SEE Summary Report

SEE Summary Report - RH, G5, N, MR, 30V
Single-Event-Effects
Summary Report
IR RAD-Hard Gen-5 30V N-channel
SEE Qualifications of:
JANTXVR, F, G, H AND JANSR, F, G, H 2N7467U2 MIL-PRF-19500/683
JANTXVR, F, G, H AND JANSR, F, G, H 2N7478T1 MIL-PRF-19500/697
JANTXVR, F, G, H AND JANSR, F, G, H 2N7479U3 MIL-PRF-19500/703
JANTXVR, F, G, H AND JANSR, F, G, H 2N7482T3 MIL-PRF-19500/702
JANTXVR, F, G, H AND JANSR, F, G, H 2N7491T2 MIL-PRF-19500/701
JANTXVR, F, G, H AND JANSR, F, G, H 2N7494U5 MIL-PRF-19500/700
IRHNA57Z60, IRHNA53Z60, IRHNA56Z60, IRHNA58Z60 SCV AND SCS
IRHMS57Z60, IRHMS53Z60, IRHMS56Z60, IRHMS58Z60 SCV AND SCS
IRHNJ57Z30, IRHNJ53Z30, IRHNJ56Z30, IRHNJ58Z30 SCV AND SCS
IRHY57Z30CM, IRHY53Z30CM, IRHY56Z30CM, IRHY58Z30CM SCV AND SCS
IRHF57Z30, IRHF53Z30, IRHF56Z30, IRHF58Z30 SCV AND SCS
IRHE57Z30, IRHE53Z30, IRHE56Z30, IRHES58Z30 SCV AND SCS
Individual-SEE-Report_Fab2-Quals.xls
57Zx0-Qual_FINAL, Page 1 of 5
05-01-2009, updated 10/20/2009
SEE Summary Report - RH, G5, N, MR, 30V
Fab-2 Wafer Lot: Q780265 Split A
SEE Test Date: February 11th & 12th 2009
SEE Test Facility: Brookhaven National Lab (BNL)
IR Fab-5 Specs
VDS Bias (Volts)
Ion
Au
Br
I
LET
37.34
59.88
82.43
Energy
285
350
28.6
Range
36.9
33.1
354
Run Numbers 205-229
567-598
941-959
IR Fab-2 Qual to Specs
VDS Bias (Volts)
Br;
I;
Au;
LET=37.34 LET=59.88 LET=82.43
VGS ; 36.9µm; ; 33.1µm; ; 28.6µm;
350MeV
354MeV
(Volts) 285MeV
0
30
25
25
-5
30
25
25
-10
30
20
20
-15
22.5
15
-20
15
7.5
New Gold Specs replace Old Copper Specs
LET=37; Br; LET=60; Xe; LET=28;
37µm;
33µm;
Cu; 40µm;
285MeV
344MeV
261MeV
VGS Bias
0
-5
-10
-15
-20
30
30
30
22.5
15
25
25
20
15
7.5
30
30
30
25
15
SEE Response - R5, 30V, N, MR
35
35
LET=37; Br;
37μm;
285MeV
25
20
LET=60; Xe;
33μm;
344MeV
15
10
5
LET=28; Cu;
40μm;
261MeV
0
0
-5
-10
-15
Bias VGS (Volts)
-20
Br;
LET=37.34;
36.9μm;
285MeV
30
Bias VDS (Volts)
30
Bias VDS (Volts)
SEE Response - G5, 30V, N, MR
25
20
I; LET=59.88;
33.1μm;
350MeV
15
10
5
0
-5
-10
-15
Bias VGS (Volts)
Run No.
Ion
DUT Id
Socket
Wafer
Serial
Batch
205
206
207
208
209
210
211
212
213
214
215
216
217
218
219
220
221
222
223
224
225
226
227
228
229
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
Br
M1
M1
M1
M1
M1
M1
M1
M1
M1
M1
M2
M2
M2
M3
M3
M3
M4
M4
M4
M5
M5
M5
M6
M6
M6
1
1
1
1
1
1
1
1
1
1
2
2
2
3
3
3
4
4
4
5
5
5
6
6
6
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
32
32
32
32
32
32
32
32
32
32
33
33
33
34
34
34
35
35
35
36
36
36
37
37
37
7
7
7
7
7
7
7
7
7
7
7
7
7
7
7
7
7
7
7
7
7
7
7
7
7
Individual-SEE-Report_Fab2-Quals.xls
Au;
LET=82.43;
28.6μm;
354MeV
0
57Zx0-Qual_FINAL, Page 2 of 5
VGS
Volts
-10
-10
-10
-10
-10
-15
-15
-20
-15
-15
-20
-20
-20
-10
-15
-20
-20
-15
-10
-10
-15
-20
-20
-15
-10
-20
VDS
Volts
20
24
26
28
30
20
22.5
15
25
30
20
22
23
30
22.5
15
15
22.5
30
30
22.5
15
15
22.5
30
Pass/Fail
Blank=Pass
F
CurvePoint1
CurvePoint2
CurvePoint3
CurvePoint3
CurvePoint2
CurvePoint1
CurvePoint1
CurvePoint2
CurvePoint3
CurvePoint3
CurvePoint2
CurvePoint1
05-01-2009, updated 10/20/2009
SEE Summary Report - RH, G5, N, MR, 30V
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
16
VGS
Volts
-5
-5
-10
-10
-15
-15
-20
-20
-10
-15
-20
-5
-10
-10
-15
-15
-20
-20
-5
-10
-10
-15
-15
-20
-20
-5
-10
-10
-15
-15
-20
-20
VDS
Volts
25
30
20
25
15
20
7.5
10
30
25
15
25
20
30
15
25
7.5
15
25
20
30
15
25
7.5
15
25
20
30
15
25
7.5
15
26
26
26
26
26
26
26
26
26
26
26
26
26
26
26
26
26
26
26
-5
-5
-5
-5
-10
-10
-10
-5
-5
-10
-10
-5
-10
-5
-10
-5
-10
-5
-10
15
20
25
30
20
25
30
25
30
20
25
25
20
25
20
25
20
25
20
Run No.
Ion
DUT Id
Socket
Wafer
Serial
Batch
567
568
569
570
571
572
573
574
575
576
577
578
579
580
581
582
583
584
585
586
587
588
589
590
591
592
593
594
595
596
597
598
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
I
M10
M10
M10
M10
M10
M10
M10
M10
M10
M10
M10
M11
M11
M11
M11
M11
M11
M11
M12
M12
M12
M12
M12
M12
M12
M13
M13
M13
M13
M13
M13
M13
1
1
1
1
1
1
1
1
1
1
1
2
2
2
2
2
2
2
3
3
3
3
3
3
3
4
4
4
4
4
4
4
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
24
24
24
24
24
24
24
24
24
24
24
25
25
25
25
25
25
25
26
26
26
26
26
26
26
27
27
27
27
27
27
27
941
942
943
944
945
946
947
948
949
950
951
952
953
954
955
956
957
958
959
Au
Au
Au
Au
Au
Au
Au
Au
Au
Au
Au
Au
Au
Au
Au
Au
Au
Au
Au
M18
M18
M18
M18
M18
M18
M18
M19
M19
M19
M19
M20
M20
M21
M21
M22
M22
M23
M23
1
1
1
1
1
1
1
2
2
2
2
3
3
4
4
5
5
6
6
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
41
41
41
41
41
41
41
42
42
42
42
43
43
44
44
45
45
46
46
Individual-SEE-Report_Fab2-Quals.xls
57Zx0-Qual_FINAL, Page 3 of 5
Pass/Fail
Blank=Pass
CurvePoint1
CurvePoint2
CurvePoint3
CurvePoint4
EngCurvePoint1
EngCurvePoint2
EngCurvePoint3
CurvePoint1
CurvePoint2
EngCurvePoint1
CurvePoint3
EngCurvePoint2
CurvePoint4
EngCurvePoint3
CurvePoint1
CurvePoint2
EngCurvePoint1
CurvePoint3
EngCurvePoint2
CurvePoint4
EngCurvePoint3
CurvePoint1
CurvePoint2
EngCurvePoint1
CurvePoint3
EngCurvePoint2
CurvePoint4
EngCurvePoint3
F
F
CurvePoint1
CurvePoint2
CurvePoint1
CurvePoint2
CurvePoint1
CurvePoint2
CurvePoint1
CurvePoint2
05-01-2009, updated 10/20/2009
SEE Summary Report - RH, G5, N, MR, 30V
RadHard MOSFET - G5, Hex 3, 30V, N-channel
Electrcial Codes:
Expected Good Devices
Post - SEE Electricals Data
SEE-Failed Devices
SEE-UnTested Devices
Parameter
I DSS
Conditions VDS=-24V
VGS=0V
Limits
Unit
SEE Id
M10
M11
M12
M13
M1
M2
M3
M4
M5
M6
M18
M19
M20
M21
M22
M23
Log Serial
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
10µA Max
nA
I GSSf
VGS=-20V
VDS=0V
I GSSr
V GS(th)
R DS(on)
VSD
ID=22A
VGS=0V
IS=22A
30V Min
20mOhms
1.2V Max
V
mOhms
V
VGS=20V IDS=1mA IDSS=1mA
VDS=0V VDS=VGS
-100nA Max 100nA Max 2V to 4V
nA
BV DSS
nA
V
Q780265A (BNL 02-11 & 02-12-2009) IRHC57Z30
0.21
0.18
0.22
2.72
1.75
1.94
2.39
46.78
0.25
0.24
15.60
1.85
3.26
0.30
0.34
0.34
0.33
0.23
0.20
0.22
514300.00
3181000.00
2.53
2.62
2.77
2.55
0.51
0.50
0.51
0.50
0.51
0.48
0.46
0.52
0.52
0.47
0.52
0.52
0.47
0.46
0.49
0.45
0.52
0.52
0.46
0.52
909600.00
999900.00
0.50
0.50
0.51
0.50
Individual-SEE-Report_Fab2-Quals.xls
0.15
0.14
0.15
0.15
0.15
0.13
0.14
0.15
0.15
0.13
0.15
0.15
0.14
0.13
0.14
0.14
0.15
0.15
0.13
0.15
999900.00
999900.00
0.14
0.14
0.15
0.15
3.580
3.572
3.581
3.567
3.574
3.683
3.667
3.672
3.610
3.652
3.674
3.677
3.659
3.656
3.643
3.605
3.574
3.649
3.641
3.637
3.667
3.668
3.656
3.603
3.579
3.543
35.3
35.4
35.3
35.3
35.3
35.1
35.2
35.2
35.4
35.3
35.2
35.2
35.2
35.3
35.3
35.4
35.4
35.3
35.4
35.3
34.5
8.3
35.2
35.4
35.4
35.4
57Zx0-Qual_FINAL, Page 4 of 5
15.40
15.48
15.61
15.67
15.68
15.51
15.37
15.42
15.32
15.79
15.54
15.40
15.40
15.45
15.09
15.12
15.63
15.30
15.42
15.69
15.95
21.09
15.25
15.44
15.54
15.35
Good Matched Electricals to SEE
0.964
0.964
0.966
0.967
0.969
0.966
0.964
0.962
0.961
0.968
0.968
0.964
0.961
0.962
0.958
0.958
0.964
0.961
0.963
0.972
0.968
0.961
0.958
0.963
0.965
0.961
Unused
Unused
Unused
Pass -5/25,-10/20,-15/15,-20/7.5
I
Pass -5/25,-10/20,-15/15,-20/7.5
I
Pass -5/25,-10/20,-15/15,-20/7.5
I
Pass -5/25,-10/20,-15/15,-20/7.5
I
Unused
Unused
Unused
Unused
Failed -15/30
Br
Failed -20/23
Br
Pass -10/30,-15/22.5,-20/15
Br
Pass -10/30,-15/22.5,-20/15
Br
Pass -10/30,-15/22.5,-20/15
Br
Pass -10/30,-15/22.5,-20/15
Br
Unused
Unused
Unused
Failed -10/30
Au
Failed -10/25
Au
Pass -5/25, -10/20
Au
Pass -5/25, -10/20
Au
Pass -5/25, -10/20
Au
Pass -5/25, -10/20
Au
05-01-2009, updated 10/20/2009
SEE Summary Report - RH, G5, N, MR, 30V
LET=38±5%;
LET=61±5%;
LET=84±5%;
Final QPL Specs
31µm±10%;
28µm±7.5%;
VGS 38µm±7.5%;
300MeV±7.5% 330MeV±7.5% 350MeV±10%
(Volts)
0
30
25
25
-5
30
25
25
-10
30
20
20
-15
22.5
15
-20
15
7.5
for 2N7467U2/683 (IRHNA57Z60) and 2N7478T1/697 (IRHMS57Z60)
for 2N7479U3/703 (IRHNJ57Z30) and 2N7482T3/702 (IRHY57Z30CM)
for 2N7491T2/701 (IRHF57Z30) and 2N7494U5/700 (IRHE57Z30)
Single-Event-Effects RESPONSE
35
LET=38±5%;
38μm±7.5%;
300MeV±7.5%
Bias VDS (Volts)
30
25
20
LET=61±5%;
31μm±10%;
330MeV±7.5%
15
10
LET=84±5%;
28μm±7.5%;
350MeV±10%
5
0
0
-5
-10
-15
-20
Bias VGS (Volts)
Individual-SEE-Report_Fab2-Quals.xls
57Zx0-Qual_FINAL, Page 5 of 5
05-01-2009, updated 10/20/2009