CYPRESS CY62148E_11

CY62148E MoBL®
4-Mbit (512 K × 8) Static RAM
4-Mbit (512 K × 8) Static RAM
Features
Functional Description
■
Very high speed: 45 ns
The CY62148E is a high performance CMOS static RAM
organized as 512 K words by 8-bits. This device features
advanced circuit design to provide ultra low active current. This
is ideal for providing More Battery Life™ (MoBL) in portable
applications such as cellular telephones. The device also has an
automatic power-down feature that significantly reduces power
consumption when addresses are not toggling. Placing the
device into standby mode reduces power consumption by more
than 99% when deselected (CE HIGH). The eight input and
output pins (I/O0 through I/O7) are placed in a high impedance
state when the device is deselected (CE HIGH), Outputs are
disabled (OE HIGH), or during an active Write operation (CE
LOW and WE LOW)
■
Voltage range: 4.5 V to 5.5 V
■
Pin compatible with CY62148B
■
Ultra low standby power
❐ Typical standby current: 1 µA
❐ Maximum standby current: 7 µA (Industrial)
■
Ultra low active power
❐ Typical active current: 2.0 mA at f = 1 MHz
■
Easy memory expansion with CE, and OE features
■
Automatic power-down when deselected
■
Complementary metal oxide semiconductor (CMOS) for
optimum speed and power
■
Available in Pb-free 32-pin thin small outline package (TSOP) II
and 32-pin small-outline integrated circuit (SOIC)[1] packages
To write to the device, take Chip Enable (CE) and Write Enable
(WE) inputs LOW. Data on the eight I/O pins (I/O0 through I/O7)
is then written into the location specified on the address pins (A0
through A18).
To read from the device, take Chip Enable (CE) and Output
Enable (OE) LOW while forcing Write Enable (WE) HIGH. Under
these conditions, the contents of the memory location specified
by the address pins appear on the I/O pins.
Logic Block Diagram
I/O00
IO
INPUT BUFFER
I/O1
IO
1
I/O2
IO
2
SENSE AMPS
ROW DECODER
512K x 8
ARRAY
I/O3
IO
3
I/O4
IO
4
I/O5
IO
5
I/O6
IO
6
CE
I/O
IO77
POWER
DOWN
A17
A18
A13
A14
OE
A15
COLUMN DECODER
WE
A16
A0
A1
A2
A3
A4
A5
A6
A7
A8
A9
A10
A11
A12
Note
1. SOIC package is available only in 55 ns speed bin.
Cypress Semiconductor Corporation
Document #: 38-05442 Rev. *I
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised April 21, 2011
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CY62148E MoBL®
Contents
Pin Configuration ............................................................. 3
Product Portfolio .............................................................. 3
Maximum Ratings ............................................................. 4
Operating Range ............................................................... 4
Capacitance ...................................................................... 4
Thermal Resistance .......................................................... 5
Data Retention Characteristics ....................................... 6
Switching Characteristics ................................................ 7
Switching Waveforms ...................................................... 8
Truth Table ........................................................................ 9
Ordering Information ...................................................... 10
Ordering Code Definitions ......................................... 10
Document #: 38-05442 Rev. *I
Package Diagrams .......................................................... 11
Acronyms ........................................................................ 13
Document Conventions ................................................. 13
Units of Measure ....................................................... 13
Document History Page ................................................. 14
Sales, Solutions, and Legal Information ...................... 16
Worldwide Sales and Design Support ....................... 16
Products .................................................................... 16
PSoC Solutions ......................................................... 16
Page 2 of 16
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CY62148E MoBL®
Pin Configuration
Figure 1. 32-pin SOIC/TSOP II Pinout
Top View
A17
A16
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O0
I/O1
I/O2
VSS
1
32
31
2
3
4
30
29
5
6
28
27
26
25
7
8
9
10
24
23
22
11
12
13
14
15
16
21
20
19
18
17
VCC
A15
A18
WE
A13
A8
A9
A11
OE
A10
CE
I/O7
I/O6
I/O5
I/O4
I/O3
Product Portfolio
Power Dissipation
VCC Range (V)
Product
CY62148ELL
TSOP II
CY62148ELL
SOIC
Speed
(ns)
Range
Min
Typ[2]
Max
Industrial
4.5
5.0
5.5
Industrial /
Automotive-A
4.5
5.0
5.5
Operating ICC (mA)
f = 1 MHz
f = fmax
Standby ISB2 (µA)
Typ[2]
Max
Typ[2]
Max
Typ[2]
Max
45
2
2.5
15
20
1
7
55
2
2.5
15
20
1
7
Note
2. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 °C.
Document #: 38-05442 Rev. *I
Page 3 of 16
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CY62148E MoBL®
Maximum Ratings
Exceeding maximum ratings may shorten the useful life of the
device. User guidelines are not tested.
Storage temperature ............................... –65 °C to + 150 °C
Output current into outputs (LOW) .............................. 20 mA
Static discharge voltage........................................... > 2001 V
(per MIL-STD-883, Method 3015)
Latch-up current ......................................................> 200 mA
Ambient temperature with
power applied .......................................... –55 °C to + 125 °C
Operating Range
Supply voltage to
ground potential.................. –0.5 V to 6.0 V (VCCmax + 0.5 V)
Device
DC voltage applied to outputs
in high Z state [3, 4] .............. –0.5 V to 6.0 V (VCCmax + 0.5 V)
Range
CY62148E
Ambient
Temperature
VCC[5]
Industrial /
–40 °C to +85 °C 4.5 V to 5.5 V
Automotive-A
DC input voltage [3, 4] .......... –0.5 V to 6.0 V (VCCmax + 0.5 V)
Electrical Characteristics
Over the operating range
Parameter
Description
Test Conditions
55 ns [6]
45 ns
Unit
Min
Typ[7]
Max
Min
Typ[7]
Max
2.4
–
–
2.4
–
–
V
VOL
Output HIGH voltage IOH = –1 mA
Output LOW voltage IOL = 2.1 mA
–
–
0.4
–
–
0.4
V
VIH
Input HIGH voltage
VCC = 4.5 V to 5.5 V
2.2
–
VCC + 0.5
2.2
–
VCC + 0.5
V
VIL
Input LOW voltage
VCC = 4.5 V to 5.5 V For TSOPII
package
–0.5
–
0.8
–
–
–
V
–
–
–
–0.5
–
0.6[8]
VOH
For SOIC
package
IIX
Input leakage current GND < VI < VCC
–1
–
+1
–1
–
+1
µA
IOZ
Output leakage
current
–1
–
+1
–1
–
+1
µA
ICC
VCC operating supply f = fmax = 1/tRC
current
f = 1 MHz
VCC = VCC(max),
IOUT = 0 mA
CMOS levels
–
15
20
–
15
20
mA
–
2
2.5
–
2
2.5
CE > VCC – 0.2 V, VIN > VCC – 0.2 V
or VIN < 0.2 V, f = 0, VCC = VCC(max)
–
1
7
–
1
7
ISB2 [9]
Automatic CE
power-down current
— CMOS inputs
GND < VO < VCC, output disabled
µA
Capacitance
Parameter[10]
Description
CIN
Input capacitance
COUT
Output capacitance
Test Conditions
TA = 25 °C, f = 1 MHz, VCC = VCC(Typ)
Max
Unit
10
pF
10
pF
Notes
3. VIL(min) = –2.0 V for pulse durations less than 20 ns for I < 30 mA.
4. VIH(max) = VCC + 0.75 V for pulse durations less than 20 ns.
5. Full device AC operation assumes a minimum of 100 µs ramp time from 0 to VCC(min) and 200 µs wait time after VCC stabilization.
6. SOIC package is available only in 55 ns speed bin.
7. Typical values are included for reference and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 °C.
8. Under DC conditions the device meets a VIL of 0.8 V. However, in dynamic conditions Input LOW Voltage applied to the device must not be higher than 0.6 V. This
is applicable to SOIC package only. Refer to AN13470 for details.
9. Chip enable (CE) must be HIGH at CMOS level to meet the ISB2 / ICCDR spec. Other inputs can be left floating.
10. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-05442 Rev. *I
Page 4 of 16
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CY62148E MoBL®
Thermal Resistance
Parameter [11]
Description
JA
Thermal resistance
(junction to ambient)
JC
Thermal resistance
(junction to case)
Test Conditions
32-pin SOIC
Package
32-pin TSOP II
Package
Unit
75
77
C/W
10
13
C/W
Still air, soldered on a 3 × 4.5 inch, two-layer
printed circuit board
Figure 2. AC Test Loads and Waveforms
R1
VCC
OUTPUT
ALL INPUT PULSES
3.0 V
30 pF
INCLUDING
JIG AND
SCOPE
90%
10%
R2
GND
Rise Time = 1 V/ns
Equivalent to:
90%
10%
Fall Time = 1 V/ns
THEVENIN EQUIVALENT
OUTPUT
RTH
V
Parameter [11]
5.0 V
Unit
R1
1800

R2
990

RTH
639

VTH
1.77
V
Note
11. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-05442 Rev. *I
Page 5 of 16
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CY62148E MoBL®
Data Retention Characteristics
Over the operating range
Parameter
Description
Min
Typ[12]
Max
Unit
2
–
–
V
–
1
7
µA
0
–
–
ns
TSOP II
45
–
–
ns
SOIC
55
–
–
ns
Conditions
VDR
VCC for data retention
ICCDR[13]
Data retention current
tCDR
Chip deselect to data retention time
tR[14]
Operation recovery time
VCC = VDR, CE > VCC – 0.2 V,
VIN > VCC – 0.2 V or VIN < 0.2 V
Industrial /
Automotive-A
Figure 3. Data Retention Waveform
DATA RETENTION MODE
VCC
VCC(min)
tCDR
VDR > 2.0 V
VCC(min)
tR
CE
Notes
12. Typical values are included for reference and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 °C.
13. Chip enable (CE) must be HIGH at CMOS level to meet the ISB2 / ICCDR spec. Other inputs can be left floating.
14. Full device operation requires linear VCC ramp from VDR to VCC(min) > 100 µs or stable at VCC(min) > 100 µs.
Document #: 38-05442 Rev. *I
Page 6 of 16
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CY62148E MoBL®
Switching Characteristics
Over the operating range
Parameter [15]
Description
55 ns[16]
45 ns
Min
Max
Min
Max
Unit
Read Cycle
tRC
Read cycle time
45
–
55
–
ns
tAA
Address to data valid
–
45
–
55
ns
tOHA
Data hold from address change
10
–
10
–
ns
tACE
CE LOW to data valid
–
45
–
55
ns
tDOE
OE LOW to data valid
–
22
–
25
ns
5
–
5
–
ns
[17]
tLZOE
OE LOW to low Z
tHZOE
OE HIGH to high Z [17, 18]
–
18
–
20
ns
tLZCE
CE LOW to low Z [17]
10
–
10
–
ns
tHZCE
CE HIGH to high Z [17, 18]
–
18
–
20
ns
tPU
CE LOW to power-up
0
–
0
–
ns
CE HIGH to power-down
–
45
–
55
ns
tWC
Write cycle time
45
–
55
–
ns
tSCE
CE LOW to write end
35
–
40
–
ns
tAW
Address setup to write end
35
–
40
–
ns
tHA
Address hold from write end
0
–
0
–
ns
tSA
Address setup to write start
0
–
0
–
ns
tPWE
WE pulse width
35
–
40
–
ns
tSD
Data setup to write end
25
–
25
–
ns
tHD
Data hold from write end
0
–
0
–
ns
tHZWE
WE LOW to high Z [17, 18]
–
18
–
20
ns
10
–
10
–
ns
tPD
Write
tLZWE
Cycle[19]
WE HIGH to low Z
[17]
Notes
15. Test conditions for all parameters other than tri-state parameters assume signal transition time of 3 ns or less, timing reference levels of 1.5 V, input pulse levels
of 0 to 3 V, and output loading of the specified IOL/IOH as shown in the AC Test Loads and Waveforms on page 5.
16. SOIC package is available only in 55 ns speed bin.
17. At any temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any device.
18. tHZOE, tHZCE, and tHZWE transitions are measured when the outputs enter a high impedance state.
19. The internal wre.ite time of the memory is defined by the overlap of WE, CE = VIL. All signals must be ACTIVE to initiate a write and any of these signals can
terminate a write by going INACTIVE. The data input setup and hold timing should be referenced to the edge of the signal that terminates the write.
Document #: 38-05442 Rev. *I
Page 7 of 16
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CY62148E MoBL®
Switching Waveforms
Figure 4. Read Cycle No. 1 (Address Transition Controlled) [20, 21]
tRC
RC
ADDRESS
tOHA
DATA OUT
tAA
PREVIOUS DATA VALID
DATA VALID
Figure 5. Read Cycle No. 2 (OE Controlled) [21, 22]
ADDRESS
tRC
CE
tACE
OE
tHZOE
tDOE
tHZCE
tLZOE
HIGH IMPEDANCE
DATA OUT
DATA VALID
tLZCE
tPD
tPU
VCC
SUPPLY
CURRENT
HIGH
IMPEDANCE
50%
50%
ICC
ISB
Figure 6. Write Cycle No. 1 (WE Controlled, OE HIGH During Write) [23, 24]
tWC
ADDRESS
tSCE
CE
tAW
tSA
tHA
tPWE
WE
OE
tSD
DATA I/O
NOTE 25
tHD
DATA VALID
tHZOE
Notes
20. Device is continuously selected. OE, CE = VIL.
21. WE is HIGH for read cycles.
22. Address valid before or similar to CE transition LOW.
23. Data I/O is high impedance if OE = VIH.
24. If CE goes HIGH simultaneously with WE HIGH, the output remains in high impedance state.
25. During this period, the I/Os are in output state and input signals must not be applied.
Document #: 38-05442 Rev. *I
Page 8 of 16
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CY62148E MoBL®
Figure 7. Write Cycle No. 2 (CE Controlled) [26, 27]
tWC
ADDRESS
tSCE
CE
tSA
tAW
tHA
tPWE
WE
tSD
DATA I/O
tHD
DATA VALID
Figure 8. Write Cycle No. 3 (WE Controlled, OE LOW) [27]
tWC
ADDRESS
tSCE
CE
tAW
tSA
tHA
tPWE
WE
tSD
NOTE 28
DATA I/O
tHD
DATA VALID
tLZWE
tHZWE
Truth Table
CE
WE
OE
H[29]
X
X
High Z
I/O
Deselect/power-down
Mode
Standby (ISB)
Power
L
H
L
Data out
Read
Active (ICC)
L
L
X
Data in
Write
Active (ICC)
L
H
H
High Z
Selected, outputs disabled
Active (ICC)
Notes
26. Data I/O is high impedance if OE = VIH.
27. If CE goes HIGH simultaneously with WE HIGH, the output remains in high impedance state.
28. During this period, the I/Os are in output state and input signals must not be applied.
29. Chip enable (CE) must be HIGH at CMOS level to meet the ISB2 / ICCDR spec. Other inputs can be left floating.
Document #: 38-05442 Rev. *I
Page 9 of 16
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CY62148E MoBL®
Ordering Information
Table 1 lists the CY62148E MoBL® key package features and ordering codes. The table contains only the parts that are currently
available. If you do not see what you are looking for, contact your local sales representative. For more information, visit the Cypress
website at www.cypress.com and refer to the product summary page at http://www.cypress.com/products.
Table 1. Key features and Ordering Information
Speed
(ns)
45
55
Ordering Code
Package
Diagram
Package Type
Operating
Range
CY62148ELL-45ZSXI
51-85095 32-pin TSOP II (Pb-free)
Industrial
CY62148ELL-45ZSXA
51-85095 32-pin TSOP II (Pb-free)
Automotive-A
CY62148ELL-55SXI
51-85081 32-pin SOIC (Pb-free)
Industrial
CY62148ELL-55SXA
51-85081 32-pin SOIC (Pb-free)
Automotive-A
Contact your local Cypress sales representative for availability of these parts.
Ordering Code Definitions
CY 621 4
8
E
LL - XX
XX X
X
Temperature Grade: X = I or A
I = Industrial; A = Automotive-A
Pb-free
Package Type: XX = ZS or S
ZS= 32-pin TSOP II
S = 32-pin SOIC
Speed Grade: XX = 45 ns or 55 ns
LL = Low Power
E = Process Technology 90 nm
Buswidth = × 8
Density = 4-Mbit
Family Code: MoBL SRAM family
Company ID: CY = Cypress
Document #: 38-05442 Rev. *I
Page 10 of 16
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CY62148E MoBL®
Package Diagrams
Figure 9. 32-pin TSOP II, 51-85095
51-85095 *B
Document #: 38-05442 Rev. *I
Page 11 of 16
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CY62148E MoBL®
Figure 10. 32-pin (450-Mil) Molded SOIC, 51-85081
51-85081-*C
Document #: 38-05442 Rev. *I
Page 12 of 16
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CY62148E MoBL®
Acronyms
Document Conventions
Acronym
Description
CMOS
complementary metal oxide semiconductor
I/O
input/output
OE
output enable
MoBL
more battery life
SOIC
small-outline integrated circuit
SRAM
static random access memory
TSOP
thin small outline package
WE
write enable
Document #: 38-05442 Rev. *I
Units of Measure
Symbol
Unit of Measure
ns
nano seconds
V
Volts
MHz
Mega Hertz
µA
micro Amperes
mA
milli Amperes
pF
pico Farads

ohms
°C
degree Celsius
W
Watts
%
percent
Page 13 of 16
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CY62148E MoBL®
Document History Page
Document Title: CY62148E MoBL®, 4-Mbit (512 K × 8) Static RAM
Document Number: 38-05442
Revision
ECN
Orig. of
Change
Submission
Date
**
201580
AJU
01/08/04
New datasheet
*A
249276
SYT
See ECN
Changed from Advance Information to Preliminary
Moved Product Portfolio to Page 2
Added RTSOP II and Removed FBGA Package
Changed VCC stabilization time in footnote #7 from 100 s to 200 s
Changed ICCDR from 2.0 A to 2.5 A
Changed typo in Data Retention Characteristics(tR) from 100 s to tRC ns
Changed tOHA from 6 ns to 10 ns for both 35 ns and 45 ns Speed Bin
Changed tHZOE, tHZWE from 12 to 15 ns for 35 ns Speed Bin and 15 to 18 ns for 45
ns Speed Bin
Changed tSCE from 25 to 30 ns for 35 ns Speed Bin and 40 to 35 ns for 45 ns Speed
Bin
Changed tHZCE from 12 to18 ns for 35 ns Speed Bin and 15 to 22 ns for 45 ns
Speed Bin
Changed tSD from 15 to 18 ns for 35 ns Speed Bin and 20 to 22 ns for
45 ns Speed Bin
Changed tDOE from 15 to 18 ns for 35 ns Speed Bin
Corrected typo in Package Name
Changed Ordering Information to include Pb-free Packages
*B
414820
ZSD
See ECN
Changed from Preliminary to Final
Changed the address of Cypress Semiconductor Corporation on Page #1 from
“3901 North First Street” to “198 Champion Court”
Removed 35ns Speed Bin
Removed “L” version of CY62148E
Changed ICC (Typ) value from 1.5 mA to 2 mA at f=1 MHz
Changed ICC (Max) value from 2 mA to 2.5 mA at f=1 MHz
Changed ICC (Typ) value from 12 mA to 15 mA at f=fmax
Removed ISB1 spec from the Electrical characteristics table
Changed ISB2 Typ values from 0.7 A to 1 A and Max values from 2.5 A to 7 A
Modified footnote #4 to include current limit
Removed redundant footnote on DNU pins
Changed the AC testload capacitance from 100 pF to 30 pF on page #4
Changed test load parameters R1, R2, RTH and VTH from 1838 , 994 ,
645 and 1.75 V to 1800 , 990 , 639 and 1.77 V
Changed ICCDR from 2.5 A to 7 A
Added ICCDR typical value
Changed tLZOE from 3 ns to 5 ns
Changed tLZCE and tLZWE from 6 ns to 10 ns
Changed tHZCE from 22 ns to 18 ns
Changed tPWE from 30 ns to 35 ns
Changed tSD from 22 ns to 25 ns
Updated the ordering information table and replaced Package Name column with
Package Diagram
*C
464503
NXR
See ECN
Included Automotive Range in product offering
Updated the Ordering Information
*D
485639
VKN
See ECN
Corrected the operating range to 4.5 V - 5.5 V on page# 3
*E
833080
VKN
See ECN
Added footnote #8
Added VILspec for SOIC package.
Document #: 38-05442 Rev. *I
Description of Change
Page 14 of 16
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CY62148E MoBL®
Document History Page (continued)
Document Title: CY62148E MoBL®, 4-Mbit (512 K × 8) Static RAM
Document Number: 38-05442
Revision
ECN
Orig. of
Change
Submission
Date
*F
890962
VKN
See ECN
*G
2947039
VKN
06/10/2010
*H
3006318
AJU
08/23/10
*I
3235744
RAME
04/20/2011
Document #: 38-05442 Rev. *I
Description of Change
Added Automotive-A part and its related information
Removed Automotive-E part and its related information
Added footnote #2 related to SOIC package
Added footnote #9 related to ISB2
Added AC values for 55 ns Industrial-SOIC range
Updated Ordering Information table
Added “CY62148ELL-45ZSXA” part in Ordering information.
Added footnote related to chip enable in Truth Table
Updated Package Diagrams
Added Contents, PSoC Solutions, and Sales, Solutions, and Legal Information.
Template update.
Updated table of contents.
Added acronyms, units of measure and ordering code definitions.
Added reference to note 12 to parameter ICCDR on page 5.
Updated Functional Description (Removed the line “For best practice
recommendations, refer to the Cypress application note AN1064, SRAM System
Guidelines”).
Updated Package Diagrams.
Page 15 of 16
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CY62148E MoBL®
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at Cypress Locations.
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© Cypress Semiconductor Corporation, 2004-2011. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems
application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document #: 38-05442 Rev. *I
Revised April 21, 2011
Page 16 of 16
More Battery Life is a trademark and MoBL is a registered trademark of Cypress Semiconductor Corporation. All products and company names mentioned in this document may be the trademarks of
their respective holders.
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