MICROCHIP RE46C146

R&E International
A Subsidiary of Microchip Technology Inc.
RE46C146
CMOS Photoelectric Smoke Detector ASIC with Intelligent Interconnect and Timer Mode
Product Specification
General Description
The RE46C146 is low power CMOS photoelectric type
smoke detector IC. With minimal external components
this circuit will provide all the required features for a
photoelectric type smoke detector.
The design incorporates a gain selectable photo
amplifier for use with an infrared emitter/detector pair.
An internal oscillator strobes power to the smoke
detection circuitry for 100us every 10 seconds to keep
standby current to a minimum. If smoke is sensed the
detection rate is increased to verify an alarm condition.
A high gain mode is available for push button chamber
testing.
•
•
•
•
•
•
•
•
•
•
•
Internal Power On Reset
Low Quiescent Current Consumption
Available in 16L PDIP or 16L N SOIC
ESD Protection on all Pins
Interconnect up to 40 Detectors
10 Minute Timer for Sensitivity Control
Temporal Horn Pattern for Smoke and CO
Internal Low Battery and Chamber Test
Compatible with Allegro A5366
Alternate Diagnostic Mode
Available in Standard Packaging or RoHS
Compliant Pb Free Packaging
Pin Configuration
In the diagnostic mode the photo amplifier output is
available on pin 15 for production calibration of the
photo chamber.
A check for a low battery condition and chamber
integrity is performed every 43 seconds when in
standby. The temporal horn pattern for a smoke alarm
condition supports the NFPA 72 emergency evacuation
signal.
An interconnect pin allows multiple detectors to be
connected such that when one units alarms, all units
will sound. The interconnect is compatible with certain
types of CO interconnect signaling and when
recognized will sound the temporal pattern for a carbon
monoxide alarm.
An internal 10 minute timer can be used for a reduced
sensitivity mode.
C1
1
16
TEST
C2
2
15
VSEN
3
14
VSS
STROBE
4
13
ROSC
VDD
5
12
COSC
IRED
6
11
LED
IO
7
10
FEED
HORNB
8
9
DETECT
HORNS
Utilizing low power CMOS technology the RE46C146
was designed for use in smoke detectors that comply
with Underwriters Laboratory Specification UL217 and
UL268.
Features
ABSOLUTE MAXIMUM RATINGS
PARAMETER
Supply Voltage
Input Voltage Range Except FEED, IO
FEED Input Voltage Range
IO Input Voltage Range
Input Current except FEED
Operating Temperature
Storage Temperature
Maximum Junction Temperature
© 2009 Microchip Technology Inc.
SYMBOL
VDD
Vin
Vinfd
Vio1
Iin
TA
TSTG
TJ
VALUE
12.5
-.3 to Vdd +.3
-10 to +22
-.3 to 17
10
-25 to 75
-55 to 125
150
UNITS
V
V
V
V
mA
°C
°C
°C
DS22176A-page 1
RE46C146
CMOS Photoelectric Smoke Detector ASIC with
Intelligent IO and Timer Mode
Product Specification
R&E International
A Subsidiary of Microchip Technology Inc.
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are
stress ratings only and operation at these conditions for extended periods may affect device reliability.
This product utilizes CMOS technology with static protection; however proper ESD prevention procedures should be used when
handling this product. Damage can occur when exposed to extremely high static electrical charge.
DC Electrical Characteristics at TA = -25° to 75°C, VDD=9V, Typical Application (unless otherwise noted)
Parameter
Supply Voltage
Supply Current
Input Voltage High
Input Voltage Low
Input Leakage Low
Input Leakage High
Input Pull Down Current
Output Leakage Current
Low
Output Leakage Current
High
Symbol
Test
Pin
VDD
5
IDD1
5
IDD2
5
IDD3
5
IDD4
5
VIH1
Limits
Typ
Max
Test Conditions
Min
6
10
Operating
Configured as in Figure 2,
COSC=VSS
Configured as in Figure 2,
VDD=12V, COSC=VSS
Configured as in Figure 2,
STROBE on, IRED off, VDD=12V
Configured as in Figure 2,
STROBE on, IRED on, VDD=12V
FEED
6.2
VIH2
7
No Local Alarm, IO as an Input
3.2
V
VIH3
15
VSEN
1.6
V
VIH4
16
TEST
8.5
V
VIL1
10
FEED
VIL2
7
No Local Alarm, IO as an Input
1.5
V
VIL3
15
VSEN
.5
V
VIL4
16
7
V
IIL1
1,2,3
-100
nA
IIL2
12
TEST
VDD=12V, COSC=12V, STROBE
active
VDD=12V, Vin=VSS
-100
nA
IIL3
15,16
VDD=12V, Vin=VSS
-1
uA
ILFD
10
-50
uA
IIH1
1,2
100
nA
IIH2
3,12
FEED=-10V
VDD=12V, Vin=VDD, STROBE
active
VDD=12V, Vin=VDD
100
nA
IHFD
10
FEED=22V
50
uA
IPD1
16
Vin=VDD
10
uA
V
4
6
uA
5.5
8
uA
2
mA
3
mA
4.5
.25
IPD2
15
Vin=VDD
.1
7
Vin=VDD
20
IPDIO2
7
Vin=17V, VDD=12
IOZL1
11,13
IOZH1
11,13
© 2009 Microchip Technology Inc.
12
4.5
IPDIO1
Units
.25
V
2.7
V
.5
uA
80
uA
140
uA
Output Off, Output=VSS
-1
uA
Output Off, Output=VDD
1
uA
DS22176A-page 2
RE46C146
CMOS Photoelectric Smoke Detector ASIC with
Intelligent IO and Timer Mode
Product Specification
R&E International
A Subsidiary of Microchip Technology Inc.
DC Electrical Characteristics (continued) at TA= -25° to 75°, VDD=9V, Typical Application (unless
otherwise noted)
Parameter
Output Voltage Low
Symbol
Test
Pin
VOL1
8,9
Iol=16mA, VDD=6.5V
VOL2
13
Iol=5mA, VDD=6.5V
Test Conditions
Min
1
.5
VOL3
11
Iol=10mA, VDD=6.5V
Output Voltage High
VOh1
8,9
Iol=-16mA, VDD=6.5V
5.5
Output Current
IIOH1
7
-4
IIODMP
7
Alarm, Vio=Vdd-2V or Vio=0V
At Conclusion of Local Alarm or
Test, Vio=1V
VLB
5
VSTOF
4
VSTON
4
VIREDOF
6
VIREDON
6
VCM1
1,2,3
Vref
-
TCST
4
TCIRED
6
ΔVSTON
ΔVIREDON
Low Battery Alarm Voltage
Output Voltage
Common Mode Voltage
Smoke Compare
Reference
Temperature Coefficient
Line Regulation
Internal Reference
4,5
VDD=6V to 12V, STROBE Output
Voltage
VDD=6V to 12V, IRED Output
Voltage
Active, VDD=6V to 12V
6,5
Active, VDD=6V to 12V
-16
V
mA
mA
7.2
7.5
11.9
2.25
V
V
5
VDD 5.3
Units
V
1
6.9
STROBE off, VDD=12V,
Iout=-1uA
STROBE on, VDD=9V
Iout= 100uA to 500uA
IRED off, VDD=12V, Iout=1uA
IRED on, VDD=9V
Iout=0 to -6mA, Ta=25C
Local smoke, Push to Test or
Chamber Test, Note 1
Limits
Typ
Max
V
V
VDD 5
3.1
VDD 4.7
.1
V
V
3.75
V
.5
VDD-2
V
VDD3.85
VDD3.15
V
.01
%/ºC
.3
%/ºC
-50
dB
-30
dB
Note 1: Not production tested
Typical values are for design information and are not guaranteed.
Limits over the specified temperature range are not production tested and are based on characterization data.
© 2009 Microchip Technology Inc.
DS22176A-page 3
RE46C146
CMOS Photoelectric Smoke Detector ASIC with
Intelligent IO and Timer Mode
Product Specification
R&E International
A Subsidiary of Microchip Technology Inc.
AC Electrical Characteristics at TA =-25° to 75°, VDD=9V, VSS=0V, Component Values from Figure 2 ;
R9=100KΩ, R12=10MΩ, C5= 1.5nF(unless otherwise noted)
Min
Limits
Typ
Max
No Alarm Condition
9.4
10.5
11.5
mS
Operating
9.4
10.5
11.5
mS
11
Standby, No Alarm
39
43
47
S
TPLED2
11
Local Alarm Condition
.45
.5
.55
S
TPLED3
11
Timer Mode, No Local Alarm
9.6
10.75
11.8
S
TPLED4
11
Remote Alarm Only
TPER1
4
TPER1A
4
TPER1B
4
TPER2
4
TPER3
4
Standby, No Alarm
Standby, After 1 Valid Smoke
Sample
Standby, After 2 Consecutive Valid
Smoke Samples
In Local Alarm – (3 Consecutive
Valid Smoke Samples)
In Remote Alarm
Symbol
Test
Pin
Oscillator Period
TPOSC
12
LED and STROBE On Time
TON1
11,4
TPLED1
Parameter
LED Period
STROBE and IRED Pulse
Period
Test Conditions
Units
LED IS NOT ON
S
9.6
10.75
11.8
S
1.8
2
2.2
S
.9
1
1.1
S
.9
1
1.1
S
7.2
8
8.9
S
TPER4
4
Pushbutton Test
300
336
370
mS
IRED On Time
TON2
6
Operating
94
104
115
uS
Horn On Time
THON1
8,9
450
500
550
mS
THON2
8,9
9.4
10.5
11.5
mS
THON3
8,9
90
100
110
mS
THOF1
8,9
Operating, Alarm Condition, Note 1
Low Battery or Failed Chamber
Test , No Alarm
Operating, CO Interconnect Alarm
Condition, Note 1
Operating, Alarm Condition, Note 1
450
500
550
mS
THOF2
8,9
1.35
1.5
1.65
S
THOF3
8,9
39
43
47
S
THOF4
8,9
90
100
110
mS
THOF5
8,9
4.59
5.1
5.61
S
TIODLY1
7
TIOPW1
7
Operating, Alarm Condition, Note 1
Low Battery or Failed Chamber
Test, No Alarm
Operating, CO Interconnect Alarm
Condition, Note 1
Operating, CO Interconnect Alarm
Condition, Note 1
From Start of Local Alarm to IO
Active
No local alarm, 2 valid pulses
required for CO
TIOTO1
7
TIODMP
7
TIODLY2
7
Horn Off Time
IO Delay
IO Pulse on Time for CO
Alarm
IO Pulse Off Time for CO
Alarm
IO Charge Dump Duration
Remote Alarm Delay
Timer Period
TTPER
0
S
46.2
IO=low
At Conclusion of Local Alarm or
Test
No Local Alarm, From IO Active to
Alarm
No Alarm Condition
590
mS
3.7
S
1.2
1.35
1.5
S
1.05
1.5
2.0
S
8
10
12
Min
Note 1 – See timing diagram for smoke alarm Horn Temporal Pattern
Typical values are for design information and are not guaranteed.
Limits over the specified temperature range are not production tested and are based on characterization data.
© 2009 Microchip Technology Inc.
DS22176A-page 4
RE46C146
CMOS Photoelectric Smoke Detector ASIC with
Intelligent IO and Timer Mode
Product Specification
© 2009 Microchip Technology Inc.
R&E International
A Subsidiary of Microchip Technology Inc.
DS22176A-page 5
RE46C146
CMOS Photoelectric Smoke Detector ASIC with
Intelligent IO and Timer Mode
Product Specification
R&E International
A Subsidiary of Microchip Technology Inc.
Functional Block Diagram
Figure 1
© 2009 Microchip Technology Inc.
DS22176A-page 6
RE46C146
CMOS Photoelectric Smoke Detector ASIC with
Intelligent IO and Timer Mode
Product Specification
R&E International
A Subsidiary of Microchip Technology Inc.
PIN DESCRIPTIONS
PIN#
PIN NAME
1
C1
The capacitor connected to this pin sets the photo amplifier gain (high) for the
push-to-test and chamber sensitivity test. The size of this capacitor will depend
on the chamber background reflections. A=1+ (C1/10) where C1 is in pF. The
gain should be <10000.
2
C2
The capacitor connected to this pin sets the photo amplifier gain (normal) during
standby. The value of this capacitor will depend on the smoke sensitivity
required. A=1+ (C2/10) where C2 is in pF.
3
DETECT
Positive input to the photo amplifier. This input is normally connected to the
cathode of an external photo diode operated at zero bias.
4
STROBE
Regulated output voltage of VDD-5 which is active during a test for smoke. This
output is the negative side of the photo amplifier circuitry.
5
VDD
Connect to the positive supply voltage
6
IRED
Provides a regulated pulsed output voltage pre-driver for the infrared emitter.
This output usually drives the base of an NPN transistor.
7
IO
This bidirectional pin provides the capability to interconnect many detectors in a
single system. This pin has an internal pull-down device.
8
HB
This pin is connected to the metal electrode of a piezoelectric transducer.
9
HS
HS is a complementary output to HB and connects to the ceramic electrode of
the piezoelectric transducer.
10
FEED
11
LED
12
COSC
A capacitor connected to this pin with a parallel resistor sets the internal clock
low time which is approximately the clock period.
13
ROSC
A resistor between this pin and pin 12 (COSC) sets the internal clock high time.
This also sets the IRED pulse width (100-200uS).
14
VSS
15
VSEN
In the timer mode this input pin can be used to set an external smoke
comparator reference.
16
TEST
This input is used to invoke two test modes and the timer mode. This input has
an internal pull-down.
© 2009 Microchip Technology Inc.
DESCRIPTION
Usually connected to the feedback electrode through a current limiting resistor. If
not used this pin must be connected to VDD or VSS.
Open drain NMOS output used to drive a visible LED.
Connect to the negative supply voltage.
DS22176A-page 7
RE46C146
CMOS Photoelectric Smoke Detector ASIC with
Intelligent IO and Timer Mode
Product Specification
R&E International
A Subsidiary of Microchip Technology Inc.
Typical Application
Figure 2
Notes:
1)
C3 is typical for an alkaline battery. This capacitance should be increased to 4.7uF or greater for a carbon battery. Place C3 as
close as possible to the device power pins.
© 2009 Microchip Technology Inc.
DS22176A-page 8
RE46C146
CMOS Photoelectric Smoke Detector ASIC with
Intelligent IO and Timer Mode
Product Specification
R&E International
A Subsidiary of Microchip Technology Inc.
CIRCUIT DESCRIPTION AND APPLICATION NOTES
Note: All timing references are nominal. See electrical characteristics for limits.
Standby Internal Timing – With the external components specified in the typical application figure for ROSC and
COSC the internal oscillator has a nominal period of 10mS. Normally the analog circuitry is powered down to
minimize standby current (typically 4uA at 9V). Once every 10 seconds the detection circuitry (normal gain) is
powered up for 10mS. Prior to completion of the 10mS period the IRED pulse is active for 100uS. At the
conclusion of this 10mS period the photo amplifier is compared to an internal reference to determine the chamber
status and latched. If a smoke condition is present the period to the next detection decreases and additional
checks are made. Three consecutive smoke detections will cause the device to go into alarm and the horn circuit
and interconnect will be active.
Once every 40 seconds the status of the battery voltage is checked. This status is checked and latched at the
conclusion of the LED pulse. In addition, once every 40 seconds the chamber is activated and using the high gain
mode (capacitor C1) a check of the chamber is made by amplifying background reflections. If either the low
battery or the photo chamber test fails the horn will chirp for 10mS every 40 seconds.
The oscillator period is determined by the values of R9, R12 and C5 (see typical application FIG 2). The oscillator
period T=TR+ TF where TR =.6931 * R12 * C5 and TF =.6931 * R9 * C5
Smoke Detection Circuitry – A comparator compares the photo amp output to an internal reference voltage. If the
required number of consecutive smoke conditions is met the device will go into local alarm and the horn will be
active. In local alarm the C2 gain is internally increased by ~10% to provide alarm hysteresis.
Push to Test Operation – If the TEST input pin is activated (Vih) then, after one internal clock cycle, the smoke
detection rate increases to once every 330mS. In this mode the high gain capacitor C1 is selected and
background reflections are used to simulate a smoke condition. After the required consecutive detections the
device will go into a local alarm condition. When the TEST input is deactivated (Vil) and after one clock cycle the
normal gain capacitor C1 is selected. The detection rate continues at once every 330mS until 3 consecutive no
smoke conditions are detected. At this point the device returns to standby timing.
LED Operation – In standby the LED is pulsed on for 10mS every 43 Seconds. In a local alarm condition or the
push to test alarm the LED pulse frequency is increased to once every .5 seconds. In the case of a remote alarm
the LED not active. In the timer mode of operation the LED is pulsed on for 10mS every 10 seconds.
Interconnect Operation – The bidirectional IO pin allows for interconnection of multiple detectors. In a local alarm
condition this pin is driven high immediately through a constant current source. Shorting this output to ground
during local alarm will not cause excessive current. The IO is ignored as an input during a local alarm.
The IO pin also has an NMOS discharge device that is active for 1.3 seconds after the conclusion of any type of
local alarm. This device helps to quickly discharge any capacitance associated with the interconnect line.
If a remote active high signal is detected the device goes into remote alarm and the horn will be active. Internal
protection circuitry allows for the signaling unit to have a higher supply voltage than the signaled unit without
excessive current draw.
In a remote alarm the intelligent interconnect circuitry will identify a DC smoke alarm signal and sound the smoke
alarm temporal horn pattern. If the IO input is pulsed high twice with a nominal pulse on time greater than 40mS
and within 3.7 seconds, a CO alarm condition is detected and the CO temporal horn pattern will sound. The CO
temporal pattern will sound at least two times if a remote CO alarm condition is detected.
© 2009 Microchip Technology Inc.
DS22176A-page 9
RE46C146
CMOS Photoelectric Smoke Detector ASIC with
Intelligent IO and Timer Mode
Product Specification
R&E International
A Subsidiary of Microchip Technology Inc.
Low Battery and Chamber Test – In standby an internal reference is compared to the voltage divided VDD supply.
Low battery status is latched at the conclusion of the LED pulse. The horn will chirp for 10ms every 43 seconds
until the low battery condition no longer exists. In standby a chamber test is also performed every 40 seconds by
switching to the high gain capacitor C1 and sensing the photo chamber background reflections. Two consecutive
chamber tests failures will also cause the horn to chirp for 10mS every 43 seconds. The low battery chirp occurs
next to the LED pulse and the failed chamber test chirp ~20 seconds later. The low battery and chamber tests are
not performed in a local or remote alarm condition.
Timer Mode – If resistors Radj1 and Radj2 are in place and a high to low transition occurs on the TEST input the
device enters a 10 minute timer mode. In this mode the smoke comparator reference is switched from the internal
VDD-3.5V reference to the voltage that appears on VSEN (pin 15). This allows the sensitivity to be modified for
the duration of the 10 minute timer period. The chamber test is not performed in the timer mode. If VSEN is left
unconnected or tied to VSS the timer mode of operation is inhibited.
Diagnostic Mode – In addition to the normal function of the TEST input a special diagnostic mode is available for
calibration and test of the smoke detector. Taking the TEST pin below VSS and sourcing ~300uA out of the pin
for 1 clock cycle will enable the diagnostic mode. In the diagnostic mode some of the pin functions are redefined.
Refer to the table below for redefined pin functions in the diagnostic mode. In addition in this mode STROBE is
always enabled and the IRED is pulsed at the clock rate of 10.5mS nominal.
Pin Name
IO
Pin Number
7
VSEN
15
FEED
10
COSC
HORNB
12
8
LED
11
Description
The IO pin (7) controls the gain capacitor used for the photo amplifier. If IO is low
then normal gain is selected. If IO is high then high gain is selected.
In diagnostic mode the output of the photo amplifier is gated to this pin and the pull
down device is disabled.
If VSEN (15) is low then taking this input high will enable hysteresis which is a
nominal 10% gain increase in normal gain mode.
If desired this pin can be driven by an external clock.
This pin becomes the smoke integrator output. A high level indicates that an alarm
condition has been detected.
The LED pin is used as a low battery indicator. For VDD above the low battery
threshold the open drain NMOS is off. If VDD falls below the threshold the NMOS
turns on.
© 2009 Microchip Technology Inc.
DS22176A-page 10
RE46C146
CMOS Photoelectric Smoke Detector ASIC with
Intelligent IO and Timer Mode
Product Specification
R&E International
A Subsidiary of Microchip Technology Inc.
Timing Diagrams
Standby, No Alarm (not to scale)
Oscillator
TPOSC
TPWOSC
Internal Clock
TON1
TPER1
STROBE
TON2
IRED
TPLED1
LED
Low Supply or Chamber Test Failure
LED
THON3
Low BatteryTest
Low BatteryWarning Chirp
Low Battery Warning Chirp
Horn
THOF3
Chamber Test and Warning is Offset from Low Battery Test and Warning by 21.5 Seconds
© 2009 Microchip Technology Inc.
DS22176A-page 11
RE46C146
CMOS Photoelectric Smoke Detector ASIC with
Intelligent IO and Timer Mode
Product Specification
R&E International
A Subsidiary of Microchip Technology Inc.
Timing Diagrams (continued)
Local Alarm Tim ing (not to scale)
TPER2
STROBE
IRED
TPLED2
LED
Sm oke Alarm Horn Tem poral Pattern (not to scale)
No Alarm
Local Alarm
THON1
No Alarm
THOF1
THOF2
Horn
TIODLY1
IO
CO Alarm Horn Tem poral Pattern (not to scale)
Remote CO Alarm
THON3
THOF4
THOF5
Horn
TIOPW 1
IO
TIOTO1
Notes:
1. Smoke is not sampled when the horn is active. Horn cycle is self completing in local alarm.
2. Low battery warning chirp is suppressed in local or remote alarm
3. IO Dump active only in local alarm, inactive if external alarm
© 2009 Microchip Technology Inc.
DS22176A-page 12
RE46C146
CMOS Photoelectric Smoke Detector ASIC with
Intelligent IO and Timer Mode
Product Specification
Information contained in this publication regarding device
applications and the like is provided only for your convenience and
may be superseded by updates. It is your responsibility to ensure
that your application meets with your specifications. MICROCHIP
MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY
KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL,
STATUTORY OR
OTHERWISE,
RELATED
TO
THE
INFORMATION, INCLUDING BUT NOT LIMITED TO ITS
CONDITION, QUALITY, PERFORMANCE, MERCHANTABILITY
OR FITNESS FOR PURPOSE. Microchip disclaims all liability
arising from this information and its use. Use of Microchip devices in
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and the buyer agrees to defend, indemnify and hold harmless
Microchip from any and all damages, claims, suits, or expenses
resulting from such use. No licenses are conveyed, implicitly or
otherwise, under any Microchip intellectual property rights.
R&E International
A Subsidiary of Microchip Technology Inc.
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© 2009 Microchip Technology Inc.
DS22176A-page 13