MAX3679A Reliability Report

MAX3679A
RELIABILITY REPORT
FOR
MAX3679AETJ+T
PLASTIC ENCAPSULATED DEVICES
December 22, 2011
MAXIM INTEGRATED PRODUCTS
120 SAN GABRIEL DR.
SUNNYVALE, CA 94086
Approved by
Richard Aburano
Quality Assurance
Manager, Reliability Engineering
Maxim Integrated Products. All rights reserved.
Page 1
MAX3679A
Conclusion
The MAX3679AETJ+T successfully meets the quality and reliability standards required of all Maxim products. In addition, Maxim's
continuous reliability monitoring program ensures that all outgoing product will continue to meet Maxim's quality and reliability standards.
Table of Contents
I. ........Device Description
V. ........Quality Assurance Information
II. ........Manufacturing Information
VI. .......Reliability Evaluation
III. .......Packaging Information
IV. .......Die Information
.....Attachments
I. Device Description
A. General
The MAX3679A is a low-jitter precision clock generator with the integration of three LVPECL and one LVCMOS outputs optimized for Ethernet
applications. The device integrates a crystal oscillator and a phase-locked loop (PLL) clock multiplier to generate high-frequency clock outputs for
Ethernet applications. Maxim's proprietary PLL design features ultra-low jitter (0.36psRMS) and excellent power-supply noise rejection, minimizing
design risk for network equipment.
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MAX3679A
II. Manufacturing Information
A. Description/Function:
+3.3V, Low-Jitter Crystal to LVPECL Clock Generator
B. Process:
MB3
C. Number of Device Transistors:
10769
D. Fabrication Location:
USA
E. Assembly Location:
China, Malaysia, Taiwan and Thailand
F. Date of Initial Production:
August 11, 2009
III. Packaging Information
A. Package Type:
32-pin TQFN 5x5
B. Lead Frame:
Copper
C. Lead Finish:
100% matte Tin
D. Die Attach:
Conductive
E. Bondwire:
Au (1.3 mil dia.)
F. Mold Material:
Epoxy with silica filler
G. Assembly Diagram:
#05-9000-3346
H. Flammability Rating:
Class UL94-V0
I. Classification of Moisture Sensitivity per
JEDEC standard J-STD-020-C
Level 1
J. Single Layer Theta Ja:
47°C/W
K. Single Layer Theta Jc:
1.7°C/W
L. Multi Layer Theta Ja:
29°C/W
M. Multi Layer Theta Jc:
1.7°C/W
IV. Die Information
A. Dimensions:
82.28 X 82.28 mils
B. Passivation:
BCB
C. Interconnect:
Al/0.5%Cu
D. Backside Metallization:
None
E. Minimum Metal Width:
Metal1 = 0.23 / Metal2 = 0.6 / Metal3 = 1.2 / Metal4 = 4 microns (as drawn)
F. Minimum Metal Spacing:
Metal1 = 0.23 / Metal2 = 0.5 / Metal3 = 1.2 / Metal4 = 4 microns (as drawn)
G. Bondpad Dimensions:
H. Isolation Dielectric:
SiO2
I. Die Separation Method:
Wafer Saw
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MAX3679A
V. Quality Assurance Information
A. Quality Assurance Contacts:
Richard Aburano (Manager, Reliability Engineering)
Don Lipps (Manager, Reliability Engineering)
Bryan Preeshl (Vice President of QA)
B. Outgoing Inspection Level:
0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
C. Observed Outgoing Defect Rate:
< 50 ppm
D. Sampling Plan:
Mil-Std-105D
VI. Reliability Evaluation
A. Accelerated Life Test
The results of the 135C biased (static) life test are shown in Table 1. Using these results, the Failure Rate (
=
1
MTTF
=
= 11.5 x 10
) is calculated as follows:
1.83
(Chi square value for MTTF upper limit)
192 x 4340 x 96 x 2
(where 4340 = Temperature Acceleration factor assuming an activation energy of 0.8eV)
-9
= 11.5 F.I.T. (60% confidence level @ 25°C)
The following failure rate represents data collected from Maxim's reliability monitor program. Maxim performs quarterly life test
monitors on its processes. This data is published in the Reliability Report found at http://www.maxim-ic.com/qa/reliability/monitor.
Cumulative monitor data for the MB3 Process results in a FIT Rate of 0.06 @ 25C and 1.05 @ 55C (0.8 eV, 60% UCL)
B. E.S.D. and Latch-Up Testing (lot SWPZBQ001C, D/C 0917)
The HQ13 die type has been found to have all pins able to withstand a HBM transient pulse of +/- 2500V per
JEDEC JESD22-A114. Latch-Up testing has shown that this device withstands a current of +/- 250mA and overvoltage
per JEDEC JESD78.
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MAX3679A
Table 1
Reliability Evaluation Test Results
MAX3679AETJ+T
TEST ITEM
TEST CONDITION
Static Life Test (Note 1)
Ta = 135C
Biased
Time = 192 hrs.
FAILURE
IDENTIFICATION
SAMPLE SIZE
NUMBER OF
FAILURES
COMMENTS
DC Parameters
& functionality
48
48
0
0
SWPZBQ001B, D/C 0915
SWPZBQ002A, D/C 1013
Note 1: Life Test Data may represent plastic DIP qualification lots.
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