QUARTERLY RELIABILITY MONITOR REPORT Q3, Jul. ~ Sept. 2013 Prepared by MPSCD Reliability Engineering The Future of Analog IC Technology® MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT INDEX 1.0 INTRODUCTION ......................................................................................2 1.1 SHORT TERM RELIBILITY MONITORING ........................................................................................................................ 2 1.2 LONG TERM RELIBILITY MONITORING ........................................................................................................................... 2 2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS.........................3 3.0 PROCESS RELIABILITY MONITORING DATA ......................................4 3.1 BCM12B Process Technology ................................................................................................................................................ 4 3.2 BCM12S Process Technology ................................................................................................................................................ 6 3.3 BCM35 Process Technology ................................................................................................................................................ 10 3.4 BCM05 Process Technology ................................................................................................................................................ 11 3.5 BCM18 Process Technology ................................................................................................................................................ 12 4.0 PACKAGE RELIABILITY MONITORING DATA ....................................13 4.1 QFN .................................................................................................................................................................................................. 13 4.2 SOIC ................................................................................................................................................................................................ 26 4.3 MSOP .............................................................................................................................................................................................. 36 4.4 TSOT ............................................................................................................................................................................................... 38 4.5 TSSOP ............................................................................................................................................................................................ 42 4.6 FLIP CHIP-QFN ......................................................................................................................................................................... 44 4.7 FLIP CHIP-SOIC........................................................................................................................................................................ 72 4.8 FLIP CHIP-TSOT ...................................................................................................................................................................... 79 The Future of Analog IC Technology® -1- MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT 1.0 INTRODUCTION This report summarizes the reliability testing results for MPS products as of Q3 2013. 1.1 SHORT TERM RELIBILITY MONITORING The short term monitoring runs on a daily basis. It provides a fast alert in case of changes in term of product reliability performance. Stress Test Name Test Condition Duration JEDEC EARLY LIFE 125°C, Vccmax 48 ~168 hrs JESD22-A108 Convection Reflow 260°C 3 times JESD22-A113 Temperature Cycle Cond C:-65℃ ~ 150℃ 100~200Cycles JESD22-A104 Autoclave 121°C /100%RH 48~96 hrs JESD22-A102 1.2 LONG TERM RELIBILITY MONITORING The long term monitoring runs on a quarterly basis. It provides the life stresses for periods long enough to provide the data necessary to calculate the steady state failure rates of products. Stress Test Name Test Condition Duration JEDEC HTOL 125°C, Vccmax 1000 hrs JESD22-A108 HTSL 150°C 1000 hrs JESD22-A103 Precondition / / JESD22-A113 Autoclave 121°C /100%RH 168 hrs JESD22-A102 Temperature Cycle Cond C:-65°C ~ 150°C 1000 Cycles JESD22-A104 85°C, 85% R.H., VDD 1000 hrs JESD22-A101 130°C, 85% R.H., VDD 96 hrs JESD22-A110 Temperature Humidity Bias (THB) High Accelerated Stress Test (HAST) The Future of Analog IC Technology® -2- MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT 2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS The long-term failure rate for a technology is gauged by a Failures In Time (FIT) calculation based upon accelerated stress data. The units for FIT are failures per Billion device hours. ( χ / 2) *10 2 FITRate = 9 stress * device hours The stress that enables FIT is High Temperature Operating Life (HTOL), which is a product level test. HTOL is accelerated by temperature and by voltage. The total number of failures in stress determines the chi-squared factor (a dimensionless number representing a 60% confidence level of statistics). The number of product units times the stress period (in Hours) is the device-Hours number. The Arrhenius equation uses the Activation energy for the fail mode as well as the stress temperature and the reporting temperature (e.g. 55℃) to compute the HTOL temperature acceleration factor, AF(T). The accelerated stress device-Hours is AF(T) times the device-Hours number. AFv= Exp(β(Vtest- Vuse), Vtest = Stress Voltage (V).Vuse = Nominal Voltage (V).β = Voltage Acceleration Constant (usually, 0.5 < Z < 1.0). The Future of Analog IC Technology® -3- MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT 3.0 PROCESS RELIABILITY MONITORING DATA 3.1 BCM12B Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: HHNEC, ASMC,SMIC EARLY LIFE (HTOL Short Term Monitor) Stress Duration: 48 ~168 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP2119DQ C587164.7H 1309 07-12-13 79 168 0 MP2119DQ C587164.7M 1309 07-12-13 79 168 0 MP2119DQ C587164.7L 1309 07-12-13 79 168 0 MP2104DJ D289876.9BT 1317 07-01-13 90 168 0 MP5414AGV B672494.9 1205 07-17-13 80 168 0 MP2119DQ C586776.7 1227 09-05-13 50 168 0 MP2119DQ C586790.7 1233 09-05-13 50 168 0 MP28223DD FA342758 1321 09-11-13 100 168 0 MP2359DJ B9955700 1325 10-09-13 80 168 0 MP4030GS CB89055.9 1313 07-01-13 80 48 0 MP1591DN C988671.7 1313 09-02-13 80 48 0 NB600CQ C572828.7 1314 07-10-13 80 48 0 MP1484EN-C166 C687569.7 1302 07-01-13 80 48 0 MP8903DJ-3.3 B482162.7C 1314 07-16-13 80 48 0 MP1530DQ CA82809.8A 1319 08-16-13 80 48 0 MP1530DQ CA82809.8B 1317 08-20-13 80 48 0 MP1015EF 8379756.9B 1319 07-04-13 80 48 0 MP1530DQ D480436.9B 1323 08-28-13 80 48 0 MP1530DQ D580695.8A 1324 08-23-13 80 48 0 MP1482DN D480346.7 1324 07-02-13 78 48 0 MP1482DN D480345.7 1324 07-02-13 80 48 0 MP1482DN D480273.9 1324 07-02-13 80 48 0 MP1482DN D480321.9 1324 07-02-13 78 48 0 MP2105DK CA88937.9A 1322 07-23-13 80 48 0 MP1484EN-C166 D480594.7 1324 07-23-13 80 48 0 MP1530DQ D580780.8A 1326 08-14-13 80 48 0 MP8001DS C486699.7 1317 08-07-13 80 48 0 MP2105DK C285714.7 1227 08-07-13 80 48 0 MP8001DS D189462.7 1329 09-09-13 80 48 0 MP1411DH C586900.7 1334 09-09-13 80 48 0 MPQ4456GQT C772927.8C 1303 07-26-13 77 48 0 The Future of Analog IC Technology® -4- FA No. MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of hrs # of Fail MPQ4456GQT CC72325.9A 1309 07-18-13 77 48 0 MP8903DJ-3.3 B482163.7G 1305 07-10-13 80 48 0 MP8903DJ-3.3 B482331.7 1218 09-02-13 80 48 0 MP4459DQT C972086.7 1303 07-04-13 78 48 0 MP8903DJ-3.3 B482472.7A 1319 09-23-13 80 48 0 MP4459DQT CB72168.9 1309 07-03-13 78 48 0 MP4459DQT D472664.7 1324 07-10-13 77 48 0 MP4459DQT D472667.9 1324 07-18-13 77 48 0 MP7731DF CB72236.9D 1321 07-10-13 80 48 0 MPQ8903DJ-3.3 B482472.7D 1323 09-10-13 80 48 0 MP4458DQT D472780.7A 1328 07-30-13 77 48 0 MP4460DQ D472802.7 1328 08-07-13 77 48 0 MP4459DQT D472780.7B 1328 08-14-13 77 48 0 MPQ4560DQ D472724.7A 1327 08-16-13 76 48 0 MPQ8903DJ-3.3 B682932.7A 1329 09-18-13 80 48 0 MP7731DF D472809.9A 1330 08-20-13 80 48 0 MP8903DJ-3.3 B382039.9C 1328 08-28-13 79 48 0 MPQ4560DQ D672095.7B 1331 08-28-13 76 48 0 MPQ4560DQ D472808.7B 1328 09-05-13 75 48 0 MPQ4462DQ-AEC1 D672137.9 1334 09-10-13 77 48 0 Total FA No. 0 LONG TERM LIFE (HTOL Long Term Monitor) Stress Duration: 1000 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of Fail MPQ4566GD-AEC1 EP289800 1309 10-09-13 80 0 MPQ4566GD-AEC1 EP289803 1309 10-09-13 80 0 MP1584EN D189503.9Q 1314 09-11-13 80 0 MPQ1530DQ-AEC1 FA342746 1319 10-09-13 80 0 MPQ1530DQ-AEC1 FA342746B 1330 10-09-13 80 0 Total 0 BCM12B #fail #device hours Accel Factor FIT Rate 0 400000 348 6.9 The Future of Analog IC Technology® -5- FA No. MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT HIGH TEMPERATURE STORAGE LIFE (HTSL) Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MP2119DQ C587164.7H 1309 07-12-13 50 0 MP2119DQ C587164.7M 1309 07-12-13 50 0 MP2119DQ C587164.7L 1309 07-12-13 50 0 MP2209DL C988551.1AH 1309 07-12-13 50 0 MP2209DL C988551.1AM 1309 07-12-13 50 0 MP2209DL C988551.1AL 1309 07-12-13 50 0 MP2109DQ D289752.1AQ 1317 07-03-13 50 0 MP5414AGV B672494.9R0 1205 07-17-13 50 0 MP2119DQ C586776.7 1227 09-05-13 50 0 MP2119DQ C586790.7 1233 09-05-13 46 0 MPQ2489DQ-AEC1 B9398200 1301 10-12-13 47 0 MPQ2489DQ-AEC1 B965700 1303 10-12-13 50 0 MPQ2489DQ-AEC1 B9677100 1309 10-12-13 50 0 MPQ4566GD-AEC1 EP289800 1309 10-09-13 47 0 MPQ1530DQ-AEC1 FA342746B 1330 10-09-13 47 0 MP2359DJ B9955700 1325 10-09-13 50 0 MP1484EN D681125.7 1330 09-26-13 50 0 Total FA No. 0 3.2 BCM12S Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: HHNEC, ASMC,SMIC EARLY LIFE (HTOL Short Term Monitor) Stress Duration: 48 ~168 hours Test Condition: Vccmax @ 125°C Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP8708EN HP3299 1311 07-10-13 80 168 0 MP8706EN D189489.9 1318 07-16-13 160 168 0 MP28256EL CA88725.7 1313 07-08-13 78 168 0 MP28252EL C145089.9 1218 07-11-13 50 168 0 MP28252EL C346428.9A 1226 07-11-13 50 168 0 MP3389EF D189469.9DT 1317 07-25-13 80 168 0 MP1482DS C346863.8QA 1203 07-24-13 80 168 0 MP1482DS C346863.8QB 1223 07-24-13 80 168 0 The Future of Analog IC Technology® -6- FA No. MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP1482DS D289832.8Y 1316 07-24-13 80 168 0 MP3388DR C586837.1CH 1309 07-30-13 80 168 0 MP3388DR C586837.1CM 1309 07-30-13 80 168 0 MP3388DR C586837.1CL 1309 07-30-13 80 168 0 MP1494DJ C872955.8A 1245 07-31-13 50 168 0 MP1494DJ C872957.8 1245 07-31-13 50 168 0 MP8736DL C888292.8A 1249 09-09-13 50 168 0 MP8736DL C888200.8 1249 09-09-13 50 168 0 MP3388DR HL2643 1247 10-09-13 80 168 0 MP3388DR HL264302 1247 10-09-13 50 168 0 MP3391EF CB72193.1 1324 10-09-13 80 168 0 MP1495DJ C872966.8 1306 07-01-13 80 48 0 MP1494DJ C872968.8 1301 07-01-13 80 48 0 MP1494DJ C872965.8A 1306 07-01-13 80 48 0 MP1494DJ C94G691.8 1309 07-01-13 80 48 0 MP1495DJ CA4H765.8 1309 07-01-13 80 48 0 NB637EL C64B156.9A 1238 08-01-13 78 48 0 MP28254EL D189452.1A 1313 07-18-13 80 48 0 MP28254EL D189497.1 1313 07-18-13 80 48 0 MP3388DR-C414 D189587.7 1314 07-10-13 80 48 0 MP28256EL CA88726.7 1314 07-04-13 80 48 0 MP8705EN CB4L073.9 1306 07-04-13 80 48 0 MP1495DJ CA4H620.8A 1316 07-18-13 80 48 0 MP1495DJ C94H383.8A 1316 07-04-13 80 48 0 MP1495DJ D14M852.8A 1320 07-02-13 80 48 0 MP1495DJ D14N765.8A 1321 07-10-13 80 48 0 MP8736DL CC89300.8 1322 07-01-13 80 48 0 MP1495DJ D14N762.8A 1320 07-10-13 80 48 0 MP1495DJ D14N762.8 1320 08-14-13 80 48 0 MP6002DN 9581388.9B 1326 07-16-13 75 48 0 MP1495DJ D24P282.8 1323 08-07-13 78 48 0 MP1495DJ D24P283.8 1323 08-07-13 78 48 0 MP1495DJ D34Q759.8 1329 08-14-13 78 48 0 MP1495DJ D44S418.8A 1332 08-28-13 80 48 0 MP1495DJ D44S042.8A 1332 09-09-13 80 48 0 MP1495DJ D44S043.8 1332 09-18-13 80 48 0 MP6002DN 9685969.7 1328 08-30-13 70 48 0 MP2315GJ D580847.8 1331 09-12-13 80 48 0 MP2315GJ D580965.8 1334 09-23-13 80 48 0 MP2315GJ D580845.8 1335 09-18-13 80 48 0 MP1495DJ D44S422.8Y 1335 09-26-13 79 48 0 MPQ8632GL-8 C582657.8Y 1251 07-03-13 80 48 0 The Future of Analog IC Technology® -7- FA No. MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of hrs # of Fail MPQ28261DL CB89058.1BY 1320 07-30-13 80 48 0 MPQ28261DL CA89004.9BY 1326 08-06-13 78 48 0 MPQ4470GL D480529.8A 1329 08-07-13 80 48 0 MPQ28261DL CA89003.9Y 1328 08-07-13 79 48 0 MPQ8904DD-AEC1 C772923.8 1236 08-16-13 80 48 0 MPQ28261DL CB89057.9Y 1329 08-16-13 79 48 0 MPQ28261DL CB89059.9Y 1329 08-30-13 78 48 0 MPQ28261DL CB89056.9Y 1328 09-05-13 78 48 0 MPQ28261DL CB89058.9 1333 09-05-13 78 48 0 MPQ28261DL B882415.9AY 1333 09-10-13 78 48 0 MP3389EF CB89067.1 1316 05-29-13 80 48 0 MP3394EF CB4L149.9A 1317 05-16-13 80 48 0 MP8706EN D189485.9 1316 05-27-13 80 48 0 MP28255EL D44R792.9A 1321 06-18-13 79 48 0 MP6002DN 9685967.7A 1320 06-18-13 75 48 0 MP8736DL CC89293.8 1318 06-26-13 80 48 0 Total FA No. 0 LONG TERM LIFE (HTOL Long Term Monitor) Stress Duration: 1000 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of Fail MP28253EL C486546.9AQ 1230 10-30-13 78 0 MP1492DS CC89314.8A 1312 07-10-13 88 0 MP3389EF D189468.1BT 1315 07-25-13 80 0 MPQ4470GL-AEC1 EP255406 1237 07-24-13 79 0 MP2314GJ EP266705 1303 07-23-13 83 0 MP2314GJ EP266704 1312 07-23-13 88 0 MPQ8904DD-AEC1 FA272923C 1248 07-24-13 79 0 MPQ4470GL-AEC1 EP270601 1247 07-22-13 79 0 MPQ4470GL-AEC1 EP270602 1249 07-22-13 80 0 MP1400GC-ST EP2976R0 1315 07-24-13 79 0 MP3388DR HL264301 1247 10-09-13 80 0 MP2615GV EP291500 1316 09-11-13 80 0 Total 0 BCM12S #fail #device hours Accel Factor FIT Rate 0 973000 348 2.8 The Future of Analog IC Technology® -8- FA No. MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT HIGH TEMPERATURE STORAGE LIFE (HTSL) Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MP28258DD C447340.8A 1227 07-05-13 50 0 MP28258DD C447877.8A 1229 07-05-13 50 0 MP1472GJ C84G049.8 1249 07-11-13 47 0 MP1472GJ C94G415.8 1249 07-11-13 47 0 MPQ8632GL-10 C882750.8A 1243 07-05-13 47 0 MPQ8632GL-10 C982765.8A 1247 07-05-13 47 0 MP4012DS C782699.1B 1316 07-10-13 50 0 MP1472GJ C448218.8 1226 07-09-13 50 0 MP1472GJ C448173.8 1226 07-09-13 50 0 MP28258DD C185020.8 1214 07-10-13 49 0 MP28258DD C285251.8 1218 07-10-13 50 0 MP28252EL C145089.9 1218 07-11-13 50 0 MP28252EL C346428.9A 1226 07-11-13 50 0 MP3399EY D14N498.9 1311 07-24-13 47 0 MP3399EY D14N009.9 1310 07-24-13 47 0 MP1482DS C346863.8QA 1203 07-24-13 50 0 MP1482DS C346863.8QB 1223 07-24-13 50 0 MPQ4470GL-AEC1 EP255406 1237 07-24-13 47 0 MP1494DJ HP300859 1243 07-24-13 50 0 MP1494DJ HP300865 1247 07-24-13 50 0 MPQ2459GJ-ACQ10 EP268400 1243 07-24-13 50 0 MPQ4470GL-AEC1 EP270601 1247 07-22-13 50 0 MPQ4470GL-AEC1 EP270602 1249 07-22-13 50 0 MP1482DS D289832.8Y 1316 07-24-13 50 0 MP3388DR C586837.1CH 1309 07-30-13 50 0 MP3388DR C586837.1CM 1309 07-30-13 50 0 MP3388DR C586837.1CL 1309 07-30-13 50 0 MP1400GC-ST EP2976 1315 07-24-13 50 0 MP1494DJ C872955.8A 1245 07-31-13 47 0 MP1494DJ C872957.8 1245 07-31-13 47 0 MP1497DJ C372425.8A 1246 07-31-13 50 0 MP1497DJ C572761.8 1250 07-31-13 50 0 MP1482DS-C165 C245633.8 1246 07-31-13 50 0 MP3389EY CA4J542.1 1311 07-24-13 47 0 MP3389EY CA88821.1 1310 07-24-13 47 0 MP1494DJ HP300821 1237 09-04-13 50 0 MP2318GJ EP293104 1322 09-03-13 50 0 MP8736DL C888292.8A 1249 09-09-13 50 0 MP8736DL C888200.8 1249 09-09-13 50 0 * The Future of Analog IC Technology® -9- FA No. MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device LOT# D/C Close Date Sample Size # of Fail MP8736DL C888200.8 1249 09-09-13 50 0 MP6922AGN FA222077C 1321 10-09-13 50 0 MP6922AGN FA222077C 1325 10-09-13 50 0 MP86884DQKT CA72137.8A 1311 09-18-13 50 0 MP86884DQKT CA72137.8B 1311 09-18-13 50 0 MP1496DJ CC4M447.8AQ 1314 10-09-13 47 0 MP1496DJ D14N454.8 1318 10-09-13 47 0 MP28259DD D189507.8 1318 10-09-13 47 0 MP28259DD D189648.8A 1321 10-09-13 47 0 MP3391EF CB72193.1 1324 10-09-13 50 0 MP1494DJ D34Q676.8AY 1328 10-12-13 50 0 Total FA No. 0 3.3 BCM35 Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: ASMC,SMIC EARLY LIFE (HTOL Short Term Monitor) Stress Duration: 48 ~168 hours Test Condition: Vccmax @ 125°C Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP5000SDQ C943132.8AA 1315 07-10-13 80 168 0 MP5010ADQ CA43183.9 1313 07-09-13 80 168 0 MP1470GJ C642993.8BA 1245 09-05-13 50 168 0 MP1470GJ C642993.8BB 1245 09-05-13 50 168 0 MP2617AGL D44S427.8 1325 10-09-13 50 168 0 MP2617AGL D143347.8C 1319 10-09-13 50 168 0 MP5010ADQ D34R696.8B 1321 07-23-13 50 48 0 MP2161GJ D24Q208.8Y 1318 07-16-13 80 48 0 Total FA No. 0 LONG TERM LIFE (HTOL Long Term Monitor) Stress Duration: 1000 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of Fail MP5000ADQ HP313204 1322 09-02-13 78 0 Total 0 BCM35 #fail #device hours Accel Factor FIT Rate 0 78 348 35 The Future of Analog IC Technology® - 10 - FA No. MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT HIGH TEMPERATURE STORAGE LIFE (HTSL) Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MP3398GF HP306405 1238 07-10-13 50 0 MP5000SDQ C943132.8AA 1315 07-10-13 50 0 MP5010ADQ CA43183.9 1313 07-09-13 50 0 MP3398LGS HP335802 1309 07-23-13 48 0 MP5506GL EP253302 1230 07-19-13 47 0 MP2625GL HP315103 1304 07-31-13 50 0 MP8843GG-JC HP3231.05 1308 09-03-13 50 0 MP1470GJ C642993.8BA 1245 09-05-13 47 0 MP1470GJ C642993.8BB 1245 09-05-13 47 0 MP8845GC HP2883R6 1311 10-12-13 50 0 MP8845BGC HP2883R4 1303 10-12-13 50 0 MP2617AGL D44S427.8 1325 10-09-13 47 0 MP2617AGL D143347.8C 1319 10-09-13 47 0 MP3394SGS D54T477.8A 139 10-09-13 50 0 Total FA No. 0 3.4 BCM05 Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: ASMC,HHNEC EARLY LIFE (HTOL Short Term Monitor) Stress Duration: 48 ~168 hours Test Condition: Vccmax @ 125°C Device LOT# D/C Close Date Sample Size # of hrs # of Fail MP6400DJ-9 EP265801 1230 07-24-13 92 168 0 Total FA No. 0 HIGH TEMPERATURE STORAGE LIFE (HTSL) Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail MP62040DQFU-E B672586.9Q 1316 07-31-13 50 0 Total 0 The Future of Analog IC Technology® - 11 - FA No. MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT 3.5 BCM18 Process Technology The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor. The specific fab locations included in this process monitor are: SMIC LONG TERM LIFE (HTOL Long Term Monitor) Stress Duration: 1000 hours Test Condition: Vccmax @125°C Device LOT# D/C Close Date Sample Size # of Fail NB675GL HP3318 1311 10-09-13 80 0 NB677GQ HP3573 1331 10-12-13 77 0 Total FA No. 0 BCM35 #fail #device hours Accel Factor FIT Rate 0 157000 348 17.5 HIGH TEMPERATURE STORAGE LIFE (HTSL) Stress Duration: 1000 hours Test Condition: 150°C Device LOT# D/C Close Date Sample Size # of Fail NB675GL CC4L659.8 1311 07-16-13 47 0 NB675GL CC4L661.8 1311 07-16-13 47 0 NB669GQ HP7M096 1312 07-17-13 50 0 NB670GQ HP3034 1309 07-17-13 50 0 NB671GQ D14M879.8 1313 07-24-13 47 0 NB671GQ D14M878.8 1313 07-24-13 45 0 MP2225GJ HP3189 1304 09-24-13 50 0 NB675GL HP3318 1311 10-09-13 50 0 NB677GQ HP3573 1331 10-12-13 50 0 Total 0 The Future of Analog IC Technology® - 12 - FA No. MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT 4.0 PACKAGE RELIABILITY MONITORING DATA 4.1 QFN The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD QFN2*2 ASAT QFN2*2 UCD QFN2*3 ASAT QFN2*3 UCD QFN3*3 ASAT QFN3*3 UCD QFN3*4 ASAT QFN3*4 UCD QFN4*4 ASAT QFN4*4 UCD QFN4*5 ASAT QFN5*5 UCD QFN5*5 ASAT QFN7*7 UCD QFN5*6 UTAC UCD QFN6*6 JCET QFN2*2 UCD QFN7*7 JCET QFN4*4 QFN3*3 4.1.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP28253EL 1230 10-30-13 160 0 MP2119DQ 1309 07-12-13 222 0 MP2119DQ 1309 07-12-13 222 0 MP2119DQ 1309 07-12-13 222 0 MP2209DL 1309 07-12-13 222 0 MP2209DL 1309 07-12-13 222 0 MP2209DL 1309 07-12-13 222 0 MP2109DQ 1317 07-03-13 200 0 MP5000SDQ 1315 07-10-13 200 0 MP5010ADQ 1313 07-09-13 200 0 MP5414AGV 1205 07-17-13 160 0 MP2615GV 1302 07-22-13 200 0 MPQ8904DD-AEC1 1236 07-24-13 100 0 MPQ3701GR 1239 07-17-13 100 0 MP3388DR 1309 07-30-13 200 0 MP3388DR 1309 07-30-13 200 0 MP3388DR 1309 07-30-13 200 0 MP62040DQFU-E 1316 07-31-13 200 0 MPQ2489DQ-AEC1 1301 10-12-13 292 0 MPQ2489DQ-AEC1 1303 10-12-13 292 0 MPQ2489DQ-AEC1 1309 10-12-13 300 0 FA NO. The Future of Analog IC Technology® - 13 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MPQ4566GD-AEC1 1309 10-09-13 302 0 MPQ4566GD-AEC1 1309 10-09-13 100 0 MPQ1530DQ-AEC1 1319 10-09-13 110 0 MPQ1530DQ-AEC1 1319 10-09-13 205 0 MP6507AGR 1320 09-24-13 200 0 MPQ1530DQ-AEC1 1330 10-09-13 300 0 MP6507AGR 1320 09-24-13 90 0 MPQ2489DQ-AEC1 1330 09-17-13 105 0 MPQ28261DL 1228 07-02-13 45 0 MPQ28261DL 1217 07-02-13 90 0 MPQ28261DL 1228 07-02-13 85 0 MP1530DQ 1310 08-28-13 100 0 MP5010ADQ 1316 07-23-13 50 0 MP5010BDQ 1320 08-28-13 50 0 MP5010BDQ 1321 08-28-13 50 0 MP5010ADQ 1321 07-23-13 50 0 MP5010BDQ 1322 09-05-13 50 0 MP5010BDQ 1323 09-10-13 51 0 MP5010BDQ 1325 09-05-13 50 0 MP5010BDQ 1329 09-10-13 50 0 MP5010BDQ 1328 09-10-13 50 0 MP5010BDQ 1331 09-10-13 50 0 Total FA NO. 0 SAT picture of QFN T-SCAN PICTURE C-SCAN PICTURE The Future of Analog IC Technology® - 14 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT 4.1.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP2119DQ 1309 07-12-13 97 0 1000 MP2119DQ 1309 07-12-13 97 0 1000 FA NO. # of cycle MP2119DQ 1309 07-12-13 97 0 1000 MP2209DL 1309 07-12-13 97 0 1000 MP2209DL 1309 07-12-13 97 0 1000 MP2209DL 1309 07-12-13 97 0 1000 MP2109DQ 1317 07-03-13 97 0 1000 MP5000SDQ 1315 07-10-13 97 0 1000 MP5010ADQ 1313 07-09-13 97 0 1000 MP28252EL 1218 07-11-13 49 0 1000 MP28252EL 1226 07-11-13 50 0 1000 MP5414AGV 1205 07-17-13 80 0 1000 MP3388DR 1309 07-30-13 97 0 1000 MP3388DR 1309 07-30-13 97 0 1000 MP3388DR 1309 07-30-13 97 0 1000 MP62040DQFU-E 1316 07-31-13 97 0 1000 MP2119DQ 1227 09-05-13 50 0 1000 MP2119DQ 1233 09-05-13 50 0 1000 MPQ2489DQ-AEC1 1301 10-12-13 84 0 1000 MPQ2489DQ-AEC1 1303 10-12-13 84 0 1000 MPQ2489DQ-AEC1 1309 10-12-13 94 0 1000 MPQ4566GD-AEC1 1309 10-09-13 94 0 1000 MPQ1530DQ-AEC1 1319 10-09-13 97 0 1000 09-24-13 94 0 1000 MP6507AGR 1320 MPQ1530DQ-AEC1 1330 10-09-13 94 0 1000 MP2633GR 1331 09-17-13 94 0 1000 MP2633GR 1331 09-17-13 55 0 1000 MPQ4560DQ 1302 07-02-13 50 0 100 MPQ4456GQT 1303 07-26-13 50 0 100 MPQ4560DQ 1302 07-02-13 50 0 100 MPQ4558DQ-AEC1 1307 07-04-13 50 0 100 MPQ4560DQ-AEC1 1303 07-02-13 50 0 100 MPQ4558DQ-AEC1 1308 07-02-13 50 0 100 MPQ4560DQ-AEC1 1306 07-02-13 50 0 100 1309 07-18-13 50 0 100 MPQ6400DG-33-AEC 1310 07-04-13 50 0 100 1306 07-02-13 50 0 100 MPQ4560DQ-AEC1 1310 07-02-13 50 0 100 MPQ4560DQ-AEC1 1312 07-02-13 50 0 100 MPQ4456GQT MPQ4560DQ The Future of Analog IC Technology® - 15 - MONOLITHIC POWER SYSTEMS Q3 Device D/C MPQ4560DQ-AEC1 1312 2013 PRODUCT RELIABILITY REPORT Close Date Sample Size # of Fail 07-02-13 50 0 100 FA NO. # of cycle MP5000SDQ 1312 08-15-13 500 0 100 MPQ4560DQ 1310 07-04-13 50 0 100 MPQ4560DQ 1308 07-02-13 50 0 100 MP2633GR 1313 07-04-13 50 0 100 MP1530DQ 1310 08-28-13 50 0 100 MPQ4561DQ-AEC1 1312 07-02-13 50 0 100 MP2611GL 1310 08-15-13 50 0 100 MPQ4560DQ 1312 07-02-13 50 0 100 MPQ4561DQ-AEC1 1315 07-04-13 50 0 100 MPQ2483DQ-AEC1 1310 07-02-13 50 0 100 MP5010ADQ 1316 07-23-13 50 0 100 MP1530DQ 1319 08-16-13 50 0 100 MP1530DQ 1317 08-20-13 50 0 100 MPQ2128DG-AEC1 1316 07-02-13 50 0 100 MP4459DQT 1303 07-04-13 50 0 100 MP2607DL 1320 09-12-13 50 0 100 MPQ4560DQ-AEC1 1315 07-02-13 50 0 100 MPQ4558DQ-AEC1 1310 07-02-13 50 0 100 50 0 100 MP3426DL 1320 08-16-13 MP5010BDQ 1320 08-28-13 50 0 100 MP28253EL-C323 1320 07-25-13 50 0 100 MPQ4560DQ 1315 07-02-13 50 0 100 MPQ4561DQ-AEC1 1320 07-02-13 50 0 100 MP5010BDQ 1321 08-28-13 50 0 100 MP4459DQT 1309 07-03-13 50 0 100 MP5010ADQ 1321 07-23-13 50 0 100 MPQ4456GQT 1322 07-02-13 50 0 100 MPQ2128DG-AEC1 1320 07-02-13 50 0 100 MP1530DQ 1323 08-28-13 50 0 100 MP2207DQ 1322 07-04-13 50 0 100 MP5010BDQ 1322 09-05-13 50 0 100 MP5010BDQ 1322 09-10-13 50 0 100 MP3388SGR 1323 07-02-13 50 0 100 MP5010BDQ 1323 09-10-13 50 0 100 MP1530DQ 1324 08-23-13 50 0 100 NB637EL-C327 1324 07-10-13 50 0 100 MP2633GR 1323 07-02-13 50 0 100 MP2127DQ 1322 07-10-13 50 0 100 MP62551DGT 1236 07-01-13 50 0 100 MP4459DQT 1324 07-10-13 50 0 100 MP2633GR 1324 07-10-13 50 0 100 The Future of Analog IC Technology® - 16 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Close Date Sample Size # of Fail MPQ2483DQ-AEC1 1324 07-04-13 50 0 100 MPQ2483DQ-AEC1 1323 07-04-13 50 0 100 Device D/C FA NO. # of cycle MP2635GR 1323 07-02-13 50 0 100 MP20045DQ 1325 07-10-13 50 0 100 MP2633GR 1324 07-10-13 50 0 100 MP4459DQT 1324 07-18-13 50 0 100 MP28256EL 1324 07-04-13 50 0 100 MP5010BDQ 1325 09-05-13 50 0 100 MP2633GR 1320 07-10-13 50 0 100 MP2633GR 1325 07-10-13 50 0 100 MP8126DR 1325 07-10-13 50 0 100 MP2635GR 1324 07-10-13 50 0 100 MP4460DQ 1325 07-10-13 50 0 100 MP5010BDQ 1326 09-10-13 50 0 100 MPQ4561DQ-AEC1 1326 07-16-13 50 0 100 MP3388DR-C414 1320 07-16-13 50 0 100 MP2633AGR 1325 07-16-13 50 0 100 MP5010BDQ 1326 09-10-13 50 0 100 MP3426DL 1325 07-16-13 50 0 100 MP3388DR-C414 1321 07-18-13 50 0 100 MP2633AGR 1324 07-18-13 50 0 100 MPQ18201HQ-A 1326 07-18-13 50 0 100 MP3425DL 1326 07-18-13 50 0 100 MP2602DQ 1325 07-18-13 50 0 100 MPQ4560DQ-AEC1 1325 07-18-13 50 0 100 MP2633GR-C498 1317 07-25-13 50 0 100 MP1530DQ 1325 07-18-13 50 0 100 MPQ4560DQ-AEC1 1321 07-18-13 50 0 100 MP2635GR 1324 07-25-13 50 0 100 MP3388SGR 1327 07-23-13 50 0 100 MP1530DQ 1326 08-14-13 50 0 100 MPQ4560DQ 1326 07-25-13 50 0 100 MPQ28261DL 1320 07-30-13 50 0 100 MP2633GR 1325 07-25-13 50 0 100 MP5010BDQ 1327 09-10-13 50 0 100 MPQ28261DL 1326 08-06-13 50 0 100 MP62551DGT 1322 07-25-13 50 0 100 MP28225DL 1305 07-25-13 50 0 100 MP2005DD 1323 07-25-13 50 0 100 MP4458DQT 1328 07-30-13 50 0 100 MP2565DQ 1327 07-25-13 50 0 100 MP5010BDQ 1327 09-10-13 50 0 100 The Future of Analog IC Technology® - 17 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP4460DQ 1328 08-07-13 50 0 100 MP5010BDQ 1327 09-10-13 50 0 100 MP4459DQT 1328 08-14-13 50 0 100 MP2633GR 1325 07-30-13 50 0 100 MP20045DQ-33 1328 08-01-13 50 0 100 MP28252EL 1328 08-01-13 50 0 100 MP2932GQK 1323 08-14-13 49 0 100 MP5010BDQ 1327 09-10-13 50 0 100 MP5010BDQ 1328 09-10-13 50 0 100 MP2002DD 1328 08-07-13 50 0 100 MP5010BDQ 1328 09-10-13 50 0 100 MP5010BDQ 1328 09-10-13 50 0 100 MP2610ER 1325 08-07-13 50 0 100 MPQ28261DL 1328 08-07-13 50 0 100 MP3430HQ 1329 08-07-13 50 0 100 MP5010BDQ 1328 09-10-13 50 0 100 NB600CQ 1327 08-07-13 50 0 100 MP2635AGR 1325 09-02-13 50 0 100 MPQ8904DD-AEC1 1236 08-16-13 50 0 100 FA NO. # of cycle MP2633GR 1325 08-14-13 50 0 100 MP2633AGR 1327 08-07-13 50 0 100 MPQ28261DL 1329 08-16-13 50 0 100 MP2012DQ 1329 08-14-13 50 0 100 MP5010BDQ 1328 09-10-13 50 0 100 MP5010BDQ 1328 09-10-13 50 0 100 MP28256EL 1328 08-14-13 50 0 100 MP5010BDQ 1329 09-10-13 50 0 100 MP2360DG 1327 08-14-13 50 0 100 MP5010BDQ 1328 09-10-13 50 0 100 MP5010BDQ 1329 09-10-13 50 0 100 MP5010SDQ 1327 08-14-13 50 0 100 MPQ4560DQ 1327 08-16-13 50 0 100 MP2209DL 1330 08-14-13 50 0 100 MPQ6400DG-33-AEC 1327 08-16-13 50 0 100 MP4462DQ 1322 08-14-13 50 0 100 MP5010BDQ 1328 09-10-13 50 0 100 MP2633AGR 1328 08-14-13 50 0 100 MP5410EQ 1330 08-16-13 50 0 100 MP2116DQ 1315 08-16-13 50 0 100 NB600CQ 1327 08-20-13 50 0 100 MP3308DL 1330 08-20-13 50 0 100 MP28256EL 1330 08-20-13 50 0 100 The Future of Analog IC Technology® - 18 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP5000DQ 1331 08-20-13 50 0 100 MP28128DQ 1325 08-28-13 50 0 100 MP5010DQ 1332 08-28-13 50 0 100 MP2128DG 1322 08-20-13 50 0 100 MP2633AGR 1328 08-23-13 50 0 100 MPQ28261DL 1329 08-30-13 50 0 100 MP3308DL 1332 08-28-13 50 0 100 FA NO. # of cycle MPQ4560DQ 1331 08-28-13 50 0 100 MPQ28261DL 1328 09-05-13 45 0 100 MP5000DQ 1332 08-28-13 50 0 100 MPQ4560DQ 1328 09-05-13 50 0 100 MP5010BDQ 1331 09-10-13 50 0 100 MP3425DL 1330 08-28-13 50 0 100 MP28252EL 1325 08-28-13 50 0 100 MP2101DQ 1332 08-28-13 50 0 100 MP2633GR 1325 08-29-13 50 0 100 MP3304CDD 1333 08-29-13 50 0 100 MP26123DR 1333 08-30-13 50 0 100 MP2005DD 1329 08-30-13 50 0 100 MP4651DQ-C227 1326 09-05-13 49 0 100 MP2119DQ 1326 09-18-13 50 0 100 MP2490DQ 1333 09-05-13 50 0 100 MPQ28261DL 1333 09-05-13 50 0 100 MPQ28261DL 1333 09-10-13 50 0 100 MP5010BDQ 1331 09-10-13 50 0 100 MP2633GR 1334 09-18-13 50 0 100 MP62041DQFU-1 1333 09-05-13 50 0 100 PQ20056GG-18-AEC 1301 09-09-13 50 0 100 MP8352DL 1334 09-05-13 50 0 100 MP6400DG-01 1327 09-09-13 50 0 100 MP28256EL 1330 09-09-13 50 0 100 MP62041DQFU-1 1329 09-09-13 50 0 100 MP3388DR-C414 1334 09-09-13 50 0 100 MP62041DQFU-1 1329 09-09-13 50 0 100 MP2635GR 1335 09-18-13 50 0 100 MP5010BDQ 1331 09-18-13 50 0 100 MP2030DQ 1319 09-10-13 50 0 100 MPQ4462DQ-AEC1 1334 09-10-13 50 0 100 MP5010BDQ 1330 09-12-13 50 0 100 MP5010BDQ 1330 09-12-13 50 0 100 MP2109DQ 1329 09-12-13 50 0 100 MP2635GR 1335 09-18-13 50 0 100 The Future of Analog IC Technology® - 19 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP62551DGT 1330 09-12-13 50 0 FA NO. # of cycle 100 MP5007DQ 1335 09-18-13 50 0 100 MP2635GR 1336 09-18-13 50 0 100 MP8668DL-C223 1336 09-23-13 50 0 100 MPQ4561DQ-AEC1 1334 09-23-13 50 0 100 MP62550DGT 1336 09-23-13 50 0 100 NB600CQ 1334 09-26-13 50 0 100 MP5010BDQ 1335 09-26-13 50 0 100 MP5010BDQ 1336 09-26-13 50 0 100 MP5010BDQ 1335 09-26-13 50 0 100 MP5010BDQ 1335 09-26-13 50 0 100 MP5010BDQ 1337 09-26-13 50 0 100 MP8125DR 1335 09-26-13 50 0 100 Total 0 4.1.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP28253EL 1230 10-30-13 80 0 168 MP2119DQ 1309 07-12-13 97 0 168 MP2119DQ 1309 07-12-13 97 0 168 MP2119DQ 1309 07-12-13 97 0 168 MP2209DL 1309 07-12-13 97 0 168 MP2209DL 1309 07-12-13 97 0 168 FA NO. # of hrs MP2209DL 1309 07-12-13 97 0 168 MP2109DQ 1317 07-03-13 97 0 168 MP5000SDQ 1315 07-10-13 97 0 168 MP5010ADQ 1313 07-09-13 97 0 168 MP5414AGV 1205 07-17-13 80 0 168 MPQ3701GR 1239 07-17-13 88 0 168 MP3388DR 1309 07-30-13 97 0 168 MP3388DR 1309 07-30-13 97 0 168 MP3388DR 1309 07-30-13 97 0 168 MP62040DQFU-E 1316 07-31-13 95 0 168 MP2119DQ 1227 09-05-13 50 0 168 MPQ2489DQ-AEC1 1301 10-12-13 87 0 168 MPQ2489DQ-AEC1 1303 10-12-13 87 0 168 MPQ2489DQ-AEC1 1309 10-12-13 100 0 168 MPQ4566GD-AEC1 1309 10-09-13 97 0 168 MPQ4566GD-AEC1 1309 10-09-13 100 2 7428 168 The Future of Analog IC Technology® - 20 - MONOLITHIC POWER SYSTEMS Device Q3 D/C MPQ1530DQ-AEC1 1319 MP6507AGR 1320 MPQ1530DQ-AEC1 1330 2013 PRODUCT RELIABILITY REPORT Close Date Sample Size # of Fail 10-09-13 97 0 168 09-24-13 97 0 168 FA NO. # of hrs 10-09-13 97 0 168 MP2633GR 1331 09-17-13 97 0 168 MP2633GR 1331 09-17-13 54 0 168 MPQ4560DQ 1302 07-02-13 50 0 48 MPQ4456GQT 1303 07-26-13 50 0 48 MPQ4560DQ 1302 07-02-13 50 0 48 MPQ4558DQ-AEC1 1307 07-04-13 50 0 48 MPQ4560DQ-AEC1 1303 07-02-13 50 0 48 MPQ4558DQ-AEC1 1308 07-02-13 50 0 48 MPQ4560DQ-AEC1 1306 07-02-13 50 0 48 1309 07-18-13 50 0 48 MPQ6400DG-33-AEC 1310 07-04-13 50 0 48 1306 07-02-13 50 0 48 MPQ4560DQ-AEC1 1310 07-02-13 50 0 48 MPQ4560DQ-AEC1 1312 07-02-13 50 0 48 MPQ4456GQT MPQ4560DQ MPQ4560DQ 1310 07-04-13 50 0 48 MPQ4560DQ 1308 07-02-13 50 0 48 MP2633GR 1313 07-04-13 50 0 48 MP1530DQ 1310 08-28-13 50 0 48 MPQ4561DQ-AEC1 1312 07-02-13 50 0 48 MP2611GL 1310 08-15-13 50 0 48 MPQ4560DQ 1312 07-02-13 50 0 48 MPQ4561DQ-AEC1 1315 07-04-13 50 0 48 MPQ2483DQ-AEC1 1310 07-02-13 50 0 48 MP5010ADQ 1316 07-23-13 50 0 48 MP1530DQ 1319 08-16-13 50 0 48 MP1530DQ 1317 08-20-13 50 0 48 MPQ2128DG-AEC1 1316 07-02-13 50 0 48 MP4459DQT 1303 07-04-13 50 0 48 MP2607DL 1320 09-12-13 50 0 48 MPQ4560DQ-AEC1 1315 07-02-13 50 0 48 MPQ4558DQ-AEC1 1310 07-02-13 50 0 48 MP3426DL 1320 08-16-13 50 0 48 MP5010BDQ 1320 08-28-13 50 0 48 MP28253EL-C323 1320 07-25-13 50 0 48 MPQ4560DQ 1315 07-02-13 50 0 48 MPQ4561DQ-AEC1 1320 07-02-13 50 0 48 MP5010BDQ 1321 08-28-13 50 0 48 MP4459DQT 1309 07-03-13 50 0 48 MP5010ADQ 1321 07-23-13 50 0 48 The Future of Analog IC Technology® - 21 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MPQ4456GQT 1322 07-02-13 50 0 48 MPQ2128DG-AEC1 1320 07-02-13 50 0 48 FA NO. # of hrs MP1530DQ 1323 08-28-13 50 0 48 MP2207DQ 1322 07-04-13 50 0 48 MP5010BDQ 1322 09-05-13 50 0 48 MP5010BDQ 1322 09-10-13 50 0 48 MP3388SGR 1323 07-02-13 50 0 48 MP5010BDQ 1323 09-10-13 50 0 48 MP1530DQ 1324 08-23-13 50 0 48 NB637EL-C327 1324 07-10-13 50 0 48 MP2633GR 1323 07-02-13 50 0 48 MP2127DQ 1322 07-10-13 50 0 48 MP62551DGT 1236 07-01-13 50 0 48 MP4459DQT 1324 07-10-13 50 0 48 MP2633GR 1324 07-10-13 50 0 48 MPQ2483DQ-AEC1 1324 07-04-13 50 0 48 MPQ2483DQ-AEC1 1323 07-04-13 50 0 48 MP2635GR 1323 07-02-13 50 0 48 MP20045DQ 1325 07-10-13 50 0 48 MP2633GR 1324 07-10-13 50 0 48 MP4459DQT 1324 07-18-13 50 0 48 MP28256EL 1324 07-04-13 50 0 48 MP5010BDQ 1325 09-05-13 50 0 48 MP2633GR 1320 07-10-13 50 0 48 MP2633GR 1325 07-10-13 50 0 48 MP8126DR 1325 07-10-13 50 0 48 MP2635GR 1324 07-10-13 50 0 48 MP4460DQ 1325 07-10-13 50 0 48 MP5010BDQ 1326 09-10-13 50 0 48 MPQ4561DQ-AEC1 1326 07-16-13 50 0 48 MP3388DR-C414 1320 07-16-13 50 0 48 MP2633AGR 1325 07-16-13 50 0 48 MP5010BDQ 1326 09-10-13 50 0 48 MP3426DL 1325 07-16-13 50 0 48 MP3388DR-C414 1321 07-18-13 50 0 48 MP2633AGR 1324 07-18-13 50 0 48 MPQ18201HQ-A 1326 07-18-13 50 0 48 MP3425DL 1326 07-18-13 50 0 48 MP2602DQ 1325 07-18-13 50 0 48 MPQ4560DQ-AEC1 1325 07-18-13 50 0 48 MP2633GR-C498 1317 07-25-13 50 0 48 MP1530DQ 1325 07-18-13 50 0 48 The Future of Analog IC Technology® - 22 - MONOLITHIC POWER SYSTEMS Device Q3 D/C MPQ4560DQ-AEC1 1321 MP2635GR 1324 2013 PRODUCT RELIABILITY REPORT Close Date Sample Size # of Fail 07-18-13 50 0 48 07-25-13 50 0 48 FA NO. # of hrs MP3388SGR 1327 07-23-13 50 0 48 MP1530DQ 1326 08-14-13 50 0 48 MPQ4560DQ 1326 07-25-13 50 0 48 MPQ28261DL 1320 07-30-13 50 0 48 MP2633GR 1325 07-25-13 50 0 48 MP5010BDQ 1327 09-10-13 50 0 48 MPQ28261DL 1326 08-06-13 50 0 48 MP62551DGT 1322 07-25-13 50 0 48 MP28225DL 1305 07-25-13 50 0 48 MP2005DD 1323 07-25-13 50 0 48 MP4458DQT 1328 07-30-13 50 0 48 MP2565DQ 1327 07-25-13 50 0 48 MP5010BDQ 1327 09-10-13 50 0 48 MP4460DQ 1328 08-07-13 50 0 48 MP5010BDQ 1327 09-10-13 50 0 48 MP4459DQT 1328 08-14-13 50 0 48 MP2633GR 1325 07-30-13 50 0 48 MP20045DQ-33 1328 08-01-13 50 0 48 MP28252EL 1328 08-01-13 50 0 48 MP2932GQK 1323 08-14-13 49 0 48 MP5010BDQ 1327 09-10-13 50 0 48 MP5010BDQ 1328 09-10-13 50 0 48 MP2002DD 1328 08-07-13 50 0 48 MP5010BDQ 1328 09-10-13 50 0 48 MP5010BDQ 1328 09-10-13 50 0 48 MP2610ER 1325 08-07-13 50 0 48 MPQ28261DL 1328 08-07-13 50 0 48 MP3430HQ 1329 08-07-13 50 0 48 MP5010BDQ 1328 09-10-13 50 0 48 NB600CQ 1327 08-07-13 50 0 48 MP2635AGR 1325 09-02-13 50 0 48 MPQ8904DD-AEC1 1236 08-16-13 50 0 48 MP2633GR 1325 08-14-13 50 0 48 MP2633AGR 1327 08-07-13 50 0 48 MPQ28261DL 1329 08-16-13 50 0 48 MP2012DQ 1329 08-14-13 50 0 48 MP5010BDQ 1328 09-10-13 50 0 48 MP5010BDQ 1328 09-10-13 50 0 48 MP28256EL 1328 08-14-13 50 0 48 MP5010BDQ 1329 09-10-13 50 0 48 The Future of Analog IC Technology® - 23 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2360DG 1327 08-14-13 50 0 48 MP5010BDQ 1328 09-10-13 50 0 48 MP5010BDQ 1329 09-10-13 50 0 48 MP5010SDQ 1327 08-14-13 50 0 48 MPQ4560DQ 1327 08-16-13 50 0 48 MP2209DL 1330 08-14-13 50 0 48 MPQ6400DG-33-AEC 1327 08-16-13 50 0 48 FA NO. # of hrs MP4462DQ 1322 08-14-13 50 0 48 MP5010BDQ 1328 09-10-13 50 0 48 MP2633AGR 1328 08-14-13 50 0 48 MP5410EQ 1330 08-16-13 50 0 48 MP2116DQ 1315 08-16-13 50 0 48 NB600CQ 1327 08-20-13 50 0 48 MP3308DL 1330 08-20-13 50 0 48 MP28256EL 1330 08-20-13 50 0 48 MP5000DQ 1331 08-20-13 50 0 48 MP28128DQ 1325 08-28-13 50 0 48 MP5010DQ 1332 08-28-13 50 0 48 MP2128DG 1322 08-20-13 50 0 48 MP2633AGR 1328 08-23-13 50 0 48 MPQ28261DL 1329 08-30-13 50 0 48 MP3308DL 1332 08-28-13 50 0 48 MPQ4560DQ 1331 08-28-13 50 0 48 MPQ28261DL 1328 09-05-13 45 0 48 MP5000DQ 1332 08-28-13 50 0 48 MPQ4560DQ 1328 09-05-13 50 0 48 MP5010BDQ 1331 09-10-13 50 0 48 MP3425DL 1330 08-28-13 50 0 48 MP28252EL 1325 08-28-13 50 0 48 MP2101DQ 1332 08-28-13 50 0 48 MP2633GR 1325 08-29-13 50 0 48 MP3304CDD 1333 08-29-13 50 0 48 MP26123DR 1333 08-30-13 50 0 48 MP2005DD 1329 08-30-13 50 0 48 MP4651DQ-C227 1326 09-05-13 49 0 48 MP2119DQ 1326 09-18-13 50 0 48 MP2490DQ 1333 09-05-13 50 0 48 MPQ28261DL 1333 09-05-13 50 0 48 MPQ28261DL 1333 09-10-13 50 0 48 MP5010BDQ 1331 09-10-13 50 0 48 MP2633GR 1334 09-18-13 50 0 48 MP62041DQFU-1 1333 09-05-13 50 0 48 The Future of Analog IC Technology® - 24 - MONOLITHIC POWER SYSTEMS Device Q3 D/C PQ20056GG-18-AEC 1301 2013 PRODUCT RELIABILITY REPORT Close Date Sample Size # of Fail 09-09-13 50 0 FA NO. # of hrs 48 MP8352DL 1334 09-05-13 50 0 48 MP6400DG-01 1327 09-09-13 50 0 48 MP28256EL 1330 09-09-13 50 0 48 MP62041DQFU-1 1329 09-09-13 50 0 48 MP3388DR-C414 1334 09-09-13 50 0 48 MP62041DQFU-1 1329 09-09-13 50 0 48 MP2635GR 1335 09-18-13 50 0 48 MP5010BDQ 1331 09-18-13 50 0 48 MP2030DQ 1319 09-10-13 50 0 48 MPQ4462DQ-AEC1 1334 09-10-13 50 0 48 MP5010BDQ 1330 09-12-13 50 0 48 MP5010BDQ 1330 09-12-13 50 0 48 MP2109DQ 1329 09-12-13 50 0 48 MP2635GR 1335 09-18-13 50 0 48 MP62551DGT 1330 09-12-13 50 0 48 MP5007DQ 1335 09-18-13 50 0 48 MP2635GR 1336 09-18-13 50 0 48 MP8668DL-C223 1336 09-23-13 50 0 48 MPQ4561DQ-AEC1 1334 09-23-13 50 0 48 MP62550DGT 1336 09-23-13 50 0 48 NB600CQ 1334 09-26-13 50 0 48 MP5010BDQ 1335 09-26-13 50 0 48 MP5010BDQ 1336 09-26-13 50 0 48 MP5010BDQ 1335 09-26-13 50 0 48 MP5010BDQ 1335 09-26-13 50 0 48 MP5010BDQ 1337 09-26-13 50 0 48 MP8125DR 1335 09-26-13 50 0 48 Total 2 4.1.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C Close Date Sample Size # of Fail MPQ8904DD-AEC1 1236 07-24-13 77 0 MPQ4566GD-AEC1 1309 10-09-13 75 0 MPQ1530DQ-AEC1 1319 10-09-13 85 0 MPQ1530DQ-AEC1 1330 10-09-13 85 0 MP6507AGR 1320 09-24-13 80 0 MPQ2489DQ-AEC1 1330 09-17-13 99 0 MP2013GQ 1331 10-09-13 101 0 FA NO. The Future of Analog IC Technology® - 25 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MPQ28261DL 1228 07-02-13 45 0 MPQ28261DL 1217 07-02-13 90 0 MPQ28261DL 1228 07-02-13 85 0 MP1530DQ 1310 08-28-13 100 0 MP5010ADQ 1316 07-23-13 50 0 MP5010BDQ 1320 08-28-13 50 0 MP5010BDQ 1321 08-28-13 50 0 MP5010ADQ 1321 07-23-13 50 0 MP5010BDQ 1322 09-05-13 50 0 MP5010BDQ 1323 09-10-13 51 0 MP5010BDQ 1325 09-05-13 50 0 MP5010BDQ 1329 09-10-13 50 0 MP5010BDQ 1328 09-10-13 50 0 MP5010BDQ 1331 09-10-13 50 0 Total FA NO. 0 4.2 SOIC The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD SOIC8 ANST SOIC14 UCD SOIC8-EP ANST SOIC16 ANST SOIC8-7 ANST SOIC20 ANST SOIC8 ANST SOIC28 ANST SOIC8-EP UTAC SOIC8 UTAC SOIC8-EP JCET SOIC8 JCET SOIC8-EP JCET SOIC16 ASE-KS SOIC8-EP ASE-KS SOIC8 4.2.1 Preconditioning MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP4012DS 1316 07-10-13 317 0 MP6922AGN 1311 07-18-13 300 0 MP157GS 1252 07-19-13 270 0 MP3398LGS 1309 07-23-13 274 0 MP3393EY 1313 09-11-13 100 0 MP3393EY 1313 09-11-13 100 0 MP6922AGN 1321 10-09-13 200 0 FA NO. The Future of Analog IC Technology® - 26 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP6922AGN 1325 10-09-13 200 0 MP1584EN 1314 09-11-13 200 0 MP3394SGS 139 10-09-13 200 0 MP1484EN 1330 09-26-13 200 0 Total FA NO. 0 SAT picture of SOIC T-SCAN PICTURE C-SCAN PICTURE 4.2.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP4012DS 1316 07-10-13 94 0 1000 MP3399EY 1311 07-24-13 47 0 1000 MP3399EY 1310 07-24-13 47 0 1000 MP6922AGN 1311 07-18-13 94 0 1000 MP157GS 1252 07-19-13 83 0 1000 MP3398LGS 1309 07-23-13 84 0 1000 MP3389EY 1311 07-24-13 47 0 1000 MP3389EY 1310 07-24-13 47 0 1000 MP6922AGN 1321 10-09-13 94 0 1000 MP3394SGS 139 10-09-13 94 0 1000 MP1484EN 1330 09-26-13 96 0 1000 HR1000HS 1226 08-29-13 50 0 100 FA NO. # of cycle MP020-5GS 1301 08-28-13 50 0 100 HR1000HS 1308 07-02-13 50 0 100 MP1482DN 1308 07-02-13 50 0 100 MP020-5GS 1309 08-28-13 50 0 100 MP020-5GS 1309 08-28-13 50 0 100 MP020-5GS 1309 08-28-13 50 0 100 The Future of Analog IC Technology® - 27 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP020-5GS 1309 08-28-13 50 0 100 MP4032-1GS 1312 08-28-13 50 0 100 FA NO. # of cycle MP1482DN 1315 08-16-13 50 0 100 MP020-5GS 1315 08-28-13 50 0 100 MP1482DN 1316 07-02-13 50 0 100 MP1410ES 1317 07-01-13 50 0 100 MP8705EN 1304 07-16-13 50 0 100 DAS09 1319 09-12-13 50 0 100 MP020-5GS 1319 08-28-13 50 0 100 MP020-5GS 1319 08-28-13 50 0 100 MP1484EN-C166 1321 07-10-13 50 0 100 MP2307DN 1320 07-01-13 50 0 100 DAS09 1323 07-02-13 50 0 100 MP3394SGS 1321 07-02-13 50 0 100 MP1482DN 1324 07-02-13 50 0 100 MP2467DN 1324 07-10-13 50 0 100 MP4030GS 1324 07-10-13 50 0 100 HF81GS 1316 07-01-13 50 0 100 MP1482DN 1324 07-02-13 50 0 100 MP020-5GS 1319 08-28-13 50 0 100 MP201DS 1325 07-04-13 50 0 100 DAS09 1323 07-02-13 50 0 100 MP020-5GS 1319 08-28-13 50 0 100 MP3394ES 1321 07-02-13 50 0 100 MP1482DN 1324 07-02-13 50 0 100 MP1482DN 1324 07-02-13 50 0 100 MP4032-1GS 1323 07-10-13 50 0 100 MP3394SGS 1322 07-10-13 50 0 100 MP3394ES 1321 07-10-13 50 0 100 MP24830HS 1312 07-18-13 50 0 100 MP3394ES 1321 07-10-13 50 0 100 HFC0300HS 1323 07-18-13 50 0 100 MP1583DN 1324 07-10-13 50 0 100 MP6002DN 1326 07-16-13 50 0 100 MP2307DN 1323 07-11-13 50 0 100 MP1583DN-C322 1324 07-11-13 50 0 100 MPQ4560DN 1313 08-07-13 50 0 100 MP1584EN 1324 07-11-13 50 0 100 MP3394SGS 1325 07-16-13 50 0 100 MP4030GS 1324 07-16-13 50 0 100 MP9415EN 1321 07-16-13 50 0 100 MP4030GS 1324 07-18-13 50 0 100 The Future of Analog IC Technology® - 28 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8670DN 1326 07-18-13 50 0 100 MP1484EN 1324 07-18-13 50 0 100 MP1482DS-C165 1327 07-18-13 50 0 100 MP3394SGS 1322 07-18-13 50 0 100 MP2303ADN 1325 07-18-13 50 0 100 MP1484EN 1326 07-18-13 50 0 100 CM500GS 1327 07-23-13 50 0 100 MP1482DS-C165 1327 07-25-13 50 0 100 MP62340DS-1 1326 07-30-13 50 0 100 MP3394SGS 1327 07-25-13 50 0 100 MP6211DN 1328 07-25-13 50 0 100 FA NO. # of cycle MP1584EN 1324 07-25-13 50 0 100 MP2303DN 1327 07-25-13 50 0 100 MP1591DN 1327 07-25-13 50 0 100 DAS09 1324 08-01-13 50 0 100 MP8001DS 1317 08-07-13 50 0 100 MPQ4559DN 1326 08-01-13 50 0 100 MP3398GS 1327 08-01-13 50 0 100 MP62340DS-1 1325 07-30-13 50 0 100 MP62341DS 1327 08-07-13 50 0 100 MP020-5GS 1319 08-28-13 50 0 100 MP8715DN 1325 08-07-13 50 0 100 MP1484EN-C166 1329 08-01-13 50 0 100 MPQ4559DN 1328 08-07-13 50 0 100 HR1000HS 1325 08-07-13 50 0 100 MP1482DS-C165 1327 08-01-13 50 0 100 MP8706EN 1325 08-07-13 50 0 100 MP020-5GS 1319 08-28-13 50 0 100 MP24830HS-C470H 1325 08-07-13 50 0 100 MP8708EN 1326 08-07-13 50 0 100 MP3394SGS 1328 08-07-13 50 0 100 DAS09 1326 08-07-13 50 0 100 MP1430DN 1327 08-07-13 50 0 100 MP020-5GS 1327 08-28-13 50 0 100 MP111DS 1329 08-07-13 50 0 100 MP9415EN 1327 08-07-13 50 0 100 MP2365DN 1329 08-14-13 50 0 100 MP020-5GS 1327 08-28-13 50 0 100 MP4031GS 1330 08-14-13 50 0 100 HF81GS 1329 08-14-13 50 0 100 MP4051GS 1325 08-14-13 50 0 100 MP24830HS-C470 1330 08-14-13 50 0 100 The Future of Analog IC Technology® - 29 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP9415EN 1327 08-14-13 50 0 100 MP020-5GS 1327 08-28-13 50 0 100 MP3394ES-C462 1326 08-14-13 50 0 100 MP4001DS 1331 08-14-13 50 0 100 MP2307DN 1324 08-14-13 50 0 100 CM3406DS 1330 08-16-13 50 0 100 MP1484EN-C166 1327 08-16-13 50 0 100 MP2495DS 1330 08-16-13 50 0 100 MP4001DS 1331 08-16-13 50 0 100 MP4012DS 1329 08-16-13 50 0 100 MP020-5GS 1328 08-28-13 50 0 100 FA NO. # of cycle MP3394SGS 1329 08-16-13 50 0 100 MP020-5GS 1330 08-28-13 50 0 100 MP4001DS 1332 08-20-13 50 0 100 MP1580HS 1325 08-20-13 50 0 100 MP24830HS-C470 1330 08-20-13 50 0 100 MP3394ES 1323 08-20-13 50 0 100 MP1484EN-C166 1327 08-23-13 50 0 100 HF81GS 1329 08-23-13 50 0 100 DAS09 1329 08-23-13 50 0 100 MP1584EN-C461 1329 08-23-13 50 0 100 MP62341DS 1332 08-23-13 50 0 100 MP201DS 1332 08-28-13 50 0 100 MP6002DN 1328 08-30-13 50 0 100 MP3394SGS 1329 08-28-13 50 0 100 MP2489DN-C504 1331 08-29-13 50 0 100 MP2396ES-C296 1333 08-30-13 50 0 100 CM500GS 1331 08-30-13 50 0 100 MP1588EN 1329 08-30-13 50 0 100 MP8001DS 1329 09-09-13 50 0 100 MP2374DS 1331 09-09-13 50 0 100 MP3398GS 1331 09-09-13 50 0 100 MP3394SGS 1333 09-10-13 50 0 100 MP4030AGS 1335 09-09-13 50 0 100 MP62340DS-1 1332 09-10-13 50 0 100 DAS09 1330 09-10-13 50 0 100 MP28317DS 1334 09-10-13 50 0 100 MP1430DN 1334 09-10-13 50 0 100 MPQ4559DN 1334 09-10-13 50 0 100 MP3394SGS 1332 09-10-13 50 0 100 MP1430DN 1334 09-18-13 50 0 100 MP3394SGS 1332 09-12-13 50 0 100 The Future of Analog IC Technology® - 30 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail CM500GS 1334 09-18-13 50 0 100 MP1482DS-C165 1335 09-13-13 50 0 100 FA NO. # of cycle DAS09 1330 09-18-13 50 0 100 MP2403DN 1334 09-23-13 50 0 100 MP3389EY 1311 09-23-13 50 0 100 MP3389EY 1311 09-23-13 50 0 100 MP3389EY 1311 09-23-13 50 0 100 MP3394SGY 1317 09-23-13 50 0 100 MP3394SGY 1313 09-23-13 50 0 100 MP3399EY 1251 09-23-13 50 0 100 MP3399EY 1310 09-23-13 50 0 100 MP3399EY 1315 09-23-13 50 0 100 MP3394SGS 1333 09-18-13 50 0 100 MPGC01DN 1332 09-18-13 50 0 100 MP8706EN 1325 09-23-13 50 0 100 MP4001DS 1336 09-23-13 50 0 100 HF81GS 1332 09-23-13 50 0 100 MP62351ES 1336 09-23-13 50 0 100 DAS09 1333 09-26-13 50 0 100 MP020-5GS 1335 09-26-13 50 0 100 MP3394SGS 1332 09-26-13 50 0 100 MP3394ES-C462 1335 09-26-13 50 0 100 MP3394ES-C462 1335 09-26-13 50 0 100 MP8001DS 1336 09-26-13 50 0 100 MP020-5GS 1336 09-26-13 50 0 100 Total 0 4.2.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP4012DS 1316 07-10-13 97 0 168 MP3399EY 1311 07-24-13 47 0 168 FA NO. # of hrs MP3399EY 1310 07-24-13 47 0 168 MP6922AGN 1311 07-18-13 97 0 168 MP157GS 1252 07-19-13 87 0 168 MP3398LGS 1309 07-23-13 87 0 168 MP3389EY 1311 07-24-13 47 0 168 MP3389EY 1310 07-24-13 47 0 168 MP6922AGN 1321 10-09-13 97 1 MP6922AGN 1325 10-09-13 97 0 7357 168 168 The Future of Analog IC Technology® - 31 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1584EN 1314 09-11-13 97 0 168 MP3394SGS 139 10-09-13 97 0 168 FA NO. # of hrs MP1484EN 1330 09-26-13 97 0 168 HR1000HS 1226 08-29-13 50 0 48 MP020-5GS 1301 08-28-13 50 0 48 HR1000HS 1308 07-02-13 50 0 48 MP1482DN 1308 07-02-13 50 0 48 MP020-5GS 1309 08-28-13 50 0 48 MP020-5GS 1309 08-28-13 50 0 48 MP020-5GS 1309 08-28-13 50 0 48 MP020-5GS 1309 08-28-13 50 0 48 MP4032-1GS 1312 08-28-13 50 0 48 MP1482DN 1315 08-16-13 50 0 48 MP020-5GS 1315 08-28-13 50 0 48 MP1482DN 1316 07-02-13 50 0 48 MP1410ES 1317 07-01-13 50 0 48 MP8705EN 1304 07-16-13 50 0 48 DAS09 1319 09-12-13 50 0 48 MP020-5GS 1319 08-28-13 50 0 48 MP020-5GS 1319 08-28-13 50 0 48 MP1484EN-C166 1321 07-10-13 50 0 48 MP2307DN 1320 07-01-13 50 0 48 DAS09 1323 07-02-13 50 0 48 MP3394SGS 1321 07-02-13 50 0 48 MP1482DN 1324 07-02-13 50 0 48 MP2467DN 1324 07-10-13 50 0 48 MP4030GS 1324 07-10-13 50 0 48 HF81GS 1316 07-01-13 50 0 48 MP1482DN 1324 07-02-13 50 0 48 MP020-5GS 1319 08-28-13 50 0 48 MP201DS 1325 07-04-13 50 0 48 DAS09 1323 07-02-13 50 0 48 MP020-5GS 1319 08-28-13 50 0 48 MP3394ES 1321 07-02-13 50 0 48 MP1482DN 1324 07-02-13 50 0 48 MP1482DN 1324 07-02-13 50 0 48 MP4032-1GS 1323 07-10-13 50 0 48 MP3394SGS 1322 07-10-13 50 0 48 MP3394ES 1321 07-10-13 50 0 48 MP24830HS 1312 07-18-13 50 0 48 MP3394ES 1321 07-10-13 50 0 48 HFC0300HS 1323 07-18-13 50 0 48 The Future of Analog IC Technology® - 32 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1583DN 1324 07-10-13 50 0 48 MP6002DN 1326 07-16-13 50 0 48 FA NO. # of hrs MP2307DN 1323 07-11-13 50 0 48 MP1583DN-C322 1324 07-11-13 50 0 48 MPQ4560DN 1313 08-07-13 50 0 48 MP1584EN 1324 07-11-13 50 0 48 MP3394SGS 1325 07-16-13 50 0 48 MP4030GS 1324 07-16-13 50 0 48 MP9415EN 1321 07-16-13 50 0 48 MP4030GS 1324 07-18-13 50 0 48 MP8670DN 1326 07-18-13 50 0 48 MP1484EN 1324 07-18-13 50 0 48 MP1482DS-C165 1327 07-18-13 50 0 48 MP3394SGS 1322 07-18-13 50 0 48 MP2303ADN 1325 07-18-13 50 0 48 MP1484EN 1326 07-18-13 50 0 48 CM500GS 1327 07-23-13 50 0 48 MP1482DS-C165 1327 07-25-13 50 0 48 MP62340DS-1 1326 07-30-13 50 0 48 MP3394SGS 1327 07-25-13 50 0 48 MP6211DN 1328 07-25-13 50 0 48 MP1584EN 1324 07-25-13 50 0 48 MP2303DN 1327 07-25-13 50 0 48 MP1591DN 1327 07-25-13 50 0 48 DAS09 1324 08-01-13 50 0 48 MP8001DS 1317 08-07-13 50 0 48 MPQ4559DN 1326 08-01-13 50 0 48 MP3398GS 1327 08-01-13 50 0 48 MP62340DS-1 1325 07-30-13 50 0 48 MP62341DS 1327 08-07-13 50 0 48 MP020-5GS 1319 08-28-13 50 0 48 MP8715DN 1325 08-07-13 50 0 48 MP1484EN-C166 1329 08-01-13 50 0 48 MPQ4559DN 1328 08-07-13 50 0 48 HR1000HS 1325 08-07-13 50 0 48 MP1482DS-C165 1327 08-01-13 50 0 48 MP8706EN 1325 08-07-13 50 0 48 MP020-5GS 1319 08-28-13 50 0 48 MP24830HS-C470H 1325 08-07-13 50 0 48 MP8708EN 1326 08-07-13 50 0 48 MP3394SGS 1328 08-07-13 50 0 48 DAS09 1326 08-07-13 50 0 48 The Future of Analog IC Technology® - 33 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1430DN 1327 08-07-13 50 0 48 MP020-5GS 1327 08-28-13 50 0 48 FA NO. # of hrs MP111DS 1329 08-07-13 50 0 48 MP9415EN 1327 08-07-13 49 0 48 MP2365DN 1329 08-14-13 46 0 48 MP020-5GS 1327 08-28-13 50 0 48 MP4031GS 1330 08-14-13 50 0 48 HF81GS 1329 08-14-13 50 0 48 MP4051GS 1325 08-14-13 50 0 48 MP24830HS-C470 1330 08-14-13 50 0 48 MP9415EN 1327 08-14-13 50 0 48 MP020-5GS 1327 08-28-13 50 0 48 MP3394ES-C462 1326 08-14-13 50 0 48 MP4001DS 1331 08-14-13 50 0 48 MP2307DN 1324 08-14-13 50 0 48 CM3406DS 1330 08-16-13 50 0 48 MP1484EN-C166 1327 08-16-13 50 0 48 MP2495DS 1330 08-16-13 50 0 48 MP4001DS 1331 08-16-13 50 0 48 MP4012DS 1329 08-16-13 50 0 48 MP020-5GS 1328 08-28-13 50 0 48 MP3394SGS 1329 08-16-13 50 0 48 MP020-5GS 1330 08-28-13 50 0 48 MP4001DS 1332 08-20-13 50 0 48 MP1580HS 1325 08-20-13 50 0 48 MP24830HS-C470 1330 08-20-13 50 0 48 MP3394ES 1323 08-20-13 50 0 48 MP1484EN-C166 1327 08-23-13 50 0 48 HF81GS 1329 08-23-13 50 0 48 DAS09 1329 08-23-13 50 0 48 MP1584EN-C461 1329 08-23-13 50 0 48 MP62341DS 1332 08-23-13 50 0 48 MP201DS 1332 08-28-13 50 0 48 MP6002DN 1328 08-30-13 50 0 48 MP3394SGS 1329 08-28-13 50 0 48 MP2489DN-C504 1331 08-29-13 50 0 48 MP2396ES-C296 1333 08-30-13 50 0 48 CM500GS 1331 08-30-13 50 0 48 MP1588EN 1329 08-30-13 50 0 48 MP8001DS 1329 09-09-13 50 0 48 MP2374DS 1331 09-09-13 50 0 48 MP3398GS 1331 09-09-13 50 0 48 The Future of Analog IC Technology® - 34 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP3394SGS 1333 09-10-13 50 0 48 MP4030AGS 1335 09-09-13 50 0 48 MP62340DS-1 1332 09-10-13 50 0 48 DAS09 1330 09-10-13 50 0 48 MP28317DS 1334 09-10-13 50 0 48 MP1430DN 1334 09-10-13 50 0 48 MPQ4559DN 1334 09-10-13 50 0 48 MP3394SGS 1332 09-10-13 50 0 48 FA NO. # of hrs MP1430DN 1334 09-18-13 50 0 48 MP3394SGS 1332 09-12-13 50 0 48 CM500GS 1334 09-18-13 50 0 48 MP1482DS-C165 1335 09-13-13 50 0 48 DAS09 1330 09-18-13 50 0 48 MP2403DN 1334 09-23-13 50 0 48 MP3389EY 1311 09-23-13 50 0 48 MP3389EY 1311 09-23-13 50 0 48 MP3389EY 1311 09-23-13 50 0 48 MP3394SGY 1317 09-23-13 50 0 48 MP3394SGY 1313 09-23-13 50 0 48 MP3399EY 1251 09-23-13 50 0 48 MP3399EY 1310 09-23-13 50 0 48 MP3399EY 1315 09-23-13 50 0 48 MP3394SGS 1333 09-18-13 50 0 48 MPGC01DN 1332 09-18-13 50 0 48 MP8706EN 1325 09-23-13 50 0 48 MP4001DS 1336 09-23-13 50 0 48 HF81GS 1332 09-23-13 50 0 48 MP62351ES 1336 09-23-13 50 0 48 DAS09 1333 09-26-13 50 0 48 MP020-5GS 1335 09-26-13 50 0 48 MP3394SGS 1332 09-26-13 50 0 48 MP3394ES-C462 1335 09-26-13 50 0 48 MP3394ES-C462 1335 09-26-13 50 0 48 MP8001DS 1336 09-26-13 50 0 48 MP020-5GS 1336 09-26-13 50 0 48 Total 1 The Future of Analog IC Technology® - 35 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT 4.2.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C Close Date Sample Size # of Fail MP4012DS 1316 07-10-13 80 0 MP3398LGS 1309 07-23-13 80 0 Total FA NO. 0 4.3 MSOP The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD MSOP8 ANST MSOP8-EP UCD MSOP10-EP ANST MSOP10 UCD MSOP10 ANST MSOP10-EP ANST MSOP8 4.3.1 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP1412DH 1322 07-01-13 50 0 100 MP1542DK 1324 07-10-13 50 0 100 MP2481DH 1325 07-11-13 50 0 100 FA NO. # of cycle MP2270DH-C334 1326 07-11-13 50 0 100 MP20073DH 1325 07-18-13 50 0 100 MP6211DH 1326 07-18-13 50 0 100 MP3213DH 1326 07-18-13 50 0 100 MP2105DK 1322 07-23-13 50 0 100 MP1542DK-C472 1325 07-23-13 50 0 100 MP3900DK 1327 07-25-13 50 0 100 MP1542DK 1324 07-30-13 50 0 100 MP2105DK 1244 08-07-13 50 0 100 MP2105DK 1227 08-07-13 50 0 100 MP2270DH-C334 1328 08-07-13 50 0 100 MP1542DK 1329 08-16-13 50 0 100 MP1542DK-C472 1331 08-23-13 50 0 100 MP2481DH 1330 08-28-13 50 0 100 MP1411DH 1334 09-09-13 50 0 100 MP1542DK 1333 09-09-13 50 0 100 The Future of Analog IC Technology® - 36 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2106DK-C103 1326 09-18-13 50 0 100 MP1412DH 1326 09-18-13 50 0 100 FA NO. # of cycle MP1542DK 1335 09-18-13 50 0 100 MP2905EK 1316 09-26-13 50 0 100 Total 0 4.3.2Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP1412DH 1322 07-01-13 50 0 48 MP1542DK 1324 07-10-13 50 0 48 MP2481DH 1325 07-11-13 50 0 48 FA NO. # of hrs MP2270DH-C334 1326 07-11-13 50 0 48 MP20073DH 1325 07-18-13 50 0 48 MP6211DH 1326 07-18-13 50 0 48 MP3213DH 1326 07-18-13 50 0 48 MP2105DK 1322 07-23-13 50 0 48 MP1542DK-C472 1325 07-23-13 50 0 48 MP3900DK 1327 07-25-13 50 0 48 MP1542DK 1324 07-30-13 50 0 48 MP2105DK 1244 08-07-13 50 0 48 MP2105DK 1227 08-07-13 50 0 48 MP2270DH-C334 1328 08-07-13 50 0 48 MP1542DK 1329 08-16-13 50 0 48 MP1542DK-C472 1331 08-23-13 50 0 48 MP2481DH 1330 08-28-13 50 0 48 MP1411DH 1334 09-09-13 50 0 48 MP1542DK 1333 09-09-13 50 0 48 MP2106DK-C103 1326 09-18-13 50 0 48 MP1412DH 1326 09-18-13 50 0 48 MP1542DK 1335 09-18-13 50 0 48 MP2905EK 1316 09-26-13 50 0 48 Total 0 The Future of Analog IC Technology® - 37 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT 4.4 TSOT The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE ANST TSOT23-5 JCET TSOT23-5 ASNT TSOT23-6 JCET TSOT23-6 ASNT TSOT23-8 JCET TSOT23-8 4.4.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device Close Date D/C MPQ2459GJ-ACQ100 1243 Sample Size # of Fail 07-24-13 260 0 MP3410DJ 1315 10-09-13 205 0 MP2359DJ 1325 10-09-13 200 0 Total FA NO. 0 SAT picture of TSOT T-SCAN PICTURE C-SCAN PICTURE 4.4.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP3217DJ 1250 07-20-13 80 0 1000 MPQ2459GJ-ACQ100 1243 07-24-13 84 0 1000 97 0 1000 MP2359DJ 1325 10-09-13 FA NO. # of cycle MP3302DJ 1306 07-02-13 50 0 100 MP8903DJ-3.3 1305 07-10-13 50 0 100 MP3120DJ 1315 08-15-13 50 0 100 The Future of Analog IC Technology® - 38 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8903DJ-3.3 1314 07-16-13 50 0 100 MP8903DJ-3.3 1218 09-02-13 50 0 100 FA NO. # of cycle MP3217DJ 1314 08-15-13 50 0 100 MP8903DJ-3.3 1319 09-23-13 50 0 100 MP2359DJ 1322 07-01-13 50 0 100 MP3217DJ 1322 07-01-13 50 0 100 MP8801DJ-2.85 1321 07-01-13 50 0 100 MP2451DT 1323 07-02-13 50 0 100 MP1541DJ 1318 07-03-13 50 0 100 MP62055EJ 1322 07-02-13 50 0 100 MP6400DJ-33 1323 07-10-13 50 0 100 MP1469GJ 1323 07-10-13 50 0 100 MP3301GJ 1319 07-10-13 50 0 100 MP1541DJ 1325 07-10-13 100 0 100 MP3217DJ 1323 07-10-13 50 0 100 MPQ8903DJ-3.3 1323 09-10-13 50 0 100 MP62055EJ 1325 07-16-13 50 0 100 MP3217DJ 1322 07-16-13 50 0 100 MP6400DJ-01 1323 07-18-13 50 0 100 MP3302DJ-C136 1327 07-18-13 50 0 100 MP3410DJ 1327 07-18-13 50 0 100 MP3217DJ 1327 07-25-13 50 0 100 MP24893DJ 1327 07-25-13 100 0 100 MP2451DT 1327 07-30-13 50 0 100 MP3217DJ 1328 08-01-13 50 0 100 MP3301GJ 1330 08-07-13 50 0 100 MP3217DJ 1328 08-14-13 50 0 100 MP3217DJ 1329 08-14-13 50 0 100 MP3301GJ 1330 08-14-13 50 0 100 MP2370DJ 1329 08-14-13 50 0 100 MPQ8903DJ-3.3 1329 09-18-13 50 0 100 MP8903DJ-3.3 1328 08-28-13 50 0 100 MP3217DJ 1330 08-16-13 50 0 100 MP3217DJ 1330 08-20-13 50 0 100 MP2112DJ 1329 08-20-13 50 0 100 MP2357DT 1330 08-23-13 50 0 100 MP1541DJ 1329 08-29-13 50 0 100 MP2259DJ 1329 08-29-13 50 0 100 MP3217DJ 1330 08-29-13 48 0 100 MP1469GJ 1331 08-29-13 50 0 100 MP1541DJ 1329 09-05-13 50 0 100 MP3217DJ 1329 09-05-13 50 0 100 The Future of Analog IC Technology® - 39 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP3301GJ 1333 09-09-13 50 0 100 MPQ20056GJ-33-AEC 1321 09-09-13 50 0 100 FA NO. # of cycle MP6400DJ-01 1334 09-10-13 50 0 100 MP3217DJ 1330 09-26-13 50 0 100 MP2359DJ 1331 09-26-13 50 0 100 MP2104DJ 1330 09-26-13 50 0 100 Total 0 4.4.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C MPQ2459GJ-ACQ100 1243 Close Date Sample Size # of Fail 07-24-13 87 0 168 FA NO. # of hrs MP3410DJ 1315 10-09-13 97 0 168 MP2359DJ 1325 10-09-13 97 0 168 MP3302DJ 1306 07-02-13 50 0 48 MP8903DJ-3.3 1305 07-10-13 50 0 48 MP3120DJ 1315 08-15-13 50 0 48 MP8903DJ-3.3 1314 07-16-13 50 0 48 MP8903DJ-3.3 1218 09-02-13 50 0 48 MP3217DJ 1314 08-15-13 50 0 48 MP8903DJ-3.3 1319 09-23-13 50 0 48 MP2359DJ 1322 07-01-13 50 0 48 MP3217DJ 1322 07-01-13 50 0 48 MP8801DJ-2.85 1321 07-01-13 50 0 48 MP2451DT 1323 07-02-13 50 0 48 MP1541DJ 1318 07-03-13 50 0 48 MP62055EJ 1322 07-02-13 50 0 48 MP6400DJ-33 1323 07-10-13 50 0 48 MP1469GJ 1323 07-10-13 50 0 48 MP3301GJ 1319 07-10-13 50 0 48 MP1541DJ 1325 07-10-13 100 0 48 MP3217DJ 1323 07-10-13 50 0 48 MPQ8903DJ-3.3 1323 09-10-13 50 0 48 MP62055EJ 1325 07-16-13 50 0 48 MP3217DJ 1322 07-16-13 50 0 48 MP6400DJ-01 1323 07-18-13 50 0 48 MP3302DJ-C136 1327 07-18-13 50 0 48 MP3410DJ 1327 07-18-13 50 0 48 MP3217DJ 1327 07-25-13 50 0 48 MP24893DJ 1327 07-25-13 50 0 48 The Future of Analog IC Technology® - 40 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2451DT 1327 07-30-13 50 0 48 MP3217DJ 1328 08-01-13 50 0 48 MP3301GJ 1330 08-07-13 50 0 48 MP3217DJ 1328 08-14-13 50 0 48 MP3217DJ 1329 08-14-13 50 0 48 MP3301GJ 1330 08-14-13 50 0 48 FA NO. # of hrs MP2370DJ 1329 08-14-13 50 0 48 MPQ8903DJ-3.3 1329 09-18-13 50 0 48 MP8903DJ-3.3 1328 08-28-13 50 0 48 MP3217DJ 1330 08-16-13 50 0 48 MP3217DJ 1330 08-20-13 50 0 48 MP2112DJ 1329 08-20-13 50 0 48 MP2357DT 1330 08-23-13 50 0 48 MP1541DJ 1329 08-29-13 50 0 48 MP2259DJ 1329 08-29-13 50 0 48 MP3217DJ 1330 08-29-13 50 0 48 MP1469GJ 1331 08-29-13 50 0 48 MP1541DJ 1329 09-05-13 50 0 48 MP3217DJ 1329 09-05-13 50 0 48 MP3301GJ 1333 09-09-13 50 0 48 MPQ20056GJ-AEC1 1321 09-09-13 50 0 48 MP6400DJ-01 1334 09-10-13 50 0 48 MP3217DJ 1330 09-26-13 50 0 48 MP2359DJ 1331 09-26-13 50 0 48 MP2104DJ 1330 09-26-13 50 0 48 Total 0 4.4.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C MPQ2459GJ-ACQ100 1243 MP3410DJ 1315 Close Date Sample Size # of Fail 07-24-13 80 0 10-09-13 99 0 Total FA NO. 0 The Future of Analog IC Technology® - 41 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT 4.5 TSSOP The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD TSSOP20 ASNT TSSOP16-EP UCD TSSOP20-EP ASNT TSSOP20 ASNT TSSOP8 ASNT TSSOP20-EP ASNT TSSOP14 ASNT TSSOP24 ASNT TSSOP16 ASNT TSSOP28 ASNT TSSOP28-EP JCET TSSOP8 4.5.1 Preconditioning MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP3398GF 1238 07-10-13 270 0 MP3389EF 1315 07-25-13 200 0 MP3391EF 1324 10-09-13 200 0 Total FA NO. 0 SAT picture of TSSOP T-SCAN PICTURE C-SCAN PICTURE 4.5.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP3398GF 1238 07-10-13 84 0 1000 MP3389EF 1315 07-25-13 97 0 1000 FA NO. # of cycle MP3391EF 1324 10-09-13 97 0 1000 MP3394EF 1316 07-01-13 50 0 100 The Future of Analog IC Technology® - 42 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT # of cycle Device D/C Close Date Sample Size # of Fail MP3394EF 1316 07-01-13 50 0 100 MP8126DF 1322 07-02-13 50 0 100 MP3389EF 1319 07-02-13 50 0 100 MP8125EF 1325 07-10-13 50 0 100 MP6507GF 1323 07-16-13 50 0 100 MP7731DF 1321 07-10-13 50 0 100 MP3389EF 1324 07-16-13 50 0 100 MP3389EF 1316 07-25-13 50 0 100 FA NO. MP3394EF 1325 07-25-13 50 0 100 MP6505DM 1328 07-30-13 50 0 100 MP2364DF 1328 08-14-13 50 0 100 MP2364DF 1329 08-14-13 50 0 100 MP8126DF 1327 08-14-13 50 0 100 MP7731DF 1330 08-20-13 50 0 100 MP8126DF 1328 08-16-13 50 0 100 MP3394EF 1331 08-20-13 50 0 100 MP8125EF 1330 08-23-13 50 0 100 MP3394EF 1333 09-05-13 50 0 100 MP8126DF 1332 09-09-13 50 0 100 Total 0 4.5.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP3398GF 1238 07-10-13 84 0 168 MP3389EF 1315 07-25-13 97 0 168 MP3391EF 1324 10-09-13 97 0 168 MP3394EF 1316 07-01-13 50 0 48 MP3394EF 1316 07-01-13 50 0 48 MP8126DF 1322 07-02-13 50 0 48 MP3389EF 1319 07-02-13 50 0 48 FA NO. # of hrs MP8125EF 1325 07-10-13 50 0 48 MP6507GF 1323 07-16-13 50 0 48 MP7731DF 1321 07-10-13 50 0 48 MP3389EF 1324 07-16-13 50 0 48 MP3389EF 1316 07-25-13 50 0 48 MP3394EF 1325 07-25-13 50 0 48 MP6505DM 1328 07-30-13 50 0 48 MP2364DF 1328 08-14-13 50 0 48 MP2364DF 1329 08-14-13 50 0 48 The Future of Analog IC Technology® - 43 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8126DF 1327 08-14-13 50 0 48 MP7731DF 1330 08-20-13 50 0 48 MP8126DF 1328 08-16-13 50 0 48 MP3394EF 1331 08-20-13 50 0 48 MP8125EF 1330 08-23-13 50 0 48 MP3394EF 1333 09-05-13 50 0 48 MP8126DF 1332 09-09-13 50 0 48 Total FA NO. # of hrs 0 4.5.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C Close Date Sample Size # of Fail MP3398GF 1238 07-10-13 90 0 Total FA NO. 0 4.6 FLIP CHIP-QFN The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD FCQFN1*1.5 UTAC FCQFN2*2 UCD FCQFN1.5*2 UTAC FCQFN2*3 UCD FCQFN2*2 UTAC FCQFN3*3 UCD FCQFN2*3 UTAC FCQFN3*4 UCD FCQFN3*3 UTAC FCQFN4*4 UCD FCQFN3*4 UTAC FCQFN4*5 UCD FCQFN3*5 UTAC FCQFN4*6 UCD FCQFN4*4 UTAC FCQFN5*5 UCD FCQFN4*5 UTAC FCQFN5*6 UCD FCQFN4*6 UTAC FCQFN6*6 4.6.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP8736DL 1312 07-02-13 80 0 MP8736DL 1312 07-02-13 80 0 MP8736DL 1316 07-12-13 85 0 MP8763GLE 1312 07-02-13 200 0 MP8736DL 1317 07-25-13 80 0 MPQ4470GL-AEC1 1237 07-24-13 296 0 FA NO. The Future of Analog IC Technology® - 44 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MPQ4470GL-AEC1 1247 07-22-13 350 0 MPQ4470GL-AEC1 1249 07-22-13 382 0 MP8620ADQK 1314 07-24-13 200 0 MP5506GL 1230 07-19-13 271 0 MP2625GL 1304 07-31-13 271 0 MP8843GG-JC 1308 09-03-13 300 0 MP8736DL 1249 09-09-13 100 0 MP8736DL 1249 09-09-13 100 0 NB675GL 1311 10-09-13 203 0 MPM3810GQB 1305 09-18-13 270 0 MPM3805GQB 1315 09-18-13 95 0 MPM3805GQB 1315 09-18-13 95 0 NB675GL 1311 10-09-13 102 0 MPM3805GQB 1305 09-18-13 98 0 MPM3810GQB-E 1329 09-16-13 190 0 MPM3810GQB-12 1329 09-16-13 200 0 MPM3810GQB-18 1329 09-16-13 200 0 MP28251GD 1330 10-08-13 302 0 NB677GQ 1331 10-12-13 400 0 MP2617GL 1329 09-05-13 47 0 MP2617GL 1331 09-05-13 49 0 MP2617GL 1329 09-10-13 47 0 MP2617GL 1332 09-10-13 49 0 MP2617GL 1333 09-27-13 49 0 MP2617GL 1333 09-27-13 47 0 Total FA NO. 0 SAT picture of FLIP CHIP-QFN T-SCAN PICTURE C-SCAN PICTURE The Future of Analog IC Technology® - 45 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT 4.6.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP28258DD 1227 07-05-13 50 0 1000 MP28258DD 1229 07-05-13 50 0 1000 MPQ8632GL-10 1243 07-05-13 47 0 1000 FA NO. # of cycle MPQ8632GL-10 1247 07-05-13 47 0 1000 NB675GL 1311 07-16-13 47 0 1000 NB675GL 1311 07-16-13 47 0 1000 MP8736DL 1308 07-12-13 97 0 1000 MP8763GLE 1312 07-02-13 94 0 1000 MP28258DD 1214 07-10-13 48 0 1000 MP28258DD 1218 07-10-13 50 0 1000 NB671GQ 1313 07-24-13 46 0 1000 NB671GQ 1313 07-24-13 45 0 1000 MPQ4470GL-AEC1 1237 07-24-13 92 0 1000 MPQ4470GL-AEC1 1247 07-22-13 84 0 1000 MPQ4470GL-AEC1 1249 07-22-13 84 0 1000 MP5506GL 1230 07-19-13 84 0 1000 MP8736DL 1303 07-31-13 97 0 1000 MP8736DL 1303 07-31-13 97 0 1000 MP2625GL 1304 07-31-13 84 0 1000 MP8843GG-JC 1308 09-03-13 93 0 1000 MP8736DL 1249 09-09-13 50 0 1000 MP8736DL 1249 09-09-13 50 0 1000 NB675GL 1311 10-09-13 94 0 1000 MP86884DQKT 1311 09-18-13 50 0 1000 MP86884DQKT 1311 09-18-13 50 0 1000 MP2617AGL 1325 10-09-13 47 0 1000 MP2617AGL 1319 10-09-13 47 0 1000 MP28259DD 1318 10-09-13 46 0 1000 MP28259DD 1321 10-09-13 46 0 1000 MPM3810GQB-E 1329 09-16-13 94 0 1000 MPM3810GQB-12 1329 09-16-13 94 0 1000 MPM3810GQB-18 1329 09-16-13 94 0 1000 MP28251GD 1330 10-08-13 94 0 1000 NB677GQ 1331 10-12-13 94 0 1000 NB675GL 1302 07-01-13 44 0 1000 NB675GL 1302 07-01-13 50 0 1000 NB675GL 1248 07-02-13 45 0 1000 NB675GL 1251 07-01-13 46 0 1000 NB675GL 1241 07-02-13 48 0 1000 The Future of Analog IC Technology® - 46 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail NB675GL 1305 07-02-13 48 0 1000 NB675GL 1304 07-15-13 50 0 1000 NB675GL 1305 07-15-13 50 0 1000 NB675GL 1305 07-01-13 50 0 1000 NB675GL 1305 07-01-13 44 0 1000 NB675GL 1309 07-01-13 50 0 1000 NB675GL 1309 07-01-13 50 0 1000 NB675GL 1314 07-16-13 47 0 1000 NB675GL 1314 07-16-13 47 0 1000 NB675GL 1311 07-25-13 47 0 1000 MPQ8636GL-10 1251 07-03-13 50 0 100 FA NO. # of cycle NB675GL 1301 07-02-13 50 0 100 MPQ8632GL-8 1251 07-03-13 50 0 100 NB671GQ 1302 07-02-13 50 0 100 NB671GQ 1302 07-02-13 50 0 100 MPQ8636GL-10 1301 07-03-13 50 0 100 MPQ8632GL-10 1251 07-03-13 50 0 100 NB670GQ 1302 08-30-13 50 0 100 NB671GQ 1304 07-01-13 50 0 100 NB670GQ 1304 07-01-13 50 0 100 NB670GQ 1304 07-01-13 50 0 100 NB671AGQ 1304 07-01-13 50 0 100 NB671AGQ 1301 07-02-13 50 0 100 NB675GL 1301 07-01-13 50 0 100 NB671AGQ 1302 07-01-13 50 0 100 NB670GQ 1302 07-01-13 50 0 100 NB671GQ 1304 07-02-13 50 0 100 NB669GQ 1305 07-01-13 50 0 100 MPQ8612GL-12 1247 07-03-13 50 0 100 MPQ8636GL-10 1302 07-03-13 50 0 100 MPQ8632GL-8 1302 07-03-13 50 0 100 NB669GQ 1305 07-01-13 50 0 100 NB669GQ 1305 07-01-13 50 0 100 NB669GQ 1305 07-01-13 50 0 100 NB671GQ 1305 07-01-13 50 0 100 NB671AGQ 1305 07-01-13 50 0 100 NB670GQ 1305 07-01-13 50 0 100 NB671GQ 1305 07-01-13 50 0 100 MP2617GL 1306 09-10-13 50 0 100 NB669GQ 1307 07-01-13 50 0 100 NB671GQ 1307 07-01-13 50 0 100 NB671GQ 1305 07-01-13 50 0 100 The Future of Analog IC Technology® - 47 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail NB675GL 1305 07-02-13 48 0 1000 NB675GL 1304 07-15-13 50 0 1000 NB675GL 1305 07-15-13 50 0 1000 NB675GL 1305 07-01-13 50 0 1000 NB675GL 1305 07-01-13 44 0 1000 NB675GL 1309 07-01-13 50 0 1000 NB675GL 1309 07-01-13 50 0 1000 NB675GL 1314 07-16-13 47 0 1000 NB675GL 1314 07-16-13 47 0 1000 NB675GL 1311 07-25-13 47 0 1000 MPQ8636GL-10 1251 07-03-13 50 0 100 FA NO. # of cycle NB675GL 1301 07-02-13 50 0 100 MPQ8632GL-8 1251 07-03-13 50 0 100 NB671GQ 1302 07-02-13 50 0 100 NB671GQ 1302 07-02-13 50 0 100 MPQ8636GL-10 1301 07-03-13 50 0 100 MPQ8632GL-10 1251 07-03-13 50 0 100 NB670GQ 1302 08-30-13 50 0 100 NB671GQ 1304 07-01-13 50 0 100 NB670GQ 1304 07-01-13 50 0 100 NB670GQ 1304 07-01-13 50 0 100 NB671AGQ 1304 07-01-13 50 0 100 NB671AGQ 1301 07-02-13 50 0 100 NB675GL 1301 07-01-13 50 0 100 NB671AGQ 1302 07-01-13 50 0 100 NB670GQ 1302 07-01-13 50 0 100 NB671GQ 1304 07-02-13 50 0 100 NB669GQ 1305 07-01-13 50 0 100 MPQ8612GL-12 1247 07-03-13 50 0 100 MPQ8636GL-10 1302 07-03-13 50 0 100 MPQ8632GL-8 1302 07-03-13 50 0 100 NB669GQ 1305 07-01-13 50 0 100 NB669GQ 1305 07-01-13 50 0 100 NB669GQ 1305 07-01-13 50 0 100 NB671GQ 1305 07-01-13 50 0 100 NB671AGQ 1305 07-01-13 50 0 100 NB670GQ 1305 07-01-13 50 0 100 NB671GQ 1305 07-01-13 50 0 100 MP2617GL 1306 09-10-13 50 0 100 NB669GQ 1307 07-01-13 50 0 100 NB671GQ 1307 07-01-13 50 0 100 NB671GQ 1305 07-01-13 50 0 100 The Future of Analog IC Technology® - 48 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail NB670GQ 1307 07-01-13 50 0 100 NB671GQ 1307 07-01-13 50 0 100 FA NO. # of cycle MPQ8616GL-12 1303 07-03-13 50 0 100 NB671GQ 1307 07-01-13 50 0 100 NB671GQ 1307 07-01-13 50 0 100 MPQ8636GL-10 1302 07-03-13 50 0 100 MPQ8632GL-6 1308 07-03-13 50 0 100 MPQ8632GL-8 1308 07-03-13 50 0 100 NB671GQ 1309 07-01-13 50 0 100 MPQ8616GL-12 1305 07-03-13 50 0 100 MPQ8632GL-12 1302 07-03-13 50 0 100 MPQ8632GL-4 1305 07-03-13 50 0 100 NB669GQ 1309 07-01-13 50 0 100 NB670GQ 1310 07-26-13 50 0 100 NB671GQ 1309 07-01-13 50 0 100 MPQ8632GL-10 1251 07-03-13 50 0 100 NB671GQ 1307 07-01-13 50 0 100 NB671GQ 1308 07-02-13 50 0 100 NB671GQ 1307 07-01-13 50 0 100 NB669GQ 1310 07-01-13 50 0 100 NB670GQ 1309 07-02-13 50 0 100 MPQ8632GL-6 1310 07-03-13 50 0 100 MPQ8632GL-6 1309 07-03-13 50 0 100 MP2617GL 1311 09-10-13 50 0 100 NB670GQ 1309 08-30-13 50 0 100 NB669GQ 1310 07-01-13 50 0 100 NB669GQ 1310 07-01-13 50 0 100 NB670GQ 1309 07-01-13 50 0 100 NB671AGQ 1304 07-01-13 50 0 100 NB669GQ 1310 07-01-13 50 0 100 NB671AGQ 1305 07-01-13 50 0 100 NB671GQ 1313 07-02-13 50 0 100 NB670GQ 1310 07-01-13 50 0 100 MPQ4470GL 1249 07-02-13 50 0 100 NB669GQ 1309 07-02-13 50 0 100 NB670GQ 1309 07-01-13 50 0 100 NB671GQ 1307 07-01-13 50 0 100 MPQ8612GL-12 1308 07-03-13 50 0 100 MPQ8632GL-12 1312 07-03-13 50 0 100 NB669GQ 1309 07-01-13 50 0 100 MP2617GL 1311 09-10-13 50 0 100 NB669GQ 1309 07-01-13 50 0 100 The Future of Analog IC Technology® - 49 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MPQ8632GL-8 1311 07-03-13 50 0 100 NB671GQ 1307 07-01-13 50 0 100 NB669GQ 1314 07-01-13 50 0 100 NB670GQ 1307 07-01-13 50 0 100 NB675GL 1314 07-16-13 50 0 100 NB670GQ 1310 07-01-13 50 0 100 MP2130DG-C423 1304 09-12-13 50 0 100 MPQ8632HGL-10 1316 07-03-13 50 0 100 NB670GQ 1309 07-02-13 50 0 100 MPQ8632GL-6 1309 07-03-13 50 0 100 MPQ8632GL-12 1316 07-03-13 50 0 100 MP2617GL 1316 09-10-13 50 0 100 NB671GQ 1309 07-01-13 50 0 100 MP2617GL 1317 09-10-13 50 0 100 NB669GQ 1315 07-01-13 50 0 100 MP2625GL 1311 09-05-13 50 0 100 MP2617GL 1316 09-10-13 50 0 100 NB670GQ 1315 07-01-13 50 0 100 MP8606DL 1321 08-15-13 50 0 100 NB669GQ 1315 07-01-13 50 0 100 MP86885GQWT 1317 08-29-13 50 0 100 MPQ8636GL-10 1318 07-03-13 50 0 100 MPQ8616GL-6 1312 07-03-13 50 0 100 NB675GL 1314 07-16-13 50 0 100 MP2625GL 1311 07-04-13 50 0 100 MP2617GL 1320 09-10-13 50 0 100 NB669GQ 1315 07-01-13 50 0 100 MP2625GL 1311 07-23-13 50 0 100 MPQ8632GL-8 1316 07-03-13 50 0 100 NB669GQ 1317 07-10-13 50 0 100 NB675GL 1311 07-25-13 50 0 100 MP2617GL 1321 09-10-13 50 0 100 MPQ8632GL-6 1321 07-03-13 50 0 100 NB670GQ 1315 07-01-13 50 0 100 NB669GQ 1316 07-10-13 50 0 100 NB671AGQ 1311 07-10-13 50 0 100 MP2617GL 1322 09-10-13 50 0 100 FA NO. # of cycle MP8736DL 1324 07-10-13 50 0 100 MP28259DD 1317 07-01-13 50 0 100 NB671AGQ 1324 07-10-13 50 0 100 MP28258DD 1306 07-01-13 50 0 100 MPQ8632GL-4 1316 07-10-13 50 0 100 The Future of Analog IC Technology® - 50 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1323 07-10-13 50 0 100 NB671LGQ 1325 07-10-13 50 0 100 MP28259DD 1321 07-01-13 50 0 100 MP28258DD 1320 07-04-13 50 0 100 MP8736DL 1323 07-10-13 50 0 100 MP28258DD 1322 07-04-13 50 0 100 MP86884DQKT 1324 07-03-13 50 0 100 FA NO. # of cycle NB650GL 1324 07-04-13 50 0 100 MP2617GL 1317 09-10-13 50 0 100 MP2158GQH 1325 07-02-13 50 0 100 MPQ8636GV-20 1317 07-10-13 50 0 100 NB638DL 1317 07-02-13 50 0 100 MP2140DD 1323 07-04-13 50 0 100 NB671LGQ 1325 07-10-13 50 0 100 MP8736DL 1324 07-01-13 50 0 100 MP2130DG 1321 07-03-13 50 0 100 MP2158GQH 1325 07-10-13 50 0 100 NB670GQ 1316 07-10-13 50 0 100 MP86884DQKT 1324 07-10-13 50 0 100 MP9180DG 1320 07-03-13 50 0 100 MP2617GL 1325 09-10-13 50 0 100 MPQ8636GL-10 1321 07-10-13 50 0 100 MP28258DD-C471 1321 07-04-13 50 0 100 MP2130DG 1321 07-03-13 50 0 100 MP8736DL 1324 07-10-13 50 0 100 MPQ8632GL-6 1324 07-10-13 50 0 100 MP4470GL 1325 07-10-13 50 0 100 NB669GQ 1318 07-10-13 50 0 100 MP2162GQH 1325 07-10-13 50 0 100 MP2130DG 1321 07-10-13 50 0 100 MP2130DG 1321 07-10-13 50 0 100 MP86963DUT 1311 07-16-13 50 0 100 MP2130DG 1323 07-10-13 50 0 100 MP2625GL 1313 07-16-13 50 0 100 MP1499GD 1321 07-16-13 50 0 100 MP2130DG 1324 07-10-13 50 0 100 MP2130DG 1322 07-10-13 50 0 100 MP8736DL 1326 07-16-13 50 0 100 NB669GQ 1316 07-16-13 50 0 100 MP86963DUT 1311 07-16-13 50 0 100 MP2617GL 1326 09-10-13 50 0 100 MP8736DL 1325 07-16-13 50 0 100 The Future of Analog IC Technology® - 51 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MPQ8632GV-20 1315 07-16-13 50 0 100 MPQ8636GL-10 1310 07-16-13 50 0 100 FA NO. # of cycle MP2625GL 1313 09-05-13 50 0 100 MP2130DG 1323 07-16-13 50 0 100 NB671GQ 1313 07-16-13 50 0 100 MP2158GQH 1326 07-16-13 50 0 100 MP2130DG 1325 07-11-13 50 0 100 MP2130DG 1323 07-16-13 50 0 100 MPQ8632GL-10 1251 07-16-13 50 0 100 MPQ8632GV-15 1322 07-16-13 50 0 100 MP2130DG 1323 07-16-13 50 0 100 NB671GQ 1311 07-16-13 50 0 100 MP2130DG 1325 07-16-13 50 0 100 MP2130DG 1323 07-16-13 50 0 100 MP2308GD 1325 07-16-13 50 0 100 MP8736DL 1325 07-16-13 50 0 100 MP2625GL 1319 07-16-13 50 0 100 MP2130DG 1323 07-11-13 50 0 100 MP2130DG 1323 07-16-13 50 0 100 MP8736DL 1325 07-16-13 50 0 100 MP2617GL 1326 09-10-13 50 0 100 MPQ8632GV-20 1323 07-16-13 50 0 100 MP2130DG 1324 07-16-13 50 0 100 NB671GQ 1313 07-18-13 50 0 100 NB650GL 1319 07-18-13 50 0 100 MPQ8632GVE-15 1304 07-18-13 50 0 100 MPQ8632GVE-20 1323 07-18-13 50 0 100 MP9180DG 1322 07-16-13 50 0 100 MP2130DG 1324 07-16-13 50 0 100 MPQ8632GL-10 1251 07-16-13 50 0 100 MP28259DD 1319 07-18-13 50 0 100 NB638DL 1327 07-18-13 50 0 100 MP2617GL 1326 09-10-13 50 0 100 MP28259DD 1325 07-18-13 50 0 100 MP2130DG 1324 07-18-13 50 0 100 NB669GQ 1319 07-23-13 50 0 100 MPQ8632GVE-20 1326 07-18-13 50 0 100 MPQ8632GVE-15 1327 07-18-13 50 0 100 MP2130DG 1325 07-18-13 50 0 100 MP2617GL 1326 09-10-13 50 0 100 MP2308GD 1325 07-18-13 50 0 100 NB650GL 1327 07-18-13 50 0 100 The Future of Analog IC Technology® - 52 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2139DD 1324 07-18-13 50 0 100 MP2625GL 1325 07-18-13 50 0 100 FA NO. # of cycle MP2130DG 1324 07-18-13 50 0 100 MP8736DL 1326 07-18-13 50 0 100 MP2130DG 1325 07-18-13 50 0 100 NB671GQ 1305 07-18-13 50 0 100 NB670GQ 1302 07-23-13 50 0 100 MP2617GL 1326 09-10-13 50 0 100 MP2625GL 1327 07-23-13 50 0 100 MP9180DG 1321 07-23-13 50 0 100 NB670GQ 1303 07-23-13 50 0 100 MP28258DD-A 1325 07-25-13 50 0 100 MPQ8632GVE-15 1327 07-23-13 50 0 100 MP2617GL 1326 09-10-13 50 0 100 NB671LGQ 1328 07-25-13 50 0 100 MP86884DQKT 1328 07-25-13 50 0 100 MP2625GL 1327 07-23-13 50 0 100 MP86884DQKT 1328 07-25-13 50 0 100 MP2140DD 1328 07-25-13 50 0 100 NB671GQ 1311 07-23-13 50 0 100 NB671LGQ 1328 07-25-13 50 0 100 MP2617GL 1326 09-10-13 50 0 100 MP86885GQWT 1325 07-23-13 50 0 100 NB671LGQ 1328 07-25-13 50 0 100 MP38873DL 1326 07-25-13 50 0 100 MP2130DG 1323 07-25-13 50 0 100 MP2625GL 1328 07-25-13 50 0 100 MP2617GL 1327 09-10-13 50 0 100 MP86884DQKT 1328 07-25-13 50 0 100 MP28258DD-C471 1305 07-25-13 50 0 100 MP2162GQH 1328 07-25-13 50 0 100 MP8736DL 1328 07-25-13 50 0 100 MP2162GQH 1328 07-30-13 50 0 100 MP2617GL 1326 09-10-13 50 0 100 MP2162GQH 1328 07-30-13 50 0 100 MP2625GL 1327 07-30-13 50 0 100 NB671LGQ 1328 07-30-13 50 0 100 MP2625GL 1328 07-30-13 50 0 100 MP28259DD 1321 07-30-13 50 0 100 MP8736DL 1328 07-30-13 50 0 100 MP2625GL 1327 08-01-13 50 0 100 MP1499GD 1324 08-01-13 50 0 100 The Future of Analog IC Technology® - 53 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2130DG 1325 07-30-13 50 0 100 MP2617GL 1326 09-10-13 50 0 100 FA NO. # of cycle MP8736DL 1329 07-30-13 50 0 100 MP2130DG 1325 07-30-13 50 0 100 MP2130DG 1325 07-30-13 50 0 100 MP86884DQKT 1311 07-30-13 50 0 100 MPQ4470GL 1329 08-07-13 50 0 100 MP86884DQKT 1329 07-30-13 50 0 100 MP2130DG 1325 08-07-13 50 0 100 MP2130DG 1324 08-07-13 50 0 100 MP8736DL 1329 08-07-13 50 0 100 MP2617GL 1328 09-10-13 50 0 100 MP2625GL 1328 08-07-13 50 0 100 MP86884DQKT 1324 08-07-13 50 0 100 MP38900DL 1328 08-07-13 50 0 100 NB671LGQ 1328 08-07-13 50 0 100 MP2130DG 1325 08-07-13 50 0 100 MP28258DD-A-C440 1321 08-07-13 50 0 100 MP2130DG 1325 08-07-13 50 0 100 MP2158GQH 1328 08-07-13 50 0 100 MP2130DG 1325 08-07-13 50 0 100 MP86884DQKT 1329 08-07-13 50 0 100 MP2334DD 1310 08-07-13 50 0 100 MPQ8632HGL-10 1330 08-07-13 50 0 100 MP2617GL 1328 09-10-13 50 0 100 MP2162GQH 1328 08-07-13 50 0 100 MP86884DQKT 1329 08-07-13 50 0 100 MPQ8632GVE-20 1330 08-07-13 50 0 100 NB638DL 1327 08-07-13 50 0 100 MP2130DG 1329 08-06-13 50 0 100 MP2130DG 1325 08-06-13 50 0 100 MP2139DD 1330 08-07-13 50 0 100 NB671LGQ 1329 08-14-13 50 0 100 MP2130DG 1329 08-14-13 50 0 100 MP8736DL 1330 08-07-13 50 0 100 MP2617GL 1329 09-10-13 50 0 100 MP2130DG 1330 08-14-13 50 0 100 NB671AGQ 1324 08-14-13 50 0 100 MP8760GL 1331 08-14-13 50 0 100 MP2617GL 1329 09-10-13 50 0 100 MPQ8636GL-10 1322 08-14-13 50 0 100 MP2130DG 1330 08-14-13 50 0 100 The Future of Analog IC Technology® - 54 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2130DG 1326 08-14-13 50 0 100 MP8736DL 1330 08-14-13 50 0 100 MP2162GQH 1329 08-14-13 50 0 100 MP2139DD 1324 08-14-13 50 0 100 MP9181DD 1331 08-14-13 50 0 100 MP2130DG 1328 08-14-13 50 0 100 MP2162GQH 1329 08-14-13 50 0 100 FA NO. # of cycle MP8736DL 1329 08-14-13 50 0 100 MP1499GD 1321 08-16-13 50 0 100 MP2617GL 1329 09-10-13 50 0 100 MP2617GL 1329 09-10-13 50 0 100 MP2625GL 1329 08-14-13 50 0 100 MPQ8632GL-6 1331 08-16-13 50 0 100 NB671GQ 1312 08-14-13 50 0 100 MP28259DD 1330 08-14-13 50 0 100 MP2162GQH 1329 08-14-13 50 0 100 NB671GQ 1305 08-14-13 50 0 100 MP8736DL 1330 08-14-13 50 0 100 MP9447GL 1331 08-14-13 50 0 100 MP28258DD 1305 08-16-13 50 0 100 MP8736DL 1331 08-16-13 50 0 100 MP1499GD 1326 08-16-13 50 0 100 MP2625GL 1331 08-16-13 50 0 100 NB670GQ 1317 08-16-13 50 0 100 NB670GQ 1317 08-16-13 50 0 100 NB671AGQ 1325 08-20-13 50 0 100 MP8606DL 1329 08-16-13 50 0 100 MP2162GQH 1330 08-20-13 50 0 100 NB650GL 1329 08-20-13 50 0 100 NB671GQ 1307 08-16-13 50 0 100 MP2617GL 1326 09-10-13 50 0 100 MP4470GL 1331 08-20-13 50 0 100 MP28258DD 1319 08-28-13 50 0 100 MP8762GL 1332 08-20-13 50 0 100 MP9181DD 1330 08-20-13 50 0 100 MP8736DL 1331 08-20-13 50 0 100 MP2625GL 1331 08-20-13 50 0 100 MP9180DG 1309 09-05-13 50 0 100 NB650HGL 1305 08-20-13 50 0 100 MP2130DG 1326 08-20-13 50 0 100 MP28258DD 1305 08-28-13 50 0 100 NB638DL 1330 08-20-13 50 0 100 The Future of Analog IC Technology® - 55 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1332 08-20-13 50 0 100 MP9180DG 1321 08-20-13 50 0 100 MP2334DD 1313 08-23-13 50 0 100 NB671GQ 1304 08-20-13 50 0 100 MP2158GQH 1330 08-20-13 50 0 100 MP2617GL 1329 09-05-13 50 0 100 MP2130DG 1327 08-23-13 50 0 100 FA NO. # of cycle NB671GQ 1309 08-28-13 50 0 100 MP2625GL 1332 08-23-13 50 0 100 NB671GQ 1302 08-28-13 50 0 100 MP28258DD 1321 08-23-13 50 0 100 NB671GQ 1307 08-28-13 50 0 100 MP9151GD 1328 08-28-13 50 0 100 NB670GQ 1316 08-28-13 50 0 100 MP2617GL 1331 09-05-13 50 0 100 MP2130DG 1329 08-23-13 50 0 100 MP2617GL 1329 09-10-13 50 0 100 MP2130DG 1328 08-23-13 50 0 100 MP28259DD-A-C441 1327 08-23-13 50 0 100 09-10-13 50 0 100 MP2617GL 1329 MP28258DD-C471 1325 08-23-13 50 0 100 NB638DL 1333 08-28-13 50 0 100 MP86961DU 1137 08-28-13 50 0 100 MP2334DD 1315 08-28-13 50 0 100 MP2625GL 1332 08-28-13 50 0 100 MP2617GL 1329 09-10-13 50 0 100 MP9186GD 1308 08-28-13 50 0 100 MP2334DD 1320 08-28-13 50 0 100 MP8760GL 1333 08-28-13 50 0 100 MP1499GD 1324 08-28-13 50 0 100 MP2617GL 1332 09-10-13 50 0 100 MP2617GL 1329 09-10-13 50 0 100 MP2130DG 1328 08-29-13 50 0 100 MPQ8632HGL-10 1330 09-05-13 50 0 100 MP9186GD 1322 08-29-13 50 0 100 MP8606DL 1332 08-30-13 50 0 100 MPQ8632GL-6 1333 08-30-13 50 0 100 MP2617GL 1329 09-10-13 50 0 100 MP2617GL 1333 09-10-13 50 0 100 MP2617GL 1332 09-10-13 50 0 100 NB650GL 1334 08-30-13 50 0 100 MP2130DG 1328 08-29-13 50 0 100 The Future of Analog IC Technology® - 56 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail NB671GQ 1326 08-29-13 50 0 100 MP2334DD 1330 08-29-13 50 0 100 FA NO. # of cycle MP1499GD 1310 08-29-13 50 0 100 MP2617GL 1332 09-10-13 50 0 100 MP28258DD 1305 08-29-13 50 0 100 NB671GQ 1326 08-29-13 50 0 100 MP2334DD 1322 08-30-13 50 0 100 MP38876DL 1327 08-30-13 50 0 100 MP8606DL 1331 08-30-13 50 0 100 MP2617GL 1333 09-27-13 50 0 100 MP2617GL 1333 09-27-13 50 0 100 MP28258DD 1311 09-05-13 50 0 100 MP8736DL 1334 09-05-13 50 0 100 MPQ8632GL-10 1321 09-05-13 50 0 100 NB671GQ 1326 09-05-13 50 0 100 MP2617GL 1334 09-10-13 50 0 100 MP2334DD 1330 09-05-13 50 0 100 MP8736DL 1334 09-09-13 50 0 100 MP2130DG 1330 09-09-13 50 0 100 MP2334DD 1331 09-09-13 50 0 100 MP2625GL 1332 09-09-13 50 0 100 NB671LGQ 1334 09-09-13 50 0 100 MP1499GD 1335 09-09-13 50 0 100 MP2130DG 1330 09-09-13 50 0 100 NB669GQ 1332 09-09-13 50 0 100 MP28258DD 1320 09-09-13 50 0 100 NB671GQ 1324 09-09-13 50 0 100 MP8736DL 1334 09-09-13 50 0 100 NB671GQ 1320 09-09-13 50 0 100 MP38875DL 1327 09-09-13 50 0 100 MP2625GL 1334 09-09-13 50 0 100 MP2735DQG 1335 09-10-13 50 0 100 NB669GQ 1332 09-10-13 50 0 100 MP9181DD 1335 09-10-13 50 0 100 NB671LGQ 1335 09-10-13 50 0 100 NB638DL 1335 09-10-13 50 0 100 NB669GQ 1332 09-10-13 50 0 100 MP2162GQH 1334 09-18-13 50 0 100 MP2625GL 1332 09-12-13 50 0 100 NB670GQ 1333 09-18-13 50 0 100 MP28257DD 1326 09-12-13 50 0 100 MP9181DD 1335 09-12-13 50 0 100 The Future of Analog IC Technology® - 57 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8760GL 1335 09-12-13 50 0 100 MP28258DD 1321 09-12-13 50 0 100 FA NO. # of cycle MP2130DG 1330 09-12-13 50 0 100 NB671GQ 1323 09-12-13 50 0 100 MP8736DL 1335 09-12-13 50 0 100 MP2130DG 1330 09-12-13 50 0 100 NB638DL 1335 09-12-13 50 0 100 MPQ8636GL-10 1335 09-12-13 50 0 100 MP2130DG 1330 09-12-13 50 0 100 MP2334DD 1330 09-12-13 50 0 100 NB650HGL 1335 09-18-13 50 0 100 NB6381DL 1316 09-18-13 50 0 100 MP8736DL 1336 09-18-13 50 0 100 MP2625GL 1335 09-18-13 50 0 100 MP2130DG 1330 09-18-13 50 0 100 MP2308GD 1333 09-18-13 50 0 100 MP8736DL 1336 09-18-13 50 0 100 MPM3810GQB 1334 09-18-13 50 0 100 MP2139DD 1336 09-23-13 50 0 100 MP2130DG-C423 1304 09-18-13 50 0 100 MP1499GD 1335 09-23-13 50 0 100 MP3306EG 1336 09-18-13 50 0 100 MP8736DL 1336 09-23-13 50 0 100 MP28259DD 1321 09-23-13 50 0 100 NB650HGL 1305 09-23-13 50 0 100 MP2617GL 1334 09-23-13 50 0 100 MPQ8632GVE-20 1336 09-23-13 50 0 100 MP2158GQH 1334 09-18-13 50 0 100 MP3306EG 1334 09-18-13 50 0 100 MP28258DD-C471 1311 09-23-13 50 0 100 MP2617GL 1334 09-26-13 50 0 100 MP9180DG 1332 09-23-13 50 0 100 MP8760GL 1335 09-26-13 50 0 100 MP1499GD 1333 09-23-13 50 0 100 NB650HGL 1311 09-26-13 50 0 100 NB639DL 1313 09-26-13 50 0 100 MP2158GQH-M006 1334 09-23-13 50 0 100 MP9180DG 1332 09-23-13 50 0 100 MP2617AGL 1336 09-26-13 50 0 100 MP9180DG 1322 09-26-13 50 0 100 MP9180DG 1322 09-26-13 50 0 100 MPQ8632GL-6 1336 09-26-13 50 0 100 The Future of Analog IC Technology® - 58 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP9180DG 1328 09-26-13 50 0 100 NB675GL 1333 09-26-13 50 0 100 MP2130DG 1333 09-26-13 50 0 100 MP9180DG 1332 09-26-13 50 0 100 MP2130DG 1330 09-26-13 50 0 100 MP2130DG 1332 09-26-13 50 0 100 MP2130DG 1332 09-26-13 50 0 100 Total FA NO. # of cycle 0 4.6.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP28258DD 1227 07-05-13 50 0 168 MP28258DD 1229 07-05-13 50 0 168 MPQ8632GL-10 1243 07-05-13 47 0 168 MPQ8632GL-10 1247 07-05-13 47 0 168 NB675GL 1311 07-16-13 47 0 168 NB675GL 1311 07-16-13 47 0 168 MP8736DL 1308 07-12-13 100 0 168 MP8763GLE 1312 07-02-13 97 0 168 MP28258DD 1214 07-10-13 47 0 168 MP28258DD 1218 07-10-13 50 0 168 NB671GQ 1313 07-24-13 47 0 168 NB671GQ 1313 07-24-13 45 0 168 MPQ4470GL-AEC1 1237 07-24-13 90 0 168 MPQ4470GL-AEC1 1247 07-22-13 87 0 168 MPQ4470GL-AEC1 1249 07-22-13 87 0 168 MP5506GL 1230 07-19-13 87 0 168 MP8620DQK 1233 07-24-13 95 0 168 MP8620DQK 1233 07-24-13 95 0 168 MP8620DQK 1233 07-24-13 95 0 168 MP8620DQK 1233 07-24-13 95 0 168 MP8620DQK 1234 07-24-13 90 0 168 MP8620DQK 1235 07-24-13 90 0 168 MP8736DL 1303 07-31-13 97 0 168 MP8736DL 1303 07-31-13 97 0 168 MP2625GL 1304 07-31-13 87 0 168 MP8843GG-JC 1308 09-03-13 97 0 168 MP8736DL 1249 09-09-13 50 0 168 MP8736DL 1249 09-09-13 50 0 168 FA NO. # of hrs The Future of Analog IC Technology® - 59 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail NB675GL 1311 10-09-13 97 0 168 MP86884DQKT 1311 09-18-13 50 0 168 MP86884DQKT 1311 09-18-13 50 0 168 MP2617AGL 1325 10-09-13 46 0 168 MP2617AGL 1319 10-09-13 47 0 168 MP28259DD 1318 10-09-13 47 0 168 MP28259DD 1321 10-09-13 47 0 168 FA NO. # of hrs MPM3810GQB-E 1329 09-16-13 87 0 168 MPM3810GQB-12 1329 09-16-13 97 0 168 MPM3810GQB-18 1329 09-16-13 97 0 168 MP28251GD 1330 10-08-13 97 0 168 NB677GQ 1331 10-12-13 97 0 168 NB675GL 1302 07-01-13 47 0 168 NB675GL 1302 07-01-13 47 0 168 NB675GL 1248 07-02-13 45 0 168 NB675GL 1251 07-01-13 50 0 168 NB675GL 1241 07-02-13 47 0 168 NB675GL 1305 07-02-13 48 0 168 NB675GL 1304 07-15-13 50 0 168 NB675GL 1305 07-15-13 50 0 168 NB675GL 1305 07-01-13 50 0 168 NB675GL 1305 07-01-13 47 0 168 NB675GL 1309 07-01-13 50 0 168 NB675GL 1309 07-01-13 50 0 168 NB675GL 1314 07-16-13 45 0 168 NB675GL 1314 07-16-13 44 0 168 NB675GL 1311 07-25-13 47 0 168 MPQ8636GL-10 1251 07-03-13 50 0 48 NB675GL 1301 07-02-13 50 0 48 MPQ8632GL-8 1251 07-03-13 50 0 48 NB671GQ 1302 07-02-13 50 0 48 NB671GQ 1302 07-02-13 50 0 48 MPQ8636GL-10 1301 07-03-13 50 0 48 MPQ8632GL-10 1251 07-03-13 50 0 48 MP8620DQK 1245 07-02-13 50 0 48 NB670GQ 1302 08-30-13 50 2 NB671GQ 1304 07-01-13 50 0 48 NB670GQ 1304 07-01-13 50 0 48 NB670GQ 1304 07-01-13 50 0 48 NB671AGQ 1304 07-01-13 50 0 48 NB671AGQ 1301 07-02-13 50 0 48 NB675GL 1301 07-01-13 50 0 48 6550 48 The Future of Analog IC Technology® - 60 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail NB671AGQ 1302 07-01-13 50 0 48 NB670GQ 1302 07-01-13 50 0 48 NB671GQ 1304 07-02-13 50 0 48 NB669GQ 1305 07-01-13 50 0 48 MPQ8612GL-12 1247 07-03-13 50 0 48 MPQ8636GL-10 1302 07-03-13 50 0 48 MPQ8632GL-8 1302 07-03-13 50 0 48 NB669GQ 1305 07-01-13 50 0 48 NB669GQ 1305 07-01-13 50 0 48 NB669GQ 1305 07-01-13 50 0 48 NB671GQ 1305 07-01-13 50 0 48 NB671AGQ 1305 07-01-13 50 0 48 NB670GQ 1305 07-01-13 50 0 48 NB671GQ 1305 07-01-13 50 0 48 MP2617GL 1306 09-10-13 50 0 48 NB669GQ 1307 07-01-13 50 0 48 NB671GQ 1307 07-01-13 50 0 48 NB671GQ 1305 07-01-13 50 0 48 NB670GQ 1307 07-01-13 50 0 48 NB671GQ 1307 07-01-13 50 0 48 FA NO. # of hrs MPQ8616GL-12 1303 07-03-13 50 0 48 NB671GQ 1307 07-01-13 50 0 48 NB671GQ 1307 07-01-13 50 0 48 MPQ8636GL-10 1302 07-03-13 50 0 48 MPQ8632GL-6 1308 07-03-13 50 0 48 MPQ8632GL-8 1308 07-03-13 50 0 48 NB671GQ 1309 07-01-13 50 0 48 MPQ8616GL-12 1305 07-03-13 50 0 48 MPQ8632GL-12 1302 07-03-13 50 0 48 MPQ8632GL-4 1305 07-03-13 50 0 48 NB669GQ 1309 07-01-13 50 0 48 NB670GQ 1310 07-26-13 50 0 48 NB671GQ 1309 07-01-13 50 0 48 MPQ8632GL-10 1251 07-03-13 50 0 48 NB670GQ 1304 07-26-13 50 0 48 NB671GQ 1307 07-01-13 50 0 48 NB671GQ 1308 07-02-13 50 0 48 NB671GQ 1307 07-01-13 50 0 48 NB669GQ 1310 07-01-13 50 0 48 NB670GQ 1309 07-02-13 50 0 48 MPQ8632GL-6 1310 07-03-13 50 0 48 MPQ8632GL-6 1309 07-03-13 50 0 48 The Future of Analog IC Technology® - 61 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2617GL 1311 09-10-13 50 0 48 NB670GQ 1309 08-30-13 50 0 48 NB669GQ 1310 07-01-13 50 0 48 NB669GQ 1310 07-01-13 50 0 48 NB670GQ 1309 07-01-13 50 0 48 NB671AGQ 1304 07-01-13 50 0 48 NB669GQ 1310 07-01-13 50 0 48 NB671AGQ 1305 07-01-13 50 0 48 NB671GQ 1313 07-02-13 50 0 48 NB670GQ 1310 07-01-13 50 0 48 MPQ4470GL 1249 07-02-13 50 0 48 NB669GQ 1309 07-02-13 50 0 48 NB670GQ 1309 07-01-13 50 0 48 NB671GQ 1307 07-01-13 50 0 48 MPQ8612GL-12 1308 07-03-13 50 0 48 FA NO. # of hrs MPQ8632GL-12 1312 07-03-13 50 0 48 NB669GQ 1309 07-01-13 50 0 48 NB669GQ 1309 07-01-13 50 0 48 MPQ8632GL-8 1311 07-03-13 50 0 48 NB671GQ 1307 07-01-13 50 0 48 NB669GQ 1314 07-01-13 50 0 48 NB670GQ 1307 07-01-13 50 0 48 NB675GL 1314 07-16-13 50 0 48 NB670GQ 1310 07-01-13 50 0 48 MP2130DG-C423 1304 09-12-13 50 0 48 MPQ8632HGL-10 1316 07-03-13 50 0 48 NB670GQ 1309 07-02-13 50 0 48 MPQ8632GL-6 1309 07-03-13 50 0 48 MPQ8632GL-12 1316 07-03-13 50 0 48 MP2617GL 1316 09-10-13 50 0 48 NB671GQ 1309 07-01-13 50 0 48 MP2617GL 1317 09-10-13 50 0 48 NB669GQ 1315 07-01-13 50 0 48 MP2625GL 1311 09-05-13 50 0 48 MP2617GL 1316 09-10-13 50 0 48 NB670GQ 1315 07-01-13 50 0 48 MP8606DL 1321 08-15-13 50 0 48 NB669GQ 1315 07-01-13 50 0 48 MP86885GQWT 1317 08-29-13 50 0 48 MPQ8636GL-10 1318 07-03-13 50 0 48 MPQ8616GL-6 1312 07-03-13 50 0 48 NB675GL 1314 07-16-13 50 0 48 The Future of Analog IC Technology® - 62 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2625GL 1311 07-04-13 50 0 48 MP2617GL 1320 09-10-13 50 0 48 FA NO. # of hrs NB669GQ 1315 07-01-13 50 0 48 MP2625GL 1311 07-23-13 50 0 48 MPQ8632GL-8 1316 07-03-13 50 0 48 NB669GQ 1317 07-10-13 50 0 48 NB675GL 1311 07-25-13 50 0 48 MP2617GL 1321 09-10-13 50 0 48 MPQ8632GL-6 1321 07-03-13 50 0 48 NB670GQ 1315 07-01-13 50 0 48 NB669GQ 1316 07-10-13 50 0 48 NB671AGQ 1311 07-10-13 50 0 48 MP2617GL 1322 09-10-13 50 0 48 MP8736DL 1324 07-10-13 50 0 48 MP28259DD 1317 07-01-13 50 0 48 NB671AGQ 1324 07-10-13 50 0 48 MP28258DD 1306 07-01-13 50 0 48 MPQ8632GL-4 1316 07-10-13 50 0 48 MP8736DL 1323 07-10-13 50 0 48 NB671LGQ 1325 07-10-13 50 0 48 MP28259DD 1321 07-01-13 50 0 48 MP28258DD 1320 07-04-13 50 0 48 MP8736DL 1323 07-10-13 50 0 48 MP28258DD 1322 07-04-13 50 0 48 MP86884DQKT 1324 07-03-13 50 0 48 NB650GL 1324 07-04-13 50 0 48 MP2617GL 1317 09-10-13 50 0 48 MP2158GQH 1325 07-02-13 50 0 48 MPQ8636GV-20 1317 07-10-13 50 0 48 NB638DL 1317 07-02-13 50 0 48 MP2140DD 1323 07-04-13 50 0 48 NB671LGQ 1325 07-10-13 50 0 48 MP8736DL 1324 07-01-13 50 0 48 MP2130DG 1321 07-03-13 50 0 48 MP2158GQH 1325 07-10-13 50 0 48 NB670GQ 1316 07-10-13 50 0 48 MP86884DQKT 1324 07-10-13 50 0 48 MP9180DG 1320 07-03-13 50 0 48 MP2617GL 1325 09-10-13 50 0 48 MPQ8636GL-10 1321 07-10-13 50 0 48 MP28258DD-C471 1321 07-04-13 50 0 48 MP2130DG 1321 07-03-13 50 0 48 The Future of Analog IC Technology® - 63 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1324 07-10-13 50 0 48 MPQ8632GL-6 1324 07-10-13 50 0 48 MP4470GL 1325 07-10-13 50 0 48 NB669GQ 1318 07-10-13 50 0 48 MP2162GQH 1325 07-10-13 50 0 48 MP2130DG 1321 07-10-13 50 0 48 MP2130DG 1321 07-10-13 50 0 48 MP86963DUT 1311 07-16-13 50 0 48 MP2130DG 1323 07-10-13 50 0 48 MP2625GL 1313 07-16-13 50 0 48 MP1499GD 1321 07-16-13 50 0 48 MP2130DG 1324 07-10-13 50 0 48 MP2130DG 1322 07-10-13 50 0 48 MP8736DL 1326 07-16-13 50 0 48 NB669GQ 1316 07-16-13 50 0 48 MP86963DUT 1311 07-16-13 50 0 48 MP2617GL 1326 09-10-13 50 0 48 MP8736DL 1325 07-16-13 50 0 48 MPQ8632GV-20 1315 07-16-13 50 0 48 MPQ8636GL-10 1310 07-16-13 50 0 48 FA NO. # of hrs MP2625GL 1313 09-05-13 50 0 48 MP2130DG 1323 07-16-13 50 0 48 NB671GQ 1313 07-16-13 50 0 48 MP2158GQH 1326 07-16-13 50 0 48 MP2130DG 1325 07-11-13 50 0 48 MP2130DG 1323 07-16-13 50 0 48 MPQ8632GL-10 1251 07-16-13 50 0 48 MPQ8632GV-15 1322 07-16-13 50 0 48 MP2130DG 1323 07-16-13 50 0 48 NB671GQ 1311 07-16-13 50 0 48 MP2130DG 1325 07-16-13 50 0 48 MP2130DG 1323 07-16-13 50 0 48 MP2308GD 1325 07-16-13 50 0 48 MP8736DL 1325 07-16-13 50 0 48 MP2625GL 1319 07-16-13 50 0 48 MP2130DG 1323 07-11-13 50 0 48 MP2130DG 1323 07-16-13 50 0 48 MP8736DL 1325 07-16-13 50 0 48 MP2617GL 1326 09-10-13 50 0 48 MPQ8632GV-20 1323 07-16-13 50 0 48 MP2130DG 1324 07-16-13 50 0 48 NB671GQ 1313 07-18-13 50 0 48 The Future of Analog IC Technology® - 64 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail NB650GL 1319 07-18-13 50 0 48 MPQ8632GVE-15 1304 07-18-13 50 0 48 MPQ8632GVE-20 1323 07-18-13 50 0 48 MP9180DG 1322 07-16-13 50 0 48 MP2130DG 1324 07-16-13 50 0 48 MPQ8632GL-10 1251 07-16-13 50 0 48 MP28259DD 1319 07-18-13 50 0 48 FA NO. # of hrs NB638DL 1327 07-18-13 50 0 48 MP2617GL 1326 09-10-13 50 0 48 MP28259DD 1325 07-18-13 50 0 48 MP2130DG 1324 07-18-13 50 0 48 NB669GQ 1319 07-23-13 50 0 48 MPQ8632GVE-20 1326 07-18-13 50 0 48 MPQ8632GVE-15 1327 07-18-13 50 0 48 MP2130DG 1325 07-18-13 50 0 48 MP2617GL 1326 09-10-13 50 0 48 MP2308GD 1325 07-18-13 50 0 48 NB650GL 1327 07-18-13 50 0 48 MP2139DD 1324 07-18-13 50 0 48 MP2625GL 1325 07-18-13 50 0 48 MP2130DG 1324 07-18-13 50 0 48 MP8736DL 1326 07-18-13 50 0 48 MP2130DG 1325 07-18-13 50 0 48 NB671GQ 1305 07-18-13 50 0 48 NB670GQ 1302 07-23-13 50 0 48 MP2617GL 1326 09-10-13 50 0 48 MP2625GL 1327 07-23-13 50 0 48 MP9180DG 1321 07-23-13 50 0 48 NB670GQ 1303 07-23-13 50 0 48 MP28258DD-A 1325 07-25-13 50 0 48 MPQ8632GVE-15 1327 07-23-13 50 0 48 MP2617GL 1326 09-10-13 50 0 48 NB671LGQ 1328 07-25-13 50 0 48 MP86884DQKT 1328 07-25-13 50 0 48 MP2625GL 1327 07-23-13 50 0 48 MP86884DQKT 1328 07-25-13 50 0 48 MP2140DD 1328 07-25-13 50 0 48 NB671GQ 1311 07-23-13 50 0 48 NB671LGQ 1328 07-25-13 50 0 48 MP2617GL 1326 09-10-13 50 0 48 MP86885GQWT 1325 07-23-13 50 0 48 NB671LGQ 1328 07-25-13 50 0 48 The Future of Analog IC Technology® - 65 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP38873DL 1326 07-25-13 50 0 48 MP2130DG 1323 07-25-13 50 0 48 MP2625GL 1328 07-25-13 50 0 48 MP2617GL 1327 09-10-13 50 0 48 MP86884DQKT 1328 07-25-13 50 0 48 MP8620DQK 1323 07-30-13 50 0 48 MP28258DD-C471 1305 07-25-13 50 0 48 MP2162GQH 1328 07-25-13 50 0 48 MP8736DL 1328 07-25-13 50 0 48 MP8620DQK 1323 07-30-13 50 0 48 MP2162GQH 1328 07-30-13 50 0 48 FA NO. # of hrs MP2617GL 1326 09-10-13 50 0 48 MP2162GQH 1328 07-30-13 50 0 48 MP2625GL 1327 07-30-13 50 0 48 NB671LGQ 1328 07-30-13 50 0 48 MP2625GL 1328 07-30-13 50 0 48 MP28259DD 1321 07-30-13 50 0 48 MP8736DL 1328 07-30-13 50 0 48 MP2625GL 1327 08-01-13 50 0 48 MP1499GD 1324 08-01-13 50 0 48 MP2130DG 1325 07-30-13 50 0 48 MP2617GL 1326 09-10-13 50 0 48 MP8736DL 1329 07-30-13 50 0 48 MP2130DG 1325 07-30-13 50 0 48 MP2130DG 1325 07-30-13 50 0 48 MP86884DQKT 1311 07-30-13 50 0 48 MPQ4470GL 1329 08-07-13 50 0 48 MP86884DQKT 1329 07-30-13 50 0 48 MP2130DG 1325 08-07-13 50 0 48 MP2130DG 1324 08-07-13 50 0 48 MP8736DL 1329 08-07-13 50 0 48 MP2617GL 1328 09-10-13 50 0 48 MP2625GL 1328 08-07-13 50 0 48 MP86884DQKT 1324 08-07-13 50 0 48 MP38900DL 1328 08-07-13 50 0 48 NB671LGQ 1328 08-07-13 50 0 48 MP2130DG 1325 08-07-13 50 0 48 MP28258DD-A-C440 1321 08-07-13 50 0 48 MP2130DG 1325 08-07-13 50 0 48 MP2158GQH 1328 08-07-13 50 0 48 MP2130DG 1325 08-07-13 50 0 48 MP86884DQKT 1329 08-07-13 50 0 48 The Future of Analog IC Technology® - 66 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2334DD 1310 08-07-13 50 0 48 MP8620DQK 1330 08-07-13 50 0 48 MPQ8632HGL-10 1330 08-07-13 50 0 48 MP2617GL 1328 09-10-13 50 0 48 MP8620DQK 1330 08-07-13 50 0 48 MP2162GQH 1328 08-07-13 50 0 48 MP86884DQKT 1329 08-07-13 50 0 48 MPQ8632GVE-20 1330 08-07-13 50 0 48 NB638DL 1327 08-07-13 50 0 48 MP2130DG 1329 08-06-13 50 0 48 MP2130DG 1325 08-06-13 50 0 48 FA NO. # of hrs MP2139DD 1330 08-07-13 50 0 48 NB671LGQ 1329 08-14-13 50 0 48 MP2130DG 1329 08-14-13 50 0 48 MP8736DL 1330 08-07-13 50 0 48 MP2617GL 1329 09-10-13 50 0 48 MP2130DG 1330 08-14-13 50 0 48 NB671AGQ 1324 08-14-13 50 0 48 MP8760GL 1331 08-14-13 50 0 48 MP2617GL 1329 09-10-13 50 0 48 MPQ8636GL-10 1322 08-14-13 50 0 48 MP2130DG 1330 08-14-13 50 0 48 MP2130DG 1326 08-14-13 50 0 48 MP8736DL 1330 08-14-13 50 0 48 MP2162GQH 1329 08-14-13 50 0 48 MP2139DD 1324 08-14-13 50 0 48 MP9181DD 1331 08-14-13 50 0 48 MP2130DG 1328 08-14-13 50 0 48 MP2162GQH 1329 08-14-13 50 0 48 MP8736DL 1329 08-14-13 50 0 48 MP1499GD 1321 08-16-13 50 0 48 MP2617GL 1329 09-10-13 50 0 48 MP2617GL 1329 09-10-13 50 0 48 MP2625GL 1329 08-14-13 50 0 48 MPQ8632GL-6 1331 08-16-13 50 0 48 NB671GQ 1312 08-14-13 50 0 48 MP28259DD 1330 08-14-13 50 0 48 MP2162GQH 1329 08-14-13 50 0 48 NB671GQ 1305 08-14-13 50 0 48 MP8736DL 1330 08-14-13 50 0 48 MP9447GL 1331 08-14-13 50 0 48 MP28258DD 1305 08-16-13 50 0 48 The Future of Analog IC Technology® - 67 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1331 08-16-13 50 0 48 MP1499GD 1326 08-16-13 50 0 48 MP2625GL 1331 08-16-13 50 0 48 NB670GQ 1317 08-16-13 50 0 48 NB670GQ 1317 08-16-13 50 0 48 NB671AGQ 1325 08-20-13 50 0 48 MP8606DL 1329 08-16-13 50 0 48 MP2162GQH 1330 08-20-13 50 0 48 NB650GL 1329 08-20-13 50 0 48 NB671GQ 1307 08-16-13 50 0 48 MP2617GL 1326 09-10-13 50 0 48 FA NO. # of hrs MP4470GL 1331 08-20-13 50 0 48 MP28258DD 1319 08-28-13 50 0 48 MP8762GL 1332 08-20-13 50 0 48 MP9181DD 1330 08-20-13 50 0 48 MP8736DL 1331 08-20-13 50 0 48 MP2625GL 1331 08-20-13 50 0 48 MP9180DG 1309 09-05-13 50 0 48 NB650HGL 1305 08-20-13 50 0 48 MP2130DG 1326 08-20-13 50 0 48 MP28258DD 1305 08-28-13 50 0 48 NB638DL 1330 08-20-13 50 0 48 MP8736DL 1332 08-20-13 50 0 48 MP9180DG 1321 08-20-13 50 0 48 MP2334DD 1313 08-23-13 50 0 48 NB671GQ 1304 08-20-13 50 0 48 MP2158GQH 1330 08-20-13 50 0 48 MP2617GL 1329 09-05-13 50 0 48 MP2130DG 1327 08-23-13 50 0 48 NB671GQ 1309 08-28-13 50 0 48 MP2625GL 1332 08-23-13 50 0 48 NB671GQ 1302 08-28-13 50 0 48 MP28258DD 1321 08-23-13 50 0 48 NB671GQ 1307 08-28-13 50 0 48 MP9151GD 1328 08-28-13 50 0 48 NB670GQ 1316 08-28-13 50 0 48 MP2617GL 1331 09-05-13 50 0 48 MP2130DG 1329 08-23-13 50 0 48 MP2617GL 1329 09-10-13 50 0 48 MP2130DG 1328 08-23-13 50 0 48 MP28259DD-A-C441 1327 08-23-13 50 0 48 09-10-13 50 0 48 MP2617GL 1329 The Future of Analog IC Technology® - 68 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP28258DD-C471 1325 08-23-13 50 0 48 NB638DL 1333 08-28-13 50 0 48 MP86961DU 1137 08-28-13 50 0 48 MP2334DD 1315 08-28-13 50 0 48 MP2625GL 1332 08-28-13 50 0 48 MP2617GL 1329 09-10-13 50 0 48 MP9186GD 1308 08-28-13 50 0 48 FA NO. # of hrs MP2334DD 1320 08-28-13 50 0 48 MP8760GL 1333 08-28-13 50 0 48 MP1499GD 1324 08-28-13 50 0 48 MP2617GL 1332 09-10-13 50 0 48 MP2617GL 1329 09-10-13 50 0 48 MP2130DG 1328 08-29-13 50 0 48 MPQ8632HGL-10 1330 09-05-13 50 0 48 MP9186GD 1322 08-29-13 50 0 48 MP8606DL 1332 08-30-13 50 0 48 MPQ8632GL-6 1333 08-30-13 50 0 48 MP2617GL 1329 09-10-13 50 0 48 MP2617GL 1333 09-10-13 50 0 48 MP2617GL 1332 09-10-13 50 0 48 NB650GL 1334 08-30-13 50 0 48 MP2130DG 1328 08-29-13 50 0 48 NB671GQ 1326 08-29-13 50 0 48 MP2334DD 1330 08-29-13 50 0 48 MP1499GD 1310 08-29-13 50 0 48 MP2617GL 1332 09-10-13 50 0 48 MP28258DD 1305 08-29-13 50 0 48 NB671GQ 1326 08-29-13 50 0 48 MP2334DD 1322 08-30-13 50 0 48 MP38876DL 1327 08-30-13 50 0 48 MP8606DL 1331 08-30-13 50 0 48 MP2617GL 1333 09-27-13 50 0 48 MP2617GL 1333 09-27-13 50 0 48 MP28258DD 1311 09-05-13 50 0 48 MP8736DL 1334 09-05-13 50 0 48 MPQ8632GL-10 1321 09-05-13 50 0 48 NB671GQ 1326 09-05-13 50 0 48 MP2617GL 1334 09-10-13 50 0 48 MP2334DD 1330 09-05-13 50 0 48 MP8736DL 1334 09-09-13 50 0 48 MP2130DG 1330 09-09-13 50 0 48 MP2334DD 1331 09-09-13 50 0 48 The Future of Analog IC Technology® - 69 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2625GL 1332 09-09-13 50 0 48 NB671LGQ 1334 09-09-13 50 0 48 MP1499GD 1335 09-09-13 50 0 48 MP2130DG 1330 09-09-13 50 0 48 NB669GQ 1332 09-09-13 50 0 48 MP28258DD 1320 09-09-13 50 0 48 NB671GQ 1324 09-09-13 50 0 48 MP8736DL 1334 09-09-13 50 0 48 NB671GQ 1320 09-09-13 50 0 48 MP38875DL 1327 09-09-13 50 0 48 MP2625GL 1334 09-09-13 50 0 48 MP2735DQG 1335 09-10-13 50 0 48 NB669GQ 1332 09-10-13 50 0 48 MP9181DD 1335 09-10-13 50 0 48 NB671LGQ 1335 09-10-13 50 0 48 FA NO. # of hrs NB638DL 1335 09-10-13 50 0 48 NB669GQ 1332 09-10-13 50 0 48 MP2162GQH 1334 09-18-13 50 0 48 MP2625GL 1332 09-12-13 50 0 48 NB670GQ 1333 09-18-13 50 0 48 MP28257DD 1326 09-12-13 50 0 48 MP9181DD 1335 09-12-13 50 0 48 MP8760GL 1335 09-12-13 50 0 48 MP28258DD 1321 09-12-13 50 0 48 MP2130DG 1330 09-12-13 50 0 48 NB671GQ 1323 09-12-13 50 0 48 MP8736DL 1335 09-12-13 50 0 48 MP2130DG 1330 09-12-13 50 0 48 NB638DL 1335 09-12-13 50 0 48 MPQ8636GL-10 1335 09-12-13 50 0 48 MP2130DG 1330 09-12-13 50 0 48 MP2334DD 1330 09-12-13 50 0 48 NB650HGL 1335 09-18-13 50 0 48 NB6381DL 1316 09-18-13 50 0 48 MP8736DL 1336 09-18-13 50 0 48 MP2625GL 1335 09-18-13 50 0 48 MP2130DG 1330 09-18-13 50 0 48 MP2308GD 1333 09-18-13 50 0 48 MP8736DL 1336 09-18-13 50 0 48 MPM3810GQB 1334 09-18-13 50 0 48 MP2139DD 1336 09-23-13 50 0 48 MP2130DG-C423 1304 09-18-13 50 0 48 The Future of Analog IC Technology® - 70 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1499GD 1335 09-23-13 50 0 FA NO. # of hrs 48 MP3306EG 1336 09-18-13 50 0 48 MP8736DL 1336 09-23-13 50 0 48 MP28259DD 1321 09-23-13 50 0 48 NB650HGL 1305 09-23-13 50 0 48 MP2617GL 1334 09-23-13 50 0 48 MPQ8632GVE-20 1336 09-23-13 50 0 48 MP2158GQH 1334 09-18-13 50 0 48 MP3306EG 1334 09-18-13 50 0 48 MP28258DD-C471 1311 09-23-13 50 0 48 MP2617GL 1334 09-26-13 50 0 48 MP9180DG 1332 09-23-13 50 0 48 MP8760GL 1335 09-26-13 50 0 48 MP1499GD 1333 09-23-13 50 0 48 NB650HGL 1311 09-26-13 50 0 48 NB639DL 1313 09-26-13 50 0 48 MP2158GQH-M006 1334 09-23-13 50 0 48 MP9180DG 1332 09-23-13 50 0 48 MP2617AGL 1336 09-26-13 50 0 48 MP9180DG 1322 09-26-13 50 0 48 MP9180DG 1322 09-26-13 50 0 48 MPQ8632GL-6 1336 09-26-13 50 0 48 MP9180DG 1328 09-26-13 50 0 48 NB675GL 1333 09-26-13 50 0 48 MP2130DG 1333 09-26-13 50 0 48 MP9180DG 1332 09-26-13 50 0 48 MP2130DG 1330 09-26-13 50 0 48 MP2130DG 1332 09-26-13 50 0 48 MP2130DG 1332 09-26-13 50 0 48 Total 2 4.6.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C Close Date Sample Size # of Fail MP8736DL 1312 07-02-13 78 0 MP8736DL 1312 07-02-13 80 0 MP8736DL 1316 07-12-13 80 0 MP8736DL 1317 07-25-13 80 0 MPQ4470GL-AEC1 1247 07-22-13 80 0 MPQ4470GL-AEC1 1249 07-22-13 80 0 FA NO. The Future of Analog IC Technology® - 71 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP8736DL 1320 07-22-13 80 0 MPM3810GQB 1305 09-18-13 78 0 MPM3805GQB 1315 09-18-13 76 0 MPM3805GQB 1315 09-18-13 76 0 NB675GL 1311 10-09-13 80 0 MP2617AGL 1325 10-09-13 49 0 MP2617AGL 1319 10-09-13 47 0 MP28251GD 1330 10-08-13 80 0 NB677GQ 1331 10-12-13 79 0 MP2617GL 1329 09-05-13 47 0 MP2617GL 1331 09-05-13 49 0 MP2617GL 1329 09-10-13 47 0 MP2617GL 1332 09-10-13 49 0 MP2617GL 1333 09-27-13 49 0 MP2617GL 1333 09-27-13 47 0 Total FA NO. 0 4.7 FLIP CHIP-SOIC The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE UCD ANST FCSOIC8 JCET JCAP FCSOIC8 FCSOIC8 ANST FCSOIC16 FCSOIC8 4.7.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP2305DS 1316 07-09-13 102 0 MP1482DS 1203 07-24-13 270 0 MP1482DS 1223 07-24-13 260 0 MP1482DS 1203 07-24-13 90 0 MP1482DS 1316 07-24-13 200 0 MP1493DS 1329 09-10-13 305 0 Total FA NO. 0 The Future of Analog IC Technology® - 72 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT SAT picture of FLIP CHIP-SOIC T-SCAN PICTURE C-SCAN PICTURE 4.7.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP1482DS 1203 07-24-13 84 0 1000 MP1482DS 1223 07-24-13 84 0 1000 MP1482DS 1316 07-24-13 97 0 1000 MP1493DS 1329 09-10-13 94 0 1000 MP1493DS 1331 09-24-13 94 0 1000 MP1482DS 1316 07-16-13 47 0 1000 MP1482DS 1316 07-16-13 47 0 1000 MP1482DS 1317 07-16-13 47 0 1000 MP1482DS 1317 07-16-13 47 0 1000 MP1482DS 1317 07-16-13 47 0 1000 MP1482DS 1317 07-16-13 47 0 1000 MP1482DS 1317 07-16-13 47 0 1000 MP1482DS 1320 08-23-13 47 0 1000 MP1482DS 1320 08-23-13 47 0 1000 MP1482DS 1322 07-23-13 47 0 1000 MP1482DS 1322 08-14-13 47 0 1000 MP1482DS 1322 08-07-13 47 0 1000 MP1482DS 1322 08-07-13 47 0 1000 MP1482DS 1322 08-07-13 47 0 1000 MP1482DS 1322 08-14-13 47 0 1000 MP1482DS 1322 08-14-13 47 0 1000 MP1482DS 1316 07-03-13 100 0 100 FA NO. # of cycle The Future of Analog IC Technology® - 73 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1492DS 1312 08-27-13 100 0 100 MP1482DS 1324 07-01-13 50 0 100 MP1482SDS 1322 07-01-13 50 0 100 MP1482DS 1322 07-01-13 50 0 100 MP1492DS 1323 07-01-13 50 0 100 MP1493DS 1316 07-01-13 50 0 100 MP1482DS 1323 07-04-13 50 0 100 MP1492DS 1319 07-04-13 50 0 100 MP1482DS 1323 07-04-13 50 0 100 MP1482SDS-C416 1324 07-02-13 50 0 100 MP1492DS 1312 07-02-13 50 0 100 MP1482DS 1325 07-02-13 50 0 100 MP1482DS 1323 07-02-13 50 0 100 MP1482DS 1321 07-02-13 50 0 100 MP1482DS 1323 07-10-13 50 0 100 MP1482DS 1226 07-10-13 50 0 100 MP1482DS 1323 07-10-13 50 0 100 MP1482DS 1324 07-10-13 50 0 100 MP1482DS 1324 07-10-13 50 0 100 MP1482DS 1320 07-10-13 50 0 100 MP1482DS 1323 07-10-13 50 0 100 MP1482DS 1321 07-10-13 50 0 100 MP1482DS 1324 07-16-13 50 0 100 MP1482DS 1324 07-16-13 50 0 100 MP1482DS 1324 07-16-13 50 0 100 MP1482DS 1326 07-23-13 50 0 100 MP1482DS 1324 07-16-13 50 0 100 MP1482DS 1325 07-11-13 50 0 100 MP2140DS 1322 07-16-13 50 0 100 MP1482DS 1326 07-23-13 50 0 100 MP1482DS 1326 07-23-13 50 0 100 MP1482DS 1325 07-11-13 50 0 100 MP1482DS 1325 07-11-13 50 0 100 MP1482DS 1325 07-11-13 50 0 100 MP1482DS 1326 07-16-13 50 0 100 MP1482DS 1324 07-16-13 50 0 100 MP1492DS 1310 07-18-13 50 0 100 FA NO. # of cycle MP1482DS 1324 07-18-13 50 0 100 MP1493DS-A 1326 07-18-13 50 0 100 MP1482DS 1326 07-18-13 50 0 100 MP1482DS 1326 07-23-13 50 0 100 MP1482DS 1327 07-23-13 50 0 100 The Future of Analog IC Technology® - 74 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DS 1327 08-16-13 50 0 100 MP1482DS 1326 08-16-13 50 0 100 MP1492DS 1324 07-23-13 50 0 100 MP1492DS-C469 1324 07-23-13 50 0 100 MP1482DS 1327 07-25-13 50 0 100 MP1482SDS-C416 1321 07-25-13 50 0 100 MP1482DS 1327 07-25-13 50 0 100 MP1492DS-A-C528 1326 07-25-13 50 0 100 MP1482DS 1321 07-30-13 50 0 100 MP1482DS 1326 07-30-13 50 0 100 MP1482DS 1326 08-07-13 50 0 100 MP1492DS 1324 07-30-13 50 0 100 MP1482DS 1324 08-07-13 50 0 100 MP1482DS 1321 08-07-13 50 0 100 MP1482DS 1318 08-07-13 50 0 100 MP1493DS-A 1320 08-07-13 50 0 100 MP1482DS 1330 08-14-13 50 0 100 MP1482DS 1330 08-14-13 50 0 100 MP1492DS-A-C528 1326 08-16-13 50 0 100 MP1482DS 1330 08-16-13 50 0 100 MP1493DS 1330 08-20-13 50 0 100 MP1482DS 1321 08-23-13 50 0 100 MP1482DS 1332 08-23-13 50 0 100 MP1482DS 1332 08-28-13 50 0 100 MP1492DS 1324 08-28-13 50 0 100 MP1482DS 1332 08-28-13 50 0 100 MP1482SDS-C416 1321 08-29-13 50 0 100 MP1482DS 1332 08-29-13 50 0 100 MP1492DS 1327 08-30-13 50 0 100 FA NO. # of cycle MP2140DS 1329 09-05-13 50 0 100 MP1493DS-C480 1328 09-09-13 50 0 100 MP1482DS 1334 09-05-13 50 0 100 MP1493DS-A 1326 09-05-13 50 0 100 MP1492DS-A-C528 1324 09-10-13 50 0 100 MP1482DS 1334 09-18-13 50 0 100 MP1482DS 1334 09-23-13 50 0 100 MP1492DS-A-C528 1331 09-26-13 50 0 100 MP1482DS 1334 09-26-13 50 0 100 MP1482DS 1334 09-26-13 50 0 100 Total 0 The Future of Analog IC Technology® - 75 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT 4.7.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP1482DS 1203 07-24-13 90 0 168 MP1482DS 1223 07-24-13 77 0 168 MP1482DS 1316 07-24-13 97 0 168 MP1493DS 1329 09-10-13 97 0 168 MP1493DS 1331 09-24-13 94 0 168 MP1482DS 1316 07-16-13 47 0 168 MP1482DS 1316 07-16-13 47 0 168 MP1482DS 1317 07-16-13 47 0 168 MP1482DS 1317 07-16-13 47 0 168 MP1482DS 1317 07-16-13 47 0 168 MP1482DS 1317 07-16-13 47 0 168 MP1482DS 1317 07-16-13 47 0 168 MP1482DS 1320 08-23-13 47 0 168 MP1482DS 1320 08-23-13 47 0 168 MP1482DS 1322 07-23-13 47 0 168 MP1482DS 1322 08-14-13 47 0 168 MP1482DS 1322 08-07-13 47 0 168 MP1482DS 1322 08-07-13 47 0 168 MP1482DS 1322 08-07-13 47 0 168 MP1482DS 1322 08-14-13 47 0 168 FA NO. # of hrs MP1482DS 1322 08-14-13 47 0 168 MP1482DS 1316 07-03-13 100 0 48 MP1492DS 1312 08-27-13 100 0 48 MP1482DS 1324 07-01-13 50 0 48 MP1482SDS 1322 07-01-13 50 0 48 MP1482DS 1322 07-01-13 50 0 48 MP1492DS 1323 07-01-13 50 0 48 MP1493DS 1316 07-01-13 50 0 48 MP1482DS 1323 07-04-13 50 0 48 MP1492DS 1319 07-04-13 50 0 48 MP1482DS 1323 07-04-13 50 0 48 MP1482SDS-C416 1324 07-02-13 50 0 48 MP1492DS 1312 07-02-13 50 0 48 MP1482DS 1325 07-02-13 50 0 48 MP1482DS 1323 07-02-13 50 0 48 MP1482DS 1321 07-02-13 50 0 48 MP1482DS 1323 07-10-13 50 0 48 MP1482DS 1226 07-10-13 50 0 48 MP1482DS 1323 07-10-13 50 0 48 The Future of Analog IC Technology® - 76 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DS 1324 07-10-13 50 0 48 MP1482DS 1324 07-10-13 50 0 48 MP1482DS 1320 07-10-13 50 0 48 MP1482DS 1323 07-10-13 50 0 48 MP1482DS 1321 07-10-13 50 0 48 MP1482DS 1324 07-16-13 50 0 48 MP1482DS 1324 07-16-13 50 0 48 MP1482DS 1324 07-16-13 50 0 48 MP1482DS 1326 07-23-13 50 0 48 MP1482DS 1324 07-16-13 50 0 48 MP1482DS 1325 07-11-13 50 0 48 MP2140DS 1322 07-16-13 50 0 48 MP1482DS 1326 07-23-13 50 0 48 MP1482DS 1326 07-23-13 50 0 48 MP1482DS 1325 07-11-13 50 0 48 MP1482DS 1325 07-11-13 50 0 48 MP1482DS 1325 07-11-13 50 0 48 MP1482DS 1326 07-16-13 50 0 48 MP1482DS 1324 07-16-13 50 0 48 MP1492DS 1310 07-18-13 50 0 48 FA NO. # of hrs MP1482DS 1324 07-18-13 50 0 48 MP1493DS-A 1326 07-18-13 50 0 48 MP1482DS 1326 07-18-13 50 0 48 MP1482DS 1326 07-23-13 50 0 48 MP1482DS 1327 07-23-13 50 0 48 MP1482DS 1327 08-16-13 50 0 48 MP1482DS 1326 08-16-13 50 0 48 MP1492DS 1324 07-23-13 50 0 48 MP1492DS-C469 1324 07-23-13 50 0 48 MP1482DS 1327 07-25-13 50 0 48 MP1482SDS-C416 1321 07-25-13 50 0 48 MP1482DS 1327 07-25-13 50 0 48 MP1492DS-A-C528 1326 07-25-13 50 0 48 MP1482DS 1321 07-30-13 50 0 48 MP1482DS 1326 07-30-13 50 0 48 MP1482DS 1326 08-07-13 50 0 48 MP1492DS 1324 07-30-13 50 0 48 MP1482DS 1324 08-07-13 50 0 48 MP1482DS 1321 08-07-13 50 0 48 MP1482DS 1318 08-07-13 50 0 48 MP1493DS-A 1320 08-07-13 50 0 48 MP1482DS 1330 08-14-13 50 0 48 The Future of Analog IC Technology® - 77 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1482DS 1330 08-14-13 50 0 48 MP1492DS-A-C528 1326 08-16-13 50 0 48 MP1482DS 1330 08-16-13 50 0 48 MP1493DS 1330 08-20-13 50 0 48 MP1482DS 1321 08-23-13 50 0 48 MP1482DS 1332 08-23-13 50 0 48 MP1482DS 1332 08-28-13 50 0 48 MP1492DS 1324 08-28-13 50 0 48 MP1482DS 1332 08-28-13 50 0 48 MP1482SDS-C416 1321 08-29-13 50 0 48 MP1482DS 1332 08-29-13 50 0 48 MP1492DS 1327 08-30-13 50 0 48 MP2140DS 1329 09-05-13 50 0 48 MP1493DS-C480 1328 09-09-13 50 0 48 MP1482DS 1334 09-05-13 50 0 48 FA NO. # of hrs MP1493DS-A 1326 09-05-13 50 0 48 MP1492DS-A-C528 1324 09-10-13 50 0 48 MP1482DS 1334 09-18-13 50 0 48 MP1482DS 1334 09-23-13 50 0 48 MP1492DS-A-C528 1331 09-26-13 50 0 48 MP1482DS 1334 09-26-13 50 0 48 MP1482DS 1334 09-26-13 50 0 48 Total 0 4.6.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C Close Date Sample Size # of Fail MP2305DS 1316 07-09-13 80 0 MP1482DS 1203 07-24-13 80 0 MP1493DS 1329 09-10-13 100 0 MP1493DS 1331 09-24-13 80 0 Total FA NO. 0 The Future of Analog IC Technology® - 78 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT 4.8 FLIP CHIP-TSOT The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor. The specific assemblies included in this package monitor are: ASSY SITE PACKAGE ASSY SITE PACKAGE ANST FCTSOT-5 JCET FCTSOT-6 ANST FCTSOT-6 JCET FCTSOT-8 ANST FCTSOT-8 4.8.1 Preconditioning MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours), @260°C Reflow Simulation(3 times), SAT check and Final test Device D/C Close Date Sample Size # of Fail MP3414DJ 1324 07-12-13 200 0 MP2314GJ 1303 07-23-13 180 0 MP2314GJ 1303 07-23-13 90 0 MP2314GJ 1312 07-23-13 102 0 MP3221GJ 1309 07-18-13 110 0 MP157GJ 1309 07-24-13 100 0 MP157GJ 1309 07-24-13 105 0 MP1494DJ 1243 07-24-13 373 0 MP1494DJ 1247 07-24-13 360 0 MP157GJ 1309 07-24-13 100 0 MP157GJ 1243 07-19-13 360 0 MP1470GJ 1305 07-31-13 180 0 MP2122GJ 1327 09-04-13 302 0 MP1494DJ 1237 09-04-13 400 0 MP2318GJ 1322 09-03-13 300 0 MP2225GJ 1304 09-24-13 381 0 MP2225GJ 1304 09-24-13 90 0 MP1494DJ 1316 09-17-13 110 0 MP1497DJ 1316 10-09-13 300 0 MP1496DJ 1314 10-09-13 150 0 MP1496DJ 1318 10-09-13 150 0 MP1470GJ-JC 1330 09-27-13 200 0 MP1494DJ-JC 1329 09-27-13 200 0 MP1494DJ 1331 09-18-13 302 0 MP1494DJ 1328 10-12-13 200 0 MP2161GJ-C499 1316 07-04-13 50 0 MP2161GJ-C499 1317 07-11-13 70 0 MP1470GJ 1323 08-28-13 48 0 MP1470GJ 1325 08-28-13 48 0 MP2161GJ-C499 1328 08-14-13 50 0 MP2161GJ-C499 1327 08-14-13 50 0 FA NO. The Future of Analog IC Technology® - 79 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2161GJ-C499 1329 09-10-13 50 0 MP1470GJ 1327 09-05-13 50 0 MP2161GJ-C499 1331 09-10-13 50 0 Total FA NO. 0 SAT picture of FLIP CHIP-TSOT T-SCAN PICTURE C-SCAN PICTURE 4.8.2 Temperature Cycling Stress Duration: 100~1000 cycles Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C) Device D/C Close Date Sample Size # of Fail MP1472GJ 1249 07-11-13 47 0 1000 MP1472GJ 1249 07-11-13 47 0 1000 MP1472GJ 1226 07-09-13 50 0 1000 MP1472GJ 1226 07-09-13 50 0 1000 MP2314GJ 1303 07-23-13 84 0 1000 MP1494DJ 1243 07-24-13 84 0 1000 MP1494DJ 1247 07-24-13 84 0 1000 MP1494DJ 1245 07-31-13 47 0 1000 MP1494DJ 1245 07-31-13 47 0 1000 MP1497DJ 1246 07-31-13 47 0 1000 MP1497DJ 1250 07-31-13 47 0 1000 MP1470GJ 1305 07-31-13 84 0 1000 MP2122GJ 1327 09-04-13 94 0 1000 FA NO. # of cycle MP1494DJ 1237 09-04-13 94 0 1000 MP2318GJ 1322 09-03-13 94 0 1000 MP1470GJ 1245 09-05-13 47 0 1000 The Future of Analog IC Technology® - 80 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1470GJ 1245 09-05-13 47 0 1000 MP2225GJ 1304 09-24-13 82 0 1000 MP1497DJ 1316 10-09-13 94 0 1000 MP1496DJ 1314 10-09-13 45 0 1000 MP1496DJ 1318 10-09-13 47 0 1000 MP1470GJ 1327 10-08-13 94 0 1000 MP1470GJ-JC 1330 09-27-13 94 0 1000 FA NO. # of cycle MP1494DJ-JC 1329 09-27-13 94 0 1000 MP1494DJ 1331 09-18-13 94 0 1000 MP1494DJ 1328 10-12-13 97 0 1000 MP1472GJ-C452 1249 07-02-13 50 0 100 MP2161GJ-C499 1305 08-14-13 50 0 100 MP1472GJ-C452 1252 07-02-13 50 0 100 MP1472GJ-C452 1312 07-02-13 100 0 100 MP2161GJ-C499 1311 08-14-13 50 0 100 MP2161GJ-C499 1313 08-14-13 50 0 100 MP1470GJ 1313 07-23-13 50 0 100 MP1470GJ 1316 07-23-13 50 0 100 MP1495DJ 1315 07-01-13 50 0 100 MP1470GJ 1316 08-28-13 50 0 100 MP1470GJ 1316 08-28-13 50 0 100 MP1470GJ 1318 08-28-13 50 0 100 MP1495DJ 1316 07-04-13 50 0 100 MP1470GJ 1318 08-28-13 50 0 100 MP1496DJ 1319 08-15-13 50 0 100 MP1470GJ 1319 08-28-13 50 0 100 MP1470GJ 1318 08-28-13 50 0 100 MP1472GJ-C452 1320 07-31-13 50 0 100 MP1470GJ 1318 08-28-13 50 0 100 MP1494DJ 1319 07-16-13 50 0 100 MP1470GJ 1319 08-28-13 50 0 100 MP1470GJ 1318 08-28-13 50 0 100 MP2143DJ 1307 08-29-13 50 0 100 MP1470GJ 1320 08-28-13 50 0 100 MP2161GJ 1312 08-14-13 50 0 100 MP2161GJ 1322 08-14-13 50 0 100 MP1470GJ 1321 08-28-13 50 0 100 MP2161GJ 1317 08-14-13 50 0 100 MP1495DJ 1320 07-02-13 50 0 100 MP1471GJ 1323 07-23-13 50 0 100 MP1470GJ 1321 08-28-13 50 0 100 MP2161GJ 1322 08-14-13 50 0 100 The Future of Analog IC Technology® - 81 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2161GJ 1322 08-14-13 50 0 100 MP1470GJ 1321 08-28-13 50 0 100 MP2161GJ-C499 1322 08-14-13 50 0 100 MP1495DJ 1321 07-10-13 50 0 100 MP2234GJ 1323 09-02-13 50 0 100 MP2161GJ 1322 08-14-13 50 0 100 MP1494DJ 1321 07-01-13 50 0 100 MP1495DJ 1320 07-10-13 50 0 100 MP3414DJ 1324 07-01-13 50 0 100 MP2161GJ 1322 08-14-13 50 0 100 MP1470GJ 1323 08-28-13 50 0 100 MP1497DJ 1324 07-01-13 50 0 100 MP1495DJ 1320 08-14-13 50 0 100 MP3414DJ 1324 07-01-13 50 0 100 MP3414DJ 1324 07-01-13 50 0 100 MP1495DJ 1321 07-01-13 50 0 100 MP1494DJ 1310 07-01-13 50 0 100 MP1495DJ 1320 07-04-13 50 0 100 MP3414DJ 1324 07-04-13 50 0 100 MP2161GJ-C499 1324 08-14-13 50 0 100 FA NO. # of cycle MP1497DJ 1324 07-04-13 50 0 100 MP2315GJ 1325 07-04-13 50 0 100 MP3414DJ 1324 07-04-13 50 0 100 MP1495DJ 1320 07-04-13 50 0 100 MP2161GJ 1318 07-16-13 50 0 100 MP1496DJ 1324 07-04-13 50 0 100 MP1471GJ 1324 07-02-13 50 0 100 MP1472GJ-C452 1323 07-02-13 50 0 100 MP1475DJ 1316 07-03-13 50 0 100 MP2161GJ-C499 1318 08-14-13 50 0 100 MP2161GJ 1318 08-14-13 50 0 100 MP1495DJ 1320 07-04-13 50 0 100 MP2161GJ-C499 1318 08-14-13 50 0 100 MP2161GJ 1325 08-14-13 50 0 100 MP1470GJ 1325 08-28-13 50 0 100 MP1472GJ-C452 1325 07-10-13 50 0 100 MP1497DJ 1324 07-04-13 50 0 100 MP156GJ 1324 07-10-13 50 0 100 MP1496DJ 1324 07-10-13 50 0 100 MP1494DJ 1319 07-10-13 50 0 100 MP1494DJ 1319 07-10-13 50 0 100 MP1497DJ 1324 07-10-13 50 0 100 The Future of Analog IC Technology® - 82 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP150GJ 1324 08-14-13 50 0 100 MP1472GJ-C452 1325 07-10-13 50 0 100 FA NO. # of cycle MP2161GJ-C499 1325 08-14-13 50 0 100 MP2161GJ 1325 08-14-13 50 0 100 MP2144GJ 1322 07-16-13 50 0 100 MP1470GJ 1325 07-23-13 50 0 100 MP2161GJ-C499 1325 08-14-13 50 0 100 MP1494DJ 1319 07-10-13 50 0 100 MP1495DJ-C494 1323 07-10-13 50 0 100 MP2161GJ 1325 08-14-13 50 0 100 MP3414DJ 1325 07-16-13 50 0 100 MP2228GJ 1319 07-16-13 50 0 100 MP1496DJ 1326 07-16-13 50 0 100 MP2161GJ-C499 1325 08-14-13 50 0 100 MP2161GJ-C499 1326 08-14-13 50 0 100 MP1470GJ 1326 07-23-13 50 0 100 MP2315GJ 1326 07-16-13 50 0 100 MP1496DJ 1326 07-16-13 50 0 100 MP3414DJ 1326 07-16-13 50 0 100 MP2161GJ-C499 1325 08-14-13 50 0 100 MP1496DJ 1326 07-16-13 50 0 100 MP1472GJ-C452 1325 07-11-13 50 0 100 MP2161GJ 1326 08-14-13 50 0 100 MP2161GJ 1326 08-14-13 50 0 100 MP2161GJ-C499 1325 08-14-13 50 0 100 MP2315GJ 1326 07-16-13 50 0 100 MP1494DJ 1323 07-16-13 50 0 100 MP2144GJ 1322 07-16-13 50 0 100 MP2161GJ 1324 08-14-13 50 0 100 MP1497DJ 1326 07-16-13 50 0 100 MP2161GJ-C499 1326 08-14-13 50 0 100 MP2122GJ 1326 07-18-13 50 0 100 MP2143DJ 1307 07-16-13 50 0 100 MP2161GJ-C499 1324 08-14-13 50 0 100 MP1472GJ-C452 1327 07-16-13 50 0 100 MP2234GJ 1327 07-18-13 50 0 100 MP1497DJ 1326 07-18-13 50 0 100 MP2314GJ 1327 07-18-13 50 0 100 MP1494DJ 1323 07-18-13 50 0 100 MP2161GJ-C499 1326 08-14-13 50 0 100 MP1470GJ 1325 07-23-13 50 0 100 MP1472GJ-C452 1327 07-18-13 50 0 100 The Future of Analog IC Technology® - 83 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1497DJ 1326 07-18-13 50 0 100 MP2161GJ 1325 08-14-13 50 0 100 MP2161GJ-C499 1326 08-14-13 50 0 100 MP3414DJ 1325 07-18-13 50 0 100 MP2122GJ 1327 07-23-13 50 0 100 MP1470GJ 1326 07-23-13 50 0 100 MP1494DJ 1323 07-23-13 50 0 100 MP3414DJ 1327 07-23-13 50 0 100 MP3414DJ 1324 07-23-13 50 0 100 MP3414DJ 1325 07-23-13 50 0 100 MP2314GJ 1328 07-25-13 50 0 100 MP2161GJ 1326 08-14-13 50 0 100 MP2161GJ 1325 08-14-13 50 0 100 MP1472GJ-C452 1327 07-23-13 50 0 100 MP1495DJ 1323 07-23-13 50 0 100 MP2161GJ 1326 08-14-13 50 0 100 MP2161GJ 1326 08-14-13 50 0 100 MP1472GJ-C452 1327 07-23-13 50 0 100 MP1497DJ 1327 07-25-13 50 0 100 MP2161GJ 1326 08-14-13 50 0 100 MP2161GJ 1326 08-14-13 50 0 100 MP1494DJ 1323 07-23-13 50 0 100 MP3414DJ 1327 07-25-13 50 0 100 MP1495DJ 1323 07-25-13 50 0 100 MP1494DJ 1323 07-25-13 50 0 100 MP3414DJ 1326 07-25-13 50 0 100 MP2161GJ 1327 08-14-13 50 0 100 MP1470GJ 1326 07-30-13 50 0 100 MP1472GJ-C452 1327 07-25-13 50 0 100 MP1497DJ 1327 07-25-13 50 0 100 MP2159GJ 1318 07-25-13 50 0 100 MP2161GJ 1328 08-14-13 50 0 100 MP1472GJ-C452 1328 07-25-13 50 0 100 MP2161GJ-C499 1326 08-14-13 50 0 100 MP2161GJ-C499 1327 08-14-13 50 0 100 MP24892DJ 1327 07-25-13 50 0 100 MP2161GJ 1325 08-14-13 50 0 100 FA NO. # of cycle MP1495DJ 1323 07-30-13 50 0 100 MP1471GJ 1327 07-30-13 50 0 100 MP1497DJ 1327 07-30-13 50 0 100 MP2161GJ-C499 1328 08-14-13 50 0 100 MP1474DJ 1327 07-30-13 50 0 100 The Future of Analog IC Technology® - 84 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2161GJ-C499 1327 08-14-13 50 0 100 MP3414DJ 1328 07-30-13 50 0 100 MP1472GJ-C452 1328 07-30-13 50 0 100 MP1496DJ 1327 07-30-13 50 0 100 MP3414DJ 1328 07-30-13 50 0 100 MP2315GJ 1329 07-30-13 50 0 100 MP1472GJ-C452 1328 07-30-13 50 0 100 MP1472GJ 1317 08-01-13 50 0 100 MP1494DJ 1323 07-30-13 50 0 100 MP1495DJ 1323 08-07-13 50 0 100 MP2161GJ 1326 08-14-13 50 0 100 MP1496DJ 1327 08-01-13 50 0 100 MP1495DJ 1323 07-30-13 50 0 100 MP1474DJ 1317 08-07-13 50 0 100 MP1472GJ-C452 1328 08-01-13 50 0 100 FA NO. # of cycle MP2161GJ-C499 1328 08-14-13 50 0 100 MP2161GJ 1327 08-14-13 50 0 100 MP2161GJ-C499 1328 08-14-13 50 0 100 MP2161GJ 1329 08-14-13 50 0 100 MP1495DJ 1323 08-07-13 50 0 100 MP1495DJ 1323 08-07-13 50 0 100 MP1472GJ 1324 08-01-13 50 0 100 MP1494DJ 1323 08-07-13 50 0 100 MP2161GJ-C499 1326 08-14-13 50 0 100 MP1472GJ-C452 1329 08-01-13 50 0 100 MP2161GJ-C499 1328 08-14-13 50 0 100 MP1470GJ 1327 08-07-13 50 0 100 MP3414DJ 1328 08-01-13 50 0 100 MP2161GJ 1326 08-14-13 50 0 100 MP1474DJ 1317 08-07-13 50 0 100 MP1495DJ 1329 08-07-13 50 0 100 MP2161GJ-C499 1328 08-14-13 50 0 100 MP2161GJ 1326 08-14-13 50 0 100 MP1472GJ 1328 08-07-13 50 0 100 MP1496DJ 1329 08-07-13 50 0 100 MP2161GJ-C499 1329 08-14-13 50 0 100 MP156GJ 1329 08-07-13 50 0 100 MP1472GJ-C452 1328 08-07-13 50 0 100 MP1495DJ 1323 08-07-13 50 0 100 MP1495DJ 1323 08-07-13 50 0 100 MP1472GJ-C452 1330 08-07-13 50 0 100 MP1495DJ 1329 08-14-13 50 0 100 The Future of Analog IC Technology® - 85 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2315GJ 1330 08-07-13 50 0 100 MP1495DJ 1323 08-14-13 50 0 100 MP1472GJ-C452 1330 08-14-13 50 0 100 MP1498DJ-C532 1307 08-14-13 50 0 100 MP2161GJ-C499 1329 09-10-13 50 0 100 MP1470GJ 1327 08-14-13 50 0 100 MP4026GJ 1329 08-14-13 50 0 100 MP1497DJ 1329 08-14-13 50 0 100 MP1494DJ 1326 08-14-13 50 0 100 MP2161GJ-C499 1329 09-10-13 50 0 100 MP9495DJ 1319 08-14-13 50 0 100 MP1470GJ 1327 09-05-13 50 0 100 MP1494DJ 1319 08-14-13 50 0 100 MP2143DJ 1330 08-14-13 50 0 100 MP1472GJ-C452 1330 08-14-13 50 0 100 FA NO. # of cycle MP1472GJ-C452 1330 08-14-13 50 0 100 MP2315GJ 1329 08-16-13 50 0 100 MP1471GJ-C519 1327 08-14-13 50 0 100 MP2161GJ-C514 1331 09-10-13 50 0 100 MP1472GJ-C452 1330 08-14-13 50 0 100 MP1497DJ 1331 08-14-13 50 0 100 MP9495DJ 1320 08-14-13 50 0 100 MP1494DJ 1323 08-14-13 50 0 100 MP1497DJ 1326 08-14-13 50 0 100 MP1470GJ 1331 08-14-13 50 0 100 MP2143DJ 1330 08-16-13 50 0 100 MP1470GJ 1328 08-20-13 50 0 100 MP2122GJ 1331 08-16-13 50 0 100 MP2161GJ-C514 1331 08-16-13 50 0 100 MP4026GJ 1331 08-16-13 50 0 100 MP1497DJ 1331 08-16-13 50 0 100 MP1494DJ 1323 08-16-13 50 0 100 MP1494DJ 1323 08-16-13 50 0 100 MP1470GJ 1331 08-20-13 50 0 100 MP2315GJ 1331 08-16-13 50 0 100 MP3414DJ 1331 08-16-13 50 0 100 MP1472GJ-C452 1330 08-16-13 50 0 100 MP1470GJ 1331 08-20-13 50 0 100 MP2149GJ 1331 08-16-13 50 0 100 MP3414DJ 1331 08-20-13 50 0 100 MP2315GJ 1331 08-20-13 50 0 100 MP1496DJ 1324 08-20-13 50 0 100 The Future of Analog IC Technology® - 86 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1472GJ-C452 1331 08-20-13 50 0 100 MP1470GJ 1326 08-20-13 50 0 100 MP1472GJ-C452 1331 08-20-13 50 0 100 MP1497DJ 1329 08-20-13 50 0 100 MP1495DJ 1323 08-20-13 50 0 100 MP3414DJ 1332 08-20-13 50 0 100 MP1494DJ 1323 08-23-13 50 0 100 FA NO. # of cycle MP1498DJ 1332 08-20-13 50 0 MP1472GJ-C452 1323 08-29-13 50 2 100 MP2161GJ-C499 1331 09-10-13 50 0 100 MP3414DJ 1332 08-20-13 50 0 100 7251 100 MP2233DJ 1332 08-20-13 50 0 100 MP1472GJ 1323 08-20-13 50 0 100 MP3414DJ 1332 08-23-13 50 0 100 MP1470GJ 1331 08-23-13 50 0 100 MP1472GJ 1330 08-23-13 50 0 100 MP150GJ 1324 08-23-13 50 0 100 MP1470GJ 1328 08-23-13 50 0 100 MP2315GJ 1331 08-28-13 50 0 100 MP2143DJ-C463 1330 08-28-13 50 0 100 MP1495DJ 1332 08-28-13 50 0 100 MP1495DJ 1332 09-09-13 50 0 100 MP1494DJ 1323 08-23-13 50 0 100 MP1496DJ 1324 08-28-13 50 0 100 MP1495DJ 1332 09-18-13 50 0 100 MP1494DJ 1326 08-23-13 50 0 100 MP1471GJ 1328 08-28-13 50 0 100 MP1470GJ 1329 08-23-13 50 0 100 MP1472GJ-C452 1331 08-28-13 50 0 100 MP2315GJ 1332 08-28-13 50 0 100 MP3414DJ 1332 08-28-13 50 0 100 MP1470GJ 1331 08-28-13 50 0 100 MP1494DJ 1323 08-28-13 50 0 100 MP2161GJ 1328 08-28-13 50 0 100 MP2315GJ 1331 09-12-13 50 0 100 MP9495DJ 1332 08-28-13 50 0 100 MP3414DJ 1333 08-28-13 50 0 100 MP1472GJ-C452 1331 08-28-13 50 0 100 MP2315GJ 1329 08-28-13 50 0 100 MP1470GJ 1332 08-28-13 50 0 100 MP1494DJ 1323 08-28-13 50 0 100 MP3414DJ 1333 08-28-13 50 0 100 The Future of Analog IC Technology® - 87 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2315GJ 1331 08-28-13 50 0 100 08-28-13 50 0 100 MP1472GJ-C452 FA NO. # of cycle MP1496DJ 1333 08-28-13 50 0 100 MP2161GJ 1331 08-28-13 50 0 100 MP9495DJ 1332 08-28-13 50 0 100 MP2161GJ 1331 08-28-13 50 0 100 MP1496DJ 1331 08-29-13 50 0 100 MP1471GJ 1332 08-29-13 50 0 100 MP1494DJ 1332 08-29-13 50 0 100 MP3414DJ 1333 08-29-13 50 0 100 MP2161GJ 1331 08-29-13 50 0 100 MP1498DJ-C532 1332 08-29-13 50 0 100 MP2143DJ 1333 08-29-13 50 0 100 MP9495DJ 1333 08-29-13 50 0 100 MP1472GJ 1330 08-29-13 50 0 100 MP2161GJ 1331 08-29-13 50 0 100 MP1470GJ 1328 08-29-13 50 0 100 MP2315GJ 1331 08-29-13 50 0 100 MP1496DJ 1333 08-29-13 50 0 100 MP2161GJ 1329 08-29-13 50 0 100 MP3414DJ 1333 08-30-13 50 0 100 MP1470GJ 1333 08-30-13 50 0 100 MP2234GJ 1333 08-30-13 50 0 100 MP1471GJ 1333 08-30-13 50 0 100 MP1494DJ 1333 08-30-13 50 0 100 MP1470GJ 1333 09-05-13 50 0 100 MP1474DJ 1332 09-05-13 50 0 100 MP1497DJ 1331 09-05-13 50 0 100 MP1471GJ 1331 09-05-13 50 0 100 MP2143DJ 1333 09-05-13 50 0 100 MP2122GJ 1333 09-05-13 50 0 100 MP1494DJ 1333 09-05-13 50 0 100 MP1495DJ 1321 09-05-13 50 0 100 MP1471GJ-C519 1333 09-05-13 50 0 100 MP1472GJ 1329 09-05-13 50 0 100 MP2235GJ 1333 09-05-13 50 0 100 MP1495DJ 1319 09-05-13 50 0 100 MP2161GJ-C514 1334 09-05-13 50 0 100 MP2143DJ 1333 09-05-13 50 0 100 MP2122GJ 1333 09-09-13 50 0 100 MP2161GJ 1334 09-05-13 50 0 100 MP2161GJ 1334 09-05-13 50 0 100 The Future of Analog IC Technology® - 88 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2315GJ 1332 09-05-13 50 0 100 MP3414DJ 1334 09-09-13 50 0 100 MP1472GJ-C452 1328 09-05-13 50 0 100 MP2161GJ-C499 1334 09-09-13 50 0 100 MP3414DJ 1334 09-09-13 50 0 100 MP1472GJ-C452 1329 09-05-13 50 0 100 MP1496DJ 1331 09-09-13 50 0 100 MP4027GJ 1329 09-09-13 50 0 100 MP1470GJ 1332 09-09-13 50 0 100 MP2235GJ 1334 09-09-13 50 0 100 MP2314GJ 1334 09-09-13 50 0 100 FA NO. # of cycle MP1494DJ 1333 09-09-13 50 0 100 MP1471AGJ 1334 09-09-13 50 0 100 MP4026GJ 1334 09-09-13 50 0 100 MP1494DJ 1323 09-09-13 50 0 100 MP1495DJ 1323 09-09-13 50 0 100 MP1470GJ 1332 09-09-13 50 0 100 MP1470GJ 1334 09-09-13 50 0 100 MP1494DJ 1326 09-09-13 50 0 100 MP1475DJ 1333 09-09-13 50 0 100 MP3414DJ 1334 09-09-13 50 0 100 MP4026GJ 1335 09-09-13 50 0 100 MP2315GJ 1334 09-10-13 50 0 100 MP1494DJ 1333 09-09-13 50 0 100 MP3414DJ 1334 09-09-13 50 0 100 MP2161GJ 1335 09-10-13 50 0 100 MP1495DJ 1319 09-12-13 50 0 100 MP1496DJ 1333 09-12-13 50 0 100 MP1498DJ 1335 09-12-13 50 0 100 MP2314GJ 1333 09-10-13 50 0 100 MP1494DJ 1333 09-12-13 50 0 100 MP2161GJ 1334 09-18-13 50 0 100 MP2143DJ 1335 09-18-13 50 0 100 MP3414DJ 1334 09-10-13 50 0 100 MP1496DJ 1332 09-12-13 50 0 100 MP1495DJ 1321 09-12-13 50 0 100 MP2122GJ 1335 09-18-13 50 0 100 MP2143DJ 1335 09-12-13 50 0 100 MP2161GJ 1335 09-12-13 50 0 100 MP1472GJ 1331 09-18-13 50 0 100 MP3414DJ 1335 09-12-13 50 0 100 MP2161GJ 1335 09-12-13 50 0 100 The Future of Analog IC Technology® - 89 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2143DJ 1335 09-12-13 50 0 100 MP4026GJ 1335 09-12-13 50 0 100 FA NO. # of cycle MP9495DJ 1334 09-18-13 50 0 100 MP1470GJ 1332 09-12-13 50 0 100 MP2315GJ 1334 09-23-13 50 0 100 MP2315GJ 1335 09-18-13 50 0 100 MP9495DJ 1333 09-18-13 50 0 100 MP1496DJ 1333 09-27-13 50 0 100 MP3414DJ 1335 09-18-13 50 0 100 MP156GJ 1335 09-13-13 50 0 100 MP2315GJ 1334 09-13-13 50 0 100 MP9495DJ 1334 09-23-13 50 0 100 MP3414DJ 1335 09-18-13 50 0 100 MP2161GJ 1335 09-23-13 50 0 100 MP1495DJ 1323 09-23-13 50 0 100 MP1470GJ 1332 09-18-13 50 0 100 MP2122GJ 1335 09-23-13 50 0 100 MP1471AGJ 1336 09-23-13 50 0 100 MP3414DJ 1335 09-18-13 50 0 100 MP1494DJ 1335 09-23-13 50 0 100 MP2161GJ 1335 09-18-13 50 0 100 MP1495DJ 1335 09-26-13 50 0 100 MP2161GJ-C514 1336 09-18-13 50 0 100 MP2315GJ 1334 09-18-13 50 0 100 MP1496DJ 1336 09-23-13 50 0 100 MP2144GJ 1333 09-23-13 50 0 100 MP1470GJ 1332 09-23-13 50 0 100 MP2143DJ 1336 09-26-13 50 0 100 MP2161GJ 1336 09-23-13 50 0 100 MP3414DJ 1335 09-23-13 50 0 100 MP1494DJ 1309 09-23-13 50 0 100 MP1470GJ 1333 09-23-13 50 0 100 MP1472GJ 1332 09-23-13 50 0 100 MP1498DJ 1336 09-23-13 50 0 100 MP1496DJ 1333 09-23-13 50 0 100 MP2161GJ 1336 09-23-13 50 0 100 MP1494DJ 1306 09-23-13 50 0 100 MP1470GJ 1333 09-23-13 50 0 100 MP1470GJ 1333 09-26-13 50 0 100 MP2161GJ 1336 09-26-13 50 0 100 MP2143DJ 1336 09-26-13 50 0 100 MP2161GJ-C514 1336 09-26-13 50 0 100 The Future of Analog IC Technology® - 90 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2315GJ 1335 09-26-13 50 0 100 MP4026GJ 1335 09-26-13 50 0 100 FA NO. # of cycle MP9495DJ 1336 09-26-13 50 0 100 MP2161GJ 1336 09-26-13 50 0 100 MP2161GJ-C514 1336 09-26-13 50 0 100 MP2144GJ 1337 09-26-13 50 0 100 Total 2 4.8.3 Autoclave test Stress Duration: 48~168 hrs Stress Conditions: 121℃,100%RH,29.7psia Device D/C Close Date Sample Size # of Fail MP1472GJ 1249 07-11-13 50 0 168 MP1472GJ 1249 07-11-13 50 0 168 MP1472GJ 1226 07-09-13 50 0 168 MP1472GJ 1226 07-09-13 50 0 168 MP2314GJ 1303 07-23-13 87 0 168 MP1494DJ 1243 07-24-13 87 0 168 MP1494DJ 1247 07-24-13 87 0 168 MP157GJ 1309 07-24-13 97 0 168 MP157GJ 1243 07-19-13 87 0 168 MP1494DJ 1245 07-31-13 50 0 168 MP1494DJ 1245 07-31-13 50 0 168 MP1497DJ 1246 07-31-13 50 0 168 MP1497DJ 1250 07-31-13 50 0 168 MP1470GJ 1305 07-31-13 87 0 168 MP2122GJ 1327 09-04-13 97 0 168 MP1494DJ 1237 09-04-13 97 0 168 MP2318GJ 1322 09-03-13 97 0 168 MP1470GJ 1245 09-05-13 50 0 168 MP1470GJ 1245 09-05-13 50 0 168 MP2225GJ 1304 09-24-13 87 0 168 MP1497DJ 1316 10-09-13 97 0 168 MP1496DJ 1314 10-09-13 50 0 168 MP1496DJ 1318 10-09-13 50 0 168 FA NO. # of hrs MP1470GJ 1327 10-08-13 97 0 168 MP1470GJ-JC 1330 09-27-13 97 0 168 MP1494DJ-JC 1329 09-27-13 97 0 168 MP1494DJ 1331 09-18-13 97 0 168 MP1494DJ 1328 10-12-13 97 0 MP1472GJ-C452 1249 07-02-13 50 1 168 6678 48 The Future of Analog IC Technology® - 91 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2161GJ-C499 1305 08-14-13 50 0 48 MP1472GJ-C452 1252 07-02-13 50 0 48 MP1472GJ-C452 1312 07-02-13 100 0 48 MP2161GJ-C499 1311 08-14-13 50 0 48 MP2161GJ-C499 1313 08-14-13 50 0 48 MP1470GJ 1313 07-23-13 50 0 48 MP1495DJ 1315 07-01-13 50 0 48 MP1470GJ 1316 08-28-13 50 0 48 MP1470GJ 1316 08-28-13 50 0 48 MP1470GJ 1318 08-28-13 50 0 48 MP1495DJ 1316 07-04-13 50 0 48 MP1470GJ 1318 08-28-13 49 0 48 MP1496DJ 1319 08-15-13 50 0 48 MP1470GJ 1319 08-28-13 50 0 48 MP1470GJ 1318 08-28-13 50 0 48 MP1472GJ-C452 1320 07-31-13 50 0 48 MP1470GJ 1318 08-28-13 50 0 48 MP1494DJ 1319 07-16-13 50 0 48 MP1470GJ 1319 08-28-13 50 0 48 MP1470GJ 1318 08-28-13 50 0 48 FA NO. # of hrs MP2143DJ 1307 08-29-13 50 0 48 MP1470GJ 1320 08-28-13 50 0 48 MP2161GJ 1312 08-14-13 50 0 48 MP2161GJ 1322 08-14-13 50 0 48 MP1470GJ 1321 08-28-13 50 0 48 MP2161GJ 1317 08-14-13 50 0 48 MP1495DJ 1320 07-02-13 50 0 48 MP1471GJ 1323 07-23-13 50 0 48 MP1470GJ 1321 08-28-13 50 0 48 MP2161GJ 1322 08-14-13 50 0 48 MP2161GJ 1322 08-14-13 50 0 48 MP1470GJ 1321 08-28-13 50 0 48 MP2161GJ-C499 1322 08-14-13 50 0 48 MP1495DJ 1321 07-10-13 50 0 48 MP2234GJ 1323 09-02-13 50 0 48 MP2161GJ 1322 08-14-13 50 0 48 MP1494DJ 1321 07-01-13 50 0 48 MP1495DJ 1320 07-10-13 50 0 48 MP3414DJ 1324 07-01-13 50 0 48 MP2161GJ 1322 08-14-13 50 0 48 MP1470GJ 1323 08-28-13 50 0 48 MP1497DJ 1324 07-01-13 50 0 48 The Future of Analog IC Technology® - 92 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1495DJ 1320 08-14-13 50 0 48 MP3414DJ 1324 07-01-13 50 0 48 MP3414DJ 1324 07-01-13 50 0 48 MP1495DJ 1321 07-01-13 50 0 48 MP1494DJ 1310 07-01-13 50 0 48 MP1495DJ 1320 07-04-13 50 0 48 MP3414DJ 1324 07-04-13 50 0 48 MP2161GJ-C499 1324 08-14-13 50 0 48 MP1497DJ 1324 07-04-13 50 0 48 MP2315GJ 1325 07-04-13 50 0 48 MP3414DJ 1324 07-04-13 50 0 48 FA NO. # of hrs MP1495DJ 1320 07-04-13 50 0 48 MP2161GJ 1318 07-16-13 50 0 48 MP1496DJ 1324 07-04-13 50 0 48 MP1471GJ 1324 07-02-13 50 0 48 MP1472GJ-C452 1323 07-02-13 50 0 48 MP1475DJ 1316 07-03-13 50 0 48 MP2161GJ-C499 1318 08-14-13 50 0 48 MP2161GJ 1318 08-14-13 50 0 48 MP1495DJ 1320 07-04-13 50 0 48 MP2161GJ-C499 1318 08-14-13 50 0 48 MP2161GJ 1325 08-14-13 50 0 48 MP1470GJ 1325 08-28-13 50 0 48 MP1472GJ-C452 1325 07-10-13 50 0 48 MP1497DJ 1324 07-04-13 50 0 48 MP156GJ 1324 07-10-13 50 0 48 MP1496DJ 1324 07-10-13 50 0 48 MP1494DJ 1319 07-10-13 50 0 48 MP1494DJ 1319 07-10-13 50 0 48 MP1497DJ 1324 07-10-13 50 0 48 MP150GJ 1324 08-14-13 50 0 48 MP1472GJ-C452 1325 07-10-13 50 0 48 MP2161GJ-C499 1325 08-14-13 50 0 48 MP2161GJ 1325 08-14-13 50 0 48 MP2144GJ 1322 07-16-13 50 0 48 MP1470GJ 1325 07-23-13 50 0 48 MP2161GJ-C499 1325 08-14-13 50 0 48 MP1494DJ 1319 07-10-13 50 0 48 MP1495DJ-C494 1323 07-10-13 50 0 48 MP2161GJ 1325 08-14-13 50 0 48 MP3414DJ 1325 07-16-13 50 0 48 MP2228GJ 1319 07-16-13 50 0 48 The Future of Analog IC Technology® - 93 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1496DJ 1326 07-16-13 50 0 48 MP2161GJ-C499 1325 08-14-13 50 0 48 MP2161GJ-C499 1326 08-14-13 50 0 48 MP1470GJ 1326 07-23-13 50 0 48 MP2315GJ 1326 07-16-13 50 0 48 MP1496DJ 1326 07-16-13 50 0 48 MP3414DJ 1326 07-16-13 50 0 48 MP2161GJ-C499 1325 08-14-13 50 0 48 MP1496DJ 1326 07-16-13 50 0 48 MP1472GJ-C452 1325 07-11-13 50 0 48 MP2161GJ 1326 08-14-13 50 0 48 FA NO. # of hrs MP2161GJ 1326 08-14-13 50 0 48 MP2161GJ-C499 1325 08-14-13 50 0 48 MP2315GJ 1326 07-16-13 50 0 48 MP1494DJ 1323 07-16-13 50 0 48 MP2144GJ 1322 07-16-13 50 0 48 MP2161GJ 1324 08-14-13 50 0 48 MP1497DJ 1326 07-16-13 50 0 48 MP2161GJ-C499 1326 08-14-13 50 0 48 MP2122GJ 1326 07-18-13 50 0 48 MP2143DJ 1307 07-16-13 50 0 48 MP2161GJ-C499 1324 08-14-13 50 0 48 MP1472GJ-C452 1327 07-16-13 50 0 48 MP2234GJ 1327 07-18-13 50 0 48 MP1497DJ 1326 07-18-13 50 0 48 MP2314GJ 1327 07-18-13 50 0 48 MP1494DJ 1323 07-18-13 50 0 48 MP2161GJ-C499 1326 08-14-13 50 0 48 MP1470GJ 1325 07-23-13 50 0 48 MP1472GJ-C452 1327 07-18-13 50 0 48 MP1497DJ 1326 07-18-13 50 0 48 MP2161GJ 1325 08-14-13 50 0 48 MP2161GJ-C499 1326 08-14-13 50 0 48 MP3414DJ 1325 07-18-13 50 0 48 MP2122GJ 1327 07-23-13 50 0 48 MP1470GJ 1326 07-23-13 50 0 48 MP1494DJ 1323 07-23-13 50 0 48 MP3414DJ 1327 07-23-13 50 0 48 MP3414DJ 1324 07-23-13 50 0 48 MP3414DJ 1325 07-23-13 50 0 48 MP2314GJ 1328 07-25-13 50 0 48 MP2161GJ 1326 08-14-13 50 0 48 The Future of Analog IC Technology® - 94 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2161GJ 1325 08-14-13 50 0 48 MP1472GJ-C452 1327 07-23-13 50 0 48 FA NO. # of hrs MP1495DJ 1323 07-23-13 50 0 48 MP2161GJ 1326 08-14-13 50 0 48 MP2161GJ 1326 08-14-13 50 0 48 MP1472GJ-C452 1327 07-23-13 50 0 48 MP1497DJ 1327 07-25-13 50 0 48 MP2161GJ 1326 08-14-13 50 0 48 MP2161GJ 1326 08-14-13 50 0 48 MP1494DJ 1323 07-23-13 50 0 48 MP3414DJ 1327 07-25-13 50 0 48 MP1495DJ 1323 07-25-13 50 0 48 MP1494DJ 1323 07-25-13 50 0 48 MP3414DJ 1326 07-25-13 50 0 48 MP2161GJ 1327 08-14-13 50 0 48 MP1470GJ 1326 07-30-13 50 0 48 MP1472GJ-C452 1327 07-25-13 50 0 48 MP1497DJ 1327 07-25-13 50 0 48 MP2159GJ 1318 07-25-13 50 0 48 MP2161GJ 1328 08-14-13 50 0 48 MP1472GJ-C452 1328 07-25-13 50 0 48 MP2161GJ-C499 1326 08-14-13 50 0 48 MP2161GJ-C499 1327 08-14-13 50 0 48 MP24892DJ 1327 07-25-13 50 0 48 MP2161GJ 1325 08-14-13 50 0 48 MP1495DJ 1323 07-30-13 50 0 48 MP1471GJ 1327 07-30-13 50 0 48 MP1497DJ 1327 07-30-13 50 0 48 MP2161GJ-C499 1328 08-14-13 50 0 48 MP1474DJ 1327 07-30-13 50 0 48 MP2161GJ-C499 1327 08-14-13 50 0 48 MP3414DJ 1328 07-30-13 50 0 48 MP1472GJ-C452 1328 07-30-13 50 0 48 MP1496DJ 1327 07-30-13 50 0 48 MP3414DJ 1328 07-30-13 50 0 48 MP2315GJ 1329 07-30-13 50 0 48 MP1472GJ-C452 1328 07-30-13 50 0 48 MP1472GJ 1317 08-01-13 50 0 48 MP1494DJ 1323 07-30-13 50 0 48 MP1495DJ 1323 08-07-13 50 0 48 MP2161GJ 1326 08-14-13 50 0 48 MP1496DJ 1327 08-01-13 50 0 48 The Future of Analog IC Technology® - 95 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1495DJ 1323 07-30-13 50 0 48 MP1474DJ 1317 08-07-13 50 0 48 MP1472GJ-C452 1328 08-01-13 50 0 48 MP2161GJ-C499 1328 08-14-13 50 0 48 MP2161GJ 1327 08-14-13 50 0 48 MP2161GJ-C499 1328 08-14-13 50 0 48 MP2161GJ 1329 08-14-13 50 0 48 MP1495DJ 1323 08-07-13 50 0 48 MP1495DJ 1323 08-07-13 50 0 48 MP1472GJ 1324 08-01-13 50 0 48 MP1494DJ 1323 08-07-13 50 0 48 MP2161GJ-C499 1326 08-14-13 50 0 48 MP1472GJ-C452 1329 08-01-13 50 0 48 MP2161GJ-C499 1328 08-14-13 50 0 48 MP1470GJ 1327 08-07-13 50 0 48 FA NO. # of hrs MP3414DJ 1328 08-01-13 50 0 48 MP2161GJ 1326 08-14-13 50 0 48 MP1474DJ 1317 08-07-13 50 0 48 MP1495DJ 1329 08-07-13 50 0 48 MP2161GJ-C499 1328 08-14-13 50 0 48 MP2161GJ 1326 08-14-13 50 0 48 MP1472GJ 1328 08-07-13 50 0 48 MP1496DJ 1329 08-07-13 50 0 48 MP2161GJ-C499 1329 08-14-13 50 0 48 MP156GJ 1329 08-07-13 50 0 48 MP1472GJ-C452 1328 08-07-13 50 0 48 MP1495DJ 1323 08-07-13 50 0 48 MP1495DJ 1323 08-07-13 50 0 48 MP1472GJ-C452 1330 08-07-13 50 0 48 MP1495DJ 1329 08-14-13 50 0 48 MP2315GJ 1330 08-07-13 50 0 48 MP1495DJ 1323 08-14-13 50 0 48 MP1472GJ-C452 1330 08-14-13 50 0 48 MP1498DJ-C532 1307 08-14-13 50 0 48 MP2161GJ-C499 1329 09-10-13 50 0 48 MP1470GJ 1327 08-14-13 50 0 48 MP4026GJ 1329 08-14-13 50 0 48 MP1497DJ 1329 08-14-13 50 0 48 MP1494DJ 1326 08-14-13 50 0 48 MP2161GJ-C499 1329 09-10-13 50 0 48 MP9495DJ 1319 08-14-13 50 0 48 MP1470GJ 1327 09-05-13 50 0 48 The Future of Analog IC Technology® - 96 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1472GJ 1323 08-20-13 50 0 48 MP3414DJ 1332 08-23-13 50 0 48 MP1470GJ 1331 08-23-13 50 0 48 MP1472GJ 1330 08-23-13 50 0 48 MP150GJ 1324 08-23-13 50 0 48 MP1470GJ 1328 08-23-13 50 0 48 MP2315GJ 1331 08-28-13 50 0 48 MP2143DJ-C463 1330 08-28-13 50 0 48 MP1495DJ 1332 08-28-13 50 0 48 MP1495DJ 1332 09-09-13 50 0 48 MP1494DJ 1323 08-23-13 50 0 48 MP1496DJ 1324 08-28-13 50 0 48 MP1495DJ 1332 09-18-13 50 0 48 MP1494DJ 1326 08-23-13 50 0 48 MP1471GJ 1328 08-28-13 50 0 48 FA NO. # of hrs MP1470GJ 1329 08-23-13 50 0 48 MP1472GJ-C452 1331 08-28-13 50 0 48 MP2315GJ 1332 08-28-13 50 0 48 MP3414DJ 1332 08-28-13 50 0 48 MP1470GJ 1331 08-28-13 50 0 48 MP1494DJ 1323 08-28-13 50 0 48 MP2161GJ 1328 08-28-13 50 0 48 MP2315GJ 1331 09-12-13 50 0 48 MP9495DJ 1332 08-28-13 50 0 48 MP3414DJ 1333 08-28-13 50 0 48 MP1472GJ-C452 1331 08-28-13 50 0 48 MP2315GJ 1329 08-28-13 50 0 48 MP1470GJ 1332 08-28-13 50 0 48 MP1494DJ 1323 08-28-13 50 0 48 MP3414DJ 1333 08-28-13 50 0 48 MP2315GJ 1331 08-28-13 50 0 48 08-28-13 50 0 48 0 48 MP1472GJ-C452 MP1496DJ 1333 08-28-13 50 MP2161GJ 1331 08-28-13 50 0 48 MP9495DJ 1332 08-28-13 50 0 48 MP2161GJ 1331 08-28-13 50 0 48 MP1496DJ 1331 08-29-13 50 0 48 MP1471GJ 1332 08-29-13 50 0 48 MP1494DJ 1332 08-29-13 50 0 48 MP3414DJ 1333 08-29-13 50 0 48 MP2161GJ 1331 08-29-13 50 0 48 MP1498DJ-C532 1332 08-29-13 50 0 48 The Future of Analog IC Technology® - 97 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP2143DJ 1333 08-29-13 50 0 48 MP9495DJ 1333 08-29-13 50 0 48 MP1472GJ 1330 08-29-13 50 0 48 MP2161GJ 1331 08-29-13 50 0 48 MP1470GJ 1328 08-29-13 50 0 48 MP2315GJ 1331 08-29-13 50 0 48 MP1496DJ 1333 08-29-13 50 0 48 MP2161GJ 1329 08-29-13 50 0 48 MP3414DJ 1333 08-30-13 50 0 48 MP1470GJ 1333 08-30-13 50 0 48 MP2234GJ 1333 08-30-13 50 0 48 MP1471GJ 1333 08-30-13 50 0 48 MP1494DJ 1333 08-30-13 50 0 48 MP1470GJ 1333 09-05-13 50 0 48 MP1474DJ 1332 09-05-13 50 0 48 FA NO. # of hrs MP1497DJ 1331 09-05-13 50 0 48 MP1471GJ 1331 09-05-13 50 0 48 MP2143DJ 1333 09-05-13 50 0 48 MP2122GJ 1333 09-05-13 50 0 48 MP1494DJ 1333 09-05-13 50 0 48 MP1495DJ 1321 09-05-13 50 0 48 MP1471GJ-C519 1333 09-05-13 50 0 48 MP1472GJ 1329 09-05-13 50 0 48 MP2235GJ 1333 09-05-13 50 0 48 MP1495DJ 1319 09-05-13 50 0 48 MP2161GJ-C514 1334 09-05-13 50 0 48 MP2143DJ 1333 09-05-13 50 0 48 MP2122GJ 1333 09-09-13 50 0 48 MP2161GJ 1334 09-05-13 50 0 48 MP2161GJ 1334 09-05-13 50 0 48 MP2315GJ 1332 09-05-13 50 0 48 MP3414DJ 1334 09-09-13 50 0 48 MP1472GJ-C452 1328 09-05-13 50 0 48 MP2161GJ-C499 1334 09-09-13 50 0 48 MP3414DJ 1334 09-09-13 50 0 48 MP1472GJ-C452 1329 09-05-13 50 0 48 MP1496DJ 1331 09-09-13 50 0 48 MP4027GJ 1329 09-09-13 50 0 48 MP1470GJ 1332 09-09-13 50 0 48 MP2235GJ 1334 09-09-13 50 0 48 MP2314GJ 1334 09-09-13 50 0 48 MP1494DJ 1333 09-09-13 50 0 48 The Future of Analog IC Technology® - 98 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP1471AGJ 1334 09-09-13 50 0 48 MP4026GJ 1334 09-09-13 50 0 48 MP1494DJ 1323 09-09-13 50 0 48 MP1495DJ 1323 09-09-13 50 0 48 MP1470GJ 1332 09-09-13 50 0 48 MP1470GJ 1334 09-09-13 50 0 48 MP1494DJ 1326 09-09-13 50 0 48 MP1475DJ 1333 09-09-13 50 0 48 MP3414DJ 1334 09-09-13 50 0 48 MP4026GJ 1335 09-09-13 50 0 48 MP2315GJ 1334 09-10-13 50 0 48 MP1494DJ 1333 09-09-13 50 0 48 MP3414DJ 1334 09-09-13 50 0 48 MP2161GJ 1335 09-10-13 50 0 48 MP1495DJ 1319 09-12-13 50 0 48 MP1496DJ 1333 09-12-13 50 0 48 MP1498DJ 1335 09-12-13 50 0 48 MP2314GJ 1333 09-10-13 50 0 48 MP1494DJ 1333 09-12-13 50 0 48 MP2161GJ 1334 09-18-13 50 0 48 MP2143DJ 1335 09-18-13 50 0 48 MP3414DJ 1334 09-10-13 50 0 48 MP1496DJ 1332 09-12-13 50 0 48 MP1495DJ 1321 09-12-13 50 0 48 MP2122GJ 1335 09-18-13 50 0 48 MP2143DJ 1335 09-12-13 50 0 48 MP2161GJ 1335 09-12-13 50 0 48 MP1472GJ 1331 09-18-13 50 0 48 FA NO. # of hrs MP3414DJ 1335 09-12-13 50 0 48 MP2161GJ 1335 09-12-13 50 0 48 MP2143DJ 1335 09-12-13 50 0 48 MP4026GJ 1335 09-12-13 50 0 48 MP9495DJ 1334 09-18-13 50 0 48 MP1470GJ 1332 09-12-13 50 0 48 MP2315GJ 1334 09-23-13 50 0 48 MP2315GJ 1335 09-18-13 50 0 48 MP9495DJ 1333 09-18-13 50 0 48 MP1496DJ 1333 09-27-13 50 0 48 MP3414DJ 1335 09-18-13 50 0 48 MP156GJ 1335 09-13-13 50 0 48 MP2315GJ 1334 09-13-13 50 0 48 MP9495DJ 1334 09-23-13 50 0 48 The Future of Analog IC Technology® - 99 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Device D/C Close Date Sample Size # of Fail MP3414DJ 1335 09-18-13 50 0 48 MP2161GJ 1335 09-23-13 50 0 48 MP1495DJ 1323 09-23-13 50 0 48 MP1470GJ 1332 09-18-13 50 0 48 FA NO. # of hrs MP2122GJ 1335 09-23-13 50 0 48 MP1471AGJ 1336 09-23-13 50 0 48 MP3414DJ 1335 09-18-13 50 0 48 MP1494DJ 1335 09-23-13 50 0 48 MP2161GJ 1335 09-18-13 50 0 48 MP1495DJ 1335 09-26-13 50 0 48 MP2161GJ-C514 1336 09-18-13 50 0 48 MP2315GJ 1334 09-18-13 50 0 48 MP1496DJ 1336 09-23-13 50 0 48 MP2144GJ 1333 09-23-13 50 0 48 MP1470GJ 1332 09-23-13 50 0 48 MP2143DJ 1336 09-26-13 50 0 48 MP2161GJ 1336 09-23-13 50 0 48 MP3414DJ 1335 09-23-13 50 0 48 MP1494DJ 1309 09-23-13 50 0 48 MP1470GJ 1333 09-23-13 50 0 48 MP1472GJ 1332 09-23-13 50 0 48 MP1498DJ 1336 09-23-13 50 0 48 MP1496DJ 1333 09-23-13 50 0 48 MP2161GJ 1336 09-23-13 50 0 48 MP1494DJ 1306 09-23-13 50 0 48 MP1470GJ 1333 09-23-13 50 0 48 MP1470GJ 1333 09-26-13 50 0 48 MP2161GJ 1336 09-26-13 50 0 48 MP2143DJ 1336 09-26-13 50 0 48 MP2161GJ-C514 1336 09-26-13 50 0 48 MP2315GJ 1335 09-26-13 50 0 48 MP4026GJ 1335 09-26-13 50 0 48 MP9495DJ 1336 09-26-13 50 0 48 MP2161GJ 1336 09-26-13 50 0 48 MP2161GJ-C514 1336 09-26-13 50 0 48 MP2144GJ 1337 09-26-13 50 0 48 Total 1 The Future of Analog IC Technology® - 100 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT 4.8.4 HAST Stress Duration: 96 hrs Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max; Device D/C Close Date Sample Size # of Fail MP2314GJ 1312 07-23-13 102 0 MP3221GJ 1309 07-18-13 95 0 MP157GJ 1309 07-24-13 99 0 MP1494DJ 1243 07-24-13 90 0 MP1494DJ 1247 07-24-13 90 0 MP2225GJ 1304 09-24-13 101 0 MP1494DJ 1316 09-17-13 101 0 MP1497DJ 1316 10-09-13 100 0 MP1496DJ 1314 10-09-13 50 0 MP1496DJ 1318 10-09-13 50 0 MP1470GJ 1327 10-08-13 92 0 MP1494DJ 1331 09-18-13 102 0 Total FA NO. 0 The Future of Analog IC Technology® - 101 - MONOLITHIC POWER SYSTEMS Q3 2013 PRODUCT RELIABILITY REPORT Monolithic Power Systems (Chengdu) Co., Ltd. No.8 Kexin Rd. West Park of Export Processing Zone, West Hi-Tech Zone, Chengdu, Sichuan 611731 Tel: 86-28-87303000 Fax: 86-28-87303060 www.monolithicpower.com The Future of Analog IC Technology® - 102 -