2013 Q1 Reliability Quarterly Report Overview

QUARTERLY RELIABILITY MONITOR
REPORT
Q1, Jan. ~ Mar. 2013
Prepared by MPSCD Reliability Engineering
The Future of Analog IC Technology®
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
INDEX
1.0 INTRODUCTION ......................................................................................2
1.1 SHORT TERM RELIBILITY MONITORING ........................................................................................................................ 2
1.2 LONG TERM RELIBILITY MONITORING ........................................................................................................................... 2
2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS.........................3
3.0 PROCESS RELIABILITY MONITORING DATA ......................................4
3.1 BCM12B Process Technology ................................................................................................................................................ 4
3.2 BCM12S Process Technology ................................................................................................................................................ 6
3.3 BCM35 Process Technology ................................................................................................................................................... 8
3.4 BCM05 Process Technology ................................................................................................................................................... 9
3.5 BCM18 Process Technology ................................................................................................................................................ 10
4.0 PACKAGE RELIABILITY MONITORING DATA .................................... 11
4.1 QFN .................................................................................................................................................................................................. 11
4.2 SOIC ................................................................................................................................................................................................ 17
4.3 MSOP .............................................................................................................................................................................................. 26
4.4 TSOT ............................................................................................................................................................................................... 30
4.5 TSSOP ............................................................................................................................................................................................ 32
4.6 FLIP CHIP-QFN ......................................................................................................................................................................... 35
4.7 FLIP CHIP-SOIC........................................................................................................................................................................ 46
4.8 FLIP CHIP-TSOT ...................................................................................................................................................................... 50
The Future of Analog IC Technology®
-1-
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
1.0 INTRODUCTION
This report summarizes the reliability testing results for MPS products as of Q1 2013.
1.1 SHORT TERM RELIBILITY MONITORING
The short term monitoring runs on a daily basis. It provides a fast alert in case of changes in term of product
reliability performance.
Stress Test Name
Test Condition
Duration
JEDEC
EARLY LIFE
125°C, Vccmax
48 ~168 hrs
JESD22-A108
Convection Reflow
260°C
3 times
JESD22-A113
Temperature Cycle
Cond C:-65℃ ~ 150℃
100~200Cycles
JESD22-A104
Autoclave
121°C /100%RH
48~96 hrs
JESD22-A102
1.2 LONG TERM RELIBILITY MONITORING
The long term monitoring runs on a quarterly basis. It provides the life stresses for periods long enough to
provide the data necessary to calculate the steady state failure rates of products.
Stress Test Name
Test Condition
Duration
JEDEC
HTOL
125°C, Vccmax
1000 hrs
JESD22-A108
HTSL
150°C
1000 hrs
JESD22-A103
Precondition
/
/
JESD22-A113
Autoclave
121°C /100%RH
168 hrs
JESD22-A102
Temperature Cycle
Cond C:-65°C ~ 150°C
1000 Cycles
JESD22-A104
85°C, 85% R.H., VDD
1000 hrs
JESD22-A101
130°C, 85% R.H., VDD
96 hrs
JESD22-A110
Temperature Humidity Bias
(THB)
High Accelerated Stress Test
(HAST)
The Future of Analog IC Technology®
-2-
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS
The long-term failure rate for a technology is gauged by a Failures In Time (FIT) calculation based upon
accelerated stress data. The units for FIT are failures per Billion device hours.
( χ / 2) *10
2
FITRate =
9
stress * device hours
The stress that enables FIT is High Temperature Operating Life (HTOL), which is a product level test. HTOL
is accelerated by temperature and by voltage. The total number of failures in stress determines the
chi-squared factor (a dimensionless number representing a 60% confidence level of statistics). The number
of product units times the stress period (in Hours) is the device-Hours number. The Arrhenius equation uses
the Activation energy for the fail mode as well as the stress temperature and the reporting temperature (e.g.
55℃) to compute the HTOL temperature acceleration factor, AF(T). The accelerated stress device-Hours is
AF(T) times the device-Hours number. AFv= Exp(β(Vtest- Vuse), Vtest = Stress Voltage (V).Vuse = Nominal
Voltage (V).β = Voltage Acceleration Constant (usually, 0.5 < Z < 1.0).
The Future of Analog IC Technology®
-3-
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
3.0 PROCESS RELIABILITY MONITORING DATA
3.1 BCM12B Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
HHNEC, ASMC,SMIC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP2303DN
C486631.9A
1232
02-06-13
50
168
0
MP2303DN
C486631.9B
1234
02-06-13
50
168
0
MP1412DH
C285403.7
1231
01-08-13
80
168
0
MP1412DH
C285402.7R
1233
01-08-13
80
168
0
MP1412DH
C285402.7
1234
01-08-13
80
168
0
MP2603EJ
C888423.1AT
1243
01-25-13
80
168
0
MP2603EJ
C888382.1AT
1243
01-25-13
80
168
0
MP2603EJ
C988552.1
1247
02-27-13
79
168
0
MP1484EN
C687360.7
1250
01-09-13
80
48
0
MP3302DJ
C472636.7B
1248
02-04-13
80
48
0
MP2451DT
C672847.7
1248
01-12-13
80
48
0
MP1484EN
C787773.7
1251
01-15-13
80
48
0
MPQ2451DT1
C872014.7
1248
02-27-13
80
48
0
MPQ4460DQ
C972085.7
1247
02-06-13
80
48
0
MP1484EN
C787781.7
1251
02-08-13
78
48
0
MP4459DQT
C772903.7
1248
02-18-13
80
48
0
MPQ2483DQ1
CA72108.9A
1249
02-27-13
80
48
0
MP1412DH
C285299.7
1303
02-08-13
80
48
0
MP1593DN-C218
C385905.7
1223
02-08-13
80
48
0
MP3302DJ
C486455.7
1302
02-27-13
80
48
0
MPQ7731DF
C572802.7A
1248
02-27-13
80
48
0
MP9115DQT
CA89007.8A
1305
02-27-13
80
48
0
MPQ4462DQ1
C472618.9A
1242
03-06-13
80
48
0
MP2359DT
C687474.9
1303
02-22-13
80
48
0
MP3217DJ
C888434.7
1303
03-06-13
80
48
0
MP1484EN-C321
C787819.7
1302
02-27-13
80
48
0
MP2307DN
C787835.7
1304
02-27-13
80
48
0
MP3217DJ
CA88955.9
1304
03-13-13
77
96
0
MP1412DH
C285398.7
1304
02-27-13
77
96
0
MP1412DH
C285401.7A
1305
03-01-13
80
48
0
MP1484EN
C787834.7
1304
02-27-13
80
48
0
The Future of Analog IC Technology®
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FA No.
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP1482DN
C687441.7
1251
03-06-13
80
48
0
MP1411DH
C285213.1A
1219
03-06-13
80
48
0
MP1411DH
C285220.1A
1219
03-07-13
80
48
0
MP1411DH
C285219.7
1219
03-13-13
80
48
0
MP1482DS-C165
CA88796.7
1305
03-06-13
80
48
0
Device
MP1411DH
C285218.7
1219
03-13-13
80
48
0
MPQ7731DF
CB72236.9A
1308
03-20-13
80
48
0
MP1482DN
CA88794.7
1305
03-20-13
80
48
0
MP1482DN
C687458.7
1308
03-13-13
80
48
0
MP1484EN-C321
C787903.7
1305
03-20-13
80
48
0
MP1482DN
C687456.7
1308
03-13-13
80
48
0
MP2105DJ
C888428.7
1302
03-28-13
80
48
0
MP1484EN-C321
C687656.7
1308
03-13-13
80
48
0
MP1482DN
C687636.7
1308
03-13-13
80
48
0
MP1482DN
C687315.7
1308
03-13-13
80
48
0
MP1411DH
C285213.7
1219
03-20-13
80
48
0
MP1411DH
C285501.7
1308
03-20-13
80
48
0
NB600CQ
C372376.7
1302
03-22-13
80
48
0
MP4460DQ
C972050.7
1303
03-28-13
80
48
0
MP1484EN
C788077.7
1305
03-20-13
80
48
0
MP1411DH
C285503.7
1308
03-22-13
80
48
0
MP1482DN
C687644.7
1308
03-20-13
80
48
0
MP2121DQ
C587008.7
1309
03-28-13
80
48
0
MP1412DH
BC84887.1A
1310
03-25-13
80
48
0
MP1482DN
C687459.7
1309
03-28-13
80
48
0
MP1482DN
C687455.7
1309
03-28-13
80
48
0
MP1482DS-C165
C787704.7
1302
03-28-13
80
48
0
MP1484EN
C888216.7
1306
03-28-13
80
48
0
MP2303ADN
C587166.7
1310
03-22-13
80
48
0
MP2012DQ
C788042.1
1310
03-25-13
80
48
0
MP1484EN
C888215.7
1306
03-28-13
80
48
0
Total
FA No.
0
LONG TERM LIFE (HTOL Long Term Monitor)
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MPQ8039GN
EP177100
1224
01-30-13
80
0
MPQ8039GN
EP177102
1224
01-30-13
80
0
MP4000DS
EP275800
1242
01-23-13
80
0
MP3900DK
EP275300
1245
01-18-13
80
0
Total
0
The Future of Analog IC Technology®
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FA No.
MONOLITHIC POWER SYSTEMS
Q1
BCM12B
2013
PRODUCT RELIABILITY REPORT
#fail
#device hours
Accel Factor
FIT Rate
0
240000
348
11.5
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP2303DN
C486631.9A
1232
02-06-13
46
0
MP2303DN
C486631.9B
1234
02-06-13
45
0
MP1412DH
C285403.7
1231
01-08-13
47
0
MP1412DH
C285402.7
1233
01-08-13
50
0
MP1412DH
C285402.7QB
1234
01-08-13
47
0
Total
FA No.
0
3.2 BCM12S Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
HHNEC, ASMC,SMIC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax @ 125°C
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
Device
LOT#
MP28252EL
C346213.9AQ
1215
02-06-13
50
168
0
MP28252EL
C346496.1E
1220
02-06-13
50
168
0
MP28253EL
C486626.7
1247
02-06-13
79
168
0
MP3388DR
C345910.1AL
1233
01-03-13
80
168
0
MP3388DR
C345910.1AM
1233
01-03-13
80
168
0
MP3388DR
C345910.1AH
1233
01-03-13
80
168
0
MP3397EF
C772924.1A
1236
03-04-13
77
168
0
MP1482DS-C165
C448499.8
1238
03-04-13
80
168
0
MP38900DL
C988554.8
1246
02-20-13
78
168
0
MPQ9361DJ
8390919.1BA
1247
02-07-13
80
48
0
MPQ9361DJ
C586952.7
1252
02-06-13
80
48
0
MP8736DL
CB89028.8
1302
03-27-13
80
48
0
MP8736DL
C788102.8
1303
03-22-13
80
48
0
MP8736DL
C988556.8
1302
03-29-13
80
48
0
MP1482DS-C416
C64A284.8A
1250
02-27-13
80
48
0
MP3389EF
CB89026.1
1303
02-27-13
80
48
0
MPQ9361DJ
C586952.7BR
1252
02-27-13
80
48
0
The Future of Analog IC Technology®
-6-
FA No.
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP8736DL
CB89038.8
1303
03-28-13
80
48
0
MP8705EN
CA4J877.9
1303
02-27-13
80
48
0
MP3389EF
CB89064.1
1304
02-27-13
80
48
0
MP8736DL
C888208.8
1302
03-20-13
80
48
0
MP3389EF
CB4K681.1
1304
03-13-13
80
48
0
MPQ28261DL
C285336.7Y
1228
03-22-13
80
48
0
MP3389EF
CB4K688.1
1305
03-20-13
80
48
0
MP28258DS
CC89253.8A
1308
03-13-13
80
48
0
MP8125EF
C888406.7
1309
03-22-13
80
48
0
MP28252EL
C64B393.9
1307
03-13-13
80
48
0
MP3389EF
CB89138.1
1305
03-28-13
80
48
0
MP8705EN
C74B817.9
1309
03-25-13
80
48
0
MP3389EF-C355
CC4M105.9A
1310
03-28-13
80
48
0
MP1495DJ
C872018.8
1302
02-27-13
80
48
0
MP1495DJ
C872030.8
1305
02-27-13
80
48
0
Total
FA No.
0
LONG TERM LIFE (HTOL Long Term Monitor) BCM12S
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP28258DS
H7G76302
1250
03-20-13
80
0
MP8125EF
HP29007
1245
03-21-13
79
0
Total
FA No.
0
BCM12S
#fail
#device hours
Accel Factor
FIT Rate
0
159000
348
17
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP28252EL
C346213.9AQ
1215
02-06-13
47
0
MP28252EL
C346496.1E
1220
02-06-13
47
0
MP3388DR
C345910.1AL
1233
01-03-13
45
0
MP3388DR
C345910.1AM
1233
01-03-13
45
0
MP3388DR
C345910.1AH
1233
01-03-13
45
0
MP150GJ
EP252601
1238
01-23-13
50
0
MP4700GS
C586922.1A
1247
02-06-13
50
0
MP4700GS
C586922.1B
1246
02-06-13
50
0
The Future of Analog IC Technology®
-7-
FA No.
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP3397EF
C772924.1A
1236
03-04-13
50
0
MP8125EF
HP29007
1245
03-21-13
50
0
MP6922AGN
FA222077B
1217
03-20-13
45
0
MP6922AGN
FA222077A-Q2A
1227
03-20-13
50
0
MP6922AGN
FA222077A-Q2B
1229
03-20-13
50
0
MP6910DZ
A998713.5
1240
03-08-13
50
0
MP6920DN
A872708.9A
1242
03-20-13
49
0
Total
FA No.
0
3.3 BCM35 Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
ASMC,SMIC
LONG TERM LIFE (HTOL Long Term Monitor) BCM35
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP7748SGF
HP274119
1244
01-11-13
78
0
MP2635GR
HP2967
1229
01-25-13
95
0
MP3398GS
HP306405
1238
01-25-13
86
0
Total
FA No.
0
BCM35
#fail
#device hours
Accel Factor
FIT Rate
0
259
348
10.6
HIGH TEMPERATURE STORAGE LIFE (HTSL) BCM35
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP7748SGF
HP274119
1244
01-11-13
50
0
MP2635GR
HP2967
1229
01-25-13
47
0
MP2635GR
HP2967Q3
1237
01-25-13
47
0
MP8845GC
HP272301
1212
01-25-13
50
0
MPM3810GQB
HP300301-LOT1
1244
02-06-13
47
0
MPM3810GQB
HP3003-LOT2
1248
02-06-13
50
0
MP2122GJ
EP263102R1
1241
01-18-13
47
0
MP3398GS
HP306405
1238
01-25-13
46
0
MP7748SGF
HP274115
1236
03-04-13
50
0
The Future of Analog IC Technology®
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FA No.
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP7748SGF
HP274113
1247
02-26-13
50
0
Total
FA No.
0
3.4 BCM05 Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
ASMC,HHNEC
EARLY LIFE (HTOL Short Term Monitor) BCM05
Stress Duration: 48 ~168 hours
Test Condition: Vccmax @125°C
D/C
Close
Date
Sample
Size
# of
Fail
Device
LOT#
# of hrs
MP20043DGT
AC72657.1E
1304
03-01-13
80
48
0
MP6400DJ-01
CB89119.1
1304
03-06-13
80
48
0
Total
FA No.
0
LONG TERM LIFE (HTOL Long Term Monitor) BCM05
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP2130DG
EP272712
1244
01-25-13
80
0
Total
FA No.
0
BCM05
#fail
#device hours
Accel Factor
FIT Rate
0
80000
348
33
HIGH TEMPERATURE STORAGE LIFE (HTSL) BCM05
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP20045DN
C482617.7
1225
02-06-13
47
0
MP20045DN
B982447.7
1214
02-06-13
48
0
MP2130DG
EP272712
1244
01-25-13
50
0
Total
0
The Future of Analog IC Technology®
-9-
FA No.
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
3.5 BCM18 Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
SMIC
LONG TERM LIFE (HTOL Long Term Monitor) BCM18
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
NB669GQ
HP2884
1233
01-22-13
80
0
Total
FA No.
0
BCM35
#fail
#device hours
Accel Factor
FIT Rate
0
80000
348
33
HIGH TEMPERATURE STORAGE LIFE (HTSL) BCM18
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
NB669GQ
HP2884
1233
01-22-13
47
0
NB670LGQ
HP2992
1238
01-18-13
50
0
NB669GQ
HP2884
1238
01-18-13
47
0
NB675GL
HP302401
1241
02-27-13
50
0
Total
0
The Future of Analog IC Technology®
- 10 -
FA No.
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
4.0 PACKAGE RELIABILITY MONITORING DATA
4.1 QFN
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
QFN2*2
ASAT
QFN2*2
UCD
QFN2*3
ASAT
QFN2*3
UCD
QFN3*3
ASAT
QFN3*3
UCD
QFN3*4
ASAT
QFN3*4
UCD
QFN4*4
ASAT
QFN4*4
UCD
QFN4*5
ASAT
QFN5*5
UCD
QFN5*5
ASAT
QFN7*7
UCD
QFN5*6
UTAC
UCD
QFN6*6
JCET
QFN2*2
UCD
QFN7*7
JCET
QFN4*4
QFN3*3
4.1.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ28261DL
1217
01-03-13
45
0
MPQ28261DL
1228
01-03-13
43
0
MPQ28261DL
1228
01-03-13
45
0
MPQ28261DL
1228
01-03-13
45
0
MP6507GQ
1236
01-03-13
100
0
MP2635GR
1227
01-09-13
100
0
MP2635GR
1229
01-25-13
186
0
MP2635GR
1237
01-25-13
180
0
MP3388DR
1233
01-03-13
181
0
MP3388DR
1233
01-03-13
181
0
MP3388DR
1233
01-03-13
190
0
MP3426DL
1235
01-18-13
95
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 11 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
SAT picture of QFN
T-SCAN PICTURE
C-SCAN PICTURE
4.1.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28252EL
1215
02-06-13
47
0
1000
MP28252EL
1220
02-06-13
47
0
1000
FA NO.
# of
cycle
MP6507GQ
1236
01-03-13
94
0
1000
MP2635GR
1227
01-09-13
48
0
1000
MP2635GR
1229
01-25-13
84
0
1000
MP2635GR
1237
01-25-13
84
0
1000
MP3388DR
1233
01-03-13
85
0
1000
MP3388DR
1233
01-03-13
85
0
1000
MP3388DR
1233
01-03-13
85
0
1000
MP1720DQ-216
1202
01-09-13
50
0
100
MP2611GL
1248
01-08-13
50
0
100
MP2611GL
1250
01-08-13
50
0
100
MP20045DQ-25
1251
01-10-13
50
0
100
MP2002DD
1251
01-11-13
50
0
100
MP2012DQ
1250
01-10-13
50
0
100
MP20046DN
1251
01-10-13
50
0
100
MP2303DQ
1252
01-14-13
50
0
100
MP2565DQ
1250
01-14-13
50
0
100
MP5000DQ
1238
01-15-13
50
0
100
MP5010DQ-C347
1250
01-15-13
50
0
100
MP38872DL
1251
01-18-13
50
0
100
MP2214DL
1248
01-18-13
50
0
100
The Future of Analog IC Technology®
- 12 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2303DQ
1252
01-18-13
50
0
100
MP28127DQ
1301
01-18-13
50
0
100
MP2371DG
1252
01-18-13
50
0
100
MP4462DQ
1301
01-22-13
50
0
100
NB634EL
1238
01-22-13
50
0
100
MP28256EL
1246
01-22-13
50
0
100
NB600CQ
1249
01-22-13
50
0
100
FA NO.
# of
cycle
MPQ4460DQ
1247
02-06-13
50
0
100
MP28114DG-1.8
1251
01-25-13
50
0
100
MP2360DG
1250
01-25-13
50
0
100
MP2361DQ
1250
01-25-13
50
0
100
MP2005DD
1251
01-29-13
50
0
100
MP20051DQ
1302
01-25-13
50
0
100
MPQ2483DQ1
1249
02-27-13
50
0
100
MP2012DQ
1241
01-29-13
50
0
100
MP38872DL
1302
01-29-13
50
0
100
NB600CQ
1249
01-29-13
50
0
100
MP2565DQ
1251
02-04-13
50
0
100
MP28127DQ
1251
01-31-13
50
0
100
MP2112DQ
1248
02-04-13
50
0
100
NB637EL
1238
01-31-13
50
0
100
MP2109DQ
1247
02-04-13
50
0
100
NB637EL
1238
02-04-13
50
0
100
MP38872DL
1303
02-04-13
50
0
100
MP9115DQT
1303
02-06-13
50
0
100
MP5000DQ-C266
1302
02-04-13
50
0
100
MP2209DL
1302
02-06-13
50
0
100
MP4560DQ
1250
02-06-13
50
0
100
MP2109DQ
1303
02-07-13
50
0
100
MP5000DQ
1304
02-27-13
50
0
100
MP5000DQ
1304
02-27-13
50
0
100
MP2303DQ
1303
02-27-13
50
0
100
MP3388DR
1302
02-27-13
50
0
100
MP2303DQ
1304
02-27-13
50
0
100
MP2303DQ
1303
02-27-13
50
0
100
MP8904DD
1252
02-27-13
50
0
100
MP3213DQ
1245
02-27-13
50
0
100
MP4460DQ
1303
02-27-13
50
0
100
MPQ4462DQ1
1242
03-06-13
50
0
100
MP2562DQ
1305
02-27-13
50
0
100
MP1720DQ
1306
03-01-13
50
0
100
MP2611GL
1301
03-01-13
50
0
100
The Future of Analog IC Technology®
- 13 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
# of
cycle
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2119DQ
1305
03-06-13
50
0
100
MP2452DD
1308
03-06-13
50
0
100
MPQ28261DL
1228
03-22-13
50
0
100
MP28256EL
1305
03-13-13
50
0
100
MP28254EL
1305
03-07-13
50
0
100
MP2121DQ-C236
1301
03-13-13
50
0
100
MP2209DL
1309
03-22-13
50
0
100
MP6900DQ
1309
03-20-13
50
0
100
MP2119DQ
1308
03-22-13
50
0
100
MP2108DQ
1306
03-20-13
50
0
100
MP4460DQ
1303
03-28-13
50
0
100
MP3388DR-C414
1309
03-25-13
50
0
100
MP2207DQ
1309
03-22-13
50
0
100
MP2120DQ
1305
03-22-13
50
0
100
MP2002DD
1304
03-22-13
50
0
100
NB634EL
1304
03-25-13
50
0
100
Total
FA NO.
0
4.1.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28252EL
1215
02-06-13
47
0
168
MP28252EL
1220
02-06-13
47
0
168
MP2635GR
1227
01-09-13
49
0
168
MP2635GR
1229
01-25-13
90
0
168
MP2635GR
1237
01-25-13
90
0
168
MP3388DR
1233
01-03-13
90
0
168
MP3388DR
1233
01-03-13
90
0
168
MP3388DR
1233
01-03-13
90
0
168
MP1720DQ-216
1202
01-09-13
50
0
48
MP2611GL
1248
01-08-13
50
0
48
MP2611GL
1250
01-08-13
50
0
48
MP20045DQ-25
1251
01-10-13
50
0
48
MP2002DD
1251
01-11-13
50
0
48
FA NO.
# of hrs
MP2012DQ
1250
01-10-13
50
0
48
MP20046DN
1251
01-10-13
50
0
48
MP2303DQ
1252
01-14-13
50
0
48
MP2565DQ
1250
01-14-13
50
0
48
The Future of Analog IC Technology®
- 14 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP5000DQ
1238
01-15-13
50
0
48
MP5010DQ-C347
1250
01-15-13
50
0
48
FA NO.
# of hrs
MP38872DL
1251
01-18-13
50
0
48
MP2214DL
1248
01-18-13
50
0
48
MP2303DQ
1252
01-18-13
50
0
48
MP28127DQ
1301
01-18-13
50
0
48
MP2371DG
1252
01-18-13
50
0
48
MP4462DQ
1301
01-22-13
50
0
48
NB634EL
1238
01-22-13
50
0
48
MP28256EL
1246
01-22-13
50
0
48
NB600CQ
1249
01-22-13
50
0
48
MPQ4460DQ
1247
02-06-13
50
0
48
MP28114DG-1.8
1251
01-25-13
50
0
48
MP2360DG
1250
01-25-13
50
0
48
MP2361DQ
1250
01-25-13
50
0
48
MP2005DD
1251
01-29-13
50
0
48
MP20051DQ
1302
01-25-13
50
0
48
MPQ2483DQ1
1249
02-27-13
50
0
48
MP2012DQ
1241
01-29-13
50
0
48
MP38872DL
1302
01-29-13
50
0
48
NB600CQ
1249
01-29-13
50
0
48
MP2565DQ
1251
02-04-13
50
0
48
MP28127DQ
1251
01-31-13
50
0
48
MP2112DQ
1248
02-04-13
50
0
48
NB637EL
1238
01-31-13
50
0
48
MP2109DQ
1247
02-04-13
50
0
48
NB637EL
1238
02-04-13
50
0
48
MP38872DL
1303
02-04-13
50
0
48
MP9115DQT
1303
02-06-13
50
0
48
MP5000DQ-C266
1302
02-04-13
50
0
48
MP2209DL
1302
02-06-13
50
0
48
MP4560DQ
1250
02-06-13
50
0
48
MP2109DQ
1303
02-07-13
50
0
48
MP5000DQ
1304
02-27-13
50
0
48
MP5000DQ
1304
02-27-13
50
0
48
MP2303DQ
1303
02-27-13
50
0
48
MP3388DR
1302
02-27-13
50
0
48
MP2303DQ
1304
02-27-13
50
0
48
MP2303DQ
1303
02-27-13
50
0
48
MP8904DD
1252
02-27-13
50
0
48
MP3213DQ
1245
02-27-13
50
0
48
MP4460DQ
1303
02-27-13
50
0
48
The Future of Analog IC Technology®
- 15 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ4462DQ1
1242
03-06-13
50
0
48
MP2562DQ
1305
02-27-13
50
0
48
MP1720DQ
1306
03-01-13
50
0
48
FA NO.
# of hrs
MP2611GL
1301
03-01-13
50
0
48
MP2119DQ
1305
03-06-13
50
0
48
MP2452DD
1308
03-06-13
50
0
48
MPQ28261DL
1228
03-22-13
50
0
48
MP28256EL
1305
03-13-13
50
0
48
MP28254EL
1305
03-07-13
50
0
48
MP2121DQ-C236
1301
03-13-13
50
0
48
MP2209DL
1309
03-22-13
50
0
48
MP6900DQ
1309
03-20-13
50
0
48
MP2119DQ
1308
03-22-13
50
0
48
MP2108DQ
1306
03-20-13
50
0
48
MP4460DQ
1303
03-28-13
50
0
48
MP3388DR-C414
1309
03-25-13
50
0
48
MP2207DQ
1309
03-22-13
50
0
48
MP2120DQ
1305
03-22-13
50
0
48
MP2002DD
1304
03-22-13
50
0
48
NB634EL
1304
03-25-13
50
0
48
Total
0
4.1.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ28261DL
1217
01-03-13
45
0
MPQ28261DL
1228
01-03-13
43
0
MPQ28261DL
1228
01-03-13
45
0
MPQ28261DL
1228
01-03-13
45
0
MP3426DL
1235
01-18-13
79
0
MPQ28261DL
1228
03-22-13
45
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 16 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
4.2 SOIC
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
SOIC8
ANST
SOIC14
UCD
SOIC8-EP
ANST
SOIC16
ANST
SOIC8-7
ANST
SOIC20
ANST
SOIC8
ANST
SOIC28
ANST
SOIC8-EP
UTAC
SOIC8
UTAC
SOIC8-EP
JCET
SOIC8
JCET
SOIC8-EP
JCET
SOIC16
ASE-KS
SOIC8-EP
ASE-KS
SOIC8
4.2.1 Preconditioning
MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3398GS
1238
01-25-13
360
0
MP4700GS
1247
02-06-13
180
0
MP4700GS
1246
02-06-13
180
0
MP6922AGN
1217
03-20-13
180
0
MP6922AGN
1227
03-20-13
180
0
MP6922AGN
1229
03-20-13
180
0
MP6922AGN
1217
03-20-13
100
0
MP6922AGN
1227
03-20-13
100
0
MP6922AGN
1229
03-20-13
100
0
MP6920DN
1242
03-20-13
200
0
Total
FA NO.
0
SAT picture of SOIC
T-SCAN PICTURE
C-SCAN PICTURE
The Future of Analog IC Technology®
- 17 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
4.2.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP20045DN
1225
02-06-13
52
0
1000
MP20045DN
1214
02-06-13
49
0
1000
MP2303DN
1232
02-06-13
57
0
1000
MP2303DN
1234
02-06-13
55
0
1000
MP4700GS
1247
02-06-13
87
0
1000
MP4700GS
1246
02-06-13
87
0
1000
MP6920DN
1242
03-20-13
94
0
1000
MP1484EN
1250
01-09-13
50
0
100
MP8718EN
1250
01-10-13
50
0
100
MP6001DN
1251
01-10-13
50
0
100
MP6205DN
1250
01-10-13
50
0
100
MP2307DN
1250
01-10-13
50
0
100
MP2482DN
1251
01-10-13
50
0
100
MP2482DN
1251
01-10-13
50
0
100
MP1482DS-C165
1251
01-10-13
50
0
100
MP1482DS-C165
1251
01-10-13
50
0
100
MP1482DS-C165
1251
01-10-13
50
0
100
MP1410ES-C019
1251
01-10-13
50
0
100
MP2305DS
1250
01-14-13
50
0
100
MP1482DS-C165
1250
01-11-13
50
0
100
CM3406DS
1252
01-14-13
50
0
100
MP1484EN
1251
01-14-13
50
0
100
MP1482DN
1250
01-14-13
50
0
100
MP2488DN
1251
01-14-13
50
0
100
FA NO.
# of
cycle
MP9141ES
1251
01-15-13
50
0
100
MP8670DN
1251
01-15-13
50
0
100
MP1484EN
1251
01-15-13
50
0
100
MP2307DN
1252
01-15-13
50
0
100
MP2483DS
1226
02-07-13
50
0
100
MP2560DN-C413
1301
01-18-13
50
0
100
MP8709EN
1251
01-18-13
50
0
100
MP28313CS-C113
1251
01-18-13
50
0
100
MP8706EN
1246
01-18-13
50
0
100
MP8706EN-C247
1246
01-18-13
50
0
100
MP1482DS-C165
1250
01-18-13
50
0
100
MP3394ES
1250
01-22-13
50
0
100
MP1482DS-C165
1252
01-22-13
50
0
100
MP2207DN
1302
01-22-13
50
0
100
MP2307DN
1252
01-22-13
50
0
100
The Future of Analog IC Technology®
- 18 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2307DN
1301
01-22-13
50
0
100
MP1484EN
1251
02-08-13
50
0
100
FA NO.
# of
cycle
MP2372DN
1302
01-25-13
50
0
100
MP2301ENE
1302
01-25-13
50
0
100
MP1484EN-C166
1252
01-25-13
50
0
100
MP1484EN-C166
1250
01-25-13
50
0
100
MP44010HS
1302
01-29-13
50
0
100
MP1484EN-C166
1251
01-29-13
50
0
100
CM3406DS
1301
01-29-13
50
0
100
MP62061DN
1302
01-30-13
50
0
100
MP1593DN-C218
1224
01-30-13
50
0
100
MP1482DS-C165
1303
01-30-13
50
0
100
MP2467DN-C478
1303
01-29-13
50
0
100
MP1583DN
1302
01-31-13
50
0
100
MP1482DN
1302
01-31-13
50
0
100
MP62061DN
1303
01-31-13
50
0
100
MP2305DS
1301
02-04-13
50
0
100
MP2307DN
1302
01-31-13
50
0
100
MP1482DS-C165
1302
01-31-13
50
0
100
MP24830HS-C470L
1236
01-31-13
50
0
100
MP38894DN
1303
01-31-13
50
0
100
MP2488DN
1302
02-04-13
50
0
100
MP4560DN
1303
02-04-13
50
0
100
MP6212DN
1302
02-01-13
50
0
100
MP6231DN
1302
02-04-13
50
0
100
MP2307DN
1302
02-04-13
50
0
100
MP6205DN
1303
02-04-13
50
0
100
MP1482DN
1302
02-04-13
50
0
100
MP2307DN
1303
02-06-13
50
0
100
MP4051GS
1302
02-06-13
50
0
100
MP3394ES
1250
02-06-13
50
0
100
MP38892DN
1302
02-06-13
50
0
100
MP9141ES
1303
02-06-13
50
0
100
MP2480DN
1303
02-06-13
50
0
100
HF81GS
1303
02-06-13
50
0
100
MP4021GS-A
1303
02-06-13
50
0
100
MP4021GS-A
1303
02-07-13
50
0
100
MP1587EN
1304
02-07-13
50
0
100
MP2307DN
1304
02-07-13
50
0
100
MP6001DN
1303
02-07-13
50
0
100
MP8001DS
1251
02-07-13
50
0
100
MP2303ADN-C258
1303
02-07-13
50
0
100
The Future of Analog IC Technology®
- 19 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP4021GS
1303
02-27-13
50
0
100
MP8705EN
1302
02-27-13
50
0
100
FA NO.
# of
cycle
MP200DS
1305
02-27-13
50
0
100
MP3394ES
1251
02-27-13
50
0
100
MP8705EN
1303
02-27-13
50
0
100
MP1484EN-C166
1304
02-27-13
50
0
100
MP1484EN-C166
1304
02-27-13
50
0
100
MP1484EN-C166
1304
02-27-13
50
0
100
MP8706EN
1303
02-27-13
50
0
100
MP2307DN
1303
02-27-13
50
0
100
MP1582EN
1306
03-13-13
50
0
100
MP2303ADN
1304
03-01-13
50
0
100
MP6001DN
1305
03-06-13
50
0
100
MP2358DS
1251
03-06-13
50
0
100
MP1583DN
1305
03-04-13
50
0
100
MP1482DN
1251
03-06-13
50
0
100
MP9141ES
1304
03-01-13
50
0
100
MP2303ADN
1304
03-01-13
50
0
100
MP1584ES
1305
03-06-13
50
0
100
MP8706EN
1305
03-01-13
50
0
100
MP1484EN-C321
1304
03-01-13
50
0
100
MP1484EN-C321
1304
03-01-13
50
0
100
MP20051DN
1304
03-06-13
50
0
100
MP1484EN
1305
03-01-13
50
0
100
MP1484EN
1305
03-06-13
50
0
100
MP3394ES-C462
1305
03-06-13
50
0
100
MP201DS
1305
03-06-13
50
0
100
MP1482DN
1305
03-13-13
50
0
100
MP8708EN
1304
03-13-13
50
0
100
MP1584EN-C461
1306
03-13-13
50
0
100
MP3394SGS
1304
03-13-13
50
0
100
MP1482DS-C165
1252
03-13-13
50
0
100
MP1482DS-C165
1304
03-13-13
50
0
100
MP1482DN
1308
03-13-13
50
0
100
MP8705EN
1304
03-07-13
50
0
100
MP1430DN
1305
03-13-13
50
0
100
MP8705EN
1309
03-07-13
50
0
100
MP1584EN
1308
03-13-13
50
0
100
MP28313DS
1210
03-07-13
50
0
100
MP1482DN
1306
03-13-13
50
0
100
MP1482DN
1308
03-13-13
50
0
100
MP8708EN-C353
1306
03-13-13
50
0
100
The Future of Analog IC Technology®
- 20 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1484EN
1305
03-07-13
50
0
100
MP1482DN
1308
03-13-13
50
0
100
FA NO.
# of
cycle
MP1482DN
1308
03-07-13
50
0
100
MP2303ADN
1308
03-13-13
50
0
100
MP28313CS-C113
1309
03-13-13
50
0
100
MP1482DS-C165
1305
03-13-13
50
0
100
MP1484EN
1305
03-13-13
50
0
100
MP1482DN
1308
03-13-13
50
0
100
MP4034GS
1306
03-20-13
50
0
100
MP2372DN
1308
03-13-13
50
0
100
MP3394ES
1305
03-28-13
50
0
100
MP8705EN
1309
03-20-13
50
0
100
MP8706EN
1308
03-20-13
50
0
100
MP8709EN
1309
03-20-13
50
0
100
MP20045DN-C442
1250
03-22-13
50
0
100
MP1906DS
1308
03-20-13
50
0
100
MP6901DS
1249
03-20-13
50
0
100
MP2307DN
1303
03-28-13
50
0
100
MP1482DS-C165
1304
03-20-13
50
0
100
MP1482DN
1308
03-20-13
50
0
100
MP1484EN
1305
03-20-13
50
0
100
MP4462DN
1306
03-20-13
50
0
100
MP20045DN
1304
03-22-13
50
0
100
MP4462DN
1308
03-25-13
50
0
100
MP1484EN
1251
03-20-13
50
0
100
MP1482DN
1308
03-20-13
50
0
100
MP1484EN
1306
03-22-13
50
0
100
MP8705EN
1306
03-22-13
50
0
100
MP1587EN
1310
03-22-13
50
0
100
MP3394ES-C462
1307
03-25-13
50
0
100
MP1482DN
1309
03-28-13
50
0
100
MP1482DN
1309
03-28-13
50
0
100
MP9141ES
1308
03-25-13
50
0
100
MP1484EN-C166
1302
03-22-13
50
0
100
MP1484EN-C166
1302
03-28-13
50
0
100
MP1431DS-C106
1307
03-28-13
50
0
100
MP1484EN
1308
03-28-13
50
0
100
MP1584EN-C461
1310
03-28-13
50
0
100
MP1482DS-C165
1305
03-28-13
50
0
100
MP9141ES
1310
03-28-13
50
0
100
MP1484EN-C321
1311
03-28-13
50
0
100
MP1482DN
1309
03-28-13
50
0
100
The Future of Analog IC Technology®
- 21 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DN
1309
03-28-13
50
0
Total
FA NO.
# of
cycle
100
0
4.2.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP20045DN
1225
02-06-13
47
0
168
MP20045DN
1214
02-06-13
47
0
168
MP2303DN
1232
02-06-13
47
0
168
FA NO.
# of hrs
MP2303DN
1234
02-06-13
47
0
168
MP3398GS
1238
01-25-13
89
0
168
MP4700GS
1247
02-06-13
87
0
168
MP4700GS
1246
02-06-13
87
0
168
MP6922AGN
1217
03-20-13
90
0
168
MP6922AGN
1227
03-20-13
90
0
168
MP6922AGN
1229
03-20-13
90
0
168
MP6920DN
1242
03-20-13
96
0
168
MP1484EN
1250
01-09-13
50
0
48
MP8718EN
1250
01-10-13
50
0
48
MP6001DN
1251
01-10-13
50
0
48
MP6205DN
1250
01-10-13
50
0
48
MP2307DN
1250
01-10-13
50
0
48
MP2482DN
1251
01-10-13
50
0
48
MP2482DN
1251
01-10-13
50
0
48
MP1482DS-C165
1251
01-10-13
50
0
48
MP1482DS-C165
1251
01-10-13
50
0
48
MP1482DS-C165
1251
01-10-13
50
0
48
MP1410ES-C019
1251
01-10-13
50
0
48
MP2305DS
1250
01-14-13
50
0
48
MP1482DS-C165
1250
01-11-13
50
0
48
CM3406DS
1252
01-14-13
50
0
48
MP1484EN
1251
01-14-13
50
0
48
MP1482DN
1250
01-14-13
50
0
48
MP2488DN
1251
01-14-13
50
0
48
MP9141ES
1251
01-15-13
50
0
48
MP8670DN
1251
01-15-13
50
0
48
MP1484EN
1251
01-15-13
50
0
48
MP2307DN
1252
01-15-13
50
0
48
MP2483DS
1226
02-07-13
50
0
48
The Future of Analog IC Technology®
- 22 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2560DN-C413
1301
01-18-13
50
0
48
MP8709EN
1251
01-18-13
50
0
48
MP28313CS-C113
1251
01-18-13
50
0
48
MP8706EN
1246
01-18-13
50
0
48
MP8706EN-C247
1246
01-18-13
50
0
48
MP1482DS-C165
1250
01-18-13
50
0
48
MP3394ES
1250
01-22-13
50
0
48
MP1482DS-C165
1252
01-22-13
50
0
48
MP2207DN
1302
01-22-13
50
0
48
MP2307DN
1252
01-22-13
50
0
48
MP2307DN
1301
01-22-13
50
0
48
FA NO.
# of hrs
MP1484EN
1251
02-08-13
50
0
48
MP2372DN
1302
01-25-13
50
0
48
MP2301ENE
1302
01-25-13
50
0
48
MP1484EN-C166
1252
01-25-13
50
0
48
MP1484EN-C166
1250
01-25-13
50
0
48
MP44010HS
1302
01-29-13
50
0
48
MP1484EN-C166
1251
01-29-13
50
0
48
CM3406DS
1301
01-29-13
50
0
48
MP62061DN
1302
01-30-13
50
0
48
MP1593DN-C218
1224
01-30-13
50
0
48
MP1482DS-C165
1303
01-30-13
50
0
48
MP2467DN-C478
1303
01-29-13
50
0
48
MP1583DN
1302
01-31-13
50
0
48
MP1482DN
1302
01-31-13
50
0
48
MP62061DN
1303
01-31-13
50
0
48
MP2305DS
1301
02-04-13
50
0
48
MP2307DN
1302
01-31-13
50
0
48
MP1482DS-C165
1302
01-31-13
50
0
48
MP24830HS-C470L
1236
01-31-13
50
0
48
MP38894DN
1303
01-31-13
50
0
48
MP2488DN
1302
02-04-13
50
0
48
MP4560DN
1303
02-04-13
50
0
48
MP6212DN
1302
02-01-13
50
0
48
MP6231DN
1302
02-04-13
50
0
48
MP2307DN
1302
02-04-13
50
0
48
MP6205DN
1303
02-04-13
50
0
48
MP1482DN
1302
02-04-13
50
0
48
MP2307DN
1303
02-06-13
50
0
48
MP4051GS
1302
02-06-13
50
0
48
MP3394ES
1250
02-06-13
50
0
48
MP38892DN
1302
02-06-13
50
0
48
The Future of Analog IC Technology®
- 23 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP9141ES
1303
02-06-13
50
0
48
MP2480DN
1303
02-06-13
50
0
48
FA NO.
# of hrs
HF81GS
1303
02-06-13
50
0
48
MP4021GS-A
1303
02-06-13
50
0
48
MP4021GS-A
1303
02-07-13
50
0
48
MP1587EN
1304
02-07-13
50
0
48
MP2307DN
1304
02-07-13
50
0
48
MP6001DN
1303
02-07-13
50
0
48
MP8001DS
1251
02-07-13
50
0
48
MP2303ADN-C258
1303
02-07-13
50
0
48
MP4021GS
1303
02-27-13
50
0
48
MP8705EN
1302
02-27-13
50
0
48
MP200DS
1305
02-27-13
50
0
48
MP3394ES
1251
02-27-13
50
0
48
MP8705EN
1303
02-27-13
50
0
48
MP1484EN-C166
1304
02-27-13
50
0
48
MP1484EN-C166
1304
02-27-13
50
0
48
MP1484EN-C166
1304
02-27-13
50
0
48
MP8706EN
1303
02-27-13
50
0
48
MP2307DN
1303
02-27-13
50
0
48
MP1582EN
1306
03-13-13
50
0
48
MP2303ADN
1304
03-01-13
50
0
48
MP6001DN
1305
03-06-13
50
0
48
MP2358DS
1251
03-06-13
50
0
48
MP1583DN
1305
03-04-13
50
0
48
MP1482DN
1251
03-06-13
50
0
48
MP9141ES
1304
03-01-13
50
0
48
MP2303ADN
1304
03-01-13
50
0
48
MP1584ES
1305
03-06-13
50
0
48
MP8706EN
1305
03-01-13
50
0
48
MP1484EN-C321
1304
03-01-13
50
0
48
MP1484EN-C321
1304
03-01-13
50
0
48
MP20051DN
1304
03-06-13
50
0
48
MP1484EN
1305
03-01-13
50
0
48
MP1484EN
1305
03-06-13
50
0
48
MP3394ES-C462
1305
03-06-13
50
0
48
MP201DS
1305
03-06-13
50
0
48
MP1482DN
1305
03-13-13
50
0
48
MP8708EN
1304
03-13-13
50
0
48
MP1584EN-C461
1306
03-13-13
50
0
48
MP3394SGS
1304
03-13-13
50
0
48
MP1482DS-C165
1252
03-13-13
50
0
48
The Future of Analog IC Technology®
- 24 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS-C165
1304
03-13-13
50
0
48
MP1482DN
1308
03-13-13
50
0
48
FA NO.
# of hrs
MP8705EN
1304
03-07-13
50
0
48
MP1430DN
1305
03-13-13
50
0
48
MP8705EN
1309
03-07-13
50
0
48
MP1584EN
1308
03-13-13
50
0
48
MP28313DS
1210
03-07-13
50
0
48
MP1482DN
1306
03-13-13
50
0
48
MP1482DN
1308
03-13-13
50
0
48
MP8708EN-C353
1306
03-13-13
50
0
48
MP1484EN
1305
03-07-13
50
0
48
MP1482DN
1308
03-13-13
50
0
48
MP1482DN
1308
03-07-13
50
0
48
MP2303ADN
1308
03-13-13
50
0
48
MP28313CS-C113
1309
03-13-13
50
0
48
MP1482DS-C165
1305
03-13-13
50
0
48
MP1484EN
1305
03-13-13
50
0
48
MP1482DN
1308
03-13-13
50
0
48
MP4034GS
1306
03-20-13
50
0
48
MP2372DN
1308
03-13-13
50
0
48
MP3394ES
1305
03-28-13
50
0
48
MP8705EN
1309
03-20-13
50
0
48
MP8706EN
1308
03-20-13
50
0
48
MP8709EN
1309
03-20-13
50
0
48
MP20045DN-C442
1250
03-22-13
50
0
48
MP1906DS
1308
03-20-13
50
0
48
MP6901DS
1249
03-20-13
50
0
48
MP2307DN
1303
03-28-13
50
0
48
MP1482DS-C165
1304
03-20-13
50
0
48
MP1482DN
1308
03-20-13
50
0
48
MP1484EN
1305
03-20-13
50
0
48
MP4462DN
1306
03-20-13
50
0
48
MP20045DN
1304
03-22-13
50
0
48
MP4462DN
1308
03-25-13
50
0
48
MP1484EN
1251
03-20-13
50
0
48
MP1482DN
1308
03-20-13
50
0
48
MP1484EN
1306
03-22-13
50
0
48
MP8705EN
1306
03-22-13
50
0
48
MP1587EN
1310
03-22-13
50
0
48
MP3394ES-C462
1307
03-25-13
50
0
48
MP1482DN
1309
03-28-13
50
0
48
MP1482DN
1309
03-28-13
50
0
48
The Future of Analog IC Technology®
- 25 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP9141ES
1308
03-25-13
50
0
48
MP1484EN-C166
1302
03-22-13
50
0
48
MP1484EN-C166
1302
03-28-13
50
0
48
MP1431DS-C106
1307
03-28-13
50
0
48
MP1484EN
1308
03-28-13
50
0
48
FA NO.
# of hrs
MP1584EN-C461
1310
03-28-13
50
0
48
MP1482DS-C165
1305
03-28-13
50
0
48
MP9141ES
1310
03-28-13
50
0
48
MP1484EN-C321
1311
03-28-13
50
0
48
MP1482DN
1309
03-28-13
50
0
48
MP1482DN
1309
03-28-13
50
0
48
Total
0
4.3 MSOP
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
MSOP8
ANST
MSOP8-EP
UCD
MSOP10-EP
ANST
MSOP10
UCD
MSOP10
ANST
MSOP10-EP
ANST
MSOP8
4.3.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3900DK
1245
01-18-13
168
0
Total
FA NO.
0
MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1412DH
1231
01-08-13
260
0
MP1412DH
1233
01-08-13
260
0
MP1412DH
1234
01-08-13
260
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 26 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
SAT picture of MSOP
T-SCAN PICTURE
C-SCAN PICTURE
4.3.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1412DH
1231
01-08-13
84
0
1000
MP1412DH
1233
01-08-13
80
0
1000
MP1412DH
1234
01-08-13
84
0
1000
MP3900DK
1245
01-18-13
84
0
1000
MP1528DK
1251
01-08-13
50
0
100
MP1412DH
1250
01-09-13
50
0
100
MP2106DK
1250
01-10-13
50
0
100
MP1412DH
1250
01-10-13
50
0
100
MP2481DH
1249
01-10-13
50
0
100
MP6211DH
1250
01-14-13
50
0
100
MP2007DH
1250
01-14-13
50
0
100
FA NO.
# of
cycle
MP2905EK
1239
01-18-13
50
0
100
MP1542DK-C472
1301
01-25-13
50
0
100
MP1412DH
1250
01-29-13
50
0
100
MP6232DH
1302
01-29-13
50
0
100
MP3213DH
1302
01-29-13
50
0
100
MP2106DK
1302
01-30-13
50
0
100
MP1412DH
1303
02-04-13
50
0
100
MP1412DH
1303
02-20-13
50
0
100
MP8110DK
1303
02-07-13
50
0
100
MP1412DH
1304
02-27-13
50
0
100
MP1412DH
1305
03-01-13
50
0
100
MP1412DH
1302
03-01-13
50
0
100
MP1411DH
1219
03-06-13
50
0
100
The Future of Analog IC Technology®
- 27 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1411DH
1219
03-07-13
50
0
100
MP6231DH
1306
03-01-13
50
0
100
MP1411DH
1219
03-13-13
50
0
100
MP2905EK-C402
1251
03-07-13
50
0
100
MP1411DH
1219
03-13-13
50
0
100
MP2361DK
1223
03-13-13
50
0
100
MP1542DK
1305
03-13-13
50
0
100
MP1411DH
1219
03-20-13
50
0
100
MP1542DK
1304
03-20-13
50
0
100
MP1411DH
1308
03-20-13
50
0
100
MP1411DH
1308
03-22-13
50
0
100
MP6211DH
1306
03-20-13
50
0
100
MP1542DK
1305
03-22-13
50
0
100
MP1567DK
1309
03-22-13
50
0
100
MP1412DH
1310
03-22-13
50
0
100
MP1412DH
1310
03-22-13
50
0
100
MP1412DH
1310
03-22-13
50
0
100
MP1412DH
1310
03-22-13
50
0
100
MP2106DK
1309
03-28-13
50
0
100
MP6215DH
1310
03-28-13
50
0
100
Total
FA NO.
# of
cycle
0
4.3.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1412DH
1231
01-08-13
90
0
168
MP1412DH
1233
01-08-13
90
0
168
MP1412DH
1234
01-08-13
87
0
168
MP3900DK
1245
01-18-13
87
0
168
FA NO.
# of hrs
MP1528DK
1251
01-08-13
50
0
48
MP1412DH
1250
01-09-13
50
0
48
MP2106DK
1250
01-10-13
50
0
48
MP1412DH
1250
01-10-13
50
0
48
MP2481DH
1249
01-10-13
50
0
48
MP6211DH
1250
01-14-13
50
0
48
MP2007DH
1250
01-14-13
50
0
48
MP2905EK
1239
01-18-13
50
0
48
MP1542DK-C472
1301
01-25-13
50
0
48
MP1412DH
1250
01-29-13
50
0
48
The Future of Analog IC Technology®
- 28 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6232DH
1302
01-29-13
50
0
48
MP3213DH
1302
01-29-13
50
0
48
MP2106DK
1302
01-30-13
50
0
48
MP1412DH
1303
02-04-13
50
0
48
MP1412DH
1303
02-20-13
50
0
48
FA NO.
# of hrs
MP8110DK
1303
02-07-13
50
0
48
MP1412DH
1304
02-27-13
50
0
48
MP1412DH
1305
03-01-13
50
0
48
MP1412DH
1302
03-01-13
50
0
48
MP1411DH
1219
03-06-13
50
0
48
MP1411DH
1219
03-07-13
50
0
48
MP6231DH
1306
03-01-13
50
0
48
MP1411DH
1219
03-13-13
50
0
48
MP2905EK-C402
1251
03-07-13
50
0
48
MP1411DH
1219
03-13-13
50
0
48
MP2361DK
1223
03-13-13
50
0
48
MP1542DK
1305
03-13-13
50
0
48
MP1411DH
1219
03-20-13
50
0
48
MP1542DK
1304
03-20-13
50
0
48
MP1411DH
1308
03-20-13
50
0
48
MP1411DH
1308
03-22-13
50
0
48
MP6211DH
1306
03-20-13
50
0
48
MP1542DK
1305
03-22-13
50
0
48
MP1567DK
1309
03-22-13
50
0
48
MP1412DH
1310
03-22-13
50
0
48
MP1412DH
1310
03-22-13
50
0
48
MP1412DH
1310
03-22-13
50
0
48
MP1412DH
1310
03-22-13
50
0
48
MP2106DK
1309
03-28-13
50
0
48
MP6215DH
1310
03-28-13
50
0
48
Total
0
4.3.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1412DH
1231
01-08-13
80
0
MP1412DH
1233
01-08-13
80
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 29 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
4.4 TSOT
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
ANST
TSOT23-5
JCET
TSOT23-5
ASNT
TSOT23-6
JCET
TSOT23-6
ASNT
TSOT23-8
JCET
TSOT23-8
4.4.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ9361DJ
1247
02-07-13
100
0
MPQ9361DJ
1252
02-06-13
100
0
MPQ9361DJ
1252
02-27-13
100
0
Total
FA NO.
0
SAT picture of TSOT
T-SCAN PICTURE
C-SCAN PICTURE
4.4.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3302DJ
1248
02-04-13
50
0
100
MP3410DJ
1248
01-09-13
50
0
100
MP1540DJ
1249
01-09-13
50
0
100
MP2359DJ
1248
01-08-13
50
0
100
MP1541DJ
1249
01-11-13
50
0
100
MP2105DJ
1246
01-10-13
50
0
100
MP3216DJ
1247
01-10-13
50
0
100
FA NO.
# of
cycle
The Future of Analog IC Technology®
- 30 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6400DJ-01
1249
01-11-13
50
0
MPQ9361DJ
1247
02-07-13
50
0
100
MP2359DJ
1252
01-18-13
50
0
100
MP1469GJ
1301
01-18-13
50
0
100
MP2016DJ
1233
01-25-13
50
0
100
MP2359DJ
1252
01-25-13
50
0
100
MP9361DJ
1252
01-25-13
50
0
100
MP3217DJ
1250
01-29-13
50
0
100
MP2104DJ
1252
01-29-13
50
0
100
FA NO.
# of
cycle
100
MP3302DJ
1302
02-04-13
50
0
100
MPQ9361DJ
1252
02-06-13
50
0
100
MP3302DJ
1304
02-07-13
50
0
100
MP3302DJ
1302
02-27-13
50
0
100
MP20048DJ
1302
02-07-13
50
0
100
MP3217DJ
1303
03-06-13
50
0
100
MP6400DJ-01
1304
02-27-13
50
0
100
MP2259DJ
1249
02-27-13
50
0
100
MP2259DJ
1213
02-27-13
50
0
100
MP2370DJ
1303
02-27-13
50
0
100
MPQ9361DJ
1252
02-27-13
50
0
100
MP3217DJ
1304
03-13-13
50
0
100
MP3216DJ
1304
03-13-13
50
0
100
MP65151DJ
1306
03-13-13
50
0
100
MP3302DJ
1304
03-13-13
50
0
100
MP1518DJ
1308
03-13-13
50
0
100
MP6400DJ-01
1306
03-20-13
50
0
100
MP2370DJ
1309
03-25-13
50
0
100
MP3202DJ
1304
03-22-13
50
0
100
MP62551DJ
1310
03-28-13
50
0
100
Total
0
4.4.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3302DJ
1248
02-04-13
50
0
48
MP3410DJ
1248
01-09-13
50
0
48
MP1540DJ
1249
01-09-13
50
0
48
MP2359DJ
1248
01-08-13
50
0
48
MP1541DJ
1249
01-11-13
50
0
48
MP2105DJ
1246
01-10-13
50
0
48
MP3216DJ
1247
01-10-13
50
0
48
FA NO.
# of hrs
The Future of Analog IC Technology®
- 31 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6400DJ-01
1249
01-11-13
50
0
48
MPQ9361DJ
1247
02-07-13
50
0
48
MP2359DJ
1252
01-18-13
50
0
48
MP1469GJ
1301
01-18-13
50
0
48
MP2016DJ
1233
01-25-13
50
0
48
MP2359DJ
1252
01-25-13
50
0
48
MP9361DJ
1252
01-25-13
50
0
48
MP3217DJ
1250
01-29-13
50
0
48
MP2104DJ
1252
01-29-13
50
0
48
FA NO.
# of hrs
MP3302DJ
1302
02-04-13
50
0
48
MPQ9361DJ
1252
02-06-13
50
0
48
MP3302DJ
1304
02-07-13
50
0
48
MP3302DJ
1302
02-27-13
50
0
48
MP20048DJ
1302
02-07-13
50
0
48
MP3217DJ
1303
03-06-13
50
0
48
MP6400DJ-01
1304
02-27-13
50
0
48
MP2259DJ
1249
02-27-13
50
0
48
MP2259DJ
1213
02-27-13
50
0
48
MP2370DJ
1303
02-27-13
50
0
48
MPQ9361DJ
1252
02-27-13
50
0
48
MP3217DJ
1304
03-13-13
50
0
48
MP3216DJ
1304
03-13-13
50
0
48
MP65151DJ
1306
03-13-13
50
0
48
MP3302DJ
1304
03-13-13
50
0
48
MP1518DJ
1308
03-13-13
50
0
48
MP6400DJ-01
1306
03-20-13
50
0
48
MP2370DJ
1309
03-25-13
50
0
48
MP3202DJ
1304
03-22-13
50
0
48
MP62551DJ
1310
03-28-13
50
0
48
Total
0
4.5 TSSOP
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
TSSOP20
ASNT
TSSOP16-EP
UCD
TSSOP20-EP
ASNT
TSSOP20
ASNT
TSSOP8
ASNT
TSSOP20-EP
ASNT
TSSOP14
ASNT
TSSOP24
ASNT
TSSOP16
ASNT
TSSOP28
ASNT
TSSOP28-EP
JCET
TSSOP8
The Future of Analog IC Technology®
- 32 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
4.5.1 Preconditioning
MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP7748SGF
1244
01-11-13
270
0
MPQ2908GF
1237
03-04-13
90
0
MP7748SGF
1236
03-04-13
160
0
MP7748SGF
1247
02-26-13
359
0
MP3397EF
1236
03-04-13
160
0
MP8125EF
1245
03-21-13
360
0
Total
FA NO.
0
SAT picture of TSSOP
T-SCAN PICTURE
C-SCAN PICTURE
4.5.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP7748SGF
1244
01-11-13
84
0
1000
MP7748SGF
1236
03-04-13
80
0
1000
MP7748SGF
1247
02-26-13
82
0
1000
MP3397EF
1236
03-04-13
80
0
1000
MP8125EF
1245
03-21-13
84
0
1000
MP8125EF
1248
01-08-13
50
0
100
MP3389EF
1242
01-10-13
50
0
100
MP3389EF
1247
01-10-13
50
0
100
MP3389EF
1247
01-10-13
50
0
100
MP1060EF
1250
01-18-13
50
0
100
MP3389EF
1250
01-18-13
50
0
100
FA NO.
# of
cycle
The Future of Analog IC Technology®
- 33 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3389EF
1250
01-18-13
50
0
100
MP3389EF
1252
01-18-13
50
0
100
MP8125EF
1249
01-30-13
50
0
100
FA NO.
# of
cycle
MP3389EF
1302
01-31-13
50
0
100
MP1530DM
1251
02-04-13
50
0
100
MP3389EF
1302
02-07-13
50
0
100
MPQ7731DF
1248
02-27-13
50
0
100
MP1026EF
1247
02-27-13
50
0
100
MP3389EF
1304
02-27-13
50
0
100
MP2364DF
1305
03-07-13
50
0
100
MP8126DF
1251
03-06-13
50
0
100
MP3389EF
1304
03-01-13
50
0
100
MP3389EF
1304
03-01-13
50
0
100
MP3389EF
1305
03-13-13
50
0
100
MPQ7731DF
1308
03-20-13
50
0
100
MP3389EF
1242
03-20-13
50
0
100
MP3389EF
1305
03-20-13
50
0
100
MP3399EF
1308
03-20-13
50
0
100
Total
0
4.5.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP7748SGF
1244
01-11-13
87
0
168
MPQ2908GF
1237
03-04-13
87
0
168
MP7748SGF
1236
03-04-13
80
0
168
MP7748SGF
1247
02-26-13
87
0
168
MP3397EF
1236
03-04-13
80
0
168
MP8125EF
1245
03-21-13
87
0
168
MP8125EF
1248
01-08-13
50
0
48
MP3389EF
1242
01-10-13
50
0
48
MP3389EF
1247
01-10-13
50
0
48
MP3389EF
1247
01-10-13
50
0
48
MP1060EF
1250
01-18-13
50
0
48
MP3389EF
1250
01-18-13
50
0
48
MP3389EF
1250
01-18-13
50
0
48
MP3389EF
1252
01-18-13
50
0
48
MP8125EF
1249
01-30-13
50
0
48
MP3389EF
1302
01-31-13
50
0
48
FA NO.
# of hrs
The Future of Analog IC Technology®
- 34 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1530DM
1251
02-04-13
50
0
48
MP3389EF
1302
02-07-13
50
0
48
MPQ7731DF
1248
02-27-13
50
0
48
MP1026EF
1247
02-27-13
50
0
48
FA NO.
# of hrs
MP3389EF
1304
02-27-13
50
0
48
MP2364DF
1305
03-07-13
50
0
48
MP8126DF
1251
03-06-13
50
0
48
MP3389EF
1304
03-01-13
50
0
48
MP3389EF
1304
03-01-13
50
0
48
MP3389EF
1305
03-13-13
50
0
48
MPQ7731DF
1308
03-20-13
50
0
48
MP3389EF
1242
03-20-13
50
0
48
MP3389EF
1305
03-20-13
50
0
48
MP3399EF
1308
03-20-13
50
0
48
Total
0
4.3.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8125EF
1245
03-21-13
81
0
Total
FA NO.
0
4.6 FLIP CHIP-QFN
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
FCQFN1*1.5
UTAC
FCQFN2*2
UCD
FCQFN1.5*2
UTAC
FCQFN2*3
UCD
FCQFN2*2
UTAC
FCQFN3*3
UCD
FCQFN2*3
UTAC
FCQFN3*4
UCD
FCQFN3*3
UTAC
FCQFN4*4
UCD
FCQFN3*4
UTAC
FCQFN4*5
UCD
FCQFN3*5
UTAC
FCQFN4*6
UCD
FCQFN4*4
UTAC
FCQFN5*5
UCD
FCQFN4*5
UTAC
FCQFN5*6
UCD
FCQFN4*6
UTAC
FCQFN6*6
The Future of Analog IC Technology®
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MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
4.6.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP5021GQV
1202
01-03-13
80
0
MP5021GQV
1242
01-03-13
204
0
MP5505GL
1241
01-02-13
90
0
MP5505GL
1246
01-25-13
180
0
NB669GQ
1233
01-22-13
260
0
NB669GQ
1233
01-22-13
96
0
NB670GQ
1223
02-06-13
91
0
MP2617GL
1243
01-18-13
180
0
MPM3810GQB
1244
02-06-13
270
0
MPM3810GQB
1248
02-06-13
280
0
MPM3810GQB
1249
02-06-13
90
0
MP2615GQ
1232
01-03-13
280
1
NB670LGQ
1238
01-18-13
180
0
NB669GQ
1238
01-18-13
180
0
MP2130DG
1244
01-25-13
270
0
NB675GL
1241
02-27-13
180
0
MP86963DUT
1249
03-01-13
200
0
MP86963DUT
1250
03-01-13
200
0
MP86963DUT
1250
03-01-13
200
0
MP9186GQ
1250
02-27-13
180
0
MP1499GD
1303
03-06-13
183
0
MP5505GL
1241
03-20-13
310
1
MP8736DL
1234
03-20-13
100
0
MP8736DL
1234
03-20-13
300
0
MP8736DL
1234
03-20-13
100
0
MP8736DL
1234
03-20-13
100
0
Total
FA NO.
6225
6508
2
The Future of Analog IC Technology®
- 36 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
SAT picture of FLIP CHIP-QFN
T-SCAN PICTURE
C-SCAN PICTURE
4.6.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1245
01-09-13
94
0
1000
MP8736DL
1245
01-09-13
94
0
1000
FA NO.
# of
cycle
MP8736DL
1245
01-09-13
94
0
1000
MP28258DD
1249
02-06-13
500
0
1000
MP28258DD
1249
02-06-13
500
0
1000
MP5021GQV
1242
01-03-13
90
0
1000
NB669GQ
1233
01-22-13
84
0
1000
MPM3810GQB
1244
02-06-13
84
0
1000
MPM3810GQB
1248
02-06-13
84
0
1000
MP2615GQ
1232
01-03-13
90
0
1000
NB670LGQ
1238
01-18-13
81
0
1000
NB669GQ
1238
01-18-13
84
0
1000
MP2130DG
1244
01-25-13
87
0
1000
MP8736DL
1248
01-23-13
94
0
1000
NB675GL
1241
02-27-13
84
0
1000
MP86963DUT
1249
03-01-13
94
0
1000
MP86963DUT
1250
03-01-13
94
0
1000
MP86963DUT
1250
03-01-13
94
0
1000
MP9186GQ
1250
02-27-13
80
0
1000
MP5505GL
1241
03-20-13
84
0
1000
MP8736DL
1234
03-20-13
90
0
1000
MP8736DL
1234
03-20-13
90
0
1000
The Future of Analog IC Technology®
- 37 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1234
03-20-13
90
0
1000
MP8736DL
1234
03-20-13
90
0
1000
MP8736DL
1242
01-08-13
100
0
100
MP8736DL
1248
01-08-13
100
0
100
MP8736DL
1245
01-08-13
100
0
100
MP8736DL
1250
01-08-13
100
0
100
MP8736DL
1249
01-08-13
100
0
100
FA NO.
# of
cycle
MP2334DD
1251
01-08-13
50
0
100
MP28258DD
1250
01-08-13
100
0
100
MP28258DD
1251
01-08-13
100
0
100
MP28258DD-C471
1250
01-08-13
100
0
100
MP28258DD
1249
01-10-13
100
0
100
MP1499GD
1252
01-10-13
50
0
100
MP8736DL
1244
01-11-13
100
0
100
MP8736DL
1250
01-14-13
100
0
100
MP8736DL
1251
01-11-13
100
0
100
MP8736DL
1250
01-14-13
100
0
100
MP8736DL
1250
01-10-13
100
0
100
MP8606DL
1251
01-11-13
50
0
100
MP9180DG
1251
01-14-13
50
0
100
MP8761GL
1251
02-18-13
50
0
100
MP28258DD
1251
01-14-13
100
0
100
MP8736DL
1251
01-11-13
100
0
100
MP8736DL
1251
01-14-13
100
0
100
MP8736DL
1252
02-07-13
100
0
100
MP8736DL
1249
01-14-13
100
0
100
MP28251GD
1244
01-18-13
50
0
100
MP28258DD-A
1247
01-15-13
100
0
100
MP8736DL
1252
01-18-13
100
0
100
MP8736DL
1251
01-15-13
100
0
100
MP28251GD
1251
01-14-13
50
0
100
MP28251GD
1301
01-18-13
50
0
100
MP8736DL
1251
01-18-13
100
0
100
MP8736DL
1248
01-18-13
100
0
100
MP8736DL
1250
01-18-13
100
0
100
MP8736DL
1251
01-18-13
100
0
100
MP8736DL
1248
01-22-13
100
0
100
MP8736DL
1251
01-18-13
100
0
100
MP8736DL
1251
01-18-13
100
0
100
MP8736DL
1252
01-18-13
100
0
100
MP8736DL
1252
01-18-13
100
0
100
MP28258DD
1252
01-18-13
100
0
100
The Future of Analog IC Technology®
- 38 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1251
01-18-13
100
0
100
MP8736DL
1301
01-18-13
100
0
100
MP8736DL
1252
02-07-13
100
0
100
MP8736DL
1252
01-22-13
100
0
100
MP2130DG
1252
01-22-13
50
0
100
MP2130DG
1251
01-23-13
50
0
100
MP28258DD
1251
01-22-13
100
0
100
MP8736DL
1252
01-22-13
100
0
100
MP8736DL
1248
01-22-13
100
0
100
MP28258DD-C471
1301
01-22-13
100
0
100
MP8736DL
1251
01-22-13
100
0
100
MP8736DL
1252
01-22-13
100
0
100
MP8736DL
1250
01-22-13
100
0
100
MP2130DG
1250
01-22-13
50
0
100
MP28258DD
1252
01-22-13
100
0
100
MP8736DL
1301
01-25-13
100
0
100
MP8736DL
1250
01-25-13
100
0
100
MP8736DL
1301
01-25-13
100
0
100
MP8736DL
1248
01-25-13
100
0
100
MP8736DL
1301
01-25-13
100
0
100
MP28251GD
1301
01-25-13
50
0
100
MP8736DL
1250
01-25-13
100
0
100
MP8736DL
1250
01-25-13
100
0
100
MP8736DL
1250
01-25-13
100
0
100
FA NO.
# of
cycle
MP28258DD-C471
1302
02-06-13
100
0
100
MP28251GD
1301
01-29-13
50
0
100
MP2162GQH
1302
01-30-13
50
0
100
MP8736DL
1301
01-29-13
100
0
100
MP8736DL
1301
01-29-13
100
0
100
MP8736DL
1250
01-29-13
100
0
100
MP8736DL
1250
01-29-13
100
0
100
MP5505GL
1303
01-30-13
50
0
100
MP2130DG
1303
01-29-13
50
0
100
MP28258DD-C471
1302
02-06-13
100
0
100
MP8620DQK
1250
01-29-13
100
0
100
MP8620DQK
1245
02-19-13
100
0
100
MP8620DQK
1245
01-30-13
100
0
100
MP28258DD-C471
1302
02-06-13
100
0
100
MP8736DL
1301
01-30-13
100
0
100
MP8736DL
1301
01-30-13
100
0
100
MP8736DL
1250
01-30-13
100
0
100
MP8736DL
1250
01-31-13
100
0
100
The Future of Analog IC Technology®
- 39 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1250
01-31-13
100
0
100
NB670GQ
1303
01-31-13
50
0
100
MP28258DD-C471
1302
02-04-13
50
0
100
MP2130DG
1303
02-04-13
50
0
100
MP8736DL
1250
01-31-13
100
0
100
MP8761GL
1302
01-31-13
50
0
100
MP8736DL
1303
02-04-13
100
0
100
MP28251GD
1303
01-31-13
50
0
100
MP8736DL
1303
02-04-13
100
0
100
MP8736DL
1301
01-31-13
100
0
100
MP28258DD
1302
02-04-13
100
0
100
MP8620DQK
1247
02-06-13
100
0
100
MP2334DD
1303
02-04-13
50
0
100
MP28258DD-C471
1302
02-04-13
100
0
100
MP8736DL
1250
02-04-13
50
0
100
FA NO.
# of
cycle
MP8736DL
1250
02-06-13
50
0
100
NB6381DL
1221
02-04-13
50
0
100
MP2130DG
1303
02-06-13
50
0
100
MP28258DD-C471
1302
02-06-13
50
0
100
MP8736DL
1302
02-06-13
50
0
100
MP8736DL
1302
02-07-13
50
0
100
MP8736DL
1304
02-07-13
50
0
100
MP8736DL
1303
02-07-13
50
0
100
MP8736DL
1303
02-21-13
50
0
100
MP8736DL
1303
02-27-13
50
0
100
MP8736DL
1303
02-27-13
50
0
100
MP8736DL
1304
02-27-13
50
0
100
MP8736DL
1303
02-27-13
50
0
100
MP8736DL
1250
02-27-13
50
0
100
MP8736DL
1303
02-27-13
50
0
100
MP8736DL
1303
02-27-13
50
0
100
MP8736DL
1303
02-27-13
50
0
100
MP8736DL
1303
02-27-13
50
0
100
MP8736DL
1303
02-27-13
50
0
100
MP8736DL
1302
02-27-13
50
0
100
MP8736DL
1303
02-27-13
50
0
100
MP8736DL
1303
02-27-13
50
0
100
MP8736DL
1303
02-27-13
50
0
100
MP8736DL
1303
02-27-13
50
0
100
MP28258DD
1302
02-27-13
50
0
100
MP28258DD
1303
02-27-13
50
0
100
MP28258DD
1303
02-27-13
50
0
100
The Future of Analog IC Technology®
- 40 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28258DD-C471
1303
02-22-13
50
0
100
MP28258DD-C471
1303
02-22-13
50
0
100
FA NO.
# of
cycle
MP28258DD-C471
1302
02-27-13
50
0
100
MP8736DL
1302
02-27-13
50
0
100
MP8736DL
1304
02-27-13
50
0
100
MP28258DD-C471
1303
02-27-13
50
0
100
MP28258DD
1305
03-13-13
50
0
100
MP8736DL
1303
03-13-13
50
0
100
MP8736DL
1303
03-13-13
50
0
100
MP8736DL
1302
03-01-13
50
0
100
MP8736DL
1302
03-01-13
50
0
100
MP8736DL
1303
03-01-13
50
0
100
MP8736DL
1302
03-01-13
50
0
100
MP8736DL
1303
03-01-13
50
0
100
MP9152GD
1306
03-01-13
50
0
100
MP28258DD
1303
03-01-13
50
0
100
MP8736DL
1303
03-01-13
50
0
100
MP8736DL
1302
03-06-13
50
0
100
MP8736DL
1303
03-13-13
50
0
100
MP8736DL
1304
03-13-13
50
0
100
MP8736DL
1304
03-06-13
50
0
100
MP28258DD
1302
03-06-13
50
0
100
MP8736DL
1304
03-07-13
50
0
100
MP8736DL
1304
03-07-13
50
0
100
MP8736DL
1304
03-07-13
50
0
100
MP8736DL
1304
03-07-13
50
0
100
MP8736DL
1302
03-07-13
50
0
100
MP8736DL
1301
03-07-13
50
0
100
MP8736DL
1304
03-07-13
50
0
100
MP28258DD-A
1308
03-07-13
50
0
100
MP28258DD
1302
03-07-13
50
0
100
MP8736DL
1304
03-13-13
50
0
100
MP8736DL
1305
03-13-13
50
0
100
MP8736DL
1305
03-13-13
50
0
100
MP8736DL
1304
03-13-13
50
0
100
MP28258DD-C471
1303
03-13-13
50
0
100
MP2130DG
1303
03-19-13
50
0
100
MP8736DL
1305
03-13-13
50
0
100
MP8736DL
1305
03-20-13
50
0
100
MP8736DL
1305
03-20-13
50
0
100
MP8736DL
1305
03-20-13
50
0
100
MP8736DL
1304
03-20-13
50
0
100
The Future of Analog IC Technology®
- 41 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1305
03-20-13
50
0
100
MP8736DL
1303
03-20-13
50
0
100
MP9180DG
1307
03-19-13
50
0
100
MP9180DG
1305
03-19-13
50
0
100
NB6381DL
1222
03-29-13
50
0
100
MP1499GD
1308
03-20-13
50
0
100
MP8736DL
1306
03-20-13
50
0
100
MP8736DL
1306
03-20-13
50
0
100
MP2130DG
1304
03-22-13
50
0
100
MP8736DL
1306
03-22-13
50
0
100
MP8736DL
1306
03-22-13
50
0
100
MP8736DL
1306
03-22-13
50
0
100
MP28258DD-C471
1310
03-22-13
50
0
100
MP8736DL
1306
03-25-13
50
0
100
MP8736DL
1305
03-25-13
50
0
100
MP8736DL
1305
03-25-13
50
0
100
MP2130DG
1304
03-25-13
50
0
100
MP9152GD
1310
03-28-13
50
0
100
FA NO.
# of
cycle
MP28258DD-C471
1310
03-22-13
50
0
100
MP8736DL
1307
03-25-13
50
0
100
MP8736DL
1306
03-25-13
50
0
100
MP8736DL
1305
03-25-13
50
0
100
MP28258DD
1303
03-28-13
50
0
100
MP8736DL
1306
03-28-13
50
0
100
MP8736DL
1309
03-28-13
50
0
100
MP8736DL
1305
03-28-13
50
0
100
MP8736DL
1309
03-28-13
50
0
100
MP8736DL
1307
03-28-13
50
0
100
MP8736DL
1307
03-28-13
50
0
100
MP28258DD
1303
03-28-13
50
0
100
Total
0
4.6.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1245
01-09-13
97
0
168
MP8736DL
1245
01-09-13
97
0
168
MP8736DL
1245
01-09-13
95
0
168
NB669GQ
1233
01-22-13
80
0
168
MPM3810GQB
1244
02-06-13
89
0
168
FA NO.
# of hrs
The Future of Analog IC Technology®
- 42 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPM3810GQB
1248
02-06-13
87
0
168
MPM3810GQB
1249
02-06-13
80
0
168
FA NO.
# of hrs
MP2615GQ
1232
01-03-13
79
0
168
NB670LGQ
1238
01-18-13
90
0
168
NB669GQ
1238
01-18-13
90
0
168
MP2130DG
1244
01-25-13
90
0
168
MP8736DL
1248
01-23-13
97
0
168
NB675GL
1241
02-27-13
90
0
168
MP86963DUT
1249
03-01-13
95
0
168
MP86963DUT
1250
03-01-13
95
0
168
MP86963DUT
1250
03-01-13
95
0
168
MP9186GQ
1250
02-27-13
85
0
168
MP1499GD
1303
03-06-13
87
0
168
MP5505GL
1241
03-20-13
87
0
168
MP8736DL
1234
03-20-13
100
0
168
MP2334DD
1251
01-08-13
50
0
48
MP1499GD
1252
01-10-13
50
0
48
MP8606DL
1251
01-11-13
50
0
48
MP9180DG
1251
01-14-13
50
0
48
MP8761GL
1251
02-18-13
50
0
48
MP28251GD
1244
01-18-13
50
0
48
MP28251GD
1251
01-14-13
50
0
48
MP28251GD
1301
01-18-13
50
0
48
MP2130DG
1252
01-22-13
50
0
48
MP2130DG
1251
01-23-13
50
0
48
MP2130DG
1250
01-22-13
50
0
48
MP5505GL
1246
01-25-13
100
0
48
MP5505GL
1241
01-25-13
100
0
48
MP28251GD
1301
01-25-13
50
0
48
MP28258DD-C471
1302
02-06-13
50
0
48
MP28251GD
1301
01-29-13
50
0
48
MP2162GQH
1302
01-30-13
50
0
48
MP5505GL
1303
01-30-13
50
0
48
MP2130DG
1303
01-29-13
50
0
48
MP28258DD-C471
1302
02-06-13
50
0
48
NB670GQ
1303
01-31-13
50
0
48
MP28258DD-C471
1302
02-04-13
50
0
48
MP2130DG
1303
02-04-13
50
0
48
MP8761GL
1302
01-31-13
50
0
48
MP28251GD
1303
01-31-13
50
0
48
MP2334DD
1303
02-04-13
50
0
48
MP8736DL
1250
02-04-13
50
0
48
The Future of Analog IC Technology®
- 43 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1250
02-06-13
50
0
48
NB6381DL
1221
02-04-13
50
0
48
FA NO.
# of hrs
MP2130DG
1303
02-06-13
50
0
48
MP28258DD-C471
1302
02-06-13
50
0
48
MP8736DL
1302
02-06-13
50
0
48
MP8736DL
1302
02-07-13
50
0
48
MP8736DL
1304
02-07-13
50
0
48
MP8736DL
1303
02-07-13
50
0
48
MP8736DL
1303
02-21-13
50
0
48
MP8736DL
1303
02-27-13
50
0
48
MP8736DL
1303
02-27-13
50
0
48
MP8736DL
1304
02-27-13
50
0
48
MP8736DL
1303
02-27-13
50
0
48
MP8736DL
1250
02-27-13
50
0
48
MP8736DL
1303
02-27-13
50
0
48
MP8736DL
1303
02-27-13
50
0
48
MP8736DL
1303
02-27-13
50
0
48
MP8736DL
1303
02-27-13
50
0
48
MP8736DL
1303
02-27-13
50
0
48
MP8736DL
1302
02-27-13
50
0
48
MP8736DL
1303
02-27-13
50
0
48
MP8736DL
1303
02-27-13
50
0
48
MP8736DL
1303
02-27-13
50
0
48
MP8736DL
1303
02-27-13
50
0
48
MP28258DD
1302
02-27-13
50
0
48
MP28258DD
1303
02-27-13
50
0
48
MP28258DD
1303
02-27-13
50
0
48
MP28258DD-C471
1303
02-22-13
50
0
48
MP28258DD-C471
1303
02-22-13
50
0
48
MP28258DD-C471
1302
02-27-13
50
0
48
MP8736DL
1302
02-27-13
50
0
48
MP8736DL
1304
02-27-13
50
0
48
MP28258DD-C471
1303
02-27-13
50
0
48
MP28258DD
1305
03-13-13
50
0
48
MP8736DL
1303
03-13-13
50
0
48
MP8736DL
1303
03-13-13
50
0
48
MP8736DL
1302
03-01-13
50
0
48
MP8736DL
1302
03-01-13
50
0
48
MP8736DL
1303
03-01-13
50
0
48
MP8736DL
1302
03-01-13
50
0
48
MP8736DL
1303
03-01-13
50
0
48
MP9152GD
1306
03-01-13
50
0
48
The Future of Analog IC Technology®
- 44 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28258DD
1303
03-01-13
50
0
48
MP8736DL
1303
03-01-13
50
0
48
FA NO.
# of hrs
MP8736DL
1302
03-06-13
50
0
48
MP8620DQK
1250
03-06-13
50
0
48
MP8736DL
1303
03-13-13
50
0
48
MP8736DL
1304
03-13-13
50
0
48
MP8736DL
1304
03-06-13
50
0
48
MP28258DD
1302
03-06-13
50
0
48
MP8620DQK
1247
03-13-13
50
0
48
MP8736DL
1304
03-07-13
50
0
48
MP8736DL
1304
03-07-13
50
0
48
MP8736DL
1304
03-07-13
50
0
48
MP8736DL
1304
03-07-13
50
0
48
MP8736DL
1302
03-07-13
50
0
48
MP8736DL
1301
03-07-13
50
0
48
MP8736DL
1304
03-07-13
50
0
48
MP28258DD-A
1308
03-07-13
50
0
48
MP28258DD
1302
03-07-13
50
0
48
MP8736DL
1304
03-13-13
50
0
48
MP8736DL
1305
03-13-13
50
0
48
MP8736DL
1305
03-13-13
50
0
48
MP8736DL
1304
03-13-13
50
0
48
MP28258DD-C471
1303
03-13-13
50
0
48
MP2130DG
1303
03-19-13
50
0
48
MP8736DL
1305
03-13-13
50
0
48
MP8736DL
1305
03-20-13
50
0
48
MP8736DL
1305
03-20-13
50
0
48
MP8736DL
1305
03-20-13
50
0
48
MP8736DL
1304
03-20-13
50
0
48
MP8736DL
1305
03-20-13
50
0
48
MP8736DL
1303
03-20-13
50
0
48
MP9180DG
1307
03-19-13
50
0
48
MP9180DG
1305
03-19-13
50
0
48
NB6381DL
1222
03-29-13
50
0
48
MP1499GD
1308
03-20-13
50
0
48
MP8736DL
1306
03-20-13
50
0
48
MP8736DL
1306
03-20-13
50
0
48
MP2130DG
1304
03-22-13
50
0
48
MP8736DL
1306
03-22-13
50
0
48
MP8736DL
1306
03-22-13
50
0
48
MP8736DL
1306
03-22-13
50
0
48
MP28258DD-C471
1310
03-22-13
50
0
48
The Future of Analog IC Technology®
- 45 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1306
03-25-13
50
0
48
MP8736DL
1305
03-25-13
50
0
48
MP8736DL
1305
03-25-13
50
0
48
MP2130DG
1304
03-25-13
50
0
48
MP9152GD
1310
03-28-13
50
0
48
MP28258DD-C471
1310
03-22-13
50
0
48
MP8736DL
1307
03-25-13
50
0
48
MP8736DL
1306
03-25-13
50
0
48
FA NO.
# of hrs
MP8736DL
1305
03-25-13
50
0
48
MP28258DD
1303
03-28-13
50
0
48
MP8736DL
1306
03-28-13
50
0
48
MP8736DL
1309
03-28-13
50
0
48
MP8736DL
1305
03-28-13
50
0
48
MP8736DL
1309
03-28-13
50
0
48
MP8736DL
1307
03-28-13
50
0
48
MP8736DL
1307
03-28-13
50
0
48
MP28258DD
1303
03-28-13
50
0
48
Total
0
4.6.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1234
03-20-13
80
0
Total
FA NO.
0
4.7 FLIP CHIP-SOIC
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE PACKAGE
ASSY SITE
PACKAGE
UCD
ANST
FCSOIC8
JCET
JCAP
FCSOIC8
FCSOIC8
ANST
FCSOIC16
FCSOIC8
4.7.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS-C165
1238
03-04-13
915
0
FA NO.
The Future of Analog IC Technology®
- 46 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
SAT picture of FLIP CHIP-SOIC
T-SCAN PICTURE
C-SCAN PICTURE
4.7.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1242
01-25-13
500
0
1000
MP1482DS
1242
01-25-13
500
0
1000
FA NO.
# of
cycle
MP1482DS
1242
02-07-13
500
0
1000
MP1482DS-C165
1247
02-06-13
500
0
1000
MP1482DS-C165
1247
02-06-13
500
0
1000
MP1482DS-C165
1247
02-06-13
500
0
1000
MP1482DS-C165
1247
02-19-13
500
0
1000
MP1482DS-C165
1247
02-19-13
500
0
1000
MP1482DS-C165
1238
03-04-13
400
0
1000
MP1482DS
1252
03-20-13
500
0
1000
MP1482DS
1252
03-20-13
500
0
1000
MP1482DS
1252
03-20-13
500
0
1000
MP1482DS
1248
01-09-13
50
0
100
MP1482DS
1249
01-15-13
50
0
100
MP1482DS
1252
01-22-13
50
0
100
MP1482DS
1218
01-18-13
50
0
100
MP1482DS
1251
01-22-13
50
0
100
MP1482DS
1218
01-22-13
50
0
100
MP1493DS-C456
1252
01-22-13
50
0
100
MP1482DS
1252
01-22-13
50
0
100
MP1482DS
1252
01-22-13
50
0
100
MP1482DS
1301
01-25-13
50
0
100
The Future of Analog IC Technology®
- 47 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1252
02-27-13
50
0
100
MP1482DS
1301
01-25-13
50
0
100
MP1482DS
1301
01-29-13
50
0
100
MP1482DS
1302
03-13-13
50
0
100
MP1482DS
1302
03-13-13
50
0
100
MP1482DS
1304
03-20-13
50
0
100
MP1482DS
1301
02-27-13
50
0
100
MP1482DS
1302
03-13-13
50
0
100
MP1482DS
1301
03-22-13
50
0
100
MP1493DS-C493
1252
03-06-13
50
0
100
FA NO.
# of
cycle
MP1482DS
1306
03-01-13
50
0
100
MP28258DS
1305
03-06-13
50
0
100
MP1482DS
1302
03-28-13
50
0
100
MP1493DS
1306
03-13-13
50
0
100
MP1493DS
1306
03-13-13
50
0
100
MP1493DS
1250
03-20-13
50
0
100
MP1493DS
1308
03-20-13
50
0
100
MP1492DS
1308
03-20-13
50
0
100
MP1493DS-A
1251
03-22-13
50
0
100
MP1492DS
1306
03-22-13
50
0
100
MP1482DS
1226
03-28-13
50
0
100
MP1482DS
1309
03-28-13
50
0
100
MP1482DS
1224
03-28-13
50
0
100
MP1482DS
1310
03-28-13
50
0
100
MP1482DS
1305
03-28-13
50
0
100
Total
0
4.7.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1242
01-25-13
500
0
168
MP1482DS
1242
01-25-13
500
0
168
FA NO.
# of hrs
MP1482DS
1242
02-07-13
500
0
168
MP1482DS-C165
1247
02-06-13
500
0
168
MP1482DS-C165
1247
02-06-13
500
0
168
MP1482DS-C165
1247
02-06-13
500
0
168
MP1482DS-C165
1247
02-19-13
500
0
168
MP1482DS-C165
1247
02-19-13
500
0
168
MP1482DS-C165
1238
03-04-13
400
0
168
MP1482DS
1252
03-20-13
500
0
168
The Future of Analog IC Technology®
- 48 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1252
03-20-13
500
0
168
MP1482DS
1252
03-20-13
500
0
168
MP1482DS
1248
01-09-13
50
0
48
MP1482DS
1249
01-15-13
50
0
48
MP1482DS
1252
01-22-13
50
0
48
MP1482DS
1218
01-18-13
50
0
48
MP1482DS
1251
01-22-13
50
0
48
MP1482DS
1218
01-22-13
50
0
48
MP1493DS-C456
1252
01-22-13
50
0
48
MP1482DS
1252
01-22-13
50
0
48
MP1482DS
1252
01-22-13
50
0
48
MP1482DS
1301
01-25-13
50
0
48
MP1482DS
1252
02-27-13
50
0
48
MP1482DS
1301
01-25-13
50
0
48
MP1482DS
1301
01-29-13
50
0
48
MP1482DS
1302
03-13-13
50
0
48
MP1482DS
1302
03-13-13
50
0
48
MP1482DS
1304
03-20-13
50
0
48
MP1482DS
1301
02-27-13
50
0
48
MP1482DS
1302
03-13-13
50
0
48
MP1482DS
1301
03-22-13
50
0
48
MP1493DS-C493
1252
03-06-13
50
0
48
MP1482DS
1306
03-01-13
50
0
48
MP28258DS
1305
03-06-13
50
0
48
MP1482DS
1302
03-28-13
50
0
48
MP1493DS
1306
03-13-13
50
0
48
MP1493DS
1306
03-13-13
50
0
48
MP1493DS
1250
03-20-13
50
0
48
MP1493DS
1308
03-20-13
50
0
48
FA NO.
# of hrs
MP1492DS
1308
03-20-13
50
0
48
MP1493DS-A
1251
03-22-13
50
0
48
MP1492DS
1306
03-22-13
50
0
48
MP1482DS
1226
03-28-13
50
0
48
MP1482DS
1309
03-28-13
50
0
48
MP1482DS
1224
03-28-13
50
0
48
MP1482DS
1310
03-28-13
50
0
48
MP1482DS
1305
03-28-13
50
0
48
Total
0
The Future of Analog IC Technology®
- 49 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
4.8 FLIP CHIP-TSOT
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
ANST
FCTSOT-5
JCET
FCTSOT-6
ANST
FCTSOT-6
JCET
FCTSOT-8
ANST
FCTSOT-8
4.8.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP150GJ
1238
01-23-13
180
0
MP3221GJ
1241
01-02-13
260
0
MP1470GJ
1251
03-04-13
209
0
Total
FA NO.
0
SAT picture of FLIP CHIP-TSOT
T-SCAN PICTURE
C-SCAN PICTURE
4.8.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP150GJ
1238
01-23-13
84
0
1000
MP3221GJ
1241
01-02-13
84
0
1000
MP1470GJ
1251
03-04-13
84
0
1000
MP1497DJ
1250
01-08-13
100
0
100
FA NO.
# of
cycle
The Future of Analog IC Technology®
- 50 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1497DJ
1250
01-08-13
100
0
100
MP1472GJ-C452
1248
01-08-13
100
0
100
MP1472GJ-C452
1248
01-08-13
100
0
100
MP1495DJ
1250
01-11-13
50
0
100
MP1472GJ-C452
1249
01-14-13
100
0
100
MP1472GJ-C452
1248
01-10-13
100
0
100
MP1496DJ
1251
01-14-13
50
0
100
FA NO.
# of
cycle
MP1470GJ
1248
01-14-13
50
0
100
MP1472GJ-C452
1249
01-14-13
100
0
100
MP1472GJ-C452
1249
01-14-13
100
0
100
MP1494DJ
1250
01-15-13
50
0
100
MP1494DJ
1252
01-18-13
50
0
100
MP2143GJ
1251
01-18-13
50
0
100
MP1497DJ
1301
01-18-13
100
0
100
MP1494DJ
1252
01-22-13
50
0
100
MP155GJ
1302
02-07-13
50
0
100
MP2161GJ
1302
01-25-13
50
0
100
MP2161GJ-C499
1302
01-29-13
50
0
100
MP2161GJ
1302
01-29-13
50
0
100
MP1470GJ
1302
01-30-13
50
0
100
MP1471GJ
1303
02-04-13
50
0
100
MP1497DJ
1252
01-31-13
100
0
100
MP1472GJ
1234
02-04-13
100
0
100
MP1472GJ
1236
01-31-13
100
0
100
MP1472GJ
1229
01-31-13
100
0
100
MP1472GJ-C452
1249
01-31-13
100
0
100
MP1472GJ
1230
02-04-13
100
0
100
MP1472GJ-C452
1250
02-06-13
50
0
100
MP1472GJ-C452
1249
02-06-13
50
0
100
MP1497DJ
1304
02-06-13
50
0
100
MP1472GJ-C452
1252
02-06-13
50
0
100
MP1494DJ
1302
02-07-13
50
0
100
MP1494DJ
1252
02-07-13
50
0
100
MP1470GJ
1302
02-07-13
50
0
100
MP1472GJ
1234
02-07-13
50
0
100
MP1472GJ-C452
1249
02-07-13
50
0
100
MP1472GJ-C452
1249
02-07-13
50
0
100
MP1472GJ-C452
1249
02-07-13
50
0
100
MP1495DJ
1302
02-27-13
50
0
100
MP1496DJ
1304
02-07-13
50
0
100
MP1497DJ
1304
02-07-13
50
0
100
MP3414DJ
1301
02-27-13
50
0
100
The Future of Analog IC Technology®
- 51 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1472GJ
1249
02-27-13
50
0
100
MP1472GJ
1302
02-27-13
50
0
100
MP1472GJ
1302
02-27-13
50
0
100
MP1472GJ
1247
02-27-13
50
0
100
MP1472GJ
1248
02-27-13
50
0
100
MP1472GJ
1302
02-27-13
50
0
100
MP1472GJ
1302
02-27-13
50
0
100
MP1472GJ-C452
1249
02-27-13
50
0
100
MP1472GJ-C452
1249
02-27-13
50
0
100
MP1472GJ-C452
1249
02-27-13
50
0
100
MP1494DJ
1302
02-27-13
50
0
100
MP1497DJ
1252
02-27-13
50
0
100
MP1497DJ
1304
02-27-13
50
0
100
MP1497DJ
1304
02-27-13
50
0
100
MP1472GJ
1302
02-27-13
50
0
100
MP1496DJ
1305
02-27-13
50
0
100
MP1497DJ
1305
02-27-13
50
0
100
MP1472GJ
1302
03-13-13
50
0
100
MP1472GJ-C452
1249
03-28-13
50
0
100
MP1472GJ-C452
1249
03-13-13
50
0
100
MP1497DJ
1305
03-20-13
50
0
100
MP2489DJ
1305
03-06-13
50
0
100
MP1472GJ
1248
03-01-13
50
0
100
MP1472GJ
1302
03-01-13
50
0
100
MP1494DJ
1306
03-01-13
50
0
100
MP1494DJ
1252
03-01-13
50
0
100
MP1472GJ
1249
03-01-13
50
0
100
MP1497DJ
1305
03-01-13
50
0
100
MP1472GJ
1302
03-06-13
50
0
100
MP1497DJ
1306
03-20-13
50
0
100
MP150GJ
1305
03-22-13
50
0
100
MP1494DJ
1306
03-07-13
50
0
100
MP1471GJ
1306
03-13-13
50
0
100
FA NO.
# of
cycle
MP1472GJ
1302
03-13-13
50
0
100
MP1472GJ-C452
1303
03-13-13
50
0
100
MP1472GJ-C452
1251
03-13-13
50
0
100
MP2143DJ
1304
03-13-13
50
0
100
MP1494DJ
1305
03-13-13
50
0
100
MP1472GJ-C452
1251
03-13-13
50
0
100
MP1497DJ
1306
03-13-13
50
0
100
MP1472GJ-C452
1252
03-13-13
50
0
100
MP1494DJ
1302
03-13-13
50
0
100
The Future of Analog IC Technology®
- 52 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1472GJ-C452
1303
03-20-13
50
0
100
MP1497DJ
1308
03-20-13
50
0
100
MP1494DJ
1252
03-20-13
50
0
100
MP1497DJ
1309
03-20-13
50
0
100
MP1472GJ-C452
1306
03-20-13
50
0
100
FA NO.
# of
cycle
MP1472GJ-C452
1307
03-20-13
50
0
100
MP1472GJ
1248
03-20-13
50
0
100
MP1497DJ
1306
03-20-13
50
0
100
MP1494DJ
1309
03-20-13
50
0
100
MP1495DJ
1306
03-20-13
50
0
100
MP1472GJ-C452
1307
03-20-13
50
0
100
MP1472GJ-C452
1307
03-20-13
50
0
100
MP1472GJ
1248
03-22-13
50
0
100
MP1472GJ
1249
03-22-13
50
0
100
MP1472GJ
1247
03-28-13
50
0
100
MP1472GJ-C452
1309
03-28-13
50
0
100
MP1472GJ-C452
1307
03-28-13
50
0
100
MP1494DJ
1309
03-28-13
50
0
100
MP1495DJ
1309
03-28-13
50
0
100
MP1496DJ
1310
03-28-13
50
0
100
MP1497DJ
1309
03-28-13
50
0
100
MP1497DJ
1309
03-25-13
50
0
100
MP2159GJ
1307
03-28-13
50
0
100
MP1472GJ
1252
03-28-13
50
0
100
MP1472GJ-C452
1306
03-28-13
50
0
100
MP1472GJ-C452
1307
03-28-13
50
0
100
MP2489DJ
1251
03-28-13
50
0
100
MP1498DJ
1307
03-28-13
250
0
100
MP1472GJ-C452
1309
03-28-13
50
0
100
MP1472GJ-C452
1307
03-28-13
50
0
100
MP1472GJ-C452
1307
03-28-13
50
0
100
Total
0
4.8.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
FA NO.
# of hrs
MP150GJ
1238
01-23-13
89
0
168
MP3221GJ
1241
01-02-13
80
0
168
MP1470GJ
1251
03-04-13
87
0
168
MP1495DJ
1250
01-11-13
50
0
48
MP1496DJ
1251
01-14-13
50
0
48
The Future of Analog IC Technology®
- 53 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1470GJ
1248
01-14-13
50
0
48
MP1494DJ
1250
01-15-13
50
0
48
FA NO.
# of hrs
MP1494DJ
1252
01-18-13
50
0
48
MP2143GJ
1251
01-18-13
50
0
48
MP1494DJ
1252
01-22-13
50
0
48
MP155GJ
1302
02-07-13
50
1
MP2161GJ
1302
01-25-13
50
0
48
MP2161GJ-C499
1302
01-29-13
50
0
48
MP2161GJ
1302
01-29-13
50
0
48
MP1470GJ
1302
01-30-13
50
0
48
MP1471GJ
1303
02-04-13
50
0
48
MP1472GJ-C452
1250
02-06-13
50
0
48
MP1472GJ-C452
1249
02-06-13
50
0
48
MP1497DJ
1304
02-06-13
50
0
48
MP1472GJ-C452
1252
02-06-13
50
0
48
MP1494DJ
1302
02-07-13
50
0
48
MP1494DJ
1252
02-07-13
50
0
48
MP1470GJ
1302
02-07-13
50
0
48
MP1472GJ
1234
02-07-13
50
0
48
MP1472GJ-C452
1249
02-07-13
50
0
48
MP1472GJ-C452
1249
02-07-13
50
0
48
MP1472GJ-C452
1249
02-07-13
50
0
48
MP1495DJ
1302
02-27-13
50
0
48
MP1496DJ
1304
02-07-13
50
0
48
MP1497DJ
1304
02-07-13
50
0
48
MP3414DJ
1301
02-27-13
50
0
48
MP1472GJ
1249
02-27-13
50
0
48
MP1472GJ
1302
02-27-13
50
0
48
MP1472GJ
1302
02-27-13
50
0
48
MP1472GJ
1247
02-27-13
50
0
48
MP1472GJ
1248
02-27-13
50
0
48
MP1472GJ
1302
02-27-13
50
0
48
MP1472GJ
1302
02-27-13
50
0
48
MP1472GJ-C452
1249
02-27-13
50
0
48
MP1472GJ-C452
1249
02-27-13
50
0
48
MP1472GJ-C452
1249
02-27-13
50
0
48
MP1494DJ
1302
02-27-13
50
0
48
MP1497DJ
1252
02-27-13
50
0
48
MP1497DJ
1304
02-27-13
50
0
48
MP1497DJ
1304
02-27-13
50
0
48
MP1472GJ
1302
02-27-13
50
0
48
MP1496DJ
1305
02-27-13
50
0
48
6514
48
The Future of Analog IC Technology®
- 54 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1497DJ
1305
02-27-13
50
0
48
MP1472GJ
1302
03-13-13
50
0
48
MP1472GJ-C452
1249
03-28-13
50
0
48
MP1472GJ-C452
1249
03-13-13
50
0
48
MP1497DJ
1305
03-20-13
50
0
48
MP2489DJ
1305
03-06-13
50
0
48
MP1472GJ
1248
03-01-13
50
0
48
MP1472GJ
1302
03-01-13
50
0
48
MP1494DJ
1306
03-01-13
50
0
48
MP1494DJ
1252
03-01-13
50
0
48
MP1472GJ
1249
03-01-13
50
0
48
FA NO.
# of hrs
MP1497DJ
1305
03-01-13
50
0
48
MP1472GJ
1302
03-06-13
50
0
48
MP1497DJ
1306
03-20-13
50
0
48
MP150GJ
1305
03-22-13
50
0
48
MP1494DJ
1306
03-07-13
50
0
48
MP1471GJ
1306
03-13-13
50
0
48
MP1472GJ
1302
03-13-13
50
0
48
MP1472GJ-C452
1303
03-13-13
50
0
48
MP1472GJ-C452
1251
03-13-13
50
0
48
MP2143DJ
1304
03-13-13
50
0
48
MP1494DJ
1305
03-13-13
50
0
48
MP1472GJ-C452
1251
03-13-13
50
0
48
MP1497DJ
1306
03-13-13
50
0
48
MP1472GJ-C452
1252
03-13-13
50
0
48
MP1494DJ
1302
03-13-13
50
0
48
MP1472GJ-C452
1303
03-20-13
50
0
48
MP1497DJ
1308
03-20-13
50
0
48
MP1494DJ
1252
03-20-13
50
0
48
MP1497DJ
1309
03-20-13
50
0
48
MP1472GJ-C452
1306
03-20-13
50
0
48
MP1472GJ-C452
1307
03-20-13
50
0
48
MP1472GJ
1248
03-20-13
50
0
48
MP1497DJ
1306
03-20-13
50
0
48
MP1494DJ
1309
03-20-13
50
0
48
MP1495DJ
1306
03-20-13
50
0
48
MP1472GJ-C452
1307
03-20-13
50
0
48
MP1472GJ-C452
1307
03-20-13
50
0
48
MP1472GJ
1248
03-22-13
50
0
48
MP1472GJ
1249
03-22-13
50
0
48
MP1472GJ
1247
03-28-13
50
0
48
MP1472GJ-C452
1309
03-28-13
50
0
48
The Future of Analog IC Technology®
- 55 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1472GJ-C452
1307
03-28-13
50
0
48
MP1494DJ
1309
03-28-13
50
0
48
MP1495DJ
1309
03-28-13
50
0
48
MP1496DJ
1310
03-28-13
50
0
48
MP1497DJ
1309
03-28-13
50
0
48
MP1497DJ
1309
03-25-13
50
0
48
MP2159GJ
1307
03-28-13
50
0
48
MP1472GJ
1252
03-28-13
50
0
48
MP1472GJ-C452
1306
03-28-13
50
0
48
MP1472GJ-C452
1307
03-28-13
50
0
48
MP2489DJ
1251
03-28-13
50
0
48
MP1498DJ
1307
03-28-13
50
0
48
MP1472GJ-C452
1309
03-28-13
50
0
48
MP1472GJ-C452
1307
03-28-13
50
0
48
MP1472GJ-C452
1307
03-28-13
50
0
48
Total
FA NO.
# of hrs
1
The Future of Analog IC Technology®
- 56 -
MONOLITHIC POWER SYSTEMS
Q1
2013
PRODUCT RELIABILITY REPORT
Monolithic Power Systems (Chengdu) Co., Ltd.
No.8 Kexin Rd. West Park of Export Processing Zone,
West Hi-Tech Zone, Chengdu, Sichuan 611731
Tel: 86-28-87303000
Fax: 86-28-87303060
www.monolithicpower.com
The Future of Analog IC Technology®
- 57 -