ETC CY7C1019BV33-12VC

1CY7C1019V33
CY7C1019BV33
CY7C1018BV33
128K x 8 Static RAM
Features
• High speed
— tAA = 10 ns
• CMOS for optimum speed/power
• Center power/ground pinout
• Automatic power-down when deselected
• Easy memory expansion with CE and OE options
• Functionally equivalent to CY7C1019V33 and/or
CY7C1018V33
Functional Description
The CY7C1019BV33/CY7C1018BV33 is a high-performance
CMOS static RAM organized as 131,072 words by 8 bits. Easy
memory expansion is provided by an active LOW Chip Enable
(CE), an active LOW Output Enable (OE), and three-state drivers. This device has an automatic power-down feature that
significantly reduces power consumption when deselected.
Writing to the device is accomplished by taking Chip Enable
(CE) and Write Enable (WE) inputs LOW. Data on the eight I/O
pins (I/O0 through I/O7) is then written into the location specified on the address pins (A0 through A16).
Reading from the device is accomplished by taking Chip
Enable (CE) and Output Enable (OE) LOW while forcing Write
Enable (WE) HIGH. Under these conditions, the contents of
the memory location specified by the address pins will appear
on the I/O pins.
The eight input/output pins (I/O0 through I/O7) are placed in a
high-impedance state when the device is deselected (CE
HIGH), the outputs are disabled (OE HIGH), or during a write
operation (CE LOW, and WE LOW).
The CY7C1019BV33 is available in a standard 400-mil-wide
package. The CY7C1018BV33 is available in a standard
300-mil-wide package.
Logic Block Diagram
Pin Configurations
SOJ
Top View
A0
A1
A2
A3
I/O0
INPUT BUFFER
CE
I/O 0
I/O 1
VC C
V SS
I/O1
I/O2
SENSE AMPS
ROW DECODER
A0
A1
A2
A3
A4
A5
A6
A7
A8
512 x 256 x 8
ARRAY
I/O3
I/O 2
I/O 3
WE
A4
A5
A6
A7
I/O4
I/O5
CE
COLUMN
DECODER
I/O6
POWER
DOWN
I/O7
OE
A16
32
31
30
29
28
27
26
A15
A14
A13
OE
I/O 7
I/O 6
VS S
VC C
I/O 5
I/O 4
A12
A 11
A10
A9
A8
25
24
23
22
21
20
19
18
17
A9
A 10
A 11
A 12
A 13
A 14
A 15
A 16
WE
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Selection Guide
7C1019BV33-10
7C1018BV33-10
7C1019BV33-12
7C1018BV33-12
7C1019BV33-15
7C1018BV33-15
Maximum Access Time (ns)
10
12
15
Maximum Operating Current (mA)
175
160
145
Maximum Standby Current (mA)
L
Cypress Semiconductor Corporation
•
3901 North First Street
5
5
5
−
0.5
0.5
•
San Jose
•
CA 95134
•
408-943-2600
June 11, 2001
CY7C1019BV33
CY7C1018BV33
Maximum Ratings
Current into Outputs (LOW)20 mA
(Above which the useful life may be impaired. For user guidelines, not tested.)
Static Discharge Voltage>2001V
(per MIL-STD-883, Method 3015)
Storage Temperature –65°C to +150°C
Latch-Up Current>200 mA
Ambient Temperature with
Power Applied–55°C to +125°C
Operating Range
[1]
Supply Voltage on VCC to Relative GND –0.5V to +7.0V
Range
DC Voltage Applied to Outputs
in High Z State[1]–0.5V to VCC + 0.5V
Ambient
Temperature[2]
VCC
0°C to +70°C
3.3V ± 10%
Commercial
DC Input Voltage[1]–0.5V to VCC + 0.5V
Electrical Characteristics Over the Operating Range
7C1019BV33-10 7C1019BV33-12 7C1019BV33-15
7C1018BV33-10 7C1018BV33-12 7C1018BV33-15
Parameter
Description
Test Conditions
Min.
Max.
Min.
Max.
VOH
Output HIGH Voltage
VCC = Min.,
IOH = – 4.0 mA
VOL
Output LOW Voltage
VCC = Min.,
IOL = 8.0 mA
VIH
Input HIGH Voltage
2.2
VCC
+ 0.3
2.2
VCC
+ 0.3
VIL
Input LOW Voltage[1]
–0.3
0.8
–0.3
0.8
2.4
Min.
2.4
0.4
Max.
2.4
0.4
Unit
V
0.4
V
2.2
VCC
+ 0.3
V
–0.3
0.8
V
IIX
Input Load Current
GND < VI < VCC
–1
+1
–1
+1
–1
+1
µA
IOZ
Output Leakage
Current
GND < VI < VCC,
Output Disabled
–5
+5
–5
+5
–5
+5
µA
ICC
VCC Operating
Supply Current
VCC = Max.,
IOUT = 0 mA,
f = fMAX = 1/tRC
175
160
145
mA
ISB1
Automatic CE
Power-Down Current
—TTL Inputs
Max. VCC, CE > VIH
VIN > VIH or
VIN < VIL, f = fMAX
20
20
20
mA
ISB2
Automatic CE
Power-Down Current
—CMOS Inputs
Max. VCC,
CE > VCC – 0.3V,
VIN > VCC – 0.3V,
or VIN < 0.3V, f = 0
5
5
5
mA
−
0.5
0.5
L
Capacitance[3]
Parameter
Description
CIN
Input Capacitance
COUT
Output Capacitance
Test Conditions
TA = 25°C, f = 1 MHz,
VCC = 5.0V
Notes:
1. VIL (min.) = –2.0V for pulse durations of less than 20 ns.
2. TA is the “Instant On” case temperature.
3. Tested initially and after any design or process changes that may affect these parameters.
2
Max.
Unit
6
pF
8
pF
CY7C1019BV33
CY7C1018BV33
AC Test Loads and Waveforms
R1 480 Ω
R1 480 Ω
3.3V
ALL INPUT PULSES
3.3V
OUTPUT
3.0V
90%
OUTPUT
R2
255 Ω
30 pF
INCLUDING
JIG AND
SCOPE
(a)
R2
255 Ω
5 pF
INCLUDING
JIG AND
SCOPE
(b)
90%
10%
GND
10%
≤ 3 ns
≤ 3 ns
THÉVENIN EQUIVALENT
167 Ω
1.73V
OUTPUT
Equivalent to:
Switching Characteristics[4] Over the Operating Range
Parameter
Description
7C1019BV33-10
7C1018BV33-10
7C1019BV33-12
7C1018BV33-12
7C1019BV33-15
7C1018BV33-15
Min.
Min.
Min.
Max.
Max.
Max.
Unit
READ CYCLE
tRC
Read Cycle Time
tAA
Address to Data Valid
tOHA
Data Hold from Address Change
tACE
CE LOW to Data Valid
10
12
15
ns
tDOE
OE LOW to Data Valid
5
6
7
ns
tLZOE
OE LOW to Low Z
tHZOE
OE HIGH to High
10
10
3
Z[6]
CE LOW to Low
tHZCE
CE HIGH to High Z[5, 6]
tPU
CE LOW to Power-Up
tPD
CE HIGH to Power-Down
15
12
3
0
5
3
3
0
10
ns
7
6
ns
ns
7
0
12
ns
ns
0
3
0
15
6
5
ns
3
0
Z[5, 6]
tLZCE
WRITE CYCLE
12
ns
ns
15
ns
[7, 8]
tWC
Write Cycle Time
10
12
15
ns
tSCE
CE LOW to Write End
8
9
10
ns
tAW
Address Set-Up to Write End
7
8
10
ns
tHA
Address Hold from Write End
0
0
0
ns
tSA
Address Set-Up to Write Start
0
0
0
ns
tPWE
WE Pulse Width
7
8
10
ns
tSD
Data Set-Up to Write End
5
6
8
ns
tHD
Data Hold from Write End
0
0
0
ns
tLZWE
WE HIGH to Low Z[6]
3
3
3
ns
tHZWE
WE LOW to High Z[5, 6]
5
6
7
ns
Notes:
4. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
IOL/IOH and 30-pF load capacitance.
5. tHZOE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.
6. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.
7. The internal write time of the memory is defined by the overlap of CE LOW and WE LOW. CE and WE must be LOW to initiate a write, and the transition of any of these
signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write.
8. The minimum write cycle time for Write Cycle no. 3 (WE controlled, OE LOW) is the sum of tHZWE and tSD.
3
CY7C1019BV33
CY7C1018BV33
Data Retention Characteristics Over the Operating Range (L Version Only)
Parameter
ICCDR
tCDR
Description
Conditions
VCC for Data Retention
VDR
Data Retention Current
[3]
Chip Deselect to Data Retention Time
tR
Min.
No input may exceed VCC + 0.5V
VCC = VDR = 2.0V,
CE > VCC – 0.3V,
VIN > VCC – 0.3V or VIN < 0.3V
Max.
2.0
V
150
Operation Recovery Time
Unit
µA
0
ns
200
µs
Data Retention Waveform
DATA RETENTION MODE
3.0V
VCC
VDR > 2V
3.0V
tR
tCDR
CE
Switching Waveforms
Read Cycle No. 1[9, 10]
tRC
ADDRESS
tAA
tOHA
DATA OUT
PREVIOUS DATA VALID
DATA VALID
Read Cycle No. 2 (OE Controlled)[10, 11]
ADDRESS
tRC
CE
tACE
OE
tHZOE
tDOE
DATA OUT
tHZCE
tLZOE
HIGH IMPEDANCE
DATA VALID
tLZCE
VCC
SUPPLY
CURRENT
HIGH
IMPEDANCE
tPD
tPU
ICC
50%
50%
ISB
Notes:
9. Device is continuously selected. OE, CE = VIL.
10. WE is HIGH for read cycle.
11. Address valid prior to or coincident with CE transition LOW.
4
CY7C1019BV33
CY7C1018BV33
Switching Waveforms (continued)
Write Cycle No. 1 (CE Controlled)[12, 13]
tWC
ADDRESS
tSCE
CE
tSA
tSCE
tHA
tAW
tPWE
WE
tSD
DATA I/O
tHD
DATA VALID
Write Cycle No. 2 (WE Controlled, OE HIGH During Write)[12, 13]
tWC
ADDRESS
tSCE
CE
tAW
tHA
tSA
tPWE
WE
OE
tSD
DATA I/O
DATAIN VALID
NOTE 14
tHZOE
Notes:
12. Data I/O is high impedance if OE = VIH.
13. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.
14. During this period the I/Os are in the output state and input signals should not be applied.
5
tHD
CY7C1019BV33
CY7C1018BV33
Switching Waveforms (continued)
Write Cycle No. 3 (WE Controlled, OE LOW)[13]
tWC
ADDRESS
tSCE
CE
tAW
tSA
tHA
tPWE
WE
tSD
NOTE 14
DATA I/O
tHD
DATA VALID
tLZWE
tHZWE
Truth Table
CE
OE
WE
I/O0–I/O7
Mode
Power
H
X
X
High Z
Power-Down
Standby (ISB)
X
X
X
High Z
Power-Down
Standby (ISB)
L
L
H
Data Out
Read
Active (ICC)
L
X
L
Data In
Write
Active (ICC)
L
H
H
High Z
Selected, Outputs Disabled
Active (ICC)
Ordering Information
Speed
(ns)
10
Ordering Code
CY7C1018V33-10VC
CY7C1019BV33-10VC
12
CY7C1018BV33-12VC
CY7C1018BV33L-12VC
CY7C1019BV33-12VC
CY7C1019BV33L-12VC
15
CY7C1018BV33-15VC
CY7C1018BV33L-15VC
CY7C1018BV33-15VI
CY7C1019BV33-15VC
CY7C1019BV33L-15VC
CY7C1019BV33-15VI
Document #: 38-01053-*B
Package
Name
V32
V33
V32
V32
V33
V33
V32
V32
V32
V33
V33
V33
Package Type
32-Lead 300-Mil Molded SOJ
32-Lead 400-Mil Molded SOJ
32-Lead 300-Mil Molded SOJ
32-Lead 300-Mil Molded SOJ
32-Lead 400-Mil Molded SOJ
32-Lead 400-Mil Molded SOJ
32-Lead 300-Mil Molded SOJ
32-Lead 300-Mil Molded SOJ
32-Lead 300-Mil Molded SOJ
32-Lead 400-Mil Molded SOJ
32-Lead 400-Mil Molded SOJ
32-Lead 400-Mil Molded SOJ
6
Operating
Range
Commercial
Industrial
CY7C1019BV33
CY7C1018BV33
Package Diagram
32-Lead (400-Mil) Molded SOJ V33
51-85041-A
32-Lead (300-Mil) Molded SOJ V32
51-85041
© Cypress Semiconductor Corporation, 2001. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize
its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress
Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.