AOS Semiconductor Product Reliability Report AO4940/AO4940L, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: (408) 830-9742 www.aosmd.com 1 This AOS product reliability report summarizes the qualification result for AO4940. Accelerated environmental tests are performed on a specific sample size, and then followed by electrical test at end point. Review of final electrical test result confirms that AO4940 passes AOS quality and reliability requirements. The released product will be categorized by the process family and be monitored on a quarterly basis for continuously improving the product quality. Table of Contents: I. II. III. IV. I. Product Description Package and Die information Environmental Stress Test Summary and Result Reliability Evaluation Product Description: The AO4940/L uses advanced trench technology to provide excellent RDS(ON) and low gate charge. The two MOSFETs make a compact and efficient switch and synchronous rectifier combination for use in DC-DC converters. A monolithically integrated Schottky diode in parallel with the synchronous MOSFET to boost efficiency further. Standard Product AO4940 is Pb-free (meets ROHS & Sony 259 specifications). - RoHS Compliant - AO4940L is Halogen Free 2 II. Die / Package Information: Process Package Type Lead Frame Die Attach Bond wire Mold Material Flammability Rating Backside Metallization Moisture Level AO4940 Standard sub-micron Low voltage N channel process 8 leads SOIC Cu, D/pad, Ag spot Ag epoxy G: Au 1.3 mils; S: Cu 2mils Epoxy resin with silica filler UL-94 V-0 Ti / Ni / Ag Up to Level 1 * AO4940L (Green Compound) Standard sub-micron Low voltage N channel process 8 leads SOIC Cu, D/pad, Ag spot Ag epoxy G: Au 1.3 mils; S: Cu 2mils Epoxy resin with silica filler UL-94 V-0 Ti / Ni / Ag Up to Level 1* Note * based on info provided by assembler and mold compound supplier III. Result of Reliability Stress for AO4940 (Standard) & AO4940L (Green) Test Item Test Condition Time Point Lot Attribution Total Sample size Solder Reflow Precondition Standard: 1hr PCT+3 cycle reflow@260°c Green: 168hr 85°c /85%RH +3 cycle reflow@260°c Temp = 150°c , Vgs=100% of Vgsmax - Standard: 83 lots Green: 29 lots 17380 pcs 0 82 pcs 0 HTGB HTRB HAST Pressure Pot Temperature Cycle Temp = 150°c , Vds=80% of Vdsmax 130 +/- 2°c , 85%RH, 33.3 psi, Vgs = 80% of Vgs max 121°c , 29.7psi, RH=100% -65°c to 150°c , air to air 168 / 500 hrs 1 lot 1000 hrs (Note A*) 168 / 500 hrs 1 lot 1000 hrs (Note A*) 100 hrs Standard: 81 lots Green: 16 lots 96 hrs 250 / 500 cycles (Note B**) Standard: 83 lots Green: 20 lots (Note B**) Standard: 87 lots Green: 29 lots (Note B**) Number of Failures 77+5 pcs / lot 82 pcs 0 77+5 pcs / lot 5335 pcs 0 50+5 pcs / lot 5665 pcs 0 50+5 pcs / lot 6380 pcs 0 50+5 pcs / lot 3 III. Result of Reliability Stress for AO4940 (Standard) & AO4940L (Green) Continues DPA Internal Vision Cross-section X-ray CSAM NA 5 5 5 5 5 5 0 NA 5 5 0 Bond Integrity Room Temp 150°°c bake 150°°c bake 0hr 250hr 500hr 40 40 40 40 wires 40 wires 40 wires 0 Solderability 245°°c 5 sec 15 15 leads 0 Note A: The HTGB and HTRB reliability data presents total of available AO4940 and AO4940L burn-in data up to the published date. Note B: The pressure pot, temperature cycle and HAST reliability data for AO4940 and AO4940L comes from the AOS generic package qualification data. IV. Reliability Evaluation FIT rate (per billion): 128 MTTF = 887 years 4