RENESAS R1LV0416DSB-5SI

R1LV0416D Series
4M SRAM (256-kword × 16-bit)
REJ03C0311-0100
Rev.1.00
May.24.2007
Description
The R1LV0416D is a 4-Mbit static RAM organized 256-kword × 16-bit, fabricated by Renesas's high-performance 0.15µm
CMOS and TFT technologies. R1LV0416D Series has realized higher density, higher performance and low power
consumption. The R1LV0416D Series offers low power standby power dissipation; therefore, it is suitable for battery
backup systems. The R1LV0416D Series is packaged in a 44-pin thin small outline mount device, or a 48-ball fine pitch
ball grid array.
Features
• Single 3.0 V supply: 2.7 V to 3.6 V
• Fast access time: 55/70 ns (max)
• Power dissipation:
 Standby: 3 µW (typ) (VCC = 3.0 V)
• Equal access and cycle times
• Common data input and output.
 Three state output
• Battery backup operation.
 2 chip selection for battery backup
• Temperature Range: -40 to +85°C
Rev.1.00, May.24.2007, page 1 of 15
R1LV0416D Series
Ordering Information
Type No.
Access time
Package
R1LV0416DSB-5SI
55 ns
400-mil 44-pin plastic TSOP II
R1LV0416DSB-7LI
70 ns
PTSB0044GA-A (44P3W-H)
R1LV0416DBG-5SI
55 ns
48-ball CSP with 0.75 mm ball pitch
R1LV0416DBG-7LI
70 ns
PTBG0048HB-A (48FHH)
Rev.1.00, May.24.2007, page 2 of 15
R1LV0416D Series
Pin Arrangement
48-ball CSP
44-pin TSOP
A4
A3
A2
A1
A0
CS1#
I/O0
I/O1
I/O2
I/O3
V CC
V SS
I/O4
I/O5
I/O6
I/O7
WE#
A17
A16
A15
A14
A13
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
A5
A6
A7
OE#
UB#
LB#
I/O15
I/O14
I/O13
I/O12
VSS
VCC
I/O11
I/O10
I/O9
I/O8
CS2
A8
A9
A10
A11
A12
(Top view)
2
3
4
5
6
A
LB#
OE#
A0
A1
A2
CS2
B
I/O8
UB#
A3
A4
CS1#
I/O0
C
I/O9
I/O10
A5
A6
I/O1
I/O2
D
VSS
I/O11
A17
A7
I/O3
VCC
E
VCC
I/O12
NC
A16
I/O4
VSS
F
I/O14
I/O13
A14
A15
I/O5
I/O6
G
I/O15
NC
A12
A13
WE#
I/O7
H
NC
A8
A9
A10
A11
NC
(Top view)
Pin Description
Pin name
1
Function
A0 to A17
Address input
I/O0 to I/O15
Data input/output
CS1# (CS1)
Chip select 1
CS2
Chip select 2
OE# (OE)
Output enable
WE# (WE)
Write enable
LB# (LB)
Lower byte select
UB# (UB)
Upper byte select
VCC
Power supply
VSS
Ground
NC
No connection
Rev.1.00, May.24.2007, page 3 of 15
R1LV0416D Series
Block Diagram
LSB
A13
V CC
A7
A8
V SS
A9
A10
A11
A12
A6
MSB
Row
decoder
•
•
•
•
•
Memory matrix
2,048 x 2,048
A14
A15
A16
I/O0
Column I/O
•
•
Input
data
control
Column decoder
I/O15
LSB A0 A1 A2 A3 A4 A5 A17 MSB
•
•
CS2
CS1#
LB#
UB#
WE#
OE#
Rev.1.00, May.24.2007, page 4 of 15
Control logic
•
•
R1LV0416D Series
Operation Table
CS1#
CS2
WE#
OE#
UB#
LB#
I/O0 to I/O7
I/O8 to I/O15
Operation
H
×
×
×
×
×
High-Z
High-Z
Standby
×
L
×
×
×
×
High-Z
High-Z
Standby
×
×
×
×
H
H
High-Z
High-Z
Standby
L
H
H
L
L
L
Dout
Dout
Read
L
H
H
L
H
L
Dout
High-Z
Lower byte read
L
H
H
L
L
H
High-Z
Dout
Upper byte read
L
H
L
×
L
L
Din
Din
Write
L
H
L
×
H
L
Din
High-Z
Lower byte write
L
H
L
×
L
H
High-Z
Din
Upper byte write
L
H
H
H
×
×
High-Z
High-Z
Output disable
Note: H: VIH, L: VIL, ×: VIH or VIL
Absolute Maximum Ratings
Parameter
Symbol
Value
Unit
Power supply voltage relative to VSS
VCC
−0.5 to +4.6
V
Terminal voltage on any pin relative to VSS
VT
−0.5*1 to VCC + 0.3*2
V
Power dissipation
PT
0.7
W
Operating temperature1
Topr
−40 to +85
°C
Storage temperature range
Tstg
−65 to +150
°C
Storage temperature range under bias
Tbias
−40 to +85
°C
Notes: 1. VT min: −3.0 V for pulse half-width ≤ 30 ns.
2. Maximum voltage is +4.6 V.
DC Operating Conditions
Parameter
Supply voltage
Symbol
Min
Typ
Max
Unit
VCC
2.7
3.0
3.6
V
VSS
0
0
0
V
Input high voltage
VIH
2.2

VCC + 0.3
V
Input low voltage
VIL
−0.3

0.6
V
Ambient temperature range
Ta
−40

+85
°C
Note:
1. VIL min: −3.0 V for pulse half-width ≤ 30 ns.
Rev.1.00, May.24.2007, page 5 of 15
Note
1
R1LV0416D Series
DC Characteristics
Parameter
Symbol
Min
Typ
Max
Unit
Test conditions
Input leakage current
|ILI|


1
µA
Vin = VSS to VCC
Output leakage current
|ILO|


1
µA
CS1# = VIH or CS2 = VIL or
OE# = VIH or WE# = VIL or
LB# = UB# = VIH,
VI/O = VSS to VCC
Operating current
ICC


20
mA CS1# = VIL, CS2 = VIH,
Others = VIH/VIL, II/O = 0 mA
Average operating current
ICC1


25
mA Min. cycle, duty = 100%,
II/O = 0 mA, CS1# = VIL,
CS2 = VIH,
Others = VIH/VIL
ICC2


5
mA Cycle time = 1 µs,
duty = 100%,
II/O = 0 mA, CS1# ≤ 0.2 V,
CS2 ≥ VCC − 0.2 V
VIH ≥ VCC − 0.2 V, VIL ≤ 0.2 V
ISB

0.1*1
0.3
mA CS2 = VIL
to +85°C
ISB1


10
µA
Vin ≥ 0 V
to +70°C
ISB1


8
µA
(1) 0 V ≤ CS2 ≤ 0.2 V or
to +40°C
ISB1


3
µA
(2) CS1# ≥ VCC − 0.2 V,
to +25°C
ISB1

1*
2.5
µA
CS2 ≥ VCC − 0.2 V or
to +85°C
ISB1


20
µA
to +70°C
ISB1


16
µA
to +40°C
ISB1


10
µA
ISB1

1*
VOH
2.4
VOH2
Standby current
Standby current
−5SI
−7LI
(3) LB# = UB# ≥ VCC − 0.2 V,
CS2 ≥ VCC − 0.2 V,
CS1# ≤ 0.2 V
10
µA
Average values
—
—
V
IOH = −1 mA
VCC − 0.2
—
—
V
IOH = −100 µA
VOL
—
—
0.4
V
IOL = 2 mA
VOL2
—
—
0.2
V
IOL = 100 µA
to +25°C
Output high voltage
Output low voltage
Note:
1
1
1. Typical values are at VCC = 3.0 V, Ta = +25°C and specified loading, and not guaranteed.
Capacitance
(Ta = +25°C, f = 1.0 MHz)
Symbol
Min
Typ
Max
Unit
Test conditions
Note
Input capacitance
Parameter
Cin


8
pF
Vin = 0 V
1
Input/output capacitance
CI/O


10
pF
VI/O = 0 V
1
Note:
1. This parameter is sampled and not 100% tested.
Rev.1.00, May.24.2007, page 6 of 15
R1LV0416D Series
AC Characteristics
(Ta = -40 to +85°C, VCC = 2.7 V to 3.6 V)
Test Conditions
Input pulse levels: VIL = 0.4 V, VIH = 2.4 V
• Input rise and fall time: 5 ns
• Input/output timing reference levels: 1.4 V
• Output load: See figures (Including scope and jig)
1.4 V
RL=500 Ω
Dout
50pF
Output load
Rev.1.00, May.24.2007, page 7 of 15
R1LV0416D Series
Read Cycle
R1LV0416D
-5SI
Parameter
-7LI
Symbol
Min
Max
Min
Max
Unit
Read cycle time
tRC
55

70

ns
Address access time
tAA

55

70
ns
tACS1

55

70
ns
tACS2

55

70
ns
Output enable to output valid
tOE

35

40
ns
Output hold from address change
tOH
10

10

ns
LB#, UB# access time
tBA

55

70
ns
Chip select to output in low-Z
tCLZ1
10

10

ns
2, 3
tCLZ2
10

10

ns
2, 3
tBLZ
5

5

ns
2, 3
Chip select access time
LB#, UB# disable to low-Z
Notes
Output enable to output in low-Z
tOLZ
5

5

ns
2, 3
Chip deselect to output in high-Z
tCHZ1
0
20
0
25
ns
1, 2, 3
tCHZ2
0
20
0
25
ns
1, 2, 3
LB#, UB# disable to high-Z
tBHZ
0
20
0
25
ns
1, 2, 3
Output disable to output in high-Z
tOHZ
0
20
0
25
ns
1, 2, 3
Rev.1.00, May.24.2007, page 8 of 15
R1LV0416D Series
Write Cycle
R1LV0416D
-5SI
Parameter
-7LI
Symbol
Min
Max
Min
Max
Unit
Notes
Write cycle time
tWC
55

70

ns
Address valid to end of write
tAW
50

60

ns
Chip selection to end of write
tCW
50

60

ns
5
Write pulse width
tWP
40

50

ns
4
LB#, UB# valid to end of write
tBW
50

55

ns
Address setup time
tAS
0

0

ns
6
Write recovery time
tWR
0

0

ns
7
Data to write time overlap
tDW
25

30

ns
Data hold from write time
tDH
0

0

ns
Output active from end of write
tOW
5

5

ns
2
Output disable to output in high-Z
tOHZ
0
20
0
25
ns
1, 2, 3
Write to output in high-Z
tWHZ
0
20
0
25
ns
1, 2
Notes: 1. tCHZ, tOHZ, tWHZ and tBHZ are defined as the time at which the outputs achieve the open circuit conditions and are not
referred to output voltage levels.
2. This parameter is sampled and not 100% tested.
3. At any given temperature and voltage condition, tHZ max is less than tLZ min both for a given device and from
device to device.
4. A write occurs during the overlap of a low CS1#, a high CS2, a low WE# and a low LB# or a low UB#. A write
begins at the latest transition among CS1# going low, CS2 going high, WE# going low and LB# going low or UB#
going low. A write ends at the earliest transition among CS1# going high, CS2 going low, WE# going high and
LB# going high or UB# going high. tWP is measured from the beginning of write to the end of write.
5. tCW is measured from the later of CS1# going low or CS2 going high to the end of write.
6. tAS is measured from the address valid to the beginning of write.
7. tWR is measured from the earliest of CS1# or WE# going high or CS2 going low to the end of write cycle.
Rev.1.00, May.24.2007, page 9 of 15
R1LV0416D Series
Timing Waveform
Read Timing Waveform (WE# = VIH)
t RC
Address
Valid address
tAA
tACS1
CS1#
tCLZ1*2, 3
CS2
tCHZ1*1, 2, 3
tACS2
tCLZ2*2, 3
tCHZ2*1, 2, 3
tBHZ*1, 2, 3
tBA
LB#, UB#
tBLZ*2, 3
tOHZ*1, 2, 3
tOE
OE#
tOLZ*2, 3
Dout
High impedance
Rev.1.00, May.24.2007, page 10 of 15
tOH
Valid data
R1LV0416D Series
Write Timing Waveform (1) (WE# Clock)
tWC
Valid address
Address
tWR*7
tCW*5
CS1#
tCW*5
CS2
tBW
LB#, UB#
tAW
tWP*4
WE#
tAS*6
tDW
tDH
Valid data
Din
tWHZ*1, 2
tOW*2
High impedance
Dout
Rev.1.00, May.24.2007, page 11 of 15
R1LV0416D Series
Write Timing Waveform (2) (CS# Clock, OE# = VIH)
tWC
Valid address
Address
tAW
tAS
*6
tWR*7
tCW*5
CS1#
tCW*5
CS2
tBW
LB#, UB#
tWP*4
WE#
tDW
Valid data
Din
High impedance
Dout
Rev.1.00, May.24.2007, page 12 of 15
tDH
R1LV0416D Series
Write Timing Waveform (3) (LB#, UB# Clock, OE# = VIH)
tWC
Valid address
Address
tAW
tCW*5
tWR*7
CS1#
tCW*5
CS2
tAS*6
tBW
LB#, UB#
tWP*4
WE#
tDW
Valid data
Din
High impedance
Dout
Rev.1.00, May.24.2007, page 13 of 15
tDH
R1LV0416D Series
Low VCC Data Retention Characteristics
(Ta = -40 to +85°C)
Parameter
Symbol
Min
Typ
Max
Unit
VDR
2.0


V
Vin ≥ 0V
(1) 0 V ≤ CS2 ≤ 0.2 V or
(2) CS2 ≥ VCC − 0.2 V,
CS1# ≥ VCC − 0.2 V or
(3) LB# = UB# ≥ VCC − 0.2 V,
CS2 ≥ VCC − 0.2 V,
CS1# ≤ 0.2 V
ICCDR


10
µA
to +70°C
ICCDR


8
µA
to +40°C
ICCDR


3
µA
to +25°C
ICCDR

1*
2.5
µA
to +85°C
ICCDR


20
µA
to +70°C
ICCDR


16
µA
VCC = 3.0 V, Vin ≥ 0V
(1) 0 V ≤ CS2 ≤ 0.2 V or
(2) CS2 ≥ VCC − 0.2 V,
CS1# ≥ VCC − 0.2 V or
(3) LB# = UB# ≥ VCC − 0.2 V,
CS2 ≥ VCC − 0.2 V,
CS1# ≤ 0.2 V
Average values
to +40°C
ICCDR


10
µA
ICCDR

1*
10
µA
tCDR
0


ns
tR
5


ms
VCC for data retention
Data
retention
current
−5SI
−7LI
to +85°C
to +25°C
Chip deselect to data retention time
Operation recovery time
Note:
1
1
Test conditions
See retention waveform
1. Typical values are at VCC = 3.0 V, Ta = +25°C and specified loading, and not guaranteed.
Rev.1.00, May.24.2007, page 14 of 15
R1LV0416D Series
Low VCC Data Retention Timing Waveform (1) (CS1# Controlled)
t CDR
Data retention mode
tR
V CC
2.7 V
2.2 V
V DR
CS1# ≥ VCC – 0.2 V
CS1#
0V
Low VCC Data Retention Timing Waveform (2) (CS2 Controlled)
t CDR
Data retention mode
tR
V CC
2.7 V
CS2
V DR
0.6 V
0 V < CS2 < 0.2 V
0V
Low VCC Data Retention Timing Waveform (3) (LB#, UB# Controlled)
t CDR
Data retention mode
V CC
2.7 V
2.2 V
V DR
LB#, UB#
0V
Rev.1.00, May.24.2007, page 15 of 15
LB#, UB# ≥ VCC – 0.2 V
tR
Revision History
Rev.
Date
0.01
1.00
Dec. 25, 2006
May. 24, 2007
R1LV0416D Series Data Sheet
Contents of Modification
Description
Page

Initial issue
2
Ordering Information
R1LV0416DSB-5S% to R1LV0416DSB-5SI
R1LV0416DSB-7L% to R1LV0416DSB-7LI
R1LV0416DBG-5S% to R1LV0416DBG-5SI
R1LV0416DBG-7L% to R1LV0416DBG-7LI
3
Pin Arrangement
A6 to A13, A13 to A6
4
Change of Block Diagram
5
Absolute Maximum Ratings: Deletion of R ver. specification
5
DC Operating Conditions: Deletion of R ver. specification
6
DC Characteristics
ISB1 (-5SI) (to +25°C) max: 3 µA to 2.5 µA
AC Characteristics: Change of Test Conditions
7
Low VCC Data Retention Characteristics
14
ICCDR (-5SI) (to +25°C) max: 3 µA to 2.5 µA
Deletion of note 2
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Renesas Technology (Shanghai) Co., Ltd.
Unit 204, 205, AZIACenter, No.1233 Lujiazui Ring Rd, Pudong District, Shanghai, China 200120
Tel: <86> (21) 5877-1818, Fax: <86> (21) 6887-7898
Renesas Technology Hong Kong Ltd.
7th Floor, North Tower, World Finance Centre, Harbour City, 1 Canton Road, Tsimshatsui, Kowloon, Hong Kong
Tel: <852> 2265-6688, Fax: <852> 2730-6071
Renesas Technology Taiwan Co., Ltd.
10th Floor, No.99, Fushing North Road, Taipei, Taiwan
Tel: <886> (2) 2715-2888, Fax: <886> (2) 2713-2999
Renesas Technology Singapore Pte. Ltd.
1 Harbour Front Avenue, #06-10, Keppel Bay Tower, Singapore 098632
Tel: <65> 6213-0200, Fax: <65> 6278-8001
Renesas Technology Korea Co., Ltd.
Kukje Center Bldg. 18th Fl., 191, 2-ka, Hangang-ro, Yongsan-ku, Seoul 140-702, Korea
Tel: <82> (2) 796-3115, Fax: <82> (2) 796-2145
Renesas Technology Malaysia Sdn. Bhd
Unit 906, Block B, Menara Amcorp, Amcorp Trade Centre, No.18, Jalan Persiaran Barat, 46050 Petaling Jaya, Selangor Darul Ehsan, Malaysia
Tel: <603> 7955-9390, Fax: <603> 7955-9510
© 2007. Renesas Technology Corp., All rights reserved. Printed in Japan.
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