NTE74HC573 Integrated Circuit TTL − High Speed CMOS, Octal D−Type Latch with 3−State Outputs Description: The NTE74HC573 is a high speed octal transparent D−type latch with 3−state outputs in a 20−Lead DIP type package with the capability to drive 15 LS−TTL loads. When the latch−enable (LE) input is high, the Q outputs follow the data (D) inputs. When LE is low, the Q outputs are latched at the logic levels of the D inputs. A buffered output−enable (OE) input can be used to place the eight outputs in either a normal logic state (high or low) or the high−impedance state. In the high−impedance state, the outputs neither load nor drive the bus lines significantly. The high−impedance state and increased drive provide the capability to drive bus lines without interface or pullup components. OE does not affect th internal operations of the latches. Old data can be retained or new data can be entered while the outputs are in the high−impedance state. To ensure the high−impedance state during power up or power down, OE should be tied to VCC through a pullup resistor; the minimum value of th resistor is determined by the current−sinking capability of the driver. Features: D Wide Power Supply Range: 2V to 6V D Three−State Outputs Directly Drive Bus Lines D Balanced Propagation Delays and Transition Times D Bu Driver Outputs Drive up to 15 LS−TTL Loads D Significant Power Reduction Compared to LS−TTL Logic ICs Absolute Maximum Ratings: (Note 1, Note 2) Supply Voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.5 to +7.0V Clamp Diode Current, IIK, IOK . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20mA DC Drain Current (Per Output), IOUT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35mA DC Output Source or Sink Current (Per Output), IOUT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25mA DC VCC or GND Current (Per Pin), ICC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50mA Maximum Junction, TJ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +150C Storage Temperature Range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65C to +150C Typical Thermal Resistance, Junction−to−Ambient, RthJA . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69C/W Lead Temperature (During Soldering, 10sec), TL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +300C Note 1. Absolute Maximum Ratings are those values beyond which damage to the device may occur. Note 2. Unless otherwise specified, all voltages are referenced to GND. Recommended Operating Conditions: (Note 3) Parameter Symbol Min Typ Max Unit Supply Voltage VCC 2.0 − 6.0 V High−Level Input Voltage VCC = 2.0V VIH 1.5 − − V VCC = 4.5V 3.15 − − V VCC = 6.0V 4.2 − − V − − 0.5 V VCC = 4.5V − − 1.35 V VCC = 6.0V − − 1.8 V 0 − VCC V − − 1000 ns VCC = 4.5V − − 500 ns VCC = 6.0V − − 400 ns Low−Level Input Voltage VCC = 2.0V VIL DC Input or Output Voltage VIN, VOUT Input Rise or Fall Times VCC = 2.0V tr, tf Note 3. All unused inputs of the device must be held at VCC or GND to ensure proper device operation. DC Electrical Characteristics: TA = +25C Parameter Minimum HIGH Level Output Voltage Symbol VOH Test Conditions VIN = VIH IOUT = −20A or VIL IOUT = −6mA IOUT = −7.8mA Minimum LOW Level Output Voltage Maximum Input Leakage Current VOL VIN = VIH or VIL VCC − Typ TA = −40 to +85C Guaranteed Limits VCC VCC −0.1 VCC −0.1 Unit V 4.5 − 3.98 3.84 V 6.0 − 5.48 5.34 V IOUT = 20A − − 0.1 0.1 V IOUT = 6mA 4.5 0.2 0.26 0.33 V IOUT = 7.8mA 6.0 0.2 0.26 0.33 V IIN VIN = VCC or GND 6.0 − 0.1 1.0 A Three−State Leakage Current IOZ VIN = VIH or VIL 6.0 − 0.5 5.0 A Maximum Quiescent Supply Current ICC VIN = VCC or GND, IOUT = 0A 6.0 − 8.0 80 A Maximum Input Capacitance CIN − − 10 10 pF Maximum Output Capacitance COUT − − 20 20 pF Power Dissipation Capacitance CPD 5 51 − − pF Prerequisite for Switching Specifications: TA = +25C Parameter Pulse Duration (LE High) Setup Time (Data before LE) Hold Time (Data after LE) Symbol tW tSU tH Test Conditions TA = −40 to +85C VCC Typ Guaranteed Limits 2.0 − 80 100 Unit ns 4.5 − 16 20 ns 6.0 − 14 17 ns 2.0 − 50 65 ns 4.5 − 10 13 ns 6.0 − 9 11 ns 2.0 − 40 50 ns 4.5 − 8 10 ns 6.0 − 7 9 ns Switching Characteristics: (CL = 50pF unless otherwise specified) TA = +25C Parameter Propagation Delay Time (From Input D to Output Q) Symbol tpd Propagation Delay Time (From Input LE to Output Q) tpd Output Enable and Disable Time (From Input OE to Output Q) Output Transition Time (To Output Q) ten, tdis tt Test Conditions TA = −40 to +85C VCC Typ Guaranteed Limits 2.0 − 175 220 Unit ns 4.5 − 35 44 ns 6.0 − 30 37 ns 2.0 − 175 220 ns 4.5 − 35 44 ns 6.0 − 30 37 ns 2.0 − 150 190 ns 4.5 − 30 38 ns 6.0 − 26 33 ns 2.0 − 60 75 ns 4.5 − 12 15 ns 6.0 − 10 13 ns Truth Table: Inputs Output OE LE D Q L H H H L H L L L L X Q0 H X X Z H = HIGH Level (Steady State) L = LOW Level (Steady State) X = Don’t Care Q0 = The level of Q before the indicated steady state input conditions were established. Z = High Impedance State Pin Connection Diagram OE 1 20 VCC D0 2 D1 3 19 Q0 18 Q1 D2 4 17 Q2 D3 5 16 Q3 D4 6 15 Q4 D5 7 14 Q5 D6 8 13 Q6 D7 9 12 Q7 GND 10 11 LE 20 11 1 10 .300 (7.62) .260 (6.6) Max 1.200 (30.5) Max .200 (5.08) Max .012 (0.30) .100 (2.54) Typ .100 (2.54) Min .350 (8.89)