SSF3605S Main Product Characteristics: VDSS -30V RDS(on) 5.1mΩ(typ.) ID -15A D G S SOP-8 Schematic diagram Assignment Features and Benefits: Marking and pin Advanced MOSFET process technology Special designed for PWM, load switching and general purpose applications Ultra low on-resistance with low gate charge Fast switching and reverse body recovery 150℃ operating temperature Description: It utilizes the latest processing techniques to achieve the high cell density and reduces the on-resistance with high repetitive avalanche rating. These features combine to make this design an extremely efficient and reliable device for use in power switching application and a wide variety of other applications. Absolute max Rating: Symbol Parameter Max. Units ID @ TC = 25°C Continuous Drain Current, VGS @ 10V① -15 ID @ TC = 70°C Continuous Drain Current, VGS @ 10V① -12.8 IDM Pulsed Drain Current② -120 PD @TC = 25°C Power Dissipation③ 3.1 W VDS Drain-Source Voltage -30 V VGS Gate-to-Source Voltage ± 25 V EAS Single Pulse Avalanche Energy @ L=0.1mH 180 mJ IAS Avalanche Current @ L=0.1mH 60 A -55 to +150 °C TJ TSTG Operating Junction and Storage Temperature Range A Thermal Resistance Symbol Characterizes RθJA Junction-to-ambient (t ≤ 10s) ④ ©Silikron Semiconductor CO.,LTD. 2012.04.09 www.silikron.com Typ. Max. Units — 40 ℃/W Version : 1.2(preliminary) page 1 of 7 SSF3605S Electrical Characterizes @TA=25℃ unless otherwise specified Symbol Parameter V(BR)DSS Drain-to-Source breakdown voltage RDS(on) Static Drain-to-Source on-resistance Min. Typ. Max. Units -30 Conditions — — V — 5.1 7 — 6.3 7.4 — 9.7 12 -1.4 -1.9 -2.7 V VDS = VGS, ID = -250μA — — -1 μA VDS = -30V,VGS = 0V — — 100 — — -100 VGS = 0V, ID = -250μA VGS=-20V,ID = -20A VGS(th) Gate threshold voltage IDSS Drain-to-Source leakage current IGSS Gate-to-Source forward leakage Qg Total gate charge — 95 — Qgs Gate-to-Source charge — 20 — Qgd Gate-to-Drain("Miller") charge — 30 — td(on) Turn-on delay time — 20 — tr Rise time — 30 — td(off) Turn-Off delay time — 50 — tf Fall time — 35 — Ciss Input capacitance — 4300 — Coss Output capacitance — 1000 — Crss Reverse transfer capacitance — 750 — mΩ VGS=-10V,ID = -20A VGS=-4.5V,ID = -20A nA VGS =20V VGS = -20V ID = -15A, nC VDS= -15V, VGS = -10V ns VGS=-10V, VDS=-15V, ID=1A ,RGEN=3Ω VGS = 0V pF VDS = -15V ƒ = 1MHz Source-Drain Ratings and Characteristics Symbol IS ISM Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Min. Typ. Max. Units — — -15 A — — -120 A Conditions MOSFET symbol showing the integral reverse p-n junction diode. VSD Diode Forward Voltage — -0.72 -1 V IS=-1A, VGS=0V trr Reverse Recovery Time — 40 — ns TJ = 25°C, IF =-15A, di/dt = Qrr Reverse Recovery Charge — 30 — nC 100A/μs ©Silikron Semiconductor CO., LTD. 2012.04.09 www.silikron.com Version: 1.2(preliminary) page 2 of 7 SSF3605S Test circuits and Waveforms EAS test circuit: Gate charge test circuit: S Switching time test circuit: Switch Waveforms: Notes: ①The maximum current rating is limited by bond-wires. ②Repetitive rating; pulse width limited by max. junction temperature. ③The power dissipation PD is based on max. junction temperature, using junction-to-case thermal resistance. ④The value of RθJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C ⑤These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming a maximum junction temperature of TJ(MAX)=150°C. ⑥ The maximum current rating is limited by bond-wires. ©Silikron Semiconductor CO., LTD. 2012.04.09 www.silikron.com Version: 1.2(preliminary) page 3 of 7 SSF3605S Thermal Resistance ZthJA Normalized Transient Typical electrical and thermal characteristics Square Wave Pluse Duration(sec) Figure1. Normalized Maximum Transient Thermal Impedance ©Silikron Semiconductor CO., LTD. 2012.04.09 www.silikron.com Version: 1.2(preliminary) page 4 of 7 SSF3605S Mechanical Data: SOP-8 PACKAGE OUTLINE DIMENSION ©Silikron Semiconductor CO., LTD. 2012.04.09 www.silikron.com Version: 1.2(preliminary) page 5 of 7 SSF3605S Ordering and Marking Information Device Marking: SSF3605S Package (Available) SOP-8 Operating Temperature Range C : -55 to 150 ºC Devices per Unit Package Type Units/ Tape Tapes/Inner Box Units/Inner Inner Box Boxes/Carton Box Units/Carton Box SOP-8 2500 2 5000 40000 8 Reliability Test Program Test Item Conditions Duration Sample Size High Temperature Reverse Bias(HTRB) High Temperature Gate Bias(HTGB) Tj=125℃ to 150℃ @ 80% of Max VDSS/VCES/VR 168 hours 500 hours 1000 hours 3 lots x 77 devices Tj=150℃ @ 100% of Max VGSS 168 hours 500 hours 1000 hours 3 lots x 77 devices ©Silikron Semiconductor CO., LTD. 2012.04.09 www.silikron.com Version: 1.2(preliminary) page 6 of 7 SSF3605S ATTENTION: ■ ■ ■ ■ ■ ■ ■ ■ ■ Any and all Silikron products described or contained herein do not have specifications that can handle applications that require extremely high levels of reliability, such as life-support systems, aircraft's control systems, or other applications whose failure can be reasonably expected to result in serious physical and/or material damage. Consult with your Silikron representative nearest you before using any Silikron products described or contained herein in such applications. Silikron assumes no responsibility for equipment failures that result from using products at values that exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or other parameters) listed in products specifications of any and all Silikron products described or contained herein. Specifications of any and all Silikron products described or contained herein stipulate the performance, characteristics, and functions of the described products in the independent state, and are not guarantees of the performance, characteristics, and functions of the described products as mounted in the customer’s products or equipment. To verify symptoms and states that cannot be evaluated in an independent device, the customer should always evaluate and test devices mounted in the customer’s products or equipment. Silikron Semiconductor CO.,LTD. strives to supply high-quality high-reliability products. However, any and all semiconductor products fail with some probability. It is possible that these probabilistic failures could give rise to accidents or events that could endanger human lives, that could give rise to smoke or fire, or that could cause damage to other property. When designing equipment, adopt safety measures so that these kinds of accidents or events cannot occur. Such measures include but are not limited to protective circuits and error prevention circuits for safe design, redundant design, and structural design. In the event that any or all Silikron products(including technical data, services) described or contained herein are controlled under any of applicable local export control laws and regulations, such products must not be exported without obtaining the export license from the authorities concerned in accordance with the above law. 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Specifications and information herein are subject to change without notice. Customer Service Worldwide Sales and Service: [email protected] Technical Support: [email protected] Suzhou Silikron Semiconductor Corp. 11A, 428 Xinglong Street, Suzhou Industrial Park, P.R.China TEL: (86-512) 62560688 FAX: (86-512) 65160705 E-mail: [email protected] ©Silikron Semiconductor CO., LTD. 2012.04.09 www.silikron.com Version: 1.2(preliminary) page 7 of 7