SIGC156T120R2CQ IGBT Chip in Fieldstop-technology FEATURES: • 1200V Fieldstop technology 120µm chip • low turn-off losses • short tail current • positive temperature coefficient • integrated gate resistor Chip Type VCE ICn SIGC156T120R2CQ 1200V 100A This chip is used for: • IGBT Modules C Applications: • SMPS, resonant applications Die Size Package 12.59 X 12.59 mm2 sawn on foil G E Ordering Code SP0000-83655 MECHANICAL PARAMETER: Raster size Emitter pad size Gate pad size Area total / active 12.59 X 12.59 mm 2 8 x (3.98 x 2.38) 1.46 x 0.8 158.5 / 132.6 Thickness 120 µm Wafer size 150 mm Flat position 90 grd Max.possible chips per wafer 82 pcs Passivation frontside Photoimide Emitter metallization 3200 nm Al Si Cu Collector metallization Die bond Wire bond Reject Ink Dot Size Recommended Storage Environment 1400 nm Ni Ag –system suitable for epoxy and soft solder die bonding electrically conductive glue or solder Al, <500µm ∅ 0.65mm ; max 1.2mm store in original container, in dry nitrogen, < 6 month at an ambient temperature of 23°C Edited by INFINEON Technologies AI PS DD HV3, L7181Q, 02.06.2005, Edition 1.0 SIGC156T120R2CQ MAXIMUM RATINGS: Parameter Symbol Value Unit 1200 V 1) A Collector-emitter voltage, Tj=25 °C V CE DC collector current, limited by Tjmax IC Pulsed collector current, tp limited by Tjmax Icpuls 300 A Gate emitter voltage V GE ±20 V Operating junction and storage temperature Tj, Ts t g -40 ... +150 °C 1) depending on thermal properties of assembly STATIC CHARACTERISTICS (tested on chip), Tj=25 °C, unless otherwise specified: Parameter Symbol Value Conditions Min. typ. Unit max. Collector-emitter breakdown voltage V(BR)CES VGE=0V , IC=5mA 1200 Collector-emitter saturation voltage VCE(sat) VGE=15V, IC =100A 2.1 Gate-emitter threshold voltage VGE(th) IC =4mA , VGE=VCE 5.5 Zero gate voltage collector current ICES VCE=1200V , VGE=0V 12 µA Gate-emitter leakage current IGES VCE=0V , VGE=20V 600 nA Integrated gate resistor RGint 7 Ω 5 V ELECTRICAL CHARACTERISTICS (tested at component): Parameter Symbol Conditions Value min. typ. Input capacitance Ci s s V C E= 2 5 V , Output capacitance Co s s V GE= 0 V , 650 Reverse transfer capacitance Cr s s f =1MHz 275 max. 7850 Unit pF SWITCHING CHARACTERISTICS (tested at component), Inductive Load Parameter Symbol Conditions 1) Turn-on delay time t d(on) Tj= 1 2 5 ° C Rise time tr V C C =600V, Value min. typ. 234 40 I C =100A, Turn-off delay time td(off) V GE= - 1 5 / 1 5 V , Fall time tf R G e x t = 5. 6 Ω 1) values also influenced by parasitic L- and C- in measurement and package. Edited by INFINEON Technologies AI PS DD HV3, L7181Q, 02.06.2005, Edition 1.0 367 84 max. Unit ns SIGC156T120R2CQ CHIP DRAWING: Edited by INFINEON Technologies AI PS DD HV3, L7181Q, 02.06.2005, Edition 1.0 SIGC156T120R2CQ FURTHER ELECTRICAL CHARACTERISTICS: This chip data sheet refers to the device data sheet DESCRIPTION: AQL 0,65 for visual inspection according to failure catalog Electrostatic Discharge Sensitive Device according to MIL-STD 883 Test-Normen Villach/Prüffeld Published by Infineon Technologies AG, D-81726 München All Rights Reserved. Attention please! The information herein is given to describe certain components and shall not be considered as warranted characteristics. Terms of delivery and rights to technical change reserved. We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding circuits, descriptions and charts stated herein. Infineon Technologies is an approved CECC manufacturer. Information For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office in Germany or our Infineon Technologies Representatives world-wide (see address list). Warnings Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. Infineon Technologies components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and / or maintain and sustain and / or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. Edited by INFINEON Technologies AI PS DD HV3, L7181Q, 02.06.2005, Edition 1.0