KMA199E Programmable angle sensor Rev. 01 — 18 October 2007 Product data sheet 1. Product profile 1.1 General description The KMA199E is a magnetic angle sensor system. The MagnetoResistive (MR) sensor bridges and the mixed signal Integrated Circuit (IC) are integrated into a single package. This angular measurement system KMA199E is pre-programmed, pre-calibrated and therefore, ready to use. The KMA199E allows user specific adjustments of angular range, zero angle and clamping voltages. The settings are stored permanently in an Electrically Erasable Programmable Read-Only Memory (EEPROM). 1.2 Features n High precision sensor for magnetic n Ratiometric output voltage angular measurement n Programmable user adjustments, n Independent from the magnetic field including zero angle and angular range strength above 35 kA/m n Single package sensor system n Programming via One-Wire Interface (OWI) n Magnet-lost and power-lost detection n Fail-safe EEPROM n Built-in transient protection n High temperature range n User-programmable 32-bit identifier n Factory calibrated n Ready to use KMA199E NXP Semiconductors Programmable angle sensor 2. Pinning information Table 1. Pinning Pin Symbol Description 1 VDD supply voltage 2 GND ground 3 OUT/DIGINT analog output voltage or digital interface Simplified outline 1 2 3 3. Ordering information Table 2. Ordering information Type number Package Name Description Version KMA199E - plastic single-ended multi-chip package; 6 interconnections; 3 in-line leads SOT880 KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 2 of 31 xxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx x xxxxxxxxxxxxxx xxxxxxxxxx xxx xxxxxx xxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxx xxxxx xxxxxx xx xxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxx xxxxxxx xxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxx xxxxxxxxxxxxxx xxxxxx xx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxx xxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxx xxxxx x x VDDS VDDS REGULATOR VDDA REGULATOR VDDD REGULATOR LOGIC VSSE VDD POWER-ON RESET NXP Semiconductors Vref Iref 4. Functional diagram KMA199E_1 Product data sheet VDDE VSSE POWER LOST Cblock VSINP MUX AMPLIFIER Rev. 01 — 18 October 2007 VSINN 2 2 A VCOSP D D A OUTPUT BUFFER VO OUT/ DIGINT VCOSN VSSS TP0 TP1 TEST CONTROL Q_PUMP POWER LOST TP2 ARRAY DIGITAL FILTER OFFSET AND CORRECTION AVERAGING EEPROM CORDIC ALGORITHM OFFSET CALCULATION ANGULAR RANGE ADJUSTMENT ONE-WIRE INTERFACE CL OSC DIGITAL BLOCKS (LOGIC) VSSE magnetoresistive sensor bridges internal protection diodes 001aag809 KMA199E Programmable angle sensor 3 of 31 © NXP B.V. 2007. All rights reserved. Fig 1. Functional diagram of KMA199E signal conditioning integrated circuit GND KMA199E NXP Semiconductors Programmable angle sensor 5. Functional description The KMA199E amplifies two orthogonal differential signals, which are delivered by MR sensor bridges and converts them into the digital domain. The angle is calculated using the COordinate Rotation DIgital Computer (CORDIC) algorithm. After a digital-to-analog conversion the analog signal is provided to the output. Thus, the output is a linear representation of the angular value. Zero angle, clamping voltages and angular range are programmable. In addition, two 16-bit registers are available for customer purposes, like sample identification. The KMA199E comprises a Cyclic Redundancy Check (CRC) and an Error Detection and Correction (EDC) supervision, as well as a magnet-lost detection to ensure a fail-safe operation. A power-lost detection circuit pulls the analog output to the remaining supply line, if either the supply voltage or the ground line is interrupted. After multiplexing the two MR Wheatstone bridge signals and their successive amplification, the signal is converted into the digital domain by an Analog-to-Digital Converter (ADC). Further processing is done within an on-chip state machine. This includes offset cancellation, calculation of the mechanical angle using the CORDIC algorithm, as well as zero angle and angular range adjustment. The internal Digital-to-Analog Converter (DAC) and the analog output stage are used for conversion of the angle information into an analog output voltage, which is ratiometric to the supply voltage. The configuration parameters are stored in an user-programmable EEPROM. For this purpose the OWI, which is accessible via the pin OUT/DIGINT, is used. 5.1 Angular measurement directions The differential signals of the MR sensor bridges depend only on the direction of the external magnetic field strength Hext, which is applied parallel to the plane of the sensor. In order to obtain a correct output signal, the minimum saturation field strength has to be exceeded. KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 4 of 31 KMA199E NXP Semiconductors Programmable angle sensor α Hext 001aag741 Fig 2. Angular measurement directions Since the Anisotropic MR (AMR) effect is periodic over 180°, the sensor output is also 180°-periodic, whereas the angle is calculated relative to a freely programmable zero angle. The dashed line indicates the mechanical zero degree position. 6. Diagnostic features The KMA199E provides four diagnostic features: 6.1 EEPROM CRC and EDC supervision The KMA199E includes a supervision of the programmed data. At power-on, a CRC of the EEPROM is done. Furthermore the EEPROM is protected against bit errors. For this purpose every 16-bit data word is saved internally as a 22-bit word. The protection logic corrects any single-bit error in a data word, while the sensor continues in normal operation mode and can detect all double-bit errors by going into diagnostic mode. 6.2 Magnet-lost detection If the applied magnetic field strength is not sufficient, the KMA199E raises a diagnostic condition. In order to enter the diagnostic mode, due to EEPROM CRC or magnet-lost detection, the device can be programmed for an active diagnostic mode, where the output is driven below 4 %VDD or above 96 %VDD. KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 5 of 31 KMA199E NXP Semiconductors Programmable angle sensor 6.3 Power-lost detection The power-lost detection circuits enable the detection of an interrupted supply or ground line of the KMA199E. In case of a power-lost condition, two internal switches within the sensor are closed, connecting the pin of the analog output with the pins of the supply voltage and the ground. KMA199E VDD ZO(pl) OUT/DIGINT ZO(pl) GND 001aag810 Fig 3. Equivalent output circuit in case of a power-lost condition Table 3 shows the resulting output voltage depending on the error case and the load resistance. Table 3. Power-lost behavior Load resistance Supply voltage lost Ground lost RL > 5 kΩ VO ≤ 4 %VDD VO ≥ 96 %VDD 6.4 Low supply voltage detection If the supply voltage is below the switch-off threshold voltage, a status bit is set. Following table describes the behavior of the analog output at different supply voltages. Table 4. Supply voltage behavior Voltage range Description Analog output 0 V to ≈ 1.5 V the output drives an active LOW, but the switches of the power-lost detection circuits are not fully opened and set the output to a level between ground and half the supply voltage actively driven output to a voltage level between ground and half the supply voltage ≈ 1.5 V to VPOR all modules begin to work and the power-on reset is active diagnostics at LOW level VPOR to Vth(on) or Vth(off) all modules begin to work and the digital part is initialized EEPROM defined diagnostic level Vth(on) or Vth(off) to analog output is switched on after power-on 4.5 V time and represents the measured angle 4.5 V to 5.5 V normal operation where the sensor works with analog output of the the specified accuracy measured angle KMA199E_1 Product data sheet analog output of the measured angle without the specified accuracy © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 6 of 31 KMA199E NXP Semiconductors Programmable angle sensor 7. Analog output The KMA199E provides one analog output signal on pin OUT/DIGINT. The measured angle α is converted linearly into a value, which is ratiometric to the supply voltage VDD. For this purpose either a positive or a negative slope is provided. The following table describes the analog output behavior for a positive slope. If for example a magnetic field angle, larger than the programmed maximum angle αmax, but smaller than the clamp switch angle αsw(CL) is applied to the sensor, the analog output is set to the upper clamping voltage. But if the magnetic field angle is even larger than the clamp switch angle, the analog output switches from upper to lower clamping voltage. In case of a negative slope, the clamping voltages are changed. Table 5. Analog output behavior for a positive slope Magnetic field angle Analog output αmax < α < αsw(CL) V(CL)u αsw(CL) < α < αref + 180° V(CL)l The analog output voltage range codes both angular and diagnostic information. A valid value of the angle is between the upper and lower clamping voltage. If the analog output is in the diagnostic range, that is below 4 %VDD or above 96 %VDD, an error condition has been detected. The analog output repeats every 180°. VO (%VDD) αrng V(CL)u V(CL)I 0 αref α (deg) αmax 180 αsw(CL) αref + 180° 001aag811 αmax = αref + αrng Fig 4. Characteristic of the analog output KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 7 of 31 KMA199E NXP Semiconductors Programmable angle sensor 8. Limiting values Table 6. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter VDD supply voltage Conditions tinit < 200 h Min Max Unit −0.3 +5.7 V V [1] - 6.0 [2] −0.3 VDD + 0.3 V - 150 mA VO output voltage Ir reverse current Tamb ambient temperature −40 +160 °C Tamb(pr) programming ambient temperature 10 70 °C Tstg storage temperature −40 +125 °C Tamb = 50 °C 17 - year Tamb(pr) = 70 °C 100 - cycle Tamb < 70 °C EEPROM tret(D) data retention time Nendu(W_ER) write or erase endurance [1] Time until sensor environment is initialized. [2] The maximum value of the output voltage is 5.7 V. 9. Recommended operating conditions Table 7. Operating conditions In a homogenous magnetic field. Symbol Parameter Conditions [1] Min Typ Max Unit 4.5 5.0 5.5 V VDD supply voltage Tamb ambient temperature −40 - +160 °C Tamb(pr) programming ambient temperature 10 - 70 °C CL load capacitance [2] 0.33 - 22 nF blocking capacitance [3] 75 100 - nF RL load resistance [4] 5 - ∞ kΩ Hext external magnetic field strength 35 - - kA/m Cblock [1] Normal operation mode. [2] Between ground and analog output, as close as possible to the package. [3] Between ground and supply voltage, as close as possible to the package and with a low equivalent series resistance. [4] Power-lost detection is only possible with a load resistance within the specified range. 10. Thermal characteristics Table 8. Thermal characteristics Symbol Parameter Rth(j-a) thermal resistance from junction to ambient Conditions KMA199E_1 Product data sheet Typ Unit 120 K/W © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 8 of 31 KMA199E NXP Semiconductors Programmable angle sensor 11. Characteristics Table 9. Supply current Characteristics are valid for the operating conditions, as specified in Section 9. Symbol Parameter Conditions [1][2] supply current IDD [1] Normal operation mode. [2] Without load current at the analog output. Min Typ Max Unit - - 10 mA Table 10. Power-on reset Characteristics are valid for the operating conditions, as specified in Section 9. Symbol Parameter Conditions Min Typ Max Unit Vth(on) switch-on threshold voltage analog output switches on, if VDD > Vth(on) 4.20 4.30 4.49 V Vth(off) switch-off threshold voltage analog output switches off, if VDD < Vth(off) - 4.20 4.30 V Vhys hysteresis voltage Vhys = Vth(on) − Vth(off) 0.1 - 0.4 V VPOR power-on reset voltage IC is initialized 2.4 - 3.3 V Table 11. System performance Characteristics are valid for the operating conditions, as specified in Section 9. Symbol Parameter Conditions Min Typ Max Unit [1] αres angle resolution - - 0.04 deg αmax maximum angle programmable angular range for V(CL)u − V(CL)l ≥ 80 %VDD [2] 5 - 180 deg αref reference angle programmable zero angle [2] 0 - 180 deg at full supply operating range VO(nom) nominal output voltage 5 - 95 %VDD VO(udr) upper diagnostic range output voltage [3] 96 - 100 %VDD VO(ldr) lower diagnostic range output voltage [3] 0 - 4 %VDD V(CL)u upper clamping voltage [4] 40 - 95 %VDD V(CL)l lower clamping voltage [4] 5 - 30.5 %VDD ∆V(CL) clamping voltage variation deviation from programmed value −0.3 - +0.3 %VDD IO output current normal operation mode; operating as sink or source - - 2 mA Vn(o)(RMS) RMS output noise voltage equivalent power noise - 0.4 2.5 mV −1.55 - +1.55 deg - - 0.8 deg - - 0.55 deg ∆φlin linearity error ∆φtemp temperature drift error [5] [5][6] [1][5][6] [7][8] ∆φtempRT [6][7][8] temperature drift error at room temperature KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 9 of 31 KMA199E NXP Semiconductors Programmable angle sensor Table 11. System performance …continued Characteristics are valid for the operating conditions, as specified in Section 9. Symbol ∆φhys Parameter hysteresis error Conditions Min Typ Max Unit referred to input [5][6] - - 0.09 deg [5][6] −0.1 - +0.1 deg - - 210 Ω ∆φµlin microlinearity error referred to input ZO(pl) power-lost output impedance impedance to remaining supply line in case of lost supply voltage or lost ground [1] At a nominal output voltage between 5 %VDD and 95 %VDD and a maximum angle of αmax = 180°. [2] In steps of resolution < 0.022°. [3] Activation is dependent on the programmed diagnostic mode. [4] In steps of 0.02 %VDD. [5] At a low-pass filtered analog output with a cut-off frequency of 0.7 kHz. [6] See Section 12. [7] Temperature range −40 °C to +140 °C. [8] Based on a 3σ standard deviation. Table 12. Dynamics Characteristics are valid for the operating conditions, as specified in Section 9. Symbol Parameter Conditions Min Typ Max Unit ton turn-on time until first valid result - - 5 ms fupd update frequency 2 3.125 - kHz ts settling time - - 1.8 ms tcmd(ent) enter command mode time after power on 16 - 26 ms Min Typ Max Unit after an ideal mechanical angle step of 45°, until 90 % of the final value is reached; CL = 5 nF Table 13. Digital interface Characteristics are valid for the operating conditions, as specified in Section 9. Symbol Parameter Conditions VIH HIGH-level input voltage 80 - - %VDD VIL LOW-level input voltage - - 20 %VDD VOH HIGH-level output voltage IO = 2 mA 80 - - %VDD VOL LOW-level output voltage IO = 2 mA - - 20 %VDD Iod overdrive current absolute value for overdriving the output buffer - - 20 mA tstart start time LOW level before rising edge 5 - - µs tstop stop time HIGH level before falling edge 5 - - µs Tbit bit period minimum period may be limited by the load capacitance 10 - 100 µs tw0 pulse width 0 0.175Tbit 0.25Tbit 0.375Tbit s tw1 pulse width 1 0.625Tbit 0.75Tbit 0.825Tbit s tto time-out time - - 220 µs digital communication reset guaranteed after maximum tto KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 10 of 31 KMA199E NXP Semiconductors Programmable angle sensor Table 13. Digital interface …continued Characteristics are valid for the operating conditions, as specified in Section 9. Symbol Parameter Conditions Min Typ Max Unit ∆Tbit bit period deviation deviation between received clock and sent clock 0.8Tbit 1Tbit 1.2Tbit s ttko(slv) slave takeover time duration of LOW level for slave takeover 1 - 5 µs ttko(mas) master takeover time duration of LOW level for master takeover 0Tbit - 0.5Tbit s tprog programming time for a single EEPROM address 20 - - ms tcp charge pump time waiting time after enabling the EEPROM charge pump clock 1 - - ms 12. Definition of errors 12.1 General Angular measurement errors by the KMA199E result from linearity errors, temperature drift errors and hysteresis errors. Figure 5 shows the output signal of an ideal sensor, where the measured angle φmeas corresponds ideally to the magnetic field angle α. This curve will further be denoted as angle reference line φref(α) with a slope of 0.5 %VDD/deg. φmeas (deg) φref(α) 180 α (deg) 001aag812 Fig 5. Definition of the reference line For valid definition of errors, the angular range is set to αmax = 180° and the clamping voltages are programmed to V(CL)l = 5 %VDD and V(CL)u = 95 %VDD. 12.2 Hysteresis error The hysteresis error ∆φhys is defined as the maximum difference between angles, given by the device output when performing a positive (clockwise) rotation and negative (counter clockwise) rotation over an angular range of 180°, measured at a constant temperature. KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 11 of 31 KMA199E NXP Semiconductors Programmable angle sensor φmeas (deg) ∆φhys 180 α (deg) 001aag813 Fig 6. Definition of the hysteresis error 12.3 Linearity error The deviation of the KMA199E output signal from a best straight line φBSL, with the same slope as the reference line, is defined as linearity error. For measurement of this linearity error, the magnetic field angle is varied at fixed temperatures. The deviation of the output signal from the best straight line at the given temperature is the linearity error ∆φlin. It is a function of the magnetic field angle α and the temperature of the device Tamb. φmeas (deg) φBSL(α, Tamb) φref(α) ∆φlin(α, Tamb) 180 α (deg) 001aag814 Fig 7. Definition of the linearity error 12.4 Microlinearity error The microlinearity error ∆φµlin is the deviation of the device output from 1°, if the magnetic field angle α is changed by ∆α = 1°. φmeas (deg) φref(α) ∆φmeas = 1° + ∆φµlin(α) ∆α = 1° α (deg) 001aag815 Fig 8. Definition of the microlinearity error KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 12 of 31 KMA199E NXP Semiconductors Programmable angle sensor 12.5 Temperature drift error The temperature drift ∆φtemp is defined as the envelope over the deviation of the angle versus the temperature range. It is considered as the pure thermal effect. φmeas (deg) Ty Tx ∆φtemp 180 α (deg) 001aag816 Fig 9. Definition of the temperature drift error Following mathematical description is given for temperature drift value ∆φtemp: ∆φ temp(α) = φ meas(α , T x) – φ meas(α , T y) (1) with: Tx: temperature for maximum φmeas at angle α Ty: temperature for minimum φmeas at angle α The deviation from the value at room temperature ∆φtempRT describes the temperature drift of the angle, compared to the value, which the sensor provides at room temperature: ∆φ temp RT (α , T amb) = φ meas(α , T amb) – φ meas(α , T RT ) (2) with: TRT: room temperature (25 °C) 13. Programming 13.1 General description The KMA199E provides an OWI for programming. For this purpose the pin OUT/DIGINT can be used bidirectional. In general the device runs in analog output mode, the normal operation mode, which is configured by the on-chip programmed data and will be started by default after a power-on reset and the time ton. In this mode the magnetic field angle is converted into a corresponding output voltage. KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 13 of 31 KMA199E NXP Semiconductors Programmable angle sensor For programming the command mode has to be entered. In this mode the customer can adjust all required parameters (like zero angle and angular range for example) to his own application. The data can be stored in the EEPROM, after enabling the internal charge pump and waiting for tcp. After changing EEPROM constants, the checksum has to be recalculated and written (see Section 13.4). In order to enter the command mode, a specific command sequence has to be sent after a power-on reset and during the time slot tcmd(ent). For this purpose the external source, which is used to send the command sequence, has to overdrive the output buffer of the KMA199E, hence it has to provide the current Iod. During the communication, the KMA199E is always the slave and the external programming hardware is always the master. Figure 10 illustrates the structure of the OWI data format. write IDLE START COMMAND DATA BYTE 1 DATA BYTE 2 STOP IDLE read IDLE START COMMAND HANDOVER DATA BYTE 1 DATA BYTE 2 TAKEOVER STOP IDLE 001aag742 Fig 10. OWI data format The master has to provide the start condition, which is a rising edge after a LOW level. Then a command byte is sent, which can be either a read or a write command. Depending on the command, the master or the slave has to send the data immediately after the command sequence. In case of a read command, an additional handover or takeover bit respectively is inserted before and after the data bytes. Each communication has to be closed with a stop condition driven by the master. If the slave gets no rising edge for a time longer than tto, a time-out condition will be recognized. Then the bus is reset to the idle state and waits for a start condition and a new command. This can be used to synchronize the device regardless of the state before. All communications are based on this structure (see Figure 10), even for entering the command mode. In this case a special write command is required, followed by the command sequence (two data bytes). The customer can access the EEPROM, the CTRL1, the TESTCTRL0 and the SIGNATURE register, which are described in Section 13.5. Only a power-on reset will leave the command mode. A more detailed description of the programming is given in the next sections. 13.2 Timing characteristics As described in the previous section, a start and stop condition is necessary for communication. The duration of the LOW level before the rising edge of the start condition is defined as tstart and the duration of the HIGH level after the rising edge of the stop condition is defined as tstop. These parameters, as well as all other timing characteristics can be found in Table 13. KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 14 of 31 KMA199E NXP Semiconductors Programmable angle sensor tstart tstop 001aag817 Fig 11. OWI start and stop condition Figure 12 shows the coding of a single bit with a HIGH level of VIH and a LOW level of VIL. Here the pulse width t1 or t0 respectively represents a logic 1 or a logic 0 of a full bit period Tbit. bit = 0 bit = 1 Tbit 0.175 Tbit 0.375 0.625 tw0 0.825 tw1 0.25 0.75 001aag818 Fig 12. OWI timing 13.3 Sending and receiving data For sending or receiving data, the master has to control the communication. The command byte defines the region, address and type of command, which is requested by the master, that is either a read or a write command. In case of a read command, an additional handover or takeover bit respectively has to be inserted before and after the two data bytes (see Figure 10). However the OWI is a serial data transmission, whereas the Most Significant Byte (MSB) must be sent at first. Table 14. Format of a command byte 7 6 5 4 3 2 1 0 CMD7 CMD6 CMD5 CMD4 CMD3 CMD2 CMD1 CMD0 Table 15. Command byte bit description Bit Symbol Description 7 to 5 CMD[7:5] region bits 000 = 16-bit EEPROM 001 to 011 = reserved 100 = 16-bit register 101 to 111 = reserved 4 to 1 CMD[4:1] address bits 0 CMD0 read/write 0 = write 1 = read KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 15 of 31 KMA199E NXP Semiconductors Programmable angle sensor A more detailed description of all registers, that can be accessed by the customer, is given in Section 13.5. Both default value and the complete command, which already includes the address and write or read request respectively, is listed there. 13.3.1 Write access In order to write data into the EEPROM, the internal charge pump must be enabled at first by setting the bits EEP_CP_CLOCK_EN and EEP_WRITE_EN and waiting for tcp. Afterwards the following procedure must be done: • • • • Start condition: The master drives a rising edge after a LOW level Command: The master sends a write command, that is the last bit is not set Data: The master sends two data bytes Stop condition: The master drives a rising edge after a LOW level Figure 13 shows the write access of the digital interface. The signal OWI represents the data on the bus, which is either caused by the master or by the slave. The signals master output enable and slave output enable just symbolize if the master or the slave output is enabled or disabled respectively. START CMD7 CMD0 WDATA15 WDATA0 STOP IDLE master output enable OWI (2) slave output enable (1) 001aag743 (1) Missing rising edges generate a time-out condition and the written data is ignored. (2) If the master might not drive the bus, the bus is defined by the bus-pull. Fig 13. OWI write access Note: As already mentioned in Section 13.1, even the command mode has to be entered using the write procedure. Without entering the command mode a digital communication is not possible and the sensor would work in normal operation mode. After changing a single address the time tprog must elapse before changing another address. Finally the checksum has to be recalculated and written, after changing the EEPROM constants (see Section 13.4). KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 16 of 31 KMA199E NXP Semiconductors Programmable angle sensor 13.3.2 Read access In order to read data from the sensor, the following procedure must be done: • Start condition: The master drives a rising edge after a LOW level • Command: The master sends a read command, that is the last bit is set • Handover: The master sends a handover bit, that is a logic 0 and disables his output after a three-quarter bit period • Takeover: The slave drives a LOW level after the falling edge for ttko(slv) • Data: The slave sends two data bytes • Handover: The slave sends a handover bit, that is a logic 0 and disables his output after a three-quarter bit period • Takeover: The master drives a LOW level after the falling edge for ttko(mas) • Stop condition: The master drives a rising edge after a LOW level Figure 14 shows the read access of the digital interface. The signal OWI represents the data on the bus, which is either caused by the master or by the slave. The signals master output enable and slave output enable just symbolize if the master or the slave output is enabled or disabled respectively. START CMD7 CMD0 HANDSHAKE RDATA15 RDATA0 HANDSHAKE STOP IDLE master output enable (3) OWI (5) (1) slave output enable (2) (2) (4) 001aag744 (1) Duration of LOW level for slave takeover ttko(slv). (2) There is an overlap in the output enables of master and slave, because both drive a LOW level. However this ensures the independency from having a pull-up or pull-down on the bus. In addition it improves the ElectroMagnetic Compatibility (EMC) robustness, because all levels are actively driven. (3) Duration of LOW level for master takeover ttko(mas). (4) If the master does not take the bus and a pull-up exists, the stop condition is generated by the pull-up. Otherwise a time-out is generated if there is a pull-down and the slave waits for a rising edge as start condition. (5) If the master might not drive the bus, the bus is defined by the bus-pull. Fig 14. OWI read access KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 17 of 31 KMA199E NXP Semiconductors Programmable angle sensor 13.3.3 Entering the command mode After a power-on reset, the sensor provides a time slot tcmd(ent) for entering the command mode. For this purpose a specific command sequence has to be sent (see Figure 15). Without entering the command mode, the sensor starts in normal operation mode. However the signature can always be written by the master, if the sensor switches into diagnostic mode. During the command mode sequence, the analog output is enabled, hence the external programming hardware has to overdrive the output with the current Iod. If the command mode is activated, the analog output will be disabled and the pin OUT/DIGINT works as a digital interface. tcmd(ent) VDD OWI START 94h command 9Bh A4h STOP signature 001aag819 Fig 15. OWI command mode procedure 13.4 Cyclic redundancy check As already mentioned in Section 6, there is an 8-bit checksum of the EEPROM data. In order to calculate this value, a CRC has to be generated with the MSB of the EEPROM data word at first over all corresponding addresses in increasing order. For calculating the checksum, all addresses from 0h to Fh have to be read out and consulted. The Least Significant Byte (LSB) of address Fh, which contains the previous checksum, must be overwritten with 0h before the calculation can be started. Finally the internal charge pump has to be enabled for programming by setting the bits EEP_CP_CLOCK_EN and EEP_WRITE_EN (see Table 16) and waiting for tcp. The generator polynomial for the calculation of the checksum is: 8 2 G(x) = x + x + x + 1 (3) With a start value of FFh and the data bits are XOR at x8 point. KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 18 of 31 KMA199E NXP Semiconductors Programmable angle sensor 13.4.1 Software example in C 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 #include <stdio.h.> // calc_crc accepts unsigned 16-bit data in data int calc_crc(int crc, unsigned int data) { const int gpoly = 0x107; // generator polynomial int i; //index variable for (i = 15; i >= 0; i--) { crc <<= 1; //shift left crc |= (int) ((data & (1u<<i))>>i); // XOR of with generator polynomial when MSB(9) = HIGH if (crc & 0x100) crc ^= gpoly; } return crc; } int main(void) { int crc, crc_res, i; // 8 LSB are CRC field filled with 0 unsigned int data_seq[] = {0x1111, 0x2222, 0x3333, 0x4444, 0x5555, 0x6666, 0x7777, 0x8888, 0x9999, 0xAAAA, 0xBBBB, 0xCCCC, 0xDDDD, 0xEEEE, 0xFFFF, 0x4200}; // calculate checksum over all data crc = 0xFF; // start value of crc register printf(“Address\tValue\n”); for (i = 0; i <= 15; i++) { printf(“0x%1X\t0x%04X\n”, i, data_seq[i]); crc = calc_crc(crc, data_seq[i]); } crc_res = crc; // crc_res = 0x6F printf(“\nChecksum\n0x%02X\n”, crc_res); // check procedure for above data sequence crc = 0xFF; for (i = 0; i <= 14; i++) crc = calc_crc(crc, data_seq[i]); // last word gets crc inserted crc = calc_crc(crc, data_seq[i] | crc_res); printf(“\nCheck procedure for data sequence: must be 0x00 is 0x%02X.\n”,crc); return 1; } The checksum of this data sequence is 6Fh. KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 19 of 31 KMA199E NXP Semiconductors Programmable angle sensor 13.5 Registers 13.5.1 Command registers In order to enter the command mode, the signature given in Table 16 has to be written via the OWI into the specific register. This must be done as described in Section 13.3.3, with a write command, followed by the signature, but after a power-on reset and not later than tcmd(ent). Table 16. Command registers Command Register write/read Bit Access Field Description 82h/83h 15 R IN_DIAG_MODE shows if there is a diagnostic condition present; this bit is not affected by the setting of the register field FORCE_DIAG_OFF 14 R/W FORCE_DIAG_OFF force diagnostic mode off; default: 0b 13 - - reserved 12 R LOW_VOLTAGE_DET low voltage condition detected 11 R/W EEP_CP_CLOCK_EN charge pump clock on (must be set after setting EEPROM write enable signal for writing to EEPROM); default: 0b CTRL1 10 and 9 - - reserved 8 R EEP_ERR_CORRECT EDC: EEPROM error has been corrected; updated every EEPROM readout and stays set once set 7 R EEP_UNCORR_ERR 6 R MAGNET_LOST_DET magnet-lost detected; bit stays set even if the condition disappears; for this detection which leads to diagnostic mode, the magnet-lost detection must be enabled 5 - - EDC: EEPROM uncorrectable error has been detected; updated every EEPROM readout and stays set once set reserved 4 R CRC_BAD CRC check has failed (checked during start-up) 3 to 0 - - reserved 94h/- SIGNATURE 15 to 0 W SIGNATURE write signature 9BA4h within tcmd(ent) to enter command mode; for more details see Section 13.3.3 96h/97h TESTCTRL0 15 to 12 - - reserved W EEP_WRITE_EN EEPROM write enable signal (must be set before writing to EEPROM) 11 0605h — disabled (default) 0E05h — enabled 10 to 0 - - reserved KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 20 of 31 KMA199E NXP Semiconductors Programmable angle sensor 13.5.2 EEPROM registers The device includes several internal registers, which are used for purposes, such as customization and identification. The initial signature allows read access to all areas, but write access just to customer registers only. Write accesses to reserved areas are ignored. Since these registers are implemented as EEPROM cells, writing to the registers needs a specific time tprog after each write access. Since there is no check for the programming time, the user has to take care that no other access to the EEPROM is done during the programming. The EEPROM must not be addressed during the time tprog. Note: Before data can be stored in the EEPROM, the internal charge pump has to be switched on for the duration of programming by setting register CTRL1, bit 11 EEP_CP_CLOCK_EN, as well as register TESTCTRL0, bit 11 EEP_WRITE_EN. For calculating the checksum, all register addresses have to be read out and consulted, although some of them are reserved for calibration purposes. Table 17. EEPROM registers Address Command Register write/read Bit Description Default MSB/LSB 0h 00h/01h - addresses are reserved for calibration purposes [1] 1h 02h/03h 2h 04h/05h 3h 06h/07h 4h 08h/09h 5h 0Ah/0Bh 6h 0Ch/0Dh 7h 0Eh/0Fh ZERO_ANGLE 15 to 0 mechanical zero degree position 00h/00h 8h 10h/11h MAGNET_LOST 15 to 0 magnet-lost detection 00h/00h reserved Note: These addresses have to be read out for calculating the checksum. The content stored in these registers may not be changed! 0000h — disabled 004Fh — enabled 9h Ah Bh 12h/13h 14h/15h 16h/17h ANG_RNG_MULT_LSB 15 to 3 CLAMP_LO CLAMP_HI least significant bits of angular range multiplicator 20h/00h 2 to 0 undefined[2] 15 to 13 undefined[2] 12 to 0 lower clamping level output voltage 15 to 13 undefined[2] 12 to 0 upper clamping level output voltage 01h/00h 12h/FFh Ch 18h/19h ID_LO 15 to 0 lower 16 bits of identification code 00h/00h Dh 1Ah/1Bh ID_HI 15 to 0 upper 16 bits of identification code 00h/00h Eh 1Ch/1Dh CLAMP_SW_ANGLE 15 to 6 when angle is bigger than CLAMP_SW_ANGLE FFh/C1h the output will switch to CLAMP_LO for a positive slope ANG_RNG_MULT_MSB 5 to 0 most significant bits of angular range multiplicator KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 21 of 31 KMA199E NXP Semiconductors Programmable angle sensor Table 17. EEPROM registers …continued Address Command Register write/read Bit Fh 15 and 14 undefined[2] 1Eh/1Fh EEP_CTRL_CUST Description Default MSB/LSB 0Ch/[1] 13 and 12 DIAGNOSTIC_LEVEL; diagnostic level behavior of analog output 00 — active LOW (in lower diagnostic range) with driver strength of the analog output 01 — active HIGH (in upper diagnostic range) with driver strength of the analog output 10 — reserved 11 — reserved 11 and 10 reserved; may not be changed 9 undefined[2] 8 SLOPE_DIR; slope of analog output 0 — rising (not inverted) 1 — falling (inverted) 7 to 0 [1] Variable and individual for each device. [2] Undefined; must be written as zero for default. CRC; checksum over all data (see Section 13.4) Table 18. ZERO_ANGLE - mechanical zero degree position (address 7h) bit allocation Data format: unsigned fixed point; resolution: 2−16. Bit 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 Value 2−1 2−2 2−3 2−4 2−5 2−6 2−7 2−8 2−9 2−10 2−11 2−12 2−13 2−14 2−15 2−16 Mechanical angular range 0000h = 0° to FFFFh = 180° − 1 LSB Examples: • Mechanical zero angle 0° = 0000h • Mechanical zero angle 10° = 0E38h • Mechanical zero angle 45° = 4000h Table 19. ANG_RNG_MULT_LSB - least significant bits of angular range multiplicator (address 9h) bit allocation Data format: unsigned fixed point; resolution: 2−14. Bit 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 Value 2−2 2−3 2−4 2−5 2−6 2−7 2−8 2−9 2−10 2−11 2−12 2−13 2−14 U[1] U[1] U[1] [1] Undefined; must be written as zero for default and may return any value when read. CLAMP_HI – CLAMP_LO 180° ANG_RNG_MULT = ------------------------------------------------------------------- × ---------------------------------------------------8192 ANGULAR_RANGE (4) Table 20. CLAMP_LO - lower clamping level output voltage (address Ah) bit allocation Data format: integer (DAC values 256 to 4864); resolution: 20. Bit 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 Value U[1] U[1] U[1] 212 211 210 29 28 27 26 25 24 23 22 21 20 KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 22 of 31 KMA199E NXP Semiconductors Programmable angle sensor [1] Undefined; must be written as zero for default and may return any value when read. Values 0 to 255 are reserved. It is not permitted to use such values. Examples: • 100 %VDD = 5120 (reserved) • 10 %VDD = 512 • 5 %VDD = 256 Table 21. CLAMP_HI - upper clamping level output voltage (address Bh) bit allocation Data format: integer (DAC values 256 to 4864); resolution: 20. Bit 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 Value U[1] U[1] U[1] 212 211 210 29 28 27 26 25 24 23 22 21 20 [1] Undefined; must be written as zero for default and may return any value when read. Values 4865 to 5120 are reserved. It is not permitted to use such values. Examples: • 100 %VDD = 5120 (reserved) • 95 %VDD = 4864 • 90 %VDD = 4608 Table 22. ANG_RNG_MULT_MSB - most significant bits of angular range multiplicator (address Eh) bit allocation Data format: unsigned fixed point. Bit 15 14 13 Value 12 11 10 9 8 7 6 CLAMP_SW_ANGLE 5 4 3 2 1 0 24 23 22 21 20 2−1 CLAMP_HI – CLAMP_LO 180° ANG_RNG_MULT = ------------------------------------------------------------------- × ---------------------------------------------------8192 ANGULAR_RANGE (5) Examples: • 4864 – 256 180° ANG_RNG_MULT = --------------------------- × ----------- = 0.5625 8192 180° • 4864 – 256 90° ANG_RNG_MULT = --------------------------- × ----------- = 1.125 8192 180° Table 23. CLAMP_SW_ANGLE - clamp switch angle (address Eh) bit allocation Data format: unsigned fixed point. Bit 15 14 13 12 11 10 9 8 7 6 Value 2−1 2−2 2−3 2−4 2−5 2−6 2−7 2−8 2−9 2−10 5 4 3 2 1 0 ANG_RNG_MULT_MSB Mechanical angular range 0000h = 0° to 3FFh = 180° − 1 LSB. CLAMP_HI – CLAMP_LO 1 1 CLAMP_SW_ANGLE = --- × 1 + -------------------------------------------------------------------- × ----------------------------------------------- 8192 ANG_RNG_MULT 2 (6) If the magnetic field angle is larger than the CLAMP_SW_ANGLE, the output will switch to CLAMP_LO for a positive slope. The value of CLAMP_SW_ANGLE can be calculated from other EEPROM constants, but must be programmed. KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 23 of 31 KMA199E NXP Semiconductors Programmable angle sensor 14. Electromagnetic compatibility EMC is achieved by the KMA199E. 14.1 Emission (CISPR 25) Tests according to CISPR 25 were fulfilled. 14.1.1 Conducted radio disturbance Test of the device according to CISPR 25, chapter 11 (artificial network). Class: 5. 14.1.2 Radiated radio disturbance Test of the device according to CISPR 25, chapter 13 (anechoic chamber component/module). Class: 5 (without addition of 6 dB in FM band). 14.2 Radiated disturbances (ISO 11452-2, ISO 11452-4 and ISO 11452-5) The common understanding of the requested function is that an effect is tolerated as described in Table 24 during the disturbance. If the KMA199E operates in operation mode, the Radio Frequency (RF) noise will occur on the signal and supply line. Table 24. Failure condition for radiated disturbances Parameter Comment Min Max Unit Variation of output signal in analog output mode value measured relative to the output at test start - ±0.9 %VDD 14.2.1 Absorber lined shielded enclosure Tests according to ISO 11452-2 were fulfilled. Test levels: > 200 V/m 200 MHz to 400 MHz (step 10 MHz) > 200 V/m 400 MHz to 1000 MHz (step 25 MHz) > 200 V/m 1 GHz to 10 GHz (step 100 MHz) Modulation: Continuous Wave (CW); AM: 1 kHz, 80 %. State: A. 14.2.2 Bulk-current injection Tests according to ISO 11452-4 were fulfilled. Test level: 200 mA with CL = 1 nF. State: A. 14.2.3 Strip line Tests according to ISO 11452-5 were fulfilled. KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 24 of 31 KMA199E NXP Semiconductors Programmable angle sensor Test level: 200 V/m with CL = 1 nF. State: A. In deviation of ISO 11452-5 the measurement must be taken up to 1 GHz. 14.2.4 Immunity against mobile phones Tests according to ISO 11452-2 were fulfilled. State: A. Definition of Global System for Mobile Communications (GSM) signal: • Pulse modulation: per GSM specification (217 Hz; 12.5 % duty cycle) • Modulation grade: ≥ 60 dB • Sweep: linear 800 MHz to 3 GHz (duration 10 s at 890 MHz, 940 MHz and 1.8 GHz band) • Antenna polarization: vertical, horizontal • Field strength: 200 V/m during on-time (calibration in CW) In deviation of ISO 11452-2 a GSM signal (definition see above) instead of an AM signal was used. 14.3 Transients - pulses (ISO 7637-1 and ISO 7637-3) The KMA199E is designed for a stabilized 5 V supply. To raise immunity against non-galvanic coupled transient pulses, protection diodes are implemented into the KMA199E. For applications with disturbances by capacitive or inductive coupling on supply line or radiated disturbances an application circuit is recommended. Applications with this arrangement passed the EMC tests according to the product standard 1 (electrical transient transmission by capacitive or inductive coupling) and standard 3 (radiated disturbances). The common understanding of the requested function is that an effect is tolerated as described in Table 25 during the disturbance. Class C means that the device goes into reset or diagnostic mode and comes back after disturbances. If the KMA199E operates in normal operation mode, the test pulses are visible on the signal line. A protection circuit is used. The KMA199E is directly supplied with 5 V. Table 25. Failure condition for transients Parameter Comment Min Max Unit Variation of output signal after exposure to pulses in analog output mode value measured relative to the output at test start - ±0.9 %VDD 14.3.1 Coupled Tests according to ISO 7637-3 were fulfilled. Level of pulses: IV (−60 V for pulse 3a and +40 V for pulse 3b). Class: B for pulse 3a, B for pulse 3b. KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 25 of 31 KMA199E NXP Semiconductors Programmable angle sensor Test time: 10 min. Transient transmission by capacitive and inductive coupling via lines other than supply lines (interface, analog output) have to be tolerated according to ISO 7637-3 (pulses 3a and 3b). 15. ElectroStatic Discharge (ESD) To raise immunity against ESD pulses, protection diodes are implemented into the KMA199E. 15.1 Human body model The KMA199E must not be damaged at 8 kV, according to the human body model at 100 pF and 1.5 kΩ. The test is according to AEC-Q100, Rev-E, method 002. This protection must be ensured at all external pins (OUT/DIGINT, VDD and GND). Furthermore all interconnects (pins between package head and package body) must not be damaged at 2 kV, according to AEC-Q100, Rev-E, method 002. 15.2 Machine model The KMA199E must not be damaged at 400 V, according to the machine model. The test is according to AEC-Q100, Rev-E, method 003. This protection must be ensured at all external pins (OUT/DIGINT, VDD and GND). Furthermore all interconnects (pins between package head and package body) must not be damaged at 200 V, according to AEC-Q100, Rev-E, method 003. All pins have a latch-up protection. 16. Application information VDD pull-up to VDD or pull-down to GND VDD 1 KMA199E 3 Cblock 2 OUT/DIGINT FILTER fg = 0.7 kHz 1st order OUT/DIGINT CL GND GND KMA199E and external capacitances electronic control unit 001aag820 (1) The block capacitance Cblock is used to suppress noise on the supply line of the device. For best functionality, the capacitances should be mounted close to the pins of the device. Fig 16. Application diagram of KMA199E KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 26 of 31 KMA199E NXP Semiconductors Programmable angle sensor 17. Marking N NNNN 2.1 min batch number A X Y Y Y Z B C 001aag745 Marking paint: laser Code: see drawing Type face: DIN 1451 condensed type Letter height: 0.8 mm Line spacing: 0.25 mm Crossing of lines not allowed A: leading letters of type number (5 characters max.) B: number and attached letters of type number (6 characters max.) C: day code/date code All lines A to C to be marked in centered position Date code: x yyy z x: product manufacturing code; m for manufacturing Manila Day code: x yyy z x: --y: day of year z: year of production (last figure) Fig 17. Marking 18. Terminals Lead frame material: CuZr with 99.9 % Cu and 0.1 % Zr Lead finish: matt tin; thickness 8 µm to 13 µm KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 27 of 31 KMA199E NXP Semiconductors Programmable angle sensor 19. Package outline Plastic single-ended multi-chip package; 6 interconnections; 3 in-line leads SOT880 view A-B HE1 A B E Q1 L1 b1 D L (1) (1) HE D1 A A B (1) Q1 A L2 1 2 e 3 b c w A v B HE2 0 2.5 5 mm scale DIMENSIONS (mm are the original dimensions) UNIT A mm 1.65 1.45 b b1 0.41 1.57 0.34 1.47 c D D1 0.30 0.24 4.1 3.9 8.1 7.9 E e 5.45 2.54 5.25 HE HE1 HE2 max 21.4 6.42 5.85 21.0 6.32 L L1 L2 min Q1 v w 7.1 6.9 0.85 0.75 4.75 0.65 0.55 0.4 1.2 Note 1. Terminals within this zone are uncontrolled to allow for flow of plastic between and besides the leads. OUTLINE VERSION REFERENCES IEC JEDEC JEITA EUROPEAN PROJECTION ISSUE DATE 07-09-03 07-09-11 SOT880 Fig 18. Package outline SOT880 KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 28 of 31 KMA199E NXP Semiconductors Programmable angle sensor 20. Handling information (2) 0.7 (1) 0.7 (1) R 0.25 min (2) 0.7 (1) R 0.25 min 006aaa246 Dimensions in mm (1) No bending allowed. (2) Plastic body and interface plastic body - leads: application of bending forces not allowed. Fig 19. Bending recommendation 21. Solderability information The solderability qualification is done according to AEC-Q100, Rev-E. Recommended soldering process for leaded devices is wave soldering. The maximum soldering temperature is 260 °C for maximum 5 s. Device terminals shall be compatible with laser and electrical welding. 22. Revision history Table 26. Revision history Document ID Release date Data sheet status Change notice Supersedes KMA199E_1 20071018 Product data sheet - - KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 29 of 31 KMA199E NXP Semiconductors Programmable angle sensor 23. Legal information 23.1 Data sheet status Document status[1][2] Product status[3] Definition Objective [short] data sheet Development This document contains data from the objective specification for product development. Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Product [short] data sheet Production This document contains the product specification. [1] Please consult the most recently issued document before initiating or completing a design. [2] The term ‘short data sheet’ is explained in section “Definitions”. [3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. 23.2 Definitions Draft — The document is a draft version only. The content is still under internal review and subject to formal approval, which may result in modifications or additions. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number(s) and title. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. 23.3 Disclaimers General — Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. This document supersedes and replaces all information supplied prior to the publication hereof. Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of a NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage. NXP Semiconductors accepts no liability for inclusion and/or use of NXP Semiconductors products in such equipment or applications and therefore such inclusion and/or use is at the customer’s own risk. Applications — Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Limiting values — Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http://www.nxp.com/profile/terms, including those pertaining to warranty, intellectual property rights infringement and limitation of liability, unless explicitly otherwise agreed to in writing by NXP Semiconductors. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights. 23.4 Trademarks Notice: All referenced brands, product names, service names and trademarks are the property of their respective owners. 24. Contact information For additional information, please visit: http://www.nxp.com For sales office addresses, send an email to: [email protected] KMA199E_1 Product data sheet © NXP B.V. 2007. All rights reserved. Rev. 01 — 18 October 2007 30 of 31 KMA199E NXP Semiconductors Programmable angle sensor 25. Contents 1 1.1 1.2 2 3 4 5 5.1 6 6.1 6.2 6.3 6.4 7 8 9 10 11 12 12.1 12.2 12.3 12.4 12.5 13 13.1 13.2 13.3 13.3.1 13.3.2 13.3.3 13.4 13.4.1 13.5 13.5.1 13.5.2 14 14.1 14.1.1 14.1.2 14.2 Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1 General description. . . . . . . . . . . . . . . . . . . . . . 1 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 Pinning information . . . . . . . . . . . . . . . . . . . . . . 2 Ordering information . . . . . . . . . . . . . . . . . . . . . 2 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 3 Functional description . . . . . . . . . . . . . . . . . . . 4 Angular measurement directions . . . . . . . . . . . 4 Diagnostic features . . . . . . . . . . . . . . . . . . . . . . 5 EEPROM CRC and EDC supervision. . . . . . . . 5 Magnet-lost detection . . . . . . . . . . . . . . . . . . . . 5 Power-lost detection . . . . . . . . . . . . . . . . . . . . . 6 Low supply voltage detection . . . . . . . . . . . . . . 6 Analog output. . . . . . . . . . . . . . . . . . . . . . . . . . . 7 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 8 Recommended operating conditions. . . . . . . . 8 Thermal characteristics. . . . . . . . . . . . . . . . . . . 8 Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Definition of errors. . . . . . . . . . . . . . . . . . . . . . 11 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Hysteresis error . . . . . . . . . . . . . . . . . . . . . . . 11 Linearity error . . . . . . . . . . . . . . . . . . . . . . . . . 12 Microlinearity error . . . . . . . . . . . . . . . . . . . . . 12 Temperature drift error . . . . . . . . . . . . . . . . . . 13 Programming . . . . . . . . . . . . . . . . . . . . . . . . . . 13 General description. . . . . . . . . . . . . . . . . . . . . 13 Timing characteristics . . . . . . . . . . . . . . . . . . . 14 Sending and receiving data . . . . . . . . . . . . . . 15 Write access . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Read access . . . . . . . . . . . . . . . . . . . . . . . . . . 17 Entering the command mode . . . . . . . . . . . . . 18 Cyclic redundancy check . . . . . . . . . . . . . . . . 18 Software example in C . . . . . . . . . . . . . . . . . . 19 Registers. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Command registers . . . . . . . . . . . . . . . . . . . . 20 EEPROM registers . . . . . . . . . . . . . . . . . . . . . 21 Electromagnetic compatibility . . . . . . . . . . . . 24 Emission (CISPR 25) . . . . . . . . . . . . . . . . . . . 24 Conducted radio disturbance . . . . . . . . . . . . . 24 Radiated radio disturbance. . . . . . . . . . . . . . . 24 Radiated disturbances (ISO 11452-2, ISO 11452-4 and ISO 11452-5) . . . . . . . . . . . 24 14.2.1 Absorber lined shielded enclosure . . . . . . . . . 24 14.2.2 Bulk-current injection . . . . . . . . . . . . . . . . . . . 24 14.2.3 Strip line . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 14.2.4 14.3 Immunity against mobile phones . . . . . . . . . . Transients - pulses (ISO 7637-1 and ISO 7637-3) . . . . . . . . . . . . . . . . . . . . . . . . . . 14.3.1 Coupled . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 ElectroStatic Discharge (ESD) . . . . . . . . . . . . 15.1 Human body model . . . . . . . . . . . . . . . . . . . . 15.2 Machine model. . . . . . . . . . . . . . . . . . . . . . . . 16 Application information . . . . . . . . . . . . . . . . . 17 Marking. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Terminals . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 20 Handling information . . . . . . . . . . . . . . . . . . . 21 Solderability information . . . . . . . . . . . . . . . . 22 Revision history . . . . . . . . . . . . . . . . . . . . . . . 23 Legal information . . . . . . . . . . . . . . . . . . . . . . 23.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 23.2 Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . 23.3 Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . 23.4 Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . 24 Contact information . . . . . . . . . . . . . . . . . . . . 25 Contents. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 25 25 26 26 26 26 27 27 28 29 29 29 30 30 30 30 30 30 31 Please be aware that important notices concerning this document and the product(s) described herein, have been included in section ‘Legal information’. © NXP B.V. 2007. All rights reserved. For more information, please visit: http://www.nxp.com For sales office addresses, please send an email to: [email protected] Date of release: 18 October 2007 Document identifier: KMA199E_1