800MHz TTL/CMOS Potato Chip PO49FCT3804G 3.3V Dual 1:4 CMOS CLOCK BUFFERED DRIVER FEATURES: DESCRIPTION: . Patent pending technology . Operating frequency up to 800MHz with 2pf load . Operating frequency up to 600MHz with 5pf load . Operating frequency up to 300MHz with 15pf load . Operating frequency up to 150MHz with 50pf load . Very low output pin to pin skew < 250ps . Very low pulse skew < 100ps . VCC = 1.65V to 3.6V . Propagation delay < 1.7ns max with 15pf load . Low input capacitance: 3pf typical . Dual 1:4 fanout . Available in 16pin 300mil wide SOIC package Potato Semiconductor’s PO49FCT3804G is designed for world top performance using submicron CMOS technology to achieve 800MHz TTL output frequency with less than 250ps output pulse skew. Pin Configuration PO49FCT3804G is a 3.3V CMOS Dual 1 input to 4 outputs Buffered driver to achieve 800MHz Max output frequency. Typical applications are clock and signal distribution. Logic Block Diagram Pin Description Pin Name Description INA, INB Signal or clock Inputs Inputs Outputs INA, INB OAn, OBn Hi-Z State Output Enable Inputs (Active LOW) L L L Signal or clock Outputs L H H GND Ground H L Z Vcc Power H H Z OAn, OBn 1 800MHz TTL/CMOS Potato Chip PO49FCT3804G 3.3V Dual 1:4 CMOS CLOCK BUFFERED DRIVER Maximum Ratings Description Max Unit Storage Temperature -65 to 150 °C Operation Temperature -40 to 85 °C Operation Voltage -0.5 to +4.6 V Input Voltage -0.5 to Vcc+0.5 V Output Voltage -0.5 to Vcc+0.5 V Note: stresses greater than listed under Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability specification is not implied. DC Electrical Characteristics Symbol Description VOH Output High voltage VOL Test Conditions Min Typ Max Unit Vcc=3V Vin=VIH or VIL, IOH= -12mA 2.4 3 - V Output Low voltage Vcc=3V Vin=VIH or VIL, IOH=12mA - 0.3 0.5 V VIH Input High voltage Guaranteed Logic HIGH Level (Input Pin) 2 - Vcc V VIL Input Low voltage Guaranteed Logic LOW Level (Input Pin) -0.5 - 0.8 V IOZH High Impedance Output current Vcc = 3.6V and Vo = Vcc - - 1 uA IOZL High Impedance Output current Vcc = 3.6V and Vo = 0V - - -1 uA IIH Input High current Vcc = 3.6V and Vin = 3.6V - - 1 uA IIL Input Low current Vcc = 3.6V and Vin = 0V - - -1 uA VIK Clamp diode voltage Vcc = Min. And IIN = -18mA - -0.7 -1.2 V Notes: 1. 2. 3. 4. 5. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. Typical values are at Vcc = 3.3V, 25 °C ambient. This parameter is guaranteed but not tested. Not more than one output should be shorted at one time. Duration of the test should not exceed one second. VoH = Vcc – 0.6V at rated current 2 800MHz TTL/CMOS Potato Chip PO49FCT3804G 3.3V Dual 1:4 CMOS CLOCK BUFFERED DRIVER Power Supply Characteristics Symbol Description Test Conditions (1) Min Typ Max Unit IccQ Quiescent Power Supply Current Vcc=Max, Vin=Vcc or GND - 0.1 30 uA ∆Icc Power Supply Current per Input High Vcc=Max, Vin= Vcc-0.6V - 50 300 uA Notes: 1. 2. 3. 4. 5. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. Typical values are at Vcc = 3.3V, 25ΕC ambient. This parameter is guaranteed but not tested. Not more than one output should be shorted at one time. Duration of the test should not exceed one second. VoH = Vcc – 0.6V at rated current Capacitance (TA= +25°C, f= 1MHz) Parameters (1) Description Test Conditions Typ Max Unit Cin Input Capacitance Vin = 0V 3 4 pF Cout Output Capacitance Vout = 0V - 6 pF Notes: 1 This parameter is determined by device characterization but not production tested. Switching Characteristics Symbol Description Test Conditions Max Unit tPLH & tPHL Propagation Delay INA to OAn, INB to OBn CL = 15pF 1.7 ns tPZH or tPZL Output Enable Time CL = 15pF 2.5 ns tPHZ or tPLZ Output Disable Time CL = 15pF 2.5 ns Rise/Fall Time 0.8V – 2.0V 0.8 ns tr/tf tsk(p) Pulse Skew (Same Package) CL = 15pF, 125MHz 0.25 ns tsk(o) Output Pin to Pin Skew (Same Package) CL = 15pF, 125MHz 0.1 ns Output Skew (Different Package) CL = 15pF, 125MHz 0.4 ns tsk(pp) fmax Input Frequency CL = 50pF 150 MHz fmax Input Frequency CL =15pF 300 MHz fmax Input Frequency CL = 5pF 600 MHz fmax Input Frequency CL = 2pF 800 MHz Notes: 1. See test circuits and waveforms. 2. tpLH, tpHL, tsk(p), and tsk(o) are production tested. All other parameters guaranteed but not production tested. 3. Airflow of 1m/s is recommended for frequencies above 133MHz 3 800MHz TTL/CMOS Potato Chip PO49FCT3804G 3.3V Dual 1:4 CMOS CLOCK BUFFERED DRIVER Test Waveforms Test Circuit 500 Ω 50Ω 50 Ω 4 500 Ω 800MHz TTL/CMOS Potato Chip PO49FCT3804G 3.3V Dual 1:4 CMOS CLOCK BUFFERED DRIVER Packaging Mechanical Drawing: 16 pin SOIC 5