MC74AC273, MC74ACT273 Octal D Flip-Flop The MC74AC273/74ACT273 has eight edge-triggered D−type flip−flops with individual D inputs and Q outputs. The common buffered Clock (CP) and Master Reset (MR) inputs load and reset (clear) all flip−flops simultaneously. The register is fully edge-triggered. The state of each D input, one setup time before the LOW−to−HIGH clock transition, is transferred to the corresponding flip−flop’s Q output. All outputs will be forced LOW independently of Clock or Data inputs by a LOW voltage level on the MR input. The device is useful for applications where the true output only is required and the Clock and Master Reset are common to all storage elements. www.onsemi.com SOIC−20WB SUFFIX DW CASE 751D 20 1 Features • • • • • • • • • • Ideal Buffer for MOS Microprocessor or Memory Eight Edge-Triggered D Flip−Flops Buffered Common Clock Buffered, Asynchronous Master Reset See MC74AC377 for Clock Enable Version See MC74AC373 for Transparent Latch Version See MC74AC374 for 3-State Version Outputs Source/Sink 24 mA ′ACT273 Has TTL Compatible Inputs These are Pb−Free Devices TSSOP−20 SUFFIX DT CASE 948E 20 1 PIN ASSIGNMENT VCC Q7 D7 D6 Q6 Q5 D5 D4 Q4 CP 20 19 18 17 16 15 14 13 12 11 PIN FUNCTION D0−D7 Data Inputs MR Master Reset CP Clock Pulse Input Q0−Q7 Data Outputs D0 D1 D2 D3 D4 D5 D6 D7 CP MR Q0 Q1 Q2 Q3 Q4 Q5 Q6 Q7 1 2 3 4 MR Q0 D0 D1 5 6 Q1 Q2 (Top View) 7 8 9 10 D2 D3 Q3 GND Logic Symbol ORDERING INFORMATION Pinout: 20−Lead Packages Conductors See detailed ordering and shipping information in the package dimensions section on page 6 of this data sheet. MODE SELECT-FUNCTION TABLE Operating Mode DEVICE MARKING INFORMATION Inputs See general marking information in the device marking section on page 6 of this data sheet. Outputs MR CP Dn Reset (Clear) L X X Qn L Load ′1′ H H H Load ′0′ H L L H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial = LOW-to-HIGH Clock Transition © Semiconductor Components Industries, LLC, 2015 February, 2015 − Rev. 7 1 Publication Order Number: MC74AC273/D MC74AC273, MC74ACT273 D0 D1 D2 D3 D4 D5 D6 D7 CP D Q D Q D Q D Q D Q D Q D Q D Q CP CP CP CP CP CP CP CP RD RD RD RD RD RD RD RD MR O0 O1 O2 O3 O4 O5 O6 O7 NOTE: That this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. Figure 1. Logic Diagram www.onsemi.com 2 MC74AC273, MC74ACT273 MAXIMUM RATINGS Symbol Parameter Value Unit −0.5 to +7.0 V VCC DC Supply Voltage (Referenced to GND) VIN DC Input Voltage (Referenced to GND) −0.5 to VCC +0.5 V DC Output Voltage (Referenced to GND) (Note 1) −0.5 to VCC +0.5 V VOUT IIK DC Input Diode Current ±20 mA IOK DC Output Diode Current ±50 mA IOUT DC Output Sink/Source Current ±50 mA ICC DC Supply Current, per Output Pin ±50 mA IGND DC Ground Current, per Output Pin ±100 mA TSTG Storage Temperature Range *65 to )150 _C TL Lead temperature, 1 mm from Case for 10 Seconds 260 _C TJ Junction Temperature Under Bias 140 _C qJA Thermal Resistance (Note 2) 65.8 110.7 _C/W MSL Moisture Sensitivity FR Flammability Rating VESD ILatchup SOIC TSSOP Level 1 Oxygen Index: 30% − 35% ESD Withstand Voltage UL 94 V−0 @ 0.125 in Human Body Model (Note 3) Machine Model (Note 4) Charged Device Model (Note 5) Latchup Performance > 2000 > 200 > 1000 V ±100 mA Above VCC and Below GND at 85_C (Note 6) Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. IOUT absolute maximum rating must be observed. 2. The package thermal impedance is calculated in accordance with JESD 51−7. 3. Tested to EIA/JESD22−A114−A. 4. Tested to EIA/JESD22−A115−A. 5. Tested to JESD22−C101−A. 6. Tested to EIA/JESD78. RECOMMENDED OPERATING CONDITIONS Symbol VCC Vin, Vout tr, tf Parameter Supply Voltage Min Typ Max ′AC 2.0 5.0 6.0 ′ACT 4.5 5.0 5.5 0 − VCC VCC @ 3.0 V − 150 − VCC @ 4.5 V − 40 − VCC @ 5.5 V − 25 − VCC @ 4.5 V − 10 − VCC @ 5.5 V − 8.0 − −40 25 85 °C DC Input Voltage, Output Voltage (Ref. to GND) Input Rise and Fall Time (Note 7) ′AC Devices except Schmitt Inputs Unit V V ns/V tr, tf Input Rise and Fall Time (Note 8) ′ACT Devices except Schmitt Inputs TA Operating Ambient Temperature Range IOH Output Current − High − − −24 mA IOL Output Current − Low − − 24 mA ns/V Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. 7. VIN from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times. 8. VIN from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times. www.onsemi.com 3 MC74AC273, MC74ACT273 DC CHARACTERISTICS Symbol VCC Parameter (V) 74AC 74AC TA = +25°C TA = −40°C to +85°C Typ Unit Conditions Guaranteed Limits VIH Minimum High Level Input Voltage 3.0 4.5 5.5 1.5 2.25 2.75 2.1 3.15 3.85 2.1 3.15 3.85 V VOUT = 0.1 V or VCC − 0.1 V VIL Maximum Low Level Input Voltage 3.0 4.5 5.5 1.5 2.25 2.75 0.9 1.35 1.65 0.9 1.35 1.65 V VOUT = 0.1 V or VCC − 0.1 V VOH Minimum High Level Output Voltage 3.0 4.5 5.5 2.99 4.49 5.49 2.9 4.4 5.4 2.9 4.4 5.4 V IOUT = −50 mA 3.0 4.5 5.5 − − − 2.56 3.86 4.86 2.46 3.76 4.76 V *VIN = VIL or VIH −12 mA −24 mA IOH −24 mA 3.0 4.5 5.5 0.002 0.001 0.001 0.1 0.1 0.1 0.1 0.1 0.1 V IOUT = 50 mA 3.0 4.5 5.5 − − − 0.36 0.36 0.36 0.44 0.44 0.44 V *VIN = VIL or VIH 12 mA 24 mA IOL 24 mA Maximum Input Leakage Current 5.5 − ±0.1 ±1.0 mA VI = VCC, GND †Minimum Dynamic Output Current 5.5 5.5 − − − − 75 −75 mA VOLD = 1.65 V Max VOHD = 3.85 V Min VOL IIN IOLD IOHD Maximum Low Level Output Voltage ICC Maximum Quiescent Supply Current 5.5 − 8.0 80 mA *All outputs loaded; thresholds on input associated with output under test. †Maximum test duration 2.0 ms, one output loaded at a time. NOTE: Note: IIN and ICC @ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V VCC. VIN = VCC or GND AC CHARACTERISTICS (For Figures and Waveforms − See Section 3 of the ON Semiconductor FACT Data Book, DL138/D) Symbol Parameter VCC* (V) 74AC 74AC TA = +25°C CL = 50 pF TA = −40°C to +85°C CL = 50 pF Unit Figure No. Min Typ Max Min Max fmax Maximum Clock Frequency 3.3 5.0 90 140 125 175 − − 75 125 − − Mhz 3−3 tPLH Propagation Delay Clock to Output 3.3 5.0 4.0 3.0 7.0 5.5 12.5 9.0 3.0 2.5 14.0 10.0 ns 3−6 tPHL Propagation Delay Clock to Output 3.3 5.0 4.0 3.0 7.0 5.0 13.0 10.0 3.5 2.5 14.5 11.0 ns 3−6 13.0 10.0 3.5 2.5 14.0 10.5 ns 3−6 Unit Figure No. Propagation Delay 3.3 4.0 7.0 MR to Output 5.0 3.0 5.0 *Voltage Range 3.3 V is 3.3 V ±0.3 V. Voltage Range 5.0 V is 5.0 V ±0.5 V. tPHL AC OPERATING REQUIREMENTS Symbol Parameter VCC* (V) 74AC 74AC TA = +25°C CL = 50 pF TA = −40°C to +85°C CL = 50 pF Typ Guaranteed Minimum ts Setup Time, HIGH or LOW Data to CP 3.3 5.0 3.5 2.5 5.5 4.0 6.0 4.5 ns 3−9 th Hold Time, HIGH or LOW Data to CP 3.3 5.0 −2.0 −1.0 0 1.0 0 1.0 ns 3−9 tw Clock Pulse Width HIGH or LOW 3.3 5.0 3.5 2.5 5.5 4.0 6.0 4.5 ns 3−6 tw MR Pulse Width HIGH or LOW 3.3 5.0 2.0 1.5 5.5 4.0 6.0 4.5 ns 3−6 Recovery Time 3.3 1.5 3.5 MR to CP 5.0 1.0 2.0 *Voltage Range 3.3 V is 3.3 V ±0.3 V. Voltage Range 5.0 V is 5.0 V ±0.5 V. 4.5 3.0 ns 3−9 trec www.onsemi.com 4 MC74AC273, MC74ACT273 DC CHARACTERISTICS 74ACT Symbol Parameter VCC (V) 74ACT TA = TA = +25°C Typ Unit −40°C to +85°C Conditions Guaranteed Limits VIH Minimum High Level Input Voltage 4.5 5.5 1.5 1.5 2.0 2.0 2.0 2.0 V VOUT = 0.1 V or VCC − 0.1 V VIL Maximum Low Level Input Voltage 4.5 5.5 1.5 1.5 0.8 0.8 0.8 0.8 V VOUT = 0.1 V or VCC − 0.1 V VOH Minimum High Level Output Voltage 4.5 5.5 4.49 5.49 4.4 5.4 4.4 5.4 V 4.5 5.5 − − 3.86 4.86 3.76 4.76 4.5 5.5 0.001 0.001 0.1 0.1 0.1 0.1 4.5 5.5 − − 0.36 0.36 0.44 0.44 VOL Maximum Low Level Output Voltage IOUT = −50 mA *VIN = VIL or VIH IOH −24 mA −24 mA V IOUT = 50 mA V V *VIN = VIL or VIH 24 mA IOL 24 mA Maximum Input Leakage Current 5.5 − ±0.1 ±1.0 mA VI = VCC, GND DICCT Additional Max. ICC/Input 5.5 0.6 − 1.5 mA VI = VCC − 2.1 V IOLD IOHD †Minimum Dynamic Output Current 5.5 5.5 − − − − 75 −75 mA VOLD = 1.65 V Max VOHD = 3.85 V Min 80 mA VIN = VCC or GND IIN ICC Maximum Quiescent Supply Current 5.5 − 8.0 *All outputs loaded; thresholds on input associated with output under test. †Maximum test duration 2.0 ms, one output loaded at a time. AC CHARACTERISTICS (For Figures and Waveforms − See Section 3 of the ON Semiconductor FACT Data Book, DL138/D) Parameter Symbol VCC* (V) 74ACT 74ACT TA = +25°C CL = 50 pF TA = −40°C to +85°C CL = 50 pF Unit Figure No. Min Typ Max Min Max − MHz 3−3 fmax Maximum Clock Frequency 5.0 125 200 − 125 tPHL Propagation Delay Clock to Output 5.0 3.0 6.0 10 2.5 11.0 ns 3−6 tPLH Propagation Delay Clock to Output 5.0 3.0 6.5 11 2.5 12.0 ns 3−6 tPHL Propagation Delay MR to Output 5.0 3.0 7.0 11 2.5 11.5 ns 3−6 Unit Figure No. *Voltage Range 5.0 V is 5.0 V ±0.5 V. AC OPERATING REQUIREMENTS Symbol Parameter VCC* (V) 74ACT 74ACT TA = +25°C CL = 50 pF TA = −40°C to +85°C CL = 50 pF Typ Guaranteed Minimum ts Setup Time, HIGH or LOW − Data to CP 5.0 3.0 4.5 5.0 ns 3−9 th Hold Time, HIGH or LOW − Data to CP 5.0 −2.5 2.0 2.0 ns 3−9 tw Clock Pulse Width − HIGH or LOW 5.0 2.5 4.0 4.5 ns 3−6 tw MR Pulse Width − HIGH or LOW 5.0 2.5 4.0 4.5 ns 3−6 trec Recovery Time − MR to CP 5.0 −1.0 2.0 3.0 ns 3−6 *Voltage Range 5.0 V is 5.0 V ±0.5 V. CAPACITANCE Symbol Parameter Value Typ Unit Test Conditions CIN Input Capacitance 4.5 pF VCC = 5.0 V CPD Power Dissipation Capacitance 50 pF VCC = 5.0 V www.onsemi.com 5 MC74AC273, MC74ACT273 ORDERING INFORMATION Package Shipping† MC74AC273DWG SOIC−20WB (Pb−Free) 38 Units / Rail MC74AC273DWR2G SOIC−20WB (Pb−Free) 1000 / Tape & Reel MC74AC273DTR2G TSSOP−20 (Pb−Free) 2500 / Tape & Reel MC74ACT273DWG SOIC−20WB (Pb−Free) 38 Units / Rail MC74ACT273DWR2G SOIC−20WB (Pb−Free) 1000 / Tape & Reel MC74ACT273DTR2G TSSOP−20 (Pb−Free) 2500 / Tape & Reel Device †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. MARKING DIAGRAMS SOIC−20WB TSSOP−20 20 20 AC 273 ALYWG G AC273 AWLYYWWG 1 1 20 20 ACT 273 ALYWG G ACT273 AWLYYWWG 1 1 A = Assembly Location WL, L = Wafer Lot YY, Y = Year WW, W = Work Week G or G = Pb−Free Package (Note: Microdot may be in either location) www.onsemi.com 6 MC74AC273, MC74ACT273 PACKAGE DIMENSIONS TSSOP−20 DT SUFFIX CASE 948E−02 ISSUE C 20X 0.15 (0.006) T U 2X K REF 0.10 (0.004) S L/2 20 M T U S V ÍÍÍÍ ÍÍÍÍ ÍÍÍÍ K K1 S J J1 11 B L SECTION N−N −U− PIN 1 IDENT 0.25 (0.010) N 1 10 M 0.15 (0.006) T U S A −V− N F DETAIL E C G D 0.100 (0.004) −T− SEATING H DETAIL E SOLDERING FOOTPRINT* PLANE NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: MILLIMETER. 3. DIMENSION A DOES NOT INCLUDE MOLD FLASH, PROTRUSIONS OR GATE BURRS. MOLD FLASH OR GATE BURRS SHALL NOT EXCEED 0.15 (0.006) PER SIDE. 4. DIMENSION B DOES NOT INCLUDE INTERLEAD FLASH OR PROTRUSION. INTERLEAD FLASH OR PROTRUSION SHALL NOT EXCEED 0.25 (0.010) PER SIDE. 5. DIMENSION K DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.08 (0.003) TOTAL IN EXCESS OF THE K DIMENSION AT MAXIMUM MATERIAL CONDITION. 6. TERMINAL NUMBERS ARE SHOWN FOR REFERENCE ONLY. 7. DIMENSION A AND B ARE TO BE DETERMINED AT DATUM PLANE −W−. MILLIMETERS INCHES DIM MIN MAX MIN MAX A 6.40 6.60 0.252 0.260 B 4.30 4.50 0.169 0.177 C --1.20 --0.047 D 0.05 0.15 0.002 0.006 F 0.50 0.75 0.020 0.030 G 0.65 BSC 0.026 BSC −W− H 0.27 0.37 0.011 0.015 J 0.09 0.20 0.004 0.008 J1 0.09 0.16 0.004 0.006 K 0.19 0.30 0.007 0.012 K1 0.19 0.25 0.007 0.010 L 6.40 BSC 0.252 BSC M 0_ 8_ 0_ 8_ 7.06 1 0.65 PITCH 16X 0.36 16X 1.26 DIMENSIONS: MILLIMETERS *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. www.onsemi.com 7 MC74AC273, MC74ACT273 PACKAGE DIMENSIONS SOIC−20W DW SUFFIX CASE 751D−05 ISSUE G 20 11 X 45 _ h H M E 0.25 10X NOTES: 1. DIMENSIONS ARE IN MILLIMETERS. 2. INTERPRET DIMENSIONS AND TOLERANCES PER ASME Y14.5M, 1994. 3. DIMENSIONS D AND E DO NOT INCLUDE MOLD PROTRUSION. 4. MAXIMUM MOLD PROTRUSION 0.15 PER SIDE. 5. DIMENSION B DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE PROTRUSION SHALL BE 0.13 TOTAL IN EXCESS OF B DIMENSION AT MAXIMUM MATERIAL CONDITION. q A B M D 1 10 20X B B 0.25 M T A S B S L A 18X e A1 DIM A A1 B C D E e H h L q MILLIMETERS MIN MAX 2.35 2.65 0.10 0.25 0.35 0.49 0.23 0.32 12.65 12.95 7.40 7.60 1.27 BSC 10.05 10.55 0.25 0.75 0.50 0.90 0_ 7_ SEATING PLANE C T ON Semiconductor and the are registered trademarks of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or other countries. SCILLC owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of SCILLC’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. 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