NNCD3.3G to NNCD7.5G, NNCD27G DS

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Old Company Name in Catalogs and Other Documents
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April 1st, 2010
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DATA SHEET
E.S.D NOISE CLIPPING DIODES
NNCD3.3G to NNCD7.5G, NNCD27G
ELECTROSTATIC DISCHARGE NOISE CLIPPING DIODES
(QUARTO TYPE : COMMON ANODE)
5 PIN MINI MOLD
PACKAGE DIMENSIONS
This product series is a diode developed for E.S.D (Electrostatic
Discharge) noise protection. Based on the IEC1000-4-2 test on
(in millimeters)
electromagnetic interference (EMI), the diode assures an endur0.65 +0.1
–0.15
1.5
external interface circuit protection.
With four elements mounted in the 5 PIN Mini Mold Package, the
• Based on the electrostatic discharge immunity test (IEC1000-4-
0.95
1.9
FEATURES
1
2), the product assures the minimum endurance of 30 KV.
5
2
0.95
2.9 ± 0.2
product can cope with high density and automatic packaging.
0.32 +0.1
–0.06
2.8 ± 0.2
ance of no less than 30 KV, thus making itself most suitable for
• Based on the reference supply of the set, the product achieves
3
4
a series over a wide range (11 product name lined up).
automatic packaging.
0.8
1.1 to 1.4
MINI MOLD package, the product can achieve a high density and
0.16 +0.1
–0.06
• With 4 elements mounted (common anode) mounted in the 5 PIN
0 to 0.1
APPLICATIONS
• External interface circuit E.S.D protection.
• Circuits for Waveform clipper, Surge absorber.
(5 PIN mini MOLD)
(SC-74A)
MAXIMUM RATINGS (TA = 25 ˚C)
Power Dissipation
P
200 mW
(Total)
Surge Reverse Power
PRSM
85 W (t = 10 µs 1 pulse)
Fig. 5
Junction Temperature
Tj
150 ˚C
Storage Temperature
Tstg
–55 ˚C to +150 ˚C
PIN CONNECTION
5
1
2
3
4
5
1
Document No. D11645EJ1V1DS00 (1st edition)
Date Published February 1998 N CP(K)
Printed in Japan
4
2
:
:
:
:
:
K1
A
K2
K3
K4
Cathode 1
Anode (common)
Cathode 2
Cathode 3
Cathode 4
3
©
1995
1996
NNCD3.3G to NNCD7.5G, NNCD27G
ELECTRICAL CHARACTERISTICS (TA = 25 ˚C) (A-K1, A-K2, A-K3, A-K4)
Parameter
Breakdown Voltage*
VBR (V)
Dynamic**
Impedance
Zz (Ω)
Reverse
Leakage
IR (µA)
Capacitance
Ct (pF)
Test
Condition
E.S.D Voltage
(KV)
MIN.
MAX.
IT (mA)
MAX.
IT (mA)
MAX.
VR (V)
TYP.
NNCD3.3G
3.10
3.50
5
130
5
20
1.0
220
30
NNCD3.6G
3.40
3.80
5
130
5
10
1.0
210
30
NNCD3.9G
3.70
4.10
5
130
5
10
1.0
200
30
NNCD4.3G
4.01
4.48
5
130
5
10
1.0
180
30
NNCD4.7G
4.42
4.90
5
130
5
10
1.0
170
NNCD5.1G
4.84
5.37
5
130
5
5
1.5
160
MIN.
30
VR = 0 V
f = 1 MHz
30
NNCD5.6G
5.31
5.92
5
80
5
5
2.5
140
30
NNCD6.2G
5.86
6.53
5
50
5
2
3.0
120
30
NNCD6.8G
6.47
7.14
5
30
5
2
3.5
110
30
NNCD7.5G
7.06
7.84
5
30
5
2
4.0
90
30
NNCD27G
25.10
28.90
2
70
2
2
21
25
30
Test
Condition
C = 150 pF
R = 330 Ω
(IEC1000
-4-2)
2
*
Tested with pulse (40 ms)
**
Zz is measured at IT give a small A.C. signal.
NNCD3.3G to NNCD7.5G, NNCD27G
TYPICAL CHARACTERISTICS (TA = 25 ˚C)
Fig. 2 It - VBR CHARACTERISTICS
(A-K1, A-K2, A-K3, A-K4)
Fig. 1 P - TA RATING
250
NNCD6.8G
NNCD7.5G
200
10 m
NNCD3.3G
NNCD3.6G
150
IT - On state Current - A
P - Power Dissipation - mW
100 m
100
50
0
25
50
75
100
125
150
TA - Ambient Temperature - ˚C
1m
NNCD3.9G
100 µ
10 µ
1µ
100 n
NNCD4.3G
10 n
1n
0
NNCD4.7G
NNCD6.2G
NNCD5.1G
NNCD5.6G
1
2
3
4
5
6
7
8
9
VBR - Breakdown Voltage - V
Fig. 3 ZT - IT CHARACTERISTICS
1 000
TYP.
NNCD3.9G
100
NNCD4.7G
Zz - Ω
NNCD5.6G
NNCD5.1G
10
NNCD7.5G
1
0.1
1
10
100
IT - On state Current - A
3
10
NNCD3.3G to NNCD7.5G, NNCD27G
Fig. 4 TRANSIENT THERMAL IMPEDANCE
1 000
Zth - Transient Thermal Impedance - (˚C/W)
625 ˚C/W
100
NNCD [ ] G
10
1
0.1
1m
10 m
100 m
1
10
100
t - Time - Sec
Fig. 5 SURGE REVERSE POWER RATING
10 000
PRSM - Surge Reverse Power - W
PRSM
TA = 25 ˚C
Non-Repetive
tT
1 000
100
NNCD [ ] G
10
1
1µ
10 µ
100 µ
1m
tT - Pulse Width - Sec
4
10 m
100 m
NNCD3.3G to NNCD7.5G, NNCD27G
Sample Application Circuits
* Set
Conecter
Micro
com.
PC
(CD ROM)
Di
Palallel
Interface
Di
Imterface Cable
* Set
Printer, P.D.C, T.V Game etc
5
NNCD3.3G to NNCD7.5G, NNCD27G
REFERENCE
Document Name
6
Document No.
NEC semiconductor device reliability/quality control system
C11745E
NEC semiconductor device reliability/quality control system
MEI-1201
Quality grade on NEC semiconductor devices
C11531E
Semiconductor device mounting technology manual
C10535E
Guide to quality assurance for semiconductor device
MEI-1202
NNCD3.3G to NNCD7.5G, NNCD27G
[MEMO]
7
NNCD3.3G to NNCD7.5G, NNCD27G
[MEMO]
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in
this document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property
rights of third parties by or arising from use of a device described herein or any other liability arising from use
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other
intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a
customer designated "quality assurance program" for a specific application. The recommended applications of
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device
before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact an NEC sales representative in advance.
Anti-radioactive design is not implemented in this product.
M4 96.5
8