PHILIPS BLA1011-300

BLA1011-300
Avionics LDMOS transistors
Rev. 02 — 5 February 2008
Product data sheet
1. Product profile
1.1 General description
300 W LDMOS pulsed power transistor for TCAS and IFF applications at frequencies from
1030 MHz to 1090 MHz.
Table 1.
Typical performance
RF performance at Tcase = 25 °C in a common source class-AB production test circuit; tp = 50 µs;
δ = 2 %.
Mode of operation
Pulsed class-AB
f
IDq
VDS
PL
Gp
ηD
(MHz)
(mA)
(V)
(W)
(dB)
(%)
1030 to 1090
150
32
300
16.5
57
CAUTION
This device is sensitive to ElectroStatic Discharge (ESD). Therefore care should be taken
during transport and handling.
1.2 Features
n Typical performance at frequencies between 1030 MHz and 1090 MHz, a supply
voltage of 32 V, an IDq of 150 mA, a tp of 50 µs and a δ of 2 %:
u Output power = 300 W
u Power gain = 16.5 dB (typ)
u Efficiency = 57 % (typ)
n Easy power control
n Excellent ruggedness
n High efficiency
n Excellent thermal stability
n Designed for operation in 1030 MHz to 1090 MHz band
n Internally matched for ease of use
n Compliant to Directive 2002/95/EC, regarding Restriction of Hazardous Substances
(RoHS)
1.3 Applications
n RF power amplifiers for Avionics applications in the 1030 MHz to 1090 MHz frequency
band
BLA1011-300
NXP Semiconductors
Avionics LDMOS transistors
2. Pinning information
Table 2.
Pinning
Pin
Description
1
drain
2
gate
3
source
Simplified outline
Symbol
1
1
3
[1]
2
2
3
sym112
[1]
Connected to flange
3. Ordering information
Table 3.
Ordering information
Type number
Package
BLA1011-300
Name
Description
Version
-
flanged LDMOST ceramic package; 2 mounting
holes; 2 leads
SOT957A
4. Limiting values
Table 4.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
VDS
VGS
Conditions
Min
Max
Unit
drain-source voltage
-
65
V
gate-source voltage
−0.5
+15
V
ID
drain current
-
15
A
Tstg
storage temperature
−65
+150
°C
Tj
junction temperature
-
200
°C
5. Thermal characteristics
Table 5.
Thermal characteristics
Symbol
Parameter
Conditions
Typ
Max
Unit
Zth(j-h)
transient thermal impedance from
junction to heatsink
Tcase = 25 °C; tp = 50 µs;
δ = 2 %; PL = 300 W
0.1
0.15
K/W
BLA1011-300_2
Product data sheet
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Rev. 02 — 5 February 2008
2 of 11
BLA1011-300
NXP Semiconductors
Avionics LDMOS transistors
6. Characteristics
Table 6.
Characteristics
Tj = 25 °C unless otherwise specified.
Symbol Parameter
Conditions
Min
Typ
Max
Unit
V(BR)DSS drain-source
breakdown voltage
VGS = 0 V; ID = 3.75 mA
65
-
-
V
VDS = 20 V; ID = 375 mA
5.2
5.6
6.2
V
VGS(th)
gate-source threshold
voltage
VGSq
gate-source quiescent VDS = 32 V; ID = 150 mA
voltage
-
5.48
-
V
IDSS
drain leakage current
VGS = 0 V; VDS = 32 V
-
-
3.3
µA
IDSX
drain cut-off current
VGS = VGS(th) + 6 V; VDS = 10 V
50
63
73
A
IGSS
gate leakage current
VGS = 13 V; VDS = 0 V
-
-
60
nA
gfs
forward
transconductance
VDS = 20 V; ID = 24 A
-
15
-
S
RDS(on)
drain-source on-state
resistance
VGS = VGS(th) + 6 V; ID =13.5 A
-
55
80
mΩ
7. Application information
Table 7.
Application information
Mode of operation: Pulsed RF; tp = 50 µs; δ = 2 %; VDS = 32 V; IDq = 150 mA; Tcase = 25 °C; unless
otherwise specified.
Symbol
Parameter
PL
output power
Conditions
Typ
Max
Unit
300
-
-
W
Gp
power gain
PL = 300 W
15
16.5
-
dB
RLin
input return loss
PL = 300 W
-
10
-
dB
ηD
drain efficiency
PL = 300 W
52
57
-
%
tr
rise time
PL = 300 W
-
30
50
ns
tf
fall time
PL = 300 W
-
5
50
ns
Pdroop(pulse)
pulse droop power
PL = 300 W
-
0
0.2
dB
BLA1011-300_2
Product data sheet
Min
© NXP B.V. 2008. All rights reserved.
Rev. 02 — 5 February 2008
3 of 11
BLA1011-300
NXP Semiconductors
Avionics LDMOS transistors
Table 8.
Typical impedance
f
ZS
ZL
MHz
Ω
Ω
1030
4.25 − j3.57
1.27 − j0.33
1060
4.24 − j3.56
1.04 − j0.41
1090
4.47 − j3.71
0.91 − j0.60
drain
ZL
gate
ZS
001aag189
Fig 1. Definition of transistor impedance
7.1 Ruggedness in class-AB operation
The BLA1011-300 is capable of withstanding a load mismatch corresponding to
VSWR = 10 : 1 through all phases under the following conditions: VDS = 32 V;
IDq = 150 mA; PL = 300 W; f = 1030 MHz to 1090 MHz.
001aag190
80
001aag191
20
Gp
(dB)
ηD
(%)
(2)
(3)
(1)
16
60
12
(1)
(2)
(3)
40
8
20
4
0
0
0
100
200
300
400
0
100
PL (W)
300
400
PL (W)
(1) f = 1030 MHz
(1) f = 1030 MHz
(2) f = 1060 MHz
(2) f = 1060 MHz
(3) f = 1090 MHz
(3) f = 1090 MHz
BLA1011-300 in a wideband circuit; VDS = 32 V;
IDq = 150 mA; tp = 50 µs; δ = 2 %.
Fig 2. Drain efficiency as functions of load power;
typical values
BLA1011-300 in a wideband circuit; VDS = 32 V;
IDq = 150 mA; tp = 50 µs; δ = 2 %.
Fig 3. Power gain as a function of load power; typical
values
BLA1011-300_2
Product data sheet
200
© NXP B.V. 2008. All rights reserved.
Rev. 02 — 5 February 2008
4 of 11
BLA1011-300
NXP Semiconductors
Avionics LDMOS transistors
001aag192
400
Gp
(dB)
PL
(W)
18
300
(3)
(1)
(2)
001aag193
20
70
ηD
(%)
ηD
60
Gp
16
50
14
40
12
30
200
100
0
0
2
4
6
8
10
10
1020
Pi (W)
1040
1060
20
1100
1080
f (MHz)
VDS = 32 V; IDq = 150 mA; tp = 50 µs; δ = 2 %.
(1) f = 1030 MHz
(2) f = 1060 MHz
(3) f = 1090 MHz
BLA1011-300 in a wideband circuit; VDS = 32 V;
IDq = 150 mA; tp = 50 µs; δ = 2 %.
Fig 4. Load power as a function of input power;
typical values
Fig 5. Power gain and drain efficiency as functions of
frequency; typical values
BLA1011-300_2
Product data sheet
© NXP B.V. 2008. All rights reserved.
Rev. 02 — 5 February 2008
5 of 11
BLA1011-300
NXP Semiconductors
Avionics LDMOS transistors
8. Test information
C5
C8
R1
C9 C12
C10
C11
C6
L1
C7
R2
C2
C1
T3
T1
T4
T6
T2
T7 T8
C4
T5
C3
001aah710
Printed-Circuit Board (PCB): Rogers Duroid 6006; εr = 6.2 F/m; height = 0.64 mm.
See Table 9 for list of components.
Fig 6. Component layout for common source class-AB pulsed production test circuit
Table 9.
List of components (see Figure 6)
To ensure good power supply of the device, adding an electrolytic capacitor close to the supply connection of the circuit may be required. The actual capacitor value may differ depending on the pulse
format, the quality of the power supply and the length of the connecting wires to the power supply. In
general a value of 470 µF will be sufficient.
Component Description
Value
C1, C4
multilayer ceramic chip capacitor 62 pF
C2, C3
multilayer ceramic chip capacitor 1.5 pF
[2]
C5
multilayer ceramic chip capacitor 100 pF
[2]
C6, C8
multilayer ceramic chip capacitor 62 pF
[2]
C7
multilayer ceramic chip capacitor 10 pF
[2]
C9
multilayer ceramic chip capacitor 1.2 nF
[1]
C10
electrolytic capacitor
47 µF; 20 V
C11
electrolytic capacitor
47 µF; 63 V
C12
multilayer ceramic chip capacitor 47 pF
L1
Ω-shaped enameled copper wire d = 1 mm;
length = 38 mm
R1
SMD resistor
18 Ω
BLA1011-300_2
Product data sheet
Remarks
[1]
[1]
0508 package
© NXP B.V. 2008. All rights reserved.
Rev. 02 — 5 February 2008
6 of 11
BLA1011-300
NXP Semiconductors
Avionics LDMOS transistors
Table 9.
List of components (see Figure 6) …continued
To ensure good power supply of the device, adding an electrolytic capacitor close to the supply connection of the circuit may be required. The actual capacitor value may differ depending on the pulse
format, the quality of the power supply and the length of the connecting wires to the power supply. In
general a value of 470 µF will be sufficient.
Component Description
Value
R2
metal film resistor
49.9 Ω
T1
stripline
-
(W × L) 5 mm × 9 mm
T2
stripline
-
(W × L) 1.25 mm × 7.5 mm
T3
stripline
-
(W × L) 15 mm × 11 mm
T4
stripline
-
(W × L) 40 mm × 16.8 mm
T5
stripline
-
(W × L) 1 mm × 6.25 mm
T6
stripline
-
(W × L) 4.95 mm × 3.55 mm
T7
stripline
-
(W × L) 9.4 mm × 3 mm
T8
stripline
-
(W × L) 12 mm × 2.45 mm
[1]
American Technical Ceramics type 100A or capacitor of same quality.
[2]
American Technical Ceramics type 100B or capacitor of same quality.
BLA1011-300_2
Product data sheet
Remarks
© NXP B.V. 2008. All rights reserved.
Rev. 02 — 5 February 2008
7 of 11
BLA1011-300
NXP Semiconductors
Avionics LDMOS transistors
9. Package outline
Flanged LDMOST ceramic package; 2 mounting holes; 2 leads
SOT957A
D
A
F
3
D1
U1
B
q
C
c
1
L
U2
H
E1
p
w1
A
M
A
M
B
E
M
2
w2
b
0
M
C
5
Q
M
10 mm
scale
DIMENSIONS (mm are the original dimensions)
UNIT
A
b
c
D
D1
E
E1
F
H
L
P
Q
q
U1
U2
w1
w2
mm
4.67
4.08
12.83
12.57
0.15
0.10
22.07
21.62
22.04
21.64
9.53
9.27
9.55
9.25
1.14
0.89
19.94
18.92
5.33
4.31
3.38
3.12
1.70
1.45
27.94
34.16
33.91
9.91
9.65
0.25
0.25
0.184 0.505
0.1605 0.495
0.006
0.004
0.869
0.851
0.868
0.852
0.375
0.365
0.376
0.364
0.045
0.035
0.785
0.745
0.210
0.170
0.133
0.123
0.067
0.057
1.100
1.345
1.335
0.390
0.380
0.01
0.01
inches
OUTLINE
VERSION
REFERENCES
IEC
JEDEC
JEITA
EUROPEAN
PROJECTION
ISSUE DATE
06-06-29
07-03-01
SOT957A
Fig 7. Package outline SOT957A
BLA1011-300_2
Product data sheet
© NXP B.V. 2008. All rights reserved.
Rev. 02 — 5 February 2008
8 of 11
BLA1011-300
NXP Semiconductors
Avionics LDMOS transistors
10. Abbreviations
Table 10.
Abbreviations
Acronym
Description
IFF
Identification Friend or Foe
LDMOS
Laterally Diffused Metal Oxide Semiconductor
LDMOST
Laterally Diffused Metal-Oxide Semiconductor Transistor
RF
Radio Frequency
TCAS
Traffic Collision Avoidance System
VSWR
Voltage Standing-Wave Ratio
11. Revision history
Table 11.
Revision history
Document ID
Release date
Data sheet status
Change notice
Supersedes
BLA1011-300_2
20080205
Product data sheet
-
BLA1011-300_1
Modifications:
BLA1011-300_1
•
•
Section 1.2 “Features” on page 1: added RoHS compliance statement
Added Section 8 “Test information” on page 6.
20070403
Product data sheet
BLA1011-300_2
Product data sheet
-
-
© NXP B.V. 2008. All rights reserved.
Rev. 02 — 5 February 2008
9 of 11
BLA1011-300
NXP Semiconductors
Avionics LDMOS transistors
12. Legal information
12.1 Data sheet status
Document status[1][2]
Product status[3]
Definition
Objective [short] data sheet
Development
This document contains data from the objective specification for product development.
Preliminary [short] data sheet
Qualification
This document contains data from the preliminary specification.
Product [short] data sheet
Production
This document contains the product specification.
[1]
Please consult the most recently issued document before initiating or completing a design.
[2]
The term ‘short data sheet’ is explained in section “Definitions”.
[3]
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
12.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
12.3 Disclaimers
General — Information in this document is believed to be accurate and
reliable. However, NXP Semiconductors does not give any representations or
warranties, expressed or implied, as to the accuracy or completeness of such
information and shall have no liability for the consequences of use of such
information.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in medical, military, aircraft,
space or life support equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liability for inclusion and/or use of
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) may cause permanent
damage to the device. Limiting values are stress ratings only and operation of
the device at these or any other conditions above those given in the
Characteristics sections of this document is not implied. Exposure to limiting
values for extended periods may affect device reliability.
Terms and conditions of sale — NXP Semiconductors products are sold
subject to the general terms and conditions of commercial sale, as published
at http://www.nxp.com/profile/terms, including those pertaining to warranty,
intellectual property rights infringement and limitation of liability, unless
explicitly otherwise agreed to in writing by NXP Semiconductors. In case of
any inconsistency or conflict between information in this document and such
terms and conditions, the latter will prevail.
No offer to sell or license — Nothing in this document may be interpreted
or construed as an offer to sell products that is open for acceptance or the
grant, conveyance or implication of any license under any copyrights, patents
or other industrial or intellectual property rights.
12.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
13. Contact information
For additional information, please visit: http://www.nxp.com
For sales office addresses, send an email to: [email protected]
BLA1011-300_2
Product data sheet
© NXP B.V. 2008. All rights reserved.
Rev. 02 — 5 February 2008
10 of 11
BLA1011-300
NXP Semiconductors
Avionics LDMOS transistors
14. Contents
1
1.1
1.2
1.3
2
3
4
5
6
7
7.1
8
9
10
11
12
12.1
12.2
12.3
12.4
13
14
Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1
General description. . . . . . . . . . . . . . . . . . . . . . 1
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Pinning information . . . . . . . . . . . . . . . . . . . . . . 2
Ordering information . . . . . . . . . . . . . . . . . . . . . 2
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 2
Thermal characteristics. . . . . . . . . . . . . . . . . . . 2
Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Application information. . . . . . . . . . . . . . . . . . . 3
Ruggedness in class-AB operation. . . . . . . . . . 4
Test information . . . . . . . . . . . . . . . . . . . . . . . . . 6
Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 8
Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Revision history . . . . . . . . . . . . . . . . . . . . . . . . . 9
Legal information. . . . . . . . . . . . . . . . . . . . . . . 10
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 10
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Contact information. . . . . . . . . . . . . . . . . . . . . 10
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
© NXP B.V. 2008.
All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
Date of release: 5 February 2008
Document identifier: BLA1011-300_2