ispLSI 3320 Data Sheet - Lattice Semiconductor

ispLSI® 3320 Device Datasheet
June 2010
All Devices Discontinued!
Product Change Notification (PCN) #09-10 has been issued to discontinue all devices in
this data sheet.
The original datasheet pages have not been modified and do not reflect those changes.
Please refer to the table below for reference PCN and current product status.
Product Line
ispLSI 3320
Ordering Part Number
ispLSI 3320-70LQ
ispLSI 3320-100LQ
ispLSI 3320-70LB320
ispLSI 3320-100LB320
Product Status
Reference PCN
Discontinued
PCN#09-10
5555 N.E. Moore Ct. z Hillsboro, Oregon 97124-6421 z Phone (503) 268-8000 z FAX (503) 268-8347
Internet: http://www.latticesemi.com
ispLSI 3320
®
In-System Programmable High Density PLD
Functional Block Diagram
• HIGH-DENSITY PROGRAMMABLE LOGIC
— 160 I/O Pins
— 14000 PLD Gates
— 480 Registers
— High Speed Global Interconnect
— Wide Input Gating for Fast Counters, State
Machines, Address Decoders, etc.
— Small Logic Block Size for Random Logic
Output Routing Pool (ORP)
H0
Output Routing Pool (ORP)
I0
Output Routing Pool (ORP)
Boundary
Scan
J0
Output Routing Pool (ORP)
Output Routing Pool (ORP)
G3
F3
G2
G1
G0
F2
F1
F0
E3
D Q
D Q
H1
E2
OR
D Q
H3
D Q
D Q
OR
Array
Twin
GLB
E0
D Q
D3
D Q
D2
I1
D Q
I2
D1
I3
D0
C3
Global Routing Pool
(GRP)
J1
C2
J2
C1
J3
C0
Output Routing Pool (ORP)
• ispLSI FEATURES:
— 5V In-System Programmable (ISP™) Using Lattice
ISP or Boundary Scan Test (IEEE 1149.1) Protocol
— Increased Manufacturing Yields, Reduced Time-toMarket, and Improved Product Quality
— Reprogram Soldered Devices for Faster Debugging
E1
AND Array
• HIGH-PERFORMANCE E2CMOS® TECHNOLOGY
— fmax = 100 MHz Maximum Operating Frequency
— tpd = 10 ns Propagation Delay
— TTL Compatible Inputs and Outputs
— Electrically Erasable and Reprogrammable
— Non-Volatile
— 100% Tested at Time of Manufacture
— Unused Product Term Shutdown Saves Power
H2
Output Routing Pool (ORP)
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Array
Output Routing Pool (ORP)
Features
• 100% IEEE 1149.1 BOUNDARY SCAN COMPATIBLE
A0
A1
A2
A3
Output Routing Pool (ORP)
• OFFERS THE EASE OF USE AND FAST SYSTEM
SPEED OF PLDs WITH THE DENSITY AND FLEXIBILITY
OF FIELD PROGRAMMABLE GATE ARRAYS
— Complete Programmable Device Can Combine Glue
Logic and Structured Designs
— Enhanced Pin Locking Capability
— Five Dedicated Clock Input Pins
— Synchronous and Asynchronous Clocks
— Programmable Output Slew Rate Control to
Minimize Switching Noise
— Flexible Pin Placement
— Optimized Global Routing Pool Provides Global
Interconnectivity
— Pin Compatible with ispLSI 3160
B0
B1
B2
B3
Output Routing Pool (ORP)
0139/3320
Description
The ispLSI 3320 is a High-Density Programmable Logic
Device containing 480 Registers, 160 Universal I/O pins,
five Dedicated Clock Input Pins, ten Output Routing
Pools (ORP) and a Global Routing Pool (GRP) which
allows complete inter-connectivity between all of these
elements. The ispLSI 3320 features 5V in-system programmability and in-system diagnostic capabilities. The
ispLSI 3320 offers non-volatile reprogrammability of the
logic, as well as the interconnect to provide truly
reconfigurable systems.
• ispDesignEXPERT™ – LOGIC COMPILER AND COMPLETE ISP DEVICE DESIGN SYSTEMS FROM HDL
SYNTHESIS THROUGH IN-SYSTEM PROGRAMMING
— Superior Quality of Results
— Tightly Integrated with Leading CAE Vendor Tools
— Productivity Enhancing Timing Analyzer, Explore
Tools, Timing Simulator and ispANALYZER™
— PC and UNIX Platforms
The basic unit of logic on the ispLSI 3320 device is the
Twin Generic Logic Block (Twin GLB) labelled A0, A1...J3.
There are a total of 40 of these Twin GLBs in the ispLSI
3320 device. Each Twin GLB has 24 inputs, a programmable AND array and two OR/Exclusive-OR Arrays, and
eight outputs which can be configured to be either combinatorial or registered. All Twin GLB inputs come from
the GRP.
Copyright © 2003 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject
to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
3320_07
1
December 2003
D0
D1
D2
2
D3
E0
E1
A1
G2
A2
G1
A3
G0
Global Routing Pool
(GRP)
B0
F3
B1
F2
B2
F1
B3
F0
E2
E3
Output Routing Pool (ORP)
Output Routing Pool (ORP)
Output Routing Pool (ORP)
Input Bus
Input Bus
Input Bus
Input Bus
Output Routing Pool (ORP)
G3
Input Bus
A0
Output Routing Pool (ORP)
H1
CLK 0
CLK 1
CLK 2
IOCLK 1
IOCLK 0
Output Routing Pool (ORP)
Y0
Y1
Y2
Y3
Y4
C3
H3
H2
I/O 76
I/O 77
I/O 78
I/O 79
C2
I0
I/O 72
I/O 73
I/O 74
I/O 75
Input Bus
Output Routing Pool (ORP)
I/O 68
I/O 69
I/O 70
I/O 71
Input Bus
Output Routing Pool (ORP)
I/O 64
I/O 65
I/O 66
I/O 67
C1
I1
I/O 60
I/O 61
I/O 62
I/O 63
C0
I2
I/O 56
I/O 57
I/O 58
I/O 59
I/O 28
I/O 29
I/O 30
I/O 31
I3
I/O 52
I/O 53
I/O 54
I/O 55
I/O 24
I/O 25
I/O 26
I/O 27
J0
I/O 48
I/O 49
I/O 50
I/O 51
I/O 20
I/O 21
I/O 22
I/O 23
J1
I/O 44
I/O 45
I/O 46
I/O 47
I/O 16
I/O 17
I/O 18
I/O 19
J2
I/O 40
I/O 41
I/O 42
I/O 43
J3
I/O 36
I/O 37
I/O 38
I/O 39
TOE
I/O 32
I/O 33
I/O 34
I/O 35
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I/O 12
I/O 13
I/O 14
I/O 15
Output Routing Pool (ORP)
I/O 0
I/O 1
I/O 2
I/O 3
Output Routing Pool (ORP)
I/O 8
I/O 9
I/O 10
I/O 11
Input Bus
I/O 4
I/O 5
I/O 6
I/O 7
Input Bus
GOE0
TMS/MODE
TCK/SCLK
BSCAN/ispEN
I/O 115
I/O 114
I/O 113
I/O 112
I/O 119
I/O 118
I/O 117
I/O 116
I/O 123
I/O 122
I/O 121
I/O 120
I/O 127
I/O 126
I/O 125
I/O 124
I/O 131
I/O 130
I/O 129
I/O 128
I/O 135
I/O 134
I/O 133
I/O 132
I/O 139
I/O 138
I/O 137
I/O 136
I/O 143
I/O 142
I/O 141
I/O 140
I/O 147
I/O 146
I/O 145
I/O 144
I/O 151
I/O 150
I/O 149
I/O 148
I/O 155
I/O 154
I/O 153
I/O 152
I/O 159
I/O 158
I/O 157
I/O 156
GOE1
Specifications ispLSI 3320
Functional Block Diagram
Figure 1. ispLSI 3320 Functional Block Diagram
Input Bus
Boundary
Scan
TDI/SDI
H0
TRST
TDO/SDO
I/O 111
I/O 110
I/O 109
I/O 108
I/O 107
I/O 106
I/O 105
I/O 104
I/O 103
I/O 102
I/O 101
I/O 100
I/O 99
I/O 98
I/O 97
I/O 96
I/O 95
I/O 94
I/O 93
I/O 92
I/O 91
I/O 90
I/O 89
I/O 88
I/O 87
I/O 86
I/O 85
I/O 84
I/O 83
I/O 82
I/O 81
I/O 80
RESET
0139/3320
Specifications ispLSI 3320
Description (continued)
Clocks in the ispLSI 3320 device are provided through
five dedicated clock pins. The five pins provide three
clocks to the Twin GLBs and two clocks to the I/O cells.
All local logic block outputs are brought back into the
GRP so they can be connected to the inputs of any other
logic block on the device. The device also has 160 I/O
cells, each of which is directly connected to an I/O pin.
Each I/O cell can be individually programmed to be a
combinatorial input, a registered input, a latched input, an
output or a bidirectional I/O pin with 3-state control. The
signal levels are TTL compatible voltages and the output
drivers can source 4 mA or sink 8 mA. Each output can
be programmed independently for fast or slow output
slew rate to minimize overall output switching noise.
The table below lists key attributes of the device along
with the number of resources available.
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An additional feature of the ispLSI 3320 is the Boundary
Scan capability, which is composed of cells connected
between the on-chip system logic and the device’s input
and output pins. All I/O pins have associated boundary
scan registers, with 3-state I/O using three boundary
scan registers and inputs using one.
The 160 I/O cells are grouped into ten sets of 16 bits.
Each of these I/O groups is associated with a logic
Megablock through the use of the ORP. Each Megablock
is able to provide one Product Term Output Enable
(PTOE) signal which is globally distributed to all I/O cells.
That PTOE signal can be generated within any GLB in the
Megablock. Each I/O cell can select one of 12 available
OEs (two Global OEs and ten PTOEs).
The ispLSI 3320 supports all IEEE 1149.1 mandatory
instructions, which include BYPASS, EXTEST and
SAMPLE.
Key Attributes of the ispLSI 3320
Attribute
Four Twin GLBs, 16 I/O cells and one ORP are connected together to make a logic Megablock. The
Megablock is defined by the resources that it shares. The
outputs of the four Twin GLBs are connected to a set of
16 I/O cells by the ORP. The ispLSI 3320 Device
contains ten of these Megablocks.
40
Registers
480
I/O Pins
160
Global Clocks
5
Global OE
2
Test OE
The GRP has as its inputs the outputs from all of the Twin
GLBs and all of the inputs from the bidirectional I/O cells.
All of these signals are made available to the inputs of the
Twin GLBs. Delays through the GRP have been equalized to minimize timing skew and logic glitching.
Quantity
Twin GLBs
1
Table 1-0003/3320
3
Specifications ispLSI 3320
Absolute Maximum Ratings 1
Supply Voltage Vcc ................................................................................ -0.5 to +7.0V
Input Voltage Applied ..................................................................... -2.5 to VCC +1.0V
Off-State Output Voltage Applied .................................................. -2.5 to VCC +1.0V
Storage Temperature ............................................................................. -65 to 150°C
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Case Temp. with Power Applied ........................................................... -55 to 125°C
Max. Junction Temp. (TJ) with Power Applied (208-Pin PQFP) ...................... 150°C
Max. Junction Temp. (TJ) with Power Applied (320-Ball BGA) ........................ 140°C
1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional
operation of the device at these or at any other conditions above those indicated in the operational sections of this specification
is not implied (while programming, follow the programming specifications).
DC Recommended Operating Condition
PARAMETER
SYMBOL
TA
VCC
VIL
VIH
Ambient Temperature
MIN.
MAX.
UNITS
0
70
°C
4.75
5.25
V
Input Low Voltage
0
0.8
V
Input High Voltage
2.0
VCC +1
Supply Voltage
V
Table 2-0005/3320
Capacitance (TA=25°C,f=1.0 MHz)
TYPICAL
UNITS
I/O Capacitance
10
pf
VCC = 5.0V, VI/O = 2.0V
Clock Capacitance
11
pf
VCC = 5.0V, VY = 2.0V
SYMBOL
C1
C2
PARAMETER
TEST CONDITIONS
Table 2-0006/3320
Data Retention Specifications
PARAMETER
MINIMUM
MAXIMUM
UNITS
20
–
Years
10000
–
Cycles
Data Retention
ispLSI Erase/Reprogram Cycles
Table 2-0008/3320
4
Specifications ispLSI 3320
Switching Test Conditions
Figure 2. Test Load
GND to 3.0V
Input Pulse Levels
+ 5V
≤ 3 ns 10% to 90%
Input Rise and Fall Time
Input Timing Reference Levels
1.5V
Output Timing Reference Levels
1.5V
Output Load
R1
Device
Output
See Figure 2
Table 2-0003/3320
3-state levels are measured 0.5V from
steady-state active level.
Test
Point
CL*
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R2
*CL includes Test Fixture and Probe Capacitance.
Output Load conditions (See Figure 2)
0213A
TEST CONDITION
A
B
C
R1
R2
CL
470Ω
390Ω
35pF
Active High
∞
390Ω
35pF
Active Low
470Ω
390Ω
35pF
Active High to Z
at VOH -0.5V
∞
390Ω
5pF
Active Low to Z
at VOL +0.5V
470Ω
390Ω
5pF
Table 2 - 0004A
DC Electrical Characteristics
Over Recommended Operating Conditions
SYMBOL
VOL
VOH
IIL
IIH
IIL-isp
IIL-PU
IOS1
ICC2, 4
CONDITION
PARAMETER
3
MIN.
TYP.
MAX. UNITS
Output Low Voltage
IOL= 8 mA
–
–
0.4
V
Output High Voltage
IOH = -4 mA
2.4
–
–
V
Input or I/O Low Leakage Current
0V ≤ VIN ≤ VIL (Max.)
–
–
-10
µA
Input or I/O High Leakage Current
3.5V ≤ VIN ≤ VCC
–
–
10
µA
ispEN Input Low Leakage Current
0V ≤ VIN ≤ VIL
–
–
-150
µA
I/O Active Pull-Up Current
0V ≤ VIN ≤ VIL
–
–
-150
µA
Output Short Circuit Current
VCC = 5V, VOUT = 0.5V
–
–
-200
mA
Operating Power Supply Current
VIL = 0.0V, VIH = 3.0V, fCLOCK = 1 MHz
–
370
–
mA
1. One output at a time for a maximum duration of one second. VOUT = 0.5V was selected to avoid test problems Table 2-0007/3320
by tester ground degradation. Characterized but not 100% tested.
2. Measured using twenty 16-bit counters.
3. Typical values are at VCC = 5V and TA= 25°C.
4. Maximum I CC varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to
estimate maximum ICC .
5
Specifications ispLSI 3320
External Switching Characteristics1, 2, 3
Over Recommended Operating Conditions
5
PARAMETER
DESCRIPTION
-100
1
-70
MIN. MAX. MIN. MAX.
UNITS
A
1 Data Propagation Delay, 4PT Bypass, ORP Bypass
–
10.0
–
15.0
ns
A
2 Data Propagation Delay
–
13.0
–
18.0
ns
A
3 Clock Frequency with Internal Feedback 3
100
–
70.0
–
MHz
77.0
–
50.0
–
MHz
–
4 Clock Frequency with External Feedback (
1
tsu2 + tco1
)
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tpd1
tpd2
fmax
fmax (Ext.)
fmax (Tog.)
tsu1
tco1
th1
tsu2
tco2
th2
tr1
trw1
tptoeen
tptoedis
tgoeen
tgoedis
ttoeen
ttoedis
twh
twl
tsu3
th3
TEST
2
#
COND.
1.
2.
3.
4.
5.
4
–
5 Clock Frequency, Maximum Toggle
–
6 GLB Reg. Setup Time before Clock, 4 PT Bypass
100
–
83.0
–
MHz
6.0
–
9.0
–
ns
A
7 GLB Reg. Clock to Output Delay, ORP Bypass
–
6.0
–
9.0
ns
–
8 GLB Reg. Hold Time after Clock, 4 PT Bypass
0.0
–
0.0
–
ns
–
9 GLB Reg. Setup Time before Clock
7.0
–
11.0
–
ns
–
10 GLB Reg. Clock to Output Delay
–
7.0
–
10.0
ns
–
11 GLB Reg. Hold Time after Clock
0.0
–
0.0
–
ns
A
12 Ext. Reset Pin to Output Delay
–
13.5
–
15.0
ns
–
13 Ext. Reset Pulse Duration
6.5
–
12.0
–
ns
B
14 Input to Output Enable
–
18.0
–
21.0
ns
C
15 Input to Output Disable
–
18.0
–
21.0
ns
B
16 Global OE Output Enable
–
9.0
–
12.0
ns
C
17 Global OE Output Disable
–
9.0
–
12.0
ns
B
18 Test OE Output Enable
–
12.0
–
15.0
ns
C
19 Test OE Output Disable
–
12.0
–
15.0
ns
–
20 Ext. Synchronous Clock Pulse Duration, High
5.0
–
6.0
–
ns
–
21 Ext. Synchronous Clock Pulse Duration, Low
5.0
–
6.0
–
ns
–
22 I/O Reg Setup Time before Ext. Synchronous Clock (Y3, Y4)
4.5
–
5.0
–
ns
–
23 I/O Reg Hold Time after Ext. Sync Clock (Y3, Y4)
0.0
–
0.0
–
ns
Unless noted otherwise, all parameters use 20 PTXOR path and ORP.
Refer to Timing Model in this data sheet for further details.
Standard 16-bit counter using GRP feedback.
fmax (Toggle) may be less than 1/(twh + twl). This is to allow for a clock duty cycle of other than 50%.
Reference Switching Test Conditions section.
6
Table 2-0030/3320
Specifications ispLSI 3320
Internal Timing Parameters1
Over Recommended Operating Conditions
PARAMETER
2
#
DESCRIPTION
-100
-70
MIN. MAX. MIN. MAX.
UNITS
Inputs
24 I/O Register Bypass
–
1.5
–
3.2
ns
25 I/O Latch Delay
–
13.0
–
18.2
ns
7.5
–
9.0
–
ns
26 I/O Register Setup Time before Clock
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tiobp
tiolat
tiosu
tioh
tioco
tior
27 I/O Register Hold Time after Clock
-3.0
–
-4.0
–
ns
28 I/O Register Clock to Out Delay
–
2.5
–
4.2
ns
29 I/O Register Reset to Out Delay
–
2.5
–
4.2
ns
30 GRP Delay
–
3.0
–
3.5
ns
31 Feedback Delay
–
1.1
–
1.6
ns
32 4 Product Term Bypass Path Delay (Comb.)
–
3.5
–
5.3
ns
33 4 Product Term Bypass Path Delay (Reg.)
–
3.5
–
3.8
ns
34 1 Product Term/XOR Path Delay
–
4.5
–
5.8
ns
35 20 Product Term/XOR Path Delay
–
4.5
–
5.8
ns
–
5.5
–
7.3
ns
–
0.5
–
0.5
ns
38 GLB Register Setup Time before Clock
1.0
–
2.5
–
ns
39 GLB Register Hold Time after Clock
4.9
–
6.3
–
ns
40 GLB Register Clock to Output Delay
–
0.5
–
1.0
ns
41 GLB Register Reset to Output Delay
–
1.0
–
1.0
ns
42 GLB Product Term Reset to Register Delay
–
7.9
–
11.5
ns
43 GLB Product Term Output Enable to I/O Cell Delay
–
9.5
–
9.3
ns
3.2
3.2
4.5
4.5
ns
45 ORP Delay
–
1.5
–
2.0
ns
46 ORP Bypass Delay
–
0.0
–
0.0
ns
GRP
tgrp
tfeedback
GLB
t4ptbp
t4ptbr
t1ptxor
t20ptxor
txoradj
tgbp
tgsu
tgh
tgco
tgro
tptre
tptoe
tptck
36 XOR Adjacent Path Delay
3
37 GLB Register Bypass Delay
44 GLB Product Term Clock Delay
ORP
torp
torpbp
1. Internal Timing Parameters are not tested and are for reference only.
2. Refer to Timing Model in this data sheet for further details.
3. The XOR adjacent path can only be used by hard macros.
7
Table 2-0036/3320
Specifications ispLSI 3320
Internal Timing Parameters1
Over Recommended Operating Conditions
PARAMETER
2
#
DESCRIPTION
-100
-70
MIN. MAX. MIN. MAX.
UNITS
Outputs
47 Output Buffer Delay
–
2.0
–
3.0
ns
48 Output Buffer Delay, Slew Limited Adder
–
12.0
–
13.0
ns
49 I/O Cell OE to Output Enabled
–
4.0
–
5.0
ns
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tob
tobs
toen
todis
50 I/O Cell OE to Output Disabled
–
4.0
–
5.0
ns
51 Clock Delay, Y0 or Y1 or Y2 to Global GLB Clock Line
3.0
3.0
4.0
4.0
ns
52 Clock Delay, Y3 or Y4 to I/O Cell Global Clock Line
3.0
3.0
4.0
4.0
ns
53 Global Reset to GLB and I/O Registers
–
9.0
–
9.0
ns
54 Global OE Pad Buffer
–
5.0
–
7.0
ns
55 Test OE Pad Buffer
–
8.0
–
10.0
ns
Clocks
tgy0/1/2
tioy3/4
Global Reset
tgr
tgoe
ttoe
1. Internal Timing Parameters are not tested and are for reference only.
2. Refer to Timing Model in this data sheet for further details.
8
Table 2-0037/3320
Specifications ispLSI 3320
ispLSI 3320 Timing Model
I/O Cell
GRP
GLB
Feedback
ORP
I/O Cell
#31
#32
I/O Reg Bypass
I/O Pin
(Input)
#24
#30
Input
D Register Q
RST
#25 - 29
4 PT Bypass
GLB Reg Bypass
ORP Bypass
#33
#37
#46
20 PT
XOR Delays
GLB Reg
Delay
ORP
Delay
D
#34 - 36
Q
#45
#47, 48
#49, 50
I/O Pin
(Output)
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#53
GRP
RST
#53
Reset
Y3,4
#38 - 41
#52
Control RE
PTs
OE
#42 - 44 CK
#51
Y0,1,2
#54
GOE0,1
#55
TOE
0902/3320
Derivations of tsu, th and tco from the Product Term Clock 1
tsu
=
=
=
2.3 ns =
Logic + Reg su - Clock (min)
(tiobp + tgrp + t20ptxor) + (tgsu) - (tiobp + tgrp + tptck(min))
(#24+ #30+ #35) + (#38) - (#24+ #30+ #44)
(1.5 + 3.0 + 4.5) + (1.0) - (1.5 + 3.0 + 3.2)
th
=
=
=
3.6 ns =
Clock (max) + Reg h - Logic
(tiobp + tgrp + tptck(max)) + (tgh) - (tiobp + tgrp + t20ptxor)
(#24+ #30+ #44) + (#39) - (#24+ #30+ #35)
(1.5 + 3.0 + 3.2) + (4.9) - (1.5 + 3.0 + 4.5)
tco
=
=
=
11.7 ns =
Clock (max) + Reg co + Output
(tiobp + tgrp + tptck(max)) + (tgco) + (torp + tob)
(#24 + #30 + #44) + (#40) + (#45 + #47)
(1.5 + 3.0 + 3.2) + (0.5) + (1.5 + 2.0)
Table 2-0042/3320
Note: Calculations are based on timing specs for the ispLSI 3320-100L.
9
Specifications ispLSI 3320
Power Consumption
Figure 3 shows the relationship between power and
operating speed.
Power consumption in the ispLSI 3320 device depends
on two primary factors: the speed at which the device is
operating and the number of product terms used.
Figure 3. Typical Device Power Consumption vs fmax
800
ispLSI 3320
ICC (mA)
A
D LL
IS
C DE
O
N VIC
TI
N ES
U
ED
700
600
500
400
300
200
0
25
50
75
100
fmax (MHz)
Notes: Configuration of 20 16-bit Counters
Typical Current at 5V, 25° C
ICC can be estimated for the ispLSI 3320 using the following equation:
ICC = 60 + (# of PTs * 0.5) + (# of nets * Max. freq * 0.0095) where:
# of PTs = Number of Product Terms used in design
# of nets = Number of Signals used in device
Max. freq = Highest Clock Frequency to the device
The ICC estimate is based on typical conditions (VCC = 5.0V, room temperature) and an assumption of 2 GLB loads
on average exists. These values are for estimates only. Since the value of ICC is sensitive to operating conditions
and the program in the device, the actual ICC should be verified.
0127A/3320
10
Specifications ispLSI 3320
Signal Descriptions
Signal Name
GOE0, GOE1
Global Output Enable input pins.
Description
I/O
Input/Output Pins – These are the general purpose I/O pins used by the logic array.
Test Output Enable pin – This pin tristates all I/O pins when a logic low is driven.
RESET
Active Low (0) Reset pin which resets all of the GLB and I/O registers in the device.
Y0, Y1, Y2
Dedicated Clock inputs. These clock inputs are connected to one of the clock inputs of all the GLBs on
the device.
Y3, Y4
Dedicated Clock inputs. These clock inputs are connected to one of the clock inputs of all the I/O cells on
the device.
A
D LL
IS
C DE
O
N VIC
TI
N ES
U
ED
TOE
BSCAN/ispEN
Input – Dedicated in-system programming enable input pin. When this pin is high, the BSCAN TAP
controller pins TMS, TDI, TDO and TCK are enabled. When this pin is brought low, the ISP State
Machine control pins MODE, SDI, SDO and SCLK are enabled. High-to-low transition of this pin will put
the device in the programming mode and put all I/O pins in the high-Z state.
TDI/SDI
Input – This pin performs two functions. It is the Test Data input pin when ispEN is logic high. When
ispEN is logic low, it functions as an input pin to load programming data into the device. SDI is also used
as one of the two control pins for the ISP State Machine.
TCK/SCLK
Input – This pin performs two functions. It is the Test Clock input pin when ispEN is logic high. When
ispEN is logic low, it functions as a clock pin for the Serial Shift Register.
TMS/MODE
Input – This pin performs two functions. It is the Test Mode Select input pin when ispEN is logic high.
When ispEN is logic low, it functions as a pin to control the operation of the ISP State Machine.
TRST
Input – Test Reset, active low to reset the Boundary Scan State Machine.
TDO/SDO
Output – This pin performs two functions. When ispEN is logic low, it functions as the pin to read the ISP
data. When ispEN is high, it functions as Test Data Out.
GND
Ground (GND)
VCC
Vcc
1
NC
No Connect.
1. NC pins are not to be connected to any active signals, VCC or GND.
11
Specifications ispLSI 3320
Signal Locations
Signal
208-Pin PQFP
320-Ball BGA
GOE0, GOE1
133, 134
AD12, AC11
TOE
30
B14
RESET
28
D13
Y0, Y1, Y2, Y3, Y4
132, 130, 129, 128, 127
AA12, AC13, AB13, AA13, AD13
BSCAN/ispEN
27
B12
TDI/SDI
25
C12
TCK/SCLK
24
D12
A
D LL
IS
C DE
O
N VIC
TI
N ES
U
ED
TMS/MODE
23
A12
TRST
29
A13
TDO/SDO
185
M4
GND
11, 26, 42, 53, 65, 78, 92, 104, 115,
131, 146, 157, 169, 183, 196, 208
A16, B13, C8, D6, D19, F4, F21, H22, J1, M2, N23, T24, U3,
W4, W21, AA6, AA19, AB17, AC12, AD9
VCC
14, 39, 58, 80, 99, 118, 143, 162, 181,
203
B10, B18, C3, D4, D21, G2, K23, R2, V23, AA4, AA21,AC7,
AC15
NC1
76, 77, 79, 81, 180, 182, 184
A1, A2, A3, A6, A9, A11, A14, A20, A23, A24, B1, B2, B5, B8,
B9, B16, B17, B20, B23, B24, C5, C13, C17, C20, C24, D7,
D11, D14, D17, D20, E1, E2, E3, E4, E22, E23, F24, G21,
G23, H2, H3, H4, H23, J2, J23, J24, K3, L1, L4, L21, L24, M3,
M21, M22, M23, N2, N3, N4, N21, N22, N24, P1, P4, P21,
P24, R22, T1, T2, T23, U2, U21, U22, U23, V2, V4, W1, Y2,
Y3, Y21, Y22, Y23, Y24, AA5, AA8, AA11, AA14, AA18, AB1,
AB5, AB8, AB12, AB20, AC1, AC2, AC5, AC8, AC9, AC16,
AC17, AC20, AC23, AC24, AD1, AD2, AD5, AD11, AD14,
AD16, AD19, AD22, AD23, AD24
1. NC pins are not to be connected to any active signals, VCC or GND.
12
Specifications ispLSI 3320
I/O Locations
PQFP
BGA
Signal
PQFP
BGA
Signal
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
I/O 8
I/O 9
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
I/O 16
I/O 17
I/O 18
I/O 19
I/O 20
I/O 21
I/O 22
I/O 23
I/O 24
I/O 25
I/O 26
I/O 27
I/O 28
I/O 29
I/O 30
I/O 31
I/O 32
I/O 33
I/O 34
I/O 35
I/O 36
I/O 37
I/O 38
I/O 39
31
32
33
34
35
36
37
38
40
41
43
44
45
46
47
48
49
50
51
52
54
55
56
57
59
60
61
62
63
64
66
67
68
69
70
71
72
73
74
75
C14
A15
B15
C15
D15
A17
C16
D16
A18
A19
C18
B19
D18
C19
A21
B21
A22
C21
B22
C22
C23
D22
E21
D23
D24
F22
E24
F23
G22
H21
G24
J21
J22
H24
K21
K22
K24
L22
L23
M24
I/O 40
I/O 41
I/O 42
I/O 43
I/O 44
I/O 45
I/O 46
I/O 47
I/O 48
I/O 49
I/O 50
I/O 51
I/O 52
I/O 53
I/O 54
I/O 55
I/O 56
I/O 57
I/O 58
I/O 59
I/O 60
I/O 61
I/O 62
I/O 63
I/O 64
I/O 65
I/O 66
I/O 67
I/O 68
I/O 69
I/O 70
I/O 71
I/O 72
I/O 73
I/O 74
I/O 75
I/O 76
I/O 77
I/O 78
I/O 79
82
83
84
85
86
87
88
89
90
91
93
94
95
96
97
98
100
101
102
103
105
106
107
108
109
110
111
112
113
114
116
117
119
120
121
122
123
124
125
126
P23
P22
R24
R23
R21
U24
T22
T21
V24
W24
V22
W23
V21
W22
AA24
AA23
AB24
AA22
AB23
AB22
AC22
AB21
AA20
AC21
AD21
AB19
AD20
AC19
AB18
AA17
AC18
AD18
AA16
AB16
AD17
AA15
AB15
AD15
AB14
AC14
I/O 80
I/O 81
I/O 82
I/O 83
I/O 84
I/O 85
I/O 86
I/O 87
I/O 88
I/O 89
I/O 90
I/O 91
I/O 92
I/O 93
I/O 94
I/O 95
I/O 96
I/O 97
I/O 98
I/O 99
I/O 100
I/O 101
I/O 102
I/O 103
I/O 104
I/O 105
I/O 106
I/O 107
I/O 108
I/O 109
I/O 110
I/O 111
I/O 112
I/O 113
I/O 114
I/O 115
I/O 116
I/O 117
I/O 118
I/O 119
PQFP
BGA
Signal
PQFP
BGA
135
136
137
138
139
140
141
142
144
145
147
148
149
150
151
152
153
154
155
156
158
159
160
161
163
164
165
166
167
168
170
171
172
173
174
175
176
177
178
179
AB11
AD10
AC10
AB10
AA10
AD8
AB9
AA9
AD7
AD6
AB7
AC6
AA7
AB6
AD4
AC4
AD3
AB4
AC3
AB3
AB2
AA3
Y4
AA2
AA1
W3
Y1
W2
V3
U4
V1
T4
T3
U1
R4
R3
R1
P3
P2
N1
I/O 120
I/O 121
I/O 122
I/O 123
I/O 124
I/O 125
I/O 126
I/O 127
I/O 128
I/O 129
I/O 130
I/O 131
I/O 132
I/O 133
I/O 134
I/O 135
I/O 136
I/O 137
I/O 138
I/O 139
I/O 140
I/O 141
I/O 142
I/O 143
I/O 144
I/O 145
I/O 146
I/O 147
I/O 148
I/O 149
I/O 150
I/O 151
I/O 152
I/O 153
I/O 154
I/O 155
I/O 156
I/O 157
I/O 158
I/O 159
186
187
188
189
190
191
192
193
194
195
197
198
199
200
201
202
204
205
206
207
1
2
3
4
5
6
7
8
9
10
12
13
15
16
17
18
19
20
21
22
M1
L2
L3
K1
K2
K4
H1
J3
J4
G1
F1
G3
F2
G4
F3
D1
D2
C1
D3
C2
B3
C4
D5
B4
A4
C6
A5
B6
C7
D8
B7
A7
D9
C9
A8
D10
C10
A10
C11
B11
A
D LL
IS
C DE
O
N VIC
TI
N ES
U
ED
Signal
13
Specifications ispLSI 3320
Pin Configuration
208
207
206
205
204
203
202
201
200
199
198
197
196
195
194
193
192
191
190
189
188
187
186
185
184
183
182
181
180
179
178
177
176
175
174
173
172
171
170
169
168
167
166
165
164
163
162
161
160
159
158
157
GND
I/O 139
I/O 138
I/O 137
I/O 136
VCC
I/O 135
I/O 134
I/O 133
I/O 132
I/O 131
I/O 130
GND
I/O 129
I/O 128
I/O 127
I/O 126
I/O 125
I/O 124
I/O 123
I/O 122
I/O 121
I/O 120
TDO/SDO
NC1
GND
NC1
VCC
NC1
I/O 119
i/O 118
I/O 117
I/O 116
I/O 115
I/O 114
I/O 113
I/O 112
I/O 111
I/O 110
GND
I/O 109
I/O 108
I/O 107
I/O 106
I/O 105
I/O 104
VCC
I/O 103
I/O 102
I/O 101
I/O 100
GND
ispLSI 3320 208-Pin PQFP (with Heat Spreader) Pinout Diagram
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
156
155
154
153
152
151
150
149
148
147
146
145
144
143
142
141
140
139
138
137
136
135
134
133
132
131
130
129
128
127
126
125
124
123
122
121
120
119
118
117
116
115
114
113
112
111
110
109
108
107
106
105
A
D LL
IS
C DE
O
N VIC
TI
N ES
U
ED
I/O 140
I/O 141
I/O 142
I/O 143
I/O 144
I/O 145
I/O 146
I/O 147
I/O 148
I/O 149
GND
I/O 150
I/O 151
VCC
I/O 152
I/O 153
I/O 154
I/O 155
I/O 156
I/O 157
I/O 158
I/O 159
TMS/MODE
TCK/SCLK
TDI/SDI
GND
BSCAN/ispEN
RESET
1TRST/NC
TOE
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
VCC
I/O 8
I/O 9
GND
I/O 10
I/O 11
I/O 12
I/O 13
I/O 14
I/O 15
I/O 16
I/O 17
I/O 18
I/O 19
ispLSI 3320
GND
I/O 20
I/O 21
I/O 22
I/O 23
VCC
I/O 24
I/O 25
I/O 26
I/O 27
I/O 28
I/O 29
GND
I/O 30
I/O 31
I/O 32
I/O 33
I/O 34
I/O 35
I/O 36
I/O 37
I/O 38
I/O 39
1NC
1NC
GND
1NC
VCC
1NC
I/O 40
I/O 41
I/O 42
I/O 43
I/O 44
I/O 45
I/O 46
I/O 47
I/O 48
I/O 49
GND
I/O 50
I/O 51
I/O 52
I/O 53
I/O 54
I/O 55
VCC
I/O 56
I/O 57
I/O 58
I/O 59
GND
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
104
Top View
1. NC pins are not to be connected to any active signal, VCC or GND.
208MQUAD/3320
14
I/O 99
I/O 98
I/O 97
I/O 96
I/O 95
I/O 94
I/O 93
I/O 92
I/O 91
I/O 90
GND
I/O 89
I/O 88
VCC
I/O 87
I/O 86
I/O 85
I/O 84
I/O 83
I/O 82
I/O 81
I/O 80
GOE1
GOE0
Y0
GND
Y1
Y2
Y3
Y4
I/O 79
I/O 78
I/O 77
I/O 76
I/O 75
I/O 74
I/O 73
I/O 72
VCC
I/O 71
I/O 70
GND
I/O 69
I/O 68
I/O 67
I/O 66
I/O 65
I/O 64
I/O 63
I/O 62
I/O 61
I/O 60
Specifications ispLSI 3320
Signal Configuration
ispLSI 3320 320-Ball BGA Signal Diagram
24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9
NC1 NC1
I/O
16
I/O
14
B
NC1 NC1
I/O
18
I/O
15
C
I/O
20
I/O
19
I/O
17
I/O
23
I/O
I/O
VCC NC1 GND
21
12
NC1
NC1
I/O
9
I/O
8
6
5
4
3
2
1
I/O
I/O I/O
I/O I/O
TMS/
NC1 TRST MODE NC1 157 NC1 154 151 NC1 146 144 NC1 NC1 NC1
A
NC1
I/O
VCC NC1 NC1
11
I/O
I/O I/O
I/O I/O
ispEN/ I/O
TOE GND BSCAN
VCC NC1 NC1
NC1
NC1 NC1
2
159
150 147
143 140
B
NC1
I/O
13
I/O
6
I/O
3
TDI/ I/O I/O I/O
I/O I/O
I/O I/O
I/O
GND
NC1
VCC
SDI 158 156 153
148 145
139 137
141
C
I/O
7
I/O
4
I/O I/O I/O
I/O
I/O I/O I/O
VCC
NC1 GND
155 152 149
142
138 136 135
D
NC1 NC1 NC1 NC1
E
I/O
10
I/O
I/O
5 GND 1
7
NC1
I/O
0
NC1
A
D LL
IS
C DE
O
N VIC
TI
N ES
U
ED
A
8
D
I/O
24
E
I/O
26
NC1 NC1
F
NC1
I/O
27
I/O GND
25
I/O I/O I/O
GND
134 132 130
F
G
I/O
30
NC1
I/O
28
NC1
I/O I/O
I/O
VCC
133 131
129
G
H
I/O
33
I/O
NC1 GND
29
I/O
126
H
NC1
TCK/
NC1 RESET SCLK
NC1
I/O
22
NC1 NC1 NC1
J
NC1 NC1
I/O
32
I/O
31
I/O I/O
1
128 127 NC GND
J
K
I/O
I/O
VCC
36
35
I/O
34
I/O
I/O I/O
NC1
125
124 123
K
L
NC1
I/O
38
NC1
I/O I/O
NC1
122 121
L
M
I/O
39
SDO/
I/O
1
TDO NC GND 120
M
N
NC1 GND NC1 NC1
I/O
119
N
NC1
NC1
I/O I/O
NC1
117 118
P
I/O
44
I/O
I/O I/O
VCC
116
114 115
R
I/O
47
I/O I/O
1
1
111 112 NC NC
T
NC1 NC1 NC1
I/O
I/O
GND NC1
109
113
U
NC1
I/O
I/O
NC1
110
108
V
GND
I/O I/O
NC1
105 107
W
I/O
I/O
NC1 NC1
102
106
Y
P
R
T
NC1
I/O
42
I/O
37
NC1
ispLSI 3320
NC1 NC1 NC1
I/O
40
I/O
43
GND NC1
I/O
41
NC1
I/O
46
U
I/O
45
V
I/O
I/O
VCC
48
50
W
I/O
49
Y
NC1 NC1 NC1 NC1
I/O
51
Bottom View
NC1 NC1 NC1
I/O
52
I/O
GND
53
AA
I/O
54
I/O
55
I/O
I/O
VCC
GND NC1
57
62
I/O
72
I/O
75
NC1
Y3
Y0
NC1
I/O
84
I/O
87
NC1
I/O
I/O I/O I/O
GND NC1 VCC
92
101 103 104
AA
AB
I/O
56
I/O
58
I/O
59
I/O
61
NC1
I/O
65
I/O
I/O
GND
68
73
I/O
76
I/O
78
Y2
NC1
I/O
80
I/O
83
I/O
86
NC1
I/O
90
AC
NC1 NC1
I/O
60
I/O
63
NC1
I/O
67
I/O
70
NC1 NC1 VCC
I/O
79
Y1 GND
AD
NC1 NC1 NC1
I/O
64
I/O
NC1
66
I/O
71
I/O
74
NC1
Y4
I/O
69
NC1
I/O
77
GOE I/O
1
82
I/O
93
NC1
I/O
97
I/O
99
I/O
NC1
100
AB
I/O
91
NC1
I/O
95
I/O
98
NC1 NC1
AC
I/O
88
I/O
89
NC1
I/O
94
I/O
96
NC1 NC1
AD
7
6
5
4
3
NC1 NC1 VCC
GOE
I/O
I/O
NC1
GND
0
81
85
24 23 22 21 20 19 18 17 16 15 14 13 12 11 10 9
8
2
1
320BGA/3320
1. NCs are not to be connected to any active signals, Vcc or GND.
Note: Ball A1 indicator dot on top side of package.
15
Specifications ispLSI 3320
Part Number Description
ispLSI 3320 – XXX X XXXX X
Device Family
Grade
Blank = Commercial
Device Number
Package
Q = PQFP (with Heat Spreader)
B320 = BGA
A
D LL
IS
C DE
O
N VIC
TI
N ES
U
ED
Speed
100 = 100 MHz fmax
70 = 70 MHz fmax
Power
L = Low
0212A/3320
Ordering Information
COMMERCIAL
FAMILY
ispLSI
fmax (MHz)
tpd (ns)
ORDERING NUMBER
PACKAGE
100
10
ispLSI 3320-100LQ
208-Pin PQFP
100
10
ispLSI 3320-100LB320
320-Ball BGA
70
15
ispLSI 3320-70LQ
208-Pin PQFP
70
15
ispLSI 3320-70LB320
320-Ball BGA
Table 2-0041A/3320
16