DISCRETE SEMICONDUCTORS DATA SHEET M3D744 PBSS5240V 40 V low VCEsat PNP transistor Product data sheet 2003 Jan 30 NXP Semiconductors Product data sheet 40 V low VCEsat PNP transistor PBSS5240V FEATURES QUICK REFERENCE DATA • Low collector-emitter saturation voltage VCEsat SYMBOL • High collector current capability IC and ICM VCEO collector-emitter voltage −40 V IC collector current (DC) −1.8 A • High efficiency leading to reduced heat generation ICRP peak collector current −2 A • Reduced printed-circuit board area requirements. RCEsat equivalent on-resistance <250 mΩ • High collector current gain (hFE) at high IC PARAMETER MAX. UNIT PINNING APPLICATIONS • Power management: PIN DESCRIPTION – DC-DC converter 1 collector – Supply line switching 2 collector – Battery charger 3 base – LCD back lighting. 4 emitter 5 collector 6 collector • Peripheral driver: – Driver in low supply voltage applications (e.g. lamps, LEDs) – Inductive load drivers (e.g. relay, buzzers and motors). handbook, halfpage 6 5 4 1, 2, 5, 6 DESCRIPTION 3 PNP transistor providing low VCEsat and high current capability in a SOT666 plastic package. NPN complement: PBSS4240V. 4 1 MARKING TYPE NUMBER PBSS5240V 2003 Jan 30 Top view MARKING CODE 2 3 MAM446 Fig.1 Simplified outline (SOT666) and symbol. 52 2 NXP Semiconductors Product data sheet 40 V low VCEsat PNP transistor PBSS5240V LIMITING VALUES In accordance with the Absolute Maximum Rating System (IEC 60134). SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT VCBO collector-base voltage open emitter − −40 V VCEO collector-emitter voltage open base − −40 V VEBO emitter-base voltage open collector − −5 V IC collector current (DC) note 1 − −1.8 A ICRP peak repetitive collector current note 2 − −2 A ICM peak collector current − −3 A IB base current (DC) − −300 mA IBM peak base current − −1 A Ptot total power dissipation Tamb ≤ 25 °C; note 3 − 300 mW Tamb ≤ 25 °C; note 4 − 500 mW Tamb ≤ 25 °C; note 1 − 900 mW Tamb ≤ 25 °C; notes 2 and 3 − 1.2 W Tstg storage temperature −65 +150 °C Tj junction temperature − 150 °C Tamb operating ambient temperature −65 +150 °C Notes 1. Device mounted on a ceramic circuit board, Al2O3, standard footprint. 2. Operated under pulsed conditions: duty cycle δ ≤ 20%, pulse width tp ≤ 30 ms. 3. Device mounted on a printed-circuit board, single-sided copper, tinplated, standard footprint. 4. Device mounted on a printed-circuit board, single-sided copper, tinplated, mounting pad for collector 1 cm2. THERMAL CHARACTERISTICS SYMBOL Rth j-a PARAMETER thermal resistance from junction to ambient CONDITIONS VALUE UNIT note 1 410 K/W note 2 215 K/W note 3 140 K/W notes 1 and 4 110 K/W Notes 1. Device mounted on a printed-circuit board, single-sided copper, tinplated, standard footprint. 2. Device mounted on a printed-circuit board, single-sided copper, tinplated, mounting pad for collector 1 cm2. 3. Device mounted on a ceramic circuit board, Al2O3, standard footprint. 4. Operated under pulsed conditions: duty cycle δ ≤ 20%, pulse width tp ≤ 30 ms. Soldering The only recommended soldering method is reflow soldering. 2003 Jan 30 3 NXP Semiconductors Product data sheet 40 V low VCEsat PNP transistor PBSS5240V CHARACTERISTICS Tamb = 25 °C unless otherwise specified. SYMBOL ICBO PARAMETER collector-base cut-off current CONDITIONS MIN. TYP. MAX. UNIT VCB = −40 V; IE = 0 − − −100 nA VCB = −40 V; IE = 0; Tamb = 150 °C − − −50 μA ICEO collector-emitter cut-off current VCE = −30 V; IB = 0 − − −100 nA IEBO emitter-base cut-off current VEB = −5 V; IC = 0 − − −100 nA hFE DC current gain VCE = −5 V; IC = −1 mA 300 − − VCE = −5 V; IC = −100 mA 300 − 800 VCE = −5 V; IC = −500 mA 250 − − VCE = −5 V; IC = −1 A 160 − − VCE = −5 V; IC = −2 A; note 1 50 − − IC = −100 mA; IB = −1 mA − −80 −120 mV IC = −500 mA; IB = −50 mA − −100 −145 mV IC = −1 A; IB = −100 mA; note 1 − −180 −250 mV IC = −2 A; IB = −200 mA − −370 −530 mV VCEsat collector-emitter saturation voltage RCEsat equivalent on-resistance IC = −1 A; IB = −100 mA; note 1 − 180 <250 mΩ VBEsat base-emitter saturation voltage IC = −1 A; IB = −100 mA − − −1.1 V VBEon base-emitter turn-on voltage VCE = −5 V; IC = −1 A − − −1 V fT transition frequency IC = −50 mA; VCE = −10 V; f = 100 MHz 150 − − MHz Cc collector capacitance VCB = −10 V; IE = Ie = 0; f = 1 MHz − − 12 pF Note 1. Pulse test: tp ≤ 300 μs; δ ≤ 0.02. 2003 Jan 30 4 NXP Semiconductors Product data sheet 40 V low VCEsat PNP transistor PBSS5240V MHC464 1000 MHC465 −1.2 handbook, halfpage handbook, halfpage hFE VBE (V) 800 (1) (1) −0.8 (2) 600 (3) (2) 400 −0.4 (3) 200 0 −10−1 −1 −10 −102 0 −10−1 −103 −104 IC (mA) −1 VCE = −5 V. (1) Tamb = 150 °C. (2) Tamb = 25 °C. VCE = −5 V. (1) Tamb = −55 °C. (2) Tamb = 25 °C. (3) Tamb = −55 °C. (3) Tamb = 150 °C. Fig.2 Fig.3 DC current gain as a function of collector current; typical values. MHC466 −103 handbook, halfpage −10 −102 −103 −104 IC (mA) Base-emitter voltage as a function of collector current; typical values. MHC467 −1.2 handbook, halfpage VBEsat (V) VCEsat (mV) −1 −102 (1) −0.8 (1) (2) (2) −0.6 (3) −10 (3) −0.4 −1 −10−1 −1 −10 −102 −0.2 −10−1 −103 −104 IC (mA) IC/IB = 20. −1 (1) Tamb = 150 °C. (2) Tamb = 25 °C. (3) Tamb = −55 °C. IC/IB = 20. (1) Tamb = −55 °C. (2) Tamb = 25 °C. (3) Tamb = 150 °C. Fig.4 Fig.5 Collector-emitter saturation voltage as a function of collector current; typical values. 2003 Jan 30 5 −10 −102 −103 −104 IC (mA) Base-emitter saturation voltage as a function of collector current; typical values. NXP Semiconductors Product data sheet 40 V low VCEsat PNP transistor PBSS5240V MHC468 −1.2 MHC469 −2.4 IC (A) −2 handbook, halfpage handbook, halfpage IC (A) (4) (3) −0.8 (2) (1) (1) (2) (3) (4) (5) −1.6 (5) (6) (7) (8) (6) (7) −1.2 (9) (8) −0.4 −0.8 (9) (10) 0 −0.4 0 −0.8 −1.2 −0.4 0 −1.4 −2 VCE (V) (5) IB = −4.2 mA. (6) IB = −3.5 mA. (7) IB = −2.8 mA. (8) IB = −2.1 mA. (9) IB = −1.4 mA. (10) IB = −0.7 mA. (1) (2) (3) (4) Collector current as a function of collector-emitter voltage; typical values. RCEsat (Ω) 102 10 (1) (2) 1 (3) −1 −10 −102 −103 −104 IC (mA) IC/IB = 20. (1) Tamb = 150 °C. Fig.8 (2) Tamb = 25 °C. (3) Tamb = −55 °C. Collector-emitter equivalent on-resistance as a function of collector current; typical values. 2003 Jan 30 IB = −50 mA. IB = −45 mA. IB = −40 mA. IB = −35 mA. Fig.7 MHC470 103 handbook, halfpage 10−1 −10−1 −0.8 −1.2 −1.6 −2 VCE (V) Tamb = 25 °C. IB = −7 mA. IB = −6.3 mA. IB = −5.6 mA. IB = −4.9 mA. Fig.6 −0.4 0 Tamb = 25 °C. (1) (2) (3) (4) (10) 6 (5) IB = −30 mA. (6) IB = −25 mA. (7) IB = −20 mA. (8) IB = −15 mA. (9) IB = −10 mA. (10) IB = −5 mA. Collector current as a function of collector-emitter voltage; typical values. NXP Semiconductors Product data sheet 40 V low VCEsat PNP transistor PBSS5240V PACKAGE OUTLINE Plastic surface mounted package; 6 leads SOT666 D E A X Y S S HE 6 5 4 pin 1 index A 1 2 e1 c 3 bp w M A Lp e detail X 0 1 2 mm scale DIMENSIONS (mm are the original dimensions) UNIT A bp c D E e e1 HE Lp w y mm 0.6 0.5 0.27 0.17 0.18 0.08 1.7 1.5 1.3 1.1 1.0 0.5 1.7 1.5 0.3 0.1 0.1 0.1 OUTLINE VERSION REFERENCES IEC JEDEC EIAJ ISSUE DATE 01-01-04 01-08-27 SOT666 2003 Jan 30 EUROPEAN PROJECTION 7 NXP Semiconductors Product data sheet 40 V low VCEsat PNP transistor PBSS5240V DATA SHEET STATUS DOCUMENT STATUS(1) PRODUCT STATUS(2) DEFINITION Objective data sheet Development This document contains data from the objective specification for product development. Preliminary data sheet Qualification This document contains data from the preliminary specification. Product data sheet Production This document contains the product specification. Notes 1. Please consult the most recently issued document before initiating or completing a design. 2. The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. DISCLAIMERS above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. General ⎯ Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. 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Export might require a prior authorization from national authorities. Quick reference data ⎯ The Quick reference data is an extract of the product data given in the Limiting values and Characteristics sections of this document, and as such is not complete, exhaustive or legally binding. Applications ⎯ Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Limiting values ⎯ Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions 2003 Jan 30 8 NXP Semiconductors Customer notification This data sheet was changed to reflect the new company name NXP Semiconductors. No changes were made to the content, except for the legal definitions and disclaimers. Contact information For additional information please visit: http://www.nxp.com For sales offices addresses send e-mail to: [email protected] © NXP B.V. 2009 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights. Printed in The Netherlands 613514/01/pp9 Date of release: 2003 Jan 30 Document order number: 9397 750 10781