MC34151 D

MC34151, MC33151
High Speed Dual
MOSFET Drivers
The MC34151/MC33151 are dual inverting high speed drivers
specifically designed for applications that require low current digital
circuitry to drive large capacitive loads with high slew rates. These
devices feature low input current making them CMOS and LSTTL
logic compatible, input hysteresis for fast output switching that is
independent of input transition time, and two high current totem pole
outputs ideally suited for driving power MOSFETs. Also included is
an undervoltage lockout with hysteresis to prevent erratic system
operation at low supply voltages.
Typical applications include switching power supplies, dc to dc
converters, capacitor charge pump voltage doublers/inverters, and
motor controllers.
These devices are available in dual−in−line and surface mount
packages.
Features
•
•
•
•
•
•
•
•
•
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MARKING
DIAGRAMS
8
8
1
1
8
8
Two Independent Channels with 1.5 A Totem Pole Output
Output Rise and Fall Times of 15 ns with 1000 pF Load
CMOS/LSTTL Compatible Inputs with Hysteresis
Undervoltage Lockout with Hysteresis
Low Standby Current
Efficient High Frequency Operation
Enhanced System Performance with Common Switching Regulator
Control ICs
Pin Out Equivalent to DS0026 and MMH0026
These are Pb−Free and Halide−Free Devices
MC3x151P
AWL
YYWWG
PDIP−8
P SUFFIX
CASE 626
1
SOIC−8
D SUFFIX
CASE 751
1
8
3x151
ALYWG
G
MC3x151
x
A
WL, L
YY, Y
WW, W
G or G
1
3151V
ALYWG
G
MC33151V
= 3 or 4
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
(Note: Microdot may be in either location)
PIN CONNECTIONS
VCC
6
N.C. 1
+
+
+
8 N.C.
Logic Input A 2
-
7 Drive Output A
GND 3
+
6 VCC
Logic Input B 4
5.7V
5 Drive Output B
+
Drive Output A
Logic Input A
100k
2
(Top View)
7
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 10 of this data sheet.
+
+
Drive Output B
100k
Logic Input B
4
GND
5
3
Figure 1. Representative Block Diagram
© Semiconductor Components Industries, LLC, 2013
August, 2013 − Rev. 9
1
Publication Order Number:
MC34151/D
MC34151, MC33151
MAXIMUM RATINGS
Symbol
Value
Unit
Power Supply Voltage
Rating
VCC
20
V
Logic Inputs (Note 1)
Vin
−0.3 to VCC
V
Drive Outputs (Note 2)
Totem Pole Sink or Source Current
Diode Clamp Current (Drive Output to VCC)
IO
IO(clamp)
1.5
1.0
PD
RqJA
0.56
180
W
°C/W
PD
RqJA
1.0
100
W
°C/W
Operating Junction Temperature
TJ
+150
°C
Operating Ambient Temperature
MC34151
MC33151
MC33151V
TA
Storage Temperature Range
Tstg
Electrostatic Discharge Sensitivity (ESD) (Note 3)
Human Body Model (HBM)
Machine Model (MM)
Charged Device Model (CDM)
ESD
A
Power Dissipation and Thermal Characteristics
D Suffix SOIC−8 Package Case 751
Maximum Power Dissipation @ TA = 50°C
Thermal Resistance, Junction−to−Air
P Suffix 8−Pin Package Case 626
Maximum Power Dissipation @ TA = 50°C
Thermal Resistance, Junction−to−Air
0 to +70
−40 to +85
−40 to +125
−65 to +150
°C
°C
V
2000
200
1500
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. For optimum switching speed, the maximum input voltage should be limited to 10 V or VCC, whichever is less.
2. Maximum package power dissipation limits must be observed.
3. ESD protection per JEDEC Standard JESD22−A114−F for HBM
per JEDEC Standard JESD22−A115−A for MM
per JEDEC Standard JESD22−C101D for CDM.
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2
MC34151, MC33151
ELECTRICAL CHARACTERISTICS (VCC = 12 V, for typical values TA = 25°C, for min/max values TA is the only operating
ambient temperature range that applies [Note 3], unless otherwise noted.)
Characteristics
Symbol
Min
Typ
Max
Unit
VIH
VIL
−
0.8
1.75
1.58
2.6
−
V
IIH
IIL
−
−
200
20
500
100
mA
VOL
−
−
−
10.5
10.4
9.5
0.8
1.1
1.7
11.2
11.1
10.9
1.2
1.5
2.5
−
−
−
V
RPD
−
100
−
kW
tPLH(in/out)
tPHL(in/out)
−
−
35
36
100
100
Drive Output Rise Time (10% to 90%) CL = 1.0 nF
Drive Output Rise Time (10% to 90%) CL = 2.5 nF
tr
−
−
14
31
30
−
ns
Drive Output Fall Time (90% to 10%) CL = 1.0 nF
Drive Output Fall Time (90% to 10%) CL = 2.5 nF
tf
−
−
16
32
30
−
ns
−
−
6.0
10.5
10
15
6.5
−
18
LOGIC INPUTS
Input Threshold Voltage −
Output Transition High to Low State
Output Transition Low to High State
Input Current − High State (VIH = 2.6 V)
Input Current − Low State (VIL = 0.8 V)
DRIVE OUTPUT
Output Voltage − Low State (ISink = 10 mA)
Output Voltage − Low State (ISink = 50 mA)
Output Voltage − Low State (ISink = 400 mA)
Output Voltage − High State (ISource = 10 mA)
Output Voltage − High State (ISource = 50 mA)
Output Voltage − High State (ISource = 400 mA)
VOH
Output Pulldown Resistor
SWITCHING CHARACTERISTICS (TA = 25°C)
Propagation Delay (10% Input to 10% Output, CL = 1.0 nF)
Logic Input to Drive Output Rise
Logic Input to Drive Output Fall
ns
TOTAL DEVICE
Power Supply Current
Standby (Logic Inputs Grounded)
Operating (CL = 1.0 nF Drive Outputs 1 and 2, f = 100 kHz)
ICC
Operating Voltage
VCC
mA
1. For optimum switching speed, the maximum input voltage should be limited to 10 V or VCC, whichever is less.
2. Maximum package power dissipation limits must be observed.
Thigh = +70°C for MC34151
3. Tlow = 0°C for MC34151
−40°C for MC33151
+85°C for MC33151
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3
V
MC34151, MC33151
12
4.7 V 0.1
+
6
+
+
+
+
-
+
5.7V
Drive Output
7
100k
2
Logic Input
50
CL
5.0 V
Logic Input
tr, tf ≤ 10 ns
0V
+
+
90%
10%
tPLH
5
4
100k
tPHL
90%
10%
Drive Output
3
Figure 2. Switching Characteristics Test Circuit
Figure 3. Switching Waveform Definitions
2.2
V th , INPUT THRESHOLD VOLTAGE (V)
I in , INPUT CURRENT (mA)
2.4
VCC = 12 V
TA = 25°C
2.0
1.6
1.2
0.8
0.4
0
0
2.0
4.0
6.0
8.0
Vin, INPUT VOLTAGE (V)
10
VCC = 12 V
2.0
1.8
Upper Threshold
Low State Output
1.6
1.4
Lower Threshold
High State Output
1.2
1.0
-55
12
200
VCC = 12 V
CL = 1.0 nF
TA = 25°C
-25
0
25
50
75
TA, AMBIENT TEMPERATURE (°C)
100
125
Figure 5. Logic Input Threshold Voltage
versus Temperature
t PHL(IN/OUT) , DRIVE OUTPUT PROPAGATION DELAY (ns)
t PLH(IN/OUT) , DRIVE OUTPUT PROPAGATION DELAY (ns)
Figure 4. Logic Input Current versus
Input Voltage
160
tr
tf
Overdrive Voltage is with Respect
to the Logic Input Lower Threshold
120
80
40
Vth(lower)
0
-1.6
-1.2
-0.8
-0.4
0
Vin, INPUT OVERDRIVE VOLTAGE BELOW LOWER THRESHOLD (V)
Figure 6. Drive Output Low−to−High Propagation
Delay versus Logic Overdrive Voltage
200
Overdrive Voltage is with Respect
to the Logic Input Lower Threshold
160
VCC = 12 V
CL = 1.0 nF
TA = 25°C
120
80
40
Vth(upper)
0
0
1.0
2.0
3.0
4.0
Vin, INPUT OVERDRIVE VOLTAGE ABOVE UPPER THRESHOLD (V)
Figure 7. Drive Output High−to−Low Propagation
Delay versus Logic Input Overdrive Voltage
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4
90%
Logic Input
V clamp , OUTPUT CLAMP VOLTAGE (V)
MC34151, MC33151
VCC = 12 V
Vin = 5 V to 0 V
CL = 1.0 nF
TA = 25°C
Drive Output
10%
3.0
High State Clamp
(Drive Output Driven Above VCC)
1.0
VCC
0
0
GND
-1.0
0
50 ns/DIV
VCC
-1.0
-2.0
Source Saturation VCC = 12 V
(Load to Ground) 80 ms Pulsed Load
120 Hz Rate
TA = 25°C
-3.0
3.0
2.0
1.0
0
Sink Saturation
(Load to VCC)
0
0.2
GND
0.4
0.6
0.8
1.0
IO, OUTPUT LOAD CURRENT (A)
0.2
Low State Clamp
(Drive Output Driven Below Ground)
0.4
0.6
0.8
1.0
IO, OUTPUT LOAD CURRENT (A)
1.2
1.4
0
-0.5
-0.7
-0.9
-1.1
1.9
1.7
Source Saturation
(Load to Ground) VCC
Isource = 10 mA
1.4
VCC = 12 V
Isource = 400 mA
Isink = 400 mA
1.5
1.0
Isink = 10 mA
0.8
GND
Sink Saturation
0.6
(Load to VCC)
0
-55
-25
0
25
50
75
TA, AMBIENT TEMPERATURE (°C)
Figure 10. Drive Output Saturation Voltage
versus Load Current
100
Figure 11. Drive Output Saturation Voltage
versus Temperature
90%
VCC = 12 V
Vin = 5 V to 0 V
CL = 1.0 nF
TA = 25°C
90%
VCC = 12 V
Vin = 5 V to 0 V
CL = 1.0 nF
TA = 25°C
10%
1.2
Figure 9. Drive Output Clamp Voltage
versus Clamp Current
V sat , OUTPUT SATURATION VOLTAGE(V)
V sat , OUTPUT SATURATION VOLTAGE(V)
Figure 8. Propagation Delay
0
VCC = 12 V
80 ms Pulsed Load
120 Hz Rate
TA = 25°C
2.0
10%
10 ns/DIV
10 ns/DIV
Figure 12. Drive Output Rise Time
Figure 13. Drive Output Fall Time
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5
125
MC34151, MC33151
80
VCC = 12 V
VIN = 0 V to 5.0 V
TA = 25°C
60
ICC, SUPPLY CURRENT (mA)
t r -t f , OUTPUT RISE‐FALL TIME(ns)
80
40
tf
20
tr
0
0.1
1.0
CL, OUTPUT LOAD CAPACITANCE (nF)
f = 500 kHz
20
f = 50 kHz
1.0
CL, OUTPUT LOAD CAPACITANCE (nF)
10
TA = 25°C
ICC , SUPPLY CURRENT (mA)
ICC , SUPPLY CURRENT (mA)
40
8.0
Both Logic Inputs Driven
0 V to 5.0 V,
50% Duty Cycle
Both Drive Outputs Loaded
TA = 25°C
1 - VCC = 18 V, CL = 2.5 nF
2 - VCC = 12 V, CL = 2.5 nF
3 - VCC = 18 V, CL = 1.0 nF
4 - VCC = 12 V, CL = 1.0 nF
1
2
3
4
20
0
f = 200 kHz
Figure 15. Supply Current versus Drive Output
Load Capacitance
80
40
60
0
0.1
10
Figure 14. Drive Output Rise and Fall Time
versus Load Capacitance
60
VCC = 12 V
Both Logic Inputs Driven
0 V to 5.0 V
50% Duty Cycle
Both Drive Outputs Loaded
TA = 25°C
10 k
100
4.0
Logic Inputs Grounded
High State Drive Outputs
2.0
0
1.0 M
Logic Inputs at VCC
Low State Drive Outputs
6.0
0
f, INPUT FREQUENCY (Hz)
4.0
8.0
12
16
VCC, SUPPLY VOLTAGE (V)
Figure 16. Supply Current versus Input Frequency
Figure 17. Supply Current versus Supply Voltage
APPLICATIONS INFORMATION
Description
Output Stage
The MC34151 is a dual inverting high speed driver
specifically designed to interface low current digital
circuitry with power MOSFETs. This device is constructed
with Schottky clamped Bipolar Analog technology which
offers a high degree of performance and ruggedness in
hostile industrial environments.
Each totem pole Drive Output is capable of sourcing and
sinking up to 1.5 A with a typical ‘on’ resistance of 2.4 W at
1.0 A. The low ‘on’ resistance allows high output currents
to be attained at a lower VCC than with comparative CMOS
drivers. Each output has a 100 kW pulldown resistor to keep
the MOSFET gate low when VCC is less than 1.4 V. No over
current or thermal protection has been designed into the
device, so output shorting to VCC or ground must be
avoided.
Parasitic inductance in series with the load will cause the
driver outputs to ring above VCC during the turn−on
transition, and below ground during the turn−off transition.
With CMOS drivers, this mode of operation can cause a
destructive output latchup condition. The MC34151 is
immune to output latchup. The Drive Outputs contain an
internal diode to VCC for clamping positive voltage
transients. When operating with VCC at 18 V, proper power
supply bypassing must be observed to prevent the output
ringing from exceeding the maximum 20 V device rating.
Negative output transients are clamped by the internal NPN
pullup transistor. Since full supply voltage is applied across
Input Stage
The Logic Inputs have 170 mV of hysteresis with the input
threshold centered at 1.67 V. The input thresholds are
insensitive to VCC making this device directly compatible
with CMOS and LSTTL logic families over its entire
operating voltage range. Input hysteresis provides fast
output switching that is independent of the input signal
transition time, preventing output oscillations as the input
thresholds are crossed. The inputs are designed to accept a
signal amplitude ranging from ground to VCC. This allows
the output of one channel to directly drive the input of a
second channel for master−slave operation. Each input has
a 30 kW pulldown resistor so that an unconnected open input
will cause the associated Drive Output to be in a known high
state.
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6
MC34151, MC33151
the NPN pullup during the negative output transient, power
dissipation at high frequencies can become excessive.
Figures 20, 21, and 22 show a method of using external
Schottky diode clamps to reduce driver power dissipation.
gate charge information on their data sheets. Figure 18
shows a curve of gate voltage versus gate charge for the ON
Semiconductor MTM15N50. Note that there are three
distinct slopes to the curve representing different input
capacitance values. To completely switch the MOSFET
‘on’, the gate must be brought to 10 V with respect to the
source. The graph shows that a gate charge Qg of 110 nC is
required when operating the MOSFET with a drain to source
voltage VDS of 400 V.
Undervoltage Lockout
V GS , GATE-TO-SOURCE VOLTAGE (V)
An undervoltage lockout with hysteresis prevents erratic
system operation at low supply voltages. The UVLO forces
the Drive Outputs into a low state as VCC rises from 1.4 V
to the 5.8 V upper threshold. The lower UVLO threshold is
5.3 V, yielding about 500 mV of hysteresis.
Power Dissipation
Circuit performance and long term reliability are
enhanced with reduced die temperature. Die temperature
increase is directly related to the power that the integrated
circuit must dissipate and the total thermal resistance from
the junction to ambient. The formula for calculating the
junction temperature with the package in free air is:
where:
TJ =
TJ =
TA =
PD =
RqJA =
TA + PD (RqJA)
Junction Temperature
Ambient Temperature
Power Dissipation
Thermal Resistance Junction to Ambient
16
MTM15N50
ID = 15 A
TA = 25°C
12
8.0
8.9 nF
4.0
2.0 nF
0
0
There are three basic components that make up total
power to be dissipated when driving a capacitive load with
respect to ground. They are:
where:
PD =
PQ =
PC =
PT =
120
160
The flat region from 10 nC to 55 nC is caused by the
drain−to−gate Miller capacitance, occurring while the
MOSFET is in the linear region dissipating substantial
amounts of power. The high output current capability of the
MC34151 is able to quickly deliver the required gate charge
for fast power efficient MOSFET switching. By operating
the MC34151 at a higher VCC, additional charge can be
provided to bring the gate above 10 V. This will reduce the
‘on’ resistance of the MOSFET at the expense of higher
driver dissipation at a given operating frequency.
The transition power dissipation is due to extremely short
simultaneous conduction of internal circuit nodes when the
Drive Outputs change state. The transition power
dissipation per driver is approximately:
ICCL (1−D) + ICCH (D)
The capacitive load power dissipation is directly related
to the load capacitance value, frequency, and Drive Output
voltage swing. The capacitive load power dissipation per
driver is:
where:
80
Qg, GATE CHARGE (nC)
PC(MOSFET) = VC Qg f
ICCL = Supply Current with Low State Drive
Outputs
ICCH = Supply Current with High State Drive
Outputs
D = Output Duty Cycle
PC =
VOH =
VOL =
CL =
f=
40
D Qg
D VGS
The capacitive load power dissipation is directly related to
the required gate charge, and operating frequency. The
capacitive load power dissipation per driver is:
The quiescent power supply current depends on the
supply voltage and duty cycle as shown in Figure 17. The
device’s quiescent power dissipation is:
where:
CGS =
Figure 18. Gate−To−Source Voltage
versus Gate Charge
PQ + PC + PT
Quiescent Power Dissipation
Capacitive Load Power Dissipation
Transition Power Dissipation
PQ = VCC
VDS = 400 V
VDS = 100 V
PT = VCC (1.08 VCC CL f − 8 y 10−4)
PT must be greater than zero.
VCC (VOH − VOL) CL f
High State Drive Output Voltage
Low State Drive Output Voltage
Load Capacitance
frequency
Switching time characterization of the MC34151 is
performed with fixed capacitive loads. Figure 14 shows that
for small capacitance loads, the switching speed is limited
by transistor turn−on/off time and the slew rate of the
internal nodes. For large capacitance loads, the switching
speed is limited by the maximum output current capability
of the integrated circuit.
When driving a MOSFET, the calculation of capacitive
load power PC is somewhat complicated by the changing
gate to source capacitance CGS as the device switches. To aid
in this calculation, power MOSFET manufacturers provide
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MC34151, MC33151
LAYOUT CONSIDERATIONS
optimum drive performance, it is recommended that the
initial circuit design contains dual power supply bypass
capacitors connected with short leads as close to the VCC pin
and ground as the layout will permit. Suggested capacitors are
a low inductance 0.1 mF ceramic in parallel with a 4.7 mF
tantalum. Additional bypass capacitors may be required
depending upon Drive Output loading and circuit layout.
Proper printed circuit board layout is extremely
critical and cannot be over emphasized.
High frequency printed circuit layout techniques are
imperative to prevent excessive output ringing and overshoot.
Do not attempt to construct the driver circuit on
wire−wrap or plug−in prototype boards. When driving
large capacitive loads, the printed circuit board must contain
a low inductance ground plane to minimize the voltage spikes
induced by the high ground ripple currents. All high current
loops should be kept as short as possible using heavy copper
runs to provide a low impedance high frequency path. For
VCC
47
Vin
0.1
6
+
+
++ 5.7V
Vin
+
+
Rg
7
+
D1
1N5819
+
5
4
100k
TL494
or
TL594
100k
100k
2
Series gate resistor Rg may be needed to damp high frequency parasitic
oscillations caused by the MOSFET input capacitance and any series
wiring inductance in the gate-source circuit. Rg will decrease the
MOSFET switching speed. Schottky diode D1 can reduce the driver's
power dissipation due to excessive ringing, by preventing the output pin
from being driven below ground.
3
The MC34151 greatly enhances the drive capabilities of common switching
regulators and CMOS/TTL logic devices.
Figure 19. Enhanced System Performance with
Common Switching Regulators
Figure 20. MOSFET Parasitic Oscillations
+
+
100k
7
4X
1N5819
+
+
Isolation
Boundary
+
100k
100k
5
1N
5819
3
3
Output Schottky diodes are recommended when driving inductive loads at
high frequencies. The diodes reduce the driver's power dissipation by
preventing the output pins from being driven above VCC and below ground.
Figure 21. Direct Transformer Drive
Figure 22. Isolated MOSFET Drive
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MC34151, MC33151
Vin
IB
Vin
+
0
+
Base Charge
Removal
-
Rg(on)
+
100k
C1
100k
Rg(off)
The totem-pole outputs can furnish negative base current for enhanced
transistor turn-off, with the addition of capacitor C1.
In noise sensitive applications, both conducted and radiated EMI can
be reduced significantly by controlling the MOSFET's turn-on and
turn-off times.
Figure 23. Controlled MOSFET Drive
Figure 24. Bipolar Transistor Drive
VCC = 15 V
4.7
0.1
+
6
+
+
+
-
+
5.7V
+
6.8 10
7
+
100k
2
1N5819
47
+
+ VO ≈ 2.0 VCC
+
+
5
6.8
10
+
100k
4
330pF
1N5819
- VO ≈ - VCC
47
+
3
10k
Output Load Regulation
The capacitor's equivalent series resistance limits the Drive Output Current
to 1.5 A. An additional series resistor may be required when using tantalum or
other low ESR capacitors.
Figure 25. Dual Charge Pump Converter
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IO (mA)
+VO (V)
−VO (V)
0
1.0
10
20
30
50
27.7
27.4
26.4
25.5
24.6
22.6
−13.3
−12.9
−11.9
−11.2
−10.5
−9.4
MC34151, MC33151
ORDERING INFORMATION
Package
Shipping†
MC34151DG
SOIC−8
(Pb−Free)
98 Units / Rail
MC34151DR2G
SOIC−8
(Pb−Free)
2500 Tape & Reel
MC34151PG
PDIP−8
(Pb−Free)
50 Units / Rail
MC33151DG
SOIC−8
(Pb−Free)
98 Units / Rail
MC33151DR2G
SOIC−8
(Pb−Free)
2500 Tape & Reel
MC33151PG
PDIP−8
(Pb−Free)
50 Units / Rail
MC33151VDR2G
SOIC−8
(Pb−Free)
2500 Tape & Reel
Device
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
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10
MC34151, MC33151
PACKAGE DIMENSIONS
PDIP−8
P SUFFIX
CASE 626−05
ISSUE N
D
A
E
H
8
5
E1
1
4
NOTE 8
b2
c
B
END VIEW
TOP VIEW
WITH LEADS CONSTRAINED
NOTE 5
A2
A
e/2
NOTE 3
L
SEATING
PLANE
A1
C
D1
M
e
8X
SIDE VIEW
b
0.010
eB
END VIEW
M
C A
M
B
M
NOTE 6
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11
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: INCHES.
3. DIMENSIONS A, A1 AND L ARE MEASURED WITH THE PACKAGE SEATED IN JEDEC SEATING PLANE GAUGE GS−3.
4. DIMENSIONS D, D1 AND E1 DO NOT INCLUDE MOLD FLASH
OR PROTRUSIONS. MOLD FLASH OR PROTRUSIONS ARE
NOT TO EXCEED 0.10 INCH.
5. DIMENSION E IS MEASURED AT A POINT 0.015 BELOW DATUM
PLANE H WITH THE LEADS CONSTRAINED PERPENDICULAR
TO DATUM C.
6. DIMENSION E3 IS MEASURED AT THE LEAD TIPS WITH THE
LEADS UNCONSTRAINED.
7. DATUM PLANE H IS COINCIDENT WITH THE BOTTOM OF THE
LEADS, WHERE THE LEADS EXIT THE BODY.
8. PACKAGE CONTOUR IS OPTIONAL (ROUNDED OR SQUARE
CORNERS).
DIM
A
A1
A2
b
b2
C
D
D1
E
E1
e
eB
L
M
INCHES
MIN
MAX
−−−− 0.210
0.015
−−−−
0.115 0.195
0.014 0.022
0.060 TYP
0.008 0.014
0.355 0.400
0.005
−−−−
0.300 0.325
0.240 0.280
0.100 BSC
−−−− 0.430
0.115 0.150
−−−−
10 °
MILLIMETERS
MIN
MAX
−−−
5.33
0.38
−−−
2.92
4.95
0.35
0.56
1.52 TYP
0.20
0.36
9.02
10.16
0.13
−−−
7.62
8.26
6.10
7.11
2.54 BSC
−−−
10.92
2.92
3.81
−−−
10 °
MC34151, MC33151
PACKAGE DIMENSIONS
SOIC−8
D SUFFIX
CASE 751−07
ISSUE AK
−X−
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.127 (0.005) TOTAL
IN EXCESS OF THE D DIMENSION AT
MAXIMUM MATERIAL CONDITION.
6. 751−01 THRU 751−06 ARE OBSOLETE. NEW
STANDARD IS 751−07.
A
8
5
S
B
0.25 (0.010)
M
Y
M
1
4
−Y−
K
G
C
N
X 45 _
SEATING
PLANE
−Z−
0.10 (0.004)
H
D
0.25 (0.010)
M
Z Y
S
X
M
J
S
DIM
A
B
C
D
G
H
J
K
M
N
S
MILLIMETERS
MIN
MAX
4.80
5.00
3.80
4.00
1.35
1.75
0.33
0.51
1.27 BSC
0.10
0.25
0.19
0.25
0.40
1.27
0_
8_
0.25
0.50
5.80
6.20
INCHES
MIN
MAX
0.189
0.197
0.150
0.157
0.053
0.069
0.013
0.020
0.050 BSC
0.004
0.010
0.007
0.010
0.016
0.050
0 _
8 _
0.010
0.020
0.228
0.244
SOLDERING FOOTPRINT*
1.52
0.060
7.0
0.275
4.0
0.155
0.6
0.024
1.270
0.050
SCALE 6:1
mm Ǔ
ǒinches
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
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“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
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MC34151/D