QUARTERLY RELIABILITY MONITOR REPORT Q2, Apr. ~ Jun. 2013 Prepared by MPSCD Reliability Engineering The Future of Analog IC Technology® MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT INDEX 1.0 INTRODUCTION ......................................................................................2 1.1 SHORT TERM RELIBILITY MONITORING ........................................................................................................................ 2 1.2 LONG TERM RELIBILITY MONITORING ........................................................................................................................... 2 2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS.........................3 3.0 PROCESS RELIABILITY MONITORING DATA ......................................4 3.1 BCM12B Process Technology ................................................................................................................................................ 4 3.2 BCM12S Process Technology ................................................................................................................................................ 8 3.3 BCM35 Process Technology ................................................................................................................................................ 11 3.4 BCM05 Process Technology ................................................................................................................................................ 12 3.5 BCM18 Process Technology ................................................................................................................................................ 13 4.0 PACKAGE RELIABILITY MONITORING DATA ....................................14 4.1 QFN .................................................................................................................................................................................................. 14 4.2 SOIC ................................................................................................................................................................................................ 25 4.3 MSOP .............................................................................................................................................................................................. 35 4.4 TSOT ............................................................................................................................................................................................... 38 4.5 TSSOP ............................................................................................................................................................................................ 43 4.6 FLIP CHIP-QFN ......................................................................................................................................................................... 45 4.7 FLIP CHIP-SOIC........................................................................................................................................................................ 58 4.8 FLIP CHIP-TSOT ...................................................................................................................................................................... 66 The Future of Analog IC Technology® -1- MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT 1.0 INTRODUCTION This report summarizes the reliability testing results for MPS products as of Q2 2013. 1.1 SHORT TERM RELIBILITY MONITORING The short term monitoring runs on a daily basis. It provides a fast alert in case of changes in term of product reliability performance. Stress Test Name Test Condition Duration JEDEC EARLY LIFE 125°C, Vccmax 48 ~168 hrs JESD22-A108 Convection Reflow 260°C 3 times JESD22-A113 Temperature Cycle Cond C:-65℃ ~ 150℃ 100~200Cycles JESD22-A104 Autoclave 121°C /100%RH 48~96 hrs JESD22-A102 1.2 LONG TERM RELIBILITY MONITORING The long term monitoring runs on a quarterly basis. It provides the life stresses for periods long enough to provide the data necessary to calculate the steady state failure rates of products. Stress Test Name Test Condition Duration JEDEC HTOL 125°C, Vccmax 1000 hrs JESD22-A108 HTSL 150°C 1000 hrs JESD22-A103 Precondition / / JESD22-A113 Autoclave 121°C /100%RH 168 hrs JESD22-A102 Temperature Cycle Cond C:-65°C ~ 150°C 1000 Cycles JESD22-A104 85°C, 85% R.H., VDD 1000 hrs JESD22-A101 130°C, 85% R.H., VDD 96 hrs JESD22-A110 Temperature Humidity Bias (THB) High Accelerated Stress Test (HAST) The Future of Analog IC Technology® -2- MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT 2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS The long-term failure rate for a technology is gauged by a Failures In Time (FIT) calculation based upon accelerated stress data. The units for FIT are failures per Billion device hours. ( χ / 2) *10 2 FITRate = 9 stress * device hours The stress that enables FIT is High Temperature Operating Life (HTOL), which is a product level test. HTOL is accelerated by temperature and by voltage. The total number of failures in stress determines the chi-squared factor (a dimensionless number representing a 60% confidence level of statistics). The number of product units times the stress period (in Hours) is the device-Hours number. The Arrhenius equation uses the Activation energy for the fail mode as well as the stress temperature and the reporting temperature (e.g. 55℃) to compute the HTOL temperature acceleration factor, AF(T). The accelerated stress device-Hours is AF(T) times the device-Hours number. AFv= Exp(β(Vtest- Vuse), Vtest = Stress Voltage (V).Vuse = Nominal Voltage (V).β = Voltage Acceleration Constant (usually, 0.5 < Z < 1.0). The Future of Analog IC Technology® -3- MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT 3.0 PROCESS RELIABILITY MONITORING DATA 3.1 BCM12B Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: HHNEC, ASMC,SMIC EARLY LIFE (HTOL Short Term Monitor) Stress Duration: 48 ~168 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP2120DQ C272169.8B 1215 05-21-13 50 168 0 MP2120DQ C372325.8A 1219 05-21-13 50 168 0 NB600CQ C372377.8A 1221 05-21-13 50 168 0 NB600CQ C372377.9 1222 05-21-13 50 168 0 MP2012DQ C386219.7 1233 05-21-13 50 168 0 MP2012DQ C586908.7 1236 05-21-13 50 168 0 MP3310EQ A989932.9DT 1305 05-09-13 84 168 0 MP2359DJ C285242.9AQ 1216 05-29-13 80 168 0 MP1484EN D289808.9T 1320 06-27-13 81 168 0 MP2307DN C572682.7 1228 06-06-13 50 168 0 MP2307DN C572730.7 1228 06-06-13 50 168 0 MP2119DQ C587164.7 1304 06-09-13 79 168 0 MP1484EN C787757.7 1304 06-09-13 80 168 0 MP3217DJ C788057.7 1250 05-20-13 79 48 0 MP3217DJ C888365.7 1250 05-01-13 80 48 0 MP3217DJ CA88957.9 1304 05-20-13 80 48 0 MP2012DQ C888344.9 1244 04-03-13 80 48 0 MP2119DQ C586759.7 1310 04-03-13 80 48 0 MP1412DH C586901.7 1308 06-21-13 80 48 0 MP2104DJ C888309.7 1309 04-02-13 80 48 0 MP2307DN C888218.7 1306 04-03-13 80 48 0 MP1484EN-C166 C888149.7 1310 04-03-13 80 48 0 MP1482DN CC89355.9 1309 04-03-13 80 48 0 MP1484EN-C166 C888163.7 1310 04-25-13 80 48 0 MP1412DH C787876.1A 1310 04-11-13 80 48 0 MP1484EN-C165 C687655.7 1312 04-16-13 80 48 0 MP1482DN CA88919.9 1312 04-15-13 80 48 0 MP1583DN C386196.7A 1312 04-16-13 80 48 0 MP1584EN CA88716.7 1310 06-18-13 80 48 0 MP1482DN CA88910.9 1312 04-12-13 80 48 0 MP1482DN CA88916.9 1312 04-16-13 80 48 0 The Future of Analog IC Technology® -4- FA No. MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP1482DN CA88914.9 1312 04-16-13 80 48 0 MP1412DH C586904.7 1309 04-11-13 80 48 0 MP2307DN C888357.7 1313 04-27-13 80 48 0 MP1482DN C787703.7 1310 04-16-13 80 48 0 MP2307DN C888358.7 1312 04-16-13 80 48 0 MP1482DS-C165 CC89274.9 1313 04-18-13 80 48 0 MP3217DJ CA88783.9 1305 05-20-13 80 48 0 MP2104DJ C988508.7 1309 04-16-13 80 48 0 MP3908DK BB72861.1B 1312 04-16-13 80 48 0 MP1412DH C787895.1A 1310 04-17-13 80 48 0 MP1430DN C687545.7 1313 05-13-13 80 48 0 MP4689DN C472567.9C 1310 04-22-13 80 48 0 MP1482DN C787712.7 1313 04-15-13 80 48 0 MP1584EN CA88759.7 1312 06-18-13 80 48 0 MP2307DN C888335.7 1312 04-17-13 80 48 0 MP2307DN C888355.7 1312 04-16-13 78 48 0 MP1484EN C888248.7 1312 04-26-13 80 48 0 MP1482DN C787710.7 1313 04-17-13 80 48 0 MP2359DJ C687506.7 1311 06-18-13 80 48 0 MP2467DN CB72169.1A 1310 04-20-13 80 48 0 MP1484EN C687400.7 1304 04-22-13 80 48 0 MP2307DN C787737.7 1315 05-28-13 80 48 0 MP1482DS-C165 C687649.7 1302 05-31-13 80 48 0 MP1593DN CA88792.9A 1314 04-23-13 80 48 0 MP1591DN C988703.7 1313 05-04-13 80 48 0 MP1484EN C687338.7 1250 04-22-13 80 48 0 MP2467DN CB72169.9 1303 04-24-13 80 48 0 MP1484EN C687656.7 1308 04-22-13 78 48 0 MP1484EN C888252.7 1312 04-22-13 80 48 0 MP2105DJ C988564.7 1250 04-26-13 80 48 0 MP1584EN D189503.9 1314 06-18-13 80 48 0 MP2303ADN-C445 C587166.7 1310 05-14-13 80 48 0 MP2359DJ C687513.7 1313 06-25-13 80 48 0 MP2012DQ C788038.7 1309 05-04-13 80 48 0 MP1484EN C787735.7 1314 04-25-13 80 48 0 MP1482DS-C165 C687701.7 1302 04-27-13 80 48 0 MP2104DJ C587190.7 1311 06-24-13 80 48 0 MP2307DN C787729.7 1313 05-28-13 78 48 0 MP1484EN C787734.7 1314 06-24-13 80 48 0 MP1482DN CB89185.9 1316 04-28-13 80 48 0 MP2307DN C787755.7 1315 05-06-13 80 48 0 MP1580HS D189706.9A 1314 06-18-13 80 48 0 The Future of Analog IC Technology® -5- FA No. MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP1482DN CA88925.9 1315 05-06-13 80 48 0 MP2104DJ C587191.7 1314 05-04-13 80 48 0 MP1530DM D189463.1A 1315 06-21-13 80 48 0 MP9115DQT D380011.8A 1316 05-06-13 80 48 0 MP2303ADN C787882.7 1316 05-14-13 80 48 0 MP1482DS-C165 CB89126.1A 1315 05-09-13 80 48 0 MP1482DN CA88926.9 1315 05-09-13 80 48 0 MP1484EN-C166 C787836.7 1316 05-23-13 80 48 0 MP1484EN C787828.7 1316 05-09-13 80 48 0 MP2359DJ C787945.7 1315 06-18-13 80 48 0 MP1484EN C787821.7 1315 06-28-13 80 48 0 MP2104DJ C888310.7 1316 05-20-13 80 48 0 MP1584EN D289713.9 1316 06-08-13 80 48 0 MP1484EN C787816.7 1316 06-24-13 80 48 0 MP2105DJ C988466.7 1316 05-29-13 80 48 0 MP1484EN C787832.7 1316 05-23-13 80 48 0 MP1482DN D289723.9 1317 05-13-13 80 48 0 MP1482DS-C165 CC89361.9 1317 05-31-13 78 48 0 MP1484EN C888213.7 1317 06-28-13 80 48 0 MP1484EN-C166 C888167.7 1317 05-23-13 80 48 0 MP2359DJ C687621.7 1316 06-25-13 80 48 0 MP2105DK C888427.7 1247 05-27-13 80 48 0 MP1411DH C586764.7 1319 06-18-13 80 48 0 MP1482DN D189563.9 1321 06-18-13 80 48 0 MP1412DH C486711.9 1318 06-28-13 80 48 0 MP1482DN D380221.9 1321 06-18-13 80 48 0 MP1482DN D189561.9 1321 06-18-13 78 48 0 MP1482DN D380225.9 1321 06-28-13 80 48 0 MP2105DK CA88882.9A 1320 06-18-13 80 48 0 MP1482DN D380222.9 1321 06-28-13 80 48 0 MP1482DN D380224.9 1321 06-24-13 78 48 0 MP1482DN D380226.9 1321 06-18-13 80 48 0 MP1411DH C787895.7 1321 06-25-13 80 48 0 MP1482DN D380223.9 1322 06-28-13 80 48 0 MP1482DN D380220.9 1322 06-28-13 80 48 0 MP1482DN D480274.9 1322 06-28-13 78 48 0 MP1482DN D380227.9 1322 06-28-13 78 48 0 Total 0 The Future of Analog IC Technology® -6- FA No. MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT LONG TERM LIFE (HTOL Long Term Monitor) Stress Duration: 1000 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of Fail MPQ1530DQ C988670 1247 05-14-13 79 0 MPQ1530DQ EP280905 1247 05-14-13 79 0 MPQ1530DQ EP280906 1249 05-14-13 80 0 MPQ1530DQ C988670 1247 05-14-13 79 0 MPQ1530DQ EP280905 1247 05-14-13 79 0 MPQ1530DQ EP280906 1249 05-14-13 80 0 MPQ2016DD FA292055 1244 05-16-13 78 0 MP8040DN EP292000 N/A 06-04-13 80 0 Total FA No. 0 BCM12B #fail #device hours Accel Factor FIT Rate 0 634000 348 4.3 HIGH TEMPERATURE STORAGE LIFE (HTSL) Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MP18030GQN EP194802-D21 1249 04-09-13 50 0 MP18030GQN EP194802-D22 1242 04-09-13 50 0 MP18030GQN EP194802-D23 1245 04-09-13 50 0 MPQ2362DF C787792.7 1243 05-14-13 50 0 MPQ2362DF C787791.7 1243 05-14-13 50 0 MPQ2362DF C787892.7 1243 05-14-13 50 0 MPQ2362DF C787792.7 1243 05-14-13 50 0 MPQ2362DF C787791.7 1243 05-14-13 50 0 MPQ2362DF C787892.7 1243 05-14-13 50 0 MPQ2016DD FA292055 1244 05-16-13 50 0 MP2120DQ C272169.8B 1215 05-21-13 46 0 MP2120DQ C372325.8A 1219 05-21-13 47 0 NB600CQ C372377.8A 1221 05-21-13 50 0 NB600CQ C372377.9 1222 05-21-13 50 0 MP2012DQ C386219.7 1233 05-21-13 47 0 MP2012DQ C586908.7 1236 05-21-13 47 0 MPQ3701GR EP270500 1239 05-29-13 50 0 MPQ4462DN FA2Y2168A 1301 05-29-13 50 0 MP2109DQ C888268.7 1303 05-20-13 50 0 MP2307DN C572682.7 1228 06-06-13 47 0 MP2307DN C572730.7 1228 06-06-13 47 0 The Future of Analog IC Technology® -7- FA No. MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of Fail MP4561DQ C672882.9 1232 06-08-13 47 0 MP4561DQ C772902.8A 1234 06-08-13 47 0 MP2119DQ C587164.7 1304 06-09-13 50 0 MP1484EN C787757.7 1304 06-09-13 50 0 MP2209DL CA88739.7 1304 06-08-13 50 0 MP2119DQ C586777.1AH 1309 06-03-13 50 0 MP2119DQ C586777.1AM 1309 06-03-13 50 0 MP2119DQ C586777.1AL 1309 06-03-13 50 0 Total FA No. 0 3.2 BCM12S Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: HHNEC, ASMC,SMIC EARLY LIFE (HTOL Short Term Monitor) Stress Duration: 48 ~168 hours Test Condition: Vccmax @ 125°C Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP3388DR C586835.7L N/A 05-06-13 80 168 0 MP3388DR C586835.7M N/A 05-06-13 80 168 0 MP3388DR C586835.7H N/A 05-06-13 80 168 0 MP5000DQ C347147.9M 1236 05-31-13 50 168 0 MP5000DQ C549750.7 1236 05-31-13 50 168 0 MPQ28261DL BB84333.9 1228 05-21-13 50 168 0 MPQ28261DL C285336.7 1228 05-21-13 50 168 0 MP28252EL HP329901 1311 2013-56 90 168 0 MP8705EN CB4K588.9Q 1309 05-21-13 80 168 0 MP1494DJ C472536.8 1232 06-06-13 50 168 0 MP1494DJ C572710.8 1235 06-06-13 50 168 0 MP3388DR C346039.1AL 1231 06-20-13 80 168 0 MP3388DR C346039.1AM 1231 06-20-13 80 168 0 MP3388DR C346039.1AH 1231 06-20-13 80 168 0 MP2670DQ C9481368.9AL 1228 06-20-13 80 168 0 MP2670DQ C9481368.9AMA 1228 06-20-13 80 168 0 MP2670DQ C9481368.9AMB 1228 06-20-13 80 168 0 MP2670DQ C9481368.9AH 1228 06-20-13 80 168 0 MP3388DR C285583.7 1304 06-08-13 80 168 0 MP28252EL D24P574.1AT 1322 06-27-13 80 168 0 MP8126DF CA88767.9Q 1252 04-22-13 80 48 0 The Future of Analog IC Technology® -8- FA No. MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP5000DQ CB89122.9 1304 04-18-13 80 48 0 MP8736DL C788084.8 1302 04-09-13 78 48 0 MP8736DL C988563.8 1302 04-09-13 80 48 0 MP8736DL CB89035.8A 1303 04-16-13 78 48 0 MP8736DL CB89053.8 1304 04-29-13 78 48 0 MP8736DL CB89097.8 1305 05-09-13 79 48 0 MP8736DL CB89052.8 1306 04-28-13 80 48 0 MP8736DL CB89046.8 1306 04-25-13 78 48 0 MP8736DL CB89085.8 1305 05-10-13 78 48 0 MP8736DL CB89101.8 1309 06-18-13 78 48 0 MP2007DH C988665.7E 1306 04-07-13 80 48 0 MP3389EF CB89062.1 1302 04-22-13 84 48 0 MP5001DQ C372370.7B 1311 04-11-13 90 48 0 MP8125EF C888406.7A 1308 04-16-13 80 48 0 MP6002DN 9685966.7 1310 05-14-13 75 48 0 MP6002DN 9685968.7 1312 05-14-13 75 48 0 MP28253EL-C323 CB4K202.1B 1313 04-23-13 79 48 0 MP3389EF D189469.1B 1313 04-19-13 80 48 0 MP8706EN CB4L110.9 1310 06-24-13 80 48 0 MP3388DR-C414 D189591.7B 1314 05-10-13 82 48 0 MP3900DK 9C91896.7A 1313 04-18-13 80 48 0 MP5010DQ-C347 C347183.9 1304 06-24-13 80 48 0 MP2002DD CB4K203.1A 1310 04-20-13 80 48 0 MP28252EL C549797.7 1311 05-28-13 80 48 0 MP8709EN CC89336.1B 1311 06-25-13 80 48 0 MP3389EF CB4K678.1 1313 05-02-13 80 48 0 MP3394EF CA4J473.9A 1310 04-28-13 80 48 0 MP8708EN D189581.9 1313 05-30-13 80 48 0 MP28252EL D189572.1B 1316 05-07-13 80 48 0 MP8708EN D14M642.9 1312 06-25-13 80 48 0 MP5001DQ C372370.7 1313 06-18-13 80 48 0 MP8708EN D189488.9 1312 06-03-13 80 48 0 MP28252EL D24P091.1A 1317 05-27-13 80 48 0 MP8705EN D14M640.9 1314 06-28-13 80 48 0 MP8125EF D289880.8A 1315 05-14-13 80 48 0 MP3389EF D189468.1C 1315 05-29-13 80 48 0 MP5010DQ-C347 C347221.9 1304 06-25-13 80 48 0 MP3389EF D189468.1 1315 05-15-13 80 48 0 MP28253EL D24P599.8A 1315 05-16-13 79 48 0 MP4688DN CA72119.9 1316 06-18-13 80 48 0 MP3389EF CB89067.1 1316 05-29-13 80 48 0 MP3394EF CB4L149.9A 1317 05-16-13 80 48 0 The Future of Analog IC Technology® -9- FA No. MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP8706EN D189485.9 1316 05-27-13 80 48 0 MP28255EL D44R792.9A 1321 06-18-13 79 48 0 MP6002DN 9685967.7A 1320 06-18-13 75 48 0 MP8736DL CC89293.8 1318 06-26-13 80 48 0 Total FA No. 0 LONG TERM LIFE (HTOL Long Term Monitor) BCM12S Stress Duration: 1000 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of Fail MP5000DQ C888369.9AQ 1249 04-03-13 80 0 MP5000DQ C888369.9BQ 1249 04-03-13 80 0 MPQ4568GQ EP264904 1248 04-22-13 80 0 MPQ4568GQ EP264904 1248 04-22-13 80 0 MP8709EN CC89336.9AT 1312 05-29-13 77 0 Total FA No. 0 BCM12S #fail #device hours Accel Factor FIT Rate 0 397000 348 7 HIGH TEMPERATURE STORAGE LIFE (HTSL) Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MP1494DJ C472536.8QBA-C 1245 04-22-13 50 0 MP1494DJ C472536.8QBB-C 1247 04-22-13 50 0 MP1494DJ C472536.8QBC-C 1249 04-22-13 50 0 MP1494DJ EP286107 1302 04-22-13 50 0 MP1494DJ C472536.8QBA 1245 04-22-13 50 0 MP1494DJ C472536.8QBB 1247 04-22-13 50 0 MP1494DJ C472536.8QBC- 1249 04-22-13 50 0 MP1494DJ EP286107 1302 04-22-13 50 0 MP5000DQ C347147.9M 1236 05-31-13 50 0 MP5000DQ C549750.7 1236 05-31-13 50 0 MPQ28261DL BB84333.9 1228 05-21-13 47 0 MPQ28261DL C285336.7 1228 05-21-13 47 0 MP8705EN CB4K588.9Q 1309 05-21-13 50 0 MP6211DN C285564.7 1217 06-06-13 47 0 MP6211DN C285565.7 1222 06-06-13 47 0 MP1494DJ C472536.8 1232 06-06-13 47 0 MP1494DJ C572710.8 1235 06-06-13 47 0 The Future of Analog IC Technology® - 10 - FA No. MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of Fail MP3388DR C346039.1AL 1231 06-20-13 45 0 MP3388DR C346039.1AM 1231 06-20-13 45 0 MP3388DR C346039.1AH 1231 06-20-13 45 0 MP2670DQ C9481368.9AL 1228 06-20-13 45 0 MP2670DQ C9481368.9AMA 1228 06-20-13 44 0 MP2670DQ C9481368.9AMB 1228 06-20-13 45 0 MP2670DQ C9481368.9AH 1228 06-20-13 45 0 MP3388DR C285583.7 1304 06-08-13 50 0 Total FA No. 0 3.3 BCM35 Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: ASMC,SMIC EARLY LIFE (HTOL Short Term Monitor) Stress Duration: 48 ~168 hours Test Condition: Vccmax @ 125°C Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP5010ADQ HP313202 1309 06-04-13 80 168 0 MP5010ADQ CC43287.9 1313 06-04-13 80 168 0 Total FA No. 0 LONG TERM LIFE (HTOL Long Term Monitor) BCM35 Stress Duration: 1000 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of Fail MP5087GQ HP303507 1305 06-09-13 78 0 Total FA No. 0 BCM35 #fail #device hours Accel Factor FIT Rate 0 78 348 35 HIGH TEMPERATURE STORAGE LIFE (HTSL) BCM35 Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MP2155GQ HP286501 1245 06-27-13 50 0 MP2161GJ HP314214 1305 06-08-13 50 0 MP5087GG HP303502 1308 06-04-13 50 0 The Future of Analog IC Technology® - 11 - FA No. MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of Fail MP5010ADQ HP313202 1309 06-04-13 50 0 MP5010ADQ CC43287.9 1313 06-04-13 50 0 MP5083GG HP306505 1317 06-27-13 50 0 Total FA No. 0 3.4 BCM05 Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: ASMC,HHNEC LONG TERM LIFE (HTOL Long Term Monitor) BCM05 Stress Duration: 1000 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of Fail MP20045DQ-25 CA88770.9 1302 06-07-13 80 0 Total FA No. 0 BCM05 #fail #device hours Accel Factor FIT Rate 0 80000 348 33 HIGH TEMPERATURE STORAGE LIFE (HTSL) BCM05 Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MP2130DG CB72203.8Q 1304 04-22-13 50 0 MP2130DG CB72203.8Q 1304 04-22-13 50 0 MP20045DQ-25 CA88770.9 1302 06-07-13 50 0 Total 0 The Future of Analog IC Technology® - 12 - FA No. MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT 3.5 BCM18 Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: SMIC HIGH TEMPERATURE STORAGE LIFE (HTSL) BCM18 Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail NB675GL HP3118 1245 04-22-13 50 0 NB675GL HP321303 1302 04-22-13 50 0 NB671LGQ HP3134 1245 04-09-13 50 0 NB675GL HP321303 1302 04-22-13 50 0 NB671LGQ HP3134 1245 04-09-13 50 0 NB671GQ HP303201 1305 06-03-13 50 0 NB671GQ HP3328 1308 06-03-13 50 0 Total 0 The Future of Analog IC Technology® - 13 - FA No. MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT 4.0 PACKAGE RELIABILITY MONITORING DATA 4.1 QFN The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD QFN2*2 ASAT QFN2*2 UCD QFN2*3 ASAT QFN2*3 UCD QFN3*3 ASAT QFN3*3 UCD QFN3*4 ASAT QFN3*4 UCD QFN4*4 ASAT QFN4*4 UCD QFN4*5 ASAT QFN5*5 UCD QFN5*5 ASAT QFN7*7 UCD QFN5*6 UTAC UCD QFN6*6 JCET QFN2*2 UCD QFN7*7 JCET QFN4*4 QFN3*3 4.1.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP5000DQ 1249 04-03-13 190 0 MP5000DQ 1249 04-03-13 190 0 NB600CQ 1221 05-21-13 100 0 NB600CQ 1222 05-21-13 100 0 MPQ3701GR 1239 05-29-13 180 0 MP2109DQ 1303 05-20-13 180 0 MP5000SDQ 1309 05-21-13 260 0 MP2119DQ 1304 06-09-13 180 0 MP3388DR 1231 06-20-13 180 0 MP3388DR 1231 06-20-13 180 0 MP3388DR 1231 06-20-13 180 0 MP2670DQ 1228 06-20-13 180 0 MP2670DQ 1228 06-20-13 180 0 MP2670DQ 1228 06-20-13 180 0 MP2670DQ 1228 06-20-13 180 0 MP2155GQ 1245 06-27-13 301 0 MP2155GQ 1318 06-27-13 106 0 MP20045DQ-25 1302 06-07-13 180 0 MP5087GQ 1305 06-09-13 80 0 MP2209DL 1304 06-08-13 180 0 MP3388DR 1304 06-08-13 180 0 FA NO. The Future of Analog IC Technology® - 14 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP5010ADQ 1309 06-04-13 302 0 MP2119DQ 1309 06-03-13 205 0 MP2119DQ 1309 06-03-13 205 0 MP2119DQ 1309 06-03-13 205 0 MP5083GG 1317 06-27-13 280 0 Total FA NO. 0 SAT picture of QFN T-SCAN PICTURE C-SCAN PICTURE 4.1.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP5000DQ 1249 04-03-13 87 0 FA NO. # of cycle 1000 MP5000DQ 1249 04-03-13 87 0 1000 MPQ3701GR 1239 05-29-13 84 0 1000 MP2109DQ 1303 05-20-13 87 0 1000 MP5000SDQ 1309 05-21-13 84 0 1000 MP2119DQ 1304 06-09-13 85 0 1000 MP3388DR 1231 06-20-13 85 0 1000 MP3388DR 1231 06-20-13 85 0 1000 MP3388DR 1231 06-20-13 85 0 1000 MP2670DQ 1228 06-20-13 85 0 1000 MP2670DQ 1228 06-20-13 85 0 1000 MP2670DQ 1228 06-20-13 85 0 1000 MP2670DQ 1228 06-20-13 85 0 1000 MP2155GQ 1245 06-27-13 94 0 1000 The Future of Analog IC Technology® - 15 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP20045DQ-25 1302 06-07-13 87 0 1000 MP2209DL 1304 06-08-13 85 0 1000 FA NO. # of cycle MP3388DR 1304 06-08-13 85 0 1000 MP5010ADQ 1309 06-04-13 95 0 1000 MP2119DQ 1309 06-03-13 97 0 1000 MP2119DQ 1309 06-03-13 97 0 1000 MP2119DQ 1309 06-03-13 97 0 1000 MP5010ADQ 1313 06-04-13 95 0 1000 MP5083GG 1317 06-27-13 94 0 1000 MPQ28261DL 1302 04-16-13 50 0 100 MP5010ADQ 1303 06-03-13 50 0 100 MP5000DQ-C266 1302 04-09-13 50 0 100 MP5010DQ 1302 04-09-13 50 0 100 MP5010ADQ 1310 05-16-13 50 0 100 MP2483DQ 1311 04-03-13 50 0 100 MP8726EL 1307 04-11-13 50 0 100 MP28252EL 1310 04-03-13 50 0 100 MP28254EL 1311 04-03-13 50 0 100 MP4459DQT 1246 04-11-13 50 0 100 MP28128DQ 1301 04-03-13 50 0 100 MP3388DR-C414 1311 04-03-13 50 0 100 MP2136EG 1311 04-11-13 50 0 100 MP2005DD 1310 04-09-13 50 0 100 MP2209DL 1309 04-09-13 50 0 100 MP5010BDQ 1312 05-28-13 50 0 100 MP62041DQFU-1 1313 04-25-13 50 0 100 MP2371DG 1310 04-27-13 50 0 100 MP2005DD 1307 04-09-13 50 0 100 MP1517DR 1307 04-09-13 50 0 100 MP2371DG 1311 04-27-13 50 0 100 MP28256EL 1311 05-14-13 50 0 100 MP2635GR 1313 04-12-13 50 0 100 MP28253EL-C323 1313 05-07-13 50 0 100 MP2452DD 1313 04-15-13 50 0 100 MP5010ADQ 1313 05-16-13 50 0 100 MP5010ADQ 1313 05-14-13 50 0 100 MP3388DR-C414 1314 04-23-13 50 0 100 MP28252EL 1313 04-22-13 50 0 100 MP62041DQFU-1 1314 04-25-13 50 0 100 MP4460DQ 1310 06-18-13 50 0 100 MP9115DQT 1315 04-22-13 50 0 100 MP3388DR-C414 1315 04-24-13 50 0 100 The Future of Analog IC Technology® - 16 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2205DL 1245 04-25-13 50 0 100 MP2106DQ 1313 04-25-13 50 0 100 FA NO. # of cycle MP3388DR-C414 1315 04-24-13 50 0 100 MP2207DQ 1223 05-30-13 50 0 100 MP4561DQ 1309 05-03-13 50 0 100 MP3388DR-C414 1315 04-25-13 50 0 100 MP5010BDQ 1315 05-21-13 50 0 100 MP3388DR-C414 1315 04-26-13 50 0 100 MP2633GR 1315 05-08-13 50 0 100 MP28252EL 1316 05-07-13 50 0 100 MP2604DQ 1247 04-28-13 50 0 100 MP2138DQT 1206 04-28-13 50 0 100 MP38874DL 1315 05-03-13 50 0 100 MP2303DQ 1311 05-18-13 50 0 100 MP3308DL 1305 05-03-13 50 0 100 MP5010DQ 1302 05-07-13 100 0 100 MP28128DQ 1306 05-02-13 50 0 100 MP2121DQ 1314 05-06-13 50 0 100 MP1528DQ 1316 05-06-13 50 0 100 MP8125DR 1316 05-08-13 50 0 100 MP2633GR 1316 05-08-13 50 0 100 MP3388DR-C414 1314 05-08-13 50 0 100 MP2489DQ 1315 05-06-13 50 0 100 MP2109DQ 1315 05-14-13 50 0 100 MP28252EL 1316 05-20-13 50 0 100 MP2012DQ 1316 05-18-13 50 0 100 MP3388DR-C414 1315 05-08-13 50 0 100 MP2209DL 1315 05-08-13 50 0 100 MP28253EL 1314 05-14-13 50 0 100 MP3384EQ 1251 05-09-13 50 0 100 NB634EL 1317 05-10-13 50 0 100 MP5010DQ-C347 1316 05-08-13 50 0 100 MP6400DG-01 1309 05-14-13 50 0 100 MP3388DR-C414 1315 05-08-13 50 0 100 MP3388DR-C414 1315 05-14-13 50 0 100 MP3388DR-C414 1316 05-14-13 50 0 100 MP3388DR-C414 1316 05-15-13 50 0 100 MP2012DQ 1317 05-16-13 50 0 100 MP28255EL 1318 05-10-13 50 0 100 MP5010DQ-C347 1316 05-14-13 50 0 100 MP3388DR-C414 1316 05-14-13 50 0 100 MP1720DQ-216 1318 05-13-13 50 0 100 The Future of Analog IC Technology® - 17 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP3305DD 1317 05-16-13 50 0 100 MP3388DR-C414 1316 05-13-13 50 0 100 FA NO. # of cycle MP1517DR 1317 05-15-13 50 0 100 MP3388DR-C414 1317 05-20-13 50 0 100 MP3388DR-C414 1317 05-20-13 50 0 100 MP3388DR-C414 1317 05-20-13 50 0 100 MP3388DR-C414 1317 05-20-13 50 0 100 MP3304CDD 1317 05-16-13 50 0 100 MPQ4456GQT 1316 05-28-13 50 0 100 MP3388DR-C414 1316 05-20-13 50 0 100 MPQ4459DQT 1238 05-21-13 50 0 100 MP26123DR 1315 05-17-13 47 0 100 MP2106DQ 1316 05-21-13 50 0 100 MP2012DQ 1313 05-22-13 50 0 100 MP2932GQK 1313 05-31-13 45 0 100 MP28256EL 1313 05-21-13 50 0 100 MPQ28261DL 1313 05-27-13 50 0 100 MP28256EL 1311 05-23-13 45 0 100 MP3308DL 1302 05-22-13 50 0 100 MPQ4462DQ 1242 05-23-13 50 0 100 MP5600EUT 1315 05-22-13 50 0 100 MP4460DQ 1318 05-23-13 50 0 100 MP28252EL 1316 05-23-13 50 0 100 MP3388DR-C414 1319 05-29-13 50 0 100 MPQ4559DQ 1319 06-04-13 50 0 100 MP8126DR 1315 05-28-13 50 0 100 MP28252EL 1316 05-28-13 50 0 100 MP28119EG-1.0 1306 05-28-13 50 0 100 MP5010DQ 1319 05-27-13 50 0 100 MP8904DD 1305 05-28-13 50 0 100 MPQ4558DQ 1312 05-28-13 50 0 100 MP3308DL 1320 05-27-13 50 0 100 MP3388SGR 1319 05-29-13 50 0 100 MP28252EL 1316 05-29-13 50 0 100 MP28252EL 1316 05-29-13 50 0 100 MP38872DL 1303 05-29-13 50 0 100 MP3310EQ 1320 05-29-13 50 0 100 MP2565DQ 1319 05-29-13 50 0 100 MP3388DR-C414 1320 05-29-13 50 0 100 MP28256EL 1320 05-29-13 50 0 100 MP26058DQ 1321 05-29-13 50 0 100 MP3388DR-C414 1320 05-30-13 50 0 100 The Future of Analog IC Technology® - 18 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP4459DQT 1321 06-18-13 50 0 100 MP38874DL 1321 06-03-13 50 0 100 MP2005DD 1313 06-03-13 50 0 100 MP2356EQ 1321 06-03-13 50 0 100 MP3388DR-C414 1320 06-03-13 50 0 100 MP2108DQ 1315 06-03-13 50 0 100 MP2633GR 1320 06-03-13 50 0 100 FA NO. # of cycle MP2214DL 1316 06-03-13 50 0 100 MP3304BDD 1321 06-18-13 50 0 100 MP1530DQ 1319 06-18-13 50 0 100 MP3388DR 1249 06-18-13 50 0 100 MP2102DQ 1317 06-18-13 50 0 100 MP2012DQ 1321 06-18-13 50 0 100 MPQ4456GQT 1321 06-24-13 50 0 100 NB600CQ 1320 06-18-13 50 0 100 MP8125DR 1319 06-24-13 50 0 100 MP2452DD 1320 06-18-13 50 0 100 MP28252EL 1322 06-24-13 50 0 100 MP2633AGR 1321 06-28-13 50 0 100 MP62040DQFU-1 1322 06-18-13 50 0 100 MP3430HQ 1321 06-18-13 50 0 100 MP28252EL 1322 06-24-13 50 0 100 MP3388DR-C414 1321 06-18-13 50 0 100 MP2633GR 1321 06-25-13 50 0 100 MP2633AGR 1322 06-28-13 50 0 100 MP2492DQ 1322 06-18-13 50 0 100 MP3021DQ 1321 06-28-13 50 0 100 MP2633GR 1322 06-25-13 50 0 100 MPQ28261DL 1320 06-25-13 50 0 100 MP2106DQ 1318 06-24-13 50 0 100 MP1720DQ-216 1322 06-25-13 50 0 100 MP2633GR 1323 06-25-13 50 0 100 MP3308DL 1323 06-24-13 50 0 100 MP2633AGR 1322 06-28-13 50 0 100 MP2120DQ 1310 06-24-13 50 0 100 NB600CQ 1321 06-28-13 50 0 100 MP1531DQ 1320 06-24-13 50 0 100 MP28127DQ 1322 06-28-13 50 0 100 MP2635GR 1321 06-28-13 50 0 100 MP2633GR 1323 06-28-13 50 0 100 MP62041DQFU-1 1324 06-28-13 50 0 100 Total 0 The Future of Analog IC Technology® - 19 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT 4.1.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP5000DQ 1249 04-03-13 87 0 168 MP5000DQ 1249 04-03-13 87 0 168 MP2120DQ 1215 05-21-13 47 0 168 MP2120DQ 1219 05-21-13 46 0 168 NB600CQ 1221 05-21-13 50 0 168 FA NO. # of hrs NB600CQ 1222 05-21-13 47 0 168 MP2012DQ 1233 05-21-13 47 0 168 MP2012DQ 1236 05-21-13 47 0 168 MP5000DQ 1236 05-31-13 50 0 168 MP5000DQ 1236 05-31-13 50 0 168 MPQ28261DL 1228 05-21-13 47 0 168 MPQ28261DL 1228 05-21-13 47 0 168 MPQ3701GR 1239 05-29-13 87 0 168 MP2109DQ 1303 05-20-13 87 0 168 MP5000SDQ 1309 05-21-13 87 0 168 MP4561DQ 1232 06-08-13 48 0 168 MP4561DQ 1234 06-08-13 47 0 168 MP2119DQ 1304 06-09-13 85 0 168 MP3388DR 1231 06-20-13 85 0 168 MP3388DR 1231 06-20-13 85 0 168 MP3388DR 1231 06-20-13 85 0 168 MP2670DQ 1228 06-20-13 90 0 168 MP2670DQ 1228 06-20-13 90 0 168 MP2670DQ 1228 06-20-13 90 0 168 MP2670DQ 1228 06-20-13 90 0 168 MP2155GQ 1245 06-27-13 87 0 168 MP20045DQ-25 1302 06-07-13 87 0 168 MP2209DL 1304 06-08-13 85 0 168 MP3388DR 1304 06-08-13 85 0 168 MP5010ADQ 1309 06-04-13 95 0 168 MP2119DQ 1309 06-03-13 97 0 168 MP2119DQ 1309 06-03-13 97 0 168 MP2119DQ 1309 06-03-13 97 0 168 MP5010ADQ 1313 06-04-13 95 0 168 MP5083GG 1317 06-27-13 97 0 168 MPQ28261DL 1302 04-16-13 50 0 48 MP5010ADQ 1303 06-03-13 50 0 48 MP5000DQ-C266 1302 04-09-13 50 0 48 The Future of Analog IC Technology® - 20 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP5010DQ 1302 04-09-13 50 0 48 MP5010ADQ 1310 05-16-13 50 0 48 FA NO. # of hrs MP2483DQ 1311 04-03-13 50 0 48 MP8726EL 1307 04-11-13 50 0 48 MP28252EL 1310 04-03-13 50 0 48 MP28254EL 1311 04-03-13 50 0 48 MP4459DQT 1246 04-11-13 50 0 48 MP28128DQ 1301 04-03-13 50 0 48 MP3388DR-C414 1311 04-03-13 50 0 48 MP2136EG 1311 04-11-13 50 0 48 MP2005DD 1310 04-09-13 50 0 48 MP2209DL 1309 04-09-13 50 0 48 MP5010BDQ 1312 05-28-13 50 0 48 MP62041DQFU-1 1313 04-25-13 50 0 48 MP2371DG 1310 04-27-13 50 0 48 MP2005DD 1307 04-09-13 50 0 48 MP1517DR 1307 04-09-13 50 0 48 MP2371DG 1311 04-27-13 50 0 48 MP28256EL 1311 05-14-13 50 0 48 MP2635GR 1313 04-12-13 50 0 48 MP28253EL-C323 1313 05-07-13 50 0 48 MP2452DD 1313 04-15-13 50 0 48 MP5010ADQ 1313 05-16-13 50 0 48 MP5010ADQ 1313 05-14-13 50 0 48 MP3388DR-C414 1314 04-23-13 50 0 48 MP28252EL 1313 04-22-13 50 0 48 MP62041DQFU-1 1314 04-25-13 50 0 48 MP4460DQ 1310 06-18-13 50 0 48 MP9115DQT 1315 04-22-13 50 0 48 MP3388DR-C414 1315 04-24-13 50 0 48 MP2205DL 1245 04-25-13 50 0 48 MP2106DQ 1313 04-25-13 50 0 48 MP3388DR-C414 1315 04-24-13 50 0 48 MP2207DQ 1223 05-30-13 50 0 48 MP4561DQ 1309 05-03-13 50 0 48 MP3388DR-C414 1315 04-25-13 50 0 48 MP5010BDQ 1315 05-21-13 50 0 48 MP3388DR-C414 1315 04-26-13 50 0 48 MP2633GR 1315 05-08-13 50 0 48 MP28252EL 1316 05-07-13 50 0 48 MP2604DQ 1247 04-28-13 50 0 48 MP2138DQT 1206 04-28-13 50 0 48 The Future of Analog IC Technology® - 21 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP38874DL 1315 05-03-13 50 0 48 MP2303DQ 1311 05-18-13 50 0 48 FA NO. # of hrs MP3308DL 1305 05-03-13 50 0 48 MP5010DQ 1302 05-07-13 100 0 48 MP28128DQ 1306 05-02-13 50 0 48 MP2121DQ 1314 05-06-13 50 0 48 MP1528DQ 1316 05-06-13 50 0 48 MP8125DR 1316 05-08-13 50 0 48 MP2633GR 1316 05-08-13 50 0 48 MP3388DR-C414 1314 05-08-13 50 0 48 MP2489DQ 1315 05-06-13 50 0 48 MP2109DQ 1315 05-14-13 50 0 48 MP28252EL 1316 05-20-13 50 0 48 MP2012DQ 1316 05-18-13 50 0 48 MP3388DR-C414 1315 05-08-13 50 0 48 MP2209DL 1315 05-08-13 49 0 48 MP28253EL 1314 05-14-13 50 0 48 MP3384EQ 1251 05-09-13 50 0 48 NB634EL 1317 05-10-13 50 0 48 MP5010DQ-C347 1316 05-08-13 50 0 48 MP6400DG-01 1309 05-14-13 50 0 48 MP3388DR-C414 1315 05-08-13 50 0 48 MP3388DR-C414 1315 05-14-13 50 0 48 MP3388DR-C414 1316 05-14-13 50 0 48 MP3388DR-C414 1316 05-15-13 50 0 48 MP2012DQ 1317 05-16-13 50 0 48 MP28255EL 1318 05-10-13 50 0 48 MP5010DQ-C347 1316 05-14-13 50 0 48 MP3388DR-C414 1316 05-14-13 50 0 48 MP1720DQ-216 1318 05-13-13 50 0 48 MP3305DD 1317 05-16-13 50 0 48 MP3388DR-C414 1316 05-13-13 50 0 48 MP1517DR 1317 05-15-13 50 0 48 MP3388DR-C414 1317 05-20-13 50 0 48 MP3388DR-C414 1317 05-20-13 50 0 48 MP3388DR-C414 1317 05-20-13 50 0 48 MP3388DR-C414 1317 05-20-13 50 0 48 MP3304CDD 1317 05-16-13 50 0 48 MPQ4456GQT 1316 05-28-13 50 0 48 MP3388DR-C414 1316 05-20-13 50 0 48 MPQ4459DQT 1238 05-21-13 50 0 48 MP26123DR 1315 05-17-13 50 0 48 The Future of Analog IC Technology® - 22 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2106DQ 1316 05-21-13 50 0 48 MP2012DQ 1313 05-22-13 50 0 48 FA NO. # of hrs MP2932GQK 1313 05-31-13 50 0 48 MP28256EL 1313 05-21-13 50 0 48 MPQ28261DL 1313 05-27-13 50 0 48 MP28256EL 1311 05-23-13 50 0 48 MP3308DL 1302 05-22-13 50 0 48 MPQ4462DQ 1242 05-23-13 50 0 48 MP5600EUT 1315 05-22-13 50 0 48 MP4460DQ 1318 05-23-13 50 0 48 MP28252EL 1316 05-23-13 50 0 48 MP3388DR-C414 1319 05-29-13 50 0 48 MPQ4559DQ 1319 06-04-13 50 0 48 MP8126DR 1315 05-28-13 50 0 48 MP28252EL 1316 05-28-13 50 0 48 MP28119EG-1.0 1306 05-28-13 50 0 48 MP5010DQ 1319 05-27-13 50 0 48 MP8904DD 1305 05-28-13 50 0 48 MPQ4558DQ 1312 05-28-13 50 0 48 MP3308DL 1320 05-27-13 50 0 48 MP3388SGR 1319 05-29-13 50 0 48 MP28252EL 1316 05-29-13 50 0 48 MP28252EL 1316 05-29-13 50 0 48 MP38872DL 1303 05-29-13 50 0 48 MP3310EQ 1320 05-29-13 50 0 48 MP2565DQ 1319 05-29-13 50 0 48 MP3388DR-C414 1320 05-29-13 50 0 48 MP28256EL 1320 05-29-13 50 0 48 MP26058DQ 1321 05-29-13 50 0 48 MP3388DR-C414 1320 05-30-13 50 0 48 MP4459DQT 1321 06-18-13 50 0 48 MP38874DL 1321 06-03-13 50 0 48 MP2005DD 1313 06-03-13 50 0 48 MP2356EQ 1321 06-03-13 50 0 48 MP3388DR-C414 1320 06-03-13 50 0 48 MP2108DQ 1315 06-03-13 50 0 48 MP2633GR 1320 06-03-13 50 0 48 MP2214DL 1316 06-03-13 50 0 48 MP3304BDD 1321 06-18-13 50 0 48 MP1530DQ 1319 06-18-13 50 0 48 MP3388DR 1249 06-18-13 50 0 48 MP2102DQ 1317 06-18-13 50 0 48 The Future of Analog IC Technology® - 23 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2012DQ 1321 06-18-13 50 0 FA NO. # of hrs 48 MPQ4456GQT 1321 06-24-13 50 0 48 NB600CQ 1320 06-18-13 50 0 48 MP8125DR 1319 06-24-13 50 0 48 MP2452DD 1320 06-18-13 50 0 48 MP28252EL 1322 06-24-13 50 0 48 MP2633AGR 1321 06-28-13 50 0 48 MP62040DQFU-1 1322 06-18-13 50 0 48 MP3430HQ 1321 06-18-13 50 0 48 MP28252EL 1322 06-24-13 50 0 48 MP3388DR-C414 1321 06-18-13 50 0 48 MP2633GR 1321 06-25-13 50 0 48 MP2633AGR 1322 06-28-13 50 0 48 MP2492DQ 1322 06-18-13 50 0 48 MP3021DQ 1321 06-28-13 50 0 48 MP2633GR 1322 06-25-13 50 0 48 MPQ28261DL 1320 06-25-13 50 0 48 MP2106DQ 1318 06-24-13 50 0 48 MP1720DQ-216 1322 06-25-13 50 0 48 MP2633GR 1323 06-25-13 50 0 48 MP3308DL 1323 06-24-13 50 0 48 MP2633AGR 1322 06-28-13 50 0 48 MP2120DQ 1310 06-24-13 50 0 48 NB600CQ 1321 06-28-13 50 0 48 MP1531DQ 1320 06-24-13 50 0 48 MP28127DQ 1322 06-28-13 50 0 48 MP2635GR 1321 06-28-13 50 0 48 MP2633GR 1323 06-28-13 50 0 48 MP62041DQFU-1 1324 06-28-13 50 0 48 Total 0 4.1.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C Close Date Sample Size # of Fail MP2155GQ 1245 06-27-13 90 0 MP2155GQ 1318 06-27-13 102 0 MP5087GQ 1305 06-09-13 80 0 MP5010ADQ 1309 06-04-13 102 0 MP5083GG 1317 06-27-13 80 0 MP5010ADQ 1303 06-03-13 50 0 MP5010ADQ 1310 05-16-13 50 0 FA NO. The Future of Analog IC Technology® - 24 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP5010BDQ 1312 05-28-13 50 0 MP5010ADQ 1313 05-16-13 100 0 MP5010ADQ 1313 05-14-13 50 0 MP5010BDQ 1315 05-21-13 50 0 Total FA NO. 0 4.2 SOIC The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD SOIC8 ANST SOIC14 UCD SOIC8-EP ANST SOIC16 ANST SOIC8-7 ANST SOIC20 ANST SOIC8 ANST SOIC28 ANST SOIC8-EP UTAC SOIC8 UTAC SOIC8-EP JCET SOIC8 JCET SOIC8-EP JCET SOIC16 ASE-KS SOIC8-EP ASE-KS SOIC8 4.2.1 Preconditioning MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MPQ4462DN 1301 05-29-13 270 0 MP8705EN 1309 05-21-13 180 0 MP8709EN 1312 05-29-13 200 0 MP1484EN 1304 06-09-13 180 0 Total FA NO. 0 SAT picture of SOIC T-SCAN PICTURE C-SCAN PICTURE The Future of Analog IC Technology® - 25 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT 4.2.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MPQ4462DN 1301 05-29-13 84 0 1000 MP8705EN 1309 05-21-13 85 0 1000 MP6211DN 1217 06-06-13 47 0 1000 MP6211DN 1222 06-06-13 47 0 1000 MP2307DN 1228 06-06-13 47 0 1000 MP2307DN 1228 06-06-13 47 0 1000 MP1484EN 1304 06-09-13 85 0 1000 MP24833GN 1305 04-17-13 50 0 100 MP24830HS 1236 04-03-13 50 0 100 MP24830HS-C470H 1236 06-18-13 50 0 100 MP2467DN-C478 1310 04-03-13 50 0 100 FA NO. # of cycle MP2307DN 1305 04-03-13 50 0 100 MP1482DS-C165 1309 04-03-13 50 0 100 MP1482DS-C165 1309 04-03-13 50 0 100 MP1482DS-C165 1309 04-03-13 50 0 100 MP24830HS-C470 1310 04-09-13 50 0 100 MP1484EN-C166 1308 04-09-13 50 0 100 MP8708EN 1306 04-03-13 50 0 100 MP4012DS 1310 04-03-13 50 0 100 MP62061DN 1310 04-09-13 50 0 100 MP8708EN 1306 04-03-13 50 0 100 MP2305DS 1304 04-03-13 50 0 100 MP2562DS 1310 04-03-13 50 0 100 MP2365DN 1309 04-03-13 50 0 100 MP8705EN 1308 04-03-13 50 0 100 MP1484EN 1312 04-09-13 50 0 100 MP1484EN 1312 04-09-13 50 0 100 MP1482DN 1312 04-15-13 50 0 100 MP1587EN 1311 04-09-13 50 0 100 MP4030GS 1310 04-16-13 50 0 100 MP2374DS 1311 04-11-13 50 0 100 MP20051DN 1311 04-09-13 50 0 100 MP62350ES 1312 04-16-13 50 0 100 MP2303ADN 1312 04-25-13 50 0 100 MP2468DN 1311 04-09-13 50 0 100 MP20045DN-33 1304 04-25-13 50 0 100 MP3394SGS 1306 04-08-13 50 0 100 MP1482DN 1312 04-12-13 50 0 100 MP1482DN 1312 04-16-13 50 0 100 The Future of Analog IC Technology® - 26 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DN 1312 04-16-13 50 0 100 MP6002DN 1310 05-14-13 50 0 100 FA NO. # of cycle MP8709EN 1312 04-28-13 50 0 100 MP1591DN 1312 04-16-13 50 0 100 MP8705EN 1313 04-28-13 50 0 100 MP1584EN 1312 04-24-13 50 0 100 MP6002DN 1312 05-14-13 50 0 100 MP1482DS-C165 1313 04-16-13 50 0 100 MP3394ES-C462 1307 04-22-13 50 0 100 MP4030GS 1313 04-16-13 50 0 100 MP4030GS 1313 05-30-13 50 0 100 MP6205DN 1309 04-11-13 50 0 100 MP3394SGS 1311 04-11-13 50 0 100 MP1582EN 1313 04-16-13 50 0 100 MP1482DN 1313 04-15-13 50 0 100 MP3394ES-C462 1307 04-15-13 50 0 100 MP20051DN 1313 04-16-13 50 0 100 MP6001DN 1311 04-16-13 50 0 100 MP20045DN 1312 04-12-13 50 0 100 MP1582EN 1309 04-16-13 50 0 100 MP2489DN-C489 1310 04-18-13 50 0 100 MP8705EN 1313 04-18-13 50 0 100 MP1482DN 1313 04-17-13 50 0 100 MP3398GS 1308 04-22-13 50 0 100 MP1484EN 1244 04-18-13 50 0 100 MP1484EN 1308 04-22-13 50 0 100 MP6211DN 1313 04-22-13 50 0 100 MP1484EN 1311 04-18-13 50 0 100 MP2307DN 1314 04-19-13 50 0 100 MP1484EN-C166 1302 04-22-13 50 0 100 MP6001DN 1311 04-19-13 50 0 100 MP3394SGS 1312 05-22-13 50 0 100 MP1587EN 1311 05-15-13 50 0 100 MP1584EN 1310 04-27-13 50 0 100 MP6211DN 1314 05-15-13 50 0 100 MP1484EN 1313 04-23-13 50 0 100 MP201DS 1315 06-25-13 50 0 100 MP1482DN 1315 06-18-13 50 0 100 MP2488DN 1310 04-22-13 50 0 100 MP8709EN 1313 04-23-13 50 0 100 MP4462DN 1315 04-26-13 50 0 100 MP2562DS 1313 05-07-13 50 0 100 The Future of Analog IC Technology® - 27 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DS-C165 1314 05-02-13 50 0 100 MP1482DN 1316 04-28-13 50 0 100 MP2374DS 1315 05-07-13 50 0 100 MP1582EN 1315 05-03-13 50 0 100 MP1482DS-C165 1314 05-06-13 50 0 100 MP1482DN 1315 05-06-13 50 0 100 MP1482DN 1315 05-03-13 50 0 100 FA NO. # of cycle MP8705EN 1316 04-28-13 50 0 100 MP1591DN 1315 05-02-13 50 0 100 MP2307DN 1316 05-03-13 50 0 100 MP3394SGS 1315 05-06-13 50 0 100 MP1584EN 1310 05-07-13 50 0 100 MP8705EN 1313 05-07-13 50 0 100 MP1584EN 1315 05-06-13 50 0 100 MP1482DN 1315 05-06-13 50 0 100 MP1482DS-C165 1315 05-06-13 50 0 100 MP1482DN 1315 05-09-13 50 0 100 MP1482DN 1316 05-27-13 50 0 100 MP1482DS-C165 1316 05-08-13 50 0 100 MP9415EN 1306 05-09-13 50 0 100 MP1431DS-C106 1315 05-09-13 50 0 100 MP1482DN 1315 05-27-13 50 0 100 MP2307DN 1315 05-07-13 50 0 100 MP3394ES 1305 05-21-13 50 0 100 MP2307DN 1316 05-08-13 50 0 100 MP2249DN 1315 05-17-13 50 0 100 MP8709EN-C465 1312 05-07-13 50 0 100 MP1482DS-C165 1316 05-07-13 50 0 100 MP1482DN 1317 06-18-13 50 0 100 MP1482DN 1317 05-15-13 50 0 100 MP3394SGS 1316 05-16-13 50 0 100 MP2307DN 1316 05-09-13 50 0 100 MP8706EN 1316 05-09-13 50 0 100 MP6903DS 1312 05-19-13 50 0 100 MP1482DN 1317 05-13-13 50 0 100 MP2307DN 1316 05-09-13 50 0 100 MPGC01DN-C123 1314 05-14-13 50 0 100 MP1906DS 1317 05-14-13 50 0 100 MP1484EN-C166 1318 05-13-13 50 0 100 MP1482DS-C165 1317 05-13-13 50 0 100 MP9415EN 1316 05-15-13 50 0 100 MP1591DN 1318 05-17-13 50 0 100 The Future of Analog IC Technology® - 28 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DS-C165 1318 05-14-13 50 0 100 MP1582EN 1318 05-14-13 50 0 100 MP1482DN 1315 06-18-13 50 0 100 MP6211DN 1317 05-15-13 50 0 100 MP6211DN 1314 05-15-13 50 0 100 MP1482DN 1315 06-18-13 50 0 100 CM500GS 1316 05-17-13 50 0 100 MP20051DN 1318 05-19-13 50 0 100 MP2374DS 1318 05-19-13 50 0 100 MP46885DN 1317 05-15-13 50 0 100 MP3394SGS 1316 05-17-13 50 0 100 MP4030GS 1318 05-17-13 50 0 100 MP6901DS 1317 05-20-13 50 0 100 MP3394ES 1314 05-20-13 50 0 100 MP1482DS-C165 1318 05-22-13 50 0 100 FA NO. # of cycle MP3394ES 1314 05-20-13 50 0 100 MP1582EN 1319 05-23-13 50 0 100 MP1482DN 1319 05-24-13 50 0 100 MP3394SGS 1318 05-27-13 50 0 100 MP4030GS 1320 05-29-13 50 0 100 MP2560DN-C241 1319 05-30-13 50 0 100 MP1484EN-C166 1321 05-31-13 50 0 100 MP1482DN 1321 06-18-13 50 0 100 MP6002DN 1320 06-18-13 50 0 100 MP1484EN-C166 1321 06-03-13 50 0 100 MP2303ADN-C258 1320 06-03-13 50 0 100 MP1482DN 1321 06-18-13 50 0 100 MP1482DN 1321 06-18-13 50 0 100 MP4000DS 1317 06-18-13 50 0 100 MP7720DS 1305 06-18-13 50 0 100 MP8706EN 1318 06-18-13 50 0 100 MP1584EN 1319 06-18-13 50 0 100 MP1484EN 1319 06-18-13 50 0 100 MP2565DN 1321 06-18-13 50 0 100 MP1482DN 1320 06-18-13 50 0 100 MP1482DN 1321 06-28-13 50 0 100 MP1482DS-C165 1320 06-18-13 50 0 100 MP3398GS 1315 06-18-13 50 0 100 DAS09 1319 06-18-13 50 0 100 MP4021GS 1317 06-18-13 50 0 100 MP3394SGS 1319 06-18-13 50 0 100 MP2307DN 1320 06-18-13 50 0 100 The Future of Analog IC Technology® - 29 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8708EN-C273 1322 06-24-13 50 0 100 MP1482DN 1321 06-28-13 50 0 100 MP1482DN 1321 06-24-13 50 0 100 MP1484EN 1319 06-24-13 50 0 100 MP3394ES-C462 1314 06-18-13 50 0 100 MP1482DN 1321 06-18-13 50 0 100 MP3394ES 1319 06-25-13 50 0 100 MP1482DS-C165 1320 06-18-13 50 0 100 FA NO. # of cycle MP2307DN 1319 06-18-13 50 0 100 MP3394ES 1316 06-25-13 50 0 100 MP1482DN 1322 06-28-13 50 0 100 MP9141ES 1321 06-28-13 50 0 100 MP1482DN 1322 06-28-13 50 0 100 MP1591DS 1322 06-28-13 50 0 100 MP1482DN 1322 06-28-13 50 0 100 MP1584EN-C319 1321 06-18-13 50 0 100 MP2307DN 1320 06-18-13 50 0 100 MP1482DN 1322 06-28-13 50 0 100 MP2307DN 1321 06-24-13 50 0 100 MP2303ADN 1321 06-25-13 50 0 100 MP20051DN 1322 06-24-13 50 0 100 MP1006ES 1322 06-24-13 50 0 100 MP1580HS 1321 06-24-13 50 0 100 MP1484EN-C166 1321 06-24-13 50 0 100 MP1583DN 1321 06-24-13 50 0 100 MP1484EN 1320 06-24-13 50 0 100 MP2305DS 1322 06-25-13 50 0 100 MP9415EN 1319 06-24-13 50 0 100 MP2451DT 1322 06-25-13 50 0 100 MP9415EN 1319 06-25-13 50 0 100 MP62340DS 1322 06-25-13 50 0 100 MP1431DS 1322 06-25-13 50 0 100 MP3394ES 1321 06-25-13 50 0 100 Total 0 4.2.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MPQ4462DN 1301 05-29-13 87 0 168 MP8705EN 1309 05-21-13 85 0 168 FA NO. # of hrs The Future of Analog IC Technology® - 30 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP6211DN 1217 06-06-13 47 0 168 MP6211DN 1222 06-06-13 47 0 168 MP2307DN 1228 06-06-13 47 0 168 MP2307DN 1228 06-06-13 47 0 168 MP1484EN 1304 06-09-13 85 0 168 MP24833GN 1305 04-17-13 50 0 48 MP24830HS 1236 04-03-13 50 0 48 FA NO. # of hrs MP24830HS-C470H 1236 06-18-13 50 0 48 MP2467DN-C478 1310 04-03-13 50 0 48 MP2307DN 1305 04-03-13 50 0 48 MP1482DS-C165 1309 04-03-13 50 0 48 MP1482DS-C165 1309 04-03-13 50 0 48 MP1482DS-C165 1309 04-03-13 50 0 48 MP24830HS-C470 1310 04-09-13 50 0 48 MP1484EN-C166 1308 04-09-13 50 0 48 MP8708EN 1306 04-03-13 50 0 48 MP4012DS 1310 04-03-13 50 0 48 MP62061DN 1310 04-09-13 50 0 48 MP8708EN 1306 04-03-13 50 0 48 MP2305DS 1304 04-03-13 50 0 48 MP2562DS 1310 04-03-13 50 0 48 MP2365DN 1309 04-03-13 50 0 48 MP8705EN 1308 04-03-13 50 0 48 MP1484EN 1312 04-09-13 50 0 48 MP1484EN 1312 04-09-13 50 0 48 MP1482DN 1312 04-15-13 50 0 48 MP1587EN 1311 04-09-13 50 0 48 MP4030GS 1310 04-16-13 50 0 48 MP2374DS 1311 04-11-13 50 0 48 MP20051DN 1311 04-09-13 50 0 48 MP62350ES 1312 04-16-13 50 0 48 MP2303ADN 1312 04-25-13 50 0 48 MP2468DN 1311 04-09-13 50 0 48 MP20045DN-33 1304 04-25-13 50 0 48 MP3394SGS 1306 04-08-13 50 0 48 MP1482DN 1312 04-12-13 50 0 48 MP1482DN 1312 04-16-13 50 0 48 MP1482DN 1312 04-16-13 50 0 48 MP6002DN 1310 05-14-13 50 0 48 MP8709EN 1312 04-28-13 50 0 48 MP1591DN 1312 04-16-13 50 0 48 MP8705EN 1313 04-28-13 50 0 48 The Future of Analog IC Technology® - 31 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1584EN 1312 04-24-13 50 0 48 MP6002DN 1312 05-14-13 50 0 48 MP1482DS-C165 1313 04-16-13 50 0 48 MP3394ES-C462 1307 04-22-13 50 0 48 MP4030GS 1313 04-16-13 50 0 48 MP4030GS 1313 05-30-13 50 0 48 FA NO. # of hrs MP6205DN 1309 04-11-13 50 0 48 MP3394SGS 1311 04-11-13 50 0 48 MP1582EN 1313 04-16-13 50 0 48 MP1482DN 1313 04-15-13 50 0 48 MP3394ES-C462 1307 04-15-13 50 0 48 MP20051DN 1313 04-16-13 50 0 48 MP6001DN 1311 04-16-13 50 0 48 MP20045DN 1312 04-12-13 50 0 48 MP1582EN 1309 04-16-13 50 0 48 MP2489DN-C489 1310 04-18-13 50 0 48 MP8705EN 1313 04-18-13 50 0 48 MP1482DN 1313 04-17-13 50 0 48 MP3398GS 1308 04-22-13 50 0 48 MP1484EN 1244 04-18-13 50 0 48 MP1484EN 1308 04-22-13 50 0 48 MP6211DN 1313 04-22-13 50 0 48 MP1484EN 1311 04-18-13 50 0 48 MP2307DN 1314 04-19-13 50 0 48 MP1484EN-C166 1302 04-22-13 50 0 48 MP6001DN 1311 04-19-13 50 0 48 MP3394SGS 1312 05-22-13 50 0 48 MP1587EN 1311 05-15-13 50 0 48 MP1584EN 1310 04-27-13 50 0 48 MP6211DN 1314 05-15-13 50 0 48 MP1484EN 1313 04-23-13 50 0 48 MP201DS 1315 06-25-13 50 0 48 MP1482DN 1315 06-18-13 50 0 48 MP2488DN 1310 04-22-13 50 0 48 MP8709EN 1313 04-23-13 50 0 48 MP4462DN 1315 04-26-13 50 0 48 MP2562DS 1313 05-07-13 50 0 48 MP1482DS-C165 1314 05-02-13 50 0 48 MP1482DN 1316 04-28-13 50 0 48 MP2374DS 1315 05-07-13 50 0 48 MP1582EN 1315 05-03-13 50 0 48 MP1482DS-C165 1314 05-06-13 50 0 48 The Future of Analog IC Technology® - 32 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DN 1315 05-06-13 50 0 48 MP1482DN 1315 05-03-13 50 0 48 FA NO. # of hrs MP8705EN 1316 04-28-13 50 0 48 MP1591DN 1315 05-02-13 50 0 48 MP2307DN 1316 05-03-13 50 0 48 MP3394SGS 1315 05-06-13 50 0 48 MP1584EN 1310 05-07-13 50 0 48 MP8705EN 1313 05-07-13 50 0 48 MP1584EN 1315 05-06-13 50 0 48 MP1482DN 1315 05-06-13 50 0 48 MP1482DS-C165 1315 05-06-13 50 0 48 MP1482DN 1315 05-09-13 50 0 48 MP1482DN 1316 05-27-13 50 0 48 MP1482DS-C165 1316 05-08-13 50 0 48 MP9415EN 1306 05-09-13 50 0 48 MP1431DS-C106 1315 05-09-13 50 0 48 MP1482DN 1315 05-27-13 50 0 48 MP2307DN 1315 05-07-13 50 0 48 MP3394ES 1305 05-21-13 50 0 48 MP2307DN 1316 05-08-13 50 0 48 MP2249DN 1315 05-17-13 50 0 48 MP8709EN-C465 1312 05-07-13 50 0 48 MP1482DS-C165 1316 05-07-13 50 0 48 MP1482DN 1317 06-18-13 50 0 48 MP1482DN 1317 05-15-13 50 0 48 MP3394SGS 1316 05-16-13 50 0 48 MP2307DN 1316 05-09-13 50 0 48 MP8706EN 1316 05-09-13 50 0 48 MP6903DS 1312 05-19-13 50 0 48 MP1482DN 1317 05-13-13 50 0 48 MP2307DN 1316 05-09-13 50 0 48 MPGC01DN-C123 1314 05-14-13 50 0 48 MP1906DS 1317 05-14-13 50 0 48 MP1484EN-C166 1318 05-13-13 50 0 48 MP1482DS-C165 1317 05-13-13 50 0 48 MP9415EN 1316 05-15-13 50 0 48 MP1591DN 1318 05-17-13 50 0 48 MP1482DS-C165 1318 05-14-13 50 0 48 MP1582EN 1318 05-14-13 50 0 48 MP1482DN 1315 06-18-13 50 0 48 MP6211DN 1317 05-15-13 50 0 48 MP6211DN 1314 05-15-13 50 0 48 The Future of Analog IC Technology® - 33 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DN 1315 06-18-13 50 0 48 CM500GS 1316 05-17-13 50 0 48 MP20051DN 1318 05-19-13 50 0 48 MP2374DS 1318 05-19-13 50 0 48 MP46885DN 1317 05-15-13 50 0 48 MP3394SGS 1316 05-17-13 50 0 48 MP4030GS 1318 05-17-13 50 0 48 MP6901DS 1317 05-20-13 50 0 48 MP3394ES 1314 05-20-13 50 0 48 MP1482DS-C165 1318 05-22-13 50 0 48 MP3394ES 1314 05-20-13 50 0 48 FA NO. # of hrs MP1582EN 1319 05-23-13 50 0 48 MP1482DN 1319 05-24-13 50 0 48 MP3394SGS 1318 05-27-13 50 0 48 MP4030GS 1320 05-29-13 50 0 48 MP2560DN-C241 1319 05-30-13 50 0 48 MP1484EN-C166 1321 05-31-13 50 0 48 MP1482DN 1321 06-18-13 50 0 48 MP6002DN 1320 06-18-13 50 0 48 MP1484EN-C166 1321 06-03-13 50 0 48 MP2303ADN-C258 1320 06-03-13 50 0 48 MP1482DN 1321 06-18-13 50 0 48 MP1482DN 1321 06-18-13 50 0 48 MP4000DS 1317 06-18-13 50 0 48 MP7720DS 1305 06-18-13 50 0 48 MP8706EN 1318 06-18-13 50 0 48 MP1584EN 1319 06-18-13 50 0 48 MP1484EN 1319 06-18-13 50 0 48 MP2565DN 1321 06-18-13 50 0 48 MP1482DN 1320 06-18-13 50 0 48 MP1482DN 1321 06-28-13 50 0 48 MP1482DS-C165 1320 06-18-13 50 0 48 MP3398GS 1315 06-18-13 50 0 48 DAS09 1319 06-18-13 50 0 48 MP4021GS 1317 06-18-13 50 0 48 MP3394SGS 1319 06-18-13 50 0 48 MP2307DN 1320 06-18-13 50 0 48 MP8708EN-C273 1322 06-24-13 50 0 48 MP1482DN 1321 06-28-13 50 0 48 MP1482DN 1321 06-24-13 50 0 48 MP1484EN 1319 06-24-13 50 0 48 MP3394ES-C462 1314 06-18-13 50 0 48 The Future of Analog IC Technology® - 34 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DN 1321 06-18-13 50 0 FA NO. # of hrs 48 MP3394ES 1319 06-25-13 50 0 48 MP1482DS-C165 1320 06-18-13 50 0 48 MP2307DN 1319 06-18-13 50 0 48 MP3394ES 1316 06-25-13 50 0 48 MP1482DN 1322 06-28-13 50 0 48 MP9141ES 1321 06-28-13 50 0 48 MP1482DN 1322 06-28-13 50 0 48 MP1591DS 1322 06-28-13 50 0 48 MP1482DN 1322 06-28-13 50 0 48 MP1584EN-C319 1321 06-18-13 50 0 48 MP2307DN 1320 06-18-13 50 0 48 MP1482DN 1322 06-28-13 50 0 48 MP2307DN 1321 06-24-13 50 0 48 MP2303ADN 1321 06-25-13 50 0 48 MP20051DN 1322 06-24-13 50 0 48 MP1006ES 1322 06-24-13 50 0 48 MP1580HS 1321 06-24-13 50 0 48 MP1484EN-C166 1321 06-24-13 50 0 48 MP1583DN 1321 06-24-13 50 0 48 MP1484EN 1320 06-24-13 50 0 48 MP2305DS 1322 06-25-13 50 0 48 MP9415EN 1319 06-24-13 50 0 48 MP2451DT 1322 06-25-13 50 0 48 MP9415EN 1319 06-25-13 50 0 48 MP62340DS 1322 06-25-13 50 0 48 MP1431DS 1322 06-25-13 50 0 48 MP3394ES 1321 06-25-13 50 0 48 Total 0 4.2.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C Close Date Sample Size # of Fail MPQ4462DN 1301 05-29-13 80 0 MPQ4462DN 1301 05-29-13 107 0 MP8709EN 1312 05-29-13 107 0 Total FA NO. 0 The Future of Analog IC Technology® - 35 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT 4.3 MSOP The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD MSOP8 ANST MSOP8-EP UCD MSOP10-EP ANST MSOP10 UCD MSOP10 ANST MSOP10-EP ANST MSOP8 4.3.1 Preconditioning MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP8110DK 1316 06-20-13 260 0 Total FA NO. 0 SAT picture of MSOP T-SCAN PICTURE C-SCAN PICTURE 4.3.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP62341DH 1309 04-03-13 50 0 100 MP6211DH 1307 04-09-13 50 0 100 MP6231DH 1309 04-03-13 50 0 100 MP1412DH 1310 04-11-13 50 0 100 FA NO. # of cycle MP2007DH 1310 04-11-13 50 0 100 MP62341DH 1311 04-11-13 50 0 100 MP2481DH 1312 04-16-13 50 0 100 The Future of Analog IC Technology® - 36 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1412DH 1310 04-17-13 50 0 100 MP1542DK 1310 04-16-13 50 0 100 MP2481DH 1313 04-15-13 50 0 100 FA NO. # of cycle MP1542DK 1313 04-19-13 50 0 100 MP2905EK 1306 06-25-13 50 0 100 MP2361DK 1315 04-22-13 50 0 100 MP2361DK 1312 04-24-13 50 0 100 MP3213DH 1316 05-07-13 50 0 100 MP1542DK 1313 05-09-13 50 0 100 MP2106DK 1318 05-16-13 50 0 100 MP1542DK 1316 05-16-13 50 0 100 MP2105DK 1247 05-27-13 50 0 100 MP1411DH 1316 05-26-13 50 0 100 MP1412DH 1316 05-30-13 50 0 100 MP1411DH 1319 06-18-13 50 0 100 MP2105DK 1320 06-18-13 50 0 100 MP1411DH 1321 06-25-13 50 0 100 MP1542DK-C472 1322 06-25-13 50 0 100 Total 0 4.3.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP62341DH 1309 04-03-13 50 0 48 MP6211DH 1307 04-09-13 50 0 48 MP6231DH 1309 04-03-13 50 0 48 MP1412DH 1310 04-11-13 50 0 48 MP2007DH 1310 04-11-13 50 0 48 MP62341DH 1311 04-11-13 50 0 48 MP2481DH 1312 04-16-13 50 0 48 MP1412DH 1310 04-17-13 50 0 48 MP1542DK 1310 04-16-13 50 0 48 MP2481DH 1313 04-15-13 50 0 48 FA NO. # of hrs MP1542DK 1313 04-19-13 50 0 48 MP2905EK 1306 06-25-13 50 0 48 MP2361DK 1315 04-22-13 50 0 48 MP2361DK 1312 04-24-13 50 0 48 MP3213DH 1316 05-07-13 50 0 48 MP1542DK 1313 05-09-13 50 0 48 The Future of Analog IC Technology® - 37 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1542DK 1313 05-09-13 50 0 48 MP2106DK 1318 05-16-13 50 0 48 MP1542DK 1316 05-16-13 50 0 48 MP2105DK 1247 05-27-13 50 0 48 MP1411DH 1316 05-26-13 50 0 48 MP1412DH 1316 05-30-13 50 0 48 MP1411DH 1319 06-18-13 50 0 48 MP2105DK 1320 06-18-13 50 0 48 MP1411DH 1321 06-25-13 50 0 48 MP1542DK-C472 1322 06-25-13 50 0 48 Total FA NO. # of hrs 0 4.4 TSOT The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE ANST TSOT23-5 JCET TSOT23-5 ASNT TSOT23-6 JCET TSOT23-6 ASNT TSOT23-8 JCET TSOT23-8 4.4.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP3217DJ 1230 06-03-13 90 0 Total FA NO. 0 SAT picture of TSOT T-SCAN PICTURE C-SCAN PICTURE The Future of Analog IC Technology® - 38 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT 4.4.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP3217DJ 1250 05-20-13 50 0 100 MP3217DJ 1244 05-20-13 50 0 100 MP3217DJ 1250 05-01-13 50 0 100 MP3217DJ 1304 05-20-13 50 0 100 MP3302DJ 1305 06-18-13 50 0 100 MP8802DJ-2.85 1309 04-03-13 50 0 100 MP62551DJ 1309 04-03-13 50 0 100 MPQ2451DT-AEC1 1251 06-18-13 50 0 100 MP3410DJ 1306 05-28-13 50 0 100 MP2259DJ 1310 04-03-13 50 0 100 MP3302DJ-C136 1311 04-03-13 50 0 100 MP8802DJ-3.3 1311 04-09-13 50 0 100 MP65151DJ 1311 04-09-13 50 0 100 MP2259DJ 1310 04-11-13 50 0 100 MP65151DJ 1311 04-03-13 50 0 100 CM600GJ 1313 04-16-13 50 0 100 FA NO. # of cycle CM600GJ 1313 04-03-13 50 0 100 MP3301GJ 1306 04-12-13 50 0 100 MP3217DJ 1305 05-20-13 50 0 100 MP8802DJ-2.85 1311 04-11-13 100 0 100 MP6400DJ-33 1305 04-18-13 50 0 100 MP2128DT 1309 04-19-13 50 0 100 MP8802DJ-2.85 1309 04-16-13 50 0 100 MP6400DJ-01 1311 04-18-13 50 0 100 MP62055EJ 1313 04-19-13 50 0 100 CM600GJ 1315 04-18-13 50 0 100 MP24893DJ 1313 04-18-13 50 0 100 MP2359DT 1310 04-18-13 50 0 100 MP3217DJ 1304 06-18-13 100 0 100 CM600GJ 1315 04-27-13 50 0 100 MP65151DJ 1312 05-03-13 50 0 100 MPQ9361DJ 1252 05-13-13 50 0 100 MP1541DJ 1315 05-21-13 50 0 100 MP2259DJ 1316 05-08-13 50 0 100 MP62055EJ 1315 05-21-13 50 0 100 MP3302DJ 1313 05-13-13 50 0 100 MP3301GJ 1315 05-16-13 50 0 100 MP1518DJ 1316 05-16-13 50 0 100 CM600GJ 1318 05-19-13 50 0 100 The Future of Analog IC Technology® - 39 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT # of cycle Device D/C Close Date Sample Size # of Fail MP3209DJ 1317 05-20-13 50 0 100 MP1541DJ 1315 05-22-13 50 0 100 MP3302DJ 1315 05-22-13 50 0 100 MP2451DT 1305 05-22-13 50 0 100 CM600GJ 1318 05-30-13 50 0 100 MP3302DJ 1317 05-23-13 48 0 100 MP3217DJ 1314 05-27-13 50 0 100 MP3217DJ 1319 05-27-13 50 0 100 MP3217DJ 1314 05-27-13 50 0 100 MP3217DJ 1314 05-27-13 50 0 100 MP3215DJ 1315 05-29-13 50 0 100 MP2128DT 1319 05-29-13 50 0 100 MP24893DJ 1319 05-30-13 50 0 100 MP3217DJ 1319 06-18-13 50 0 100 MP3217DJ 1319 05-30-13 50 0 100 MP6400DJ-01 1317 05-31-13 50 0 100 MP3120DJ 1316 06-03-13 50 0 100 MP3217DJ 1319 06-03-13 50 0 100 MP3217DJ 1321 06-05-13 50 0 100 MP3217DJ 1321 06-05-13 50 0 100 MP1488DJ 1239 06-18-13 50 0 100 FA NO. MP2104DJ 1317 06-18-13 50 0 100 MP8802DJ-3.3 1321 06-18-13 50 0 100 MP3302DJ-C136 1320 06-18-13 50 0 100 MP1541DJ 1316 06-18-13 50 0 100 MP2451DT 1319 06-18-13 50 0 100 MP3202DJ 1322 06-28-13 50 0 100 MP62055EJ 1321 06-18-13 50 0 100 MP3217DJ 1321 06-18-13 50 0 100 MP3217DJ 1322 06-18-13 50 0 100 MP6400DJ-09 1304 06-18-13 50 0 100 MP3217DJ 1321 06-24-13 50 0 100 MP2259DJ 1322 06-25-13 50 0 100 MP62551DJ 1323 06-25-13 50 0 100 MP2259DJ 1317 06-25-13 50 0 100 MP65150DJ 1321 06-25-13 50 0 100 Total 0 The Future of Analog IC Technology® - 40 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT 4.4.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP3217DJ 1230 06-03-13 90 0 168 MP3217DJ 1250 05-20-13 50 0 48 MP3217DJ 1244 05-20-13 50 0 48 MP3217DJ 1250 05-01-13 50 0 48 MP3217DJ 1304 05-20-13 50 0 48 MP3302DJ 1305 06-18-13 50 0 48 MP8802DJ-2.85 1309 04-03-13 50 0 48 FA NO. # of hrs MP62551DJ 1309 04-03-13 50 0 48 MPQ2451DT-AEC1 1251 06-18-13 50 0 48 MP3410DJ 1306 05-28-13 50 0 48 MP2259DJ 1310 04-03-13 50 0 48 MP3302DJ-C136 1311 04-03-13 50 0 48 MP8802DJ-3.3 1311 04-09-13 50 0 48 MP65151DJ 1311 04-09-13 50 0 48 MP2259DJ 1310 04-11-13 50 0 48 MP65151DJ 1311 04-03-13 50 0 48 CM600GJ 1313 04-16-13 50 0 48 CM600GJ 1313 04-03-13 50 0 48 MP3301GJ 1306 04-12-13 50 0 48 MP3217DJ 1305 05-20-13 50 0 48 MP8802DJ-2.85 1311 04-11-13 100 0 48 MP6400DJ-33 1305 04-18-13 50 0 48 MP2128DT 1309 04-19-13 50 0 48 MP8802DJ-2.85 1309 04-16-13 50 0 48 MP6400DJ-01 1311 04-18-13 50 0 48 MP62055EJ 1313 04-19-13 50 0 48 CM600GJ 1315 04-18-13 50 0 48 MP24893DJ 1313 04-18-13 50 0 48 MP2359DT 1310 04-18-13 50 0 48 MP3217DJ 1304 06-18-13 100 0 48 CM600GJ 1315 04-27-13 50 0 48 MP65151DJ 1312 05-03-13 50 0 48 MPQ9361DJ 1252 05-13-13 50 0 48 MP1541DJ 1315 05-21-13 50 0 48 MP2259DJ 1316 05-08-13 50 0 48 MP62055EJ 1315 05-21-13 50 0 48 MP3302DJ 1313 05-13-13 50 0 48 MP3301GJ 1315 05-16-13 50 0 48 MP1518DJ 1316 05-16-13 50 0 48 The Future of Analog IC Technology® - 41 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail CM600GJ 1318 05-19-13 50 0 48 MP3209DJ 1317 05-20-13 50 0 48 MP1541DJ 1315 05-22-13 50 0 48 MP3302DJ 1315 05-22-13 50 0 48 MP2451DT 1305 05-22-13 50 0 48 CM600GJ 1318 05-30-13 50 0 48 MP3302DJ 1317 05-23-13 50 0 48 MP3217DJ 1314 05-27-13 50 0 48 MP3217DJ 1319 05-27-13 50 0 48 MP3217DJ 1314 05-27-13 50 0 48 MP3217DJ 1314 05-27-13 50 0 48 FA NO. # of hrs MP3215DJ 1315 05-29-13 50 0 48 MP2128DT 1319 05-29-13 50 0 48 MP24893DJ 1319 05-30-13 50 0 48 MP3217DJ 1319 06-18-13 50 0 48 MP3217DJ 1319 05-30-13 50 0 48 MP6400DJ-01 1317 05-31-13 50 0 48 MP3120DJ 1316 06-03-13 50 0 48 MP3217DJ 1319 06-03-13 50 0 48 MP3217DJ 1321 06-05-13 50 0 48 MP3217DJ 1321 06-05-13 50 0 48 MP1488DJ 1239 06-18-13 50 0 48 MP2104DJ 1317 06-18-13 50 0 48 MP8802DJ-3.3 1321 06-18-13 50 0 48 MP3302DJ-C136 1320 06-18-13 50 0 48 MP1541DJ 1316 06-18-13 50 0 48 MP2451DT 1319 06-18-13 50 0 48 MP3202DJ 1322 06-28-13 50 0 48 MP62055EJ 1321 06-18-13 50 0 48 MP3217DJ 1321 06-18-13 50 0 48 MP3217DJ 1322 06-18-13 50 0 48 MP6400DJ-09 1304 06-18-13 50 0 48 MP3217DJ 1321 06-24-13 50 0 48 MP2259DJ 1322 06-25-13 50 0 48 MP62551DJ 1323 06-25-13 50 0 48 MP2259DJ 1317 06-25-13 50 0 48 MP65150DJ 1321 06-25-13 50 0 48 Total 0 The Future of Analog IC Technology® - 42 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT 4.5 TSSOP The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD TSSOP20 ASNT TSSOP16-EP UCD TSSOP20-EP ASNT TSSOP20 ASNT TSSOP8 ASNT TSSOP20-EP ASNT TSSOP14 ASNT TSSOP24 ASNT TSSOP16 ASNT TSSOP28 ASNT TSSOP28-EP JCET TSSOP8 4.5.1 Preconditioning MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP2960TF 1235 04-03-13 170 0 MP7748SGF 1308 04-23-13 100 0 MP7748SGF 1308 04-23-13 100 0 MPQ4570GF 1310 06-03-13 200 0 Total FA NO. 0 SAT picture of TSSOP T-SCAN PICTURE C-SCAN PICTURE 4.5.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) # of cycle Device D/C Close Date Sample Size # of Fail MP2960TF 1235 04-03-13 84 0 1000 MPQ4570GF 1310 06-03-13 94 0 1000 FA NO. The Future of Analog IC Technology® - 43 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT # of cycle Device D/C Close Date Sample Size # of Fail MP3389EF-C355 1310 04-03-13 50 0 100 MP8126DF 1309 04-04-13 50 0 100 MP4601EF 1202 04-11-13 50 0 100 MP3389EF 1313 04-19-13 50 0 100 MP1060EF 1313 05-15-13 50 0 100 MP6507GF 1313 05-08-13 49 0 100 MPQ7731DF 1310 04-26-13 50 0 100 MP3394SGF 1313 05-10-13 50 0 100 MP3389EF 1315 05-09-13 50 0 100 MP3394EF 1316 05-15-13 50 0 100 MP3389EF 1316 05-18-13 49 0 100 MP8126DF 1320 05-29-13 50 0 100 FA NO. MP6505DM 1310 05-31-13 50 0 100 MP3394EF 1319 06-18-13 50 0 100 MP1038EM 1321 06-24-13 50 0 100 MP3389EF 1322 06-28-13 50 0 100 Total 0 4.5.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail FA NO. # of hrs 6305 168 MP2960TF 1235 04-03-13 80 2 MPQ4570GF 1310 06-03-13 97 0 168 MP3389EF-C355 1310 04-03-13 50 0 48 MP8126DF 1309 04-04-13 50 0 48 MP4601EF 1202 04-11-13 50 0 48 MP3389EF 1313 04-19-13 50 0 48 MP1060EF 1313 05-15-13 50 0 48 MP6507GF 1313 05-08-13 49 0 48 MPQ7731DF 1310 04-26-13 50 0 48 MP3394SGF 1313 05-10-13 50 0 48 MP3389EF 1315 05-09-13 50 0 48 MP3394EF 1316 05-15-13 50 0 48 MP3389EF 1316 05-18-13 49 0 48 MP8126DF 1320 05-29-13 50 0 48 MP6505DM 1310 05-31-13 50 0 48 MP3394EF 1319 06-18-13 50 0 48 MP1038EM 1321 06-24-13 50 0 48 MP3389EF 1322 06-28-13 50 0 48 Total 2 The Future of Analog IC Technology® - 44 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT 4.5.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C Close Date Sample Size # of Fail MP7748SGF 1308 04-23-13 78 0 MP7748SGF 1308 04-23-13 78 0 Total FA NO. 0 4.6 FLIP CHIP-QFN The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD FCQFN1*1.5 UTAC FCQFN2*2 UCD FCQFN1.5*2 UTAC FCQFN2*3 UCD FCQFN2*2 UTAC FCQFN3*3 UCD FCQFN2*3 UTAC FCQFN3*4 UCD FCQFN3*3 UTAC FCQFN4*4 UCD FCQFN3*4 UTAC FCQFN4*5 UCD FCQFN3*5 UTAC FCQFN4*6 UCD FCQFN4*4 UTAC FCQFN5*5 UCD FCQFN4*5 UTAC FCQFN5*6 UCD FCQFN4*6 UTAC FCQFN6*6 4.6.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail NB671GQ 1244 04-03-13 99 0 NB671GQ 1244 04-03-13 100 0 NB675GL 1245 04-22-13 189 0 NB675GL 1302 04-22-13 218 0 MP2130DG 1302 05-06-13 120 0 NB671LGQ 1245 04-09-13 180 0 MP1499GD 1303 04-09-13 183 0 MP2130DG 1304 04-22-13 180 0 MP8761GLE 1302 04-26-13 270 0 NB675GL 1302 04-22-13 218 0 MP2130DG 1302 05-06-13 120 0 NB671LGQ 1245 04-09-13 180 0 MP1499GD 1303 04-09-13 183 0 MP2130DG 1304 04-22-13 180 0 FA NO. The Future of Analog IC Technology® - 45 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8761GLE 1302 04-26-13 270 0 MP5021GQV 1308 06-20-13 185 0 MP5021GQV 1309 06-20-13 185 0 NB671GQ 1305 06-03-13 270 0 NB671GQ 1308 06-03-13 200 0 NB671GQ 1308 06-03-13 80 0 MP5087GG 1308 06-04-13 270 0 MP2162GQH 1304 05-27-13 100 0 MP8620DQK 1247 04-11-13 100 0 MP8620DQK 1311 04-12-13 100 0 Total FA NO. 0 SAT picture of FLIP CHIP-QFN T-SCAN PICTURE C-SCAN PICTURE 4.6.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail NB675GL 1245 04-22-13 84 0 1000 NB675GL 1302 04-22-13 77 0 1000 NB671LGQ 1245 04-09-13 84 0 1000 MP1499GD 1303 04-09-13 84 0 1000 MP5021GQV 1248 04-22-13 97 0 1000 FA NO. # of cycle MP2130DG 1304 04-22-13 84 0 1000 MP8761GLE 1302 04-26-13 84 0 1000 NB675GL 1302 04-22-13 77 0 1000 NB671LGQ 1245 04-09-13 84 0 1000 MP1499GD 1303 04-09-13 84 0 1000 The Future of Analog IC Technology® - 46 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP5021GQV 1248 04-22-13 97 0 1000 MP2130DG 1304 04-22-13 84 0 1000 FA NO. # of cycle MP8761GLE 1302 04-26-13 84 0 1000 MP5021GQV 1308 06-20-13 84 0 1000 MP5021GQV 1309 06-20-13 84 0 1000 NB671GQ 1305 06-03-13 84 0 1000 NB671GQ 1308 06-03-13 94 0 1000 MP5087GG 1308 06-04-13 84 0 1000 MP2617GL 1305 06-18-13 50 0 100 MP2162GQH 1304 05-27-13 50 0 100 MP28258DD 1303 04-03-13 50 0 100 MP86884DQKT 1311 04-03-13 50 0 100 MP86884DQKT 1311 04-03-13 50 0 100 MP2162GQH 1308 06-25-13 50 0 100 MP8736DL 1308 04-03-13 50 0 100 MP8736DL 1305 04-03-13 50 0 100 MP8736DL 1309 04-03-13 50 0 100 MP8736DL 1306 04-03-13 50 0 100 MP8736DL 1308 04-03-13 50 0 100 MP8736DL 1308 04-03-13 50 0 100 MP2130DG 1306 04-03-13 50 0 100 MP2130DG 1306 04-03-13 50 0 100 MP28258DD 1304 04-03-13 50 0 100 MP2334DD 1309 04-03-13 50 0 100 MP8736DL 1308 04-09-13 50 0 100 MP8736DL 1308 04-09-13 50 0 100 MP8761GL 1311 04-09-13 50 0 100 MP2158GQH 1312 04-03-13 100 0 100 MP8736DL 1310 04-09-13 50 0 100 MP8736DL 1308 04-09-13 50 0 100 MP9180DG 1308 04-03-13 50 0 100 MP8736DL 1309 04-09-13 50 0 100 MP8736DL 1310 04-09-13 50 0 100 MP8736DL 1311 04-09-13 100 0 100 MP8736DL 1310 04-09-13 50 0 100 MP8736DL 1309 04-09-13 50 0 100 MP8736DL 1310 04-09-13 50 0 100 MP8736DL 1310 04-09-13 50 0 100 MP28258DD 1304 04-11-13 50 0 100 MP38875DL 1312 05-27-13 50 0 100 MP8736DL 1309 04-09-13 50 0 100 MP28258DD 1302 04-09-13 100 0 100 The Future of Analog IC Technology® - 47 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1310 04-11-13 50 0 100 MP2140DD 1303 04-16-13 50 0 100 FA NO. # of cycle MP2140DD 1305 04-16-13 50 0 100 MP8736DL 1311 04-11-13 100 0 100 MP8736DL 1310 04-11-13 100 0 100 MP8736DL 1310 04-11-13 100 0 100 MP8736DL 1310 04-11-13 100 0 100 MP8736DL 1310 04-11-13 50 0 100 MP8736DL 1310 04-11-13 100 0 100 MP8736DL 1309 04-11-13 50 0 100 MP8736DL 1309 04-11-13 50 0 100 MP2625GL 1310 04-17-13 99 0 100 MP2625GL 1306 04-17-13 99 0 100 NB638DL 1242 04-29-13 100 0 100 NB650GL 1312 05-20-13 51 0 100 MP8736DL 1311 04-29-13 100 0 100 MP8736DL 1310 04-16-13 100 0 100 MP8736DL 1310 04-16-13 100 0 100 MP28258DD 1303 04-11-13 100 0 100 MP2130DG 1306 04-23-13 100 0 100 MP8736DL 1309 04-16-13 100 0 100 MP8736DL 1310 04-16-13 100 0 100 MP8736DL 1310 04-16-13 100 0 100 MP28259DD 1310 04-16-13 100 0 100 MP8736DL 1310 04-16-13 100 0 100 MP2130DG 1307 04-16-13 100 0 100 NB650HGL 1251 04-19-13 100 0 100 MP8736DL 1311 04-16-13 100 0 100 MP8736DL 1310 04-16-13 100 0 100 MP8736DL 1311 04-16-13 100 0 100 MP9152GD 1312 04-19-13 100 0 100 MP28258DD 1305 04-16-13 100 0 100 MP2130DG 1307 04-16-13 100 0 100 MP2130DG 1307 04-16-13 97 0 100 MP9180DG 1309 04-22-13 100 0 100 MP8736DL 1310 04-18-13 100 0 100 MP8736DL 1310 04-18-13 100 0 100 NB6381DL 1221 04-18-13 100 0 100 MP8736DL 1310 04-18-13 100 0 100 MP8761GL 1313 04-23-13 100 0 100 NB6381DL 1312 04-17-13 100 0 100 MP28258DD-A 1310 04-25-13 100 0 100 The Future of Analog IC Technology® - 48 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1310 04-22-13 100 0 100 NB6381DL 1311 04-18-13 100 0 100 MP28258DD 1306 04-19-13 100 0 100 MP8736DL 1310 04-22-13 100 0 100 NB638DL 1250 04-29-13 100 0 100 MP8736DL 1310 04-22-13 100 0 100 MP9180DG 1309 04-22-13 100 0 100 FA NO. # of cycle MP8736DL 1311 04-22-13 100 0 100 MP28258DD 1304 04-22-13 100 0 100 MP8762GL 1314 04-23-13 100 0 100 MP8736DL 1311 04-23-13 100 0 100 MP28258DD 1304 04-22-13 100 0 100 MP8736DL 1311 04-22-13 100 0 100 MP8736DL 1311 04-29-13 100 0 100 MP8736DL 1311 04-24-13 100 0 100 MP2130DG 1307 04-25-13 98 0 100 MP8736DL 1311 04-25-13 100 0 100 MP8736DL 1312 04-25-13 100 0 100 MP8736DL 1311 04-25-13 100 0 100 MP38873DL 1312 05-06-13 50 0 100 NB638EL 1238 04-27-13 100 0 100 MP2130DG 1312 04-25-13 100 0 100 MP8736DL 1311 04-25-13 100 0 100 MP8736DL 1311 04-25-13 100 0 100 MP28258DD-C471 1312 04-27-13 100 0 100 MP8736DL 1312 04-25-13 100 0 100 MP9181DD 1301 04-24-13 100 0 100 MP9180DG 1309 04-25-13 97 0 100 MP8736DL 1311 04-27-13 100 0 100 NB650GL 1314 05-02-13 100 0 100 NB638DL 1249 04-26-13 100 0 100 MP2617GL 1311 05-28-13 50 0 100 MP8736DL 1311 04-27-13 100 0 100 MP8736DL 1311 04-27-13 100 0 100 MP2130DG 1312 05-02-13 100 0 100 MP8736DL 1311 05-02-13 100 0 100 MP9180DG 1311 05-02-13 100 0 100 MP8736DL 1311 05-02-13 100 0 100 NB650HGL 1250 05-02-13 100 0 100 MP2130DG 1315 05-02-13 92 0 100 MP9180DG 1311 05-07-13 50 0 100 MP28251GD 1311 05-06-13 50 0 100 The Future of Analog IC Technology® - 49 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1311 05-07-13 50 0 100 NB650HGL 1251 05-06-13 50 0 100 FA NO. # of cycle MP28251GD 1315 05-14-13 50 0 100 MP2617GL 1316 05-28-13 50 0 100 MP2617GL 1311 06-04-13 50 0 100 MP2130DG 1315 05-06-13 50 0 100 MP28251GD 1315 05-08-13 50 0 100 NB669GQ 1315 05-08-13 50 0 100 MP8736DL 1311 05-08-13 50 0 100 MP28258DD-C471 1313 05-18-13 50 0 100 MP9180DG 1311 05-06-13 50 0 100 MP28251GD 1315 05-05-13 50 0 100 MP2130DG 1317 05-06-13 50 0 100 MP2308GD 1315 05-08-13 50 0 100 NB670GQ 1315 05-09-13 50 0 100 MP8736DL 1311 05-08-13 50 0 100 MP8736DL 1312 05-08-13 50 0 100 MP28258DD 1313 05-08-13 50 0 100 MP2130DG 1315 05-14-13 50 0 100 MP2334DD 1314 05-08-13 50 0 100 MP2308GD 1315 05-14-13 50 0 100 MP8736DL 1312 05-09-13 50 0 100 MP28258DD-A 1317 05-14-13 50 0 100 MP28259DD 1317 05-14-13 50 0 100 MP9180DG 1311 05-14-13 50 0 100 MP28258DD 1304 05-14-13 50 0 100 MP2162GQH 1315 05-14-13 50 0 100 MP9180DG 1314 05-14-13 50 0 100 MP2162GQH 1318 05-27-13 50 0 100 MP8736DL 1312 05-13-13 50 0 100 MP2334DD 1314 05-16-13 50 0 100 MP28258DD 1304 05-18-13 50 0 100 MP9180DG 1314 05-15-13 50 0 100 NB650HGL 1305 05-16-13 50 0 100 MP1499GD 1310 05-16-13 50 0 100 MP2625GL 1311 05-16-13 50 0 100 MP2158GQH 1318 05-15-13 50 0 100 NB650GL 1316 05-20-13 50 0 100 MP28258DD 1317 05-18-13 50 0 100 MP2130DG 1316 05-17-13 50 0 100 NB650GL 1302 05-19-13 97 0 100 MP2130DG 1317 05-20-13 50 0 100 The Future of Analog IC Technology® - 50 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2130DG 1317 05-20-13 50 0 100 MP28258DD 1304 05-22-13 50 0 100 MP9180DG 1316 05-22-13 50 0 100 MP2130DG 1317 05-22-13 50 0 100 MP28259DD 1318 05-22-13 50 0 100 MP9180DG 1317 05-22-13 50 0 100 MP2130DG 1317 05-23-13 50 0 100 MP2130DG 1317 05-24-13 50 0 100 MP2130DG 1317 05-27-13 50 0 100 MP9180DG 1317 05-27-13 50 0 100 MP28258DD 1304 05-28-13 50 0 100 FA NO. # of cycle MP9180DG 1317 05-29-13 50 0 100 MP28258DD 1305 05-29-13 50 0 100 MP9180DG 1318 05-29-13 50 0 100 MP9180DG 1318 05-29-13 50 0 100 MP9180DG 1316 05-30-13 50 0 100 MP9180DG 1318 05-31-13 50 0 100 MP2130DG 1320 06-03-13 50 0 100 MP2130DG 1320 06-03-13 50 0 100 MP8760GL 1321 06-18-13 50 0 100 MP8606DL 1321 06-18-13 50 0 100 MP28258DD-C471 1318 06-18-13 50 0 100 MP2130DG 1320 06-18-13 50 0 100 MP8736DL 1312 06-18-13 50 0 100 MP8736DL 1311 06-18-13 50 0 100 MP38900DL 1320 06-18-13 50 0 100 MP8736DL 1313 06-18-13 50 0 100 MP28258DD 1321 06-18-13 50 0 100 MP8736DL 1311 06-18-13 50 0 100 MP28259DD 1319 06-24-13 50 0 100 MP38900DL 1321 06-18-13 50 0 100 MP38875DL 1322 06-18-13 50 0 100 MP8736DL 1313 06-18-13 50 0 100 MP9180DG 1320 06-18-13 50 0 100 NB650GL 1319 06-25-13 50 0 100 MP2140DD 1322 06-24-13 50 0 100 MP8736DL 1313 06-18-13 50 0 100 MP8736DL 1311 06-18-13 50 0 100 MP8736DL 1318 06-18-13 50 0 100 MP2162GQH 1322 06-18-13 50 0 100 MP28258DD-A 1321 06-24-13 50 0 100 MP8736DL 1319 06-18-13 50 0 100 The Future of Analog IC Technology® - 51 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1499GD 1311 06-18-13 50 0 100 MP1499GD 1320 06-18-13 50 0 100 FA NO. # of cycle NB650GL 1321 06-18-13 50 0 100 MP8736DL 1318 06-18-13 50 0 100 MP8736DL 1319 06-18-13 50 0 100 MP8736DL 1318 06-18-13 50 0 100 MP8736DL 1315 06-18-13 50 0 100 MP8736DL 1313 06-18-13 50 0 100 MP8736DL 1315 06-18-13 50 0 100 MP2162GQH 1322 06-18-13 50 0 100 MP8736DL 1319 06-24-13 50 0 100 MP28259DD 1319 06-24-13 50 0 100 MP8736DL 1319 06-24-13 50 0 100 MP28258DD 1305 06-24-13 50 0 100 MP2130DG 1321 06-24-13 50 0 100 MP2162GQH 1323 06-24-13 50 0 100 MP8736DL 1319 06-25-13 50 0 100 MP28257DD 1314 06-28-13 50 0 100 MP2308GD 1322 06-28-13 50 0 100 MP2130DG 1320 06-25-13 50 0 100 MP2162GQH 1323 06-28-13 50 0 100 Total 0 4.6.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail NB675GL 1245 04-22-13 86 0 168 NB675GL 1302 04-22-13 83 0 168 NB671LGQ 1245 04-09-13 87 0 168 MP1499GD 1303 04-09-13 87 0 168 MP5021GQV 1248 04-22-13 97 0 168 MP2130DG 1304 04-22-13 87 0 168 MP8761GLE 1302 04-26-13 87 0 168 NB675GL 1302 04-22-13 83 0 168 FA NO. # of hrs NB671LGQ 1245 04-09-13 87 0 168 MP1499GD 1303 04-09-13 87 0 168 MP5021GQV 1248 04-22-13 97 0 168 MP2130DG 1304 04-22-13 87 0 168 MP8761GLE 1302 04-26-13 87 0 168 NB671GQ 1305 06-03-13 87 0 168 The Future of Analog IC Technology® - 52 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail NB671GQ 1308 06-03-13 97 0 168 MP5087GG 1308 06-04-13 85 0 168 FA NO. # of hrs MP2617GL 1305 06-18-13 50 0 48 MP2162GQH 1304 05-27-13 50 0 48 MP28258DD 1303 04-03-13 50 0 48 MP86884DQKT 1311 04-03-13 50 0 48 MP86884DQKT 1311 04-03-13 50 0 48 MP2162GQH 1308 06-25-13 50 0 48 MP8736DL 1308 04-03-13 50 0 48 MP8736DL 1305 04-03-13 50 0 48 MP8736DL 1309 04-03-13 50 0 48 MP8736DL 1306 04-03-13 50 0 48 MP8736DL 1308 04-03-13 50 0 48 MP8736DL 1308 04-03-13 50 0 48 MP2130DG 1306 04-03-13 50 0 48 MP2130DG 1306 04-03-13 50 0 48 MP28258DD 1304 04-03-13 50 0 48 MP2334DD 1309 04-03-13 50 0 48 MP8736DL 1308 04-09-13 50 0 48 MP8736DL 1308 04-09-13 50 0 48 MP8761GL 1311 04-09-13 50 0 48 MP2158GQH 1312 04-03-13 100 0 48 MP8736DL 1310 04-09-13 50 0 48 MP8736DL 1308 04-09-13 50 0 48 MP9180DG 1308 04-03-13 50 0 48 MP8620DQK 1247 04-11-13 50 0 48 MP8736DL 1309 04-09-13 50 0 48 MP8736DL 1310 04-09-13 50 0 48 MP8736DL 1311 04-09-13 100 0 48 MP8736DL 1310 04-09-13 50 0 48 MP8736DL 1309 04-09-13 50 0 48 MP8736DL 1310 04-09-13 50 0 48 MP8736DL 1310 04-09-13 50 0 48 MP28258DD 1304 04-11-13 50 0 48 MP38875DL 1312 05-27-13 50 0 48 MP8736DL 1309 04-09-13 50 0 48 MP28258DD 1302 04-09-13 100 0 48 MP8736DL 1310 04-11-13 50 0 48 MP2140DD 1303 04-16-13 50 0 48 MP2140DD 1305 04-16-13 50 0 48 MP8736DL 1311 04-11-13 100 0 48 MP8736DL 1310 04-11-13 100 0 48 The Future of Analog IC Technology® - 53 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1310 04-11-13 100 0 48 MP8736DL 1310 04-11-13 100 0 48 FA NO. # of hrs MP8736DL 1310 04-11-13 50 0 48 MP8736DL 1310 04-11-13 100 0 48 MP8736DL 1309 04-11-13 50 0 48 MP8736DL 1309 04-11-13 50 0 48 MP2625GL 1310 04-17-13 100 0 48 MP2625GL 1306 04-17-13 99 0 48 NB638DL 1242 04-29-13 100 0 48 MP8620DQK 1311 04-12-13 49 0 48 NB650GL 1312 05-20-13 50 0 48 MP8736DL 1311 04-29-13 100 0 48 MP8736DL 1310 04-16-13 100 0 48 MP8736DL 1310 04-16-13 100 0 48 MP28258DD 1303 04-11-13 100 0 48 MP2130DG 1306 04-23-13 100 0 48 MP8736DL 1309 04-16-13 100 0 48 MP8736DL 1310 04-16-13 100 0 48 MP8736DL 1310 04-16-13 100 0 48 MP28259DD 1310 04-16-13 100 0 48 MP8736DL 1310 04-16-13 100 0 48 MP2130DG 1307 04-16-13 100 0 48 NB650HGL 1251 04-19-13 100 0 48 MP8736DL 1311 04-16-13 100 0 48 MP8736DL 1310 04-16-13 100 0 48 MP8736DL 1311 04-16-13 100 0 48 MP9152GD 1312 04-19-13 99 0 48 MP28258DD 1305 04-16-13 100 0 48 MP2130DG 1307 04-16-13 100 0 48 MP2130DG 1307 04-16-13 100 0 48 MP9180DG 1309 04-22-13 100 0 48 MP8736DL 1310 04-18-13 100 0 48 MP8736DL 1310 04-18-13 100 0 48 NB6381DL 1221 04-18-13 100 0 48 MP8736DL 1310 04-18-13 100 0 48 MP8761GL 1313 04-23-13 100 0 48 NB6381DL 1312 04-17-13 100 0 48 MP28258DD-A 1310 04-25-13 100 0 48 MP8736DL 1310 04-22-13 100 0 48 NB6381DL 1311 04-18-13 100 0 48 MP28258DD 1306 04-19-13 100 0 48 MP8736DL 1310 04-22-13 99 0 48 The Future of Analog IC Technology® - 54 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail NB638DL 1250 04-29-13 100 0 48 MP8736DL 1310 04-22-13 100 0 48 MP9180DG 1309 04-22-13 100 0 48 MP8736DL 1311 04-22-13 100 0 48 MP28258DD 1304 04-22-13 100 0 48 MP8762GL 1314 04-23-13 100 0 48 MP8736DL 1311 04-23-13 100 0 48 MP28258DD 1304 04-22-13 100 0 48 MP8736DL 1311 04-22-13 100 0 48 MP8736DL 1311 04-29-13 100 0 48 MP8736DL 1311 04-24-13 100 0 48 MP2130DG 1307 04-25-13 100 0 48 MP8736DL 1311 04-25-13 100 0 48 MP8736DL 1312 04-25-13 100 0 48 MP8736DL 1311 04-25-13 100 0 48 MP38873DL 1312 05-06-13 50 0 48 NB638EL 1238 04-27-13 100 0 48 MP2130DG 1312 04-25-13 100 0 48 MP8736DL 1311 04-25-13 100 0 48 MP8736DL 1311 04-25-13 100 0 48 MP28258DD-C471 1312 04-27-13 100 0 48 MP8736DL 1312 04-25-13 100 0 48 MP9181DD 1301 04-24-13 100 0 48 MP9180DG 1309 04-25-13 100 0 48 MP8736DL 1311 04-27-13 100 0 48 NB650GL 1314 05-02-13 100 0 48 NB638DL 1249 04-26-13 100 0 48 MP2617GL 1311 05-28-13 50 0 48 MP8736DL 1311 04-27-13 100 0 48 MP8736DL 1311 04-27-13 100 0 48 MP2130DG 1312 05-02-13 100 0 48 MP8736DL 1311 05-02-13 100 0 48 MP9180DG 1311 05-02-13 100 0 48 FA NO. # of hrs MP8736DL 1311 05-02-13 100 0 48 NB650HGL 1250 05-02-13 100 0 48 MP2130DG 1315 05-02-13 100 0 48 MP9180DG 1311 05-07-13 50 0 48 MP28251GD 1311 05-06-13 50 0 48 MP8736DL 1311 05-07-13 50 0 48 NB650HGL 1251 05-06-13 50 0 48 MP28251GD 1315 05-14-13 50 0 48 MP2130DG 1315 05-06-13 50 0 48 The Future of Analog IC Technology® - 55 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP28251GD 1315 05-08-13 50 0 48 NB669GQ 1315 05-08-13 50 0 48 FA NO. # of hrs MP8736DL 1311 05-08-13 50 0 48 MP28258DD-C471 1313 05-18-13 50 0 48 MP9180DG 1311 05-06-13 50 0 48 MP28251GD 1315 05-05-13 50 0 48 MP2130DG 1317 05-06-13 50 0 48 MP2308GD 1315 05-08-13 50 0 48 NB670GQ 1315 05-09-13 50 0 48 MP8736DL 1311 05-08-13 50 0 48 MP8736DL 1312 05-08-13 50 0 48 MP28258DD 1313 05-08-13 47 0 48 MP2130DG 1315 05-14-13 50 0 48 MP2334DD 1314 05-08-13 50 0 48 MP2308GD 1315 05-14-13 50 0 48 MP8736DL 1312 05-09-13 50 0 48 MP28258DD-A 1317 05-14-13 50 0 48 MP28259DD 1317 05-14-13 50 0 48 MP9180DG 1311 05-14-13 50 0 48 MP28258DD 1304 05-14-13 50 0 48 MP2162GQH 1315 05-14-13 50 0 48 MP9180DG 1314 05-14-13 50 0 48 MP2162GQH 1318 05-27-13 50 0 48 MP8736DL 1312 05-13-13 50 0 48 MP2334DD 1314 05-16-13 50 0 48 MP28258DD 1304 05-18-13 50 0 48 MP9180DG 1314 05-15-13 50 0 48 MP8620DQK 1316 05-16-13 50 0 48 MP8620DQK 1316 05-16-13 50 0 48 NB650HGL 1305 05-16-13 50 0 48 MP1499GD 1310 05-16-13 50 0 48 MP2625GL 1311 05-16-13 50 0 48 MP2158GQH 1318 05-15-13 50 0 48 NB650GL 1316 05-20-13 50 0 48 MP28258DD 1317 05-18-13 50 0 48 MP2130DG 1316 05-17-13 50 0 48 NB650GL 1302 05-19-13 95 0 48 MP2130DG 1317 05-20-13 50 0 48 MP2130DG 1317 05-20-13 50 0 48 MP28258DD 1304 05-22-13 50 0 48 MP9180DG 1316 05-22-13 50 0 48 MP2130DG 1317 05-22-13 50 0 48 The Future of Analog IC Technology® - 56 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP28259DD 1318 05-22-13 50 0 48 MP9180DG 1317 05-22-13 50 0 48 MP2130DG 1317 05-23-13 50 0 48 MP2130DG 1317 05-24-13 50 0 48 MP2130DG 1317 05-27-13 50 0 48 MP9180DG 1317 05-27-13 50 0 48 MP28258DD 1304 05-28-13 50 0 48 FA NO. # of hrs MP9180DG 1317 05-29-13 50 0 48 MP28258DD 1305 05-29-13 50 0 48 MP9180DG 1318 05-29-13 50 0 48 MP9180DG 1318 05-29-13 50 0 48 MP9180DG 1316 05-30-13 50 0 48 MP9180DG 1318 05-31-13 50 0 48 MP2130DG 1320 06-03-13 50 0 48 MP2130DG 1320 06-03-13 50 0 48 MP8760GL 1321 06-18-13 50 0 48 MP8606DL 1321 06-18-13 50 0 48 MP28258DD-C471 1318 06-18-13 50 0 48 MP2130DG 1320 06-18-13 50 0 48 MP8736DL 1312 06-18-13 50 0 48 MP8736DL 1311 06-18-13 50 0 48 MP38900DL 1320 06-18-13 50 0 48 MP8736DL 1313 06-18-13 50 0 48 MP28258DD 1321 06-18-13 50 0 48 MP8736DL 1311 06-18-13 50 0 48 MP28259DD 1319 06-24-13 50 0 48 MP38900DL 1321 06-18-13 50 0 48 MP38875DL 1322 06-18-13 50 0 48 MP8736DL 1313 06-18-13 50 0 48 MP9180DG 1320 06-18-13 50 0 48 NB650GL 1319 06-25-13 50 0 48 MP2140DD 1322 06-24-13 50 0 48 MP8736DL 1313 06-18-13 50 0 48 MP8736DL 1311 06-18-13 50 0 48 MP8736DL 1318 06-18-13 50 0 48 MP2162GQH 1322 06-18-13 50 0 48 MP28258DD-A 1321 06-24-13 50 0 48 MP8736DL 1319 06-18-13 50 0 48 MP1499GD 1311 06-18-13 50 0 48 MP1499GD 1320 06-18-13 50 0 48 NB650GL 1321 06-18-13 50 0 48 MP8736DL 1318 06-18-13 50 0 48 The Future of Analog IC Technology® - 57 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1319 06-18-13 50 0 48 MP8736DL 1318 06-18-13 50 0 48 MP8736DL 1315 06-18-13 50 0 48 MP8736DL 1313 06-18-13 50 0 48 MP8736DL 1315 06-18-13 50 0 48 MP2162GQH 1322 06-18-13 50 0 48 MP8736DL 1319 06-24-13 50 0 48 MP28259DD 1319 06-24-13 50 0 48 FA NO. # of hrs MP8736DL 1319 06-24-13 50 0 48 MP28258DD 1305 06-24-13 50 0 48 MP2130DG 1321 06-24-13 50 0 48 MP2162GQH 1323 06-24-13 50 0 48 MP8736DL 1319 06-25-13 50 0 48 MP28257DD 1314 06-28-13 50 0 48 MP2308GD 1322 06-28-13 50 0 48 MP2130DG 1320 06-25-13 50 0 48 MP2162GQH 1323 06-28-13 50 0 48 Total 0 4.6.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C Close Date Sample Size # of Fail MP2130DG 1302 05-06-13 90 0 MP2130DG 1302 05-06-13 90 0 NB671GQ 1308 06-03-13 80 0 MP2617GL 1305 06-18-13 50 0 MP38875DL 1312 05-27-13 44 0 MP38873DL 1312 05-06-13 45 0 MP2617GL 1311 05-28-13 50 0 MP2617GL 1316 05-28-13 50 0 MP2617GL 1311 06-04-13 50 0 Total FA NO. 0 4.7 FLIP CHIP-SOIC The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD ANST FCSOIC8 JCET JCAP FCSOIC8 FCSOIC8 ANST FCSOIC16 FCSOIC8 The Future of Analog IC Technology® - 58 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT 4.7.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP1482DS-C416 1318 06-18-13 100 0 FA NO. SAT picture of FLIP CHIP-SOIC T-SCAN PICTURE C-SCAN PICTURE 4.7.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP1482DS 1305 04-03-13 50 0 1000 MP1482DS 1305 04-11-13 50 0 1000 MP1482DS 1252 05-07-13 408 0 1000 MP1482DS 1307 04-16-13 50 0 1000 MP1482DS 1309 04-23-13 50 0 1000 MP1482DS 1312 04-10-13 91 0 1000 MP1482DS 1313 05-08-13 100 0 1000 MP1482DS 1311 05-09-13 100 0 1000 MP1482DS 1312 04-09-13 100 0 100 MP1482DS 1312 04-03-13 100 0 100 MP1482DS 1310 04-09-13 100 0 100 MP1482DS 1310 04-07-13 100 0 100 MP1482DS 1312 04-09-13 100 0 100 MP1482DS 1312 04-09-13 100 0 100 MP1482DS 1312 04-09-13 100 0 100 MP1482DS 1310 04-09-13 100 0 100 FA NO. # of cycle The Future of Analog IC Technology® - 59 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DS 1312 04-09-13 100 0 100 MP1492DS 1232 04-11-13 100 0 100 FA NO. # of cycle MP1482DS 1313 04-16-13 99 0 100 MP1482DS 1310 04-16-13 100 0 100 MP1482DS 1312 04-16-13 100 0 100 MP1482DS 1312 04-16-13 100 0 100 MP1492DS 1310 04-16-13 100 0 100 MP1492DS 1233 04-15-13 100 0 100 MP1493DS-A 1313 04-16-13 100 0 100 MP1492DS-C469 1312 04-15-13 100 0 100 MP1482DS 1314 04-16-13 100 0 100 MP1482DS 1314 04-16-13 100 0 100 MP1493DS 1229 04-15-13 100 0 100 MP1482DS 1311 04-16-13 100 0 100 MP1482DS 1312 04-22-13 100 0 100 MP1482DS 1314 04-22-13 100 0 100 MP1492DS 1235 04-22-13 94 0 100 MP1493DS 1310 04-22-13 98 0 100 MP1493DS-A 1313 04-22-13 100 0 100 MP1482DS 1312 04-18-13 100 0 100 MP1482DS 1312 06-09-13 100 0 100 MP1493DS 1312 04-19-13 100 0 100 MP1492DS 1229 04-19-13 100 0 100 MP1482DS 1312 04-22-13 100 0 100 MP1493DS-C480 1312 04-23-13 100 0 100 MP1482SDS-C416 1312 06-09-13 100 0 100 MP1482DS 1315 04-22-13 100 0 100 MP1482DS 1314 05-06-13 100 0 100 MP1482DS 1314 04-26-13 100 0 100 MP1493DS 1312 04-24-13 100 0 100 MP1492DS 1232 04-24-13 100 0 100 MP1493DS-A 1314 04-24-13 100 0 100 MP1492DS 1231 05-03-13 100 0 100 MP1482DS 1314 05-06-13 100 0 100 MP1492DS 1233 05-03-13 100 0 100 MP1482DS 1314 04-26-13 100 0 100 MP1482DS 1314 04-25-13 100 0 100 MP1482DS 1314 04-26-13 100 0 100 MP1482DS 1315 04-26-13 100 0 100 MP1482DS 1315 04-26-13 100 0 100 MP1482DS 1315 05-03-13 100 0 100 MP1492DS-A 1311 05-03-13 100 0 100 The Future of Analog IC Technology® - 60 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DS 1315 04-28-13 100 0 100 MP1482DS 1314 04-28-13 100 0 100 MP28258DS 1311 05-03-13 100 0 100 MP1482DS 1316 05-02-13 100 0 100 MP1492DS-A 1218 05-02-13 100 0 100 MP1482DS 1314 05-10-13 100 0 100 MP1492DS 1252 05-03-13 100 0 100 MP1493DS-C493 1316 05-06-13 100 0 100 MP1482DS 1315 05-06-13 50 0 100 MP1482DS 1315 05-08-13 50 0 100 MP1482DS 1315 05-08-13 50 0 100 MP1493DS-C456 1312 05-07-13 100 0 100 MP1482DS 1316 05-10-13 50 0 100 MP1482DS 1316 05-07-13 50 0 100 MP1482DS 1316 05-07-13 50 0 100 MP1482DS 1316 05-09-13 50 0 100 MP1493DS 1312 05-14-13 50 0 100 MP1482DS 1314 05-15-13 50 0 100 MP1482DS 1315 05-13-13 50 0 100 MP1493DS 1312 05-14-13 50 0 100 MP1482DS 1317 05-15-13 50 0 100 MP1482DS 1317 05-15-13 50 0 100 MP1482SDS-C416 1318 05-15-13 50 0 100 MP1482DS 1317 06-25-13 50 0 100 FA NO. # of cycle MP1482SDS-C416 1318 05-15-13 50 0 100 MP1492DS-A-C528 1311 05-19-13 50 0 100 MP1482DS 1317 05-18-13 50 0 100 MP1482DS 1317 05-18-13 50 0 100 MP1482DS 1317 05-22-13 50 0 100 MP1482DS 1316 05-22-13 50 0 100 MP1482DS 1319 05-27-13 50 0 100 MP1482DS 1316 05-22-13 50 0 100 MP1482DS 1317 05-22-13 50 0 100 MP28258DS 1317 05-29-13 50 0 100 MP1482DS 1319 05-23-13 50 0 100 MP1482DS 1319 05-27-13 50 0 100 MP1482DS 1319 05-29-13 50 0 100 MP1482DS 1320 05-29-13 50 0 100 MP1482DS 1319 05-29-13 50 0 100 MP1482DS 1320 05-29-13 50 0 100 MP1482DS 1319 05-29-13 50 0 100 MP1482DS 1319 05-29-13 50 0 100 The Future of Analog IC Technology® - 61 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DS 1320 06-03-13 50 0 100 MP1482DS 1319 06-03-13 50 0 100 MP1482DS 1319 06-03-13 50 0 100 MP1492DS 1319 06-03-13 50 0 100 MP1482DS 1319 06-18-13 50 0 100 MP1482DS 1321 06-18-13 50 0 100 MP1482DS 1320 06-18-13 50 0 100 MP1482DS 1319 06-18-13 50 0 100 FA NO. # of cycle MP1492DS-A 1319 06-18-13 50 0 100 MP1482DS 1320 06-18-13 50 0 100 MP1482SDS-C416 1318 06-18-13 50 0 100 MP1482DS 1318 06-18-13 50 0 100 MP1482DS 1320 06-18-13 50 0 100 MP1482DS 1320 06-18-13 50 0 100 MP1482DS 1314 06-18-13 50 0 100 MP1482DS 1301 06-18-13 50 0 100 MP1482DS 1316 06-18-13 50 0 100 MP1482DS 1321 06-18-13 50 0 100 MP1492DS 1321 06-18-13 50 0 100 MP1482DS 1322 06-18-13 50 0 100 MP1482DS-C416 1318 06-18-13 50 0 100 MP1492DS 1319 06-18-13 50 0 100 MP28258DS 1319 06-18-13 50 0 100 MP1482DS 1321 06-24-13 50 0 100 MP1482DS 1321 06-24-13 50 0 100 MP1492DS-A 1322 06-24-13 50 0 100 MP1482DS 1322 06-25-13 50 0 100 MP1493DS-C480 1312 06-25-13 50 0 100 MP1482DS 1322 06-25-13 50 0 100 MP1482DS 1322 06-25-13 50 0 100 MP1492DS 1316 06-25-13 50 0 100 MP1482DS 1321 06-25-13 50 0 100 MP1482DS 1322 06-25-13 50 0 100 Total 0 4.7.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP1482DS 1228 06-03-13 500 0 168 MP1482DS 1305 04-03-13 50 0 168 MP1482DS 1305 04-11-13 50 0 168 FA NO. # of hrs The Future of Analog IC Technology® - 62 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DS 1252 05-07-13 453 0 168 MP1482DS 1307 04-16-13 50 0 168 MP1482DS 1309 04-23-13 50 0 168 MP1482DS 1312 04-10-13 94 0 168 MP1482DS 1313 05-08-13 100 0 168 MP1482DS 1311 05-09-13 100 0 168 MP1482DS 1311 06-18-13 500 0 168 MP1482DS 1312 04-09-13 100 0 48 MP1482DS 1312 04-03-13 100 0 48 MP1482DS 1310 04-09-13 100 0 48 MP1482DS 1310 04-07-13 100 0 48 MP1482DS 1312 04-09-13 100 0 48 MP1482DS 1312 04-09-13 100 0 48 MP1482DS 1312 04-09-13 100 0 48 MP1482DS 1310 04-09-13 100 0 48 MP1482DS 1312 04-09-13 100 0 48 MP1492DS 1232 04-11-13 100 0 48 MP1482DS 1313 04-16-13 99 0 48 MP1482DS 1310 04-16-13 100 0 48 MP1482DS 1312 04-16-13 100 0 48 MP1482DS 1312 04-16-13 100 0 48 MP1492DS 1310 04-16-13 100 0 48 MP1492DS 1233 04-15-13 100 0 48 MP1493DS-A 1313 04-16-13 100 0 48 MP1492DS-C469 1312 04-15-13 100 0 48 MP1482DS 1314 04-16-13 100 0 48 MP1482DS 1314 04-16-13 100 0 48 MP1493DS 1229 04-15-13 100 0 48 MP1482DS 1311 04-16-13 100 0 48 MP1482DS 1312 04-22-13 100 0 48 MP1482DS 1314 04-22-13 100 0 48 MP1492DS 1235 04-22-13 94 0 48 MP1493DS 1310 04-22-13 98 0 48 MP1493DS-A 1313 04-22-13 100 0 48 MP1482DS 1312 04-18-13 100 0 48 MP1482DS 1312 06-09-13 100 0 48 MP1493DS 1312 04-19-13 100 0 48 MP1492DS 1229 04-19-13 100 0 48 MP1482DS 1312 04-22-13 100 0 48 MP1493DS-C480 1312 04-23-13 100 0 48 MP1482SDS-C416 1312 06-09-13 100 0 48 MP1482DS 1315 04-22-13 100 0 48 FA NO. # of hrs The Future of Analog IC Technology® - 63 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DS 1314 05-06-13 100 0 48 MP1482DS 1314 04-26-13 100 0 48 MP1493DS 1312 04-24-13 100 0 48 MP1492DS 1232 04-24-13 100 0 48 FA NO. # of hrs MP1493DS-A 1314 04-24-13 100 0 48 MP1492DS 1231 05-03-13 100 0 48 MP1482DS 1314 05-06-13 100 0 48 MP1492DS 1233 05-03-13 100 0 48 MP1482DS 1314 04-26-13 100 0 48 MP1482DS 1314 04-25-13 100 0 48 MP1482DS 1314 04-26-13 100 0 48 MP1482DS 1315 04-26-13 100 0 48 MP1482DS 1315 04-26-13 100 0 48 MP1482DS 1315 05-03-13 100 0 48 MP1492DS-A 1311 05-03-13 100 0 48 MP1482DS 1315 04-28-13 100 0 48 MP1482DS 1314 04-28-13 100 0 48 MP28258DS 1311 05-03-13 100 0 48 MP1482DS 1316 05-02-13 100 0 48 MP1492DS-A 1218 05-02-13 100 0 48 MP1482DS 1314 05-10-13 100 0 48 MP1492DS 1252 05-03-13 100 0 48 MP1493DS-C493 1316 05-06-13 100 0 48 MP1482DS 1315 05-06-13 50 0 48 MP1482DS 1315 05-08-13 50 0 48 MP1482DS 1315 05-08-13 50 0 48 MP1493DS-C456 1312 05-07-13 100 0 48 MP1482DS 1316 05-10-13 50 0 48 MP1482DS 1316 05-07-13 50 0 48 MP1482DS 1316 05-07-13 50 0 48 MP1482DS 1316 05-09-13 50 0 48 MP1493DS 1312 05-14-13 50 0 48 MP1482DS 1314 05-15-13 50 0 48 MP1482DS 1315 05-13-13 50 0 48 MP1493DS 1312 05-14-13 50 0 48 MP1482DS 1317 05-15-13 50 0 48 MP1482DS 1317 05-15-13 50 0 48 MP1482SDS-C416 1318 05-15-13 50 0 48 MP1482DS 1317 06-25-13 50 0 48 MP1482SDS-C416 1318 05-15-13 50 0 48 MP1492DS-A-C528 1311 05-19-13 50 0 48 MP1482DS 1317 05-18-13 50 0 48 The Future of Analog IC Technology® - 64 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DS 1317 05-18-13 50 0 48 MP1482DS 1317 05-22-13 50 0 48 MP1482DS 1316 05-22-13 50 0 48 MP1482DS 1319 05-27-13 50 0 48 MP1482DS 1316 05-22-13 50 0 48 MP1482DS 1317 05-22-13 50 0 48 MP28258DS 1317 05-29-13 50 0 48 MP1482DS 1319 05-23-13 50 0 48 MP1482DS 1319 05-27-13 50 0 48 MP1482DS 1319 05-29-13 50 0 48 MP1482DS 1320 05-29-13 50 0 48 MP1482DS 1319 05-29-13 50 0 48 MP1482DS 1320 05-29-13 50 0 48 MP1482DS 1319 05-29-13 50 0 48 MP1482DS 1319 05-29-13 50 0 48 MP1482DS 1320 06-03-13 50 0 48 MP1482DS 1319 06-03-13 50 0 48 MP1482DS 1319 06-03-13 50 0 48 MP1492DS 1319 06-03-13 50 0 48 MP1482DS 1319 06-18-13 50 0 48 MP1482DS 1321 06-18-13 50 0 48 MP1482DS 1320 06-18-13 50 0 48 MP1482DS 1319 06-18-13 50 0 48 MP1492DS-A 1319 06-18-13 50 0 48 FA NO. # of hrs MP1482DS 1320 06-18-13 50 0 48 MP1482SDS-C416 1318 06-18-13 50 0 48 MP1482DS 1318 06-18-13 50 0 48 MP1482DS 1320 06-18-13 50 0 48 MP1482DS 1320 06-18-13 50 0 48 MP1482DS 1314 06-18-13 50 0 48 MP1482DS 1301 06-18-13 50 0 48 MP1482DS 1316 06-18-13 50 0 48 MP1482DS 1321 06-18-13 50 0 48 MP1492DS 1321 06-18-13 50 0 48 MP1482DS 1322 06-18-13 50 0 48 MP1482DS-C416 1318 06-18-13 50 0 48 MP1492DS 1319 06-18-13 50 0 48 MP28258DS 1319 06-18-13 50 0 48 MP1482DS 1321 06-24-13 50 0 48 MP1482DS 1321 06-24-13 50 0 48 MP1492DS-A 1322 06-24-13 50 0 48 MP1482DS 1322 06-25-13 50 0 48 The Future of Analog IC Technology® - 65 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1493DS-C480 1312 06-25-13 50 0 48 MP1482DS 1322 06-25-13 50 0 48 MP1482DS 1322 06-25-13 50 0 48 MP1492DS 1316 06-25-13 50 0 48 MP1482DS 1321 06-25-13 50 0 48 MP1482DS 1322 06-25-13 50 0 48 Total FA NO. # of hrs 0 4.8 FLIP CHIP-TSOT The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE ANST FCTSOT-5 JCET FCTSOT-6 ANST FCTSOT-6 JCET FCTSOT-8 ANST FCTSOT-8 4.8.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP1494DJ 1302 04-03-13 270 0 MP1494DJ 1245 04-22-13 350 0 MP1494DJ 1247 04-22-13 350 0 MP1494DJ 1249 04-22-13 350 0 MP1494DJ 1302 04-22-13 360 0 MP1494DJ 1306 04-26-13 600 0 MP1494DJ 1245 04-22-13 350 0 MP1494DJ 1247 04-22-13 350 0 MP1494DJ 1249 04-22-13 350 0 MP1494DJ 1302 04-22-13 360 0 MP1494DJ 1306 04-26-13 600 0 MP1470GJ 1316 06-20-13 600 0 MP2161GJ 1305 06-08-13 180 0 MP2234GJ 1305 06-05-13 102 0 MP1470GJ 1313 06-04-13 600 0 Total FA NO. 0 The Future of Analog IC Technology® - 66 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT SAT picture of FLIP CHIP-TSOT T-SCAN PICTURE C-SCAN PICTURE 4.8.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP1494DJ 1302 04-03-13 84 0 1000 MP1494DJ 1245 04-22-13 84 0 1000 MP1494DJ 1247 04-22-13 84 0 1000 MP1494DJ 1249 04-22-13 84 0 1000 MP1494DJ 1302 04-22-13 84 0 1000 MP1494DJ 1245 04-22-13 84 0 1000 MP1494DJ 1247 04-22-13 84 0 1000 MP1494DJ 1249 04-22-13 84 0 1000 MP1494DJ 1302 04-22-13 84 0 1000 MP1494DJ 1232 06-06-13 47 0 1000 MP1494DJ 1235 06-06-13 46 0 1000 MP2161GJ 1305 06-08-13 83 0 1000 MP1470GJ 1305 05-20-13 50 0 100 MP1470GJ 1301 04-22-13 50 0 100 MP2161GJ 1305 05-27-13 50 0 100 MP1470GJ 1305 04-16-13 50 0 100 MP1470GJ 1309 04-09-13 50 0 100 MP2161GJ 1305 06-25-13 50 0 100 MP1475DJ 1306 04-11-13 50 0 100 MP1470GJ 1307 04-16-13 50 0 100 MP1497DJ 1307 04-09-13 50 0 100 MP1497DJ 1309 04-03-13 50 0 100 FA NO. # of cycle The Future of Analog IC Technology® - 67 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1472GJ-C452 1309 04-03-13 50 0 100 MP1471GJ 1309 04-01-13 100 0 100 MP1472GJ-C452 1307 04-03-13 50 0 100 MP1494DJ 1311 04-03-13 100 0 100 MP1472GJ-C452 1309 04-09-13 50 0 100 MP1472GJ-C452 1309 04-09-13 50 0 100 MP1472GJ-C452 1309 04-09-13 50 0 100 MP1497DJ 1309 04-09-13 50 0 100 MP1496DJ 1310 04-09-13 50 0 100 MP9495DJ 1311 04-11-13 100 0 100 MP150GJ 1310 04-09-13 100 0 100 FA NO. # of cycle MP1497DJ 1311 04-09-13 100 0 100 MP1472GJ 1311 04-09-13 100 0 100 MP1471GJ 1311 04-09-13 100 0 100 MP1472GJ-C452 1311 06-28-13 100 0 100 MP1472GJ-C452 1309 06-28-13 100 0 100 MP1472GJ-C452 1311 06-28-13 100 0 100 MP1472GJ-C452 1309 06-28-13 100 0 100 MP1497DJ 1313 04-16-13 100 0 100 MP1494DJ 1311 04-16-13 50 0 100 MP1470GJ 1311 04-22-13 50 0 100 MP1472GJ-C452 1312 04-16-13 100 0 100 MP1497DJ 1313 04-16-13 100 0 100 MP1472GJ-C452 1312 06-25-13 100 0 100 MP1474DJ 1312 04-16-13 98 0 100 MP1471GJ 1313 04-16-13 100 0 100 MP2161GJ N/A 04-12-13 1000 0 100 MP2161GJ 1241 04-12-13 1000 0 100 MP1474DJ 1313 04-27-13 100 0 100 MP2144GJ 1307 04-12-13 100 0 100 MP1471GJ 1313 04-16-13 100 0 100 MP1494DJ 1309 04-15-13 100 0 100 MP1472GJ 1312 04-16-13 100 0 100 MP1497DJ 1311 04-15-13 100 0 100 MP1474DJ 1312 04-15-13 100 0 100 MP1472GJ 1311 04-16-13 100 0 100 MP1470GJ 1313 05-16-13 50 0 100 MP1472GJ-C452 1312 04-19-13 99 0 100 MP2161GJ-C499 1312 06-28-13 50 0 100 MP1472GJ-C452 1312 04-19-13 100 0 100 MP1472GJ-C452 1312 04-19-13 100 0 100 MP1497DJ 1314 04-20-13 100 0 100 The Future of Analog IC Technology® - 68 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1494DJ 1311 04-17-13 100 0 100 MP2161GJ-C499 1314 06-25-13 1000 0 100 MP2161GJ-C499 1312 06-24-13 900 0 100 MP1472GJ-C452 1251 06-25-13 100 0 100 MP1470GJ 1313 05-08-13 50 0 100 MP1497DJ 1311 04-26-13 100 0 100 MP1472GJ-C452 1309 06-25-13 100 0 100 MP1472GJ-C452 1312 04-20-13 100 0 100 MP1494DJ 1311 04-19-13 100 0 100 MP1470GJ 1313 05-08-13 50 0 100 MP1474DJ-C491 1312 04-28-13 100 0 100 MP1497DJ 1314 04-26-13 100 0 100 MP1475DJ 1306 04-27-13 100 0 100 MP1472GJ 1313 04-22-13 100 0 100 MP1496DJ 1313 04-22-13 100 0 100 FA NO. # of cycle MP1472GJ-C452 1309 04-22-13 100 0 100 MP1472GJ 1314 04-26-13 100 0 100 MP1472GJ-C452 1312 06-25-13 100 0 100 MP1472GJ-C452 1307 06-25-13 99 0 100 MP2143DJ 1304 04-24-13 100 0 100 MP2144GJ 1307 04-26-13 100 0 100 MP1471GJ-C519 1306 04-26-13 100 0 100 MP1472GJ-C452 1314 06-25-13 99 0 100 MP1496DJ 1214 04-25-13 100 0 100 MP2161GJ-C499 1315 06-28-13 1000 0 100 MP1496DJ 1314 04-25-13 100 0 100 MP1472GJ-C452 1314 04-25-13 100 0 100 MP1495DJ 1315 04-27-13 100 0 100 MP9495DJ 1311 05-02-13 100 0 100 MP1472GJ 1303 04-26-13 100 0 100 MP2144GJ 1314 04-27-13 95 0 100 MP2143DJ-C463 1307 05-03-13 100 0 100 MP1472GJ-C452 1314 05-13-13 100 0 100 MP1495DJ 1311 05-14-13 50 0 100 MP1472GJ-C452 1314 06-24-13 100 0 100 MP1496DJ 1314 04-27-13 100 0 100 MP1497DJ 1315 05-07-13 100 0 100 MP1472GJ-C452 1312 05-03-13 100 0 100 MP1494DJ 1311 05-02-13 50 0 100 MP1495DJ 1314 04-28-13 99 0 100 MP1471GJ 1313 04-28-13 1000 0 100 MP2144GJ 1314 05-17-13 100 0 100 The Future of Analog IC Technology® - 69 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1472GJ-C452 1314 05-02-13 100 0 100 MP1496DJ 1314 05-02-13 100 0 100 FA NO. # of cycle MP1472GJ-C452 1314 05-03-13 100 0 100 MP2144GJ 1314 05-07-13 100 0 100 MP9495DJ 1311 05-09-13 100 0 100 MP2144GJ 1314 06-18-13 100 0 100 MP2144GJ 1314 06-18-13 100 0 100 MP1472GJ 1314 05-03-13 100 0 100 MP1472GJ-C452 1312 05-02-13 93 0 100 MP1471GJ 1313 05-07-13 100 0 100 MP1472GJ-C452 1312 05-06-13 100 0 100 MP2144GJ 1314 06-18-13 100 0 100 MP1472GJ-C452 1312 06-24-13 50 0 100 MP1496DJ 1313 05-07-13 50 0 100 MP1495DJ 1315 05-06-13 50 0 100 MP1472GJ-C452 1314 05-08-13 50 0 100 MP2143DJ 1307 05-07-13 50 0 100 MP24892DJ 1316 05-14-13 50 0 100 MP1472GJ-C452 1312 05-08-13 50 0 100 MP1494DJ 1311 05-09-13 49 0 100 MP1497DJ 1314 05-16-13 50 0 100 MP1472GJ-C452 1312 05-13-13 50 0 100 MP1496DJ 1314 05-16-13 50 0 100 MP1472GJ-C452 1315 05-13-13 50 0 100 MP1495DJ 1316 05-06-13 50 0 100 MP1472GJ-C452 1315 05-08-13 98 0 100 MP3414DJ 1317 05-15-13 50 0 100 MP1496DJ 1314 05-15-13 50 0 100 MP1472GJ-C452 1314 05-08-13 50 0 100 MP1495DJ 1315 05-14-13 50 0 100 MP1472GJ-C452 1315 05-08-13 50 0 100 MP1497DJ 1316 05-14-13 50 0 100 MP1495DJ 1315 05-14-13 50 0 100 MP1497DJ 1316 05-16-13 50 0 100 MP1472GJ-C452 1314 05-13-13 50 0 100 MP1472GJ-C452 1314 05-09-13 50 0 100 MP2489DJ 1316 05-14-13 50 0 100 MP1472GJ-C452 1316 05-15-13 50 0 100 MP1494DJ 1315 05-14-13 50 0 100 MP1497DJ 1316 05-13-13 50 0 100 MP1472GJ-C452 1315 05-14-13 50 0 100 MP1472GJ 1315 05-10-13 50 0 100 The Future of Analog IC Technology® - 70 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1472GJ-C452 1316 05-13-13 50 0 100 MP2144GJ 1314 05-18-13 50 0 100 MP1471GJ-C519 1313 05-14-13 50 0 100 MP1494DJ 1315 05-13-13 50 0 100 MP1495DJ 1315 05-13-13 50 0 100 MP2143DJ 1245 05-21-13 50 0 100 MP1497DJ 1313 05-13-13 50 0 100 MP1472GJ-C452 1316 05-13-13 50 0 100 MP1495DJ 1316 05-13-13 50 0 100 MP1497DJ 1314 05-13-13 50 0 100 MP1472GJ-C452 1316 05-14-13 50 0 100 MP1472GJ 1311 05-14-13 50 0 100 MP1497DJ 1316 05-16-13 50 0 100 MP1497DJ 1314 05-16-13 50 0 100 MP1472GJ-C452 1316 05-19-13 50 0 100 FA NO. # of cycle MP1497DJ 1316 05-16-13 50 0 100 MP1472GJ-C452 1314 06-25-13 50 0 100 MP9495DJ 1311 05-15-13 50 0 100 MP1472GJ-C452 1312 06-25-13 50 0 100 MP1472GJ-C452 1316 05-19-13 50 0 100 MP1472GJ-C452 1309 05-19-13 50 0 100 MP2143DJ-C463 1307 05-17-13 50 0 100 MP1472GJ-C452 1316 05-19-13 50 0 100 MP1495DJ 1315 05-18-13 50 0 100 MP1497DJ 1316 05-18-13 50 0 100 MP1495DJ 1314 06-24-13 50 0 100 MP1472GJ 1249 05-20-13 50 0 100 MP1497DJ 1318 05-22-13 50 0 100 MP1494DJ 1313 05-22-13 50 0 100 MP1497DJ 1317 05-22-13 50 0 100 MP1496DJ 1318 05-22-13 50 0 100 MP1495DJ 1315 05-22-13 50 0 100 MP1472GJ-C452 1316 05-22-13 50 0 100 MP1494DJ 1315 05-25-13 50 0 100 MP2159GJ 1317 05-22-13 50 0 100 MP1471GJ 1318 05-30-13 50 0 100 MP1495DJ 1316 05-25-13 50 0 100 MP1497DJ 1317 05-25-13 50 0 100 MP1495DJ 1315 05-25-13 50 0 100 MP1496DJ 1318 05-25-13 50 0 100 MP1472GJ 1307 05-26-13 50 0 100 MP2143DJ 1307 05-28-13 50 0 100 The Future of Analog IC Technology® - 71 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1497DJ 1317 05-28-13 50 0 100 MP1497DJ 1317 05-28-13 50 0 100 MP24894GJ 1317 05-29-13 50 0 100 MP1472GJ 1311 05-29-13 50 0 100 MP1495DJ 1311 05-28-13 50 0 100 MP1495DJ 1316 06-18-13 50 0 100 MP1497DJ 1318 05-29-13 50 0 100 MP1497DJ 1317 05-29-13 50 0 100 MP2233DJ 1307 05-29-13 50 0 100 MP2314GJ 1316 05-30-13 50 0 100 MP2234GJ 1319 05-30-13 50 0 100 MP1496DJ 1319 05-30-13 50 0 100 MP1497DJ 1318 05-30-13 50 0 100 MP1495DJ 1315 05-30-13 50 0 100 MP3414DJ 1320 05-31-13 50 0 100 MP1495DJ 1316 05-31-13 50 0 100 MP1497DJ 1314 06-03-13 50 0 100 MP2159GJ 1321 06-03-13 50 0 100 MP1496DJ 1319 06-03-13 50 0 100 MP3414DJ 1320 06-03-13 50 0 100 MP2144GJ 1314 06-03-13 50 0 100 MP1471GJ 1318 06-18-13 50 0 100 MP9495DJ 1320 06-18-13 50 0 100 MP1472GJ 1320 06-18-13 50 0 100 MP1496DJ 1314 06-18-13 50 0 100 MP2143DJ 1307 06-18-13 50 0 100 MP3414DJ 1320 06-18-13 50 0 100 MP2144GJ 1307 06-18-13 50 0 100 FA NO. # of cycle MP150GJ 1310 06-18-13 50 0 100 MP1497DJ 1321 06-18-13 50 0 100 MP3414DJ 1320 06-18-13 50 0 100 MP1495DJ-C494 1310 06-18-13 50 0 100 MP1495DJ-C494 1306 06-18-13 50 0 100 MP2143DJ 1302 06-18-13 50 0 100 MP1472GJ-C452 1322 06-18-13 50 0 100 MP1496DJ 1318 06-24-13 50 0 100 MP1497DJ 1320 06-24-13 50 0 100 MP1495DJ 1316 06-24-13 50 0 100 MP3414DJ 1322 06-24-13 50 0 100 MP1472GJ 1320 06-24-13 50 0 100 MP2315GJ 1322 06-28-13 50 0 100 MP1494DJ 1321 06-18-13 50 0 100 The Future of Analog IC Technology® - 72 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT # of cycle Device D/C Close Date Sample Size # of Fail MP1495DJ 1321 06-18-13 50 0 100 MP1496DJ 1319 06-18-13 50 0 100 MP1472GJ-C452 1322 06-18-13 50 0 100 MP1497DJ 1320 06-18-13 50 0 100 MP2144GJ 1314 06-18-13 50 0 100 MP1497DJ 1322 06-24-13 50 0 100 MP1494DJ 1311 06-24-13 50 0 100 MP1497DJ 1321 06-24-13 50 0 100 FA NO. MP1494DJ 1315 06-24-13 50 0 100 MP2122GJ 1321 06-28-13 50 0 100 MP3414DJ 1322 06-24-13 50 0 100 MP2235GJ 1323 06-25-13 50 0 100 MP1494DJ 1318 06-24-13 50 0 100 MP24892DJ 1323 06-25-13 50 0 100 MP3414DJ 1322 06-24-13 50 0 100 MP1472GJ 1322 06-25-13 50 0 100 MP2159GJ 1322 06-24-13 50 0 100 MP9495DJ 1320 06-24-13 50 0 100 MP1496DJ 1323 06-24-13 50 0 100 MP9495DJ 1319 06-24-13 50 0 100 MP1494DJ 1321 06-25-13 50 0 100 MP2143DJ-C463 1307 06-25-13 50 0 100 MP2489DJ 1323 06-25-13 50 0 100 MP1495DJ 1320 06-25-13 50 0 100 MP1497DJ 1322 06-25-13 50 0 100 MP1472GJ-C452 1323 06-25-13 50 0 100 MP1494DJ 1321 06-28-13 50 0 100 MP1495DJ-C494 1323 06-28-13 50 0 100 MP2144GJ 1314 06-28-13 50 0 100 MP1471GJ-C519 1313 06-25-13 50 0 100 MP1471GJ-C519 1323 06-25-13 50 0 100 MP2159GJ 1324 06-28-13 50 0 100 MP2143DJ 1322 06-28-13 50 0 100 Total 0 4.8.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP1494DJ 1302 04-03-13 87 0 168 MP1494DJ 1245 04-22-13 87 0 168 MP1494DJ 1247 04-22-13 87 0 168 FA NO. # of hrs The Future of Analog IC Technology® - 73 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1494DJ 1249 04-22-13 87 0 168 MP1494DJ 1302 04-22-13 87 0 168 MP1494DJ 1245 04-22-13 87 0 168 MP1494DJ 1247 04-22-13 87 0 168 MP1494DJ 1249 04-22-13 87 0 168 MP1494DJ 1302 04-22-13 87 0 168 MP1494DJ 1232 06-06-13 50 0 168 FA NO. # of hrs MP1494DJ 1235 06-06-13 47 0 168 MP2161GJ 1305 06-08-13 87 0 168 MP1470GJ 1305 05-20-13 50 0 48 MP1470GJ 1301 04-22-13 50 0 48 MP2161GJ 1305 05-27-13 50 0 48 MP1470GJ 1305 04-16-13 50 0 48 MP1470GJ 1309 04-09-13 50 0 48 MP2161GJ 1305 06-25-13 50 0 48 MP1475DJ 1306 04-11-13 50 0 48 MP1470GJ 1307 04-16-13 50 0 48 MP1497DJ 1307 04-09-13 50 0 48 MP1497DJ 1309 04-03-13 50 0 48 MP1472GJ-C452 1309 04-03-13 50 0 48 MP1471GJ 1309 04-01-13 100 0 48 MP1472GJ-C452 1307 04-03-13 50 0 48 MP1494DJ 1311 04-03-13 100 0 48 MP1472GJ-C452 1309 04-09-13 50 0 48 MP1472GJ-C452 1309 04-09-13 50 0 48 MP1472GJ-C452 1309 04-09-13 50 0 48 MP1497DJ 1309 04-09-13 50 0 48 MP1496DJ 1310 04-09-13 50 0 48 MP9495DJ 1311 04-11-13 100 0 48 MP150GJ 1310 04-09-13 100 0 48 MP1497DJ 1311 04-09-13 100 0 48 MP1472GJ 1311 04-09-13 100 0 48 MP1471GJ 1311 04-09-13 100 0 48 MP1472GJ-C452 1311 06-28-13 100 0 48 MP1472GJ-C452 1309 06-28-13 66 0 48 MP1472GJ-C452 1311 06-28-13 100 0 48 MP1472GJ-C452 1309 06-28-13 100 0 48 MP1497DJ 1313 04-16-13 100 0 48 MP1494DJ 1311 04-16-13 50 0 48 MP1470GJ 1311 04-22-13 50 0 48 MP1472GJ-C452 1312 04-16-13 100 0 48 MP1497DJ 1313 04-16-13 100 0 48 The Future of Analog IC Technology® - 74 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1472GJ-C452 1312 06-25-13 100 0 48 MP1474DJ 1312 04-16-13 100 0 48 MP1471GJ 1313 04-16-13 100 0 48 MP2161GJ N/A 04-12-13 1000 0 48 MP2161GJ 1241 04-12-13 1000 0 48 MP1474DJ 1313 04-27-13 100 0 48 MP2144GJ 1307 04-12-13 100 0 48 FA NO. # of hrs MP1471GJ 1313 04-16-13 100 0 48 MP1494DJ 1309 04-15-13 100 0 48 MP1472GJ 1312 04-16-13 100 0 48 MP1497DJ 1311 04-15-13 100 0 48 MP1474DJ 1312 04-15-13 100 0 48 MP1472GJ 1311 04-16-13 100 0 48 MP1470GJ 1313 05-16-13 50 0 48 MP1472GJ-C452 1312 04-19-13 100 0 48 MP2161GJ-C499 1312 06-28-13 42 0 48 MP1472GJ-C452 1312 04-19-13 100 0 48 MP1472GJ-C452 1312 04-19-13 100 0 48 MP1497DJ 1314 04-20-13 100 0 48 MP1494DJ 1311 04-17-13 100 0 48 MP2161GJ-C499 1314 06-25-13 1000 0 48 MP2161GJ-C499 1312 06-24-13 1000 0 48 MP1472GJ-C452 1251 06-25-13 100 0 48 MP1470GJ 1313 05-08-13 50 0 48 MP1497DJ 1311 04-26-13 100 0 48 MP1472GJ-C452 1309 06-25-13 99 0 48 MP1472GJ-C452 1312 04-20-13 100 0 48 MP1494DJ 1311 04-19-13 100 0 48 MP1470GJ 1313 05-08-13 50 0 48 MP1474DJ-C491 1312 04-28-13 100 0 48 MP1497DJ 1314 04-26-13 100 0 48 MP1475DJ 1306 04-27-13 100 0 48 MP1472GJ 1313 04-22-13 100 0 48 MP1496DJ 1313 04-22-13 100 0 48 MP1472GJ-C452 1309 04-22-13 100 0 48 MP1472GJ 1314 04-26-13 100 0 48 MP1472GJ-C452 1312 06-25-13 100 0 48 MP1472GJ-C452 1307 06-25-13 100 0 48 MP2143DJ 1304 04-24-13 99 0 48 MP2144GJ 1307 04-26-13 100 0 48 MP1471GJ-C519 1306 04-26-13 100 0 48 MP1472GJ-C452 1314 06-25-13 100 0 48 The Future of Analog IC Technology® - 75 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1496DJ 1214 04-25-13 100 0 48 MP2161GJ-C499 1315 06-28-13 1000 0 48 FA NO. # of hrs MP1496DJ 1314 04-25-13 100 0 48 MP1472GJ-C452 1314 04-25-13 100 0 48 MP1495DJ 1315 04-27-13 100 0 48 MP9495DJ 1311 05-02-13 100 0 48 MP1472GJ 1303 04-26-13 100 0 48 MP2144GJ 1314 04-27-13 100 0 48 MP2143DJ-C463 1307 05-03-13 100 0 48 MP1472GJ-C452 1314 05-13-13 100 0 48 MP1495DJ 1311 05-14-13 50 0 48 MP1472GJ-C452 1314 06-24-13 100 0 48 MP1496DJ 1314 04-27-13 100 0 48 MP1497DJ 1315 05-07-13 100 0 48 MP1472GJ-C452 1312 05-03-13 100 0 48 MP1494DJ 1311 05-02-13 50 0 48 MP1495DJ 1314 04-28-13 100 0 48 MP1471GJ 1313 04-28-13 1000 0 48 MP2144GJ 1314 05-17-13 100 0 48 MP1472GJ-C452 1314 05-02-13 100 0 48 MP1496DJ 1314 05-02-13 100 0 48 MP1472GJ-C452 1314 05-03-13 98 0 48 MP2144GJ 1314 05-07-13 97 0 48 MP9495DJ 1311 05-09-13 100 0 48 MP2144GJ 1314 06-18-13 100 0 48 MP2144GJ 1314 06-18-13 100 0 48 MP1472GJ 1314 05-03-13 100 0 48 MP1472GJ-C452 1312 05-02-13 100 0 48 MP1471GJ 1313 05-07-13 100 0 48 MP1472GJ-C452 1312 05-06-13 100 0 48 MP2144GJ 1314 06-18-13 100 0 48 MP1472GJ-C452 1312 06-24-13 50 0 48 MP1496DJ 1313 05-07-13 50 0 48 MP1495DJ 1315 05-06-13 50 0 48 MP1472GJ-C452 1314 05-08-13 50 0 48 MP2143DJ 1307 05-07-13 50 0 48 MP24892DJ 1316 05-14-13 50 0 48 MP1472GJ-C452 1312 05-08-13 50 0 48 MP1494DJ 1311 05-09-13 50 0 48 MP1497DJ 1314 05-16-13 50 0 48 MP1472GJ-C452 1312 05-13-13 50 0 48 MP1496DJ 1314 05-16-13 50 0 48 The Future of Analog IC Technology® - 76 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1472GJ-C452 1315 05-13-13 50 0 48 MP1495DJ 1316 05-06-13 50 0 48 MP1472GJ-C452 1315 05-08-13 89 0 48 MP3414DJ 1317 05-15-13 50 0 48 MP1496DJ 1314 05-15-13 50 0 48 MP1472GJ-C452 1314 05-08-13 50 0 48 FA NO. # of hrs MP1495DJ 1315 05-14-13 50 0 48 MP1472GJ-C452 1315 05-08-13 50 0 48 MP1497DJ 1316 05-14-13 50 0 48 MP1495DJ 1315 05-14-13 50 0 48 MP1497DJ 1316 05-16-13 50 0 48 MP1472GJ-C452 1314 05-13-13 50 0 48 MP1472GJ-C452 1314 05-09-13 50 0 48 MP2489DJ 1316 05-14-13 50 0 48 MP1472GJ-C452 1316 05-15-13 50 0 48 MP1494DJ 1315 05-14-13 50 0 48 MP1497DJ 1316 05-13-13 50 0 48 MP1472GJ-C452 1315 05-14-13 50 0 48 MP1472GJ 1315 05-10-13 50 0 48 MP1472GJ-C452 1316 05-13-13 50 0 48 MP2144GJ 1314 05-18-13 50 0 48 MP1471GJ-C519 1313 05-14-13 50 0 48 MP1494DJ 1315 05-13-13 50 0 48 MP1495DJ 1315 05-13-13 50 0 48 MP2143DJ 1245 05-21-13 50 0 48 MP1497DJ 1313 05-13-13 50 0 48 MP1472GJ-C452 1316 05-13-13 50 0 48 MP1495DJ 1316 05-13-13 50 0 48 MP1497DJ 1314 05-13-13 50 0 48 MP1472GJ-C452 1316 05-14-13 50 0 48 MP1472GJ 1311 05-14-13 50 0 48 MP1497DJ 1316 05-16-13 50 0 48 MP1497DJ 1314 05-16-13 50 0 48 MP1472GJ-C452 1316 05-19-13 50 0 48 MP1497DJ 1316 05-16-13 50 0 48 MP1472GJ-C452 1314 06-25-13 50 0 48 MP9495DJ 1311 05-15-13 50 0 48 MP1472GJ-C452 1312 06-25-13 50 0 48 MP1472GJ-C452 1316 05-19-13 50 0 48 MP1472GJ-C452 1309 05-19-13 50 0 48 MP2143DJ-C463 1307 05-17-13 50 0 48 MP1472GJ-C452 1316 05-19-13 50 0 48 The Future of Analog IC Technology® - 77 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1495DJ 1315 05-18-13 50 0 48 MP1497DJ 1316 05-18-13 50 0 48 FA NO. # of hrs MP1495DJ 1314 06-24-13 50 0 48 MP1472GJ 1249 05-20-13 50 0 48 MP1497DJ 1318 05-22-13 50 0 48 MP1494DJ 1313 05-22-13 50 0 48 MP1497DJ 1317 05-22-13 50 0 48 MP1496DJ 1318 05-22-13 50 0 48 MP1495DJ 1315 05-22-13 50 0 48 MP1472GJ-C452 1316 05-22-13 50 0 48 MP1494DJ 1315 05-25-13 50 0 48 MP2159GJ 1317 05-22-13 50 0 48 MP1471GJ 1318 05-30-13 50 0 48 MP1495DJ 1316 05-25-13 50 0 48 MP1497DJ 1317 05-25-13 50 0 48 MP1495DJ 1315 05-25-13 50 0 48 MP1496DJ 1318 05-25-13 50 0 48 MP1472GJ 1307 05-26-13 50 0 48 MP2143DJ 1307 05-28-13 50 0 48 MP1497DJ 1317 05-28-13 50 0 48 MP1497DJ 1317 05-28-13 50 0 48 MP24894GJ 1317 05-29-13 50 0 48 MP1472GJ 1311 05-29-13 50 0 48 MP1495DJ 1311 05-28-13 50 0 48 MP1495DJ 1316 06-18-13 50 0 48 MP1497DJ 1318 05-29-13 50 0 48 MP1497DJ 1317 05-29-13 50 0 48 MP2233DJ 1307 05-29-13 50 0 48 MP2314GJ 1316 05-30-13 50 0 48 MP2234GJ 1319 05-30-13 50 0 48 MP1496DJ 1319 05-30-13 50 0 48 MP1497DJ 1318 05-30-13 50 0 48 MP1495DJ 1315 05-30-13 50 0 48 MP3414DJ 1320 05-31-13 50 0 48 MP1495DJ 1316 05-31-13 50 0 48 MP1497DJ 1314 06-03-13 50 0 48 MP2159GJ 1321 06-03-13 50 0 48 MP1496DJ 1319 06-03-13 50 0 48 MP3414DJ 1320 06-03-13 50 0 48 MP2144GJ 1314 06-03-13 50 0 48 MP1471GJ 1318 06-18-13 50 0 48 MP9495DJ 1320 06-18-13 50 0 48 The Future of Analog IC Technology® - 78 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1472GJ 1320 06-18-13 50 0 48 MP1496DJ 1314 06-18-13 50 0 48 MP2143DJ 1307 06-18-13 50 0 48 MP3414DJ 1320 06-18-13 50 0 48 MP2144GJ 1307 06-18-13 50 0 48 MP150GJ 1310 06-18-13 50 0 48 MP1497DJ 1321 06-18-13 50 0 48 FA NO. # of hrs MP3414DJ 1320 06-18-13 50 0 48 MP1495DJ-C494 1310 06-18-13 50 0 48 MP1495DJ-C494 1306 06-18-13 50 0 48 MP2143DJ 1302 06-18-13 50 0 48 MP1472GJ-C452 1322 06-18-13 50 0 48 MP1496DJ 1318 06-24-13 50 0 48 MP1497DJ 1320 06-24-13 50 0 48 MP1495DJ 1316 06-24-13 50 0 48 MP3414DJ 1322 06-24-13 50 0 48 MP1472GJ 1320 06-24-13 50 0 48 MP2315GJ 1322 06-28-13 50 0 48 MP1494DJ 1321 06-18-13 50 0 48 MP1495DJ 1321 06-18-13 50 0 48 MP1496DJ 1319 06-18-13 50 0 48 MP1472GJ-C452 1322 06-18-13 50 0 48 MP1497DJ 1320 06-18-13 50 0 48 MP2144GJ 1314 06-18-13 50 0 48 MP1497DJ 1322 06-24-13 50 0 48 MP1494DJ 1311 06-24-13 50 0 48 MP1497DJ 1321 06-24-13 50 0 48 MP1494DJ 1315 06-24-13 50 0 48 MP2122GJ 1321 06-28-13 50 0 48 MP3414DJ 1322 06-24-13 50 0 48 MP2235GJ 1323 06-25-13 50 0 48 MP1494DJ 1318 06-24-13 50 0 48 MP24892DJ 1323 06-25-13 50 0 48 MP3414DJ 1322 06-24-13 50 0 48 MP1472GJ 1322 06-25-13 50 0 48 MP2159GJ 1322 06-24-13 50 0 48 MP9495DJ 1320 06-24-13 50 0 48 MP1496DJ 1323 06-24-13 50 0 48 MP9495DJ 1319 06-24-13 50 0 48 MP1494DJ 1321 06-25-13 50 0 48 MP2143DJ-C463 1307 06-25-13 50 0 48 MP2489DJ 1323 06-25-13 50 0 48 The Future of Analog IC Technology® - 79 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1495DJ 1320 06-25-13 50 0 48 FA NO. # of hrs MP1497DJ 1322 06-25-13 50 0 48 MP1472GJ-C452 1323 06-25-13 50 0 48 MP1494DJ 1321 06-28-13 50 0 48 MP1495DJ-C494 1323 06-28-13 50 0 48 MP2144GJ 1314 06-28-13 50 0 48 MP1471GJ-C519 1313 06-25-13 50 0 48 MP1471GJ-C519 1323 06-25-13 50 0 48 MP2159GJ 1324 06-28-13 50 0 48 MP2143DJ 1322 06-28-13 50 0 48 Total 0 4.8.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C Close Date Sample Size # of Fail MP1494DJ 1245 04-22-13 80 0 MP1494DJ 1247 04-22-13 80 0 MP1494DJ 1249 04-22-13 80 0 MP1494DJ 1302 04-22-13 90 0 MP1494DJ 1245 04-22-13 80 0 MP1494DJ 1247 04-22-13 80 0 MP1494DJ 1249 04-22-13 80 0 MP1494DJ 1302 04-22-13 90 0 MP2234GJ 1305 06-05-13 102 0 MP1470GJ 1305 05-20-13 50 0 MP1470GJ 1301 04-22-13 50 0 MP1470GJ 1305 04-16-13 50 0 MP1470GJ 1309 04-09-13 50 0 MP2161GJ 1305 06-25-13 50 0 MP1470GJ 1311 04-22-13 50 0 MP1470GJ 1313 05-16-13 50 0 MP2161GJ-C499 1312 06-28-13 50 0 MP2161GJ-C499 1314 06-25-13 50 0 MP2161GJ-C499 1312 06-24-13 50 0 MP1470GJ 1313 05-08-13 50 0 MP1470GJ 1313 05-08-13 49 0 MP2161GJ-C499 1315 06-28-13 50 0 Total FA NO. 0 The Future of Analog IC Technology® - 80 - MONOLITHIC POWER SYSTEMS Q2 2013 PRODUCT RELIABILITY REPORT Monolithic Power Systems (Chengdu) Co., Ltd. No.8 Kexin Rd. West Park of Export Processing Zone, West Hi-Tech Zone, Chengdu, Sichuan 611731 Tel: 86-28-87303000 Fax: 86-28-87303060 www.monolithicpower.com The Future of Analog IC Technology® - 81 -