QUARTERLY RELIABILITY MONITOR REPORT Q1, Jan. ~ Mar. 2013 Prepared by MPSCD Reliability Engineering The Future of Analog IC Technology® MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT INDEX 1.0 INTRODUCTION ......................................................................................2 1.1 SHORT TERM RELIBILITY MONITORING ........................................................................................................................ 2 1.2 LONG TERM RELIBILITY MONITORING ........................................................................................................................... 2 2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS.........................3 3.0 PROCESS RELIABILITY MONITORING DATA ......................................4 3.1 BCM12B Process Technology ................................................................................................................................................ 4 3.2 BCM12S Process Technology ................................................................................................................................................ 6 3.3 BCM35 Process Technology ................................................................................................................................................... 8 3.4 BCM05 Process Technology ................................................................................................................................................... 9 3.5 BCM18 Process Technology ................................................................................................................................................ 10 4.0 PACKAGE RELIABILITY MONITORING DATA .................................... 11 4.1 QFN .................................................................................................................................................................................................. 11 4.2 SOIC ................................................................................................................................................................................................ 17 4.3 MSOP .............................................................................................................................................................................................. 26 4.4 TSOT ............................................................................................................................................................................................... 30 4.5 TSSOP ............................................................................................................................................................................................ 32 4.6 FLIP CHIP-QFN ......................................................................................................................................................................... 35 4.7 FLIP CHIP-SOIC........................................................................................................................................................................ 46 4.8 FLIP CHIP-TSOT ...................................................................................................................................................................... 50 The Future of Analog IC Technology® -1- MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT 1.0 INTRODUCTION This report summarizes the reliability testing results for MPS products as of Q1 2013. 1.1 SHORT TERM RELIBILITY MONITORING The short term monitoring runs on a daily basis. It provides a fast alert in case of changes in term of product reliability performance. Stress Test Name Test Condition Duration JEDEC EARLY LIFE 125°C, Vccmax 48 ~168 hrs JESD22-A108 Convection Reflow 260°C 3 times JESD22-A113 Temperature Cycle Cond C:-65℃ ~ 150℃ 100~200Cycles JESD22-A104 Autoclave 121°C /100%RH 48~96 hrs JESD22-A102 1.2 LONG TERM RELIBILITY MONITORING The long term monitoring runs on a quarterly basis. It provides the life stresses for periods long enough to provide the data necessary to calculate the steady state failure rates of products. Stress Test Name Test Condition Duration JEDEC HTOL 125°C, Vccmax 1000 hrs JESD22-A108 HTSL 150°C 1000 hrs JESD22-A103 Precondition / / JESD22-A113 Autoclave 121°C /100%RH 168 hrs JESD22-A102 Temperature Cycle Cond C:-65°C ~ 150°C 1000 Cycles JESD22-A104 85°C, 85% R.H., VDD 1000 hrs JESD22-A101 130°C, 85% R.H., VDD 96 hrs JESD22-A110 Temperature Humidity Bias (THB) High Accelerated Stress Test (HAST) The Future of Analog IC Technology® -2- MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT 2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS The long-term failure rate for a technology is gauged by a Failures In Time (FIT) calculation based upon accelerated stress data. The units for FIT are failures per Billion device hours. ( χ / 2) *10 2 FITRate = 9 stress * device hours The stress that enables FIT is High Temperature Operating Life (HTOL), which is a product level test. HTOL is accelerated by temperature and by voltage. The total number of failures in stress determines the chi-squared factor (a dimensionless number representing a 60% confidence level of statistics). The number of product units times the stress period (in Hours) is the device-Hours number. The Arrhenius equation uses the Activation energy for the fail mode as well as the stress temperature and the reporting temperature (e.g. 55℃) to compute the HTOL temperature acceleration factor, AF(T). The accelerated stress device-Hours is AF(T) times the device-Hours number. AFv= Exp(β(Vtest- Vuse), Vtest = Stress Voltage (V).Vuse = Nominal Voltage (V).β = Voltage Acceleration Constant (usually, 0.5 < Z < 1.0). The Future of Analog IC Technology® -3- MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT 3.0 PROCESS RELIABILITY MONITORING DATA 3.1 BCM12B Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: HHNEC, ASMC,SMIC EARLY LIFE (HTOL Short Term Monitor) Stress Duration: 48 ~168 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP2303DN C486631.9A 1232 02-06-13 50 168 0 MP2303DN C486631.9B 1234 02-06-13 50 168 0 MP1412DH C285403.7 1231 01-08-13 80 168 0 MP1412DH C285402.7R 1233 01-08-13 80 168 0 MP1412DH C285402.7 1234 01-08-13 80 168 0 MP2603EJ C888423.1AT 1243 01-25-13 80 168 0 MP2603EJ C888382.1AT 1243 01-25-13 80 168 0 MP2603EJ C988552.1 1247 02-27-13 79 168 0 MP1484EN C687360.7 1250 01-09-13 80 48 0 MP3302DJ C472636.7B 1248 02-04-13 80 48 0 MP2451DT C672847.7 1248 01-12-13 80 48 0 MP1484EN C787773.7 1251 01-15-13 80 48 0 MPQ2451DT1 C872014.7 1248 02-27-13 80 48 0 MPQ4460DQ C972085.7 1247 02-06-13 80 48 0 MP1484EN C787781.7 1251 02-08-13 78 48 0 MP4459DQT C772903.7 1248 02-18-13 80 48 0 MPQ2483DQ1 CA72108.9A 1249 02-27-13 80 48 0 MP1412DH C285299.7 1303 02-08-13 80 48 0 MP1593DN-C218 C385905.7 1223 02-08-13 80 48 0 MP3302DJ C486455.7 1302 02-27-13 80 48 0 MPQ7731DF C572802.7A 1248 02-27-13 80 48 0 MP9115DQT CA89007.8A 1305 02-27-13 80 48 0 MPQ4462DQ1 C472618.9A 1242 03-06-13 80 48 0 MP2359DT C687474.9 1303 02-22-13 80 48 0 MP3217DJ C888434.7 1303 03-06-13 80 48 0 MP1484EN-C321 C787819.7 1302 02-27-13 80 48 0 MP2307DN C787835.7 1304 02-27-13 80 48 0 MP3217DJ CA88955.9 1304 03-13-13 77 96 0 MP1412DH C285398.7 1304 02-27-13 77 96 0 MP1412DH C285401.7A 1305 03-01-13 80 48 0 MP1484EN C787834.7 1304 02-27-13 80 48 0 The Future of Analog IC Technology® -4- FA No. MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT LOT# D/C Close Date Sample Size # of hrs # of Fail MP1482DN C687441.7 1251 03-06-13 80 48 0 MP1411DH C285213.1A 1219 03-06-13 80 48 0 MP1411DH C285220.1A 1219 03-07-13 80 48 0 MP1411DH C285219.7 1219 03-13-13 80 48 0 MP1482DS-C165 CA88796.7 1305 03-06-13 80 48 0 Device MP1411DH C285218.7 1219 03-13-13 80 48 0 MPQ7731DF CB72236.9A 1308 03-20-13 80 48 0 MP1482DN CA88794.7 1305 03-20-13 80 48 0 MP1482DN C687458.7 1308 03-13-13 80 48 0 MP1484EN-C321 C787903.7 1305 03-20-13 80 48 0 MP1482DN C687456.7 1308 03-13-13 80 48 0 MP2105DJ C888428.7 1302 03-28-13 80 48 0 MP1484EN-C321 C687656.7 1308 03-13-13 80 48 0 MP1482DN C687636.7 1308 03-13-13 80 48 0 MP1482DN C687315.7 1308 03-13-13 80 48 0 MP1411DH C285213.7 1219 03-20-13 80 48 0 MP1411DH C285501.7 1308 03-20-13 80 48 0 NB600CQ C372376.7 1302 03-22-13 80 48 0 MP4460DQ C972050.7 1303 03-28-13 80 48 0 MP1484EN C788077.7 1305 03-20-13 80 48 0 MP1411DH C285503.7 1308 03-22-13 80 48 0 MP1482DN C687644.7 1308 03-20-13 80 48 0 MP2121DQ C587008.7 1309 03-28-13 80 48 0 MP1412DH BC84887.1A 1310 03-25-13 80 48 0 MP1482DN C687459.7 1309 03-28-13 80 48 0 MP1482DN C687455.7 1309 03-28-13 80 48 0 MP1482DS-C165 C787704.7 1302 03-28-13 80 48 0 MP1484EN C888216.7 1306 03-28-13 80 48 0 MP2303ADN C587166.7 1310 03-22-13 80 48 0 MP2012DQ C788042.1 1310 03-25-13 80 48 0 MP1484EN C888215.7 1306 03-28-13 80 48 0 Total FA No. 0 LONG TERM LIFE (HTOL Long Term Monitor) Stress Duration: 1000 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of Fail MPQ8039GN EP177100 1224 01-30-13 80 0 MPQ8039GN EP177102 1224 01-30-13 80 0 MP4000DS EP275800 1242 01-23-13 80 0 MP3900DK EP275300 1245 01-18-13 80 0 Total 0 The Future of Analog IC Technology® -5- FA No. MONOLITHIC POWER SYSTEMS Q1 BCM12B 2013 PRODUCT RELIABILITY REPORT #fail #device hours Accel Factor FIT Rate 0 240000 348 11.5 HIGH TEMPERATURE STORAGE LIFE (HTSL) Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MP2303DN C486631.9A 1232 02-06-13 46 0 MP2303DN C486631.9B 1234 02-06-13 45 0 MP1412DH C285403.7 1231 01-08-13 47 0 MP1412DH C285402.7 1233 01-08-13 50 0 MP1412DH C285402.7QB 1234 01-08-13 47 0 Total FA No. 0 3.2 BCM12S Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: HHNEC, ASMC,SMIC EARLY LIFE (HTOL Short Term Monitor) Stress Duration: 48 ~168 hours Test Condition: Vccmax @ 125°C D/C Close Date Sample Size # of hrs # of Fail Device LOT# MP28252EL C346213.9AQ 1215 02-06-13 50 168 0 MP28252EL C346496.1E 1220 02-06-13 50 168 0 MP28253EL C486626.7 1247 02-06-13 79 168 0 MP3388DR C345910.1AL 1233 01-03-13 80 168 0 MP3388DR C345910.1AM 1233 01-03-13 80 168 0 MP3388DR C345910.1AH 1233 01-03-13 80 168 0 MP3397EF C772924.1A 1236 03-04-13 77 168 0 MP1482DS-C165 C448499.8 1238 03-04-13 80 168 0 MP38900DL C988554.8 1246 02-20-13 78 168 0 MPQ9361DJ 8390919.1BA 1247 02-07-13 80 48 0 MPQ9361DJ C586952.7 1252 02-06-13 80 48 0 MP8736DL CB89028.8 1302 03-27-13 80 48 0 MP8736DL C788102.8 1303 03-22-13 80 48 0 MP8736DL C988556.8 1302 03-29-13 80 48 0 MP1482DS-C416 C64A284.8A 1250 02-27-13 80 48 0 MP3389EF CB89026.1 1303 02-27-13 80 48 0 MPQ9361DJ C586952.7BR 1252 02-27-13 80 48 0 The Future of Analog IC Technology® -6- FA No. MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP8736DL CB89038.8 1303 03-28-13 80 48 0 MP8705EN CA4J877.9 1303 02-27-13 80 48 0 MP3389EF CB89064.1 1304 02-27-13 80 48 0 MP8736DL C888208.8 1302 03-20-13 80 48 0 MP3389EF CB4K681.1 1304 03-13-13 80 48 0 MPQ28261DL C285336.7Y 1228 03-22-13 80 48 0 MP3389EF CB4K688.1 1305 03-20-13 80 48 0 MP28258DS CC89253.8A 1308 03-13-13 80 48 0 MP8125EF C888406.7 1309 03-22-13 80 48 0 MP28252EL C64B393.9 1307 03-13-13 80 48 0 MP3389EF CB89138.1 1305 03-28-13 80 48 0 MP8705EN C74B817.9 1309 03-25-13 80 48 0 MP3389EF-C355 CC4M105.9A 1310 03-28-13 80 48 0 MP1495DJ C872018.8 1302 02-27-13 80 48 0 MP1495DJ C872030.8 1305 02-27-13 80 48 0 Total FA No. 0 LONG TERM LIFE (HTOL Long Term Monitor) BCM12S Stress Duration: 1000 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of Fail MP28258DS H7G76302 1250 03-20-13 80 0 MP8125EF HP29007 1245 03-21-13 79 0 Total FA No. 0 BCM12S #fail #device hours Accel Factor FIT Rate 0 159000 348 17 HIGH TEMPERATURE STORAGE LIFE (HTSL) Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MP28252EL C346213.9AQ 1215 02-06-13 47 0 MP28252EL C346496.1E 1220 02-06-13 47 0 MP3388DR C345910.1AL 1233 01-03-13 45 0 MP3388DR C345910.1AM 1233 01-03-13 45 0 MP3388DR C345910.1AH 1233 01-03-13 45 0 MP150GJ EP252601 1238 01-23-13 50 0 MP4700GS C586922.1A 1247 02-06-13 50 0 MP4700GS C586922.1B 1246 02-06-13 50 0 The Future of Analog IC Technology® -7- FA No. MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of Fail MP3397EF C772924.1A 1236 03-04-13 50 0 MP8125EF HP29007 1245 03-21-13 50 0 MP6922AGN FA222077B 1217 03-20-13 45 0 MP6922AGN FA222077A-Q2A 1227 03-20-13 50 0 MP6922AGN FA222077A-Q2B 1229 03-20-13 50 0 MP6910DZ A998713.5 1240 03-08-13 50 0 MP6920DN A872708.9A 1242 03-20-13 49 0 Total FA No. 0 3.3 BCM35 Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: ASMC,SMIC LONG TERM LIFE (HTOL Long Term Monitor) BCM35 Stress Duration: 1000 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of Fail MP7748SGF HP274119 1244 01-11-13 78 0 MP2635GR HP2967 1229 01-25-13 95 0 MP3398GS HP306405 1238 01-25-13 86 0 Total FA No. 0 BCM35 #fail #device hours Accel Factor FIT Rate 0 259 348 10.6 HIGH TEMPERATURE STORAGE LIFE (HTSL) BCM35 Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MP7748SGF HP274119 1244 01-11-13 50 0 MP2635GR HP2967 1229 01-25-13 47 0 MP2635GR HP2967Q3 1237 01-25-13 47 0 MP8845GC HP272301 1212 01-25-13 50 0 MPM3810GQB HP300301-LOT1 1244 02-06-13 47 0 MPM3810GQB HP3003-LOT2 1248 02-06-13 50 0 MP2122GJ EP263102R1 1241 01-18-13 47 0 MP3398GS HP306405 1238 01-25-13 46 0 MP7748SGF HP274115 1236 03-04-13 50 0 The Future of Analog IC Technology® -8- FA No. MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of Fail MP7748SGF HP274113 1247 02-26-13 50 0 Total FA No. 0 3.4 BCM05 Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: ASMC,HHNEC EARLY LIFE (HTOL Short Term Monitor) BCM05 Stress Duration: 48 ~168 hours Test Condition: Vccmax @125°C D/C Close Date Sample Size # of Fail Device LOT# # of hrs MP20043DGT AC72657.1E 1304 03-01-13 80 48 0 MP6400DJ-01 CB89119.1 1304 03-06-13 80 48 0 Total FA No. 0 LONG TERM LIFE (HTOL Long Term Monitor) BCM05 Stress Duration: 1000 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of Fail MP2130DG EP272712 1244 01-25-13 80 0 Total FA No. 0 BCM05 #fail #device hours Accel Factor FIT Rate 0 80000 348 33 HIGH TEMPERATURE STORAGE LIFE (HTSL) BCM05 Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MP20045DN C482617.7 1225 02-06-13 47 0 MP20045DN B982447.7 1214 02-06-13 48 0 MP2130DG EP272712 1244 01-25-13 50 0 Total 0 The Future of Analog IC Technology® -9- FA No. MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT 3.5 BCM18 Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: SMIC LONG TERM LIFE (HTOL Long Term Monitor) BCM18 Stress Duration: 1000 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of Fail NB669GQ HP2884 1233 01-22-13 80 0 Total FA No. 0 BCM35 #fail #device hours Accel Factor FIT Rate 0 80000 348 33 HIGH TEMPERATURE STORAGE LIFE (HTSL) BCM18 Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail NB669GQ HP2884 1233 01-22-13 47 0 NB670LGQ HP2992 1238 01-18-13 50 0 NB669GQ HP2884 1238 01-18-13 47 0 NB675GL HP302401 1241 02-27-13 50 0 Total 0 The Future of Analog IC Technology® - 10 - FA No. MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT 4.0 PACKAGE RELIABILITY MONITORING DATA 4.1 QFN The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD QFN2*2 ASAT QFN2*2 UCD QFN2*3 ASAT QFN2*3 UCD QFN3*3 ASAT QFN3*3 UCD QFN3*4 ASAT QFN3*4 UCD QFN4*4 ASAT QFN4*4 UCD QFN4*5 ASAT QFN5*5 UCD QFN5*5 ASAT QFN7*7 UCD QFN5*6 UTAC UCD QFN6*6 JCET QFN2*2 UCD QFN7*7 JCET QFN4*4 QFN3*3 4.1.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MPQ28261DL 1217 01-03-13 45 0 MPQ28261DL 1228 01-03-13 43 0 MPQ28261DL 1228 01-03-13 45 0 MPQ28261DL 1228 01-03-13 45 0 MP6507GQ 1236 01-03-13 100 0 MP2635GR 1227 01-09-13 100 0 MP2635GR 1229 01-25-13 186 0 MP2635GR 1237 01-25-13 180 0 MP3388DR 1233 01-03-13 181 0 MP3388DR 1233 01-03-13 181 0 MP3388DR 1233 01-03-13 190 0 MP3426DL 1235 01-18-13 95 0 Total FA NO. 0 The Future of Analog IC Technology® - 11 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT SAT picture of QFN T-SCAN PICTURE C-SCAN PICTURE 4.1.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP28252EL 1215 02-06-13 47 0 1000 MP28252EL 1220 02-06-13 47 0 1000 FA NO. # of cycle MP6507GQ 1236 01-03-13 94 0 1000 MP2635GR 1227 01-09-13 48 0 1000 MP2635GR 1229 01-25-13 84 0 1000 MP2635GR 1237 01-25-13 84 0 1000 MP3388DR 1233 01-03-13 85 0 1000 MP3388DR 1233 01-03-13 85 0 1000 MP3388DR 1233 01-03-13 85 0 1000 MP1720DQ-216 1202 01-09-13 50 0 100 MP2611GL 1248 01-08-13 50 0 100 MP2611GL 1250 01-08-13 50 0 100 MP20045DQ-25 1251 01-10-13 50 0 100 MP2002DD 1251 01-11-13 50 0 100 MP2012DQ 1250 01-10-13 50 0 100 MP20046DN 1251 01-10-13 50 0 100 MP2303DQ 1252 01-14-13 50 0 100 MP2565DQ 1250 01-14-13 50 0 100 MP5000DQ 1238 01-15-13 50 0 100 MP5010DQ-C347 1250 01-15-13 50 0 100 MP38872DL 1251 01-18-13 50 0 100 MP2214DL 1248 01-18-13 50 0 100 The Future of Analog IC Technology® - 12 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2303DQ 1252 01-18-13 50 0 100 MP28127DQ 1301 01-18-13 50 0 100 MP2371DG 1252 01-18-13 50 0 100 MP4462DQ 1301 01-22-13 50 0 100 NB634EL 1238 01-22-13 50 0 100 MP28256EL 1246 01-22-13 50 0 100 NB600CQ 1249 01-22-13 50 0 100 FA NO. # of cycle MPQ4460DQ 1247 02-06-13 50 0 100 MP28114DG-1.8 1251 01-25-13 50 0 100 MP2360DG 1250 01-25-13 50 0 100 MP2361DQ 1250 01-25-13 50 0 100 MP2005DD 1251 01-29-13 50 0 100 MP20051DQ 1302 01-25-13 50 0 100 MPQ2483DQ1 1249 02-27-13 50 0 100 MP2012DQ 1241 01-29-13 50 0 100 MP38872DL 1302 01-29-13 50 0 100 NB600CQ 1249 01-29-13 50 0 100 MP2565DQ 1251 02-04-13 50 0 100 MP28127DQ 1251 01-31-13 50 0 100 MP2112DQ 1248 02-04-13 50 0 100 NB637EL 1238 01-31-13 50 0 100 MP2109DQ 1247 02-04-13 50 0 100 NB637EL 1238 02-04-13 50 0 100 MP38872DL 1303 02-04-13 50 0 100 MP9115DQT 1303 02-06-13 50 0 100 MP5000DQ-C266 1302 02-04-13 50 0 100 MP2209DL 1302 02-06-13 50 0 100 MP4560DQ 1250 02-06-13 50 0 100 MP2109DQ 1303 02-07-13 50 0 100 MP5000DQ 1304 02-27-13 50 0 100 MP5000DQ 1304 02-27-13 50 0 100 MP2303DQ 1303 02-27-13 50 0 100 MP3388DR 1302 02-27-13 50 0 100 MP2303DQ 1304 02-27-13 50 0 100 MP2303DQ 1303 02-27-13 50 0 100 MP8904DD 1252 02-27-13 50 0 100 MP3213DQ 1245 02-27-13 50 0 100 MP4460DQ 1303 02-27-13 50 0 100 MPQ4462DQ1 1242 03-06-13 50 0 100 MP2562DQ 1305 02-27-13 50 0 100 MP1720DQ 1306 03-01-13 50 0 100 MP2611GL 1301 03-01-13 50 0 100 The Future of Analog IC Technology® - 13 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT # of cycle Device D/C Close Date Sample Size # of Fail MP2119DQ 1305 03-06-13 50 0 100 MP2452DD 1308 03-06-13 50 0 100 MPQ28261DL 1228 03-22-13 50 0 100 MP28256EL 1305 03-13-13 50 0 100 MP28254EL 1305 03-07-13 50 0 100 MP2121DQ-C236 1301 03-13-13 50 0 100 MP2209DL 1309 03-22-13 50 0 100 MP6900DQ 1309 03-20-13 50 0 100 MP2119DQ 1308 03-22-13 50 0 100 MP2108DQ 1306 03-20-13 50 0 100 MP4460DQ 1303 03-28-13 50 0 100 MP3388DR-C414 1309 03-25-13 50 0 100 MP2207DQ 1309 03-22-13 50 0 100 MP2120DQ 1305 03-22-13 50 0 100 MP2002DD 1304 03-22-13 50 0 100 NB634EL 1304 03-25-13 50 0 100 Total FA NO. 0 4.1.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP28252EL 1215 02-06-13 47 0 168 MP28252EL 1220 02-06-13 47 0 168 MP2635GR 1227 01-09-13 49 0 168 MP2635GR 1229 01-25-13 90 0 168 MP2635GR 1237 01-25-13 90 0 168 MP3388DR 1233 01-03-13 90 0 168 MP3388DR 1233 01-03-13 90 0 168 MP3388DR 1233 01-03-13 90 0 168 MP1720DQ-216 1202 01-09-13 50 0 48 MP2611GL 1248 01-08-13 50 0 48 MP2611GL 1250 01-08-13 50 0 48 MP20045DQ-25 1251 01-10-13 50 0 48 MP2002DD 1251 01-11-13 50 0 48 FA NO. # of hrs MP2012DQ 1250 01-10-13 50 0 48 MP20046DN 1251 01-10-13 50 0 48 MP2303DQ 1252 01-14-13 50 0 48 MP2565DQ 1250 01-14-13 50 0 48 The Future of Analog IC Technology® - 14 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP5000DQ 1238 01-15-13 50 0 48 MP5010DQ-C347 1250 01-15-13 50 0 48 FA NO. # of hrs MP38872DL 1251 01-18-13 50 0 48 MP2214DL 1248 01-18-13 50 0 48 MP2303DQ 1252 01-18-13 50 0 48 MP28127DQ 1301 01-18-13 50 0 48 MP2371DG 1252 01-18-13 50 0 48 MP4462DQ 1301 01-22-13 50 0 48 NB634EL 1238 01-22-13 50 0 48 MP28256EL 1246 01-22-13 50 0 48 NB600CQ 1249 01-22-13 50 0 48 MPQ4460DQ 1247 02-06-13 50 0 48 MP28114DG-1.8 1251 01-25-13 50 0 48 MP2360DG 1250 01-25-13 50 0 48 MP2361DQ 1250 01-25-13 50 0 48 MP2005DD 1251 01-29-13 50 0 48 MP20051DQ 1302 01-25-13 50 0 48 MPQ2483DQ1 1249 02-27-13 50 0 48 MP2012DQ 1241 01-29-13 50 0 48 MP38872DL 1302 01-29-13 50 0 48 NB600CQ 1249 01-29-13 50 0 48 MP2565DQ 1251 02-04-13 50 0 48 MP28127DQ 1251 01-31-13 50 0 48 MP2112DQ 1248 02-04-13 50 0 48 NB637EL 1238 01-31-13 50 0 48 MP2109DQ 1247 02-04-13 50 0 48 NB637EL 1238 02-04-13 50 0 48 MP38872DL 1303 02-04-13 50 0 48 MP9115DQT 1303 02-06-13 50 0 48 MP5000DQ-C266 1302 02-04-13 50 0 48 MP2209DL 1302 02-06-13 50 0 48 MP4560DQ 1250 02-06-13 50 0 48 MP2109DQ 1303 02-07-13 50 0 48 MP5000DQ 1304 02-27-13 50 0 48 MP5000DQ 1304 02-27-13 50 0 48 MP2303DQ 1303 02-27-13 50 0 48 MP3388DR 1302 02-27-13 50 0 48 MP2303DQ 1304 02-27-13 50 0 48 MP2303DQ 1303 02-27-13 50 0 48 MP8904DD 1252 02-27-13 50 0 48 MP3213DQ 1245 02-27-13 50 0 48 MP4460DQ 1303 02-27-13 50 0 48 The Future of Analog IC Technology® - 15 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MPQ4462DQ1 1242 03-06-13 50 0 48 MP2562DQ 1305 02-27-13 50 0 48 MP1720DQ 1306 03-01-13 50 0 48 FA NO. # of hrs MP2611GL 1301 03-01-13 50 0 48 MP2119DQ 1305 03-06-13 50 0 48 MP2452DD 1308 03-06-13 50 0 48 MPQ28261DL 1228 03-22-13 50 0 48 MP28256EL 1305 03-13-13 50 0 48 MP28254EL 1305 03-07-13 50 0 48 MP2121DQ-C236 1301 03-13-13 50 0 48 MP2209DL 1309 03-22-13 50 0 48 MP6900DQ 1309 03-20-13 50 0 48 MP2119DQ 1308 03-22-13 50 0 48 MP2108DQ 1306 03-20-13 50 0 48 MP4460DQ 1303 03-28-13 50 0 48 MP3388DR-C414 1309 03-25-13 50 0 48 MP2207DQ 1309 03-22-13 50 0 48 MP2120DQ 1305 03-22-13 50 0 48 MP2002DD 1304 03-22-13 50 0 48 NB634EL 1304 03-25-13 50 0 48 Total 0 4.1.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C Close Date Sample Size # of Fail MPQ28261DL 1217 01-03-13 45 0 MPQ28261DL 1228 01-03-13 43 0 MPQ28261DL 1228 01-03-13 45 0 MPQ28261DL 1228 01-03-13 45 0 MP3426DL 1235 01-18-13 79 0 MPQ28261DL 1228 03-22-13 45 0 Total FA NO. 0 The Future of Analog IC Technology® - 16 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT 4.2 SOIC The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD SOIC8 ANST SOIC14 UCD SOIC8-EP ANST SOIC16 ANST SOIC8-7 ANST SOIC20 ANST SOIC8 ANST SOIC28 ANST SOIC8-EP UTAC SOIC8 UTAC SOIC8-EP JCET SOIC8 JCET SOIC8-EP JCET SOIC16 ASE-KS SOIC8-EP ASE-KS SOIC8 4.2.1 Preconditioning MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP3398GS 1238 01-25-13 360 0 MP4700GS 1247 02-06-13 180 0 MP4700GS 1246 02-06-13 180 0 MP6922AGN 1217 03-20-13 180 0 MP6922AGN 1227 03-20-13 180 0 MP6922AGN 1229 03-20-13 180 0 MP6922AGN 1217 03-20-13 100 0 MP6922AGN 1227 03-20-13 100 0 MP6922AGN 1229 03-20-13 100 0 MP6920DN 1242 03-20-13 200 0 Total FA NO. 0 SAT picture of SOIC T-SCAN PICTURE C-SCAN PICTURE The Future of Analog IC Technology® - 17 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT 4.2.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP20045DN 1225 02-06-13 52 0 1000 MP20045DN 1214 02-06-13 49 0 1000 MP2303DN 1232 02-06-13 57 0 1000 MP2303DN 1234 02-06-13 55 0 1000 MP4700GS 1247 02-06-13 87 0 1000 MP4700GS 1246 02-06-13 87 0 1000 MP6920DN 1242 03-20-13 94 0 1000 MP1484EN 1250 01-09-13 50 0 100 MP8718EN 1250 01-10-13 50 0 100 MP6001DN 1251 01-10-13 50 0 100 MP6205DN 1250 01-10-13 50 0 100 MP2307DN 1250 01-10-13 50 0 100 MP2482DN 1251 01-10-13 50 0 100 MP2482DN 1251 01-10-13 50 0 100 MP1482DS-C165 1251 01-10-13 50 0 100 MP1482DS-C165 1251 01-10-13 50 0 100 MP1482DS-C165 1251 01-10-13 50 0 100 MP1410ES-C019 1251 01-10-13 50 0 100 MP2305DS 1250 01-14-13 50 0 100 MP1482DS-C165 1250 01-11-13 50 0 100 CM3406DS 1252 01-14-13 50 0 100 MP1484EN 1251 01-14-13 50 0 100 MP1482DN 1250 01-14-13 50 0 100 MP2488DN 1251 01-14-13 50 0 100 FA NO. # of cycle MP9141ES 1251 01-15-13 50 0 100 MP8670DN 1251 01-15-13 50 0 100 MP1484EN 1251 01-15-13 50 0 100 MP2307DN 1252 01-15-13 50 0 100 MP2483DS 1226 02-07-13 50 0 100 MP2560DN-C413 1301 01-18-13 50 0 100 MP8709EN 1251 01-18-13 50 0 100 MP28313CS-C113 1251 01-18-13 50 0 100 MP8706EN 1246 01-18-13 50 0 100 MP8706EN-C247 1246 01-18-13 50 0 100 MP1482DS-C165 1250 01-18-13 50 0 100 MP3394ES 1250 01-22-13 50 0 100 MP1482DS-C165 1252 01-22-13 50 0 100 MP2207DN 1302 01-22-13 50 0 100 MP2307DN 1252 01-22-13 50 0 100 The Future of Analog IC Technology® - 18 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2307DN 1301 01-22-13 50 0 100 MP1484EN 1251 02-08-13 50 0 100 FA NO. # of cycle MP2372DN 1302 01-25-13 50 0 100 MP2301ENE 1302 01-25-13 50 0 100 MP1484EN-C166 1252 01-25-13 50 0 100 MP1484EN-C166 1250 01-25-13 50 0 100 MP44010HS 1302 01-29-13 50 0 100 MP1484EN-C166 1251 01-29-13 50 0 100 CM3406DS 1301 01-29-13 50 0 100 MP62061DN 1302 01-30-13 50 0 100 MP1593DN-C218 1224 01-30-13 50 0 100 MP1482DS-C165 1303 01-30-13 50 0 100 MP2467DN-C478 1303 01-29-13 50 0 100 MP1583DN 1302 01-31-13 50 0 100 MP1482DN 1302 01-31-13 50 0 100 MP62061DN 1303 01-31-13 50 0 100 MP2305DS 1301 02-04-13 50 0 100 MP2307DN 1302 01-31-13 50 0 100 MP1482DS-C165 1302 01-31-13 50 0 100 MP24830HS-C470L 1236 01-31-13 50 0 100 MP38894DN 1303 01-31-13 50 0 100 MP2488DN 1302 02-04-13 50 0 100 MP4560DN 1303 02-04-13 50 0 100 MP6212DN 1302 02-01-13 50 0 100 MP6231DN 1302 02-04-13 50 0 100 MP2307DN 1302 02-04-13 50 0 100 MP6205DN 1303 02-04-13 50 0 100 MP1482DN 1302 02-04-13 50 0 100 MP2307DN 1303 02-06-13 50 0 100 MP4051GS 1302 02-06-13 50 0 100 MP3394ES 1250 02-06-13 50 0 100 MP38892DN 1302 02-06-13 50 0 100 MP9141ES 1303 02-06-13 50 0 100 MP2480DN 1303 02-06-13 50 0 100 HF81GS 1303 02-06-13 50 0 100 MP4021GS-A 1303 02-06-13 50 0 100 MP4021GS-A 1303 02-07-13 50 0 100 MP1587EN 1304 02-07-13 50 0 100 MP2307DN 1304 02-07-13 50 0 100 MP6001DN 1303 02-07-13 50 0 100 MP8001DS 1251 02-07-13 50 0 100 MP2303ADN-C258 1303 02-07-13 50 0 100 The Future of Analog IC Technology® - 19 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP4021GS 1303 02-27-13 50 0 100 MP8705EN 1302 02-27-13 50 0 100 FA NO. # of cycle MP200DS 1305 02-27-13 50 0 100 MP3394ES 1251 02-27-13 50 0 100 MP8705EN 1303 02-27-13 50 0 100 MP1484EN-C166 1304 02-27-13 50 0 100 MP1484EN-C166 1304 02-27-13 50 0 100 MP1484EN-C166 1304 02-27-13 50 0 100 MP8706EN 1303 02-27-13 50 0 100 MP2307DN 1303 02-27-13 50 0 100 MP1582EN 1306 03-13-13 50 0 100 MP2303ADN 1304 03-01-13 50 0 100 MP6001DN 1305 03-06-13 50 0 100 MP2358DS 1251 03-06-13 50 0 100 MP1583DN 1305 03-04-13 50 0 100 MP1482DN 1251 03-06-13 50 0 100 MP9141ES 1304 03-01-13 50 0 100 MP2303ADN 1304 03-01-13 50 0 100 MP1584ES 1305 03-06-13 50 0 100 MP8706EN 1305 03-01-13 50 0 100 MP1484EN-C321 1304 03-01-13 50 0 100 MP1484EN-C321 1304 03-01-13 50 0 100 MP20051DN 1304 03-06-13 50 0 100 MP1484EN 1305 03-01-13 50 0 100 MP1484EN 1305 03-06-13 50 0 100 MP3394ES-C462 1305 03-06-13 50 0 100 MP201DS 1305 03-06-13 50 0 100 MP1482DN 1305 03-13-13 50 0 100 MP8708EN 1304 03-13-13 50 0 100 MP1584EN-C461 1306 03-13-13 50 0 100 MP3394SGS 1304 03-13-13 50 0 100 MP1482DS-C165 1252 03-13-13 50 0 100 MP1482DS-C165 1304 03-13-13 50 0 100 MP1482DN 1308 03-13-13 50 0 100 MP8705EN 1304 03-07-13 50 0 100 MP1430DN 1305 03-13-13 50 0 100 MP8705EN 1309 03-07-13 50 0 100 MP1584EN 1308 03-13-13 50 0 100 MP28313DS 1210 03-07-13 50 0 100 MP1482DN 1306 03-13-13 50 0 100 MP1482DN 1308 03-13-13 50 0 100 MP8708EN-C353 1306 03-13-13 50 0 100 The Future of Analog IC Technology® - 20 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1484EN 1305 03-07-13 50 0 100 MP1482DN 1308 03-13-13 50 0 100 FA NO. # of cycle MP1482DN 1308 03-07-13 50 0 100 MP2303ADN 1308 03-13-13 50 0 100 MP28313CS-C113 1309 03-13-13 50 0 100 MP1482DS-C165 1305 03-13-13 50 0 100 MP1484EN 1305 03-13-13 50 0 100 MP1482DN 1308 03-13-13 50 0 100 MP4034GS 1306 03-20-13 50 0 100 MP2372DN 1308 03-13-13 50 0 100 MP3394ES 1305 03-28-13 50 0 100 MP8705EN 1309 03-20-13 50 0 100 MP8706EN 1308 03-20-13 50 0 100 MP8709EN 1309 03-20-13 50 0 100 MP20045DN-C442 1250 03-22-13 50 0 100 MP1906DS 1308 03-20-13 50 0 100 MP6901DS 1249 03-20-13 50 0 100 MP2307DN 1303 03-28-13 50 0 100 MP1482DS-C165 1304 03-20-13 50 0 100 MP1482DN 1308 03-20-13 50 0 100 MP1484EN 1305 03-20-13 50 0 100 MP4462DN 1306 03-20-13 50 0 100 MP20045DN 1304 03-22-13 50 0 100 MP4462DN 1308 03-25-13 50 0 100 MP1484EN 1251 03-20-13 50 0 100 MP1482DN 1308 03-20-13 50 0 100 MP1484EN 1306 03-22-13 50 0 100 MP8705EN 1306 03-22-13 50 0 100 MP1587EN 1310 03-22-13 50 0 100 MP3394ES-C462 1307 03-25-13 50 0 100 MP1482DN 1309 03-28-13 50 0 100 MP1482DN 1309 03-28-13 50 0 100 MP9141ES 1308 03-25-13 50 0 100 MP1484EN-C166 1302 03-22-13 50 0 100 MP1484EN-C166 1302 03-28-13 50 0 100 MP1431DS-C106 1307 03-28-13 50 0 100 MP1484EN 1308 03-28-13 50 0 100 MP1584EN-C461 1310 03-28-13 50 0 100 MP1482DS-C165 1305 03-28-13 50 0 100 MP9141ES 1310 03-28-13 50 0 100 MP1484EN-C321 1311 03-28-13 50 0 100 MP1482DN 1309 03-28-13 50 0 100 The Future of Analog IC Technology® - 21 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DN 1309 03-28-13 50 0 Total FA NO. # of cycle 100 0 4.2.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP20045DN 1225 02-06-13 47 0 168 MP20045DN 1214 02-06-13 47 0 168 MP2303DN 1232 02-06-13 47 0 168 FA NO. # of hrs MP2303DN 1234 02-06-13 47 0 168 MP3398GS 1238 01-25-13 89 0 168 MP4700GS 1247 02-06-13 87 0 168 MP4700GS 1246 02-06-13 87 0 168 MP6922AGN 1217 03-20-13 90 0 168 MP6922AGN 1227 03-20-13 90 0 168 MP6922AGN 1229 03-20-13 90 0 168 MP6920DN 1242 03-20-13 96 0 168 MP1484EN 1250 01-09-13 50 0 48 MP8718EN 1250 01-10-13 50 0 48 MP6001DN 1251 01-10-13 50 0 48 MP6205DN 1250 01-10-13 50 0 48 MP2307DN 1250 01-10-13 50 0 48 MP2482DN 1251 01-10-13 50 0 48 MP2482DN 1251 01-10-13 50 0 48 MP1482DS-C165 1251 01-10-13 50 0 48 MP1482DS-C165 1251 01-10-13 50 0 48 MP1482DS-C165 1251 01-10-13 50 0 48 MP1410ES-C019 1251 01-10-13 50 0 48 MP2305DS 1250 01-14-13 50 0 48 MP1482DS-C165 1250 01-11-13 50 0 48 CM3406DS 1252 01-14-13 50 0 48 MP1484EN 1251 01-14-13 50 0 48 MP1482DN 1250 01-14-13 50 0 48 MP2488DN 1251 01-14-13 50 0 48 MP9141ES 1251 01-15-13 50 0 48 MP8670DN 1251 01-15-13 50 0 48 MP1484EN 1251 01-15-13 50 0 48 MP2307DN 1252 01-15-13 50 0 48 MP2483DS 1226 02-07-13 50 0 48 The Future of Analog IC Technology® - 22 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2560DN-C413 1301 01-18-13 50 0 48 MP8709EN 1251 01-18-13 50 0 48 MP28313CS-C113 1251 01-18-13 50 0 48 MP8706EN 1246 01-18-13 50 0 48 MP8706EN-C247 1246 01-18-13 50 0 48 MP1482DS-C165 1250 01-18-13 50 0 48 MP3394ES 1250 01-22-13 50 0 48 MP1482DS-C165 1252 01-22-13 50 0 48 MP2207DN 1302 01-22-13 50 0 48 MP2307DN 1252 01-22-13 50 0 48 MP2307DN 1301 01-22-13 50 0 48 FA NO. # of hrs MP1484EN 1251 02-08-13 50 0 48 MP2372DN 1302 01-25-13 50 0 48 MP2301ENE 1302 01-25-13 50 0 48 MP1484EN-C166 1252 01-25-13 50 0 48 MP1484EN-C166 1250 01-25-13 50 0 48 MP44010HS 1302 01-29-13 50 0 48 MP1484EN-C166 1251 01-29-13 50 0 48 CM3406DS 1301 01-29-13 50 0 48 MP62061DN 1302 01-30-13 50 0 48 MP1593DN-C218 1224 01-30-13 50 0 48 MP1482DS-C165 1303 01-30-13 50 0 48 MP2467DN-C478 1303 01-29-13 50 0 48 MP1583DN 1302 01-31-13 50 0 48 MP1482DN 1302 01-31-13 50 0 48 MP62061DN 1303 01-31-13 50 0 48 MP2305DS 1301 02-04-13 50 0 48 MP2307DN 1302 01-31-13 50 0 48 MP1482DS-C165 1302 01-31-13 50 0 48 MP24830HS-C470L 1236 01-31-13 50 0 48 MP38894DN 1303 01-31-13 50 0 48 MP2488DN 1302 02-04-13 50 0 48 MP4560DN 1303 02-04-13 50 0 48 MP6212DN 1302 02-01-13 50 0 48 MP6231DN 1302 02-04-13 50 0 48 MP2307DN 1302 02-04-13 50 0 48 MP6205DN 1303 02-04-13 50 0 48 MP1482DN 1302 02-04-13 50 0 48 MP2307DN 1303 02-06-13 50 0 48 MP4051GS 1302 02-06-13 50 0 48 MP3394ES 1250 02-06-13 50 0 48 MP38892DN 1302 02-06-13 50 0 48 The Future of Analog IC Technology® - 23 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP9141ES 1303 02-06-13 50 0 48 MP2480DN 1303 02-06-13 50 0 48 FA NO. # of hrs HF81GS 1303 02-06-13 50 0 48 MP4021GS-A 1303 02-06-13 50 0 48 MP4021GS-A 1303 02-07-13 50 0 48 MP1587EN 1304 02-07-13 50 0 48 MP2307DN 1304 02-07-13 50 0 48 MP6001DN 1303 02-07-13 50 0 48 MP8001DS 1251 02-07-13 50 0 48 MP2303ADN-C258 1303 02-07-13 50 0 48 MP4021GS 1303 02-27-13 50 0 48 MP8705EN 1302 02-27-13 50 0 48 MP200DS 1305 02-27-13 50 0 48 MP3394ES 1251 02-27-13 50 0 48 MP8705EN 1303 02-27-13 50 0 48 MP1484EN-C166 1304 02-27-13 50 0 48 MP1484EN-C166 1304 02-27-13 50 0 48 MP1484EN-C166 1304 02-27-13 50 0 48 MP8706EN 1303 02-27-13 50 0 48 MP2307DN 1303 02-27-13 50 0 48 MP1582EN 1306 03-13-13 50 0 48 MP2303ADN 1304 03-01-13 50 0 48 MP6001DN 1305 03-06-13 50 0 48 MP2358DS 1251 03-06-13 50 0 48 MP1583DN 1305 03-04-13 50 0 48 MP1482DN 1251 03-06-13 50 0 48 MP9141ES 1304 03-01-13 50 0 48 MP2303ADN 1304 03-01-13 50 0 48 MP1584ES 1305 03-06-13 50 0 48 MP8706EN 1305 03-01-13 50 0 48 MP1484EN-C321 1304 03-01-13 50 0 48 MP1484EN-C321 1304 03-01-13 50 0 48 MP20051DN 1304 03-06-13 50 0 48 MP1484EN 1305 03-01-13 50 0 48 MP1484EN 1305 03-06-13 50 0 48 MP3394ES-C462 1305 03-06-13 50 0 48 MP201DS 1305 03-06-13 50 0 48 MP1482DN 1305 03-13-13 50 0 48 MP8708EN 1304 03-13-13 50 0 48 MP1584EN-C461 1306 03-13-13 50 0 48 MP3394SGS 1304 03-13-13 50 0 48 MP1482DS-C165 1252 03-13-13 50 0 48 The Future of Analog IC Technology® - 24 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DS-C165 1304 03-13-13 50 0 48 MP1482DN 1308 03-13-13 50 0 48 FA NO. # of hrs MP8705EN 1304 03-07-13 50 0 48 MP1430DN 1305 03-13-13 50 0 48 MP8705EN 1309 03-07-13 50 0 48 MP1584EN 1308 03-13-13 50 0 48 MP28313DS 1210 03-07-13 50 0 48 MP1482DN 1306 03-13-13 50 0 48 MP1482DN 1308 03-13-13 50 0 48 MP8708EN-C353 1306 03-13-13 50 0 48 MP1484EN 1305 03-07-13 50 0 48 MP1482DN 1308 03-13-13 50 0 48 MP1482DN 1308 03-07-13 50 0 48 MP2303ADN 1308 03-13-13 50 0 48 MP28313CS-C113 1309 03-13-13 50 0 48 MP1482DS-C165 1305 03-13-13 50 0 48 MP1484EN 1305 03-13-13 50 0 48 MP1482DN 1308 03-13-13 50 0 48 MP4034GS 1306 03-20-13 50 0 48 MP2372DN 1308 03-13-13 50 0 48 MP3394ES 1305 03-28-13 50 0 48 MP8705EN 1309 03-20-13 50 0 48 MP8706EN 1308 03-20-13 50 0 48 MP8709EN 1309 03-20-13 50 0 48 MP20045DN-C442 1250 03-22-13 50 0 48 MP1906DS 1308 03-20-13 50 0 48 MP6901DS 1249 03-20-13 50 0 48 MP2307DN 1303 03-28-13 50 0 48 MP1482DS-C165 1304 03-20-13 50 0 48 MP1482DN 1308 03-20-13 50 0 48 MP1484EN 1305 03-20-13 50 0 48 MP4462DN 1306 03-20-13 50 0 48 MP20045DN 1304 03-22-13 50 0 48 MP4462DN 1308 03-25-13 50 0 48 MP1484EN 1251 03-20-13 50 0 48 MP1482DN 1308 03-20-13 50 0 48 MP1484EN 1306 03-22-13 50 0 48 MP8705EN 1306 03-22-13 50 0 48 MP1587EN 1310 03-22-13 50 0 48 MP3394ES-C462 1307 03-25-13 50 0 48 MP1482DN 1309 03-28-13 50 0 48 MP1482DN 1309 03-28-13 50 0 48 The Future of Analog IC Technology® - 25 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP9141ES 1308 03-25-13 50 0 48 MP1484EN-C166 1302 03-22-13 50 0 48 MP1484EN-C166 1302 03-28-13 50 0 48 MP1431DS-C106 1307 03-28-13 50 0 48 MP1484EN 1308 03-28-13 50 0 48 FA NO. # of hrs MP1584EN-C461 1310 03-28-13 50 0 48 MP1482DS-C165 1305 03-28-13 50 0 48 MP9141ES 1310 03-28-13 50 0 48 MP1484EN-C321 1311 03-28-13 50 0 48 MP1482DN 1309 03-28-13 50 0 48 MP1482DN 1309 03-28-13 50 0 48 Total 0 4.3 MSOP The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD MSOP8 ANST MSOP8-EP UCD MSOP10-EP ANST MSOP10 UCD MSOP10 ANST MSOP10-EP ANST MSOP8 4.3.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP3900DK 1245 01-18-13 168 0 Total FA NO. 0 MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP1412DH 1231 01-08-13 260 0 MP1412DH 1233 01-08-13 260 0 MP1412DH 1234 01-08-13 260 0 Total FA NO. 0 The Future of Analog IC Technology® - 26 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT SAT picture of MSOP T-SCAN PICTURE C-SCAN PICTURE 4.3.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP1412DH 1231 01-08-13 84 0 1000 MP1412DH 1233 01-08-13 80 0 1000 MP1412DH 1234 01-08-13 84 0 1000 MP3900DK 1245 01-18-13 84 0 1000 MP1528DK 1251 01-08-13 50 0 100 MP1412DH 1250 01-09-13 50 0 100 MP2106DK 1250 01-10-13 50 0 100 MP1412DH 1250 01-10-13 50 0 100 MP2481DH 1249 01-10-13 50 0 100 MP6211DH 1250 01-14-13 50 0 100 MP2007DH 1250 01-14-13 50 0 100 FA NO. # of cycle MP2905EK 1239 01-18-13 50 0 100 MP1542DK-C472 1301 01-25-13 50 0 100 MP1412DH 1250 01-29-13 50 0 100 MP6232DH 1302 01-29-13 50 0 100 MP3213DH 1302 01-29-13 50 0 100 MP2106DK 1302 01-30-13 50 0 100 MP1412DH 1303 02-04-13 50 0 100 MP1412DH 1303 02-20-13 50 0 100 MP8110DK 1303 02-07-13 50 0 100 MP1412DH 1304 02-27-13 50 0 100 MP1412DH 1305 03-01-13 50 0 100 MP1412DH 1302 03-01-13 50 0 100 MP1411DH 1219 03-06-13 50 0 100 The Future of Analog IC Technology® - 27 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1411DH 1219 03-07-13 50 0 100 MP6231DH 1306 03-01-13 50 0 100 MP1411DH 1219 03-13-13 50 0 100 MP2905EK-C402 1251 03-07-13 50 0 100 MP1411DH 1219 03-13-13 50 0 100 MP2361DK 1223 03-13-13 50 0 100 MP1542DK 1305 03-13-13 50 0 100 MP1411DH 1219 03-20-13 50 0 100 MP1542DK 1304 03-20-13 50 0 100 MP1411DH 1308 03-20-13 50 0 100 MP1411DH 1308 03-22-13 50 0 100 MP6211DH 1306 03-20-13 50 0 100 MP1542DK 1305 03-22-13 50 0 100 MP1567DK 1309 03-22-13 50 0 100 MP1412DH 1310 03-22-13 50 0 100 MP1412DH 1310 03-22-13 50 0 100 MP1412DH 1310 03-22-13 50 0 100 MP1412DH 1310 03-22-13 50 0 100 MP2106DK 1309 03-28-13 50 0 100 MP6215DH 1310 03-28-13 50 0 100 Total FA NO. # of cycle 0 4.3.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP1412DH 1231 01-08-13 90 0 168 MP1412DH 1233 01-08-13 90 0 168 MP1412DH 1234 01-08-13 87 0 168 MP3900DK 1245 01-18-13 87 0 168 FA NO. # of hrs MP1528DK 1251 01-08-13 50 0 48 MP1412DH 1250 01-09-13 50 0 48 MP2106DK 1250 01-10-13 50 0 48 MP1412DH 1250 01-10-13 50 0 48 MP2481DH 1249 01-10-13 50 0 48 MP6211DH 1250 01-14-13 50 0 48 MP2007DH 1250 01-14-13 50 0 48 MP2905EK 1239 01-18-13 50 0 48 MP1542DK-C472 1301 01-25-13 50 0 48 MP1412DH 1250 01-29-13 50 0 48 The Future of Analog IC Technology® - 28 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP6232DH 1302 01-29-13 50 0 48 MP3213DH 1302 01-29-13 50 0 48 MP2106DK 1302 01-30-13 50 0 48 MP1412DH 1303 02-04-13 50 0 48 MP1412DH 1303 02-20-13 50 0 48 FA NO. # of hrs MP8110DK 1303 02-07-13 50 0 48 MP1412DH 1304 02-27-13 50 0 48 MP1412DH 1305 03-01-13 50 0 48 MP1412DH 1302 03-01-13 50 0 48 MP1411DH 1219 03-06-13 50 0 48 MP1411DH 1219 03-07-13 50 0 48 MP6231DH 1306 03-01-13 50 0 48 MP1411DH 1219 03-13-13 50 0 48 MP2905EK-C402 1251 03-07-13 50 0 48 MP1411DH 1219 03-13-13 50 0 48 MP2361DK 1223 03-13-13 50 0 48 MP1542DK 1305 03-13-13 50 0 48 MP1411DH 1219 03-20-13 50 0 48 MP1542DK 1304 03-20-13 50 0 48 MP1411DH 1308 03-20-13 50 0 48 MP1411DH 1308 03-22-13 50 0 48 MP6211DH 1306 03-20-13 50 0 48 MP1542DK 1305 03-22-13 50 0 48 MP1567DK 1309 03-22-13 50 0 48 MP1412DH 1310 03-22-13 50 0 48 MP1412DH 1310 03-22-13 50 0 48 MP1412DH 1310 03-22-13 50 0 48 MP1412DH 1310 03-22-13 50 0 48 MP2106DK 1309 03-28-13 50 0 48 MP6215DH 1310 03-28-13 50 0 48 Total 0 4.3.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C Close Date Sample Size # of Fail MP1412DH 1231 01-08-13 80 0 MP1412DH 1233 01-08-13 80 0 Total FA NO. 0 The Future of Analog IC Technology® - 29 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT 4.4 TSOT The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE ANST TSOT23-5 JCET TSOT23-5 ASNT TSOT23-6 JCET TSOT23-6 ASNT TSOT23-8 JCET TSOT23-8 4.4.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MPQ9361DJ 1247 02-07-13 100 0 MPQ9361DJ 1252 02-06-13 100 0 MPQ9361DJ 1252 02-27-13 100 0 Total FA NO. 0 SAT picture of TSOT T-SCAN PICTURE C-SCAN PICTURE 4.4.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP3302DJ 1248 02-04-13 50 0 100 MP3410DJ 1248 01-09-13 50 0 100 MP1540DJ 1249 01-09-13 50 0 100 MP2359DJ 1248 01-08-13 50 0 100 MP1541DJ 1249 01-11-13 50 0 100 MP2105DJ 1246 01-10-13 50 0 100 MP3216DJ 1247 01-10-13 50 0 100 FA NO. # of cycle The Future of Analog IC Technology® - 30 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP6400DJ-01 1249 01-11-13 50 0 MPQ9361DJ 1247 02-07-13 50 0 100 MP2359DJ 1252 01-18-13 50 0 100 MP1469GJ 1301 01-18-13 50 0 100 MP2016DJ 1233 01-25-13 50 0 100 MP2359DJ 1252 01-25-13 50 0 100 MP9361DJ 1252 01-25-13 50 0 100 MP3217DJ 1250 01-29-13 50 0 100 MP2104DJ 1252 01-29-13 50 0 100 FA NO. # of cycle 100 MP3302DJ 1302 02-04-13 50 0 100 MPQ9361DJ 1252 02-06-13 50 0 100 MP3302DJ 1304 02-07-13 50 0 100 MP3302DJ 1302 02-27-13 50 0 100 MP20048DJ 1302 02-07-13 50 0 100 MP3217DJ 1303 03-06-13 50 0 100 MP6400DJ-01 1304 02-27-13 50 0 100 MP2259DJ 1249 02-27-13 50 0 100 MP2259DJ 1213 02-27-13 50 0 100 MP2370DJ 1303 02-27-13 50 0 100 MPQ9361DJ 1252 02-27-13 50 0 100 MP3217DJ 1304 03-13-13 50 0 100 MP3216DJ 1304 03-13-13 50 0 100 MP65151DJ 1306 03-13-13 50 0 100 MP3302DJ 1304 03-13-13 50 0 100 MP1518DJ 1308 03-13-13 50 0 100 MP6400DJ-01 1306 03-20-13 50 0 100 MP2370DJ 1309 03-25-13 50 0 100 MP3202DJ 1304 03-22-13 50 0 100 MP62551DJ 1310 03-28-13 50 0 100 Total 0 4.4.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP3302DJ 1248 02-04-13 50 0 48 MP3410DJ 1248 01-09-13 50 0 48 MP1540DJ 1249 01-09-13 50 0 48 MP2359DJ 1248 01-08-13 50 0 48 MP1541DJ 1249 01-11-13 50 0 48 MP2105DJ 1246 01-10-13 50 0 48 MP3216DJ 1247 01-10-13 50 0 48 FA NO. # of hrs The Future of Analog IC Technology® - 31 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP6400DJ-01 1249 01-11-13 50 0 48 MPQ9361DJ 1247 02-07-13 50 0 48 MP2359DJ 1252 01-18-13 50 0 48 MP1469GJ 1301 01-18-13 50 0 48 MP2016DJ 1233 01-25-13 50 0 48 MP2359DJ 1252 01-25-13 50 0 48 MP9361DJ 1252 01-25-13 50 0 48 MP3217DJ 1250 01-29-13 50 0 48 MP2104DJ 1252 01-29-13 50 0 48 FA NO. # of hrs MP3302DJ 1302 02-04-13 50 0 48 MPQ9361DJ 1252 02-06-13 50 0 48 MP3302DJ 1304 02-07-13 50 0 48 MP3302DJ 1302 02-27-13 50 0 48 MP20048DJ 1302 02-07-13 50 0 48 MP3217DJ 1303 03-06-13 50 0 48 MP6400DJ-01 1304 02-27-13 50 0 48 MP2259DJ 1249 02-27-13 50 0 48 MP2259DJ 1213 02-27-13 50 0 48 MP2370DJ 1303 02-27-13 50 0 48 MPQ9361DJ 1252 02-27-13 50 0 48 MP3217DJ 1304 03-13-13 50 0 48 MP3216DJ 1304 03-13-13 50 0 48 MP65151DJ 1306 03-13-13 50 0 48 MP3302DJ 1304 03-13-13 50 0 48 MP1518DJ 1308 03-13-13 50 0 48 MP6400DJ-01 1306 03-20-13 50 0 48 MP2370DJ 1309 03-25-13 50 0 48 MP3202DJ 1304 03-22-13 50 0 48 MP62551DJ 1310 03-28-13 50 0 48 Total 0 4.5 TSSOP The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD TSSOP20 ASNT TSSOP16-EP UCD TSSOP20-EP ASNT TSSOP20 ASNT TSSOP8 ASNT TSSOP20-EP ASNT TSSOP14 ASNT TSSOP24 ASNT TSSOP16 ASNT TSSOP28 ASNT TSSOP28-EP JCET TSSOP8 The Future of Analog IC Technology® - 32 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT 4.5.1 Preconditioning MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP7748SGF 1244 01-11-13 270 0 MPQ2908GF 1237 03-04-13 90 0 MP7748SGF 1236 03-04-13 160 0 MP7748SGF 1247 02-26-13 359 0 MP3397EF 1236 03-04-13 160 0 MP8125EF 1245 03-21-13 360 0 Total FA NO. 0 SAT picture of TSSOP T-SCAN PICTURE C-SCAN PICTURE 4.5.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP7748SGF 1244 01-11-13 84 0 1000 MP7748SGF 1236 03-04-13 80 0 1000 MP7748SGF 1247 02-26-13 82 0 1000 MP3397EF 1236 03-04-13 80 0 1000 MP8125EF 1245 03-21-13 84 0 1000 MP8125EF 1248 01-08-13 50 0 100 MP3389EF 1242 01-10-13 50 0 100 MP3389EF 1247 01-10-13 50 0 100 MP3389EF 1247 01-10-13 50 0 100 MP1060EF 1250 01-18-13 50 0 100 MP3389EF 1250 01-18-13 50 0 100 FA NO. # of cycle The Future of Analog IC Technology® - 33 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP3389EF 1250 01-18-13 50 0 100 MP3389EF 1252 01-18-13 50 0 100 MP8125EF 1249 01-30-13 50 0 100 FA NO. # of cycle MP3389EF 1302 01-31-13 50 0 100 MP1530DM 1251 02-04-13 50 0 100 MP3389EF 1302 02-07-13 50 0 100 MPQ7731DF 1248 02-27-13 50 0 100 MP1026EF 1247 02-27-13 50 0 100 MP3389EF 1304 02-27-13 50 0 100 MP2364DF 1305 03-07-13 50 0 100 MP8126DF 1251 03-06-13 50 0 100 MP3389EF 1304 03-01-13 50 0 100 MP3389EF 1304 03-01-13 50 0 100 MP3389EF 1305 03-13-13 50 0 100 MPQ7731DF 1308 03-20-13 50 0 100 MP3389EF 1242 03-20-13 50 0 100 MP3389EF 1305 03-20-13 50 0 100 MP3399EF 1308 03-20-13 50 0 100 Total 0 4.5.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP7748SGF 1244 01-11-13 87 0 168 MPQ2908GF 1237 03-04-13 87 0 168 MP7748SGF 1236 03-04-13 80 0 168 MP7748SGF 1247 02-26-13 87 0 168 MP3397EF 1236 03-04-13 80 0 168 MP8125EF 1245 03-21-13 87 0 168 MP8125EF 1248 01-08-13 50 0 48 MP3389EF 1242 01-10-13 50 0 48 MP3389EF 1247 01-10-13 50 0 48 MP3389EF 1247 01-10-13 50 0 48 MP1060EF 1250 01-18-13 50 0 48 MP3389EF 1250 01-18-13 50 0 48 MP3389EF 1250 01-18-13 50 0 48 MP3389EF 1252 01-18-13 50 0 48 MP8125EF 1249 01-30-13 50 0 48 MP3389EF 1302 01-31-13 50 0 48 FA NO. # of hrs The Future of Analog IC Technology® - 34 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1530DM 1251 02-04-13 50 0 48 MP3389EF 1302 02-07-13 50 0 48 MPQ7731DF 1248 02-27-13 50 0 48 MP1026EF 1247 02-27-13 50 0 48 FA NO. # of hrs MP3389EF 1304 02-27-13 50 0 48 MP2364DF 1305 03-07-13 50 0 48 MP8126DF 1251 03-06-13 50 0 48 MP3389EF 1304 03-01-13 50 0 48 MP3389EF 1304 03-01-13 50 0 48 MP3389EF 1305 03-13-13 50 0 48 MPQ7731DF 1308 03-20-13 50 0 48 MP3389EF 1242 03-20-13 50 0 48 MP3389EF 1305 03-20-13 50 0 48 MP3399EF 1308 03-20-13 50 0 48 Total 0 4.3.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C Close Date Sample Size # of Fail MP8125EF 1245 03-21-13 81 0 Total FA NO. 0 4.6 FLIP CHIP-QFN The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD FCQFN1*1.5 UTAC FCQFN2*2 UCD FCQFN1.5*2 UTAC FCQFN2*3 UCD FCQFN2*2 UTAC FCQFN3*3 UCD FCQFN2*3 UTAC FCQFN3*4 UCD FCQFN3*3 UTAC FCQFN4*4 UCD FCQFN3*4 UTAC FCQFN4*5 UCD FCQFN3*5 UTAC FCQFN4*6 UCD FCQFN4*4 UTAC FCQFN5*5 UCD FCQFN4*5 UTAC FCQFN5*6 UCD FCQFN4*6 UTAC FCQFN6*6 The Future of Analog IC Technology® - 35 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT 4.6.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP5021GQV 1202 01-03-13 80 0 MP5021GQV 1242 01-03-13 204 0 MP5505GL 1241 01-02-13 90 0 MP5505GL 1246 01-25-13 180 0 NB669GQ 1233 01-22-13 260 0 NB669GQ 1233 01-22-13 96 0 NB670GQ 1223 02-06-13 91 0 MP2617GL 1243 01-18-13 180 0 MPM3810GQB 1244 02-06-13 270 0 MPM3810GQB 1248 02-06-13 280 0 MPM3810GQB 1249 02-06-13 90 0 MP2615GQ 1232 01-03-13 280 1 NB670LGQ 1238 01-18-13 180 0 NB669GQ 1238 01-18-13 180 0 MP2130DG 1244 01-25-13 270 0 NB675GL 1241 02-27-13 180 0 MP86963DUT 1249 03-01-13 200 0 MP86963DUT 1250 03-01-13 200 0 MP86963DUT 1250 03-01-13 200 0 MP9186GQ 1250 02-27-13 180 0 MP1499GD 1303 03-06-13 183 0 MP5505GL 1241 03-20-13 310 1 MP8736DL 1234 03-20-13 100 0 MP8736DL 1234 03-20-13 300 0 MP8736DL 1234 03-20-13 100 0 MP8736DL 1234 03-20-13 100 0 Total FA NO. 6225 6508 2 The Future of Analog IC Technology® - 36 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT SAT picture of FLIP CHIP-QFN T-SCAN PICTURE C-SCAN PICTURE 4.6.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP8736DL 1245 01-09-13 94 0 1000 MP8736DL 1245 01-09-13 94 0 1000 FA NO. # of cycle MP8736DL 1245 01-09-13 94 0 1000 MP28258DD 1249 02-06-13 500 0 1000 MP28258DD 1249 02-06-13 500 0 1000 MP5021GQV 1242 01-03-13 90 0 1000 NB669GQ 1233 01-22-13 84 0 1000 MPM3810GQB 1244 02-06-13 84 0 1000 MPM3810GQB 1248 02-06-13 84 0 1000 MP2615GQ 1232 01-03-13 90 0 1000 NB670LGQ 1238 01-18-13 81 0 1000 NB669GQ 1238 01-18-13 84 0 1000 MP2130DG 1244 01-25-13 87 0 1000 MP8736DL 1248 01-23-13 94 0 1000 NB675GL 1241 02-27-13 84 0 1000 MP86963DUT 1249 03-01-13 94 0 1000 MP86963DUT 1250 03-01-13 94 0 1000 MP86963DUT 1250 03-01-13 94 0 1000 MP9186GQ 1250 02-27-13 80 0 1000 MP5505GL 1241 03-20-13 84 0 1000 MP8736DL 1234 03-20-13 90 0 1000 MP8736DL 1234 03-20-13 90 0 1000 The Future of Analog IC Technology® - 37 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1234 03-20-13 90 0 1000 MP8736DL 1234 03-20-13 90 0 1000 MP8736DL 1242 01-08-13 100 0 100 MP8736DL 1248 01-08-13 100 0 100 MP8736DL 1245 01-08-13 100 0 100 MP8736DL 1250 01-08-13 100 0 100 MP8736DL 1249 01-08-13 100 0 100 FA NO. # of cycle MP2334DD 1251 01-08-13 50 0 100 MP28258DD 1250 01-08-13 100 0 100 MP28258DD 1251 01-08-13 100 0 100 MP28258DD-C471 1250 01-08-13 100 0 100 MP28258DD 1249 01-10-13 100 0 100 MP1499GD 1252 01-10-13 50 0 100 MP8736DL 1244 01-11-13 100 0 100 MP8736DL 1250 01-14-13 100 0 100 MP8736DL 1251 01-11-13 100 0 100 MP8736DL 1250 01-14-13 100 0 100 MP8736DL 1250 01-10-13 100 0 100 MP8606DL 1251 01-11-13 50 0 100 MP9180DG 1251 01-14-13 50 0 100 MP8761GL 1251 02-18-13 50 0 100 MP28258DD 1251 01-14-13 100 0 100 MP8736DL 1251 01-11-13 100 0 100 MP8736DL 1251 01-14-13 100 0 100 MP8736DL 1252 02-07-13 100 0 100 MP8736DL 1249 01-14-13 100 0 100 MP28251GD 1244 01-18-13 50 0 100 MP28258DD-A 1247 01-15-13 100 0 100 MP8736DL 1252 01-18-13 100 0 100 MP8736DL 1251 01-15-13 100 0 100 MP28251GD 1251 01-14-13 50 0 100 MP28251GD 1301 01-18-13 50 0 100 MP8736DL 1251 01-18-13 100 0 100 MP8736DL 1248 01-18-13 100 0 100 MP8736DL 1250 01-18-13 100 0 100 MP8736DL 1251 01-18-13 100 0 100 MP8736DL 1248 01-22-13 100 0 100 MP8736DL 1251 01-18-13 100 0 100 MP8736DL 1251 01-18-13 100 0 100 MP8736DL 1252 01-18-13 100 0 100 MP8736DL 1252 01-18-13 100 0 100 MP28258DD 1252 01-18-13 100 0 100 The Future of Analog IC Technology® - 38 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1251 01-18-13 100 0 100 MP8736DL 1301 01-18-13 100 0 100 MP8736DL 1252 02-07-13 100 0 100 MP8736DL 1252 01-22-13 100 0 100 MP2130DG 1252 01-22-13 50 0 100 MP2130DG 1251 01-23-13 50 0 100 MP28258DD 1251 01-22-13 100 0 100 MP8736DL 1252 01-22-13 100 0 100 MP8736DL 1248 01-22-13 100 0 100 MP28258DD-C471 1301 01-22-13 100 0 100 MP8736DL 1251 01-22-13 100 0 100 MP8736DL 1252 01-22-13 100 0 100 MP8736DL 1250 01-22-13 100 0 100 MP2130DG 1250 01-22-13 50 0 100 MP28258DD 1252 01-22-13 100 0 100 MP8736DL 1301 01-25-13 100 0 100 MP8736DL 1250 01-25-13 100 0 100 MP8736DL 1301 01-25-13 100 0 100 MP8736DL 1248 01-25-13 100 0 100 MP8736DL 1301 01-25-13 100 0 100 MP28251GD 1301 01-25-13 50 0 100 MP8736DL 1250 01-25-13 100 0 100 MP8736DL 1250 01-25-13 100 0 100 MP8736DL 1250 01-25-13 100 0 100 FA NO. # of cycle MP28258DD-C471 1302 02-06-13 100 0 100 MP28251GD 1301 01-29-13 50 0 100 MP2162GQH 1302 01-30-13 50 0 100 MP8736DL 1301 01-29-13 100 0 100 MP8736DL 1301 01-29-13 100 0 100 MP8736DL 1250 01-29-13 100 0 100 MP8736DL 1250 01-29-13 100 0 100 MP5505GL 1303 01-30-13 50 0 100 MP2130DG 1303 01-29-13 50 0 100 MP28258DD-C471 1302 02-06-13 100 0 100 MP8620DQK 1250 01-29-13 100 0 100 MP8620DQK 1245 02-19-13 100 0 100 MP8620DQK 1245 01-30-13 100 0 100 MP28258DD-C471 1302 02-06-13 100 0 100 MP8736DL 1301 01-30-13 100 0 100 MP8736DL 1301 01-30-13 100 0 100 MP8736DL 1250 01-30-13 100 0 100 MP8736DL 1250 01-31-13 100 0 100 The Future of Analog IC Technology® - 39 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1250 01-31-13 100 0 100 NB670GQ 1303 01-31-13 50 0 100 MP28258DD-C471 1302 02-04-13 50 0 100 MP2130DG 1303 02-04-13 50 0 100 MP8736DL 1250 01-31-13 100 0 100 MP8761GL 1302 01-31-13 50 0 100 MP8736DL 1303 02-04-13 100 0 100 MP28251GD 1303 01-31-13 50 0 100 MP8736DL 1303 02-04-13 100 0 100 MP8736DL 1301 01-31-13 100 0 100 MP28258DD 1302 02-04-13 100 0 100 MP8620DQK 1247 02-06-13 100 0 100 MP2334DD 1303 02-04-13 50 0 100 MP28258DD-C471 1302 02-04-13 100 0 100 MP8736DL 1250 02-04-13 50 0 100 FA NO. # of cycle MP8736DL 1250 02-06-13 50 0 100 NB6381DL 1221 02-04-13 50 0 100 MP2130DG 1303 02-06-13 50 0 100 MP28258DD-C471 1302 02-06-13 50 0 100 MP8736DL 1302 02-06-13 50 0 100 MP8736DL 1302 02-07-13 50 0 100 MP8736DL 1304 02-07-13 50 0 100 MP8736DL 1303 02-07-13 50 0 100 MP8736DL 1303 02-21-13 50 0 100 MP8736DL 1303 02-27-13 50 0 100 MP8736DL 1303 02-27-13 50 0 100 MP8736DL 1304 02-27-13 50 0 100 MP8736DL 1303 02-27-13 50 0 100 MP8736DL 1250 02-27-13 50 0 100 MP8736DL 1303 02-27-13 50 0 100 MP8736DL 1303 02-27-13 50 0 100 MP8736DL 1303 02-27-13 50 0 100 MP8736DL 1303 02-27-13 50 0 100 MP8736DL 1303 02-27-13 50 0 100 MP8736DL 1302 02-27-13 50 0 100 MP8736DL 1303 02-27-13 50 0 100 MP8736DL 1303 02-27-13 50 0 100 MP8736DL 1303 02-27-13 50 0 100 MP8736DL 1303 02-27-13 50 0 100 MP28258DD 1302 02-27-13 50 0 100 MP28258DD 1303 02-27-13 50 0 100 MP28258DD 1303 02-27-13 50 0 100 The Future of Analog IC Technology® - 40 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP28258DD-C471 1303 02-22-13 50 0 100 MP28258DD-C471 1303 02-22-13 50 0 100 FA NO. # of cycle MP28258DD-C471 1302 02-27-13 50 0 100 MP8736DL 1302 02-27-13 50 0 100 MP8736DL 1304 02-27-13 50 0 100 MP28258DD-C471 1303 02-27-13 50 0 100 MP28258DD 1305 03-13-13 50 0 100 MP8736DL 1303 03-13-13 50 0 100 MP8736DL 1303 03-13-13 50 0 100 MP8736DL 1302 03-01-13 50 0 100 MP8736DL 1302 03-01-13 50 0 100 MP8736DL 1303 03-01-13 50 0 100 MP8736DL 1302 03-01-13 50 0 100 MP8736DL 1303 03-01-13 50 0 100 MP9152GD 1306 03-01-13 50 0 100 MP28258DD 1303 03-01-13 50 0 100 MP8736DL 1303 03-01-13 50 0 100 MP8736DL 1302 03-06-13 50 0 100 MP8736DL 1303 03-13-13 50 0 100 MP8736DL 1304 03-13-13 50 0 100 MP8736DL 1304 03-06-13 50 0 100 MP28258DD 1302 03-06-13 50 0 100 MP8736DL 1304 03-07-13 50 0 100 MP8736DL 1304 03-07-13 50 0 100 MP8736DL 1304 03-07-13 50 0 100 MP8736DL 1304 03-07-13 50 0 100 MP8736DL 1302 03-07-13 50 0 100 MP8736DL 1301 03-07-13 50 0 100 MP8736DL 1304 03-07-13 50 0 100 MP28258DD-A 1308 03-07-13 50 0 100 MP28258DD 1302 03-07-13 50 0 100 MP8736DL 1304 03-13-13 50 0 100 MP8736DL 1305 03-13-13 50 0 100 MP8736DL 1305 03-13-13 50 0 100 MP8736DL 1304 03-13-13 50 0 100 MP28258DD-C471 1303 03-13-13 50 0 100 MP2130DG 1303 03-19-13 50 0 100 MP8736DL 1305 03-13-13 50 0 100 MP8736DL 1305 03-20-13 50 0 100 MP8736DL 1305 03-20-13 50 0 100 MP8736DL 1305 03-20-13 50 0 100 MP8736DL 1304 03-20-13 50 0 100 The Future of Analog IC Technology® - 41 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1305 03-20-13 50 0 100 MP8736DL 1303 03-20-13 50 0 100 MP9180DG 1307 03-19-13 50 0 100 MP9180DG 1305 03-19-13 50 0 100 NB6381DL 1222 03-29-13 50 0 100 MP1499GD 1308 03-20-13 50 0 100 MP8736DL 1306 03-20-13 50 0 100 MP8736DL 1306 03-20-13 50 0 100 MP2130DG 1304 03-22-13 50 0 100 MP8736DL 1306 03-22-13 50 0 100 MP8736DL 1306 03-22-13 50 0 100 MP8736DL 1306 03-22-13 50 0 100 MP28258DD-C471 1310 03-22-13 50 0 100 MP8736DL 1306 03-25-13 50 0 100 MP8736DL 1305 03-25-13 50 0 100 MP8736DL 1305 03-25-13 50 0 100 MP2130DG 1304 03-25-13 50 0 100 MP9152GD 1310 03-28-13 50 0 100 FA NO. # of cycle MP28258DD-C471 1310 03-22-13 50 0 100 MP8736DL 1307 03-25-13 50 0 100 MP8736DL 1306 03-25-13 50 0 100 MP8736DL 1305 03-25-13 50 0 100 MP28258DD 1303 03-28-13 50 0 100 MP8736DL 1306 03-28-13 50 0 100 MP8736DL 1309 03-28-13 50 0 100 MP8736DL 1305 03-28-13 50 0 100 MP8736DL 1309 03-28-13 50 0 100 MP8736DL 1307 03-28-13 50 0 100 MP8736DL 1307 03-28-13 50 0 100 MP28258DD 1303 03-28-13 50 0 100 Total 0 4.6.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP8736DL 1245 01-09-13 97 0 168 MP8736DL 1245 01-09-13 97 0 168 MP8736DL 1245 01-09-13 95 0 168 NB669GQ 1233 01-22-13 80 0 168 MPM3810GQB 1244 02-06-13 89 0 168 FA NO. # of hrs The Future of Analog IC Technology® - 42 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MPM3810GQB 1248 02-06-13 87 0 168 MPM3810GQB 1249 02-06-13 80 0 168 FA NO. # of hrs MP2615GQ 1232 01-03-13 79 0 168 NB670LGQ 1238 01-18-13 90 0 168 NB669GQ 1238 01-18-13 90 0 168 MP2130DG 1244 01-25-13 90 0 168 MP8736DL 1248 01-23-13 97 0 168 NB675GL 1241 02-27-13 90 0 168 MP86963DUT 1249 03-01-13 95 0 168 MP86963DUT 1250 03-01-13 95 0 168 MP86963DUT 1250 03-01-13 95 0 168 MP9186GQ 1250 02-27-13 85 0 168 MP1499GD 1303 03-06-13 87 0 168 MP5505GL 1241 03-20-13 87 0 168 MP8736DL 1234 03-20-13 100 0 168 MP2334DD 1251 01-08-13 50 0 48 MP1499GD 1252 01-10-13 50 0 48 MP8606DL 1251 01-11-13 50 0 48 MP9180DG 1251 01-14-13 50 0 48 MP8761GL 1251 02-18-13 50 0 48 MP28251GD 1244 01-18-13 50 0 48 MP28251GD 1251 01-14-13 50 0 48 MP28251GD 1301 01-18-13 50 0 48 MP2130DG 1252 01-22-13 50 0 48 MP2130DG 1251 01-23-13 50 0 48 MP2130DG 1250 01-22-13 50 0 48 MP5505GL 1246 01-25-13 100 0 48 MP5505GL 1241 01-25-13 100 0 48 MP28251GD 1301 01-25-13 50 0 48 MP28258DD-C471 1302 02-06-13 50 0 48 MP28251GD 1301 01-29-13 50 0 48 MP2162GQH 1302 01-30-13 50 0 48 MP5505GL 1303 01-30-13 50 0 48 MP2130DG 1303 01-29-13 50 0 48 MP28258DD-C471 1302 02-06-13 50 0 48 NB670GQ 1303 01-31-13 50 0 48 MP28258DD-C471 1302 02-04-13 50 0 48 MP2130DG 1303 02-04-13 50 0 48 MP8761GL 1302 01-31-13 50 0 48 MP28251GD 1303 01-31-13 50 0 48 MP2334DD 1303 02-04-13 50 0 48 MP8736DL 1250 02-04-13 50 0 48 The Future of Analog IC Technology® - 43 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1250 02-06-13 50 0 48 NB6381DL 1221 02-04-13 50 0 48 FA NO. # of hrs MP2130DG 1303 02-06-13 50 0 48 MP28258DD-C471 1302 02-06-13 50 0 48 MP8736DL 1302 02-06-13 50 0 48 MP8736DL 1302 02-07-13 50 0 48 MP8736DL 1304 02-07-13 50 0 48 MP8736DL 1303 02-07-13 50 0 48 MP8736DL 1303 02-21-13 50 0 48 MP8736DL 1303 02-27-13 50 0 48 MP8736DL 1303 02-27-13 50 0 48 MP8736DL 1304 02-27-13 50 0 48 MP8736DL 1303 02-27-13 50 0 48 MP8736DL 1250 02-27-13 50 0 48 MP8736DL 1303 02-27-13 50 0 48 MP8736DL 1303 02-27-13 50 0 48 MP8736DL 1303 02-27-13 50 0 48 MP8736DL 1303 02-27-13 50 0 48 MP8736DL 1303 02-27-13 50 0 48 MP8736DL 1302 02-27-13 50 0 48 MP8736DL 1303 02-27-13 50 0 48 MP8736DL 1303 02-27-13 50 0 48 MP8736DL 1303 02-27-13 50 0 48 MP8736DL 1303 02-27-13 50 0 48 MP28258DD 1302 02-27-13 50 0 48 MP28258DD 1303 02-27-13 50 0 48 MP28258DD 1303 02-27-13 50 0 48 MP28258DD-C471 1303 02-22-13 50 0 48 MP28258DD-C471 1303 02-22-13 50 0 48 MP28258DD-C471 1302 02-27-13 50 0 48 MP8736DL 1302 02-27-13 50 0 48 MP8736DL 1304 02-27-13 50 0 48 MP28258DD-C471 1303 02-27-13 50 0 48 MP28258DD 1305 03-13-13 50 0 48 MP8736DL 1303 03-13-13 50 0 48 MP8736DL 1303 03-13-13 50 0 48 MP8736DL 1302 03-01-13 50 0 48 MP8736DL 1302 03-01-13 50 0 48 MP8736DL 1303 03-01-13 50 0 48 MP8736DL 1302 03-01-13 50 0 48 MP8736DL 1303 03-01-13 50 0 48 MP9152GD 1306 03-01-13 50 0 48 The Future of Analog IC Technology® - 44 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP28258DD 1303 03-01-13 50 0 48 MP8736DL 1303 03-01-13 50 0 48 FA NO. # of hrs MP8736DL 1302 03-06-13 50 0 48 MP8620DQK 1250 03-06-13 50 0 48 MP8736DL 1303 03-13-13 50 0 48 MP8736DL 1304 03-13-13 50 0 48 MP8736DL 1304 03-06-13 50 0 48 MP28258DD 1302 03-06-13 50 0 48 MP8620DQK 1247 03-13-13 50 0 48 MP8736DL 1304 03-07-13 50 0 48 MP8736DL 1304 03-07-13 50 0 48 MP8736DL 1304 03-07-13 50 0 48 MP8736DL 1304 03-07-13 50 0 48 MP8736DL 1302 03-07-13 50 0 48 MP8736DL 1301 03-07-13 50 0 48 MP8736DL 1304 03-07-13 50 0 48 MP28258DD-A 1308 03-07-13 50 0 48 MP28258DD 1302 03-07-13 50 0 48 MP8736DL 1304 03-13-13 50 0 48 MP8736DL 1305 03-13-13 50 0 48 MP8736DL 1305 03-13-13 50 0 48 MP8736DL 1304 03-13-13 50 0 48 MP28258DD-C471 1303 03-13-13 50 0 48 MP2130DG 1303 03-19-13 50 0 48 MP8736DL 1305 03-13-13 50 0 48 MP8736DL 1305 03-20-13 50 0 48 MP8736DL 1305 03-20-13 50 0 48 MP8736DL 1305 03-20-13 50 0 48 MP8736DL 1304 03-20-13 50 0 48 MP8736DL 1305 03-20-13 50 0 48 MP8736DL 1303 03-20-13 50 0 48 MP9180DG 1307 03-19-13 50 0 48 MP9180DG 1305 03-19-13 50 0 48 NB6381DL 1222 03-29-13 50 0 48 MP1499GD 1308 03-20-13 50 0 48 MP8736DL 1306 03-20-13 50 0 48 MP8736DL 1306 03-20-13 50 0 48 MP2130DG 1304 03-22-13 50 0 48 MP8736DL 1306 03-22-13 50 0 48 MP8736DL 1306 03-22-13 50 0 48 MP8736DL 1306 03-22-13 50 0 48 MP28258DD-C471 1310 03-22-13 50 0 48 The Future of Analog IC Technology® - 45 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1306 03-25-13 50 0 48 MP8736DL 1305 03-25-13 50 0 48 MP8736DL 1305 03-25-13 50 0 48 MP2130DG 1304 03-25-13 50 0 48 MP9152GD 1310 03-28-13 50 0 48 MP28258DD-C471 1310 03-22-13 50 0 48 MP8736DL 1307 03-25-13 50 0 48 MP8736DL 1306 03-25-13 50 0 48 FA NO. # of hrs MP8736DL 1305 03-25-13 50 0 48 MP28258DD 1303 03-28-13 50 0 48 MP8736DL 1306 03-28-13 50 0 48 MP8736DL 1309 03-28-13 50 0 48 MP8736DL 1305 03-28-13 50 0 48 MP8736DL 1309 03-28-13 50 0 48 MP8736DL 1307 03-28-13 50 0 48 MP8736DL 1307 03-28-13 50 0 48 MP28258DD 1303 03-28-13 50 0 48 Total 0 4.6.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C Close Date Sample Size # of Fail MP8736DL 1234 03-20-13 80 0 Total FA NO. 0 4.7 FLIP CHIP-SOIC The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD ANST FCSOIC8 JCET JCAP FCSOIC8 FCSOIC8 ANST FCSOIC16 FCSOIC8 4.7.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP1482DS-C165 1238 03-04-13 915 0 FA NO. The Future of Analog IC Technology® - 46 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT SAT picture of FLIP CHIP-SOIC T-SCAN PICTURE C-SCAN PICTURE 4.7.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP1482DS 1242 01-25-13 500 0 1000 MP1482DS 1242 01-25-13 500 0 1000 FA NO. # of cycle MP1482DS 1242 02-07-13 500 0 1000 MP1482DS-C165 1247 02-06-13 500 0 1000 MP1482DS-C165 1247 02-06-13 500 0 1000 MP1482DS-C165 1247 02-06-13 500 0 1000 MP1482DS-C165 1247 02-19-13 500 0 1000 MP1482DS-C165 1247 02-19-13 500 0 1000 MP1482DS-C165 1238 03-04-13 400 0 1000 MP1482DS 1252 03-20-13 500 0 1000 MP1482DS 1252 03-20-13 500 0 1000 MP1482DS 1252 03-20-13 500 0 1000 MP1482DS 1248 01-09-13 50 0 100 MP1482DS 1249 01-15-13 50 0 100 MP1482DS 1252 01-22-13 50 0 100 MP1482DS 1218 01-18-13 50 0 100 MP1482DS 1251 01-22-13 50 0 100 MP1482DS 1218 01-22-13 50 0 100 MP1493DS-C456 1252 01-22-13 50 0 100 MP1482DS 1252 01-22-13 50 0 100 MP1482DS 1252 01-22-13 50 0 100 MP1482DS 1301 01-25-13 50 0 100 The Future of Analog IC Technology® - 47 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DS 1252 02-27-13 50 0 100 MP1482DS 1301 01-25-13 50 0 100 MP1482DS 1301 01-29-13 50 0 100 MP1482DS 1302 03-13-13 50 0 100 MP1482DS 1302 03-13-13 50 0 100 MP1482DS 1304 03-20-13 50 0 100 MP1482DS 1301 02-27-13 50 0 100 MP1482DS 1302 03-13-13 50 0 100 MP1482DS 1301 03-22-13 50 0 100 MP1493DS-C493 1252 03-06-13 50 0 100 FA NO. # of cycle MP1482DS 1306 03-01-13 50 0 100 MP28258DS 1305 03-06-13 50 0 100 MP1482DS 1302 03-28-13 50 0 100 MP1493DS 1306 03-13-13 50 0 100 MP1493DS 1306 03-13-13 50 0 100 MP1493DS 1250 03-20-13 50 0 100 MP1493DS 1308 03-20-13 50 0 100 MP1492DS 1308 03-20-13 50 0 100 MP1493DS-A 1251 03-22-13 50 0 100 MP1492DS 1306 03-22-13 50 0 100 MP1482DS 1226 03-28-13 50 0 100 MP1482DS 1309 03-28-13 50 0 100 MP1482DS 1224 03-28-13 50 0 100 MP1482DS 1310 03-28-13 50 0 100 MP1482DS 1305 03-28-13 50 0 100 Total 0 4.7.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP1482DS 1242 01-25-13 500 0 168 MP1482DS 1242 01-25-13 500 0 168 FA NO. # of hrs MP1482DS 1242 02-07-13 500 0 168 MP1482DS-C165 1247 02-06-13 500 0 168 MP1482DS-C165 1247 02-06-13 500 0 168 MP1482DS-C165 1247 02-06-13 500 0 168 MP1482DS-C165 1247 02-19-13 500 0 168 MP1482DS-C165 1247 02-19-13 500 0 168 MP1482DS-C165 1238 03-04-13 400 0 168 MP1482DS 1252 03-20-13 500 0 168 The Future of Analog IC Technology® - 48 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DS 1252 03-20-13 500 0 168 MP1482DS 1252 03-20-13 500 0 168 MP1482DS 1248 01-09-13 50 0 48 MP1482DS 1249 01-15-13 50 0 48 MP1482DS 1252 01-22-13 50 0 48 MP1482DS 1218 01-18-13 50 0 48 MP1482DS 1251 01-22-13 50 0 48 MP1482DS 1218 01-22-13 50 0 48 MP1493DS-C456 1252 01-22-13 50 0 48 MP1482DS 1252 01-22-13 50 0 48 MP1482DS 1252 01-22-13 50 0 48 MP1482DS 1301 01-25-13 50 0 48 MP1482DS 1252 02-27-13 50 0 48 MP1482DS 1301 01-25-13 50 0 48 MP1482DS 1301 01-29-13 50 0 48 MP1482DS 1302 03-13-13 50 0 48 MP1482DS 1302 03-13-13 50 0 48 MP1482DS 1304 03-20-13 50 0 48 MP1482DS 1301 02-27-13 50 0 48 MP1482DS 1302 03-13-13 50 0 48 MP1482DS 1301 03-22-13 50 0 48 MP1493DS-C493 1252 03-06-13 50 0 48 MP1482DS 1306 03-01-13 50 0 48 MP28258DS 1305 03-06-13 50 0 48 MP1482DS 1302 03-28-13 50 0 48 MP1493DS 1306 03-13-13 50 0 48 MP1493DS 1306 03-13-13 50 0 48 MP1493DS 1250 03-20-13 50 0 48 MP1493DS 1308 03-20-13 50 0 48 FA NO. # of hrs MP1492DS 1308 03-20-13 50 0 48 MP1493DS-A 1251 03-22-13 50 0 48 MP1492DS 1306 03-22-13 50 0 48 MP1482DS 1226 03-28-13 50 0 48 MP1482DS 1309 03-28-13 50 0 48 MP1482DS 1224 03-28-13 50 0 48 MP1482DS 1310 03-28-13 50 0 48 MP1482DS 1305 03-28-13 50 0 48 Total 0 The Future of Analog IC Technology® - 49 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT 4.8 FLIP CHIP-TSOT The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE ANST FCTSOT-5 JCET FCTSOT-6 ANST FCTSOT-6 JCET FCTSOT-8 ANST FCTSOT-8 4.8.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP150GJ 1238 01-23-13 180 0 MP3221GJ 1241 01-02-13 260 0 MP1470GJ 1251 03-04-13 209 0 Total FA NO. 0 SAT picture of FLIP CHIP-TSOT T-SCAN PICTURE C-SCAN PICTURE 4.8.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP150GJ 1238 01-23-13 84 0 1000 MP3221GJ 1241 01-02-13 84 0 1000 MP1470GJ 1251 03-04-13 84 0 1000 MP1497DJ 1250 01-08-13 100 0 100 FA NO. # of cycle The Future of Analog IC Technology® - 50 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1497DJ 1250 01-08-13 100 0 100 MP1472GJ-C452 1248 01-08-13 100 0 100 MP1472GJ-C452 1248 01-08-13 100 0 100 MP1495DJ 1250 01-11-13 50 0 100 MP1472GJ-C452 1249 01-14-13 100 0 100 MP1472GJ-C452 1248 01-10-13 100 0 100 MP1496DJ 1251 01-14-13 50 0 100 FA NO. # of cycle MP1470GJ 1248 01-14-13 50 0 100 MP1472GJ-C452 1249 01-14-13 100 0 100 MP1472GJ-C452 1249 01-14-13 100 0 100 MP1494DJ 1250 01-15-13 50 0 100 MP1494DJ 1252 01-18-13 50 0 100 MP2143GJ 1251 01-18-13 50 0 100 MP1497DJ 1301 01-18-13 100 0 100 MP1494DJ 1252 01-22-13 50 0 100 MP155GJ 1302 02-07-13 50 0 100 MP2161GJ 1302 01-25-13 50 0 100 MP2161GJ-C499 1302 01-29-13 50 0 100 MP2161GJ 1302 01-29-13 50 0 100 MP1470GJ 1302 01-30-13 50 0 100 MP1471GJ 1303 02-04-13 50 0 100 MP1497DJ 1252 01-31-13 100 0 100 MP1472GJ 1234 02-04-13 100 0 100 MP1472GJ 1236 01-31-13 100 0 100 MP1472GJ 1229 01-31-13 100 0 100 MP1472GJ-C452 1249 01-31-13 100 0 100 MP1472GJ 1230 02-04-13 100 0 100 MP1472GJ-C452 1250 02-06-13 50 0 100 MP1472GJ-C452 1249 02-06-13 50 0 100 MP1497DJ 1304 02-06-13 50 0 100 MP1472GJ-C452 1252 02-06-13 50 0 100 MP1494DJ 1302 02-07-13 50 0 100 MP1494DJ 1252 02-07-13 50 0 100 MP1470GJ 1302 02-07-13 50 0 100 MP1472GJ 1234 02-07-13 50 0 100 MP1472GJ-C452 1249 02-07-13 50 0 100 MP1472GJ-C452 1249 02-07-13 50 0 100 MP1472GJ-C452 1249 02-07-13 50 0 100 MP1495DJ 1302 02-27-13 50 0 100 MP1496DJ 1304 02-07-13 50 0 100 MP1497DJ 1304 02-07-13 50 0 100 MP3414DJ 1301 02-27-13 50 0 100 The Future of Analog IC Technology® - 51 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1472GJ 1249 02-27-13 50 0 100 MP1472GJ 1302 02-27-13 50 0 100 MP1472GJ 1302 02-27-13 50 0 100 MP1472GJ 1247 02-27-13 50 0 100 MP1472GJ 1248 02-27-13 50 0 100 MP1472GJ 1302 02-27-13 50 0 100 MP1472GJ 1302 02-27-13 50 0 100 MP1472GJ-C452 1249 02-27-13 50 0 100 MP1472GJ-C452 1249 02-27-13 50 0 100 MP1472GJ-C452 1249 02-27-13 50 0 100 MP1494DJ 1302 02-27-13 50 0 100 MP1497DJ 1252 02-27-13 50 0 100 MP1497DJ 1304 02-27-13 50 0 100 MP1497DJ 1304 02-27-13 50 0 100 MP1472GJ 1302 02-27-13 50 0 100 MP1496DJ 1305 02-27-13 50 0 100 MP1497DJ 1305 02-27-13 50 0 100 MP1472GJ 1302 03-13-13 50 0 100 MP1472GJ-C452 1249 03-28-13 50 0 100 MP1472GJ-C452 1249 03-13-13 50 0 100 MP1497DJ 1305 03-20-13 50 0 100 MP2489DJ 1305 03-06-13 50 0 100 MP1472GJ 1248 03-01-13 50 0 100 MP1472GJ 1302 03-01-13 50 0 100 MP1494DJ 1306 03-01-13 50 0 100 MP1494DJ 1252 03-01-13 50 0 100 MP1472GJ 1249 03-01-13 50 0 100 MP1497DJ 1305 03-01-13 50 0 100 MP1472GJ 1302 03-06-13 50 0 100 MP1497DJ 1306 03-20-13 50 0 100 MP150GJ 1305 03-22-13 50 0 100 MP1494DJ 1306 03-07-13 50 0 100 MP1471GJ 1306 03-13-13 50 0 100 FA NO. # of cycle MP1472GJ 1302 03-13-13 50 0 100 MP1472GJ-C452 1303 03-13-13 50 0 100 MP1472GJ-C452 1251 03-13-13 50 0 100 MP2143DJ 1304 03-13-13 50 0 100 MP1494DJ 1305 03-13-13 50 0 100 MP1472GJ-C452 1251 03-13-13 50 0 100 MP1497DJ 1306 03-13-13 50 0 100 MP1472GJ-C452 1252 03-13-13 50 0 100 MP1494DJ 1302 03-13-13 50 0 100 The Future of Analog IC Technology® - 52 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1472GJ-C452 1303 03-20-13 50 0 100 MP1497DJ 1308 03-20-13 50 0 100 MP1494DJ 1252 03-20-13 50 0 100 MP1497DJ 1309 03-20-13 50 0 100 MP1472GJ-C452 1306 03-20-13 50 0 100 FA NO. # of cycle MP1472GJ-C452 1307 03-20-13 50 0 100 MP1472GJ 1248 03-20-13 50 0 100 MP1497DJ 1306 03-20-13 50 0 100 MP1494DJ 1309 03-20-13 50 0 100 MP1495DJ 1306 03-20-13 50 0 100 MP1472GJ-C452 1307 03-20-13 50 0 100 MP1472GJ-C452 1307 03-20-13 50 0 100 MP1472GJ 1248 03-22-13 50 0 100 MP1472GJ 1249 03-22-13 50 0 100 MP1472GJ 1247 03-28-13 50 0 100 MP1472GJ-C452 1309 03-28-13 50 0 100 MP1472GJ-C452 1307 03-28-13 50 0 100 MP1494DJ 1309 03-28-13 50 0 100 MP1495DJ 1309 03-28-13 50 0 100 MP1496DJ 1310 03-28-13 50 0 100 MP1497DJ 1309 03-28-13 50 0 100 MP1497DJ 1309 03-25-13 50 0 100 MP2159GJ 1307 03-28-13 50 0 100 MP1472GJ 1252 03-28-13 50 0 100 MP1472GJ-C452 1306 03-28-13 50 0 100 MP1472GJ-C452 1307 03-28-13 50 0 100 MP2489DJ 1251 03-28-13 50 0 100 MP1498DJ 1307 03-28-13 250 0 100 MP1472GJ-C452 1309 03-28-13 50 0 100 MP1472GJ-C452 1307 03-28-13 50 0 100 MP1472GJ-C452 1307 03-28-13 50 0 100 Total 0 4.8.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail FA NO. # of hrs MP150GJ 1238 01-23-13 89 0 168 MP3221GJ 1241 01-02-13 80 0 168 MP1470GJ 1251 03-04-13 87 0 168 MP1495DJ 1250 01-11-13 50 0 48 MP1496DJ 1251 01-14-13 50 0 48 The Future of Analog IC Technology® - 53 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1470GJ 1248 01-14-13 50 0 48 MP1494DJ 1250 01-15-13 50 0 48 FA NO. # of hrs MP1494DJ 1252 01-18-13 50 0 48 MP2143GJ 1251 01-18-13 50 0 48 MP1494DJ 1252 01-22-13 50 0 48 MP155GJ 1302 02-07-13 50 1 MP2161GJ 1302 01-25-13 50 0 48 MP2161GJ-C499 1302 01-29-13 50 0 48 MP2161GJ 1302 01-29-13 50 0 48 MP1470GJ 1302 01-30-13 50 0 48 MP1471GJ 1303 02-04-13 50 0 48 MP1472GJ-C452 1250 02-06-13 50 0 48 MP1472GJ-C452 1249 02-06-13 50 0 48 MP1497DJ 1304 02-06-13 50 0 48 MP1472GJ-C452 1252 02-06-13 50 0 48 MP1494DJ 1302 02-07-13 50 0 48 MP1494DJ 1252 02-07-13 50 0 48 MP1470GJ 1302 02-07-13 50 0 48 MP1472GJ 1234 02-07-13 50 0 48 MP1472GJ-C452 1249 02-07-13 50 0 48 MP1472GJ-C452 1249 02-07-13 50 0 48 MP1472GJ-C452 1249 02-07-13 50 0 48 MP1495DJ 1302 02-27-13 50 0 48 MP1496DJ 1304 02-07-13 50 0 48 MP1497DJ 1304 02-07-13 50 0 48 MP3414DJ 1301 02-27-13 50 0 48 MP1472GJ 1249 02-27-13 50 0 48 MP1472GJ 1302 02-27-13 50 0 48 MP1472GJ 1302 02-27-13 50 0 48 MP1472GJ 1247 02-27-13 50 0 48 MP1472GJ 1248 02-27-13 50 0 48 MP1472GJ 1302 02-27-13 50 0 48 MP1472GJ 1302 02-27-13 50 0 48 MP1472GJ-C452 1249 02-27-13 50 0 48 MP1472GJ-C452 1249 02-27-13 50 0 48 MP1472GJ-C452 1249 02-27-13 50 0 48 MP1494DJ 1302 02-27-13 50 0 48 MP1497DJ 1252 02-27-13 50 0 48 MP1497DJ 1304 02-27-13 50 0 48 MP1497DJ 1304 02-27-13 50 0 48 MP1472GJ 1302 02-27-13 50 0 48 MP1496DJ 1305 02-27-13 50 0 48 6514 48 The Future of Analog IC Technology® - 54 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1497DJ 1305 02-27-13 50 0 48 MP1472GJ 1302 03-13-13 50 0 48 MP1472GJ-C452 1249 03-28-13 50 0 48 MP1472GJ-C452 1249 03-13-13 50 0 48 MP1497DJ 1305 03-20-13 50 0 48 MP2489DJ 1305 03-06-13 50 0 48 MP1472GJ 1248 03-01-13 50 0 48 MP1472GJ 1302 03-01-13 50 0 48 MP1494DJ 1306 03-01-13 50 0 48 MP1494DJ 1252 03-01-13 50 0 48 MP1472GJ 1249 03-01-13 50 0 48 FA NO. # of hrs MP1497DJ 1305 03-01-13 50 0 48 MP1472GJ 1302 03-06-13 50 0 48 MP1497DJ 1306 03-20-13 50 0 48 MP150GJ 1305 03-22-13 50 0 48 MP1494DJ 1306 03-07-13 50 0 48 MP1471GJ 1306 03-13-13 50 0 48 MP1472GJ 1302 03-13-13 50 0 48 MP1472GJ-C452 1303 03-13-13 50 0 48 MP1472GJ-C452 1251 03-13-13 50 0 48 MP2143DJ 1304 03-13-13 50 0 48 MP1494DJ 1305 03-13-13 50 0 48 MP1472GJ-C452 1251 03-13-13 50 0 48 MP1497DJ 1306 03-13-13 50 0 48 MP1472GJ-C452 1252 03-13-13 50 0 48 MP1494DJ 1302 03-13-13 50 0 48 MP1472GJ-C452 1303 03-20-13 50 0 48 MP1497DJ 1308 03-20-13 50 0 48 MP1494DJ 1252 03-20-13 50 0 48 MP1497DJ 1309 03-20-13 50 0 48 MP1472GJ-C452 1306 03-20-13 50 0 48 MP1472GJ-C452 1307 03-20-13 50 0 48 MP1472GJ 1248 03-20-13 50 0 48 MP1497DJ 1306 03-20-13 50 0 48 MP1494DJ 1309 03-20-13 50 0 48 MP1495DJ 1306 03-20-13 50 0 48 MP1472GJ-C452 1307 03-20-13 50 0 48 MP1472GJ-C452 1307 03-20-13 50 0 48 MP1472GJ 1248 03-22-13 50 0 48 MP1472GJ 1249 03-22-13 50 0 48 MP1472GJ 1247 03-28-13 50 0 48 MP1472GJ-C452 1309 03-28-13 50 0 48 The Future of Analog IC Technology® - 55 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1472GJ-C452 1307 03-28-13 50 0 48 MP1494DJ 1309 03-28-13 50 0 48 MP1495DJ 1309 03-28-13 50 0 48 MP1496DJ 1310 03-28-13 50 0 48 MP1497DJ 1309 03-28-13 50 0 48 MP1497DJ 1309 03-25-13 50 0 48 MP2159GJ 1307 03-28-13 50 0 48 MP1472GJ 1252 03-28-13 50 0 48 MP1472GJ-C452 1306 03-28-13 50 0 48 MP1472GJ-C452 1307 03-28-13 50 0 48 MP2489DJ 1251 03-28-13 50 0 48 MP1498DJ 1307 03-28-13 50 0 48 MP1472GJ-C452 1309 03-28-13 50 0 48 MP1472GJ-C452 1307 03-28-13 50 0 48 MP1472GJ-C452 1307 03-28-13 50 0 48 Total FA NO. # of hrs 1 The Future of Analog IC Technology® - 56 - MONOLITHIC POWER SYSTEMS Q1 2013 PRODUCT RELIABILITY REPORT Monolithic Power Systems (Chengdu) Co., Ltd. No.8 Kexin Rd. West Park of Export Processing Zone, West Hi-Tech Zone, Chengdu, Sichuan 611731 Tel: 86-28-87303000 Fax: 86-28-87303060 www.monolithicpower.com The Future of Analog IC Technology® - 57 -