Micro-3 Pb Free Plating Qualification

International Rectifier – Temecula Reliability Laboratory
QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory
HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154
QUALIFICATION REPORT
Title
Product/Part # *
Qualification Level
MSL
Silicon Technology
Micro-3 Pb free plating Qualification
Gen-5 and Gen-8 Micro3 devices
Consumer
MSL1@260°C
FET
REVISION HISTORY
#
A
Date
3/15/04
Author
Rel Engr.
Description of Changes
Initial Draft
INTRODUCTION
In compliance with worldwide Industry initiative of “Lead Free” material for semiconductor
fabrication, IR is proposing the conversion of the existing 70-90Sn, Bal=Pb solder plating
process to a more environment friendly 100% Sn plating process for the assembly of Micro-3
devices.
SUMMARY/CONCLUSION
Based on the results of reliability stress testing, the Micro-3 devices assembled with 100%Sn
plating are qualified to Consumer Level.
The surface mount reflow temperature for these devices should not exceed 260°C.
Reliability Engineer
Page 1
International Rectifier – Temecula Reliability Laboratory
QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory
HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154
QUALIFICATION TEST RESULTS
Part Type
Tests
IRLML5103
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Temperature Cycling
2804A3
-55°C/150°C
1000 cycles
1 lot x 55 devices
0 failures
High Humidity, High Temperature Reverse Bias (H3TRB)
2804B3
85°C/85%RH/-24V
1000 hours
1 lot x 55 devices
0 failures
High Temperature Reverse Bias
2804C3
150°C/-24V
1000 hours
1 lot x 55 devices
0 failures
High Temperature Gate Bias
2804D3
150°C/-16V
1000 hours
1 lot x 55 devices
0 failures
Page 2
International Rectifier – Temecula Reliability Laboratory
QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory
HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154
Part Type
Tests
IRLML2804
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Temperature Cycling
2804A4
-55°C/150°C
1000 cycles
1 lot x 55 devices
0 failures
High Humidity, High Temperature Reverse Bias (H3TRB)
2804B4
85°C/85%RH/24V
1000 hours
1 lot x 55 devices
0 failures
High Temperature Reverse Bias
2804C4
150°C/24V
1000 hours
1 lot x 55 devices
0 failures
High Temperature Gate Bias
2804D4
150°C/16V
1000 hours
1 lot x 55 devices
0 failures
Page 3
International Rectifier – Temecula Reliability Laboratory
QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory
HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154
Part Type
Tests
IRLML2502
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Temperature Cycling
2804A1
-55°C/150°C
1000 cycles
1 lot x 55 devices
0 failures
High Humidity, High Temperature Reverse Bias (H3TRB)
2804B1
85°C/85%RH/16V
1000 hours
1 lot x 55 devices
0 failures
High Temperature Reverse Bias
2804C1
150°C/16V
1000 hours
1 lot x 55 devices
0 failures
High Temperature Gate Bias
2804D1
150°C/9.6V
1000 hours
1 lot x 55 devices
0 failures
Page 4
International Rectifier – Temecula Reliability Laboratory
QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory
HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154
Part Type
Tests
IRLML6401
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Temperature Cycling
2804A2
-55°C/150°C
1000 cycles
1 lot x 55 devices
0 failures
High Humidity, High Temperature Reverse Bias (H3TRB)
2804B2
85°C/85%RH/-9.6V
1000 hours
1 lot x 55 devices
0 failures
High Temperature Reverse Bias
2804C2
150°C/-9.6V
1000 hours
1 lot x 55 devices
0 failures
High Temperature Gate Bias
2804D2
150°C/-9.6V
1000 hours
1 lot x 55 devices
0 failures
Page 5
International Rectifier – Temecula Reliability Laboratory
QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory
HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154
Part Type
Tests
IRLML2402
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Temperature Cycling
2804A5
-55°C/150°C
1000 cycles
1 lot x 55 devices
0 failures
High Humidity, High Temperature Reverse Bias (H3TRB)
2804B5
85°C/85%RH/16V
1000 hours
1 lot x 55 devices
0 failures
High Temperature Reverse Bias
2804C5
150°C/16V
1000 hours
1 lot x 55 devices
0 failures
High Temperature Gate Bias
2804D5
150°C/16V
1000 hours
1 lot x 55 devices
0 failures
Page 6
International Rectifier – Temecula Reliability Laboratory
QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory
HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154
Part Type
Tests
IRLML6402
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Temperature Cycling
2804A6
-55°C/150°C
1000 cycles
1 lot x 55 devices
0 failures
High Humidity, High Temperature Reverse Bias (H3TRB)
2804B6
85°C/85%RH/-16V
1000 hours
1 lot x 55 devices
0 failures
High Temperature Reverse Bias
2804C6
150°C/-16V
1000 hours
1 lot x 55 devices
0 failures
High Temperature Gate Bias
2804D6
150°C/-9.6V
1000 hours
1 lot x 55 devices
0 failures
Page 7