NSC DS90LV110AT

DS90LV110AT
1 to 10 LVDS Data/Clock Distributor with Failsafe
General Description
Features
DS90LV110A is a 1 to 10 data/clock distributor utilizing LVDS
(Low Voltage Differential Signaling) technology for low
power, high speed operation. Data paths are fully differential
from input to output for low noise generation and low pulse
width distortion. The design allows connection of 1 input to
all 10 outputs. LVDS I/O enable high speed data transmission for point-to-point interconnects. This device can be used
as a high speed differential 1 to 10 signal distribution / fanout
replacing multi-drop bus applications for higher speed links
with improved signal quality. It can also be used for clock
distribution up to 200MHz.
n Low jitter 400 Mbps fully differential data path
n 145 ps (typ) of pk-pk jitter with PRBS = 223−1 data
pattern at 400 Mbps
n Single +3.3 V Supply
n Balanced output impedance
n Output channel-to-channel skew is 35ps (typ)
n Differential output voltage (VOD) is 320mV (typ) with
100Ω termination load.
n LVDS receiver inputs accept LVPECL signals
n LVDS input failsafe
n Fast propagation delay of 2.8 ns (typ)
n Receiver open, shorted, and terminated input failsafe
n 28 lead TSSOP package
n Conforms to ANSI/TIA/EIA-644 LVDS standard
The DS90LV110A accepts LVDS signal levels, LVPECL levels directly or PECL with attenuation networks.
The LVDS outputs can be put into TRI-STATE by use of the
enable pin.
For more details, please refer to the Application Information
section of this datasheet.
Connection Diagram
Block Diagram
20098201
20098205
Order Number DS90LV110ATMT
See NS Package Number MTC28
© 2004 National Semiconductor Corporation
DS200982
www.national.com
DS90LV110AT 1 to 10 LVDS Data/Clock Distributor with Failsafe
October 2004
DS90LV110AT
Absolute Maximum Ratings (Note 1)
Package Derating
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
θJA
Supply Voltage (VDD-VSS)
LVCMOS/LVTTL Input Voltage
(EN)
28L TSSOP
9.67 mW/˚C above +25˚C
28L TSSOP
−0.3V to +4V
103.4 ˚C/Watt
ESD Rating:
> 4 kV
> 250 V
(HBM, 1.5kΩ, 100pF)
−0.3V to (VCC + 0.3V)
(EIAJ, 0Ω, 200pF)
LVDS Receiver Input Voltage
(IN+, IN−)
−0.3V to +4V
LVDS Driver Output Voltage
(OUT+, OUT−)
−0.3V to +4V
Junction Temperature
Recommended Operating
Conditions
+150˚C
Storage Temperature Range
Min Typ Max Units
−65˚C to +150˚C
Supply Voltage (VDD - VSS)
Lead Temperature
Receiver Input Voltage
(Soldering, 4 sec.)
+260˚C
3.0
3.3
3.6
V
VDD
V
+25 +85
˚C
0
Operating Free Air Temperature
-40
Maximum Package Power Dissipation at 25˚C
28L TSSOP
1.209 W
Electrical Characteristics
Over recommended operating supply and temperature ranges unless otherwise specified
Symbol
Parameter
Conditions
Min
Typ
Max
Units
VDD
V
LVCMOS/LVTTL DC SPECIFICATIONS (EN)
VIH
High Level Input Voltage
2.0
VIL
Low Level Input Voltage
IIH
High Level Input Current
VIN = 3.6V or 2.0V; VDD = 3.6V
IIL
Low Level Input Current
VIN = 0V or 0.8V; VDD = 3.6V
VCL
Input Clamp Voltage
ICL = −18 mA
VSS
0.8
V
±7
±7
± 20
± 20
µA
−0.8
−1.5
V
µA
LVDS OUTPUT DC SPECIFICATIONS (OUT1, OUT2, OUT3, OUT4, OUT5, OUT6, OUT7, OUT8, OUT9, OUT10)
VOD
Differential Output Voltage
RL = 100Ω
250
320
450
mV
RL = 100Ω, VDD = 3.3V, TA = 25˚C
260
320
425
mV
35
|mV|
1.125
1.25
1.375
V
35
|mV|
±1
± 10
µA
± 10
µA
∆VOD
Change in VOD between Complimentary Output States
VOS
Offset Voltage (Note 3)
∆VOS
Change in VOS between Complimentary Output States
IOZ
Output TRI-STATE Current
EN = 0V,
VOUT = VDD or GND
IOFF
Power-Off Leakage Current
VDD = 0V; VOUT = 3.6V or GND
±1
ISA,ISB
Output Short Circuit Current
VOUT+ OR VOUT− = 0V or VDD
12
24
|mA|
ISAB
Both Outputs Shorted (Note 4)
VOUT+ = VOUT−
6
12
|mA|
VCM = +0.05V or +1.2V or +3.25V,
0
+100
mV
LVDS RECEIVER DC SPECIFICATIONS (IN)
VTH
Differential Input High Threshold
VTL
Differential Input Low Threshold
VDD = 3.3V
−100
VCMR
Common Mode Voltage Range
VID = 100mV, VDD = 3.3V
0.05
IIN
Input Current
VIN = +3.0V, VDD = 3.6V or 0V
VIN = 0V, VDD = 3.6V or 0V
www.national.com
2
0
±1
±1
mV
3.25
V
± 10
± 10
µA
µA
(Continued)
Over recommended operating supply and temperature ranges unless otherwise specified
Symbol
Parameter
Conditions
Min
Typ
Max
Units
125
160
mA
No Load, 200 MHz, EN = High
80
125
mA
EN = Low
15
29
mA
SUPPLY CURRENT
ICCD
Total Supply Current
RL = 100Ω, CL = 5 pF, 200 MHz,
EN = High
ICCZ
TRI-STATE Supply Current
Note 1: “Absolute Maximum Ratings” are these beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the device should
be operated at these limits. The table of “Electrical Characteristics” provides conditions for actual device operation.
Note 2: All typical are given for VCC = +3.3V and TA = +25˚C, unless otherwise stated.
Note 3: VOS is defined as (VOH + VOL) / 2.
Note 4: Only one output can be shorted at a time. Don’t exceed the package absolute maximum rating.
AC Electrical Characteristics
Over recommended operating supply and temperature ranges unless otherwise specified.
Symbol
Parameter
Conditions
Min
Typ
Max
Units
TLHT
Output Low-to-High Transition Time, 20% to 80%, Figure 4
(Note 5)
390
550
ps
THLT
Output High-to-Low Transition Time, 80% to 20%, Figure 4
(Note 5)
390
550
ps
TDJ
LVDS Data Jitter, Deterministic
(Peak-to-Peak)(Note 6)
VID = 300mV; PRBS=223-1 data;
VCM = 1.2V at 400 Mbps (NRZ)
145
ps
TRJ
LVDS Clock Jitter, Random (Note 6)
VID = 300mV; VCM = 1.2V
at 200 MHz clock
2.8
ps
TPLHD
Propagation Low to High Delay, Figure 5
2.2
2.8
3.6
ns
TPHLD
Propagation High to Low Delay, Figure 5
2.2
2.8
3.9
ns
TSKEW
Pulse Skew |TPLHD - TPHLD| (Note 5)
20
340
ps
TCCS
Output Channel-to-Channel Skew, Figure 6 (Note 5)
35
91
ps
TPHZ
Disable Time (Active to TRI-STATE) High to Z, Figure 1
3.0
6.0
ns
TPLZ
Disable Time (Active to TRI-STATE) Low to Z, Figure 1
1.8
6.0
ns
TPZH
Enable Time (TRI-STATE to Active) Z to High, Figure 1
10.0
23.0
ns
TPZL
Enable Time (TRI-STATE to Active) Z to Low, Figure 1
7.0
23.0
ns
Note 5: The parameters are guaranteed by design. The limits are based on statistical analysis of the device performance over PVT (process, voltage and
temperature) range.
Note 6: The measurement used the following equipment and test setup: HP8133A pattern/pulse generator), 5 feet of RG-142 cable with DUT test board and
HP83480A (digital scope mainframe) with HP83484A (50GHz scope module). The HP8133A with the RG-142 cable exhibit a TDJ = 26ps and TRJ = 1.3 ps
3
www.national.com
DS90LV110AT
Electrical Characteristics
DS90LV110AT
AC Timing Diagrams
20098204
FIGURE 1. Output active to TRI-STATE and TRI-STATE to active output time
20098215
FIGURE 2. LVDS Driver TRI-STATE Circuit
20098206
FIGURE 3. LVDS Output Load
20098209
FIGURE 4. LVDS Output Transition Time
www.national.com
4
DS90LV110AT
AC Timing Diagrams
(Continued)
20098207
FIGURE 5. Propagation Delay Low-to-High and High-to-Low
20098208
FIGURE 6. Output 1 to 10 Channel-to-Channel Skew
5
www.national.com
DS90LV110AT
DS90LV110A Pin Descriptions
Pin Name
# of Pin
Input/Output
IN+
1
I
Non-inverting LVDS input
Description
IN -
1
I
Inverting LVDS input
OUT+
10
O
Non-inverting LVDS Output
OUT -
10
O
Inverting LVDS Output
EN
1
I
This pin has an internal pull-down when left open. A
logic low on the Enable puts all the LVDS outputs into
TRI-STATE and reduces the supply current.
VSS
3
P
Ground (all ground pins must be tied to the same
supply)
VDD
2
P
Power Supply (all power pins must be tied to the same
supply)
cies, and makes the value and placement of external bypass
capacitors less critical. External bypass capacitors should
include both RF ceramic and tantalum electrolytic types. RF
capacitors may use values in the range 0.01 µF to 0.1 µF.
Tantalum capacitors may be in the range 2.2 µF to 10 µF.
Voltage rating for tantalum capacitors should be at least 5X
the power supply voltage being used. It is recommended
practice to use two vias at each power pin of the
DS90LV110A as well as all RF bypass capacitor terminals.
Dual vias reduce the interconnect inductance by up to half,
thereby reducing interconnect inductance and extending the
effective frequency range of the bypass components.
The outer layers of the PCB may be flooded with additional
ground plane. These planes will improve shielding and isolation as well as increase the intrinsic capacitance of the
power supply plane system. Naturally, to be effective, these
planes must be tied to the ground supply plane at frequent
intervals with vias. Frequent via placement also improves
signal integrity on signal transmission lines by providing
short paths for image currents which reduces signal distortion. The planes should be pulled back from all transmission
lines and component mounting pads a distance equal to the
width of the widest transmission line or the thickness of the
dielectric separating the transmission line from the internal
power or ground plane(s) whichever is greater. Doing so
minimizes effects on transmission line impedances and reduces unwanted parasitic capacitances at component
mounting pads.
There are more common practices which should be followed
when designing PCBs for LVDS signaling. Please see Application Note: AN-1108 for additional information.
Application Information
INPUT FAIL-SAFE
The receiver inputs of the DS90LV110A have internal failsafe biasing for short, open, and teminated input conditions.
LVDS INPUTS TERMINATION
The LVDS Receiver input must have a 100Ω termination
resistor placed as close as possible across the input pins.
UNUSED CONTROL INPUTS
The EN control input pin has internal pull down device. If left
open, the 10 outputs will default to TRI-STATE.
EXPANDING THE NUMBER OF OUTPUT PORTS
To expand the number of output ports, more than one
DS90LV110A can be used. Total propagation delay through
the devices should be considered to determine the maximum expansion. Adding more devices will increase the output jitter due to each pass.
PCB LAYOUT AND POWER SYSTEM BYPASS
Circuit board layout and stack-up for the DS90LV110A
should be designed to provide noise-free power to the device. Good layout practice also will separate high frequency
or high level inputs and outputs to minimize unwanted stray
noise pickup, feedback and interference. Power system performance may be greatly improved by using thin dielectrics
(4 to 10 mils) for power/ground sandwiches. This increases
the intrinsic capacitance of the PCB power system which
improves power supply filtering, especially at high frequen-
www.national.com
6
DS90LV110AT
Multi-drop Applications
20098202
Point-to-Point Distribution Applications
20098203
For applications operating at data rate greater than 400Mbps, a point-to-point distribution application should be used. This
improves signal quality compared to multi-drop applications due to no stub PCB trace loading. The only load is a receiver at the
far end of the transmission line. Point-to-point distribution applications will have a wider LVDS bus lines, but data rate can
increase well above 400Mbps due to the improved signal quality.
7
www.national.com
DS90LV110AT
Typical Performance Characteristics
Output Voltage (VOD) vs. Resistive Load (RL)
Peak-to-Peak Output Jitter at VCM = +0.4V vs. VID
20098212
20098211
Peak-to-Peak Output Jitter at VCM = +1.2V vs. VID
Peak-to-Peak Output Jitter at VCM = +2.9V vs. VID
20098213
www.national.com
20098214
8
DS90LV110AT 1 to 10 LVDS Data/Clock Distributor with Failsafe
Physical Dimensions
inches (millimeters) unless otherwise noted
NS Package Number MTC28
Order Number DS90LV110ATMT (Rail quantity of 48)
DS90LV110ATMTX (2500 piece Tape and Reel)
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves
the right at any time without notice to change said circuitry and specifications.
For the most current product information visit us at www.national.com.
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS
WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL COUNSEL OF NATIONAL SEMICONDUCTOR
CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body, or
(b) support or sustain life, and whose failure to perform when
properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to result
in a significant injury to the user.
2. A critical component is any component of a life support
device or system whose failure to perform can be reasonably
expected to cause the failure of the life support device or
system, or to affect its safety or effectiveness.
BANNED SUBSTANCE COMPLIANCE
National Semiconductor certifies that the products and packing materials meet the provisions of the Customer Products Stewardship
Specification (CSP-9-111C2) and the Banned Substances and Materials of Interest Specification (CSP-9-111S2) and contain no ‘‘Banned
Substances’’ as defined in CSP-9-111S2.
National Semiconductor
Americas Customer
Support Center
Email: [email protected]
Tel: 1-800-272-9959
www.national.com
National Semiconductor
Europe Customer Support Center
Fax: +49 (0) 180-530 85 86
Email: [email protected]
Deutsch Tel: +49 (0) 69 9508 6208
English Tel: +44 (0) 870 24 0 2171
Français Tel: +33 (0) 1 41 91 8790
National Semiconductor
Asia Pacific Customer
Support Center
Email: [email protected]
National Semiconductor
Japan Customer Support Center
Fax: 81-3-5639-7507
Email: [email protected]
Tel: 81-3-5639-7560