SDRAM Memory Technical Data Sheet Description The HMSD1616 SDRAM is a high-speed CMOS synchronous DRAM containing 256 Mbits. It is internally configured as 4 Banks of 4M word x 16 DRAM with a synchronous interface (all signals are registered on the positive edge of the clock signal, CLK). Read and write accesses to the SDRAM are burst oriented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. Accesses begin with the registration of a BankActivate command which is then followed by a Read or Write command. The HMSD1616 provides for programmable Read or Write burst lengths of 1, 2, 4, 8, or full page, with a burst termination option. An auto precharge function may be enabled to provide a self-timed row precharge that is initiated at the end of the burst sequence. The refresh functions, either Auto or Self Refresh are easy to use. By having a programmable mode register, the system can choose the most suitable modes to maximize its performance. These devices are well suited for applications requiring high memory bandwidth and particularly well suited to high performance PC applications. Features • JEDEC Standard Compliant • Fast access time clock: 5.4 ns • Fast clock rate: 143 MHz • Fully synchronous operation • Internal pipelined architecture • 4M word x 16-bit x 4-bank • Programmable Mode registers - CAS Latency: 2, or 3 - Burst Length: 1, 2, 4, 8, or full page - Burst Type: interleaved or linear burst - Burst stop function • Auto Refresh and Self Refresh • 8192 refresh cycles/64ms • CKE power down mode • Single +3.3V power supply • Interface: LVTTL • Operating temperature range: -55℃~+125℃ • MIL-STD-883 Screening • RoHS Compliant in Accordance with EU Directive 2005/95/EC PAGE 1 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Package Details • LGA package: 96 pin ceramic LGA(CLGA96) • LCC package: 64 pin ceramic LCC(CLCC64) Table 1. Key Specifications HMSD1616 Unit(ns) tCK3 Clock Cycle time (min.) 7 tAC3 Access time from CLK (max.) 5.4 tRAS Row Active time (min.) 49 tRC Row Cycle time (min.) 63 Table 2. Ordering Information Part Number Package HMSD1616-143GM CLGA96 HMSD1616-143LM CLCC64 PAGE 2 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure1. Block Diagram PAGE 3 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Pin Descriptions Table 3. (1) Pin Details Symbol Type Description CLK Clock: CLK is driven by the system clock. All SDRAM input signals are sampled on the Input positive edge of CLK. CLK also increments the internal burst counter and controls the output registers. CKE Clock Enable: CKE activates (HIGH) and deactivates (LOW) the CLK signal. If CKE goes low synchronously with clock (set-up and hold time same as other inputs), the internal clock is suspended from the next clock cycle and the state of output and burstaddress is frozen as long as the CKE remains low. When all banks are in the idle state,deactivating the clock Input controls the entry to the Power Down and Self Refresh modes. CKE is synchronous except after the device enters Power Down and Self Refresh modes, where CKE becomes asynchronous until exiting the same mode. The input buffers, including CLK, are disabled during Power Down and Self Refresh modes,providing low standby power. Bank Activate: BA0, BA1 input select the bank for operation. BA0, BA1 A0-A12 CS# BA1 BA0 Select Bank 0 0 BANK #A 0 1 BANK #B 1 0 BANK #C 1 1 BANK #D Input Address Inputs: A0-A12 are sampled during the BankActivate command (row address A0A12) and Read/Write command (column address A0-A8 with A10 defining Auto Precharge) Input to select one location out of the 4M available in the respective bank. During a Precharge command, A10 is sampled to determine if all banks are to be precharged (A10 = HIGH). The address inputs also provide the op-code during a Mode Register Set command. Input Chip Select: CS# enables (sampled LOW) and disables (sampled HIGH) the command decoder. All commands are masked when CS# is sampled HIGH. CS# provides for external bank selection on systems with multiple banks. It is considered part of the command code. RAS# Row Address Strobe: The RAS# signal defines the operation commands in conjunction with the CAS# and WE# signals and is latched at the positive edges of CLK. When RAS# and CS# are asserted "LOW" and CAS# is asserted "HIGH," either the BankActivate command or Input the Precharge command is selected by the WE# signal. When the WE# is asserted "HIGH," the BankActivate command is selected and the bank designated by BA is turned on to the active state. When the WE# is asserted "LOW," the Precharge command is selected and the bank designated by BA is switched to the idle state after the precharge operation. CAS# Column Address Strobe: The CAS# signal defines the operation commands in conjunction with the RAS# and WE# signals and is latched at the positive edges of CLK. When RAS# is Input held "HIGH" and CS# is asserted "LOW," the column access is started by asserting CAS# "LOW." Then, the Read or Write command is selected by asserting WE# "LOW" or "HIGH." WE# Write Enable: The WE# signal defines the operation commands in conjunction with the Input RAS# and CAS# signals and is latched at the positive edges of CLK. The WE# input is used to select the BankActivate or Precharge command and Read or Write command. PAGE 4 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet LDM, UDM DQ0 - DQ15 NC Data Input/Output Mask: Controls output buffers in read mode and masks Input data in Input write mode. Input Data I/O: The DQ0-15 input and output data are synchronized with the positive edges of /Output CLK. The I/Os are maskabled during Reads and Writes. - No Connect: These pins should be left unconnected. VDDQ Supply DQ Power: Provide isolated power to DQs for improved noise immunity. ( 3.3V± 0.3V ) VSSQ Supply DQ Ground: Provide isolated ground to DQs for improved noise immunity.( 0 V ) VDD Supply Power Supply: +3.3V ± 0.3V VSS Supply Ground PAGE 5 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Table 3. (2) CLGA96 Pin Definitions Pin No Define Pin No Define Pin No Define Pin No Define Pin No Define A1 BA1 B1 BA0 C1 RAS# D1 WE# E1 VDD A2 A10 B2 VSS C2 CS# D2 CAS# E2 DQ7 A3 NC B3 A0 C3 VSS D3 VSS E3 DQML A4 VSS B4 A1 C4 VSS D4 VSS E4 VSS A5 NC B5 A2 C5 A3 D5 VSS - - A6 VDD B6 VDD C6 VSS D6 VSS - - A7 VSS B7 A4 C7 A5 D7 VSS E7 VDDQ A8 NC B8 A6 C8 VSS D8 VSS E8 VSS A9 A7 B9 VSS C9 A11 D9 CKE E9 DQMH A10 A8 B10 A9 C10 A12 D10 CLK E10 VSS Pin No Define Pin No Define Pin No Define Pin No Define Pin No Define F1 VSSQ G1 NC H1 VSS J1 DQ4 K1 DQ3 F2 DQ6 G2 DQ5 H2 VDDQ J2 VSS K2 NC F3 VSS G3 VSS H3 VSSQ J3 DQ2 K3 VDDQ F4 VSS G4 VSS H4 DQ1 J4 VSS K4 VDD - - G5 DQ0 H5 VDD J5 VSS K5 VDD - - G6 VDD H6 VSS J6 VSS K6 VSS F7 VSS G7 VDDQ H7 VSSQ J7 DQ15 K7 VSS F8 VSS G8 VSS H8 VSS J8 DQ14 K8 NC F9 DQ8 G9 DQ9 H9 VSSQ J9 VSS K9 DQ13 F10 NC G10 NC H10 DQ10 J10 DQ11 K10 DQ12 PAGE 6 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Table 3. (3) CLCC64 Pin Definitions Pin No Define Pin No Define Pin No Define Pin No Define 1 VDD 17 VSS 33 DQ8 49 VDD 2 DQML 18 VSS 34 VDDQ 50 VDD 3 WE# 19 VSS 35 DQ9 51 VDD 4 CAS# 20 VSS 36 DQ10 52 VDD 5 RAS# 21 A4 37 VSSQ 53 DQ0 6 CS# 22 A5 38 DQ11 54 VDDQ 7 BA0 23 A6 39 DQ12 55 DQ1 8 BA1 24 A7 40 VDDQ 56 DQ2 9 A10 25 A8 41 DQ13 57 VSSQ 10 A0 26 A9 42 DQ14 58 DQ3 11 A1 27 A11 43 VSSQ 59 DQ4 12 A2 28 A12 44 DQ15 60 VDDQ 13 A3 29 CKE 45 VSS 61 DQ5 14 VDD 30 CLK 46 VSS 62 DQ6 15 VDD 31 DQMH 47 VSS 63 VSSQ 16 VDD 32 VSS 48 VSS 64 DQ7 PAGE 7 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Operation Mode Fully synchronous operations are performed to latch the commands at the positive edges of CLK. Table 4 shows the truth table for the operation commands. Table 4. Truth Table (Note (1), (2)) Command CKEn-1 CKEn DQM BA0,1 A10 A0-9,12 State CS# RAS# CAS# WE# Idle(3) Any H X X V Row address L L H H H X X V L X L L H L Any H X X X H X L L H L Write Active(3) H X V V L Column address L H L L Write and AutoPrecharge Active(3) H X V V H (A0-A8) L H L L Read Active(3) H X V V L Column address L H L H Read and Autoprecharge Active(3) H X V V H (A0-A8) L H L H Mode Register Set Idle H X X L L L L No-Operation Any H X X X X X L H H H Active(4) H X X X X X L H H L Device Deselect Any H X X X X X H X X X AutoRefresh Idle H H X X X X L L L H SelfRefresh Entry Idle H L X X X X L L L H Idle (SelfRefresh) L H X X X X H X X X L H H H Active H L X X X X H X X X BankActivate Bank Precharge PrechargeALL Burst Stop SelfRefresh Exit Clock Suspend Mode Entry Power Down Mode Entry Any(5) OP code L V V V H X X X L H H H X X X X H X X X L H H H H L X X X X Active L H X X X X Any (PowerDown) L H X X X X Data Write/Output Enable Active H X L X X X X X X X Data Mask/Output Disable Active H X H X X X X X X X Clock Suspend Mode Exit Power Down Mode Exit Note: 1. V=Valid, X=Don't Care, L=Low level, H=High level 2. CKEn signal is input level when commands are provided. CKEn-1 signal is input level one clock cycle before the commands are provided. 3. These are states of bank designated by BA signal. 4. Device state is 1, 2, 4, 8, and full page burst operation. 5. Power Down Mode can not enter in the burst operation. When this command is asserted in the burst cycle, device state is clock suspend mode. PAGE 8 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Commands 1 BankActivate (RAS# = "L", CAS# = "H", WE# = "H", BAs = Bank, A0-A12 = Row Address) The BankActivate command activates the idle bank designated by the BA0, 1 signals. By latching the row address on A0 to A12 at the time of this command, the selected row access is initiated. The read or write operation in the same bank can occur after a time delay of tRCD(min.) from the time of bank activation. A subsequent BankActivate command to a different row in the same bank can only be issued after the previous active row has been precharged (refer to the following figure). The minimum time interval between successive BankActivate commands to the same bank is defined by tRC(min.). The SDRAM has four internal banks on the same chip and shares part of the internal circuitry to reduce chip area; therefore it restricts the back-to-back activation of the two banks. tRRD(min.) specifies the minimum time required between activating different banks. After this command is used, the Write command and the Block Write command perform the no mask write operation. T0 T1 T2 T3 Tn+3 Tn+4 Tn+5 Tn+6 CLK ADDRESS Bank A Bank A Bank B Bank A Row Addr. Col Addr. Row Addr. Row Addr. R/W A with Bank B Activate RAS#-CAS# delay(tRCD) COMMAND Bank A Activate NOP NOP RAS#-RAS# delay time(tRRD) AutoPrecharge NOP NOP Bank A Activate RAS#-Cycle time(tRC) AutoPrecharge Begin Don’t Care Figure2.BankActivate Command Cycle (Burst Length = n) 2 BankPrecharge command (RAS# = "L", CAS# = "H", WE# = "L", BAs = Bank, A10 = "L", A0-A9, A11 and A12 = Don't care) The BankPrecharge command precharges the bank disignated by BA signal. The precharged bank is switched from the active state to the idle state. This command can be asserted anytime after t RAS(min.) is satisfied from the BankActivate command in the desired bank. The maximum time any bank can be active is specified by tRAS(max.). Therefore, the precharge function must be performed in any active bank within tRAS(max.). At the end of precharge, the precharged bank is still in the idle state and is ready to be activated again 3 PrechargeAll command (RAS# = "L", CAS# = "H", WE# = "L", BAs = Don’t care, A10 = "H", A0-A9, A11 and A12 = Don't care) The PrechargeAll command precharges all banks simultaneously and can be issued even if all banks are not in the active state. All banks are then switched to the idle state. PAGE 9 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet 4 Read command (RAS# = "H", CAS# = "L", WE# = "H", BAs = Bank, A10 = "L", A0-A8 = Column Address) The Read command is used to read a burst of data on consecutive clock cycles from an active row in an active bank. The bank must be active for at least tRCD(min) before the Read command is issued. During read bursts, the valid data-out element from the starting column address will be available following the CAS# latency after the issue of the Read command. Each subsequent data-out element will be valid by the next positive clock edge (refer to the following figure). The DQs go into high-impedance at the end of the burst unless other command is initiated. The burst length, burst sequence, and CAS# latency are determined by the mode register, which is already programmed. A full-page burst will continue until terminated (at the end of the page it will wrap to column 0 and continue). T0 T1 READ A NOP T2 T3 T4 T5 T6 T7 T8 CLK COMMAND CAS# Latency=2 tCK2, DQ NOP DOUT A0 CAS# Latency=3 tck3, DQ NOP NOP NOP DOUT A1 DOUT A2 DOUT A3 DOUT A0 DOUT A1 DOUT A2 NOP NOP NOP DOUT A3 Figure3.Burst Read Operation (Burst Length = 4,CAS# Latency=2,3) The read data appears on the DQs subject to the values on the DQM inputs two clocks earlier (i.e. DQM latency is two clocks for output buffers). A read burst without the auto precharge function may be interrupted by a subsequent Read or Write command to the same bank or the other active bank before the end of the burst length. It may be interrupted by a BankPrecharge/ PrechargeAll command to the same bank too. The interrupt coming from the Read command can occur on any clock cycle following a previous Read command (refer to the following figure). T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK COMMAND CAS# Latency=2 tCK2, DQ CAS# Latency=3 tck3, DQ READ A READ B NOP DOUT A0 NOP NOP NOP DOUT B0 DOUT B1 DOUT B2 DOUT A0 DOUT B0 DOUT B1 NOP NOP NOP DOUT B3 DOUT B2 DOUT B3 Figure4.Read Interrupted by a Read (Burst Length = 4,CAS# Latency=2,3) PAGE 10 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet The DQM inputs are used to avoid I/O contention on the DQ pins when the interrupt comes from a Write command. The DQMs must be asserted (HIGH) at least two clocks prior to the Write command to suppress data-out on the DQ pins. To guarantee the DQ pins against I/O contention, a single cycle with highimpedance on the DQ pins must occur between the last read data and the Write command (refer to the following three figures). If the data output of the burst read occurs at the second clock of the burst write, the DQMs must be asserted (HIGH) at least one clock prior to the Write command to avoid internal bus contention. T0 T1 T2 NOP Bank A Activate T3 T4 T5 T6 T7 T8 T9 READ A WRITE A NOP NOP NOP DIN A0 DIN A1 DIN A2 DIN A3 CLK DQM COMMAND NOP NOP NOP CAS# Latency=2 tCK2, DQ Figure5.Read to Write Interval(Burst Length ≥ 4,CAS# Latency=2) T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK DQM COMMAND NOP NOP READ A NOP NOP CAS# Latency=2 tCK2, DQ WRITE B DIN B0 NOP NOP NOP DIN B1 DIN B2 DIN B3 Must be Hi-Z before the Write Command Don’t Care Figure6.Read to Write Interval(Burst Length ≥ 4,CAS# Latency=2) PAGE 11 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK DQM COMMAND NOP READ A NOP NOP CAS# Latency=3 tck3, DQ NOP NOP WRITE B NOP NOP DIN B0 DIN B1 DIN B2 DOUT A0 Must be Hi-Z before the Write Command Don’t Care Figure7.Read to Write Interval(Burst Length ≥ 4,CAS# Latency=3) A read burst without the auto precharge function may be interrupted by a BankPrecharge/ PrechargeAll command to the same bank. The following figure shows the optimum time that BankPrecharge/PrechargeAll command is issued in different CAS# latency. T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK ADDRESS Bank, Col A Bank Row Bank(S) tRP COMMAND READ A NOP CAS# Latency=2 tck2, DQ NOP DOUT A0 CAS# Latency=3 tck3, DQ NOP Precharge DOUT A1 DOUT A2 DOUT A3 DOUT A1 DOUT A2 DOUT A0 NOP NOP Activate NOP DOUT A3 Figure8.Read to Precharge(CAS# Latency=2,3) 5 Read and AutoPrecharge command (RAS# = "H", CAS# = "L", WE# = "H", BAs = Bank, A10 = "H", A0-A8 = Column Address) The Read and AutoPrecharge command automatically performs the precharge operation after the read operation. Once this command is given, any subsequent command cannot occur within a time delay of {tRP(min.) + burst length}. At full-page burst, only the read operation is performed in this command and the auto precharge function is ignored. 6 Write command (RAS# = "H", CAS# = "L", WE# = "L", BAs = Bank, A10 = "L", A0-A8 = Column Address) PAGE 12 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet The Write command is used to write a burst of data on consecutive clock cycles from an active row in an active bank. The bank must be active for at least tRCD(min.) before the Write command is issued. During write bursts, the first valid data-in element will be registered coincident with the Write command. Subsequent data elements will be registered on each successive positive clock edge (refer to the following figure). The DQs remain with high-impedance at the end of the burst unless another command is initiated. The burst length and burst sequence are determined by the mode register, which is already programmed. A full-page burst will continue until terminated (at the end of the page it will wrap to column 0 and continue). T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK COMMAND NOP DQ WRITE A NOP NOP DIN A0 DIN A1 DIN A2 NOP NOP NOP NOP NOP don’t care DIN A3 The first data element and the write are registered on the same clock edge Figure9. Burst Write Operation (Burst Length = 4) A write burst without the auto precharge function may be interrupted by a subsequent Write, BankPrecharge/PrechargeAll, or Read command before the end of the burst length. An interrupt coming from Write command can occur on any clock cycle following the previous Write command (refer to the following figure). T0 T1 T2 T3 T4 T5 WRITE A WRITE B NOP NOP NOP DIN A0 DIN B0 DIN B1 DIN B2 DIN B3 T6 T7 T8 CLK COMMAND NOP DQ NOP NOP NOP Figure10. Write Interrupted by a Write (Burst Length = 4) The Read command that interrupts a write burst without auto precharge function should be issued one cycle after the clock edge in which the last data-in element is registered. In order to avoid data contention, input data must be removed from the DQs at least one clock cycle before the first read data appears on the outputs (refer to the following figure). Once the Read command is registered, the data inputs will be ignored and writes will not be executed. PAGE 13 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet T0 T1 T2 WRITE A WRITE B T3 T4 T5 T6 T7 T8 CLK COMMAND NOP CAS# Latency=2 tCK2, DQ DIN A0 don’t care CAS# Latency=3 tck3, DQ DIN A0 don’t care NOP NOP NOP NOP DOUT B0 DOUT B1 DOUT B2 DOUT B3 DOUT B0 DOUT B1 DOUT B2 don’t care NOP NOP DOUT B3 Input data must be removed from the DQ at least one clock cycle before the Read data appears on the outputs to avoid data contention Figure11. Write Interrupted by a Read(Burst Length = 4, CAS# Latency=2,3) The BankPrecharge/PrechargeAll command that interrupts a write burst without the auto precharge function should be issued m cycles after the clock edge in which the last data-in element is registered, where m equals tWR/tCK rounded up to the next whole number. In addition, the DQM signals must be used to mask input data, starting with the clock edge following the last data-in element and ending with the clock edge on which the BankPrecharge/PrechargeAll command is entered (refer to the following figure). T0 T1 T2 T3 T4 T5 T6 T7 CLK DQM tRP COMMAND WRITE ADDRESS Bank Col n DQ DIN n NOP NOP Precharge NOP NOP Bank(s) Activate NOP ROW tWR DIN N+1 Don’t Care Note: The DQMs can remain low in this example if the length of the write burst is 1 or 2. Figure12. Write to Precharge 7 Write and AutoPrecharge command (RAS# = "H", CAS# = "L", WE# = "L", BAs = Bank, A10 = "H", A0-A8 = Column Address) The Write and AutoPrecharge command performs the precharge operation automatically after the write operation. Once this command is given, any subsequent command can not occur within a time delay of PAGE 14 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet {(burst length -1) + tWR + tRP(min.)}. At full-page burst, only the write operation is performed in this command and the auto precharge function is ignored. T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 CLK COMMAND Bank A Activate WRITEA NOP NOP AutoPrecharge NOP NOP NOP NOP NOP Bank A Activate tDAL DQ DIN A0 DIN A1 Begin AutoPrecharge Bank can be reactivated at ompletion of tDAL tDAL=tWR+trp Figure13. Burst Write with Auto-Precharge(Burst Length = 2) 8 Mode Register Set command (RAS# = "L", CAS# = "L", WE# = "L", A0-A12 = Register Data) The mode register stores the data for controlling the various operating modes of SDRAM. The Mode Register Set command programs the values of CAS# latency, Addressing Mode and Burst Length in the Mode register to make SDRAM useful for a variety of different applications. The default values of the Mode Register after power-up are undefined; therefore this command must be issued at the power-up sequence. The state of pins A0~A9 and A12 in the same cycle is the data written to the mode register. Two clock cycles are required to complete the write in the mode register (refer to the following figure). The contents of the mode register can be changed using the same command and the clock cycle requirements during operation as long as all banks are in the idle state. Table5. Mode Register Bitmap PAGE 15 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 CLK CKE tMRD CS# RAS# CAS# WE# BA0,1 A10 Address Key A0-A9, A11-A12 DQM tRP Hi-Z DQ Mode Register Set Command PrechargeAll Any Command Don’t Care Figure14. Mode Register Set Cycle Burst Length Field (A2~A0) This field specifies the data length of column access using the A2~A0 pins and selects the Burst Length to be 2,4,8, or full page. Table6. Burst Length Field A2 0 0 0 0 1 1 1 1 A1 0 0 1 1 0 0 1 1 A0 0 1 0 1 0 1 0 1 Burst Length 1 2 4 8 Reserved Reserved Reserved Full Page Full Page Length:512 Burst Type Field (A3) The Addressing Mode can be one of two modes, Interleave Mode or Sequential Mode. Sequential Mode supports burst length of 1, 2, 4, 8, or full page, but Interleave Mode only supports burst length of 4 and 8. PAGE 16 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Table 7. Addressing Mode Select Field A3 0 1 Burst Type Sequential Interleave Burst Definition, Addressing Sequence of Sequential and Interleave Mode Table 8. Burst Definition Burst Length 2 4 8 Full Page A2 X X X X X X 0 0 0 0 1 1 1 1 Start Address A2 A0 X 0 X 1 0 0 0 1 1 0 1 1 0 0 0 1 1 0 1 1 0 0 0 1 1 0 1 1 Location = 0 - 511 Sequential Interleave 0,1 1,0 0,1,2,3 1,2,3,0 2,3,0,1 3,0,1,2 0,1,2,3,4,5,6,7 1,2,3,4,5,6,7,0 2,3,4,5,6,7,0,1 3,4,5,6,7,0,1,2 4,5,6,7,0,1,2,3 5,6,7,0,1,2,3,4 6,7,0,1,2,3,4,5 7,0,1,2,3,4,5,6 n,n+1,n+2,n+3,… 511,0,1,2,…,n-1,n,… 0,1 1,0 0,1,2,3 1,0,3,2 2,3,0,1 3,2,1,0 0,1,2,3,4,5,6,7 1,0,3,2,5,4,7,6 2,3,0,1,6,7,4,5 3,2,1,0,7,6,5,4 4,5,6,7,0,1,2,3 5,4,7,6,1,0,3,2 6,7,4,5,2,3,0,1 7,6,5,4,3,2,1,0 Not Support CAS# Latency Field (A6~A4) This field specifies the number of clock cycles from the assertion of the Read command to the first read data. The minimum whole value of CAS# Latency depends on the frequency of CLK. The minimum whole value satisfying the following formula must be programmed into this field. tCAC(min) ≤ CAS# Latency X tCK Table9. CAS Latency A6 0 0 0 0 1 A5 0 0 1 1 X A4 0 1 0 1 X CAS# Latency Reserved Reserved 2 clocks 3 clocks Reserved Test Mode field (A8~A7) These two bits are used to enter the test mode and must be programmed to "00" in normal operation. Table 10. Test Mode A8 0 0 1 A7 0 1 X Test Mode Normal Mode Vendor Use Only Vendor Use Only Write Burst Length (A9) This bit is used to select the write burst mode. When the A9 bit is "0", the Burst-Read-Burst-Write mode is selected. When the A9 bit is "1", the Burst-Read-Single-Write mode is selected. PAGE 17 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Table 11. Write Burst Length A9 0 1 Write Burst Mode Burst-Read-Burst-Write Burst-Read-Single-Write Note: A10 and BA0, 1 should stay “L” during mode set cycle. 9 No-Operation command (RAS# = "H", CAS# = "H", WE# = "H") The No-Operation command is used to perform a NOP to the SDRAM which is selected (CS# is Low). This prevents unwanted commands from being registered during idle or wait states. 10 Burst Stop command (RAS# = "H", CAS# = "H", WE# = "L") The Burst Stop command is used to terminate either fixed-length or full-page bursts. This command is only effective in a read/write burst without the auto precharge function. The terminated read burst ends after a delay equal to the CAS# latency (refer to the following figure). The termination of a write burst is shown in the following figure. T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK COMMAND READ A NOP NOP NOP Burst NOP NOP NOP NOP Stop The burst ends after a delay equal to the CAS# Latency CAS# Latency=2 tCK2, DQ DOUT A0 CAS# Latency=3 tCK3, DQ DOUT A1 DOUT A2 DOUT A3 DOUT A0 DOUT A1 DOUT A2 DOUT A3 Figure15. Termination of a Burst Read Operation(Burst Length >4, CAS# Latency=2,3) T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK COMMAND DQ NOP WRITE A NOP NOP Burst NOP NOP NOP NOP Stop DIN A0 DIN A1 DIN A2 don’t care Figure16. Termination of a Burst Write Operation(Burst Length = X) PAGE 18 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet 11 Device Deselect command (CS# = "H") The Device Deselect command disables the command decoder so that the RAS#, CAS#, WE# and Address inputs are ignored, regardless of whether the CLK is enabled. This command is similar to the No Operation command. 12 AutoRefresh command (RAS# = "L", CAS# = "L", WE# = "H", CKE = "H", A0-A12 = Don't care) The AutoRefresh command is used during normal operation of the SDRAM and is analogous to CAS#before-RAS# (CBR) Refresh in conventional DRAMs. This command is non-persistent, so it must be issued each time a refresh is required. The addressing is generated by the internal refresh controller. This makes the address bits a "don't care" during an AutoRefresh command. The internal refresh counter increments automatically on every auto refresh cycle to all of the rows. The refresh operation must be performed 8192 times within 64ms. The time required to complete the auto refresh operation is specified by tRC(min). To provide the AutoRefresh command, all banks need to be in the idle state and the device must not be in power down mode (CKE is high in the previous cycle). This command must be followed by NOPs until the auto refresh operation is completed. The precharge time requirement, tRP(min), must be met before successive auto refresh operations are performed. 13 SelfRefresh Entry command (RAS# = "L", CAS# = "L", WE# = "H", CKE = "L", A0-A12 = Don't care) The SelfRefresh is another refresh mode available in the SDRAM. It is the preferred refresh mode for data retention and low power operation. Once the SelfRefresh command is registered, all the inputs to the SDRAM become "don't care" with the exception of CKE, which must remain LOW. The refresh addressing and timing is internally generated to reduce power consumption. The SDRAM may remain in SelfRefresh mode for an indefinite period. The SelfRefresh mode is exited by restarting the external clock and then asserting HIGH on CKE (SelfRefresh Exit command). 14 SelfRefresh Exit command This command is used to exit from the SelfRefresh mode. Once this command is registered, NOP or Device Deselect commands must be issued for tXSR(min) because time is required for the completion of any bank currently being internally refreshed. If auto refresh cycles in bursts are performed during normal operation, a burst of 8192 auto refresh cycles should be completed just prior to entering and just after exiting the SelfRefresh mode. 15 Clock Suspend Mode Entry / PowerDown Mode Entry command (CKE = "L") When the SDRAM is operating the burst cycle, the internal CLK is suspended (masked) from the subsequent cycle by issuing this command (asserting CKE "LOW"). The device operation is held intact while CLK is suspended. On the other hand, when all banks are in the idle state, this command performs entry into the PowerDown mode. All input and output buffers (except the CKE buffer) are turned off in the PowerDown PAGE 19 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet mode. The device may not remain in the Clock Suspend or PowerDown state longer than the refresh period (64ms) since the command does not perform any refresh operations. 16 Clock Suspend Mode Exit / PowerDown Mode Exit command (CKE= "H") When the internal CLK has been suspended, the operation of the internal CLK is reinitiated from the subsequent cycle by providing this command (asserting CKE "HIGH", the command should be NOP or deselect). When the device is in the PowerDown mode, the device exits this mode and all disabled buffers are turned on to the active state. tPDE (min) is required when the device exits from the PowerDown mode. Any subsequent commands can be issued after one clock cycle from the end of this command. 17 Data Write / Output Enable, Data Mask / Output Disable command (DQM = "L", "H") During a write cycle, the DQM signal functions as a Data Mask and can control every word of the input data. During a read cycle, the DQM functions as the controller of output buffers. DQM is also used for device selection, byte selection and bus control in a memory system. PAGE 20 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Table12. Absolute Maximum Rating Symbol Item Rating Unit Note VIN,VOUT Input, Output Voltage -0.5 ~ 4.6 V 1 VDD,VDDQ Power Supply Voltage -0.5 ~ 4.6 V 1 TA Ambient Temperature -55 ~ 125 °C 1 TSTG Storage Temperature -65 ~ 150 °C 1 0.15 W 1 50 mA 1 PD Power Dissipation IOUT Short Circuit Output Current Table13. Recommended D.C. Operating Conditions (TA = -55~125°C) Symbol Parameter Min. Typ. Max. Unit Note VDD Power Supply Voltage 3.0 3.3 3.6 V 2 VDDQ Power Supply Voltage(for I/O Buffer) 3.0 3.3 3.6 V 2 VIH LVTTL Input High Voltage 2.0 3.0 VDDQ+0.3 V 2 VIL LVTTL Input Low Voltage -0.3 0 0.8 V 2 IIL Input Leakage Current (0V≤VIN≤VDD, All other pins not under test = 0V ) -10 - 10 uA IOL Output Leakage Current Output disable, 0V≤VOUT≤VDDQ -10 - 10 uA VOH LVTTL Output “H” Level Voltage (IOUT = -2mA ) 2.4 - - V VOL LVTTL Output “L” level Voltage (IOUT = 2mA ) - - 0.4 V Table14. Capacitance (VDD = 3.3V, f = 1MHz, TA = 25°C) Symbol CI CI/O Parameter Input Capacitance Input/Output Capacitance PAGE 21 www.ctscorp.com Min. Max. Unit 2.5 5 pF 4 6.5 pF Rev. B SDRAM Memory Technical Data Sheet Table15. D.C. Characteristics (VDD = 3.3V±0.3V, TA = -55~125°C) Description/Test condition Symbol Max. Operating Current tRC ≥ tRC(min), Outputs Open, One bank active IDD1 100 Precharge Standby Current in non-power down mode tCK = 15ns, CS# ≥ VIH(min), CKE ≥ VIH Input signals are changed every 2clks IDD2N 40 Precharge Standby Current in non-power down mode tCK = ∞, CLK≤ VIL(max), CKE ≥ VIH IDD2NS 30 Precharge Standby Current in power down mode tCK = 15ns, CKE ≤ VIL(max) IDD2P 5 Precharge Standby Current in power down mode tCK = ∞, CKE ≤ VIL(max) IDD2PS 5 Unit Note 3 mA Active Standby Current in non-power down mode tCK = 15ns, CKE ≥ VIH(min), CS# ≥ VIH(min) Input signals are changed every 2clks IDD3N 65 Active Standby Current in non-power down mode tCK = ∞, CKE ≥ VIH(min), CLK≤ VIL(max) IDD3NS 45 Operating Current (Burst mode) tCK = tCK(min), Outputs Open, Multi-bank interleave IDD4 150 3,4 Refresh Current tRC = tRC(min) IDD5 200 3 Self Refresh Current CKE ≤ 0.2V,for other inputs VIH ≥ VDD – 0.2V, VIL ≤ 0.2V IDD6 6 PAGE 22 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Table16. Electrical Characteristics and Recommended A.C. Operating Conditions Symbol A.C. Parameter Min. Max. tRC Row cycle time (same bank) 63 - tRFC Refresh cycle time 63 - tRCD RAS# to CAS# delay (same bank) 21 - tRP Precharge to refresh/row active command (same bank) 21 - tRRD Row active to row active delay (different banks) 14 - tMRD Mode register set cycle time 14 - tRAS Row active to precharge time (same bank) 49 120k tWR Write recover time 14 - tCK Clock cycle time CL* = 2 12 - CL* = 3 7 - Unit Note 9 ns tCH Clock high time 2.5 - 10 tCL Clock low time 2.5 - 10 tAC Access time from CLK (positive edge) CL* = 2 - 6.5 CL* = 3 - 5.4 tOH Data output hold time 2 - tLZ Data output low impedance 0 - tHZ Data output high impedance - 5.4 8 tIS Data/Address/Control Input set-up time 1.5 - 10 tIH Data/Address/Control Input hold time 1 - 10 10 9 tPDE Power Down Exit set-up time tIS+ tCK - tREFI Average Refresh interval time - 7.8 us tXSR Exit Self-Refresh to Read Command tRC+ tIS - ns * CL is CAS# Latency. PAGE 23 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Note: 1. Stress greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. 2. All voltages are referenced to VSS. Overshoot VIH(max) = VDDQ + 2.0V for pulse width ≤ 3ns. Undershoot VIL(min) = -2.0V for pulse width ≤ 3ns. 3. These parameters depend on the cycle rate and these values are measured by the cycle rate under the minimum value of tCK and tRC. Input signals are changed one time during every 2 t CK. 4. These parameters depend on the output loading. Specified values are obtained with the output open. 5. Power-up sequence is described in Note 11. 6. A.C. Test Conditions. Table 17. LVTTL Interface Reference Level of Output Signals 1.4V / 1.4V Input Signal Levels 2.4V / 0.4V Transition Time (Rise and Fall) of Input Signals 1ns Reference Level of Input Signals 1.4V 7. Transition times are measured between VIH and VIL. Transition (rise and fall) of input signals are in a fixed slope (1 ns) 8. tHZ defines the time in which the outputs achieve the open circuit condition and are not at reference levels. 9. If clock rising time is longer than 1 ns, (tR / 2 -0.5) ns should be added to the parameter. 10. Assumed input rise and fall time tT (tR & tF) = 1 ns If tR or tF is longer than 1 ns, transient time compensation should be considered, i.e., [(tr + tf)/2 - 1] ns should be added to the parameter. 11. Power up Sequence PAGE 24 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Power up must be performed in the following sequence. 1) Power must be applied to VDD and VDDQ (simultaneously) when CKE= "LOW", DQM= "HIGH" and all input signals are held "NOP" state. 2) Start clock and maintain stable condition for minimum 200 μs, then bring CKE "HIGH" and, it is recommended that DQM is held "HIGH" (VDD levels) to ensure DQ output is in high impedance. 3) All banks must be precharged. 4) Mode Register Set command must be asserted to initialize the Mode register. 5) A minimum of 2 Auto-Refresh dummy cycles must be required to stabilize the internal circuitry of the device * The Auto Refresh command can be issue before or after Mode Register Set command PAGE 25 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Timing Waveforms Figure18. AC Parameters for Write Timing (Burst Length=4) T0 T1 T2 T3 T4 T5 T6 T7 T8 CLK T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 tCH tCL CKE tIS tIS tIH Begin Auto Begin Auto Precharge Bank A Precharge Bank B CS# RAS# CAS# WE# BA0,1 tIH A10 RAx RAY RBx tIS A0-A9, A11-A12 CAx RAx CBx RBx RAY CAY DQM tDAL tRCD tIS tRC DQ tWR tIH Hi-Z Ax0 Activate Command Bank A Write with Ax1 Ax2 Ax3 Bx0 Bx1 Bx2 Bx3 Ay0 Ay1 Ay2 Ay3 Activate Auto Precharge Command Command Bank B Write with Activate Write Precharge Auto Precharge Command Command Command Command Bank A Bank A Bank A Bank A Bank B Don’t Care PAGE 26 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 19. AC Parameters for Read Timing (Burst Length=2, CAS# Latency=2) T0 CLK T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 tCH tCL CKE Begin Auto Precharge Bank B tIS tIS tIH tIH CS# RAS# CAS# WE# BA0,1 tIH A10 RBx RAx RAy tIS A0-A9, A11-A12 RAx CBx RBx CAx RAy tRRD tRAS DQM tRC tAC tRCD DQ Hi-Z tRP tHZ tLZ Ax0 Bx0 Ax1 Bx1 tHZ tOH Activate Read Activate Write with Precharge Activate Command Command Command Auto Precharge Command Command Bank A Bank A Bank B Command Bank A Bank A Bank B Don’t Care PAGE 27 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 20. Auto Refresh (Burst Length=4, CAS# Latency=2) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14T15 T16 T17 T18 T19 T20 T21 T22 CLK CKE CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 CAx RAx tRC tRP tRC tRCD DQM DQ Ax0 Precharge All Auto Refresh Auto Refresh Activate Read Command Command Command Command Command Bank A Bank A PAGE 28 www.ctscorp.com Ax1 Don’t Care Rev. B SDRAM Memory Technical Data Sheet Figure 21. Power on Sequence and Auto Refresh T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 CLK High Level CKE Minimum for 2 Refresh Cycles are required Is reguired CS# RAS# CAS# WE# BA0,1 A10 Address Key A0-A9, A11-A12 DQM DQ tRP tMRD Hi-Z Precharge All Inputs must be Stable for Command 1st Auto Refresh Mode Register (*) 2nd Auto Refresh (*) Command Command Set Command Any Command Don’t Care 200µs Note(*) :The Auto Refresh command can be issue before or after Mode Register Set command PAGE 29 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 22. Self Refresh Entry & Exit Cycle T0 T1 T2 CLK T3 T4 T5 T6 T7 T8 T9 T10 *Note 2 tXSR *Note 5 *Note 1 CKE T11 T12 T13 T14 T15 T16 T17 T18 T19 tIS tIH *Note 3,4 *Note 8 tPDE *Note 6 *Note 7 tIS CS# RAS# *Note 9 CAS# WE# BA0,1 A10 A0-A9, A11-A12 DQM Hi-Z Hi-Z DQ Self Refresh Entry Self Refresh Exit Auto Refresh Don’t Care Note: To Enter SelfRefresh Mode 1. CAS# with CKE should be low at the same clock cycle. 2. After 1 clock cycle, all the inputs including the system clock can be don’t care except for CKE. 3. The device remains in SelfRefresh mode as long as CKE stays "low". 4. Once the device enter SelfRefresh mode, minimum tRAS is required before exit from SelfRefresh. To Exit SelfRefresh Mode 5. System clock restart and be stable before returning CKE high. 6. Enable CKE and CKE should be set high for valid setup time and hold time. 7. CS# starts from high. 8. Minimum tXSR is required after CKE going high to complete SelfRefresh exit. 9. 8192 cycles of burst AutoRefresh is required before SelfRefresh entry and after SelfRefresh exit if the system uses burst refresh. PAGE 30 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 23.1. Clock Suspension During Burst Read (Using CKE) (Burst length=4, CAS# Latency=2) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx CAx DQM tHZ Hi-Z Ax0 DQ Ax1 Ax2 Ax3 Activate Read Clock Suspend Clock Suspend Clock Suspend Command Command 1 Cycle 2 Cycle 3 Cycle Bank A Bank A Don’t Care PAGE 31 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 23.2. Clock Suspension During Burst Read (Using CKE) (Burst Length=4, CAS# Latency=3) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE CS# RAS# CAS# WE# BA0,1 RAx A10 A0-A9, A11-A12 RAx CAx DQM tHZ Hi-Z Ax0 DQ Ax1 Ax2 Ax3 Activate Read Clock Suspend Clock Suspend Clock Suspend Command Command 1 Cycle 2 Cycle 3 Cycle Bank A Bank A Don’t Care PAGE 32 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 24. Clock Suspension During Burst Write (Using CKE) (Burst Length = 4) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE CS# RAS# CAS# WE# BA0,1 RAx A10 A0-A9, A11-A12 RAx CAx DQM Hi-Z DAx0 DQ Activate Command Bank A Write DAx1 DAx2 DAx3 Clock Suspend Clock Suspend Clock Suspend 1 Cycle 2 Cycle 3 Cycle Command Don’t Care Bank A PAGE 33 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 25. Power Down Mode and Clock Suspension (Burst Length=4, CAS# Latency=2) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK tIH tIS tPDE CKE Valid CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx CAx DQM tHZ Hi-Z Ax0 DQ Ax1 Ax2 ACTIVE Activate STANDBY Command Bank A Read Clock Suspension Clock Suspension Command Start End Power Down Power Down Bank A Mode Entry Mode Exit Ax3 Precharge Command Bank A PRECHARGE STANDBY Power Down Mode Exit Any Command Power Down Mode Entry PAGE 34 www.ctscorp.com Don’t Care Rev. B SDRAM Memory Technical Data Sheet Figure 26.1. Random Column Read (Page within same Bank) (Burst Length=4, CAS# Latency=2) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE CS# RAS# CAS# WE# BA0,1 A10 RAW A0-A9, A11-A12 RAW RAz CAW CAx CAy RAz CAz DQM Hi-Z Aw0 DQ Activate Command Bank A Read Command Bank A Aw1 Aw2 Aw3 Read Command Bank A Ax0 Ax1 Ay0 Ay1 Read Command Bank A Ay2 Ay3 Precharge Command Bank A Az0 Activate Command Bank A Read Command Bank A Don’t Care PAGE 35 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 26.2. Random Column Read (Page within same Bank) (Burst Length=4, CAS# Latency=3) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE CS# RAS# CAS# WE# BA0,1 A10 RAW A0-A9, A11-A12 RAW RAz CAW CAx CAy RAz CAz DQM Hi-Z Aw0 DQ Aw1 Aw2 Aw3 Ax0 Activate Read Read Read Command Command Command Command Bank A Bank A Bank A Bank A Ax1 Ay0 Ay1 Ay2 Precharge Command Bank A Ay3 Activate Read Command Command Bank A Bank A Don’t Care PAGE 36 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 27. Random Column Write (Page within same Bank) (Burst Length=4) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE CS# RAS# CAS# WE# BA0,1 A10 RBW A0-A9, A11-A12 RBW RBz CBx CBW CBy RBz CBz DQM Hi-Z DBw0 DQ DBw1 DBw2 DBw3 DBx0 DBx1 DBy0 DBy1 Activate Write Write Write Command Command Command Command Bank B Bank B Bank B Bank B DBy2 DBy3 DBz0 Precharge Command Bank B DBz1 Activate Write Command Command Bank B Bank B Don’t Care PAGE 37 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 28.1. Random Row Read (Interleaving Banks) (Burst Length=8, CAS# Latency=2) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE High CS# RAS# CAS# WE# BA0,1 A10 RBx A0-A9, A11-A12 RBx RBy RAx CBx RAx tAC tRCD RBy CAx CBy tRP DQM Hi-Z Bx0 DQ Bx1 Bx2 Bx3 Bx4 Bx5 Activate Read Activate Command Command Command Bank B Bank B Bank A Bx6 Bx7 Ax0 Read Command Bank A Precharge Command Bank B PAGE 38 www.ctscorp.com Ax1 Ax2 Ax3 Ax4 Ax5 Ax6 Ax7 Activate Read Command Command Bank B Bank B Don’t Care Rev. B SDRAM Memory Technical Data Sheet Figure 28.2. Random Row Read (Interleaving Banks) (Burst Length=8, CAS# Latency=3) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE High CS# RAS# CAS# WE# BA0,1 A10 RBx A0-A9, A11-A12 RBx RBy RAx RAx CBx RBy CAx tAC tRCD CBy tRP DQM Hi-Z DQ Bx0 Bx1 Bx2 Bx3 Activate Read Activate Command Command Command Bank B Bank B Bank A Bx4 Bx5 Bx6 Read Command Bank A Bx7 Ax0 Precharge Command Bank B Ax1 Ax2 Ax3 Ax4 Ax5 Ax6 Activate Read Command Command Bank B Bank B Ax7 By0 Precharge Command Bank A Don’t Care PAGE 39 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 29. Random Row Write (Interleaving Banks) (Burst Length=8) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE High CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx RBx RAy RBx CAx RAy CBx tRCD tWR* CAy tWR* tRP DQM DQ Hi-Z DAx0 DAx1 DAx2 DAx3 DAx4 DAx5 DAx6 DAx7 DBx0 DBx1 Activate Write Activate Write Command Command Command Command Bank A Bank A Bank B Bank B DBx2 DBx3 Precharge Command Bank A DBx4 DBx5 DBx6 DBx7 DAy0 DAy1 Activate Write Command Command Bank A Bank A DAy2 DAy3 Precharge Command Bank B Don’t Care *tWR>tWR (min.) PAGE 40 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 30.1. Read and Write Cycle (Burst Length=4, CAS# Latency=2) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx CAy CAx CAz DQM Hi-Z Ax0 DQ Ax1 Ax2 Ax3 DAy0 DAy1 DAy3 Az0 Activate Read Write The Write Data Read Command Command Command is Masked with a Command Bank A Bank A Bank A Zero Clock Bank A Latency PAGE 41 www.ctscorp.com Az1 Az3 The Read Data s Masked with a Two Clock Latency Don’t Care Rev. B SDRAM Memory Technical Data Sheet Figure 30.2. Read and Write Cycle (Burst Length=4, CAS# Latency=3) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx CAx CAy CAz DQM Hi-Z Ax0 DQ Ax1 Ax2 Ax3 DAy0 DAy1 DAy3 Az0 Activate Read Write The Write Data Command Command Command is Masked with a Bank A Bank B Bank A Zero Clock Read Latency Command Bank A PAGE 42 www.ctscorp.com Az1 Az3 The Read Data s Masked with a Two Clock Latency Don’t Care Rev. B SDRAM Memory Technical Data Sheet Figure 31.1. Interleaving Column Read Cycle (Burst Length=4, CAS# Latency=2) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx RBx RBx CAy CBw CBx Ax3 Bw0 CBy CAy CBz tRCD DQM tAC Hi-Z Ax0 DQ Ax1 Ax2 Bw1 Bx0 Bx1 By0 By1 Ay0 Ay1 Activate Read Activate Read Read Read Read Read Command Command Command Command Command Command Command Command Bank A Bank A Bank B Bank B Bank B Bank B Bank A Bank B Bz0 Precharge Command Bank A Bz1 Bz2 Bz3 Precharge Command Bank B Don’t Care PAGE 43 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 31.2. Interleaved Column Read Cycle (Burst Length=4, CAS# Latency=3) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx RBx CAx RBx CBx CBy CBz CAy tRCD DQM tAC Hi-Z Ax0 DQ Ax1 Ax2 Ax3 Bx0 Bx1 By0 By1 Bz0 Activate Read Read Read Read Read Command Command Command Command Command Command Bank B Bank B Bank A Bank A Bank A Activate Bank B Bz1 Precharge Command Bank B Ay0 Ay1 Ay2 Ay3 Precharge Command Bank A Don’t Care Command Bank B PAGE 44 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 32. Interleaved Column Write Cycle (Burst Length=4) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx RBw RBw CAx CBw CBx CBy CAy tRCD CBz tWR tWR DQM tRRD>tRRD(min) Hi-Z DAx0 DQ DAx1 DAx2 DAx3 DBw0 DBw1 DBx0 DBx1 DBy0 DBy1 DAy0 DAy1 DBz0 DBz1 DBz2 Activate Write Write Write Write Write Write Command Command Command Command Command Command Bank A Bank A Bank B Bank B Bank B Bank A Command Bank B Precharge Command Bank A Activate Command DBz3 Precharge Command Bank B Don’t Care Bank B PAGE 45 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 33.1. Auto Precharge after Read Burst (Burst Length=4, CAS# Latency=2) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE High Begin Auto Begin Auto Precharge Precharge Bank B Bank A CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx RBx CAx RBy RBx CBx CAy RAz RBy CBy RAz tRP DQM Hi-Z Ax0 DQ Ax1 Ax2 Ax3 Bx0 Bx1 Bx2 Bx3 Ay0 Ay1 Ay2 Ay3 By0 By1 Activate Read Activate Read with Read with Activate Read with Activate Command Command Command Auto Precharge Auto Precharge Command Auto Precharge Command Bank A Bank A Bank B Command Command Bank B Command Bank A Bank B Bank A PAGE 46 www.ctscorp.com Bank B By2 Don’t Care Rev. B SDRAM Memory Technical Data Sheet Figure 33.2. Auto Precharge after Read Burst (Burst Length=4, CAS# Latency=3) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE High Begin Auto Begin Auto Precharge Precharge Bank B Bank A CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx RBy RBx CAx RBx CAy CBx RBy CBy tRP DQM Hi-Z Ax0 DQ Ax1 Ax2 Ax3 Bx0 Bx1 Bx2 Bx3 Ay0 Ay1 Ay2 Ay3 Activate Read Read with Read with Activate Read with Command Command Auto Precharge Auto Precharge Command Auto Precharge Bank A Bank A Command Command Bank B Command Bank B Bank A Activate Command Bank B By0 By1 By2 Don’t Care Bank B PAGE 47 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 34. Auto Precharge after Write Burst (Burst Length=4) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE High Begin Auto Begin Auto Precharge Precharge Bank B Bank A CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx RBx CAx RBy RBx CBx CAy RBy CBy tDAL RAz DQM Hi-Z DAx0 DAx1 DQ DAx2 DAx3 DBx0 DBx1 DBx2 DBx3 DAy0 DAy1 DAy2 DAy3 DBy0 DBy1 DBy2 Activate Write Write with Write with Activate Write with Command Command Auto Precharge Auto Precharge Command Auto Precharge Bank A Bank A Command Command Bank B Command Bank B Bank A Activate Command Bank B DBy3 Don’t Care Bank B PAGE 48 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 35.1. Full Page Read Cycle (Burst Length=Full Page, CAS# Latency=2) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE High CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx RBx CAx RBy RBx CBx RBy tRP DQM Hi-Z Ax DQ Ax+1 Ax+2 Ax-2 Ax-1 Activate Read Activate Command Command Command from the highest order Bank A Bank A Bank B The burst counter wraps page address back to zero during this time interval Ax Ax+1 Bx Bx+1 Bx+2 Bx+3 Bx+4 Bx+5 Bx+6 Precharge Command Bank B Read Command Bank B Full Page burst operation does not Burst Stop terminate when the burst length is satisfied; Command Activate Command Bank B Don’t Care the burst counter increments and continues Bursting beginning with the starting address PAGE 49 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 35.2. Full Page Read Cycle (Burst Length=Full Page, CAS# Latency=3) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE High CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx RBx CAx RBy RBx CBx RBy tRP DQM Hi-Z Ax DQ Activate Read Activate Command Command Command Bank A Bank A Bank B Ax+1 Ax+2 Ax-2 Ax-1 Ax Ax+1 Bx Bx+1 Read Command Bank B Bx+2 Bx+3 Bx+4 Bx+5 Precharge Command Bank B The burst counter wraps from the highest order Burst Stop page address back to zero Command Activate Command Bank B Don’t Care during this time interval Full Page burst operation does not terminate when the burst length is satisfied; the burst counter increments and continues Bursting beginning with the starting address PAGE 50 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 36. Full Page Write Cycle (Burst Length=Full Page) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE High CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx RBx RBy RBx CAx CBx RBy DQM Data is ignored Hi-Z DAx DQ DAx+1 DAx+2 Activate Write Activate Command Command Command Bank A Bank A Bank B DAx+3 DAx-1 DAx DAx+1 DBx DBx+1 DBx+2 DBx+3 DBx+4 DBx+5 Write Command Bank B The burst counter wraps from the highest order Full Page burst operation does not page address back to zero terminate when the burst length is satisfied; the burst counter increments and continues during this time interval Precharge Command Bank B Burst Stop Command Activate Command Bank B Don’t Care Bursting beginning with the starting address PAGE 51 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 37. Byte Write Operation (Burst Length=4, CAS# Latency=2) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE High CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx CAz CAy CAx DQML DQMH DQ0-DQ7 Ax0 DQ8-DQ15 Ax1 Ax2 Ax1 Ax2 DAy1 Ax3 DAy0 Activate Read Upper Byte Lower Byte Command Command is masked is masked Bank A Bank A Day2 DAy1 Write Command Bank A Az1 DAy3 Az0 Upper Byte Read is masked Command Bank A PAGE 52 www.ctscorp.com Az2 Az1 Lower Byte is masked Az2 Az3 Lower Byte is masked Don’t Care Rev. B SDRAM Memory Technical Data Sheet Figure 38. Random Row Read (Interleaving Banks) (Burst Length=4, CAS# Latency=2) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE High Begin Auto Begin Auto Begin Auto Begin Auto Precharge Precharge Precharge Precharge Bank B Bank A Bank B Bank A CS# RAS# CAS# WE# BA0,1 A10 RBu Ax A0-A9, A11-A12 RBu Ax RAu Bx CBu RBv CAu RAu RAv RBv CBv RBw RAv CAv RBw tRP tRP tRP DQM Bu0 DQ Activate Command Bank B Read Bank B with Auto Bu1 Bu2 Bu3 Au0 Au1 Au2 Au3 Bv0 Bv1 Bv2 Activate Read Activate Activate Read Command Bank A Command Command Bank A Bank A with Auto Bank B Bank A with Auto Precharge Read Bank B with Auto Precharge Precharge PAGE 53 www.ctscorp.com Bv3 Av0 Av1 Av2 Av3 Activate Command Bank B Precharge Don’t Care Rev. B SDRAM Memory Technical Data Sheet Figure 39. Full Page Random Column Read (Burst Length=Full Page, CAS# Latency=2) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE CS# RAS# CAS# WE# BA0,1 A10 RAx RBx A0-A9, A11-A12 RAx RBx RBw CAx CBx Cay CBy CAz CBz RBw tRP DQM tRRD tRCD Hi-Z Ax0 DQ Ax1 Bx0 Ay0 Ay1 By0 By1 Az0 Az1 Az2 Bz0 Bz1 Bz2 Activate Activate Read Read Read Read Precharge Activate Command Command Command Command Command Command CommandBank B Command Bank A Bank B Bank B Bank B Bank A Bank B (Precharge Temination) Bank B Read Read Command Command Bank A Bank A Don’t Care PAGE 54 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 40. Full Page Random Column Write (Burst Length=Full Page) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE CS# RAS# CAS# WE# BA0,1 A10 RAx RBx A0-A9, A11-A12 RAx RBx RBw CAx CBx CAy CBy CAz CBz RBw tRP tWR DQM tRRD Hi-Z tRCD DQ DAx0 DAx1 DBx0 DAy0 DAy1 DBy0 DBy1 DAz0 DAz1 DAz2 DBz0 DBz1 DBz2 Activate Activate Write Write Write Write Precharge Activate Command Command Command Command Command Command CommandBank B Command Bank A Bank B Bank B Bank B Bank A Bank B (Precharge Temination) Bank B Write Write Command Command Bank A Bank A Write Data are masked PAGE 55 www.ctscorp.com Don’t Care Rev. B SDRAM Memory Technical Data Sheet Figure 41. Precharge Termination of a Burst (Burst Length=4,8 or Full Page, CAS# Latency=3) T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15T16 T17 T18 T19 T20 T21 T22 CLK CKE High CS# RAS# CAS# WE# BA0,1 A10 RAx A0-A9, A11-A12 RAx RAz RAy CAx RAy tWR CAy RAz tRP tRP DQM DAx0 DQ DAx1 Activate Write Command Command Bank B Bank A Ay0 Precharge Command Bank A Precharge Termination Ay1 Ay2 Activate Read Precharge Activate Precharge Temination Command Command Command Command of a Read Burst Bank A Bank A Bank B Bank A of a Write Burst Write Data are masked Don’t Care PAGE 56 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 42.1 CLGA96 Package Information □11.00±0.15 K J H G F E D C B A 1 2 3 4 5 6 7 8 9 10 TOP VIEW 2X9.16 P. 1.00X9=9.00±0.1 4x (R0.15) 4X P.1.00 0.752 P. 1.00X9=9.00±0.1 G F E D P.1.00 2X9.16 H 4X J 0.752 K C B A 92X 10 9 8 7 6 5 4 3 2 1 0.60 INDEX MARK (C0.20) BOTTOM VIEW PAD PLATING Ni: 5μm ;Au: 0.5μm. PAGE 57 www.ctscorp.com Rev. B SDRAM Memory Technical Data Sheet Figure 42.2 CLCC64 Package Information □ 18.29±0.2 56 41 57 40 64 1 8 25 9 24 1.016 +0.15 P. 1.016X16=15.24 P. 1.016 63X 1.524±0.1 TOP VIEW 41 56 40 57 64X R0.19 INDEX MARK PIN NO.1 64 64X 0.508 1 8 25 0.508 X45 3X (R0.095 ) 9 24 2.16 +0.20 BOTTOM VIEW PAD PLATING Au: 1.5μm. PAGE 58 www.ctscorp.com Rev. B