SILICON POWER MOS FET NE5531079A 7.5 V OPERATION SILICON RF POWER LDMOS FET FOR UHF-BAND 10 W TRANSMISSION AMPLIFIERS DESCRIPTION The NE5531079A is an N-channel silicon power laterally diffused MOS FET specially designed as the transmission power amplifier for 7.5 V radio systems. Die are manufactured using our NEWMOS-M1 technology and housed in a surface mount package. This device can deliver 40.0 dBm output power with 68% power added efficiency at 460 MHz with 7.5 V supply voltage. FEATURES • High output power : Pout = 40.0 dBm TYP. (VDS = 7.5 V, IDset = 200 mA, f = 460 MHz, Pin = 25 dBm) • High power added efficiency : add = 68% TYP. (VDS = 7.5 V, IDset = 200 mA, f = 460 MHz, Pin = 25 dBm) • High linear gain : GL = 20.5 dB TYP. (VDS = 7.5 V, IDset = 200 mA, f = 460 MHz, Pin = 10 dBm) • Surface mount package : 5.7 5.7 1.1 mm MAX. • Single supply : VDS = 7.5 V MAX. APPLICATIONS • 460 MHz band radio systems • 900 MHz band radio systems ORDERING INFORMATION Part Number NE5531079A Order Number NE5531079A-A Package Marking 79A (Pb-Free) W5 Supplying Form • 12 mm wide embossed taping • Gate pin face the perforation side of the tape NE5531079A-T1 NE5531079A-T1-A • 12 mm wide embossed taping • Gate pin face the perforation side of the tape • Qty 1 kpcs/reel NE5531079A-T1A NE5531079A-T1A-A • 12 mm wide embossed taping • Gate pin face the perforation side of the tape • Qty 5 kpcs/reel Remark To order evaluation samples, please contact your nearby sales office. Part number for sample order: NE5531079A-A Caution: Observe precautions when handling because these devices are sensitive to electrostatic discharge Document No. PU10752EJ01V0DS (1st edition) Date Published April 2009 NS NE5531079A ABSOLUTE MAXIMUM RATINGS (T A = +25C) Operation in excess of any one of these parameters may result in permanent damage. Parameter Drain to Source Voltage Symbol VDS Ratings Unit 30 V Note 1 Gate to Source Voltage VGS 6.0 V Drain Current IDS 3.0 A 6.0 A Drain Current (Pulse Test) IDS Note 2 Total Power Dissipation Ptot 35 W Channel Temperature Tch 125 C Storage Temperature Tstg 55 to +125 C Note 1. VDS will be used under 12 V on RF operation. 2. Duty Cycle 50%, Ton 1 s RECOMMENDED OPERATING CONDITIONS Parameter Symbol Test Conditions MIN. TYP. MAX. Unit Drain to Source Voltage VDS 6.0 7.5 V Gate to Source Voltage VGS 1.15 1.55 2.05 V Drain Current IDS 2.0 A Input Power Pin 25 30 dBm f = 460 MHz, VDS = 6.0 V ELECTRICAL CHARACTERISTICS (T A = +25C, unless otherwise specified, using our standard test fixture) Parameter Symbol Test Conditions MIN. TYP. MAX. Unit Gate to Source Leakage Current IGSS VGS = 6.0 V 100 nA Drain to Source Leakage Current (Zero Gate Voltage Drain Current) IDSS VDS = 25 V 10 nA Gate Threshold Voltage Vth VDS = 7.5 V, IDS = 1.0 mA 0.8 1.15 1.55 V Thermal Resistance Rth Channel to Case 2.9 C/W Transconductance gm VDS = 7.5 V, IDS = 700100 mA 2.5 3.2 4.0 S IDSS = 10 A 25 35 V 39.0 40.0 dBm Drain to Source Breakdown Voltage BVDSS Output Power Pout f = 460 MHz, VDS = 7.5 V, Drain Current IDS Pin = 25 dBm, 2.0 A Power Added Efficiency add IDset = 200 mA (RF OFF) 68 % 20.5 dB Linear Gain GL Note Note Pin = 10 dBm DC performance is 100% testing. RF performance is testing several samples per wafer. Wafer rejection criteria for standard devices is 1 reject for several samples. 2 Data Sheet PU10752EJ01V0DS NE5531079A TEST CIRCUIT (f = 460 MHz) The application circuits and their parameters are for reference only and are not intended for use in actual design-ins. COMPONENTS OF TEST CIRCUIT FOR MEASURING ELECTRICAL CHARACTERISTICS Symbol Value C1 1F C2 Type Maker GRM31CR72A105KA01B Murata 1 000 pF GRM1882C1H102JA01 Murata C10 10 pF GRM1882C1H100JA01 Murata C11 24 pF ATC100A240JW American Technical Ceramics C20 27 pF ATC100A270JW American Technical Ceramics C21 1.8 pF ATC100A1R8BW American Technical Ceramics C22 100 pF ATC100A101JW American Technical Ceramics R1 4.7 k 1/8W Chip Resistor R2 150 1/8W Chip Resistor L1 123 nH 0.5 mm, D = 3 mm, 10 Turns PCB R4775, t = 0.4 mm, r = 4.5, size = 30 48 mm Data Sheet PU10752EJ01V0DS Ohesangyou 3 NE5531079A ILLUSTRATION OF THE TEST CIRCUIT ASSEMBLED ON EVALUATION BOARD USING THE EVALUATION BOARD 4 Symbol Value C1 1F C2 1 000 pF C10 10 pF C11 24 pF C20 27 pF C21 1.8 pF C22 100 pF R1 4.7 k R2 150 L1 123 nH Data Sheet PU10752EJ01V0DS NE5531079A TYPICAL CHARACTERISTICS (T A = +25C, IDset = 200 mA, unless otherwise specified) Remark The graphs indicate nominal characteristics. Data Sheet PU10752EJ01V0DS 5 NE5531079A S-PARAMETERS 6 Data Sheet PU10752EJ01V0DS NE5531079A PACKAGE DIMENSIONS 79A (UNIT: mm) 79A PACKAGE RECOMMENDED P.C.B. LAYOUT (UNIT: mm) Data Sheet PU10752EJ01V0DS 7 NE5531079A RECOMMENDED SOLDERING CONDITIONS This product should be soldered and mounted under the following recommended conditions. For soldering methods and conditions other than those recommended below, contact your nearby sales office. Soldering Method Infrared Reflow Wave Soldering Partial Heating Soldering Conditions Condition Symbol Peak temperature (package surface temperature) : 260C or below Time at peak temperature : 10 seconds or less Time at temperature of 220C or higher : 60 seconds or less Preheating time at 120 to 180C : 12030 seconds Maximum number of reflow processes : 3 times Maximum chlorine content of rosin flux (% mass) : 0.2%(Wt.) or below Peak temperature (molten solder temperature) : 260C or below Time at peak temperature : 10 seconds or less Preheating temperature (package surface temperature) : 120C or below Maximum number of flow processes : 1 time Maximum chlorine content of rosin flux (% mass) : 0.2%(Wt.) or below Peak temperature (pin temperature) : 350C or below Soldering time (per pin of device) : 3 seconds or less Maximum chlorine content of rosin flux (% mass) : 0.2%(Wt.) or below Caution Do not use different soldering methods together (except for partial heating). 8 Data Sheet PU10752EJ01V0DS IR260 WS260 HS350-P3 NOTICE 1. 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