TPA SERIES SIDAC

TPA SERIES
SIDAC
D2
FEATURES
* Bi-directional Crowbar Protection.
* Voltage Range: From 62 Volt to 270 Volt
* Holding Current, IH = 150 mA min.
1.00 (25.4)
MIN.
0.161 (4.1)
0.154 (3.9)
* Peak Pulse Current : IPP = 50 A, 10/1000 µs.
* Pb / RoHS Free
0.284 (7.2)
0.268 (6.8)
DESCRIPTION
The TPA series are SIDAC devices especially designed
for protecting sensitive telecommunication equipment against
1.00 (25.4)
MIN.
0.034 (0.86)
0.028 (0.71)
lightning and transient voltages induced by AC power lines.
They are available in the D2 axial package
SIDAC device provide bi-directional protection by crowbar action.
Dimensions in inches and ( millimeters )
Their characteristic response to transient overvoltage makes
them particularly suited to protect voltage sensitive telecommunication
equipment.
COMPLIES WITH THE
Peak Surge
Voltage
Current
Admissible
Necessary
FOLLOWING STANDARDS :
Voltage
Waveform
Waveform
Ipp
Resistance
(V)
1000
1500
2000
2000
level 3
level 4
1500
800
1000
(µ
µ s)
10/700
10/700
10/700
1.2/50
10/700
1.2/50
10/160
10/560
9/720
(µ
µ s)
5/310
5/310
5/310
1/20
5/310
8/20
10/160
10/560
5/320
(A)
25
38
50
50
50
100
75
55
25
(Ω
Ω)
12.5
6.5
-
2500
1000
5000
2/10
10/1000
2/10
2/10
10/100
2/10
150
50
150
11.5
10
11.5
1000
0.5/700
0.8/310
25
-
(CCITT) ITU-K20
(CCITT) ITU-K17
VDE0433
VDE0878
IEC-1000-4-5
FCC Part 68, lightning surge
type A
FCC Part 68, lightning surge
type B
BELLCORE TR-NWT-001089
First level
BELLCORE TR-NWT-001089
Second level
CNET 131-24
ABSOLUTE MAXIMUM RATINGS (Ta = 25 ° C)
Symbol
P
IPP
Parameter
Value
Unit
1.7
W
10/1000µs
50
A
8/20µs
100
Power dissipation on infinite heatsink
Ta = 50°C
Peak pulse current
ITSM
Non repetitive surge peak on-state current
tp = 20ms
30
A
I2t
dv/dt
I2t value for fusing
Critical rate of rise of off-state voltage
tp = 20ms
VRM
9
5
A2s
kV/µs
Tstg
Storage temperature range
Tj
TL
Page 1 of 4
-55 to + 150
°C
Maximum junction temperature
150
°C
Maximum lead temperature for soldering during 10s at 5mm from case
230
°C
Rev. 02 : March 25, 2005
THERMAL RESISTANCES
Symbol
Value
Unit
Rth(j-l)
Junction to leads (Llead = 10mm)
Parameter
60
°C/W
Rth(j-a)
Junction to ambient on printed circuit (Llead = 10mm)
100
°C/W
Symbol
I
Parameter
Ipp
VRM
Stand-off Voltage
IRM
Leakage current at stand-off Voltage
VRM
Continuous Reverse Voltage
VBR
Breakdown Voltage
VBO
Breakover Voltage
IH
Holding Current
IBO
Breakover Current
IPP
Peak pulse current
C
Capacitance
IT
IBO
IH
IRM
VT
V
VRM VR VBRVBO
ELECTRICAL CHARACTERISTICS
Rating at 25 °C ambient temperature unless otherwise specified
IRM max.@ VRM
TYPE
IR max. @ VBR
max. (note1)
VBO @ IBO
max. (note2)
IH
min. (note3)
C
max. (note4)
µA
V
µA
V
V
mA
mA
pF
TPA62
2
56
50
62
82
800
150
150
TPA68
2
61
50
68
90
800
150
150
TPA100
2
90
50
100
133
800
150
100
TPA120
2
108
50
120
160
800
150
100
TPA130
2
117
50
130
173
800
150
100
TPA180
2
162
50
180
240
800
150
100
TPA200
2
180
50
200
267
800
150
100
TPA220
2
198
50
220
293
800
150
100
TPA240
2
216
50
240
320
800
150
100
TPA270
2
243
50
270
360
800
150
100
Note : 1. IR measured at VR guarantee VBRmin ≥ VR
2. Measured at 50 Hz (1 cycle) - See test circuit 1
3. See test circuit 2
4. VR = 1V, f = 1MHz. Refer to fig.3 for C versus VR.
Page 2 of 4
Rev.02 : March 25, 2005
TEST CIRCUIT 1 for IBO and VBO parameter :
tp = 20ms
Auto
Transformer
220V/2A
R1
140Ω
static
relay
R2
240Ω
K
Vout
220V/2A
D.U.T
VBO
measure
IBO
measure
Auto
Transformer
220V/800V
5A
TEST PROCEDURE :
• Pulse Test duration (tp=20ms) :
- For Bi-directional devices = Switch K is closed
- For Unidirectional devices = Switch K is open.
• VOUT Selection
- Device with VBO < 200 Volt
- VOUT = 250 VRMS, R1 = 140 Ω
- Device with VBO ≥ 200 Volt
- VOUT = 480 VRMS, R1 = 240 Ω
TEST CIRCUIT 2 for IH parameter :
R
VBAT = -48V
-VP
D.U.T
Surge generator
This is GO - NOGO Test which allows to confirm the holding current (IH) level in a functional test circuit.
TEST PROCEDURE :
1. Adjust the current level at the IH value by short circuiting the AK of the D.U.T
2. Fire the D.U.T. with a surge Current : Ipp = 10A , 10/1000 µs.
3. The D.U.T. will Come back off-state within 50ms max.
Page 3 of 4
Rev. 02 : March 25, 2005
Fig. 1 : Non repetitive surge peak on-state current
versus overload duration (Tj initial = 25 °C)
Fig. 2 : Relative variation of holding current versus
junction temperature
ITSM(A)
IH(Tj) / IH(Tj=25°C)
40
2.0
35
1.8
1.6
30
1.4
f=50Hz
25
1.2
20
1.0
15
0.8
0.6
10
0.4
5
t(a)
0
1E-2
1E-1
1E+0
Tj(°C)
0.2
1E+1
1E+2
0
-40
1E+3
Fig 3 : Relative variation of junction capacitance
versus reverse applied voltage (typical values).
Note: For V RM upper than 56 V , the curve is
extrapolated dotted line).
-20
0
20
40
80
60
100
Fig. 4 : On-state current versus on-state voltage
(typical value).
C[VR] / C[VR=1V]
IT(A)
1.0
50
Ta=25°C
f=1MHz
0.5
20
10
5
0.2
VR (V)
2
0.1
VT (V)
1
1
10
100
300
0
1
2
3
4
5
6
7
8
9
10
Fig. 5 : Transient thermal impedance junction to
ambient versus pulse duration (for FR4 PC Board
with T lead = 10 mm).
Zth(j-a)(°CW)
1E+2
1E+1
1E+0
tp(s)
1E-1
1E-3
Page 4 of 4
1E-2
1E-1
1E+0
1E+1
1E+2
5E+2
Rev. 02 : March 25, 2005