2013 Q2 Reliability Quarterly Report Overview

QUARTERLY RELIABILITY MONITOR
REPORT
Q2, Apr. ~ Jun. 2013
Prepared by MPSCD Reliability Engineering
The Future of Analog IC Technology®
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
INDEX
1.0 INTRODUCTION ......................................................................................2
1.1 SHORT TERM RELIBILITY MONITORING ........................................................................................................................ 2
1.2 LONG TERM RELIBILITY MONITORING ........................................................................................................................... 2
2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS.........................3
3.0 PROCESS RELIABILITY MONITORING DATA ......................................4
3.1 BCM12B Process Technology ................................................................................................................................................ 4
3.2 BCM12S Process Technology ................................................................................................................................................ 8
3.3 BCM35 Process Technology ................................................................................................................................................ 11
3.4 BCM05 Process Technology ................................................................................................................................................ 12
3.5 BCM18 Process Technology ................................................................................................................................................ 13
4.0 PACKAGE RELIABILITY MONITORING DATA ....................................14
4.1 QFN .................................................................................................................................................................................................. 14
4.2 SOIC ................................................................................................................................................................................................ 25
4.3 MSOP .............................................................................................................................................................................................. 35
4.4 TSOT ............................................................................................................................................................................................... 38
4.5 TSSOP ............................................................................................................................................................................................ 43
4.6 FLIP CHIP-QFN ......................................................................................................................................................................... 45
4.7 FLIP CHIP-SOIC........................................................................................................................................................................ 58
4.8 FLIP CHIP-TSOT ...................................................................................................................................................................... 66
The Future of Analog IC Technology®
-1-
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
1.0 INTRODUCTION
This report summarizes the reliability testing results for MPS products as of Q2 2013.
1.1 SHORT TERM RELIBILITY MONITORING
The short term monitoring runs on a daily basis. It provides a fast alert in case of changes in term of product
reliability performance.
Stress Test Name
Test Condition
Duration
JEDEC
EARLY LIFE
125°C, Vccmax
48 ~168 hrs
JESD22-A108
Convection Reflow
260°C
3 times
JESD22-A113
Temperature Cycle
Cond C:-65℃ ~ 150℃
100~200Cycles
JESD22-A104
Autoclave
121°C /100%RH
48~96 hrs
JESD22-A102
1.2 LONG TERM RELIBILITY MONITORING
The long term monitoring runs on a quarterly basis. It provides the life stresses for periods long enough to
provide the data necessary to calculate the steady state failure rates of products.
Stress Test Name
Test Condition
Duration
JEDEC
HTOL
125°C, Vccmax
1000 hrs
JESD22-A108
HTSL
150°C
1000 hrs
JESD22-A103
Precondition
/
/
JESD22-A113
Autoclave
121°C /100%RH
168 hrs
JESD22-A102
Temperature Cycle
Cond C:-65°C ~ 150°C
1000 Cycles
JESD22-A104
85°C, 85% R.H., VDD
1000 hrs
JESD22-A101
130°C, 85% R.H., VDD
96 hrs
JESD22-A110
Temperature Humidity Bias
(THB)
High Accelerated Stress Test
(HAST)
The Future of Analog IC Technology®
-2-
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS
The long-term failure rate for a technology is gauged by a Failures In Time (FIT) calculation based upon
accelerated stress data. The units for FIT are failures per Billion device hours.
( χ / 2) *10
2
FITRate =
9
stress * device hours
The stress that enables FIT is High Temperature Operating Life (HTOL), which is a product level test. HTOL
is accelerated by temperature and by voltage. The total number of failures in stress determines the
chi-squared factor (a dimensionless number representing a 60% confidence level of statistics). The number
of product units times the stress period (in Hours) is the device-Hours number. The Arrhenius equation uses
the Activation energy for the fail mode as well as the stress temperature and the reporting temperature (e.g.
55℃) to compute the HTOL temperature acceleration factor, AF(T). The accelerated stress device-Hours is
AF(T) times the device-Hours number. AFv= Exp(β(Vtest- Vuse), Vtest = Stress Voltage (V).Vuse = Nominal
Voltage (V).β = Voltage Acceleration Constant (usually, 0.5 < Z < 1.0).
The Future of Analog IC Technology®
-3-
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
3.0 PROCESS RELIABILITY MONITORING DATA
3.1 BCM12B Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
HHNEC, ASMC,SMIC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP2120DQ
C272169.8B
1215
05-21-13
50
168
0
MP2120DQ
C372325.8A
1219
05-21-13
50
168
0
NB600CQ
C372377.8A
1221
05-21-13
50
168
0
NB600CQ
C372377.9
1222
05-21-13
50
168
0
MP2012DQ
C386219.7
1233
05-21-13
50
168
0
MP2012DQ
C586908.7
1236
05-21-13
50
168
0
MP3310EQ
A989932.9DT
1305
05-09-13
84
168
0
MP2359DJ
C285242.9AQ
1216
05-29-13
80
168
0
MP1484EN
D289808.9T
1320
06-27-13
81
168
0
MP2307DN
C572682.7
1228
06-06-13
50
168
0
MP2307DN
C572730.7
1228
06-06-13
50
168
0
MP2119DQ
C587164.7
1304
06-09-13
79
168
0
MP1484EN
C787757.7
1304
06-09-13
80
168
0
MP3217DJ
C788057.7
1250
05-20-13
79
48
0
MP3217DJ
C888365.7
1250
05-01-13
80
48
0
MP3217DJ
CA88957.9
1304
05-20-13
80
48
0
MP2012DQ
C888344.9
1244
04-03-13
80
48
0
MP2119DQ
C586759.7
1310
04-03-13
80
48
0
MP1412DH
C586901.7
1308
06-21-13
80
48
0
MP2104DJ
C888309.7
1309
04-02-13
80
48
0
MP2307DN
C888218.7
1306
04-03-13
80
48
0
MP1484EN-C166
C888149.7
1310
04-03-13
80
48
0
MP1482DN
CC89355.9
1309
04-03-13
80
48
0
MP1484EN-C166
C888163.7
1310
04-25-13
80
48
0
MP1412DH
C787876.1A
1310
04-11-13
80
48
0
MP1484EN-C165
C687655.7
1312
04-16-13
80
48
0
MP1482DN
CA88919.9
1312
04-15-13
80
48
0
MP1583DN
C386196.7A
1312
04-16-13
80
48
0
MP1584EN
CA88716.7
1310
06-18-13
80
48
0
MP1482DN
CA88910.9
1312
04-12-13
80
48
0
MP1482DN
CA88916.9
1312
04-16-13
80
48
0
The Future of Analog IC Technology®
-4-
FA No.
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP1482DN
CA88914.9
1312
04-16-13
80
48
0
MP1412DH
C586904.7
1309
04-11-13
80
48
0
MP2307DN
C888357.7
1313
04-27-13
80
48
0
MP1482DN
C787703.7
1310
04-16-13
80
48
0
MP2307DN
C888358.7
1312
04-16-13
80
48
0
MP1482DS-C165
CC89274.9
1313
04-18-13
80
48
0
MP3217DJ
CA88783.9
1305
05-20-13
80
48
0
MP2104DJ
C988508.7
1309
04-16-13
80
48
0
MP3908DK
BB72861.1B
1312
04-16-13
80
48
0
MP1412DH
C787895.1A
1310
04-17-13
80
48
0
MP1430DN
C687545.7
1313
05-13-13
80
48
0
MP4689DN
C472567.9C
1310
04-22-13
80
48
0
MP1482DN
C787712.7
1313
04-15-13
80
48
0
MP1584EN
CA88759.7
1312
06-18-13
80
48
0
MP2307DN
C888335.7
1312
04-17-13
80
48
0
MP2307DN
C888355.7
1312
04-16-13
78
48
0
MP1484EN
C888248.7
1312
04-26-13
80
48
0
MP1482DN
C787710.7
1313
04-17-13
80
48
0
MP2359DJ
C687506.7
1311
06-18-13
80
48
0
MP2467DN
CB72169.1A
1310
04-20-13
80
48
0
MP1484EN
C687400.7
1304
04-22-13
80
48
0
MP2307DN
C787737.7
1315
05-28-13
80
48
0
MP1482DS-C165
C687649.7
1302
05-31-13
80
48
0
MP1593DN
CA88792.9A
1314
04-23-13
80
48
0
MP1591DN
C988703.7
1313
05-04-13
80
48
0
MP1484EN
C687338.7
1250
04-22-13
80
48
0
MP2467DN
CB72169.9
1303
04-24-13
80
48
0
MP1484EN
C687656.7
1308
04-22-13
78
48
0
MP1484EN
C888252.7
1312
04-22-13
80
48
0
MP2105DJ
C988564.7
1250
04-26-13
80
48
0
MP1584EN
D189503.9
1314
06-18-13
80
48
0
MP2303ADN-C445
C587166.7
1310
05-14-13
80
48
0
MP2359DJ
C687513.7
1313
06-25-13
80
48
0
MP2012DQ
C788038.7
1309
05-04-13
80
48
0
MP1484EN
C787735.7
1314
04-25-13
80
48
0
MP1482DS-C165
C687701.7
1302
04-27-13
80
48
0
MP2104DJ
C587190.7
1311
06-24-13
80
48
0
MP2307DN
C787729.7
1313
05-28-13
78
48
0
MP1484EN
C787734.7
1314
06-24-13
80
48
0
MP1482DN
CB89185.9
1316
04-28-13
80
48
0
MP2307DN
C787755.7
1315
05-06-13
80
48
0
MP1580HS
D189706.9A
1314
06-18-13
80
48
0
The Future of Analog IC Technology®
-5-
FA No.
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP1482DN
CA88925.9
1315
05-06-13
80
48
0
MP2104DJ
C587191.7
1314
05-04-13
80
48
0
MP1530DM
D189463.1A
1315
06-21-13
80
48
0
MP9115DQT
D380011.8A
1316
05-06-13
80
48
0
MP2303ADN
C787882.7
1316
05-14-13
80
48
0
MP1482DS-C165
CB89126.1A
1315
05-09-13
80
48
0
MP1482DN
CA88926.9
1315
05-09-13
80
48
0
MP1484EN-C166
C787836.7
1316
05-23-13
80
48
0
MP1484EN
C787828.7
1316
05-09-13
80
48
0
MP2359DJ
C787945.7
1315
06-18-13
80
48
0
MP1484EN
C787821.7
1315
06-28-13
80
48
0
MP2104DJ
C888310.7
1316
05-20-13
80
48
0
MP1584EN
D289713.9
1316
06-08-13
80
48
0
MP1484EN
C787816.7
1316
06-24-13
80
48
0
MP2105DJ
C988466.7
1316
05-29-13
80
48
0
MP1484EN
C787832.7
1316
05-23-13
80
48
0
MP1482DN
D289723.9
1317
05-13-13
80
48
0
MP1482DS-C165
CC89361.9
1317
05-31-13
78
48
0
MP1484EN
C888213.7
1317
06-28-13
80
48
0
MP1484EN-C166
C888167.7
1317
05-23-13
80
48
0
MP2359DJ
C687621.7
1316
06-25-13
80
48
0
MP2105DK
C888427.7
1247
05-27-13
80
48
0
MP1411DH
C586764.7
1319
06-18-13
80
48
0
MP1482DN
D189563.9
1321
06-18-13
80
48
0
MP1412DH
C486711.9
1318
06-28-13
80
48
0
MP1482DN
D380221.9
1321
06-18-13
80
48
0
MP1482DN
D189561.9
1321
06-18-13
78
48
0
MP1482DN
D380225.9
1321
06-28-13
80
48
0
MP2105DK
CA88882.9A
1320
06-18-13
80
48
0
MP1482DN
D380222.9
1321
06-28-13
80
48
0
MP1482DN
D380224.9
1321
06-24-13
78
48
0
MP1482DN
D380226.9
1321
06-18-13
80
48
0
MP1411DH
C787895.7
1321
06-25-13
80
48
0
MP1482DN
D380223.9
1322
06-28-13
80
48
0
MP1482DN
D380220.9
1322
06-28-13
80
48
0
MP1482DN
D480274.9
1322
06-28-13
78
48
0
MP1482DN
D380227.9
1322
06-28-13
78
48
0
Total
0
The Future of Analog IC Technology®
-6-
FA No.
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
LONG TERM LIFE (HTOL Long Term Monitor)
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MPQ1530DQ
C988670
1247
05-14-13
79
0
MPQ1530DQ
EP280905
1247
05-14-13
79
0
MPQ1530DQ
EP280906
1249
05-14-13
80
0
MPQ1530DQ
C988670
1247
05-14-13
79
0
MPQ1530DQ
EP280905
1247
05-14-13
79
0
MPQ1530DQ
EP280906
1249
05-14-13
80
0
MPQ2016DD
FA292055
1244
05-16-13
78
0
MP8040DN
EP292000
N/A
06-04-13
80
0
Total
FA No.
0
BCM12B
#fail
#device hours
Accel Factor
FIT Rate
0
634000
348
4.3
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP18030GQN
EP194802-D21
1249
04-09-13
50
0
MP18030GQN
EP194802-D22
1242
04-09-13
50
0
MP18030GQN
EP194802-D23
1245
04-09-13
50
0
MPQ2362DF
C787792.7
1243
05-14-13
50
0
MPQ2362DF
C787791.7
1243
05-14-13
50
0
MPQ2362DF
C787892.7
1243
05-14-13
50
0
MPQ2362DF
C787792.7
1243
05-14-13
50
0
MPQ2362DF
C787791.7
1243
05-14-13
50
0
MPQ2362DF
C787892.7
1243
05-14-13
50
0
MPQ2016DD
FA292055
1244
05-16-13
50
0
MP2120DQ
C272169.8B
1215
05-21-13
46
0
MP2120DQ
C372325.8A
1219
05-21-13
47
0
NB600CQ
C372377.8A
1221
05-21-13
50
0
NB600CQ
C372377.9
1222
05-21-13
50
0
MP2012DQ
C386219.7
1233
05-21-13
47
0
MP2012DQ
C586908.7
1236
05-21-13
47
0
MPQ3701GR
EP270500
1239
05-29-13
50
0
MPQ4462DN
FA2Y2168A
1301
05-29-13
50
0
MP2109DQ
C888268.7
1303
05-20-13
50
0
MP2307DN
C572682.7
1228
06-06-13
47
0
MP2307DN
C572730.7
1228
06-06-13
47
0
The Future of Analog IC Technology®
-7-
FA No.
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP4561DQ
C672882.9
1232
06-08-13
47
0
MP4561DQ
C772902.8A
1234
06-08-13
47
0
MP2119DQ
C587164.7
1304
06-09-13
50
0
MP1484EN
C787757.7
1304
06-09-13
50
0
MP2209DL
CA88739.7
1304
06-08-13
50
0
MP2119DQ
C586777.1AH
1309
06-03-13
50
0
MP2119DQ
C586777.1AM
1309
06-03-13
50
0
MP2119DQ
C586777.1AL
1309
06-03-13
50
0
Total
FA No.
0
3.2 BCM12S Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
HHNEC, ASMC,SMIC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax @ 125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP3388DR
C586835.7L
N/A
05-06-13
80
168
0
MP3388DR
C586835.7M
N/A
05-06-13
80
168
0
MP3388DR
C586835.7H
N/A
05-06-13
80
168
0
MP5000DQ
C347147.9M
1236
05-31-13
50
168
0
MP5000DQ
C549750.7
1236
05-31-13
50
168
0
MPQ28261DL
BB84333.9
1228
05-21-13
50
168
0
MPQ28261DL
C285336.7
1228
05-21-13
50
168
0
MP28252EL
HP329901
1311
2013-56
90
168
0
MP8705EN
CB4K588.9Q
1309
05-21-13
80
168
0
MP1494DJ
C472536.8
1232
06-06-13
50
168
0
MP1494DJ
C572710.8
1235
06-06-13
50
168
0
MP3388DR
C346039.1AL
1231
06-20-13
80
168
0
MP3388DR
C346039.1AM
1231
06-20-13
80
168
0
MP3388DR
C346039.1AH
1231
06-20-13
80
168
0
MP2670DQ
C9481368.9AL
1228
06-20-13
80
168
0
MP2670DQ
C9481368.9AMA
1228
06-20-13
80
168
0
MP2670DQ
C9481368.9AMB
1228
06-20-13
80
168
0
MP2670DQ
C9481368.9AH
1228
06-20-13
80
168
0
MP3388DR
C285583.7
1304
06-08-13
80
168
0
MP28252EL
D24P574.1AT
1322
06-27-13
80
168
0
MP8126DF
CA88767.9Q
1252
04-22-13
80
48
0
The Future of Analog IC Technology®
-8-
FA No.
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP5000DQ
CB89122.9
1304
04-18-13
80
48
0
MP8736DL
C788084.8
1302
04-09-13
78
48
0
MP8736DL
C988563.8
1302
04-09-13
80
48
0
MP8736DL
CB89035.8A
1303
04-16-13
78
48
0
MP8736DL
CB89053.8
1304
04-29-13
78
48
0
MP8736DL
CB89097.8
1305
05-09-13
79
48
0
MP8736DL
CB89052.8
1306
04-28-13
80
48
0
MP8736DL
CB89046.8
1306
04-25-13
78
48
0
MP8736DL
CB89085.8
1305
05-10-13
78
48
0
MP8736DL
CB89101.8
1309
06-18-13
78
48
0
MP2007DH
C988665.7E
1306
04-07-13
80
48
0
MP3389EF
CB89062.1
1302
04-22-13
84
48
0
MP5001DQ
C372370.7B
1311
04-11-13
90
48
0
MP8125EF
C888406.7A
1308
04-16-13
80
48
0
MP6002DN
9685966.7
1310
05-14-13
75
48
0
MP6002DN
9685968.7
1312
05-14-13
75
48
0
MP28253EL-C323
CB4K202.1B
1313
04-23-13
79
48
0
MP3389EF
D189469.1B
1313
04-19-13
80
48
0
MP8706EN
CB4L110.9
1310
06-24-13
80
48
0
MP3388DR-C414
D189591.7B
1314
05-10-13
82
48
0
MP3900DK
9C91896.7A
1313
04-18-13
80
48
0
MP5010DQ-C347
C347183.9
1304
06-24-13
80
48
0
MP2002DD
CB4K203.1A
1310
04-20-13
80
48
0
MP28252EL
C549797.7
1311
05-28-13
80
48
0
MP8709EN
CC89336.1B
1311
06-25-13
80
48
0
MP3389EF
CB4K678.1
1313
05-02-13
80
48
0
MP3394EF
CA4J473.9A
1310
04-28-13
80
48
0
MP8708EN
D189581.9
1313
05-30-13
80
48
0
MP28252EL
D189572.1B
1316
05-07-13
80
48
0
MP8708EN
D14M642.9
1312
06-25-13
80
48
0
MP5001DQ
C372370.7
1313
06-18-13
80
48
0
MP8708EN
D189488.9
1312
06-03-13
80
48
0
MP28252EL
D24P091.1A
1317
05-27-13
80
48
0
MP8705EN
D14M640.9
1314
06-28-13
80
48
0
MP8125EF
D289880.8A
1315
05-14-13
80
48
0
MP3389EF
D189468.1C
1315
05-29-13
80
48
0
MP5010DQ-C347
C347221.9
1304
06-25-13
80
48
0
MP3389EF
D189468.1
1315
05-15-13
80
48
0
MP28253EL
D24P599.8A
1315
05-16-13
79
48
0
MP4688DN
CA72119.9
1316
06-18-13
80
48
0
MP3389EF
CB89067.1
1316
05-29-13
80
48
0
MP3394EF
CB4L149.9A
1317
05-16-13
80
48
0
The Future of Analog IC Technology®
-9-
FA No.
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP8706EN
D189485.9
1316
05-27-13
80
48
0
MP28255EL
D44R792.9A
1321
06-18-13
79
48
0
MP6002DN
9685967.7A
1320
06-18-13
75
48
0
MP8736DL
CC89293.8
1318
06-26-13
80
48
0
Total
FA No.
0
LONG TERM LIFE (HTOL Long Term Monitor) BCM12S
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP5000DQ
C888369.9AQ
1249
04-03-13
80
0
MP5000DQ
C888369.9BQ
1249
04-03-13
80
0
MPQ4568GQ
EP264904
1248
04-22-13
80
0
MPQ4568GQ
EP264904
1248
04-22-13
80
0
MP8709EN
CC89336.9AT
1312
05-29-13
77
0
Total
FA No.
0
BCM12S
#fail
#device hours
Accel Factor
FIT Rate
0
397000
348
7
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP1494DJ
C472536.8QBA-C
1245
04-22-13
50
0
MP1494DJ
C472536.8QBB-C
1247
04-22-13
50
0
MP1494DJ
C472536.8QBC-C
1249
04-22-13
50
0
MP1494DJ
EP286107
1302
04-22-13
50
0
MP1494DJ
C472536.8QBA
1245
04-22-13
50
0
MP1494DJ
C472536.8QBB
1247
04-22-13
50
0
MP1494DJ
C472536.8QBC-
1249
04-22-13
50
0
MP1494DJ
EP286107
1302
04-22-13
50
0
MP5000DQ
C347147.9M
1236
05-31-13
50
0
MP5000DQ
C549750.7
1236
05-31-13
50
0
MPQ28261DL
BB84333.9
1228
05-21-13
47
0
MPQ28261DL
C285336.7
1228
05-21-13
47
0
MP8705EN
CB4K588.9Q
1309
05-21-13
50
0
MP6211DN
C285564.7
1217
06-06-13
47
0
MP6211DN
C285565.7
1222
06-06-13
47
0
MP1494DJ
C472536.8
1232
06-06-13
47
0
MP1494DJ
C572710.8
1235
06-06-13
47
0
The Future of Analog IC Technology®
- 10 -
FA No.
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP3388DR
C346039.1AL
1231
06-20-13
45
0
MP3388DR
C346039.1AM
1231
06-20-13
45
0
MP3388DR
C346039.1AH
1231
06-20-13
45
0
MP2670DQ
C9481368.9AL
1228
06-20-13
45
0
MP2670DQ
C9481368.9AMA
1228
06-20-13
44
0
MP2670DQ
C9481368.9AMB
1228
06-20-13
45
0
MP2670DQ
C9481368.9AH
1228
06-20-13
45
0
MP3388DR
C285583.7
1304
06-08-13
50
0
Total
FA No.
0
3.3 BCM35 Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
ASMC,SMIC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax @ 125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP5010ADQ
HP313202
1309
06-04-13
80
168
0
MP5010ADQ
CC43287.9
1313
06-04-13
80
168
0
Total
FA No.
0
LONG TERM LIFE (HTOL Long Term Monitor) BCM35
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP5087GQ
HP303507
1305
06-09-13
78
0
Total
FA No.
0
BCM35
#fail
#device hours
Accel Factor
FIT Rate
0
78
348
35
HIGH TEMPERATURE STORAGE LIFE (HTSL) BCM35
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP2155GQ
HP286501
1245
06-27-13
50
0
MP2161GJ
HP314214
1305
06-08-13
50
0
MP5087GG
HP303502
1308
06-04-13
50
0
The Future of Analog IC Technology®
- 11 -
FA No.
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP5010ADQ
HP313202
1309
06-04-13
50
0
MP5010ADQ
CC43287.9
1313
06-04-13
50
0
MP5083GG
HP306505
1317
06-27-13
50
0
Total
FA No.
0
3.4 BCM05 Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
ASMC,HHNEC
LONG TERM LIFE (HTOL Long Term Monitor) BCM05
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP20045DQ-25
CA88770.9
1302
06-07-13
80
0
Total
FA No.
0
BCM05
#fail
#device hours
Accel Factor
FIT Rate
0
80000
348
33
HIGH TEMPERATURE STORAGE LIFE (HTSL) BCM05
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP2130DG
CB72203.8Q
1304
04-22-13
50
0
MP2130DG
CB72203.8Q
1304
04-22-13
50
0
MP20045DQ-25
CA88770.9
1302
06-07-13
50
0
Total
0
The Future of Analog IC Technology®
- 12 -
FA No.
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
3.5 BCM18 Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
SMIC
HIGH TEMPERATURE STORAGE LIFE (HTSL) BCM18
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
NB675GL
HP3118
1245
04-22-13
50
0
NB675GL
HP321303
1302
04-22-13
50
0
NB671LGQ
HP3134
1245
04-09-13
50
0
NB675GL
HP321303
1302
04-22-13
50
0
NB671LGQ
HP3134
1245
04-09-13
50
0
NB671GQ
HP303201
1305
06-03-13
50
0
NB671GQ
HP3328
1308
06-03-13
50
0
Total
0
The Future of Analog IC Technology®
- 13 -
FA No.
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
4.0 PACKAGE RELIABILITY MONITORING DATA
4.1 QFN
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
QFN2*2
ASAT
QFN2*2
UCD
QFN2*3
ASAT
QFN2*3
UCD
QFN3*3
ASAT
QFN3*3
UCD
QFN3*4
ASAT
QFN3*4
UCD
QFN4*4
ASAT
QFN4*4
UCD
QFN4*5
ASAT
QFN5*5
UCD
QFN5*5
ASAT
QFN7*7
UCD
QFN5*6
UTAC
UCD
QFN6*6
JCET
QFN2*2
UCD
QFN7*7
JCET
QFN4*4
QFN3*3
4.1.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP5000DQ
1249
04-03-13
190
0
MP5000DQ
1249
04-03-13
190
0
NB600CQ
1221
05-21-13
100
0
NB600CQ
1222
05-21-13
100
0
MPQ3701GR
1239
05-29-13
180
0
MP2109DQ
1303
05-20-13
180
0
MP5000SDQ
1309
05-21-13
260
0
MP2119DQ
1304
06-09-13
180
0
MP3388DR
1231
06-20-13
180
0
MP3388DR
1231
06-20-13
180
0
MP3388DR
1231
06-20-13
180
0
MP2670DQ
1228
06-20-13
180
0
MP2670DQ
1228
06-20-13
180
0
MP2670DQ
1228
06-20-13
180
0
MP2670DQ
1228
06-20-13
180
0
MP2155GQ
1245
06-27-13
301
0
MP2155GQ
1318
06-27-13
106
0
MP20045DQ-25
1302
06-07-13
180
0
MP5087GQ
1305
06-09-13
80
0
MP2209DL
1304
06-08-13
180
0
MP3388DR
1304
06-08-13
180
0
FA NO.
The Future of Analog IC Technology®
- 14 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP5010ADQ
1309
06-04-13
302
0
MP2119DQ
1309
06-03-13
205
0
MP2119DQ
1309
06-03-13
205
0
MP2119DQ
1309
06-03-13
205
0
MP5083GG
1317
06-27-13
280
0
Total
FA NO.
0
SAT picture of QFN
T-SCAN PICTURE
C-SCAN PICTURE
4.1.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP5000DQ
1249
04-03-13
87
0
FA NO.
# of
cycle
1000
MP5000DQ
1249
04-03-13
87
0
1000
MPQ3701GR
1239
05-29-13
84
0
1000
MP2109DQ
1303
05-20-13
87
0
1000
MP5000SDQ
1309
05-21-13
84
0
1000
MP2119DQ
1304
06-09-13
85
0
1000
MP3388DR
1231
06-20-13
85
0
1000
MP3388DR
1231
06-20-13
85
0
1000
MP3388DR
1231
06-20-13
85
0
1000
MP2670DQ
1228
06-20-13
85
0
1000
MP2670DQ
1228
06-20-13
85
0
1000
MP2670DQ
1228
06-20-13
85
0
1000
MP2670DQ
1228
06-20-13
85
0
1000
MP2155GQ
1245
06-27-13
94
0
1000
The Future of Analog IC Technology®
- 15 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP20045DQ-25
1302
06-07-13
87
0
1000
MP2209DL
1304
06-08-13
85
0
1000
FA NO.
# of
cycle
MP3388DR
1304
06-08-13
85
0
1000
MP5010ADQ
1309
06-04-13
95
0
1000
MP2119DQ
1309
06-03-13
97
0
1000
MP2119DQ
1309
06-03-13
97
0
1000
MP2119DQ
1309
06-03-13
97
0
1000
MP5010ADQ
1313
06-04-13
95
0
1000
MP5083GG
1317
06-27-13
94
0
1000
MPQ28261DL
1302
04-16-13
50
0
100
MP5010ADQ
1303
06-03-13
50
0
100
MP5000DQ-C266
1302
04-09-13
50
0
100
MP5010DQ
1302
04-09-13
50
0
100
MP5010ADQ
1310
05-16-13
50
0
100
MP2483DQ
1311
04-03-13
50
0
100
MP8726EL
1307
04-11-13
50
0
100
MP28252EL
1310
04-03-13
50
0
100
MP28254EL
1311
04-03-13
50
0
100
MP4459DQT
1246
04-11-13
50
0
100
MP28128DQ
1301
04-03-13
50
0
100
MP3388DR-C414
1311
04-03-13
50
0
100
MP2136EG
1311
04-11-13
50
0
100
MP2005DD
1310
04-09-13
50
0
100
MP2209DL
1309
04-09-13
50
0
100
MP5010BDQ
1312
05-28-13
50
0
100
MP62041DQFU-1
1313
04-25-13
50
0
100
MP2371DG
1310
04-27-13
50
0
100
MP2005DD
1307
04-09-13
50
0
100
MP1517DR
1307
04-09-13
50
0
100
MP2371DG
1311
04-27-13
50
0
100
MP28256EL
1311
05-14-13
50
0
100
MP2635GR
1313
04-12-13
50
0
100
MP28253EL-C323
1313
05-07-13
50
0
100
MP2452DD
1313
04-15-13
50
0
100
MP5010ADQ
1313
05-16-13
50
0
100
MP5010ADQ
1313
05-14-13
50
0
100
MP3388DR-C414
1314
04-23-13
50
0
100
MP28252EL
1313
04-22-13
50
0
100
MP62041DQFU-1
1314
04-25-13
50
0
100
MP4460DQ
1310
06-18-13
50
0
100
MP9115DQT
1315
04-22-13
50
0
100
MP3388DR-C414
1315
04-24-13
50
0
100
The Future of Analog IC Technology®
- 16 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2205DL
1245
04-25-13
50
0
100
MP2106DQ
1313
04-25-13
50
0
100
FA NO.
# of
cycle
MP3388DR-C414
1315
04-24-13
50
0
100
MP2207DQ
1223
05-30-13
50
0
100
MP4561DQ
1309
05-03-13
50
0
100
MP3388DR-C414
1315
04-25-13
50
0
100
MP5010BDQ
1315
05-21-13
50
0
100
MP3388DR-C414
1315
04-26-13
50
0
100
MP2633GR
1315
05-08-13
50
0
100
MP28252EL
1316
05-07-13
50
0
100
MP2604DQ
1247
04-28-13
50
0
100
MP2138DQT
1206
04-28-13
50
0
100
MP38874DL
1315
05-03-13
50
0
100
MP2303DQ
1311
05-18-13
50
0
100
MP3308DL
1305
05-03-13
50
0
100
MP5010DQ
1302
05-07-13
100
0
100
MP28128DQ
1306
05-02-13
50
0
100
MP2121DQ
1314
05-06-13
50
0
100
MP1528DQ
1316
05-06-13
50
0
100
MP8125DR
1316
05-08-13
50
0
100
MP2633GR
1316
05-08-13
50
0
100
MP3388DR-C414
1314
05-08-13
50
0
100
MP2489DQ
1315
05-06-13
50
0
100
MP2109DQ
1315
05-14-13
50
0
100
MP28252EL
1316
05-20-13
50
0
100
MP2012DQ
1316
05-18-13
50
0
100
MP3388DR-C414
1315
05-08-13
50
0
100
MP2209DL
1315
05-08-13
50
0
100
MP28253EL
1314
05-14-13
50
0
100
MP3384EQ
1251
05-09-13
50
0
100
NB634EL
1317
05-10-13
50
0
100
MP5010DQ-C347
1316
05-08-13
50
0
100
MP6400DG-01
1309
05-14-13
50
0
100
MP3388DR-C414
1315
05-08-13
50
0
100
MP3388DR-C414
1315
05-14-13
50
0
100
MP3388DR-C414
1316
05-14-13
50
0
100
MP3388DR-C414
1316
05-15-13
50
0
100
MP2012DQ
1317
05-16-13
50
0
100
MP28255EL
1318
05-10-13
50
0
100
MP5010DQ-C347
1316
05-14-13
50
0
100
MP3388DR-C414
1316
05-14-13
50
0
100
MP1720DQ-216
1318
05-13-13
50
0
100
The Future of Analog IC Technology®
- 17 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3305DD
1317
05-16-13
50
0
100
MP3388DR-C414
1316
05-13-13
50
0
100
FA NO.
# of
cycle
MP1517DR
1317
05-15-13
50
0
100
MP3388DR-C414
1317
05-20-13
50
0
100
MP3388DR-C414
1317
05-20-13
50
0
100
MP3388DR-C414
1317
05-20-13
50
0
100
MP3388DR-C414
1317
05-20-13
50
0
100
MP3304CDD
1317
05-16-13
50
0
100
MPQ4456GQT
1316
05-28-13
50
0
100
MP3388DR-C414
1316
05-20-13
50
0
100
MPQ4459DQT
1238
05-21-13
50
0
100
MP26123DR
1315
05-17-13
47
0
100
MP2106DQ
1316
05-21-13
50
0
100
MP2012DQ
1313
05-22-13
50
0
100
MP2932GQK
1313
05-31-13
45
0
100
MP28256EL
1313
05-21-13
50
0
100
MPQ28261DL
1313
05-27-13
50
0
100
MP28256EL
1311
05-23-13
45
0
100
MP3308DL
1302
05-22-13
50
0
100
MPQ4462DQ
1242
05-23-13
50
0
100
MP5600EUT
1315
05-22-13
50
0
100
MP4460DQ
1318
05-23-13
50
0
100
MP28252EL
1316
05-23-13
50
0
100
MP3388DR-C414
1319
05-29-13
50
0
100
MPQ4559DQ
1319
06-04-13
50
0
100
MP8126DR
1315
05-28-13
50
0
100
MP28252EL
1316
05-28-13
50
0
100
MP28119EG-1.0
1306
05-28-13
50
0
100
MP5010DQ
1319
05-27-13
50
0
100
MP8904DD
1305
05-28-13
50
0
100
MPQ4558DQ
1312
05-28-13
50
0
100
MP3308DL
1320
05-27-13
50
0
100
MP3388SGR
1319
05-29-13
50
0
100
MP28252EL
1316
05-29-13
50
0
100
MP28252EL
1316
05-29-13
50
0
100
MP38872DL
1303
05-29-13
50
0
100
MP3310EQ
1320
05-29-13
50
0
100
MP2565DQ
1319
05-29-13
50
0
100
MP3388DR-C414
1320
05-29-13
50
0
100
MP28256EL
1320
05-29-13
50
0
100
MP26058DQ
1321
05-29-13
50
0
100
MP3388DR-C414
1320
05-30-13
50
0
100
The Future of Analog IC Technology®
- 18 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP4459DQT
1321
06-18-13
50
0
100
MP38874DL
1321
06-03-13
50
0
100
MP2005DD
1313
06-03-13
50
0
100
MP2356EQ
1321
06-03-13
50
0
100
MP3388DR-C414
1320
06-03-13
50
0
100
MP2108DQ
1315
06-03-13
50
0
100
MP2633GR
1320
06-03-13
50
0
100
FA NO.
# of
cycle
MP2214DL
1316
06-03-13
50
0
100
MP3304BDD
1321
06-18-13
50
0
100
MP1530DQ
1319
06-18-13
50
0
100
MP3388DR
1249
06-18-13
50
0
100
MP2102DQ
1317
06-18-13
50
0
100
MP2012DQ
1321
06-18-13
50
0
100
MPQ4456GQT
1321
06-24-13
50
0
100
NB600CQ
1320
06-18-13
50
0
100
MP8125DR
1319
06-24-13
50
0
100
MP2452DD
1320
06-18-13
50
0
100
MP28252EL
1322
06-24-13
50
0
100
MP2633AGR
1321
06-28-13
50
0
100
MP62040DQFU-1
1322
06-18-13
50
0
100
MP3430HQ
1321
06-18-13
50
0
100
MP28252EL
1322
06-24-13
50
0
100
MP3388DR-C414
1321
06-18-13
50
0
100
MP2633GR
1321
06-25-13
50
0
100
MP2633AGR
1322
06-28-13
50
0
100
MP2492DQ
1322
06-18-13
50
0
100
MP3021DQ
1321
06-28-13
50
0
100
MP2633GR
1322
06-25-13
50
0
100
MPQ28261DL
1320
06-25-13
50
0
100
MP2106DQ
1318
06-24-13
50
0
100
MP1720DQ-216
1322
06-25-13
50
0
100
MP2633GR
1323
06-25-13
50
0
100
MP3308DL
1323
06-24-13
50
0
100
MP2633AGR
1322
06-28-13
50
0
100
MP2120DQ
1310
06-24-13
50
0
100
NB600CQ
1321
06-28-13
50
0
100
MP1531DQ
1320
06-24-13
50
0
100
MP28127DQ
1322
06-28-13
50
0
100
MP2635GR
1321
06-28-13
50
0
100
MP2633GR
1323
06-28-13
50
0
100
MP62041DQFU-1
1324
06-28-13
50
0
100
Total
0
The Future of Analog IC Technology®
- 19 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
4.1.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP5000DQ
1249
04-03-13
87
0
168
MP5000DQ
1249
04-03-13
87
0
168
MP2120DQ
1215
05-21-13
47
0
168
MP2120DQ
1219
05-21-13
46
0
168
NB600CQ
1221
05-21-13
50
0
168
FA NO.
# of hrs
NB600CQ
1222
05-21-13
47
0
168
MP2012DQ
1233
05-21-13
47
0
168
MP2012DQ
1236
05-21-13
47
0
168
MP5000DQ
1236
05-31-13
50
0
168
MP5000DQ
1236
05-31-13
50
0
168
MPQ28261DL
1228
05-21-13
47
0
168
MPQ28261DL
1228
05-21-13
47
0
168
MPQ3701GR
1239
05-29-13
87
0
168
MP2109DQ
1303
05-20-13
87
0
168
MP5000SDQ
1309
05-21-13
87
0
168
MP4561DQ
1232
06-08-13
48
0
168
MP4561DQ
1234
06-08-13
47
0
168
MP2119DQ
1304
06-09-13
85
0
168
MP3388DR
1231
06-20-13
85
0
168
MP3388DR
1231
06-20-13
85
0
168
MP3388DR
1231
06-20-13
85
0
168
MP2670DQ
1228
06-20-13
90
0
168
MP2670DQ
1228
06-20-13
90
0
168
MP2670DQ
1228
06-20-13
90
0
168
MP2670DQ
1228
06-20-13
90
0
168
MP2155GQ
1245
06-27-13
87
0
168
MP20045DQ-25
1302
06-07-13
87
0
168
MP2209DL
1304
06-08-13
85
0
168
MP3388DR
1304
06-08-13
85
0
168
MP5010ADQ
1309
06-04-13
95
0
168
MP2119DQ
1309
06-03-13
97
0
168
MP2119DQ
1309
06-03-13
97
0
168
MP2119DQ
1309
06-03-13
97
0
168
MP5010ADQ
1313
06-04-13
95
0
168
MP5083GG
1317
06-27-13
97
0
168
MPQ28261DL
1302
04-16-13
50
0
48
MP5010ADQ
1303
06-03-13
50
0
48
MP5000DQ-C266
1302
04-09-13
50
0
48
The Future of Analog IC Technology®
- 20 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP5010DQ
1302
04-09-13
50
0
48
MP5010ADQ
1310
05-16-13
50
0
48
FA NO.
# of hrs
MP2483DQ
1311
04-03-13
50
0
48
MP8726EL
1307
04-11-13
50
0
48
MP28252EL
1310
04-03-13
50
0
48
MP28254EL
1311
04-03-13
50
0
48
MP4459DQT
1246
04-11-13
50
0
48
MP28128DQ
1301
04-03-13
50
0
48
MP3388DR-C414
1311
04-03-13
50
0
48
MP2136EG
1311
04-11-13
50
0
48
MP2005DD
1310
04-09-13
50
0
48
MP2209DL
1309
04-09-13
50
0
48
MP5010BDQ
1312
05-28-13
50
0
48
MP62041DQFU-1
1313
04-25-13
50
0
48
MP2371DG
1310
04-27-13
50
0
48
MP2005DD
1307
04-09-13
50
0
48
MP1517DR
1307
04-09-13
50
0
48
MP2371DG
1311
04-27-13
50
0
48
MP28256EL
1311
05-14-13
50
0
48
MP2635GR
1313
04-12-13
50
0
48
MP28253EL-C323
1313
05-07-13
50
0
48
MP2452DD
1313
04-15-13
50
0
48
MP5010ADQ
1313
05-16-13
50
0
48
MP5010ADQ
1313
05-14-13
50
0
48
MP3388DR-C414
1314
04-23-13
50
0
48
MP28252EL
1313
04-22-13
50
0
48
MP62041DQFU-1
1314
04-25-13
50
0
48
MP4460DQ
1310
06-18-13
50
0
48
MP9115DQT
1315
04-22-13
50
0
48
MP3388DR-C414
1315
04-24-13
50
0
48
MP2205DL
1245
04-25-13
50
0
48
MP2106DQ
1313
04-25-13
50
0
48
MP3388DR-C414
1315
04-24-13
50
0
48
MP2207DQ
1223
05-30-13
50
0
48
MP4561DQ
1309
05-03-13
50
0
48
MP3388DR-C414
1315
04-25-13
50
0
48
MP5010BDQ
1315
05-21-13
50
0
48
MP3388DR-C414
1315
04-26-13
50
0
48
MP2633GR
1315
05-08-13
50
0
48
MP28252EL
1316
05-07-13
50
0
48
MP2604DQ
1247
04-28-13
50
0
48
MP2138DQT
1206
04-28-13
50
0
48
The Future of Analog IC Technology®
- 21 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP38874DL
1315
05-03-13
50
0
48
MP2303DQ
1311
05-18-13
50
0
48
FA NO.
# of hrs
MP3308DL
1305
05-03-13
50
0
48
MP5010DQ
1302
05-07-13
100
0
48
MP28128DQ
1306
05-02-13
50
0
48
MP2121DQ
1314
05-06-13
50
0
48
MP1528DQ
1316
05-06-13
50
0
48
MP8125DR
1316
05-08-13
50
0
48
MP2633GR
1316
05-08-13
50
0
48
MP3388DR-C414
1314
05-08-13
50
0
48
MP2489DQ
1315
05-06-13
50
0
48
MP2109DQ
1315
05-14-13
50
0
48
MP28252EL
1316
05-20-13
50
0
48
MP2012DQ
1316
05-18-13
50
0
48
MP3388DR-C414
1315
05-08-13
50
0
48
MP2209DL
1315
05-08-13
49
0
48
MP28253EL
1314
05-14-13
50
0
48
MP3384EQ
1251
05-09-13
50
0
48
NB634EL
1317
05-10-13
50
0
48
MP5010DQ-C347
1316
05-08-13
50
0
48
MP6400DG-01
1309
05-14-13
50
0
48
MP3388DR-C414
1315
05-08-13
50
0
48
MP3388DR-C414
1315
05-14-13
50
0
48
MP3388DR-C414
1316
05-14-13
50
0
48
MP3388DR-C414
1316
05-15-13
50
0
48
MP2012DQ
1317
05-16-13
50
0
48
MP28255EL
1318
05-10-13
50
0
48
MP5010DQ-C347
1316
05-14-13
50
0
48
MP3388DR-C414
1316
05-14-13
50
0
48
MP1720DQ-216
1318
05-13-13
50
0
48
MP3305DD
1317
05-16-13
50
0
48
MP3388DR-C414
1316
05-13-13
50
0
48
MP1517DR
1317
05-15-13
50
0
48
MP3388DR-C414
1317
05-20-13
50
0
48
MP3388DR-C414
1317
05-20-13
50
0
48
MP3388DR-C414
1317
05-20-13
50
0
48
MP3388DR-C414
1317
05-20-13
50
0
48
MP3304CDD
1317
05-16-13
50
0
48
MPQ4456GQT
1316
05-28-13
50
0
48
MP3388DR-C414
1316
05-20-13
50
0
48
MPQ4459DQT
1238
05-21-13
50
0
48
MP26123DR
1315
05-17-13
50
0
48
The Future of Analog IC Technology®
- 22 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2106DQ
1316
05-21-13
50
0
48
MP2012DQ
1313
05-22-13
50
0
48
FA NO.
# of hrs
MP2932GQK
1313
05-31-13
50
0
48
MP28256EL
1313
05-21-13
50
0
48
MPQ28261DL
1313
05-27-13
50
0
48
MP28256EL
1311
05-23-13
50
0
48
MP3308DL
1302
05-22-13
50
0
48
MPQ4462DQ
1242
05-23-13
50
0
48
MP5600EUT
1315
05-22-13
50
0
48
MP4460DQ
1318
05-23-13
50
0
48
MP28252EL
1316
05-23-13
50
0
48
MP3388DR-C414
1319
05-29-13
50
0
48
MPQ4559DQ
1319
06-04-13
50
0
48
MP8126DR
1315
05-28-13
50
0
48
MP28252EL
1316
05-28-13
50
0
48
MP28119EG-1.0
1306
05-28-13
50
0
48
MP5010DQ
1319
05-27-13
50
0
48
MP8904DD
1305
05-28-13
50
0
48
MPQ4558DQ
1312
05-28-13
50
0
48
MP3308DL
1320
05-27-13
50
0
48
MP3388SGR
1319
05-29-13
50
0
48
MP28252EL
1316
05-29-13
50
0
48
MP28252EL
1316
05-29-13
50
0
48
MP38872DL
1303
05-29-13
50
0
48
MP3310EQ
1320
05-29-13
50
0
48
MP2565DQ
1319
05-29-13
50
0
48
MP3388DR-C414
1320
05-29-13
50
0
48
MP28256EL
1320
05-29-13
50
0
48
MP26058DQ
1321
05-29-13
50
0
48
MP3388DR-C414
1320
05-30-13
50
0
48
MP4459DQT
1321
06-18-13
50
0
48
MP38874DL
1321
06-03-13
50
0
48
MP2005DD
1313
06-03-13
50
0
48
MP2356EQ
1321
06-03-13
50
0
48
MP3388DR-C414
1320
06-03-13
50
0
48
MP2108DQ
1315
06-03-13
50
0
48
MP2633GR
1320
06-03-13
50
0
48
MP2214DL
1316
06-03-13
50
0
48
MP3304BDD
1321
06-18-13
50
0
48
MP1530DQ
1319
06-18-13
50
0
48
MP3388DR
1249
06-18-13
50
0
48
MP2102DQ
1317
06-18-13
50
0
48
The Future of Analog IC Technology®
- 23 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2012DQ
1321
06-18-13
50
0
FA NO.
# of hrs
48
MPQ4456GQT
1321
06-24-13
50
0
48
NB600CQ
1320
06-18-13
50
0
48
MP8125DR
1319
06-24-13
50
0
48
MP2452DD
1320
06-18-13
50
0
48
MP28252EL
1322
06-24-13
50
0
48
MP2633AGR
1321
06-28-13
50
0
48
MP62040DQFU-1
1322
06-18-13
50
0
48
MP3430HQ
1321
06-18-13
50
0
48
MP28252EL
1322
06-24-13
50
0
48
MP3388DR-C414
1321
06-18-13
50
0
48
MP2633GR
1321
06-25-13
50
0
48
MP2633AGR
1322
06-28-13
50
0
48
MP2492DQ
1322
06-18-13
50
0
48
MP3021DQ
1321
06-28-13
50
0
48
MP2633GR
1322
06-25-13
50
0
48
MPQ28261DL
1320
06-25-13
50
0
48
MP2106DQ
1318
06-24-13
50
0
48
MP1720DQ-216
1322
06-25-13
50
0
48
MP2633GR
1323
06-25-13
50
0
48
MP3308DL
1323
06-24-13
50
0
48
MP2633AGR
1322
06-28-13
50
0
48
MP2120DQ
1310
06-24-13
50
0
48
NB600CQ
1321
06-28-13
50
0
48
MP1531DQ
1320
06-24-13
50
0
48
MP28127DQ
1322
06-28-13
50
0
48
MP2635GR
1321
06-28-13
50
0
48
MP2633GR
1323
06-28-13
50
0
48
MP62041DQFU-1
1324
06-28-13
50
0
48
Total
0
4.1.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2155GQ
1245
06-27-13
90
0
MP2155GQ
1318
06-27-13
102
0
MP5087GQ
1305
06-09-13
80
0
MP5010ADQ
1309
06-04-13
102
0
MP5083GG
1317
06-27-13
80
0
MP5010ADQ
1303
06-03-13
50
0
MP5010ADQ
1310
05-16-13
50
0
FA NO.
The Future of Analog IC Technology®
- 24 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP5010BDQ
1312
05-28-13
50
0
MP5010ADQ
1313
05-16-13
100
0
MP5010ADQ
1313
05-14-13
50
0
MP5010BDQ
1315
05-21-13
50
0
Total
FA NO.
0
4.2 SOIC
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
SOIC8
ANST
SOIC14
UCD
SOIC8-EP
ANST
SOIC16
ANST
SOIC8-7
ANST
SOIC20
ANST
SOIC8
ANST
SOIC28
ANST
SOIC8-EP
UTAC
SOIC8
UTAC
SOIC8-EP
JCET
SOIC8
JCET
SOIC8-EP
JCET
SOIC16
ASE-KS
SOIC8-EP
ASE-KS
SOIC8
4.2.1 Preconditioning
MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ4462DN
1301
05-29-13
270
0
MP8705EN
1309
05-21-13
180
0
MP8709EN
1312
05-29-13
200
0
MP1484EN
1304
06-09-13
180
0
Total
FA NO.
0
SAT picture of SOIC
T-SCAN PICTURE
C-SCAN PICTURE
The Future of Analog IC Technology®
- 25 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
4.2.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ4462DN
1301
05-29-13
84
0
1000
MP8705EN
1309
05-21-13
85
0
1000
MP6211DN
1217
06-06-13
47
0
1000
MP6211DN
1222
06-06-13
47
0
1000
MP2307DN
1228
06-06-13
47
0
1000
MP2307DN
1228
06-06-13
47
0
1000
MP1484EN
1304
06-09-13
85
0
1000
MP24833GN
1305
04-17-13
50
0
100
MP24830HS
1236
04-03-13
50
0
100
MP24830HS-C470H
1236
06-18-13
50
0
100
MP2467DN-C478
1310
04-03-13
50
0
100
FA NO.
# of
cycle
MP2307DN
1305
04-03-13
50
0
100
MP1482DS-C165
1309
04-03-13
50
0
100
MP1482DS-C165
1309
04-03-13
50
0
100
MP1482DS-C165
1309
04-03-13
50
0
100
MP24830HS-C470
1310
04-09-13
50
0
100
MP1484EN-C166
1308
04-09-13
50
0
100
MP8708EN
1306
04-03-13
50
0
100
MP4012DS
1310
04-03-13
50
0
100
MP62061DN
1310
04-09-13
50
0
100
MP8708EN
1306
04-03-13
50
0
100
MP2305DS
1304
04-03-13
50
0
100
MP2562DS
1310
04-03-13
50
0
100
MP2365DN
1309
04-03-13
50
0
100
MP8705EN
1308
04-03-13
50
0
100
MP1484EN
1312
04-09-13
50
0
100
MP1484EN
1312
04-09-13
50
0
100
MP1482DN
1312
04-15-13
50
0
100
MP1587EN
1311
04-09-13
50
0
100
MP4030GS
1310
04-16-13
50
0
100
MP2374DS
1311
04-11-13
50
0
100
MP20051DN
1311
04-09-13
50
0
100
MP62350ES
1312
04-16-13
50
0
100
MP2303ADN
1312
04-25-13
50
0
100
MP2468DN
1311
04-09-13
50
0
100
MP20045DN-33
1304
04-25-13
50
0
100
MP3394SGS
1306
04-08-13
50
0
100
MP1482DN
1312
04-12-13
50
0
100
MP1482DN
1312
04-16-13
50
0
100
The Future of Analog IC Technology®
- 26 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DN
1312
04-16-13
50
0
100
MP6002DN
1310
05-14-13
50
0
100
FA NO.
# of
cycle
MP8709EN
1312
04-28-13
50
0
100
MP1591DN
1312
04-16-13
50
0
100
MP8705EN
1313
04-28-13
50
0
100
MP1584EN
1312
04-24-13
50
0
100
MP6002DN
1312
05-14-13
50
0
100
MP1482DS-C165
1313
04-16-13
50
0
100
MP3394ES-C462
1307
04-22-13
50
0
100
MP4030GS
1313
04-16-13
50
0
100
MP4030GS
1313
05-30-13
50
0
100
MP6205DN
1309
04-11-13
50
0
100
MP3394SGS
1311
04-11-13
50
0
100
MP1582EN
1313
04-16-13
50
0
100
MP1482DN
1313
04-15-13
50
0
100
MP3394ES-C462
1307
04-15-13
50
0
100
MP20051DN
1313
04-16-13
50
0
100
MP6001DN
1311
04-16-13
50
0
100
MP20045DN
1312
04-12-13
50
0
100
MP1582EN
1309
04-16-13
50
0
100
MP2489DN-C489
1310
04-18-13
50
0
100
MP8705EN
1313
04-18-13
50
0
100
MP1482DN
1313
04-17-13
50
0
100
MP3398GS
1308
04-22-13
50
0
100
MP1484EN
1244
04-18-13
50
0
100
MP1484EN
1308
04-22-13
50
0
100
MP6211DN
1313
04-22-13
50
0
100
MP1484EN
1311
04-18-13
50
0
100
MP2307DN
1314
04-19-13
50
0
100
MP1484EN-C166
1302
04-22-13
50
0
100
MP6001DN
1311
04-19-13
50
0
100
MP3394SGS
1312
05-22-13
50
0
100
MP1587EN
1311
05-15-13
50
0
100
MP1584EN
1310
04-27-13
50
0
100
MP6211DN
1314
05-15-13
50
0
100
MP1484EN
1313
04-23-13
50
0
100
MP201DS
1315
06-25-13
50
0
100
MP1482DN
1315
06-18-13
50
0
100
MP2488DN
1310
04-22-13
50
0
100
MP8709EN
1313
04-23-13
50
0
100
MP4462DN
1315
04-26-13
50
0
100
MP2562DS
1313
05-07-13
50
0
100
The Future of Analog IC Technology®
- 27 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS-C165
1314
05-02-13
50
0
100
MP1482DN
1316
04-28-13
50
0
100
MP2374DS
1315
05-07-13
50
0
100
MP1582EN
1315
05-03-13
50
0
100
MP1482DS-C165
1314
05-06-13
50
0
100
MP1482DN
1315
05-06-13
50
0
100
MP1482DN
1315
05-03-13
50
0
100
FA NO.
# of
cycle
MP8705EN
1316
04-28-13
50
0
100
MP1591DN
1315
05-02-13
50
0
100
MP2307DN
1316
05-03-13
50
0
100
MP3394SGS
1315
05-06-13
50
0
100
MP1584EN
1310
05-07-13
50
0
100
MP8705EN
1313
05-07-13
50
0
100
MP1584EN
1315
05-06-13
50
0
100
MP1482DN
1315
05-06-13
50
0
100
MP1482DS-C165
1315
05-06-13
50
0
100
MP1482DN
1315
05-09-13
50
0
100
MP1482DN
1316
05-27-13
50
0
100
MP1482DS-C165
1316
05-08-13
50
0
100
MP9415EN
1306
05-09-13
50
0
100
MP1431DS-C106
1315
05-09-13
50
0
100
MP1482DN
1315
05-27-13
50
0
100
MP2307DN
1315
05-07-13
50
0
100
MP3394ES
1305
05-21-13
50
0
100
MP2307DN
1316
05-08-13
50
0
100
MP2249DN
1315
05-17-13
50
0
100
MP8709EN-C465
1312
05-07-13
50
0
100
MP1482DS-C165
1316
05-07-13
50
0
100
MP1482DN
1317
06-18-13
50
0
100
MP1482DN
1317
05-15-13
50
0
100
MP3394SGS
1316
05-16-13
50
0
100
MP2307DN
1316
05-09-13
50
0
100
MP8706EN
1316
05-09-13
50
0
100
MP6903DS
1312
05-19-13
50
0
100
MP1482DN
1317
05-13-13
50
0
100
MP2307DN
1316
05-09-13
50
0
100
MPGC01DN-C123
1314
05-14-13
50
0
100
MP1906DS
1317
05-14-13
50
0
100
MP1484EN-C166
1318
05-13-13
50
0
100
MP1482DS-C165
1317
05-13-13
50
0
100
MP9415EN
1316
05-15-13
50
0
100
MP1591DN
1318
05-17-13
50
0
100
The Future of Analog IC Technology®
- 28 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS-C165
1318
05-14-13
50
0
100
MP1582EN
1318
05-14-13
50
0
100
MP1482DN
1315
06-18-13
50
0
100
MP6211DN
1317
05-15-13
50
0
100
MP6211DN
1314
05-15-13
50
0
100
MP1482DN
1315
06-18-13
50
0
100
CM500GS
1316
05-17-13
50
0
100
MP20051DN
1318
05-19-13
50
0
100
MP2374DS
1318
05-19-13
50
0
100
MP46885DN
1317
05-15-13
50
0
100
MP3394SGS
1316
05-17-13
50
0
100
MP4030GS
1318
05-17-13
50
0
100
MP6901DS
1317
05-20-13
50
0
100
MP3394ES
1314
05-20-13
50
0
100
MP1482DS-C165
1318
05-22-13
50
0
100
FA NO.
# of
cycle
MP3394ES
1314
05-20-13
50
0
100
MP1582EN
1319
05-23-13
50
0
100
MP1482DN
1319
05-24-13
50
0
100
MP3394SGS
1318
05-27-13
50
0
100
MP4030GS
1320
05-29-13
50
0
100
MP2560DN-C241
1319
05-30-13
50
0
100
MP1484EN-C166
1321
05-31-13
50
0
100
MP1482DN
1321
06-18-13
50
0
100
MP6002DN
1320
06-18-13
50
0
100
MP1484EN-C166
1321
06-03-13
50
0
100
MP2303ADN-C258
1320
06-03-13
50
0
100
MP1482DN
1321
06-18-13
50
0
100
MP1482DN
1321
06-18-13
50
0
100
MP4000DS
1317
06-18-13
50
0
100
MP7720DS
1305
06-18-13
50
0
100
MP8706EN
1318
06-18-13
50
0
100
MP1584EN
1319
06-18-13
50
0
100
MP1484EN
1319
06-18-13
50
0
100
MP2565DN
1321
06-18-13
50
0
100
MP1482DN
1320
06-18-13
50
0
100
MP1482DN
1321
06-28-13
50
0
100
MP1482DS-C165
1320
06-18-13
50
0
100
MP3398GS
1315
06-18-13
50
0
100
DAS09
1319
06-18-13
50
0
100
MP4021GS
1317
06-18-13
50
0
100
MP3394SGS
1319
06-18-13
50
0
100
MP2307DN
1320
06-18-13
50
0
100
The Future of Analog IC Technology®
- 29 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8708EN-C273
1322
06-24-13
50
0
100
MP1482DN
1321
06-28-13
50
0
100
MP1482DN
1321
06-24-13
50
0
100
MP1484EN
1319
06-24-13
50
0
100
MP3394ES-C462
1314
06-18-13
50
0
100
MP1482DN
1321
06-18-13
50
0
100
MP3394ES
1319
06-25-13
50
0
100
MP1482DS-C165
1320
06-18-13
50
0
100
FA NO.
# of
cycle
MP2307DN
1319
06-18-13
50
0
100
MP3394ES
1316
06-25-13
50
0
100
MP1482DN
1322
06-28-13
50
0
100
MP9141ES
1321
06-28-13
50
0
100
MP1482DN
1322
06-28-13
50
0
100
MP1591DS
1322
06-28-13
50
0
100
MP1482DN
1322
06-28-13
50
0
100
MP1584EN-C319
1321
06-18-13
50
0
100
MP2307DN
1320
06-18-13
50
0
100
MP1482DN
1322
06-28-13
50
0
100
MP2307DN
1321
06-24-13
50
0
100
MP2303ADN
1321
06-25-13
50
0
100
MP20051DN
1322
06-24-13
50
0
100
MP1006ES
1322
06-24-13
50
0
100
MP1580HS
1321
06-24-13
50
0
100
MP1484EN-C166
1321
06-24-13
50
0
100
MP1583DN
1321
06-24-13
50
0
100
MP1484EN
1320
06-24-13
50
0
100
MP2305DS
1322
06-25-13
50
0
100
MP9415EN
1319
06-24-13
50
0
100
MP2451DT
1322
06-25-13
50
0
100
MP9415EN
1319
06-25-13
50
0
100
MP62340DS
1322
06-25-13
50
0
100
MP1431DS
1322
06-25-13
50
0
100
MP3394ES
1321
06-25-13
50
0
100
Total
0
4.2.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ4462DN
1301
05-29-13
87
0
168
MP8705EN
1309
05-21-13
85
0
168
FA NO.
# of hrs
The Future of Analog IC Technology®
- 30 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6211DN
1217
06-06-13
47
0
168
MP6211DN
1222
06-06-13
47
0
168
MP2307DN
1228
06-06-13
47
0
168
MP2307DN
1228
06-06-13
47
0
168
MP1484EN
1304
06-09-13
85
0
168
MP24833GN
1305
04-17-13
50
0
48
MP24830HS
1236
04-03-13
50
0
48
FA NO.
# of hrs
MP24830HS-C470H
1236
06-18-13
50
0
48
MP2467DN-C478
1310
04-03-13
50
0
48
MP2307DN
1305
04-03-13
50
0
48
MP1482DS-C165
1309
04-03-13
50
0
48
MP1482DS-C165
1309
04-03-13
50
0
48
MP1482DS-C165
1309
04-03-13
50
0
48
MP24830HS-C470
1310
04-09-13
50
0
48
MP1484EN-C166
1308
04-09-13
50
0
48
MP8708EN
1306
04-03-13
50
0
48
MP4012DS
1310
04-03-13
50
0
48
MP62061DN
1310
04-09-13
50
0
48
MP8708EN
1306
04-03-13
50
0
48
MP2305DS
1304
04-03-13
50
0
48
MP2562DS
1310
04-03-13
50
0
48
MP2365DN
1309
04-03-13
50
0
48
MP8705EN
1308
04-03-13
50
0
48
MP1484EN
1312
04-09-13
50
0
48
MP1484EN
1312
04-09-13
50
0
48
MP1482DN
1312
04-15-13
50
0
48
MP1587EN
1311
04-09-13
50
0
48
MP4030GS
1310
04-16-13
50
0
48
MP2374DS
1311
04-11-13
50
0
48
MP20051DN
1311
04-09-13
50
0
48
MP62350ES
1312
04-16-13
50
0
48
MP2303ADN
1312
04-25-13
50
0
48
MP2468DN
1311
04-09-13
50
0
48
MP20045DN-33
1304
04-25-13
50
0
48
MP3394SGS
1306
04-08-13
50
0
48
MP1482DN
1312
04-12-13
50
0
48
MP1482DN
1312
04-16-13
50
0
48
MP1482DN
1312
04-16-13
50
0
48
MP6002DN
1310
05-14-13
50
0
48
MP8709EN
1312
04-28-13
50
0
48
MP1591DN
1312
04-16-13
50
0
48
MP8705EN
1313
04-28-13
50
0
48
The Future of Analog IC Technology®
- 31 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1584EN
1312
04-24-13
50
0
48
MP6002DN
1312
05-14-13
50
0
48
MP1482DS-C165
1313
04-16-13
50
0
48
MP3394ES-C462
1307
04-22-13
50
0
48
MP4030GS
1313
04-16-13
50
0
48
MP4030GS
1313
05-30-13
50
0
48
FA NO.
# of hrs
MP6205DN
1309
04-11-13
50
0
48
MP3394SGS
1311
04-11-13
50
0
48
MP1582EN
1313
04-16-13
50
0
48
MP1482DN
1313
04-15-13
50
0
48
MP3394ES-C462
1307
04-15-13
50
0
48
MP20051DN
1313
04-16-13
50
0
48
MP6001DN
1311
04-16-13
50
0
48
MP20045DN
1312
04-12-13
50
0
48
MP1582EN
1309
04-16-13
50
0
48
MP2489DN-C489
1310
04-18-13
50
0
48
MP8705EN
1313
04-18-13
50
0
48
MP1482DN
1313
04-17-13
50
0
48
MP3398GS
1308
04-22-13
50
0
48
MP1484EN
1244
04-18-13
50
0
48
MP1484EN
1308
04-22-13
50
0
48
MP6211DN
1313
04-22-13
50
0
48
MP1484EN
1311
04-18-13
50
0
48
MP2307DN
1314
04-19-13
50
0
48
MP1484EN-C166
1302
04-22-13
50
0
48
MP6001DN
1311
04-19-13
50
0
48
MP3394SGS
1312
05-22-13
50
0
48
MP1587EN
1311
05-15-13
50
0
48
MP1584EN
1310
04-27-13
50
0
48
MP6211DN
1314
05-15-13
50
0
48
MP1484EN
1313
04-23-13
50
0
48
MP201DS
1315
06-25-13
50
0
48
MP1482DN
1315
06-18-13
50
0
48
MP2488DN
1310
04-22-13
50
0
48
MP8709EN
1313
04-23-13
50
0
48
MP4462DN
1315
04-26-13
50
0
48
MP2562DS
1313
05-07-13
50
0
48
MP1482DS-C165
1314
05-02-13
50
0
48
MP1482DN
1316
04-28-13
50
0
48
MP2374DS
1315
05-07-13
50
0
48
MP1582EN
1315
05-03-13
50
0
48
MP1482DS-C165
1314
05-06-13
50
0
48
The Future of Analog IC Technology®
- 32 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DN
1315
05-06-13
50
0
48
MP1482DN
1315
05-03-13
50
0
48
FA NO.
# of hrs
MP8705EN
1316
04-28-13
50
0
48
MP1591DN
1315
05-02-13
50
0
48
MP2307DN
1316
05-03-13
50
0
48
MP3394SGS
1315
05-06-13
50
0
48
MP1584EN
1310
05-07-13
50
0
48
MP8705EN
1313
05-07-13
50
0
48
MP1584EN
1315
05-06-13
50
0
48
MP1482DN
1315
05-06-13
50
0
48
MP1482DS-C165
1315
05-06-13
50
0
48
MP1482DN
1315
05-09-13
50
0
48
MP1482DN
1316
05-27-13
50
0
48
MP1482DS-C165
1316
05-08-13
50
0
48
MP9415EN
1306
05-09-13
50
0
48
MP1431DS-C106
1315
05-09-13
50
0
48
MP1482DN
1315
05-27-13
50
0
48
MP2307DN
1315
05-07-13
50
0
48
MP3394ES
1305
05-21-13
50
0
48
MP2307DN
1316
05-08-13
50
0
48
MP2249DN
1315
05-17-13
50
0
48
MP8709EN-C465
1312
05-07-13
50
0
48
MP1482DS-C165
1316
05-07-13
50
0
48
MP1482DN
1317
06-18-13
50
0
48
MP1482DN
1317
05-15-13
50
0
48
MP3394SGS
1316
05-16-13
50
0
48
MP2307DN
1316
05-09-13
50
0
48
MP8706EN
1316
05-09-13
50
0
48
MP6903DS
1312
05-19-13
50
0
48
MP1482DN
1317
05-13-13
50
0
48
MP2307DN
1316
05-09-13
50
0
48
MPGC01DN-C123
1314
05-14-13
50
0
48
MP1906DS
1317
05-14-13
50
0
48
MP1484EN-C166
1318
05-13-13
50
0
48
MP1482DS-C165
1317
05-13-13
50
0
48
MP9415EN
1316
05-15-13
50
0
48
MP1591DN
1318
05-17-13
50
0
48
MP1482DS-C165
1318
05-14-13
50
0
48
MP1582EN
1318
05-14-13
50
0
48
MP1482DN
1315
06-18-13
50
0
48
MP6211DN
1317
05-15-13
50
0
48
MP6211DN
1314
05-15-13
50
0
48
The Future of Analog IC Technology®
- 33 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DN
1315
06-18-13
50
0
48
CM500GS
1316
05-17-13
50
0
48
MP20051DN
1318
05-19-13
50
0
48
MP2374DS
1318
05-19-13
50
0
48
MP46885DN
1317
05-15-13
50
0
48
MP3394SGS
1316
05-17-13
50
0
48
MP4030GS
1318
05-17-13
50
0
48
MP6901DS
1317
05-20-13
50
0
48
MP3394ES
1314
05-20-13
50
0
48
MP1482DS-C165
1318
05-22-13
50
0
48
MP3394ES
1314
05-20-13
50
0
48
FA NO.
# of hrs
MP1582EN
1319
05-23-13
50
0
48
MP1482DN
1319
05-24-13
50
0
48
MP3394SGS
1318
05-27-13
50
0
48
MP4030GS
1320
05-29-13
50
0
48
MP2560DN-C241
1319
05-30-13
50
0
48
MP1484EN-C166
1321
05-31-13
50
0
48
MP1482DN
1321
06-18-13
50
0
48
MP6002DN
1320
06-18-13
50
0
48
MP1484EN-C166
1321
06-03-13
50
0
48
MP2303ADN-C258
1320
06-03-13
50
0
48
MP1482DN
1321
06-18-13
50
0
48
MP1482DN
1321
06-18-13
50
0
48
MP4000DS
1317
06-18-13
50
0
48
MP7720DS
1305
06-18-13
50
0
48
MP8706EN
1318
06-18-13
50
0
48
MP1584EN
1319
06-18-13
50
0
48
MP1484EN
1319
06-18-13
50
0
48
MP2565DN
1321
06-18-13
50
0
48
MP1482DN
1320
06-18-13
50
0
48
MP1482DN
1321
06-28-13
50
0
48
MP1482DS-C165
1320
06-18-13
50
0
48
MP3398GS
1315
06-18-13
50
0
48
DAS09
1319
06-18-13
50
0
48
MP4021GS
1317
06-18-13
50
0
48
MP3394SGS
1319
06-18-13
50
0
48
MP2307DN
1320
06-18-13
50
0
48
MP8708EN-C273
1322
06-24-13
50
0
48
MP1482DN
1321
06-28-13
50
0
48
MP1482DN
1321
06-24-13
50
0
48
MP1484EN
1319
06-24-13
50
0
48
MP3394ES-C462
1314
06-18-13
50
0
48
The Future of Analog IC Technology®
- 34 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DN
1321
06-18-13
50
0
FA NO.
# of hrs
48
MP3394ES
1319
06-25-13
50
0
48
MP1482DS-C165
1320
06-18-13
50
0
48
MP2307DN
1319
06-18-13
50
0
48
MP3394ES
1316
06-25-13
50
0
48
MP1482DN
1322
06-28-13
50
0
48
MP9141ES
1321
06-28-13
50
0
48
MP1482DN
1322
06-28-13
50
0
48
MP1591DS
1322
06-28-13
50
0
48
MP1482DN
1322
06-28-13
50
0
48
MP1584EN-C319
1321
06-18-13
50
0
48
MP2307DN
1320
06-18-13
50
0
48
MP1482DN
1322
06-28-13
50
0
48
MP2307DN
1321
06-24-13
50
0
48
MP2303ADN
1321
06-25-13
50
0
48
MP20051DN
1322
06-24-13
50
0
48
MP1006ES
1322
06-24-13
50
0
48
MP1580HS
1321
06-24-13
50
0
48
MP1484EN-C166
1321
06-24-13
50
0
48
MP1583DN
1321
06-24-13
50
0
48
MP1484EN
1320
06-24-13
50
0
48
MP2305DS
1322
06-25-13
50
0
48
MP9415EN
1319
06-24-13
50
0
48
MP2451DT
1322
06-25-13
50
0
48
MP9415EN
1319
06-25-13
50
0
48
MP62340DS
1322
06-25-13
50
0
48
MP1431DS
1322
06-25-13
50
0
48
MP3394ES
1321
06-25-13
50
0
48
Total
0
4.2.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ4462DN
1301
05-29-13
80
0
MPQ4462DN
1301
05-29-13
107
0
MP8709EN
1312
05-29-13
107
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 35 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
4.3 MSOP
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
MSOP8
ANST
MSOP8-EP
UCD
MSOP10-EP
ANST
MSOP10
UCD
MSOP10
ANST
MSOP10-EP
ANST
MSOP8
4.3.1 Preconditioning
MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8110DK
1316
06-20-13
260
0
Total
FA NO.
0
SAT picture of MSOP
T-SCAN PICTURE
C-SCAN PICTURE
4.3.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP62341DH
1309
04-03-13
50
0
100
MP6211DH
1307
04-09-13
50
0
100
MP6231DH
1309
04-03-13
50
0
100
MP1412DH
1310
04-11-13
50
0
100
FA NO.
# of
cycle
MP2007DH
1310
04-11-13
50
0
100
MP62341DH
1311
04-11-13
50
0
100
MP2481DH
1312
04-16-13
50
0
100
The Future of Analog IC Technology®
- 36 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1412DH
1310
04-17-13
50
0
100
MP1542DK
1310
04-16-13
50
0
100
MP2481DH
1313
04-15-13
50
0
100
FA NO.
# of
cycle
MP1542DK
1313
04-19-13
50
0
100
MP2905EK
1306
06-25-13
50
0
100
MP2361DK
1315
04-22-13
50
0
100
MP2361DK
1312
04-24-13
50
0
100
MP3213DH
1316
05-07-13
50
0
100
MP1542DK
1313
05-09-13
50
0
100
MP2106DK
1318
05-16-13
50
0
100
MP1542DK
1316
05-16-13
50
0
100
MP2105DK
1247
05-27-13
50
0
100
MP1411DH
1316
05-26-13
50
0
100
MP1412DH
1316
05-30-13
50
0
100
MP1411DH
1319
06-18-13
50
0
100
MP2105DK
1320
06-18-13
50
0
100
MP1411DH
1321
06-25-13
50
0
100
MP1542DK-C472
1322
06-25-13
50
0
100
Total
0
4.3.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP62341DH
1309
04-03-13
50
0
48
MP6211DH
1307
04-09-13
50
0
48
MP6231DH
1309
04-03-13
50
0
48
MP1412DH
1310
04-11-13
50
0
48
MP2007DH
1310
04-11-13
50
0
48
MP62341DH
1311
04-11-13
50
0
48
MP2481DH
1312
04-16-13
50
0
48
MP1412DH
1310
04-17-13
50
0
48
MP1542DK
1310
04-16-13
50
0
48
MP2481DH
1313
04-15-13
50
0
48
FA NO.
# of hrs
MP1542DK
1313
04-19-13
50
0
48
MP2905EK
1306
06-25-13
50
0
48
MP2361DK
1315
04-22-13
50
0
48
MP2361DK
1312
04-24-13
50
0
48
MP3213DH
1316
05-07-13
50
0
48
MP1542DK
1313
05-09-13
50
0
48
The Future of Analog IC Technology®
- 37 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1542DK
1313
05-09-13
50
0
48
MP2106DK
1318
05-16-13
50
0
48
MP1542DK
1316
05-16-13
50
0
48
MP2105DK
1247
05-27-13
50
0
48
MP1411DH
1316
05-26-13
50
0
48
MP1412DH
1316
05-30-13
50
0
48
MP1411DH
1319
06-18-13
50
0
48
MP2105DK
1320
06-18-13
50
0
48
MP1411DH
1321
06-25-13
50
0
48
MP1542DK-C472
1322
06-25-13
50
0
48
Total
FA NO.
# of hrs
0
4.4 TSOT
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
ANST
TSOT23-5
JCET
TSOT23-5
ASNT
TSOT23-6
JCET
TSOT23-6
ASNT
TSOT23-8
JCET
TSOT23-8
4.4.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3217DJ
1230
06-03-13
90
0
Total
FA NO.
0
SAT picture of TSOT
T-SCAN PICTURE
C-SCAN PICTURE
The Future of Analog IC Technology®
- 38 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
4.4.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3217DJ
1250
05-20-13
50
0
100
MP3217DJ
1244
05-20-13
50
0
100
MP3217DJ
1250
05-01-13
50
0
100
MP3217DJ
1304
05-20-13
50
0
100
MP3302DJ
1305
06-18-13
50
0
100
MP8802DJ-2.85
1309
04-03-13
50
0
100
MP62551DJ
1309
04-03-13
50
0
100
MPQ2451DT-AEC1
1251
06-18-13
50
0
100
MP3410DJ
1306
05-28-13
50
0
100
MP2259DJ
1310
04-03-13
50
0
100
MP3302DJ-C136
1311
04-03-13
50
0
100
MP8802DJ-3.3
1311
04-09-13
50
0
100
MP65151DJ
1311
04-09-13
50
0
100
MP2259DJ
1310
04-11-13
50
0
100
MP65151DJ
1311
04-03-13
50
0
100
CM600GJ
1313
04-16-13
50
0
100
FA NO.
# of
cycle
CM600GJ
1313
04-03-13
50
0
100
MP3301GJ
1306
04-12-13
50
0
100
MP3217DJ
1305
05-20-13
50
0
100
MP8802DJ-2.85
1311
04-11-13
100
0
100
MP6400DJ-33
1305
04-18-13
50
0
100
MP2128DT
1309
04-19-13
50
0
100
MP8802DJ-2.85
1309
04-16-13
50
0
100
MP6400DJ-01
1311
04-18-13
50
0
100
MP62055EJ
1313
04-19-13
50
0
100
CM600GJ
1315
04-18-13
50
0
100
MP24893DJ
1313
04-18-13
50
0
100
MP2359DT
1310
04-18-13
50
0
100
MP3217DJ
1304
06-18-13
100
0
100
CM600GJ
1315
04-27-13
50
0
100
MP65151DJ
1312
05-03-13
50
0
100
MPQ9361DJ
1252
05-13-13
50
0
100
MP1541DJ
1315
05-21-13
50
0
100
MP2259DJ
1316
05-08-13
50
0
100
MP62055EJ
1315
05-21-13
50
0
100
MP3302DJ
1313
05-13-13
50
0
100
MP3301GJ
1315
05-16-13
50
0
100
MP1518DJ
1316
05-16-13
50
0
100
CM600GJ
1318
05-19-13
50
0
100
The Future of Analog IC Technology®
- 39 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
# of
cycle
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3209DJ
1317
05-20-13
50
0
100
MP1541DJ
1315
05-22-13
50
0
100
MP3302DJ
1315
05-22-13
50
0
100
MP2451DT
1305
05-22-13
50
0
100
CM600GJ
1318
05-30-13
50
0
100
MP3302DJ
1317
05-23-13
48
0
100
MP3217DJ
1314
05-27-13
50
0
100
MP3217DJ
1319
05-27-13
50
0
100
MP3217DJ
1314
05-27-13
50
0
100
MP3217DJ
1314
05-27-13
50
0
100
MP3215DJ
1315
05-29-13
50
0
100
MP2128DT
1319
05-29-13
50
0
100
MP24893DJ
1319
05-30-13
50
0
100
MP3217DJ
1319
06-18-13
50
0
100
MP3217DJ
1319
05-30-13
50
0
100
MP6400DJ-01
1317
05-31-13
50
0
100
MP3120DJ
1316
06-03-13
50
0
100
MP3217DJ
1319
06-03-13
50
0
100
MP3217DJ
1321
06-05-13
50
0
100
MP3217DJ
1321
06-05-13
50
0
100
MP1488DJ
1239
06-18-13
50
0
100
FA NO.
MP2104DJ
1317
06-18-13
50
0
100
MP8802DJ-3.3
1321
06-18-13
50
0
100
MP3302DJ-C136
1320
06-18-13
50
0
100
MP1541DJ
1316
06-18-13
50
0
100
MP2451DT
1319
06-18-13
50
0
100
MP3202DJ
1322
06-28-13
50
0
100
MP62055EJ
1321
06-18-13
50
0
100
MP3217DJ
1321
06-18-13
50
0
100
MP3217DJ
1322
06-18-13
50
0
100
MP6400DJ-09
1304
06-18-13
50
0
100
MP3217DJ
1321
06-24-13
50
0
100
MP2259DJ
1322
06-25-13
50
0
100
MP62551DJ
1323
06-25-13
50
0
100
MP2259DJ
1317
06-25-13
50
0
100
MP65150DJ
1321
06-25-13
50
0
100
Total
0
The Future of Analog IC Technology®
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MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
4.4.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3217DJ
1230
06-03-13
90
0
168
MP3217DJ
1250
05-20-13
50
0
48
MP3217DJ
1244
05-20-13
50
0
48
MP3217DJ
1250
05-01-13
50
0
48
MP3217DJ
1304
05-20-13
50
0
48
MP3302DJ
1305
06-18-13
50
0
48
MP8802DJ-2.85
1309
04-03-13
50
0
48
FA NO.
# of hrs
MP62551DJ
1309
04-03-13
50
0
48
MPQ2451DT-AEC1
1251
06-18-13
50
0
48
MP3410DJ
1306
05-28-13
50
0
48
MP2259DJ
1310
04-03-13
50
0
48
MP3302DJ-C136
1311
04-03-13
50
0
48
MP8802DJ-3.3
1311
04-09-13
50
0
48
MP65151DJ
1311
04-09-13
50
0
48
MP2259DJ
1310
04-11-13
50
0
48
MP65151DJ
1311
04-03-13
50
0
48
CM600GJ
1313
04-16-13
50
0
48
CM600GJ
1313
04-03-13
50
0
48
MP3301GJ
1306
04-12-13
50
0
48
MP3217DJ
1305
05-20-13
50
0
48
MP8802DJ-2.85
1311
04-11-13
100
0
48
MP6400DJ-33
1305
04-18-13
50
0
48
MP2128DT
1309
04-19-13
50
0
48
MP8802DJ-2.85
1309
04-16-13
50
0
48
MP6400DJ-01
1311
04-18-13
50
0
48
MP62055EJ
1313
04-19-13
50
0
48
CM600GJ
1315
04-18-13
50
0
48
MP24893DJ
1313
04-18-13
50
0
48
MP2359DT
1310
04-18-13
50
0
48
MP3217DJ
1304
06-18-13
100
0
48
CM600GJ
1315
04-27-13
50
0
48
MP65151DJ
1312
05-03-13
50
0
48
MPQ9361DJ
1252
05-13-13
50
0
48
MP1541DJ
1315
05-21-13
50
0
48
MP2259DJ
1316
05-08-13
50
0
48
MP62055EJ
1315
05-21-13
50
0
48
MP3302DJ
1313
05-13-13
50
0
48
MP3301GJ
1315
05-16-13
50
0
48
MP1518DJ
1316
05-16-13
50
0
48
The Future of Analog IC Technology®
- 41 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
CM600GJ
1318
05-19-13
50
0
48
MP3209DJ
1317
05-20-13
50
0
48
MP1541DJ
1315
05-22-13
50
0
48
MP3302DJ
1315
05-22-13
50
0
48
MP2451DT
1305
05-22-13
50
0
48
CM600GJ
1318
05-30-13
50
0
48
MP3302DJ
1317
05-23-13
50
0
48
MP3217DJ
1314
05-27-13
50
0
48
MP3217DJ
1319
05-27-13
50
0
48
MP3217DJ
1314
05-27-13
50
0
48
MP3217DJ
1314
05-27-13
50
0
48
FA NO.
# of hrs
MP3215DJ
1315
05-29-13
50
0
48
MP2128DT
1319
05-29-13
50
0
48
MP24893DJ
1319
05-30-13
50
0
48
MP3217DJ
1319
06-18-13
50
0
48
MP3217DJ
1319
05-30-13
50
0
48
MP6400DJ-01
1317
05-31-13
50
0
48
MP3120DJ
1316
06-03-13
50
0
48
MP3217DJ
1319
06-03-13
50
0
48
MP3217DJ
1321
06-05-13
50
0
48
MP3217DJ
1321
06-05-13
50
0
48
MP1488DJ
1239
06-18-13
50
0
48
MP2104DJ
1317
06-18-13
50
0
48
MP8802DJ-3.3
1321
06-18-13
50
0
48
MP3302DJ-C136
1320
06-18-13
50
0
48
MP1541DJ
1316
06-18-13
50
0
48
MP2451DT
1319
06-18-13
50
0
48
MP3202DJ
1322
06-28-13
50
0
48
MP62055EJ
1321
06-18-13
50
0
48
MP3217DJ
1321
06-18-13
50
0
48
MP3217DJ
1322
06-18-13
50
0
48
MP6400DJ-09
1304
06-18-13
50
0
48
MP3217DJ
1321
06-24-13
50
0
48
MP2259DJ
1322
06-25-13
50
0
48
MP62551DJ
1323
06-25-13
50
0
48
MP2259DJ
1317
06-25-13
50
0
48
MP65150DJ
1321
06-25-13
50
0
48
Total
0
The Future of Analog IC Technology®
- 42 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
4.5 TSSOP
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
TSSOP20
ASNT
TSSOP16-EP
UCD
TSSOP20-EP
ASNT
TSSOP20
ASNT
TSSOP8
ASNT
TSSOP20-EP
ASNT
TSSOP14
ASNT
TSSOP24
ASNT
TSSOP16
ASNT
TSSOP28
ASNT
TSSOP28-EP
JCET
TSSOP8
4.5.1 Preconditioning
MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2960TF
1235
04-03-13
170
0
MP7748SGF
1308
04-23-13
100
0
MP7748SGF
1308
04-23-13
100
0
MPQ4570GF
1310
06-03-13
200
0
Total
FA NO.
0
SAT picture of TSSOP
T-SCAN PICTURE
C-SCAN PICTURE
4.5.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
# of
cycle
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2960TF
1235
04-03-13
84
0
1000
MPQ4570GF
1310
06-03-13
94
0
1000
FA NO.
The Future of Analog IC Technology®
- 43 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
# of
cycle
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3389EF-C355
1310
04-03-13
50
0
100
MP8126DF
1309
04-04-13
50
0
100
MP4601EF
1202
04-11-13
50
0
100
MP3389EF
1313
04-19-13
50
0
100
MP1060EF
1313
05-15-13
50
0
100
MP6507GF
1313
05-08-13
49
0
100
MPQ7731DF
1310
04-26-13
50
0
100
MP3394SGF
1313
05-10-13
50
0
100
MP3389EF
1315
05-09-13
50
0
100
MP3394EF
1316
05-15-13
50
0
100
MP3389EF
1316
05-18-13
49
0
100
MP8126DF
1320
05-29-13
50
0
100
FA NO.
MP6505DM
1310
05-31-13
50
0
100
MP3394EF
1319
06-18-13
50
0
100
MP1038EM
1321
06-24-13
50
0
100
MP3389EF
1322
06-28-13
50
0
100
Total
0
4.5.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
FA NO.
# of hrs
6305
168
MP2960TF
1235
04-03-13
80
2
MPQ4570GF
1310
06-03-13
97
0
168
MP3389EF-C355
1310
04-03-13
50
0
48
MP8126DF
1309
04-04-13
50
0
48
MP4601EF
1202
04-11-13
50
0
48
MP3389EF
1313
04-19-13
50
0
48
MP1060EF
1313
05-15-13
50
0
48
MP6507GF
1313
05-08-13
49
0
48
MPQ7731DF
1310
04-26-13
50
0
48
MP3394SGF
1313
05-10-13
50
0
48
MP3389EF
1315
05-09-13
50
0
48
MP3394EF
1316
05-15-13
50
0
48
MP3389EF
1316
05-18-13
49
0
48
MP8126DF
1320
05-29-13
50
0
48
MP6505DM
1310
05-31-13
50
0
48
MP3394EF
1319
06-18-13
50
0
48
MP1038EM
1321
06-24-13
50
0
48
MP3389EF
1322
06-28-13
50
0
48
Total
2
The Future of Analog IC Technology®
- 44 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
4.5.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP7748SGF
1308
04-23-13
78
0
MP7748SGF
1308
04-23-13
78
0
Total
FA NO.
0
4.6 FLIP CHIP-QFN
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
FCQFN1*1.5
UTAC
FCQFN2*2
UCD
FCQFN1.5*2
UTAC
FCQFN2*3
UCD
FCQFN2*2
UTAC
FCQFN3*3
UCD
FCQFN2*3
UTAC
FCQFN3*4
UCD
FCQFN3*3
UTAC
FCQFN4*4
UCD
FCQFN3*4
UTAC
FCQFN4*5
UCD
FCQFN3*5
UTAC
FCQFN4*6
UCD
FCQFN4*4
UTAC
FCQFN5*5
UCD
FCQFN4*5
UTAC
FCQFN5*6
UCD
FCQFN4*6
UTAC
FCQFN6*6
4.6.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB671GQ
1244
04-03-13
99
0
NB671GQ
1244
04-03-13
100
0
NB675GL
1245
04-22-13
189
0
NB675GL
1302
04-22-13
218
0
MP2130DG
1302
05-06-13
120
0
NB671LGQ
1245
04-09-13
180
0
MP1499GD
1303
04-09-13
183
0
MP2130DG
1304
04-22-13
180
0
MP8761GLE
1302
04-26-13
270
0
NB675GL
1302
04-22-13
218
0
MP2130DG
1302
05-06-13
120
0
NB671LGQ
1245
04-09-13
180
0
MP1499GD
1303
04-09-13
183
0
MP2130DG
1304
04-22-13
180
0
FA NO.
The Future of Analog IC Technology®
- 45 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8761GLE
1302
04-26-13
270
0
MP5021GQV
1308
06-20-13
185
0
MP5021GQV
1309
06-20-13
185
0
NB671GQ
1305
06-03-13
270
0
NB671GQ
1308
06-03-13
200
0
NB671GQ
1308
06-03-13
80
0
MP5087GG
1308
06-04-13
270
0
MP2162GQH
1304
05-27-13
100
0
MP8620DQK
1247
04-11-13
100
0
MP8620DQK
1311
04-12-13
100
0
Total
FA NO.
0
SAT picture of FLIP CHIP-QFN
T-SCAN PICTURE
C-SCAN PICTURE
4.6.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB675GL
1245
04-22-13
84
0
1000
NB675GL
1302
04-22-13
77
0
1000
NB671LGQ
1245
04-09-13
84
0
1000
MP1499GD
1303
04-09-13
84
0
1000
MP5021GQV
1248
04-22-13
97
0
1000
FA NO.
# of
cycle
MP2130DG
1304
04-22-13
84
0
1000
MP8761GLE
1302
04-26-13
84
0
1000
NB675GL
1302
04-22-13
77
0
1000
NB671LGQ
1245
04-09-13
84
0
1000
MP1499GD
1303
04-09-13
84
0
1000
The Future of Analog IC Technology®
- 46 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP5021GQV
1248
04-22-13
97
0
1000
MP2130DG
1304
04-22-13
84
0
1000
FA NO.
# of
cycle
MP8761GLE
1302
04-26-13
84
0
1000
MP5021GQV
1308
06-20-13
84
0
1000
MP5021GQV
1309
06-20-13
84
0
1000
NB671GQ
1305
06-03-13
84
0
1000
NB671GQ
1308
06-03-13
94
0
1000
MP5087GG
1308
06-04-13
84
0
1000
MP2617GL
1305
06-18-13
50
0
100
MP2162GQH
1304
05-27-13
50
0
100
MP28258DD
1303
04-03-13
50
0
100
MP86884DQKT
1311
04-03-13
50
0
100
MP86884DQKT
1311
04-03-13
50
0
100
MP2162GQH
1308
06-25-13
50
0
100
MP8736DL
1308
04-03-13
50
0
100
MP8736DL
1305
04-03-13
50
0
100
MP8736DL
1309
04-03-13
50
0
100
MP8736DL
1306
04-03-13
50
0
100
MP8736DL
1308
04-03-13
50
0
100
MP8736DL
1308
04-03-13
50
0
100
MP2130DG
1306
04-03-13
50
0
100
MP2130DG
1306
04-03-13
50
0
100
MP28258DD
1304
04-03-13
50
0
100
MP2334DD
1309
04-03-13
50
0
100
MP8736DL
1308
04-09-13
50
0
100
MP8736DL
1308
04-09-13
50
0
100
MP8761GL
1311
04-09-13
50
0
100
MP2158GQH
1312
04-03-13
100
0
100
MP8736DL
1310
04-09-13
50
0
100
MP8736DL
1308
04-09-13
50
0
100
MP9180DG
1308
04-03-13
50
0
100
MP8736DL
1309
04-09-13
50
0
100
MP8736DL
1310
04-09-13
50
0
100
MP8736DL
1311
04-09-13
100
0
100
MP8736DL
1310
04-09-13
50
0
100
MP8736DL
1309
04-09-13
50
0
100
MP8736DL
1310
04-09-13
50
0
100
MP8736DL
1310
04-09-13
50
0
100
MP28258DD
1304
04-11-13
50
0
100
MP38875DL
1312
05-27-13
50
0
100
MP8736DL
1309
04-09-13
50
0
100
MP28258DD
1302
04-09-13
100
0
100
The Future of Analog IC Technology®
- 47 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1310
04-11-13
50
0
100
MP2140DD
1303
04-16-13
50
0
100
FA NO.
# of
cycle
MP2140DD
1305
04-16-13
50
0
100
MP8736DL
1311
04-11-13
100
0
100
MP8736DL
1310
04-11-13
100
0
100
MP8736DL
1310
04-11-13
100
0
100
MP8736DL
1310
04-11-13
100
0
100
MP8736DL
1310
04-11-13
50
0
100
MP8736DL
1310
04-11-13
100
0
100
MP8736DL
1309
04-11-13
50
0
100
MP8736DL
1309
04-11-13
50
0
100
MP2625GL
1310
04-17-13
99
0
100
MP2625GL
1306
04-17-13
99
0
100
NB638DL
1242
04-29-13
100
0
100
NB650GL
1312
05-20-13
51
0
100
MP8736DL
1311
04-29-13
100
0
100
MP8736DL
1310
04-16-13
100
0
100
MP8736DL
1310
04-16-13
100
0
100
MP28258DD
1303
04-11-13
100
0
100
MP2130DG
1306
04-23-13
100
0
100
MP8736DL
1309
04-16-13
100
0
100
MP8736DL
1310
04-16-13
100
0
100
MP8736DL
1310
04-16-13
100
0
100
MP28259DD
1310
04-16-13
100
0
100
MP8736DL
1310
04-16-13
100
0
100
MP2130DG
1307
04-16-13
100
0
100
NB650HGL
1251
04-19-13
100
0
100
MP8736DL
1311
04-16-13
100
0
100
MP8736DL
1310
04-16-13
100
0
100
MP8736DL
1311
04-16-13
100
0
100
MP9152GD
1312
04-19-13
100
0
100
MP28258DD
1305
04-16-13
100
0
100
MP2130DG
1307
04-16-13
100
0
100
MP2130DG
1307
04-16-13
97
0
100
MP9180DG
1309
04-22-13
100
0
100
MP8736DL
1310
04-18-13
100
0
100
MP8736DL
1310
04-18-13
100
0
100
NB6381DL
1221
04-18-13
100
0
100
MP8736DL
1310
04-18-13
100
0
100
MP8761GL
1313
04-23-13
100
0
100
NB6381DL
1312
04-17-13
100
0
100
MP28258DD-A
1310
04-25-13
100
0
100
The Future of Analog IC Technology®
- 48 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1310
04-22-13
100
0
100
NB6381DL
1311
04-18-13
100
0
100
MP28258DD
1306
04-19-13
100
0
100
MP8736DL
1310
04-22-13
100
0
100
NB638DL
1250
04-29-13
100
0
100
MP8736DL
1310
04-22-13
100
0
100
MP9180DG
1309
04-22-13
100
0
100
FA NO.
# of
cycle
MP8736DL
1311
04-22-13
100
0
100
MP28258DD
1304
04-22-13
100
0
100
MP8762GL
1314
04-23-13
100
0
100
MP8736DL
1311
04-23-13
100
0
100
MP28258DD
1304
04-22-13
100
0
100
MP8736DL
1311
04-22-13
100
0
100
MP8736DL
1311
04-29-13
100
0
100
MP8736DL
1311
04-24-13
100
0
100
MP2130DG
1307
04-25-13
98
0
100
MP8736DL
1311
04-25-13
100
0
100
MP8736DL
1312
04-25-13
100
0
100
MP8736DL
1311
04-25-13
100
0
100
MP38873DL
1312
05-06-13
50
0
100
NB638EL
1238
04-27-13
100
0
100
MP2130DG
1312
04-25-13
100
0
100
MP8736DL
1311
04-25-13
100
0
100
MP8736DL
1311
04-25-13
100
0
100
MP28258DD-C471
1312
04-27-13
100
0
100
MP8736DL
1312
04-25-13
100
0
100
MP9181DD
1301
04-24-13
100
0
100
MP9180DG
1309
04-25-13
97
0
100
MP8736DL
1311
04-27-13
100
0
100
NB650GL
1314
05-02-13
100
0
100
NB638DL
1249
04-26-13
100
0
100
MP2617GL
1311
05-28-13
50
0
100
MP8736DL
1311
04-27-13
100
0
100
MP8736DL
1311
04-27-13
100
0
100
MP2130DG
1312
05-02-13
100
0
100
MP8736DL
1311
05-02-13
100
0
100
MP9180DG
1311
05-02-13
100
0
100
MP8736DL
1311
05-02-13
100
0
100
NB650HGL
1250
05-02-13
100
0
100
MP2130DG
1315
05-02-13
92
0
100
MP9180DG
1311
05-07-13
50
0
100
MP28251GD
1311
05-06-13
50
0
100
The Future of Analog IC Technology®
- 49 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1311
05-07-13
50
0
100
NB650HGL
1251
05-06-13
50
0
100
FA NO.
# of
cycle
MP28251GD
1315
05-14-13
50
0
100
MP2617GL
1316
05-28-13
50
0
100
MP2617GL
1311
06-04-13
50
0
100
MP2130DG
1315
05-06-13
50
0
100
MP28251GD
1315
05-08-13
50
0
100
NB669GQ
1315
05-08-13
50
0
100
MP8736DL
1311
05-08-13
50
0
100
MP28258DD-C471
1313
05-18-13
50
0
100
MP9180DG
1311
05-06-13
50
0
100
MP28251GD
1315
05-05-13
50
0
100
MP2130DG
1317
05-06-13
50
0
100
MP2308GD
1315
05-08-13
50
0
100
NB670GQ
1315
05-09-13
50
0
100
MP8736DL
1311
05-08-13
50
0
100
MP8736DL
1312
05-08-13
50
0
100
MP28258DD
1313
05-08-13
50
0
100
MP2130DG
1315
05-14-13
50
0
100
MP2334DD
1314
05-08-13
50
0
100
MP2308GD
1315
05-14-13
50
0
100
MP8736DL
1312
05-09-13
50
0
100
MP28258DD-A
1317
05-14-13
50
0
100
MP28259DD
1317
05-14-13
50
0
100
MP9180DG
1311
05-14-13
50
0
100
MP28258DD
1304
05-14-13
50
0
100
MP2162GQH
1315
05-14-13
50
0
100
MP9180DG
1314
05-14-13
50
0
100
MP2162GQH
1318
05-27-13
50
0
100
MP8736DL
1312
05-13-13
50
0
100
MP2334DD
1314
05-16-13
50
0
100
MP28258DD
1304
05-18-13
50
0
100
MP9180DG
1314
05-15-13
50
0
100
NB650HGL
1305
05-16-13
50
0
100
MP1499GD
1310
05-16-13
50
0
100
MP2625GL
1311
05-16-13
50
0
100
MP2158GQH
1318
05-15-13
50
0
100
NB650GL
1316
05-20-13
50
0
100
MP28258DD
1317
05-18-13
50
0
100
MP2130DG
1316
05-17-13
50
0
100
NB650GL
1302
05-19-13
97
0
100
MP2130DG
1317
05-20-13
50
0
100
The Future of Analog IC Technology®
- 50 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2130DG
1317
05-20-13
50
0
100
MP28258DD
1304
05-22-13
50
0
100
MP9180DG
1316
05-22-13
50
0
100
MP2130DG
1317
05-22-13
50
0
100
MP28259DD
1318
05-22-13
50
0
100
MP9180DG
1317
05-22-13
50
0
100
MP2130DG
1317
05-23-13
50
0
100
MP2130DG
1317
05-24-13
50
0
100
MP2130DG
1317
05-27-13
50
0
100
MP9180DG
1317
05-27-13
50
0
100
MP28258DD
1304
05-28-13
50
0
100
FA NO.
# of
cycle
MP9180DG
1317
05-29-13
50
0
100
MP28258DD
1305
05-29-13
50
0
100
MP9180DG
1318
05-29-13
50
0
100
MP9180DG
1318
05-29-13
50
0
100
MP9180DG
1316
05-30-13
50
0
100
MP9180DG
1318
05-31-13
50
0
100
MP2130DG
1320
06-03-13
50
0
100
MP2130DG
1320
06-03-13
50
0
100
MP8760GL
1321
06-18-13
50
0
100
MP8606DL
1321
06-18-13
50
0
100
MP28258DD-C471
1318
06-18-13
50
0
100
MP2130DG
1320
06-18-13
50
0
100
MP8736DL
1312
06-18-13
50
0
100
MP8736DL
1311
06-18-13
50
0
100
MP38900DL
1320
06-18-13
50
0
100
MP8736DL
1313
06-18-13
50
0
100
MP28258DD
1321
06-18-13
50
0
100
MP8736DL
1311
06-18-13
50
0
100
MP28259DD
1319
06-24-13
50
0
100
MP38900DL
1321
06-18-13
50
0
100
MP38875DL
1322
06-18-13
50
0
100
MP8736DL
1313
06-18-13
50
0
100
MP9180DG
1320
06-18-13
50
0
100
NB650GL
1319
06-25-13
50
0
100
MP2140DD
1322
06-24-13
50
0
100
MP8736DL
1313
06-18-13
50
0
100
MP8736DL
1311
06-18-13
50
0
100
MP8736DL
1318
06-18-13
50
0
100
MP2162GQH
1322
06-18-13
50
0
100
MP28258DD-A
1321
06-24-13
50
0
100
MP8736DL
1319
06-18-13
50
0
100
The Future of Analog IC Technology®
- 51 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1499GD
1311
06-18-13
50
0
100
MP1499GD
1320
06-18-13
50
0
100
FA NO.
# of
cycle
NB650GL
1321
06-18-13
50
0
100
MP8736DL
1318
06-18-13
50
0
100
MP8736DL
1319
06-18-13
50
0
100
MP8736DL
1318
06-18-13
50
0
100
MP8736DL
1315
06-18-13
50
0
100
MP8736DL
1313
06-18-13
50
0
100
MP8736DL
1315
06-18-13
50
0
100
MP2162GQH
1322
06-18-13
50
0
100
MP8736DL
1319
06-24-13
50
0
100
MP28259DD
1319
06-24-13
50
0
100
MP8736DL
1319
06-24-13
50
0
100
MP28258DD
1305
06-24-13
50
0
100
MP2130DG
1321
06-24-13
50
0
100
MP2162GQH
1323
06-24-13
50
0
100
MP8736DL
1319
06-25-13
50
0
100
MP28257DD
1314
06-28-13
50
0
100
MP2308GD
1322
06-28-13
50
0
100
MP2130DG
1320
06-25-13
50
0
100
MP2162GQH
1323
06-28-13
50
0
100
Total
0
4.6.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB675GL
1245
04-22-13
86
0
168
NB675GL
1302
04-22-13
83
0
168
NB671LGQ
1245
04-09-13
87
0
168
MP1499GD
1303
04-09-13
87
0
168
MP5021GQV
1248
04-22-13
97
0
168
MP2130DG
1304
04-22-13
87
0
168
MP8761GLE
1302
04-26-13
87
0
168
NB675GL
1302
04-22-13
83
0
168
FA NO.
# of hrs
NB671LGQ
1245
04-09-13
87
0
168
MP1499GD
1303
04-09-13
87
0
168
MP5021GQV
1248
04-22-13
97
0
168
MP2130DG
1304
04-22-13
87
0
168
MP8761GLE
1302
04-26-13
87
0
168
NB671GQ
1305
06-03-13
87
0
168
The Future of Analog IC Technology®
- 52 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB671GQ
1308
06-03-13
97
0
168
MP5087GG
1308
06-04-13
85
0
168
FA NO.
# of hrs
MP2617GL
1305
06-18-13
50
0
48
MP2162GQH
1304
05-27-13
50
0
48
MP28258DD
1303
04-03-13
50
0
48
MP86884DQKT
1311
04-03-13
50
0
48
MP86884DQKT
1311
04-03-13
50
0
48
MP2162GQH
1308
06-25-13
50
0
48
MP8736DL
1308
04-03-13
50
0
48
MP8736DL
1305
04-03-13
50
0
48
MP8736DL
1309
04-03-13
50
0
48
MP8736DL
1306
04-03-13
50
0
48
MP8736DL
1308
04-03-13
50
0
48
MP8736DL
1308
04-03-13
50
0
48
MP2130DG
1306
04-03-13
50
0
48
MP2130DG
1306
04-03-13
50
0
48
MP28258DD
1304
04-03-13
50
0
48
MP2334DD
1309
04-03-13
50
0
48
MP8736DL
1308
04-09-13
50
0
48
MP8736DL
1308
04-09-13
50
0
48
MP8761GL
1311
04-09-13
50
0
48
MP2158GQH
1312
04-03-13
100
0
48
MP8736DL
1310
04-09-13
50
0
48
MP8736DL
1308
04-09-13
50
0
48
MP9180DG
1308
04-03-13
50
0
48
MP8620DQK
1247
04-11-13
50
0
48
MP8736DL
1309
04-09-13
50
0
48
MP8736DL
1310
04-09-13
50
0
48
MP8736DL
1311
04-09-13
100
0
48
MP8736DL
1310
04-09-13
50
0
48
MP8736DL
1309
04-09-13
50
0
48
MP8736DL
1310
04-09-13
50
0
48
MP8736DL
1310
04-09-13
50
0
48
MP28258DD
1304
04-11-13
50
0
48
MP38875DL
1312
05-27-13
50
0
48
MP8736DL
1309
04-09-13
50
0
48
MP28258DD
1302
04-09-13
100
0
48
MP8736DL
1310
04-11-13
50
0
48
MP2140DD
1303
04-16-13
50
0
48
MP2140DD
1305
04-16-13
50
0
48
MP8736DL
1311
04-11-13
100
0
48
MP8736DL
1310
04-11-13
100
0
48
The Future of Analog IC Technology®
- 53 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1310
04-11-13
100
0
48
MP8736DL
1310
04-11-13
100
0
48
FA NO.
# of hrs
MP8736DL
1310
04-11-13
50
0
48
MP8736DL
1310
04-11-13
100
0
48
MP8736DL
1309
04-11-13
50
0
48
MP8736DL
1309
04-11-13
50
0
48
MP2625GL
1310
04-17-13
100
0
48
MP2625GL
1306
04-17-13
99
0
48
NB638DL
1242
04-29-13
100
0
48
MP8620DQK
1311
04-12-13
49
0
48
NB650GL
1312
05-20-13
50
0
48
MP8736DL
1311
04-29-13
100
0
48
MP8736DL
1310
04-16-13
100
0
48
MP8736DL
1310
04-16-13
100
0
48
MP28258DD
1303
04-11-13
100
0
48
MP2130DG
1306
04-23-13
100
0
48
MP8736DL
1309
04-16-13
100
0
48
MP8736DL
1310
04-16-13
100
0
48
MP8736DL
1310
04-16-13
100
0
48
MP28259DD
1310
04-16-13
100
0
48
MP8736DL
1310
04-16-13
100
0
48
MP2130DG
1307
04-16-13
100
0
48
NB650HGL
1251
04-19-13
100
0
48
MP8736DL
1311
04-16-13
100
0
48
MP8736DL
1310
04-16-13
100
0
48
MP8736DL
1311
04-16-13
100
0
48
MP9152GD
1312
04-19-13
99
0
48
MP28258DD
1305
04-16-13
100
0
48
MP2130DG
1307
04-16-13
100
0
48
MP2130DG
1307
04-16-13
100
0
48
MP9180DG
1309
04-22-13
100
0
48
MP8736DL
1310
04-18-13
100
0
48
MP8736DL
1310
04-18-13
100
0
48
NB6381DL
1221
04-18-13
100
0
48
MP8736DL
1310
04-18-13
100
0
48
MP8761GL
1313
04-23-13
100
0
48
NB6381DL
1312
04-17-13
100
0
48
MP28258DD-A
1310
04-25-13
100
0
48
MP8736DL
1310
04-22-13
100
0
48
NB6381DL
1311
04-18-13
100
0
48
MP28258DD
1306
04-19-13
100
0
48
MP8736DL
1310
04-22-13
99
0
48
The Future of Analog IC Technology®
- 54 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB638DL
1250
04-29-13
100
0
48
MP8736DL
1310
04-22-13
100
0
48
MP9180DG
1309
04-22-13
100
0
48
MP8736DL
1311
04-22-13
100
0
48
MP28258DD
1304
04-22-13
100
0
48
MP8762GL
1314
04-23-13
100
0
48
MP8736DL
1311
04-23-13
100
0
48
MP28258DD
1304
04-22-13
100
0
48
MP8736DL
1311
04-22-13
100
0
48
MP8736DL
1311
04-29-13
100
0
48
MP8736DL
1311
04-24-13
100
0
48
MP2130DG
1307
04-25-13
100
0
48
MP8736DL
1311
04-25-13
100
0
48
MP8736DL
1312
04-25-13
100
0
48
MP8736DL
1311
04-25-13
100
0
48
MP38873DL
1312
05-06-13
50
0
48
NB638EL
1238
04-27-13
100
0
48
MP2130DG
1312
04-25-13
100
0
48
MP8736DL
1311
04-25-13
100
0
48
MP8736DL
1311
04-25-13
100
0
48
MP28258DD-C471
1312
04-27-13
100
0
48
MP8736DL
1312
04-25-13
100
0
48
MP9181DD
1301
04-24-13
100
0
48
MP9180DG
1309
04-25-13
100
0
48
MP8736DL
1311
04-27-13
100
0
48
NB650GL
1314
05-02-13
100
0
48
NB638DL
1249
04-26-13
100
0
48
MP2617GL
1311
05-28-13
50
0
48
MP8736DL
1311
04-27-13
100
0
48
MP8736DL
1311
04-27-13
100
0
48
MP2130DG
1312
05-02-13
100
0
48
MP8736DL
1311
05-02-13
100
0
48
MP9180DG
1311
05-02-13
100
0
48
FA NO.
# of hrs
MP8736DL
1311
05-02-13
100
0
48
NB650HGL
1250
05-02-13
100
0
48
MP2130DG
1315
05-02-13
100
0
48
MP9180DG
1311
05-07-13
50
0
48
MP28251GD
1311
05-06-13
50
0
48
MP8736DL
1311
05-07-13
50
0
48
NB650HGL
1251
05-06-13
50
0
48
MP28251GD
1315
05-14-13
50
0
48
MP2130DG
1315
05-06-13
50
0
48
The Future of Analog IC Technology®
- 55 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28251GD
1315
05-08-13
50
0
48
NB669GQ
1315
05-08-13
50
0
48
FA NO.
# of hrs
MP8736DL
1311
05-08-13
50
0
48
MP28258DD-C471
1313
05-18-13
50
0
48
MP9180DG
1311
05-06-13
50
0
48
MP28251GD
1315
05-05-13
50
0
48
MP2130DG
1317
05-06-13
50
0
48
MP2308GD
1315
05-08-13
50
0
48
NB670GQ
1315
05-09-13
50
0
48
MP8736DL
1311
05-08-13
50
0
48
MP8736DL
1312
05-08-13
50
0
48
MP28258DD
1313
05-08-13
47
0
48
MP2130DG
1315
05-14-13
50
0
48
MP2334DD
1314
05-08-13
50
0
48
MP2308GD
1315
05-14-13
50
0
48
MP8736DL
1312
05-09-13
50
0
48
MP28258DD-A
1317
05-14-13
50
0
48
MP28259DD
1317
05-14-13
50
0
48
MP9180DG
1311
05-14-13
50
0
48
MP28258DD
1304
05-14-13
50
0
48
MP2162GQH
1315
05-14-13
50
0
48
MP9180DG
1314
05-14-13
50
0
48
MP2162GQH
1318
05-27-13
50
0
48
MP8736DL
1312
05-13-13
50
0
48
MP2334DD
1314
05-16-13
50
0
48
MP28258DD
1304
05-18-13
50
0
48
MP9180DG
1314
05-15-13
50
0
48
MP8620DQK
1316
05-16-13
50
0
48
MP8620DQK
1316
05-16-13
50
0
48
NB650HGL
1305
05-16-13
50
0
48
MP1499GD
1310
05-16-13
50
0
48
MP2625GL
1311
05-16-13
50
0
48
MP2158GQH
1318
05-15-13
50
0
48
NB650GL
1316
05-20-13
50
0
48
MP28258DD
1317
05-18-13
50
0
48
MP2130DG
1316
05-17-13
50
0
48
NB650GL
1302
05-19-13
95
0
48
MP2130DG
1317
05-20-13
50
0
48
MP2130DG
1317
05-20-13
50
0
48
MP28258DD
1304
05-22-13
50
0
48
MP9180DG
1316
05-22-13
50
0
48
MP2130DG
1317
05-22-13
50
0
48
The Future of Analog IC Technology®
- 56 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28259DD
1318
05-22-13
50
0
48
MP9180DG
1317
05-22-13
50
0
48
MP2130DG
1317
05-23-13
50
0
48
MP2130DG
1317
05-24-13
50
0
48
MP2130DG
1317
05-27-13
50
0
48
MP9180DG
1317
05-27-13
50
0
48
MP28258DD
1304
05-28-13
50
0
48
FA NO.
# of hrs
MP9180DG
1317
05-29-13
50
0
48
MP28258DD
1305
05-29-13
50
0
48
MP9180DG
1318
05-29-13
50
0
48
MP9180DG
1318
05-29-13
50
0
48
MP9180DG
1316
05-30-13
50
0
48
MP9180DG
1318
05-31-13
50
0
48
MP2130DG
1320
06-03-13
50
0
48
MP2130DG
1320
06-03-13
50
0
48
MP8760GL
1321
06-18-13
50
0
48
MP8606DL
1321
06-18-13
50
0
48
MP28258DD-C471
1318
06-18-13
50
0
48
MP2130DG
1320
06-18-13
50
0
48
MP8736DL
1312
06-18-13
50
0
48
MP8736DL
1311
06-18-13
50
0
48
MP38900DL
1320
06-18-13
50
0
48
MP8736DL
1313
06-18-13
50
0
48
MP28258DD
1321
06-18-13
50
0
48
MP8736DL
1311
06-18-13
50
0
48
MP28259DD
1319
06-24-13
50
0
48
MP38900DL
1321
06-18-13
50
0
48
MP38875DL
1322
06-18-13
50
0
48
MP8736DL
1313
06-18-13
50
0
48
MP9180DG
1320
06-18-13
50
0
48
NB650GL
1319
06-25-13
50
0
48
MP2140DD
1322
06-24-13
50
0
48
MP8736DL
1313
06-18-13
50
0
48
MP8736DL
1311
06-18-13
50
0
48
MP8736DL
1318
06-18-13
50
0
48
MP2162GQH
1322
06-18-13
50
0
48
MP28258DD-A
1321
06-24-13
50
0
48
MP8736DL
1319
06-18-13
50
0
48
MP1499GD
1311
06-18-13
50
0
48
MP1499GD
1320
06-18-13
50
0
48
NB650GL
1321
06-18-13
50
0
48
MP8736DL
1318
06-18-13
50
0
48
The Future of Analog IC Technology®
- 57 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1319
06-18-13
50
0
48
MP8736DL
1318
06-18-13
50
0
48
MP8736DL
1315
06-18-13
50
0
48
MP8736DL
1313
06-18-13
50
0
48
MP8736DL
1315
06-18-13
50
0
48
MP2162GQH
1322
06-18-13
50
0
48
MP8736DL
1319
06-24-13
50
0
48
MP28259DD
1319
06-24-13
50
0
48
FA NO.
# of hrs
MP8736DL
1319
06-24-13
50
0
48
MP28258DD
1305
06-24-13
50
0
48
MP2130DG
1321
06-24-13
50
0
48
MP2162GQH
1323
06-24-13
50
0
48
MP8736DL
1319
06-25-13
50
0
48
MP28257DD
1314
06-28-13
50
0
48
MP2308GD
1322
06-28-13
50
0
48
MP2130DG
1320
06-25-13
50
0
48
MP2162GQH
1323
06-28-13
50
0
48
Total
0
4.6.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2130DG
1302
05-06-13
90
0
MP2130DG
1302
05-06-13
90
0
NB671GQ
1308
06-03-13
80
0
MP2617GL
1305
06-18-13
50
0
MP38875DL
1312
05-27-13
44
0
MP38873DL
1312
05-06-13
45
0
MP2617GL
1311
05-28-13
50
0
MP2617GL
1316
05-28-13
50
0
MP2617GL
1311
06-04-13
50
0
Total
FA NO.
0
4.7 FLIP CHIP-SOIC
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE PACKAGE
ASSY SITE
PACKAGE
UCD
ANST
FCSOIC8
JCET
JCAP
FCSOIC8
FCSOIC8
ANST
FCSOIC16
FCSOIC8
The Future of Analog IC Technology®
- 58 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
4.7.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS-C416
1318
06-18-13
100
0
FA NO.
SAT picture of FLIP CHIP-SOIC
T-SCAN PICTURE
C-SCAN PICTURE
4.7.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1305
04-03-13
50
0
1000
MP1482DS
1305
04-11-13
50
0
1000
MP1482DS
1252
05-07-13
408
0
1000
MP1482DS
1307
04-16-13
50
0
1000
MP1482DS
1309
04-23-13
50
0
1000
MP1482DS
1312
04-10-13
91
0
1000
MP1482DS
1313
05-08-13
100
0
1000
MP1482DS
1311
05-09-13
100
0
1000
MP1482DS
1312
04-09-13
100
0
100
MP1482DS
1312
04-03-13
100
0
100
MP1482DS
1310
04-09-13
100
0
100
MP1482DS
1310
04-07-13
100
0
100
MP1482DS
1312
04-09-13
100
0
100
MP1482DS
1312
04-09-13
100
0
100
MP1482DS
1312
04-09-13
100
0
100
MP1482DS
1310
04-09-13
100
0
100
FA NO.
# of
cycle
The Future of Analog IC Technology®
- 59 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1312
04-09-13
100
0
100
MP1492DS
1232
04-11-13
100
0
100
FA NO.
# of
cycle
MP1482DS
1313
04-16-13
99
0
100
MP1482DS
1310
04-16-13
100
0
100
MP1482DS
1312
04-16-13
100
0
100
MP1482DS
1312
04-16-13
100
0
100
MP1492DS
1310
04-16-13
100
0
100
MP1492DS
1233
04-15-13
100
0
100
MP1493DS-A
1313
04-16-13
100
0
100
MP1492DS-C469
1312
04-15-13
100
0
100
MP1482DS
1314
04-16-13
100
0
100
MP1482DS
1314
04-16-13
100
0
100
MP1493DS
1229
04-15-13
100
0
100
MP1482DS
1311
04-16-13
100
0
100
MP1482DS
1312
04-22-13
100
0
100
MP1482DS
1314
04-22-13
100
0
100
MP1492DS
1235
04-22-13
94
0
100
MP1493DS
1310
04-22-13
98
0
100
MP1493DS-A
1313
04-22-13
100
0
100
MP1482DS
1312
04-18-13
100
0
100
MP1482DS
1312
06-09-13
100
0
100
MP1493DS
1312
04-19-13
100
0
100
MP1492DS
1229
04-19-13
100
0
100
MP1482DS
1312
04-22-13
100
0
100
MP1493DS-C480
1312
04-23-13
100
0
100
MP1482SDS-C416
1312
06-09-13
100
0
100
MP1482DS
1315
04-22-13
100
0
100
MP1482DS
1314
05-06-13
100
0
100
MP1482DS
1314
04-26-13
100
0
100
MP1493DS
1312
04-24-13
100
0
100
MP1492DS
1232
04-24-13
100
0
100
MP1493DS-A
1314
04-24-13
100
0
100
MP1492DS
1231
05-03-13
100
0
100
MP1482DS
1314
05-06-13
100
0
100
MP1492DS
1233
05-03-13
100
0
100
MP1482DS
1314
04-26-13
100
0
100
MP1482DS
1314
04-25-13
100
0
100
MP1482DS
1314
04-26-13
100
0
100
MP1482DS
1315
04-26-13
100
0
100
MP1482DS
1315
04-26-13
100
0
100
MP1482DS
1315
05-03-13
100
0
100
MP1492DS-A
1311
05-03-13
100
0
100
The Future of Analog IC Technology®
- 60 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1315
04-28-13
100
0
100
MP1482DS
1314
04-28-13
100
0
100
MP28258DS
1311
05-03-13
100
0
100
MP1482DS
1316
05-02-13
100
0
100
MP1492DS-A
1218
05-02-13
100
0
100
MP1482DS
1314
05-10-13
100
0
100
MP1492DS
1252
05-03-13
100
0
100
MP1493DS-C493
1316
05-06-13
100
0
100
MP1482DS
1315
05-06-13
50
0
100
MP1482DS
1315
05-08-13
50
0
100
MP1482DS
1315
05-08-13
50
0
100
MP1493DS-C456
1312
05-07-13
100
0
100
MP1482DS
1316
05-10-13
50
0
100
MP1482DS
1316
05-07-13
50
0
100
MP1482DS
1316
05-07-13
50
0
100
MP1482DS
1316
05-09-13
50
0
100
MP1493DS
1312
05-14-13
50
0
100
MP1482DS
1314
05-15-13
50
0
100
MP1482DS
1315
05-13-13
50
0
100
MP1493DS
1312
05-14-13
50
0
100
MP1482DS
1317
05-15-13
50
0
100
MP1482DS
1317
05-15-13
50
0
100
MP1482SDS-C416
1318
05-15-13
50
0
100
MP1482DS
1317
06-25-13
50
0
100
FA NO.
# of
cycle
MP1482SDS-C416
1318
05-15-13
50
0
100
MP1492DS-A-C528
1311
05-19-13
50
0
100
MP1482DS
1317
05-18-13
50
0
100
MP1482DS
1317
05-18-13
50
0
100
MP1482DS
1317
05-22-13
50
0
100
MP1482DS
1316
05-22-13
50
0
100
MP1482DS
1319
05-27-13
50
0
100
MP1482DS
1316
05-22-13
50
0
100
MP1482DS
1317
05-22-13
50
0
100
MP28258DS
1317
05-29-13
50
0
100
MP1482DS
1319
05-23-13
50
0
100
MP1482DS
1319
05-27-13
50
0
100
MP1482DS
1319
05-29-13
50
0
100
MP1482DS
1320
05-29-13
50
0
100
MP1482DS
1319
05-29-13
50
0
100
MP1482DS
1320
05-29-13
50
0
100
MP1482DS
1319
05-29-13
50
0
100
MP1482DS
1319
05-29-13
50
0
100
The Future of Analog IC Technology®
- 61 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1320
06-03-13
50
0
100
MP1482DS
1319
06-03-13
50
0
100
MP1482DS
1319
06-03-13
50
0
100
MP1492DS
1319
06-03-13
50
0
100
MP1482DS
1319
06-18-13
50
0
100
MP1482DS
1321
06-18-13
50
0
100
MP1482DS
1320
06-18-13
50
0
100
MP1482DS
1319
06-18-13
50
0
100
FA NO.
# of
cycle
MP1492DS-A
1319
06-18-13
50
0
100
MP1482DS
1320
06-18-13
50
0
100
MP1482SDS-C416
1318
06-18-13
50
0
100
MP1482DS
1318
06-18-13
50
0
100
MP1482DS
1320
06-18-13
50
0
100
MP1482DS
1320
06-18-13
50
0
100
MP1482DS
1314
06-18-13
50
0
100
MP1482DS
1301
06-18-13
50
0
100
MP1482DS
1316
06-18-13
50
0
100
MP1482DS
1321
06-18-13
50
0
100
MP1492DS
1321
06-18-13
50
0
100
MP1482DS
1322
06-18-13
50
0
100
MP1482DS-C416
1318
06-18-13
50
0
100
MP1492DS
1319
06-18-13
50
0
100
MP28258DS
1319
06-18-13
50
0
100
MP1482DS
1321
06-24-13
50
0
100
MP1482DS
1321
06-24-13
50
0
100
MP1492DS-A
1322
06-24-13
50
0
100
MP1482DS
1322
06-25-13
50
0
100
MP1493DS-C480
1312
06-25-13
50
0
100
MP1482DS
1322
06-25-13
50
0
100
MP1482DS
1322
06-25-13
50
0
100
MP1492DS
1316
06-25-13
50
0
100
MP1482DS
1321
06-25-13
50
0
100
MP1482DS
1322
06-25-13
50
0
100
Total
0
4.7.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1228
06-03-13
500
0
168
MP1482DS
1305
04-03-13
50
0
168
MP1482DS
1305
04-11-13
50
0
168
FA NO.
# of hrs
The Future of Analog IC Technology®
- 62 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1252
05-07-13
453
0
168
MP1482DS
1307
04-16-13
50
0
168
MP1482DS
1309
04-23-13
50
0
168
MP1482DS
1312
04-10-13
94
0
168
MP1482DS
1313
05-08-13
100
0
168
MP1482DS
1311
05-09-13
100
0
168
MP1482DS
1311
06-18-13
500
0
168
MP1482DS
1312
04-09-13
100
0
48
MP1482DS
1312
04-03-13
100
0
48
MP1482DS
1310
04-09-13
100
0
48
MP1482DS
1310
04-07-13
100
0
48
MP1482DS
1312
04-09-13
100
0
48
MP1482DS
1312
04-09-13
100
0
48
MP1482DS
1312
04-09-13
100
0
48
MP1482DS
1310
04-09-13
100
0
48
MP1482DS
1312
04-09-13
100
0
48
MP1492DS
1232
04-11-13
100
0
48
MP1482DS
1313
04-16-13
99
0
48
MP1482DS
1310
04-16-13
100
0
48
MP1482DS
1312
04-16-13
100
0
48
MP1482DS
1312
04-16-13
100
0
48
MP1492DS
1310
04-16-13
100
0
48
MP1492DS
1233
04-15-13
100
0
48
MP1493DS-A
1313
04-16-13
100
0
48
MP1492DS-C469
1312
04-15-13
100
0
48
MP1482DS
1314
04-16-13
100
0
48
MP1482DS
1314
04-16-13
100
0
48
MP1493DS
1229
04-15-13
100
0
48
MP1482DS
1311
04-16-13
100
0
48
MP1482DS
1312
04-22-13
100
0
48
MP1482DS
1314
04-22-13
100
0
48
MP1492DS
1235
04-22-13
94
0
48
MP1493DS
1310
04-22-13
98
0
48
MP1493DS-A
1313
04-22-13
100
0
48
MP1482DS
1312
04-18-13
100
0
48
MP1482DS
1312
06-09-13
100
0
48
MP1493DS
1312
04-19-13
100
0
48
MP1492DS
1229
04-19-13
100
0
48
MP1482DS
1312
04-22-13
100
0
48
MP1493DS-C480
1312
04-23-13
100
0
48
MP1482SDS-C416
1312
06-09-13
100
0
48
MP1482DS
1315
04-22-13
100
0
48
FA NO.
# of hrs
The Future of Analog IC Technology®
- 63 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1314
05-06-13
100
0
48
MP1482DS
1314
04-26-13
100
0
48
MP1493DS
1312
04-24-13
100
0
48
MP1492DS
1232
04-24-13
100
0
48
FA NO.
# of hrs
MP1493DS-A
1314
04-24-13
100
0
48
MP1492DS
1231
05-03-13
100
0
48
MP1482DS
1314
05-06-13
100
0
48
MP1492DS
1233
05-03-13
100
0
48
MP1482DS
1314
04-26-13
100
0
48
MP1482DS
1314
04-25-13
100
0
48
MP1482DS
1314
04-26-13
100
0
48
MP1482DS
1315
04-26-13
100
0
48
MP1482DS
1315
04-26-13
100
0
48
MP1482DS
1315
05-03-13
100
0
48
MP1492DS-A
1311
05-03-13
100
0
48
MP1482DS
1315
04-28-13
100
0
48
MP1482DS
1314
04-28-13
100
0
48
MP28258DS
1311
05-03-13
100
0
48
MP1482DS
1316
05-02-13
100
0
48
MP1492DS-A
1218
05-02-13
100
0
48
MP1482DS
1314
05-10-13
100
0
48
MP1492DS
1252
05-03-13
100
0
48
MP1493DS-C493
1316
05-06-13
100
0
48
MP1482DS
1315
05-06-13
50
0
48
MP1482DS
1315
05-08-13
50
0
48
MP1482DS
1315
05-08-13
50
0
48
MP1493DS-C456
1312
05-07-13
100
0
48
MP1482DS
1316
05-10-13
50
0
48
MP1482DS
1316
05-07-13
50
0
48
MP1482DS
1316
05-07-13
50
0
48
MP1482DS
1316
05-09-13
50
0
48
MP1493DS
1312
05-14-13
50
0
48
MP1482DS
1314
05-15-13
50
0
48
MP1482DS
1315
05-13-13
50
0
48
MP1493DS
1312
05-14-13
50
0
48
MP1482DS
1317
05-15-13
50
0
48
MP1482DS
1317
05-15-13
50
0
48
MP1482SDS-C416
1318
05-15-13
50
0
48
MP1482DS
1317
06-25-13
50
0
48
MP1482SDS-C416
1318
05-15-13
50
0
48
MP1492DS-A-C528
1311
05-19-13
50
0
48
MP1482DS
1317
05-18-13
50
0
48
The Future of Analog IC Technology®
- 64 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1317
05-18-13
50
0
48
MP1482DS
1317
05-22-13
50
0
48
MP1482DS
1316
05-22-13
50
0
48
MP1482DS
1319
05-27-13
50
0
48
MP1482DS
1316
05-22-13
50
0
48
MP1482DS
1317
05-22-13
50
0
48
MP28258DS
1317
05-29-13
50
0
48
MP1482DS
1319
05-23-13
50
0
48
MP1482DS
1319
05-27-13
50
0
48
MP1482DS
1319
05-29-13
50
0
48
MP1482DS
1320
05-29-13
50
0
48
MP1482DS
1319
05-29-13
50
0
48
MP1482DS
1320
05-29-13
50
0
48
MP1482DS
1319
05-29-13
50
0
48
MP1482DS
1319
05-29-13
50
0
48
MP1482DS
1320
06-03-13
50
0
48
MP1482DS
1319
06-03-13
50
0
48
MP1482DS
1319
06-03-13
50
0
48
MP1492DS
1319
06-03-13
50
0
48
MP1482DS
1319
06-18-13
50
0
48
MP1482DS
1321
06-18-13
50
0
48
MP1482DS
1320
06-18-13
50
0
48
MP1482DS
1319
06-18-13
50
0
48
MP1492DS-A
1319
06-18-13
50
0
48
FA NO.
# of hrs
MP1482DS
1320
06-18-13
50
0
48
MP1482SDS-C416
1318
06-18-13
50
0
48
MP1482DS
1318
06-18-13
50
0
48
MP1482DS
1320
06-18-13
50
0
48
MP1482DS
1320
06-18-13
50
0
48
MP1482DS
1314
06-18-13
50
0
48
MP1482DS
1301
06-18-13
50
0
48
MP1482DS
1316
06-18-13
50
0
48
MP1482DS
1321
06-18-13
50
0
48
MP1492DS
1321
06-18-13
50
0
48
MP1482DS
1322
06-18-13
50
0
48
MP1482DS-C416
1318
06-18-13
50
0
48
MP1492DS
1319
06-18-13
50
0
48
MP28258DS
1319
06-18-13
50
0
48
MP1482DS
1321
06-24-13
50
0
48
MP1482DS
1321
06-24-13
50
0
48
MP1492DS-A
1322
06-24-13
50
0
48
MP1482DS
1322
06-25-13
50
0
48
The Future of Analog IC Technology®
- 65 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1493DS-C480
1312
06-25-13
50
0
48
MP1482DS
1322
06-25-13
50
0
48
MP1482DS
1322
06-25-13
50
0
48
MP1492DS
1316
06-25-13
50
0
48
MP1482DS
1321
06-25-13
50
0
48
MP1482DS
1322
06-25-13
50
0
48
Total
FA NO.
# of hrs
0
4.8 FLIP CHIP-TSOT
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
ANST
FCTSOT-5
JCET
FCTSOT-6
ANST
FCTSOT-6
JCET
FCTSOT-8
ANST
FCTSOT-8
4.8.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1494DJ
1302
04-03-13
270
0
MP1494DJ
1245
04-22-13
350
0
MP1494DJ
1247
04-22-13
350
0
MP1494DJ
1249
04-22-13
350
0
MP1494DJ
1302
04-22-13
360
0
MP1494DJ
1306
04-26-13
600
0
MP1494DJ
1245
04-22-13
350
0
MP1494DJ
1247
04-22-13
350
0
MP1494DJ
1249
04-22-13
350
0
MP1494DJ
1302
04-22-13
360
0
MP1494DJ
1306
04-26-13
600
0
MP1470GJ
1316
06-20-13
600
0
MP2161GJ
1305
06-08-13
180
0
MP2234GJ
1305
06-05-13
102
0
MP1470GJ
1313
06-04-13
600
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 66 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
SAT picture of FLIP CHIP-TSOT
T-SCAN PICTURE
C-SCAN PICTURE
4.8.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1494DJ
1302
04-03-13
84
0
1000
MP1494DJ
1245
04-22-13
84
0
1000
MP1494DJ
1247
04-22-13
84
0
1000
MP1494DJ
1249
04-22-13
84
0
1000
MP1494DJ
1302
04-22-13
84
0
1000
MP1494DJ
1245
04-22-13
84
0
1000
MP1494DJ
1247
04-22-13
84
0
1000
MP1494DJ
1249
04-22-13
84
0
1000
MP1494DJ
1302
04-22-13
84
0
1000
MP1494DJ
1232
06-06-13
47
0
1000
MP1494DJ
1235
06-06-13
46
0
1000
MP2161GJ
1305
06-08-13
83
0
1000
MP1470GJ
1305
05-20-13
50
0
100
MP1470GJ
1301
04-22-13
50
0
100
MP2161GJ
1305
05-27-13
50
0
100
MP1470GJ
1305
04-16-13
50
0
100
MP1470GJ
1309
04-09-13
50
0
100
MP2161GJ
1305
06-25-13
50
0
100
MP1475DJ
1306
04-11-13
50
0
100
MP1470GJ
1307
04-16-13
50
0
100
MP1497DJ
1307
04-09-13
50
0
100
MP1497DJ
1309
04-03-13
50
0
100
FA NO.
# of
cycle
The Future of Analog IC Technology®
- 67 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1472GJ-C452
1309
04-03-13
50
0
100
MP1471GJ
1309
04-01-13
100
0
100
MP1472GJ-C452
1307
04-03-13
50
0
100
MP1494DJ
1311
04-03-13
100
0
100
MP1472GJ-C452
1309
04-09-13
50
0
100
MP1472GJ-C452
1309
04-09-13
50
0
100
MP1472GJ-C452
1309
04-09-13
50
0
100
MP1497DJ
1309
04-09-13
50
0
100
MP1496DJ
1310
04-09-13
50
0
100
MP9495DJ
1311
04-11-13
100
0
100
MP150GJ
1310
04-09-13
100
0
100
FA NO.
# of
cycle
MP1497DJ
1311
04-09-13
100
0
100
MP1472GJ
1311
04-09-13
100
0
100
MP1471GJ
1311
04-09-13
100
0
100
MP1472GJ-C452
1311
06-28-13
100
0
100
MP1472GJ-C452
1309
06-28-13
100
0
100
MP1472GJ-C452
1311
06-28-13
100
0
100
MP1472GJ-C452
1309
06-28-13
100
0
100
MP1497DJ
1313
04-16-13
100
0
100
MP1494DJ
1311
04-16-13
50
0
100
MP1470GJ
1311
04-22-13
50
0
100
MP1472GJ-C452
1312
04-16-13
100
0
100
MP1497DJ
1313
04-16-13
100
0
100
MP1472GJ-C452
1312
06-25-13
100
0
100
MP1474DJ
1312
04-16-13
98
0
100
MP1471GJ
1313
04-16-13
100
0
100
MP2161GJ
N/A
04-12-13
1000
0
100
MP2161GJ
1241
04-12-13
1000
0
100
MP1474DJ
1313
04-27-13
100
0
100
MP2144GJ
1307
04-12-13
100
0
100
MP1471GJ
1313
04-16-13
100
0
100
MP1494DJ
1309
04-15-13
100
0
100
MP1472GJ
1312
04-16-13
100
0
100
MP1497DJ
1311
04-15-13
100
0
100
MP1474DJ
1312
04-15-13
100
0
100
MP1472GJ
1311
04-16-13
100
0
100
MP1470GJ
1313
05-16-13
50
0
100
MP1472GJ-C452
1312
04-19-13
99
0
100
MP2161GJ-C499
1312
06-28-13
50
0
100
MP1472GJ-C452
1312
04-19-13
100
0
100
MP1472GJ-C452
1312
04-19-13
100
0
100
MP1497DJ
1314
04-20-13
100
0
100
The Future of Analog IC Technology®
- 68 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1494DJ
1311
04-17-13
100
0
100
MP2161GJ-C499
1314
06-25-13
1000
0
100
MP2161GJ-C499
1312
06-24-13
900
0
100
MP1472GJ-C452
1251
06-25-13
100
0
100
MP1470GJ
1313
05-08-13
50
0
100
MP1497DJ
1311
04-26-13
100
0
100
MP1472GJ-C452
1309
06-25-13
100
0
100
MP1472GJ-C452
1312
04-20-13
100
0
100
MP1494DJ
1311
04-19-13
100
0
100
MP1470GJ
1313
05-08-13
50
0
100
MP1474DJ-C491
1312
04-28-13
100
0
100
MP1497DJ
1314
04-26-13
100
0
100
MP1475DJ
1306
04-27-13
100
0
100
MP1472GJ
1313
04-22-13
100
0
100
MP1496DJ
1313
04-22-13
100
0
100
FA NO.
# of
cycle
MP1472GJ-C452
1309
04-22-13
100
0
100
MP1472GJ
1314
04-26-13
100
0
100
MP1472GJ-C452
1312
06-25-13
100
0
100
MP1472GJ-C452
1307
06-25-13
99
0
100
MP2143DJ
1304
04-24-13
100
0
100
MP2144GJ
1307
04-26-13
100
0
100
MP1471GJ-C519
1306
04-26-13
100
0
100
MP1472GJ-C452
1314
06-25-13
99
0
100
MP1496DJ
1214
04-25-13
100
0
100
MP2161GJ-C499
1315
06-28-13
1000
0
100
MP1496DJ
1314
04-25-13
100
0
100
MP1472GJ-C452
1314
04-25-13
100
0
100
MP1495DJ
1315
04-27-13
100
0
100
MP9495DJ
1311
05-02-13
100
0
100
MP1472GJ
1303
04-26-13
100
0
100
MP2144GJ
1314
04-27-13
95
0
100
MP2143DJ-C463
1307
05-03-13
100
0
100
MP1472GJ-C452
1314
05-13-13
100
0
100
MP1495DJ
1311
05-14-13
50
0
100
MP1472GJ-C452
1314
06-24-13
100
0
100
MP1496DJ
1314
04-27-13
100
0
100
MP1497DJ
1315
05-07-13
100
0
100
MP1472GJ-C452
1312
05-03-13
100
0
100
MP1494DJ
1311
05-02-13
50
0
100
MP1495DJ
1314
04-28-13
99
0
100
MP1471GJ
1313
04-28-13
1000
0
100
MP2144GJ
1314
05-17-13
100
0
100
The Future of Analog IC Technology®
- 69 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1472GJ-C452
1314
05-02-13
100
0
100
MP1496DJ
1314
05-02-13
100
0
100
FA NO.
# of
cycle
MP1472GJ-C452
1314
05-03-13
100
0
100
MP2144GJ
1314
05-07-13
100
0
100
MP9495DJ
1311
05-09-13
100
0
100
MP2144GJ
1314
06-18-13
100
0
100
MP2144GJ
1314
06-18-13
100
0
100
MP1472GJ
1314
05-03-13
100
0
100
MP1472GJ-C452
1312
05-02-13
93
0
100
MP1471GJ
1313
05-07-13
100
0
100
MP1472GJ-C452
1312
05-06-13
100
0
100
MP2144GJ
1314
06-18-13
100
0
100
MP1472GJ-C452
1312
06-24-13
50
0
100
MP1496DJ
1313
05-07-13
50
0
100
MP1495DJ
1315
05-06-13
50
0
100
MP1472GJ-C452
1314
05-08-13
50
0
100
MP2143DJ
1307
05-07-13
50
0
100
MP24892DJ
1316
05-14-13
50
0
100
MP1472GJ-C452
1312
05-08-13
50
0
100
MP1494DJ
1311
05-09-13
49
0
100
MP1497DJ
1314
05-16-13
50
0
100
MP1472GJ-C452
1312
05-13-13
50
0
100
MP1496DJ
1314
05-16-13
50
0
100
MP1472GJ-C452
1315
05-13-13
50
0
100
MP1495DJ
1316
05-06-13
50
0
100
MP1472GJ-C452
1315
05-08-13
98
0
100
MP3414DJ
1317
05-15-13
50
0
100
MP1496DJ
1314
05-15-13
50
0
100
MP1472GJ-C452
1314
05-08-13
50
0
100
MP1495DJ
1315
05-14-13
50
0
100
MP1472GJ-C452
1315
05-08-13
50
0
100
MP1497DJ
1316
05-14-13
50
0
100
MP1495DJ
1315
05-14-13
50
0
100
MP1497DJ
1316
05-16-13
50
0
100
MP1472GJ-C452
1314
05-13-13
50
0
100
MP1472GJ-C452
1314
05-09-13
50
0
100
MP2489DJ
1316
05-14-13
50
0
100
MP1472GJ-C452
1316
05-15-13
50
0
100
MP1494DJ
1315
05-14-13
50
0
100
MP1497DJ
1316
05-13-13
50
0
100
MP1472GJ-C452
1315
05-14-13
50
0
100
MP1472GJ
1315
05-10-13
50
0
100
The Future of Analog IC Technology®
- 70 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1472GJ-C452
1316
05-13-13
50
0
100
MP2144GJ
1314
05-18-13
50
0
100
MP1471GJ-C519
1313
05-14-13
50
0
100
MP1494DJ
1315
05-13-13
50
0
100
MP1495DJ
1315
05-13-13
50
0
100
MP2143DJ
1245
05-21-13
50
0
100
MP1497DJ
1313
05-13-13
50
0
100
MP1472GJ-C452
1316
05-13-13
50
0
100
MP1495DJ
1316
05-13-13
50
0
100
MP1497DJ
1314
05-13-13
50
0
100
MP1472GJ-C452
1316
05-14-13
50
0
100
MP1472GJ
1311
05-14-13
50
0
100
MP1497DJ
1316
05-16-13
50
0
100
MP1497DJ
1314
05-16-13
50
0
100
MP1472GJ-C452
1316
05-19-13
50
0
100
FA NO.
# of
cycle
MP1497DJ
1316
05-16-13
50
0
100
MP1472GJ-C452
1314
06-25-13
50
0
100
MP9495DJ
1311
05-15-13
50
0
100
MP1472GJ-C452
1312
06-25-13
50
0
100
MP1472GJ-C452
1316
05-19-13
50
0
100
MP1472GJ-C452
1309
05-19-13
50
0
100
MP2143DJ-C463
1307
05-17-13
50
0
100
MP1472GJ-C452
1316
05-19-13
50
0
100
MP1495DJ
1315
05-18-13
50
0
100
MP1497DJ
1316
05-18-13
50
0
100
MP1495DJ
1314
06-24-13
50
0
100
MP1472GJ
1249
05-20-13
50
0
100
MP1497DJ
1318
05-22-13
50
0
100
MP1494DJ
1313
05-22-13
50
0
100
MP1497DJ
1317
05-22-13
50
0
100
MP1496DJ
1318
05-22-13
50
0
100
MP1495DJ
1315
05-22-13
50
0
100
MP1472GJ-C452
1316
05-22-13
50
0
100
MP1494DJ
1315
05-25-13
50
0
100
MP2159GJ
1317
05-22-13
50
0
100
MP1471GJ
1318
05-30-13
50
0
100
MP1495DJ
1316
05-25-13
50
0
100
MP1497DJ
1317
05-25-13
50
0
100
MP1495DJ
1315
05-25-13
50
0
100
MP1496DJ
1318
05-25-13
50
0
100
MP1472GJ
1307
05-26-13
50
0
100
MP2143DJ
1307
05-28-13
50
0
100
The Future of Analog IC Technology®
- 71 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1497DJ
1317
05-28-13
50
0
100
MP1497DJ
1317
05-28-13
50
0
100
MP24894GJ
1317
05-29-13
50
0
100
MP1472GJ
1311
05-29-13
50
0
100
MP1495DJ
1311
05-28-13
50
0
100
MP1495DJ
1316
06-18-13
50
0
100
MP1497DJ
1318
05-29-13
50
0
100
MP1497DJ
1317
05-29-13
50
0
100
MP2233DJ
1307
05-29-13
50
0
100
MP2314GJ
1316
05-30-13
50
0
100
MP2234GJ
1319
05-30-13
50
0
100
MP1496DJ
1319
05-30-13
50
0
100
MP1497DJ
1318
05-30-13
50
0
100
MP1495DJ
1315
05-30-13
50
0
100
MP3414DJ
1320
05-31-13
50
0
100
MP1495DJ
1316
05-31-13
50
0
100
MP1497DJ
1314
06-03-13
50
0
100
MP2159GJ
1321
06-03-13
50
0
100
MP1496DJ
1319
06-03-13
50
0
100
MP3414DJ
1320
06-03-13
50
0
100
MP2144GJ
1314
06-03-13
50
0
100
MP1471GJ
1318
06-18-13
50
0
100
MP9495DJ
1320
06-18-13
50
0
100
MP1472GJ
1320
06-18-13
50
0
100
MP1496DJ
1314
06-18-13
50
0
100
MP2143DJ
1307
06-18-13
50
0
100
MP3414DJ
1320
06-18-13
50
0
100
MP2144GJ
1307
06-18-13
50
0
100
FA NO.
# of
cycle
MP150GJ
1310
06-18-13
50
0
100
MP1497DJ
1321
06-18-13
50
0
100
MP3414DJ
1320
06-18-13
50
0
100
MP1495DJ-C494
1310
06-18-13
50
0
100
MP1495DJ-C494
1306
06-18-13
50
0
100
MP2143DJ
1302
06-18-13
50
0
100
MP1472GJ-C452
1322
06-18-13
50
0
100
MP1496DJ
1318
06-24-13
50
0
100
MP1497DJ
1320
06-24-13
50
0
100
MP1495DJ
1316
06-24-13
50
0
100
MP3414DJ
1322
06-24-13
50
0
100
MP1472GJ
1320
06-24-13
50
0
100
MP2315GJ
1322
06-28-13
50
0
100
MP1494DJ
1321
06-18-13
50
0
100
The Future of Analog IC Technology®
- 72 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
# of
cycle
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1495DJ
1321
06-18-13
50
0
100
MP1496DJ
1319
06-18-13
50
0
100
MP1472GJ-C452
1322
06-18-13
50
0
100
MP1497DJ
1320
06-18-13
50
0
100
MP2144GJ
1314
06-18-13
50
0
100
MP1497DJ
1322
06-24-13
50
0
100
MP1494DJ
1311
06-24-13
50
0
100
MP1497DJ
1321
06-24-13
50
0
100
FA NO.
MP1494DJ
1315
06-24-13
50
0
100
MP2122GJ
1321
06-28-13
50
0
100
MP3414DJ
1322
06-24-13
50
0
100
MP2235GJ
1323
06-25-13
50
0
100
MP1494DJ
1318
06-24-13
50
0
100
MP24892DJ
1323
06-25-13
50
0
100
MP3414DJ
1322
06-24-13
50
0
100
MP1472GJ
1322
06-25-13
50
0
100
MP2159GJ
1322
06-24-13
50
0
100
MP9495DJ
1320
06-24-13
50
0
100
MP1496DJ
1323
06-24-13
50
0
100
MP9495DJ
1319
06-24-13
50
0
100
MP1494DJ
1321
06-25-13
50
0
100
MP2143DJ-C463
1307
06-25-13
50
0
100
MP2489DJ
1323
06-25-13
50
0
100
MP1495DJ
1320
06-25-13
50
0
100
MP1497DJ
1322
06-25-13
50
0
100
MP1472GJ-C452
1323
06-25-13
50
0
100
MP1494DJ
1321
06-28-13
50
0
100
MP1495DJ-C494
1323
06-28-13
50
0
100
MP2144GJ
1314
06-28-13
50
0
100
MP1471GJ-C519
1313
06-25-13
50
0
100
MP1471GJ-C519
1323
06-25-13
50
0
100
MP2159GJ
1324
06-28-13
50
0
100
MP2143DJ
1322
06-28-13
50
0
100
Total
0
4.8.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1494DJ
1302
04-03-13
87
0
168
MP1494DJ
1245
04-22-13
87
0
168
MP1494DJ
1247
04-22-13
87
0
168
FA NO.
# of hrs
The Future of Analog IC Technology®
- 73 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1494DJ
1249
04-22-13
87
0
168
MP1494DJ
1302
04-22-13
87
0
168
MP1494DJ
1245
04-22-13
87
0
168
MP1494DJ
1247
04-22-13
87
0
168
MP1494DJ
1249
04-22-13
87
0
168
MP1494DJ
1302
04-22-13
87
0
168
MP1494DJ
1232
06-06-13
50
0
168
FA NO.
# of hrs
MP1494DJ
1235
06-06-13
47
0
168
MP2161GJ
1305
06-08-13
87
0
168
MP1470GJ
1305
05-20-13
50
0
48
MP1470GJ
1301
04-22-13
50
0
48
MP2161GJ
1305
05-27-13
50
0
48
MP1470GJ
1305
04-16-13
50
0
48
MP1470GJ
1309
04-09-13
50
0
48
MP2161GJ
1305
06-25-13
50
0
48
MP1475DJ
1306
04-11-13
50
0
48
MP1470GJ
1307
04-16-13
50
0
48
MP1497DJ
1307
04-09-13
50
0
48
MP1497DJ
1309
04-03-13
50
0
48
MP1472GJ-C452
1309
04-03-13
50
0
48
MP1471GJ
1309
04-01-13
100
0
48
MP1472GJ-C452
1307
04-03-13
50
0
48
MP1494DJ
1311
04-03-13
100
0
48
MP1472GJ-C452
1309
04-09-13
50
0
48
MP1472GJ-C452
1309
04-09-13
50
0
48
MP1472GJ-C452
1309
04-09-13
50
0
48
MP1497DJ
1309
04-09-13
50
0
48
MP1496DJ
1310
04-09-13
50
0
48
MP9495DJ
1311
04-11-13
100
0
48
MP150GJ
1310
04-09-13
100
0
48
MP1497DJ
1311
04-09-13
100
0
48
MP1472GJ
1311
04-09-13
100
0
48
MP1471GJ
1311
04-09-13
100
0
48
MP1472GJ-C452
1311
06-28-13
100
0
48
MP1472GJ-C452
1309
06-28-13
66
0
48
MP1472GJ-C452
1311
06-28-13
100
0
48
MP1472GJ-C452
1309
06-28-13
100
0
48
MP1497DJ
1313
04-16-13
100
0
48
MP1494DJ
1311
04-16-13
50
0
48
MP1470GJ
1311
04-22-13
50
0
48
MP1472GJ-C452
1312
04-16-13
100
0
48
MP1497DJ
1313
04-16-13
100
0
48
The Future of Analog IC Technology®
- 74 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1472GJ-C452
1312
06-25-13
100
0
48
MP1474DJ
1312
04-16-13
100
0
48
MP1471GJ
1313
04-16-13
100
0
48
MP2161GJ
N/A
04-12-13
1000
0
48
MP2161GJ
1241
04-12-13
1000
0
48
MP1474DJ
1313
04-27-13
100
0
48
MP2144GJ
1307
04-12-13
100
0
48
FA NO.
# of hrs
MP1471GJ
1313
04-16-13
100
0
48
MP1494DJ
1309
04-15-13
100
0
48
MP1472GJ
1312
04-16-13
100
0
48
MP1497DJ
1311
04-15-13
100
0
48
MP1474DJ
1312
04-15-13
100
0
48
MP1472GJ
1311
04-16-13
100
0
48
MP1470GJ
1313
05-16-13
50
0
48
MP1472GJ-C452
1312
04-19-13
100
0
48
MP2161GJ-C499
1312
06-28-13
42
0
48
MP1472GJ-C452
1312
04-19-13
100
0
48
MP1472GJ-C452
1312
04-19-13
100
0
48
MP1497DJ
1314
04-20-13
100
0
48
MP1494DJ
1311
04-17-13
100
0
48
MP2161GJ-C499
1314
06-25-13
1000
0
48
MP2161GJ-C499
1312
06-24-13
1000
0
48
MP1472GJ-C452
1251
06-25-13
100
0
48
MP1470GJ
1313
05-08-13
50
0
48
MP1497DJ
1311
04-26-13
100
0
48
MP1472GJ-C452
1309
06-25-13
99
0
48
MP1472GJ-C452
1312
04-20-13
100
0
48
MP1494DJ
1311
04-19-13
100
0
48
MP1470GJ
1313
05-08-13
50
0
48
MP1474DJ-C491
1312
04-28-13
100
0
48
MP1497DJ
1314
04-26-13
100
0
48
MP1475DJ
1306
04-27-13
100
0
48
MP1472GJ
1313
04-22-13
100
0
48
MP1496DJ
1313
04-22-13
100
0
48
MP1472GJ-C452
1309
04-22-13
100
0
48
MP1472GJ
1314
04-26-13
100
0
48
MP1472GJ-C452
1312
06-25-13
100
0
48
MP1472GJ-C452
1307
06-25-13
100
0
48
MP2143DJ
1304
04-24-13
99
0
48
MP2144GJ
1307
04-26-13
100
0
48
MP1471GJ-C519
1306
04-26-13
100
0
48
MP1472GJ-C452
1314
06-25-13
100
0
48
The Future of Analog IC Technology®
- 75 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1496DJ
1214
04-25-13
100
0
48
MP2161GJ-C499
1315
06-28-13
1000
0
48
FA NO.
# of hrs
MP1496DJ
1314
04-25-13
100
0
48
MP1472GJ-C452
1314
04-25-13
100
0
48
MP1495DJ
1315
04-27-13
100
0
48
MP9495DJ
1311
05-02-13
100
0
48
MP1472GJ
1303
04-26-13
100
0
48
MP2144GJ
1314
04-27-13
100
0
48
MP2143DJ-C463
1307
05-03-13
100
0
48
MP1472GJ-C452
1314
05-13-13
100
0
48
MP1495DJ
1311
05-14-13
50
0
48
MP1472GJ-C452
1314
06-24-13
100
0
48
MP1496DJ
1314
04-27-13
100
0
48
MP1497DJ
1315
05-07-13
100
0
48
MP1472GJ-C452
1312
05-03-13
100
0
48
MP1494DJ
1311
05-02-13
50
0
48
MP1495DJ
1314
04-28-13
100
0
48
MP1471GJ
1313
04-28-13
1000
0
48
MP2144GJ
1314
05-17-13
100
0
48
MP1472GJ-C452
1314
05-02-13
100
0
48
MP1496DJ
1314
05-02-13
100
0
48
MP1472GJ-C452
1314
05-03-13
98
0
48
MP2144GJ
1314
05-07-13
97
0
48
MP9495DJ
1311
05-09-13
100
0
48
MP2144GJ
1314
06-18-13
100
0
48
MP2144GJ
1314
06-18-13
100
0
48
MP1472GJ
1314
05-03-13
100
0
48
MP1472GJ-C452
1312
05-02-13
100
0
48
MP1471GJ
1313
05-07-13
100
0
48
MP1472GJ-C452
1312
05-06-13
100
0
48
MP2144GJ
1314
06-18-13
100
0
48
MP1472GJ-C452
1312
06-24-13
50
0
48
MP1496DJ
1313
05-07-13
50
0
48
MP1495DJ
1315
05-06-13
50
0
48
MP1472GJ-C452
1314
05-08-13
50
0
48
MP2143DJ
1307
05-07-13
50
0
48
MP24892DJ
1316
05-14-13
50
0
48
MP1472GJ-C452
1312
05-08-13
50
0
48
MP1494DJ
1311
05-09-13
50
0
48
MP1497DJ
1314
05-16-13
50
0
48
MP1472GJ-C452
1312
05-13-13
50
0
48
MP1496DJ
1314
05-16-13
50
0
48
The Future of Analog IC Technology®
- 76 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1472GJ-C452
1315
05-13-13
50
0
48
MP1495DJ
1316
05-06-13
50
0
48
MP1472GJ-C452
1315
05-08-13
89
0
48
MP3414DJ
1317
05-15-13
50
0
48
MP1496DJ
1314
05-15-13
50
0
48
MP1472GJ-C452
1314
05-08-13
50
0
48
FA NO.
# of hrs
MP1495DJ
1315
05-14-13
50
0
48
MP1472GJ-C452
1315
05-08-13
50
0
48
MP1497DJ
1316
05-14-13
50
0
48
MP1495DJ
1315
05-14-13
50
0
48
MP1497DJ
1316
05-16-13
50
0
48
MP1472GJ-C452
1314
05-13-13
50
0
48
MP1472GJ-C452
1314
05-09-13
50
0
48
MP2489DJ
1316
05-14-13
50
0
48
MP1472GJ-C452
1316
05-15-13
50
0
48
MP1494DJ
1315
05-14-13
50
0
48
MP1497DJ
1316
05-13-13
50
0
48
MP1472GJ-C452
1315
05-14-13
50
0
48
MP1472GJ
1315
05-10-13
50
0
48
MP1472GJ-C452
1316
05-13-13
50
0
48
MP2144GJ
1314
05-18-13
50
0
48
MP1471GJ-C519
1313
05-14-13
50
0
48
MP1494DJ
1315
05-13-13
50
0
48
MP1495DJ
1315
05-13-13
50
0
48
MP2143DJ
1245
05-21-13
50
0
48
MP1497DJ
1313
05-13-13
50
0
48
MP1472GJ-C452
1316
05-13-13
50
0
48
MP1495DJ
1316
05-13-13
50
0
48
MP1497DJ
1314
05-13-13
50
0
48
MP1472GJ-C452
1316
05-14-13
50
0
48
MP1472GJ
1311
05-14-13
50
0
48
MP1497DJ
1316
05-16-13
50
0
48
MP1497DJ
1314
05-16-13
50
0
48
MP1472GJ-C452
1316
05-19-13
50
0
48
MP1497DJ
1316
05-16-13
50
0
48
MP1472GJ-C452
1314
06-25-13
50
0
48
MP9495DJ
1311
05-15-13
50
0
48
MP1472GJ-C452
1312
06-25-13
50
0
48
MP1472GJ-C452
1316
05-19-13
50
0
48
MP1472GJ-C452
1309
05-19-13
50
0
48
MP2143DJ-C463
1307
05-17-13
50
0
48
MP1472GJ-C452
1316
05-19-13
50
0
48
The Future of Analog IC Technology®
- 77 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1495DJ
1315
05-18-13
50
0
48
MP1497DJ
1316
05-18-13
50
0
48
FA NO.
# of hrs
MP1495DJ
1314
06-24-13
50
0
48
MP1472GJ
1249
05-20-13
50
0
48
MP1497DJ
1318
05-22-13
50
0
48
MP1494DJ
1313
05-22-13
50
0
48
MP1497DJ
1317
05-22-13
50
0
48
MP1496DJ
1318
05-22-13
50
0
48
MP1495DJ
1315
05-22-13
50
0
48
MP1472GJ-C452
1316
05-22-13
50
0
48
MP1494DJ
1315
05-25-13
50
0
48
MP2159GJ
1317
05-22-13
50
0
48
MP1471GJ
1318
05-30-13
50
0
48
MP1495DJ
1316
05-25-13
50
0
48
MP1497DJ
1317
05-25-13
50
0
48
MP1495DJ
1315
05-25-13
50
0
48
MP1496DJ
1318
05-25-13
50
0
48
MP1472GJ
1307
05-26-13
50
0
48
MP2143DJ
1307
05-28-13
50
0
48
MP1497DJ
1317
05-28-13
50
0
48
MP1497DJ
1317
05-28-13
50
0
48
MP24894GJ
1317
05-29-13
50
0
48
MP1472GJ
1311
05-29-13
50
0
48
MP1495DJ
1311
05-28-13
50
0
48
MP1495DJ
1316
06-18-13
50
0
48
MP1497DJ
1318
05-29-13
50
0
48
MP1497DJ
1317
05-29-13
50
0
48
MP2233DJ
1307
05-29-13
50
0
48
MP2314GJ
1316
05-30-13
50
0
48
MP2234GJ
1319
05-30-13
50
0
48
MP1496DJ
1319
05-30-13
50
0
48
MP1497DJ
1318
05-30-13
50
0
48
MP1495DJ
1315
05-30-13
50
0
48
MP3414DJ
1320
05-31-13
50
0
48
MP1495DJ
1316
05-31-13
50
0
48
MP1497DJ
1314
06-03-13
50
0
48
MP2159GJ
1321
06-03-13
50
0
48
MP1496DJ
1319
06-03-13
50
0
48
MP3414DJ
1320
06-03-13
50
0
48
MP2144GJ
1314
06-03-13
50
0
48
MP1471GJ
1318
06-18-13
50
0
48
MP9495DJ
1320
06-18-13
50
0
48
The Future of Analog IC Technology®
- 78 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1472GJ
1320
06-18-13
50
0
48
MP1496DJ
1314
06-18-13
50
0
48
MP2143DJ
1307
06-18-13
50
0
48
MP3414DJ
1320
06-18-13
50
0
48
MP2144GJ
1307
06-18-13
50
0
48
MP150GJ
1310
06-18-13
50
0
48
MP1497DJ
1321
06-18-13
50
0
48
FA NO.
# of hrs
MP3414DJ
1320
06-18-13
50
0
48
MP1495DJ-C494
1310
06-18-13
50
0
48
MP1495DJ-C494
1306
06-18-13
50
0
48
MP2143DJ
1302
06-18-13
50
0
48
MP1472GJ-C452
1322
06-18-13
50
0
48
MP1496DJ
1318
06-24-13
50
0
48
MP1497DJ
1320
06-24-13
50
0
48
MP1495DJ
1316
06-24-13
50
0
48
MP3414DJ
1322
06-24-13
50
0
48
MP1472GJ
1320
06-24-13
50
0
48
MP2315GJ
1322
06-28-13
50
0
48
MP1494DJ
1321
06-18-13
50
0
48
MP1495DJ
1321
06-18-13
50
0
48
MP1496DJ
1319
06-18-13
50
0
48
MP1472GJ-C452
1322
06-18-13
50
0
48
MP1497DJ
1320
06-18-13
50
0
48
MP2144GJ
1314
06-18-13
50
0
48
MP1497DJ
1322
06-24-13
50
0
48
MP1494DJ
1311
06-24-13
50
0
48
MP1497DJ
1321
06-24-13
50
0
48
MP1494DJ
1315
06-24-13
50
0
48
MP2122GJ
1321
06-28-13
50
0
48
MP3414DJ
1322
06-24-13
50
0
48
MP2235GJ
1323
06-25-13
50
0
48
MP1494DJ
1318
06-24-13
50
0
48
MP24892DJ
1323
06-25-13
50
0
48
MP3414DJ
1322
06-24-13
50
0
48
MP1472GJ
1322
06-25-13
50
0
48
MP2159GJ
1322
06-24-13
50
0
48
MP9495DJ
1320
06-24-13
50
0
48
MP1496DJ
1323
06-24-13
50
0
48
MP9495DJ
1319
06-24-13
50
0
48
MP1494DJ
1321
06-25-13
50
0
48
MP2143DJ-C463
1307
06-25-13
50
0
48
MP2489DJ
1323
06-25-13
50
0
48
The Future of Analog IC Technology®
- 79 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1495DJ
1320
06-25-13
50
0
48
FA NO.
# of hrs
MP1497DJ
1322
06-25-13
50
0
48
MP1472GJ-C452
1323
06-25-13
50
0
48
MP1494DJ
1321
06-28-13
50
0
48
MP1495DJ-C494
1323
06-28-13
50
0
48
MP2144GJ
1314
06-28-13
50
0
48
MP1471GJ-C519
1313
06-25-13
50
0
48
MP1471GJ-C519
1323
06-25-13
50
0
48
MP2159GJ
1324
06-28-13
50
0
48
MP2143DJ
1322
06-28-13
50
0
48
Total
0
4.8.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1494DJ
1245
04-22-13
80
0
MP1494DJ
1247
04-22-13
80
0
MP1494DJ
1249
04-22-13
80
0
MP1494DJ
1302
04-22-13
90
0
MP1494DJ
1245
04-22-13
80
0
MP1494DJ
1247
04-22-13
80
0
MP1494DJ
1249
04-22-13
80
0
MP1494DJ
1302
04-22-13
90
0
MP2234GJ
1305
06-05-13
102
0
MP1470GJ
1305
05-20-13
50
0
MP1470GJ
1301
04-22-13
50
0
MP1470GJ
1305
04-16-13
50
0
MP1470GJ
1309
04-09-13
50
0
MP2161GJ
1305
06-25-13
50
0
MP1470GJ
1311
04-22-13
50
0
MP1470GJ
1313
05-16-13
50
0
MP2161GJ-C499
1312
06-28-13
50
0
MP2161GJ-C499
1314
06-25-13
50
0
MP2161GJ-C499
1312
06-24-13
50
0
MP1470GJ
1313
05-08-13
50
0
MP1470GJ
1313
05-08-13
49
0
MP2161GJ-C499
1315
06-28-13
50
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 80 -
MONOLITHIC POWER SYSTEMS
Q2
2013
PRODUCT RELIABILITY REPORT
Monolithic Power Systems (Chengdu) Co., Ltd.
No.8 Kexin Rd. West Park of Export Processing Zone,
West Hi-Tech Zone, Chengdu, Sichuan 611731
Tel: 86-28-87303000
Fax: 86-28-87303060
www.monolithicpower.com
The Future of Analog IC Technology®
- 81 -