CYPRESS CYV15G0404RB

CYV15G0404RB
PRELIMINARY
Independent Clock Quad HOTLink II™ Reclocking
Deserializer
Features
• Quad channel video reclocking deserializer
— 195- to 1500-Mbps serial data signaling rate
— Simultaneous operation at different signaling rates
• Second-generation HOTLink® technology
• Compliant to SMPTE 292M and SMPTE 259M video
standards
• Supports reception of either 1.485 or 1.485/1.001 Gbps
data rate with the same training clock
• Supports half-rate and full-rate clocking
• Internal phase-locked loops (PLLs) with no external
PLL components
• Selectable differential PECL-compatible serial inputs
— Internal DC-restoration
• Synchronous LVTTL parallel interface
• JTAG boundary scan
• Built-In Self-Test (BIST) for at-speed link testing
• Link Quality Indicator
— Analog signal detect
— Digital signal detect
• Low-power 3W @ 3.3V typical
• Single 3.3V supply
• Thermally enhanced BGA
• 0.25µ BiCMOS technology
Functional Description
The CYV15G0404RB Independent Clock Quad HOTLink II™
Deserializing Reclocker is a point-to-point or point-to-multipoint communications building block enabling transfer of data
over a variety of high-speed serial links including SMPTE 292
and SMPTE 259 video applications. It supports signaling rates
in the range of 195 to 1500 Mbps per serial link. The four
channels are independent and can simultaneously operate at
different rates. Each receive channel accepts serial data and
converts it to 10-bit parallel characters and presents these
characters to an Output Register. The received serial data can
also be reclocked and retransmitted through the reclocker
serial outputs. Figure 1 illustrates typical connections between
independent video co-processors and corresponding
CYV15G0404RB
Reclocking
Deserializer
and
CYV15G0403TB Serializer chips.
The CYV15G0404RB satisfies the SMPTE-259M and
SMPTE-292M compliance as per SMPTE EG34-1999 Pathological Test Requirements.
As
a
second-generation
HOTLink
device,
the
CYV15G0404RB extends the HOTLink family with enhanced
levels of integration and faster data rates, while maintaining
serial-link compatibility (data and BIST) with other HOTLink
devices.
Each channel of the CYV15G0404RB Quad HOTLink II device
accepts a serial bit-stream from one of two selectable PECLcompatible differential line receivers, and using a completely
integrated Clock and Data Recovery PLL, recovers the timing
information necessary for data reconstruction. The recovered
bit-stream is reclocked and retransmitted through the
reclocker serial outputs. Also, the recovered serial data is
deserialized and presented to the destination host system.
Each channel contains an independent BIST pattern checker.
This BIST hardware allows at-speed testing of the high-speed
serial data paths in each receive section of this device, each
transmit section of a connected HOTLink II device, and across
the interconnecting links.
The CYV15G0404RB is ideal for SMPTE applications where
different data rates and serial interface standards are
necessary for each channel. Some applications include multiformat routers, switchers, format converters, SDI monitors,
and camera control units.
Reclocked
Outputs
10
Video Coprocessor
10
10
Independent
Channel
CYV15G0403TB
Serializer
Independent
Channel
CYV15G0404RB
Reclocking Deserializer
Serial Links
10
10
Video Coprocessor
10
10
10
Reclocked
Outputs
Figure 1. HOTLink II™ System Connections
Cypress Semiconductor Corporation
Document #: 38-02102 Rev. **
•
3901 North First Street
•
San Jose, CA 95134
•
408-943-2600
Revised July 21, 2004
CYV15G0404RB
PRELIMINARY
TRGCLKD±
RXDD[9:0]
TRGCLKC±
RXDC[9:0]
TRGCLKB±
RXDB[9:0]
RXDA[9:0]
TRGCLKA±
CYV15G0404RB Deserializing Reclocker Logic Block Diagram
Deserializer
RX
Reclocker
RX
Reclocker
RX
Reclocker
Document #: 38-02102 Rev. **
RX
IND1±
IND2±
Reclocker
ROUTD1±
ROUTD2±
Deserializer
INC1±
INC2±
Deserializer
ROUTC1±
ROUTC2±
Deserializer
INB1±
INB2±
x10
ROUTB1±
ROUTB2±
x10
INA1±
INA2±
x10
ROUTA1±
ROUTA2±
x10
Page 2 of 26
CYV15G0404RB
PRELIMINARY
Reclocking Deserializer Path Block Diagram
= Internal Signal
RESET
TRGRATEA
x2
TRGCLKA
TRST
JTAG
Boundary
Scan
Controller
SDASEL[2..1]A[1:0]
TMS
TCLK
TDI
TDO
LDTDEN
Clock &
Data
Recovery
PLL
INA2+
INA2–
ULCA
10
10
Output
Register
INA1+
INA1–
Shifter
INSELA
BIST LFSR
LFIA
Receive
Signal
Monitor
10
BISTSTA
RXCLKA+
RXCLKA–
÷2
SPDSELA
RXDA[9:0]
RXBISTA[1:0]
RXRATEA
RXPLLPDA
Recovered Serial Data
ROE[2..1]A
Reclocker
Output PLL
Clock Multiplier A
RECLKOA
Register
Recovered Character Clock
ROE[2..1]A
ROUTA1+
ROUTA1–
ROUTA2+
ROUTA2–
Character-Rate Clock A
REPDOA
TRGRATEB
x2
TRGCLKB
SDASEL[2..1]B[1:0]
LDTDEN
Clock &
Data
Recovery
PLL
INB2+
INB2–
ULCB
10
10
Output
Register
INB1+
INB1–
Shifter
INSELB
BIST LFSR
LFIB
Receive
Signal
Monitor
10
BISTSTB
RXCLKB+
RXCLKB–
÷2
SPDSELB
RXDB[9:0]
RXBISTB[1:0]
RXRATEB
RXPLLPDB
Recovered Serial Data
Reclocker
Output PLL
Clock Multiplier B
RECLKOB
ROE[2..1]B
ROE[2..1]B
Register
Recovered Character Clock
ROUTB1+
ROUTB1–
ROUTB2+
ROUTB2–
Character-Rate Clock B
REPDOB
Document #: 38-02102 Rev. **
Page 3 of 26
CYV15G0404RB
PRELIMINARY
Reclocking Deserializer Path Block Diagram (Continued)
= Internal Signal
TRGRATEC
x2
TRGCLKC
SDASEL[2..1]C[1:0]
LDTDEN
Clock &
Data
Recovery
PLL
INC2+
INC2–
ULCC
10
10
Output
Register
INC1+
INC1–
Shifter
INSELC
BIST LFSR
LFIC
Receive
Signal
Monitor
10
BISTSTC
RXCLKC+
RXCLKC–
÷2
SPDSELC
RXDC[9:0]
RXBISTC[1:0]
RXRATEC
RXPLLPDC
Recovered Serial Data
ROE[2..1]C
Reclocker
Output PLL
Clock Multiplier C
RECLKOC
Register
Recovered Character Clock
ROE[2..1]C
ROUTC1+
ROUTC1–
ROUTC2+
ROUTC2–
Character-Rate Clock C
REPDOC
TRGRATED
x2
TRGCLKD
SDASEL[2..1]D[1:0]
LDTDEN
Clock &
Data
Recovery
PLL
IND2+
IND2–
ULCD
10
10
Output
Register
IND1+
IND1–
Shifter
INSELD
BIST LFSR
LFID
Receive
Signal
Monitor
10
BISTSTD
RXCLKD+
RXCLKD–
÷2
SPDSELD
RXDD[9:0]
RXBISTD[1:0]
RXRATED
RXPLLPDD
Recovered Serial Data
Reclocker
Output PLL
Clock Multiplier D
RECLKOD
ROE[2..1]D
ROE[2..1]D
Register
Recovered Character Clock
ROUTD1+
ROUTD1–
ROUTD2+
ROUTD2–
Character-Rate Clock D
REPDOD
Document #: 38-02102 Rev. **
Page 4 of 26
PRELIMINARY
Device Configuration and Control Block Diagram
WREN
ADDR[3:0]
DATA[7:0]
Device Configuration
and Control Interface
Document #: 38-02102 Rev. **
CYV15G0404RB
= Internal Signal
RXBIST[A..D]
RXRATE[A..D]
SDASEL[A..D][1:0]
RXPLLPD[A..D]
ROE[2..1][A..D]
GLEN[11..0]
FGLEN[2..0]
Page 5 of 26
CYV15G0404RB
PRELIMINARY
Pin Configuration (Top View)[1]
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
U
V
W
Y
1.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
IN
C1–
ROUT
C1–
IN
C2–
ROUT
C2–
VCC
IN
D1–
ROUT
D1–
GND
IN
D2–
ROUT
D2–
IN
A1–
ROUT
A1–
GND
IN
A2–
ROUT
A2–
VCC
IN
B1–
ROUT
B1–
IN
B2–
ROUT
B2–
IN
C1+
ROUT
C1+
IN
C2+
ROUT
C2+
VCC
IN
D1+
ROUT
D1+
GND
IN
D2+
ROUT
D2+
IN
A1+
ROUT
A1+
GND
IN
A2+
ROUT
A2+
VCC
IN
B1+
ROUT
B1+
IN
B2+
ROUT
B2+
TDI
TMS
INSELC INSELB
VCC
ULCD
ULCC
GND
DATA
[7]
DATA
[5]
DATA
[3]
DATA
[1]
GND
VCC
SPD
SELD
VCC
LDTD
EN
TRST
GND
TDO
RESET INSELD INSELA
VCC
ULCA
SPD
SELC
GND
DATA
[6]
DATA
[4]
DATA
[2]
DATA
[0]
GND
GND
ULCB
VCC
NC
VCC
SCAN TMEN3
EN2
TCLK
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
RX
DC[8]
RX
DC[9]
VCC
VCC
VCC
RX
DB[0]
RE
CLKOB
RX
DB[1]
GND
WREN
GND
GND
SPD
SELB
NC
SPD
SELA
RX
DB[3]
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
BIST
STB
RX
DB[2]
RX
DB[7]
RX
DB[4]
RX
DC[4]
TRG
CLKC–
GND
GND
RX
DB[5]
RX
DB[6]
RX
DB[9]
LFIB
RX
DC[5]
TRG
CLKC+
LFIC
GND
RX
DB[8]
RX
DC[6]
RX
DC[7]
VCC
RE
PDOC
GND
GND
GND
GND
GND
RX
DC[3]
RX
DC[2]
RX
DC[1]
RX
DC[0]
BIST
STC
RX
RX
CLKB+ CLKB–
TRG
TRG
CLKB+ CLKB–
RE
RX
RX
CLKOC CLKC+ CLKC–
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
RX
DD[4]
RX
DD[3]
GND
GND
ADDR
TRG
[0]
CLKD–
VCC
VCC
VCC
RX
DD[8]
VCC
RX
DD[5]
RX
DD[1]
GND
BIST
STD
VCC
VCC
LFID
RX
CLKD–
VCC
RX
DD[6]
RX
DD[0]
GND
VCC
VCC
RX
DD[9]
RX
CLKD+
VCC
RX
DD[7]
RX
DD[2]
GND
GND
RE
PDOB
GND
GND
GND
GND
GND
GND
GND
GND
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
GND
GND
VCC
VCC
RX
DA[4]
VCC
BIST
STA
RX
DA[0]
ADDR
TRG
RE
[2]
CLKD+ CLKOA
GND
GND
VCC
VCC
RX
DA[9]
RX
DA[5]
RX
DA[2]
RX
DA[1]
ADDR
[3]
ADDR
[1]
RX
CLKA+
RE
PDOA
GND
GND
VCC
VCC
LFIA
TRG
CLKA+
RX
DA[6]
RX
DA[3]
RE
CLKOD
NC
GND
RX
CLKA–
GND
GND
VCC
VCC
RE
TRG
PDOD CLKA–
RX
DA[8]
RX
DA[7]
GND
NC = Do not connect.
Document #: 38-02102 Rev. **
Page 6 of 26
CYV15G0404RB
PRELIMINARY
Pin Configuration (Bottom View)[1]
20
19
18
17
16
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
A
ROUT
B2–
IN
B2–
ROUT
B1–
IN
B1–
VCC
ROUT
A2–
IN
A2–
GND
ROUT
A1–
IN
A1–
ROUT
D2–
IN
D2–
GND
ROUT
D1–
IN
D1–
VCC
ROUT
C2–
IN
C2–
ROUT
C1–
IN
C1–
B
ROUT
B2+
IN
B2+
ROUT
B1+
IN
B1+
VCC
ROUT
A2+
IN
A2+
GND
ROUT
A1+
IN
A1+
ROUT
D2+
IN
D2+
GND
ROUT
D1+
IN
D1+
VCC
ROUT
C2+
IN
C2+
ROUT
C1+
IN
C1+
C
TDO
GND
TRST
LDTD
EN
VCC
SPD
SELD
VCC
GND
DATA
[1]
DATA
[3]
DATA
[5]
DATA
[7]
GND
ULCC
ULCD
VCC
INSELB INSELC
TMS
TDI
TMEN3 SCAN
EN2
VCC
NC
VCC
ULCB
GND
GND
DATA
[0]
DATA
[2]
DATA
[4]
DATA
[6]
GND
SPD
SELC
ULCA
VCC
INSELA INSELD RESET
D
TCLK
E
VCC
VCC
VCC
VCC
VCC
VCC
VCC
VCC
F
RX
DB[1]
RE
CLKOB
RX
DB[0]
VCC
VCC
VCC
RX
DC[9]
RX
DC[8]
G
RX
DB[3]
SPD
SELA
NC
SPD
SELB
GND
GND
WREN
GND
H
GND
GND
GND
GND
GND
GND
GND
GND
J
RX
DB[4]
RX
DB[7]
RX
DB[2]
BIST
STB
GND
GND
GND
GND
K
LFIB
RX
DB[9]
RX
DB[6]
RX
DB[5]
GND
GND
TRG
CLKC–
RX
DC[4]
L
GND
RX
RX
CLKB– CLKB+
RX
DB[8]
GND
LFIC
TRG
CLKC+
RX
DC[5]
M
GND
RE
PDOB
TRG
TRG
CLKB– CLKB+
RE
PDOC
VCC
RX
DC[7]
RX
DC[6]
N
GND
GND
GND
GND
GND
GND
GND
GND
P
GND
GND
GND
GND
RX
DC[0]
RX
DC[1]
RX
DC[2]
RX
DC[3]
R
VCC
VCC
VCC
VCC
T
VCC
VCC
VCC
VCC
U
RX
DA[0]
BIST
STA
VCC
RX
DA[4]
VCC
VCC
GND
GND
V
RX
DA[1]
RX
DA[2]
RX
DA[5]
RX
DA[9]
VCC
VCC
GND
W
RX
DA[3]
RX
DA[6]
TRG
CLKA+
LFIA
VCC
VCC
Y
RX
DA[7]
RX
DA[8]
TRG
RE
CLKA– PDOD
VCC
VCC
Document #: 38-02102 Rev. **
RX
RX
RE
CLKC– CLKC+ CLKOC
BIST
STC
VCC
VCC
VCC
VCC
TRG
ADDR
CLKD–
[0]
GND
GND
RX
DD[3]
RX
DD[4]
VCC
VCC
VCC
VCC
VCC
GND
RE
TRG
ADDR
CLKOA CLKD+
[2]
BIST
STD
GND
RX
DD[1]
RX
DD[5]
VCC
RX
DD[8]
VCC
VCC
VCC
GND
GND
RE
PDOA
RX
CLKA+
ADDR
[1]
ADDR
[3]
GND
RX
DD[0]
RX
DD[6]
VCC
RX
CLKD–
LFID
VCC
VCC
GND
GND
RX
CLKA–
GND
NC
RE
CLKOD
GND
RX
DD[2]
RX
DD[7]
VCC
RX
CLKD+
RX
DD[9]
VCC
VCC
GND
Page 7 of 26
PRELIMINARY
CYV15G0404RB
Pin Definitions
CYV15G0404RB Quad HOTLink II Deserializing Reclocker
Name
I/O Characteristics
Signal Description
Receive Path Data and Status Signals
RXDA[9:0]
RXDB[9:0]
RXDC[9:0]
RXDD[9:0]
LVTTL Output,
synchronous to the
RXCLK± output
Parallel Data Output. RXDx[9:0] parallel data outputs change relative to the
receive interface clock. If RXCLKx± is a full-rate clock, the RXCLKx± clock
outputs are complementary clocks operating at the character rate. The
RXDx[9:0] outputs for the associated receive channels follow rising edge of
RXCLKx+ or falling edge of RXCLKx–. If RXCLKx± is a half-rate clock, the
RXCLKx± clock outputs are complementary clocks operating at half the
character rate. The RXDx[9:0] outputs for the associated receive channels
follow both the falling and rising edges of the associated RXCLKx± clock
outputs.
When BIST is enabled on the receive channel, the BIST status is presented on
the RXDx[1:0] and BISTSTx outputs. See Table 5 for each status reported by
the BIST state machine. Also, while BIST is enabled, the RXDx[9:2] outputs
should be ignored.
BISTSTA
BISTSTB
BISTSTC
BISTSTD
LVTTL Output,
synchronous to the
RXCLKx ± output
REPDOA
REPDOB
REPDOC
REPDOD
Asynchronous to
reclocker output
channel
enable / disable
BIST Status Output. When RXBISTx[1:0] = 10, BISTSTx (along with
RXDx[1:0]) displays the status of the BIST reception. See Table 5 for the BIST
status reported for each combination of BISTSTx and RXDx[1:0].
When RXBISTx[1:0] ≠ 10, BISTSTx should be ignored.
Reclocker Powered Down Status Output. REPDOx is asserted HIGH, when
the associated channel’s reclocker output logic is powered down. This occurs
when ROE2x and ROE1x are both disabled by setting ROE2x = 0 and ROE1x
= 0.
Receive Path Clock Signals
TRGCLKA±
TRGCLKB±
TRGCLKC±
TRGCLKD±
Differential LVPECL or
single-ended
LVTTL input clock
CDR PLL Training Clock. TRGCLKx± clock inputs are used as the reference
source for the frequency detector (Range Controller) of the associated receive
PLL to reduce PLL acquisition time.
In the presence of valid serial data, the recovered clock output of the receive
CDR PLL (RXCLKx±) has no frequency or phase relationship with TRGCLKx±.
When driven by a single-ended LVCMOS or LVTTL clock source, connect the
clock source to either the true or complement TRGCLKx input, and leave the
alternate TRGCLKx input open (floating). When driven by an LVPECL clock
source, the clock must be a differential clock, using both inputs.
RXCLKA±
RXCLKB±
RXCLKC±
RXCLKD±
LVTTL Output Clock
Receive Clock Output. RXCLKx± is the receive interface clock used to control
timing of the RXDx[9:0] parallel outputs. These true and complement clocks are
used to control timing of data output transfers. These clocks are output continuously at either the half-character rate (1/20th the serial bit-rate) or character
rate (1/10th the serial bit-rate) of the data being received, as selected by
RXRATEx.
RECLKOA
RECLKOB
RECLKOC
RECLKOD
LVTTL Output
Reclocker Clock Output. RECLKOx output clock is synthesized by the
associated reclocker output PLL and operates synchronous to the internal
recovered character clock. RECLKOx operates at either the same frequency as
RXCLKx± (RXRATEx = 0), or at twice the frequency of RXCLKx± (RXRATEx =
1).The reclocker clock outputs have no fixed phase relationship to RXCLKx±.
Device Control Signals
RESET
LVTTL Input,
asynchronous,
internal pull-up
Document #: 38-02102 Rev. **
Asynchronous Device Reset. RESET initializes all state machines, counters,
and configuration latches in the device to a known state. RESET must be
asserted LOW for a minimum pulse width. When the reset is removed, all state
machines, counters and configuration latches are at an initial state. See Table 3
for the initialize values of the device configuration latches.
Page 8 of 26
PRELIMINARY
CYV15G0404RB
Pin Definitions (continued)
CYV15G0404RB Quad HOTLink II Deserializing Reclocker
Name
I/O Characteristics
Signal Description
LDTDEN
LVTTL Input,
internal pull-up
Level Detect Transition Density Enable. When LDTDEN is HIGH, the Signal
Level Detector, Range Controller, and Transition Density Detector are all
enabled to determine if the RXPLL tracks TRGCLKx± or the selected input serial
data stream. If the Signal Level Detector, Range Controller, or Transition Density
Detector are out of their respective limits while LDTDEN is HIGH, the RXPLL
locks to TRGCLKx± until such a time they become valid. The SDASEL[A..D][1:0]
inputs are used to configure the trip level of the Signal Level Detector. The
Transition Density Detector limit is one transition in every 60 consecutive bits.
When LDTDEN is LOW, only the Range Controller is used to determine if the
RXPLL tracks TRGCLKx± or the selected input serial data stream. It is recommended to set LDTDEN = HIGH.
ULCA
ULCB
ULCC
ULCD
LVTTL Input,
internal pull-up
Use Local Clock. When ULCx is LOW, the RXPLL is forced to lock to
TRGCLKx± instead of the received serial data stream. While ULCx is LOW, the
LFIx for the associated channel is LOW indicating a link fault.
SPDSELA
SPDSELB
SPDSELC
SPDSELD
3-Level Select[2]
static control input
When ULCx is HIGH, the RXPLL performs Clock and Data Recovery functions
on the input data streams. This function is used in applications in which a stable
RXCLKx± is needed. In cases when there is an absence of valid data transitions
for a long period of time, or the high-gain differential serial inputs (INx±) are left
floating, there may be brief frequency excursions of the RXCLKx± outputs from
TRGCLKx±.
Serial Rate Select. The SPDSELx inputs specify the operating signaling-rate
range of each channel’s receive PLL.
LOW = 195 – 400 MBd
MID = 400 – 800 MBd
HIGH = 800 – 1500 MBd.
INSELA
INSELB
INSELC
INSELD
LVTTL Input,
asynchronous
Receive Input Selector. The INSELx input determines which external serial bit
stream is passed to the receiver’s Clock and Data Recovery circuit. When
INSELx is HIGH, the Primary Differential Serial Data Input, INx1±, is selected
for the associated receive channel. When INSELx is LOW, the Secondary Differential Serial Data Input, INx2±, is selected for the associated receive channel.
LFIA
LFIB
LFIC
LFID
LVTTL Output,
asynchronous
Link Fault Indication Output. LFIx is an output status indicator signal. LFIx is
the logical OR of six internal conditions. LFIx is asserted LOW when any of the
following conditions is true:
• Received serial data rate outside expected range
• Analog amplitude below expected levels
• Transition density lower than expected
• Receive channel disabled
• ULCx is LOW
• Absence of TRGCLKx±.
Device Configuration and Control Bus Signals
WREN
LVTTL input,
asynchronous,
internal pull-up
Control Write Enable. The WREN input writes the values of the DATA[7:0] bus
into the latch specified by the address location on the ADDR[3:0] bus.[3]
ADDR[3:0]
LVTTL input
asynchronous,
internal pull-up
Control Addressing Bus. The ADDR[3:0] bus is the input address bus used to
configure the device. The WREN input writes the values of the DATA[7:0] bus
into the latch specified by the address location on the ADDR[3:0] bus.[3] Table 3
lists the configuration latches within the device, and the initialization value of the
latches upon the assertion of RESET. Table 4 shows how the latches are
mapped in the device.
Notes:
2. 3-Level Select inputs are used for static configuration. These are ternary inputs that make use of logic levels of LOW, MID, and HIGH. The LOW level is usually
implemented by direct connection to VSS (ground). The HIGH level is usually implemented by direct connection to VCC (power). The MID level is usually
implemented by not connecting the input (left floating), which allows it to self bias to the proper level.
3. See Device Configuration and Control Interface for detailed information on the operation of the Configuration Interface.
Document #: 38-02102 Rev. **
Page 9 of 26
PRELIMINARY
CYV15G0404RB
Pin Definitions (continued)
CYV15G0404RB Quad HOTLink II Deserializing Reclocker
Name
DATA[7:0]
I/O Characteristics
LVTTL input
asynchronous,
internal pull-up
Signal Description
Control Data Bus. The DATA[7:0] bus is the input data bus used to configure
the device. The WREN input writes the values of the DATA[7:0] bus into the latch
specified by address location on the ADDR[3:0] bus.[3 ] Table 3 lists the configuration latches within the device, and the initialization value of the latches upon
the assertion of RESET. Table 4 shows how the latches are mapped in the
device.
Internal Device Configuration Latches
RXRATE[A..D]
Internal Latch[4]
Receive Clock Rate Select.
SDASEL[2..1][A..D]
[1:0]
Internal Latch[4]
Signal Detect Amplitude Select.
RXPLLPD[A..D]
Internal Latch[4]
Receive Channel Power Control.
Latch[4]
RXBIST[A..D][1:0]
Internal
ROE2[A..D]
Internal Latch[4]
Reclocker Differential Serial Output Driver 2 Enable.
ROE1[A..D]
Internal
Latch[4]
Reclocker Differential Serial Output Driver 1 Enable.
GLEN[11..0]
Internal Latch[4]
FGLEN[2..0]
Latch[4]
Internal
Receive Bist Disabled.
Global Latch Enable.
Force Global Latch Enable.
Factory Test Modes
SCANEN2
LVTTL input,
internal pull-down
Factory Test 2. SCANEN2 input is for factory testing only. This input may be left
as a NO CONNECT, or GND only.
TMEN3
LVTTL input,
internal pull-down
Factory Test 3. TMEN3 input is for factory testing only. This input may be left
as a NO CONNECT, or GND only.
ROUTA1±
ROUTB1±
ROUTC1±
ROUTD1±
CML Differential
Output
Primary Differential Serial Data Output. The ROUTx1± PECL-compatible
CML outputs (+3.3V referenced) are capable of driving terminated transmission
lines or standard fiber-optic transmitter modules, and must be AC-coupled for
PECL-compatible connections.
ROUTA2±
ROUTB2±
ROUTC2±
ROUTD2±
CML Differential
Output
Secondary Differential Serial Data Output. The ROUTx2± PECL-compatible CML
outputs (+3.3V referenced) are capable of driving terminated transmission lines or
standard fiber-optic transmitter modules, and must be AC-coupled for PECLcompatible connections.
INA1±
INB1±
INC1±
IND1±
Differential Input
Primary Differential Serial Data Input. The INx1± input accepts the serial data
stream for deserialization. The INx1± serial stream is passed to the receive CDR
circuit to extract the data content when INSELx = HIGH.
INA2±
INB2±
INC2±
IND2±
Differential Input
Secondary Differential Serial Data Input. The INx2± input accepts the serial
data stream for deserialization. The INx2± serial stream is passed to the receiver
CDR circuit to extract the data content when INSELx = LOW.
TMS
LVTTL Input,
internal pull-up
Test Mode Select. Used to control access to the JTAG Test Modes. If
maintained high for ≥5 TCLK cycles, the JTAG test controller is reset.
TCLK
LVTTL Input,
internal pull-down
JTAG Test Clock.
TDO
3-State LVTTL Output
Test Data Out. JTAG data output buffer. High-Z while JTAG test mode is not
selected.
TDI
LVTTL Input,
internal pull-up
Test Data In. JTAG data input port.
TRST
LVTTL Input,
internal pull-up
JTAG reset signal. When asserted (LOW), this input asynchronously resets the
JTAG test access port controller.
Analog I/O
JTAG Interface
Note:
4. See Device Configuration and Control Interface for detailed information on the internal latches.
Document #: 38-02102 Rev. **
Page 10 of 26
CYV15G0404RB
PRELIMINARY
Pin Definitions (continued)
CYV15G0404RB Quad HOTLink II Deserializing Reclocker
Name
I/O Characteristics
Signal Description
Power
VCC
+3.3V Power.
GND
Signal and Power Ground for all internal circuits.
CYV15G0404RB HOTLink II Operation
The CYV15G0404RB is a highly configurable, independent
clocking, quad-channel reclocking deserializer designed to
support reliable transfer of large quantities of digital video
data, using high-speed serial links from multiple sources to
multiple destinations. This device supports four 10-bit
channels.
CYV15G0404RB Receive Data Path
Serial Line Receivers
Two differential Line Receivers, INx1± and INx2±, are
available on each channel for accepting serial data streams.
The active Serial Line Receiver on a channel is selected using
the associated INSELx input. The Serial Line Receiver inputs
are differential, and can accommodate wire interconnect and
filtering losses or transmission line attenuation greater than
16 dB. For normal operation, these inputs should receive a
signal of at least VIDIFF > 100 mV, or 200 mV peak-to-peak
differential. Each Line Receiver can be DC- or AC-coupled to
+3.3V powered fiber-optic interface modules (any ECL/PECL
family, not limited to 100K PECL) or AC-coupled to +5V
powered optical modules. The common-mode tolerance of
these line receivers accommodates a wide range of signal
termination voltages. Each receiver provides internal DCrestoration, to the center of the receiver’s common mode
range, for AC-coupled signals.
Signal Detect/Link Fault
Each selected Line Receiver (i.e., that routed to the clock and
data recovery PLL) is simultaneously monitored for
• analog amplitude above amplitude level selected by
SDASELx
• transition density above the specified limit
• range controls report the received data stream inside
normal frequency range (±1500ppm[21])
• receive channel enabled
• Presence of reference clock
• ULCx is not asserted.
All of these conditions must be valid for the Signal Detect block
to indicate a valid signal is present. This status is presented on
the LFIx (Link Fault Indicator) output associated with each
receive channel, which changes synchronous to the receive
interface clock.
Analog Amplitude
While most signal monitors are based on fixed constants, the
analog amplitude level detection is adjustable to allow
operation with highly attenuated signals, or in high-noise
environments. The analog amplitude level detection is set by
the SDASELx latch via device configuration interface. The
SDASELx latch sets the trip point for the detection of a valid
signal at one of three levels, as listed in Table 1. This control
input affects the analog monitors for all receive channels. The
Analog Signal Detect monitors are active for the Line Receiver
as selected by the associated INSELx input.
Table 1. Analog Amplitude Detect Valid Signal Levels[5]
SDASEL
Typical Signal with Peak Amplitudes Above
00
Analog Signal Detector is disabled
01
140 mV p-p differential
10
280 mV p-p differential
11
420 mV p-p differential
Transition Density
The Transition Detection logic checks for the absence of
transitions spanning greater than six transmission characters
(60 bits). If no transitions are present in the data received, the
Detection logic for that channel asserts LFIx.
Range Controls
The CDR circuit includes logic to monitor the frequency of the
PLL Voltage Controlled Oscillator (VCO) used to sample the
incoming data stream. This logic ensures that the VCO
operates at, or near the rate of the incoming data stream for
two primary cases:
• when the incoming data stream resumes after a time in
which it has been “missing.”
• when the incoming data stream is outside the acceptable
signaling rate range.
To perform this function, the frequency of the RXPLL VCO is
periodically compared to the frequency of the
TRGCLKx±input. If the VCO is running at a frequency beyond
±1500ppm[21] as defined by the TRGCLKx± frequency, it is
periodically forced to the correct frequency (as defined by
TRGCLKx±, SPDSELx, and TRGRATEx) and then released in
an attempt to lock to the input data stream.
The sampling and relock period of the Range Control is calculated as follows: RANGE_CONTROL_ SAMPLING_PERIOD
= (RECOVERED BYTE CLOCK PERIOD) * (4096).
Note:
5. The peak amplitudes listed in this table are for typical waveforms that have generally 3 – 4 transitions for every ten bits. In a worse case environment the signals
may have a sine-wave appearance (highest transition density with repeating 0101...). Signal peak amplitudes levels within this environment type could increase
the values in the table above by approximately 100 mV.
Document #: 38-02102 Rev. **
Page 11 of 26
PRELIMINARY
During the time that the Range Control forces the RXPLL VCO
to track TRGCLKx±, the LFIx output is asserted LOW. After a
valid serial data stream is applied, it may take up to one
RANGE CONTROL SAMPLING PERIOD before the PLL
locks to the input data stream, after which LFIx should be
HIGH.
The operating serial signaling-rate and allowable range of
TRGCLK± frequencies are listed in Table 2.
Table 2. Operating Speed Settings
SPDSELx
TRGRATEx
TRGCLKx±
Frequency
(MHz)
LOW
1
reserved
0
19.5 – 40
MID (Open)
1
20 – 40
0
40 – 80
1
40 – 75
0
80 – 150
HIGH
Signaling
Rate (Mbps)
195 – 400
400 – 800
800 – 1500
Receive Channel Enabled
The CYV15G0404RB contains four receive channels that can
be independently enabled and disabled. Each channel can be
enabled or disabled separately through the RXPLLPDx input
latch as controlled by the device configuration interface. When
the RXPLLPDx latch = 0, the associated PLL and analog
circuitry of the channel is disabled. Any disabled channel
indicates a constant link fault condition on the LFIx output.
When RXPLLPDx = 1, the associated PLL and receive
channel is enabled to receive a serial stream.
Note. When a disabled receive channel is reenabled, the
status of the associated LFIx output and data on the parallel
outputs for the associated channel may be indeterminate for
up to 2 ms.
Clock/Data Recovery
The extraction of a bit-rate clock and recovery of bits from each
received serial stream is performed by a separate CDR block
within each receive channel. The clock extraction function is
performed by an integrated PLL that tracks the frequency of
the transitions in the incoming bit stream and align the phase
of the internal bit-rate clock to the transitions in the selected
serial data stream.
Each CDR accepts a character-rate (bit-rate ÷ 10) or halfcharacter-rate (bit-rate ÷ 20) training clock from the
associated TRGCLKx± input. This TRGCLKx± input is used to
• ensure that the VCO (within the CDR) is operating at the
correct frequency (rather than a harmonic of the bit-rate)
• reduce PLL acquisition time
• limit unlocked frequency excursions of the CDR VCO when
there is no input data present at the selected Serial Line
Receiver.
Regardless of the type of signal present, the CDR attempts to
recover a data stream from it. If the signalling rate of the
recovered data stream is outside the limits set by the range
control monitors, the CDR tracks TRGCLKx± instead of the
data stream. Once the CDR output (RXCLK±) frequency
returns back close to TRGCLKx± frequency, the CDR input is
switched back to the input data stream. If no data is present at
the selected line receiver, this switching behavior may result
Document #: 38-02102 Rev. **
CYV15G0404RB
in brief RXCLK± frequency excursions from TRGCLKx±.
However, the validity of the input data stream is indicated by
the LFIx output. The frequency of TRGCLKx± is required to be
within ±1500ppm[21] of the frequency of the clock that drives
the reference clock input of the remote transmitter to ensure a
lock to the incoming data stream. This large ppm tolerance
allows the CDR PLL to reliably receive a 1.485 or 1.485/1.001
Gbps SMPTE HD-SDI data stream with a constant TRGCLK
frequency.
For systems using multiple or redundant connections, the LFIx
output can be used to select an alternate data stream. When
an LFIx indication is detected, external logic can toggle
selection of the associated INx1± and INx2± input through the
associated INSELx input. When a port switch takes place, it is
necessary for the receive PLL for that channel to reacquire the
new serial stream.
Reclocker
Each receive channel performs a reclocker function on the
incoming serial data. To do this, the Clock and Data Recovery
PLL first recovers the clock from the data. The data is retimed
by the recovered clock and then passed to an output register.
Also, the recovered character clock from the receive PLL is
passed to the reclocker output PLL which generates the bit
clock that is used to clock the retimed data into the output
register. This data stream is then transmitted through the
differential serial outputs.
Reclocker Serial Output Drivers
The serial output interface drivers use differential Current
Mode Logic (CML) drivers to provide source-matched drivers
for 50Ω transmission lines. These drivers accept data from the
reclocker output register in the reclocker channel. These
drivers have signal swings equivalent to that of standard PECL
drivers, and are capable of driving AC-coupled optical
modules or transmission lines.
Reclocker Output Channels Enabled
Each driver can be enabled or disabled separately via the
device configuration interface.
When a driver is disabled via the configuration interface, it is
internally powered down to reduce device power. If both
reclocker serial drivers for a channel are in this disabled state,
the associated internal reclocker logic is also powered down.
The deserialization logic and parallel outputs will remain
enabled. A device reset (RESET sampled LOW) disables all
output drivers.
Note. When the disabled reclocker function (i.e., both outputs
disabled) is re-enabled, the data on the reclocker serial
outputs may not meet all timing specifications for up to 250 µs.
Output Bus
Each receive channel presents a 10-bit data signal (and a
BIST status signal when RXBISTx[1:0] = 10).
Receive BIST Operation
Each receiver channel contains an internal pattern checker
that can be used to validate both device and link operation.
These pattern checkers are enabled by the associated
RXBISTx[1:0] latch via the device configuration interface.
When enabled, a register in the associated receive channel
becomes a signature pattern generator and checker by
Page 12 of 26
PRELIMINARY
logically converting to a Linear Feedback Shift Register
(LFSR). This LFSR generates a 511-character sequence. This
provides a predictable yet pseudo-random sequence that can
be matched to an identical LFSR in the attached Transmitter(s). When synchronized with the received data stream,
the associated Receiver checks each character from the
deserializer with each character generated by the LFSR and
indicates compare errors and BIST status at the RXDx[1:0]
and BISTSTx bits of the Output Register.
CYV15G0404RB
Following a device reset, it is necessary to enable the receive
channels used for normal operation. This can be done by
sequencing the appropriate values on the device configuration
interface.[3]
Device Configuration and Control Interface
A device reset (RESET sampled LOW) presets the BIST
Enable Latches to disable BIST on all channels.
The CYV15G0404RB is highly configurable via the configuration interface. The configuration interface allows the device
to be configured globally or allows each channel to be
configured independently. Table 3 lists the configuration
latches within the device including the initialization value of the
latches upon the assertion of RESET. Table 4 shows how the
latches are mapped in the device. Each row in the Table 4
maps to a 8-bit latch bank. There are 16 such write-only latch
banks. When WREN = 0, the logic value in the DATA[7:0] is
latched to the latch bank specified by the values in ADDR[3:0].
The second column of Table 4 specifies the channels
associated with the corresponding latch bank. For example,
the first three latch banks (0,1 and 2) consist of configuration
bits for channel A. The latch banks 12, 13 and 14 consist of
Global configuration bits and the last latch bank (15) is the
Mask latch bank that can be configured to perform bit-by-bit
configuration.
BIST Status State Machine
Global Enable Function
When a receive path is enabled to look for and compare the
received data stream with the BIST pattern, the {BISTSTx,
RXDx[0], RXDx[1]} bits identify the present state of the BIST
compare operation.
The global enable function, controlled by the GLENx bits, is a
feature that can be used to reduce the number of write operations needed to setup the latch banks. This function is
beneficial in systems that use a common configuration in
multiple channels. The GLENx bit is present in bit 0 of latch
banks 0 through 11 only. Its default value (1) enables the global
update of the latch bank's contents. Setting the GLENx bit to
0 disables this functionality.
The BIST status bus {BISTSTx, RXDx[0], RXDx[1]} indicates
010b or 100b for one character period per BIST loop to
indicate loop completion. This status can be used to check test
pattern progress.
The specific status reported by the BIST state machine is listed
in Table 5. These same codes are reported on the receive
status outputs.
If the number of invalid characters received ever exceeds the
number of valid characters by 16, the receive BIST state
machine aborts the compare operations and resets the LFSR
to look for the start of the BIST sequence again.
The BIST state machine has multiple states, as shown in
Figure 2 and Table 5. When the receive PLL detects an out-oflock condition, the BIST state is forced to the Start-of-BIST
state, regardless of the present state of the BIST state
machine. If the number of detected errors ever exceeds the
number of valid matches by greater than 16, the state machine
is forced to the WAIT_FOR_BIST state where it monitors the
receive path for the first character of the next BIST sequence.
Power Control
The CYV15G0404RB supports user control of the powered up
or down state of each transmit and receive channel. The
receive channels are controlled by the RXPLLPDx latch via the
device configuration interface. When RXPLLPDx = 0, the
associated PLL and analog circuitry of the channel is disabled.
The transmit channels are controlled by the OE1x and the
OE2x latches via the device configuration interface. The
reclocker function is controlled by the ROE1x and the ROE2x
latches via the device configuration interface. When a driver is
disabled via the configuration interface, it is internally powered
down to reduce device power. If both serial drivers for a
channel are in this disabled state, the associated internal logic
for that channel is also powered down. When the reclocker
serial drivers are disabled, the reclocker function will be
disabled, but the deserialization logic and parallel outputs will
remain enabled.
Device Reset State
When the CYV15G0404RB is reset by assertion of RESET, all
state machines, counters, and configuration latches in the
device are initialized to a reset state. See Table 3 for the
initialize values of the configuration latches.
Document #: 38-02102 Rev. **
Latch Banks 12, 13, and 14 are used to load values in the
related latch banks in a global manner. A write operation to
latch bank 12 could do a global write to latch banks 0, 3, 6, and
9 depending on the value of GLENx in these latch banks; latch
bank 13 could do a global write to latch banks 1, 4, 7 and 10;
and latch banks 14 could do a global write to latch banks 2, 5,
8 and 11. The GLENx bit cannot be modified by a global write
operation.
Force Global Enable Function
FGLENx forces the global update of the target latch banks, but
does not change the contents of the GLENx bits. If FGLENx =
1 for the associated global channel, FGLENx forces the global
update of the target latch banks.
Mask Function
An additional latch bank (15) is used as a global mask vector
to control the update of the configuration latch banks on a bitby-bit basis. A logic 1 in a bit location allows for the update of
that same location of the target latch bank(s), whereas a logic
0 disables it. The reset value of this latch bank is FFh, thereby
making its use optional by default. The mask latch bank is not
maskable. The FGLEN functionality is not affected by the bit 0
value of the mask latch bank.
Latch Types
There are two types of latch banks: static (S) and dynamic (D).
Each channel is configured by 2 static and 1 dynamic latch
banks. The S type contain those settings that normally do not
change for a given application, whereas the D type controls
Page 13 of 26
PRELIMINARY
the settings that could change during the application's lifetime.
The first and second rows of each channel (address numbers
0, 1, 3, 4, 6, 7, 9, and 10) are the static control latches. The
third row of latches for each channel (address numbers 2, 5,
8, and 11) are the dynamic control latches that are associated
with enabling dynamic functions within the device.
CYV15G0404RB
when ADDR[3:0] is left unchanged with a value of “1110” and
WREN is left asserted. The signals present in DATA[7:0] effectively become global control pins, and for the latch banks 2, 5,
8 and 11.
Static Latch Values
There are some latches in the table that have a static value (ie.
Latch Bank 14 is also useful for those users that do not need
1, 0, or X). The latches that have a ‘1’ or ‘0’ must be configured
the latch-based programmable feature of the device. This
with their corresponding value each time that their associated
latch bank could be used in those applications that do not need
latch bank is configured. The latches that have an ‘X’ are don’t
to modify the default value of the static latch banks, and that
cares and can be configured with any value
can afford a global (i.e., not independent) control of the
dynamic signals. In this case, this feature becomes available
Table 3. Device Configuration and Control Latch Descriptions
Name
RXRATEA
RXRATEB
RXRATEC
RXRATED
Signal Description
Receive Clock Rate Select. The initialization value of the RXRATEx latch = 1. RXRATEx is used to
select the rate of the RXCLKx± clock output.
When RXRATEx = 1, the RXCLKx± clock outputs are complementary clocks that follow the recovered
clock operating at half the character rate. Data for the associated receive channels should be latched
alternately on the rising edge of RXCLKx+ and RXCLKx–.
When RXRATEx = 0, the RXCLKx± clock outputs are complementary clocks that follow the recovered
clock operating at the character rate. Data for the associated receive channels should be latched on the
rising edge of RXCLKx+ or falling edge of RXCLKx–.
SDASEL1A[1:0]
SDASEL1B[1:0]
SDASEL1C[1:0]
SDASEL1D[1:0]
Primary Serial Data Input Signal Detector Amplitude Select. The initialization value of the
SDASEL1x[1:0] latch = 10. SDASEL1x[1:0] selects the trip point for the detection of a valid signal for the
INx1± Primary Differential Serial Data Inputs.
When SDASEL1x[1:0] = 00, the Analog Signal Detector is disabled.
When SDASEL1x[1:0] = 01, the typical p-p differential voltage threshold level is 140mV.
When SDASEL1x[1:0] = 10, the typical p-p differential voltage threshold level is 280mV.
When SDASEL1x[1:0] = 11, the typical p-p differential voltage threshold level is 420mV.
SDASEL2A[1:0]
SDASEL2B[1:0]
SDASEL2C[1:0]
SDASEL2D[1:0]
Secondary Serial Data Input Signal Detector Amplitude Select. The initialization value of the
SDASEL2x[1:0] latch = 10. SDASEL2x[1:0] selects the trip point for the detection of a valid signal for the
INx2± Secondary Differential Serial Data Inputs.
When SDASEL2x[1:0] = 00, the Analog Signal Detector is disabled
When SDASEL2x[1:0] = 01, the typical p-p differential voltage threshold level is 140mV.
When SDASEL2x[1:0] = 10, the typical p-p differential voltage threshold level is 280mV.
When SDASEL2x[1:0] = 11, the typical p-p differential voltage threshold level is 420mV.
TRGRATEA
TRGRATEB
TRGRATEC
TRGRATED
Training Clock Rate Select. The initialization value of the TRGRATEx latch = 0. TRGRATEx is used to
select the clock multiplier for the training clock input to the associated CDR PLL. When TRGRATEx =
0, the associated TRGCLKx± input is not multiplied before it is passed to the CDR PLL. When TRGRATEx
= 1, the TRGCLKx± input is multiplied by 2 before it is passed to the CDR PLL. TRGRATEx = 1 and
SPDSELx = LOW is an invalid state and this combination is reserved.
RXPLLPDA
RXPLLPDB
RXPLLPDC
RXPLLPDD
Receive Channel Enable. The initialization value of the RXPLLPDx latch = 0. RXPLLPDx selects if the
associated receive channel is enabled or powered-down. When RXPLLPDx = 0, the associated receive
PLL and analog circuitry are powered-down. When RXPLLPDx = 1, the associated receive PLL and
analog circuitry are enabled.
RXBISTA[1:0]
RXBISTB[1:0]
RXBISTC[1:0]
RXBISTD[1:0]
Receive Bist Disable / SMPTE Receive Enable. The initialization value of the RXBISTx[1:0] latch =
11. For SMPTE data reception, RXBISTx[1:0] should not remain in this initialization state (11).
RXBISTx[1:0] selects if receive BIST is disabled or enabled and sets the associated channel for SMPTE
data reception. When RXBISTx[1:0] = 01, the receiver BIST function is disabled and the associated
channel is set to receive SMPTE data. When RXBISTx[1:0] = 10, the receive BIST function is enabled
and the associated channel is set to receive BIST data. RXBISTx[1:0] = 00 and RXBISTx[1:0] = 11 are
invalid states.
ROE2A
ROE2B
ROE2C
ROE2D
Reclocker Secondary Differential Serial Data Output Driver Enable. The initialization value of the
ROE2x latch = 0. ROE2x selects if the ROUT2± secondary differential output drivers are enabled or
disabled. When ROE2x = 1, the associated serial data output driver is enabled allowing data to be
transmitted from the transmit shifter. When ROE2x = 0, the associated serial data output driver is
disabled. When a driver is disabled via the configuration interface, it is internally powered down to reduce
device power. If both serial drivers for a channel are in this disabled state, the associated internal logic
for that channel is also powered down. A device reset (RESET sampled LOW) disables all output drivers.
Document #: 38-02102 Rev. **
Page 14 of 26
PRELIMINARY
CYV15G0404RB
Table 3. Device Configuration and Control Latch Descriptions (continued)
ROE1A
ROE1B
ROE1C
ROE1D
Reclocker Primary Differential Serial Data Output Driver Enable. The initialization value of the
ROE1x latch = 0. ROE1x selects if the ROUT1± primary differential output drivers are enabled or
disabled. When ROE1x = 1, the associated serial data output driver is enabled allowing data to be
transmitted from the transmit shifter. When ROE1x = 0, the associated serial data output driver is
disabled. When a driver is disabled via the configuration interface, it is internally powered down to reduce
device power. If both serial drivers for a channel are in this disabled state, the associated internal logic
for that channel is also powered down. A device reset (RESET sampled LOW) disables all output drivers.
GLEN[11..0]
Global Enable. The initialization value of the GLENx latch = 1. The GLENx is used to reconfigure several
channels simultaneously in applications where several channels may have the same configuration.
When GLENx = 1 for a given address, that address is allowed to participate in a global configuration.
When GLENx = 0 for a given address, that address is disabled from participating in a global configuration.
FGLEN[2..0]
Force Global Enable. The initialization value of the FGLENx latch is NA. The FGLENx latch forces a
GLobal ENable no matter what the setting is on the GLENx latch. If FGLENx = 1 for the associated
Global channel, FGLEN forces the global update of the target latch banks.
Device Configuration Strategy
The following is a series of ordered events needed to load the
configuration latches on a per channel basis:
1. Pulse RESET Low after device power-up. This operation
resets all four channels.
2. Set the static latch banks for the target channel. May be
performed using a global operation, if the application
Document #: 38-02102 Rev. **
permits it. [Optional step if the default settings match the
desired configuration.]
3. Set the dynamic bank of latches for the target channel.
Enable the Receive PLLs and set each channel for SMPTE
data reception (RXBISTx[1:0] = 01) or BIST data reception
(RXBISTx[1:0] = 10). May be performed using a global
operation, if the application permits it. [Required step.]
Page 15 of 26
CYV15G0404RB
PRELIMINARY
Table 4. Device Control Latch Configuration Table
ADDR Channel Type
DATA7
DATA6
DATA5
DATA4
DATA3
DATA2
DATA1
DATA0
Reset
Value
0
(0000b)
A
S
1
0
X
X
0
0
RXRATEA
GLEN0
10111111
1
(0001b)
A
S
SDASEL2A[1]
SDASEL2A[0]
SDASEL1A[1]
SDASEL1A[0]
X
X
TRGRATEA
GLEN1
10101101
2
(0010b)
A
D
RXBISTA[1]
RXPLLPDA
RXBISTA[0]
X
ROE2A
ROE1A
X
GLEN2
10110011
3
(0011b)
B
S
1
0
X
X
0
0
RXRATEB
GLEN3
10111111
4
(0100b)
B
S
SDASEL2B[1]
SDASEL2B[0]
SDASEL1B[1]
SDASEL1B[0]
X
X
TRGRATEB
GLEN4
10101101
5
(0101b)
B
D
RXBISTB[1]
RXPLLPDB
RXBISTB[0]
X
ROE2B
ROE1B
X
GLEN5
10110011
6
(0110b)
C
S
1
0
X
X
0
0
RXRATEC
GLEN6
10111111
7
(0111b)
C
S
SDASEL2C[1]
SDASEL2C[0]
SDASEL1C[1]
SDASEL1C[0]
X
X
TRGRATEC
GLEN7
10101101
8
(1000b)
C
D
RXBISTC[1]
RXPLLPDC
RXBISTC[0]
X
ROE2C
ROE1C
X
GLEN8
10110011
9
(1001b)
D
S
1
0
X
X
0
0
RXRATED
GLEN9
10111111
10
(1010b)
D
S
SDASEL2D[1]
SDASEL2D[0]
SDASEL1D[1]
SDASEL1D[0]
X
X
TRGRATED
GLEN10
10101101
11
(1011b)
D
D
RXBISTD[1]
RXPLLPDD
RXBISTD[0]
X
ROE2D
ROE1D
X
GLEN11
10110011
12
GLOBAL
(1100b)
S
1
0
X
X
0
0
RXRATEGL
FGLEN0
N/A
13
GLOBAL
(1101b)
S
X
X
TRGRATEGL
FGLEN1
N/A
14
GLOBAL
(1110b)
D
RXBISTGL[1]
RXPLLPDGL
RXBISTGL[0]
X
ROE2GL
ROE1GL
X
FGLEN2
N/A
15
(1111b)
D
D7
D6
D5
D4
D3
D2
D1
D0
11111111
MASK
SDASEL2GL[1] SDASEL2GL[0] SDASEL1GL[1] SDASEL1GL[0]
JTAG Support
3-Level Select Inputs
The CYV15G0404RB contains a JTAG port to allow system
level diagnosis of device interconnect. Of the available JTAG
modes, boundary scan, and bypass are supported. This
capability is present only on the LVTTL inputs and outputs and
the TRGCLKx± clock input. The high-speed serial inputs and
outputs are not part of the JTAG test chain.
Each 3-Level select inputs reports as two bits in the scan
register. These bits report the LOW, MID, and HIGH state of
the associated input as 00, 10, and 11 respectively
JTAG ID
The JTAG device ID for the CYV15G0404RB is ‘0C811069’x.
Table 5. Receive BIST Status Bits
Description
{BISTSTx, RXDx[0],
RXDx[1]}
000, 001
Receive BIST Status
(Receive BIST = Enabled)
BIST Data Compare. Character compared correctly.
010
BIST Last Good. Last Character of BIST sequence detected and valid.
011
Reserved.
100
BIST Last Bad. Last Character of BIST sequence detected invalid.
101
BIST Start. Receive BIST is enabled on this channel, but character compares have not yet
commenced. This also indicates a PLL Out of Lock condition.
110
BIST Error. While comparing characters, a mismatch was found in one or more of the character bits.
111
BIST Wait. The receiver is comparing characters. but has not yet found the start of BIST character to
enable the LFSR.
Document #: 38-02102 Rev. **
Page 16 of 26
CYV15G0404RB
PRELIMINARY
Monitor Data
Received
Receive BIST
{BISTSTx, RXDx[0], Detected LOW
RXDx[1]} =
BIST_START (101)
RX PLL
Out of Lock
{BISTSTx, RXDx[0], RXDx[1]} =
BIST_WAIT (111)
Start of
BIST Detected
No
Yes, {BISTSTx, RXDx[0], RXDx[1]} =
BIST_DATA_COMPARE (000, 001)
Compare
Next Character
Mismatch
Yes
Match
Auto-Abort
Condition
{BISTSTx, RXDx[0], RXDx[1]} =
BIST_DATA_COMPARE (000, 001)
No
End-of-BIST
State
End-of-BIST
State
Yes, {BISTSTx, RXDx[0], RXDx[1]} =
BIST_LAST_BAD (100)
Yes, {BISTSTx, RXDx[0], RXDx[1]} =
BIST_LAST_GOOD (010)
No
No, {BISTSTx, RXDx[0], RXDx[1]} =
BIST_ERROR (110)
Figure 2. Receive BIST State Machine
Document #: 38-02102 Rev. **
Page 17 of 26
CYV15G0404RB
PRELIMINARY
Maximum Ratings
Above which the useful life may be impaired. User guidelines
only, not tested
Static Discharge Voltage.......................................... > 2000 V
(per MIL-STD-883, Method 3015)
Latch-up Current..................................................... > 200 mA
Storage Temperature .................................. –65°C to +150°C
Power-up Requirements
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
The CYV15G0404RB requires one power-supply. The Voltage
on any input or I/O pin cannot exceed the power pin during
power-up.
Supply Voltage to Ground Potential ............... –0.5V to +3.8V
DC Voltage Applied to LVTTL Outputs
in High-Z State .......................................–0.5V to VCC + 0.5V
Output Current into LVTTL Outputs (LOW)..................60 mA
DC Input Voltage....................................–0.5V to VCC + 0.5V
Operating Range
Range
Ambient Temperature
VCC
Commercial
0°C to +70°C
+3.3V ±5%
CYV15G0404RB DC Electrical Characteristics
Parameter
Description
LVTTL-compatible Outputs
Output HIGH Voltage
VOHT
Output LOW Voltage
VOLT
Output Short Circuit Current
IOST
IOZL
High-Z Output Leakage Current
LVTTL-compatible Inputs
Input HIGH Voltage
VIHT
VILT
Input LOW Voltage
Input HIGH Current
IIHT
IILT
Input LOW Current
Test Conditions
IOH = − 4 mA, VCC = Min.
IOL = 4 mA, VCC = Min.
VOUT = 0V[6], VCC = 3.3V
VOUT = 0V, VCC
Min.
Unit
0.4
–100
20
V
V
mA
µA
VCC + 0.3
0.8
1.5
+40
–1.5
–40
+200
–200
V
V
mA
µA
mA
µA
µA
µA
2.4
–20
–20
2.0
–0.5
TRGCLKx Input, VIN = VCC
Other Inputs, VIN = VCC
TRGCLKx Input, VIN = 0.0V
Other Inputs, VIN = 0.0V
VIN = VCC
VIN = 0.0V
Max.
Input HIGH Current with internal pull-down
IIHPDT
IILPUT
Input LOW Current with internal pull-up
LVDIFF Inputs: TRGCLKx±
Input Differential Voltage
400
VCC
VDIFF[7]
VIHHP
Highest Input HIGH Voltage
1.2
VCC
Lowest Input LOW voltage
0.0
VCC/2
VILLP
1.0
VCC – 1.2V
VCOMREF[8] Common Mode Range
3-Level Inputs
Three-Level Input HIGH Voltage
Min. ≤ VCC ≤ Max.
0.87 * VCC
VCC
VIHH
Three-Level Input MID Voltage
Min. ≤ VCC ≤ Max.
0.47 * VCC
0.53 * VCC
VIMM
Three-Level Input LOW Voltage
Min. ≤ VCC ≤ Max.
0.0
0.13 * VCC
VILL
Input HIGH Current
VIN = VCC
200
IIHH
Input MID current
VIN = VCC/2
–50
50
IIMM
Input LOW current
VIN = GND
–200
IILL
Differential CML Serial Outputs: ROUTA1±, ROUTA2±, ROUTB1±, ROUTB2±, ROUTC1±, ROUTC2±, ROUTD1±,
ROUTD2±
100Ω differential load
VCC – 0.5
Output HIGH Voltage
VCC – 0.2
VOHC
(Vcc Referenced)
VCC – 0.2
150Ω differential load
VCC – 0.5
Output LOW Voltage
VOLC
100Ω differential load
VCC – 1.4 VCC – 0.7
(VCC Referenced)
VCC – 0.7
150Ω differential load
VCC – 1.4
6.
7.
8.
mV
V
V
V
V
V
V
µA
µA
µA
V
V
V
V
Tested one output at a time, output shorted for less than one second, less than 10% duty cycle.
This is the minimum difference in voltage between the true and complement inputs required to ensure detection of a logic-1 or logic-0. A logic-1 exists when
the true (+) input is more positive than the complement (−) input. A logic-0 exists when the complement (−) input is more positive than true (+) input.
The common mode range defines the allowable range of TRGCLKx+ and TRGCLKx− when TRGCLKx+ = TRGCLKx−. This marks the zero-crossing between
the true and complement inputs as the signal switches between a logic-1 and a logic-0.
Document #: 38-02102 Rev. **
Page 18 of 26
CYV15G0404RB
PRELIMINARY
CYV15G0404RB DC Electrical Characteristics (continued)
Parameter
VODIF
Description
Output Differential Voltage
|(OUT+) − (OUT−)|
Test Conditions
Min.
100Ω differential load
450
150Ω differential load
560
Differential Serial Line Receiver Inputs: INA1±, INA2±, INB1±, INB2±, INC1±, INC2±, IND1±, IND2±
Input Differential Voltage |(IN+) − (IN−)|
100
VDIFFs[7]
Highest Input HIGH Voltage
VIHE
VILE
Lowest Input LOW Voltage
VCC – 2.0
Input HIGH Current
VIN = VIHE Max.
IIHE
Input LOW Current
VIN = VILE Min.
–700
IILE
VICOM[9]
Common Mode input range
((VCC – 2.0V)+0.5)min,
+1.25
(VCC – 0.5V) max.
Power Supply
Typ.
Max Power Supply Current
TRGCLKx Commercial
910
ICC [10,11]
= MAX
Industrial
Typical Power Supply Current
TRGCLKx Commercial
900
ICC [10,11]
= 125 MHz Industrial
Max.
900
1000
Unit
mV
mV
1200
VCC
+3.1
mV
V
V
µA
µA
V
Max.
1270
1320
1270
1320
mA
mA
mA
mA
1350
AC Test Loads and Waveforms
3.3V
RL = 100Ω
R1
R1 = 590Ω
R2 = 435Ω
CL
CL ≤ 7 pF
(Includes fixture and
probe capacitance)
(Includes fixture and
probe capacitance)
R2
(a) LVTTL Output Test Load
(b) CML Output Test Load
Vth = 1.4V
GND
2.0V
0.8V
0.8V
Note 12
Note 12
3.0V
2.0V
RL
VIHE
VIHE
Vth = 1.4V
VILE
≤ 1 ns
≤ 1 ns
(c) LVTTL Input Test Waveform
Note 13
80%
80%
20%
≤ 270 ps
20%
VILE
≤ 270 ps
(d) CML/LVPECL Input Test Waveform
CYV15G0404RB AC Electrical Characteristics
Parameter
Description
Min.
Max
Unit
CYV15G0404RB Receiver LVTTL Switching Characteristics Over the Operating Range
fRS
RXCLKx± Clock Output Frequency
9.75
150
MHz
tRXCLKP
RXCLKx± Period = 1/fRS
6.66
102.56
ns
tRXCLKD
RXCLKx± Duty Cycle Centered at 50% (Full Rate and Half Rate)
–1.0
+1.0
ns
tRXCLKR [14]
RXCLKx± Rise Time
0.3
1.2
ns
tRXCLKF [14]
RXCLKx± Fall Time
0.3
1.2
ns
tRXDv–[18]
Status and Data Valid Time to RXCLKx± (RXRATEx = 0) (Full Rate)
5UI–1.8[19]
ns
Status and Data Valid Time to RXCLKx± (RXRATEx = 1) (Half Rate)
5UI–1.3[19]
ns
Notes:
9. The common mode range defines the allowable range of INPUT+ and INPUT− when INPUT+ = INPUT−. This marks the zero-crossing between the true and
complement inputs as the signal switches between a logic-1 and a logic-0.
10. Maximum ICC is measured with VCC = MAX, TA = 25°C, with all channels and Serial Line Drivers enabled, sending a continuous alternating 01 pattern, and
outputs unloaded.
11. Typical ICC is measured under similar conditions except with VCC = 3.3V, TA = 25°C, with all channels enabled and one Serial Line Driver per transmit channel
sending a continuous alternating 01 pattern. The redundant outputs on each channel are powered down and the parallel outputs are unloaded.
12. Cypress uses constant current (ATE) load configurations and forcing functions. This figure is for reference only.
13. The LVTTL switching threshold is 1.4V. All timing references are made relative to where the signal edges cross the threshold voltage.
14. Tested initially and after any design or process changes that may affect these parameters, but not 100% tested.
Document #: 38-02102 Rev. **
Page 19 of 26
CYV15G0404RB
PRELIMINARY
CYV15G0404RB AC Electrical Characteristics (continued)
Parameter
tRXDv+[18]
Description
Min.
Status and Data Valid Time to RXCLKx± (RXRATEx = 0)
5UI–1.7[19]
Status and Data Valid Time to RXCLKx± (RXRATEx = 1)
5UI–2.1[19]
Max
Unit
ns
ns
fROS
RECLKOx Clock Frequency
19.5
150
MHz
tRECLKO
RECLKOx Period=1/fROS
6.66
51.28
ns
tRECLKOD
RECLKOx Duty Cycle centered at 60% HIGH time
-1.9
0
ns
19.5
150
MHz
51.28
CYV15G0404RB TRGCLKx Switching Characteristics Over the Operating Range
fTRG
TRGCLKx Clock Frequency
TRGCLK
TRGCLKx Period = 1/fREF
6.6
tTRGH
TRGCLKx HIGH Time (TXRATEx = 1)(Half Rate)
5.9
TRGCLKx HIGH Time (TXRATEx = 0)(Full Rate)
2.9[14]
ns
TRGCLKx LOW Time (TXRATEx = 1)(Half Rate)
5.9
ns
TRGCLKx LOW Time (TXRATEx = 0)(Full Rate)
2.9[14]
tTRGL
tTRGD[20]
tTRGR
[14, 15, 16,
17]
TRGCLKx Duty Cycle
30
TRGCLKx Rise Time (20%–80%)
tTRGF[14, 15, 16, 17] TRGCLKx Fall Time (20%–80%)
tTRGRX[21]
TRGCLKx Frequency Referenced to Received Clock Frequency
–0.15
ns
ns
ns
70
%
2
ns
2
ns
+0.15
%
CYV15G0404RB Bus Configuration Write Timing Characteristics Over the Operating Range
tDATAH
Bus Configuration Data Hold
0
ns
tDATAS
Bus Configuration Data Setup
10
ns
tWRENP
Bus Configuration WREN Pulse Width
10
ns
CYV15G0404RB JTAG Test Clock Characteristics Over the Operating Range
fTCLK
JTAG Test Clock Frequency
tTCLK
JTAG Test Clock Period
20
MHz
50
ns
30
ns
CYV15G0404RB Device RESET Characteristics Over the Operating Range
tRST
Device RESET Pulse Width
CYV15G0404RB Reclocker Serial Output Characteristics Over the Operating Range
Parameter
Description
tB
Bit Time
tRISE[14]
CML Output Rise Time 20−80% (CML Test Load)
tFALL[14]
CML Output Fall Time 80−20% (CML Test Load)
Condition
Min.
Max.
Unit
5128
660
ps
SPDSELx = HIGH
50
270
ps
SPDSELx = MID
100
500
ps
SPDSELx =LOW
180
1000
ps
SPDSELx = HIGH
50
270
ps
SPDSELx = MID
100
500
ps
SPDSELx =LOW
180
1000
ps
Notes:
15. The ratio of rise time to falling time must not vary by greater than 2:1.
16. For a given operating frequency, neither rise or fall specification can be greater than 20% of the clock-cycle period or the data sheet maximum time.
17. All transmit AC timing parameters measured with 1ns typical rise time and fall time.
18. Parallel data output specifications are only valid if all outputs are loaded with similar DC and AC loads.
19. Receiver UI (Unit Interval) is calculated as 1/(fTRG * 20) (when TRGRATEx = 1) or 1/(fTRG * 10) (when TRGRATEx = 0). In an operating link this is equivalent to tB.
20. The duty cycle specification is a simultaneous condition with the tREFH and tREFL parameters. This means that at faster character rates the TRGCLKx± duty
cycle cannot be as large as 30%–70%.
21. TRGCLKx± has no phase or frequency relationship with the recovered clock(s) and only acts as a centering reference to reduce clock synchronization time.
TRGCLKx± must be within ±1500 PPM (±0.15%) of the transmitter PLL reference (REFCLKx±) frequency. Although transmitting to a HOTLink II receiver channel
necessitates the frequency difference between the transmitter and receiver reference clocks to be within ±1500-PPM, the stability of the crystal needs to be
within the limits specified by the appropriate standard when transmitting to a remote receiver that is compliant to that standard.
Document #: 38-02102 Rev. **
Page 20 of 26
CYV15G0404RB
PRELIMINARY
PLL Characteristics
Parameter
Description
Condition
Min
.
Typ.
Max.
Unit
CYV15G0404RB Reclocker Output PLL Characteristics
tJRGENSD[14, 22]
Reclocker Jitter Generation - SD Data Rate
TRGCLKx = 27 MHz
133
ps
tJRGENHD[14, 22]
Reclocker Jitter Generation - HD Data Rate
TRGCLKx = 148.5
MHz
107
ps
CYV15G0404RB Receive PLL Characteristics Over the Operating Range
tRXLOCK
tRXUNLOCK
Receive PLL lock to input data stream (cold start)
376k
UI
Receive PLL lock to input data stream
376k
UI
46
UI
Receive PLL Unlock Rate
Capacitance [14]
Parameter
Description
Test Conditions
Max.
Unit
CINTTL
TTL Input Capacitance
TA = 25°C, f0 = 1 MHz, VCC = 3.3V
7
pF
CINPECL
PECL input Capacitance
TA = 25°C, f0 = 1 MHz, VCC = 3.3V
4
pF
Switching Waveforms for the CYV15G0404RB HOTLink II Receiver
Receive Interface
Read Timing
tRXCLKP
RXRATEx = 0
RXCLKx+
RXCLKx-
tRXDV–
RXDx[9:0]
tRXDV+
Receive Interface
Read Timing
tRXCLKP
RXRATEx = 1
RXCLKx+
RXCLKx-
tRXDV–
RXDx[9:0]
tRXDV+
Notes:
22. Receiver input stream is BIST data from the transmit channel. This data is reclocked and output to a wide-bandwidth digital sampling oscilloscope. The
measurement was recorded after 10,000 histogram hits, time referenced to REFCLKx± of the transmit channel.
Document #: 38-02102 Rev. **
Page 21 of 26
CYV15G0404RB
PRELIMINARY
CYV15G0404RB HOTLink II Bus Configuration Switching Waveforms
Bus Configuration
Write Timing
ADDR[3:0]
DATA[7:0]
tWRENP
WREN
Document #: 38-02102 Rev. **
tDATAS
tDATAH
Page 22 of 26
CYV15G0404RB
PRELIMINARY
Table 6. Package Coordinate Signal Allocation
Ball
ID
Signal Name
Signal Type
Ball
ID
Signal Name
Signal Type
Ball
ID
Signal Name
Signal Type
A01
INC1–
CML IN
C07
ULCC
LVTTL IN PU
F17
VCC
POWER
A02
ROUTC1–
CML OUT
C08
GND
GROUND
F18
RXDB[0]
LVTTL OUT
A03
INC2–
CML IN
C09
DATA[7]
LVTTL IN PU
F19
RECLKOB
LVTTL OUT
A04
ROUTC2–
CML OUT
C10
DATA[5]
LVTTL IN PU
F20
RXDB[1]
LVTTL OUT
A05
VCC
POWER
C11
DATA[3]
LVTTL IN PU
G01
GND
GROUND
A06
IND1–
CML IN
C12
DATA[1]
LVTTL IN PU
G02
WREN
LVTTL IN PU
A07
ROUTD1–
CML OUT
C13
GND
GROUND
G03
GND
GROUND
A08
GND
GROUND
C14
VCC
POWER
G04
GND
GROUND
A09
IND2–
CML IN
C15
SPDSELD
3-LEVEL SEL
G17
SPDSELB
3-LEVEL SEL
A10
ROUTD2–
CML OUT
C16
VCC
POWER
G18
NC
NO CONNECT
A11
INA1–
CML IN
C17
LDTDEN
LVTTL IN PU
G19
SPDSELA
3-LEVEL SEL
A12
ROUTA1–
CML OUT
C18
TRST
LVTTL IN PU
G20
RXDB[3]
LVTTL OUT
A13
GND
GROUND
C19
GND
GROUND
H01
GND
GROUND
A14
INA2–
CML IN
C20
TDO
LVTTL 3-S OUT
H02
GND
GROUND
A15
ROUTA2–
CML OUT
D01
TCLK
LVTTL IN PD
H03
GND
GROUND
A16
VCC
POWER
D02
RESET
LVTTL IN PU
H04
GND
GROUND
A17
INB1–
CML IN
D03
INSELD
LVTTL IN
H17
GND
GROUND
A18
ROUTB1–
CML OUT
D04
INSELA
LVTTL IN
H18
GND
GROUND
A19
INB2–
CML IN
D05
VCC
POWER
H19
GND
GROUND
A20
ROUTB2–
CML OUT
D06
ULCA
LVTTL IN PU
H20
GND
GROUND
B01
INC1+
CML IN
D07
SPDSELC
3-LEVEL SEL
J01
GND
GROUND
B02
ROUTC1+
CML OUT
D08
GND
GROUND
J02
GND
GROUND
B03
INC2+
CML IN
D09
DATA[6]
LVTTL IN PU
J03
GND
GROUND
B04
ROUTC2+
CML OUT
D10
DATA[4]
LVTTL IN PU
J04
GND
GROUND
B05
VCC
POWER
D11
DATA[2]
LVTTL IN PU
J17
BISTSTB
LVTTL OUT
B06
IND1+
CML IN
D12
DATA[0]
LVTTL IN PU
J18
RXDB[2]
LVTTL OUT
B07
ROUTD1+
CML OUT
D13
GND
GROUND
J19
RXDB[7]
LVTTL OUT
B08
GND
GROUND
D14
GND
GROUND
J20
RXDB[4]
LVTTL OUT
B09
IND2+
CML IN
D15
ULCB
LVTTL IN PU
K01
RXDC[4]
LVTTL OUT
B10
ROUTD2+
CML OUT
D16
VCC
POWER
K02
TRGCLKC–
PECL IN
B11
INA1+
CML IN
D17
NC
NO CONNECT
K03
GND
GROUND
B12
ROUTA1+
CML OUT
D18
VCC
POWER
K04
GND
GROUND
B13
GND
GROUND
D19
SCANEN2
LVTTL IN PD
K17
RXDB[5]
LVTTL OUT
B14
INA2+
CML IN
D20
TMEN3
LVTTL IN PD
K18
RXDB[6]
LVTTL OUT
B15
ROUTA2+
CML OUT
E01
VCC
POWER
K19
RXDB[9]
LVTTL OUT
B16
VCC
POWER
E02
VCC
POWER
K20
LFIB
LVTTL OUT
B17
INB1+
CML IN
E03
VCC
POWER
L01
RXDC[5]
LVTTL OUT
B18
ROUTB1+
CML OUT
E04
VCC
POWER
L02
TRGCLKC+
PECL IN
B19
INB2+
CML IN
E17
VCC
POWER
L03
LFIC
LVTTL OUT
B20
ROUTB2+
CML OUT
E18
VCC
POWER
L04
GND
GROUND
C01
TDI
LVTTL IN PU
E19
VCC
POWER
L17
RXDB[8]
LVTTL OUT
C02
TMS
LVTTL IN PU
E20
VCC
POWER
L18
RXCLKB+
LVTTL OUT
C03
INSELC
LVTTL IN
F01
RXDC[8]
LVTTL OUT
L19
RXCLKB–
LVTTL OUT
Document #: 38-02102 Rev. **
Page 23 of 26
CYV15G0404RB
PRELIMINARY
Table 6. Package Coordinate Signal Allocation (continued)
Ball
ID
Signal Name
Signal Type
Ball
ID
Signal Name
Signal Type
Ball
ID
Signal Name
Signal Type
C04
INSELB
LVTTL IN
F02
RXDC[9]
LVTTL OUT
L20
GND
GROUND
C05
VCC
POWER
F03
VCC
POWER
M01
RXDC[6]
LVTTL OUT
C06
ULCD
LVTTL IN PU
F04
VCC
POWER
M02
RXDC[7]
LVTTL OUT
M03
VCC
POWER
U03
VCC
POWER
W03
LFID
LVTTL OUT
M04
REPDOC
LVTTL OUT
U04
VCC
POWER
W04
RXCLKD–
LVTTL OUT
M17
TRGCLKB+
PECL IN
U05
VCC
POWER
W05
VCC
POWER
M18
TRGCLKB–
PECL IN
U06
RXDD[4]
LVTTL OUT
W06
RXDD[6]
LVTTL OUT
M19
REPDOB
LVTTL OUT
U07
RXDD[3]
LVTTL OUT
W07
RXDD[0]
LVTTL OUT
M20
GND
GROUND
U08
GND
GROUND
W08
GND
GROUND
N01
GND
GROUND
U09
GND
GROUND
W09
ADDR [3]
LVTTL IN PU
N02
GND
GROUND
U10
ADDR [0]
LVTTL IN PU
W10
ADDR [1]
LVTTL IN PU
N03
GND
GROUND
U11
TRGCLKD–
PECL IN
W11
RXCLKA+
LVTTL OUT
N04
GND
GROUND
U12
GND
GROUND
W12
REPDOA
LVTTL OUT
N17
GND
GROUND
U13
GND
GROUND
W13
GND
GROUND
N18
GND
GROUND
U14
GND
GROUND
W14
GND
GROUND
N19
GND
GROUND
U15
VCC
POWER
W15
VCC
POWER
N20
GND
GROUND
U16
VCC
POWER
W16
VCC
POWER
P01
RXDC[3]
LVTTL OUT
U17
RXDA[4]
LVTTL OUT
W17
LFIA
LVTTL OUT
P02
RXDC[2]
LVTTL OUT
U18
VCC
POWER
W18
TRGCLKA+
PECL IN
P03
RXDC[1]
LVTTL OUT
U19
BISTSTA
LVTTL OUT
W19
RXDA[6]
LVTTL OUT
P04
RXDC[0]
LVTTL OUT
U20
RXDA[0]
LVTTL OUT
W20
RXDA[3]
LVTTL OUT
P17
GND
GROUND
V01
VCC
POWER
Y01
VCC
POWER
P18
GND
GROUND
V02
VCC
POWER
Y02
VCC
POWER
P19
GND
GROUND
V03
VCC
POWER
Y03
RXDD[9]
LVTTL OUT
P20
GND
GROUND
V04
RXDD[8]
LVTTL OUT
Y04
RXCLKD+
LVTTL OUT
R01
BISTSTC
LVTTL OUT
V05
VCC
POWER
Y05
VCC
POWER
R02
RECLKOC
LVTTL OUT
V06
RXDD[5]
LVTTL OUT
Y06
RXDD[7]
LVTTL OUT
R03
RXCLKC+
LVTTL OUT
V07
RXDD[1]
LVTTL OUT
Y07
RXDD[2]
LVTTL OUT
R04
RXCLKC–
LVTTL OUT
V08
GND
GROUND
Y08
GND
GROUND
R17
VCC
POWER
V09
BISTSTD
LVTTL OUT
Y09
RECLKOD
LVTTL OUT
R18
VCC
POWER
V10
ADDR [2]
LVTTL IN PU
Y10
NC
NO CONNECT
R19
VCC
POWER
V11
TRGCLKD+
PECL IN
Y11
GND
GROUND
R20
VCC
POWER
V12
RECLKOA
LVTTL OUT
Y12
RXCLKA–
LVTTL OUT
T01
VCC
POWER
V13
GND
GROUND
Y13
GND
GROUND
T02
VCC
POWER
V14
GND
GROUND
Y14
GND
GROUND
T03
VCC
POWER
V15
VCC
POWER
Y15
VCC
POWER
T04
VCC
POWER
V16
VCC
POWER
Y16
VCC
POWER
T17
VCC
POWER
V17
RXDA[9]
LVTTL OUT
Y17
REPDOD
LVTTL OUT
T18
VCC
POWER
V18
RXDA[5]
LVTTL OUT
Y18
TRGCLKA–
PECL IN
T19
VCC
POWER
V19
RXDA[2]
LVTTL OUT
Y19
RXDA[8]
LVTTL OUT
T20
VCC
POWER
V20
RXDA[1]
LVTTL OUT
Y20
RXDA[7]
LVTTL OUT
U01
VCC
POWER
W01
VCC
POWER
U02
VCC
POWER
W02
VCC
POWER
Document #: 38-02102 Rev. **
Page 24 of 26
CYV15G0404RB
PRELIMINARY
Ordering Information
Speed
Standard
Ordering Code
CYV15G0404RB-BGC
Package Name
BL256
Package Type
256-Ball Thermally Enhanced Ball Grid Array
Operating
Range
Commercial
Package Diagram
256-Lead L2 Ball Grid Array (27 x 27 x 1.57 mm) BL256
51-85123-*E
HOTLink is a registered trademark and HOTLink II is a trademark of Cypress Semiconductor. All product and company names
mentioned in this document may be the trademarks of their respective holders.
Document #: 38-02102 Rev. **
Page 25 of 26
© Cypress Semiconductor Corporation, 2004. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be
used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its
products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress
products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges
PRELIMINARY
CYV15G0404RB
Document History Page
Document Title: CYV15G0404RB Independent Clock Quad HOTLink II™ Deserializing Reclocker
Document Number: 38-02102
REV.
ECN NO.
ISSUE
DATE
ORIG. OF
CHANGE
**
246850
See ECN
FRE
Document #: 38-02102 Rev. **
DESCRIPTION OF CHANGE
New Data Sheet
Page 26 of 26