Reliability Data Report Product Family R427 LTC4210 / LTC4211 / LTC4212 / LTC4214 / LTC4230 / LTC4240 / LTC4241 / LTC4244 / LTC4251 / LTC4252 / LTC4253 / LTC4350 Reliability Data Report Report Number: R427 Report generated on: Tue Apr 05 13:03:03 PDT 2016 OPERATING LIFE TEST PACKAGE TYPE SSOP/TSSOP SOIC/MSOP SOT Totals SAMPLE SIZE 2348 4834 638 7,820 OLDEST DATE NEWEST DATE K DEVICE HRS 1 No. of FAILURES 2,3 CODE CODE (+125°C) 0040 0040 0531 - 1243 1507 1444 - 1738 3085 156 4,979 0 0 0 0 K DEVICE HRS No. of FAILURES PRESSURE COOKER TEST AT 15 PSIG , +121 DEG C PACKAGE TYPE SAMPLE SIZE SSOP/TSSOP SOIC/MSOP QFN/DFN SOT Totals 5867 2541 150 3583 12,141 OLDEST DATE NEWEST DATE CODE CODE 0027 0104 0511 0143 - 1248 1418 0741 1346 - 504 151 34 302 991 0 0 0 0 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES CODE CODE CYCLES 0027 9952 0511 0143 - 1053 1418 0741 1346 - 553 545 55 586 1,739 0 0 0 0 0 OLDEST DATE NEWEST DATE K DEVICE No. of FAILURES CODE CODE CYCLES 0129 0105 0511 0143 - 1248 1418 0741 1346 - 388 278 55 535 1,256 TEMP CYCLE FROM -65 TO 150 DEG C PACKAGE TYPE SAMPLE SIZE SSOP/TSSOP SOIC/MSOP QFN/DFN SOT Totals 1589 4196 150 2955 8,890 THERMAL SHOCK FROM -65 TO 150 DEG C PACKAGE TYPE SAMPLE SIZE SSOP/TSSOP SOIC/MSOP QFN/DFN SOT Totals 1088 1989 150 2254 5,481 (1) Assumes Activation Energy = 0.7 Electron Volts (2) Failure Rate Equivalent to +55 °C, 60% Confidence Level =2.38 FITS (3) Mean Time Between Failure in Years = 47968.28 Note: 1 FIT = 1 Failure in One Billion Hours. Note 2: HAST, Temp Cycle & Thermal Shock are subjected to J-STD-020 MSL1 Preconditioning 0 0 0 0 0