PRELIMINARY CY7C185D 64K (8K x 8) Static RAM Functional Description[1] Features • Pin- and function-compatible with CY7C185 The CY7C185D is a high-performance CMOS static RAM organized as 8192 words by 8 bits. Easy memory expansion is provided by an active LOW chip enable (CE1), an active HIGH chip enable (CE2), and active LOW output enable (OE) and three-state drivers. This device has an automatic power-down feature (CE1 or CE2), reducing the power consumption when deselected. • High speed — tAA = 10 ns • Low active power — ICC = 60 mA @ 10 ns • Low CMOS standby power — ISB2 = 3 mA • CMOS for optimum speed/power • Data Retention at 2.0V • Easy memory expansion with CE1, CE2, and OE features • TTL-compatible inputs and outputs • Automatic power-down when deselected • Available in Lead (Pb)-Free Packages An active LOW write enable signal (WE) controls the writing/reading operation of the memory. When CE1 and WE inputs are both LOW and CE2 is HIGH, data on the eight data input/output pins (I/O0 through I/O7) is written into the memory location addressed by the address present on the address pins (A0 through A12). Reading the device is accomplished by selecting the device and enabling the outputs, CE1 and OE active LOW, CE2 active HIGH, while WE remains inactive or HIGH. Under these conditions, the contents of the location addressed by the information on address pins are present on the eight data input/output pins. The input/output pins remain in a high-impedance state unless the chip is selected, outputs are enabled, and write enable (WE) is HIGH.The CY7C185D is in a standard 28-pin 300-mil-wide DIP, SOJ, or SOIC Pb-Free package. Logic Block Diagram Pin Configurations DIP/SOJ/SOIC Top View I/O0 INPUT BUFFER SENSE AMPS A1 A2 A3 A4 A5 A6 A7 A8 ROW DECODER I/O1 256 x 32 x 8 ARRAY I/O2 I/O3 I/O4 NC A4 A5 A6 A7 A8 A9 A10 A11 A12 I/O0 I/O1 I/O2 GND 1 2 3 4 5 6 7 8 9 10 11 12 13 14 28 27 26 25 24 23 22 21 20 19 18 17 16 15 VCC WE CE2 A3 A2 A1 OE A0 CE1 I/O7 I/O6 I/O5 I/O4 I/O3 I/O5 I/O6 CE1 CE2 WE COLUMN DECODER POWER DOWN I/O7 A12 A11 A10 A0 A9 OE Note: 1. For guidelines on SRAM system design, please refer to the ‘System Design Guidelines’ Cypress application note, available on the internet at www.cypress.com. Cypress Semiconductor Corporation Document #: 38-05466 Rev. *C • 3901 North First Street • San Jose, CA 95134 • 408-943-2600 Revised January 10, 2005 CY7C185D PRELIMINARY Selection Guide CY7C185D-10 CY7C185D-12 CY7C185D-15 Unit Maximum Access Time 10 12 15 ns Maximum Operating Current 60 50 40 mA Maximum Standby Current 3 3 3 mA Document #: 38-05466 Rev. *C Page 2 of 10 CY7C185D PRELIMINARY DC Input Voltage[2].................................... −0.5V to VCC + 0.5V Maximum Ratings (Above which the useful life may be impaired. For user guidelines, not tested.) Storage Temperature ................................. –65°C to +150°C Ambient Temperature with Power Applied............................................. –55°C to +125°C Output Current into Outputs (LOW)............................. 20 mA Static Discharge Voltage.......................................... > 2001V (per MIL-STD-883, Method 3015) Latch-up Current.................................................... > 200 mA Operating Range Supply Voltage to Ground Potential ............... –0.5V to +7.0V DC Voltage Applied to Outputs in High-Z State[2] ....................................... −0.5V to VCC + 0.5V Range Ambient Temperature VCC 0°C to +70°C 5V ± 10% –40°C to +85°C 5V ± 10% Commercial Industrial Electrical Characteristics Over the Operating Range 7C185D-10 Parameter Description Test Conditions VOH Output HIGH Voltage VCC = Min., IOH = –4.0 mA VOL Output LOW Voltage VCC = Min., IOL = 8.0 mA VIH Input HIGH Voltage Voltage[2] Min. 7C185D-12 Max. Min. 2.4 Max. 2.4 0.4 Unit V 0.4 V 2.0 VCC + 0.3V 2.0 VCC + 0.3V V –0.5 0.8 –0.5 0.8 V VIL Input LOW IIX Input Load Current GND ≤ VI ≤ VCC –1 +1 –1 +1 µA IOZ Output Leakage Current GND ≤ VI ≤ VCC, Output Disabled –1 +1 –1 +1 µA –300 mA IOS Output Short Circuit Current[3] VCC = Max., VOUT = GND –300 ICC VCC Operating Supply Current VCC = Max., IOUT = 0 mA 60 50 mA ISB1 Automatic Power-down Current Max. VCC, CE1 ≥ VIH or CE2 ≤ VIL Min. Duty Cycle = 100% 10 10 mA ISB2 Automatic Power-down Current Max. VCC, CE1 ≥ VCC – 0.3V, or CE2 ≤ 0.3V VIN ≥ VCC – 0.3V or VIN ≤ 0.3V 3.0 3.0 mA 7C185D-15 Parameter Description Test Conditions VOH Output HIGH Voltage VCC = Min., IOH = –4.0 mA VOL Output LOW Voltage VCC = Min., IOL = 8.0 mA VIH Input HIGH Voltage Min. 2.4 Voltage[2] VIL Input LOW IIX Input Load Current IOZ Output Leakage Current Current[3] Max. Unit V 0.4 V 2.0 VCC + 0.3V V –0.5 0.8 V GND ≤ VI ≤ VCC –1 +1 µA GND ≤ VI ≤ VCC, Output Disabled –1 +1 µA IOS Output Short Circuit –300 mA ICC VCC Operating Supply Current VCC = Max., IOUT = 0 mA 40 mA ISB1 Automatic Power-down Current Max. VCC, CE1 ≥ VIH or CE2 ≤ VIL Min. Duty Cycle = 100% 10 mA ISB2 Automatic Power-down Current Max. VCC, CE1 ≥ VCC – 0.3V or CE2 ≤ 0.3V VIN ≥ VCC – 0.3V or VIN ≤ 0.3V 3.0 mA VCC = Max., VOUT = GND Capacitance[4] Parameter Description CIN Input Capacitance COUT Output Capacitance Test Conditions TA = 25°C, f = 1 MHz, VCC = 5.0V Max. Unit 7 pF 7 pF Notes: 2. VIL (min.) = –2.0V and VIH(max) = VCC + 2V for pulse durations of less than 20 ns. 3. Not more than 1 output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds. 4. Tested initially and after any design or process changes that may affect these parameters. Document #: 38-05466 Rev. *C Page 3 of 10 CY7C185D PRELIMINARY Thermal Resistance[4] Parameter Description Test Conditions ΘJA Thermal Resistance (Junction to Ambient)[4] ΘJC Thermal Resistance (Junction to Case)[4] All-Packages Unit TBD °C/W TBD °C/W Still Air, soldered on a 3 × 4.5 inch, two-layer printed circuit board AC Test Loads and Waveforms 10-ns Device ALL INPUT PULSES Z = 50Ω 3.0V OUTPUT 50 Ω * CAPACITIVE LOAD CONSISTS OF ALL COMPONENTS OF THE TEST ENVIRONMENT (a) Equivalent to: THÉVENIN EQUIVALENT OUTPUT 167Ω 30 pF* GND ≤ 3 ns ≤ 3 ns 12, 15-ns Devices R1 481 Ω 5V OUTPUT 1.5V 30 pF 1.73V INCLUDING JIG AND SCOPE 90% 10% 90% 10% High-Z characteristics: 5V OUTPUT R2 255Ω R1 481 Ω 5 pF INCLUDING JIGAND SCOPE (b) R2 255Ω (c) Switching Characteristics Over the Operating Range [6] 7C185D-10 Parameter Description Min. Max. 7C185D-12 Min. Max. 7C185D-15 Min. Max. Unit Read Cycle tpower[5] VCC(typical) to the first access 100 100 100 µs tRC Read Cycle Time 10 12 15 ns tAA Address to Data Valid tOHA Data Hold from Address Change tACE1 CE1 LOW to Data Valid 10 12 15 ns tACE2 CE2 HIGH to Data Valid 10 12 15 ns tDOE OE LOW to Data Valid tLZOE OE LOW to Low Z tHZOE OE HIGH to High Z[7] tLZCE1 CE1 LOW to Low Z[8] tLZCE2 CE2 HIGH to Low Z tHZCE CE1 HIGH to High Z[7, 8] CE2 LOW to High Z tPU CE1 LOW to Power-Up CE2 to HIGH to Power-Up tPD CE1 HIGH to Power-Down CE2 LOW to Power-Down 10 3 12 3 5 3 6 3 5 3 ns 7 0 12 ns ns 3 0 10 7 6 ns ns 3 3 5 0 8 6 ns ns 3 3 3 15 3 ns ns 15 ns Notes: 5. tPOWER gives the minimum amount of time that the power supply should be at typical VCC values until the first memory access can be performed. 6. Test conditions assume signal transition time of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, and output loading of the specified IOL/IOH and 30-pF load capacitance. 7. tHZOE, tHZCE, and tHZWE are specified with CL = 5 pF as in part (b) of AC Test Loads. Transition is measured ±200 mV from steady state voltage. 8. At any given temperature and voltage condition, tHZCE is less than tLZCE1 and tLZCE2 for any given device. Document #: 38-05466 Rev. *C Page 4 of 10 CY7C185D PRELIMINARY Switching Characteristics Over the Operating Range (continued)[6] 7C185D-10 Parameter Write Cycle Description Min. Max. 7C185D-12 Min. 7C185D-15 Max. Min. Max. Unit [9] tWC Write Cycle Time 10 12 15 ns tSCE1 CE1 LOW to Write End 8 10 12 ns tSCE2 CE2 HIGH to Write End 8 10 12 ns tAW Address Set-up to Write End 7 10 12 ns tHA Address Hold from Write End 0 0 0 ns tSA Address Set-up to Write Start 0 0 0 ns tPWE WE Pulse Width 7 10 12 ns tSD Data Set-up to Write End 6 7 8 ns tHD Data Hold from Write End 0 0 0 ns tHZWE WE LOW to High Z[7] tLZWE WE HIGH to Low Z 6 3 6 7 3 3 ns ns Data Retention Characteristics (Over the Operating Range) Parameter Description Conditions VDR VCC for Data Retention ICCDR Data Retention Current Non-L, Com’l / Ind’l tCDR tR[10] Max. 2.0 L-Version Only Chip Deselect to Data Retention Time [4] Min. VCC = VDR = 2.0V, CE > VCC – 0.3V, VIN > VCC – 0.3V or VIN < 0.3V Operation Recovery Time Unit V 3 mA 1.2 mA 0 ns tRC ns Data Retention Waveform DATA RETENTION MODE 4.5V VCC VDR > 2V 4.5V tR tCDR CE Switching Waveforms Read Cycle No.1[11,12] tRC ADDRESS tOHA DATA OUT PREVIOUS DATA VALID tAA DATA VALID Notes: 9. The internal write time of the memory is defined by the overlap of CE1 LOW, CE2 HIGH, and WE LOW. All 3 signals must be active to initiate a write and either signal can terminate a write by going HIGH. The data input set-up and hold timing should be referenced to the rising edge of the signal that terminates the write. 10. Full device operation requires linear VCC ramp from VDR to VCC(min.) > 50 µs or stable at VCC(min.) > 50 µs. 11. Device is continuously selected. OE, CE1 = VIL. CE2 = VIH. 12. WE is HIGH for read cycle. Document #: 38-05466 Rev. *C Page 5 of 10 CY7C185D PRELIMINARY Switching Waveforms (continued) Read Cycle No.2[13,14] tRC CE1 CE2 tACE OE OE DATA OUT tHZOE tDOE tLZOE HIGH IMPEDANCE tHZCE HIGH IMPEDANCE DATA VALID tLZCE VCC SUPPLY CURRENT tPD tPU ICC 50% 50% ISB Write Cycle No. 1 (WE Controlled)[12,14] tWC ADDRESS tSCEI CE1 tAW tHA tSCE2 CE CE 2 tSA WE tPWE OE tSD DATA I/O tHD DATA IN VALID NOTE 15 tHZOE Write Cycle No. 2 (CE Controlled)[14,15,16] tWC ADDRESS tSCE1 CE1 tSA tSCE2 CE2 tAW tHA WE tSD DATA I/O tHD DATA IN VALID Notes: 13. Data I/O is High Z if OE = VIH, CE1 = VIH, WE = VIL, or CE2=VIL. 14. The internal write time of the memory is defined by the overlap of CE1 LOW, CE2 HIGH and WE LOW. CE1 and WE must be LOW and CE2 must be HIGH to initiate write. A write can be terminated by CE1 or WE going HIGH or CE2 going LOW. The data input set-up and hold timing should be referenced to the rising edge of the signal that terminates the write. 15. During this period, the I/Os are in the output state and input signals should not be applied. 16. The minimum write cycle time for write cycle #3 (WE controlled, OE LOW) is the sum of tHZWE and tSD. Document #: 38-05466 Rev. *C Page 6 of 10 CY7C185D PRELIMINARY Switching Waveforms (continued) Write Cycle No. 3 (WE Controlled, OE LOW)[14,15,16,17] tWC ADDRESS CE1 tSCE1 CE2 tSCE2 tAW tHA tSA WE tSD DATA I/O NOTE 15 tHD DATA IN VALID tLZWE tHZWE Truth Table CE1 CE2 WE OE Input/Output Mode H X X X High Z Deselect/Power-down X L X X High Z Deselect/Power-down L H H L Data Out Read L H L X Data In Write L H H H High Z Deselect Ordering Information Speed (ns) 10 12 15 Ordering Code Package Name Package Type Operating Range CY7C185D-10PXC P21 28-Lead (300-Mil) Molded DIP (Pb-Free) Commercial CY7C185D-10SXC S21 28-Lead Molded SOIC (Pb-Free) CY7C185D-10VXC V21 28-Lead Molded SOJ (Pb-Free) CY7C185D-10VXI V21 28-Lead Molded SOJ (Pb-Free) Industrial CY7C185D-12PXC P21 28-Lead (300-Mil) Molded DIP (Pb-Free) Commercial CY7C185D-12SXC S21 28-Lead Molded SOIC (Pb-Free) CY7C185D-12VXC V21 28-Lead Molded SOJ (Pb-Free) CY7C185D-12VXI V21 28-Lead Molded SOJ (Pb-Free) Industrial CY7C185D-15PXC P21 28-Lead (300-Mil) Molded DIP (Pb-Free) Commercial CY7C185D-15SXC S21 28-Lead Molded SOIC (Pb-Free) CY7C185D-15VXC V21 28-Lead Molded SOJ (Pb-Free) CY7C185D-15VXI V21 28-Lead Molded SOJ (Pb-Free) Industrial Shaded areas contain advance information. Please contact your local Cypress sales representative for availability of these parts. Note: 17. If CE1 goes HIGH or CE2 goes LOW simultaneously with WE HIGH, the output remains in a high-impedance state. Document #: 38-05466 Rev. *C Page 7 of 10 CY7C185D PRELIMINARY Package Diagrams 28-Lead (300-Mil) PDIP P21 SEE LEAD END OPTION 14 1 DIMENSIONS IN INCHES [MM] MIN. MAX. REFERENCE JEDEC MO-095 0.260[6.60] 0.295[7.49] 15 PACKAGE WEIGHT: 2.15 gms 28 0.030[0.76] 0.080[2.03] SEATING PLANE 1.345[34.16] 1.385[35.18] 0.290[7.36] 0.325[8.25] 0.120[3.05] 0.140[3.55] 0.140[3.55] 0.190[4.82] 0.115[2.92] 0.160[4.06] 0.015[0.38] 0.060[1.52] 0.009[0.23] 0.012[0.30] 0.055[1.39] 0.065[1.65] 0.090[2.28] 0.110[2.79] 3° MIN. 0.310[7.87] 0.385[9.78] 0.015[0.38] 0.020[0.50] SEE LEAD END OPTION 51-85014-*D LEAD END OPTION (LEAD #1, 14, 15 & 28) 28-Lead (300-Mil) Molded SOIC S21 PIN 1 ID 14 1 MIN. MAX. DIMENSIONS IN INCHES[MM] 0.394[10.01] * 0.419[10.64] 0.291[7.39] PACKAGE WEIGHT 0.85gms 0.300[7.62] 15 28 REFERENCE JEDEC MO-119 PART # S28.3 STANDARD PKG. SZ28.3 LEAD FREE PKG. 0.026[0.66] 0.032[0.81] SEATING PLANE 0.697[17.70] 0.713[18.11] 0.092[2.33] 0.105[2.67] 0.004[0.10] 0.050[1.27] TYP. 0.013[0.33] 0.004[0.10] 0.019[0.48] 0.0118[0.30] * 0.015[0.38] 0.050[1.27] 0.0091[0.23] 0.0125[3.17] * 51-85026-*C Document #: 38-05466 Rev. *C Page 8 of 10 PRELIMINARY CY7C185D Package Diagrams (continued) 28-Lead (300-Mil) Molded SOJ V21 51-85031-*B All product and company names mentioned in this document may be the trademarks of their respective holders. Document #: 38-05466 Rev. *C Page 9 of 10 © Cypress Semiconductor Corporation, 2005. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. PRELIMINARY CY7C185D Document History Page Document Title: CY7C185D 64K (8K x 8) Static RAM (Preliminary) Document Number: 38-05466 REV. ECN NO. Orig. of Issue Date Change Description of Change ** 201560 See ECN SWI Advance Datasheet for C9 IPP *A 233715 See ECN RKF DC parameters are modified as per EROS (Spec # 01-2165) Pb-free offering in Ordering Information *B 262950 See ECN RKF Added Tpower Spec in Switching Characteristics table Added Data Retention Characteristics table and waveforms Shaded Ordering Information *C 307593 See ECN RKF 1) Reduced Speed bins to -10, -12 and -15 ns 2) Added ‘Industrial’ grade parts to the Ordering Info on Page #6 Document #: 38-05466 Rev. *C Page 10 of 10