M Series Short Form

M SERIES ULTRA HIGH Q CAPACITOR SPEC
Rev. D
FEATURES:
-
Ultra High-Q and low ESR
-
Extended working range for wireless products
-
Extended battery life of portable devices
PART NUMBER DESCRIPTION
M
0402
Series
Size
0201 (0603) M : Ultra High Q,
0402 (1005)
Low ESR
0505 (1414)
0603 (1608)
0805 (2012)
250
Rated Voltage (VDC)
6R3=6.3
100-10
160=16
250=25
500=50
101=100
201=200
251=250
501=500
N
Dielectric
N: NP0
0R1
Capacitance
0R1=0.10pF
0R5=0.50pF
1R0=1.0pF
100=10pF
101=100pF
B
Tolerance
A: ±0.05pF
B: ±0.1pF
C: ±0.25pF
D: ±0.5pF
F: ±1%
G: ±2%
J: ±5%
T
C
Termination
C=Cu/Ni/Sn
Packaging
T=7” Paper Tape
U=13” Paper Tape
E=7” Plastic Tape
Q=13” Plastic Tape
Z or blank=Bulk
General Electrical Data
Dielectric
Size
Capacitance Range
Capacitance tolerance
Rated voltage (WVDC)
NP0
0201, 0402, 0505, 0603, 0805
0.1pF to 180pF
Cap≤5pF: A (±0.05pF ), B (±0.1pF), C (±0.25pF)
5pF<Cap<10pF: B (±0.1pF), C (±0.25pF), D (±0.5pF)
Cap≥10pF: F (±1%), G (±2%), J (±5%)
6.3V, 10V, 16V, 25V, 50V, 100V, 200V, 250V, 500V
Insulation resistance (25°C)
Operating temperature
Cap≥30pF, Q≥1000
Cap<30pF,Q≥400+20C
≥10GΩ
-55°C to +125°C
Temperature coefficient of capacitance
Termination
±30ppm/°C (±60ppm/°C for 0201 with values ≥22pF)
Ni/Sn (lead-free termination)
Q
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667 E. Cochran St. Simi valley, CA 93065
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M SERIES ULTRA HIGH Q CAPACITOR SPEC
Rev. D
External Dimensions
Case Size
EIA (mm)
0201
(0603)
Outline
L (mm)
W (mm)
T (mm)
Soldering
Method
MB (mm)
0.60 ±0.03
0.30 ±0.03
0.30 ±0.03
R
0.15 ±0.05
1.00 ±0.05
0.50 ±0.05
0.50
+0.02/-0.05
R
0.25 +0.05/-0.1
1.00 ±0.20
0.50 ±0.20
0.50 ±0.20
1.40 +0.33/-0.25
1.40 ±0.38
1.15 ±0.15
R/W
0.25 +0.25/-0.13
1.60±0.10
0.80±0.10
0.80±0.07
1.60 +0.15/-0.10
0.80+0.15/-0.10
R/W
0.40 ±0.15
0.50 ±0.05
0402
(1005)
0505
(1414)
0603
(1608)
0.50±0.10
0.80+0.15/-0.10
1.60 ±0.20
2.0 ±0.15
0.80±0.20
0.8±0.20
0.50±0.10
R/W
0.60±0.10
R/W
0.80±0.10
R/W
1.25±0.10
R
0.85±0.10
R/W
1.25±0.20
R
1.25 ±0.10
0805
(2012)
2.0 ±0.20
1.25 ±0.20
0.50 ±0.20
Thickness Codes/Packaging Quantity
Case
Size
Size
Code
Max
Thickness
(mm)
Length
(mm)
Width
(mm)
Thickness
(mm)
0201
AA
0.33
0.60 ±0.03
0.30 ±0.03
0.30 ±0.03
BA
0.55
1.0 ±0.05
0.5 ±0.05
BC
0.70
1.0 ±0.2
0.5 ±0.2
KA
1.30
1.40 +0.33/-0.25
CA
0.87
CC
0402
0505
0603
0805
Paper Tape
Embossed Plastic
Tape
7" Reel
13" Reel
7" Reel
13" Reel
15,000
70,000
-
-
10,000
50,000
-
-
0.5 ±0.2
10,000
-
-
-
1.40 ±0.38
1.15 ±0.15
-
-
3,000
-
1.6 ±0.1
0.8 ±0.1
0.8 ±0.07
4,000
15,000
-
-
0.95
1.6 +0.15/-0.01
0.8 +0.15/-0.1
0.8 +0.15/-0.1
4,000
15,000
-
-
CD
1.00
1.6 ±0.2
0.8 ±0.2
0.8 ±0.2
4,000
15,000
-
-
DB
0.70
2.0 ±0.15
1.25 ±0.1
0.6 ±0.1
4,000
15,000
-
-
DC
0.90
2.0 ±0.15
1.25 ±0.1
0.8 ±0.1
4,000
15,000
-
-
DD
1.35
2.0 ±0.15
1.25 ±0.1
1.25 ±0.1
-
-
3,000
10,000
DE
0.95
2.0 ±0.2
1.25 ±0.2
0.85 ±0.1
4,000
15,000
-
-
DF
1.45
2.0 ±0.2
1.25 ±0.2
1.25 ±0.2
-
-
3,000
10,000
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0.5 ±0.05
0.50 +0.02/-0.05
667 E. Cochran St. Simi valley, CA 93065
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M SERIES ULTRA HIGH Q CAPACITOR SPEC
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Rev. D
667 E. Cochran St. Simi valley, CA 93065
Phone: 1-805-522-9998, Fax: 1-805-522-9989
M SERIES ULTRA HIGH Q CAPACITOR SPEC
RF15, NP0, 50V
Rev. D
RF15, NP0, 50V
100000
10000
10000
1000
1pF
1pF
100
Q
IZI (Ω)
1000
100
1.5pF
1.5pF
3.3pF
10
6.8pF
10
6.8pF
1
1
1
10
100
1,000
10,000
100
1,000
10,000
Frequency (MHz)
Frequency (MHz)
Q vs. Frequency
Impedance vs. Frequency
ESR vs. Frequency
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RF15, SPEC
NP0, 50V Comparison
M SERIES ULTRA HIGH Q CAPACITOR
Rev. D
RF15, NP0, 50V
0
2pF
Measured data (<8.5GHz)
Simulation data
20
-20
15
-40
1pF
0.5pF
S21 (dB)
Self resonance frequency (GHz)
25
10
-60
-80
5
-100
0
0.1
1
10
0.1
100
1
10
Frequency (GHz)
Capacitance (pF)
SRF vs. Capacitance (0201)
S21 vs. Frequency (0201)
RF03, NP0, 25V Comparison
RF03, NP0, 25V
0
Measured data (<8.5GHz)
Simulation data
2pF
25
1pF
-20
0.5pF
20
S21 (dB)
Self resonance frequency (GHz)
30
15
-40
-60
10
-80
5
-100
0
0.1
1
10
0.1
100
1
10
Frequency (GHz)
Capacitance (pF)
S21 vs. Frequency (0402)
SRF vs. Capacitance (0402)
RF15, NP0, 50V Comparison
RF03, NP0, 25V Comparison
0
0
0.5pF
-20
-20
-40
-40
1pF
-60
2pF
S11 (dB)
S11 (dB)
0.5pF
-60
1pF
2pF
-80
-80
-100
-100
0.1
1
10
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1
S11 vs. Frequency (0402)
S11 vs. Frequency (0201)
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0.1
Frequency (GHz)
Frequency (GHz)
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10
M SERIES ULTRA HIGH Q CAPACITOR SPEC
Item
1
Visual and Mechanical
2
Capacitance
Test Condition
---
Requirements
* No remarkable defect
* Dimensions conform to individual specification sheet
* Shall not exceed the limits given in the detailed spec
NP0: Cap≥30pF, Q≥1000, Cap<30pF,Q≥400+20C
X7R, X5R:
Rated voltage
(DCV)
≤ 2.5%
35V
≤3.5%
Class I: NP0Class I: NP0
Cap≤1,000pF 1.0±0.2Vrms, 1MHz±10%
Cap>1,000pF 1.0±0.2Vrms, 1KHz±10%
16V
Q/ DF (Dissipation Factor)
D.F. ≤
≥ 50V
25V
3
Exception of D.F. ≤
≤3.5%
10V
≤3%
0201(50V), 0603 ≥ 0.047μF,
0805 ≥ 0.18μF, 1206 ≥ 0.47μF
≤5%
1210 ≥ 4.7μF
≤10%
0603≥1μF, 0805≥1μF,1206≥2.2μF, 1210≥10μF
≤10%
0805≥2.2µF, 1210≥10μF
≤5%
0201≥0.01μF,0805≥1μF, 1210≥10μF
≤7%
0603≥0.33μF, 1206≥4.7μF
≤10%
0402≥0.10μF,0603≥0.47μF, 0805≥2.2μF,
≤5%
0201≥0.01μF,0402≥0.033μF, 0603≥0.15μF,
0805≥0.68μF, 1206≥2.2μF,1210≥4.7μF
≤10%
0402≥ 0.22uF, 0603≥0.68μF,0805≥2.2μF,
1206≥4.7μF, 1210≥22μF
≤10%
0201≥0.012μF,0402≥0.33μF,0603≥0.33μF,0805
≥2.2μF, 1206≥2.2μF,1210≥22μF
≤15%
0201≥0.1μF, 0402≥1μF
≤15%
0201≥0.1μF,0402≥1μF,0603≥10μF,
0805≥4.7μF, 1206≥47μF :1210≥100μF
≤20%
---
0402≥2.2μF
---
≤3.5%
Class II: X7R, X5R,Y5V
Cap≤10µF, 1.0±0.2Vrms, 1kHz±10% **
Cap>10µF, 0.5±0.2Vrms, 120Hz±20%
** Test condition: 0.5±0.2Vrms ，1KHz±10%
X7R: 0603≥225 (10V), 0805=106 (6.3V&10V)
X5R: 0201≥224 (6.3V), 0402≥475 (6.3V),
0402≥225(10V),0603=106 (6.3V)
Rev. D
≤5%
6.3V
≤10%
4V
≤15%
Y5V:
D.F. ≤
Rated voltage
Exception of D.F.≤
≥50V
≤5%
≤7%
35V
≤7%
---
25V
≤5%
0603≥0.1μF, 0805≥0.47μF, 1206≥4.7μF,
Cap≥1μF
---
≤7%
0402≥0.047μF,0603≥0.1μF,
0805≥0.33μF,1206≥1μF, 1210≥4.7μF
≤9%
0402≥0.068μF,0603≥0.47μF, 1206≥4.7μF,
1210≥22μF, Cap≥1μF
16V
(C<1.0μF)
≤7%
≤9%
≤12.5%
0402≥0.068μF, 0603≥0.68μF
0402≥0.22μF
16V
(C≥1.0μF)
≤9%
≤12.5%
0603≥2.2μF, 0805≥3.3μF,1206≥10μF,
1210≥22μF, 1812≥47μF, Cap≥1μF
10V
6.3V
≤12.5%
≤20%
≤20%
---
0402≥0.47μF
---
*To apply voltage(≤100V) 250%.
*Duration: 1 to 5 sec.
*Charge & discharge current less than 50mA.
4
Dielectric Strength
*To apply voltage:
200V ~300V & LD series ≥2 times V DC
500V ~ 999V
≥1.5 times V DC
1000V ~ 3000V
≥1.2 times V DC
*Cut-off, set at 10mA
*TEST= 15 sec. *RAMP=0
*No evidence of damage or flash over during test.
10GΩ or RxC≥500Ω-F whichever is lower.
Class II (X7R, X7E, X5R, Y5V):
To apply rated voltage for max. 120 sec.
5
Insulation Resistance
Rated Voltage:
200V ~ 630V
>630V
6
7
Temperature Coefficient
Adhesive Strength of Termination
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Insulation Resistance
10GΩ or RxC≥100 Ω-F
whichever is lower.
To apply rated voltage (500V max.) for
>10GΩ or 100Ω-F whichever is lower.
60 sec.
To apply 500V for 60sec.
>10GΩ
With no electrical load.
T.C.
Operating Temp
NPO (C0G)
NPO (C0H)
-55~125°C at 25°C
NPO (C0J)
X7R
X5R
-55~ 85°C at 25°C
Y5V
-25~ 85°C at 20°C
*Pressurizing force：
0201: 2N
0402 & 0603: 5N
>0603: 10N
*Test time：10 ±1 sec
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Rated voltage
100V: X7R
50V:0603≥1µF,0805≥1µF, 1206≥2.2μF, 1210≥4.7µF
35V:0805≥2.2µF,1210≥10μF
25V:0402≥1µF,0603≥2.2µF,0805≥2.2µF, 1206≥10µF,1210≥10µF
16V:0402≥0.22µF,0603≥1µF,0805≥2.2µF, 1206≥10µF,1210≥47µF
10V:0201≥47nF,0402≥0.47µF,0603≥0.47µF, 0805≥2.2µF,
T.C.
NPO (C0G)
NPO (C0H)
NPO (C0J)
X7R
X5R
Y5V
Capacitance Change
Within ±30ppm/°C
Within ±60ppm/°C
Within ±120ppm/°C
Within ±15%
Within ±15%
Within +30%/-80%
* No remarkable damage or removal of the terminations.
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M SERIES ULTRA HIGH Q CAPACITOR SPEC
Item
8
Vibration Resistance
9
Solderability
10
11
Test Condition
* Vibration frequency: 10~55 Hz/min.
* Total amplitude: 1.5mm
* Test time: 6 hours
(Two hrs each in three mutually perpendicular
directions)
* Measurement to be made after keeping at room
temp. for 24±2 hours
* Solder temperature: 235±5°C
* Dipping time: 2±0.5 sec.
Bending Test
*The middle part of substrate shall be pressurized
by means of the pressurizing rod at a rate of
approximately 1 mm per second until the
deflection becomes 1 mm and then the pressure
shall be maintained for 5±1 sec.
*Measurement to be made after keeping at room
temp. for 24±2 hrs.
Resistance to Soldering
Heat
* Solder temperature: 260±5°C
* Dipping time: 10±1 sec
* Preheating: 120 to 150°C for 1 minute before
immersing the capacitor in an eutectic solder.
* Before initial measurement (Class II only):
Perform 150+0/-10°C for 1 hr and then set for
24±2 hrs at room temp.
* Measurement to be made after keeping at room
temp. for 24±2 hrs.
* Conduct the five cycles according to the
temperatures and time.
Step
1
2
12
3
Temperature Cycle
4
Temp. (°C)
Min. operating temp.
+0/-3
Room temp.
Max. operating temp.
+3/-0
Room temp.
Time (min.)
30±3
2~3
Rev. D
Requirements
* No remarkable damage.
* Cap change and Q/D.F.: To meet initial spec.
95% min. coverage of all metalized area.
* No remarkable damage.
* Capacitance change：
NP0: within ±5% or 0.5pF whichever is larger
X7R, X7E, X5R: within ±12.5%
Y5V: within ±30%
(This capacitance change means the change of capacitance under specified flexure of substrate from the
capacitance measured before the test.)
* No remarkable damage.
* Capacitance change:
NP0: within ±2.5% or 0.25pF whichever is larger
X7R, X7E, X5R: within ±7.5%
Y5V: within ±20%
* Q/D.F., I.R. and dielectric strength: To meet initial requirements.
* 25% max. leaching on each edge.
* No remarkable damage.
* Capacitance change
NP0: within ±2.5% or 0.25pF whichever is larger
X7R, X7E, X5R: within ±7.5%
Y5V: within ±20%
* Q/D.F., I.R. and dielectric strength: To meet initial requirements.
30±3
2~3
* Before initial measurement (Class II only):
Perform 150+0/-10°C for 1 hr and then set for
24±2 hrs at room temp.
* Measurement to be made after keeping at room
temp. for 24±2 hrs.
* No remarkable damage.
* Cap change: NP0: within ±5% or 0.5pF whichever is larger
X7R, X7E, X5R: ≥10V**,within ±12.5%;6.3V within ±25%;TT series,within ±25%
**10V:0603≥4.7μF;0402≥1μF;0201≥0.1μF, within ±25%;
Y5V: ≥10V, within ±30%; 6.3V, within +30/-40%
* Q/D.F. value:
NP0: More than 30pF Q≥350, 10pF≤C≤30pF, Q≥275+2.5C,Less than 10pF Q≥200+10C
X7R, X5R:
Rated vol.
≤3%
35V
≤5%
25V
≤5%
16V
13
Humidity (Damp Heat)
Steady State
* Test temp.: 40±2°C
* Humidity: 90~95% RH
* Test time: 500+24/-0hrs.
* Before initial measurement (Class II only):
Perform 150 +0/-10°C for 1 hr and then set for
24±2 hrs. at room temp.
* Measurement to be made after keeping at room
temp. for 24±2 hrs.
D.F.≤
≥50V
≤5％
≤6%
≤10%
≤20%
≤20%
≤10%
≤14%
Exception of D.F.≤
0201(50V); 0603≥0.047μF; 0805≥0.18μF; 1206≥0.47μF
1210≥4.7μF
0603≥1μF; 0805≥1μF; 1206≥2.2μF; 1210≥10μF
0805≥2.2µF;1210≥10μF
0201≥0.01μF;0805≥1μF; 1210≥10μF
0603≥0.33μF;1206≥4.7μF
≤15%
6≥6.8μF1210≥22μF
≤10%
0603≥0.15μF;0805≥0.68μF;1206≥2.2μF;1210≥4.7μF
≤15%
0201≥0.01μF;0402≥0.033μF;0603≥0.68μF;0805≥2.2μF; 1206≥4.7μF;
1210≥22μF
≤
≤15%
≤20%
6.3V
≤15%
≤30%
4V
X7R/X7E, LD≤20%
series : DF--- 3%
10V
≤7.5%
Y5V:
Rated vol.
D.F.≤
≥50V
≤7.5%
35V
≤10%
≤10%
--≤10%
25V
≤7.5%
≤15%
16V
(C<1.0μF)
16V
(C≥1.0μF)
10V
6.3V
≤10%
≤12.5%
≤20%
≤12.5%
≤20%
≤20%
≤30%
≤30%
---
0201≥0.012μF; 0402≥0.33μF; 0603≥0.33μF;0805≥2.2μF; 1206≥2.2μF;
0201≥0.1μF ;0402≥1μF
0201≥0.1μF;0402≥1μF;0603≥10μF; 0805≥4.7μF;
---
Exception of D.F.≤
0603≥0.1μF; 0805≥0.47μF; 1206≥4.7μF; Cap≥1μF
--0402≥0.047μF;0603≥0.1μF;0805≥0.33μF;
1206≥1μF; 1210≥4.7μF
0402≥0.068μF;0603≥0.47μF;1206≥4.7μF;
1210≥22μF; Cap≥1μF
0402≥0.068μF; 0603≥0.68μF
0402≥0.22μF
0603≥2.2μF;0805≥3.3μF;1206≥10μF;1210≥22μF;
1812≥47μF; Cap≥1μF
0402≥0.47μF
---
*I.R.: ≥10V, 1GΩ or 50 Ω-F whichever is lower.
Class II (X7R, X7E, X5R, Y5V)
Rated voltage
Insulation Resistance
100V: X7R
50V:0603≥1µF;0805≥1µF; 206≥2.2μF;1210≥4.7µF
25V:0402≥1µF;0603≥2.2µF;0805≥2.2µF;1206≥10µF;1210≥10µF
1GΩ or RxC≥10 Ω-F whichever is lower.
16V:0402≥0.22µF;0603≥1µF;0805≥2.2µF;1206≥10µF;1210≥47µF
10V:0201≥47nF;0402≥0.47µF;0603≥0.47µF;0805≥2.2µF;1206≥4.
7µF;1210≥47µF
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M SERIES ULTRA HIGH Q CAPACITOR SPEC
Item
Test Condition
Rev. D
Requirements
* No remarkable damage.
Cap change:
NP0: ±7.5% or 0.75pF whichever is larger.
X7R, X7E, X5R: ≥10V**,within ±12.5%;6.3V within ±25%;
**10V:0603≥4.7μF;0402≥1μF;0201≥0.1μF, within ±25%;
Y5V: ≥10V, within ±30%; 6.3V, within +30/-40%
Q/D.F. value:
NP0: C≥30pF,Q≥200;C<30pF, Q≥100+10/3C
X7R, X5R:
Rated voltage
≥50V
≤3%
≤5%
35V
14
Humidity (Damp Heat) Load
* Test temp.: 40±2°C
* Humidity: 90~95%RH
* Test time: 500+24/-0 hrs.
* Voltage：
Rated voltage.(Max.500V)
* Before initial measurement (Class II only): To apply
test voltage for 1hr at 40°C and then set
for 24±2 hrs
at room temp.* Measurement to be made after keeping
at room temp. for 24±2 hrs.
Exception of D.F. ≤
D.F.≤
≤6%
0201(50V);0603≥0.047μF; 0805≥0.18μF; 1206≥0.47μF
≤10%
1210≥4.7μF
≤20%
0603≥1μF; 0805≥1μF; 1206≥2.2μF; 1210≥10μF
≤20%
0805≥2.2µF;1210≥10μF
≤10%
0201≥0.01μF;0805≥1μF; 1210≥10μF
≤14%
≤15%
0603≥0.33μF;1206≥4.7μF
≤10%
0603≥0.15μF;0805≥0.68μF;1206≥2.2μF;1210≥4.7μF
≤15%
0201≥0.01μF;0402≥0.033μF;0603≥0.68μF;0805≥2.2μF; 1206≥4.7μF; 1210≥22μF
≤15%
0201≥0.012μF;0402≥0.33μF; 0603≥0.33μF;0805≥2.2μF; 1206≥2.2μF; 1210≥22μF
≤20%
0201≥0.1μF ;0402≥1μF
25V
≤5%
16V
≤5％
10V
≤7.5%
6.3V
≤15%
≤30%
0201≥0.1μF;0402≥1μF;0603≥10μF; 0805≥4.7μF;1206≥47μF;1210≥100μF
4V
≤20%
---
---
0402≥0.10μF;0603≥0.47μF;0805≥2.2μF; 1206≥6.8μF;1210≥22μF
X7R/X7E, LD series : DF≤3%
Y5V:
Rated voltage
≥50V
35V
D.F.≤
≤7.5%
≤10%
25V
≤7.5%
16V (C<1.0μF)
≤10%
16V (C≥1.0μF)
10V
≤12.5%
≤20%
≤30%
6.3V
≤10%
---
Exception of D.F.≤
0603≥0.1μF; 0805≥0.47μF;1206≥4.7μF; Cap≥1μF
---
≤10%
≤15%
≤12.5%
0402≥0.047μF;0603≥0.1μF;0805≥0.33μF;1206≥1μF; 1210≥4.7μF
0402≥0.068μF;0603≥0.47μF;1206≥4.7μF;1210≥22μF; Cap≥1μF
0402≥0.068μF; 0603≥0.68μF
≤20%
≤20%
≤30%
0402≥0.22μF
0603≥2.2μF;0805≥3.3μF;1206≥10μF;1210≥22μF;1812≥47μF; Cap≥1μF
0402≥0.47μF
---
---
*I.R.: ≥10V, 500MΩ or 25 Ω-F whichever is lower. Class II (X7R, X7E, X5R, Y5V)
Rated voltage
Insulation Resistance
100V: X7R
50V:0603≥1µF;0805≥1µF; 1206≥2.2μF;1210≥4.7µF
25V:0402≥1µF;0603≥2.2µF;0805≥2.2µF;1206≥10µF;1210≥10µF
16V:0402≥0.22µF;0603≥1µF;0805≥2.2µF;1206≥10µF;1210≥47µF
10V:0201≥47nF;0402≥0.47µF;0603≥0.47µF;0805≥2.2µF; 1206≥4.7µF;1210≥47µF
*Test temp.：
NP0, X7R/X7E: 125±3°C
X5R, Y5V: 85±3°C
*Test time: 1000+24/-0 hrs.
*To apply voltage:
(1) 6.3V or C≥10µF 150% of rated voltage:
(2) 10V≤Ur<500V: 200% of rated voltage.
(3) 500V: 150% of rated voltage.
(4) Ur≥630V: 120% of rated voltage.(5) 100% of rated
voltage for below range:
Size
Dielectric
Rated voltage
0201
0402
0603
0805
X5R/X7R
X5R/X7R
X5R/X7R
X5R/X7R
X5R/X7R
NP0
6.3V,10V
6.3V,10V
6.3V,10V
6.3V
6.3V
3000V
1206
Size
0402
15
High Temperature Load
(Endurance)
0603
0805
Dielectric
X5R/X7R
Y5V
X5R/X7R
Y5V
X5R/X7R
Y5V
Rated voltage
10V,16V,25V
16V
10V,16V
16V
10V
16V
Capacitance
C≥0.22μF
C≥0.47μF
C≥1.0μF
C≥2.2μF
C≥4.7μF
C≥4.7μF
*Before initial measurement (Class II only):
To apply test voltage for 1hr at test temp. and
then set for 24±2 hrs at room temp.
*Measurement to be made after keeping at room
temp. for 24±2 hrs.
* No remarkable damage.
Cap change:
NP0: ±3.0% or ±0.3pF whichever is larger
X7R, X7E, X5R: ≥10V**,within ±12.5%;6.3V within ±25%; **10V:0603≥4.7μF;0402≥1μF;0201≥0.1μF, within ±25%;
Y5V: ≥10V, within ±30%; 6.3V, within +30/-40%
Q/D.F. value:
NP0: More than 30pF, Q≥350; 10pF≤C<30pF, Q≥275+2.5C; Less than 10pF, Q≥200+10C
X7R, X5R:
Rated voltage
(6)150% of rated voltage for below range:
500MΩ or RxC≥5 Ω-F whichever is
lower.
D.F.≤
≥50V
≤3%
35V
≤5%
25V
≤5%
16V
≤5％
10V
≤7.5%
6.3V
4V
X7R: DF≤3%
Y5V:
≤15%
≤20%
Rated voltage
D.F.≤
≥50V
≤7.5%
25V
≤7.5%
16V (C<1.0μF)
≤10%
16V (C≥1.0μF) ≤12.5%
10V
≤20%
Exception of D.F.≤
≤6%
≤10%
≤20%
≤20%
≤10%
≤14%
≤15%
≤10%
≤15%
≤15%
≤20%
≤30%
--
0201(50V);0603≥0.047μF; 0805≥0.18μF; 1206≥0.47μF
1210≥4.7μF
0603≥1μF; 0805≥1μF; 1206≥2.2μF; 1210≥10μF
0805≥2.2µF;1210≥10μF
0201≥0.01μF;0805≥1μF; 1210≥10μF
0603≥0.33μF;1206≥4.7μF
0402≥0.10μF;0603≥0.47μF;0805≥2.2μF; 1206≥6.8μF;1210≥22μF
0603≥0.15μF;0805≥0.68μF; 1206≥2.2μF;1210≥4.7μF
0201≥0.01μF;0402≥0.033μF; 0603≥0.68μF;0805≥2.2μF; 1206≥4.7μF; 1210≥22μF
0201≥0.012μF;0402≥0.33μF; 0603≥0.33μF;0805≥2.2μF; 1206≥2.2μF; 1210≥22μF
0201≥0.1μF ;0402≥1μF
0201≥0.1μF;0402≥1μF; 0603≥10μF;0805≥4.7μF; 1206≥47μF; 1210≥100μF
--
≤10%
0603≥0.1μF; 0805≥0.47μF;1206≥4.7μF;Cap≥1μF
≤10%
≤15%
≤12.5%
0402≥0.047μF;0603≥0.1μF; 0805≥0.33μF;1206≥1μF; 1210≥4.7μF
0402≥0.068μF;0603≥0.47μF; 1206≥4.7μF;1210≥22μF;Cap≥1μF
0402≥0.068μF; 0603≥0.68μF
≤20%
≤20%
≤30%
0402≥0.22μF
0603≥2.2μF;0805≥3.3μF;1206≥10μF; 1210≥22μF;1812≥47μF;Cap≥1μF
0402≥0.47μF
Exception of D.F.≤
--6.3V
≤30%
--*I.R.: ≥10V, 1GΩ or 50 Ω-F whichever is lower.
Class II (X7R, X7E, X5R, Y5V):
Rated voltage
100V: X7R
50V:0603≥1µF;0805≥1µF; 1206≥2.2μF;1210≥4.7µF
25V:0402≥1µF;0603≥2.2µF; 0805≥2.2µF;1206≥10µF;1210≥10µF
16V:0402≥0.22µF;0603≥1µF; 0805≥2.2µF;1206≥10µF;1210≥47µF
10V:0201≥47nF;0402≥0.47µF; 0603≥0.47µF;0805≥2.2µF; 1206≥4.7µF;1210≥47µF
6.3V ; 4V
Frontier Electronics Corp.®
http://www.frontierusa.com
Page 8 of 9
Insulation Resistance
1GΩ or RxC≥10 Ω-F
whichever is lower.
667 E. Cochran St. Simi valley, CA 93065
Phone: 1-805-522-9998, Fax: 1-805-522-9989
M SERIES ULTRA HIGH Q CAPACITOR SPEC
Name
1
Ceramic material
2
Inner electrode
3
4
Termination
5
NP0/X7R
Rev. D
NPO/X7R/X5R/Y5V
BaTiO3 based
Ni
Inner layer
Cu
Middle layer
Ni
Outer layer
Sn
Storage and handling
(1)
(2)
Products should be stored at 5 to 40C ambient temperature and 20 to 70%. relative humidity.
It is recommended that the product be used within one year from shipment. After one year from shipment, solderability
should be checked.
Cautions
a.
b.
c.
Corrosive gas reacts with the terminal electrodes of capacitors. Do not store capacitors in the proximity of corrosive gas (e.g.,
hydrogen sulfide, sulfur dioxide, chlorine, ammonia gas etc.) otherwise there can be solderability issues.
In a corrosive atmosphere, solderability might be degraded, and/or silver migration may occur which can cause lower reliability.
Dewing caused by rapid humidity changes and/or photochemical changes of the terminal electrode (caused by direct sunlight
contact) can affect the solderability and electrical performance. Do not store capacitors under direct sunlight or in dewing
conditions.
Recommended reflow profile for
SnAgCu solder paste:
4℃/ sec max
Recommended wave profile for
SnAgCu solder paste:
Over 60sec at least by
natural cooling
Frontier Electronics Corp.®
http://www.frontierusa.com
Page 9 of 9
667 E. Cochran St. Simi valley, CA 93065
Phone: 1-805-522-9998, Fax: 1-805-522-9989