SOT-223 Pb Free Qualification

International Rectifier – Temecula Reliability Laboratory
QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory
HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154
QUALIFICATION REPORT
Title
Product/Part # *
Qualification Level
Silicon Technology
Mositure Sensitivity
SOT-223 Pb free Qualification
SOT-223 devices
Q101 (or current qualification level)
FET
MSL1 @ 260°C
REVISION HISTORY
#
A
Date
12/2/03
Author
Rel Engr
Description of Changes
Initial release
INTRODUCTION
In compliance with worldwide Industry initiative of “Lead Free” material for semiconductor
fabrication, International Rectifier is proposing the conversion of the existing 85Sn/15Pb solder
plating process to a Pb-free 100%Sn plating process for the assembly of SOT-223 devices.
SUMMARY/CONCLUSION
Based on the results of reliability stress testing, the SOT-223 100%Sn plating process is
qualified. This qualification has been performed to the Q101 qualification level and allows
qualification of currently Q101, Industrial and Consumer level qualified SOT-223 devices.
The reflow temperature during surface mount of these devices should not exceed 260°C.
Reliability Engineer
Page 1
International Rectifier – Temecula Reliability Laboratory
QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory
HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154
QUALIFICATION TEST RESULTS
Part Type
Tests
IRFL014
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Temperature Cycling
2561A4
-55°C/150°C
1000 cycles
1 lot x 77 devices
0 failures
High Humidity, High Temperature Reverse Bias (H3TRB)
2561B4
85°C/85%RH/48V
1000 hours
1 lot x 77 devices
0 failures
Autoclave
2561F4
121°C/100%RH/15psig
96 hours
1 lot x 77 devices
0 failures
Part Type
Tests
IRFL9014
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Temperature Cycling
2561A5
-55°C/150°C
1000 cycles
1 lot x 77 devices
0 failures
High Humidity, High Temperature Reverse Bias (H3TRB)
2561B2
85°C/85%RH/-48V
1000 hours
1 lot x 77 devices
0 failures
Autoclave
2561F2
121°C/100%RH/15psig
96 hours
1 lot x 77 devices
0 failures
Page 2
International Rectifier – Temecula Reliability Laboratory
QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory
HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154
Part Type
Tests
IRLL2705
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Temperature Cycling
2561A6
-55°C/150°C
1000 cycles
1 lot x 77 devices
0 failures
High Humidity, High Temperature Reverse Bias (H3TRB)
2705B6
85°C/85%RH/44V
1000 hours
1 lot x 77 devices
0 failures
Autoclave
2561F6
121°C/100%RH/15psig
96 hours
1 lot x 77 devices
0 failures
Part Type
Tests
IRFL214
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Temperature Cycling
2561A7
-55°C/150°C
1000 cycles
1 lot x 77 devices
0 failures
High Humidity, High Temperature Reverse Bias (H3TRB)
2561B7
85°C/85%RH/100V
1000 hours
1 lot x 77 devices
0 failures
High Temperature Reverse Bias
2561C7
150°C/200V
1000 hours
1 lot x 77 devices
0 failures
High Temperature Gate Bias
2561D7
150°C/20V
1000 hours
1 lot x 77 devices
0 failures
Autoclave
2561F7
121°C/100%RH/15psig
96 hours
1 lot x 77 devices
0 failures
Page 3
International Rectifier – Temecula Reliability Laboratory
QS-9000 and ISO-9000 Certified Facility; SQ-1000 Certified Laboratory
HEXFET America Facility: 41915 Business Park Drive Temecula, CA 92590 Phone 909-676-7500 Fax 909-676-9154
Part Type
Tests
IRLL3303
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Test:
R#:
Conditions:
Duration:
Quantity:
Failures:
Temperature Cycling
2561A8-11
-55°C/150°C
1000 cycles
4 lots x 77 devices
0 failures
High Humidity, High Temperature Reverse Bias (H3TRB)
2561B8-11
85°C/85%RH/24V
1000 hours
4 lots x 77 devices
0 failures
High Temperature Reverse Bias
2561C8-11
150°C/24V
1000 hours
3 lots x 77 devices
0 failures
High Temperature Gate Bias
2561D8-11
150°C/16V
1000 hours
4 lots x 77 devices
0 failures
Intermittent Operating Life (Power Cycling)
2561E9-11
∆Tj = 100°C
15,000 cycles
3 lots x 77 devices
0 failures
Autoclave
2797F1-3
121°C/100%RH/15psig
96 hours
3 lots x 77 devices
0 failures
Page 4