2DAD-C5R

oH
V SC
AV ER OM
AI SIO PL
LA N IA
BL S NT
E
Features
■
*R
■
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■
■
Applications
Lead free versions available
RoHS compliant (lead free version)*
ESD protection
Protects four lines
Low capacitance 15 pF
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Cell phones
PDAs and notebooks
MP3 players
2DAD-C5R - Integrated Passive & Active Device using CSP
General Information
The 2DAD-C5R device, manufactured using Thin Film on
Silicon technology, provides ESD protection for the
external ports of portable electronic devices such as cell
phones, modems and PDAs.
SOLDER
BUMPS
The ESD protection provided by the component enables
a data port to withstand a minimum ±8 KV Contact /
±15 KV Air Discharge per the ESD test method specified
in IEC 61000-4-2. The device measures 1.00 mm x 1.33
mm and is available in a 5 bump CSP package intended
to be mounted directly onto an FR4 printed circuit board.
The CSP device meets typical thermal cycle and bend test
specifications without the use of an underfill material.
SILICON
DIE
E
T
E
L
O
S
B
O
Electrical & Thermal Characteristics
Electrical Characteristics
(TA = 25 °C unless otherwise noted)
Capacitance @ 2.5 V 1 MHz
Rated Standoff Voltage
Breakdown Voltage @ 1 mA
Forward Voltage @ 10 mA
Leakage Current @ 3.3 V
ESD Protection: IEC 61000-4-2
Contact Discharge
Air Discharge
Thermal Characteristics
Symbol
Minimum
C
12
VWM
VBR
Nominal
Maximum
Unit
15
18
pF
5.0
V
0.8
V
6.0
VF
IR
0.1
±8
±15
V
µA
kV
kV
(TA = 25 °C unless otherwise noted)
DC Power Rating
Operating Temperature Range
Storage Temperature Range
*RoHS Directive 2002/95/EC Jan 27 2003 including Annex
Specifications are subject to change without notice.
Customers should verify actual device performance in their specific applications.
P
200
mW
TJ
-40
25
+85
°C
TSTG
-55
25
+150
°C
2DAD-C5R - Integrated Passive & Active Device using CSP
Mechanical Characteristics
This is a silicon-based device and is packaged using chip scale packaging technology. Solder bumps, formed on the silicon die,
provide the interconnect medium from die to PCB. The bumps are arranged on the die in a regular grid formation. The grid pitch is
0.5 mm and the dimensions for the packaged device are shown below.
0.432 - 0.559
(0.017 - 0.022)
0.3
DIA.
(0.012)
A1
C1
0.435
(0.017)
B2
1.285 - 1.375
(0.051 - 0.054)
0.435
(0.017)
E
T
E
L
O
S
B
O
A3
0.330 - 0.457
(0.013 - 0.018)
C3
0.180 - 0.280
(0.007 - 0.011)
0.180 - 0.280
(0.007 - 0.011)
0.50
(0.020)
0.971 - 1.001
(0.038 - 0.039)
Reliability Data
DIMENSIONS =
MILLIMETERS
(INCHES)
Reliability data is gathered on an ongoing basis for Bourns® Integrated Passive and Active Devices.
“Package level” testing of the integrity of the solder joint is carried out on an independent Daisy-Chain test device. A 25-Pin Daisy
Chain component is available from Bourns for this purpose (part number 2TAD-C25R). This is a 5 x 5 array featuring 0.5 mm pitch
solder bumps. The Distance to Neutral Point (DNP) on that component is larger than that of the 2DAD-C5R and is thus deemed
suitable for Thermal Cycle testing.
“Silicon level” reliability performance is based on similarity to other integrated passive CSP devices from Bourns.
Overshoot and Clamping Voltage Response
5 Volts per Division
35
25
15
5
-5
-90,000 ns
10,000 ns
110,000 ns
ESD Test Pulse - 25 kilovolt, 1/30 ns (waveshape)
Specifications are subject to change without notice.
Customers should verify actual device performance in their specific applications.
2DAD-C5R - Integrated Passive & Active Device using CSP
PCB Design and SMT Processing
Block Diagram
The CSP device block diagram below includes the pin names and basic electrical
connections associated with each channel.
EXT1
Please consult the “Bourns Design
Guide Using CSP” for notes on PCB
design and SMT Processing.
EXT2
How to Order
2 DAD - C5R ____
GND
Thinfilm
Model
E
T
E
L
O
S
B
O
Chipscale
No. of Solder Bumps
EXT4
EXT3
Packaging Option
R = Tape and Reel
Packaged 3000 pcs. / 7 ” reel
Terminations
LF = Sn/Ag/Cu (lead free)
Blank = Sn/Pb
Specifications are subject to change without notice.
Customers should verify actual device performance in their specific applications.
2DAD-C5R - Integrated Passive & Active Device using CSP
Device Pin Out
The pin-out for the device is shown below with the bumps facing up.
1
EXT2
2
3
C
EXT3
Pin Out
A1
C1
B2
B
EXT1
EXT4
A
GND
Packaging
Function
EXT1
EXT2
GND
Pin Out
A3
C3
E
T
E
L
O
S
B
O
Function
EXT4
EXT3
The surface mount product is packaged in an 8 mm x 4 mm Tape and Reel format per EIA-481 standard.
TOP SIDE VIEW
(INTO COMPONENT POCKET)
DIMENSIONS =
0.3 ± 0.05
(.01 ± .002)
0.3
MAX.
(0.01)
0.76 ± 0.1
(.03 ± .004)
(INCHES)
4.0 ± 0.1
(.16 ± .004)
1.5 ± 0.1/-0
(.06 ± .004/-0)
DIA.
2.0 ± 0.05
(.08 ± .002)
R
MILLIMETERS
1.52 ± 0.1
(.06 ± .004)
1.18 ± 0.1
(.05 ± .004)
4.0 ± 0.1
(.16 ± .004)
ORIENTATION
OF COMPONENT
IN POCKET
1.75 ± 0.1
(.07 ± .004)
8.0 ± 0.3
(.31 ± .01)
3.5 ± 0.05
(.14 ± .002)
R 0.25 TYP.
(0.010)
BACKSIDE FACING UP
Reliable Electronic Solutions
Asia-Pacific:
TEL +886- (0)2 25624117 • FAX +886- (0)2 25624116
Europe:
TEL +41-41 768 5555 • FAX +41-41 768 5510
The Americas: TEL +1-951 781-5492 • FAX +1-951 781-5700
www.bourns.com
COPYRIGHT© 2004, BOURNS, INC. LITHO IN U.S.A. 06/05 e/IPA0507
2DAD-C5R REV. B, 1/05
Specifications are subject to change without notice.
Customers should verify actual device performance in their specific applications.