TI SN74AS1804N

SN74AS1804
HEX 2-INPUT NAND DRIVER
SDAS042C – AUGUST 1984 – REVISED JANUARY 1995
•
•
DW OR N PACKAGE
(TOP VIEW)
High Capacitive-Drive Capability
Typical Delay Time of 2.6 ns (CL = 50 pF)
and Typical Power Dissipation of Less
Than 9 mW Per Gate
Center VCC and GND Configuration
Provides Minimum Lead Inductance in
High-Current Switching Applications
Package Options Include Plastic
Small-Outline (DW) Packages and Standard
Plastic (N) 300-mil DIPs
•
•
description
5B
6Y
6A
6B
1
20
2
19
3
18
4
17
VCC
1A
1B
1Y
2A
2B
5
16
6
15
7
14
8
13
9
12
10
11
5A
5Y
4B
4A
4Y
GND
3Y
3B
3A
2Y
This device contains six independent 2-input
NAND drivers. It performs the Boolean functions
Y = A • B or Y = A + B in positive logic.
The center-pin configuration reduces lead inductance when compared to the ′AS804B. The reduced lead
inductance minimizes noise generated onto either the VCC or GND bus. This reduction is significant in
high-current switching applications.
The SN74AS1804 is characterized for operation from 0°C to 70°C.
FUNCTION TABLE
(each driver)
INPUTS
B
H
H
L
L
X
H
X
L
H
logic symbol†
1A
1B
2A
2B
3A
3B
4A
4B
5A
5B
6A
6B
6
OUTPUT
Y
A
logic diagram (positive logic)
&
8
7
9
1Y
1B
11
10
2Y
14
3Y
16
4Y
20
1
19
2
4A
4B
5Y
3
4
3A
3B
17
18
2A
2B
12
13
1A
5A
5B
6Y
6A
6B
6
7
9
10
12
13
17
18
20
8
11
14
16
19
1
3
4
2
1Y
2Y
3Y
4Y
5Y
6Y
† This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Copyright  1995, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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1
SN74AS1804
HEX 2-INPUT NAND DRIVER
SDAS042C – AUGUST 1984 – REVISED JANUARY 1995
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Input voltage, VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
Operating free-air temperature range, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65°C to 150°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
recommended operating conditions‡
VCC
VIH
Supply voltage
VIL
IOH
Low-level input voltage
High-level input voltage
MIN
NOM
MAX
4.5
5
5.5
2
V
V
High-level output current
IOL
Low-level output current
TA
Operating free-air temperature
‡ This high sink- or source-current device is not recommended for use above 40 MHz.
UNIT
0.8
V
– 48
mA
48
mA
70
°C
0
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
VIK
TEST CONDITIONS
MIN
VCC = 4.5 V,
VCC = 4.5 V to 5.5 V,
II = –18 mA
IOH = – 2 mA
VCC = 4
4.5
5V
IOH = – 3 mA
IOH = – 48 mA
VOL
II
VCC = 4.5 V,
VCC = 5.5 V,
IOL = 48 mA
VI = 7 V
IIH
IIL
IO¶
VCC = 5.5 V,
VCC = 5.5 V,
VI = 2.7 V
VI = 0.4 V
VCC = 5.5 V,
VCC = 5.5 V,
VO = 2.25 V
VI = 0
VCC = 5.5 V,
VI = 4.5 V
VOH
ICCH
ICCL
TYP§
VCC – 2
2.4
MAX
UNIT
–1.2
V
V
3.2
2
0.35
0.5
V
0.1
mA
20
µA
– 0.5
mA
– 200
mA
3.5
5
mA
16
27
– 50
mA
§ All typical values are at VCC = 5 V, TA = 25°C.
¶ The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, IOS.
switching characteristics (see Figure 1)
PARAMETER
tPLH
tPHL
FROM
(INPUT)
A or B
TO
(OUTPUT)
Y
VCC = 4.5 V to 5.5 V,
CL = 50 pF,
RL = 500 Ω,
TA = MIN to MAX#
MIN
MAX
1
4
1
4
# For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
2
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UNIT
ns
SN74AS1804
HEX 2-INPUT NAND DRIVER
SDAS042C – AUGUST 1984 – REVISED JANUARY 1995
PARAMETER MEASUREMENT INFORMATION
SERIES 54ALS/74ALS AND 54AS/74AS DEVICES
7V
RL = R1 = R2
VCC
S1
RL
R1
Test
Point
From Output
Under Test
CL
(see Note A)
From Output
Under Test
RL
Test
Point
From Output
Under Test
CL
(see Note A)
CL
(see Note A)
LOAD CIRCUIT FOR
BI-STATE
TOTEM-POLE OUTPUTS
LOAD CIRCUIT
FOR OPEN-COLLECTOR OUTPUTS
3.5 V
Timing
Input
Test
Point
LOAD CIRCUIT
FOR 3-STATE OUTPUTS
3.5 V
High-Level
Pulse
1.3 V
R2
1.3 V
1.3 V
0.3 V
0.3 V
Data
Input
tw
th
tsu
3.5 V
1.3 V
3.5 V
Low-Level
Pulse
1.3 V
0.3 V
1.3 V
0.3 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS
PULSE DURATIONS
3.5 V
Output
Control
(low-level
enabling)
1.3 V
1.3 V
0.3 V
tPZL
Waveform 1
S1 Closed
(see Note B)
tPLZ
[3.5 V
1.3 V
tPHZ
tPZH
Waveform 2
S1 Open
(see Note B)
1.3 V
VOL
0.3 V
VOH
1.3 V
0.3 V
[0 V
3.5 V
1.3 V
Input
1.3 V
0.3 V
tPHL
tPLH
VOH
In-Phase
Output
1.3 V
1.3 V
VOL
tPLH
tPHL
VOH
Out-of-Phase
Output
(see Note C)
1.3 V
1.3 V
VOL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. When measuring propagation delay items of 3-state outputs, switch S1 is open.
D. All input pulses have the following characteristics: PRR ≤ 1 MHz, tr = tf = 2 ns, duty cycle = 50%.
E. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuits and Voltage Waveforms
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3
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