CYPRESS CY7C1019B-12ZC

CY7C1019B
128K x 8 Static RAM
Features
expansion is provided by an active LOW Chip Enable (CE), an
active LOW Output Enable (OE), and tri-state drivers. This
device has an automatic power-down feature that significantly
reduces power consumption when deselected.
• High speed
— tAA = 12 ns
Writing to the device is accomplished by taking Chip Enable
(CE) and Write Enable (WE) inputs LOW. Data on the eight I/O
pins (I/O0 through I/O7) is then written into the location
specified on the address pins (A0 through A16).
• CMOS for optimum speed/power
• Center power/ground pinout
• Automatic power-down when deselected
• Easy memory expansion with CE and OE options
• Functionally equivalent to CY7C1019
• Available in Pb-free and non Pb-free 32-pin TSOP II, non
Pb-free 400-mil-wide SOJ packages.
Functional Description
The CY7C1019B is a high-performance CMOS static RAM
organized as 131,072 words by 8 bits. Easy memory
Reading from the device is accomplished by taking Chip
Enable (CE) and Output Enable (OE) LOW while forcing Write
Enable (WE) HIGH. Under these conditions, the contents of
the memory location specified by the address pins will appear
on the I/O pins.
The eight input/output pins (I/O0 through I/O7) are placed in a
high-impedance state when the device is deselected (CE
HIGH), the outputs are disabled (OE HIGH), or during a write
operation (CE LOW, and WE LOW).
Logic Block Diagram
Pin Configurations
SOJ /TSOPII
Top View
A0
A1
A2
A3
I/O0
CE
I/O0
I/O1
VCC
V SS
INPUT BUFFER
SENSE AMPS
I/O2
ROW DECODER
A0
A1
A2
A3
A4
A5
A6
A7
A8
I/O1
128K x 8
ARRAY
I/O3
I/O4
I/O5
COLUMN
DECODER
CE
I/O6
POWER
DOWN
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
A16
A15
A14
A13
OE
I/O7
I/O6
VSS
VCC
I/O5
I/O4
A12
A11
A10
A9
A8
I/O7
A9
A 10
A 11
A 12
A 13
A 14
A 15
A 16
WE
OE
I/O2
I/O3
WE
A4
A5
A6
A7
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
Selection Guide
-12
-15
Unit
Maximum Access Time
12
15
ns
Maximum Operating Current
140
130
mA
Maximum Standby Current
10
10
mA
Cypress Semiconductor Corporation
Document #: 38-05026 Rev. *C
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised August 3, 2006
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CY7C1019B
Maximum Ratings
Current into Outputs (LOW)......................................... 20 mA
Static Discharge Voltage............................................ >2001V
(per MIL-STD-883, Method 3015)
(Above which the useful life may be impaired. For user guidelines, not tested.)
Latch-Up Current ..................................................... >200 mA
Storage Temperature ................................. –65°C to +150°C
Operating Range
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage on VCC to Relative GND[1] .... –0.5V to +7.0V
Range
DC Voltage Applied to Outputs
in High Z State[1] ....................................–0.5V to VCC + 0.5V
Commercial
Ambient
Temperature[2]
VCC
0°C to +70°C
5V ± 10%
DC Input Voltage[1] .................................–0.5V to VCC + 0.5V
Electrical Characteristics Over the Operating Range
-12
Parameter
Description
Test Conditions
Min.
VOH
Output HIGH Voltage
VCC = Min., IOH = – 4.0 mA
VOL
Output LOW Voltage
VCC = Min., IOL = 8.0 mA
VIH
Input HIGH Voltage
-15
Max.
Min.
2.4
0.4
Voltage[1]
Max.
Unit
2.4
V
0.4
V
V
2.2
VCC + 0.3
2.2
VCC + 0.3
VIL
Input LOW
–0.3
0.8
–0.3
0.8
V
IIX
Input Leakage Current
GND < VI < VCC
–1
+1
–1
+1
µA
IOZ
Output Leakage Current GND < VI < VCC,
Output Disabled
–5
+5
–5
+5
µA
ICC
VCC Operating
Supply Current
VCC = Max., IOUT = 0 mA,
f = fMAX = 1/tRC
140
130
mA
ISB1
Automatic CE
Power- Down Current
—TTL Inputs
Max. VCC, CE > VIH
VIN > VIH or VIN < VIL, f = fMAX
40
40
mA
ISB2
Automatic CE
Power-Down Current
—CMOS Inputs
Max. VCC, CE > VCC – 0.3V,
VIN > VCC – 0.3V,
or VIN < 0.3V, f = 0
10
10
mA
Capacitance[3]
Parameter
Description
CIN
Input Capacitance
COUT
Output Capacitance
Test Conditions
Max.
TA = 25°C, f = 1 MHz,
VCC = 5.0V
Unit
6
pF
8
pF
AC Test Loads and Waveforms
R1 480Ω
R1 480Ω
5V
ALL INPUT PULSES
3.0V
5V
OUTPUT
90%
OUTPUT
30 pF
R2
255Ω
INCLUDING
JIG AND
SCOPE
(a)
5 pF
R2
255Ω
GND
INCLUDING
JIG AND
SCOPE
(b)
90%
10%
10%
≤ 3 ns
≤ 3 ns
Equivalent to: THÉVENIN EQUIVALENT
167Ω
1.73V
OUTPUT
Notes:
1. VIL (min.) = –2.0V for pulse durations of less than 20 ns.
2. TA is the “Instant On” case temperature.
3. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-05026 Rev. *C
Page 2 of 8
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CY7C1019B
Switching Characteristics[4] Over the Operating Range
-12
Parameter
Description
Min.
-15
Max.
Min.
Max.
Unit
Read Cycle
tRC
Read Cycle Time
12
tAA
Address to Data Valid
tOHA
Data Hold from Address Change
tACE
CE LOW to Data Valid
12
15
ns
tDOE
OE LOW to Data Valid
6
7
ns
tLZOE
OE LOW to Low Z
3
OE HIGH to High Z
[6]
tLZCE
CE LOW to Low Z
CE HIGH to High Z[5, 6]
tPU
CE LOW to Power-Up
15
3
ns
7
3
6
0
ns
ns
7
0
12
ns
ns
0
6
CE HIGH to Power-Down
tPD
ns
3
0
tHZCE
Write Cycle
12
[5, 6]
tHZOE
15
ns
ns
15
ns
[7, 8]
tWC
Write Cycle Time
12
15
ns
tSCE
CE LOW to Write End
9
10
ns
tAW
Address Set-Up to Write End
8
10
ns
tHA
Address Hold from Write End
0
0
ns
tSA
Address Set-Up to Write Start
0
0
ns
tPWE
WE Pulse Width
8
10
ns
tSD
Data Set-Up to Write End
6
8
ns
tHD
Data Hold from Write End
0
0
ns
tLZWE
WE HIGH to Low Z[6]
3
3
ns
tHZWE
WE LOW to High
Z[5, 6]
6
7
ns
Notes:
4. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified
IOL/IOH and 30-pF load capacitance.
5. tHZOE, tHZCE, and tHZWE are specified with a load capacitance of 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.
6. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.
7. The internal write time of the memory is defined by the overlap of CE LOW and WE LOW. CE and WE must be LOW to initiate a write, and the transition of any
of these signals can terminate the write. The input data set-up and hold timing should be referenced to the leading edge of the signal that terminates the write.
8. The minimum write cycle time for Write Cycle no. 3 (WE controlled, OE LOW) is the sum of tHZWE and tSD.
Document #: 38-05026 Rev. *C
Page 3 of 8
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CY7C1019B
Data Retention Waveform
DATA RETENTION MODE
3.0V
VCC
VDR > 2V
3.0V
tR
tCDR
CE
Switching Waveforms
Read Cycle No. 1[9, 10]
tRC
ADDRESS
tAA
tOHA
DATA OUT
PREVIOUS DATA VALID
DATA VALID
Read Cycle No. 2 (OE Controlled)[10, 11]
ADDRESS
tRC
CE
tACE
OE
tHZOE
tDOE
DATA OUT
tLZOE
HIGH IMPEDANCE
tLZCE
VCC
SUPPLY
CURRENT
tHZCE
HIGH
IMPEDANCE
DATA VALID
tPD
tPU
50%
ICC
50%
ISB
Notes:
9. Device is continuously selected. OE, CE = VIL.
10. WE is HIGH for read cycle.
11. Address valid prior to or coincident with CE transition LOW.
Document #: 38-05026 Rev. *C
Page 4 of 8
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CY7C1019B
Switching Waveforms (continued)
Write Cycle No. 1 (CE Controlled)[12, 13]
tWC
ADDRESS
tSCE
CE
tSA
tSCE
tHA
tAW
tPWE
WE
tSD
DATA I/O
tHD
DATA VALID
Write Cycle No. 2 (WE Controlled, OE HIGH During Write)[12, 13]
tWC
ADDRESS
tSCE
CE
tAW
tSA
tHA
tPWE
WE
OE
tSD
DATA I/O
tHD
DATAIN VALID
NOTE 14
tHZOE
Notes:
12. Data I/O is high impedance if OE = VIH.
13. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high-impedance state.
14. During this period the I/Os are in the output state and input signals should not be applied.
Document #: 38-05026 Rev. *C
Page 5 of 8
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CY7C1019B
Switching Waveforms (continued)
Write Cycle No. 3 (WE Controlled, OE LOW)[13]
tWC
ADDRESS
tSCE
CE
tAW
tSA
tHA
tPWE
WE
tSD
NOTE 14
DATA I/O
tHD
DATA VALID
tLZWE
tHZWE
Truth Table
CE
H
OE
X
WE
X
L
L
I/O0–I/O7
Mode
Power
High Z
Power-Down
Standby (ISB)
H
Data Out
Read
Active (ICC)
L
X
L
Data In
Write
Active (ICC)
L
H
H
High Z
Selected, Outputs Disabled
Active (ICC)
Ordering Information
Speed
(ns)
12
15
Ordering Code
CY7C1019B-12VC
CY7C1019B-12ZC
CY7C1019B-12ZXC
CY7C1019B-15VC
CY7C1019B-15ZXC
Package
Name
51-85033
51-85095
32-pin
32-pin
32-pin
51-85033 32-pin
51-85095 32-pin
Package Type
400-Mil Molded SOJ
TSOP Type II
TSOP Type II (Pb -Free)
400-Mil Molded SOJ
TSOP Type II (Pb -Free)
Operating
Range
Commercial
Commercial
Please contact local sales representative regarding availability of these parts
Document #: 38-05026 Rev. *C
Page 6 of 8
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CY7C1019B
Package Diagrams
32-pin (400-mil) Molded SOJ (51-85033)
51-85033-*B
32-pin TSOP II (51-85095)
51-85095-**
All product or company names mentioned in this document may be the trademarks of their respective holders.
Document #: 38-05026 Rev. *C
Page 7 of 8
© Cypress Semiconductor Corporation, 2006. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be
used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its
products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress
products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
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CY7C1019B
Document History Page
Document Title: CY7C1019B 128K x 8 Static RAM
Document Number: 38-05026
REV.
ECN NO.
Issue Date
Orig. of
Change
Description of Change
**
109949
09/25/01
SZV
Change from Spec number: 38-01115 to 38-05026
*A
116170
08/14/02
HGK
1. SOJ (400-mil) package outline replacing incorrect SOJ package
2. Pin for pin compatible with CY7C1019
3. Industrial packages added to Ordering Information
*B
397875
See ECN
NXR
Changed address of Cypress Semiconductor Corporation on Page# 1
from “3901 North First Street” to “198 Champion Court”
Updated the Ordering Information Table on page # 6
*C
493543
See ECN
NXR
Removed CY7C10191B from product offering
Removed Industrial Operating Range
Changed the description of IIX from Input Load Current to
Input Leakage Current in DC Electrical Characteristics table
Removed IOS parameter from DC Electrical Characteristics table
Updated Ordering Information table
Document #: 38-05026 Rev. *C
Page 8 of 8
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