INTERSIL HI1-0546-2

HI-546, HI-547, HI-548, HI-549
Data Sheet
Single 16 and 8, Differential 8-Channel
and 4-Channel CMOS Analog MUXs with
Active Overvoltage Protection
The HI-546, HI-547, HI-548 and HI-549 are analog
multiplexers with active overvoltage protection and
guaranteed rON matching. Analog input levels may greatly
exceed either power supply without damaging the device or
disturbing the signal path of other channels. Active
protection circuitry assures that signal fidelity is maintained
even under fault conditions that would destroy other
multiplexers.
Analog inputs can withstand constant 70VP-P levels with
±15V supplies. Digital inputs will also sustain continuous
faults up to 4V greater than either supply. In addition, signal
sources are protected from short circuiting should
multiplexer supply loss occur. Each input presents 1kΩ of
resistance under this condition. These features make the
HI-546, HI-547, HI-548 and HI-549 ideal for use in systems
where the analog inputs originate from external equipment
or separately powered circuitry. All devices are fabricated
with 44V Dielectrically Isolated CMOS technology. The
HI-546 is a single 16-Channel, the HI-547 is an 8-Channel
differential, the HI-548 is a single 8-Channel and the HI-549
is a 4-Channel differential device. If input overvoltage
protection is not needed the HI-506/507/508/509
multiplexers are recommended. For further information see
Application Notes AN520 and AN521.
For MIL-STD-883 compliant parts, request the HI-546/883,
HI-547/883, HI-548/883 and HI-549/883 datasheets.
1
June 1999
File Number
3150.2
Features
• Analog Overvoltage Protection. . . . . . . . . . . . . . . . . . 70VP-P
• No Channel Interaction During Overvoltage
• Guaranteed rON Matching
• Maximum Power Supply . . . . . . . . . . . . . . . . . . . . . . . 44V
• Break-Before-Make Switching
• Analog Signal Range . . . . . . . . . . . . . . . . . . . . . . . . ±15V
• Access Time (Typical) . . . . . . . . . . . . . . . . . . . . . . . 500ns
• Standby Power (Typical) . . . . . . . . . . . . . . . . . . . . . 7.5mW
Applications
• Data Acquisition
• Industrial Controls
• Telemetry
Ordering Information
PART NUMBER
TEMP.
RANGE (oC)
PACKAGE
PKG.
NO.
HI1-0546-5
0 to 75
28 Ld CERDIP
F28.6
HI1-0546-2
-55 to 125
28 Ld CERDIP
F28.6
HI3-0546-5
0 to 75
28 Ld PDIP
E28.6
HI4P0546-5
0 to 75
28 Ld PLCC
N28.45
HI9P0546-9
-40 to 85
28 Ld SOIC
M28.3
HI1-0547-5
0 to 75
28 Ld CERDIP
F28.6
HI3-0547-5
0 to 75
28 Ld PDIP
E28.6
HI4P0547-5
0 to 75
28 Ld PLCC
N28.45
HI9P0547-9
-40 to 85
28 Ld SOIC
M28.3
HI1-0548-2
-55 to 125
16 Ld CERDIP
F16.3
HI1-0548-5
0 to 75
16 Ld CERDIP
F16.3
HI3-0548-5
0 to 75
16 Ld PDIP
E16.3
HI4P0548-5
0 to 75
20 Ld PLCC
N20.35
HI9P0548-5
0 to 75
16 Ld SOIC
M16.15
HI9P0548-9
-40 to 85
16 Ld SOIC
M16.15
HI1-0549-2
-55 to 125
16 Ld CERDIP
F16.3
HI3-0549-5
0 to 75
16 Ld PDIP
E16.3
HI4P0549-5
0 to 75
20 Ld PLCC
N20.35
HI9P0549-5
0 to 75
16 Ld SOIC
M16.15
HI9P0549-9
-40 to 85
16 Ld SOIC
M16.15
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207 | Copyright © Intersil Corporation 1999
HI-546, HI-547, HI-548, HI-549
Pinouts
HI-546 (CERDIP, PDIP, SOIC)
TOP VIEW
HI-547 (CERDIP, PDIP, SOIC)
TOP VIEW
28 OUT A
+VSUPPLY 1
28 OUT
+VSUPPLY 1
NC 2
27 -VSUPPLY
27 -VSUPPLY
OUT B 2
NC 3
26 IN 8
NC 3
26 IN 8A
IN 16 4
25 IN 7
IN 8B 4
25 IN 7A
IN 15 5
24 IN 6
IN 7B 5
24 IN 6A
IN 14 6
23 IN 5
IN 6B 6
23 IN 5A
IN 13 7
22 IN 4
IN 5B 7
22 IN 4A
IN 12 8
21 IN 3
IN 4B 8
21 IN 3A
IN 11 9
20 IN 2
IN 3B 9
20 IN 2A
IN 10 10
19 IN 1
IN 2B 10
19 IN 1A
18 ENABLE
IN 1B 11
18 ENABLE
IN 9 11
GND 12
17 ADDRESS A0
GND 12
17 ADDRESS A0
VREF 13
16 ADDRESS A1
VREF 13
16 ADDRESS A1
ADDRESS A3 14
15 ADDRESS A2
NC 14
15 ADDRESS A2
NC
NC
+VSUPPLY
OUT
-VSUPPLY
IN 8
IN 8B
NC
OUT B
+VSUPPLY
OUT A
-VSUPPLY
IN 8A
HI-547 (PLCC)
TOP VIEW
IN 16
HI-546 (PLCC)
TOP VIEW
4
3
2
1
28
27
26
4
3
2
1
28
27
26
IN 4B 8
22 IN 4A
IN 11 9
21 IN 3
IN 3B 9
21 IN 3A
IN 10 10
20 IN 2
IN 2B 10
20 IN 2A
IN 9 11
19 IN 1
IN 1B 11
19 IN 1A
12
13
14
15
16
17
18
HI-548 (CERDIP, PDIP, SOIC)
TOP VIEW
12
13
14
15
16
17
18
ENABLE
22 IN 4
A0
IN 12 8
A1
23 IN 5A
A2
IN 5B 7
NC
23 IN 5
VREF
IN 13 7
GND
24 IN 6A
ENABLE
IN 6B 6
A0
24 IN 6
A1
IN 14 6
A2
25 IN 7A
A3
IN 7B 5
GND
25 IN 7
VREF
IN 15 5
HI-549 (CERDIP, PDIP, SOIC)
TOP VIEW
A0 1
16 A1
A0 1
ENABLE 2
15 A2
ENABLE 2
14 GND
-VSUPPLY 3
-VSUPPLY 3
16 A1
15 GND
14 +VSUPPLY
IN 1 4
13 +VSUPPLY
IN 1A 4
13 IN 1B
IN 2 5
12 IN 5
IN 2A 5
12 IN 2B
IN 3 6
11 IN 6
IN 3A 6
11 IN 3B
IN 4 7
10 IN 7
IN 4A 7
10 IN 4B
OUT 8
9 IN 8
OUT A 8
2
9 OUT B
HI-546, HI-547, HI-548, HI-549
Pinouts
(Continued)
10
11
12
13
A1
GND
20
19
18 +VSUPPLY
17 IN 1B
16 NC
NC 6
IN 2A 7
15 IN 2B
IN 3A 8
14 IN 3B
9
10
11
12
13
IN 4B
9
IN 7
14 IN 6
IN 8
IN 3 8
NC
15 IN 5
OUT
IN 2 7
IN 4
16 NC
1
IN 1A 5
17 +V
SUPPLY
NC 6
2
-VSUPPLY 4
18 GND
IN 1 5
3
OUT B
-VSUPPLY 4
NC
19
NC
20
A0
A2
1
OUT A
A1
2
ENABLE
NC
3
IN 4A
A0
HI-549 (PLCC)
TOP VIEW
ENABLE
HI-548 (PLCC)
TOP VIEW
TRUTH TABLE HI-547 (Continued)
TRUTH TABLE HI-546
A3
A2
A1
A0
EN
“ON” CHANNEL
A2
A1
A0
EN
“ON” CHANNEL PAIR
X
X
X
X
L
None
H
L
H
H
6
L
L
L
L
H
1
H
H
L
H
7
L
L
L
H
H
2
H
H
H
H
8
L
L
H
L
H
3
L
L
H
H
H
4
L
H
L
L
H
5
L
H
L
H
H
6
L
H
H
L
H
7
L
H
H
H
H
8
H
L
L
L
H
9
H
L
L
H
H
10
H
L
H
L
H
11
H
L
H
H
H
12
H
H
L
L
H
13
H
H
L
H
H
14
H
H
H
L
H
15
H
H
H
H
H
16
TRUTH TABLE HI-547
A2
A1
A0
EN
“ON” CHANNEL PAIR
X
X
X
L
None
L
L
L
H
1
L
L
H
H
2
L
H
L
H
3
L
H
H
H
4
H
L
L
H
5
3
TRUTH TABLE HI-548
A2
A1
A0
EN
“ON” CHANNEL
X
X
X
L
None
L
L
L
H
1
L
L
H
H
2
L
H
L
H
3
L
H
H
H
4
H
L
L
H
5
H
L
H
H
6
H
H
L
H
7
H
H
H
H
8
TRUTH TABLE HI-549
A1
A0
EN
“ON” CHANNEL PAIR
X
X
L
None
L
L
H
1
L
H
H
2
H
L
H
3
H
H
H
4
HI-546, HI-547, HI-548, HI-549
Functional Diagrams
HI-546
HI-547
OUT
1K
IN 1
OUT
A
1K
IN 1A
1K
1K
IN 2
OUT
B
IN 8A
1K
DECODER/
DRIVER
IN 1B
1K
1K
DECODER/
DRIVER
IN 8B
IN 16
OVERVOLTAGE
CLAMP AND
SIGNAL
ISOLATION
5V
REF
OVERVOLTAGE
CLAMP AND
SIGNAL
ISOLATION
LEVEL
SHIFT
† DIGITAL INPUT
5V
REF
LEVEL
SHIFT
† DIGITAL INPUT
† † † † †
†
†
†
†
VREF A0
A1
A2
EN
PROTECTION
PROTECTION
VREF A0 A1 A2 A3 EN
HI-548
HI-549
OUT
1K
OUT
A
1K
IN 1A
IN 1
1K
1K
OUT
B
IN 4A
IN 2
1K
DECODER/
DRIVER
IN 1B
1K
1K
DECODER/
DRIVER
IN 4B
IN 8
OVERVOLTAGE
CLAMP AND
SIGNAL
ISOLATION
5V
REF
OVERVOLTAGE
CLAMP AND
SIGNAL
ISOLATION
LEVEL
SHIFT
† DIGITAL INPUT
†
†
†
†
† DIGITAL INPUT
5V
REF
LEVEL
SHIFT
†
†
†
A0
A1
EN
PROTECTION
PROTECTION
A0
4
A1
A2 EN
HI-546, HI-547, HI-548, HI-549
Schematic Diagrams
ADDRESS DECODER
V+
P
P
P
P
A0 OR A0
A1 OR A1
P
P
P
N
N
N
N
N
A2 OR A2
TO P-CHANNEL
DEVICE OF
THE SWITCH
TO N-CHANNEL
DEVICE OF
THE SWITCH
N
A3 OR A3
N
ENABLE
DELETE A3 OR A3 INPUT FOR HI-547, HI-548, HI-549
DELETE A2 OR A2 INPUT FOR HI-549
V-
MULTIPLEX SWITCH
FROM
DECODE
OVERVOLTAGE PROTECTION
N
V+
P
R11
1K
D6
Q5
D7
D4
D5
N
IN
N
Q6
V-
P
FROM
DECODE
5
OUT
HI-546, HI-547, HI-548, HI-549
Schematic Diagrams
(Continued)
ADDRESS INPUT BUFFER AND LEVEL SHIFTER
TTL REFERENCE
CIRCUIT
V+
R10
R9
Q1
VREF
Q4
D3
GND
LEVEL SHIFTER
V+
OVERVOLTAGE
PROTECTION
P
P
P
N
R2
P
P
P
P
R5
V+
D1
LEVEL
SHIFTED
ADDRESS
TO
DECODE
N
N
N
N
R8
N
N
N
V-
GND
ADD
IN
6
P
R7
R6
N
P
R4
R3
D2
R1
200
Ω
P
V-
N
HI-546, HI-547, HI-548, HI-549
Absolute Maximum Ratings
Thermal Information
V+ to V- . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +44V
V+ to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +22V
V- to GND. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -25V
Digital Input Voltage (VEN , VA) . . . . . . . . . . . . . (V-) -4V to (V+) +4V
Analog Signal (VIN, VOUT). . . . . . . . . . . . . . . (V-) -20V to (V+) +20V
or 20mA, Whichever Occurs First
Continuous Current, IN or OUT . . . . . . . . . . . . . . . . . . . . . . . . 20mA
Peak Current, IN or OUT (Pulsed 1ms, 10% Duty Cycle Max) . . 40mA
Thermal Resistance (Typical, Note 1)
θJA (oC/W) θJC (oC/W)
16 Ld CERDIP Package . . . . . . . . . . .
85
32
28 Ld CERDIP Package . . . . . . . . . . .
55
18
28 Ld PDIP Package . . . . . . . . . . . . .
60
N/A
16 Ld PDIP Package . . . . . . . . . . . . .
90
N/A
28 Ld PLCC Package . . . . . . . . . . . . .
70
N/A
20 Ld PLCC Package . . . . . . . . . . . . .
80
N/A
28 Ld SOIC Package . . . . . . . . . . . . .
75
N/A
16 Ld SOIC Package . . . . . . . . . . . . .
105
N/A
Maximum Junction Temperature
Ceramic Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .175oC
Plastic Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .150oC
Maximum Storage Temperature Range . . . . . . . . . . -65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300oC
(PLCC, SOIC - Lead Tips Only)
Operating Conditions
Temperature Ranges
HI-546/548/549-2 . . . . . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC
HI-546/547/548/549-5 . . . . . . . . . . . . . . . . . . . . . . . 0oC to 75oC
HI-546/547/548/549-9 . . . . . . . . . . . . . . . . . . . . . . -40oC to 85oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θJA is measured with the component mounted on an evaluation PC board in free air.
Electrical Specifications
Supplies = +15V, -15V; VREF Pin = Open; VAH (Logic Level High) = 4V; VAL (Logic Level Low) = 0.8V; Unless
Otherwise Specified. For Test Conditions, Consult Test Circuits Section
TEST
CONDITIONS
-2
-5, -9
TEMP
(oC)
MIN
TYP
MAX
MIN
TYP
MAX
UNITS
25
-
0.5
-
-
0.5
-
µs
Full
-
-
1.0
-
-
1.0
µs
Break-Before Make Delay, tOPEN
25
25
80
-
25
80
-
ns
Enable Delay (ON), tON(EN)
25
-
300
500
-
300
-
ns
Full
-
-
1000
-
-
1000
ns
25
-
300
500
-
300
-
ns
PARAMETER
SWITCHING CHARACTERISTICS
Access Time, tA
Enable Delay (OFF), tOFF(EN)
Full
-
-
1000
-
-
1000
ns
To 0.1%
25
-
1.2
-
-
1.2
-
µs
To 0.01%
25
-
3.5
-
-
3.5
-
µs
Note 6
25
50
68
-
50
68
-
dB
25
-
10
-
-
10
-
pF
HI-546
25
-
52
-
-
52
-
pF
HI-547
25
-
30
-
-
30
-
pF
HI-548
25
-
25
-
-
25
-
pF
HI-549
25
-
12
-
-
12
-
pF
25
-
0.1
-
-
0.1
-
pF
Input Low Threshold, TTL Drive, VAL
Full
-
-
0.8
-
-
0.8
V
Input High Threshold, VAH (Note 8)
Full
4.0
-
-
4.0
-
-
V
Settling Time
Off Isolation
Channel Input Capacitance, CS(OFF)
Channel Output Capacitance CD(OFF)
Input to Output Capacitance, CDS(OFF)
DIGITAL INPUT CHARACTERISTICS
MOS Drive, VAL (HI-546/547 Only)
VREF = 10V
25
-
-
0.8
-
-
0.8
V
MOS Drive, VAH (HI-546/547 Only)
VREF = 10V
25
6.0
-
-
6.0
-
-
V
Input Leakage Current (High or Low), IA
Note 5
Full
-
-
1.0
-
-
1.0
µA
7
HI-546, HI-547, HI-548, HI-549
Electrical Specifications
Supplies = +15V, -15V; VREF Pin = Open; VAH (Logic Level High) = 4V; VAL (Logic Level Low) = 0.8V; Unless
Otherwise Specified. For Test Conditions, Consult Test Circuits Section (Continued)
TEST
CONDITIONS
PARAMETER
-2
-5, -9
TEMP
(oC)
MIN
TYP
MAX
MIN
TYP
MAX
UNITS
Full
-15
-
+15
-15
-
+15
V
25
-
1.2
1.5
-
1.5
1.8
kΩ
Full
-
1.5
1.8
-
1.8
2.0
kΩ
25
-
-
7.0
-
-
7.0
%
25
-
0.03
-
-
0.03
-
nA
Full
-
-
50
-
-
50
nA
ANALOG CHANNEL CHARACTERISTICS
Analog Signal Range, VIN
On Resistance, rON
Note 2
∆rON , (Any Two Channels)
Off Input Leakage Current, IS(OFF)
Off Output Leakage Current, ID(OFF)
Note 3
25
-
0.1
-
-
0.1
-
nA
HI-546
Full
-
-
300
-
-
300
nA
HI-547
Full
-
-
200
-
-
200
nA
HI-548
Full
-
-
200
-
-
200
nA
HI-549
Full
-
-
100
-
-
100
nA
25
-
4.0
-
-
4.0
-
nA
Full
-
-
2.0
-
-
-
µA
25
-
0.1
-
-
0.1
-
nA
HI-546
Full
-
-
300
-
-
300
nA
HI-547
Full
-
-
200
-
-
200
nA
HI-548
Full
-
-
200
-
-
200
nA
HI-549
Full
-
-
100
-
-
100
nA
Full
-
-
50
-
-
50
nA
Full
-
7.5
-
-
7.5
-
mW
ID(OFF) With Input Overvoltage Applied
On Channel Leakage Current, ID(ON)
Note 3
Note 4
Note 3
Differential Off Output Leakage Current
IDIFF (HI-547, HI-549 Only)
POWER SUPPLY CHARACTERISTICS
Power Dissipation, PD
Current, I+
Note 7
Full
-
0.5
2.0
-
0.5
2.0
mA
Current, I-
Note 7
Full
-
0.02
1.0
-
0.02
1.0
mA
NOTES:
±
2. VOUT = ±10V, IOUT =
100µA.
3. 10nA is the practical lower limit for high speed measurement in the production test environments.
4. Analog Overvoltage = ±33V.
5. Digital input leakage is primarily due to the clamp diodes (see Schematic). Typical leakage is less than 1nA at 25oC.
6. VEN = 0.8V, RL = 1K, CL = 15pF, VS = 7VRMS , f = 100kHz.
7. VEN , VA = 0V or 4V.
8. To drive from DTL/TTLCircuits, 1kΩ pull-up resistors to +5V supply are recommended.
8
HI-546, HI-547, HI-548, HI-549
Test Circuits and Waveforms
TA = 25oC, VSUPPLY = ±15V, VAH = 4V, VAL = 0.8V, VREF = Open, Unless Otherwise Specified
100µA
V2
IN
OUT
VIN
rON =
V2
100µA
FIGURE 1A. ON RESISTANCE TEST CIRCUIT
1.4
1.2
1.1
25oC
1.0
-55oC
0.9
0.8
0.7
0.6
-10
1.5
1.4
1.3
1.2
1.1
1.0
0.9
0.8
-8
-6
-4
-2
0
2
4
6
8
10
5
ANALOG INPUT (V)
6
7
8
9
10
11
12
13
14
SUPPLY VOLTAGE (±V)
FIGURE 1B. ON RESISTANCE vs ANALOG INPUT VOLTAGE
FIGURE 1C. NORMALIZED ON RESISTANCE vs SUPPLY
VOLTAGE
FIGURE 1. ON RESISTANCE
100nA
LEAKAGE CURRENT
10nA
ON LEAKAGE
CURRENT
ID(ON)
OFF OUTPUT
CURRENT
ID(OFF)
+0.8V
EN
OUT
1nA
A
±10V
ID(OFF)
±
ON RESISTANCE (kΩ)
NORMALIZED ON RESISTANCE
(REFERRED TO VALUE AT ±15V)
125oC
1.3
10V
OFF INPUT
LEAKAGE CURRENT
IS(OFF)
100pA
10pA
25
50
75
100
TEMPERATURE (oC)
125
FIGURE 2A. LEAKAGE CURRENT vs TEMPERATURE
9
FIGURE 2B. ID(OFF) TEST CIRCUIT (NOTE 9)
15
HI-546, HI-547, HI-548, HI-549
Test Circuits and Waveforms
TA = 25oC, VSUPPLY = ±15V, VAH = 4V, VAL = 0.8V, VREF = Open, Unless Otherwise Specified (Continued)
OUT
OUT
IS(OFF)
A
+0.8V
A
EN
±
±10V
ID(ON)
EN
10V
±10V
10V
±
4V
FIGURE 2C. IS(OFF) TEST CIRCUIT (NOTE 9)
FIGURE 2D. ID(ON) TEST CIRCUIT (NOTE 9)
NOTE:
10V. (Two measurements per device for ID(OFF): ±10V and
±
9. Two measurements per channel: ±10V and
10V.)
±
FIGURE 2. LEAKAGE CURRENTS
ANALOG INPUT
CURRENT (IIN)
15
5
12
4
9
3
6
2
OUTPUT OFF LEAKAGE
CURRENT ID(OFF)
3
1
0
0
15
18
21
24
27
30
33
ANALOG INPUT OVERVOLTAGE (±V)
OUTPUT OFF LEAKAGE CURRENT (nA)
ANALOG INPUT CURRENT (mA)
18
A
IIN
A
ID(OFF)
±VIN
36
FIGURE 3A. ANALOG INPUT CURRENT AND OUTPUT OFF
LEAKAGE CURRENT vs ANALOG INPUT
OVER-VOLTAGE
FIGURE 3B. TEST CIRCUIT
FIGURE 3. ANALOG INPUT OVERVOLTAGE CHARACTERISTICS
±14
-55oC
25oC
SWITCH CURRENT (mA)
±12
±10
125oC
±8
±6
±VIN
±4
A
±2
0
0
2
4
6
8
10
12
VOLTAGE ACROSS SWITCH (±V)
14
FIGURE 4A. ON CHANNEL CURRENT vs VOLTAGE
FIGURE 4. ON CHANNEL CURRENT
10
FIGURE 4B. TEST CIRCUIT
HI-546, HI-547, HI-548, HI-549
Test Circuits and Waveforms
TA = 25oC, VSUPPLY = ±15V, VAH = 4V, VAL = 0.8V, VREF = Open, Unless Otherwise Specified (Continued)
8
6
V+
IN 1
A3
VSUPPLY = ± 10V
2
A1
IN 2
THRU
IN 15
A0
IN 16
EN
+4V
GND
±
50Ω
VA
±10V/±5V
HI-546 †
A2
VSUPPLY = ± 15V
4
+15V/+10V
+ISUPPLY
10V/ 5V
OUT
V10MΩ
A
0
1K
10K
100K
1M
10M
TOGGLE FREQUENCY (Hz)
±
SUPPLY CURRENT (mA)
A
14pF
-ISUPPLY
-15V/-10V
† Similar connection for HI-547/HI-548/HI-549.
FIGURE 5A. SUPPLY CURRENT vs TOGGLE FREQUENCY
FIGURE 5B. TEST CIRCUIT
FIGURE 5. DYNAMIC SUPPLY CURRENT
+15V
900
ACCESS TIME (ns)
VREF
A3
700
A2
50Ω
VA
600
A1
V+
IN 1
±10V
IN 2 THRU
IN 15
HI-546 †
A0
IN 16
±
VREF = OPEN FOR LOGIC HIGH LEVEL < 6V
VREF = LOGIC HIGH FOR LOGIC HIGH LEVELS > 6V
800
10V
500
EN
+4V
GND
OUT
V-
400
10kΩ
300
3
4
5
6
7
8
9 10 11
LOGIC LEVEL (HIGH) (V)
12
13
14
-15V
15
† Similar connection for HI-547/HI-548/HI-549.
FIGURE 6A. ACCESS TIME vs LOGIC LEVEL (HIGH)
VAH = 4.0V
FIGURE 6B. TEST CIRCUIT
VA INPUT
2V/DIV.
ADDRESS
DRIVE (VA)
50%
0V
S1 ON
+10V
OUTPUT
10%
OUTPUT
5V/DIV.
-10V
S16 ON
tA
200ns/DIV.
FIGURE 6C. MEASUREMENT POINTS
FIGURE 6D. WAVEFORMS
FIGURE 6. ACCESS TIME
11
50pF
HI-546, HI-547, HI-548, HI-549
Test Circuits and Waveforms
A3
TA = 25oC, VSUPPLY = ±15V, VAH = 4V, VAL = 0.8V, VREF = Open, Unless Otherwise Specified (Continued)
HI-546 †
A2
+5V
VAH = 4V
IN 1
IN 2 THRU
50Ω
VA
+4V
A1
IN 15
A0
IN 16
EN
OUT
GND
ADDRESS
DRIVE (VA)
0V
VOUT
OUTPUT
50pF
1kΩ
50%
50%
tOPEN
† Similar connection for HI-547/HI-548/HI-549
FIGURE 7A. TEST CIRCUIT
FIGURE 7B. MEASUREMENT POINTS
VA INPUT
2V/DIV.
S16 ON
S1 ON
OUTPUT
0.5V/DIV.
100ns/DIV.
FIGURE 7C. WAVEFORMS
FIGURE 7. BREAK-BEFORE-MAKE DELAY
A3
HI-546 †
A2
A1
IN 1
+10V
IN 2 THRU
IN16
ENABLE DRIVE
(VA)
0V
VOUT
90%
OUT
EN
50Ω
50%
50%
A0
VA
VAH = 4V
GND
1kΩ
OUTPUT
50pF
10%
0V
t ON(EN)
† Similar connection for HI-547/HI-548/HI-549
FIGURE 8A. TEST CIRCUIT
12
t OFF(EN)
FIGURE 8B. MEASUREMENT POINTS
HI-546, HI-547, HI-548, HI-549
Test Circuits and Waveforms
TA = 25oC, VSUPPLY = ±15V, VAH = 4V, VAL = 0.8V, VREF = Open, Unless Otherwise Specified (Continued)
ENABLE
DRIVE
2V/DIV.
DISABLED
OUTPUT
2V/DIV.
ENABLED (S1 ON)
100ns/DIV.
FIGURE 8C. WAVEFORMS
FIGURE 8. ENABLE DELAYS
13
HI-546, HI-547, HI-548, HI-549
Die Characteristics
DIE DIMENSIONS:
PASSIVATION:
83.9 mils x 159 mils
Type: Nitride Over Silox
Nitride Thickness: 3.5kÅ ±1kÅ
Silox Thickness: 12kÅ ±2kÅ
METALLIZATION:
Type: CuAl
Thickness: 16kÅ ±2kÅ
WORST CASE CURRENT DENSITY:
1.4 x 105 A/cm2
SUBSTRATE POTENTIAL (NOTE):
TRANSISTOR COUNT:
-VSUPPLY
485
PROCESS:
CMOS-DI
NOTE: The substrate appears resistive to the -VSUPPLY terminal, therefore it may be left floating (Insulating Die Mount) or it may be mounted on a
conductor at -VSUPPLY potential.
Metallization Mask Layouts
HI-546
EN
(18)
A0
(17)
A1 A2
(16) (15)
HI-547
A3 VREF
(14) (13)
EN
(18)
GND
(12)
A0
(17)
A1 A2
(16) (15)
NC VREF
(14) (13)
GND
(12)
IN 1B
(11)
IN 2B
(10)
IN 1
(19)
IN 9
(11)
IN 1A
(19)
IN 2
(20)
IN 10
(10)
IN 2A
(20)
IN 3
(21)
IN 11
(9)
IN 3A
(21)
IN 3B
(9)
IN 4
(22)
IN 12
(8)
IN 4A
(22)
IN 4B
(8)
IN 5
(23)
IN 6
(24)
IN 13
(7)
IN 14
(6)
IN 5A
(23)
IN 6A
(24)
IN 5B
(7)
IN 6B
(6)
IN 7
(25)
IN 15
(5)
IN 7A
(25)
IN 7B
(5)
IN 8
(26)
IN 16
(4)
IN 8A
(26)
IN 8B
(4)
V- (27)
OUT (28)
+V (1)
14
NC (2)
V- (27)
OUT A (28)
+V (1)
OUT B(2)
HI-546, HI-547, HI-548, HI-549
Die Characteristics
DIE DIMENSIONS:
PASSIVATION:
83 mils x 108 mils
Type: Nitride Over Silox
Nitride Thickness: 3.5kÅ ±1kÅ
Silox Thickness: 12kÅ ±2kÅ
METALLIZATION:
Type: CuAl
Thickness: 16kÅ ±2kÅ
WORST CASE CURRENT DENSITY:
1.4 x 105 A/cm
SUBSTRATE POTENTIAL (NOTE):
TRANSISTOR COUNT:
-VSUPPLY
253
PROCESS:
CMOS-DI
NOTE: The substrate appears resistive to the -VSUPPLY terminal, therefore it may be left floating (Insulating Die Mount) or it may be mounted on a
conductor at -VSUPPLY potential.
Metallization Mask Layouts
HI-548
IN 6
(11)
IN 7 IN 8
(10) (9)
HI-549
OUT
(8)
IN 4 IN 3
(7)
(6)
IN 3B IN 4B OUT B
(11) (10)
(9)
OUT A
(8)
IN 4A IN 3A
(7)
(6)
IN 5
(12)
IN 2
(5)
IN 2B
(12)
IN 2A
(5)
+V
(13)
GND
(14)
IN 1
(4)
-V
(3)
IN 1B
(13)
+V
(14)
IN 1A
(4)
-V
(3)
A2
(15)
A1
(16)
A0
(1)
EN
(2)
GND
(15)
A1
(16)
A0
(1)
EN
(2)
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
15