MC74AC273 D

MC74AC273, MC74ACT273
Octal D Flip-Flop
The MC74AC273/74ACT273 has eight edge-triggered D−type
flip−flops with individual D inputs and Q outputs. The common
buffered Clock (CP) and Master Reset (MR) inputs load and reset
(clear) all flip−flops simultaneously.
The register is fully edge-triggered. The state of each D input, one
setup time before the LOW−to−HIGH clock transition, is transferred
to the corresponding flip−flop’s Q output.
All outputs will be forced LOW independently of Clock or Data
inputs by a LOW voltage level on the MR input. The device is useful
for applications where the true output only is required and the Clock
and Master Reset are common to all storage elements.
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SOIC−20WB
SUFFIX DW
CASE 751D
20
1
Features
•
•
•
•
•
•
•
•
•
•
Ideal Buffer for MOS Microprocessor or Memory
Eight Edge-Triggered D Flip−Flops
Buffered Common Clock
Buffered, Asynchronous Master Reset
See MC74AC377 for Clock Enable Version
See MC74AC373 for Transparent Latch Version
See MC74AC374 for 3-State Version
Outputs Source/Sink 24 mA
′ACT273 Has TTL Compatible Inputs
These are Pb−Free Devices
TSSOP−20
SUFFIX DT
CASE 948E
20
1
PIN ASSIGNMENT
VCC
Q7
D7
D6
Q6
Q5
D5
D4
Q4
CP
20
19
18
17
16
15
14
13
12
11
PIN
FUNCTION
D0−D7
Data Inputs
MR
Master Reset
CP
Clock Pulse Input
Q0−Q7
Data Outputs
D0 D1 D2 D3 D4 D5 D6 D7
CP
MR
Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7
1
2
3
4
MR
Q0
D0
D1
5
6
Q1
Q2
(Top View)
7
8
9
10
D2
D3
Q3
GND
Logic Symbol
ORDERING INFORMATION
Pinout: 20−Lead Packages Conductors
See detailed ordering and shipping information in the package
dimensions section on page 6 of this data sheet.
MODE SELECT-FUNCTION TABLE
Operating Mode
DEVICE MARKING INFORMATION
Inputs
See general marking information in the device marking
section on page 6 of this data sheet.
Outputs
MR
CP
Dn
Reset (Clear)
L
X
X
Qn
L
Load ′1′
H
H
H
Load ′0′
H
L
L
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
= LOW-to-HIGH Clock Transition
© Semiconductor Components Industries, LLC, 2015
February, 2015 − Rev. 7
1
Publication Order Number:
MC74AC273/D
MC74AC273, MC74ACT273
D0
D1
D2
D3
D4
D5
D6
D7
CP
D
Q
D
Q
D
Q
D
Q
D
Q
D
Q
D
Q
D
Q
CP
CP
CP
CP
CP
CP
CP
CP
RD
RD
RD
RD
RD
RD
RD
RD
MR
O0
O1
O2
O3
O4
O5
O6
O7
NOTE: That this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
Figure 1. Logic Diagram
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2
MC74AC273, MC74ACT273
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
−0.5 to +7.0
V
VCC
DC Supply Voltage (Referenced to GND)
VIN
DC Input Voltage (Referenced to GND)
−0.5 to VCC +0.5
V
DC Output Voltage (Referenced to GND) (Note 1)
−0.5 to VCC +0.5
V
VOUT
IIK
DC Input Diode Current
±20
mA
IOK
DC Output Diode Current
±50
mA
IOUT
DC Output Sink/Source Current
±50
mA
ICC
DC Supply Current, per Output Pin
±50
mA
IGND
DC Ground Current, per Output Pin
±100
mA
TSTG
Storage Temperature Range
*65 to )150
_C
TL
Lead temperature, 1 mm from Case for 10 Seconds
260
_C
TJ
Junction Temperature Under Bias
140
_C
qJA
Thermal Resistance (Note 2)
65.8
110.7
_C/W
MSL
Moisture Sensitivity
FR
Flammability Rating
VESD
ILatchup
SOIC
TSSOP
Level 1
Oxygen Index: 30% − 35%
ESD Withstand Voltage
UL 94 V−0 @ 0.125 in
Human Body Model (Note 3)
Machine Model (Note 4)
Charged Device Model (Note 5)
Latchup Performance
> 2000
> 200
> 1000
V
±100
mA
Above VCC and Below GND at 85_C (Note 6)
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. IOUT absolute maximum rating must be observed.
2. The package thermal impedance is calculated in accordance with JESD 51−7.
3. Tested to EIA/JESD22−A114−A.
4. Tested to EIA/JESD22−A115−A.
5. Tested to JESD22−C101−A.
6. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
VCC
Vin, Vout
tr, tf
Parameter
Supply Voltage
Min
Typ
Max
′AC
2.0
5.0
6.0
′ACT
4.5
5.0
5.5
0
−
VCC
VCC @ 3.0 V
−
150
−
VCC @ 4.5 V
−
40
−
VCC @ 5.5 V
−
25
−
VCC @ 4.5 V
−
10
−
VCC @ 5.5 V
−
8.0
−
−40
25
85
°C
DC Input Voltage, Output Voltage (Ref. to GND)
Input Rise and Fall Time (Note 7)
′AC Devices except Schmitt Inputs
Unit
V
V
ns/V
tr, tf
Input Rise and Fall Time (Note 8)
′ACT Devices except Schmitt Inputs
TA
Operating Ambient Temperature Range
IOH
Output Current − High
−
−
−24
mA
IOL
Output Current − Low
−
−
24
mA
ns/V
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
7. VIN from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times.
8. VIN from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.
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3
MC74AC273, MC74ACT273
DC CHARACTERISTICS
Symbol
VCC
Parameter
(V)
74AC
74AC
TA = +25°C
TA = −40°C to +85°C
Typ
Unit
Conditions
Guaranteed Limits
VIH
Minimum High Level Input Voltage
3.0
4.5
5.5
1.5
2.25
2.75
2.1
3.15
3.85
2.1
3.15
3.85
V
VOUT = 0.1 V
or VCC − 0.1 V
VIL
Maximum Low Level Input Voltage
3.0
4.5
5.5
1.5
2.25
2.75
0.9
1.35
1.65
0.9
1.35
1.65
V
VOUT = 0.1 V
or VCC − 0.1 V
VOH
Minimum High Level Output Voltage
3.0
4.5
5.5
2.99
4.49
5.49
2.9
4.4
5.4
2.9
4.4
5.4
V
IOUT = −50 mA
3.0
4.5
5.5
−
−
−
2.56
3.86
4.86
2.46
3.76
4.76
V
*VIN = VIL or VIH
−12 mA
−24 mA
IOH
−24 mA
3.0
4.5
5.5
0.002
0.001
0.001
0.1
0.1
0.1
0.1
0.1
0.1
V
IOUT = 50 mA
3.0
4.5
5.5
−
−
−
0.36
0.36
0.36
0.44
0.44
0.44
V
*VIN = VIL or VIH
12 mA
24 mA
IOL
24 mA
Maximum Input Leakage Current
5.5
−
±0.1
±1.0
mA
VI = VCC, GND
†Minimum Dynamic Output Current
5.5
5.5
−
−
−
−
75
−75
mA
VOLD = 1.65 V Max
VOHD = 3.85 V Min
VOL
IIN
IOLD
IOHD
Maximum Low Level Output Voltage
ICC
Maximum Quiescent Supply Current
5.5
−
8.0
80
mA
*All outputs loaded; thresholds on input associated with output under test.
†Maximum test duration 2.0 ms, one output loaded at a time.
NOTE: Note: IIN and ICC @ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V VCC.
VIN = VCC or GND
AC CHARACTERISTICS (For Figures and Waveforms − See Section 3 of the ON Semiconductor FACT Data Book, DL138/D)
Symbol
Parameter
VCC*
(V)
74AC
74AC
TA = +25°C CL = 50 pF
TA = −40°C to +85°C CL = 50 pF
Unit
Figure
No.
Min
Typ
Max
Min
Max
fmax
Maximum Clock
Frequency
3.3
5.0
90
140
125
175
−
−
75
125
−
−
Mhz
3−3
tPLH
Propagation Delay
Clock to Output
3.3
5.0
4.0
3.0
7.0
5.5
12.5
9.0
3.0
2.5
14.0
10.0
ns
3−6
tPHL
Propagation Delay
Clock to Output
3.3
5.0
4.0
3.0
7.0
5.0
13.0
10.0
3.5
2.5
14.5
11.0
ns
3−6
13.0
10.0
3.5
2.5
14.0
10.5
ns
3−6
Unit
Figure
No.
Propagation Delay
3.3
4.0
7.0
MR to Output
5.0
3.0
5.0
*Voltage Range 3.3 V is 3.3 V ±0.3 V. Voltage Range 5.0 V is 5.0 V ±0.5 V.
tPHL
AC OPERATING REQUIREMENTS
Symbol
Parameter
VCC*
(V)
74AC
74AC
TA = +25°C CL = 50 pF
TA = −40°C to +85°C CL = 50 pF
Typ
Guaranteed Minimum
ts
Setup Time, HIGH or LOW
Data to CP
3.3
5.0
3.5
2.5
5.5
4.0
6.0
4.5
ns
3−9
th
Hold Time, HIGH or LOW
Data to CP
3.3
5.0
−2.0
−1.0
0
1.0
0
1.0
ns
3−9
tw
Clock Pulse Width
HIGH or LOW
3.3
5.0
3.5
2.5
5.5
4.0
6.0
4.5
ns
3−6
tw
MR Pulse Width
HIGH or LOW
3.3
5.0
2.0
1.5
5.5
4.0
6.0
4.5
ns
3−6
Recovery Time
3.3
1.5
3.5
MR to CP
5.0
1.0
2.0
*Voltage Range 3.3 V is 3.3 V ±0.3 V. Voltage Range 5.0 V is 5.0 V ±0.5 V.
4.5
3.0
ns
3−9
trec
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4
MC74AC273, MC74ACT273
DC CHARACTERISTICS
74ACT
Symbol
Parameter
VCC
(V)
74ACT
TA =
TA = +25°C
Typ
Unit
−40°C to +85°C
Conditions
Guaranteed Limits
VIH
Minimum High Level Input Voltage
4.5
5.5
1.5
1.5
2.0
2.0
2.0
2.0
V
VOUT = 0.1 V
or VCC − 0.1 V
VIL
Maximum Low Level Input Voltage
4.5
5.5
1.5
1.5
0.8
0.8
0.8
0.8
V
VOUT = 0.1 V
or VCC − 0.1 V
VOH
Minimum High Level Output Voltage
4.5
5.5
4.49
5.49
4.4
5.4
4.4
5.4
V
4.5
5.5
−
−
3.86
4.86
3.76
4.76
4.5
5.5
0.001
0.001
0.1
0.1
0.1
0.1
4.5
5.5
−
−
0.36
0.36
0.44
0.44
VOL
Maximum Low Level Output Voltage
IOUT = −50 mA
*VIN = VIL or VIH
IOH −24 mA
−24 mA
V
IOUT = 50 mA
V
V
*VIN = VIL or VIH
24 mA
IOL
24 mA
Maximum Input Leakage Current
5.5
−
±0.1
±1.0
mA
VI = VCC, GND
DICCT
Additional Max. ICC/Input
5.5
0.6
−
1.5
mA
VI = VCC − 2.1 V
IOLD
IOHD
†Minimum Dynamic Output Current
5.5
5.5
−
−
−
−
75
−75
mA
VOLD = 1.65 V Max
VOHD = 3.85 V Min
80
mA
VIN = VCC or GND
IIN
ICC
Maximum Quiescent Supply Current
5.5
−
8.0
*All outputs loaded; thresholds on input associated with output under test.
†Maximum test duration 2.0 ms, one output loaded at a time.
AC CHARACTERISTICS (For Figures and Waveforms − See Section 3 of the ON Semiconductor FACT Data Book, DL138/D)
Parameter
Symbol
VCC*
(V)
74ACT
74ACT
TA = +25°C CL = 50 pF
TA = −40°C to +85°C
CL = 50 pF
Unit
Figure
No.
Min
Typ
Max
Min
Max
−
MHz
3−3
fmax
Maximum Clock Frequency
5.0
125
200
−
125
tPHL
Propagation Delay Clock to Output
5.0
3.0
6.0
10
2.5
11.0
ns
3−6
tPLH
Propagation Delay Clock to Output
5.0
3.0
6.5
11
2.5
12.0
ns
3−6
tPHL
Propagation Delay MR to Output
5.0
3.0
7.0
11
2.5
11.5
ns
3−6
Unit
Figure
No.
*Voltage Range 5.0 V is 5.0 V ±0.5 V.
AC OPERATING REQUIREMENTS
Symbol
Parameter
VCC*
(V)
74ACT
74ACT
TA = +25°C CL = 50 pF
TA = −40°C to +85°C
CL = 50 pF
Typ
Guaranteed Minimum
ts
Setup Time, HIGH or LOW − Data to CP
5.0
3.0
4.5
5.0
ns
3−9
th
Hold Time, HIGH or LOW − Data to CP
5.0
−2.5
2.0
2.0
ns
3−9
tw
Clock Pulse Width − HIGH or LOW
5.0
2.5
4.0
4.5
ns
3−6
tw
MR Pulse Width − HIGH or LOW
5.0
2.5
4.0
4.5
ns
3−6
trec
Recovery Time − MR to CP
5.0
−1.0
2.0
3.0
ns
3−6
*Voltage Range 5.0 V is 5.0 V ±0.5 V.
CAPACITANCE
Symbol
Parameter
Value Typ
Unit
Test Conditions
CIN
Input Capacitance
4.5
pF
VCC = 5.0 V
CPD
Power Dissipation Capacitance
50
pF
VCC = 5.0 V
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5
MC74AC273, MC74ACT273
ORDERING INFORMATION
Package
Shipping†
MC74AC273DWG
SOIC−20WB
(Pb−Free)
38 Units / Rail
MC74AC273DWR2G
SOIC−20WB
(Pb−Free)
1000 / Tape & Reel
MC74AC273DTR2G
TSSOP−20
(Pb−Free)
2500 / Tape & Reel
MC74ACT273DWG
SOIC−20WB
(Pb−Free)
38 Units / Rail
MC74ACT273DWR2G
SOIC−20WB
(Pb−Free)
1000 / Tape & Reel
MC74ACT273DTR2G
TSSOP−20
(Pb−Free)
2500 / Tape & Reel
Device
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
MARKING DIAGRAMS
SOIC−20WB
TSSOP−20
20
20
AC
273
ALYWG
G
AC273
AWLYYWWG
1
1
20
20
ACT
273
ALYWG
G
ACT273
AWLYYWWG
1
1
A
= Assembly Location
WL, L
= Wafer Lot
YY, Y
= Year
WW, W = Work Week
G or G
= Pb−Free Package
(Note: Microdot may be in either location)
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6
MC74AC273, MC74ACT273
PACKAGE DIMENSIONS
TSSOP−20
DT SUFFIX
CASE 948E−02
ISSUE C
20X
0.15 (0.006) T U
2X
K REF
0.10 (0.004)
S
L/2
20
M
T U
S
V
ÍÍÍÍ
ÍÍÍÍ
ÍÍÍÍ
K
K1
S
J J1
11
B
L
SECTION N−N
−U−
PIN 1
IDENT
0.25 (0.010)
N
1
10
M
0.15 (0.006) T U
S
A
−V−
N
F
DETAIL E
C
G
D
0.100 (0.004)
−T− SEATING
H
DETAIL E
SOLDERING FOOTPRINT*
PLANE
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION:
MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE
MOLD FLASH, PROTRUSIONS OR GATE
BURRS. MOLD FLASH OR GATE BURRS
SHALL NOT EXCEED 0.15 (0.006) PER SIDE.
4. DIMENSION B DOES NOT INCLUDE
INTERLEAD FLASH OR PROTRUSION.
INTERLEAD FLASH OR PROTRUSION
SHALL NOT EXCEED 0.25 (0.010) PER SIDE.
5. DIMENSION K DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08
(0.003) TOTAL IN EXCESS OF THE K
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
6. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE
DETERMINED AT DATUM PLANE −W−.
MILLIMETERS
INCHES
DIM MIN
MAX
MIN
MAX
A
6.40
6.60 0.252
0.260
B
4.30
4.50 0.169
0.177
C
--1.20
--0.047
D
0.05
0.15 0.002
0.006
F
0.50
0.75 0.020
0.030
G
0.65 BSC
0.026 BSC
−W−
H
0.27
0.37
0.011
0.015
J
0.09
0.20 0.004
0.008
J1
0.09
0.16 0.004
0.006
K
0.19
0.30 0.007
0.012
K1
0.19
0.25 0.007
0.010
L
6.40 BSC
0.252 BSC
M
0_
8_
0_
8_
7.06
1
0.65
PITCH
16X
0.36
16X
1.26
DIMENSIONS: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
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7
MC74AC273, MC74ACT273
PACKAGE DIMENSIONS
SOIC−20W
DW SUFFIX
CASE 751D−05
ISSUE G
20
11
X 45 _
h
H
M
E
0.25
10X
NOTES:
1. DIMENSIONS ARE IN MILLIMETERS.
2. INTERPRET DIMENSIONS AND TOLERANCES
PER ASME Y14.5M, 1994.
3. DIMENSIONS D AND E DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 PER SIDE.
5. DIMENSION B DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE PROTRUSION
SHALL BE 0.13 TOTAL IN EXCESS OF B
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
q
A
B
M
D
1
10
20X
B
B
0.25
M
T A
S
B
S
L
A
18X
e
A1
DIM
A
A1
B
C
D
E
e
H
h
L
q
MILLIMETERS
MIN
MAX
2.35
2.65
0.10
0.25
0.35
0.49
0.23
0.32
12.65
12.95
7.40
7.60
1.27 BSC
10.05
10.55
0.25
0.75
0.50
0.90
0_
7_
SEATING
PLANE
C
T
ON Semiconductor and the
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MC74AC273/D