2013 Q3 Reliability Quarterly Report Overview

QUARTERLY RELIABILITY MONITOR
REPORT
Q3, Jul. ~ Sept. 2013
Prepared by MPSCD Reliability Engineering
The Future of Analog IC Technology®
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
INDEX
1.0 INTRODUCTION ......................................................................................2
1.1 SHORT TERM RELIBILITY MONITORING ........................................................................................................................ 2
1.2 LONG TERM RELIBILITY MONITORING ........................................................................................................................... 2
2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS.........................3
3.0 PROCESS RELIABILITY MONITORING DATA ......................................4
3.1 BCM12B Process Technology ................................................................................................................................................ 4
3.2 BCM12S Process Technology ................................................................................................................................................ 6
3.3 BCM35 Process Technology ................................................................................................................................................ 10
3.4 BCM05 Process Technology ................................................................................................................................................ 11
3.5 BCM18 Process Technology ................................................................................................................................................ 12
4.0 PACKAGE RELIABILITY MONITORING DATA ....................................13
4.1 QFN .................................................................................................................................................................................................. 13
4.2 SOIC ................................................................................................................................................................................................ 26
4.3 MSOP .............................................................................................................................................................................................. 36
4.4 TSOT ............................................................................................................................................................................................... 38
4.5 TSSOP ............................................................................................................................................................................................ 42
4.6 FLIP CHIP-QFN ......................................................................................................................................................................... 44
4.7 FLIP CHIP-SOIC........................................................................................................................................................................ 72
4.8 FLIP CHIP-TSOT ...................................................................................................................................................................... 79
The Future of Analog IC Technology®
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MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
1.0 INTRODUCTION
This report summarizes the reliability testing results for MPS products as of Q3 2013.
1.1 SHORT TERM RELIBILITY MONITORING
The short term monitoring runs on a daily basis. It provides a fast alert in case of changes in term of product
reliability performance.
Stress Test Name
Test Condition
Duration
JEDEC
EARLY LIFE
125°C, Vccmax
48 ~168 hrs
JESD22-A108
Convection Reflow
260°C
3 times
JESD22-A113
Temperature Cycle
Cond C:-65℃ ~ 150℃
100~200Cycles
JESD22-A104
Autoclave
121°C /100%RH
48~96 hrs
JESD22-A102
1.2 LONG TERM RELIBILITY MONITORING
The long term monitoring runs on a quarterly basis. It provides the life stresses for periods long enough to
provide the data necessary to calculate the steady state failure rates of products.
Stress Test Name
Test Condition
Duration
JEDEC
HTOL
125°C, Vccmax
1000 hrs
JESD22-A108
HTSL
150°C
1000 hrs
JESD22-A103
Precondition
/
/
JESD22-A113
Autoclave
121°C /100%RH
168 hrs
JESD22-A102
Temperature Cycle
Cond C:-65°C ~ 150°C
1000 Cycles
JESD22-A104
85°C, 85% R.H., VDD
1000 hrs
JESD22-A101
130°C, 85% R.H., VDD
96 hrs
JESD22-A110
Temperature Humidity Bias
(THB)
High Accelerated Stress Test
(HAST)
The Future of Analog IC Technology®
-2-
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
2.0 FAILURE RATE CALCULATIONS AND PREDICTIONS
The long-term failure rate for a technology is gauged by a Failures In Time (FIT) calculation based upon
accelerated stress data. The units for FIT are failures per Billion device hours.
( χ / 2) *10
2
FITRate =
9
stress * device hours
The stress that enables FIT is High Temperature Operating Life (HTOL), which is a product level test. HTOL
is accelerated by temperature and by voltage. The total number of failures in stress determines the
chi-squared factor (a dimensionless number representing a 60% confidence level of statistics). The number
of product units times the stress period (in Hours) is the device-Hours number. The Arrhenius equation uses
the Activation energy for the fail mode as well as the stress temperature and the reporting temperature (e.g.
55℃) to compute the HTOL temperature acceleration factor, AF(T). The accelerated stress device-Hours is
AF(T) times the device-Hours number. AFv= Exp(β(Vtest- Vuse), Vtest = Stress Voltage (V).Vuse = Nominal
Voltage (V).β = Voltage Acceleration Constant (usually, 0.5 < Z < 1.0).
The Future of Analog IC Technology®
-3-
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
3.0 PROCESS RELIABILITY MONITORING DATA
3.1 BCM12B Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
HHNEC, ASMC,SMIC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP2119DQ
C587164.7H
1309
07-12-13
79
168
0
MP2119DQ
C587164.7M
1309
07-12-13
79
168
0
MP2119DQ
C587164.7L
1309
07-12-13
79
168
0
MP2104DJ
D289876.9BT
1317
07-01-13
90
168
0
MP5414AGV
B672494.9
1205
07-17-13
80
168
0
MP2119DQ
C586776.7
1227
09-05-13
50
168
0
MP2119DQ
C586790.7
1233
09-05-13
50
168
0
MP28223DD
FA342758
1321
09-11-13
100
168
0
MP2359DJ
B9955700
1325
10-09-13
80
168
0
MP4030GS
CB89055.9
1313
07-01-13
80
48
0
MP1591DN
C988671.7
1313
09-02-13
80
48
0
NB600CQ
C572828.7
1314
07-10-13
80
48
0
MP1484EN-C166
C687569.7
1302
07-01-13
80
48
0
MP8903DJ-3.3
B482162.7C
1314
07-16-13
80
48
0
MP1530DQ
CA82809.8A
1319
08-16-13
80
48
0
MP1530DQ
CA82809.8B
1317
08-20-13
80
48
0
MP1015EF
8379756.9B
1319
07-04-13
80
48
0
MP1530DQ
D480436.9B
1323
08-28-13
80
48
0
MP1530DQ
D580695.8A
1324
08-23-13
80
48
0
MP1482DN
D480346.7
1324
07-02-13
78
48
0
MP1482DN
D480345.7
1324
07-02-13
80
48
0
MP1482DN
D480273.9
1324
07-02-13
80
48
0
MP1482DN
D480321.9
1324
07-02-13
78
48
0
MP2105DK
CA88937.9A
1322
07-23-13
80
48
0
MP1484EN-C166
D480594.7
1324
07-23-13
80
48
0
MP1530DQ
D580780.8A
1326
08-14-13
80
48
0
MP8001DS
C486699.7
1317
08-07-13
80
48
0
MP2105DK
C285714.7
1227
08-07-13
80
48
0
MP8001DS
D189462.7
1329
09-09-13
80
48
0
MP1411DH
C586900.7
1334
09-09-13
80
48
0
MPQ4456GQT
C772927.8C
1303
07-26-13
77
48
0
The Future of Analog IC Technology®
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FA No.
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MPQ4456GQT
CC72325.9A
1309
07-18-13
77
48
0
MP8903DJ-3.3
B482163.7G
1305
07-10-13
80
48
0
MP8903DJ-3.3
B482331.7
1218
09-02-13
80
48
0
MP4459DQT
C972086.7
1303
07-04-13
78
48
0
MP8903DJ-3.3
B482472.7A
1319
09-23-13
80
48
0
MP4459DQT
CB72168.9
1309
07-03-13
78
48
0
MP4459DQT
D472664.7
1324
07-10-13
77
48
0
MP4459DQT
D472667.9
1324
07-18-13
77
48
0
MP7731DF
CB72236.9D
1321
07-10-13
80
48
0
MPQ8903DJ-3.3
B482472.7D
1323
09-10-13
80
48
0
MP4458DQT
D472780.7A
1328
07-30-13
77
48
0
MP4460DQ
D472802.7
1328
08-07-13
77
48
0
MP4459DQT
D472780.7B
1328
08-14-13
77
48
0
MPQ4560DQ
D472724.7A
1327
08-16-13
76
48
0
MPQ8903DJ-3.3
B682932.7A
1329
09-18-13
80
48
0
MP7731DF
D472809.9A
1330
08-20-13
80
48
0
MP8903DJ-3.3
B382039.9C
1328
08-28-13
79
48
0
MPQ4560DQ
D672095.7B
1331
08-28-13
76
48
0
MPQ4560DQ
D472808.7B
1328
09-05-13
75
48
0
MPQ4462DQ-AEC1
D672137.9
1334
09-10-13
77
48
0
Total
FA No.
0
LONG TERM LIFE (HTOL Long Term Monitor)
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MPQ4566GD-AEC1
EP289800
1309
10-09-13
80
0
MPQ4566GD-AEC1
EP289803
1309
10-09-13
80
0
MP1584EN
D189503.9Q
1314
09-11-13
80
0
MPQ1530DQ-AEC1
FA342746
1319
10-09-13
80
0
MPQ1530DQ-AEC1
FA342746B
1330
10-09-13
80
0
Total
0
BCM12B
#fail
#device hours
Accel Factor
FIT Rate
0
400000
348
6.9
The Future of Analog IC Technology®
-5-
FA No.
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP2119DQ
C587164.7H
1309
07-12-13
50
0
MP2119DQ
C587164.7M
1309
07-12-13
50
0
MP2119DQ
C587164.7L
1309
07-12-13
50
0
MP2209DL
C988551.1AH
1309
07-12-13
50
0
MP2209DL
C988551.1AM
1309
07-12-13
50
0
MP2209DL
C988551.1AL
1309
07-12-13
50
0
MP2109DQ
D289752.1AQ
1317
07-03-13
50
0
MP5414AGV
B672494.9R0
1205
07-17-13
50
0
MP2119DQ
C586776.7
1227
09-05-13
50
0
MP2119DQ
C586790.7
1233
09-05-13
46
0
MPQ2489DQ-AEC1
B9398200
1301
10-12-13
47
0
MPQ2489DQ-AEC1
B965700
1303
10-12-13
50
0
MPQ2489DQ-AEC1
B9677100
1309
10-12-13
50
0
MPQ4566GD-AEC1
EP289800
1309
10-09-13
47
0
MPQ1530DQ-AEC1
FA342746B
1330
10-09-13
47
0
MP2359DJ
B9955700
1325
10-09-13
50
0
MP1484EN
D681125.7
1330
09-26-13
50
0
Total
FA No.
0
3.2 BCM12S Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
HHNEC, ASMC,SMIC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax @ 125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP8708EN
HP3299
1311
07-10-13
80
168
0
MP8706EN
D189489.9
1318
07-16-13
160
168
0
MP28256EL
CA88725.7
1313
07-08-13
78
168
0
MP28252EL
C145089.9
1218
07-11-13
50
168
0
MP28252EL
C346428.9A
1226
07-11-13
50
168
0
MP3389EF
D189469.9DT
1317
07-25-13
80
168
0
MP1482DS
C346863.8QA
1203
07-24-13
80
168
0
MP1482DS
C346863.8QB
1223
07-24-13
80
168
0
The Future of Analog IC Technology®
-6-
FA No.
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP1482DS
D289832.8Y
1316
07-24-13
80
168
0
MP3388DR
C586837.1CH
1309
07-30-13
80
168
0
MP3388DR
C586837.1CM
1309
07-30-13
80
168
0
MP3388DR
C586837.1CL
1309
07-30-13
80
168
0
MP1494DJ
C872955.8A
1245
07-31-13
50
168
0
MP1494DJ
C872957.8
1245
07-31-13
50
168
0
MP8736DL
C888292.8A
1249
09-09-13
50
168
0
MP8736DL
C888200.8
1249
09-09-13
50
168
0
MP3388DR
HL2643
1247
10-09-13
80
168
0
MP3388DR
HL264302
1247
10-09-13
50
168
0
MP3391EF
CB72193.1
1324
10-09-13
80
168
0
MP1495DJ
C872966.8
1306
07-01-13
80
48
0
MP1494DJ
C872968.8
1301
07-01-13
80
48
0
MP1494DJ
C872965.8A
1306
07-01-13
80
48
0
MP1494DJ
C94G691.8
1309
07-01-13
80
48
0
MP1495DJ
CA4H765.8
1309
07-01-13
80
48
0
NB637EL
C64B156.9A
1238
08-01-13
78
48
0
MP28254EL
D189452.1A
1313
07-18-13
80
48
0
MP28254EL
D189497.1
1313
07-18-13
80
48
0
MP3388DR-C414
D189587.7
1314
07-10-13
80
48
0
MP28256EL
CA88726.7
1314
07-04-13
80
48
0
MP8705EN
CB4L073.9
1306
07-04-13
80
48
0
MP1495DJ
CA4H620.8A
1316
07-18-13
80
48
0
MP1495DJ
C94H383.8A
1316
07-04-13
80
48
0
MP1495DJ
D14M852.8A
1320
07-02-13
80
48
0
MP1495DJ
D14N765.8A
1321
07-10-13
80
48
0
MP8736DL
CC89300.8
1322
07-01-13
80
48
0
MP1495DJ
D14N762.8A
1320
07-10-13
80
48
0
MP1495DJ
D14N762.8
1320
08-14-13
80
48
0
MP6002DN
9581388.9B
1326
07-16-13
75
48
0
MP1495DJ
D24P282.8
1323
08-07-13
78
48
0
MP1495DJ
D24P283.8
1323
08-07-13
78
48
0
MP1495DJ
D34Q759.8
1329
08-14-13
78
48
0
MP1495DJ
D44S418.8A
1332
08-28-13
80
48
0
MP1495DJ
D44S042.8A
1332
09-09-13
80
48
0
MP1495DJ
D44S043.8
1332
09-18-13
80
48
0
MP6002DN
9685969.7
1328
08-30-13
70
48
0
MP2315GJ
D580847.8
1331
09-12-13
80
48
0
MP2315GJ
D580965.8
1334
09-23-13
80
48
0
MP2315GJ
D580845.8
1335
09-18-13
80
48
0
MP1495DJ
D44S422.8Y
1335
09-26-13
79
48
0
MPQ8632GL-8
C582657.8Y
1251
07-03-13
80
48
0
The Future of Analog IC Technology®
-7-
FA No.
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MPQ28261DL
CB89058.1BY
1320
07-30-13
80
48
0
MPQ28261DL
CA89004.9BY
1326
08-06-13
78
48
0
MPQ4470GL
D480529.8A
1329
08-07-13
80
48
0
MPQ28261DL
CA89003.9Y
1328
08-07-13
79
48
0
MPQ8904DD-AEC1
C772923.8
1236
08-16-13
80
48
0
MPQ28261DL
CB89057.9Y
1329
08-16-13
79
48
0
MPQ28261DL
CB89059.9Y
1329
08-30-13
78
48
0
MPQ28261DL
CB89056.9Y
1328
09-05-13
78
48
0
MPQ28261DL
CB89058.9
1333
09-05-13
78
48
0
MPQ28261DL
B882415.9AY
1333
09-10-13
78
48
0
MP3389EF
CB89067.1
1316
05-29-13
80
48
0
MP3394EF
CB4L149.9A
1317
05-16-13
80
48
0
MP8706EN
D189485.9
1316
05-27-13
80
48
0
MP28255EL
D44R792.9A
1321
06-18-13
79
48
0
MP6002DN
9685967.7A
1320
06-18-13
75
48
0
MP8736DL
CC89293.8
1318
06-26-13
80
48
0
Total
FA No.
0
LONG TERM LIFE (HTOL Long Term Monitor)
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP28253EL
C486546.9AQ
1230
10-30-13
78
0
MP1492DS
CC89314.8A
1312
07-10-13
88
0
MP3389EF
D189468.1BT
1315
07-25-13
80
0
MPQ4470GL-AEC1
EP255406
1237
07-24-13
79
0
MP2314GJ
EP266705
1303
07-23-13
83
0
MP2314GJ
EP266704
1312
07-23-13
88
0
MPQ8904DD-AEC1
FA272923C
1248
07-24-13
79
0
MPQ4470GL-AEC1
EP270601
1247
07-22-13
79
0
MPQ4470GL-AEC1
EP270602
1249
07-22-13
80
0
MP1400GC-ST
EP2976R0
1315
07-24-13
79
0
MP3388DR
HL264301
1247
10-09-13
80
0
MP2615GV
EP291500
1316
09-11-13
80
0
Total
0
BCM12S
#fail
#device hours
Accel Factor
FIT Rate
0
973000
348
2.8
The Future of Analog IC Technology®
-8-
FA No.
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP28258DD
C447340.8A
1227
07-05-13
50
0
MP28258DD
C447877.8A
1229
07-05-13
50
0
MP1472GJ
C84G049.8
1249
07-11-13
47
0
MP1472GJ
C94G415.8
1249
07-11-13
47
0
MPQ8632GL-10
C882750.8A
1243
07-05-13
47
0
MPQ8632GL-10
C982765.8A
1247
07-05-13
47
0
MP4012DS
C782699.1B
1316
07-10-13
50
0
MP1472GJ
C448218.8
1226
07-09-13
50
0
MP1472GJ
C448173.8
1226
07-09-13
50
0
MP28258DD
C185020.8
1214
07-10-13
49
0
MP28258DD
C285251.8
1218
07-10-13
50
0
MP28252EL
C145089.9
1218
07-11-13
50
0
MP28252EL
C346428.9A
1226
07-11-13
50
0
MP3399EY
D14N498.9
1311
07-24-13
47
0
MP3399EY
D14N009.9
1310
07-24-13
47
0
MP1482DS
C346863.8QA
1203
07-24-13
50
0
MP1482DS
C346863.8QB
1223
07-24-13
50
0
MPQ4470GL-AEC1
EP255406
1237
07-24-13
47
0
MP1494DJ
HP300859
1243
07-24-13
50
0
MP1494DJ
HP300865
1247
07-24-13
50
0
MPQ2459GJ-ACQ10
EP268400
1243
07-24-13
50
0
MPQ4470GL-AEC1
EP270601
1247
07-22-13
50
0
MPQ4470GL-AEC1
EP270602
1249
07-22-13
50
0
MP1482DS
D289832.8Y
1316
07-24-13
50
0
MP3388DR
C586837.1CH
1309
07-30-13
50
0
MP3388DR
C586837.1CM
1309
07-30-13
50
0
MP3388DR
C586837.1CL
1309
07-30-13
50
0
MP1400GC-ST
EP2976
1315
07-24-13
50
0
MP1494DJ
C872955.8A
1245
07-31-13
47
0
MP1494DJ
C872957.8
1245
07-31-13
47
0
MP1497DJ
C372425.8A
1246
07-31-13
50
0
MP1497DJ
C572761.8
1250
07-31-13
50
0
MP1482DS-C165
C245633.8
1246
07-31-13
50
0
MP3389EY
CA4J542.1
1311
07-24-13
47
0
MP3389EY
CA88821.1
1310
07-24-13
47
0
MP1494DJ
HP300821
1237
09-04-13
50
0
MP2318GJ
EP293104
1322
09-03-13
50
0
MP8736DL
C888292.8A
1249
09-09-13
50
0
MP8736DL
C888200.8
1249
09-09-13
50
0
*
The Future of Analog IC Technology®
-9-
FA No.
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
C888200.8
1249
09-09-13
50
0
MP6922AGN
FA222077C
1321
10-09-13
50
0
MP6922AGN
FA222077C
1325
10-09-13
50
0
MP86884DQKT
CA72137.8A
1311
09-18-13
50
0
MP86884DQKT
CA72137.8B
1311
09-18-13
50
0
MP1496DJ
CC4M447.8AQ
1314
10-09-13
47
0
MP1496DJ
D14N454.8
1318
10-09-13
47
0
MP28259DD
D189507.8
1318
10-09-13
47
0
MP28259DD
D189648.8A
1321
10-09-13
47
0
MP3391EF
CB72193.1
1324
10-09-13
50
0
MP1494DJ
D34Q676.8AY
1328
10-12-13
50
0
Total
FA No.
0
3.3 BCM35 Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
ASMC,SMIC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax @ 125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP5000SDQ
C943132.8AA
1315
07-10-13
80
168
0
MP5010ADQ
CA43183.9
1313
07-09-13
80
168
0
MP1470GJ
C642993.8BA
1245
09-05-13
50
168
0
MP1470GJ
C642993.8BB
1245
09-05-13
50
168
0
MP2617AGL
D44S427.8
1325
10-09-13
50
168
0
MP2617AGL
D143347.8C
1319
10-09-13
50
168
0
MP5010ADQ
D34R696.8B
1321
07-23-13
50
48
0
MP2161GJ
D24Q208.8Y
1318
07-16-13
80
48
0
Total
FA No.
0
LONG TERM LIFE (HTOL Long Term Monitor)
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP5000ADQ
HP313204
1322
09-02-13
78
0
Total
0
BCM35
#fail
#device hours
Accel Factor
FIT Rate
0
78
348
35
The Future of Analog IC Technology®
- 10 -
FA No.
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP3398GF
HP306405
1238
07-10-13
50
0
MP5000SDQ
C943132.8AA
1315
07-10-13
50
0
MP5010ADQ
CA43183.9
1313
07-09-13
50
0
MP3398LGS
HP335802
1309
07-23-13
48
0
MP5506GL
EP253302
1230
07-19-13
47
0
MP2625GL
HP315103
1304
07-31-13
50
0
MP8843GG-JC
HP3231.05
1308
09-03-13
50
0
MP1470GJ
C642993.8BA
1245
09-05-13
47
0
MP1470GJ
C642993.8BB
1245
09-05-13
47
0
MP8845GC
HP2883R6
1311
10-12-13
50
0
MP8845BGC
HP2883R4
1303
10-12-13
50
0
MP2617AGL
D44S427.8
1325
10-09-13
47
0
MP2617AGL
D143347.8C
1319
10-09-13
47
0
MP3394SGS
D54T477.8A
139
10-09-13
50
0
Total
FA No.
0
3.4 BCM05 Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
ASMC,HHNEC
EARLY LIFE (HTOL Short Term Monitor)
Stress Duration: 48 ~168 hours
Test Condition: Vccmax @ 125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of hrs
# of
Fail
MP6400DJ-9
EP265801
1230
07-24-13
92
168
0
Total
FA No.
0
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
MP62040DQFU-E
B672586.9Q
1316
07-31-13
50
0
Total
0
The Future of Analog IC Technology®
- 11 -
FA No.
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
3.5 BCM18 Process Technology
The data in the tables that follow was generated as the result of an on-going Process Reliability Monitor.
The specific fab locations included in this process monitor are:
SMIC
LONG TERM LIFE (HTOL Long Term Monitor)
Stress Duration: 1000 hours
Test Condition: Vccmax @125°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
NB675GL
HP3318
1311
10-09-13
80
0
NB677GQ
HP3573
1331
10-12-13
77
0
Total
FA No.
0
BCM35
#fail
#device hours
Accel Factor
FIT Rate
0
157000
348
17.5
HIGH TEMPERATURE STORAGE LIFE (HTSL)
Stress Duration: 1000 hours
Test Condition: 150°C
Device
LOT#
D/C
Close
Date
Sample
Size
# of
Fail
NB675GL
CC4L659.8
1311
07-16-13
47
0
NB675GL
CC4L661.8
1311
07-16-13
47
0
NB669GQ
HP7M096
1312
07-17-13
50
0
NB670GQ
HP3034
1309
07-17-13
50
0
NB671GQ
D14M879.8
1313
07-24-13
47
0
NB671GQ
D14M878.8
1313
07-24-13
45
0
MP2225GJ
HP3189
1304
09-24-13
50
0
NB675GL
HP3318
1311
10-09-13
50
0
NB677GQ
HP3573
1331
10-12-13
50
0
Total
0
The Future of Analog IC Technology®
- 12 -
FA No.
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
4.0 PACKAGE RELIABILITY MONITORING DATA
4.1 QFN
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
QFN2*2
ASAT
QFN2*2
UCD
QFN2*3
ASAT
QFN2*3
UCD
QFN3*3
ASAT
QFN3*3
UCD
QFN3*4
ASAT
QFN3*4
UCD
QFN4*4
ASAT
QFN4*4
UCD
QFN4*5
ASAT
QFN5*5
UCD
QFN5*5
ASAT
QFN7*7
UCD
QFN5*6
UTAC
UCD
QFN6*6
JCET
QFN2*2
UCD
QFN7*7
JCET
QFN4*4
QFN3*3
4.1.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28253EL
1230
10-30-13
160
0
MP2119DQ
1309
07-12-13
222
0
MP2119DQ
1309
07-12-13
222
0
MP2119DQ
1309
07-12-13
222
0
MP2209DL
1309
07-12-13
222
0
MP2209DL
1309
07-12-13
222
0
MP2209DL
1309
07-12-13
222
0
MP2109DQ
1317
07-03-13
200
0
MP5000SDQ
1315
07-10-13
200
0
MP5010ADQ
1313
07-09-13
200
0
MP5414AGV
1205
07-17-13
160
0
MP2615GV
1302
07-22-13
200
0
MPQ8904DD-AEC1
1236
07-24-13
100
0
MPQ3701GR
1239
07-17-13
100
0
MP3388DR
1309
07-30-13
200
0
MP3388DR
1309
07-30-13
200
0
MP3388DR
1309
07-30-13
200
0
MP62040DQFU-E
1316
07-31-13
200
0
MPQ2489DQ-AEC1
1301
10-12-13
292
0
MPQ2489DQ-AEC1
1303
10-12-13
292
0
MPQ2489DQ-AEC1
1309
10-12-13
300
0
FA NO.
The Future of Analog IC Technology®
- 13 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ4566GD-AEC1
1309
10-09-13
302
0
MPQ4566GD-AEC1
1309
10-09-13
100
0
MPQ1530DQ-AEC1
1319
10-09-13
110
0
MPQ1530DQ-AEC1
1319
10-09-13
205
0
MP6507AGR
1320
09-24-13
200
0
MPQ1530DQ-AEC1
1330
10-09-13
300
0
MP6507AGR
1320
09-24-13
90
0
MPQ2489DQ-AEC1
1330
09-17-13
105
0
MPQ28261DL
1228
07-02-13
45
0
MPQ28261DL
1217
07-02-13
90
0
MPQ28261DL
1228
07-02-13
85
0
MP1530DQ
1310
08-28-13
100
0
MP5010ADQ
1316
07-23-13
50
0
MP5010BDQ
1320
08-28-13
50
0
MP5010BDQ
1321
08-28-13
50
0
MP5010ADQ
1321
07-23-13
50
0
MP5010BDQ
1322
09-05-13
50
0
MP5010BDQ
1323
09-10-13
51
0
MP5010BDQ
1325
09-05-13
50
0
MP5010BDQ
1329
09-10-13
50
0
MP5010BDQ
1328
09-10-13
50
0
MP5010BDQ
1331
09-10-13
50
0
Total
FA NO.
0
SAT picture of QFN
T-SCAN PICTURE
C-SCAN PICTURE
The Future of Analog IC Technology®
- 14 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
4.1.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2119DQ
1309
07-12-13
97
0
1000
MP2119DQ
1309
07-12-13
97
0
1000
FA NO.
# of
cycle
MP2119DQ
1309
07-12-13
97
0
1000
MP2209DL
1309
07-12-13
97
0
1000
MP2209DL
1309
07-12-13
97
0
1000
MP2209DL
1309
07-12-13
97
0
1000
MP2109DQ
1317
07-03-13
97
0
1000
MP5000SDQ
1315
07-10-13
97
0
1000
MP5010ADQ
1313
07-09-13
97
0
1000
MP28252EL
1218
07-11-13
49
0
1000
MP28252EL
1226
07-11-13
50
0
1000
MP5414AGV
1205
07-17-13
80
0
1000
MP3388DR
1309
07-30-13
97
0
1000
MP3388DR
1309
07-30-13
97
0
1000
MP3388DR
1309
07-30-13
97
0
1000
MP62040DQFU-E
1316
07-31-13
97
0
1000
MP2119DQ
1227
09-05-13
50
0
1000
MP2119DQ
1233
09-05-13
50
0
1000
MPQ2489DQ-AEC1 1301
10-12-13
84
0
1000
MPQ2489DQ-AEC1 1303
10-12-13
84
0
1000
MPQ2489DQ-AEC1 1309
10-12-13
94
0
1000
MPQ4566GD-AEC1 1309
10-09-13
94
0
1000
MPQ1530DQ-AEC1 1319
10-09-13
97
0
1000
09-24-13
94
0
1000
MP6507AGR
1320
MPQ1530DQ-AEC1 1330
10-09-13
94
0
1000
MP2633GR
1331
09-17-13
94
0
1000
MP2633GR
1331
09-17-13
55
0
1000
MPQ4560DQ
1302
07-02-13
50
0
100
MPQ4456GQT
1303
07-26-13
50
0
100
MPQ4560DQ
1302
07-02-13
50
0
100
MPQ4558DQ-AEC1 1307
07-04-13
50
0
100
MPQ4560DQ-AEC1 1303
07-02-13
50
0
100
MPQ4558DQ-AEC1 1308
07-02-13
50
0
100
MPQ4560DQ-AEC1 1306
07-02-13
50
0
100
1309
07-18-13
50
0
100
MPQ6400DG-33-AEC 1310
07-04-13
50
0
100
1306
07-02-13
50
0
100
MPQ4560DQ-AEC1 1310
07-02-13
50
0
100
MPQ4560DQ-AEC1 1312
07-02-13
50
0
100
MPQ4456GQT
MPQ4560DQ
The Future of Analog IC Technology®
- 15 -
MONOLITHIC POWER SYSTEMS
Q3
Device
D/C
MPQ4560DQ-AEC1 1312
2013
PRODUCT RELIABILITY REPORT
Close
Date
Sample
Size
# of
Fail
07-02-13
50
0
100
FA NO.
# of
cycle
MP5000SDQ
1312
08-15-13
500
0
100
MPQ4560DQ
1310
07-04-13
50
0
100
MPQ4560DQ
1308
07-02-13
50
0
100
MP2633GR
1313
07-04-13
50
0
100
MP1530DQ
1310
08-28-13
50
0
100
MPQ4561DQ-AEC1 1312
07-02-13
50
0
100
MP2611GL
1310
08-15-13
50
0
100
MPQ4560DQ
1312
07-02-13
50
0
100
MPQ4561DQ-AEC1 1315
07-04-13
50
0
100
MPQ2483DQ-AEC1 1310
07-02-13
50
0
100
MP5010ADQ
1316
07-23-13
50
0
100
MP1530DQ
1319
08-16-13
50
0
100
MP1530DQ
1317
08-20-13
50
0
100
MPQ2128DG-AEC1 1316
07-02-13
50
0
100
MP4459DQT
1303
07-04-13
50
0
100
MP2607DL
1320
09-12-13
50
0
100
MPQ4560DQ-AEC1 1315
07-02-13
50
0
100
MPQ4558DQ-AEC1 1310
07-02-13
50
0
100
50
0
100
MP3426DL
1320
08-16-13
MP5010BDQ
1320
08-28-13
50
0
100
MP28253EL-C323
1320
07-25-13
50
0
100
MPQ4560DQ
1315
07-02-13
50
0
100
MPQ4561DQ-AEC1 1320
07-02-13
50
0
100
MP5010BDQ
1321
08-28-13
50
0
100
MP4459DQT
1309
07-03-13
50
0
100
MP5010ADQ
1321
07-23-13
50
0
100
MPQ4456GQT
1322
07-02-13
50
0
100
MPQ2128DG-AEC1 1320
07-02-13
50
0
100
MP1530DQ
1323
08-28-13
50
0
100
MP2207DQ
1322
07-04-13
50
0
100
MP5010BDQ
1322
09-05-13
50
0
100
MP5010BDQ
1322
09-10-13
50
0
100
MP3388SGR
1323
07-02-13
50
0
100
MP5010BDQ
1323
09-10-13
50
0
100
MP1530DQ
1324
08-23-13
50
0
100
NB637EL-C327
1324
07-10-13
50
0
100
MP2633GR
1323
07-02-13
50
0
100
MP2127DQ
1322
07-10-13
50
0
100
MP62551DGT
1236
07-01-13
50
0
100
MP4459DQT
1324
07-10-13
50
0
100
MP2633GR
1324
07-10-13
50
0
100
The Future of Analog IC Technology®
- 16 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Close
Date
Sample
Size
# of
Fail
MPQ2483DQ-AEC1 1324
07-04-13
50
0
100
MPQ2483DQ-AEC1 1323
07-04-13
50
0
100
Device
D/C
FA NO.
# of
cycle
MP2635GR
1323
07-02-13
50
0
100
MP20045DQ
1325
07-10-13
50
0
100
MP2633GR
1324
07-10-13
50
0
100
MP4459DQT
1324
07-18-13
50
0
100
MP28256EL
1324
07-04-13
50
0
100
MP5010BDQ
1325
09-05-13
50
0
100
MP2633GR
1320
07-10-13
50
0
100
MP2633GR
1325
07-10-13
50
0
100
MP8126DR
1325
07-10-13
50
0
100
MP2635GR
1324
07-10-13
50
0
100
MP4460DQ
1325
07-10-13
50
0
100
MP5010BDQ
1326
09-10-13
50
0
100
MPQ4561DQ-AEC1 1326
07-16-13
50
0
100
MP3388DR-C414
1320
07-16-13
50
0
100
MP2633AGR
1325
07-16-13
50
0
100
MP5010BDQ
1326
09-10-13
50
0
100
MP3426DL
1325
07-16-13
50
0
100
MP3388DR-C414
1321
07-18-13
50
0
100
MP2633AGR
1324
07-18-13
50
0
100
MPQ18201HQ-A
1326
07-18-13
50
0
100
MP3425DL
1326
07-18-13
50
0
100
MP2602DQ
1325
07-18-13
50
0
100
MPQ4560DQ-AEC1 1325
07-18-13
50
0
100
MP2633GR-C498
1317
07-25-13
50
0
100
MP1530DQ
1325
07-18-13
50
0
100
MPQ4560DQ-AEC1 1321
07-18-13
50
0
100
MP2635GR
1324
07-25-13
50
0
100
MP3388SGR
1327
07-23-13
50
0
100
MP1530DQ
1326
08-14-13
50
0
100
MPQ4560DQ
1326
07-25-13
50
0
100
MPQ28261DL
1320
07-30-13
50
0
100
MP2633GR
1325
07-25-13
50
0
100
MP5010BDQ
1327
09-10-13
50
0
100
MPQ28261DL
1326
08-06-13
50
0
100
MP62551DGT
1322
07-25-13
50
0
100
MP28225DL
1305
07-25-13
50
0
100
MP2005DD
1323
07-25-13
50
0
100
MP4458DQT
1328
07-30-13
50
0
100
MP2565DQ
1327
07-25-13
50
0
100
MP5010BDQ
1327
09-10-13
50
0
100
The Future of Analog IC Technology®
- 17 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP4460DQ
1328
08-07-13
50
0
100
MP5010BDQ
1327
09-10-13
50
0
100
MP4459DQT
1328
08-14-13
50
0
100
MP2633GR
1325
07-30-13
50
0
100
MP20045DQ-33
1328
08-01-13
50
0
100
MP28252EL
1328
08-01-13
50
0
100
MP2932GQK
1323
08-14-13
49
0
100
MP5010BDQ
1327
09-10-13
50
0
100
MP5010BDQ
1328
09-10-13
50
0
100
MP2002DD
1328
08-07-13
50
0
100
MP5010BDQ
1328
09-10-13
50
0
100
MP5010BDQ
1328
09-10-13
50
0
100
MP2610ER
1325
08-07-13
50
0
100
MPQ28261DL
1328
08-07-13
50
0
100
MP3430HQ
1329
08-07-13
50
0
100
MP5010BDQ
1328
09-10-13
50
0
100
NB600CQ
1327
08-07-13
50
0
100
MP2635AGR
1325
09-02-13
50
0
100
MPQ8904DD-AEC1 1236
08-16-13
50
0
100
FA NO.
# of
cycle
MP2633GR
1325
08-14-13
50
0
100
MP2633AGR
1327
08-07-13
50
0
100
MPQ28261DL
1329
08-16-13
50
0
100
MP2012DQ
1329
08-14-13
50
0
100
MP5010BDQ
1328
09-10-13
50
0
100
MP5010BDQ
1328
09-10-13
50
0
100
MP28256EL
1328
08-14-13
50
0
100
MP5010BDQ
1329
09-10-13
50
0
100
MP2360DG
1327
08-14-13
50
0
100
MP5010BDQ
1328
09-10-13
50
0
100
MP5010BDQ
1329
09-10-13
50
0
100
MP5010SDQ
1327
08-14-13
50
0
100
MPQ4560DQ
1327
08-16-13
50
0
100
MP2209DL
1330
08-14-13
50
0
100
MPQ6400DG-33-AEC 1327
08-16-13
50
0
100
MP4462DQ
1322
08-14-13
50
0
100
MP5010BDQ
1328
09-10-13
50
0
100
MP2633AGR
1328
08-14-13
50
0
100
MP5410EQ
1330
08-16-13
50
0
100
MP2116DQ
1315
08-16-13
50
0
100
NB600CQ
1327
08-20-13
50
0
100
MP3308DL
1330
08-20-13
50
0
100
MP28256EL
1330
08-20-13
50
0
100
The Future of Analog IC Technology®
- 18 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP5000DQ
1331
08-20-13
50
0
100
MP28128DQ
1325
08-28-13
50
0
100
MP5010DQ
1332
08-28-13
50
0
100
MP2128DG
1322
08-20-13
50
0
100
MP2633AGR
1328
08-23-13
50
0
100
MPQ28261DL
1329
08-30-13
50
0
100
MP3308DL
1332
08-28-13
50
0
100
FA NO.
# of
cycle
MPQ4560DQ
1331
08-28-13
50
0
100
MPQ28261DL
1328
09-05-13
45
0
100
MP5000DQ
1332
08-28-13
50
0
100
MPQ4560DQ
1328
09-05-13
50
0
100
MP5010BDQ
1331
09-10-13
50
0
100
MP3425DL
1330
08-28-13
50
0
100
MP28252EL
1325
08-28-13
50
0
100
MP2101DQ
1332
08-28-13
50
0
100
MP2633GR
1325
08-29-13
50
0
100
MP3304CDD
1333
08-29-13
50
0
100
MP26123DR
1333
08-30-13
50
0
100
MP2005DD
1329
08-30-13
50
0
100
MP4651DQ-C227
1326
09-05-13
49
0
100
MP2119DQ
1326
09-18-13
50
0
100
MP2490DQ
1333
09-05-13
50
0
100
MPQ28261DL
1333
09-05-13
50
0
100
MPQ28261DL
1333
09-10-13
50
0
100
MP5010BDQ
1331
09-10-13
50
0
100
MP2633GR
1334
09-18-13
50
0
100
MP62041DQFU-1
1333
09-05-13
50
0
100
PQ20056GG-18-AEC 1301
09-09-13
50
0
100
MP8352DL
1334
09-05-13
50
0
100
MP6400DG-01
1327
09-09-13
50
0
100
MP28256EL
1330
09-09-13
50
0
100
MP62041DQFU-1
1329
09-09-13
50
0
100
MP3388DR-C414
1334
09-09-13
50
0
100
MP62041DQFU-1
1329
09-09-13
50
0
100
MP2635GR
1335
09-18-13
50
0
100
MP5010BDQ
1331
09-18-13
50
0
100
MP2030DQ
1319
09-10-13
50
0
100
MPQ4462DQ-AEC1 1334
09-10-13
50
0
100
MP5010BDQ
1330
09-12-13
50
0
100
MP5010BDQ
1330
09-12-13
50
0
100
MP2109DQ
1329
09-12-13
50
0
100
MP2635GR
1335
09-18-13
50
0
100
The Future of Analog IC Technology®
- 19 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP62551DGT
1330
09-12-13
50
0
FA NO.
# of
cycle
100
MP5007DQ
1335
09-18-13
50
0
100
MP2635GR
1336
09-18-13
50
0
100
MP8668DL-C223
1336
09-23-13
50
0
100
MPQ4561DQ-AEC1 1334
09-23-13
50
0
100
MP62550DGT
1336
09-23-13
50
0
100
NB600CQ
1334
09-26-13
50
0
100
MP5010BDQ
1335
09-26-13
50
0
100
MP5010BDQ
1336
09-26-13
50
0
100
MP5010BDQ
1335
09-26-13
50
0
100
MP5010BDQ
1335
09-26-13
50
0
100
MP5010BDQ
1337
09-26-13
50
0
100
MP8125DR
1335
09-26-13
50
0
100
Total
0
4.1.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28253EL
1230
10-30-13
80
0
168
MP2119DQ
1309
07-12-13
97
0
168
MP2119DQ
1309
07-12-13
97
0
168
MP2119DQ
1309
07-12-13
97
0
168
MP2209DL
1309
07-12-13
97
0
168
MP2209DL
1309
07-12-13
97
0
168
FA NO.
# of hrs
MP2209DL
1309
07-12-13
97
0
168
MP2109DQ
1317
07-03-13
97
0
168
MP5000SDQ
1315
07-10-13
97
0
168
MP5010ADQ
1313
07-09-13
97
0
168
MP5414AGV
1205
07-17-13
80
0
168
MPQ3701GR
1239
07-17-13
88
0
168
MP3388DR
1309
07-30-13
97
0
168
MP3388DR
1309
07-30-13
97
0
168
MP3388DR
1309
07-30-13
97
0
168
MP62040DQFU-E
1316
07-31-13
95
0
168
MP2119DQ
1227
09-05-13
50
0
168
MPQ2489DQ-AEC1 1301
10-12-13
87
0
168
MPQ2489DQ-AEC1 1303
10-12-13
87
0
168
MPQ2489DQ-AEC1 1309
10-12-13
100
0
168
MPQ4566GD-AEC1 1309
10-09-13
97
0
168
MPQ4566GD-AEC1 1309
10-09-13
100
2
7428
168
The Future of Analog IC Technology®
- 20 -
MONOLITHIC POWER SYSTEMS
Device
Q3
D/C
MPQ1530DQ-AEC1 1319
MP6507AGR
1320
MPQ1530DQ-AEC1 1330
2013
PRODUCT RELIABILITY REPORT
Close
Date
Sample
Size
# of
Fail
10-09-13
97
0
168
09-24-13
97
0
168
FA NO.
# of hrs
10-09-13
97
0
168
MP2633GR
1331
09-17-13
97
0
168
MP2633GR
1331
09-17-13
54
0
168
MPQ4560DQ
1302
07-02-13
50
0
48
MPQ4456GQT
1303
07-26-13
50
0
48
MPQ4560DQ
1302
07-02-13
50
0
48
MPQ4558DQ-AEC1 1307
07-04-13
50
0
48
MPQ4560DQ-AEC1 1303
07-02-13
50
0
48
MPQ4558DQ-AEC1 1308
07-02-13
50
0
48
MPQ4560DQ-AEC1 1306
07-02-13
50
0
48
1309
07-18-13
50
0
48
MPQ6400DG-33-AEC 1310
07-04-13
50
0
48
1306
07-02-13
50
0
48
MPQ4560DQ-AEC1 1310
07-02-13
50
0
48
MPQ4560DQ-AEC1 1312
07-02-13
50
0
48
MPQ4456GQT
MPQ4560DQ
MPQ4560DQ
1310
07-04-13
50
0
48
MPQ4560DQ
1308
07-02-13
50
0
48
MP2633GR
1313
07-04-13
50
0
48
MP1530DQ
1310
08-28-13
50
0
48
MPQ4561DQ-AEC1 1312
07-02-13
50
0
48
MP2611GL
1310
08-15-13
50
0
48
MPQ4560DQ
1312
07-02-13
50
0
48
MPQ4561DQ-AEC1 1315
07-04-13
50
0
48
MPQ2483DQ-AEC1 1310
07-02-13
50
0
48
MP5010ADQ
1316
07-23-13
50
0
48
MP1530DQ
1319
08-16-13
50
0
48
MP1530DQ
1317
08-20-13
50
0
48
MPQ2128DG-AEC1 1316
07-02-13
50
0
48
MP4459DQT
1303
07-04-13
50
0
48
MP2607DL
1320
09-12-13
50
0
48
MPQ4560DQ-AEC1 1315
07-02-13
50
0
48
MPQ4558DQ-AEC1 1310
07-02-13
50
0
48
MP3426DL
1320
08-16-13
50
0
48
MP5010BDQ
1320
08-28-13
50
0
48
MP28253EL-C323
1320
07-25-13
50
0
48
MPQ4560DQ
1315
07-02-13
50
0
48
MPQ4561DQ-AEC1 1320
07-02-13
50
0
48
MP5010BDQ
1321
08-28-13
50
0
48
MP4459DQT
1309
07-03-13
50
0
48
MP5010ADQ
1321
07-23-13
50
0
48
The Future of Analog IC Technology®
- 21 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ4456GQT
1322
07-02-13
50
0
48
MPQ2128DG-AEC1 1320
07-02-13
50
0
48
FA NO.
# of hrs
MP1530DQ
1323
08-28-13
50
0
48
MP2207DQ
1322
07-04-13
50
0
48
MP5010BDQ
1322
09-05-13
50
0
48
MP5010BDQ
1322
09-10-13
50
0
48
MP3388SGR
1323
07-02-13
50
0
48
MP5010BDQ
1323
09-10-13
50
0
48
MP1530DQ
1324
08-23-13
50
0
48
NB637EL-C327
1324
07-10-13
50
0
48
MP2633GR
1323
07-02-13
50
0
48
MP2127DQ
1322
07-10-13
50
0
48
MP62551DGT
1236
07-01-13
50
0
48
MP4459DQT
1324
07-10-13
50
0
48
MP2633GR
1324
07-10-13
50
0
48
MPQ2483DQ-AEC1 1324
07-04-13
50
0
48
MPQ2483DQ-AEC1 1323
07-04-13
50
0
48
MP2635GR
1323
07-02-13
50
0
48
MP20045DQ
1325
07-10-13
50
0
48
MP2633GR
1324
07-10-13
50
0
48
MP4459DQT
1324
07-18-13
50
0
48
MP28256EL
1324
07-04-13
50
0
48
MP5010BDQ
1325
09-05-13
50
0
48
MP2633GR
1320
07-10-13
50
0
48
MP2633GR
1325
07-10-13
50
0
48
MP8126DR
1325
07-10-13
50
0
48
MP2635GR
1324
07-10-13
50
0
48
MP4460DQ
1325
07-10-13
50
0
48
MP5010BDQ
1326
09-10-13
50
0
48
MPQ4561DQ-AEC1 1326
07-16-13
50
0
48
MP3388DR-C414
1320
07-16-13
50
0
48
MP2633AGR
1325
07-16-13
50
0
48
MP5010BDQ
1326
09-10-13
50
0
48
MP3426DL
1325
07-16-13
50
0
48
MP3388DR-C414
1321
07-18-13
50
0
48
MP2633AGR
1324
07-18-13
50
0
48
MPQ18201HQ-A
1326
07-18-13
50
0
48
MP3425DL
1326
07-18-13
50
0
48
MP2602DQ
1325
07-18-13
50
0
48
MPQ4560DQ-AEC1 1325
07-18-13
50
0
48
MP2633GR-C498
1317
07-25-13
50
0
48
MP1530DQ
1325
07-18-13
50
0
48
The Future of Analog IC Technology®
- 22 -
MONOLITHIC POWER SYSTEMS
Device
Q3
D/C
MPQ4560DQ-AEC1 1321
MP2635GR
1324
2013
PRODUCT RELIABILITY REPORT
Close
Date
Sample
Size
# of
Fail
07-18-13
50
0
48
07-25-13
50
0
48
FA NO.
# of hrs
MP3388SGR
1327
07-23-13
50
0
48
MP1530DQ
1326
08-14-13
50
0
48
MPQ4560DQ
1326
07-25-13
50
0
48
MPQ28261DL
1320
07-30-13
50
0
48
MP2633GR
1325
07-25-13
50
0
48
MP5010BDQ
1327
09-10-13
50
0
48
MPQ28261DL
1326
08-06-13
50
0
48
MP62551DGT
1322
07-25-13
50
0
48
MP28225DL
1305
07-25-13
50
0
48
MP2005DD
1323
07-25-13
50
0
48
MP4458DQT
1328
07-30-13
50
0
48
MP2565DQ
1327
07-25-13
50
0
48
MP5010BDQ
1327
09-10-13
50
0
48
MP4460DQ
1328
08-07-13
50
0
48
MP5010BDQ
1327
09-10-13
50
0
48
MP4459DQT
1328
08-14-13
50
0
48
MP2633GR
1325
07-30-13
50
0
48
MP20045DQ-33
1328
08-01-13
50
0
48
MP28252EL
1328
08-01-13
50
0
48
MP2932GQK
1323
08-14-13
49
0
48
MP5010BDQ
1327
09-10-13
50
0
48
MP5010BDQ
1328
09-10-13
50
0
48
MP2002DD
1328
08-07-13
50
0
48
MP5010BDQ
1328
09-10-13
50
0
48
MP5010BDQ
1328
09-10-13
50
0
48
MP2610ER
1325
08-07-13
50
0
48
MPQ28261DL
1328
08-07-13
50
0
48
MP3430HQ
1329
08-07-13
50
0
48
MP5010BDQ
1328
09-10-13
50
0
48
NB600CQ
1327
08-07-13
50
0
48
MP2635AGR
1325
09-02-13
50
0
48
MPQ8904DD-AEC1 1236
08-16-13
50
0
48
MP2633GR
1325
08-14-13
50
0
48
MP2633AGR
1327
08-07-13
50
0
48
MPQ28261DL
1329
08-16-13
50
0
48
MP2012DQ
1329
08-14-13
50
0
48
MP5010BDQ
1328
09-10-13
50
0
48
MP5010BDQ
1328
09-10-13
50
0
48
MP28256EL
1328
08-14-13
50
0
48
MP5010BDQ
1329
09-10-13
50
0
48
The Future of Analog IC Technology®
- 23 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2360DG
1327
08-14-13
50
0
48
MP5010BDQ
1328
09-10-13
50
0
48
MP5010BDQ
1329
09-10-13
50
0
48
MP5010SDQ
1327
08-14-13
50
0
48
MPQ4560DQ
1327
08-16-13
50
0
48
MP2209DL
1330
08-14-13
50
0
48
MPQ6400DG-33-AEC 1327
08-16-13
50
0
48
FA NO.
# of hrs
MP4462DQ
1322
08-14-13
50
0
48
MP5010BDQ
1328
09-10-13
50
0
48
MP2633AGR
1328
08-14-13
50
0
48
MP5410EQ
1330
08-16-13
50
0
48
MP2116DQ
1315
08-16-13
50
0
48
NB600CQ
1327
08-20-13
50
0
48
MP3308DL
1330
08-20-13
50
0
48
MP28256EL
1330
08-20-13
50
0
48
MP5000DQ
1331
08-20-13
50
0
48
MP28128DQ
1325
08-28-13
50
0
48
MP5010DQ
1332
08-28-13
50
0
48
MP2128DG
1322
08-20-13
50
0
48
MP2633AGR
1328
08-23-13
50
0
48
MPQ28261DL
1329
08-30-13
50
0
48
MP3308DL
1332
08-28-13
50
0
48
MPQ4560DQ
1331
08-28-13
50
0
48
MPQ28261DL
1328
09-05-13
45
0
48
MP5000DQ
1332
08-28-13
50
0
48
MPQ4560DQ
1328
09-05-13
50
0
48
MP5010BDQ
1331
09-10-13
50
0
48
MP3425DL
1330
08-28-13
50
0
48
MP28252EL
1325
08-28-13
50
0
48
MP2101DQ
1332
08-28-13
50
0
48
MP2633GR
1325
08-29-13
50
0
48
MP3304CDD
1333
08-29-13
50
0
48
MP26123DR
1333
08-30-13
50
0
48
MP2005DD
1329
08-30-13
50
0
48
MP4651DQ-C227
1326
09-05-13
49
0
48
MP2119DQ
1326
09-18-13
50
0
48
MP2490DQ
1333
09-05-13
50
0
48
MPQ28261DL
1333
09-05-13
50
0
48
MPQ28261DL
1333
09-10-13
50
0
48
MP5010BDQ
1331
09-10-13
50
0
48
MP2633GR
1334
09-18-13
50
0
48
MP62041DQFU-1
1333
09-05-13
50
0
48
The Future of Analog IC Technology®
- 24 -
MONOLITHIC POWER SYSTEMS
Device
Q3
D/C
PQ20056GG-18-AEC 1301
2013
PRODUCT RELIABILITY REPORT
Close
Date
Sample
Size
# of
Fail
09-09-13
50
0
FA NO.
# of hrs
48
MP8352DL
1334
09-05-13
50
0
48
MP6400DG-01
1327
09-09-13
50
0
48
MP28256EL
1330
09-09-13
50
0
48
MP62041DQFU-1
1329
09-09-13
50
0
48
MP3388DR-C414
1334
09-09-13
50
0
48
MP62041DQFU-1
1329
09-09-13
50
0
48
MP2635GR
1335
09-18-13
50
0
48
MP5010BDQ
1331
09-18-13
50
0
48
MP2030DQ
1319
09-10-13
50
0
48
MPQ4462DQ-AEC1 1334
09-10-13
50
0
48
MP5010BDQ
1330
09-12-13
50
0
48
MP5010BDQ
1330
09-12-13
50
0
48
MP2109DQ
1329
09-12-13
50
0
48
MP2635GR
1335
09-18-13
50
0
48
MP62551DGT
1330
09-12-13
50
0
48
MP5007DQ
1335
09-18-13
50
0
48
MP2635GR
1336
09-18-13
50
0
48
MP8668DL-C223
1336
09-23-13
50
0
48
MPQ4561DQ-AEC1 1334
09-23-13
50
0
48
MP62550DGT
1336
09-23-13
50
0
48
NB600CQ
1334
09-26-13
50
0
48
MP5010BDQ
1335
09-26-13
50
0
48
MP5010BDQ
1336
09-26-13
50
0
48
MP5010BDQ
1335
09-26-13
50
0
48
MP5010BDQ
1335
09-26-13
50
0
48
MP5010BDQ
1337
09-26-13
50
0
48
MP8125DR
1335
09-26-13
50
0
48
Total
2
4.1.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ8904DD-AEC1
1236
07-24-13
77
0
MPQ4566GD-AEC1
1309
10-09-13
75
0
MPQ1530DQ-AEC1
1319
10-09-13
85
0
MPQ1530DQ-AEC1
1330
10-09-13
85
0
MP6507AGR
1320
09-24-13
80
0
MPQ2489DQ-AEC1
1330
09-17-13
99
0
MP2013GQ
1331
10-09-13
101
0
FA NO.
The Future of Analog IC Technology®
- 25 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ28261DL
1228
07-02-13
45
0
MPQ28261DL
1217
07-02-13
90
0
MPQ28261DL
1228
07-02-13
85
0
MP1530DQ
1310
08-28-13
100
0
MP5010ADQ
1316
07-23-13
50
0
MP5010BDQ
1320
08-28-13
50
0
MP5010BDQ
1321
08-28-13
50
0
MP5010ADQ
1321
07-23-13
50
0
MP5010BDQ
1322
09-05-13
50
0
MP5010BDQ
1323
09-10-13
51
0
MP5010BDQ
1325
09-05-13
50
0
MP5010BDQ
1329
09-10-13
50
0
MP5010BDQ
1328
09-10-13
50
0
MP5010BDQ
1331
09-10-13
50
0
Total
FA NO.
0
4.2 SOIC
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
SOIC8
ANST
SOIC14
UCD
SOIC8-EP
ANST
SOIC16
ANST
SOIC8-7
ANST
SOIC20
ANST
SOIC8
ANST
SOIC28
ANST
SOIC8-EP
UTAC
SOIC8
UTAC
SOIC8-EP
JCET
SOIC8
JCET
SOIC8-EP
JCET
SOIC16
ASE-KS
SOIC8-EP
ASE-KS
SOIC8
4.2.1 Preconditioning
MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP4012DS
1316
07-10-13
317
0
MP6922AGN
1311
07-18-13
300
0
MP157GS
1252
07-19-13
270
0
MP3398LGS
1309
07-23-13
274
0
MP3393EY
1313
09-11-13
100
0
MP3393EY
1313
09-11-13
100
0
MP6922AGN
1321
10-09-13
200
0
FA NO.
The Future of Analog IC Technology®
- 26 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP6922AGN
1325
10-09-13
200
0
MP1584EN
1314
09-11-13
200
0
MP3394SGS
139
10-09-13
200
0
MP1484EN
1330
09-26-13
200
0
Total
FA NO.
0
SAT picture of SOIC
T-SCAN PICTURE
C-SCAN PICTURE
4.2.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP4012DS
1316
07-10-13
94
0
1000
MP3399EY
1311
07-24-13
47
0
1000
MP3399EY
1310
07-24-13
47
0
1000
MP6922AGN
1311
07-18-13
94
0
1000
MP157GS
1252
07-19-13
83
0
1000
MP3398LGS
1309
07-23-13
84
0
1000
MP3389EY
1311
07-24-13
47
0
1000
MP3389EY
1310
07-24-13
47
0
1000
MP6922AGN
1321
10-09-13
94
0
1000
MP3394SGS
139
10-09-13
94
0
1000
MP1484EN
1330
09-26-13
96
0
1000
HR1000HS
1226
08-29-13
50
0
100
FA NO.
# of
cycle
MP020-5GS
1301
08-28-13
50
0
100
HR1000HS
1308
07-02-13
50
0
100
MP1482DN
1308
07-02-13
50
0
100
MP020-5GS
1309
08-28-13
50
0
100
MP020-5GS
1309
08-28-13
50
0
100
MP020-5GS
1309
08-28-13
50
0
100
The Future of Analog IC Technology®
- 27 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP020-5GS
1309
08-28-13
50
0
100
MP4032-1GS
1312
08-28-13
50
0
100
FA NO.
# of
cycle
MP1482DN
1315
08-16-13
50
0
100
MP020-5GS
1315
08-28-13
50
0
100
MP1482DN
1316
07-02-13
50
0
100
MP1410ES
1317
07-01-13
50
0
100
MP8705EN
1304
07-16-13
50
0
100
DAS09
1319
09-12-13
50
0
100
MP020-5GS
1319
08-28-13
50
0
100
MP020-5GS
1319
08-28-13
50
0
100
MP1484EN-C166
1321
07-10-13
50
0
100
MP2307DN
1320
07-01-13
50
0
100
DAS09
1323
07-02-13
50
0
100
MP3394SGS
1321
07-02-13
50
0
100
MP1482DN
1324
07-02-13
50
0
100
MP2467DN
1324
07-10-13
50
0
100
MP4030GS
1324
07-10-13
50
0
100
HF81GS
1316
07-01-13
50
0
100
MP1482DN
1324
07-02-13
50
0
100
MP020-5GS
1319
08-28-13
50
0
100
MP201DS
1325
07-04-13
50
0
100
DAS09
1323
07-02-13
50
0
100
MP020-5GS
1319
08-28-13
50
0
100
MP3394ES
1321
07-02-13
50
0
100
MP1482DN
1324
07-02-13
50
0
100
MP1482DN
1324
07-02-13
50
0
100
MP4032-1GS
1323
07-10-13
50
0
100
MP3394SGS
1322
07-10-13
50
0
100
MP3394ES
1321
07-10-13
50
0
100
MP24830HS
1312
07-18-13
50
0
100
MP3394ES
1321
07-10-13
50
0
100
HFC0300HS
1323
07-18-13
50
0
100
MP1583DN
1324
07-10-13
50
0
100
MP6002DN
1326
07-16-13
50
0
100
MP2307DN
1323
07-11-13
50
0
100
MP1583DN-C322
1324
07-11-13
50
0
100
MPQ4560DN
1313
08-07-13
50
0
100
MP1584EN
1324
07-11-13
50
0
100
MP3394SGS
1325
07-16-13
50
0
100
MP4030GS
1324
07-16-13
50
0
100
MP9415EN
1321
07-16-13
50
0
100
MP4030GS
1324
07-18-13
50
0
100
The Future of Analog IC Technology®
- 28 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8670DN
1326
07-18-13
50
0
100
MP1484EN
1324
07-18-13
50
0
100
MP1482DS-C165
1327
07-18-13
50
0
100
MP3394SGS
1322
07-18-13
50
0
100
MP2303ADN
1325
07-18-13
50
0
100
MP1484EN
1326
07-18-13
50
0
100
CM500GS
1327
07-23-13
50
0
100
MP1482DS-C165
1327
07-25-13
50
0
100
MP62340DS-1
1326
07-30-13
50
0
100
MP3394SGS
1327
07-25-13
50
0
100
MP6211DN
1328
07-25-13
50
0
100
FA NO.
# of
cycle
MP1584EN
1324
07-25-13
50
0
100
MP2303DN
1327
07-25-13
50
0
100
MP1591DN
1327
07-25-13
50
0
100
DAS09
1324
08-01-13
50
0
100
MP8001DS
1317
08-07-13
50
0
100
MPQ4559DN
1326
08-01-13
50
0
100
MP3398GS
1327
08-01-13
50
0
100
MP62340DS-1
1325
07-30-13
50
0
100
MP62341DS
1327
08-07-13
50
0
100
MP020-5GS
1319
08-28-13
50
0
100
MP8715DN
1325
08-07-13
50
0
100
MP1484EN-C166
1329
08-01-13
50
0
100
MPQ4559DN
1328
08-07-13
50
0
100
HR1000HS
1325
08-07-13
50
0
100
MP1482DS-C165
1327
08-01-13
50
0
100
MP8706EN
1325
08-07-13
50
0
100
MP020-5GS
1319
08-28-13
50
0
100
MP24830HS-C470H
1325
08-07-13
50
0
100
MP8708EN
1326
08-07-13
50
0
100
MP3394SGS
1328
08-07-13
50
0
100
DAS09
1326
08-07-13
50
0
100
MP1430DN
1327
08-07-13
50
0
100
MP020-5GS
1327
08-28-13
50
0
100
MP111DS
1329
08-07-13
50
0
100
MP9415EN
1327
08-07-13
50
0
100
MP2365DN
1329
08-14-13
50
0
100
MP020-5GS
1327
08-28-13
50
0
100
MP4031GS
1330
08-14-13
50
0
100
HF81GS
1329
08-14-13
50
0
100
MP4051GS
1325
08-14-13
50
0
100
MP24830HS-C470
1330
08-14-13
50
0
100
The Future of Analog IC Technology®
- 29 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP9415EN
1327
08-14-13
50
0
100
MP020-5GS
1327
08-28-13
50
0
100
MP3394ES-C462
1326
08-14-13
50
0
100
MP4001DS
1331
08-14-13
50
0
100
MP2307DN
1324
08-14-13
50
0
100
CM3406DS
1330
08-16-13
50
0
100
MP1484EN-C166
1327
08-16-13
50
0
100
MP2495DS
1330
08-16-13
50
0
100
MP4001DS
1331
08-16-13
50
0
100
MP4012DS
1329
08-16-13
50
0
100
MP020-5GS
1328
08-28-13
50
0
100
FA NO.
# of
cycle
MP3394SGS
1329
08-16-13
50
0
100
MP020-5GS
1330
08-28-13
50
0
100
MP4001DS
1332
08-20-13
50
0
100
MP1580HS
1325
08-20-13
50
0
100
MP24830HS-C470
1330
08-20-13
50
0
100
MP3394ES
1323
08-20-13
50
0
100
MP1484EN-C166
1327
08-23-13
50
0
100
HF81GS
1329
08-23-13
50
0
100
DAS09
1329
08-23-13
50
0
100
MP1584EN-C461
1329
08-23-13
50
0
100
MP62341DS
1332
08-23-13
50
0
100
MP201DS
1332
08-28-13
50
0
100
MP6002DN
1328
08-30-13
50
0
100
MP3394SGS
1329
08-28-13
50
0
100
MP2489DN-C504
1331
08-29-13
50
0
100
MP2396ES-C296
1333
08-30-13
50
0
100
CM500GS
1331
08-30-13
50
0
100
MP1588EN
1329
08-30-13
50
0
100
MP8001DS
1329
09-09-13
50
0
100
MP2374DS
1331
09-09-13
50
0
100
MP3398GS
1331
09-09-13
50
0
100
MP3394SGS
1333
09-10-13
50
0
100
MP4030AGS
1335
09-09-13
50
0
100
MP62340DS-1
1332
09-10-13
50
0
100
DAS09
1330
09-10-13
50
0
100
MP28317DS
1334
09-10-13
50
0
100
MP1430DN
1334
09-10-13
50
0
100
MPQ4559DN
1334
09-10-13
50
0
100
MP3394SGS
1332
09-10-13
50
0
100
MP1430DN
1334
09-18-13
50
0
100
MP3394SGS
1332
09-12-13
50
0
100
The Future of Analog IC Technology®
- 30 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
CM500GS
1334
09-18-13
50
0
100
MP1482DS-C165
1335
09-13-13
50
0
100
FA NO.
# of
cycle
DAS09
1330
09-18-13
50
0
100
MP2403DN
1334
09-23-13
50
0
100
MP3389EY
1311
09-23-13
50
0
100
MP3389EY
1311
09-23-13
50
0
100
MP3389EY
1311
09-23-13
50
0
100
MP3394SGY
1317
09-23-13
50
0
100
MP3394SGY
1313
09-23-13
50
0
100
MP3399EY
1251
09-23-13
50
0
100
MP3399EY
1310
09-23-13
50
0
100
MP3399EY
1315
09-23-13
50
0
100
MP3394SGS
1333
09-18-13
50
0
100
MPGC01DN
1332
09-18-13
50
0
100
MP8706EN
1325
09-23-13
50
0
100
MP4001DS
1336
09-23-13
50
0
100
HF81GS
1332
09-23-13
50
0
100
MP62351ES
1336
09-23-13
50
0
100
DAS09
1333
09-26-13
50
0
100
MP020-5GS
1335
09-26-13
50
0
100
MP3394SGS
1332
09-26-13
50
0
100
MP3394ES-C462
1335
09-26-13
50
0
100
MP3394ES-C462
1335
09-26-13
50
0
100
MP8001DS
1336
09-26-13
50
0
100
MP020-5GS
1336
09-26-13
50
0
100
Total
0
4.2.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP4012DS
1316
07-10-13
97
0
168
MP3399EY
1311
07-24-13
47
0
168
FA NO.
# of hrs
MP3399EY
1310
07-24-13
47
0
168
MP6922AGN
1311
07-18-13
97
0
168
MP157GS
1252
07-19-13
87
0
168
MP3398LGS
1309
07-23-13
87
0
168
MP3389EY
1311
07-24-13
47
0
168
MP3389EY
1310
07-24-13
47
0
168
MP6922AGN
1321
10-09-13
97
1
MP6922AGN
1325
10-09-13
97
0
7357
168
168
The Future of Analog IC Technology®
- 31 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1584EN
1314
09-11-13
97
0
168
MP3394SGS
139
10-09-13
97
0
168
FA NO.
# of hrs
MP1484EN
1330
09-26-13
97
0
168
HR1000HS
1226
08-29-13
50
0
48
MP020-5GS
1301
08-28-13
50
0
48
HR1000HS
1308
07-02-13
50
0
48
MP1482DN
1308
07-02-13
50
0
48
MP020-5GS
1309
08-28-13
50
0
48
MP020-5GS
1309
08-28-13
50
0
48
MP020-5GS
1309
08-28-13
50
0
48
MP020-5GS
1309
08-28-13
50
0
48
MP4032-1GS
1312
08-28-13
50
0
48
MP1482DN
1315
08-16-13
50
0
48
MP020-5GS
1315
08-28-13
50
0
48
MP1482DN
1316
07-02-13
50
0
48
MP1410ES
1317
07-01-13
50
0
48
MP8705EN
1304
07-16-13
50
0
48
DAS09
1319
09-12-13
50
0
48
MP020-5GS
1319
08-28-13
50
0
48
MP020-5GS
1319
08-28-13
50
0
48
MP1484EN-C166
1321
07-10-13
50
0
48
MP2307DN
1320
07-01-13
50
0
48
DAS09
1323
07-02-13
50
0
48
MP3394SGS
1321
07-02-13
50
0
48
MP1482DN
1324
07-02-13
50
0
48
MP2467DN
1324
07-10-13
50
0
48
MP4030GS
1324
07-10-13
50
0
48
HF81GS
1316
07-01-13
50
0
48
MP1482DN
1324
07-02-13
50
0
48
MP020-5GS
1319
08-28-13
50
0
48
MP201DS
1325
07-04-13
50
0
48
DAS09
1323
07-02-13
50
0
48
MP020-5GS
1319
08-28-13
50
0
48
MP3394ES
1321
07-02-13
50
0
48
MP1482DN
1324
07-02-13
50
0
48
MP1482DN
1324
07-02-13
50
0
48
MP4032-1GS
1323
07-10-13
50
0
48
MP3394SGS
1322
07-10-13
50
0
48
MP3394ES
1321
07-10-13
50
0
48
MP24830HS
1312
07-18-13
50
0
48
MP3394ES
1321
07-10-13
50
0
48
HFC0300HS
1323
07-18-13
50
0
48
The Future of Analog IC Technology®
- 32 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1583DN
1324
07-10-13
50
0
48
MP6002DN
1326
07-16-13
50
0
48
FA NO.
# of hrs
MP2307DN
1323
07-11-13
50
0
48
MP1583DN-C322
1324
07-11-13
50
0
48
MPQ4560DN
1313
08-07-13
50
0
48
MP1584EN
1324
07-11-13
50
0
48
MP3394SGS
1325
07-16-13
50
0
48
MP4030GS
1324
07-16-13
50
0
48
MP9415EN
1321
07-16-13
50
0
48
MP4030GS
1324
07-18-13
50
0
48
MP8670DN
1326
07-18-13
50
0
48
MP1484EN
1324
07-18-13
50
0
48
MP1482DS-C165
1327
07-18-13
50
0
48
MP3394SGS
1322
07-18-13
50
0
48
MP2303ADN
1325
07-18-13
50
0
48
MP1484EN
1326
07-18-13
50
0
48
CM500GS
1327
07-23-13
50
0
48
MP1482DS-C165
1327
07-25-13
50
0
48
MP62340DS-1
1326
07-30-13
50
0
48
MP3394SGS
1327
07-25-13
50
0
48
MP6211DN
1328
07-25-13
50
0
48
MP1584EN
1324
07-25-13
50
0
48
MP2303DN
1327
07-25-13
50
0
48
MP1591DN
1327
07-25-13
50
0
48
DAS09
1324
08-01-13
50
0
48
MP8001DS
1317
08-07-13
50
0
48
MPQ4559DN
1326
08-01-13
50
0
48
MP3398GS
1327
08-01-13
50
0
48
MP62340DS-1
1325
07-30-13
50
0
48
MP62341DS
1327
08-07-13
50
0
48
MP020-5GS
1319
08-28-13
50
0
48
MP8715DN
1325
08-07-13
50
0
48
MP1484EN-C166
1329
08-01-13
50
0
48
MPQ4559DN
1328
08-07-13
50
0
48
HR1000HS
1325
08-07-13
50
0
48
MP1482DS-C165
1327
08-01-13
50
0
48
MP8706EN
1325
08-07-13
50
0
48
MP020-5GS
1319
08-28-13
50
0
48
MP24830HS-C470H
1325
08-07-13
50
0
48
MP8708EN
1326
08-07-13
50
0
48
MP3394SGS
1328
08-07-13
50
0
48
DAS09
1326
08-07-13
50
0
48
The Future of Analog IC Technology®
- 33 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1430DN
1327
08-07-13
50
0
48
MP020-5GS
1327
08-28-13
50
0
48
FA NO.
# of hrs
MP111DS
1329
08-07-13
50
0
48
MP9415EN
1327
08-07-13
49
0
48
MP2365DN
1329
08-14-13
46
0
48
MP020-5GS
1327
08-28-13
50
0
48
MP4031GS
1330
08-14-13
50
0
48
HF81GS
1329
08-14-13
50
0
48
MP4051GS
1325
08-14-13
50
0
48
MP24830HS-C470
1330
08-14-13
50
0
48
MP9415EN
1327
08-14-13
50
0
48
MP020-5GS
1327
08-28-13
50
0
48
MP3394ES-C462
1326
08-14-13
50
0
48
MP4001DS
1331
08-14-13
50
0
48
MP2307DN
1324
08-14-13
50
0
48
CM3406DS
1330
08-16-13
50
0
48
MP1484EN-C166
1327
08-16-13
50
0
48
MP2495DS
1330
08-16-13
50
0
48
MP4001DS
1331
08-16-13
50
0
48
MP4012DS
1329
08-16-13
50
0
48
MP020-5GS
1328
08-28-13
50
0
48
MP3394SGS
1329
08-16-13
50
0
48
MP020-5GS
1330
08-28-13
50
0
48
MP4001DS
1332
08-20-13
50
0
48
MP1580HS
1325
08-20-13
50
0
48
MP24830HS-C470
1330
08-20-13
50
0
48
MP3394ES
1323
08-20-13
50
0
48
MP1484EN-C166
1327
08-23-13
50
0
48
HF81GS
1329
08-23-13
50
0
48
DAS09
1329
08-23-13
50
0
48
MP1584EN-C461
1329
08-23-13
50
0
48
MP62341DS
1332
08-23-13
50
0
48
MP201DS
1332
08-28-13
50
0
48
MP6002DN
1328
08-30-13
50
0
48
MP3394SGS
1329
08-28-13
50
0
48
MP2489DN-C504
1331
08-29-13
50
0
48
MP2396ES-C296
1333
08-30-13
50
0
48
CM500GS
1331
08-30-13
50
0
48
MP1588EN
1329
08-30-13
50
0
48
MP8001DS
1329
09-09-13
50
0
48
MP2374DS
1331
09-09-13
50
0
48
MP3398GS
1331
09-09-13
50
0
48
The Future of Analog IC Technology®
- 34 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3394SGS
1333
09-10-13
50
0
48
MP4030AGS
1335
09-09-13
50
0
48
MP62340DS-1
1332
09-10-13
50
0
48
DAS09
1330
09-10-13
50
0
48
MP28317DS
1334
09-10-13
50
0
48
MP1430DN
1334
09-10-13
50
0
48
MPQ4559DN
1334
09-10-13
50
0
48
MP3394SGS
1332
09-10-13
50
0
48
FA NO.
# of hrs
MP1430DN
1334
09-18-13
50
0
48
MP3394SGS
1332
09-12-13
50
0
48
CM500GS
1334
09-18-13
50
0
48
MP1482DS-C165
1335
09-13-13
50
0
48
DAS09
1330
09-18-13
50
0
48
MP2403DN
1334
09-23-13
50
0
48
MP3389EY
1311
09-23-13
50
0
48
MP3389EY
1311
09-23-13
50
0
48
MP3389EY
1311
09-23-13
50
0
48
MP3394SGY
1317
09-23-13
50
0
48
MP3394SGY
1313
09-23-13
50
0
48
MP3399EY
1251
09-23-13
50
0
48
MP3399EY
1310
09-23-13
50
0
48
MP3399EY
1315
09-23-13
50
0
48
MP3394SGS
1333
09-18-13
50
0
48
MPGC01DN
1332
09-18-13
50
0
48
MP8706EN
1325
09-23-13
50
0
48
MP4001DS
1336
09-23-13
50
0
48
HF81GS
1332
09-23-13
50
0
48
MP62351ES
1336
09-23-13
50
0
48
DAS09
1333
09-26-13
50
0
48
MP020-5GS
1335
09-26-13
50
0
48
MP3394SGS
1332
09-26-13
50
0
48
MP3394ES-C462
1335
09-26-13
50
0
48
MP3394ES-C462
1335
09-26-13
50
0
48
MP8001DS
1336
09-26-13
50
0
48
MP020-5GS
1336
09-26-13
50
0
48
Total
1
The Future of Analog IC Technology®
- 35 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
4.2.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP4012DS
1316
07-10-13
80
0
MP3398LGS
1309
07-23-13
80
0
Total
FA NO.
0
4.3 MSOP
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
MSOP8
ANST
MSOP8-EP
UCD
MSOP10-EP
ANST
MSOP10
UCD
MSOP10
ANST
MSOP10-EP
ANST
MSOP8
4.3.1 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1412DH
1322
07-01-13
50
0
100
MP1542DK
1324
07-10-13
50
0
100
MP2481DH
1325
07-11-13
50
0
100
FA NO.
# of
cycle
MP2270DH-C334
1326
07-11-13
50
0
100
MP20073DH
1325
07-18-13
50
0
100
MP6211DH
1326
07-18-13
50
0
100
MP3213DH
1326
07-18-13
50
0
100
MP2105DK
1322
07-23-13
50
0
100
MP1542DK-C472
1325
07-23-13
50
0
100
MP3900DK
1327
07-25-13
50
0
100
MP1542DK
1324
07-30-13
50
0
100
MP2105DK
1244
08-07-13
50
0
100
MP2105DK
1227
08-07-13
50
0
100
MP2270DH-C334
1328
08-07-13
50
0
100
MP1542DK
1329
08-16-13
50
0
100
MP1542DK-C472
1331
08-23-13
50
0
100
MP2481DH
1330
08-28-13
50
0
100
MP1411DH
1334
09-09-13
50
0
100
MP1542DK
1333
09-09-13
50
0
100
The Future of Analog IC Technology®
- 36 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2106DK-C103
1326
09-18-13
50
0
100
MP1412DH
1326
09-18-13
50
0
100
FA NO.
# of
cycle
MP1542DK
1335
09-18-13
50
0
100
MP2905EK
1316
09-26-13
50
0
100
Total
0
4.3.2Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1412DH
1322
07-01-13
50
0
48
MP1542DK
1324
07-10-13
50
0
48
MP2481DH
1325
07-11-13
50
0
48
FA NO.
# of hrs
MP2270DH-C334
1326
07-11-13
50
0
48
MP20073DH
1325
07-18-13
50
0
48
MP6211DH
1326
07-18-13
50
0
48
MP3213DH
1326
07-18-13
50
0
48
MP2105DK
1322
07-23-13
50
0
48
MP1542DK-C472
1325
07-23-13
50
0
48
MP3900DK
1327
07-25-13
50
0
48
MP1542DK
1324
07-30-13
50
0
48
MP2105DK
1244
08-07-13
50
0
48
MP2105DK
1227
08-07-13
50
0
48
MP2270DH-C334
1328
08-07-13
50
0
48
MP1542DK
1329
08-16-13
50
0
48
MP1542DK-C472
1331
08-23-13
50
0
48
MP2481DH
1330
08-28-13
50
0
48
MP1411DH
1334
09-09-13
50
0
48
MP1542DK
1333
09-09-13
50
0
48
MP2106DK-C103
1326
09-18-13
50
0
48
MP1412DH
1326
09-18-13
50
0
48
MP1542DK
1335
09-18-13
50
0
48
MP2905EK
1316
09-26-13
50
0
48
Total
0
The Future of Analog IC Technology®
- 37 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
4.4 TSOT
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
ANST
TSOT23-5
JCET
TSOT23-5
ASNT
TSOT23-6
JCET
TSOT23-6
ASNT
TSOT23-8
JCET
TSOT23-8
4.4.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
Close
Date
D/C
MPQ2459GJ-ACQ100 1243
Sample
Size
# of
Fail
07-24-13
260
0
MP3410DJ
1315
10-09-13
205
0
MP2359DJ
1325
10-09-13
200
0
Total
FA NO.
0
SAT picture of TSOT
T-SCAN PICTURE
C-SCAN PICTURE
4.4.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3217DJ
1250
07-20-13
80
0
1000
MPQ2459GJ-ACQ100 1243
07-24-13
84
0
1000
97
0
1000
MP2359DJ
1325
10-09-13
FA NO.
# of
cycle
MP3302DJ
1306
07-02-13
50
0
100
MP8903DJ-3.3
1305
07-10-13
50
0
100
MP3120DJ
1315
08-15-13
50
0
100
The Future of Analog IC Technology®
- 38 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8903DJ-3.3
1314
07-16-13
50
0
100
MP8903DJ-3.3
1218
09-02-13
50
0
100
FA NO.
# of
cycle
MP3217DJ
1314
08-15-13
50
0
100
MP8903DJ-3.3
1319
09-23-13
50
0
100
MP2359DJ
1322
07-01-13
50
0
100
MP3217DJ
1322
07-01-13
50
0
100
MP8801DJ-2.85
1321
07-01-13
50
0
100
MP2451DT
1323
07-02-13
50
0
100
MP1541DJ
1318
07-03-13
50
0
100
MP62055EJ
1322
07-02-13
50
0
100
MP6400DJ-33
1323
07-10-13
50
0
100
MP1469GJ
1323
07-10-13
50
0
100
MP3301GJ
1319
07-10-13
50
0
100
MP1541DJ
1325
07-10-13
100
0
100
MP3217DJ
1323
07-10-13
50
0
100
MPQ8903DJ-3.3
1323
09-10-13
50
0
100
MP62055EJ
1325
07-16-13
50
0
100
MP3217DJ
1322
07-16-13
50
0
100
MP6400DJ-01
1323
07-18-13
50
0
100
MP3302DJ-C136
1327
07-18-13
50
0
100
MP3410DJ
1327
07-18-13
50
0
100
MP3217DJ
1327
07-25-13
50
0
100
MP24893DJ
1327
07-25-13
100
0
100
MP2451DT
1327
07-30-13
50
0
100
MP3217DJ
1328
08-01-13
50
0
100
MP3301GJ
1330
08-07-13
50
0
100
MP3217DJ
1328
08-14-13
50
0
100
MP3217DJ
1329
08-14-13
50
0
100
MP3301GJ
1330
08-14-13
50
0
100
MP2370DJ
1329
08-14-13
50
0
100
MPQ8903DJ-3.3
1329
09-18-13
50
0
100
MP8903DJ-3.3
1328
08-28-13
50
0
100
MP3217DJ
1330
08-16-13
50
0
100
MP3217DJ
1330
08-20-13
50
0
100
MP2112DJ
1329
08-20-13
50
0
100
MP2357DT
1330
08-23-13
50
0
100
MP1541DJ
1329
08-29-13
50
0
100
MP2259DJ
1329
08-29-13
50
0
100
MP3217DJ
1330
08-29-13
48
0
100
MP1469GJ
1331
08-29-13
50
0
100
MP1541DJ
1329
09-05-13
50
0
100
MP3217DJ
1329
09-05-13
50
0
100
The Future of Analog IC Technology®
- 39 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3301GJ
1333
09-09-13
50
0
100
MPQ20056GJ-33-AEC 1321
09-09-13
50
0
100
FA NO.
# of
cycle
MP6400DJ-01
1334
09-10-13
50
0
100
MP3217DJ
1330
09-26-13
50
0
100
MP2359DJ
1331
09-26-13
50
0
100
MP2104DJ
1330
09-26-13
50
0
100
Total
0
4.4.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
MPQ2459GJ-ACQ100 1243
Close
Date
Sample
Size
# of
Fail
07-24-13
87
0
168
FA NO.
# of hrs
MP3410DJ
1315
10-09-13
97
0
168
MP2359DJ
1325
10-09-13
97
0
168
MP3302DJ
1306
07-02-13
50
0
48
MP8903DJ-3.3
1305
07-10-13
50
0
48
MP3120DJ
1315
08-15-13
50
0
48
MP8903DJ-3.3
1314
07-16-13
50
0
48
MP8903DJ-3.3
1218
09-02-13
50
0
48
MP3217DJ
1314
08-15-13
50
0
48
MP8903DJ-3.3
1319
09-23-13
50
0
48
MP2359DJ
1322
07-01-13
50
0
48
MP3217DJ
1322
07-01-13
50
0
48
MP8801DJ-2.85
1321
07-01-13
50
0
48
MP2451DT
1323
07-02-13
50
0
48
MP1541DJ
1318
07-03-13
50
0
48
MP62055EJ
1322
07-02-13
50
0
48
MP6400DJ-33
1323
07-10-13
50
0
48
MP1469GJ
1323
07-10-13
50
0
48
MP3301GJ
1319
07-10-13
50
0
48
MP1541DJ
1325
07-10-13
100
0
48
MP3217DJ
1323
07-10-13
50
0
48
MPQ8903DJ-3.3
1323
09-10-13
50
0
48
MP62055EJ
1325
07-16-13
50
0
48
MP3217DJ
1322
07-16-13
50
0
48
MP6400DJ-01
1323
07-18-13
50
0
48
MP3302DJ-C136
1327
07-18-13
50
0
48
MP3410DJ
1327
07-18-13
50
0
48
MP3217DJ
1327
07-25-13
50
0
48
MP24893DJ
1327
07-25-13
50
0
48
The Future of Analog IC Technology®
- 40 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2451DT
1327
07-30-13
50
0
48
MP3217DJ
1328
08-01-13
50
0
48
MP3301GJ
1330
08-07-13
50
0
48
MP3217DJ
1328
08-14-13
50
0
48
MP3217DJ
1329
08-14-13
50
0
48
MP3301GJ
1330
08-14-13
50
0
48
FA NO.
# of hrs
MP2370DJ
1329
08-14-13
50
0
48
MPQ8903DJ-3.3
1329
09-18-13
50
0
48
MP8903DJ-3.3
1328
08-28-13
50
0
48
MP3217DJ
1330
08-16-13
50
0
48
MP3217DJ
1330
08-20-13
50
0
48
MP2112DJ
1329
08-20-13
50
0
48
MP2357DT
1330
08-23-13
50
0
48
MP1541DJ
1329
08-29-13
50
0
48
MP2259DJ
1329
08-29-13
50
0
48
MP3217DJ
1330
08-29-13
50
0
48
MP1469GJ
1331
08-29-13
50
0
48
MP1541DJ
1329
09-05-13
50
0
48
MP3217DJ
1329
09-05-13
50
0
48
MP3301GJ
1333
09-09-13
50
0
48
MPQ20056GJ-AEC1 1321
09-09-13
50
0
48
MP6400DJ-01
1334
09-10-13
50
0
48
MP3217DJ
1330
09-26-13
50
0
48
MP2359DJ
1331
09-26-13
50
0
48
MP2104DJ
1330
09-26-13
50
0
48
Total
0
4.4.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
MPQ2459GJ-ACQ100 1243
MP3410DJ
1315
Close
Date
Sample
Size
# of
Fail
07-24-13
80
0
10-09-13
99
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 41 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
4.5 TSSOP
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
TSSOP20
ASNT
TSSOP16-EP
UCD
TSSOP20-EP
ASNT
TSSOP20
ASNT
TSSOP8
ASNT
TSSOP20-EP
ASNT
TSSOP14
ASNT
TSSOP24
ASNT
TSSOP16
ASNT
TSSOP28
ASNT
TSSOP28-EP
JCET
TSSOP8
4.5.1 Preconditioning
MSL2: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/60%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3398GF
1238
07-10-13
270
0
MP3389EF
1315
07-25-13
200
0
MP3391EF
1324
10-09-13
200
0
Total
FA NO.
0
SAT picture of TSSOP
T-SCAN PICTURE
C-SCAN PICTURE
4.5.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3398GF
1238
07-10-13
84
0
1000
MP3389EF
1315
07-25-13
97
0
1000
FA NO.
# of
cycle
MP3391EF
1324
10-09-13
97
0
1000
MP3394EF
1316
07-01-13
50
0
100
The Future of Analog IC Technology®
- 42 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
# of
cycle
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3394EF
1316
07-01-13
50
0
100
MP8126DF
1322
07-02-13
50
0
100
MP3389EF
1319
07-02-13
50
0
100
MP8125EF
1325
07-10-13
50
0
100
MP6507GF
1323
07-16-13
50
0
100
MP7731DF
1321
07-10-13
50
0
100
MP3389EF
1324
07-16-13
50
0
100
MP3389EF
1316
07-25-13
50
0
100
FA NO.
MP3394EF
1325
07-25-13
50
0
100
MP6505DM
1328
07-30-13
50
0
100
MP2364DF
1328
08-14-13
50
0
100
MP2364DF
1329
08-14-13
50
0
100
MP8126DF
1327
08-14-13
50
0
100
MP7731DF
1330
08-20-13
50
0
100
MP8126DF
1328
08-16-13
50
0
100
MP3394EF
1331
08-20-13
50
0
100
MP8125EF
1330
08-23-13
50
0
100
MP3394EF
1333
09-05-13
50
0
100
MP8126DF
1332
09-09-13
50
0
100
Total
0
4.5.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3398GF
1238
07-10-13
84
0
168
MP3389EF
1315
07-25-13
97
0
168
MP3391EF
1324
10-09-13
97
0
168
MP3394EF
1316
07-01-13
50
0
48
MP3394EF
1316
07-01-13
50
0
48
MP8126DF
1322
07-02-13
50
0
48
MP3389EF
1319
07-02-13
50
0
48
FA NO.
# of hrs
MP8125EF
1325
07-10-13
50
0
48
MP6507GF
1323
07-16-13
50
0
48
MP7731DF
1321
07-10-13
50
0
48
MP3389EF
1324
07-16-13
50
0
48
MP3389EF
1316
07-25-13
50
0
48
MP3394EF
1325
07-25-13
50
0
48
MP6505DM
1328
07-30-13
50
0
48
MP2364DF
1328
08-14-13
50
0
48
MP2364DF
1329
08-14-13
50
0
48
The Future of Analog IC Technology®
- 43 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8126DF
1327
08-14-13
50
0
48
MP7731DF
1330
08-20-13
50
0
48
MP8126DF
1328
08-16-13
50
0
48
MP3394EF
1331
08-20-13
50
0
48
MP8125EF
1330
08-23-13
50
0
48
MP3394EF
1333
09-05-13
50
0
48
MP8126DF
1332
09-09-13
50
0
48
Total
FA NO.
# of hrs
0
4.5.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3398GF
1238
07-10-13
90
0
Total
FA NO.
0
4.6 FLIP CHIP-QFN
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
UCD
FCQFN1*1.5
UTAC
FCQFN2*2
UCD
FCQFN1.5*2
UTAC
FCQFN2*3
UCD
FCQFN2*2
UTAC
FCQFN3*3
UCD
FCQFN2*3
UTAC
FCQFN3*4
UCD
FCQFN3*3
UTAC
FCQFN4*4
UCD
FCQFN3*4
UTAC
FCQFN4*5
UCD
FCQFN3*5
UTAC
FCQFN4*6
UCD
FCQFN4*4
UTAC
FCQFN5*5
UCD
FCQFN4*5
UTAC
FCQFN5*6
UCD
FCQFN4*6
UTAC
FCQFN6*6
4.6.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1312
07-02-13
80
0
MP8736DL
1312
07-02-13
80
0
MP8736DL
1316
07-12-13
85
0
MP8763GLE
1312
07-02-13
200
0
MP8736DL
1317
07-25-13
80
0
MPQ4470GL-AEC1
1237
07-24-13
296
0
FA NO.
The Future of Analog IC Technology®
- 44 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ4470GL-AEC1
1247
07-22-13
350
0
MPQ4470GL-AEC1
1249
07-22-13
382
0
MP8620ADQK
1314
07-24-13
200
0
MP5506GL
1230
07-19-13
271
0
MP2625GL
1304
07-31-13
271
0
MP8843GG-JC
1308
09-03-13
300
0
MP8736DL
1249
09-09-13
100
0
MP8736DL
1249
09-09-13
100
0
NB675GL
1311
10-09-13
203
0
MPM3810GQB
1305
09-18-13
270
0
MPM3805GQB
1315
09-18-13
95
0
MPM3805GQB
1315
09-18-13
95
0
NB675GL
1311
10-09-13
102
0
MPM3805GQB
1305
09-18-13
98
0
MPM3810GQB-E
1329
09-16-13
190
0
MPM3810GQB-12
1329
09-16-13
200
0
MPM3810GQB-18
1329
09-16-13
200
0
MP28251GD
1330
10-08-13
302
0
NB677GQ
1331
10-12-13
400
0
MP2617GL
1329
09-05-13
47
0
MP2617GL
1331
09-05-13
49
0
MP2617GL
1329
09-10-13
47
0
MP2617GL
1332
09-10-13
49
0
MP2617GL
1333
09-27-13
49
0
MP2617GL
1333
09-27-13
47
0
Total
FA NO.
0
SAT picture of FLIP CHIP-QFN
T-SCAN PICTURE
C-SCAN PICTURE
The Future of Analog IC Technology®
- 45 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
4.6.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28258DD
1227
07-05-13
50
0
1000
MP28258DD
1229
07-05-13
50
0
1000
MPQ8632GL-10
1243
07-05-13
47
0
1000
FA NO.
# of
cycle
MPQ8632GL-10
1247
07-05-13
47
0
1000
NB675GL
1311
07-16-13
47
0
1000
NB675GL
1311
07-16-13
47
0
1000
MP8736DL
1308
07-12-13
97
0
1000
MP8763GLE
1312
07-02-13
94
0
1000
MP28258DD
1214
07-10-13
48
0
1000
MP28258DD
1218
07-10-13
50
0
1000
NB671GQ
1313
07-24-13
46
0
1000
NB671GQ
1313
07-24-13
45
0
1000
MPQ4470GL-AEC1
1237
07-24-13
92
0
1000
MPQ4470GL-AEC1
1247
07-22-13
84
0
1000
MPQ4470GL-AEC1
1249
07-22-13
84
0
1000
MP5506GL
1230
07-19-13
84
0
1000
MP8736DL
1303
07-31-13
97
0
1000
MP8736DL
1303
07-31-13
97
0
1000
MP2625GL
1304
07-31-13
84
0
1000
MP8843GG-JC
1308
09-03-13
93
0
1000
MP8736DL
1249
09-09-13
50
0
1000
MP8736DL
1249
09-09-13
50
0
1000
NB675GL
1311
10-09-13
94
0
1000
MP86884DQKT
1311
09-18-13
50
0
1000
MP86884DQKT
1311
09-18-13
50
0
1000
MP2617AGL
1325
10-09-13
47
0
1000
MP2617AGL
1319
10-09-13
47
0
1000
MP28259DD
1318
10-09-13
46
0
1000
MP28259DD
1321
10-09-13
46
0
1000
MPM3810GQB-E
1329
09-16-13
94
0
1000
MPM3810GQB-12
1329
09-16-13
94
0
1000
MPM3810GQB-18
1329
09-16-13
94
0
1000
MP28251GD
1330
10-08-13
94
0
1000
NB677GQ
1331
10-12-13
94
0
1000
NB675GL
1302
07-01-13
44
0
1000
NB675GL
1302
07-01-13
50
0
1000
NB675GL
1248
07-02-13
45
0
1000
NB675GL
1251
07-01-13
46
0
1000
NB675GL
1241
07-02-13
48
0
1000
The Future of Analog IC Technology®
- 46 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB675GL
1305
07-02-13
48
0
1000
NB675GL
1304
07-15-13
50
0
1000
NB675GL
1305
07-15-13
50
0
1000
NB675GL
1305
07-01-13
50
0
1000
NB675GL
1305
07-01-13
44
0
1000
NB675GL
1309
07-01-13
50
0
1000
NB675GL
1309
07-01-13
50
0
1000
NB675GL
1314
07-16-13
47
0
1000
NB675GL
1314
07-16-13
47
0
1000
NB675GL
1311
07-25-13
47
0
1000
MPQ8636GL-10
1251
07-03-13
50
0
100
FA NO.
# of
cycle
NB675GL
1301
07-02-13
50
0
100
MPQ8632GL-8
1251
07-03-13
50
0
100
NB671GQ
1302
07-02-13
50
0
100
NB671GQ
1302
07-02-13
50
0
100
MPQ8636GL-10
1301
07-03-13
50
0
100
MPQ8632GL-10
1251
07-03-13
50
0
100
NB670GQ
1302
08-30-13
50
0
100
NB671GQ
1304
07-01-13
50
0
100
NB670GQ
1304
07-01-13
50
0
100
NB670GQ
1304
07-01-13
50
0
100
NB671AGQ
1304
07-01-13
50
0
100
NB671AGQ
1301
07-02-13
50
0
100
NB675GL
1301
07-01-13
50
0
100
NB671AGQ
1302
07-01-13
50
0
100
NB670GQ
1302
07-01-13
50
0
100
NB671GQ
1304
07-02-13
50
0
100
NB669GQ
1305
07-01-13
50
0
100
MPQ8612GL-12
1247
07-03-13
50
0
100
MPQ8636GL-10
1302
07-03-13
50
0
100
MPQ8632GL-8
1302
07-03-13
50
0
100
NB669GQ
1305
07-01-13
50
0
100
NB669GQ
1305
07-01-13
50
0
100
NB669GQ
1305
07-01-13
50
0
100
NB671GQ
1305
07-01-13
50
0
100
NB671AGQ
1305
07-01-13
50
0
100
NB670GQ
1305
07-01-13
50
0
100
NB671GQ
1305
07-01-13
50
0
100
MP2617GL
1306
09-10-13
50
0
100
NB669GQ
1307
07-01-13
50
0
100
NB671GQ
1307
07-01-13
50
0
100
NB671GQ
1305
07-01-13
50
0
100
The Future of Analog IC Technology®
- 47 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB675GL
1305
07-02-13
48
0
1000
NB675GL
1304
07-15-13
50
0
1000
NB675GL
1305
07-15-13
50
0
1000
NB675GL
1305
07-01-13
50
0
1000
NB675GL
1305
07-01-13
44
0
1000
NB675GL
1309
07-01-13
50
0
1000
NB675GL
1309
07-01-13
50
0
1000
NB675GL
1314
07-16-13
47
0
1000
NB675GL
1314
07-16-13
47
0
1000
NB675GL
1311
07-25-13
47
0
1000
MPQ8636GL-10
1251
07-03-13
50
0
100
FA NO.
# of
cycle
NB675GL
1301
07-02-13
50
0
100
MPQ8632GL-8
1251
07-03-13
50
0
100
NB671GQ
1302
07-02-13
50
0
100
NB671GQ
1302
07-02-13
50
0
100
MPQ8636GL-10
1301
07-03-13
50
0
100
MPQ8632GL-10
1251
07-03-13
50
0
100
NB670GQ
1302
08-30-13
50
0
100
NB671GQ
1304
07-01-13
50
0
100
NB670GQ
1304
07-01-13
50
0
100
NB670GQ
1304
07-01-13
50
0
100
NB671AGQ
1304
07-01-13
50
0
100
NB671AGQ
1301
07-02-13
50
0
100
NB675GL
1301
07-01-13
50
0
100
NB671AGQ
1302
07-01-13
50
0
100
NB670GQ
1302
07-01-13
50
0
100
NB671GQ
1304
07-02-13
50
0
100
NB669GQ
1305
07-01-13
50
0
100
MPQ8612GL-12
1247
07-03-13
50
0
100
MPQ8636GL-10
1302
07-03-13
50
0
100
MPQ8632GL-8
1302
07-03-13
50
0
100
NB669GQ
1305
07-01-13
50
0
100
NB669GQ
1305
07-01-13
50
0
100
NB669GQ
1305
07-01-13
50
0
100
NB671GQ
1305
07-01-13
50
0
100
NB671AGQ
1305
07-01-13
50
0
100
NB670GQ
1305
07-01-13
50
0
100
NB671GQ
1305
07-01-13
50
0
100
MP2617GL
1306
09-10-13
50
0
100
NB669GQ
1307
07-01-13
50
0
100
NB671GQ
1307
07-01-13
50
0
100
NB671GQ
1305
07-01-13
50
0
100
The Future of Analog IC Technology®
- 48 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB670GQ
1307
07-01-13
50
0
100
NB671GQ
1307
07-01-13
50
0
100
FA NO.
# of
cycle
MPQ8616GL-12
1303
07-03-13
50
0
100
NB671GQ
1307
07-01-13
50
0
100
NB671GQ
1307
07-01-13
50
0
100
MPQ8636GL-10
1302
07-03-13
50
0
100
MPQ8632GL-6
1308
07-03-13
50
0
100
MPQ8632GL-8
1308
07-03-13
50
0
100
NB671GQ
1309
07-01-13
50
0
100
MPQ8616GL-12
1305
07-03-13
50
0
100
MPQ8632GL-12
1302
07-03-13
50
0
100
MPQ8632GL-4
1305
07-03-13
50
0
100
NB669GQ
1309
07-01-13
50
0
100
NB670GQ
1310
07-26-13
50
0
100
NB671GQ
1309
07-01-13
50
0
100
MPQ8632GL-10
1251
07-03-13
50
0
100
NB671GQ
1307
07-01-13
50
0
100
NB671GQ
1308
07-02-13
50
0
100
NB671GQ
1307
07-01-13
50
0
100
NB669GQ
1310
07-01-13
50
0
100
NB670GQ
1309
07-02-13
50
0
100
MPQ8632GL-6
1310
07-03-13
50
0
100
MPQ8632GL-6
1309
07-03-13
50
0
100
MP2617GL
1311
09-10-13
50
0
100
NB670GQ
1309
08-30-13
50
0
100
NB669GQ
1310
07-01-13
50
0
100
NB669GQ
1310
07-01-13
50
0
100
NB670GQ
1309
07-01-13
50
0
100
NB671AGQ
1304
07-01-13
50
0
100
NB669GQ
1310
07-01-13
50
0
100
NB671AGQ
1305
07-01-13
50
0
100
NB671GQ
1313
07-02-13
50
0
100
NB670GQ
1310
07-01-13
50
0
100
MPQ4470GL
1249
07-02-13
50
0
100
NB669GQ
1309
07-02-13
50
0
100
NB670GQ
1309
07-01-13
50
0
100
NB671GQ
1307
07-01-13
50
0
100
MPQ8612GL-12
1308
07-03-13
50
0
100
MPQ8632GL-12
1312
07-03-13
50
0
100
NB669GQ
1309
07-01-13
50
0
100
MP2617GL
1311
09-10-13
50
0
100
NB669GQ
1309
07-01-13
50
0
100
The Future of Analog IC Technology®
- 49 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ8632GL-8
1311
07-03-13
50
0
100
NB671GQ
1307
07-01-13
50
0
100
NB669GQ
1314
07-01-13
50
0
100
NB670GQ
1307
07-01-13
50
0
100
NB675GL
1314
07-16-13
50
0
100
NB670GQ
1310
07-01-13
50
0
100
MP2130DG-C423
1304
09-12-13
50
0
100
MPQ8632HGL-10
1316
07-03-13
50
0
100
NB670GQ
1309
07-02-13
50
0
100
MPQ8632GL-6
1309
07-03-13
50
0
100
MPQ8632GL-12
1316
07-03-13
50
0
100
MP2617GL
1316
09-10-13
50
0
100
NB671GQ
1309
07-01-13
50
0
100
MP2617GL
1317
09-10-13
50
0
100
NB669GQ
1315
07-01-13
50
0
100
MP2625GL
1311
09-05-13
50
0
100
MP2617GL
1316
09-10-13
50
0
100
NB670GQ
1315
07-01-13
50
0
100
MP8606DL
1321
08-15-13
50
0
100
NB669GQ
1315
07-01-13
50
0
100
MP86885GQWT
1317
08-29-13
50
0
100
MPQ8636GL-10
1318
07-03-13
50
0
100
MPQ8616GL-6
1312
07-03-13
50
0
100
NB675GL
1314
07-16-13
50
0
100
MP2625GL
1311
07-04-13
50
0
100
MP2617GL
1320
09-10-13
50
0
100
NB669GQ
1315
07-01-13
50
0
100
MP2625GL
1311
07-23-13
50
0
100
MPQ8632GL-8
1316
07-03-13
50
0
100
NB669GQ
1317
07-10-13
50
0
100
NB675GL
1311
07-25-13
50
0
100
MP2617GL
1321
09-10-13
50
0
100
MPQ8632GL-6
1321
07-03-13
50
0
100
NB670GQ
1315
07-01-13
50
0
100
NB669GQ
1316
07-10-13
50
0
100
NB671AGQ
1311
07-10-13
50
0
100
MP2617GL
1322
09-10-13
50
0
100
FA NO.
# of
cycle
MP8736DL
1324
07-10-13
50
0
100
MP28259DD
1317
07-01-13
50
0
100
NB671AGQ
1324
07-10-13
50
0
100
MP28258DD
1306
07-01-13
50
0
100
MPQ8632GL-4
1316
07-10-13
50
0
100
The Future of Analog IC Technology®
- 50 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1323
07-10-13
50
0
100
NB671LGQ
1325
07-10-13
50
0
100
MP28259DD
1321
07-01-13
50
0
100
MP28258DD
1320
07-04-13
50
0
100
MP8736DL
1323
07-10-13
50
0
100
MP28258DD
1322
07-04-13
50
0
100
MP86884DQKT
1324
07-03-13
50
0
100
FA NO.
# of
cycle
NB650GL
1324
07-04-13
50
0
100
MP2617GL
1317
09-10-13
50
0
100
MP2158GQH
1325
07-02-13
50
0
100
MPQ8636GV-20
1317
07-10-13
50
0
100
NB638DL
1317
07-02-13
50
0
100
MP2140DD
1323
07-04-13
50
0
100
NB671LGQ
1325
07-10-13
50
0
100
MP8736DL
1324
07-01-13
50
0
100
MP2130DG
1321
07-03-13
50
0
100
MP2158GQH
1325
07-10-13
50
0
100
NB670GQ
1316
07-10-13
50
0
100
MP86884DQKT
1324
07-10-13
50
0
100
MP9180DG
1320
07-03-13
50
0
100
MP2617GL
1325
09-10-13
50
0
100
MPQ8636GL-10
1321
07-10-13
50
0
100
MP28258DD-C471
1321
07-04-13
50
0
100
MP2130DG
1321
07-03-13
50
0
100
MP8736DL
1324
07-10-13
50
0
100
MPQ8632GL-6
1324
07-10-13
50
0
100
MP4470GL
1325
07-10-13
50
0
100
NB669GQ
1318
07-10-13
50
0
100
MP2162GQH
1325
07-10-13
50
0
100
MP2130DG
1321
07-10-13
50
0
100
MP2130DG
1321
07-10-13
50
0
100
MP86963DUT
1311
07-16-13
50
0
100
MP2130DG
1323
07-10-13
50
0
100
MP2625GL
1313
07-16-13
50
0
100
MP1499GD
1321
07-16-13
50
0
100
MP2130DG
1324
07-10-13
50
0
100
MP2130DG
1322
07-10-13
50
0
100
MP8736DL
1326
07-16-13
50
0
100
NB669GQ
1316
07-16-13
50
0
100
MP86963DUT
1311
07-16-13
50
0
100
MP2617GL
1326
09-10-13
50
0
100
MP8736DL
1325
07-16-13
50
0
100
The Future of Analog IC Technology®
- 51 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MPQ8632GV-20
1315
07-16-13
50
0
100
MPQ8636GL-10
1310
07-16-13
50
0
100
FA NO.
# of
cycle
MP2625GL
1313
09-05-13
50
0
100
MP2130DG
1323
07-16-13
50
0
100
NB671GQ
1313
07-16-13
50
0
100
MP2158GQH
1326
07-16-13
50
0
100
MP2130DG
1325
07-11-13
50
0
100
MP2130DG
1323
07-16-13
50
0
100
MPQ8632GL-10
1251
07-16-13
50
0
100
MPQ8632GV-15
1322
07-16-13
50
0
100
MP2130DG
1323
07-16-13
50
0
100
NB671GQ
1311
07-16-13
50
0
100
MP2130DG
1325
07-16-13
50
0
100
MP2130DG
1323
07-16-13
50
0
100
MP2308GD
1325
07-16-13
50
0
100
MP8736DL
1325
07-16-13
50
0
100
MP2625GL
1319
07-16-13
50
0
100
MP2130DG
1323
07-11-13
50
0
100
MP2130DG
1323
07-16-13
50
0
100
MP8736DL
1325
07-16-13
50
0
100
MP2617GL
1326
09-10-13
50
0
100
MPQ8632GV-20
1323
07-16-13
50
0
100
MP2130DG
1324
07-16-13
50
0
100
NB671GQ
1313
07-18-13
50
0
100
NB650GL
1319
07-18-13
50
0
100
MPQ8632GVE-15
1304
07-18-13
50
0
100
MPQ8632GVE-20
1323
07-18-13
50
0
100
MP9180DG
1322
07-16-13
50
0
100
MP2130DG
1324
07-16-13
50
0
100
MPQ8632GL-10
1251
07-16-13
50
0
100
MP28259DD
1319
07-18-13
50
0
100
NB638DL
1327
07-18-13
50
0
100
MP2617GL
1326
09-10-13
50
0
100
MP28259DD
1325
07-18-13
50
0
100
MP2130DG
1324
07-18-13
50
0
100
NB669GQ
1319
07-23-13
50
0
100
MPQ8632GVE-20
1326
07-18-13
50
0
100
MPQ8632GVE-15
1327
07-18-13
50
0
100
MP2130DG
1325
07-18-13
50
0
100
MP2617GL
1326
09-10-13
50
0
100
MP2308GD
1325
07-18-13
50
0
100
NB650GL
1327
07-18-13
50
0
100
The Future of Analog IC Technology®
- 52 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2139DD
1324
07-18-13
50
0
100
MP2625GL
1325
07-18-13
50
0
100
FA NO.
# of
cycle
MP2130DG
1324
07-18-13
50
0
100
MP8736DL
1326
07-18-13
50
0
100
MP2130DG
1325
07-18-13
50
0
100
NB671GQ
1305
07-18-13
50
0
100
NB670GQ
1302
07-23-13
50
0
100
MP2617GL
1326
09-10-13
50
0
100
MP2625GL
1327
07-23-13
50
0
100
MP9180DG
1321
07-23-13
50
0
100
NB670GQ
1303
07-23-13
50
0
100
MP28258DD-A
1325
07-25-13
50
0
100
MPQ8632GVE-15
1327
07-23-13
50
0
100
MP2617GL
1326
09-10-13
50
0
100
NB671LGQ
1328
07-25-13
50
0
100
MP86884DQKT
1328
07-25-13
50
0
100
MP2625GL
1327
07-23-13
50
0
100
MP86884DQKT
1328
07-25-13
50
0
100
MP2140DD
1328
07-25-13
50
0
100
NB671GQ
1311
07-23-13
50
0
100
NB671LGQ
1328
07-25-13
50
0
100
MP2617GL
1326
09-10-13
50
0
100
MP86885GQWT
1325
07-23-13
50
0
100
NB671LGQ
1328
07-25-13
50
0
100
MP38873DL
1326
07-25-13
50
0
100
MP2130DG
1323
07-25-13
50
0
100
MP2625GL
1328
07-25-13
50
0
100
MP2617GL
1327
09-10-13
50
0
100
MP86884DQKT
1328
07-25-13
50
0
100
MP28258DD-C471
1305
07-25-13
50
0
100
MP2162GQH
1328
07-25-13
50
0
100
MP8736DL
1328
07-25-13
50
0
100
MP2162GQH
1328
07-30-13
50
0
100
MP2617GL
1326
09-10-13
50
0
100
MP2162GQH
1328
07-30-13
50
0
100
MP2625GL
1327
07-30-13
50
0
100
NB671LGQ
1328
07-30-13
50
0
100
MP2625GL
1328
07-30-13
50
0
100
MP28259DD
1321
07-30-13
50
0
100
MP8736DL
1328
07-30-13
50
0
100
MP2625GL
1327
08-01-13
50
0
100
MP1499GD
1324
08-01-13
50
0
100
The Future of Analog IC Technology®
- 53 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2130DG
1325
07-30-13
50
0
100
MP2617GL
1326
09-10-13
50
0
100
FA NO.
# of
cycle
MP8736DL
1329
07-30-13
50
0
100
MP2130DG
1325
07-30-13
50
0
100
MP2130DG
1325
07-30-13
50
0
100
MP86884DQKT
1311
07-30-13
50
0
100
MPQ4470GL
1329
08-07-13
50
0
100
MP86884DQKT
1329
07-30-13
50
0
100
MP2130DG
1325
08-07-13
50
0
100
MP2130DG
1324
08-07-13
50
0
100
MP8736DL
1329
08-07-13
50
0
100
MP2617GL
1328
09-10-13
50
0
100
MP2625GL
1328
08-07-13
50
0
100
MP86884DQKT
1324
08-07-13
50
0
100
MP38900DL
1328
08-07-13
50
0
100
NB671LGQ
1328
08-07-13
50
0
100
MP2130DG
1325
08-07-13
50
0
100
MP28258DD-A-C440 1321
08-07-13
50
0
100
MP2130DG
1325
08-07-13
50
0
100
MP2158GQH
1328
08-07-13
50
0
100
MP2130DG
1325
08-07-13
50
0
100
MP86884DQKT
1329
08-07-13
50
0
100
MP2334DD
1310
08-07-13
50
0
100
MPQ8632HGL-10
1330
08-07-13
50
0
100
MP2617GL
1328
09-10-13
50
0
100
MP2162GQH
1328
08-07-13
50
0
100
MP86884DQKT
1329
08-07-13
50
0
100
MPQ8632GVE-20
1330
08-07-13
50
0
100
NB638DL
1327
08-07-13
50
0
100
MP2130DG
1329
08-06-13
50
0
100
MP2130DG
1325
08-06-13
50
0
100
MP2139DD
1330
08-07-13
50
0
100
NB671LGQ
1329
08-14-13
50
0
100
MP2130DG
1329
08-14-13
50
0
100
MP8736DL
1330
08-07-13
50
0
100
MP2617GL
1329
09-10-13
50
0
100
MP2130DG
1330
08-14-13
50
0
100
NB671AGQ
1324
08-14-13
50
0
100
MP8760GL
1331
08-14-13
50
0
100
MP2617GL
1329
09-10-13
50
0
100
MPQ8636GL-10
1322
08-14-13
50
0
100
MP2130DG
1330
08-14-13
50
0
100
The Future of Analog IC Technology®
- 54 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2130DG
1326
08-14-13
50
0
100
MP8736DL
1330
08-14-13
50
0
100
MP2162GQH
1329
08-14-13
50
0
100
MP2139DD
1324
08-14-13
50
0
100
MP9181DD
1331
08-14-13
50
0
100
MP2130DG
1328
08-14-13
50
0
100
MP2162GQH
1329
08-14-13
50
0
100
FA NO.
# of
cycle
MP8736DL
1329
08-14-13
50
0
100
MP1499GD
1321
08-16-13
50
0
100
MP2617GL
1329
09-10-13
50
0
100
MP2617GL
1329
09-10-13
50
0
100
MP2625GL
1329
08-14-13
50
0
100
MPQ8632GL-6
1331
08-16-13
50
0
100
NB671GQ
1312
08-14-13
50
0
100
MP28259DD
1330
08-14-13
50
0
100
MP2162GQH
1329
08-14-13
50
0
100
NB671GQ
1305
08-14-13
50
0
100
MP8736DL
1330
08-14-13
50
0
100
MP9447GL
1331
08-14-13
50
0
100
MP28258DD
1305
08-16-13
50
0
100
MP8736DL
1331
08-16-13
50
0
100
MP1499GD
1326
08-16-13
50
0
100
MP2625GL
1331
08-16-13
50
0
100
NB670GQ
1317
08-16-13
50
0
100
NB670GQ
1317
08-16-13
50
0
100
NB671AGQ
1325
08-20-13
50
0
100
MP8606DL
1329
08-16-13
50
0
100
MP2162GQH
1330
08-20-13
50
0
100
NB650GL
1329
08-20-13
50
0
100
NB671GQ
1307
08-16-13
50
0
100
MP2617GL
1326
09-10-13
50
0
100
MP4470GL
1331
08-20-13
50
0
100
MP28258DD
1319
08-28-13
50
0
100
MP8762GL
1332
08-20-13
50
0
100
MP9181DD
1330
08-20-13
50
0
100
MP8736DL
1331
08-20-13
50
0
100
MP2625GL
1331
08-20-13
50
0
100
MP9180DG
1309
09-05-13
50
0
100
NB650HGL
1305
08-20-13
50
0
100
MP2130DG
1326
08-20-13
50
0
100
MP28258DD
1305
08-28-13
50
0
100
NB638DL
1330
08-20-13
50
0
100
The Future of Analog IC Technology®
- 55 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1332
08-20-13
50
0
100
MP9180DG
1321
08-20-13
50
0
100
MP2334DD
1313
08-23-13
50
0
100
NB671GQ
1304
08-20-13
50
0
100
MP2158GQH
1330
08-20-13
50
0
100
MP2617GL
1329
09-05-13
50
0
100
MP2130DG
1327
08-23-13
50
0
100
FA NO.
# of
cycle
NB671GQ
1309
08-28-13
50
0
100
MP2625GL
1332
08-23-13
50
0
100
NB671GQ
1302
08-28-13
50
0
100
MP28258DD
1321
08-23-13
50
0
100
NB671GQ
1307
08-28-13
50
0
100
MP9151GD
1328
08-28-13
50
0
100
NB670GQ
1316
08-28-13
50
0
100
MP2617GL
1331
09-05-13
50
0
100
MP2130DG
1329
08-23-13
50
0
100
MP2617GL
1329
09-10-13
50
0
100
MP2130DG
1328
08-23-13
50
0
100
MP28259DD-A-C441 1327
08-23-13
50
0
100
09-10-13
50
0
100
MP2617GL
1329
MP28258DD-C471
1325
08-23-13
50
0
100
NB638DL
1333
08-28-13
50
0
100
MP86961DU
1137
08-28-13
50
0
100
MP2334DD
1315
08-28-13
50
0
100
MP2625GL
1332
08-28-13
50
0
100
MP2617GL
1329
09-10-13
50
0
100
MP9186GD
1308
08-28-13
50
0
100
MP2334DD
1320
08-28-13
50
0
100
MP8760GL
1333
08-28-13
50
0
100
MP1499GD
1324
08-28-13
50
0
100
MP2617GL
1332
09-10-13
50
0
100
MP2617GL
1329
09-10-13
50
0
100
MP2130DG
1328
08-29-13
50
0
100
MPQ8632HGL-10
1330
09-05-13
50
0
100
MP9186GD
1322
08-29-13
50
0
100
MP8606DL
1332
08-30-13
50
0
100
MPQ8632GL-6
1333
08-30-13
50
0
100
MP2617GL
1329
09-10-13
50
0
100
MP2617GL
1333
09-10-13
50
0
100
MP2617GL
1332
09-10-13
50
0
100
NB650GL
1334
08-30-13
50
0
100
MP2130DG
1328
08-29-13
50
0
100
The Future of Analog IC Technology®
- 56 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB671GQ
1326
08-29-13
50
0
100
MP2334DD
1330
08-29-13
50
0
100
FA NO.
# of
cycle
MP1499GD
1310
08-29-13
50
0
100
MP2617GL
1332
09-10-13
50
0
100
MP28258DD
1305
08-29-13
50
0
100
NB671GQ
1326
08-29-13
50
0
100
MP2334DD
1322
08-30-13
50
0
100
MP38876DL
1327
08-30-13
50
0
100
MP8606DL
1331
08-30-13
50
0
100
MP2617GL
1333
09-27-13
50
0
100
MP2617GL
1333
09-27-13
50
0
100
MP28258DD
1311
09-05-13
50
0
100
MP8736DL
1334
09-05-13
50
0
100
MPQ8632GL-10
1321
09-05-13
50
0
100
NB671GQ
1326
09-05-13
50
0
100
MP2617GL
1334
09-10-13
50
0
100
MP2334DD
1330
09-05-13
50
0
100
MP8736DL
1334
09-09-13
50
0
100
MP2130DG
1330
09-09-13
50
0
100
MP2334DD
1331
09-09-13
50
0
100
MP2625GL
1332
09-09-13
50
0
100
NB671LGQ
1334
09-09-13
50
0
100
MP1499GD
1335
09-09-13
50
0
100
MP2130DG
1330
09-09-13
50
0
100
NB669GQ
1332
09-09-13
50
0
100
MP28258DD
1320
09-09-13
50
0
100
NB671GQ
1324
09-09-13
50
0
100
MP8736DL
1334
09-09-13
50
0
100
NB671GQ
1320
09-09-13
50
0
100
MP38875DL
1327
09-09-13
50
0
100
MP2625GL
1334
09-09-13
50
0
100
MP2735DQG
1335
09-10-13
50
0
100
NB669GQ
1332
09-10-13
50
0
100
MP9181DD
1335
09-10-13
50
0
100
NB671LGQ
1335
09-10-13
50
0
100
NB638DL
1335
09-10-13
50
0
100
NB669GQ
1332
09-10-13
50
0
100
MP2162GQH
1334
09-18-13
50
0
100
MP2625GL
1332
09-12-13
50
0
100
NB670GQ
1333
09-18-13
50
0
100
MP28257DD
1326
09-12-13
50
0
100
MP9181DD
1335
09-12-13
50
0
100
The Future of Analog IC Technology®
- 57 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8760GL
1335
09-12-13
50
0
100
MP28258DD
1321
09-12-13
50
0
100
FA NO.
# of
cycle
MP2130DG
1330
09-12-13
50
0
100
NB671GQ
1323
09-12-13
50
0
100
MP8736DL
1335
09-12-13
50
0
100
MP2130DG
1330
09-12-13
50
0
100
NB638DL
1335
09-12-13
50
0
100
MPQ8636GL-10
1335
09-12-13
50
0
100
MP2130DG
1330
09-12-13
50
0
100
MP2334DD
1330
09-12-13
50
0
100
NB650HGL
1335
09-18-13
50
0
100
NB6381DL
1316
09-18-13
50
0
100
MP8736DL
1336
09-18-13
50
0
100
MP2625GL
1335
09-18-13
50
0
100
MP2130DG
1330
09-18-13
50
0
100
MP2308GD
1333
09-18-13
50
0
100
MP8736DL
1336
09-18-13
50
0
100
MPM3810GQB
1334
09-18-13
50
0
100
MP2139DD
1336
09-23-13
50
0
100
MP2130DG-C423
1304
09-18-13
50
0
100
MP1499GD
1335
09-23-13
50
0
100
MP3306EG
1336
09-18-13
50
0
100
MP8736DL
1336
09-23-13
50
0
100
MP28259DD
1321
09-23-13
50
0
100
NB650HGL
1305
09-23-13
50
0
100
MP2617GL
1334
09-23-13
50
0
100
MPQ8632GVE-20
1336
09-23-13
50
0
100
MP2158GQH
1334
09-18-13
50
0
100
MP3306EG
1334
09-18-13
50
0
100
MP28258DD-C471
1311
09-23-13
50
0
100
MP2617GL
1334
09-26-13
50
0
100
MP9180DG
1332
09-23-13
50
0
100
MP8760GL
1335
09-26-13
50
0
100
MP1499GD
1333
09-23-13
50
0
100
NB650HGL
1311
09-26-13
50
0
100
NB639DL
1313
09-26-13
50
0
100
MP2158GQH-M006
1334
09-23-13
50
0
100
MP9180DG
1332
09-23-13
50
0
100
MP2617AGL
1336
09-26-13
50
0
100
MP9180DG
1322
09-26-13
50
0
100
MP9180DG
1322
09-26-13
50
0
100
MPQ8632GL-6
1336
09-26-13
50
0
100
The Future of Analog IC Technology®
- 58 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP9180DG
1328
09-26-13
50
0
100
NB675GL
1333
09-26-13
50
0
100
MP2130DG
1333
09-26-13
50
0
100
MP9180DG
1332
09-26-13
50
0
100
MP2130DG
1330
09-26-13
50
0
100
MP2130DG
1332
09-26-13
50
0
100
MP2130DG
1332
09-26-13
50
0
100
Total
FA NO.
# of
cycle
0
4.6.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28258DD
1227
07-05-13
50
0
168
MP28258DD
1229
07-05-13
50
0
168
MPQ8632GL-10
1243
07-05-13
47
0
168
MPQ8632GL-10
1247
07-05-13
47
0
168
NB675GL
1311
07-16-13
47
0
168
NB675GL
1311
07-16-13
47
0
168
MP8736DL
1308
07-12-13
100
0
168
MP8763GLE
1312
07-02-13
97
0
168
MP28258DD
1214
07-10-13
47
0
168
MP28258DD
1218
07-10-13
50
0
168
NB671GQ
1313
07-24-13
47
0
168
NB671GQ
1313
07-24-13
45
0
168
MPQ4470GL-AEC1
1237
07-24-13
90
0
168
MPQ4470GL-AEC1
1247
07-22-13
87
0
168
MPQ4470GL-AEC1
1249
07-22-13
87
0
168
MP5506GL
1230
07-19-13
87
0
168
MP8620DQK
1233
07-24-13
95
0
168
MP8620DQK
1233
07-24-13
95
0
168
MP8620DQK
1233
07-24-13
95
0
168
MP8620DQK
1233
07-24-13
95
0
168
MP8620DQK
1234
07-24-13
90
0
168
MP8620DQK
1235
07-24-13
90
0
168
MP8736DL
1303
07-31-13
97
0
168
MP8736DL
1303
07-31-13
97
0
168
MP2625GL
1304
07-31-13
87
0
168
MP8843GG-JC
1308
09-03-13
97
0
168
MP8736DL
1249
09-09-13
50
0
168
MP8736DL
1249
09-09-13
50
0
168
FA NO.
# of hrs
The Future of Analog IC Technology®
- 59 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB675GL
1311
10-09-13
97
0
168
MP86884DQKT
1311
09-18-13
50
0
168
MP86884DQKT
1311
09-18-13
50
0
168
MP2617AGL
1325
10-09-13
46
0
168
MP2617AGL
1319
10-09-13
47
0
168
MP28259DD
1318
10-09-13
47
0
168
MP28259DD
1321
10-09-13
47
0
168
FA NO.
# of hrs
MPM3810GQB-E
1329
09-16-13
87
0
168
MPM3810GQB-12
1329
09-16-13
97
0
168
MPM3810GQB-18
1329
09-16-13
97
0
168
MP28251GD
1330
10-08-13
97
0
168
NB677GQ
1331
10-12-13
97
0
168
NB675GL
1302
07-01-13
47
0
168
NB675GL
1302
07-01-13
47
0
168
NB675GL
1248
07-02-13
45
0
168
NB675GL
1251
07-01-13
50
0
168
NB675GL
1241
07-02-13
47
0
168
NB675GL
1305
07-02-13
48
0
168
NB675GL
1304
07-15-13
50
0
168
NB675GL
1305
07-15-13
50
0
168
NB675GL
1305
07-01-13
50
0
168
NB675GL
1305
07-01-13
47
0
168
NB675GL
1309
07-01-13
50
0
168
NB675GL
1309
07-01-13
50
0
168
NB675GL
1314
07-16-13
45
0
168
NB675GL
1314
07-16-13
44
0
168
NB675GL
1311
07-25-13
47
0
168
MPQ8636GL-10
1251
07-03-13
50
0
48
NB675GL
1301
07-02-13
50
0
48
MPQ8632GL-8
1251
07-03-13
50
0
48
NB671GQ
1302
07-02-13
50
0
48
NB671GQ
1302
07-02-13
50
0
48
MPQ8636GL-10
1301
07-03-13
50
0
48
MPQ8632GL-10
1251
07-03-13
50
0
48
MP8620DQK
1245
07-02-13
50
0
48
NB670GQ
1302
08-30-13
50
2
NB671GQ
1304
07-01-13
50
0
48
NB670GQ
1304
07-01-13
50
0
48
NB670GQ
1304
07-01-13
50
0
48
NB671AGQ
1304
07-01-13
50
0
48
NB671AGQ
1301
07-02-13
50
0
48
NB675GL
1301
07-01-13
50
0
48
6550
48
The Future of Analog IC Technology®
- 60 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB671AGQ
1302
07-01-13
50
0
48
NB670GQ
1302
07-01-13
50
0
48
NB671GQ
1304
07-02-13
50
0
48
NB669GQ
1305
07-01-13
50
0
48
MPQ8612GL-12
1247
07-03-13
50
0
48
MPQ8636GL-10
1302
07-03-13
50
0
48
MPQ8632GL-8
1302
07-03-13
50
0
48
NB669GQ
1305
07-01-13
50
0
48
NB669GQ
1305
07-01-13
50
0
48
NB669GQ
1305
07-01-13
50
0
48
NB671GQ
1305
07-01-13
50
0
48
NB671AGQ
1305
07-01-13
50
0
48
NB670GQ
1305
07-01-13
50
0
48
NB671GQ
1305
07-01-13
50
0
48
MP2617GL
1306
09-10-13
50
0
48
NB669GQ
1307
07-01-13
50
0
48
NB671GQ
1307
07-01-13
50
0
48
NB671GQ
1305
07-01-13
50
0
48
NB670GQ
1307
07-01-13
50
0
48
NB671GQ
1307
07-01-13
50
0
48
FA NO.
# of hrs
MPQ8616GL-12
1303
07-03-13
50
0
48
NB671GQ
1307
07-01-13
50
0
48
NB671GQ
1307
07-01-13
50
0
48
MPQ8636GL-10
1302
07-03-13
50
0
48
MPQ8632GL-6
1308
07-03-13
50
0
48
MPQ8632GL-8
1308
07-03-13
50
0
48
NB671GQ
1309
07-01-13
50
0
48
MPQ8616GL-12
1305
07-03-13
50
0
48
MPQ8632GL-12
1302
07-03-13
50
0
48
MPQ8632GL-4
1305
07-03-13
50
0
48
NB669GQ
1309
07-01-13
50
0
48
NB670GQ
1310
07-26-13
50
0
48
NB671GQ
1309
07-01-13
50
0
48
MPQ8632GL-10
1251
07-03-13
50
0
48
NB670GQ
1304
07-26-13
50
0
48
NB671GQ
1307
07-01-13
50
0
48
NB671GQ
1308
07-02-13
50
0
48
NB671GQ
1307
07-01-13
50
0
48
NB669GQ
1310
07-01-13
50
0
48
NB670GQ
1309
07-02-13
50
0
48
MPQ8632GL-6
1310
07-03-13
50
0
48
MPQ8632GL-6
1309
07-03-13
50
0
48
The Future of Analog IC Technology®
- 61 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2617GL
1311
09-10-13
50
0
48
NB670GQ
1309
08-30-13
50
0
48
NB669GQ
1310
07-01-13
50
0
48
NB669GQ
1310
07-01-13
50
0
48
NB670GQ
1309
07-01-13
50
0
48
NB671AGQ
1304
07-01-13
50
0
48
NB669GQ
1310
07-01-13
50
0
48
NB671AGQ
1305
07-01-13
50
0
48
NB671GQ
1313
07-02-13
50
0
48
NB670GQ
1310
07-01-13
50
0
48
MPQ4470GL
1249
07-02-13
50
0
48
NB669GQ
1309
07-02-13
50
0
48
NB670GQ
1309
07-01-13
50
0
48
NB671GQ
1307
07-01-13
50
0
48
MPQ8612GL-12
1308
07-03-13
50
0
48
FA NO.
# of hrs
MPQ8632GL-12
1312
07-03-13
50
0
48
NB669GQ
1309
07-01-13
50
0
48
NB669GQ
1309
07-01-13
50
0
48
MPQ8632GL-8
1311
07-03-13
50
0
48
NB671GQ
1307
07-01-13
50
0
48
NB669GQ
1314
07-01-13
50
0
48
NB670GQ
1307
07-01-13
50
0
48
NB675GL
1314
07-16-13
50
0
48
NB670GQ
1310
07-01-13
50
0
48
MP2130DG-C423
1304
09-12-13
50
0
48
MPQ8632HGL-10
1316
07-03-13
50
0
48
NB670GQ
1309
07-02-13
50
0
48
MPQ8632GL-6
1309
07-03-13
50
0
48
MPQ8632GL-12
1316
07-03-13
50
0
48
MP2617GL
1316
09-10-13
50
0
48
NB671GQ
1309
07-01-13
50
0
48
MP2617GL
1317
09-10-13
50
0
48
NB669GQ
1315
07-01-13
50
0
48
MP2625GL
1311
09-05-13
50
0
48
MP2617GL
1316
09-10-13
50
0
48
NB670GQ
1315
07-01-13
50
0
48
MP8606DL
1321
08-15-13
50
0
48
NB669GQ
1315
07-01-13
50
0
48
MP86885GQWT
1317
08-29-13
50
0
48
MPQ8636GL-10
1318
07-03-13
50
0
48
MPQ8616GL-6
1312
07-03-13
50
0
48
NB675GL
1314
07-16-13
50
0
48
The Future of Analog IC Technology®
- 62 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2625GL
1311
07-04-13
50
0
48
MP2617GL
1320
09-10-13
50
0
48
FA NO.
# of hrs
NB669GQ
1315
07-01-13
50
0
48
MP2625GL
1311
07-23-13
50
0
48
MPQ8632GL-8
1316
07-03-13
50
0
48
NB669GQ
1317
07-10-13
50
0
48
NB675GL
1311
07-25-13
50
0
48
MP2617GL
1321
09-10-13
50
0
48
MPQ8632GL-6
1321
07-03-13
50
0
48
NB670GQ
1315
07-01-13
50
0
48
NB669GQ
1316
07-10-13
50
0
48
NB671AGQ
1311
07-10-13
50
0
48
MP2617GL
1322
09-10-13
50
0
48
MP8736DL
1324
07-10-13
50
0
48
MP28259DD
1317
07-01-13
50
0
48
NB671AGQ
1324
07-10-13
50
0
48
MP28258DD
1306
07-01-13
50
0
48
MPQ8632GL-4
1316
07-10-13
50
0
48
MP8736DL
1323
07-10-13
50
0
48
NB671LGQ
1325
07-10-13
50
0
48
MP28259DD
1321
07-01-13
50
0
48
MP28258DD
1320
07-04-13
50
0
48
MP8736DL
1323
07-10-13
50
0
48
MP28258DD
1322
07-04-13
50
0
48
MP86884DQKT
1324
07-03-13
50
0
48
NB650GL
1324
07-04-13
50
0
48
MP2617GL
1317
09-10-13
50
0
48
MP2158GQH
1325
07-02-13
50
0
48
MPQ8636GV-20
1317
07-10-13
50
0
48
NB638DL
1317
07-02-13
50
0
48
MP2140DD
1323
07-04-13
50
0
48
NB671LGQ
1325
07-10-13
50
0
48
MP8736DL
1324
07-01-13
50
0
48
MP2130DG
1321
07-03-13
50
0
48
MP2158GQH
1325
07-10-13
50
0
48
NB670GQ
1316
07-10-13
50
0
48
MP86884DQKT
1324
07-10-13
50
0
48
MP9180DG
1320
07-03-13
50
0
48
MP2617GL
1325
09-10-13
50
0
48
MPQ8636GL-10
1321
07-10-13
50
0
48
MP28258DD-C471
1321
07-04-13
50
0
48
MP2130DG
1321
07-03-13
50
0
48
The Future of Analog IC Technology®
- 63 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1324
07-10-13
50
0
48
MPQ8632GL-6
1324
07-10-13
50
0
48
MP4470GL
1325
07-10-13
50
0
48
NB669GQ
1318
07-10-13
50
0
48
MP2162GQH
1325
07-10-13
50
0
48
MP2130DG
1321
07-10-13
50
0
48
MP2130DG
1321
07-10-13
50
0
48
MP86963DUT
1311
07-16-13
50
0
48
MP2130DG
1323
07-10-13
50
0
48
MP2625GL
1313
07-16-13
50
0
48
MP1499GD
1321
07-16-13
50
0
48
MP2130DG
1324
07-10-13
50
0
48
MP2130DG
1322
07-10-13
50
0
48
MP8736DL
1326
07-16-13
50
0
48
NB669GQ
1316
07-16-13
50
0
48
MP86963DUT
1311
07-16-13
50
0
48
MP2617GL
1326
09-10-13
50
0
48
MP8736DL
1325
07-16-13
50
0
48
MPQ8632GV-20
1315
07-16-13
50
0
48
MPQ8636GL-10
1310
07-16-13
50
0
48
FA NO.
# of hrs
MP2625GL
1313
09-05-13
50
0
48
MP2130DG
1323
07-16-13
50
0
48
NB671GQ
1313
07-16-13
50
0
48
MP2158GQH
1326
07-16-13
50
0
48
MP2130DG
1325
07-11-13
50
0
48
MP2130DG
1323
07-16-13
50
0
48
MPQ8632GL-10
1251
07-16-13
50
0
48
MPQ8632GV-15
1322
07-16-13
50
0
48
MP2130DG
1323
07-16-13
50
0
48
NB671GQ
1311
07-16-13
50
0
48
MP2130DG
1325
07-16-13
50
0
48
MP2130DG
1323
07-16-13
50
0
48
MP2308GD
1325
07-16-13
50
0
48
MP8736DL
1325
07-16-13
50
0
48
MP2625GL
1319
07-16-13
50
0
48
MP2130DG
1323
07-11-13
50
0
48
MP2130DG
1323
07-16-13
50
0
48
MP8736DL
1325
07-16-13
50
0
48
MP2617GL
1326
09-10-13
50
0
48
MPQ8632GV-20
1323
07-16-13
50
0
48
MP2130DG
1324
07-16-13
50
0
48
NB671GQ
1313
07-18-13
50
0
48
The Future of Analog IC Technology®
- 64 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
NB650GL
1319
07-18-13
50
0
48
MPQ8632GVE-15
1304
07-18-13
50
0
48
MPQ8632GVE-20
1323
07-18-13
50
0
48
MP9180DG
1322
07-16-13
50
0
48
MP2130DG
1324
07-16-13
50
0
48
MPQ8632GL-10
1251
07-16-13
50
0
48
MP28259DD
1319
07-18-13
50
0
48
FA NO.
# of hrs
NB638DL
1327
07-18-13
50
0
48
MP2617GL
1326
09-10-13
50
0
48
MP28259DD
1325
07-18-13
50
0
48
MP2130DG
1324
07-18-13
50
0
48
NB669GQ
1319
07-23-13
50
0
48
MPQ8632GVE-20
1326
07-18-13
50
0
48
MPQ8632GVE-15
1327
07-18-13
50
0
48
MP2130DG
1325
07-18-13
50
0
48
MP2617GL
1326
09-10-13
50
0
48
MP2308GD
1325
07-18-13
50
0
48
NB650GL
1327
07-18-13
50
0
48
MP2139DD
1324
07-18-13
50
0
48
MP2625GL
1325
07-18-13
50
0
48
MP2130DG
1324
07-18-13
50
0
48
MP8736DL
1326
07-18-13
50
0
48
MP2130DG
1325
07-18-13
50
0
48
NB671GQ
1305
07-18-13
50
0
48
NB670GQ
1302
07-23-13
50
0
48
MP2617GL
1326
09-10-13
50
0
48
MP2625GL
1327
07-23-13
50
0
48
MP9180DG
1321
07-23-13
50
0
48
NB670GQ
1303
07-23-13
50
0
48
MP28258DD-A
1325
07-25-13
50
0
48
MPQ8632GVE-15
1327
07-23-13
50
0
48
MP2617GL
1326
09-10-13
50
0
48
NB671LGQ
1328
07-25-13
50
0
48
MP86884DQKT
1328
07-25-13
50
0
48
MP2625GL
1327
07-23-13
50
0
48
MP86884DQKT
1328
07-25-13
50
0
48
MP2140DD
1328
07-25-13
50
0
48
NB671GQ
1311
07-23-13
50
0
48
NB671LGQ
1328
07-25-13
50
0
48
MP2617GL
1326
09-10-13
50
0
48
MP86885GQWT
1325
07-23-13
50
0
48
NB671LGQ
1328
07-25-13
50
0
48
The Future of Analog IC Technology®
- 65 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP38873DL
1326
07-25-13
50
0
48
MP2130DG
1323
07-25-13
50
0
48
MP2625GL
1328
07-25-13
50
0
48
MP2617GL
1327
09-10-13
50
0
48
MP86884DQKT
1328
07-25-13
50
0
48
MP8620DQK
1323
07-30-13
50
0
48
MP28258DD-C471
1305
07-25-13
50
0
48
MP2162GQH
1328
07-25-13
50
0
48
MP8736DL
1328
07-25-13
50
0
48
MP8620DQK
1323
07-30-13
50
0
48
MP2162GQH
1328
07-30-13
50
0
48
FA NO.
# of hrs
MP2617GL
1326
09-10-13
50
0
48
MP2162GQH
1328
07-30-13
50
0
48
MP2625GL
1327
07-30-13
50
0
48
NB671LGQ
1328
07-30-13
50
0
48
MP2625GL
1328
07-30-13
50
0
48
MP28259DD
1321
07-30-13
50
0
48
MP8736DL
1328
07-30-13
50
0
48
MP2625GL
1327
08-01-13
50
0
48
MP1499GD
1324
08-01-13
50
0
48
MP2130DG
1325
07-30-13
50
0
48
MP2617GL
1326
09-10-13
50
0
48
MP8736DL
1329
07-30-13
50
0
48
MP2130DG
1325
07-30-13
50
0
48
MP2130DG
1325
07-30-13
50
0
48
MP86884DQKT
1311
07-30-13
50
0
48
MPQ4470GL
1329
08-07-13
50
0
48
MP86884DQKT
1329
07-30-13
50
0
48
MP2130DG
1325
08-07-13
50
0
48
MP2130DG
1324
08-07-13
50
0
48
MP8736DL
1329
08-07-13
50
0
48
MP2617GL
1328
09-10-13
50
0
48
MP2625GL
1328
08-07-13
50
0
48
MP86884DQKT
1324
08-07-13
50
0
48
MP38900DL
1328
08-07-13
50
0
48
NB671LGQ
1328
08-07-13
50
0
48
MP2130DG
1325
08-07-13
50
0
48
MP28258DD-A-C440 1321
08-07-13
50
0
48
MP2130DG
1325
08-07-13
50
0
48
MP2158GQH
1328
08-07-13
50
0
48
MP2130DG
1325
08-07-13
50
0
48
MP86884DQKT
1329
08-07-13
50
0
48
The Future of Analog IC Technology®
- 66 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2334DD
1310
08-07-13
50
0
48
MP8620DQK
1330
08-07-13
50
0
48
MPQ8632HGL-10
1330
08-07-13
50
0
48
MP2617GL
1328
09-10-13
50
0
48
MP8620DQK
1330
08-07-13
50
0
48
MP2162GQH
1328
08-07-13
50
0
48
MP86884DQKT
1329
08-07-13
50
0
48
MPQ8632GVE-20
1330
08-07-13
50
0
48
NB638DL
1327
08-07-13
50
0
48
MP2130DG
1329
08-06-13
50
0
48
MP2130DG
1325
08-06-13
50
0
48
FA NO.
# of hrs
MP2139DD
1330
08-07-13
50
0
48
NB671LGQ
1329
08-14-13
50
0
48
MP2130DG
1329
08-14-13
50
0
48
MP8736DL
1330
08-07-13
50
0
48
MP2617GL
1329
09-10-13
50
0
48
MP2130DG
1330
08-14-13
50
0
48
NB671AGQ
1324
08-14-13
50
0
48
MP8760GL
1331
08-14-13
50
0
48
MP2617GL
1329
09-10-13
50
0
48
MPQ8636GL-10
1322
08-14-13
50
0
48
MP2130DG
1330
08-14-13
50
0
48
MP2130DG
1326
08-14-13
50
0
48
MP8736DL
1330
08-14-13
50
0
48
MP2162GQH
1329
08-14-13
50
0
48
MP2139DD
1324
08-14-13
50
0
48
MP9181DD
1331
08-14-13
50
0
48
MP2130DG
1328
08-14-13
50
0
48
MP2162GQH
1329
08-14-13
50
0
48
MP8736DL
1329
08-14-13
50
0
48
MP1499GD
1321
08-16-13
50
0
48
MP2617GL
1329
09-10-13
50
0
48
MP2617GL
1329
09-10-13
50
0
48
MP2625GL
1329
08-14-13
50
0
48
MPQ8632GL-6
1331
08-16-13
50
0
48
NB671GQ
1312
08-14-13
50
0
48
MP28259DD
1330
08-14-13
50
0
48
MP2162GQH
1329
08-14-13
50
0
48
NB671GQ
1305
08-14-13
50
0
48
MP8736DL
1330
08-14-13
50
0
48
MP9447GL
1331
08-14-13
50
0
48
MP28258DD
1305
08-16-13
50
0
48
The Future of Analog IC Technology®
- 67 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1331
08-16-13
50
0
48
MP1499GD
1326
08-16-13
50
0
48
MP2625GL
1331
08-16-13
50
0
48
NB670GQ
1317
08-16-13
50
0
48
NB670GQ
1317
08-16-13
50
0
48
NB671AGQ
1325
08-20-13
50
0
48
MP8606DL
1329
08-16-13
50
0
48
MP2162GQH
1330
08-20-13
50
0
48
NB650GL
1329
08-20-13
50
0
48
NB671GQ
1307
08-16-13
50
0
48
MP2617GL
1326
09-10-13
50
0
48
FA NO.
# of hrs
MP4470GL
1331
08-20-13
50
0
48
MP28258DD
1319
08-28-13
50
0
48
MP8762GL
1332
08-20-13
50
0
48
MP9181DD
1330
08-20-13
50
0
48
MP8736DL
1331
08-20-13
50
0
48
MP2625GL
1331
08-20-13
50
0
48
MP9180DG
1309
09-05-13
50
0
48
NB650HGL
1305
08-20-13
50
0
48
MP2130DG
1326
08-20-13
50
0
48
MP28258DD
1305
08-28-13
50
0
48
NB638DL
1330
08-20-13
50
0
48
MP8736DL
1332
08-20-13
50
0
48
MP9180DG
1321
08-20-13
50
0
48
MP2334DD
1313
08-23-13
50
0
48
NB671GQ
1304
08-20-13
50
0
48
MP2158GQH
1330
08-20-13
50
0
48
MP2617GL
1329
09-05-13
50
0
48
MP2130DG
1327
08-23-13
50
0
48
NB671GQ
1309
08-28-13
50
0
48
MP2625GL
1332
08-23-13
50
0
48
NB671GQ
1302
08-28-13
50
0
48
MP28258DD
1321
08-23-13
50
0
48
NB671GQ
1307
08-28-13
50
0
48
MP9151GD
1328
08-28-13
50
0
48
NB670GQ
1316
08-28-13
50
0
48
MP2617GL
1331
09-05-13
50
0
48
MP2130DG
1329
08-23-13
50
0
48
MP2617GL
1329
09-10-13
50
0
48
MP2130DG
1328
08-23-13
50
0
48
MP28259DD-A-C441 1327
08-23-13
50
0
48
09-10-13
50
0
48
MP2617GL
1329
The Future of Analog IC Technology®
- 68 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP28258DD-C471
1325
08-23-13
50
0
48
NB638DL
1333
08-28-13
50
0
48
MP86961DU
1137
08-28-13
50
0
48
MP2334DD
1315
08-28-13
50
0
48
MP2625GL
1332
08-28-13
50
0
48
MP2617GL
1329
09-10-13
50
0
48
MP9186GD
1308
08-28-13
50
0
48
FA NO.
# of hrs
MP2334DD
1320
08-28-13
50
0
48
MP8760GL
1333
08-28-13
50
0
48
MP1499GD
1324
08-28-13
50
0
48
MP2617GL
1332
09-10-13
50
0
48
MP2617GL
1329
09-10-13
50
0
48
MP2130DG
1328
08-29-13
50
0
48
MPQ8632HGL-10
1330
09-05-13
50
0
48
MP9186GD
1322
08-29-13
50
0
48
MP8606DL
1332
08-30-13
50
0
48
MPQ8632GL-6
1333
08-30-13
50
0
48
MP2617GL
1329
09-10-13
50
0
48
MP2617GL
1333
09-10-13
50
0
48
MP2617GL
1332
09-10-13
50
0
48
NB650GL
1334
08-30-13
50
0
48
MP2130DG
1328
08-29-13
50
0
48
NB671GQ
1326
08-29-13
50
0
48
MP2334DD
1330
08-29-13
50
0
48
MP1499GD
1310
08-29-13
50
0
48
MP2617GL
1332
09-10-13
50
0
48
MP28258DD
1305
08-29-13
50
0
48
NB671GQ
1326
08-29-13
50
0
48
MP2334DD
1322
08-30-13
50
0
48
MP38876DL
1327
08-30-13
50
0
48
MP8606DL
1331
08-30-13
50
0
48
MP2617GL
1333
09-27-13
50
0
48
MP2617GL
1333
09-27-13
50
0
48
MP28258DD
1311
09-05-13
50
0
48
MP8736DL
1334
09-05-13
50
0
48
MPQ8632GL-10
1321
09-05-13
50
0
48
NB671GQ
1326
09-05-13
50
0
48
MP2617GL
1334
09-10-13
50
0
48
MP2334DD
1330
09-05-13
50
0
48
MP8736DL
1334
09-09-13
50
0
48
MP2130DG
1330
09-09-13
50
0
48
MP2334DD
1331
09-09-13
50
0
48
The Future of Analog IC Technology®
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MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2625GL
1332
09-09-13
50
0
48
NB671LGQ
1334
09-09-13
50
0
48
MP1499GD
1335
09-09-13
50
0
48
MP2130DG
1330
09-09-13
50
0
48
NB669GQ
1332
09-09-13
50
0
48
MP28258DD
1320
09-09-13
50
0
48
NB671GQ
1324
09-09-13
50
0
48
MP8736DL
1334
09-09-13
50
0
48
NB671GQ
1320
09-09-13
50
0
48
MP38875DL
1327
09-09-13
50
0
48
MP2625GL
1334
09-09-13
50
0
48
MP2735DQG
1335
09-10-13
50
0
48
NB669GQ
1332
09-10-13
50
0
48
MP9181DD
1335
09-10-13
50
0
48
NB671LGQ
1335
09-10-13
50
0
48
FA NO.
# of hrs
NB638DL
1335
09-10-13
50
0
48
NB669GQ
1332
09-10-13
50
0
48
MP2162GQH
1334
09-18-13
50
0
48
MP2625GL
1332
09-12-13
50
0
48
NB670GQ
1333
09-18-13
50
0
48
MP28257DD
1326
09-12-13
50
0
48
MP9181DD
1335
09-12-13
50
0
48
MP8760GL
1335
09-12-13
50
0
48
MP28258DD
1321
09-12-13
50
0
48
MP2130DG
1330
09-12-13
50
0
48
NB671GQ
1323
09-12-13
50
0
48
MP8736DL
1335
09-12-13
50
0
48
MP2130DG
1330
09-12-13
50
0
48
NB638DL
1335
09-12-13
50
0
48
MPQ8636GL-10
1335
09-12-13
50
0
48
MP2130DG
1330
09-12-13
50
0
48
MP2334DD
1330
09-12-13
50
0
48
NB650HGL
1335
09-18-13
50
0
48
NB6381DL
1316
09-18-13
50
0
48
MP8736DL
1336
09-18-13
50
0
48
MP2625GL
1335
09-18-13
50
0
48
MP2130DG
1330
09-18-13
50
0
48
MP2308GD
1333
09-18-13
50
0
48
MP8736DL
1336
09-18-13
50
0
48
MPM3810GQB
1334
09-18-13
50
0
48
MP2139DD
1336
09-23-13
50
0
48
MP2130DG-C423
1304
09-18-13
50
0
48
The Future of Analog IC Technology®
- 70 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1499GD
1335
09-23-13
50
0
FA NO.
# of hrs
48
MP3306EG
1336
09-18-13
50
0
48
MP8736DL
1336
09-23-13
50
0
48
MP28259DD
1321
09-23-13
50
0
48
NB650HGL
1305
09-23-13
50
0
48
MP2617GL
1334
09-23-13
50
0
48
MPQ8632GVE-20
1336
09-23-13
50
0
48
MP2158GQH
1334
09-18-13
50
0
48
MP3306EG
1334
09-18-13
50
0
48
MP28258DD-C471
1311
09-23-13
50
0
48
MP2617GL
1334
09-26-13
50
0
48
MP9180DG
1332
09-23-13
50
0
48
MP8760GL
1335
09-26-13
50
0
48
MP1499GD
1333
09-23-13
50
0
48
NB650HGL
1311
09-26-13
50
0
48
NB639DL
1313
09-26-13
50
0
48
MP2158GQH-M006
1334
09-23-13
50
0
48
MP9180DG
1332
09-23-13
50
0
48
MP2617AGL
1336
09-26-13
50
0
48
MP9180DG
1322
09-26-13
50
0
48
MP9180DG
1322
09-26-13
50
0
48
MPQ8632GL-6
1336
09-26-13
50
0
48
MP9180DG
1328
09-26-13
50
0
48
NB675GL
1333
09-26-13
50
0
48
MP2130DG
1333
09-26-13
50
0
48
MP9180DG
1332
09-26-13
50
0
48
MP2130DG
1330
09-26-13
50
0
48
MP2130DG
1332
09-26-13
50
0
48
MP2130DG
1332
09-26-13
50
0
48
Total
2
4.6.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1312
07-02-13
78
0
MP8736DL
1312
07-02-13
80
0
MP8736DL
1316
07-12-13
80
0
MP8736DL
1317
07-25-13
80
0
MPQ4470GL-AEC1
1247
07-22-13
80
0
MPQ4470GL-AEC1
1249
07-22-13
80
0
FA NO.
The Future of Analog IC Technology®
- 71 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP8736DL
1320
07-22-13
80
0
MPM3810GQB
1305
09-18-13
78
0
MPM3805GQB
1315
09-18-13
76
0
MPM3805GQB
1315
09-18-13
76
0
NB675GL
1311
10-09-13
80
0
MP2617AGL
1325
10-09-13
49
0
MP2617AGL
1319
10-09-13
47
0
MP28251GD
1330
10-08-13
80
0
NB677GQ
1331
10-12-13
79
0
MP2617GL
1329
09-05-13
47
0
MP2617GL
1331
09-05-13
49
0
MP2617GL
1329
09-10-13
47
0
MP2617GL
1332
09-10-13
49
0
MP2617GL
1333
09-27-13
49
0
MP2617GL
1333
09-27-13
47
0
Total
FA NO.
0
4.7 FLIP CHIP-SOIC
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE PACKAGE
ASSY SITE
PACKAGE
UCD
ANST
FCSOIC8
JCET
JCAP
FCSOIC8
FCSOIC8
ANST
FCSOIC16
FCSOIC8
4.7.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2305DS
1316
07-09-13
102
0
MP1482DS
1203
07-24-13
270
0
MP1482DS
1223
07-24-13
260
0
MP1482DS
1203
07-24-13
90
0
MP1482DS
1316
07-24-13
200
0
MP1493DS
1329
09-10-13
305
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 72 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
SAT picture of FLIP CHIP-SOIC
T-SCAN PICTURE
C-SCAN PICTURE
4.7.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1203
07-24-13
84
0
1000
MP1482DS
1223
07-24-13
84
0
1000
MP1482DS
1316
07-24-13
97
0
1000
MP1493DS
1329
09-10-13
94
0
1000
MP1493DS
1331
09-24-13
94
0
1000
MP1482DS
1316
07-16-13
47
0
1000
MP1482DS
1316
07-16-13
47
0
1000
MP1482DS
1317
07-16-13
47
0
1000
MP1482DS
1317
07-16-13
47
0
1000
MP1482DS
1317
07-16-13
47
0
1000
MP1482DS
1317
07-16-13
47
0
1000
MP1482DS
1317
07-16-13
47
0
1000
MP1482DS
1320
08-23-13
47
0
1000
MP1482DS
1320
08-23-13
47
0
1000
MP1482DS
1322
07-23-13
47
0
1000
MP1482DS
1322
08-14-13
47
0
1000
MP1482DS
1322
08-07-13
47
0
1000
MP1482DS
1322
08-07-13
47
0
1000
MP1482DS
1322
08-07-13
47
0
1000
MP1482DS
1322
08-14-13
47
0
1000
MP1482DS
1322
08-14-13
47
0
1000
MP1482DS
1316
07-03-13
100
0
100
FA NO.
# of
cycle
The Future of Analog IC Technology®
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MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1492DS
1312
08-27-13
100
0
100
MP1482DS
1324
07-01-13
50
0
100
MP1482SDS
1322
07-01-13
50
0
100
MP1482DS
1322
07-01-13
50
0
100
MP1492DS
1323
07-01-13
50
0
100
MP1493DS
1316
07-01-13
50
0
100
MP1482DS
1323
07-04-13
50
0
100
MP1492DS
1319
07-04-13
50
0
100
MP1482DS
1323
07-04-13
50
0
100
MP1482SDS-C416
1324
07-02-13
50
0
100
MP1492DS
1312
07-02-13
50
0
100
MP1482DS
1325
07-02-13
50
0
100
MP1482DS
1323
07-02-13
50
0
100
MP1482DS
1321
07-02-13
50
0
100
MP1482DS
1323
07-10-13
50
0
100
MP1482DS
1226
07-10-13
50
0
100
MP1482DS
1323
07-10-13
50
0
100
MP1482DS
1324
07-10-13
50
0
100
MP1482DS
1324
07-10-13
50
0
100
MP1482DS
1320
07-10-13
50
0
100
MP1482DS
1323
07-10-13
50
0
100
MP1482DS
1321
07-10-13
50
0
100
MP1482DS
1324
07-16-13
50
0
100
MP1482DS
1324
07-16-13
50
0
100
MP1482DS
1324
07-16-13
50
0
100
MP1482DS
1326
07-23-13
50
0
100
MP1482DS
1324
07-16-13
50
0
100
MP1482DS
1325
07-11-13
50
0
100
MP2140DS
1322
07-16-13
50
0
100
MP1482DS
1326
07-23-13
50
0
100
MP1482DS
1326
07-23-13
50
0
100
MP1482DS
1325
07-11-13
50
0
100
MP1482DS
1325
07-11-13
50
0
100
MP1482DS
1325
07-11-13
50
0
100
MP1482DS
1326
07-16-13
50
0
100
MP1482DS
1324
07-16-13
50
0
100
MP1492DS
1310
07-18-13
50
0
100
FA NO.
# of
cycle
MP1482DS
1324
07-18-13
50
0
100
MP1493DS-A
1326
07-18-13
50
0
100
MP1482DS
1326
07-18-13
50
0
100
MP1482DS
1326
07-23-13
50
0
100
MP1482DS
1327
07-23-13
50
0
100
The Future of Analog IC Technology®
- 74 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1327
08-16-13
50
0
100
MP1482DS
1326
08-16-13
50
0
100
MP1492DS
1324
07-23-13
50
0
100
MP1492DS-C469
1324
07-23-13
50
0
100
MP1482DS
1327
07-25-13
50
0
100
MP1482SDS-C416
1321
07-25-13
50
0
100
MP1482DS
1327
07-25-13
50
0
100
MP1492DS-A-C528
1326
07-25-13
50
0
100
MP1482DS
1321
07-30-13
50
0
100
MP1482DS
1326
07-30-13
50
0
100
MP1482DS
1326
08-07-13
50
0
100
MP1492DS
1324
07-30-13
50
0
100
MP1482DS
1324
08-07-13
50
0
100
MP1482DS
1321
08-07-13
50
0
100
MP1482DS
1318
08-07-13
50
0
100
MP1493DS-A
1320
08-07-13
50
0
100
MP1482DS
1330
08-14-13
50
0
100
MP1482DS
1330
08-14-13
50
0
100
MP1492DS-A-C528
1326
08-16-13
50
0
100
MP1482DS
1330
08-16-13
50
0
100
MP1493DS
1330
08-20-13
50
0
100
MP1482DS
1321
08-23-13
50
0
100
MP1482DS
1332
08-23-13
50
0
100
MP1482DS
1332
08-28-13
50
0
100
MP1492DS
1324
08-28-13
50
0
100
MP1482DS
1332
08-28-13
50
0
100
MP1482SDS-C416
1321
08-29-13
50
0
100
MP1482DS
1332
08-29-13
50
0
100
MP1492DS
1327
08-30-13
50
0
100
FA NO.
# of
cycle
MP2140DS
1329
09-05-13
50
0
100
MP1493DS-C480
1328
09-09-13
50
0
100
MP1482DS
1334
09-05-13
50
0
100
MP1493DS-A
1326
09-05-13
50
0
100
MP1492DS-A-C528
1324
09-10-13
50
0
100
MP1482DS
1334
09-18-13
50
0
100
MP1482DS
1334
09-23-13
50
0
100
MP1492DS-A-C528
1331
09-26-13
50
0
100
MP1482DS
1334
09-26-13
50
0
100
MP1482DS
1334
09-26-13
50
0
100
Total
0
The Future of Analog IC Technology®
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MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
4.7.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1203
07-24-13
90
0
168
MP1482DS
1223
07-24-13
77
0
168
MP1482DS
1316
07-24-13
97
0
168
MP1493DS
1329
09-10-13
97
0
168
MP1493DS
1331
09-24-13
94
0
168
MP1482DS
1316
07-16-13
47
0
168
MP1482DS
1316
07-16-13
47
0
168
MP1482DS
1317
07-16-13
47
0
168
MP1482DS
1317
07-16-13
47
0
168
MP1482DS
1317
07-16-13
47
0
168
MP1482DS
1317
07-16-13
47
0
168
MP1482DS
1317
07-16-13
47
0
168
MP1482DS
1320
08-23-13
47
0
168
MP1482DS
1320
08-23-13
47
0
168
MP1482DS
1322
07-23-13
47
0
168
MP1482DS
1322
08-14-13
47
0
168
MP1482DS
1322
08-07-13
47
0
168
MP1482DS
1322
08-07-13
47
0
168
MP1482DS
1322
08-07-13
47
0
168
MP1482DS
1322
08-14-13
47
0
168
FA NO.
# of hrs
MP1482DS
1322
08-14-13
47
0
168
MP1482DS
1316
07-03-13
100
0
48
MP1492DS
1312
08-27-13
100
0
48
MP1482DS
1324
07-01-13
50
0
48
MP1482SDS
1322
07-01-13
50
0
48
MP1482DS
1322
07-01-13
50
0
48
MP1492DS
1323
07-01-13
50
0
48
MP1493DS
1316
07-01-13
50
0
48
MP1482DS
1323
07-04-13
50
0
48
MP1492DS
1319
07-04-13
50
0
48
MP1482DS
1323
07-04-13
50
0
48
MP1482SDS-C416
1324
07-02-13
50
0
48
MP1492DS
1312
07-02-13
50
0
48
MP1482DS
1325
07-02-13
50
0
48
MP1482DS
1323
07-02-13
50
0
48
MP1482DS
1321
07-02-13
50
0
48
MP1482DS
1323
07-10-13
50
0
48
MP1482DS
1226
07-10-13
50
0
48
MP1482DS
1323
07-10-13
50
0
48
The Future of Analog IC Technology®
- 76 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1324
07-10-13
50
0
48
MP1482DS
1324
07-10-13
50
0
48
MP1482DS
1320
07-10-13
50
0
48
MP1482DS
1323
07-10-13
50
0
48
MP1482DS
1321
07-10-13
50
0
48
MP1482DS
1324
07-16-13
50
0
48
MP1482DS
1324
07-16-13
50
0
48
MP1482DS
1324
07-16-13
50
0
48
MP1482DS
1326
07-23-13
50
0
48
MP1482DS
1324
07-16-13
50
0
48
MP1482DS
1325
07-11-13
50
0
48
MP2140DS
1322
07-16-13
50
0
48
MP1482DS
1326
07-23-13
50
0
48
MP1482DS
1326
07-23-13
50
0
48
MP1482DS
1325
07-11-13
50
0
48
MP1482DS
1325
07-11-13
50
0
48
MP1482DS
1325
07-11-13
50
0
48
MP1482DS
1326
07-16-13
50
0
48
MP1482DS
1324
07-16-13
50
0
48
MP1492DS
1310
07-18-13
50
0
48
FA NO.
# of hrs
MP1482DS
1324
07-18-13
50
0
48
MP1493DS-A
1326
07-18-13
50
0
48
MP1482DS
1326
07-18-13
50
0
48
MP1482DS
1326
07-23-13
50
0
48
MP1482DS
1327
07-23-13
50
0
48
MP1482DS
1327
08-16-13
50
0
48
MP1482DS
1326
08-16-13
50
0
48
MP1492DS
1324
07-23-13
50
0
48
MP1492DS-C469
1324
07-23-13
50
0
48
MP1482DS
1327
07-25-13
50
0
48
MP1482SDS-C416
1321
07-25-13
50
0
48
MP1482DS
1327
07-25-13
50
0
48
MP1492DS-A-C528
1326
07-25-13
50
0
48
MP1482DS
1321
07-30-13
50
0
48
MP1482DS
1326
07-30-13
50
0
48
MP1482DS
1326
08-07-13
50
0
48
MP1492DS
1324
07-30-13
50
0
48
MP1482DS
1324
08-07-13
50
0
48
MP1482DS
1321
08-07-13
50
0
48
MP1482DS
1318
08-07-13
50
0
48
MP1493DS-A
1320
08-07-13
50
0
48
MP1482DS
1330
08-14-13
50
0
48
The Future of Analog IC Technology®
- 77 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1482DS
1330
08-14-13
50
0
48
MP1492DS-A-C528
1326
08-16-13
50
0
48
MP1482DS
1330
08-16-13
50
0
48
MP1493DS
1330
08-20-13
50
0
48
MP1482DS
1321
08-23-13
50
0
48
MP1482DS
1332
08-23-13
50
0
48
MP1482DS
1332
08-28-13
50
0
48
MP1492DS
1324
08-28-13
50
0
48
MP1482DS
1332
08-28-13
50
0
48
MP1482SDS-C416
1321
08-29-13
50
0
48
MP1482DS
1332
08-29-13
50
0
48
MP1492DS
1327
08-30-13
50
0
48
MP2140DS
1329
09-05-13
50
0
48
MP1493DS-C480
1328
09-09-13
50
0
48
MP1482DS
1334
09-05-13
50
0
48
FA NO.
# of hrs
MP1493DS-A
1326
09-05-13
50
0
48
MP1492DS-A-C528
1324
09-10-13
50
0
48
MP1482DS
1334
09-18-13
50
0
48
MP1482DS
1334
09-23-13
50
0
48
MP1492DS-A-C528
1331
09-26-13
50
0
48
MP1482DS
1334
09-26-13
50
0
48
MP1482DS
1334
09-26-13
50
0
48
Total
0
4.6.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2305DS
1316
07-09-13
80
0
MP1482DS
1203
07-24-13
80
0
MP1493DS
1329
09-10-13
100
0
MP1493DS
1331
09-24-13
80
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 78 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
4.8 FLIP CHIP-TSOT
The data in the tables that follow was generated as the result of an on-going Package Reliability Monitor.
The specific assemblies included in this package monitor are:
ASSY SITE
PACKAGE
ASSY SITE
PACKAGE
ANST
FCTSOT-5
JCET
FCTSOT-6
ANST
FCTSOT-6
JCET
FCTSOT-8
ANST
FCTSOT-8
4.8.1 Preconditioning
MSL1: Including t0 test, SAT check, 24 hours bake @ 125°C, Moisture Soak (85°C/85%RH,168hours),
@260°C Reflow Simulation(3 times), SAT check and Final test
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3414DJ
1324
07-12-13
200
0
MP2314GJ
1303
07-23-13
180
0
MP2314GJ
1303
07-23-13
90
0
MP2314GJ
1312
07-23-13
102
0
MP3221GJ
1309
07-18-13
110
0
MP157GJ
1309
07-24-13
100
0
MP157GJ
1309
07-24-13
105
0
MP1494DJ
1243
07-24-13
373
0
MP1494DJ
1247
07-24-13
360
0
MP157GJ
1309
07-24-13
100
0
MP157GJ
1243
07-19-13
360
0
MP1470GJ
1305
07-31-13
180
0
MP2122GJ
1327
09-04-13
302
0
MP1494DJ
1237
09-04-13
400
0
MP2318GJ
1322
09-03-13
300
0
MP2225GJ
1304
09-24-13
381
0
MP2225GJ
1304
09-24-13
90
0
MP1494DJ
1316
09-17-13
110
0
MP1497DJ
1316
10-09-13
300
0
MP1496DJ
1314
10-09-13
150
0
MP1496DJ
1318
10-09-13
150
0
MP1470GJ-JC
1330
09-27-13
200
0
MP1494DJ-JC
1329
09-27-13
200
0
MP1494DJ
1331
09-18-13
302
0
MP1494DJ
1328
10-12-13
200
0
MP2161GJ-C499
1316
07-04-13
50
0
MP2161GJ-C499
1317
07-11-13
70
0
MP1470GJ
1323
08-28-13
48
0
MP1470GJ
1325
08-28-13
48
0
MP2161GJ-C499
1328
08-14-13
50
0
MP2161GJ-C499
1327
08-14-13
50
0
FA NO.
The Future of Analog IC Technology®
- 79 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2161GJ-C499
1329
09-10-13
50
0
MP1470GJ
1327
09-05-13
50
0
MP2161GJ-C499
1331
09-10-13
50
0
Total
FA NO.
0
SAT picture of FLIP CHIP-TSOT
T-SCAN PICTURE
C-SCAN PICTURE
4.8.2 Temperature Cycling
Stress Duration: 100~1000 cycles
Stress Conditions: Temperature cycling between -65°C to 150°C (Condition C)
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1472GJ
1249
07-11-13
47
0
1000
MP1472GJ
1249
07-11-13
47
0
1000
MP1472GJ
1226
07-09-13
50
0
1000
MP1472GJ
1226
07-09-13
50
0
1000
MP2314GJ
1303
07-23-13
84
0
1000
MP1494DJ
1243
07-24-13
84
0
1000
MP1494DJ
1247
07-24-13
84
0
1000
MP1494DJ
1245
07-31-13
47
0
1000
MP1494DJ
1245
07-31-13
47
0
1000
MP1497DJ
1246
07-31-13
47
0
1000
MP1497DJ
1250
07-31-13
47
0
1000
MP1470GJ
1305
07-31-13
84
0
1000
MP2122GJ
1327
09-04-13
94
0
1000
FA NO.
# of
cycle
MP1494DJ
1237
09-04-13
94
0
1000
MP2318GJ
1322
09-03-13
94
0
1000
MP1470GJ
1245
09-05-13
47
0
1000
The Future of Analog IC Technology®
- 80 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1470GJ
1245
09-05-13
47
0
1000
MP2225GJ
1304
09-24-13
82
0
1000
MP1497DJ
1316
10-09-13
94
0
1000
MP1496DJ
1314
10-09-13
45
0
1000
MP1496DJ
1318
10-09-13
47
0
1000
MP1470GJ
1327
10-08-13
94
0
1000
MP1470GJ-JC
1330
09-27-13
94
0
1000
FA NO.
# of
cycle
MP1494DJ-JC
1329
09-27-13
94
0
1000
MP1494DJ
1331
09-18-13
94
0
1000
MP1494DJ
1328
10-12-13
97
0
1000
MP1472GJ-C452
1249
07-02-13
50
0
100
MP2161GJ-C499
1305
08-14-13
50
0
100
MP1472GJ-C452
1252
07-02-13
50
0
100
MP1472GJ-C452
1312
07-02-13
100
0
100
MP2161GJ-C499
1311
08-14-13
50
0
100
MP2161GJ-C499
1313
08-14-13
50
0
100
MP1470GJ
1313
07-23-13
50
0
100
MP1470GJ
1316
07-23-13
50
0
100
MP1495DJ
1315
07-01-13
50
0
100
MP1470GJ
1316
08-28-13
50
0
100
MP1470GJ
1316
08-28-13
50
0
100
MP1470GJ
1318
08-28-13
50
0
100
MP1495DJ
1316
07-04-13
50
0
100
MP1470GJ
1318
08-28-13
50
0
100
MP1496DJ
1319
08-15-13
50
0
100
MP1470GJ
1319
08-28-13
50
0
100
MP1470GJ
1318
08-28-13
50
0
100
MP1472GJ-C452
1320
07-31-13
50
0
100
MP1470GJ
1318
08-28-13
50
0
100
MP1494DJ
1319
07-16-13
50
0
100
MP1470GJ
1319
08-28-13
50
0
100
MP1470GJ
1318
08-28-13
50
0
100
MP2143DJ
1307
08-29-13
50
0
100
MP1470GJ
1320
08-28-13
50
0
100
MP2161GJ
1312
08-14-13
50
0
100
MP2161GJ
1322
08-14-13
50
0
100
MP1470GJ
1321
08-28-13
50
0
100
MP2161GJ
1317
08-14-13
50
0
100
MP1495DJ
1320
07-02-13
50
0
100
MP1471GJ
1323
07-23-13
50
0
100
MP1470GJ
1321
08-28-13
50
0
100
MP2161GJ
1322
08-14-13
50
0
100
The Future of Analog IC Technology®
- 81 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2161GJ
1322
08-14-13
50
0
100
MP1470GJ
1321
08-28-13
50
0
100
MP2161GJ-C499
1322
08-14-13
50
0
100
MP1495DJ
1321
07-10-13
50
0
100
MP2234GJ
1323
09-02-13
50
0
100
MP2161GJ
1322
08-14-13
50
0
100
MP1494DJ
1321
07-01-13
50
0
100
MP1495DJ
1320
07-10-13
50
0
100
MP3414DJ
1324
07-01-13
50
0
100
MP2161GJ
1322
08-14-13
50
0
100
MP1470GJ
1323
08-28-13
50
0
100
MP1497DJ
1324
07-01-13
50
0
100
MP1495DJ
1320
08-14-13
50
0
100
MP3414DJ
1324
07-01-13
50
0
100
MP3414DJ
1324
07-01-13
50
0
100
MP1495DJ
1321
07-01-13
50
0
100
MP1494DJ
1310
07-01-13
50
0
100
MP1495DJ
1320
07-04-13
50
0
100
MP3414DJ
1324
07-04-13
50
0
100
MP2161GJ-C499
1324
08-14-13
50
0
100
FA NO.
# of
cycle
MP1497DJ
1324
07-04-13
50
0
100
MP2315GJ
1325
07-04-13
50
0
100
MP3414DJ
1324
07-04-13
50
0
100
MP1495DJ
1320
07-04-13
50
0
100
MP2161GJ
1318
07-16-13
50
0
100
MP1496DJ
1324
07-04-13
50
0
100
MP1471GJ
1324
07-02-13
50
0
100
MP1472GJ-C452
1323
07-02-13
50
0
100
MP1475DJ
1316
07-03-13
50
0
100
MP2161GJ-C499
1318
08-14-13
50
0
100
MP2161GJ
1318
08-14-13
50
0
100
MP1495DJ
1320
07-04-13
50
0
100
MP2161GJ-C499
1318
08-14-13
50
0
100
MP2161GJ
1325
08-14-13
50
0
100
MP1470GJ
1325
08-28-13
50
0
100
MP1472GJ-C452
1325
07-10-13
50
0
100
MP1497DJ
1324
07-04-13
50
0
100
MP156GJ
1324
07-10-13
50
0
100
MP1496DJ
1324
07-10-13
50
0
100
MP1494DJ
1319
07-10-13
50
0
100
MP1494DJ
1319
07-10-13
50
0
100
MP1497DJ
1324
07-10-13
50
0
100
The Future of Analog IC Technology®
- 82 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP150GJ
1324
08-14-13
50
0
100
MP1472GJ-C452
1325
07-10-13
50
0
100
FA NO.
# of
cycle
MP2161GJ-C499
1325
08-14-13
50
0
100
MP2161GJ
1325
08-14-13
50
0
100
MP2144GJ
1322
07-16-13
50
0
100
MP1470GJ
1325
07-23-13
50
0
100
MP2161GJ-C499
1325
08-14-13
50
0
100
MP1494DJ
1319
07-10-13
50
0
100
MP1495DJ-C494
1323
07-10-13
50
0
100
MP2161GJ
1325
08-14-13
50
0
100
MP3414DJ
1325
07-16-13
50
0
100
MP2228GJ
1319
07-16-13
50
0
100
MP1496DJ
1326
07-16-13
50
0
100
MP2161GJ-C499
1325
08-14-13
50
0
100
MP2161GJ-C499
1326
08-14-13
50
0
100
MP1470GJ
1326
07-23-13
50
0
100
MP2315GJ
1326
07-16-13
50
0
100
MP1496DJ
1326
07-16-13
50
0
100
MP3414DJ
1326
07-16-13
50
0
100
MP2161GJ-C499
1325
08-14-13
50
0
100
MP1496DJ
1326
07-16-13
50
0
100
MP1472GJ-C452
1325
07-11-13
50
0
100
MP2161GJ
1326
08-14-13
50
0
100
MP2161GJ
1326
08-14-13
50
0
100
MP2161GJ-C499
1325
08-14-13
50
0
100
MP2315GJ
1326
07-16-13
50
0
100
MP1494DJ
1323
07-16-13
50
0
100
MP2144GJ
1322
07-16-13
50
0
100
MP2161GJ
1324
08-14-13
50
0
100
MP1497DJ
1326
07-16-13
50
0
100
MP2161GJ-C499
1326
08-14-13
50
0
100
MP2122GJ
1326
07-18-13
50
0
100
MP2143DJ
1307
07-16-13
50
0
100
MP2161GJ-C499
1324
08-14-13
50
0
100
MP1472GJ-C452
1327
07-16-13
50
0
100
MP2234GJ
1327
07-18-13
50
0
100
MP1497DJ
1326
07-18-13
50
0
100
MP2314GJ
1327
07-18-13
50
0
100
MP1494DJ
1323
07-18-13
50
0
100
MP2161GJ-C499
1326
08-14-13
50
0
100
MP1470GJ
1325
07-23-13
50
0
100
MP1472GJ-C452
1327
07-18-13
50
0
100
The Future of Analog IC Technology®
- 83 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1497DJ
1326
07-18-13
50
0
100
MP2161GJ
1325
08-14-13
50
0
100
MP2161GJ-C499
1326
08-14-13
50
0
100
MP3414DJ
1325
07-18-13
50
0
100
MP2122GJ
1327
07-23-13
50
0
100
MP1470GJ
1326
07-23-13
50
0
100
MP1494DJ
1323
07-23-13
50
0
100
MP3414DJ
1327
07-23-13
50
0
100
MP3414DJ
1324
07-23-13
50
0
100
MP3414DJ
1325
07-23-13
50
0
100
MP2314GJ
1328
07-25-13
50
0
100
MP2161GJ
1326
08-14-13
50
0
100
MP2161GJ
1325
08-14-13
50
0
100
MP1472GJ-C452
1327
07-23-13
50
0
100
MP1495DJ
1323
07-23-13
50
0
100
MP2161GJ
1326
08-14-13
50
0
100
MP2161GJ
1326
08-14-13
50
0
100
MP1472GJ-C452
1327
07-23-13
50
0
100
MP1497DJ
1327
07-25-13
50
0
100
MP2161GJ
1326
08-14-13
50
0
100
MP2161GJ
1326
08-14-13
50
0
100
MP1494DJ
1323
07-23-13
50
0
100
MP3414DJ
1327
07-25-13
50
0
100
MP1495DJ
1323
07-25-13
50
0
100
MP1494DJ
1323
07-25-13
50
0
100
MP3414DJ
1326
07-25-13
50
0
100
MP2161GJ
1327
08-14-13
50
0
100
MP1470GJ
1326
07-30-13
50
0
100
MP1472GJ-C452
1327
07-25-13
50
0
100
MP1497DJ
1327
07-25-13
50
0
100
MP2159GJ
1318
07-25-13
50
0
100
MP2161GJ
1328
08-14-13
50
0
100
MP1472GJ-C452
1328
07-25-13
50
0
100
MP2161GJ-C499
1326
08-14-13
50
0
100
MP2161GJ-C499
1327
08-14-13
50
0
100
MP24892DJ
1327
07-25-13
50
0
100
MP2161GJ
1325
08-14-13
50
0
100
FA NO.
# of
cycle
MP1495DJ
1323
07-30-13
50
0
100
MP1471GJ
1327
07-30-13
50
0
100
MP1497DJ
1327
07-30-13
50
0
100
MP2161GJ-C499
1328
08-14-13
50
0
100
MP1474DJ
1327
07-30-13
50
0
100
The Future of Analog IC Technology®
- 84 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2161GJ-C499
1327
08-14-13
50
0
100
MP3414DJ
1328
07-30-13
50
0
100
MP1472GJ-C452
1328
07-30-13
50
0
100
MP1496DJ
1327
07-30-13
50
0
100
MP3414DJ
1328
07-30-13
50
0
100
MP2315GJ
1329
07-30-13
50
0
100
MP1472GJ-C452
1328
07-30-13
50
0
100
MP1472GJ
1317
08-01-13
50
0
100
MP1494DJ
1323
07-30-13
50
0
100
MP1495DJ
1323
08-07-13
50
0
100
MP2161GJ
1326
08-14-13
50
0
100
MP1496DJ
1327
08-01-13
50
0
100
MP1495DJ
1323
07-30-13
50
0
100
MP1474DJ
1317
08-07-13
50
0
100
MP1472GJ-C452
1328
08-01-13
50
0
100
FA NO.
# of
cycle
MP2161GJ-C499
1328
08-14-13
50
0
100
MP2161GJ
1327
08-14-13
50
0
100
MP2161GJ-C499
1328
08-14-13
50
0
100
MP2161GJ
1329
08-14-13
50
0
100
MP1495DJ
1323
08-07-13
50
0
100
MP1495DJ
1323
08-07-13
50
0
100
MP1472GJ
1324
08-01-13
50
0
100
MP1494DJ
1323
08-07-13
50
0
100
MP2161GJ-C499
1326
08-14-13
50
0
100
MP1472GJ-C452
1329
08-01-13
50
0
100
MP2161GJ-C499
1328
08-14-13
50
0
100
MP1470GJ
1327
08-07-13
50
0
100
MP3414DJ
1328
08-01-13
50
0
100
MP2161GJ
1326
08-14-13
50
0
100
MP1474DJ
1317
08-07-13
50
0
100
MP1495DJ
1329
08-07-13
50
0
100
MP2161GJ-C499
1328
08-14-13
50
0
100
MP2161GJ
1326
08-14-13
50
0
100
MP1472GJ
1328
08-07-13
50
0
100
MP1496DJ
1329
08-07-13
50
0
100
MP2161GJ-C499
1329
08-14-13
50
0
100
MP156GJ
1329
08-07-13
50
0
100
MP1472GJ-C452
1328
08-07-13
50
0
100
MP1495DJ
1323
08-07-13
50
0
100
MP1495DJ
1323
08-07-13
50
0
100
MP1472GJ-C452
1330
08-07-13
50
0
100
MP1495DJ
1329
08-14-13
50
0
100
The Future of Analog IC Technology®
- 85 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2315GJ
1330
08-07-13
50
0
100
MP1495DJ
1323
08-14-13
50
0
100
MP1472GJ-C452
1330
08-14-13
50
0
100
MP1498DJ-C532
1307
08-14-13
50
0
100
MP2161GJ-C499
1329
09-10-13
50
0
100
MP1470GJ
1327
08-14-13
50
0
100
MP4026GJ
1329
08-14-13
50
0
100
MP1497DJ
1329
08-14-13
50
0
100
MP1494DJ
1326
08-14-13
50
0
100
MP2161GJ-C499
1329
09-10-13
50
0
100
MP9495DJ
1319
08-14-13
50
0
100
MP1470GJ
1327
09-05-13
50
0
100
MP1494DJ
1319
08-14-13
50
0
100
MP2143DJ
1330
08-14-13
50
0
100
MP1472GJ-C452
1330
08-14-13
50
0
100
FA NO.
# of
cycle
MP1472GJ-C452
1330
08-14-13
50
0
100
MP2315GJ
1329
08-16-13
50
0
100
MP1471GJ-C519
1327
08-14-13
50
0
100
MP2161GJ-C514
1331
09-10-13
50
0
100
MP1472GJ-C452
1330
08-14-13
50
0
100
MP1497DJ
1331
08-14-13
50
0
100
MP9495DJ
1320
08-14-13
50
0
100
MP1494DJ
1323
08-14-13
50
0
100
MP1497DJ
1326
08-14-13
50
0
100
MP1470GJ
1331
08-14-13
50
0
100
MP2143DJ
1330
08-16-13
50
0
100
MP1470GJ
1328
08-20-13
50
0
100
MP2122GJ
1331
08-16-13
50
0
100
MP2161GJ-C514
1331
08-16-13
50
0
100
MP4026GJ
1331
08-16-13
50
0
100
MP1497DJ
1331
08-16-13
50
0
100
MP1494DJ
1323
08-16-13
50
0
100
MP1494DJ
1323
08-16-13
50
0
100
MP1470GJ
1331
08-20-13
50
0
100
MP2315GJ
1331
08-16-13
50
0
100
MP3414DJ
1331
08-16-13
50
0
100
MP1472GJ-C452
1330
08-16-13
50
0
100
MP1470GJ
1331
08-20-13
50
0
100
MP2149GJ
1331
08-16-13
50
0
100
MP3414DJ
1331
08-20-13
50
0
100
MP2315GJ
1331
08-20-13
50
0
100
MP1496DJ
1324
08-20-13
50
0
100
The Future of Analog IC Technology®
- 86 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1472GJ-C452
1331
08-20-13
50
0
100
MP1470GJ
1326
08-20-13
50
0
100
MP1472GJ-C452
1331
08-20-13
50
0
100
MP1497DJ
1329
08-20-13
50
0
100
MP1495DJ
1323
08-20-13
50
0
100
MP3414DJ
1332
08-20-13
50
0
100
MP1494DJ
1323
08-23-13
50
0
100
FA NO.
# of
cycle
MP1498DJ
1332
08-20-13
50
0
MP1472GJ-C452
1323
08-29-13
50
2
100
MP2161GJ-C499
1331
09-10-13
50
0
100
MP3414DJ
1332
08-20-13
50
0
100
7251
100
MP2233DJ
1332
08-20-13
50
0
100
MP1472GJ
1323
08-20-13
50
0
100
MP3414DJ
1332
08-23-13
50
0
100
MP1470GJ
1331
08-23-13
50
0
100
MP1472GJ
1330
08-23-13
50
0
100
MP150GJ
1324
08-23-13
50
0
100
MP1470GJ
1328
08-23-13
50
0
100
MP2315GJ
1331
08-28-13
50
0
100
MP2143DJ-C463
1330
08-28-13
50
0
100
MP1495DJ
1332
08-28-13
50
0
100
MP1495DJ
1332
09-09-13
50
0
100
MP1494DJ
1323
08-23-13
50
0
100
MP1496DJ
1324
08-28-13
50
0
100
MP1495DJ
1332
09-18-13
50
0
100
MP1494DJ
1326
08-23-13
50
0
100
MP1471GJ
1328
08-28-13
50
0
100
MP1470GJ
1329
08-23-13
50
0
100
MP1472GJ-C452
1331
08-28-13
50
0
100
MP2315GJ
1332
08-28-13
50
0
100
MP3414DJ
1332
08-28-13
50
0
100
MP1470GJ
1331
08-28-13
50
0
100
MP1494DJ
1323
08-28-13
50
0
100
MP2161GJ
1328
08-28-13
50
0
100
MP2315GJ
1331
09-12-13
50
0
100
MP9495DJ
1332
08-28-13
50
0
100
MP3414DJ
1333
08-28-13
50
0
100
MP1472GJ-C452
1331
08-28-13
50
0
100
MP2315GJ
1329
08-28-13
50
0
100
MP1470GJ
1332
08-28-13
50
0
100
MP1494DJ
1323
08-28-13
50
0
100
MP3414DJ
1333
08-28-13
50
0
100
The Future of Analog IC Technology®
- 87 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2315GJ
1331
08-28-13
50
0
100
08-28-13
50
0
100
MP1472GJ-C452
FA NO.
# of
cycle
MP1496DJ
1333
08-28-13
50
0
100
MP2161GJ
1331
08-28-13
50
0
100
MP9495DJ
1332
08-28-13
50
0
100
MP2161GJ
1331
08-28-13
50
0
100
MP1496DJ
1331
08-29-13
50
0
100
MP1471GJ
1332
08-29-13
50
0
100
MP1494DJ
1332
08-29-13
50
0
100
MP3414DJ
1333
08-29-13
50
0
100
MP2161GJ
1331
08-29-13
50
0
100
MP1498DJ-C532
1332
08-29-13
50
0
100
MP2143DJ
1333
08-29-13
50
0
100
MP9495DJ
1333
08-29-13
50
0
100
MP1472GJ
1330
08-29-13
50
0
100
MP2161GJ
1331
08-29-13
50
0
100
MP1470GJ
1328
08-29-13
50
0
100
MP2315GJ
1331
08-29-13
50
0
100
MP1496DJ
1333
08-29-13
50
0
100
MP2161GJ
1329
08-29-13
50
0
100
MP3414DJ
1333
08-30-13
50
0
100
MP1470GJ
1333
08-30-13
50
0
100
MP2234GJ
1333
08-30-13
50
0
100
MP1471GJ
1333
08-30-13
50
0
100
MP1494DJ
1333
08-30-13
50
0
100
MP1470GJ
1333
09-05-13
50
0
100
MP1474DJ
1332
09-05-13
50
0
100
MP1497DJ
1331
09-05-13
50
0
100
MP1471GJ
1331
09-05-13
50
0
100
MP2143DJ
1333
09-05-13
50
0
100
MP2122GJ
1333
09-05-13
50
0
100
MP1494DJ
1333
09-05-13
50
0
100
MP1495DJ
1321
09-05-13
50
0
100
MP1471GJ-C519
1333
09-05-13
50
0
100
MP1472GJ
1329
09-05-13
50
0
100
MP2235GJ
1333
09-05-13
50
0
100
MP1495DJ
1319
09-05-13
50
0
100
MP2161GJ-C514
1334
09-05-13
50
0
100
MP2143DJ
1333
09-05-13
50
0
100
MP2122GJ
1333
09-09-13
50
0
100
MP2161GJ
1334
09-05-13
50
0
100
MP2161GJ
1334
09-05-13
50
0
100
The Future of Analog IC Technology®
- 88 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2315GJ
1332
09-05-13
50
0
100
MP3414DJ
1334
09-09-13
50
0
100
MP1472GJ-C452
1328
09-05-13
50
0
100
MP2161GJ-C499
1334
09-09-13
50
0
100
MP3414DJ
1334
09-09-13
50
0
100
MP1472GJ-C452
1329
09-05-13
50
0
100
MP1496DJ
1331
09-09-13
50
0
100
MP4027GJ
1329
09-09-13
50
0
100
MP1470GJ
1332
09-09-13
50
0
100
MP2235GJ
1334
09-09-13
50
0
100
MP2314GJ
1334
09-09-13
50
0
100
FA NO.
# of
cycle
MP1494DJ
1333
09-09-13
50
0
100
MP1471AGJ
1334
09-09-13
50
0
100
MP4026GJ
1334
09-09-13
50
0
100
MP1494DJ
1323
09-09-13
50
0
100
MP1495DJ
1323
09-09-13
50
0
100
MP1470GJ
1332
09-09-13
50
0
100
MP1470GJ
1334
09-09-13
50
0
100
MP1494DJ
1326
09-09-13
50
0
100
MP1475DJ
1333
09-09-13
50
0
100
MP3414DJ
1334
09-09-13
50
0
100
MP4026GJ
1335
09-09-13
50
0
100
MP2315GJ
1334
09-10-13
50
0
100
MP1494DJ
1333
09-09-13
50
0
100
MP3414DJ
1334
09-09-13
50
0
100
MP2161GJ
1335
09-10-13
50
0
100
MP1495DJ
1319
09-12-13
50
0
100
MP1496DJ
1333
09-12-13
50
0
100
MP1498DJ
1335
09-12-13
50
0
100
MP2314GJ
1333
09-10-13
50
0
100
MP1494DJ
1333
09-12-13
50
0
100
MP2161GJ
1334
09-18-13
50
0
100
MP2143DJ
1335
09-18-13
50
0
100
MP3414DJ
1334
09-10-13
50
0
100
MP1496DJ
1332
09-12-13
50
0
100
MP1495DJ
1321
09-12-13
50
0
100
MP2122GJ
1335
09-18-13
50
0
100
MP2143DJ
1335
09-12-13
50
0
100
MP2161GJ
1335
09-12-13
50
0
100
MP1472GJ
1331
09-18-13
50
0
100
MP3414DJ
1335
09-12-13
50
0
100
MP2161GJ
1335
09-12-13
50
0
100
The Future of Analog IC Technology®
- 89 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2143DJ
1335
09-12-13
50
0
100
MP4026GJ
1335
09-12-13
50
0
100
FA NO.
# of
cycle
MP9495DJ
1334
09-18-13
50
0
100
MP1470GJ
1332
09-12-13
50
0
100
MP2315GJ
1334
09-23-13
50
0
100
MP2315GJ
1335
09-18-13
50
0
100
MP9495DJ
1333
09-18-13
50
0
100
MP1496DJ
1333
09-27-13
50
0
100
MP3414DJ
1335
09-18-13
50
0
100
MP156GJ
1335
09-13-13
50
0
100
MP2315GJ
1334
09-13-13
50
0
100
MP9495DJ
1334
09-23-13
50
0
100
MP3414DJ
1335
09-18-13
50
0
100
MP2161GJ
1335
09-23-13
50
0
100
MP1495DJ
1323
09-23-13
50
0
100
MP1470GJ
1332
09-18-13
50
0
100
MP2122GJ
1335
09-23-13
50
0
100
MP1471AGJ
1336
09-23-13
50
0
100
MP3414DJ
1335
09-18-13
50
0
100
MP1494DJ
1335
09-23-13
50
0
100
MP2161GJ
1335
09-18-13
50
0
100
MP1495DJ
1335
09-26-13
50
0
100
MP2161GJ-C514
1336
09-18-13
50
0
100
MP2315GJ
1334
09-18-13
50
0
100
MP1496DJ
1336
09-23-13
50
0
100
MP2144GJ
1333
09-23-13
50
0
100
MP1470GJ
1332
09-23-13
50
0
100
MP2143DJ
1336
09-26-13
50
0
100
MP2161GJ
1336
09-23-13
50
0
100
MP3414DJ
1335
09-23-13
50
0
100
MP1494DJ
1309
09-23-13
50
0
100
MP1470GJ
1333
09-23-13
50
0
100
MP1472GJ
1332
09-23-13
50
0
100
MP1498DJ
1336
09-23-13
50
0
100
MP1496DJ
1333
09-23-13
50
0
100
MP2161GJ
1336
09-23-13
50
0
100
MP1494DJ
1306
09-23-13
50
0
100
MP1470GJ
1333
09-23-13
50
0
100
MP1470GJ
1333
09-26-13
50
0
100
MP2161GJ
1336
09-26-13
50
0
100
MP2143DJ
1336
09-26-13
50
0
100
MP2161GJ-C514
1336
09-26-13
50
0
100
The Future of Analog IC Technology®
- 90 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2315GJ
1335
09-26-13
50
0
100
MP4026GJ
1335
09-26-13
50
0
100
FA NO.
# of
cycle
MP9495DJ
1336
09-26-13
50
0
100
MP2161GJ
1336
09-26-13
50
0
100
MP2161GJ-C514
1336
09-26-13
50
0
100
MP2144GJ
1337
09-26-13
50
0
100
Total
2
4.8.3 Autoclave test
Stress Duration: 48~168 hrs
Stress Conditions: 121℃,100%RH,29.7psia
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1472GJ
1249
07-11-13
50
0
168
MP1472GJ
1249
07-11-13
50
0
168
MP1472GJ
1226
07-09-13
50
0
168
MP1472GJ
1226
07-09-13
50
0
168
MP2314GJ
1303
07-23-13
87
0
168
MP1494DJ
1243
07-24-13
87
0
168
MP1494DJ
1247
07-24-13
87
0
168
MP157GJ
1309
07-24-13
97
0
168
MP157GJ
1243
07-19-13
87
0
168
MP1494DJ
1245
07-31-13
50
0
168
MP1494DJ
1245
07-31-13
50
0
168
MP1497DJ
1246
07-31-13
50
0
168
MP1497DJ
1250
07-31-13
50
0
168
MP1470GJ
1305
07-31-13
87
0
168
MP2122GJ
1327
09-04-13
97
0
168
MP1494DJ
1237
09-04-13
97
0
168
MP2318GJ
1322
09-03-13
97
0
168
MP1470GJ
1245
09-05-13
50
0
168
MP1470GJ
1245
09-05-13
50
0
168
MP2225GJ
1304
09-24-13
87
0
168
MP1497DJ
1316
10-09-13
97
0
168
MP1496DJ
1314
10-09-13
50
0
168
MP1496DJ
1318
10-09-13
50
0
168
FA NO.
# of hrs
MP1470GJ
1327
10-08-13
97
0
168
MP1470GJ-JC
1330
09-27-13
97
0
168
MP1494DJ-JC
1329
09-27-13
97
0
168
MP1494DJ
1331
09-18-13
97
0
168
MP1494DJ
1328
10-12-13
97
0
MP1472GJ-C452
1249
07-02-13
50
1
168
6678
48
The Future of Analog IC Technology®
- 91 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2161GJ-C499
1305
08-14-13
50
0
48
MP1472GJ-C452
1252
07-02-13
50
0
48
MP1472GJ-C452
1312
07-02-13
100
0
48
MP2161GJ-C499
1311
08-14-13
50
0
48
MP2161GJ-C499
1313
08-14-13
50
0
48
MP1470GJ
1313
07-23-13
50
0
48
MP1495DJ
1315
07-01-13
50
0
48
MP1470GJ
1316
08-28-13
50
0
48
MP1470GJ
1316
08-28-13
50
0
48
MP1470GJ
1318
08-28-13
50
0
48
MP1495DJ
1316
07-04-13
50
0
48
MP1470GJ
1318
08-28-13
49
0
48
MP1496DJ
1319
08-15-13
50
0
48
MP1470GJ
1319
08-28-13
50
0
48
MP1470GJ
1318
08-28-13
50
0
48
MP1472GJ-C452
1320
07-31-13
50
0
48
MP1470GJ
1318
08-28-13
50
0
48
MP1494DJ
1319
07-16-13
50
0
48
MP1470GJ
1319
08-28-13
50
0
48
MP1470GJ
1318
08-28-13
50
0
48
FA NO.
# of hrs
MP2143DJ
1307
08-29-13
50
0
48
MP1470GJ
1320
08-28-13
50
0
48
MP2161GJ
1312
08-14-13
50
0
48
MP2161GJ
1322
08-14-13
50
0
48
MP1470GJ
1321
08-28-13
50
0
48
MP2161GJ
1317
08-14-13
50
0
48
MP1495DJ
1320
07-02-13
50
0
48
MP1471GJ
1323
07-23-13
50
0
48
MP1470GJ
1321
08-28-13
50
0
48
MP2161GJ
1322
08-14-13
50
0
48
MP2161GJ
1322
08-14-13
50
0
48
MP1470GJ
1321
08-28-13
50
0
48
MP2161GJ-C499
1322
08-14-13
50
0
48
MP1495DJ
1321
07-10-13
50
0
48
MP2234GJ
1323
09-02-13
50
0
48
MP2161GJ
1322
08-14-13
50
0
48
MP1494DJ
1321
07-01-13
50
0
48
MP1495DJ
1320
07-10-13
50
0
48
MP3414DJ
1324
07-01-13
50
0
48
MP2161GJ
1322
08-14-13
50
0
48
MP1470GJ
1323
08-28-13
50
0
48
MP1497DJ
1324
07-01-13
50
0
48
The Future of Analog IC Technology®
- 92 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1495DJ
1320
08-14-13
50
0
48
MP3414DJ
1324
07-01-13
50
0
48
MP3414DJ
1324
07-01-13
50
0
48
MP1495DJ
1321
07-01-13
50
0
48
MP1494DJ
1310
07-01-13
50
0
48
MP1495DJ
1320
07-04-13
50
0
48
MP3414DJ
1324
07-04-13
50
0
48
MP2161GJ-C499
1324
08-14-13
50
0
48
MP1497DJ
1324
07-04-13
50
0
48
MP2315GJ
1325
07-04-13
50
0
48
MP3414DJ
1324
07-04-13
50
0
48
FA NO.
# of hrs
MP1495DJ
1320
07-04-13
50
0
48
MP2161GJ
1318
07-16-13
50
0
48
MP1496DJ
1324
07-04-13
50
0
48
MP1471GJ
1324
07-02-13
50
0
48
MP1472GJ-C452
1323
07-02-13
50
0
48
MP1475DJ
1316
07-03-13
50
0
48
MP2161GJ-C499
1318
08-14-13
50
0
48
MP2161GJ
1318
08-14-13
50
0
48
MP1495DJ
1320
07-04-13
50
0
48
MP2161GJ-C499
1318
08-14-13
50
0
48
MP2161GJ
1325
08-14-13
50
0
48
MP1470GJ
1325
08-28-13
50
0
48
MP1472GJ-C452
1325
07-10-13
50
0
48
MP1497DJ
1324
07-04-13
50
0
48
MP156GJ
1324
07-10-13
50
0
48
MP1496DJ
1324
07-10-13
50
0
48
MP1494DJ
1319
07-10-13
50
0
48
MP1494DJ
1319
07-10-13
50
0
48
MP1497DJ
1324
07-10-13
50
0
48
MP150GJ
1324
08-14-13
50
0
48
MP1472GJ-C452
1325
07-10-13
50
0
48
MP2161GJ-C499
1325
08-14-13
50
0
48
MP2161GJ
1325
08-14-13
50
0
48
MP2144GJ
1322
07-16-13
50
0
48
MP1470GJ
1325
07-23-13
50
0
48
MP2161GJ-C499
1325
08-14-13
50
0
48
MP1494DJ
1319
07-10-13
50
0
48
MP1495DJ-C494
1323
07-10-13
50
0
48
MP2161GJ
1325
08-14-13
50
0
48
MP3414DJ
1325
07-16-13
50
0
48
MP2228GJ
1319
07-16-13
50
0
48
The Future of Analog IC Technology®
- 93 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1496DJ
1326
07-16-13
50
0
48
MP2161GJ-C499
1325
08-14-13
50
0
48
MP2161GJ-C499
1326
08-14-13
50
0
48
MP1470GJ
1326
07-23-13
50
0
48
MP2315GJ
1326
07-16-13
50
0
48
MP1496DJ
1326
07-16-13
50
0
48
MP3414DJ
1326
07-16-13
50
0
48
MP2161GJ-C499
1325
08-14-13
50
0
48
MP1496DJ
1326
07-16-13
50
0
48
MP1472GJ-C452
1325
07-11-13
50
0
48
MP2161GJ
1326
08-14-13
50
0
48
FA NO.
# of hrs
MP2161GJ
1326
08-14-13
50
0
48
MP2161GJ-C499
1325
08-14-13
50
0
48
MP2315GJ
1326
07-16-13
50
0
48
MP1494DJ
1323
07-16-13
50
0
48
MP2144GJ
1322
07-16-13
50
0
48
MP2161GJ
1324
08-14-13
50
0
48
MP1497DJ
1326
07-16-13
50
0
48
MP2161GJ-C499
1326
08-14-13
50
0
48
MP2122GJ
1326
07-18-13
50
0
48
MP2143DJ
1307
07-16-13
50
0
48
MP2161GJ-C499
1324
08-14-13
50
0
48
MP1472GJ-C452
1327
07-16-13
50
0
48
MP2234GJ
1327
07-18-13
50
0
48
MP1497DJ
1326
07-18-13
50
0
48
MP2314GJ
1327
07-18-13
50
0
48
MP1494DJ
1323
07-18-13
50
0
48
MP2161GJ-C499
1326
08-14-13
50
0
48
MP1470GJ
1325
07-23-13
50
0
48
MP1472GJ-C452
1327
07-18-13
50
0
48
MP1497DJ
1326
07-18-13
50
0
48
MP2161GJ
1325
08-14-13
50
0
48
MP2161GJ-C499
1326
08-14-13
50
0
48
MP3414DJ
1325
07-18-13
50
0
48
MP2122GJ
1327
07-23-13
50
0
48
MP1470GJ
1326
07-23-13
50
0
48
MP1494DJ
1323
07-23-13
50
0
48
MP3414DJ
1327
07-23-13
50
0
48
MP3414DJ
1324
07-23-13
50
0
48
MP3414DJ
1325
07-23-13
50
0
48
MP2314GJ
1328
07-25-13
50
0
48
MP2161GJ
1326
08-14-13
50
0
48
The Future of Analog IC Technology®
- 94 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2161GJ
1325
08-14-13
50
0
48
MP1472GJ-C452
1327
07-23-13
50
0
48
FA NO.
# of hrs
MP1495DJ
1323
07-23-13
50
0
48
MP2161GJ
1326
08-14-13
50
0
48
MP2161GJ
1326
08-14-13
50
0
48
MP1472GJ-C452
1327
07-23-13
50
0
48
MP1497DJ
1327
07-25-13
50
0
48
MP2161GJ
1326
08-14-13
50
0
48
MP2161GJ
1326
08-14-13
50
0
48
MP1494DJ
1323
07-23-13
50
0
48
MP3414DJ
1327
07-25-13
50
0
48
MP1495DJ
1323
07-25-13
50
0
48
MP1494DJ
1323
07-25-13
50
0
48
MP3414DJ
1326
07-25-13
50
0
48
MP2161GJ
1327
08-14-13
50
0
48
MP1470GJ
1326
07-30-13
50
0
48
MP1472GJ-C452
1327
07-25-13
50
0
48
MP1497DJ
1327
07-25-13
50
0
48
MP2159GJ
1318
07-25-13
50
0
48
MP2161GJ
1328
08-14-13
50
0
48
MP1472GJ-C452
1328
07-25-13
50
0
48
MP2161GJ-C499
1326
08-14-13
50
0
48
MP2161GJ-C499
1327
08-14-13
50
0
48
MP24892DJ
1327
07-25-13
50
0
48
MP2161GJ
1325
08-14-13
50
0
48
MP1495DJ
1323
07-30-13
50
0
48
MP1471GJ
1327
07-30-13
50
0
48
MP1497DJ
1327
07-30-13
50
0
48
MP2161GJ-C499
1328
08-14-13
50
0
48
MP1474DJ
1327
07-30-13
50
0
48
MP2161GJ-C499
1327
08-14-13
50
0
48
MP3414DJ
1328
07-30-13
50
0
48
MP1472GJ-C452
1328
07-30-13
50
0
48
MP1496DJ
1327
07-30-13
50
0
48
MP3414DJ
1328
07-30-13
50
0
48
MP2315GJ
1329
07-30-13
50
0
48
MP1472GJ-C452
1328
07-30-13
50
0
48
MP1472GJ
1317
08-01-13
50
0
48
MP1494DJ
1323
07-30-13
50
0
48
MP1495DJ
1323
08-07-13
50
0
48
MP2161GJ
1326
08-14-13
50
0
48
MP1496DJ
1327
08-01-13
50
0
48
The Future of Analog IC Technology®
- 95 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1495DJ
1323
07-30-13
50
0
48
MP1474DJ
1317
08-07-13
50
0
48
MP1472GJ-C452
1328
08-01-13
50
0
48
MP2161GJ-C499
1328
08-14-13
50
0
48
MP2161GJ
1327
08-14-13
50
0
48
MP2161GJ-C499
1328
08-14-13
50
0
48
MP2161GJ
1329
08-14-13
50
0
48
MP1495DJ
1323
08-07-13
50
0
48
MP1495DJ
1323
08-07-13
50
0
48
MP1472GJ
1324
08-01-13
50
0
48
MP1494DJ
1323
08-07-13
50
0
48
MP2161GJ-C499
1326
08-14-13
50
0
48
MP1472GJ-C452
1329
08-01-13
50
0
48
MP2161GJ-C499
1328
08-14-13
50
0
48
MP1470GJ
1327
08-07-13
50
0
48
FA NO.
# of hrs
MP3414DJ
1328
08-01-13
50
0
48
MP2161GJ
1326
08-14-13
50
0
48
MP1474DJ
1317
08-07-13
50
0
48
MP1495DJ
1329
08-07-13
50
0
48
MP2161GJ-C499
1328
08-14-13
50
0
48
MP2161GJ
1326
08-14-13
50
0
48
MP1472GJ
1328
08-07-13
50
0
48
MP1496DJ
1329
08-07-13
50
0
48
MP2161GJ-C499
1329
08-14-13
50
0
48
MP156GJ
1329
08-07-13
50
0
48
MP1472GJ-C452
1328
08-07-13
50
0
48
MP1495DJ
1323
08-07-13
50
0
48
MP1495DJ
1323
08-07-13
50
0
48
MP1472GJ-C452
1330
08-07-13
50
0
48
MP1495DJ
1329
08-14-13
50
0
48
MP2315GJ
1330
08-07-13
50
0
48
MP1495DJ
1323
08-14-13
50
0
48
MP1472GJ-C452
1330
08-14-13
50
0
48
MP1498DJ-C532
1307
08-14-13
50
0
48
MP2161GJ-C499
1329
09-10-13
50
0
48
MP1470GJ
1327
08-14-13
50
0
48
MP4026GJ
1329
08-14-13
50
0
48
MP1497DJ
1329
08-14-13
50
0
48
MP1494DJ
1326
08-14-13
50
0
48
MP2161GJ-C499
1329
09-10-13
50
0
48
MP9495DJ
1319
08-14-13
50
0
48
MP1470GJ
1327
09-05-13
50
0
48
The Future of Analog IC Technology®
- 96 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1472GJ
1323
08-20-13
50
0
48
MP3414DJ
1332
08-23-13
50
0
48
MP1470GJ
1331
08-23-13
50
0
48
MP1472GJ
1330
08-23-13
50
0
48
MP150GJ
1324
08-23-13
50
0
48
MP1470GJ
1328
08-23-13
50
0
48
MP2315GJ
1331
08-28-13
50
0
48
MP2143DJ-C463
1330
08-28-13
50
0
48
MP1495DJ
1332
08-28-13
50
0
48
MP1495DJ
1332
09-09-13
50
0
48
MP1494DJ
1323
08-23-13
50
0
48
MP1496DJ
1324
08-28-13
50
0
48
MP1495DJ
1332
09-18-13
50
0
48
MP1494DJ
1326
08-23-13
50
0
48
MP1471GJ
1328
08-28-13
50
0
48
FA NO.
# of hrs
MP1470GJ
1329
08-23-13
50
0
48
MP1472GJ-C452
1331
08-28-13
50
0
48
MP2315GJ
1332
08-28-13
50
0
48
MP3414DJ
1332
08-28-13
50
0
48
MP1470GJ
1331
08-28-13
50
0
48
MP1494DJ
1323
08-28-13
50
0
48
MP2161GJ
1328
08-28-13
50
0
48
MP2315GJ
1331
09-12-13
50
0
48
MP9495DJ
1332
08-28-13
50
0
48
MP3414DJ
1333
08-28-13
50
0
48
MP1472GJ-C452
1331
08-28-13
50
0
48
MP2315GJ
1329
08-28-13
50
0
48
MP1470GJ
1332
08-28-13
50
0
48
MP1494DJ
1323
08-28-13
50
0
48
MP3414DJ
1333
08-28-13
50
0
48
MP2315GJ
1331
08-28-13
50
0
48
08-28-13
50
0
48
0
48
MP1472GJ-C452
MP1496DJ
1333
08-28-13
50
MP2161GJ
1331
08-28-13
50
0
48
MP9495DJ
1332
08-28-13
50
0
48
MP2161GJ
1331
08-28-13
50
0
48
MP1496DJ
1331
08-29-13
50
0
48
MP1471GJ
1332
08-29-13
50
0
48
MP1494DJ
1332
08-29-13
50
0
48
MP3414DJ
1333
08-29-13
50
0
48
MP2161GJ
1331
08-29-13
50
0
48
MP1498DJ-C532
1332
08-29-13
50
0
48
The Future of Analog IC Technology®
- 97 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2143DJ
1333
08-29-13
50
0
48
MP9495DJ
1333
08-29-13
50
0
48
MP1472GJ
1330
08-29-13
50
0
48
MP2161GJ
1331
08-29-13
50
0
48
MP1470GJ
1328
08-29-13
50
0
48
MP2315GJ
1331
08-29-13
50
0
48
MP1496DJ
1333
08-29-13
50
0
48
MP2161GJ
1329
08-29-13
50
0
48
MP3414DJ
1333
08-30-13
50
0
48
MP1470GJ
1333
08-30-13
50
0
48
MP2234GJ
1333
08-30-13
50
0
48
MP1471GJ
1333
08-30-13
50
0
48
MP1494DJ
1333
08-30-13
50
0
48
MP1470GJ
1333
09-05-13
50
0
48
MP1474DJ
1332
09-05-13
50
0
48
FA NO.
# of hrs
MP1497DJ
1331
09-05-13
50
0
48
MP1471GJ
1331
09-05-13
50
0
48
MP2143DJ
1333
09-05-13
50
0
48
MP2122GJ
1333
09-05-13
50
0
48
MP1494DJ
1333
09-05-13
50
0
48
MP1495DJ
1321
09-05-13
50
0
48
MP1471GJ-C519
1333
09-05-13
50
0
48
MP1472GJ
1329
09-05-13
50
0
48
MP2235GJ
1333
09-05-13
50
0
48
MP1495DJ
1319
09-05-13
50
0
48
MP2161GJ-C514
1334
09-05-13
50
0
48
MP2143DJ
1333
09-05-13
50
0
48
MP2122GJ
1333
09-09-13
50
0
48
MP2161GJ
1334
09-05-13
50
0
48
MP2161GJ
1334
09-05-13
50
0
48
MP2315GJ
1332
09-05-13
50
0
48
MP3414DJ
1334
09-09-13
50
0
48
MP1472GJ-C452
1328
09-05-13
50
0
48
MP2161GJ-C499
1334
09-09-13
50
0
48
MP3414DJ
1334
09-09-13
50
0
48
MP1472GJ-C452
1329
09-05-13
50
0
48
MP1496DJ
1331
09-09-13
50
0
48
MP4027GJ
1329
09-09-13
50
0
48
MP1470GJ
1332
09-09-13
50
0
48
MP2235GJ
1334
09-09-13
50
0
48
MP2314GJ
1334
09-09-13
50
0
48
MP1494DJ
1333
09-09-13
50
0
48
The Future of Analog IC Technology®
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MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP1471AGJ
1334
09-09-13
50
0
48
MP4026GJ
1334
09-09-13
50
0
48
MP1494DJ
1323
09-09-13
50
0
48
MP1495DJ
1323
09-09-13
50
0
48
MP1470GJ
1332
09-09-13
50
0
48
MP1470GJ
1334
09-09-13
50
0
48
MP1494DJ
1326
09-09-13
50
0
48
MP1475DJ
1333
09-09-13
50
0
48
MP3414DJ
1334
09-09-13
50
0
48
MP4026GJ
1335
09-09-13
50
0
48
MP2315GJ
1334
09-10-13
50
0
48
MP1494DJ
1333
09-09-13
50
0
48
MP3414DJ
1334
09-09-13
50
0
48
MP2161GJ
1335
09-10-13
50
0
48
MP1495DJ
1319
09-12-13
50
0
48
MP1496DJ
1333
09-12-13
50
0
48
MP1498DJ
1335
09-12-13
50
0
48
MP2314GJ
1333
09-10-13
50
0
48
MP1494DJ
1333
09-12-13
50
0
48
MP2161GJ
1334
09-18-13
50
0
48
MP2143DJ
1335
09-18-13
50
0
48
MP3414DJ
1334
09-10-13
50
0
48
MP1496DJ
1332
09-12-13
50
0
48
MP1495DJ
1321
09-12-13
50
0
48
MP2122GJ
1335
09-18-13
50
0
48
MP2143DJ
1335
09-12-13
50
0
48
MP2161GJ
1335
09-12-13
50
0
48
MP1472GJ
1331
09-18-13
50
0
48
FA NO.
# of hrs
MP3414DJ
1335
09-12-13
50
0
48
MP2161GJ
1335
09-12-13
50
0
48
MP2143DJ
1335
09-12-13
50
0
48
MP4026GJ
1335
09-12-13
50
0
48
MP9495DJ
1334
09-18-13
50
0
48
MP1470GJ
1332
09-12-13
50
0
48
MP2315GJ
1334
09-23-13
50
0
48
MP2315GJ
1335
09-18-13
50
0
48
MP9495DJ
1333
09-18-13
50
0
48
MP1496DJ
1333
09-27-13
50
0
48
MP3414DJ
1335
09-18-13
50
0
48
MP156GJ
1335
09-13-13
50
0
48
MP2315GJ
1334
09-13-13
50
0
48
MP9495DJ
1334
09-23-13
50
0
48
The Future of Analog IC Technology®
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MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP3414DJ
1335
09-18-13
50
0
48
MP2161GJ
1335
09-23-13
50
0
48
MP1495DJ
1323
09-23-13
50
0
48
MP1470GJ
1332
09-18-13
50
0
48
FA NO.
# of hrs
MP2122GJ
1335
09-23-13
50
0
48
MP1471AGJ
1336
09-23-13
50
0
48
MP3414DJ
1335
09-18-13
50
0
48
MP1494DJ
1335
09-23-13
50
0
48
MP2161GJ
1335
09-18-13
50
0
48
MP1495DJ
1335
09-26-13
50
0
48
MP2161GJ-C514
1336
09-18-13
50
0
48
MP2315GJ
1334
09-18-13
50
0
48
MP1496DJ
1336
09-23-13
50
0
48
MP2144GJ
1333
09-23-13
50
0
48
MP1470GJ
1332
09-23-13
50
0
48
MP2143DJ
1336
09-26-13
50
0
48
MP2161GJ
1336
09-23-13
50
0
48
MP3414DJ
1335
09-23-13
50
0
48
MP1494DJ
1309
09-23-13
50
0
48
MP1470GJ
1333
09-23-13
50
0
48
MP1472GJ
1332
09-23-13
50
0
48
MP1498DJ
1336
09-23-13
50
0
48
MP1496DJ
1333
09-23-13
50
0
48
MP2161GJ
1336
09-23-13
50
0
48
MP1494DJ
1306
09-23-13
50
0
48
MP1470GJ
1333
09-23-13
50
0
48
MP1470GJ
1333
09-26-13
50
0
48
MP2161GJ
1336
09-26-13
50
0
48
MP2143DJ
1336
09-26-13
50
0
48
MP2161GJ-C514
1336
09-26-13
50
0
48
MP2315GJ
1335
09-26-13
50
0
48
MP4026GJ
1335
09-26-13
50
0
48
MP9495DJ
1336
09-26-13
50
0
48
MP2161GJ
1336
09-26-13
50
0
48
MP2161GJ-C514
1336
09-26-13
50
0
48
MP2144GJ
1337
09-26-13
50
0
48
Total
1
The Future of Analog IC Technology®
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MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
4.8.4 HAST
Stress Duration: 96 hrs
Stress Conditions: 130℃,85%RH,33.3psia,96h,Vcc max;
Device
D/C
Close
Date
Sample
Size
# of
Fail
MP2314GJ
1312
07-23-13
102
0
MP3221GJ
1309
07-18-13
95
0
MP157GJ
1309
07-24-13
99
0
MP1494DJ
1243
07-24-13
90
0
MP1494DJ
1247
07-24-13
90
0
MP2225GJ
1304
09-24-13
101
0
MP1494DJ
1316
09-17-13
101
0
MP1497DJ
1316
10-09-13
100
0
MP1496DJ
1314
10-09-13
50
0
MP1496DJ
1318
10-09-13
50
0
MP1470GJ
1327
10-08-13
92
0
MP1494DJ
1331
09-18-13
102
0
Total
FA NO.
0
The Future of Analog IC Technology®
- 101 -
MONOLITHIC POWER SYSTEMS
Q3
2013
PRODUCT RELIABILITY REPORT
Monolithic Power Systems (Chengdu) Co., Ltd.
No.8 Kexin Rd. West Park of Export Processing Zone,
West Hi-Tech Zone, Chengdu, Sichuan 611731
Tel: 86-28-87303000
Fax: 86-28-87303060
www.monolithicpower.com
The Future of Analog IC Technology®
- 102 -