—
–12
mA
IOL
—
—
12
Input clock slew rate
SR
1
—
—
V/ns
Operating temperature
Ta
0
—
70
°C
Note: Unused inputs must be held high or low to prevent them from floating.
Rev.2, Sep. 2002, page 5 of 10
HD151BF853
Electrical Characteristics
Item
Symbol Min
Typ *1
Max
Unit
Test Conditions
Input clamp voltage
(All inputs)
VIK
—
—
–1.2
V
II = –18 mA, VDD = 2.3 V
Output voltage
VOH
VDD–0.2 —
—
V
IOH = –100 µA, VDD = 2.3 to 2.7
V
1.7
—
VDD
IOH = –12 mA, VDD = 2.3 V
—
—
0.2
IOL = 100 µA, VDD = 2.3 to 2.7 V
—
—
0.6
IOL = 12 mA, VDD = 2.3 V
VOL
Input current
II
–10
—
10
µA
VI = 0 V or 2.7 V,
VDD = 2.7 V, CLKIN, FBIN
Analog supply current
AICC
—
—
12
mA
VDD = AVDD = 2.7 V,
170 MHz
Dynamic supply current
DICC
—
250
300
mA
VDD = AVDD = 2.7 V,
170 MHz
All Yn, Yn, = open
CI
2.5
—
3.5
pF
CLKIN and FBIN
CDi
–0.25
—
0.25
pF
Input capacitance*2
2
Delta input capacitance*
Notes: 1. For conditions shown as Min or Max, use the appropriate value specified under recommended
operating conditions.
2. Target of design, not 100% tested in production.
Rev.2, Sep. 2002, page 6 of 10
HD151BF853
Switching Characteristics
Ta = 25°C, VDD = AVDD = 2.5V
Item
Symbol
Min
Typ
Max
Unit Test Conditions & Notes
Period jitter
tPER
–75
0
75
ps
*7, 8
Half period jitter
tHPER
–120
0
120
ps
*8
Cycle to cycle jitter
tCC
–75
0
75
ps
Static phase offset
tsPE
–150
—
150
ps
Output clock skew
tsk
—
—
150
ps
Operating clock frequency fCLK(O)
60
—
210
MHz *1, 2
Application clock
frequency
80
166
210
MHz *1, 3
Slew rate
1.0
—
2.0
V/ns 20% to 80%
Stabilization time
—
—
0.1
ms
fCLK(A)
*4, 5
*6
Notes: Target of design, not 100% tested in production.
1. The PLL must be able to handle spread spectrum induced skew. (the specification for this
frequency modulation can be found in the latest Intel PC100 Registered DIMM specification)
2. Operating clock frequency indicates a range over which the PLL must be able to lock, but in
which it is not required to meet the other timing parameters. (Used for low speed system debug.)
3. Application clock frequency indicates a range over which the PLL must meet all timing
parameters.
4. Assumes equal wire length and loading on the clock output and feedback path.
5. Static phase offset does not include jitter.
6. Stabilization time is the time required for the integrated PLL circuit to obtain phase lock of it’s
feedback signal to it’s reference signal after power on.
7. Period jitter defines the largest variation in clock period, around a nominal clock period.
8. Period jitter and half period jitter are separate specifications that must be met independently of
each other.
Rev.2, Sep. 2002, page 7 of 10
HD151BF853
Zo = 60 Ω
Yn
*1
RT =
120 Ω
C = 14 pF
Zo = 60 Ω
Yn
*1
C = 14 pF
Note: 1. SDRAM Cin 3.5 pF ×4
Figure 1 Clock outputs test circuit
Yn
Yn
tcycle n
tcycle n+1
t CC = (tcycle n) - (tcycle n+1)
Figure 2 Cycle to cycle jitter
Yx
Yx
Yy
Yy
tsk
Figure 3 Output clock skew (Differential clock output)
Rev.2, Sep. 2002, page 8 of 10
HD151BF853
Package Dimensions
15.85 ± 0.3
25
1
24
0.635
0.25 ± 0.1
0.15
0.13 M
0.10 Min
0.78 Max
0.15 ± 0.05
2.65 Max
7.50 ± 0.3
48
10.40 ± 0.4
1.45
0˚ - 10˚
0.60 ± 0.2
Rev.2, Sep. 2002, page 9 of 10
HD151BF853
Disclaimer
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copyright, trademark, or other intellectual property rights for information contained in this document.
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intellectual property rights, in connection with use of the information contained in this document.
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received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
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products.
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Copyright © Hitachi, Ltd., 2002. All rights reserved. Printed in Japan.
Colophon 7.0
Rev.2, Sep. 2002, page 10 of 10