CYPRESS CY7C1049-15VC

049
PRELIMINARY
CY7C1049
512K x 8 Static RAM
Features
• High speed
— tAA = 15 ns
• Low active power
— 1210 mW (max.)
• Low CMOS standby power (Commercial L version)
— 2.75 mW (max.)
• 2.0V Data Retention (400 µW at 2.0V retention)
• Automatic power-down when deselected
• TTL-compatible inputs and outputs
• Easy memory expansion with CE and OE features
Functional Description
The CY7C1049 is a high-performance CMOS static RAM organized as 524,288 words by 8 bits. Easy memory expansion
is provided by an active LOW chip enable (CE), an active LOW
output enable (OE), and three-state drivers. Writing to the device is accomplished by taking chip enable (CE) and write enable (WE) inputs LOW. Data on the eight I/O pins (I/O0 through
I/O7) is then written into the location specified on the address
pins (A0 through A18).
Reading from the device is accomplished by taking chip enable (CE) and output enable (OE) LOW while forcing write enable (WE) HIGH. Under these conditions, the contents of the
memory location specified by the address pins will appear on
the I/O pins.
The eight input/output pins (I/O0 through I/O7) are placed in a
high-impedance state when the device is deselected (CE
HIGH), the outputs are disabled (OE HIGH), or during a write
operation (CE LOW, and WE LOW).
The CY7C1049 is available in a standard 400-mil-wide 36-pin
SOJ package with center power and ground (revolutionary)
pinout.
Logic Block Diagram
Pin Configuration
SOJ
Top View
A0
A1
A2
A3
A4
CE
I/O0
I/O1
VCC
GND
I/O2
I/O3
WE
A5
A6
A7
A8
A9
I/O0
INPUT BUFFER
I/O1
ROW DECODER
I/O2
SENSE AMPS
A0
A1
A2
A3
A4
A5
A6
A7
A8
A9
A10
512K x 8
ARRAY
I/O3
I/O4
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
20
19
COLUMN
DECODER
NC
A18
A17
A16
A15
OE
I/O7
I/O6
GND
VCC
I/O5
I/O4
A14
A13
A12
A11
A10
NC
1049–2
I/O5
CE
I/O6
POWER
DOWN
I/O7
A 11
A 12
A 13
A14
A15
A16
A17
A18
WE
OE
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
1049–1
Selection Guide
7C1049-12
7C1049-15
7C1049-17
7C1049-20
7C1049-25
Maximum Access Time (ns)
12
15
17
20
25
Maximum Operating Current (mA)
240
220
195
185
180
8
8
8
8
8
0.5
0.5
0.5
0.5
0.5
9
9
9
Maximum CMOS Standby
Current (mA)
Com’l
Com’l
L
Ind’l
Military
9
9
10
10
Shaded areas contain advance information.
Cypress Semiconductor Corporation
Document #: 38-05063 Rev. **
•
3901 North First Street
•
San Jose
•
CA 95134 • 408-943-2600
Revised August 31, 2001
PRELIMINARY
CY7C1049
Maximum Ratings
Static Discharge Voltage ........................................... >2001V
(per MIL-STD-883, Method 3015)
(Above which the useful life may be impaired. For user guidelines, not tested.)
Latch-Up Current..................................................... >200 mA
Storage Temperature ................................. –65°C to +150°C
Operating Range
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage on VCC to Relative GND[1] .... –0.5V to +7.0V
Range
Commercial
Ambient
Temperature[2]
VCC
0°C to +70°C
4.5V–5.5V
DC Voltage Applied to Outputs
in High Z State[1] ....................................–0.5V to VCC + 0.5V
Industrial
–40°C to +85°C
DC Input Voltage[1] ................................–0.5V to VCC + 0.5V
Military
–55°C to +125°C
Current into Outputs (LOW) .........................................20 mA
Electrical Characteristics Over the Operating Range
Parameter
Description
7C1049-12
Test Conditions
Min.
Max.
2.4
7C1049-15
Min.
Max.
VOH
Output HIGH Voltage VCC = Min., IOH = –4.0 mA
VOL
Output LOW Voltage
VIH
Input HIGH Voltage
2.2
VCC
+ 0.3
2.2
VCC
+ 0.3
VIL
Input LOW Voltage[1]
–0.3
0.8
–0.3
VCC = Min., IOL = 8.0 mA
2.4
0.4
7C1049-17
Min.
Max.
2.4
0.4
Unit
V
0.4
V
2.2
VCC
+ 0.3
V
0.8
–0.3
0.3
V
IIX
Input Load Current
GND < VI < VCC
–1
+1
–1
+1
–1
+1
µA
IOZ
Output Leakage
Current
GND < VOUT < VCC,
Output Disabled
–1
+1
–1
+1
–1
+1
µA
ICC
VCC Operating
Supply Current
VCC = Max.,
f = fMAX = 1/tRC
240
220
195
mA
ISB1
Automatic CE
Power-Down Current
—TTL Inputs
Max. VCC, CE > VIH
VIN > VIH or
VIN < VIL, f = fMAX
40
40
40
mA
ISB2
Automatic CE
Power-Down Current
—CMOS Inputs
Max. VCC,
CE > VCC – 0.3V,
VIN > VCC – 0.3V,
or VIN < 0.3V, f=0
8
8
8
mA
0.5
0.5
0.5
mA
Ind’l
9
9
9
mA
Military
10
10
10
mA
Com’l
Com’l
L
Shaded areas contain advance information.
Notes:
1. VIL (min.) = –2.0V for pulse durations of less than 20 ns.
2. TA is the “instant on” case temperature.
Document #: 38-05063 Rev. **
Page 2 of 10
PRELIMINARY
CY7C1049
Electrical Characteristics Over the Operating Range (continued)
Test Conditions
Parameter
7C1049-20
Description
Min.
VOH
Output HIGH Voltage
VCC = Min., IOH = –4.0 mA
VOL
Output LOW Voltage
VCC = Min., IOL = 8.0 mA
VIH
Input HIGH Voltage
VIL
Input LOW Voltage[1]
IIX
Input Load Current
GND < VI < VCC
IOZ
Output Leakage
Current
GND < VOUT < VCC,
Output Disabled
ICC
VCC Operating
Supply Current
VCC = Max.,
f = fMAX = 1/tRC
ISB1
Automatic CE
Power-Down Current
—TTL Inputs
Max. VCC, CE > VIH
VIN > VIH or
VIN < VIL, f = fMAX
ISB2
Automatic CE
Power-Down Current
—CMOS Inputs
Max. VCC,
CE > VCC – 0.3V,
VIN > VCC – 0.3V,
or VIN < 0.3V, f=0
7C1049-25
Max.
Min.
2.4
Unit
2.4
0.4
V
0.4
V
V
2.2
VCC
+ 0.3
2.2
VCC +
0.3
–0.3
0.8
–0.3
0.8
V
–1
+1
–1
+1
µA
–1
+1
–1
+1
µA
185
180
mA
40
40
mA
8
8
mA
Com’l
Com’l
Max.
0.5
0.5
mA
Ind’l
L
9
9
mA
Military
10
10
mA
Capacitance[3]
Parameter
Description
CIN
Input Capacitance
COUT
I/O Capacitance
Test Conditions
Max.
Unit
8
pF
8
pF
TA = 25°C, f = 1 MHz,
VCC = 5.0V
Note:
3. Tested initially and after any design or process changes that may affect these parameters.
AC Test Loads and Waveforms
R1 481 Ω
5V
R1 481 Ω
5V
OUTPUT
ALL INPUT PULSES
3.0V
90%
OUTPUT
30 pF
R2
255Ω
INCLUDING
JIG AND
SCOPE
(a)
5 pF
INCLUDING
JIG AND
SCOPE
(b)
R2
255Ω
GND
≤ 3ns
10%
90%
10%
≤ 3 ns
1049–3
1049–4
THÉVENIN EQUIVALENT
167Ω
1.73V
OUTPUT
Equivalent to:
Document #: 38-05063 Rev. **
Page 3 of 10
PRELIMINARY
CY7C1049
Switching Characteristics[4] Over the Operating Range
7C1049-12
Parameter
Description
Min.
Max.
7C1049-15
Min.
Max.
7C1049-17
Min.
Max.
Unit
READ CYCLE
tRC
Read Cycle Time
tAA
Address to Data Valid
tOHA
Data Hold from Address Change
tACE
CE LOW to Data Valid
12
15
17
ns
tDOE
OE LOW to Data Valid
6
7
8
ns
tLZOE
OE LOW to Low Z
12
[6]
12
3
OE HIGH to High Z
tLZCE
CE LOW to Low Z[6]
tHZCE
CE HIGH to High Z
tPU
CE LOW to Power-Up
tPD
CE HIGH to Power-Down
15
6
0
17
7
0
12
ns
7
ns
3
7
ns
7
ns
0
15
ns
ns
0
3
6
ns
3
0
3
[5, 6]
17
3
0
[5, 6]
tHZOE
15
ns
17
ns
WRITE CYCLE[7,8]
tWC
Write Cycle Time
12
15
17
ns
tSCE
CE LOW to Write End
10
12
12
ns
tAW
Address Set-Up to Write End
10
12
12
ns
tHA
Address Hold from Write End
0
0
0
ns
tSA
Address Set-Up to Write Start
0
0
0
ns
tPWE
WE Pulse Width
10
12
12
ns
tSD
Data Set-Up to Write End
7
8
8
ns
tHD
Data Hold from Write End
0
0
0
ns
3
3
3
ns
tLZWE
tHZWE
WE HIGH to Low Z
[6]
WE LOW to High Z
[5, 6]
6
7
8
ns
Shaded areas contain advance information.
Notes:
4. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
IOL/IOH and 30-pF load capacitance.
5. tHZOE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.
6. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.
7. The internal write time of the memory is defined by the overlap of CE LOW, and WE LOW. CE and WE must be LOW to initiate a write, and the transition of either of
these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write.
8. The minimum write cycle time for Write Cycle no. 3 (WE controlled, OE LOW) is the sum of tHZWE and tSD.
Document #: 38-05063 Rev. **
Page 4 of 10
PRELIMINARY
CY7C1049
Switching Characteristics[4] Over the Operating Range (continued)
7C1049-20
Parameter
Description
Min.
Max.
7C1049-25
Min.
Max.
Unit
READ CYCLE
tRC
Read Cycle Time
tAA
Address to Data Valid
tOHA
Data Hold from Address Change
tACE
CE LOW to Data Valid
20
25
ns
tDOE
OE LOW to Data Valid
8
10
ns
tLZOE
20
OE LOW to Low Z
25
ns
20
3
[6]
ns
5
0
[5, 6]
25
ns
0
ns
tHZOE
OE HIGH to High Z
tLZCE
CE LOW to Low Z[6]
tHZCE
CE HIGH to High Z[5, 6]
tPU
CE LOW to Power-Up
tPD
CE HIGH to Power-Down
WRITE CYCLE
[7]
tWC
Write Cycle Time
20
25
ns
8
3
10
ns
5
ns
8
0
10
ns
0
ns
20
25
ns
tSCE
CE LOW to Write End
13
15
ns
tAW
Address Set-Up to Write End
13
15
ns
tHA
Address Hold from Write End
0
0
ns
tSA
Address Set-Up to Write Start
0
0
ns
tPWE
WE Pulse Width
13
15
ns
tSD
Data Set-Up to Write End
9
10
ns
tHD
Data Hold from Write End
0
0
ns
tLZWE
WE HIGH to Low Z[6]
3
5
ns
tHZWE
WE LOW to High Z[5, 6]
8
10
ns
Data Retention Characteristics Over the Operating Range
Parameter
Conditions[10]
Description
VDR
VCC for Data Retention
ICCDR
Data Retention Current
Military
tCDR
tR[9]
Max
Unit
200
µA
1
mA
2
mA
2.0
Com’l
Ind’l
[3]
Min.
L VCC = VDR = 3.0V,
CE > VCC – 0.3V
VIN > VCC – 0.3V or VIN < 0.3V
Chip Deselect to Data Retention Time
Operation Recovery Time
V
0
ns
tRC
ns
Notes:
9. tr < 3 ns for the -12 and -15 speeds. tr < 5 ns for the -20 ns and slower speeds.
10. No input may exceed VCC + 0.5V.
Document #: 38-05063 Rev. **
Page 5 of 10
PRELIMINARY
CY7C1049
Data Retention Waveform
DATA RETENTION MODE
3.0V
VCC
3.0V
VDR > 2V
tR
tCDR
CE
1049–5
Switching Waveforms
Read Cycle No. 1[11, 12]
tRC
ADDRESS
tAA
tOHA
DATA OUT
PREVIOUS DATA VALID
DATA VALID
1049–6
Read Cycle No. 2 (OE Controlled)[12, 13]
ADDRESS
tRC
CE
tACE
OE
tHZOE
tDOE
DATA OUT
tLZOE
HIGH IMPEDANCE
tLZCE
VCC
SUPPLY
CURRENT
tHZCE
HIGH
IMPEDANCE
DATA VALID
tPD
tPU
50%
ICC
50%
ISB
1049–7
Notes:
11. Device is continuously selected. OE, CE = VIL.
12. WE is HIGH for read cycle.
13. Address valid prior to or coincident with CE transition LOW.
Document #: 38-05063 Rev. **
Page 6 of 10
PRELIMINARY
CY7C1049
Switching Waveforms (continued)
Write Cycle No. 1 (CE Controlled)[14, 15]
tWC
ADDRESS
tSCE
CE
tSA
tSCE
tHA
tAW
tPWE
WE
tSD
DATA I/O
tHD
DATA VALID
1049–8
Write Cycle No. 2 (WE Controlled, OE HIGH During Write)[14, 15]
tWC
ADDRESS
tSCE
CE
tAW
tSA
tHA
tPWE
WE
OE
tSD
DATA I/O
tHD
DATAIN VALID
NOTE 16
tHZOE
1049–9
Notes:
14. Data I/O is high impedance if OE = VIH.
15. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.
16. During this period the I/Os are in the output state and input signals should not be applied.
Document #: 38-05063 Rev. **
Page 7 of 10
PRELIMINARY
CY7C1049
Switching Waveforms (continued)
Write Cycle No. 3 (WE Controlled, OE LOW)[15]
tWC
ADDRESS
tSCE
CE
tAW
tSA
tHA
tPWE
WE
tSD
DATA I/O
NOTE 16
tHD
DATA VALID
tLZWE
tHZWE
1049–10
Ordering Information
Speed
(ns)
15
17
20
25
Ordering Code
Package
Name
Package Type
CY7C1049-15VC
V36
36-Lead (400-Mil) Molded SOJ
CY7C1049L-15VC
V36
36-Lead (400-Mil) Molded SOJ
CY7C1049-17VC
V36
36-Lead (400-Mil) Molded SOJ
CY7C1049L-17VC
V36
36-Lead (400-Mil) Molded SOJ
CY7C1049-20VC
V36
36-Lead (400-Mil) Molded SOJ
CY7C1049L-20VC
V36
36-Lead (400-Mil) Molded SOJ
CY7C1049-20VI
V36
36-Lead (400-Mil) Molded SOJ
CY7C1049L-20VI
V36
36-Lead (400-Mil) Molded SOJ
CY7C1049-20VM
V36
36-Lead (400-Mil) Molded SOJ
CY7C1049L-20VM
V36
36-Lead (400-Mil) Molded SOJ
CY7C1049-25VC
V36
36-Lead (400-Mil) Molded SOJ
CY7C1049L-25VC
V36
36-Lead (400-Mil) Molded SOJ
CY7C1049-25VI
V36
36-Lead (400-Mil) Molded SOJ
CY7C1049L-25VI
V36
36-Lead (400-Mil) Molded SOJ
CY7C1049-25VM
V36
36-Lead (400-Mil) Molded SOJ
CY7C1049L-25VM
V36
36-Lead (400-Mil) Molded SOJ
Operating
Range
Commercial
Industrial
Military
Commercial
Industrial
Military
Shaded areas contain advance information.
Document #: 38-05063 Rev. **
Page 8 of 10
PRELIMINARY
CY7C1049
Package Diagram
36-Lead (400-Mil) Molded SOJ V36
Document #: 38-05063 Rev. **
Page 9 of 10
© Cypress Semiconductor Corporation, 2001. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize
its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress
Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.
PRELIMINARY
CY7C1049
Document Title: CY7C1049 512K x 8 Static RAM
Document Number: 38-05063
REV.
ECN NO.
Issue
Date
Orig. of
Change
Description of Change
**
107256
09/10/01
SZV
Change from Spec number: 38-00563 to 38-05063
Document #: 38-05063 Rev. **
Page 10 of 10