Manual - RMT Ltd

RMT Ltd
DEVICE FOR MEASURING SEEBECK
COEFFICIENT AND ELECTRICAL
CONDUCTIVITY OF INGOTS
DX8070
USER GUIDE
Moscow 2010
Version 1.00
RMT Ltd
DX8070 User Guide
Edition May 2010
Copyright
All rights reserved.
Reproduction in any manner, in whole or in part is straightly prohibited without
written permission of RMT Ltd.
The information contained in this document is the subject to change without notice.
Limited Warranty
RMT Ltd warrants that the DX8070 Device, if properly installed and used, will be
free from defects in material and workmanship and will substantially conform to RMT’s
publicly available specification for a period of one (1) year after the date that the DX8070
Device was purchased.
If the DX8070 Device, which is the subject of this Limited Warranty, fails during the
warranty period for the reasons covered by this Limited Warranty, RMT, at this option, will:
REPAIR the DX8070 Device; OR
REPLACE the DX8070 Device with another DX8070 Device of the same model.
Trademark Acknowledgments
All trademarks are the property of their respective owners.
RMT Ltd.
53 Leninskij prosp. Moscow 119991 Russia
phone: +7-499-132-6817 fax: +7-499-783-3664
e-mail: [email protected] http://www.rmtltd.ru
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DX8070 User Guide
CONTENTS
INTRODUCTION .................................................................................................................... 5
1.
TECHNICAL PARAMETERS ........................................................................................ 6
2.
STANDARD KIT ............................................................................................................ 7
3.
ARRANGEMENT AND OPERATION ............................................................................ 8
4.
5.
3.1.
Connection Procedure ............................................................................................ 8
3.2.
Samples Preparation ............................................................................................ 11
3.2.1.
Ingots Preparation ......................................................................................... 11
3.2.2.
Disks Preparation .......................................................................................... 11
3.2.3.
Ingot Installation for the Measurement .......................................................... 11
3.2.4.
Disk Installation for the Measurement ........................................................... 13
MEASURING PROCEDURE AND METHODS OF CALCULATIONS .......................... 14
4.1.
Measurement of the Seebeck Coefficient ............................................................. 14
4.2.
Measurement of Electrical Conductivity ................................................................ 15
SOFTWARE DX8070 .................................................................................................. 16
5.1.
System Requirements and Software Installation................................................... 16
5.2.
How to Start Measuring ........................................................................................ 16
5.3.
Main Window........................................................................................................ 17
5.3.1.
Measurement of Ingot Properties .................................................................. 18
5.3.2.
Measurement of Disk Properties ................................................................... 20
5.3.3.
Results Window ............................................................................................ 21
6.
SECURITY MEASURES ............................................................................................. 22
7.
MAINTENANCE SERVICE.......................................................................................... 23
8.
POSSIBLE MALFUNCTIONS AND WAYS OF THEIR ELIMINATION......................... 24
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DX8070 User Guide
INTRODUCTION
This User Guide is intended for studying the facility DX8070 (further the DX8070) for
the incoming control of the Seebeck coefficient of ingot and disks, as well as the Seebeck
coefficient and electrical conductivity of ingots of thermoelectric (TE) material based on
Bi2Te3 taking into account the polarity (n/p) and contains all the necessary data and
illustrations, sufficient for a correct operation.
The device provides measurements of the following parameters of thermoelectric
(TE) modules - see the table below.
Parameter measured
Seebeck coefficient
Electrical conductivity
Units
mV/K
1/(Ohm·cm)
Designation


Values
100…300
300…2000
Accuracy, %
3
5
Samples of the material should meet the following dimensions:
Parameter
Length
Diameter
Thickness
Diameter
Units
Ingot
mm
mm
Disk
mm
mm
min
Max
40
20
110
25*
20
30
25*
Note: * - larger diameter is available on request.
For the measurements, the samples should be prepared in an appropriate way. The
order of preparation will be described further.
The facility works under the control of a computer with the software installed. The
commands from a computer are processed by the control block.
The device has a degree of automation, allowing to realize measurement of
parameters in one cycle for ingots (along one axis) or over the section of a disk according
to some law of coordinates changing at a given ambient temperature.
The facility allows performing research, acceptance, qualification, periodic and other
kinds of TE material testing.
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1. TECHNICAL PARAMETERS
Technical parameters of the facility are given in the table
Parameter
Step between the nearest points measured
Accuracy of the probe positioning
Positioning repeatability
Summed length of the probe moving
Voltage measured
Voltage measurement accuracy
Ambient temperature measurement accuracy
Electric current
Designation
d
x
L
U
Тamb
I
Units
mm
mm
mm
мм
mV
V
K
А
Values
To be set
0.02
0.04
0…200
0.01…2
±3.5
0.5
0.5 – 5
Power supply:


AC voltage, V - 220 +10/-15;
Power consumption – no more than 200 W.
The equipment DX8070 is meant for laboratory measurements at the ambient
temperature 25±3ºC and relative humidity up to 80%.
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2. STANDARD KIT
#
Name
1
Control block
2
Robot with the following equipment:
Note
РМТК 249.04.00
3
Measuring table
РМТК 249.05.00
4
Probe head
РМТК 249.06.00
5
Flat cable
РМТК 249.08.00
6
1kHz cable
РМТК 249.09.00
7
Computer supply cable
8
Computer-monitor supply cable
9
USB cable
10
RS232 cable
For operation, a computer with the software installed is necessary.
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3. ARRANGEMENT AND OPERATION
Item designations in the figures correspond to item designations given in Section 1.
"Standard Kit".
Further in the text of a designation in brackets correspond to the designations in figures.
The measuring part of the facility is a
measuring table on which the sample
and the probe head are established.
Mutual positioning of the probe head of a
sample is made by the robot.
The device control and processing of
signals are carried out by the control
block, by commands from a computer.
3.1. Connection Procedure
Item designations in the figures correspond to item designations given in Section 1
"Standard Kit".
Further in the text of a designation in brackets correspond to the designations in figures.

Connect the flat cable (5) to the control block (5a) and to the probe head (5b).

Connect the 1 kHz cable (6) to the control block (6a) and to the measuring table
(6b).

Connect the supply cable (7) to the control block.

Connect the supply cable (8) to the control block (8a) and to the robot (8b).

Connect the control block and computer by the cable USB (9).

Connect the control block (10a) and the robot (10b).by the RS232 cable (10).
Before starting to work:

Plug in the supply cable (7). Be sure the power source is ~220 V (50 Hz)

Turn on the robot switch (11)

Turn the robot switch (12) to the position "RUN"
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5b
4
2
5
6b
1
3
6
DX8070 general outlines
1
1
5b
10a
6a
8a
7
9
Control block front panel
AC 1kHz
Control block back panel
Status
Digital input
Robot
USB
AC 220 out
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AC 220 in
ON-OFF
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2
10b
12
11
8b
Robot connection panel
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3.2. Samples Preparation
3.2.1. Ingots Preparation


Check the face surfaces of an ingot. If they do not satisfy to the conditions of
perpendicularity of 1 degree and flatness of 0.1 mm, it is necessary to make a
treatment of the face surfaces.
Sand-paper places of connection of electrodes
a. Sample face surfaces
b. Cylinder generatrix along which the measurements will be carried out
c. Contact area of the top electrode
b
c
a







a
Wash the sample with a soap in the water
Treat the sample by a clean gasoline
Treat the sample by ethanol
Wipe copper contacts of the measuring table and those of the probe by ethanol
Place the sample on a clean surface and keep it 2 hours at room temperature.
3.2.2. Disks Preparation
Check the face surfaces of a disk. If they do not satisfy to the conditions of flatness
of 0.1 mm, it is necessary to make a treatment of the face surfaces.
Sand-paper the face surfaces
a
a





Wash the sample with a soap in the water
Treat the sample by a clean gasoline
Treat the sample by ethanol
Wipe copper contacts of the measuring table and those of the probe by ethanol
Place the sample on a clean surface and keep it 2 hours at room temperature.
3.2.3. Ingot Installation for the Measurement
Not to stain the sample, put on the gloves.
Place the sample on a measuring table according to the figure below, having made the
following actions.
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6
1
2
5
4
3
6
5
7
4
3

Screw the panel of the thermocouple of the "cold end" 1 onto the top measuring
electrode 2 of the measuring table

Rotating the handle of screw 3, move apart the supporting disks 4 to the distance
slightly less than the ingot length

Rotating the handle of screw 5, move apart the leading electrodes to the distance
slightly less than the ingot length.

Press the clip arm 6

Insert the ingot, leaning it against the supporting disks 4. The orientation of the
ingot should be such that the cleaned zones corresponded to the places of
connection of the electrodes.

Press the ingot tightly to the left leading electrode 7

Let off the arm of clip 6, fix the ingot and be visually be sure that there is a contact
of the top electrode 2 and of the ingot

Rotating the handle of screw 5, press the right leading electrode to the ingot tightly
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Installation of a sample should provide a good electric contact of the sample all-over the
plane of the leading electrodes, as well as both good thermal and electric contact with the
top measuring electrode.
3.2.4. Disk Installation for the Measurement
Not to stain the sample, put on the gloves.
Place the sample on a measuring table according to the figure below, having made the
following actions.
1
8 10
9
3
4

Rotating the handle of screw 3, move apart the supporting disks 4 to the distance
slightly less than the plate length for the disk measurement 8

Insert the plate for the disk measurement 8 into the measuring table

Rotating the handle of screw 3 move up the supporting plates 4 and fix the disks
measuring plate 8

Screw the panel of the thermocouple of the "cold end" 1 onto the disk measuring
plate 8

Weaken the fixing screw 9 and remove holder 10 to the right

Establish the disk by pressing it tightly to plate 8 and leaning it against two
supporting ledges of the plate for disk measurement

Fix the disk by holder 10 by moving it firmly to the left and turn tightly fixing screw
9
Installation of a sample should provide a good thermal and electric contact with plate 8.
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4. MEASURING PROCEDURE AND METHODS OF CALCULATIONS

Prepare the sample and mount it onto the measuring table as shown in Section
3.2. Measure the dimensions of the sample.

Turn on the control block and perform the measurements according to the
calculations – see Section 4.1 and by the software – see Section 5.
4.1. Measurement of the Seebeck Coefficient
The method can be figured out with the help of the following scheme.
U2
Рабочая
часть
зонда
медь
медь
Исследуемый
образец
медь
нагреватель
U1
T1 константан
U1=k(T1-T2);
(1)
U2=s(T1-T2);
(2)
T2
керамика
There is a heated double probe consisting of a constantan part and a copper part.
The voltage on the constantan probe is given by:
U1  K T1  T2  ,
(1)
where  k is the constantan Seebeck coefficient referred to copper.
The voltage on a sample is voltage on the copper probe U 2 :
U2  s T1  T2  ,
(2)
where  s is the sample Seebeck coefficient referred to copper, T1 is the sample
temperature close to the probe end, T2 is the base temperature in relation to which the
temperature is measured.
From Eqs. (1) and (2) the sample Seebeck coefficient referred to copper is equal to:
s 
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U Cu k
,
Uk
(3)
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4.2. Measurement of Electrical Conductivity
Electrical conductivity is measured by the voltage U (x) at AC electric current I as
illustrated below.
медь
Исследуемый
образец
UCU
медь
Рабочая
часть
зонда
Токоподводящий
электрод 2
Токоподводящий
электрод 1
Источник переменного
тока
The value is calculated as:
 (x) 
I x
,
s U ( x )  U ( x  x )
(4)
where x is a distance between two nearest points, I is the sample current, s is the
sample cross-section, U(х) is a potential difference between points х and 0.
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5. SOFTWARE DX8070
5.1. System Requirements and Software Installation
Important!!! It is necessary to install the software “DX8080 Application" before the
connection of the device "DX8070" to a computer.
For a successful installation of the software, the computer should meet the following
requirements:

Processor – Intel Pentium, frequency 1.5 GHz or AMD Athlon and higher

512 Mb RAM

Operating system Windows 2000/XP/VISTA

50 Mb of free space

CD-ROM
If you install the software from the CD (it is supposed that the option of automatic
loading is on) "Autorun"), press the button "DX8070 Application Setup". If you downloaded
the software from the site (http://www.rmtltd.ru), run the file "<PATH>\Dx8070Setup.exe"
and follow the instructions, where <PATH> is the path to the file-setup.
5.2. How to Start Measuring
1. Turn on the device by the switch "ON-OFF".
2. Wait for the sound signal of the robot initialization ending.
3. Switch on the computer and start the program of controlling the device "DX8070".
The software is started in a usual way, by a double-click of the mouse on the
appropriate tag. After it, the software will try to define (determine) necessary
devices for work. In case of a successful detection, the window with devices found
will appear on the screen. It is necessary to choose one of the lists and to press
button "Ok" for сcontinuation.
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In case of an unsuccessful connection, the message will appear:
5.3. Main Window
After the device detection, the software main window is loaded:
The main window has a simple interface and allows proceeding quickly to necessary
measurements on an ingot or on a disk. For this purpose, it is enough to press a mouse
on the appropriate button.
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5.3.1. Measurement of Ingot Properties
Fill the ingot parameters in the fields "Diameter", "Length" and "Step".
A number of points to measure is set by a number of elements. The more the
number of elements, the smaller the step between points. It is not recommended to set
the number of elements more than 8. An approximate arrangement of points is given on
the plot below.
For beginning to measure, we press button "start". Measurement on an ingot
includes two independent processes: the measurement of electrical conductivity (Sigma)
and that of the Seebeck coefficient (Alpha). After the measurements are over, the
dependences of Alpha and Sigma versus the coordinate will be plotted, and the average
values will be shown.
For the detailed information on properties of the material in a measured point, it is
necessary to put the mouse cursor on a point needed. Within a small time the information
will be shown in a separate window.
The following parameters are given in this window:
 Point number
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





DX8070 User Guide
Sigma value
AC current
Copper wire voltage (for sigma)
Alpha value
Constantan wire voltage (for alpha)
Copper wire voltage (for alpha)
In case of a bad contact between the sample and electrodes, the results can be
incorrect. Such a situation is displayed on the diagram by strong fluctuations from the
average value. If so, it is recommended to correct the contact and to repeat
measurements. The examples of results of measurements with bad and good contact are
given in the following figures.
Bad contact measurements
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Good contact measurements
5.3.2. Measurement of Disk Properties
Fix the disk on the measuring table, as recommended.
Measure the disk diameter and write into the corresponding field of the software.
It is only the Seebeck coefficient that can be measured in this mode. To start the
measuring procedure, press the button "Start".
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5.3.3. Results Window
In this window the summary information on measurements is given. To open the log
of the test results, it is necessary to press button "further" after the end of measurements.
The test log offers the following services:
 Results storage
 Earlier results loading
 Results printing
All the actions are done by an appropriate button choice.
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6. SECURITY MEASURES

At operation, maintenance service and checking it is necessary to observe
requirements of the Russian Standard "GOST 12.3.019-80", "Service regulations
of consumers' electronic devices" and "Rules of a labor safety at operation of
consumers' electronic devices", or to apply similar documents of your country.

The voltage on the contacts of the device at operation is up to 250 V, which is
dangerous to human life. Any connections to the device and its maintenance
service are only to be done at power switched off.

Moisture on contacts and internal elements of the device are not allowed. The
usage of the device in aggressive environments in the atmosphere of acids,
alkalis, oils, etc. is forbidden.

The connection, adjustment and servicing of the device should only be performed
by the qualified experts who have studied this document.
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7. MAINTENANCE SERVICE
Service of the operational device consists of the technical inspection.
At the maintenance service of the device observe the security measures - see
section 6 SECURITY MEASURES.
Technical inspection of the device should be carried out not rarer than once in three
months and includes the following operations:

Cleaning of the device housing of dust, dirt and extraneous subjects;

Cables checking;

Checking of reliability of inter-block connections.
The malfunctions found at the technical inspection should be removed immediately.
Checking of metrological characteristics of the device should be done not rarer than once
in 3 years.
If necessary, make the adjustment of the device. It means the operations providing
restoration of its metrological characteristics in case of their change during a long
operation.
Important!!! Necessity of the adjustment is determined by results of the device checking
only by the qualified experts of the metrological services carrying out this checking.
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8. POSSIBLE MALFUNCTIONS AND WAYS OF THEIR ELIMINATION
Possible malfunctions and ways of their elimination are given in the table below.
Appearance
Possible reason
The program could not
contact the control block
Faulty USB cable
Temperature value is not
true
Breakage of a circuit of one
of thermal resistances
Necessary drivers are not
installed
Way of elimination
Malfunction reason
elimination
Malfunction reason
elimination
Note. If a malfunction or a reason is not specified in the table, it is necessary to deliver the
device for repair.
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