AGILENT N4375B

Agilent
N4375B
20 GHz and 26.5 GHz Single-Mode
Lightwave Component Analyzer
for 10GbE -LR, OC 192, FCx8, FCx17(16)
Data Sheet
General Information
Key benefits
Agilent’s N4375B Lightwave Component Analyzer (LCA) is the
instrument of choice to test 10G Ethernet, FCx8, FCx10 and
FCx16 electro-optical components, with up to 20 or 26.5 GHz
modulation range.
‡
Modern optical transmission systems require fast, accurate
and repeatable characterization of the core electro-optical
components, the transmitter, receiver, and their subcomponents (lasers, modulators and detectors), to guarantee performance with respect to modulation bandwidth, jitter, gain,
and distortion of the final transceiver.
For frequency dependent responsivity measurements
the N4375B is the successor of the industry standard
8703A/B LCAs.
With a completely new design of the optical test set and a
new RF-switched architecture, together with the latest PNA
family of network analyzers, the N4375B guarantees excellent electro-optical measurement performance. In addition
a unique new calibration concept significantly reduces time
from powering up the LCA until the first calibrated measurement can be made. This increases productivity in R&D and
on the manufacturing floor.
The fully integrated “turnkey” solution reduces time to market, compared to the time-consuming development of a selfmade setup.
By optimizing the electrical and optical design of the N4375B
for lowest noise and ripple, the accuracy has been improved
by more than a factor of 3 and is now independent of the
electrical reflection coefficient of the device under test.
It’s the excellent accuracy that improves the yield from tests
performed with the N4375B, by narrowing margins needed
to pass the tested devices. NIST traceability ensures worldwide comparability of test results.
The advanced optical design together with temperaturestabilized transmitter and receiver ensures repeatable measurements over days without recalibration.
Using the advanced measurement capabilities of the network analyzer, all S-parameter related characteristics of the
device under test, like responsivity, ripple, group delay and
3dB-cutoff frequency, can be qualified with the new N4375B
Lightwave Component Analyzer from 10 MHz to 20 GHz.
‡
‡
‡
‡
‡
High absolute and relative accuracy measurements
improve the yield of development and production processes. With the excellent accuracy and reproducibility, measurement results can be compared among test
locations world wide.
High confidence and fast time-to-market with a NISTtraceable turnkey solution.
Significantly increased productivity using the fast and
easy measurement setup with an unique new calibration process leads to lower cost of test.
More than 3 times faster than predecessor 8703A/B
series speeds up every test procedure
New switched architecture of optical test set for longterm reliability and stability of test results.
Identical LCA software and remote control across the
N437xB family simplifies integration
Relative frequency response uncertainty:
± 0.5 dB @ 20GHz (typ)
Absolute frequency response uncertainty:
± 1.5 dB @ 20GHz (typ)
Noise floor:
-86 dB W/A for E/O measurements @ 20 GHz
-76 dB A/W for O/E measurements @ 20 GHz
Typical phase uncertainty:
±2.0°
Transmitter wavelength:
1550nm ± 20 nm
1310nm ± 20 nm
1290 - 1610 nm with external source input
Built-in optical power meter
For fast transmitter power verification
Powerful remote control:
State of the art programming interface based on Microsoft
.NET or COM.
Warranty:
1 year warranty is standard for N4375B Lightwave Component Analyzer;
Extension to 3 years available.
The network analyzer
The N4375B comes in two basic versions. The economic line
is based on a PNA-L network-analyzer and is available as a
2 port system. The high end version is based on the new
PNA-X and offers true balanced measurements, extended
optical modulation index (OMI) and is available with 2 or
4 ports. Both versions have the same specifications up to 20
GHz. The PNA-X based LCA is calibrated up to 26.5 GHz.
2
Agilent N4375B Applications
Agilent N4375B Features
In digital photonic transmission systems, the performance
is ultimately determined by bit error ratio test (BERT), which
parameter describes the performance of the whole system.
However it is necessary to design and qualify subcomponents like modulators and receivers, which are analog by nature, with different parameters. Those parameters are core
to the overall system performance.
These electro-optical components significantly influence the
overall performance of the transmission system via the following parameters:
‡ 3dB bandwidth of the electro-optical transmission
‡ Relative frequency response, quantifying the electrooptical shape of the conversion.
‡ Absolute frequency response, relating to the conversion efficiency of signals from the input to the output,
or indicating the gain of a receiver.
‡ Electrical reflection at the RF port
‡ Group delay of the electro-optical transfer funktion
Only a careful design of these electro-optical components
over a wide modulation signal bandwidth guarantees successful operation in the transmission system.
Turnkey solution
In today’s highly competitive environment, short time-tomarket with high quality is essential for new products. Instead of developing a home-grown measurement solution
which takes a lot of time and is limited in transferability and
support, a fully specified and supported solution helps to focus resources on faster development and on optimizing the
manufacturing process.
In the N4375B all optical and electrical components are
carefully selected and matched to each other to minimize
noise and ripple in the measurement traces. Together with
the temperature stabilized environment of the core components, this improves the repeatability and the accuracy
of the overall system. Extended factory calibration data at
various optical power levels ensures accurate and reliable
measurements that can only be achieved with an integrated
solution like the N4375B.
Easy calibration
An LCA essentially measures the conversion relation between optical and electrical signals. This is why user calibration of such systems can evolve into a time consuming
task. With the new calibration process implemented in the
N4375B, the tasks that have to be done by the user are reduced to one pure electrical calibration. The calibration with
an electrical microwave calibration module is automated
and needs only minimal manual interaction.
Electro-optical components
The frequency response of amplified or unamplified detector
diodes, modulators and directly modulated lasers typically
depends on various parameters, like bias voltages, optical
input power, operating current and ambient temperature. To
determine the optimum operating point of these devices, an
LCA helps by making a fast characterization of the electrooptic transfer function while optimizing these operating
conditions. In parallel the LCA also measures the electrical
return loss.
In manufacturing it is important to be able to monitor the
processes regularly to keep up the throughput and yield. In
this case the LCA is the tool of choice to monitor transmission characteristics and absolute responsivity of the manufactured device. The remote control of the N4375B offers another tool to improve the productivity by making automated
measurements and analysis of the measured data.
Built-in performance verification
Sometimes it is necessary to make a quick verification of the
validity of the calibration and the performance of the system.
The N4375B’s unique calibration process allows the user to
perform a self-test without external reference devices. This
gives full confidence that the system performance is within
the user’s required uncertainty bands.
State-of-the-art remote control
Testing the frequency response of electro-optical components under a wide range of parameters, which is often
necessary in qualification cycles, is very time consuming.
To support the user in minimizing the effort for performing this huge number of tests, all functions of the LCA can
be controlled remotely via LAN over the state-of-the-art
Microsoft .NET or COM interface.
Based on programming examples for VBA with Excel, Agilent VEE and C++, it is very easy for every user to build applications for their requirements.
These examples cover applications like integration of complete LCA measurement sequences.
Electrical components
Electrical components such as amplifiers, filters and transmission lines are used in modern transmission systems and
require characterization to ensure optimal performance.
Typical measurements are bandwidth, insertion loss or gain,
impedance match and group delay. The new switched architecture offers direct access to the electrical outputs and inputs of the network-analyzers just by selecting electrical- to
electrical measurement mode in the LCA user interface.
3
Integrated optical power meter
In applications where optical power dependence characterization is needed, the average power meter can be used to
set the exact average output power of the LCA transmitter
by connecting the LCA optical transmitter output, optionally
through an optical attenuator, to the LCA optical receiver input. By adjusting the transmitter output power in the LCA
user interface or the optical attenuation, the desired transmitter optical power can be set.
In cases where an unexpectedly low responsivity is measured from the device under test, it is very helpful to get a
fast indication of the CW optical power that is launched into
the LCA receiver. The cause might be a bad connection or a
bent fiber in the setup. For this reason too, a measurement
of the average optical power at the LCA receiver is very helpful for fast debugging of the test setup.
Selectable output power of the transmitter
Most PIN diodes and receiver optical subassemblies (ROSA’s) need to be characterized at various average optical
power levels. In this case it is necessary to set the average
input power of the device under test to the desired value.
The variable average optical output power of the LCA transmitter offers this feature. Together with an external optical
attenuator, this range can be extended to all desired optical
power levels.
Group delay and length measurements
In some applications it is necessary to determine the electrical or optical length of a device. With the internal length
calibration of the electro-optical paths with reference to the
electrical and optical inputs or outputs, it is possible to determine the length of the device under test
Large signal measurements
LCA S21 measurements are typically small-signal linear
transfer function measurements. If an electro-optical component must be tested under large signal conditions, normal
balanced measurements might lead to wrong measurement
results.
The PNA-X based version of the LCA offers true balanced
measurements for differential ports by offering two independent high power RF sources. With this setup the LCA measures the correct S21 transfer function of E/O components,
even in the nonlinear regime.
To stimulate O/E components like PIN-TIA receivers under
optical large signal conditions, the PNA-X based LCA offers
a variable optical modulation index up 50%.
External optical source input
For applications where test of opto-electric devices need to
be done at a specific optical wavelength, the N4375B-050
offers an external optical input to the internal modulator
where an external tunable laser can be applied. As modulators are polarization sensitive devices, this input is a PMF
input to a PMF optical switch to maintain the polarization
at the modulator input.
4
Definitions
Explanation of terms
Generally, all specifications are valid at the stated operating and measurement conditions and settings, with uninterrupted line voltage.
Responsivity
For electro-optical devices (e.g. modulators ) this describes
the ratio of the optical modulated output signal amplitude
compared to the RF input amplitude of the device.
For opto-electrical devices (e.g. photodiodes) this describes
the ratio of at the RF amplitude at the device output to the
amplitude of the modulated optical signal input. .
Specifications (guaranteed)
Describes warranted product performance that is valid under
the specified conditions.
Specifications include guard bands to account for the expected statistical performance distribution, measurement
uncertainties changes in performance due to environmental
changes and aging of components.
Relative frequency response uncertainty
Describes the maximum deviation of the shape of a measured trace from the (unknown) real trace. This specification
has strong influence on the accuracy of the 3-dB cut-off frequency determined for the device under test.
Typical values (characteristics)
Characteristics describe the product performance that is
usually met but not guaranteed. Typical values are based on
data from a representative set of instruments.
Absolute frequency response uncertainty
Describes the maximum difference between any amplitude
point of the measured trace and the (unknown) real value.
This specification is useful to determine the absolute responsivity of the device versus modulation frequency.
General characteristics
Give additional information for using the instrument. These
are general descriptive terms that do not imply a level of
performance.
Frequency response repeatability
Describes the deviation of repeated measurement without
changing any parameter or connection relative to the average of this measurements.
Minimum measurable frequency response
Describes the average measured responsivity when no modulation signal is present at the device under test. This represents the noise floor of the measurement system.
Definition of LCA input and output names
LCA electrical port A
LCA optical output
LCA electrical port B
LCA optical input
5
Agilent N4375B Specifications
Measurement capabilities
3dB cut-off frequency (S21),
Responsivity (S21),
Electrical reflection (S11 or S22),
Group Delay vs. frequency,
Insertion Loss (IL),
Transmission bandwidth,
all electrical S-parameter measurements.
Measurement conditions
‡ Modulation frequency range from 10 MHz to 20.0 GHz
‡ Foreward RF power +5 dBm,
option -312, -314, -392, -394
‡ Foreward RF power +3 dBm, option -322, -382
‡ Reverse RF power 0 dBm
‡ Number of averages: 1
‡ 100 Hz IFBW (“Reduce IF bandwidth at low frequency”
enabled) with modulation frequency step size 10 MHz
and measurement points on a 10 MHz raster (if not
differently stated)
‡ Network analyzer set to “stepped sweep – sweep
moves in discrete steps”
‡ All network-analyzer ports configured in standard
coupler configuration (“CPLR ARM” to “RCVB B in”,
“SOURCE OUT” to “CPLR THRU”)
‡ After full two-port electrical calibration using an
Electronic Calibration Module, Agilent N4691B, at
constant temperature (±1° C)
‡ Modulator bias optimization set to “every sweep”
‡ Measurement frequency grid equals electrical
calibration grid
‡ DUT signal delay ≤ 0.1/IF-BW
‡ Specified temperature range: +20° C to +26° C.
‡ After warm-up time of 90 minutes
‡ Using high quality electrical and optical connectors
and RF cables in perfect condition
‡ Using internal laser source
Target test devices
Transmitter (E/O)
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Receiver (O/E)
‡ PIN diodes
‡ Avalanche photodiodes (APD)
‡ Receiver optical subassemblies (ROSA)
Optical (O/O)
‡ Passive optical components
‡ Optical fibers and filters
‡ Optical transmission systems
6
Transmitter and Receiver Specifications
Optical Test set
Option -322, -382
Option -312, -314, -392, -394
Operation frequency range
10 MHz to 20 GHz
10 MHz to 26.5 GHz
Connector type
optical input
SMF angled with Agilent versatile connector interface
optical output
optical source input PMF angled, with Agilent versatile connector interface,
(rear)
polarization orientation aligned with connector key
RF
3.5 mm male
LCA optical input
Operating input wavelength range
1250 nm to 1640 nm [f4]
Maximum linear average input power [f1]
Optical input 1:
Optical input 2:
+4 dBm
+14 dBm
Maximum safe average input power
Optical input 1:
Optical input 2:
+7 dBm
+17 dBm
Optical return loss (typ.) [f1]
> 27 dBo
[f1]
Average power measurement range
Optical input 1:
Optical input 2:
Average power measurement
uncertainty (typ.) [f2]
±0.5 dBo
-25 dBm to +4 dBm on optical input 1
-15 dBm to +14 dBm on optical input 2
LCA optical output
Optical modulation index (OMI)
at 10 GHz (typ.)
Output wavelength
> 27 % @ +5dBm RF
> 27 % @ +5dBm RF power
> 47 % @ +10dBm RF power
option -100, -102 (1310 ± 20) nm
option -101, -102 (1550 ± 20) nm
Average output power range
-2 dBm to +4 dBm
Average output power uncertainty (typ.)
±0.5 dBo
[f2]
Average output power stability,
15 minutes (typ.)
±0.5 dBo
External optical source input (-050)
Recommended optical input power [f3]
+8 to + 15 dBm
Optical input power damage level
+20 dBm
Typical loss at quadrature bias point
9 dB
Operating input wavelength range
1290 nm to 1610 nm [4]
LCA RF test port input
Maximum safe input level at port A or B
+15 dBm RF, 7V DC
[f1] Wavelength within range as specified for LCA optical output
[f2] After modulator optimization
[f3] Required source characteristics: SMSR > 15 dB, linewidth <10 MHz ,power stability < 0.1dB pp , PER >20 dB, unmodulated, single mode
[f4] Excluding water absprption wavelength
7
Specifications for electro-optical measurements at 1310 nm
N4375B system with network analyzer
(E/O mode)
N5230C -225
N5242A -200
N5242A -400
Specifications are valid under the stated measurement conditions.
‡ At optical input 1 (“+ 7 dBm max”). At optical input 2 (“+ 17 dBm max”), specifications are typicaly the same for
10 dB higher incident average and modulated optical power.
‡ For wavelength:
(1310 ±20) nm
(option -100, 102).
System performance
Relative frequency
response uncertainty
Absolute frequency
response uncertainty
Frequency response
repeatability (typ.)
0.05 GHz to 0.2 GHz
0.2 GHz to 0.7 GHz
0.7 GHz to 20 GHz
±0.7 dBe typ.
±0.7 dBe
(±0.5 dBe typ.)
±0.7 dBe
(±0.5 dBe typ.)
≥ -32 dB(W/A)
±0.7 dBe typ.
±0.5 dBe typ.
±0.5 dBe typ.
≥ -42 dB(W/A)
±0.8 dBe typ.
±0.6 dBe typ
±0.6 dBe typ.
±1.7 dBe typ
±2.2 dBe
(±1.5 dBe typ.)
±2.2 dBe
(±1.5 dBe typ.)
≥ -22 dB(W/A) [f1]
±0.1 dBe
±0.1 dBe
±0.12 dBe
≥ -32 dB(W/A)
±0.1 dBe
±0.1 dBe
±0.12 dBe
≥ -42 dB(W/A)
±0.19 dBe
±0.15 dBe
±0.17 dBe
-60 dB(W/A)
-86 dB(W/A)
-86 dB(W/A)
±2.0°
±2.0°
DUT response
≥ -22 dB(W/A) [f1]
DUT response
≥ -22 dB(W/A) [f1]
DUT response
Minimum measurable frequency
response (noise floor ) [f2] [f4]
Phase uncertainty
(typ.) [f3]
Group delay uncertainty
[f1]
[f2]
[f3]
[f4]
DUT response
≥ -42 dB(W/A) [f1]
-
Derived from phase uncertainty, see section
“Group delay uncertainty”.
Example: ±2.0° → ±8 ps (1 GHz aperture)
For DUT optical peak output power ≤ +7 dBm.
IFBW = 10 Hz.
Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a wavelength step size of ≤ 0.2 GHz to avoid phase wraps). Excluding a
constant group delay offset of <±0.3 ns typ. (cable length uncertainty < ±0.06 m). A constant group delay offset leads to a phase offset ∆φ = 360° × ∆GD × fmod
(in deg).
Average value over frequency range
8
Specifications for electro-optical measurements at 1550 nm
N4375B system with network analyzer
(E/O mode)
N5230C -225
N5242A -200
N5242A -400
Specifications are valid under the stated measurement conditions.
‡ At optical input 1 (“+ 7 dBm max”). At optical input 2 (“+ 17 dBm max”), specifications are typicaly the same for
10 dB higher incident average and modulated optical power.
‡ For wavelength:
(1550 ±20) nm
(option -101, 102).
System performance
Relative frequency
response uncertainty
Absolute frequency
response uncertainty
Frequency response
repeatability (typ.)
0.05 GHz to 0.2 GHz
0.2 GHz to 0.7 GHz
0.7 GHz to 20 GHz
≥ -22 dB(W/A) [f1]
±0.7 dBe typ.
±0.7 dBe
(±0.5 dBe typ.)
±0.7 dBe
(±0.5 dBe typ.)
≥ -32 dB(W/A)
±0.7 dBe typ.
±0.5 dBe typ.
±0.5 dBe typ.
≥ -42 dB(W/A)
±0.8 dBe typ.
±0.6 dBe typ
±0.6 dBe typ.
±1.7 dBe typ
±1.7 dBe
(±1.5 dBe typ.)
±1.8 dBe
(±1.5 dBe typ.)
≥ -22 dB(W/A) [f1]
±0.02 dBe
±0.02 dBe
±0.05 dBe
≥ -32 dB(W/A)
±0.06 dBe
±0.02 dBe
±0.05 dBe
≥ -42 dB(W/A)
±0.17 dBe
±0.03 dBe
±0.07 dBe
-60 dB(W/A)
-86 dB(W/A)
-86 dB(W/A)
±2.0°
±2.0°
DUT response
DUT response
≥ -22 dB(W/A) [f1]
DUT response
Minimum measurable frequency
response (noise floor ) [f2] [f4]
Phase uncertainty
(typ.) [f3]
Group delay uncertainty
[f1]
[f2]
[f3]
[f4]
DUT response
≥-42 dB(W/A) [f1]
-
Derived from phase uncertainty, see section
“Group delay uncertainty”.
Example: ±2.0° → ±8 ps (1 GHz aperture)
For DUT optical peak output power ≤ +7 dBm.
IFBW = 10 Hz.
Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a wavelength step size of ≤ 0.2 GHz to avoid phase wraps). Excluding a
constant group delay offset of <±0.3 ns typ. (cable length uncertainty < ±0.06 m). A constant group delay offset leads to a phase offset ∆φ = 360° × ∆GD × fmod
(in deg).
Average value over frequency range.
9
Specifications for opto-electrical measurements at 1310 nm
N4375B system with network analyzer
(O/E mode)
N5230C -225
N5242A -200
N5242A -400
Specifications are valid under the stated measurement conditions.
‡ With external source optical input all specifications are typical [f2][f6][f7]
‡ For wavelength:
(1310 ±20) nm
(option -100, 102)
System performance
Relative frequency
response
uncertainty[f2]
0.05 GHz to 0.2 GHz
0.2 GHz to 0.7 GHz
0.7 GHz to 20 GHz
±0.7 dBe typ.
±0.7 dBe
(±0.5 dBe [f8] )
±0.8 dBe
(±0.5 dBe [f8] )
±0.8 dBe typ.
±0.7 dBe typ.
±0.8 dBe typ.
±1.7 dBe typ
±2.0 dBe
(±1.6 dBe [f8] )
±2.1 dBe
(±1.7 dBe [f8] )
≥ -36 dB(A/W) [f1] [f2]
±0.15 dBe
±0.1 dBe
±0.12 dBe
≥ -46 dB(A/W)
±0.25 dBe
±0.15 dBe
±0.17 dBe
-49 dB(A/W)
-72 dB(A/W)
-76 dB(A/W)
±2.0°
±2.0°
DUT response
≥ -36 dB(A/W) [f1] [f2]
≥ -46 dB(A/W)
Absolute frequency
response uncertainty
Frequency response
repeatability (typ.) [f2]
DUT response
≥ -36 dB(A/W) [f1][f2]
DUT response
Minimum measurable frequency
response (noise floor ) [f2] [f3] [f5]
Phase uncertainty
(typ.) [f2][f4]
Group delay uncertainty
[f1]
[f2]
[f3]
[f4]
[f5]
[f6]
[f7]
[f8]
DUT response
≥ -36 dB(A/W) [f1]
-
Derived from phase uncertainty, see section
“Group delay uncertainty”.
Example: ±2.0° → ±8 ps (1 GHz aperture)
For DUT response max. +10 dB (A/W).
For +4 dBm average output power from LCA optical output.
IFBW = 10 Hz.
Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a wavelength step size of ≤0.2 GHz to avoid phase wraps). Excluding a
constant group delay offset of <±0.3 ns typ. (cable length uncertainty <±0.06 m). A constant group delay offset leads to a phase offset ∆φ = 360° × ∆GD × fmod.(in deg).
Average value over frequency range.
After CW responsivity and user calibration with external source.
Requires option -100 or -102.
Typical with internal source.
10
Specifications for opto-electrical measurements at 1550 nm
N4375B system with network analyzer
(O/E mode)
N5230C -225
N5242A -200
N5242A -400
Specifications are valid under the stated measurement conditions.
‡ With external source optical input all specifications are typical [f2][f6][f7]
‡ For wavelength:
(1550 ±20) nm
(option -101, 102)
System performance
Relative frequency
response
uncertainty[f2]
0.05 GHz to 0.2 GHz
0.2 GHz to 0.7 GHz
0.7 GHz to 20 GHz
±0.7 dBe typ.
±0.7 dBe
(±0.5 dBe [f8] )
±0.8 dBe
(±0.5 dBe [f8] )
±0.8 dBe typ.
±0.7 dBe typ.
±0.8 dBe typ.
±1.5 dBe typ
±1.8 dBe
(±1.5 dBe [f8] )
±1.8 dBe
(±1.5 dBe [f8] )
≥ -36 dB(A/W) [f1] [f2]
±0.15 dBe
±0.05 dBe
±0.05 dBe
≥ -46 dB(A/W)
±0.25 dBe
±0.1 dBe
±0.1 dBe
-49 dB(A/W)
-72 dB(A/W)
-76 dB(A/W)
±2.0°
±2.0°
DUT response
≥ -36 dB(A/W) [f1] [f2]
≥ -46 dB(A/W)
Absolute frequency
response uncertainty
Frequency response
repeatability (typ.) [f2]
DUT response
≥ -36 dB(A/W) [f1][f2]
DUT response
Minimum measurable frequency
response (noise floor ) [f2] [f3] [f5]
Phase uncertainty
(typ.) [f2][f4]
Group delay uncertainty
[f1]
[f2]
[f3]
[f4]
[f5]
[f6]
[f7]
[f8]
DUT response
≥ -36 dB(A/W) [f1]
-
Derived from phase uncertainty, see section
“Group delay uncertainty”.
Example: ±2.0° → ±8 ps (1 GHz aperture)
For DUT response max. +10 dB (A/W).
For +4 dBm average output power from LCA optical output.
IFBW = 10 Hz.
Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a wavelength step size of ≤0.2 GHz to avoid phase wraps). Excluding a
constant group delay offset of <±0.3 ns typ. (cable length uncertainty <±0.06 m). A constant group delay offset leads to a phase offset ∆φ = 360° × ∆GD × fmod.(in deg).
Average value over frequency range.
After CW responsivity and user calibration with external source.
Requires option -101 or -102.
Typical with internal source.
11
Specifications for optical to optical measurements at 1310 nm
N4375B system with networrk analyzer
(O/O mode)
N5230C -225
N5242A -200
N5242A -400
Specifications are valid under the stated measurement conditions and after user calibration with LCA optical output set to
maximum average power (+4 dBm)
‡ At optical input 1 (“+ 7 dBm max”). At optical input 2 (“+ 17 dBm max”), specifications are typicaly the same for
10 dB higher incident average and modulated optical power.
‡ With external source optical input all specifications are typical [f2][f6][f7]
‡ For wavelength:
(1310 ±20) nm
(option -100, 102).
System performance
0.05 GHz to 0.2 GHz
0.2 GHz to 0.7 GHz
0.7 GHz to 20 GHz
Relative frequency
DUT response
response uncertainty[f3]
≥ -13 dBe
( ≥-6.5 dBo) [f4]
±0.25 dBe, (typ.)
(±0.125 dBo ), (typ.)
±0.25 dBe
(±0.125 dBo)
±0.25 dBe
(±0.125 dBo)
±1.2 dBe typ.
(±0.6 dBo typ.)
±1.2 dBe
(±0.6 dBo)
±1.2 dBe
(±0.6 dBo)
±0.1 dBe
±0.1 dBe
±0.1 dBe
-35 dBe
(-17.5 dBo)
-60 dBe
(-30 dBo)
-64 dBe
(-32 dBo )
±2.0°
±2.0°
Absolute frequency
DUT response
response uncertainty[f3]
≥ -13 dBe [f4]
( ≥-6.5 dBo)
Frequency response
repeatability (typ.) [f3]
DUT response
≥ -13 dBe
( ≥-6.5 dBo) [f4]
Minimum measurable frequency
response (noise floor ) [f1] [f3][f5]
Phase uncertainty
(typ.) [f2][f3]
Group delay uncertainty
[f1]
[f2]
[f3]
[f4]
[f5]
[f6]
[f7]
.
DUT response
≥ -13 dBe
(≥-6.5 dBo) [f4]
-
Derived from phase uncertainty, see section
“Group delay uncertainty”.
Example: ±2.0° → ±8 ps (1 GHz aperture)
IFBW = 10 Hz.
Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a wavelength step size of ≤ 0.2 GHz to avoid phase wraps).
For +4 dBm average output power from LCA optical output.
For DUT response maximum +6 dBe (+3dBo ) gain.
Average value over frequency range.
After CW responsivity and user calibration with external source.
Requires option -100 or -102.
12
Specifications for optical to optical measurements at 1550 nm
N4375B system with networrk analyzer
(O/O mode)
N5230C -225
N5242A -200
N5242A -400
Specifications are valid under the stated measurement conditions and after user calibration with LCA optical output set to
maximum average power (+4 dBm)
‡ At optical input 1 (“+ 7 dBm max”). At optical input 2 (“+ 17 dBm max”), specifications are typicaly the same for
10 dB higher incident average and modulated optical power.
‡ With external source optical input all specifications are typical [f2][f6][f7]
‡ For wavelength:
(1550 ±20) nm
(option -101, 102).
System performance
0.05 GHz to 0.2 GHz
0.2 GHz to 0.7 GHz
0.7 GHz to 20 GHz
Relative frequency
DUT response
response uncertainty[f3]
≥ -13 dBe
( ≥-6.5 dBo) [f4]
±0.25 dBe, (typ.)
(±0.125 dBo ), (typ.)
±0.25 dBe
(±0.125 dBo)
±0.25 dBe
(±0.125 dBo)
Absolute frequency
DUT response
response uncertainty[f3]
≥ -13 dBe [f4]
( ≥-6.5 dBo)
±1.2 dBe typ.
(±0.6 dBo typ.)
±1.2 dBe
(±0.6 dBo)
±1.2 dBe
(±0.6 dBo)
±0.06 dBe
±0.02 dBe
±0.04 dBe
-35 dBe
(-17.5 dBo)
-60 dBe
(-30 dBo)
-64 dBe
(-32 dBo )
±2.0°
±2.0°
Frequency response
repeatability (typ.) [f3]
DUT response
≥ -13 dBe
( ≥-6.5 dBo) [f4]
Minimum measurable frequency
response (noise floor ) [f1] [f3][f5]
Phase uncertainty
(typ.) [f2][f3]
Group delay uncertainty
[f1]
[f2]
[f3]
[f4]
[f5]
[f6]
[f7]
DUT response
≥ -13 dBe
(≥-6.5 dBo) [f4]
-
Derived from phase uncertainty, see section
“Group delay uncertainty”.
Example: ±2.0° → ±8 ps (1 GHz aperture)
IFBW = 10 Hz.
Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a wavelength step size of ≤ 0.2 GHz to avoid phase wraps).
For +4 dBm average output power from LCA optical output.
For DUT response maximum +6 dBe (+3dBo) gain.
Average value over frequency range.
After CW responsivity and user calibration with external source.
Requires option -101 or -102.
13
Specifications for electrical-electrical measurements (E/E mode)
For detailed specification of the network analyzer see corresponding data sheet.
N4375B: option -322, -382
N5230C -225
option -312, -392
N5242A -200
option -314, -394
N5242A -400
Optical test set
Electrical loss of optical test set
< 2.0 dBe (typ.)
Group delay uncertainty
For more details see specifications of the N5230C and N5242A.
Group delay
Group delay is computed by measuring the phase change within a specified
aperture (for aperture see below.
GD [s] =
Phase change [deg]
----------------------------------------Aperture [Hz] * 360
(1)
Group delay uncertainty
Is calculated from the specified phase uncertainty and from the aperture (for aperture see below):
GD [±s] =
Phase uncertainty [±deg]
--------------------------------------- *sqrt(2)
Aperture [Hz] * 360
(2)
Aperture
Determined by the frequency span and the number of points per sweep
Aperture:
(frequency span) / (number of points–1)
GD Range
The maximum group delay is limited to measuring no more than ±180 degrees of
phase change within the selected aperture (see Equation 1).
14
General Characteristics
Shipping contents
1x Network-analyzer depending on option selected option
1x N4375B optical test set
3x 81000NI FC connector interface narrow key
1x N4373-6127 f 3.5 mm - f 3.5 mm RF short cut cable
1x 4375B-90A01 Getting started
1x 4373B-90CD1 LCA support CD
1x 1150-7896 Keyboard
1x 1150-7799 Mouse
1x 8121-1242 USB cable
1x E5525-10285 UK6 report
1x N4373-61627 electrical short cut cable
1x 9320-6677 RoHS addendum for Photonic accessories
1x 9320-6654 RoHS addendum for Photonic T&M products
Assembled dimensions: (H x W x D)
-322
41.3 cm x 43.8 cm x 47.3 cm,
(16.3 in x 17.3 in x 18.7 in)
-312, -314
41.3 cm x 43.8 cm x 53.8 cm,
(16.3 in x 17.3 in x 21.2 in)
Weight
Product net weight:
-322
34 kg (74.9 lbs)
-312
36 kg (79.4 lbs)
-314
46 kg (101.4 lbs)
Packaged product:
-322
54 kg (119 lbs)
-312
56 kg (123.5 lbs)
-314
66 kg (145.7 lbs)
Additional, option dependent shipping contents:
-021 straight connector[1]
2x N4373-87907 0.5m FC/PC -FC/APC patch cord
1x 1005-0256 FC/FC adaptor
-022 angled connector [1]
2x N4373-87906 0.5m FC/APC - FC/APC patch cord
1x 1005-1027 FC/FC adaptor
-322, 312, -382,-392 2 port LCA:
1x E7342-60004 0.5 m (m) to (f) high performance RF cable
-314, -394 4 port LCA:
2x E7342-60004 0.5 m (m) to (f) high performance RF cable
-050 external optical source input
1x PMF patchcord 1.0m FC/APC narrow key
1x 81000NI optical adapter FC
Power Requirements
100 to 240 V~, 50 to 60 Hz
2 power cables
N5230C
max. 350 VA
N5242A
max 450 VA
Optical test set: max. 40 VA
Network-analyzer
Option 322
N5230C -225
Option 312
N5242A -200
Option 314
N5242A -400
Storage temperature range
-40° C to +70° C
LCA connector types at optical testset
LCA electrical input
3.5 mm (m)
LCA electrical output
3.5 mm (m)
LCA optical input 1
9um single-mode angled [1],
with Agilent universal adapter
LCA optical input 2
9um single-mode angled [1],
with Agilent universal adapter
LCA optical output
9um single-mode angled[1], with
Agilent universal adapter
LCA external TX input
9um polarization maintaining
(option -050 only)
single-mode angled, with
Agilent universal adapter
Operating temperature range
+5° C to +35° C
Humidity
15 % to 80 % relative humidity, non-condensing
Altitude (operating)
0 ... 2000 m
Recommended re-calibration period
1 year
[1]
The optical test set always has angled connectors.
Depending on the selected option (-012 straight, -022 angled)
the appropriate jumper cable will be delivered.
This jumper cable must always be used in front to the optical
test set to protect the connectors at the optical test set
Laser Safety Information
All laser sources listed above are classified as Class 1M
according to IEC 60825 1 (2001).
All laser sources comply with 21 CFR 1040.10 except for
deviations pursuant to Laser Notice No. 50,
dated 2001-July-26
.
15
Mechanical Outline Drawings, option -322, -382 (all dimensions in mm)
16
Mechanical Outline Drawings, option -312, -314, -392, -394 (all dimensions in mm)
17
Ordering informations
The N4375B consists of an optical test set and an electrical network analyzer which are mechanically connected.
To protect your network analyzer investment, Agilent offers the integration of an already owned PNA-L or PNA-X with the
optical test set as listed below.
All systems have 1 year warranty.
N4375B LCA ordering options
Network-analyzer options
N4375B - 322
20 GHz 2 port LCA based on N5230C -225
N4375B - 312
20/26.5 GHz 2 port LCA based on N5242A -200
N4375B - 314
20/26.5 GHz 2 port LCA based on N5242A -400
Network-analyzer integration options
N4375B - 382
Integration of customer PNA-L
- N5230A/C -220, -225
- for other NWA call factory
N4375B - 392
Integration of customer PNA- X
- N5242A -200,
- N5242A -219 (all specifications typical)
- for other NWA call factory
N4375B - 394
Integration of customer PNA- X
- N5242A -400,
- N5242A -419 (all specifications typical)
- for other NWA call factory
Optical wavelength options
N4375B-100
1310 nm source optical test set
N4375B-101
1550 nm source optical test set
N4375B-102
1310 nm and 1550 nm source optical test set
Configuration independent options
N4375B-010
Time domain
N4375B-050
External optical source input
N4375B-021
Straight connector interface (external 0.5 m patch cord)
N4375B-022
Angled connector interface (external 0.5 m patch cord)
Service and Repair
R1280A
1 year Return-to-Agilent warranty extended to 3 or 5 years
R1282A
Calibration up front support plan 3 or 5 year coverage
Required accessories (to be ordered separately! )
N4691B
2 port microwave electrical calibration module
( -00F recommended)
18
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19
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Printed in USA, January 14th, 2009
5989-7302EN